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From: R. Cross :      r.cross-at-ru.ac.za
Date: Thu, 1 Mar 2001 08:14:49 +0200
Subject: Re: History of TEM trivia questions

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Dear Wharton

} I have found some references to books on TEM history by Marton (1968)
} and Hawkes (1985) but don't have these on hand.

I have a book that was published at the time of the International
Congress on EM in Kyoto, Japan, in 1986, entitled "History of
Electron Microscopes 1986" edited by Hiroshi Fujita. This gives a
lot of information on the history of EM, mainly from a Japanese
perspective. I haven't seen whether or not this has the answers to
your specific questions but if there is someone near you who has a
copy of this book you will find much interesting information in it.
Please let me know if you cannot get hold of a copy.


Robin H Cross (Mr)
Director : Electron Microscopy Unit
Rhodes University, PO Box 94, Grahamstown, South Africa
tel: +27 46 603 8168/9, fax: +27 46 622 4377
email: r.cross-at-ru.ac.za
http://www.ru.ac.za/emu/index.htm

** remember ICEM-15 in Durban in September 2002 **


From daemon Thu Mar 1 01:09:44 2001



From: Gareth Morgan :      Gareth.Morgan-at-impi.ki.se
Date: Thu, 01 Mar 2001 08:17:33 +0100
Subject: Re: LM: staining particles forensic type application

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Hi

I am not a forensic scientist so my suggestions are general - therefore I
am uncertain how the methods I give could be made robust enough for use in
court. I assume that IPA is isopropyl alcohol?

Starch should be positive with the periodic acid Schiff method (PAS) and
may be 'confirmed' as such by using an amylase control. Starch should also
show 'Maltese Cross' birefringence under polarised light. The cellulose
should also be PAS positive, resist amylase and show 'linear' birefringence.

The protein is a little more difficult to confirm absolutely but if these
are skin cells they will contain cytokeratins - thus giving the possibility
of using immunocytochemistry with a pancytokeratin antibody.

Good luck!

PS Why is an IR/Raman engineer doing forensic work on paper/cells?

At 16:07 2001-02-28 -0800, HAMMOND,LOMA (HP-Corvallis,ex1) wrote:
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Med vänliga hälsningar/With best regards

Gareth

'Coelum non animum mutant qui trans mare currunt'

e-mail Gareth.Morgan-at-impi.ki.se
http://www.ki.se/biomedlab

Tel +46 8 728 3734
Fax +46 8 728 3688

Gareth Morgan MPhil MSc FIBMS,
Institutionen för Mikrobiologi, Patologi och Immunologi(IMPI), H5,
Karolinska Institutet,
Avdelningar för biomedicinsk
laboratorievetenskap och
biomedicinska ämnen,
Lindhagensgatan 92, Box 12773,
S 112 96, Stockholm
Sverige

OBS! Besöksadress: Lindhagensgatan 92
NB! Visiting address:Lindhagensgatan 92


From daemon Thu Mar 1 03:36:46 2001



From: Debby Sherman :      dsherman-at-purdue.edu
Date: Wednesday, February 28, 2001 3:52 PM
Subject: Fwd: SEM of fungus

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Congo red will stain cellulose red, and can also be viewed by
fluorescence using a green (RITC-type) excitation filter. Cellulose
and starch are also birefringent, which you could demonstrate by using
crossed polarizers. A 1/4 wave or 1-wave plate may make this easier to
see. The fluorescence of Cellulose stained with congo red is also
polarized because the CR molecules line up on the oriented cellulose
microfibrils. As has already been mentioned starch and cellulose stain
with periodate-Schiff. If you have access to a fluorescence
microsocope you might also try a fluorescence variant of PAS, by
replacing schiff reagent with Lucifer Yellow CH. View with FITC-type
excitation.

Iodine/potassium iodide will stain starch blue/black.

Chris

----- Original Message -----
} From: "HAMMOND,LOMA (HP-Corvallis,ex1)" {loma_hammond-at-hp.com}
To: "'Microscopy-at-MSA.Microscopy.Com'"
{Microscopy-at-sparc5.microscopy.com}
Sent: Thursday, March 01, 2001 12:07 AM

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Fungal people,
Although vapor fixation works sometimes and immersion fixation also works sometimes, often fungi samples are too delicate to handle with routine techniques. Just immersion in an aqueous solution can damage the structures. Repeated washings also can wash away delicate conidia. CPD causes shrinkage which may not be a major concern with some samples but can be a real problem with delicate ones like fungal hyphae.
Really the very best way to deal with many fungi samples is cryo SEM. True you may have to coat a bit longer than normal, etc. but the structures, when instantly frozen, are most likely to be similar to the living state. Unfortunately many people do not have access to Cryo -SEM equipment so must settle for the next best approach....fixation and drying by one of the methods already mentioned.

Debby

Debby Sherman Phone: 765-494-6666
Life Science Microscopy Facility FAX: 765-494-5896
Purdue University E-mail: dsherman-at-purdue.edu
S-099e Whistler Building
West Lafayette, IN 47907

--------------------------------------


Microlisters,

While the simpler and less time consuming suggestions already mentioned in
this thread may work in some cases, I found out a long time ago that the
only way to deal with the "fungal jungle", eg. fungi cultured on agar
plates, is to hit 'em with the ol' OTO method, preceded by glutaraldehye
fixation. Quick outline is as follows:

Glut. fixation, your favorite buffer
Buffer rinses
Osmium tetroxide, 2%
Water rinses
Thiocarbohydrazide, sat. soln.,filtered
water rinses
Osmium tetroxide, 2%
Water rinses
dehydration series, EtOH, or acetone
CPD
metal coating? Maybe, maybe not. Try without first.

This eliminates the charging, and fixation is quite good.

Classic reference for this method:

"Ligand-mediated osmium binding:Its application in coating biological
specimens for scanning electron microscopy". Kelley, Robert O., A.F. Dekker
and John G. Bluemink. J. Ultrastrucute Research 45:254-258 (1973).

See also:

"Non-coating techniques to render biological specimens conductive/1980
update". Judith A. Murphy. Scanning Electron Microscopy/1980 Vol.I, p.
209-220.


Good luck!

Gib Ahlstrand

-----------------------------------------------------------------
Rad0

You might try exposing your non-aquatic sample (bread molds, mushrooms,
etc. ) to vapors of Osmium tetroxide for several hours ( a few drops of 4%
OsO4 on the lid of a very small container with your sample inside or the
lid over the sample directly), then air dry, mount, coat and view. As with
any sample, the drying artifacts vary with the fungus. Some things look
great.

good luck

Steve
} -----------------------------------------------------------------
} Hello,
}
} Forgive me, I haven't tried to find this on my own yet...
}
} But have any of you used an electron microscope to get a
} close-up of a fungus? Can this be done?
}
} Thanks...



___________________________________________________
Dr. Steven Barlow
EM Facility/Biology Dept.
San Diego State University
5500 Campanile Drive
San Diego CA 92182-4614
phone: (619) 594-4523
fax: (619) 594-5676

--
Gib Ahlstrand
Electron Optical Facility, University of Minnesota, CBS Imaging Center,
35 Snyder Hall, St. Paul, MN. USA. 55108 (612)624-3454
(612)624-1799 FAX, giba-at-puccini.cdl.umn.edu
http://www.cbs.umn.edu/ic/






From daemon Thu Mar 1 08:07:18 2001



From: Bob Bagnell :      rml-at-grayhawk.med.unc.edu
Date: Thu, 1 Mar 2001 09:04:12 -0400
Subject: Phase Contrast Artifacts

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As others have pointed out, phase halo is easily demonstrated.
Shading-off is a different matter, at least for me. Both artifacts are the
result of incomplete segregation of the direct and diffracted light to the
conjugate and complementary areas respectively of the phase plate.
Shading-off is described in "Advanced Light Microscopy" vol. 2 pg. 15-20 by
Maksymilian Pluta. Shading-off appears as a brighter central area becoming
darker toward the edge in positive phase contrast, and just the reverse for
negative phase contrast. Pluta has illustrations of this on pages 18 and
19, but he doesn't say what the object is. It looks like a crystal of some
kind.

My point in bringing this up is to solicit others ideas on how best
to teach students (as well as ourselves) to interpret the phase contrast
image. The phase image has these artifacts superimposed on it. The phase
halo can mislead a novice but actually help an expert. Shading-off is more
subtle in a complex specimen than it is in Pluta's example, and I have
never seriously considered how it affects the phase image. I wonder if
there is a biological sample that clearly shows both artifacts? Any
thoughts and suggestions on this?

Bob

_____________________________________________________________
C. Robert Bagnell Jr., Ph.D., Res.Assoc.Prof.
Microscopy Services Laboratory
Department of Pathology & Laboratory Medicine
CB #7525 UNC-CH, Chapel Hill, N.C. 27599
ph 919-966-2413 fx 919-966-6718
http://www.pathology.med.unc.edu/path/microscopy/welcome.htm




From daemon Thu Mar 1 08:50:20 2001



From: kuznetsv-at-geo.komisc.ru
Date: Thu, 1 Mar 2001 08:48:53 -0600
Subject: Ask-A-Microscopist: Stereo Graphic Projections

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---------------------------------------------------------------------------

Email: kuznetsv-at-geo.komisc.ru
Name: Chuprov Georgy
School: The Institute of Geology
State: Republic of Komi

Question: Please, tell me.
Where I can find a computer program for plot of
stereografic projections of optical axes
(were tested by optical microscop)?

---------------------------------------------------------------------------




From daemon Thu Mar 1 09:32:28 2001



From: Tindall, Randy D. :      TindallR-at-missouri.edu
Date: Thu, 1 Mar 2001 09:28:12 -0600
Subject: TEM: Focusing

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Hi all,

I have one of those very basic "thought" questions on a procedure that I've
always taken for granted, but am now not so sure about. I had been trained
from Day One to always focus a TEM with the beam at crossover, then to
spread the beam until the exposure intensity is reached. The idea seems to
be that small focusing errors at crossover will be corrected as the beam is
spread and "depth of focus" is increased somehow.

The reason I'm asking is that in recent years, almost no one else I've run
across focuses in this way, preferring instead to focus with the beam
already spread to the point at which the photograph will be taken (at least
as long as the image is bright enough to see for focusing). Out of
curiosity, I ran tests using both methods and have noted no clear
differences.

Does anyone have any thoughts on this? Any ideas or theories about why one
method would be superior to the other?

Sincerely,
Curious in Columbia

Randy Tindall
EM Specialist
Electron Microscopy Core Facility
W122 Veterinary Medicine
University of Missouri
Columbia, MO 65211
Tel: (573) 882-8304
Fax: (573) 884-5414
Email: tindallr-at-missouri.edu
Web: http://www.biotech.missouri.edu/emc/





From daemon Thu Mar 1 10:03:21 2001



From: Bruce Ingber :      bingber-at-srrc.ars.usda.gov
Date: Thu, 01 Mar 2001 09:56:05 -0600
Subject: SEM of fungi

Contents Retrieved from Microscopy Listserver Archives
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Dr. Ahlstrand's technique is excellent for imaging hyphal structures and some spore bodies while the stick on method of Dr. Mary Mager works well for certain individual spores. However, imaging of fruiting body structures (conidiophores, etc.) are often best prepared by using Osmium vapor fixation followed simply by air-drying (AD). One can also add minimal solvent exchange before AD, but some structural collapse will be observed in any event. "One size does not fit all" for fungi, sometimes even within one species.

We have a new ESEM now and hopefully combinations of low vacuum technology and various wet modes will improve imaging for our mycologists.


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Microlisters,

While the simpler and less time consuming suggestions already mentioned in
this thread may work in some cases, I found out a long time ago that the
only way to deal with the "fungal jungle", eg. fungi cultured on agar
plates, is to hit 'em with the ol' OTO method, preceded by glutaraldehye
fixation. Quick outline is as follows:

Glut. fixation, your favorite buffer
Buffer rinses
Osmium tetroxide, 2%
Water rinses
Thiocarbohydrazide, sat. soln.,filtered
water rinses
Osmium tetroxide, 2%
Water rinses
dehydration series, EtOH, or acetone
CPD
metal coating? Maybe, maybe not. Try without first.

This eliminates the charging, and fixation is quite good.

Classic reference for this method:

"Ligand-mediated osmium binding:Its application in coating biological
specimens for scanning electron microscopy". Kelley, Robert O., A.F. Dekker
and John G. Bluemink. J. Ultrastructure Research 45:254-258 (1973).

See also:

"Non-coating techniques to render biological specimens conductive/1980
update". Judith A. Murphy. Scanning Electron Microscopy/1980 Vol.I, p.
209-220.


Good luck!

Gib Ahlstrand

-----------------------------------------------------------------
Rad0

You might try exposing your non-aquatic sample (bread molds, mushrooms,
etc. ) to vapors of Osmium tetroxide for several hours ( a few drops of 4%
OsO4 on the lid of a very small container with your sample inside or the
lid over the sample directly), then air dry, mount, coat and view. As with
any sample, the drying artifacts vary with the fungus. Some things look
great.

good luck

Steve
-----------------------------------------------------------------

Dear rad0,
I have looked at fungus and fungus spores on my SEM and they are very simple
to prepare. Just stick them to a stub by sticky tab or glue and then gold
coat. They are very robust and they don't need any fixing or dehydration.

Regards,
Mary

Mary Mager
Electron Microscopist
Metals and Materials Engineering
University of British Columbia
6350 Stores Road
Vancouver, B.C. V6T 1Z4
CANADA
tel: 604-822-5648
e-mail: mager-at-interchg.ubc.ca

} -----------------------------------------------------------------
} Hello,
}
} Forgive me, I haven't tried to find this on my own yet...
}
} But have any of you used an electron microscope to get a
} close-up of a fungus? Can this be done?
}
} Thanks...



___________________________________________________
Dr. Steven Barlow
EM Facility/Biology Dept.
San Diego State University
5500 Campanile Drive
San Diego CA 92182-4614
phone: (619) 594-4523
fax: (619) 594-5676

--
Gib Ahlstrand
Electron Optical Facility, University of Minnesota, CBS Imaging Center,
35 Snyder Hall, St. Paul, MN. USA. 55108 (612)624-3454
(612)624-1799 FAX, giba-at-puccini.cdl.umn.edu
http://www.cbs.umn.edu/ic/


Bruce F. Ingber, Biologist
USDA-ARS, SRRC
1100 Robert E. Lee Blvd.
New Orleans, LA 70124
bingber-at-srrc.ars.usda.gov
504-286-4270 phone
504-286-4419 fax



From daemon Thu Mar 1 10:39:36 2001



From: Ron Doole :      ron.doole-at-materials.oxford.ac.uk
Date: Thu, 1 Mar 2001 16:46:09 +0000 (GMT Standard Time)
Subject: Re: Quantitative stereo TEM (quite long)

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Hi Rod,

You might guess from the lack of response that quantitative
stereoscopy using TEM is not that popular a pastime. I was
involved some 20 years ago and can offer some comments
which were relevant then.

