| Dates | Meeting/Course and Short Synopsis Local Date/Time is: 2009 / 7 / 3 @ 18:58 |
Jul 06, 2009 to Jul 10, 2009 | - Light/Optical IR/Raman Fluorescence SEM TEM
- The 61st Annual INTER/MICRO Symposium will include presentations, workshops, and exhibits that cover recent advancements in instrumentation, techniques, and applications in the field of microscopy and microanalysis. Focus areas include Techniques, Instrumentation, Environmental, Industrial Microscopy, Chemical and Forensic Microscopy.
Meeting events include the ‘Evening with Brian’ presentation with the speaker, scientist, and author, Brian J. Ford of Gonville & Caius College, Cambridge University.
Presentations from experts in all areas of applied and electron microscopy.
Social hours for discussions and networking with speakers, exhibitors and other attendees on advances in microscopy research, techniques and instrumentation
Two day workshop on Airborne Fungus Spores (July 9-10)with Dr. John Haines. 2009 Inter/Micro Banquet – closing ceremonies for the meeting and following the banquet, the State Microscopical Society of Illinois (SMSI) will hold its Annual Meeting and auction. Hosted by the McCrone Research Institute.
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Jul 06, 2009 to Jul 10, 2009 | - Light/Optical IR/Raman Fluorescence SEM TEM TPM/TPC
- Papers are being solicited in all areas of applied microscopy. Please visit the website for more information. Deadline for Title and Abstract submission is April 15, 2009.
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Jul 12, 2009 to Jul 16, 2009 | | Title: | Interdisciplinary Symposium on 3 Dimensional Microscopy 2009 | | Sponsor: | Swiss Society for Optics and Microscopy | | Location: | Interlaken Congress Centre , Interlaken NNA SWITZERLAND | | URL: | http://www.ssom.ch/3D/index.html |
- Light/Optical Near Field NSOM Scanning Probe SPM STM AFM SEM LVSEM ESEM TEM HREM STEM CBED AEM ELS EDS WDS EMPA SIMS AtomProbe FIB X-Ray Microscopy XRF XRD XAFS MRI Computational
- Methods using three dimensional imaging to retrieve data in volume will be discussed, whether “light”, x-rays, electrons or near field probes, would be used.
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Jul 26, 2009 to Jul 30, 2009 | - Light/Optical MultiPhoton IR/Raman Fluorescence Near Field NSOM Scanning Probe SPM STM AFM MFM SEM LVSEM ESEM LEEM TEM HREM STEM SCEM IVEM/HVEM CBED TED EBSD OIM Tomography Holography Lorentz Insitu AEM ELS EDS WDS EMPA AES ESCA SIM SIMS FIM AtomProbe FIB
- The annual meeting of the Microscopy Society of America and the Microbeam Analysis Society, co sponsored by the International Metallographic Society
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Aug 16, 2009 to Aug 20, 2009 | | Title: | The American Chemical Society | | Sponsor: | | | Location: | , Washington, DC DC United States | | URL: | |
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Sep 27, 2009 to Oct 02, 2009 | | Title: | The Twelfth Frontiers of Electron Microscopy in Materials Science (FEMMS2009) | | Sponsor: | Japan Society for the Promotion of Science | | Location: | Huis Ten Bosch , Sasebo JAPAN | | URL: | http://www.femms2009.org/ |
- SEM LVSEM ESEM LEEM TEM HREM STEM SCEM IVEM/HVEM CBED TED EBSD OIM Tomography Holography Lorentz Insitu AEM ELS EDS WDS SIM SIMS FIM AtomProbe FIB X-Ray Microscopy Computational TPM/TPC
- FEMMS is an international symposium focused on the application of electron microscopy in materials science. The meeting typically includes over 50 invited speakers, who are the most influential scientists.
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Sep 28, 2009 to Oct 02, 2009 | | Title: | First Joint Advanced Electron Microscopy School for Nanomaterials and the Workshop on Nanomaterials (AEM-NANOMAT09) | | Sponsor: | FEI Company, Jeol, Carl Zeiss | | Location: | Research Center for Applied Chemistry (CIQA) , Saltillo MEXICO | | URL: | http://aem.ciqa.mx |
- SEM TEM HREM STEM CBED Computational
- Attendance at this meeting will allow you to:
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Learn from internationally renowned researchers and experts in a comprehensive program covering the latest developments in Advanced Electron Microscopy techniques for Nanomaterials: Scanning and Transmission Electron Microscopy as well as specimen preparation using a Dual-Beam (SEM/FIB) system.
