|May 31, 2020|
Jun 05, 2020
- SEM LVSEM TEM CBED TED EBSD AEM SIMS FIB X-Ray Microscopy XRD
In the world of big-time, small-scale characterization, the Lehigh Microscopy School has been leading the way for 50 years, and shows no signs of slowing down.
May 31-June 5, 2020, the School will mark its 50th year since Professor Joe Goldstein founded the annual week long session to keep colleagues and professionals abreast of the absolute state-of-the-art in electron microscopy.
|Oct 25, 2020|
Oct 30, 2020
|Title:||AVS 67th International Symposium & Exhibition|
|Sponsor:||American Vacuum Society|
|Location:||Colorado Convention Center , Denver CO United States|
- IR/Raman Scanning Probe SPM STM AFM SEM Insitu SIM SIMS FIM AtomProbe FIB
- The AVS 67 International Symposium and Exhibition addresses cutting edge issues associated with materials, processing and interfaces in both the research and manufacturing communities. AVS 67 will be an ideal forum for presentation and discussion of your latest results and will provide many opportunities to connect with other engineers and scientists.