There is a big difference between TEM and SEM stereo
analysis. In SEM images you have a lower surface that can
be seen easily, in TEM images you have a view through both
surfaces and the specimen, the surfaces are very hard to
distinguish. It is relatively easy to calculate the height
from a fixed surface as in a SEM micrograph. Calculating
the height from an 'invisible' surface, as in a TEM
micrograph, is very difficult. It's OK to think of
something like a dislocation running through the specimen
and then assume that it ends at either surface but very few
examples go through from surface to surface and thus are
considerably more difficult.

Height measurements are made from stereo pairs by measuring
the parallax between the two tilted images. Provided the
tilt axis is known and the magnifications corrected, for
any change in focus current, then the height difference
between two points can be calculated. This is a long way
from reconstructing a 3D image.

It is relatively easy to view stereo images using a stereo
viewer but not everyone can do it. You need two eyes of
equal strength and a certain type of brain. From memory the
mapmakers said 50% of the population could see stereo
properly and 10% could make accurate measurements.

There were programs that would allow 2 stereo micrographs
to be placed side by side on a graphics tablet and then the
same points marked on both micrographs. The height
differences between these points were then calculated using
the first pair of points as a reference height. I don't
know if these are still available for modern computers
(they ran on an Apple 11+).

Stereo viewers are available that will project a 'floating'
point of light in the specimen that you can position onto a
feature and then read out the height from a micrometer (it
will need to be scaled to get the real height). We modified
one of these viewers to record and calculate these heights
(and X,Y coordinates) automatically), but it it still a lot
of work to produce even a simple 3D image.

I am not aware of any image recognition program that will
analyse your two images and produce a 3D image from them.
(Well if that doesn't get details sent in nothing will!)

If you want some references then in the mid 70s Hudson and
Makin descibed the how to select the tilt angle taking into
account the film thickness and the final magnification.
Much of the work at that time was being done by Alan Boyde.
I may be more use with references when I get my office back
- contact me off list in a few days if you want 20-25 year
old refences.

Good luck,
Ron


On Wed, 28 Feb 2001 10:03:56 -0700 Rodney McCabe
{rmccabe-at-lanl.gov} wrote:

}
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}
-----------------------------------------------------------------------.
}
} } Dear Colleagues:
} } I am interested in doing quantitative stereo microscopy
using a TEM and am } looking for software that may be
helpful in such an endeavor. I anticipate } the primary
application will be examining the spatial arrangement of
linear } defects. I have not been able to find a software
designed directly for } quantitative stereo TEM. I have
come across one commercial software that } can be used for
SEM surface topography that may be applicable. It seems }
like there must be other software packages out there used
for applications } such as surface mapping, electron
tomography, or even astronomy that could } be useful.
Also, as I am new to stereo microscopy, any words of wisdom
} would be appreciated. }
} Thanks, }
} Rod }
} }

----------------------
Mr. R.C. Doole Department of Materials,
University of Oxford.
Parks Road, Oxford. OX1 3PH. UK.
Phone +44 (0) 1865 273701
Fax +44 (0) 1865 283333
ron.doole-at-materials.ox.ac.uk



From daemon Thu Mar 1 11:12:48 2001



From: Pete Augustus +44 1327 356362 :      pete.augustus-at-marconi.com
Date: Thu, 01 Mar 2001 17:07:55 +0000 (GMT)
Subject: Re: History of TEM trivia - dislocations

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Pete Augustus
Caswell Technology


Hi Listers,

I'm preparing a talk which is to include a timeline giving dates and names
for some relevant TEM developments. I'm trying to find answers to two
trivia questions with great importance to microscopy:

1) Who was the first to knowingly image a dislocation in a TEM, when was it
done and where was it published? On this, I have found references as far
back as an article by Heidenreich in J. Appl. Phys, 1949, but don't have
this journal going back that far.

2) Who developed the solid state detector for energy analysis of x-rays
(EDS), when and where published?

I have found some references to books on TEM history by Marton (1968) and
Hawkes (1985) but don't have these on hand.

Thanks,

Wharton

***********************
Wharton Sinkler
UOP LLC
Des Plaines, IL




From daemon Thu Mar 1 12:05:36 2001



From: Edward J. King :      king-at-biology.utah.edu
Date: Thu, 01 Mar 2001 11:04:37 -0700
Subject: Re: SEM of fungi

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For fragile conidiophores and their associated conidial chains, it is
still possible to use critical point drying after vapor fixation with
OsO4.

A fairly simple dehydration technique that avoids the solution changes
-- and turbulence -- that often lead to loss of the conidia from aerial
conidiophores (and the air drying that often does the same), is
described at Can. J. Microbiol. 29:653-658 (1983).

It's an adaptation of a slick idea published in Naturwissenshaften
17:402-403, for TEM, in 1962(!).

Ed King


From daemon Thu Mar 1 14:33:03 2001



From: Matthew Lynn :      mlynn-at-miami.edu
Date: Thu, 01 Mar 2001 15:30:29 -0500
Subject: RE: Focusing

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I always "heard" to focus the image with the beam in an overfocus condition
(past crossover) for improved beam coherence. I find it difficult to focus at
crossover anyway. Also, I don't think you can accurately assess focus or
astigmatism with the beam at intensities suitable for most photography.
Depends on the magnification and a host of other things, of course, such as
your exposure time. I don't think there's any justification to focus at
exactly the same intensity at which you will photograph. I too await further
enlightenment from the list....

Matt

Matthew J. Lynn
Center for Advanced Microscopy
University of Miami
(305)284-4736
mlynn-at-miami.edu


On Thursday, March 01, 2001 10:28 AM, Tindall, Randy D.
[SMTP:TindallR-at-missouri.edu] wrote:
} ------------------------------------------------------------------------
} The Microscopy ListServer -- Sponsor: The Microscopy Society of America
} To Subscribe/Unsubscribe -- Send Email to ListServer-at-MSA.Microscopy.Com
} On-Line Help http://www.msa.microscopy.com/MicroscopyListserver/FAQ.html
} -----------------------------------------------------------------------.
}
}
} Hi all,
}
} I have one of those very basic "thought" questions on a procedure that I've
} always taken for granted, but am now not so sure about. I had been trained
} from Day One to always focus a TEM with the beam at crossover, then to
} spread the beam until the exposure intensity is reached. The idea seems to
} be that small focusing errors at crossover will be corrected as the beam is
} spread and "depth of focus" is increased somehow.
}
} The reason I'm asking is that in recent years, almost no one else I've run
} across focuses in this way, preferring instead to focus with the beam
} already spread to the point at which the photograph will be taken (at least
} as long as the image is bright enough to see for focusing). Out of
} curiosity, I ran tests using both methods and have noted no clear
} differences.
}
} Does anyone have any thoughts on this? Any ideas or theories about why one
} method would be superior to the other?
}
} Sincerely,
} Curious in Columbia
}
} Randy Tindall
} EM Specialist
} Electron Microscopy Core Facility
} W122 Veterinary Medicine
} University of Missouri
} Columbia, MO 65211
} Tel: (573) 882-8304
} Fax: (573) 884-5414
} Email: tindallr-at-missouri.edu
} Web: http://www.biotech.missouri.edu/emc/
}
}



From daemon Thu Mar 1 15:06:41 2001



From: Lucille A. Giannuzzi :      lag-at-mail.ucf.edu
Date: Thu, 1 Mar 2001 16:03:13 -0500
Subject: position opennings

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*******************************************************************
Lucille A. Giannuzzi, Ph.D.

Associate Professor, Mechanical, Materials, and Aerospace Engineering
Director, UCF/Cirent Materials Characterization Facility
University of Central Florida
12443 Research Parkway, Suite 305
Orlando, FL 32826 email lag-at-mail.ucf.edu phone (407) 882-1500
fax (407) 275-4321
--------------------------------------------------------------------
"Good judgement comes from experience.

Experience comes from making bad judgement."

Mark Twain
********************************************************************




From daemon Thu Mar 1 17:04:56 2001



From: William P. Sharp :      wsharp-at-asu.edu
Date: Thu, 01 Mar 2001 15:59:52 -0700
Subject: Focusing

Contents Retrieved from Microscopy Listserver Archives
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I have focused at a higher beam intensity than I use for exposing the
micrograph for many years, and, in fact continue to do so on our Philips
EM201. When we got a new Philips TwinLens CM12S in December of 1988, we
started to have problems with slightly out of focus micrographs across the
board - all experienced biological microscopists - about 10-12 of us - had
the same problem. Philips, to their credit, tried repeatedly to find and
solve the problem. They sent high level engineers, applications experts,
attached a high mag TV camera, changed all of the high tension cabling,
insulator, wehnelt, column liner, etc. over the course of nearly a year.
Towards the end of 1989, in desperation and because the biological TEM
applications experts were all busy, a materials science applications
engineer came to the lab and made beautiful, perfectly focused micrographs.
We could not duplicate his performance. Finally, he asked to watch one of
our most experienced and well published microscopists work. When the
Professor increased beam intensity to focus and stigmate, the applications
engineer went ballistic! he maintained that the focus MUST be done at the
intensity at which the micrograph is made. We did argue, but also agreed to
test the hypothesis. He was, of course, correct (IN THIS PARTICULAR CASE).
As we later found out, changing the C2 lens current also has a subtle
effect on the objective lens current, changing focus enough to cause
problems. Our service engineer was later able to demonstrate the effect
(although it doesn't show up when monitoring the lens current page) and
this strange phenomenon was written off to a design compromise which,
apparently, physicists and materials scientists are used to and expect, but
which biologists and cell biologists had never heard of. Something to do
with short focal length objective lenses, low contrast which makes focusing
more difficult, and compromises required to allow STEM and TEM to co-exist
in the same column and be switched back and forth with a minimum of
re-alignment. Anyone else have this experience??
William P. Sharp
Arizona State University
Dept. Plant Biology, box 871601
Tempe, AZ 85287-1601
Phone - (480)-965-3210
Fax - (480)-965-6899



From daemon Thu Mar 1 18:54:11 2001



From: Sergey Ryazantsev :      sryazant-at-ucla.edu
Date: Thu, 01 Mar 2001 16:53:17 -0800
Subject: RE: Focusing

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


I spread the beam as much as possible in order to be able to see the
changes during the focusing (usually the intensity is less than necessary
to make a photograph, so, I have to condense the beam a little bit for
photographing). I am using "three-chick" technique: rotating focus-control
knob in both directions to find the position when you will clearly see the
transition: "owerfocus-infocus-underfocus" on the background's
granules. This technique works for me from x40K and up. At the lower
magnification, I am using wobbler to focus (there is a "blind spot" at
x30-40K). The "three-chick" technique is a good test how your instrument is
aligned. The number of "clicks" depends from current setup and model of
coarse. I simply could not focus correctly if the beam is condensed too much.

Sergey

At 03:30 PM 3/1/01 -0500, you wrote:
} ------------------------------------------------------------------------
} The Microscopy ListServer -- Sponsor: The Microscopy Society of America

_____________________________________

Sergey Ryazantsev Ph. D.
Electron Microscopy
UCLA School of Medicine
Department of Biological Chemistry
Box 951737
Los Angeles, CA 90095-1737

Phone: (310) 825-1144
Pager: (310) 845-0248
FAX (departmental): (310) 206-5272
mailto:sryazant-at-ucla.edu





From daemon Thu Mar 1 20:46:34 2001



From: Tindall, Randy D. :      TindallR-at-missouri.edu
Date: Thu, 1 Mar 2001 20:41:43 -0600
Subject: Re: Focusing

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Hi again,

Well, I got my answer----right from one of the people who initially trained
me back in the '80's (and, in fact, is responsible for me being in the field
in the first place----that'll teach him).

Here is John Bozzola's reply to my post on focusing TEM's at beam crossover
versus a defocused beam: "(T)his is a holdover from (our Hitachi) HU11A when
illumination was a problem at the higher mags and when no focus wobbler was
available for low mag work. On the other hand, it still DOES work for
individuals who have diminishing eyesight and need the extra illumination
and minimal depth of field. Unfortunately, it greatly increases the
possibility of specimen damage and should be used only on hardy specimens.

"The bottom line is that if you have normal (or acute) vision, you won't
need to do this in modern TEMs. Of course, I sometimes still "check" my
focus by doing this..... old habit, I guess."

Now this is very interesting to me, because the first TEM I ever used was
the Hitachi HU11AB. I was trained to focus carefully at crossover, then
defocus until the proper exposure intensity was reached. Somehow over the
years, I ended up with the notion that there was a property of electron
"optics" that made this the preferred method of focusing because it
minimized focusing errors by increasing the depth of focus. I really don't
recall where this notion came from, but I trained dozens of students and
others in this way of focusing. Now I wonder how many others were trained
by them to do the same thing and will be just as stubborn about it as I have
been.

Probably not much harm done, really, but this reminds me of one of my
favorite stories about a woman cooking a ham for a family reunion picnic.
Her daughter watched her mother cut off the end of the ham before putting it
in a pan in the oven, and she asked why she did that. Her mother responded
that that's how she was taught by HER mother, but she didn't really know
why. She became curious, and at the reunion she asked her mother why she
had always cut the ends off hams before cooking them. The response was that
she had also been taught that way by her mother. Both curious now, they
hunted up Great-grandmother at the picnic and asked her why she had cooked
hams with the ends cut off. Great-grandmother answered, "I only had one pan
and it was too short for the ham."

Lesson learned. Again.

Cheers,
Randy

Randy Tindall
Electron Microscopy Core
University of Missouri




From daemon Thu Mar 1 21:20:51 2001



From: Sinkler, Wharton :      WSinkler-at-uop.com
Date: Thu, 1 Mar 2001 15:30:22 -0600
Subject: RE: Focusing

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html



In terms of contrast transfer theory (i.e. when linear imaging allows
approximating the imaging process as convolution with a point spread
function), the lens transfer functon doesn't depend on convergence. So for
example you shouldn't effect the defocus of the image by slight changes of
the illumination convergence.

However, the convergence imposes a damping on the total contrast transfer,
which gets more severe when convergence is greater. For details on this
'spatial coherence envelope' see any text on HREM. Because of this, the
image quality will improve if you record with a less condensed beam (better
coherence).

With a field emission gun, you won't be able to image at crossover, because
the source will almost certainly be too small - these guns give the most
coherent illumination available.

For a thermionic gun, the limiting factor will be: if the convergence is too
great at crossover, you won't see much because everything will be blurred
out by the coherence limitation of the incident irradiation. If this is the
case, you should either change condenser apertures to decrease convergence
(then you can focus, and/or stigmate at crossover), or spread the beam to
improve coherence.

