| Dates | Meeting/Course and Short Synopsis
Local Date/Time is: 2010 / 7 / 29 @ 13:16 |
Jun 29, 2010
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Jul 01, 2010 |
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Jul 05, 2010
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Jul 08, 2010 | | Title: | 52nd International Field Emission Symposium | | Sponsor: | Australian Key Centre for Microscopy and Microanalysis, University of Sydney | | Location: | Crowne Plaza Hotel Coogee , Sydney NNA AUSTRALIA | | URL: | http://www.ifes2010.org |
- Light/Optical MultiPhoton IR/Raman Fluorescence Near Field NSOM Scanning Probe SPM STM AFM MFM SEM LVSEM ESEM LEEM TEM HREM STEM SCEM IVEM/HVEM CBED TED EBSD OIM Tomography Holography Lorentz Insitu AEM ELS EDS WDS EMPA AES ESCA SIM SIMS FIM AtomProbe FIB
- The inspiring scientific program focusing on high field nanoscience and atom probe microscopy will also include the IFES Bloch Lecture, EW Muller Award, international keynote lectures and workshops.
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Jul 11, 2010
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Jul 15, 2010 | | Title: | 21st Australian Conference on Microscopy and Microanalysis (ACMM-21) | | Sponsor: | Australian Microscopy and Microanalysis Society | | Location: | Brisbane Convention & Exhibition Centre , Brisbane AUSTRALIA | | URL: | http://www.acmm21.com.au/ |
- Light/Optical MultiPhoton Scanning Probe SEM LVSEM ESEM TEM HREM STEM CBED TED EBSD Insitu AEM ELS EDS WDS SIM AtomProbe FIB
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themes such as advances in analytical electron microscopy, cryo-electron microscopy and tomography, and developing micro-analytical techniques. In 2010 we will be celebrating the 21st anniversary of the conference and we anticipate over 250 delegates will attend this informative and exciting event.
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Jul 12, 2010
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Jul 16, 2010 |
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Jul 21, 2010
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Jul 23, 2010 | | Title: | Practical Stereology | | Sponsor: | Microscopy Imaging Center, University of Vermont | | Location: | Health Science Research Facility, College of Medic , Burlington VT United States | | URL: | http://www.med.uvm.edu/microscopyimaging/ |
- Light/Optical MultiPhoton Fluorescence SEM LVSEM ESEM TEM Computational stereology
- This 3 day practical hands-on course is designed for advanced students, Post-Doctoral fellows, technicians, and Principal Investigators seeking to understand the principles of stereology as applied to microscopy and other imaging modalities.
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Jul 28, 2010
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Jul 30, 2010 |
- Light/Optical TEM
- The objective of the course is to provide researchers with the opportunity to learn the theory and practice of immunogold labeling. Participants will process their own samples.
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Aug 01, 2010
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Aug 05, 2010 |
- Light/Optical MultiPhoton IR/Raman Fluorescence Near Field NSOM Scanning Probe SPM STM AFM MFM SEM LVSEM ESEM LEEM TEM HREM STEM SCEM IVEM/HVEM CBED TED EBSD OIM Tomography Holography Lorentz Insitu AEM ELS EDS WDS EMPA AES ESCA SIM SIMS FIM AtomProbe FIB
- The annual meeting of the Microscopy Society of America adn the Microbeam Analysis Society, co-sponsored by the International Metallographic Society
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Aug 15, 2010
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Aug 20, 2010 | | Title: | The 10th International Conference on X-ray Microscopy | | Sponsor: | Argonne National Laboratory | | Location: | Sheraton Hotel & Towers , Chicago IL United States | | URL: | http://xrm2010.aps.anl.gov/ |
- X-Ray Microscopy STXM XRF XRD XAFS
- The international conference on x-ray microscopy is a gathering for the presentation and discussion of advances in high resolution x-ray imaging and its application to understanding a broad field of scientific questions.
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Aug 22, 2010
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Aug 26, 2010 | | Title: | The American Chemical Society | | Location: | , Boston MA United States | | URL: | |
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Sep 01, 2010
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Sep 02, 2010 | | Title: | Master´s Degree Programme in Biomedical Imaging | | Sponsor: | University of Turku and Åbo Akademi University, Finland | | Location: | Turku University Campus , Turku FINLAND | | URL: | http://www.med.utu.fi/bioimaging |
- Light/Optical MultiPhoton IR/Raman Fluorescence Scanning Probe AFM SEM TEM X-Ray Microscopy MRI
- International Master´s Programme in Biomedical Imaging - CALL FOR
APPLICATIONS - DEADLINE 26 FEB 2010 !
International Master´s Programme in Biomedical Imaging begins in Turku, Finland in September 2010 ! The programme is jointly administrated by the University of Turku and Åbo Akademi University.
Application period for the programme: December 1, 2009 - February 26,
2010.
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Sep 19, 2010
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Sep 24, 2010 |
- Light/Optical MultiPhoton Scanning Probe SPM STM AFM MFM SEM ESEM TEM HREM STEM SCEM CBED TED EBSD OIM Tomography Holography Lorentz Insitu AEM ELS EDS WDS EMPA SIM SIMS TPM/TPC
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Oct 04, 2010
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Oct 08, 2010 | | Title: | NIBSC / JEOL / LEICA CryoEM -Workshop | | Sponsor: | NIBSC / JEOL / LEICA CryoEM -Workshop | | Location: | NIBSC, South Mimms, Herts. UK (near London) , Potters Bar NNA UNITED KINGDOM | | URL: | http://www.nibsc.ac.uk |
- SEM TEM Cryo-EM
- The course will embrace cryo-preparation techniques using Cryo-FEGSEM, Cryo-TEM with tomography and the many associated preparation techniques:
• Freeze fracture (Leica/BAF060)
• High pressure freezing
• Cryo-sectioning (Tokuyasu)
• Freeze substitution
• High resolution Cryo-FEG
• Vitreous thin films (plunge freezing)
• Cryo-sectioning and CEMOVIS
The course will be held over 5 days commencing 4th October through to Friday 8th October 2010. Delegate numbers will be strictly limited to ensure maximum hands-on training.