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Present your latest research in oral and poster sessions. The AEM-NANOMAT organization provides the opportunity to attend ONLY to the Workshop on Nanomaterials.
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Interact and promote scientific exchanges with interdisciplinary colleagues that are interested on recent developments in all branches of fundamental and applied Nanotechnology and Nanomaterials.
The AEM School program will include keynote and invited lectures, as well as experimental session. Moreover, it will address state of the art topics, practical problems and solutions in the physics and chemistry of Nanomaterials.
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Oct 25, 2009 to Oct 28, 2009 | | Title: | 10th Inter-American Congress of Electron Microscopy 2009 - CIASEM 2009 | | Sponsor: | Inter-American Committee of Societies for Electron Microscopy | | Location: | Pueyrredon 762 , Rosario ARGENTINA | | URL: | http://www.cab.cnea.gov.ar/ciasem2009 |
- Light/Optical Fluorescence Near Field Scanning Probe SPM STM AFM MFM SEM LVSEM ESEM LEEM TEM HREM STEM SCEM IVEM/HVEM CBED TED EBSD OIM Tomography Holography Lorentz Insitu AEM ELS EDS WDS EMPA SIM SIMS FIM AtomProbe FIB Computational
- Contribution related to TEM, SEM, SPM and optical microscopes will be welcome. Topics concerning Physics and Materials Sciences, Life Sciences, Instrumentation and Applications will be covered.
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Dec 05, 2009 to Dec 09, 2009 | | Title: | The American Society for Cell Biology | | Sponsor: | | | Location: | , San Diego CA United States | | URL: | http://www.ascb.org |
- Light/Optical MultiPhoton Fluorescence SPM STM AFM SEM LVSEM TEM HREM STEM IVEM/HVEM Tomography Holography
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Annual Meeting
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Mar 21, 2010 to Mar 25, 2010 | | Title: | The American Chemical Society | | Sponsor: | | | Location: | , San Francisco CA United States | | URL: | |
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Jun 24, 2010 to Jun 26, 2010 | | Title: | The 2nd International Symposium on Advanced Microscopy and Theoretical Calculations (AMTC2) | | Sponsor: | Nanostructures Research Laboratory, Japan Fine Ceramics Center | | Location: | The Nagoya Congress Center , Nagoya JAPAN | | URL: | http://www.jecs.org/amtc2/ |
- Scanning Probe SPM STM AFM MFM SEM LVSEM ESEM LEEM TEM HREM STEM SCEM IVEM/HVEM CBED TED EBSD OIM Tomography Holography Lorentz Insitu AEM ELS EDS FIM AtomProbe FIB Computational
- AMTC2 will bring together experts in the fields of electron microscopy and computer simulation to discuss recent findings, state-of-the-art technology and the charting of future research paths.
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Aug 01, 2010 to Aug 05, 2010 | - Light/Optical MultiPhoton IR/Raman Fluorescence Near Field NSOM Scanning Probe SPM STM AFM MFM SEM LVSEM ESEM LEEM TEM HREM STEM SCEM IVEM/HVEM CBED TED EBSD OIM Tomography Holography Lorentz Insitu AEM ELS EDS WDS EMPA AES ESCA SIM SIMS FIM AtomProbe FIB
- The annual meeting of the Microscopy Society of America adn the Microbeam Analysis Society, co-sponsored by the International Metallographic Society
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Aug 22, 2010 to Aug 26, 2010 | | Title: | The American Chemical Society | | Sponsor: | | | Location: | , Boston MA United States | | URL: | |
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Aug 07, 2011 to Aug 11, 2011 | - Light/Optical MultiPhoton IR/Raman Fluorescence Near Field NSOM Scanning Probe SPM STM AFM MFM SEM LVSEM ESEM LEEM TEM HREM STEM SCEM IVEM/HVEM CBED TED EBSD OIM Tomography Holography Lorentz Insitu AEM ELS EDS WDS EMPA AES ESCA SIM SIMS FIM AtomProbe FIB
- The annual meeting of the Microscopy Society of America adn the Microbeam Analysis Society, co-sponsored by the International Metallographic Society
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Jul 29, 2012 to Aug 02, 2012 | - Light/Optical MultiPhoton IR/Raman Fluorescence Near Field NSOM Scanning Probe SPM STM AFM MFM SEM LVSEM ESEM LEEM TEM HREM STEM SCEM IVEM/HVEM CBED TED EBSD OIM Tomography Holography Lorentz Insitu AEM ELS EDS WDS EMPA AES ESCA SIM SIMS FIM AtomProbe FIB
- The annual meeting of the Microscopy Society of America adn the Microbeam Analysis Society, co-sponsored by the International Metallographic Society
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