As far as I can see, there is no reason why one should or should not adjust
or even record images at crossover (except that if the filament is a bit
undersaturated, you will get uneven illumination). Getting the best
possible coherence is important, but it doesn't really matter how one
achieves this optically. Decreasing intensity is therefore good, to the
extent that sample drift doesn't become too much a limiting factor.

Overfocusing the illumination rather than underfocusing is better, I would
say (based on experience). I'm not sure why - perhaps some of the energy
spread gets filtered out more effectively - at any rate for the same size
beam one has more intensity underfocused than overfocused, so something is
being cut out by overfocusing.

Wharton


} -----Original Message-----
} From: Matthew Lynn [SMTP:mlynn-at-miami.edu]
} Sent: Thursday, March 01, 2001 2:30 PM
} To: 'Microscopy-at-MSA.Microscopy.com'
} Subject: RE: Focusing
}
} ------------------------------------------------------------------------
} The Microscopy ListServer -- Sponsor: The Microscopy Society of America
} To Subscribe/Unsubscribe -- Send Email to ListServer-at-MSA.Microscopy.Com
} On-Line Help http://www.msa.microscopy.com/MicroscopyListserver/FAQ.html
} -----------------------------------------------------------------------.
}
}
} I always "heard" to focus the image with the beam in an overfocus
} condition
} (past crossover) for improved beam coherence. I find it difficult to
} focus at
} crossover anyway. Also, I don't think you can accurately assess focus or
} astigmatism with the beam at intensities suitable for most photography.
} Depends on the magnification and a host of other things, of course, such
} as
} your exposure time. I don't think there's any justification to focus at
} exactly the same intensity at which you will photograph. I too await
} further
} enlightenment from the list....
}
} Matt
}
} Matthew J. Lynn
} Center for Advanced Microscopy
} University of Miami
} (305)284-4736
} mlynn-at-miami.edu
}
}
} On Thursday, March 01, 2001 10:28 AM, Tindall, Randy D.
} [SMTP:TindallR-at-missouri.edu] wrote:
} } ------------------------------------------------------------------------
} } The Microscopy ListServer -- Sponsor: The Microscopy Society of America
} } To Subscribe/Unsubscribe -- Send Email to ListServer-at-MSA.Microscopy.Com
} } On-Line Help http://www.msa.microscopy.com/MicroscopyListserver/FAQ.html
} } -----------------------------------------------------------------------.
} }
} }
} } Hi all,
} }
} } I have one of those very basic "thought" questions on a procedure that
} I've
} } always taken for granted, but am now not so sure about. I had been
} trained
} } from Day One to always focus a TEM with the beam at crossover, then to
} } spread the beam until the exposure intensity is reached. The idea seems
} to
} } be that small focusing errors at crossover will be corrected as the beam
} is
} } spread and "depth of focus" is increased somehow.
} }
} } The reason I'm asking is that in recent years, almost no one else I've
} run
} } across focuses in this way, preferring instead to focus with the beam
} } already spread to the point at which the photograph will be taken (at
} least
} } as long as the image is bright enough to see for focusing). Out of
} } curiosity, I ran tests using both methods and have noted no clear
} } differences.
} }
} } Does anyone have any thoughts on this? Any ideas or theories about why
} one
} } method would be superior to the other?
} }
} } Sincerely,
} } Curious in Columbia
} }
} } Randy Tindall
} } EM Specialist
} } Electron Microscopy Core Facility
} } W122 Veterinary Medicine
} } University of Missouri
} } Columbia, MO 65211
} } Tel: (573) 882-8304
} } Fax: (573) 884-5414
} } Email: tindallr-at-missouri.edu
} } Web: http://www.biotech.missouri.edu/emc/
} }
} }
}


From daemon Fri Mar 2 00:36:08 2001



From: Dr Malcolm Roberts :      m.roberts-at-ru.ac.za
Date: Fri, 02 Mar 2001 08:28:51 +0200
Subject: Strain exsolution in Cu wire

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


We're analysing Cu wire here for purposes better known to ourselves. We
are noticing, but not able to image interesting variations in the
concentration of impurities, which suggests to us, either that the
original material was inhomogeneous, or that drawing the wire has caused
some kind of exsolution process. Have any of you encountered smilar
things in metals? Refs?
Malc.

--
Dr MP Roberts Phone: [+27](0)46 603 8313
Dept of Geology Fax: [+27](0)46 622 9715
Rhodes University Cell: 083 4060 262 (usually off)
6140 Grahamstown e-mail: m.roberts-at-ru.ac.za
SOUTH AFRICA




From daemon Fri Mar 2 03:14:02 2001



From: Ron Doole :      ron.doole-at-materials.oxford.ac.uk
Date: Fri, 2 Mar 2001 08:54:18 +0000 (GMT Standard Time)
Subject: Re: RE: Focusing

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Hi Matt and Wharton,

To add to Wharton's explanation the reason overfocus is
better than underfocus is that he has a strong objective lens
(as most are these days). Many years ago underfocus would
have been better.

What we are trying to achieve is parallel illumination not
convergent (or divergent). Modern TEMs have strong objective
lenses and use the prefield (field above the specimen) as
part of their probe forming optics thus if there is a
crossover above the specimen (overfocus)the prefield
converges the diverging rays from this to form a parallel
probe. In underfocus conditions the crossover is below the
specimen and the probe on the specimen is made more
convergent by the objective lens prefield.

If you have a Lorentz (low field for magnetic work) pole
piece or an old instrument (pre 1970ish) the objective lens
is weak and does not have this prefield effect so
underfocus is more parallel.

Regards,
Ron

On Thu, 1 Mar 2001 15:30:22 -0600 "Sinkler, Wharton"
{WSinkler-at-uop.com} wrote:

} ------------------------------------------------------------------------
} The Microscopy ListServer -- Sponsor: The Microscopy Society of America
} To Subscribe/Unsubscribe -- Send Email to ListServer-at-MSA.Microscopy.Com
} On-Line Help http://www.msa.microscopy.com/MicroscopyListserver/FAQ.html
} -----------------------------------------------------------------------.
}
}
}
} In terms of contrast transfer theory (i.e. when linear imaging allows
} approximating the imaging process as convolution with a point spread
} function), the lens transfer functon doesn't depend on convergence. So for
} example you shouldn't effect the defocus of the image by slight changes of
} the illumination convergence.
}
} However, the convergence imposes a damping on the total contrast transfer,
} which gets more severe when convergence is greater. For details on this
} 'spatial coherence envelope' see any text on HREM. Because of this, the
} image quality will improve if you record with a less condensed beam (better
} coherence).
}
} With a field emission gun, you won't be able to image at crossover, because
} the source will almost certainly be too small - these guns give the most
} coherent illumination available.
}
} For a thermionic gun, the limiting factor will be: if the convergence is too
} great at crossover, you won't see much because everything will be blurred
} out by the coherence limitation of the incident irradiation. If this is the
} case, you should either change condenser apertures to decrease convergence
} (then you can focus, and/or stigmate at crossover), or spread the beam to
} improve coherence.
}
} As far as I can see, there is no reason why one should or should not adjust
} or even record images at crossover (except that if the filament is a bit
} undersaturated, you will get uneven illumination). Getting the best
} possible coherence is important, but it doesn't really matter how one
} achieves this optically. Decreasing intensity is therefore good, to the
} extent that sample drift doesn't become too much a limiting factor.
}
} Overfocusing the illumination rather than underfocusing is better, I would
} say (based on experience). I'm not sure why - perhaps some of the energy
} spread gets filtered out more effectively - at any rate for the same size
} beam one has more intensity underfocused than overfocused, so something is
} being cut out by overfocusing.
}
} Wharton
}
}
} } -----Original Message-----
} } From: Matthew Lynn [SMTP:mlynn-at-miami.edu]
} } Sent: Thursday, March 01, 2001 2:30 PM
} } To: 'Microscopy-at-MSA.Microscopy.com'
} } Subject: RE: Focusing
} }
} } ------------------------------------------------------------------------
} } The Microscopy ListServer -- Sponsor: The Microscopy Society of America
} } To Subscribe/Unsubscribe -- Send Email to ListServer-at-MSA.Microscopy.Com
} } On-Line Help http://www.msa.microscopy.com/MicroscopyListserver/FAQ.html
} } -----------------------------------------------------------------------.
} }
} }
} } I always "heard" to focus the image with the beam in an overfocus
} } condition
} } (past crossover) for improved beam coherence. I find it difficult to
} } focus at
} } crossover anyway. Also, I don't think you can accurately assess focus or
} } astigmatism with the beam at intensities suitable for most photography.
} } Depends on the magnification and a host of other things, of course, such
} } as
} } your exposure time. I don't think there's any justification to focus at
} } exactly the same intensity at which you will photograph. I too await
} } further
} } enlightenment from the list....
} }
} } Matt
} }
} } Matthew J. Lynn
} } Center for Advanced Microscopy
} } University of Miami
} } (305)284-4736
} } mlynn-at-miami.edu
} }
} }
} } On Thursday, March 01, 2001 10:28 AM, Tindall, Randy D.
} } [SMTP:TindallR-at-missouri.edu] wrote:
} } } ------------------------------------------------------------------------
} } } The Microscopy ListServer -- Sponsor: The Microscopy Society of America
} } } To Subscribe/Unsubscribe -- Send Email to ListServer-at-MSA.Microscopy.Com
} } } On-Line Help http://www.msa.microscopy.com/MicroscopyListserver/FAQ.html
} } } -----------------------------------------------------------------------.
} } }
} } }
} } } Hi all,
} } }
} } } I have one of those very basic "thought" questions on a procedure that
} } I've
} } } always taken for granted, but am now not so sure about. I had been
} } trained
} } } from Day One to always focus a TEM with the beam at crossover, then to
} } } spread the beam until the exposure intensity is reached. The idea seems
} } to
} } } be that small focusing errors at crossover will be corrected as the beam
} } is
} } } spread and "depth of focus" is increased somehow.
} } }
} } } The reason I'm asking is that in recent years, almost no one else I've
} } run
} } } across focuses in this way, preferring instead to focus with the beam
} } } already spread to the point at which the photograph will be taken (at
} } least
} } } as long as the image is bright enough to see for focusing). Out of
} } } curiosity, I ran tests using both methods and have noted no clear
} } } differences.
} } }
} } } Does anyone have any thoughts on this? Any ideas or theories about why
} } one
} } } method would be superior to the other?
} } }
} } } Sincerely,
} } } Curious in Columbia
} } }
} } } Randy Tindall
} } } EM Specialist
} } } Electron Microscopy Core Facility
} } } W122 Veterinary Medicine
} } } University of Missouri
} } } Columbia, MO 65211
} } } Tel: (573) 882-8304
} } } Fax: (573) 884-5414
} } } Email: tindallr-at-missouri.edu
} } } Web: http://www.biotech.missouri.edu/emc/
} } }
} } }
} }
}

----------------------
Mr. R.C. Doole
Department of Materials,
University of Oxford.
Parks Road, Oxford. OX1 3PH. UK.
Phone +44 (0) 1865 273701
Fax +44 (0) 1865 283333
ron.doole-at-materials.ox.ac.uk



From daemon Fri Mar 2 05:58:34 2001



From: Dmitry Cherny :      dtcherny-at-mpc186.mpibpc.gwdg.de
Date: Fri, 02 Mar 2001 12:52:33 +0100
Subject: Nanoscope III is needed

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Dear All,

we are looking for a working Nanoscope III (III or IIIa) controller
together with the PC boards (Digital Instruments, Santa Barbara, USA). If
somebody is going to clean out its lab please contact us directly by phone,
fax or e.mail



With best regards,

Dr. Dmitry Cherny, PhD, Dr.Sc.

MPI for Biophysical Chemistry, Dept. of Molecular Biology
am Fassberg 11, D-37077 Gottingen, Germany
tel: +49(0) 551 201 1383; fax: +49(0) 551 201 1467
e.mail: dtcherny-at-mpc186.mpibpc.gwdg.de




From daemon Fri Mar 2 07:24:10 2001



From: marian miller :      millermn-at-email.uc.edu
Date: Fri, 02 Mar 2001 08:18:35 -0500
Subject: hydronephrosis

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


does anyone have any suggestions on how to assess hydronephrosis with
paraffin sections of kidney using a quantitative technique. equipment
we currently use for other tissues include microscope, spot camera,
digitizing tablet, camera lucida, SigmaScan, and image processing
software plugins for adobe photoshop,


thanks so much, marian miller



From daemon Fri Mar 2 09:56:20 2001



From: FARNHAM, WARREN H :      WHFARN-at-solutia.com
Date: Fri, 2 Mar 2001 10:39:00 -0500
Subject: AFM Capabilities

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


I have several questions for an AFM microscopist;

1. Can AFM really measure surface modulus?

2. If yes, what is the mode of operation or measurement?

3. Is it a quantitative measurement? Is it an absolute measurement
or a relative measurement?

4. Can the results be correlated to the (bulk) modulus measured by
rheometer?

Regard;
Warren


From daemon Fri Mar 2 10:01:07 2001



From: Arrowood, Roy :      arrowood-at-utep.edu
Date: Fri, 2 Mar 2001 08:59:05 -0700
Subject: Reply: strain exsolution in copper wire

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Nonuniform distribution of impurities in metal wires is not uncommon. There
may be a core-to-surface variation, which may be caused by contamination (or
de-contamination) of the surface layer during drawing or annealing .
Variations in impurity concentration may also relate to original
inhomogeneity in the billet prior to drawing. Segregation of impurities to
dislocation-rich deformed areas is also a possibility.

What are the impurity elements that you are seeing? How are the
concentration variations distributed spatially? (Radial gradients,
irregular patches smaller than wire diameter or larger than wire diameter,
wire bends vs. straight segments, or what?)

-------Roy
====================================
Roy Arrowood, Associate Professor
Metallurgical and Materials Engineering
UTEP, El Paso, TX 79968-0520
(915)747-6934
arrowood-at-utep.edu



From daemon Fri Mar 2 10:05:05 2001



From: Mike Bode :      mb-at-Soft-Imaging.com
Date: Fri, 2 Mar 2001 08:56:34 -0700
Subject: RE: Focusing

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


} From a practical standpoint, wouldn't it be best to focus using the same
conditions that are later used for taking the images, unless there are
intensity or other issues that prevent that?

A few years back, when I was doing hi-res TEM, we would carefully set the
conditions on the TV screen, then turn off the room fan, move away from the
column, hold our breath and take a picture.

However, this may have been peculiar to hi-res materials work, where even
tiny changes in focus can have dramatic effects.