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Oct 04, 2010
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Oct 08, 2010 | | Title: | NIBSC / JEOL / LEICA CryoEM -Workshop | | Sponsor: | NIBSC / JEOL / LEICA CryoEM -Workshop | | Location: | NIBSC, South Mimms, Herts. UK (near London) , Potters Bar NNA UNITED KINGDOM | | URL: | http://www.nibsc.ac.uk |
- SEM TEM Cryo-EM
- The course will embrace cryo-preparation techniques using Cryo-FEGSEM, Cryo-TEM with tomography and the many associated preparation techniques:
• Freeze fracture (Leica/BAF060)
• High pressure freezing
• Cryo-sectioning (Tokuyasu)
• Freeze substitution
• High resolution Cryo-FEG
• Vitreous thin films (plunge freezing)
• Cryo-sectioning and CEMOVIS
The course will be held over 5 days commencing 4th October through to Friday 8th October 2010. Delegate numbers will be strictly limited to ensure maximum hands-on training.
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Apr 04, 2011
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Apr 07, 2011 | | Title: | Microscopy of Semiconducting Materials (MSM-XVII) | | Sponsor: | Institute of Physics (London) / Royal Microscopical Society (Oxford) and Materials Research Society | | Location: | Churchill College , Cambridge NNA UNITED KINGDOM | | URL: | http://msm2011.org |
- Light/Optical MultiPhoton Near Field NSOM Scanning Probe SPM STM AFM MFM SEM LVSEM ESEM LEEM TEM HREM STEM SCEM IVEM/HVEM CBED TED EBSD OIM Tomography Holography Lorentz Insitu AEM ELS EDS WDS EMPA AES ESCA SIM SIMS FIM FIB X-Ray Microscopy STXM XRF XRD X
- The conference will focus on the most recent advances in the study of the structural and electronic properties of semiconducting materials by the application of transmission and scanning electron microscopy. The latest developments in the use of other important microcharacterisation techniques including scanning probe microscopy and X-ray topography and diffraction will also be featured. Developments in materials science and technology covering the complete range of elemental and compound semiconductors will be described.
The main topic areas to be covered are as follows:
- characterisation of as-grown semiconductors in both bulk and thin film forms.
- study of nanostructures of all types from quantum dots, wires, etc to nanotubes.
- investigation of lattice defect and impurity behaviour in semiconducting materials.
- study of the effects of semiconductor processing treatments, such as oxidation, nitridation, ion implantation, annealing, silicidation, etc.
- assessment of finished electronic devices, including studies of the influence of structural defects upon their behaviour and important new design features such as high/low k dielectrics, etc.
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Apr 04, 2011
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Apr 07, 2011 | | Title: | Microscopy of Semiconducting Materials (MSM-XVII) | | Sponsor: | Institute of Physics (London) / Royal Microscopical Society (Oxford) and Materials Research Society | | Location: | Churchill College , Cambridge NNA UNITED KINGDOM | | URL: | http://msm2011.org |
- Light/Optical MultiPhoton Near Field NSOM Scanning Probe SPM STM AFM MFM SEM LVSEM ESEM LEEM TEM HREM STEM SCEM IVEM/HVEM CBED TED EBSD OIM Tomography Holography Lorentz Insitu AEM ELS EDS WDS EMPA AES ESCA SIM SIMS FIM FIB X-Ray Microscopy STXM XRF XRD X
- The conference will focus on the most recent advances in the study of the structural and electronic properties of semiconducting materials by the application of transmission and scanning electron microscopy. The latest developments in the use of other important microcharacterisation techniques including scanning probe microscopy and X-ray topography and diffraction will also be featured. Developments in materials science and technology covering the complete range of elemental and compound semiconductors will be described.
The main topic areas to be covered are as follows:
- characterisation of as-grown semiconductors in both bulk and thin film forms.
- study of nanostructures of all types from quantum dots, wires, etc to nanotubes.
- investigation of lattice defect and impurity behaviour in semiconducting materials.
- study of the effects of semiconductor processing treatments, such as oxidation, nitridation, ion implantation, annealing, silicidation, etc.
- assessment of finished electronic devices, including studies of the influence of structural defects upon their behaviour and important new design features such as high/low k dielectrics, etc.
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Aug 07, 2011
to
Aug 11, 2011 |
- Light/Optical MultiPhoton IR/Raman Fluorescence Near Field NSOM Scanning Probe SPM STM AFM MFM SEM LVSEM ESEM LEEM TEM HREM STEM SCEM IVEM/HVEM CBED TED EBSD OIM Tomography Holography Lorentz Insitu AEM ELS EDS WDS EMPA AES ESCA SIM SIMS FIM AtomProbe FIB
- The annual meeting of the Microscopy Society of America adn the Microbeam Analysis Society, co-sponsored by the International Metallographic Society
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Jul 29, 2012
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Aug 02, 2012 |
- Light/Optical MultiPhoton IR/Raman Fluorescence Near Field NSOM Scanning Probe SPM STM AFM MFM SEM LVSEM ESEM LEEM TEM HREM STEM SCEM IVEM/HVEM CBED TED EBSD OIM Tomography Holography Lorentz Insitu AEM ELS EDS WDS EMPA AES ESCA SIM SIMS FIM AtomProbe FIB
- The annual meeting of the Microscopy Society of America adn the Microbeam Analysis Society, co-sponsored by the International Metallographic Society
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