Directory of Microscopy & Microanalysis Meetings/ShortCourses/Conferences


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Dates
Meeting/Course and Short Synopsis
Local Date/Time is: 2018 / 4 / 19 @ 17:58
May 29, 2018
to
Jun 01, 2018
Title:62nd Conference on Electron, Ion, and Photon Beam Technology and Nanofabrication
Sponsor:APS, AVS, OSA, DOE
Location:Rio Mar Beach Resort & Spa , Puerto Rico PR United States
URL: http://www.eipbn.org/

  • Light/Optical Scanning Probe SEM TEM CBED OIM AEM SIM X-Ray Microscopy MRI Computational Optical / EUV lithography, Neuromorphic Computing, Quantum electronics
  • The EIPBN Conference is recognized as the foremost international meeting dedicated to lithographic science and technology and its application to micro and nanofabrication techniques. The conference brings together engineers and scientists from industries and universities from all over the world to discuss recent progress and future trends.
May 29, 2018
to
Jun 01, 2018
Title:The 62nd International Conference on Electron, Ion, and Photon Beam Technology and Nanofabrication
Sponsor:AVS APS OSA DOE
Location:Rio Mar Beach Resort & Spa , Puerto Rico PR United States
URL: http://www.eipbn.org/

  • Light/Optical Scanning Probe SEM TEM CBED OIM AEM SIM X-Ray Microscopy MRI Computational
  • The EIPBN Conference is dedicated to lithographic patterning science, nanomanufacturing process technology, and the applications these methods enable. For 61 years and 62 meetings, the conference has brought together engineers and scientists from industries and universities from all over the world to report on and discuss recent progress and future trends.
May 29, 2018
to
Jun 01, 2018
Title:The 62nd International Conference on Electron, Ion, and Photon Beam Technology and Nanofabrication
Sponsor:AVS APS OSA DOE
Location:Rio Mar Beach Resort & Spa , Puerto Rico PR United States
URL: http://www.eipbn.org/

  • Light/Optical Scanning Probe SEM TEM CBED OIM AEM SIM X-Ray Microscopy MRI Computational
  • The EIPBN Conference is dedicated to lithographic patterning science, nanomanufacturing process technology, and the applications these methods enable. For 61 years and 62 meetings, the conference has brought together engineers and scientists from industries and universities from all over the world to report on and discuss recent progress and future trends.
May 29, 2018
to
Jun 01, 2018
Title:The 62nd International Conference on Electron, Ion, and Photon Beam Technology and Nanofabrication
Sponsor:AVS APS OSA DOE
Location:Rio Mar Beach Resort , Puerto Rico PR United States
URL: http://www.eipbn.org/

  • Light/Optical Scanning Probe SEM TEM CBED OIM AEM SIM X-Ray Microscopy MRI Computational
  • The EIPBN Conference is dedicated to lithographic patterning science, nanomanufacturing process technology, and the applications these methods enable. For 61 years and 62 meetings, the conference has brought together engineers and scientists from industries and universities from all over the world to report on and discuss recent progress and future trends.
Jun 03, 2018
to
Jun 08, 2018
Title:Lehigh Microscopy School
Sponsor:Lehigh University
Location:Lehigh University , Bethlehem PA United States
URL: http://www.lehigh.edu/microscopy

  • SEM LVSEM ESEM TEM STEM CBED EBSD AEM EDS WDS EMPA FIB X-Ray Microscopy XRF XRD
  • Forty-eighth anniversary of the Lehigh Microscopy School. June 3-8, 2018 on the campus of Lehigh University, Bethehem, PA. USA. Courses include SEM, Introduction to SEM and EDS, Focused Ion Beam, Problem Solving: Interpretation and Analysis of SEM/EDS/EBSD Data, Quantitative X-ray Microanalysis, Scanning Transmission Electron Microscopy
Jun 10, 2018
to
Jun 15, 2018
Title:Atom Probe Tomography and Microscopy 2018 (APT&M 2018)
Sponsor:National Insitute of Standards and Technology
Location:NIST , Gaithersburg MD United States
URL: http://tinyurl.com/aptm2018

  • FIM AtomProbe
  • The 6-day, biennial meeting is the premier international gathering of 200+ interdisciplinary researchers, in the fields of high field nanoscience and atom probe microscopy.

Nestor J. Zaluzec / Zaluzec@microscopy.com