Michael

Michael Bode, Ph.D.
Soft Imaging System Corp.
1675 Carr St., #105N
Lakewood, CO 80215
===================================
phone: (888) FIND SIS
(303) 234-9270
fax: (303) 234-9271
email: mailto:info-at-soft-imaging.com
web: http://www.soft-imaging.com
===================================



-----Original Message-----
} From: Sinkler, Wharton [mailto:WSinkler-at-uop.com]
Sent: Thursday, March 01, 2001 2:30 PM
To: 'mlynn-at-miami.edu'; 'Microscopy-at-MSA.Microscopy.com'



In terms of contrast transfer theory (i.e. when linear imaging allows
approximating the imaging process as convolution with a point spread
function), the lens transfer functon doesn't depend on convergence. So for
example you shouldn't effect the defocus of the image by slight changes of
the illumination convergence.

However, the convergence imposes a damping on the total contrast transfer,
which gets more severe when convergence is greater. For details on this
'spatial coherence envelope' see any text on HREM. Because of this, the
image quality will improve if you record with a less condensed beam (better
coherence).

With a field emission gun, you won't be able to image at crossover, because
the source will almost certainly be too small - these guns give the most
coherent illumination available.

For a thermionic gun, the limiting factor will be: if the convergence is too
great at crossover, you won't see much because everything will be blurred
out by the coherence limitation of the incident irradiation. If this is the
case, you should either change condenser apertures to decrease convergence
(then you can focus, and/or stigmate at crossover), or spread the beam to
improve coherence.

As far as I can see, there is no reason why one should or should not adjust
or even record images at crossover (except that if the filament is a bit
undersaturated, you will get uneven illumination). Getting the best
possible coherence is important, but it doesn't really matter how one
achieves this optically. Decreasing intensity is therefore good, to the
extent that sample drift doesn't become too much a limiting factor.

Overfocusing the illumination rather than underfocusing is better, I would
say (based on experience). I'm not sure why - perhaps some of the energy
spread gets filtered out more effectively - at any rate for the same size
beam one has more intensity underfocused than overfocused, so something is
being cut out by overfocusing.

Wharton


} -----Original Message-----
} From: Matthew Lynn [SMTP:mlynn-at-miami.edu]
} Sent: Thursday, March 01, 2001 2:30 PM
} To: 'Microscopy-at-MSA.Microscopy.com'
} Subject: RE: Focusing
}
} ------------------------------------------------------------------------
} The Microscopy ListServer -- Sponsor: The Microscopy Society of America
} To Subscribe/Unsubscribe -- Send Email to ListServer-at-MSA.Microscopy.Com
} On-Line Help http://www.msa.microscopy.com/MicroscopyListserver/FAQ.html
} -----------------------------------------------------------------------.
}
}
} I always "heard" to focus the image with the beam in an overfocus
} condition
} (past crossover) for improved beam coherence. I find it difficult to
} focus at
} crossover anyway. Also, I don't think you can accurately assess focus or
} astigmatism with the beam at intensities suitable for most photography.
} Depends on the magnification and a host of other things, of course, such
} as
} your exposure time. I don't think there's any justification to focus at
} exactly the same intensity at which you will photograph. I too await
} further
} enlightenment from the list....
}
} Matt
}
} Matthew J. Lynn
} Center for Advanced Microscopy
} University of Miami
} (305)284-4736
} mlynn-at-miami.edu
}
}
} On Thursday, March 01, 2001 10:28 AM, Tindall, Randy D.
} [SMTP:TindallR-at-missouri.edu] wrote:
} } ------------------------------------------------------------------------
} } The Microscopy ListServer -- Sponsor: The Microscopy Society of America
} } To Subscribe/Unsubscribe -- Send Email to ListServer-at-MSA.Microscopy.Com
} } On-Line Help http://www.msa.microscopy.com/MicroscopyListserver/FAQ.html
} } -----------------------------------------------------------------------.
} }
} }
} } Hi all,
} }
} } I have one of those very basic "thought" questions on a procedure that
} I've
} } always taken for granted, but am now not so sure about. I had been
} trained
} } from Day One to always focus a TEM with the beam at crossover, then to
} } spread the beam until the exposure intensity is reached. The idea seems
} to
} } be that small focusing errors at crossover will be corrected as the beam
} is
} } spread and "depth of focus" is increased somehow.
} }
} } The reason I'm asking is that in recent years, almost no one else I've
} run
} } across focuses in this way, preferring instead to focus with the beam
} } already spread to the point at which the photograph will be taken (at
} least
} } as long as the image is bright enough to see for focusing). Out of
} } curiosity, I ran tests using both methods and have noted no clear
} } differences.
} }
} } Does anyone have any thoughts on this? Any ideas or theories about why
} one
} } method would be superior to the other?
} }
} } Sincerely,
} } Curious in Columbia
} }
} } Randy Tindall
} } EM Specialist
} } Electron Microscopy Core Facility
} } W122 Veterinary Medicine
} } University of Missouri
} } Columbia, MO 65211
} } Tel: (573) 882-8304
} } Fax: (573) 884-5414
} } Email: tindallr-at-missouri.edu
} } Web: http://www.biotech.missouri.edu/emc/
} }
} }
}


From daemon Fri Mar 2 10:38:47 2001



From: E.M.M. Manders :      e.manders-at-chem.uva.nl
Date: Fri, 02 Mar 2001 16:28:13 +0100
Subject: Final PROGRAM Focus on Microscopy 2001, Amsterdam, April 1-4

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html



***************************************************
PROGAM: FOCUS ON MICROSCOPY 2001
***************************************************

Dear colleagues,

The program of the conference "Focus on Microscopy 2001", April 1 - 4,
2001, Amsterdam, has been finalised and can be found on our Web-site

www.focusonmicroscopy.org

This conference is the 14th in a successful series of interdisciplinary
meetings on 3D acquisition and 3D image processing and forms an effective
meeting point for both developers and users of 3D-microscopy. The more than
120 contributions this year range from new developments in Coherent
Anti-Stokes Raman Microscopy (CARS) and multi-photon excitation to the
application of such techniques in biology, medicine and material sciences.
This year "3D Microscopy of living cells and tissues" will receive special
attention, which reflects the growing number of researchers that use
GFP-techniques and life-cell imaging for their experiments.

A substantial instrument exposition including the main manufacturers in the
field will accompany the conference.

Please, visit our web site http://www.focusonmicroscopy.org for further
details concerning the program and the conference.

Looking forward to seeing you in 1st of April in Amsterdam, on behalf of
the program committee,

Erik Manders and G.J. Brakenhoff


Conference Office:
------------------
Mrs M.P.A. Beunk-Timmers
Nicolaes Tulp Institute
PO-Box 23213
1100 DS Amsterdam
The Netherlands
Fax: +31-(0)20-6963228
Phone +31-(0)20-5668585
Web: http://www.FocusOnMicroscopy.org
E-mail: info-at-FocusOnMicroscopy.org





---------------
Erik Manders
Swammerdam Institute for Life Sciences
Faculty of Science, University of Amsterdam

Visit: Kruislaan 316, Building III, room 2.07, Amsterdam, The Netherlands
Plantage Muidergracht 12, 4th floor, Amsterdam, The Netherlands
Mail: Kruislaan 316
1098 SM AMSTERDAM
The Netherlands
E-mail: e.manders-at-chem.uva.nl
Tel: +31-(0)20-5256225 (5257702)(5255136)
Fax: +31-(0)20-5256271
Web: http://wwwmc.bio.uva.nl/
http://www.FocusOnMicroscopy.org/
---------------



From daemon Fri Mar 2 10:47:46 2001



From: Marta Taules :      mtaules-at-medicina.ub.es
Date: Fri, 02 Mar 2001 17:50:50 +0100
Subject: LR White and gangliosides detection

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Dear microscopists,

We are working with embbeded cells in LR White with and without osmium.
(Polimerization was acomplished at 60ºC). Our purpose is to detect
gangliosides (GD3). Do you have any suggestion?

Thanks a lot


Marta Taulés
Universitat de Barcelona
SCT





From daemon Fri Mar 2 11:22:54 2001



From: Marie E. Cantino :      cantino-at-uconnvm.uconn.edu
Date: Fri, 2 Mar 2001 12:20:17 -0500
Subject: Re: Focusing

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


I also was told early on in my career that one should focus at the
magnification the picture was to be taken at, though I find it difficult to
do this in practice because the illumination is often too low. I usually
compromise and focus with as little illumination as I can get away with.

I wonder whether the reason for the change in focus is not due to changes
in the illumination, but changes in the specimen position. At different
beam densities the degree of specimen charging may vary, thereby changing
the position of the specimen in the lens field. This might explain why
some microscopes are less sensitive to the specimen current density than
others. Certainly the amount of specimen charging seems to be affected by
the objective aperture, for example.

Marie


Dr. Marie E. Cantino
Dept. of Physiology and Neurobiology, U-2131
University of Connecticut
Storrs, CT 06269-2131
Phone: 860-486-3588
Fax: 860-486-6369




From daemon Fri Mar 2 12:03:50 2001



From: Roger Moretz :      rcmoretz-at-excite.com
Date: Fri, 2 Mar 2001 10:00:15 -0800 (PST)
Subject: Re: TEM processing/formalin fixed tissue

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Peggy:
I don't know if you received any responses off-line, and I hope that Ronald
Austin was able to provide you with a protocol for his microwave procedure
(actually, if you have one available Ronald, I'd like a copy, please). Your
question is most appropriate because that is what I am (frantically) in the
midst of doing. Altho' "frantic" applies only to the deadline.... Sans a
microwave procedure, I am doing the old time-tested methods. The only thing
I make sure of is the buffer used to transfer the tissue from formalin. I
add 6% sucrose to the buffers and carry that through until I get into
osmium. Loss of membranes occurs in the formalin, and if you add the 6%
sucrose it seems to help retain membranes in the final EM sample.

Roger Moretz, Ph.D.
Dept of Toxicology
Boehringer Ingelheim Pharmaceuticals, Inc.


On 26 Feb 2001 15:06:20 -0500 (EST),
"HARGER-ALLEN.MARGARET_J-at-INDIANAPOLIS.VA.GOV"-at-sparc5.microscopy.com wrote:

| ------------------------------------------------------------------------
| The Microscopy ListServer -- Sponsor: The Microscopy Society of America
| To Subscribe/Unsubscribe -- Send Email to ListServer-at-MSA.Microscopy.Com
| On-Line Help http://www.msa.microscopy.com/MicroscopyListserver/FAQ.html
| -----------------------------------------------------------------------.
|
|
| Pathology lab. listers: are there any new/and/or superior techniques
| for processing previously formalin fixed tissue for TEM?
| Thanks, Peggy Harger-Allen
| |TAB|email:harger-allen-at-indianapolis.va.gov
|


Roger Moretz, Ph.D.
Dept of Toxicology
Boehringer Ingelheim Pharmaceuticals, Inc.
900 Rigdebury Road
Ridgefield, CT 06877
203-798-5448





_______________________________________________________
Send a cool gift with your E-Card
http://www.bluemountain.com/giftcenter/




From daemon Fri Mar 2 13:45:25 2001



From: pjp6 :      pjp6-at-dana.ucc.nau.edu
Date: Fri, 02 Mar 2001 12:39:46 -0700
Subject: TEM prep for fecal pellets of Hydrobiid snail

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


The pellets are from a hydrobiid snail found in highly mineralized warm desert
springs and Posos in Mexico. I am interested primarily in the bacteria found
on
and in them but would also like to be able to inventory the entire contents of
the pellets to help get a better picture of what part they play in their
isolated ecosystem. I've done some light and SEM on samples but need to get
inside to determine if the bacteria that break them down are carried
internally or are picked up environmentally from the water. For sample
preparation and sectioning I need to consider other contents like diatoms and
stromatolite pieces and the high concentration of mineral solids in the
samples. To start I plan to fix with glut/OsO4, dehydrate with acetone,
infiltrate with propylene oxide and go into embed 812. After sections are
imaged for non organic I planned on staining with lead citrate and comparing.
Being new to TEM and not having a good idea of the precise osmolarity of the
sample has left me puzzling over buffer selection (sodium cacodylate vs.
phosphate), concentration, and times. We have an excellent EM technician here
at NAU but it seems more my responsibility to make these determinations so any
suggestions or references you could offer would be greatly appreciated.
Thanks
Pete Polsgrove
Northern Arizona University
pjp6-at-dana.nau.edu




From daemon Fri Mar 2 15:38:12 2001



From: Leonardo Lagoeiro :      lagoeiro-at-degeo.ufop.br
Date: Fri, 2 Mar 2001 18:35:22 -0300
Subject: Nikon CoolPix 990

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Dear All,

we have just bought a Nikon CoolPix 990. It is an outstanding camera.
One thing that we are disapointed it is a focusing problem when
taking picture in Microscope. For any zoom setting and even in a
manual mode, the micrograph borders always get out of focus, and in
some situation with a Chromatic aberration.
Does anyone have any idea how to eliminate this problem? The camera
came with all necessary accessories for mounting in a microscope,
e.g., c-mount, and MDC relay lens and remote cable.


Best regards,

Leonardo
--
---
Leonardo Lagoeiro
Departamento de Geologia
Universidade Federal de Ouro Preto
Ouro Preto, MG, 35400-000
Brazil
E-mai: lagoeiro-at-degeo.ufop.br


From daemon Fri Mar 2 23:24:38 2001



From: Gary Gaugler :      gary-at-gaugler.com
Date: Fri, 02 Mar 2001 21:20:20 -0800
Subject: Re: Nikon CoolPix 990

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


The CoolPix 990 is indeed a nice camera. Unfortunately, it is
not ideal for microscopy. It will work in this type of application
but the results are mixed and the effort can be great.

If you zoom out to infinity, you should get best results. The
key problem I have found is obtaining consistent exposure
values. Preview with the puck looks good but the captured
image is over exposed. Trying the best of five sometimes
helps. But i have relegated the 990 to travel and snapshots.
I don't think that it is ready from prime time microscopy.
YMMV.

gary g.

http://photoweb.net



At 01:35 PM 3/2/01, you wrote:

} Dear All,
}
} we have just bought a Nikon CoolPix 990. It is an outstanding camera. One
} thing that we are disapointed it is a focusing problem when taking picture
} in Microscope. For any zoom setting and even in a manual mode, the
} micrograph borders always get out of focus, and in some situation with a
} Chromatic aberration.
} Does anyone have any idea how to eliminate this problem? The camera came
} with all necessary accessories for mounting in a microscope, e.g.,
} c-mount, and MDC relay lens and remote cable.
}
}
} Best regards,
}
} Leonardo
} --
} ---
} Leonardo Lagoeiro
} Departamento de Geologia
} Universidade Federal de Ouro Preto
} Ouro Preto, MG, 35400-000
} Brazil
} E-mai: lagoeiro-at-degeo.ufop.br



From daemon Sat Mar 3 02:26:35 2001



From: awgrossm :      awgrossm-at-students.uiuc.edu
Date: Sat, 3 Mar 2001 02:28:13 -0600
Subject: 1um section staining for neurons vs. glia (LM/TEM)

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Hi,

I am trying to distinguish between neurons and glia in
cortical tissue that has been embedded in epoxy resin
(LX112/NMA/DDSA/DMP-30). Does anyone know how to do
this on semithin sections? Toluidine-Blue staining
imparts some subtle differences in the appearance of
chromatin in the nuclei of neurons vs. glia, but i am
looking for a staining procedure that provides a more
obvious color difference (without going all the way to
immunohistochemistry).

It is my understanding also that KMnO4 will react with
NMA (even if i disolve the resin out??), so those
procedures are out, unless I can find a substitute for
KMnO4.

thank you in advance for your advice....

aaron grossman
univ. of illinois




From daemon Sat Mar 3 09:04:50 2001



From: Mike Bode :      mb-at-Soft-Imaging.com
Date: Sat, 3 Mar 2001 07:54:18 -0700
Subject: Re: Nikon CoolPix 990

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Gary,

let me make two observations and see if you agree:

1) The Coolpix (and any other camera like it) is originally designed for
snapshots. That means, that the emphasis is on "nice" pictures under normal
(outside or flash) conditions. This does not necessary mean, that one can
take good scientific images. This may be the reason that you had problems
with exposure time. The camera may take a weighted measurement to calculate
exposure time, for example only from the middle. If you take a snapshot
outside, the most important feature is likely to be found somewhere around
the center of the image. So it's important to get that part right. That
might not apply to photography on a microscope.

2) The quality of the picture is affected by the weakest link in the chain.
My suspicion is, that the lens on the camera is far inferior to anything you
put on a microscope. For example, we spend a lot of time (and money) to
develop and make our own lenses for our TEM cameras. I don't see the point
of spending thousands of Dollars on good microscope lenses and then have all
that negated by an inferior lens on the camera.

One word to Nikon: I am not trying to knock this camera, it is probably a
very good camera (I don't know it myself). My remarks are general and apply
to other camera manufacturers (Kodak, Canon, Fuji, etc.). This was just a
thread which mentioned the Nikon camera. Plus, all these ramblings are my
personal opinion.

Michael Bode, Ph.D.
Soft Imaging System Corp.
1675 Carr St., #105N
Lakewood, CO 80215
===================================
phone: (888) FIND SIS
(303) 234-9270
fax: (303) 234-9271
email: mailto:info-at-soft-imaging.com
web: http://www.soft-imaging.com
===================================



-----Original Message-----
} From: Gary Gaugler [mailto:gary-at-gaugler.com]
Sent: Friday, March 02, 2001 10:20 PM
To: Leonardo Lagoeiro
Cc: MSA listserver


The CoolPix 990 is indeed a nice camera. Unfortunately, it is
not ideal for microscopy. It will work in this type of application
but the results are mixed and the effort can be great.

If you zoom out to infinity, you should get best results. The
key problem I have found is obtaining consistent exposure
values. Preview with the puck looks good but the captured
image is over exposed. Trying the best of five sometimes
helps. But i have relegated the 990 to travel and snapshots.
I don't think that it is ready from prime time microscopy.
YMMV.

gary g.

http://photoweb.net



At 01:35 PM 3/2/01, you wrote:

} Dear All,
}
} we have just bought a Nikon CoolPix 990. It is an outstanding camera. One
} thing that we are disapointed it is a focusing problem when taking picture
} in Microscope. For any zoom setting and even in a manual mode, the
} micrograph borders always get out of focus, and in some situation with a
} Chromatic aberration.
} Does anyone have any idea how to eliminate this problem? The camera came
} with all necessary accessories for mounting in a microscope, e.g.,
} c-mount, and MDC relay lens and remote cable.
}
}
} Best regards,
}
} Leonardo
} --
} ---
} Leonardo Lagoeiro
} Departamento de Geologia
} Universidade Federal de Ouro Preto
} Ouro Preto, MG, 35400-000
} Brazil
} E-mai: lagoeiro-at-degeo.ufop.br



From daemon Sat Mar 3 11:31:53 2001



From: Norman_C_Miller-at-raytheon.com
Date: Sat, 3 Mar 2001 11:27:02 -0600
Subject: GaAs cathodoluminescence

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


All,

Does anyone have a GaAs cathodoluminescence attachment in a SEM? This means a
photomultiplier optimized to 8500A, an S1 photomultiplier. I would like to look
at light emitted from a GaAs diode under power. Or does anyone know of a lab
that does have GaAs cathodoluminescence as a SEM attachment.

Carl Miller
Raytheon Co./Lexington Lab




From daemon Sat Mar 3 12:46:09 2001



From: Xinran Liu :      xinran.liu-at-UTSouthwestern.edu
Date: Sat, 3 Mar 2001 12:44:58 -0600
Subject: Thank you / Vibratome section problem

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html



I would like to thank those colleagues who kindly provided their advice and
shared their experience with us regarding the problems of vibratome brain
sectioning that I posted on the list server a while ago.

We now use double-edge feather blades that we purchased from Ted Pella, the
quality of sections are much improved, also sometimes it seems helpful at
low amplitude rather than high one.

Xinran Liu, M.D., Ph.D.

Center for Basic Neuroscience
UT Southwestern Medical Center
6000 Harry Hines Blvd., NA4. 214A
Dallas, TX 75390-9111

Phone: (214) 648-1830
Fax: (214) 648-1801
E-mail: Xinran.Liu-at-UTsouthwestern.edu




From daemon Sat Mar 3 14:34:36 2001



From: Ronald Austin :      rla-at-mindspring.com
Date: Sat, 3 Mar 2001 14:29:19 -0600
Subject: reply to 1um section staining for neurons vs. glia

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Arron:
Try using Araldrite 502 for your resin. It does not contain NMA. This should
eliminate your concern with using KMnO4. The mixture I use is a 1-1
Araldrite 502 and DDSA, mix well then add your DMP-30 and mix again. Don't
worry about the air bubbles.

Ron Austin (Research Associate)
Dept of Pathology
LSU Medical Ct.
Shreveport, LA
rla-at-mindspring.com



From daemon Sat Mar 3 14:46:59 2001



From: pjp6-at-dana.nau.edu
Date: Sat, 3 Mar 2001 16:03:43 -0600
Subject: protocol for imaging fecal pellets

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html




-----Original Message-----
} From: "PostMaster {rla-at-mindspring.com} "-at-sparc5.microscopy.com
[mailto:"PostMaster {rla-at-mindspring.com} "-at-sparc5.microscopy.com]
Sent: Saturday, March 03, 2001 2:43 PM
To: rla-at-mindspring.com




-----Original Message-----
} From: Ronald Austin [mailto:rla-at-mindspring.com]
Sent: Saturday, March 03, 2001 2:41 PM
To: Microscopy Society of America


---------------------------------------------------------------------------

Email: pjp6-at-dana.nau.edu
Name: Pete Polsgrove
School: Northern Arizona University


Question: I'm looking for an protocol for imaging fecal pellets. The
pellets are from a hydrobiid snail found in highly mineralized warm desert
springs and Posos in Mexico. I am interested primarily in the bacteria
found on and in them but would also like to be able to inventory the entire
contents of the pellets to help get a better picture of what part they play
in their isolated ecosystem. I've done some light and SEM on samples but
need to get inside to determine if the bacteria that break them down are
carried internally or are picked up environmentally from the water. For
sample preparation and sectioning I need to consider other contents like
diatoms and stromatolite pieces and the high concentration of mineral
solids in the samples. To start I plan to fix with glut/OsO4, dehydrate
with acetone,
infiltrate with propylene oxide and go into embed 812. After sections are
imaged for non organic I planned on staining with lead citrate and
comparing. Being new to TEM and not having a good idea of the precise
osmolarity of the sample has left me puzzling over buffer selection (sodium
cacodylate vs. phosphate), concentration, and times. We have an excellent
EM technician here at NAU but it seems more my responsibility to make these
determinations so any suggestions or references you could offer would be
greatly appreciated.
Thanks Pete Polsgrove

---------------------------------------------------------------------------




From daemon Sat Mar 3 18:31:28 2001



From: Gary Gaugler :      gary-at-gaugler.com
Date: Sat, 03 Mar 2001 16:28:01 -0800
Subject: RE: Nikon CoolPix 990

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


I think you have hit the nail right on the head.

1) The camera is of course intended for general purpose
photography. Snapshots, indoors and outdoors. It has
a miniature flash which is good for about ten feet distance.
For microscopy, of course the flash is turned off.

2)There are some macro zoom situations where the camera
does a nice job. But for compound transmitted and reflected
work, I have not found it to be satisfactory. Optem has
made a high quality interface for the CoolPix which interfaces
to Zeiss, Olympus and many other 'scopes. I have a common
optical tube with C-mount to CoolPix for Axioskop and
Olympus. I cannot fault this adapter system at all. But
as you point out, the native CoolPix optics are not intended
for discriminatory microscopy work. At about $700 for
the Optem adapter, the CoolPix package with remote release
and AC adapter is not cheap.

I recently took 765 pix with the CoolPix on a trip to
Australia. It did a super job. I used two 128MB AVL
CF modules. Some images were in highest JPEG
resolution and some were in XGA fine. All print on
an Epson Stylus Photo 2000P with outstanding results.
And, of course, they go to the Web without any problem.

The Pixera Penguin 600CL is quite a different camera.
It is highly suitable for microscopy, but also will do
excellent macro work with an inexpensive C-mount
zoom lens. Optem also makes the adapter for this
camera to the Zeiss and Olympus microscopes.
Same high quality and fine results. I have done
multiple slices and stitched them together for a
final TIFF file size of 110MB.

The Pixera is non-interpolated 5.8M pixels using their
Diractor prism device. At 2776x2074 pixels, it generates
a 17.5MB TIFF file. In 16-bit mode, the size is twice that.
As I mentioned in a prior post, their software supports
multiple capture averaging and integration. It also does
variable sized spot metering and average metering. The CL version
has Peltier cooling and exhibits exceptionally low thermal
noise. Four frame averaging reduces noise even further.

The Pixera is 10-bits per color while the Nikon MX1200 is 8-bits
per color. The word on the street is that the next release
of the MX1200 will be 10-bits per color. Whether this is worth
anything to a particular user is their own decision.

Being a professional Nikon shooter for many years, I am
no longer an intransigent fan. In fact, I have dumped nearly
all of my Nikon SLR equipment in favor of Contax. This of course
has nothing to do with microscopy. But the point is that
in my extended experience, Nikon is struggling to develop new products,
which by specifications, leapfrog their competition--while in
practice, they do not.

Try before buy is a good operative in this respect. I really
don't care who makes what, as long as it is good stuff. Sorting
through all the marketing hype is a chore. Sometimes even
working with the equipment is a chore. But the actual results
of using products is much more telling than sales pitches or
product brochures.

gary g.

http://photoweb.net





At 06:54 AM 3/3/01, you wrote:

} Gary,
}
} let me make two observations and see if you agree:
}
} 1) The Coolpix (and any other camera like it) is originally designed for
} snapshots. That means, that the emphasis is on "nice" pictures under normal
} (outside or flash) conditions. This does not necessary mean, that one can
} take good scientific images. This may be the reason that you had problems
} with exposure time. The camera may take a weighted measurement to calculate
} exposure time, for example only from the middle. If you take a snapshot
} outside, the most important feature is likely to be found somewhere around
} the center of the image. So it's important to get that part right. That
} might not apply to photography on a microscope.
}
} 2) The quality of the picture is affected by the weakest link in the chain.
} My suspicion is, that the lens on the camera is far inferior to anything you
} put on a microscope. For example, we spend a lot of time (and money) to
} develop and make our own lenses for our TEM cameras. I don't see the point
} of spending thousands of Dollars on good microscope lenses and then have all
} that negated by an inferior lens on the camera.
}
} One word to Nikon: I am not trying to knock this camera, it is probably a
} very good camera (I don't know it myself). My remarks are general and apply
} to other camera manufacturers (Kodak, Canon, Fuji, etc.). This was just a
} thread which mentioned the Nikon camera. Plus, all these ramblings are my
} personal opinion.
}
} Michael Bode, Ph.D.
} Soft Imaging System Corp.
} 1675 Carr St., #105N
} Lakewood, CO 80215
} ===================================
} phone: (888) FIND SIS
} (303) 234-9270
} fax: (303) 234-9271
} email: mailto:info-at-soft-imaging.com
} web: http://www.soft-imaging.com
} ===================================
}
}
}
} -----Original Message-----
} } From: Gary Gaugler [mailto:gary-at-gaugler.com]
} Sent: Friday, March 02, 2001 10:20 PM
} To: Leonardo Lagoeiro
} Cc: MSA listserver
} Subject: Re: Nikon CoolPix 990
}
}
} ------------------------------------------------------------------------
} The Microscopy ListServer -- Sponsor: The Microscopy Society of America



From daemon Sun Mar 4 05:58:37 2001



From: twilley :      jtwilley-at-sprynet.com
Date: Sun, 4 Mar 2001 05:54:31 -0600
Subject: SEM views of gold paint

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


} }
} } Subject:
} }
} } SEM views of gold paint
} }
} } Content:
} }
} } Does anyone have any views of modern gold flake (real gold, not brass
} } flake) used in making paintable substitutes for gold leaf?
} }
} } John Twilley
} } Conservation Scientist
}




From daemon Mon Mar 5 02:00:05 2001



From: Nick SCHRYVERS :      schryver-at-ruca.ua.ac.be
Date: Mon, 05 Mar 2001 08:47:05 +0100
Subject: post-doc at Agfa

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


VACANCY FOR POST-DOCTORAL RESEARCH SCIENTIST AT AGFA-BELGIUM

In a world in which nanostructured materials are of growing importance
for a variety of industrial applications, Agfa’s R&D laboratories are
increasingly oriented towards research on nanophased systems. In order
to decrease development time for new products based on functional
nanomaterials, a significant part of the research effort is spent on an
understanding of the basic working mechanisms in a variety of
nanostructured systems.

To reinforce this research-team, Agfa-Gevaert N.V. in Mortsel (Belgium)
has a 2-year vacant position for a postdoctoral scientist who will be
involved in an advanced characterisation programme of nanostructured
building blocks for new imaging and other functional materials,
including photo-, electro- and thermoresponsive systems. The objective
is to use advanced microscopical and analytical equipment to
characterise nanoscaled systems, with the aim of providing an increased
understanding in the relationship between nanostructuration and
properties. Moreover, this research work will also provide clues for a
controlled synthesis of nanostructured systems.

The candidate will be working in a diverse industrial R&D-environment
with several links to university labs. He/she will be involved in a
multidisciplinary team working on several nanostructured applications.
Main focus of the work will be on microscopical and crystallographic
(diffraction) techniques. In order to meet the technical requirements,
the candidate should have a PhD in materials science, experience with
TEM- and diffraction-techniques, and have a background in
crystallography of inorganic materials. He/she should be a good
teamplayer to function in a multi-disciplinary team, and be fluent in
English and/or Dutch.

Candidates please apply to the following persons :

Dr. Christiaan Van Roost
R&D Materials/Physics and Analytics
Septestraat 27
B-2640 Mortsel
Belgium
Phone : (32)03 444 37 00
E-mail : christiaan.vanroost.cv-at-belgium.agfa.com

Rene De Keyzer - Master in Applied Science
Manager External R&D - R&D Materials
Septestraat 27
B-2640 Mortsel
Phone : (32) 03 444 31 00
E-mail : rene.dekeyzer.rd-at-belgium.agfa.com

For selection procedures, eligibility criteria and so on, please see
homepage
Marie Curie Industry Host Fellowships: http://www.cordis.lu/improving.
Please note in particular that candidate fellows must be nationals of an
EU Member or Associated State, or have resided in the EU for at least
five years immdiately prior to their selection by Agfa.






From daemon Mon Mar 5 02:02:26 2001



From: Faerber Jacques :      Jacques.Faerber-at-ipcms.u-strasbg.fr
Date: Mon, 5 Mar 2001 09:02:55 +0100
Subject: Maintenance of LM; quest.

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Hi all

I don't want to wake up a recent discussion (I was away in the last
weeks), but I take advantage of this subject to askh a question about an
other aspect of this subject. Sometimes you have so old material and
maintenance services are laughing when they see what your are working with
and/or on the other hand (with new materials also) it's faster and cheaper
to do cleaning and (basic) maintenance yourself (and I like to do it
myself !).

My question :
What kind of grease/oil, where, on a LM ?

Manufacterer and maintenance services don't like to answer such a
question. They say its complicate, there are much type of greases etc
etc...
So, does someone know something about that.

Thanks

J. Faerber
IPCMS-GSI
(Institut de Physique et Chimie des Matériaux de Strasbourg
Groupe Surface et Interfaces)
23, rue de Loess
67037 Strasbourg CEDEX
France

Tel 00 33(0)3 88 10 71 01
Fax 00 33(0)0 88 10 72 48
E-mail Jacques.Faerber-at-ipcms.u-strasbg.fr




From daemon Mon Mar 5 03:36:19 2001



From: Steve Chapman :      PROTRAIN-at-CompuServe.COM
Date: Mon, 5 Mar 2001 04:30:54 -0500
Subject: TEM: Focusing

Contents Retrieved from Microscopy Listserver Archives
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Hi Randy

I was quite surprised to see the problems that are being discussed in
relation to TEM focus, particularly as I was with Hitachi in the HU11 days,
lets keep it simple and try to help?

When setting the image focus you should be aware of a number of problems
that may complicate matters.

1. To try to focus at condenser cross over is absolutely the wrong thing
to do!
i) At crossover there is the poorest illumination coherence,
this will lead to soft images, not out of focus but not optimised either.
ii) At crossover there is a space charge effect (too
many electrons in a small area and they repel each other) which may cause a
false focus. (Just look at any image at crossover and then overfocus the
condenser - you can see more detail!)
iii) To focus at crossover and then change to a lower
intensity is asking for trouble as the change in heating effect is likely
to cause specimen drift and flexing which may change the contrast of
material science specimens.

2. You MUST focus at the photographic magnification. Focus is the
matching of the focal lengths of the objective and diffraction lenses. If
you focus at a higher level and there is a diffraction lens change when
dropping the magnification, you will find a matching objective correction
will be required or your image will be out of focus.

3. What is best FOCUS, not always true focus? To a materials scientist
it will almost certainly be true focus, no Fresnel fringes, as determined
by the focus wobbler. They will set their intensity in advance as an
intensity change may cause the material to flex and change in contrast. To
the biological scientist it will be a degree of underfocus determined by
the specimen's organelle density, its thickness, the kV, the objective
aperture size and most important, the magnification; this is optimum under
focus, the defocus where the (white) Fresnel fringes enhance the high
contrast areas!

When taking a photograph the ideal conditions (as used in all the
manufacturer's demo laboratories that I have worked with, Hitachi, JEOL and
ISI) require the photograph to be taken at the same intensity level as when
the focus is set. WHY? Well, once an intensity is set the operator may
focus and during the focus procedure they should be concentrating
sufficient to spot any image drift; it is most important to see the image
under the conditions that you are going to photograph. So what will the
excuses be?

1. "It is too dim to focus" - then
i) increase the emission current, many people run at too low a
current and make the task of optimising the instrument settings much more
difficult
ii) increase the kV which would increase the intensity too
ii) re calibrate the photographic system to allow a focus intensity
that is suitable for most operators

2. "The negatives are to dark" -
i) the denser the negative the higher the contrast, so may be you
could increase the kV, have a more stable specimen and an even brighter
image?

3. Difficult one this - "the pathologists like a very bright image" - yes
I know I guess it comes from looking down light microscopes all day?
i) try 1 or 2 above - "yes but the pathologists like a high screen
contrast" - yes I know but you should explain that no one publishes the
screen, it it the photographic record that is the most important item(?)
and we can get stacks of contrast from modern printing/publishing systems.

Regarding the reported overlap in currents between condenser and objective
it is true, however the result is usually more of an image shift than a
focal change in my observations, but yet another reason to focus and
stigmate at the photographic intensity.

So to conclude I would

1. Always focus and stigmate at the photographic illumination level,
if a biologist determine and plot out the optimum under focus for your
material over your normal magnification range.
2. Always use the second condenser overfocus from crossover for high
coherence and combine this with a 2 micron spot size for biology.
3. Set up the instrument's photographic procedure to suit as many
operators as possible so that they too may focus at the photographic level.
4. Increase the emission current to give a higher brightness making
point 2 far easier to use
5. Always use a higher kV (if 60, wow please go to 80, if 80 try 100)
and work to obtain the best results on a photograph not trying to optimise
for the screen.
6. To focus at low magnifications try removing the objective aperture
and focus without a binocular, or a wobbler, looking for the very strong
minimum contrast effect.

Well I hope this helps, its standard information on our courses, guess we
do too much SEM in the States!

Regards

Steve Chapman
Senior Consultant Protrain
For consultancy and training by professionals World Wide
Tel +44 1280 814774 Fax +44 1280 814007
www.emcourses.com


From daemon Mon Mar 5 03:50:33 2001



From: Giles Sanders :      g.sanders-at-ic.ac.uk
Date: Mon, 5 Mar 2001 09:42:18 -0000
Subject: Re: AFM Capabilities

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


I reply to Warren's question

}
} I have several questions for an AFM microscopist;
}
} 1. Can AFM really measure surface modulus?

Probably - but there are a number of factors which may have to be taken into
account. These will include the nature of sample, any additional
interactions between the sample and the scanning probe tip, the nature of
the tip and SPM cantilever and so on.

}
} 2. If yes, what is the mode of operation or measurement?
}
In terms of imaging modes (i.e. those where you are obtaining an image along
with surface property information) there are two that may provide some
surface modulus information.

i) Phase imaging (see for
e.g.http://www.di.com/AppNotes/Phase/PhaseMain.html) is capable of providing
a surface map based on the viscoelastic properties of the surface.
Therefore the image will probably be a convolution between both the surface
modulus and other surface properties (for example elasticity and whether the
sample has any interactions with the tip).
In this mode the probe is tapped into the surface and the lag between the
voltage driving the tip oscillation and the actual tip oscillation provides
this information. (It is particularly difficult, if not impossible to
quantise the results obtained).


ii) Pulsed force should be able to deconvolute between sample stiffness and
sample adhesion. http://www.thermomicro.com/tech/modes/pfm.htm should
provide more information about this mode. However whether true values could
be measured would again be a matter of some discussion.


Further mode of scanning probe microscopes are the spectroscopic ones in
which the probe tip is move towards and away from the sample and the tip
response measured. In AFM this mode is force-distance (see for e.g.
http://www.thermomicro.com/tech/modes/fvsd.htm).
This should again provide some information regarding the surface modulus.
And with some tip calibration may provide something akin to a quantitative
measurement.

With all of these mode the cantilever type will have an effect on the amount
of information available. If the cantilever is less stiff than the surface
of interest your measurement will generally be of the Young's modulus of the
cantilever.

Nanoindenters may provide a more accurate measurement.
http://freespace.virgin.net/micro.materials/ is an example. There are some
companies that offer methods of converting commercial SPMs towards a
nanoindenter.

} 3. Is it a quantitative measurement? Is it an absolute measurement
} or a relative measurement?

My cynical opinion would be that most measurements available from a more
qualitative than quantitative, though many would disagree.
For example in this case, the area of tip-sample contact is unlikely to be
able to be measured accurately but will have a major effect on your
measurements,
You may however be able to obtain some numbers that can be converted to an
absolute measurement after careful consideration.

}
} 4. Can the results be correlated to the (bulk) modulus measured by
} rheometer?


This would, I presume, depend upon the material.

I hope this is of some use.

Giles


----------------------------------------------------------------------------
---------------------------
Dr. Giles Sanders
Zeneca / SmithKline Beecham Centre for Analytical Sciences
Chemistry Department
Imperial College of Science, Technology and Medicine
London
SW7 2AY

Web: http://www.achem.ic.ac.uk/gsanders/web/giles.htm

Tel: (44) - 020-7594-5749
Fax: (44) -020-7594-5833



Never express yourself more clearly than you think.
-- Niels Bohr (1885-1962) Danish physicist

----------------------------------------------------------------------------
------------------------

}
} Regard;
} Warren
}
}



From daemon Mon Mar 5 09:59:38 2001



From: Colin Reid :      creid-at-truxa1.tcd.ie
Date: Mon, 5 Mar 2001 15:57:18 -0000
Subject: Remote Access to SEM

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Hi,

I have had a request from a customer to allow remote access to our SEM in
operation ( Hitachi S3500N ). The software they are proposing to use is
"Timbuktoo" (?). They wish to set up three-way access across the internet
along with a web-cam.
I would appreciate advice from anyone who has tried this already. It would
be useful to know what software has been used elsewhere and what problems
have arisen. There may be better software available to carry out this
function, but I have not approached this problem until now and am a bit in
the dark.
All advice, comments, etc. will be much appreciated.

Thanks.

Best wishes,

Colin

Colin Reid,
Electron Microscope Unit,
Trinity College Dublin,
Dublin 2,
Rep. of Ireland.
Tel: 353-1-6081820
Fax: 353-1-6770438
Email: creid-at-tcd.ie
Home Page: http://www2.tcd.ie/Electron_Microscope/emu/home.htm




From daemon Mon Mar 5 10:52:30 2001



From: Anita Garg :      Anita.Garg-at-grc.nasa.gov
Date: Mon, 05 Mar 2001 11:47:45 -0500
Subject: Re: EMISPEC and other related systems

Contents Retrieved from Microscopy Listserver Archives
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Dear Colleagues
We have a CM200 (S)TEM equipped with EDAX IIs, 4pi digital imaging system
and Gatan GIF. We are considering buying an integrated data acquision
system for this microscope. ES Vision System from Emispec Systems, Inc. is
under consideration . Comments from users of this ES Vision System would be
highly appreciated. Of particular interest is operation of the Gatan Image
Filter; would the autofilter functions still be available?
Are there any other such systems out there?
TIA
Anita



From daemon Mon Mar 5 12:01:22 2001



From: Timothy Schneider :      Timothy.Schneider-at-mail.tju.edu
Date: Mon, 5 Mar 2001 11:45:37 -0500
Subject: L.R. White

Contents Retrieved from Microscopy Listserver Archives
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To the person who is polymerizing the L.R. White at 60 degrees C:

Turn down the oven. If you want to do some sort of gold labeling on your
sections try polymerizing the blocks at 45 degrees C for 2 to four days. Be
sure to do this in some sort of BEEM capsule, as the stuff will not get hard
if it is exposed to air. This type of plastic is not very stable in the
electron beam, pick up your sections on carbon coated gold grids. Good
luck, Tim

Timothy G. Schneider
Director of Electron Microscopy
Department of Pathology
Room 229 Jefferson Hall
Thomas Jefferson University
1020 Locust St.
Philadelphia Pa. 19107
215-503-4798 work
610-613-8170 cellular
timothy.schneider-at-mail.tju.edu



From daemon Mon Mar 5 12:25:13 2001



From: Warren E Straszheim :      wesaia-at-iastate.edu
Date: Mon, 05 Mar 2001 11:59:31 -0600
Subject: Re: Remote Access to SEM

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


First off, I suppose that Nestor or the folks at ORNL will have much more
to say about this since they have essentially developed and refined
telemicroscopy. However, I have some experience with Timbuktu that I will
relate.

We have been using Tibuktu for a number of years since I first heard of it
several years ago at an MSA workshop on telemicroscopy. It is designed for
remote observation or control of computers in general and has been borrowed
for the microscopy application. There are several other products also
available for the same work. Norton has PC anywhere. ATT has developed VNC
which has been mentioned here before and is free.

Timbuktu (and the others) simply requires a connection to the Internet.
Whatever happens on the screen is potentially available to the world once
a client logs in with a password. This can slow down the host computer as
it also has to transmit a copy of the screen.

I don't know about PC Anywhere, but Timbuktu is much faster on the client
side than is WinVNC, even on a LAN. There can be a lot of data to transmit
and it flat out takes a while to do so. Well-written code can do a lot to
speed that up. You should also consider the connection between your PC and
your client. If they have only a modem connection, refresh rates will be
painfully slow.

I couldn't guarantee how well Timbuktu (or any other program) would work on
your scope. I seem to recall that there were some windows whose contents
were not available for Timbuktu to share. It may be that the SEM control
programs were doing non-standard operations that circumvented the normal
Windows system. Presently, I am able to view video windows whether they be
from Oxford's AutoBeam, Quartz's PCI or Dazzle's video preview. But don't
expect refresh rates measured in frames per second, at least not with a
remote control/viewer program. Still, it could be a good alternative
compared to more expensive solutions or to traveling to the site.

BTW, we also picked Timbuktu since it worked with either Macs or Windows
machines.

I cannot tell you much about web cams. I know some systems are available
that are stand-alone and practically plug and play. I don't know that I
would want to burden my microscopy or EDS computer with the extra task.
Others may have more to say.

There, that ought to be worth a couple of cents.

Warren

At 03:57 PM 3/5/2001 +0000, you wrote:
} Hi,
}
} I have had a request from a customer to allow remote access to our SEM in
} operation ( Hitachi S3500N ). The software they are proposing to use is
} "Timbuktoo" (?). They wish to set up three-way access across the internet
} along with a web-cam.
} I would appreciate advice from anyone who has tried this already. It would
} be useful to know what software has been used elsewhere and what problems
} have arisen. There may be better software available to carry out this
} function, but I have not approached this problem until now and am a bit in
} the dark.
} All advice, comments, etc. will be much appreciated.
}
} Thanks.
}
} Best wishes,
}
} Colin

----------------------
Warren E. Straszheim
Materials Analysis and Research Lab
Iowa State University
23 Town Engineering
Ames IA, 50011-3232

Ph: 515-294-8187
FAX: 515-294-4563

E-Mail: wesaia-at-iastate.edu
Web: www.marl.iastate.edu

Scanning electron microscopy, x-ray analysis, and image analysis of materials
Computer applications and networking



From daemon Mon Mar 5 14:42:26 2001



From: Gary Gaugler :      gary-at-gaugler.com
Date: Mon, 05 Mar 2001 12:28:44 -0800
Subject: Re: Remote Access to SEM

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Timbuktu is a remote control software package made by
Netopia.

http://www.netopia.com/software/

There is a free trial version which can be downloaded.

Whether it will work for you, I don't know. One of the
key issues is real-time image transfer for mag and focusing.
The interconnect between the SEM and the remote user is
a major factor in response time. Slow analog modems
are not going to be all that responsive. If running on a
LAN or intranet, that would make a big difference.

A similar product is PC-Anywhere.

gary g.



At 07:57 AM 3/5/01, you wrote:
} ------------------------------------------------------------------------
} The Microscopy ListServer -- Sponsor: The Microscopy Society of America



From daemon Mon Mar 5 17:27:53 2001



From: ileyozerlat-at-yahoo.com ()
Date: Mon, 5 Mar 2001 17:25:50 -0600
Subject: Ask-A-Microscopist: Epiflorescent Microscope

Contents Retrieved from Microscopy Listserver Archives
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Email: ileyozerlat-at-yahoo.com
Name: Iley Ozerlat

Organization: Macalester College

Education: Undergraduate College

Location: St. Paul, Minnesota

Question: How does an "Epiflorescent Microscope" work?
What are the functions of the features of that
microscope?





From daemon Mon Mar 5 20:23:13 2001



From: Walck, Scott D. :      walck-at-ppg.com
Date: Mon, 5 Mar 2001 21:01:49 -0500
Subject: RE: Remote Access to SEM

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


You can do it very cheaply (i.e. free if you have Windows machines) using NetMeeting. Our LEO 1530 was easily set up to do this. You can do "over the shoulder" microscopy where the remote location observes. You need fast bandwidth for control and the instrument must be fully digitally controlled. We have tried it out with remote locations within our company and it works, but do not use it very much (i.e. never).


-Scott

Scott D. Walck, Ph.D.
PPG Industries, Inc.
Glass Technology Center
Guys Run Rd. (packages)
P. O. Box 11472 (letters)
Pittsburgh, PA 15238-0472

Walck-at-PPG.com

(412) 820-8651 (office)
(412) 820-8161 (fax)



-----Original Message-----
From: Colin Reid [mailto:creid-at-truxa1.tcd.ie]
Sent: Monday, March 05, 2001 10:57 AM
To: MSA.Microscopy.Com (E-mail)
Subject: Remote Access to SEM


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The Microscopy ListServer -- Sponsor: The Microscopy Society
of America
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Hi,

I have had a request from a customer to allow remote access to
our SEM in
operation ( Hitachi S3500N ). The software they are
proposing to use is
"Timbuktoo" (?). They wish to set up three-way access across
the internet
along with a web-cam.
I would appreciate advice from anyone who has tried this
already. It would
be useful to know what software has been used elsewhere and
what problems
have arisen. There may be better software available to carry out this
function, but I have not approached this problem until now and
am a bit in
the dark.
All advice, comments, etc. will be much appreciated.

Thanks.

Best wishes,

Colin

Colin Reid,
Electron Microscope Unit,
Trinity College Dublin,
Dublin 2,
Rep. of Ireland.
Tel: 353-1-6081820
Fax: 353-1-6770438
Email: creid-at-tcd.ie
Home Page: http://www2.tcd.ie/Electron_Microscope/emu/home.htm





From daemon Tue Mar 6 04:05:09 2001



From: Susanne Guder :      guder-at-wm.mw.tum.de
Date: Tue, 06 Mar 2001 09:48:21 +0100
Subject: Re:Strain exsolution in Cu wire

Contents Retrieved from Microscopy Listserver Archives
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Malcom,

to make a guess, you should can give some more information.
What impurity elements did you find/expect ?
Can you make any suggestion about the size of any kind of inhomogeneity -
conzentration, precipitation
or what ever ?

S.Guder


} We're analysing Cu wire here for purposes better known to ourselves. We
} are noticing, but not able to image interesting variations in the
} concentration of impurities, which suggests to us, either that the
} original material was inhomogeneous, or that drawing the wire has caused
} some kind of exsolution process. Have any of you encountered smilar
} things in metals? Refs?
} Malc.
}
} --
} Dr MP Roberts Phone: [+27](0)46 603 8313
} Dept of Geology Fax: [+27](0)46 622 9715
} Rhodes University Cell: 083 4060 262 (usually off)
} 6140 Grahamstown e-mail: m.roberts-at-ru.ac.za
} SOUTH AFRICA

--
~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~
Dr.-Ing. Susanne Guder
Technical University Munich
Department of Materials in Mechanical Engineering
D - 85747 Garching
Phone: + 49-(0)89-289-15308/15338
Fax: + 49-(0)89-289-15301
Email: guder-at-wm.mw.tum.de
~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~




From daemon Tue Mar 6 04:16:16 2001



From: Alan E. Davis :      adavis-at-saipan.com
Date: Tue, 6 Mar 2001 20:11:18 +1000
Subject: Re: light microscope lenses

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


I own a zeiss 63X water immersion lens. If the coverslip thickness
is 0, does that mean that this is meant for direct viewing of
specimens in water? I purchased it with that in mind (I work in
marine environments, felt it would be convenient to observe
microorganisms and microanimals directly). Using a coverslip
doesn't seem to work well, if at all. For some specimens it is
nice, but any focusing movement will push specimens out of the way.
Nice for zooxanthellae in a small sea anemone, for example, and was
pretty good for a thick broth of unicellular green algae.

I am trying to get a feel for this objective. WOuld appreciate any
information possible.

Alan Davis
adavis-at-saipan.com


On Fri, 13 Oct 2000 08:51:07 -0400
Gary Radice {gradice-at-richmond.edu} wrote:

}
------------------------------------------------------------------------
} The Microscopy ListServer -- Sponsor: The Microscopy Society of
} America
} To Subscribe/Unsubscribe -- Send Email to
} ListServer-at-MSA.Microscopy.Com
} On-Line Help
} http://www.msa.microscopy.com/MicroscopyListserver/FAQ.html
}
-----------------------------------------------------------------------.
}
}
} I've had some experience with water immersion lenses. Their main
} advantage is higher numerical aperture than dry lenses at
} equivalent
} magnification, so better theoretical resolution. They don't offer
} quite as good resolution as oil immersion lenses, but they tend to
} have longer working distances, I believe, and don't have the
} messy
} clean-up of oil immersion lenses. So, yes, they do have some
} distinct
} advantages.
}
} However, as others have pointed out, you may already be able to
} see
} everything you need to see with your current lenses. And nothing
} beats a test-drive.
} --
} Gary P. Radice gradice-at-richmond.edu
} Associate Professor of Biology 804 289 8107 (voice)
} University of Richmond 804 289 8233 (FAX)
} Richmond VA 23173 http://www.science.richmond.edu/~radice


--
adavis-at-saipan.com
1-670-235-6580
Alan E. Davis, PMB 30, Box 10006, Saipan, MP 96950-8906, NMI

I have steadily endeavored to keep my mind free, so as to give up
any
hypothesis, however much beloved -- and I cannot resist forming one
on
every subject -- as soon as facts are shown to be opposed to it.
-- Charles Darwin (1809-1882)






From daemon Tue Mar 6 04:17:50 2001



From: Gary Gaugler :      gary-at-gaugler.com
Date: Tue, 06 Mar 2001 02:03:30 -0800
Subject: Philips XL30 models

Contents Retrieved from Microscopy Listserver Archives
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Has anyone priced the XL30 high vac FESEM
and the EFESEM or variations which use LaB6?
What is the general price range for these, and
which Hitachi models would closely compete?

Is service any good and is it reasonably priced?

All responses are welcomed.

tnx,
gary g.



From daemon Tue Mar 6 04:46:53 2001



From: Drouillon, Philippe :      Philippe.Drouillon-at-solvay.com
Date: Tue, 6 Mar 2001 08:42:13 -0600
Subject: Help wanted : looking for parts of a Siemens Elmiskop 102 TEM for

Contents Retrieved from Microscopy Listserver Archives
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A normal (upright) epifluorescence microscope excites
fluorescence in a specimen by passing the excitation light to the
top of the specimen via the objective lens, which is used to focus
the light into an intense spot exactly at the point on the specimen
which is to be viewed. Fluoresced light from the region of interest is
collected by the objective and is viewed or photographed normally
after filtration to remove any excitation light and unwanted
fluorescence wavelengths. The excitation illumination is commonly
provided by a high-pressure mercury vapour lamp, which
conveniently provides very high intensity illumination in UV, blue
and green wavelengths. Other high-intensity sources are now also
used, including xenon lamps, lasers (e.g. in confocal microscopes,
which are a highly-derived type of epifluorescence microscope) and
even tungsten-halogen lamps. The separation of excitation and
fluorescence wavelengths is usually accomplished using a dichroic
beam splitter which reflects green, for example, and transmits
orange/red. Further fine-tuning of the excitation wavelengths may
be done using dichroic filters. Many microscope manufacturers
provide filter systems as beam-splitter cube assemblies with all the
filters and dichroic reflectors required for a particular fluorochrome
installed in one pre-aligned package for easy exchange. The
fluoresced light may be further filtered for viewing or photography by
"barrier" filters either of dichroic type, or of coloured glass or
sometimes gelatin (e.g. Kodak Wratten).

Other than that, an epifluorescence microscope can be a normal
compound microscope, but because efficiency of illumination and
collection of light is important, and is limited by the objective lens,
fluorescence microscopes usually employ high quality objectives
with very high numerical aperture. If UV is used, it may be
necessary to select ojectives with very low UV absorption.

Hope this helps
Chris
Date sent: Mon, 5 Mar 2001 17:25:50 -0600
To: Microscopy-at-sparc5.microscopy.com
} From: ileyozerlat-at-yahoo.com ()


The FEI XL30SFEG costs in the region of £250k in UK
The closest Hitachi competitor is the S4700.
The FEI is thermal field emission, the Hitachi is Cold cathode field
emission. There is no Hitachi ESEM, but they do a variable
pressure tungsten filament SEM.

Philips / FEI service in UK is excellent. I have no first hand
knowledge of the Hitachi service operation, but believe it is also
first rate. Hitachi quote much lower prices for their service
contracts than FEI. They tell me that their engineers generally have
little to do because the instruments are so reliable! I don't know
whether this is a true reflection of the cost of ownership, however.

Date sent: Tue, 06 Mar 2001 02:03:30 -0800
To: MSA listserver {Microscopy-at-sparc5.microscopy.com}
} From: Gary Gaugler {gary-at-gaugler.com}


Hello,

Our Siemens Elmisjop 102 is presently out of order. We are looking for
several parts of a Siemens Elmiskop 102 which must be replaced.

Parts List C73000 - E3174 - C1 - 1

Part N°335 - Objective current control fine / superfine - cat n° C72315 -
A29 - A4

Part N°333 - Objective current control coarse I level - cat n° C72315 - A31
- B1

Part N°334 - Objective current control medium II level - cat n° C72315 - A31
- B2

Part N°455 - P.C. board V9 "Objective controller" LR - cat n° C72302 - A41 -
A2


Many thanks in advance

Best regards

Philippe Drouillon
Solvay Research and Technology
Electron Microscopy and Image Analysis - Coordinateur Informatique de
Division
Rue de Ransbeek, 310
B-1120 Brussels (Belgium)
phone : (00 32) 2 264 24 47 mailto:philippe.drouillon-at-solvay.com




From daemon Tue Mar 6 09:03:35 2001



From: Neal D. Evans :      evansnd-at-ornl.gov
Date: Tue, 06 Mar 2001 09:57:40 -0500
Subject: Re: EMISPEC and other related systems

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Anita,

We have an Emispec Vision system on our CM200FEG TEM-STEM to acquire
spectrum lines and spectrum images from our Oxford EDS and Gatan GIF. We
tune the GIF using the autofilter functions, and setup the GIF with
ImageFilterControl, but let ESVision read out the GIF multiscan camera
during acquisition. All in all, we are quite pleased with the system. If
you would like to discuss this offline, please contact me directly.

Regards,
Neal



From daemon Tue Mar 6 12:24:30 2001



From: Geoff McAuliffe :      mcauliff-at-umdnj.edu
Date: Tue, 06 Mar 2001 13:22:46 -0500
Subject: Re: 1um section staining for neurons vs. glia (LM/TEM)

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


awgrossm wrote:

} Hi,
}
} I am trying to distinguish between neurons and glia in
} cortical tissue that has been embedded in epoxy resin
} (LX112/NMA/DDSA/DMP-30). Does anyone know how to do
} this on semithin sections? Toluidine-Blue staining
} imparts some subtle differences in the appearance of
} chromatin in the nuclei of neurons vs. glia, but i am
} looking for a staining procedure that provides a more
} obvious color difference (without going all the way to
} immunohistochemistry).

I think you are going to have to rely on morphology alone. Get a copy of
Peters, Palay and Webster, "Fine Structure of the Nervous System". You
should be able to extrapolate from the low mag EMs to LM. You could probably
do an immuno for GFAP (most but not all astrocytes) but that still leaves
oligos and microglia. I don't know of a good immuno for these cells on
plastic sections. Plus, there will be smaller neurons to contend with.
Sorry!

} It is my understanding also that KMnO4 will react with
} NMA (even if i disolve the resin out??), so those
} procedures are out, unless I can find a substitute for
} KMnO4.

And the KMnO4 is for ??


Geoff
--
**********************************************
Geoff McAuliffe, Ph.D.
Neuroscience and Cell Biology
Robert Wood Johnson Medical School
675 Hoes Lane, Piscataway, NJ 08854
voice: (732)-235-4583; fax: -4029
mcauliff-at-umdnj.edu
**********************************************




From daemon Tue Mar 6 13:33:07 2001



From: Holly Aaron :      hollya-at-socrates.berkeley.edu
Date: Tue, 6 Mar 2001 11:28:40 -0800
Subject: job posting

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Dear Microscopists –

There is an official open position now at Genentech (the one I alluded to in
an earlier post, but HR is not too speedy over there) . The posting is
below and can also be found on their website: http:// www.genentech.com
{http://www.genentech.com/} .

For immediate consideration please send a c.v. to Peter Schow at
pschow-at-gene.com {mailto:pschow-at-gene.com} .
He is not on the list, so please email him directly.
I have already forwarded previous resumes I received to him, so no need to
resend those.

Thank you,
Holly Aaron


----------------------------------------------------------------------------
----

Position: Research Associate- Cytometry Lab
Requisition #: 01-0003250


Description
Research Associate position available in the Research Cytometry Lab. The lab
support core facility, collaborative and basic research functions. Primary
responsibilities include operation and maintenance of flow cytometers and/or
imaging instrumentation and may cover all aspects of data acquisition,
analysis, interpretation and presentation in the contexts of basic and
applied research. Lab supports Coulter and BDIS flow cytometers, Leica
(confocal) and Nikon (digital fluorescence) microscopes and both Mac and PC
computers. The person will work in a dynamic and interactive environment
requiring a strong teamwork orientation, good communication skills,
flexibility and the ability to interact with a diversity of research
personnel.

Requirements
Position requires a BS/MS and extensive experience with flow and/or image
cytometry. Good working knowledge of cell and molecular biology necessary.
Industrial experience is desirable.



----------------------------------------------------------------------------


Holly Aaron
Head, Berkeley Imaging Center
University of California, Berkeley
Dept. of Molecular and Cell Biology
447 LSA
Berkeley, CA 94720-2751
hollya-at-socrates.berkeley.edu




From daemon Tue Mar 6 15:59:48 2001



From: jmkrupp-at-cats.ucsc.edu (Jon Krupp)
Date: Tue, 6 Mar 2001 13:55:14 -0800
Subject: How to measure film thickness?

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Hi:

How does one measure the thickness of an estimated 20 to 100 nm titanium
dioxide film on glass?

Can it be done via TEM or SEM, or do we need a completely different approach?

Thanks

Jonathan Krupp
Microscopy & Imaging Lab
University of California
Santa Cruz, CA 95064
(831) 459-2477
jmkrupp-at-cats.ucsc.edu




From daemon Tue Mar 6 16:51:21 2001



From: L. D. Marks :      ldm-at-risc4.numis.nwu.edu
Date: Tue, 6 Mar 2001 16:48:17 -0600 (CST)
Subject: Lawsuit

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Northwestern University is drafting a complaint against a vendor
of microscopy products, AMT. Has anyone else had experience with
lawsuits against vendors?

-------------------------------------------------------
Laurence Marks
Department of Materials Science and Engineering
Northwestern University
Tel: (847) 491-3996 Fax: (847) 491-7820
mailto:ldm-at-risc4.numis.nwu.edu http://www.numis.nwu.edu
-------------------------------------------------------

Workshop May 17-19 2001 "New approaches to the Phase Problem"
http://xraysweb.lbl.gov/esg/phasing/index.html




From daemon Tue Mar 6 17:22:02 2001



From: Nestor J. Zaluzec :      zaluzec-at-aaem.amc.anl.gov
Date: Tue, 6 Mar 2001 17:19:24 -0600
Subject: Administrivia: Lawsuit - Commentary and Listserver Rules

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Colleagues....

When issues concerning items like this occur please
refrain from any specifics on the Microscopy Listserver.

It is fine to pose a question to ask if anyone has experience
with a legal action against a manufacturer or vendor, but
you should not identify any specific organizations,
vendors, or manufacturers as the target of such action.

This type of posting could be construed as
using the Microscopy Listserver to defame a individual or
organization, in the mind's eye of the community and is completely
against the Listserver rules of operation. The Listserver
is not a forum to "flame" either an individual or a company regardless
of the degree to which you feel that you or your
organization have been wronged.

If you are unsure about a posting, feel free to contact me
off-line first and I will make myself available to comment as to
its appropriateness.

Nestor
Your Friendly Neighborhood SysOp











===========================================
Dr. Nestor J. Zaluzec
Materials Science Division
Building 212
Argonne National Lab
9700 S. Cass Ave
Argonne, Illinois 60439 USA
Tel: 630-252-7901, Fax: 630-252-4798
Email: Zaluzec-at-aaem.amc.anl.gov
===========================================
TPMLab: http://tpm.amc.anl.gov
MMSite: http://www.amc.anl.gov
===========================================

The box said ...
"This program requires Win 95/98/NT or better..."
So I bought a G3 Mac !

===========================================




From daemon Tue Mar 6 22:19:45 2001



From: Rick Mott :      rickmott-at-alumni.princeton.edu
Date: Tue, 06 Mar 2001 23:20:03 -0500
Subject: Tangential question: laser vision correction for microscopists?

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


I am considering this, but have read about issues of contrast
perception and/or low light vision. It occurred to me that
microscopists, particularly EM types, depend on their eyes in
low-light situations more than any other profession I can think
of, with the possible exception of cat burglars.

Has anyone out there had LASIK or similar procedure, and
has it been positive or negative for your work? Did you
notice reduced contrast sensitivity?

Thanks for any personal experiences; since it's not a direct
microscopy query, please send replies to me and (if there's
interest) I'll summarize for the list.

Rick Mott (myopic, -7 or so, with some astigmatism)




From daemon Wed Mar 7 00:25:10 2001



From: erich-at-ento.csiro.au (Eric Hines)
Date: Wed, 7 Mar 2001 17:22:16 +1100
Subject: SEM cryo-stage

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Dear all,

We have a ten year old cryo-stage and transfer device for sale.

It is a BioRad E7400 comprising:
Pump valve controller
Sputtering module
Evaporation module
Edwards E2M5 rotary pump x2
Valve block
Transfer/coating unit with dewar
Stage cooling unit with dewar
Specimen insertion rod
ie all you need to go cryo-SEMing.

The rod and flanges suit a JEOL 6400 SEM. The unit was functioning and in
good condition prior to replacement. Any offers?

Eric Hines
Microscopy Centre
CSIRO Entomology
Canberra.




From daemon Wed Mar 7 04:12:23 2001



From: Belluso elena :      belluso-at-dsmp.unito.it
Date: Wed, 7 Mar 2001 11:04:24 +0100 (MET)
Subject: looking for a stage

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Dear all,
I send you the following message written by a serious student. I hope that
someone can offer a possibility to her.
Thanh you very much. All the best,
Elena Belluso


My name is Elisa Fornero and I doing my Degree thesis, at Turin University -
Italy- (Dept. of Mineralogical and Petrologic Sciences), on "INORGANIC
FIBERS IN LUNG TISSUES: MINERALOGICAL CHARACTERIZATION, COMPARISION WITH
NATURAL ASBESTOS AND CALCULATION OF DIFFERENT FIBROUS MINERALOGICAL SPECIES"
(the samples of tissues derived from people not professionally exsposed in
order to value the environmental pollution of fibrous minerals).
During my thesis I extensively worked with SEM and EDS and I learned to
prepare the samples from lungs tissues filtrated.
I would like to have some international experience taking part, about for
two months between April and June 2001, to a stage in a foreigner
University. I would like found a laboratory where develop my knowledge in
this field.
If there is anyone interested to host me, I can send my curriculum vitae,
Thank you
Elisa Fornero



----------------------------------------------------
Elena BELLUSO
Dipartimento di Scienze Mineralogiche e Petrologiche
Via Valperga Caluso, 35
I-10125 TORINO - ITALIA
tel:(39) 011 670 7135 - fax: (39) 011 670 7128
e-mail: belluso-at-dsmp.unito.it
http://www.dsmp.unito.it
----------------------------------------------------


"I've... seen things you people wouldn't believe.
Attack ships on fire off the shoulder of Orion.
I watched C-beams... glitter in the dark near the Tanhauser Gate.
All those... moments will be lost... in time...,
like... tears... in... rain."

Blade Runner



From daemon Wed Mar 7 04:12:24 2001



From: Faerber Jacques :      Jacques.Faerber-at-ipcms.u-strasbg.fr
Date: Wed, 7 Mar 2001 11:08:39 +0100
Subject: Re : How to measure film thickness?

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html



It should be possible to do this much faster and without any sample
preparation with X ray reflectometry.

See web site :

http://www-cxro.lbl.gov/optical_constants/

The is there the possibility to simulate some mesures.

Optical methodes could also be able to do this, by interferences in the
TiO2 film.



J. Faerber
IPCMS-GSI
(Institut de Physique et Chimie des Matériaux de Strasbourg
Groupe Surface et Interfaces)
23, rue de Loess
67037 Strasbourg CEDEX
France

Tel 00 33(0)3 88 10 71 01
Fax 00 33(0)0 88 10 72 48
E-mail Jacques.Faerber-at-ipcms.u-strasbg.fr



From daemon Wed Mar 7 04:12:29 2001



From: Belluso elena :      belluso-at-dsmp.unito.it
Date: Wed, 7 Mar 2001 11:05:15 +0100 (MET)
Subject: looking for a stage

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Dear all,
I send you the following message written by a serious student. I hope that
someone can offer a possibility to her.
Thanh you very much. All the best,
Elena Belluso


My name is Elisa Fornero and I doing my Degree thesis, at Turin University -
Italy- (Dept. of Mineralogical and Petrologic Sciences), on "INORGANIC
FIBERS IN LUNG TISSUES: MINERALOGICAL CHARACTERIZATION, COMPARISION WITH
NATURAL ASBESTOS AND CALCULATION OF DIFFERENT FIBROUS MINERALOGICAL SPECIES"
(the samples of tissues derived from people not professionally exsposed in
order to value the environmental pollution of fibrous minerals).
During my thesis I extensively worked with SEM and EDS and I learned to
prepare the samples from lungs tissues filtrated.
I would like to have some international experience taking part, about for
two months between April and June 2001, to a stage in a foreigner
University. I would like found a laboratory where develop my knowledge in
this field.
If there is anyone interested to host me, I can send my curriculum vitae,
Thank you
Elisa Fornero



----------------------------------------------------
Elena BELLUSO
Dipartimento di Scienze Mineralogiche e Petrologiche
Via Valperga Caluso, 35
I-10125 TORINO - ITALIA
tel:(39) 011 670 7135 - fax: (39) 011 670 7128
e-mail: belluso-at-dsmp.unito.it
http://www.dsmp.unito.it
----------------------------------------------------


"I've... seen things you people wouldn't believe.
Attack ships on fire off the shoulder of Orion.
I watched C-beams... glitter in the dark near the Tanhauser Gate.
All those... moments will be lost... in time...,
like... tears... in... rain."

Blade Runner



From daemon Wed Mar 7 04:41:50 2001



From: Corneliu Sarbu :      Corneliu.Sarbu-at-mtm.kuleuven.ac.be
Date: Wed, 7 Mar 2001 11:35:34 +0100
Subject: analysis of EDS X-ray spectra

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html



Dear fellows microscopists,

we are interested in purchasing a good software for desktop-
analysis (on a PC) of X-ray EDS spectra, previously acquired
on an analytical TEM and transferred to other computer.

In the book of Williams and Carter is mentioned only one such
program, i.e. the DTSA, from NIST. Does anyone of you know
a web address where I could get more informations about this
software ? I would be delighted if there will be any possibility to
check it before ordering, but where or how?
Besides, does anyone know about a better program of this kind ?
We would much better appreciate a free one, but we are ready to
purchase even a commercial one.

Thank you for your attention.

Corneliu Sarbu, PhD
Metallyrgy and Applied Materials Science Dept.
Catholic University of Leuven
Belgium



From daemon Wed Mar 7 05:04:28 2001



From: Paula Sicurello :      patpxs-at-gwumc.edu
Date: Wed, 07 Mar 2001 08:31:14 -0500
Subject: I've got the screws loose

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html



----------
} From: "CAROL.A.WALDER" {eencaw-at-elec-eng.leeds.ac.uk}
To: mtlrmdb-at-leeds.ac.uk


Hi Listers,

I have a LKB Bromma 11800 Pyramitome whose belt has come loos and it needs to be replaced. I can't find the instruction manual or the slip of paper that my predecessor wrote the service person's name on.

Does anybody out there have a source for the instruction manual? I called Leica but they told me this machine was absolete when they acquired the LKB line.

I'll fix this thing myself if anyone can send me a copy of the manual (I'll glaly pay for the cost of copying and shipping).

If anyone knows of a repair person who still works on these ancient beasties, please let me know. It would be good to have someone who could give them tune-ups every now & then.

My screws are loose and I've got the hammer, blow torch sosme bubble gum and bailing wire....now all I need is the manual.


Pretty please??

Paula :-)

Paula Sicurello
George Washington Univ. Medical Center
Dept. of Pathology, Ross Hall rm 505
Electron Microscope Lab
2300 Eye St.
Washington, DC 20037
202-994-2930 phone
202-994-2518 fax



From daemon Wed Mar 7 07:46:47 2001



From: John Henry J. Scott :      johnhenry.scott-at-nist.gov
Date: Wed, 07 Mar 2001 09:02:26 -0500
Subject: Re: analysis of EDS X-ray spectra

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Rick,

An excellent write-up about the process is located at
http://www.manufacturing.net/magazine/dn/archives/current/feature1.html

Cheers
Peter Tarquinio
peter-at-evex.com


Evex Analytical
Microanalysis and Digital Imaging
857 State Road
Princeton, NJ 08540
609-252-9192 T
609-252-9091 F
www.evex.com
info-at-evex.com
----- Original Message -----
} From: "Rick Mott" {rickmott-at-alumni.princeton.edu}
To: {Microscopy-at-sparc5.microscopy.com}
Sent: Tuesday, March 06, 2001 11:20 PM



} In the book of Williams and Carter is mentioned only one such
} program, i.e. the DTSA, from NIST. Does anyone of you know
} a web address where I could get more informations about this
} software ? I would be delighted if there will be any possibility to
} check it before ordering, but where or how?
} Besides, does anyone know about a better program of this kind ?
} We would much better appreciate a free one, but we are ready to
} purchase even a commercial one.
}
} Thank you for your attention.
}
} Corneliu Sarbu, PhD
} Metallyrgy and Applied Materials Science Dept.
} Catholic University of Leuven
} Belgium


Corneliu,

DTSA is no longer sold as a Standard Reference Data product. NIST has
abrogated its patent on DTSA so both the executable and source code are
available from the following URL free of charge:

http://www.cstl.nist.gov/div837/837.02/MicroscopySoftware.html

If you find it does not meet your needs, please drop me an email. Our group
welcomes suggestions for new features or improvements.

-- John Henry

John Henry J. Scott Bldg 222/Rm A113
NIST Microanalysis Research Group 100 Bureau Drive Stop 8371
(301) 975-4981; (301) 417-1321 FAX Gaithersburg, MD 20899-8371



From daemon Wed Mar 7 08:21:17 2001



From: Belluso elena :      belluso-at-dsmp.unito.it
Date: Wed, 7 Mar 2001 08:20:24 -0600
Subject: looking for a stage

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Dear all,
I send you the following message written by a serious student. I hope that
someone can offer a possibility to her.
Thanh you very much. All the best,
Elena Belluso


My name is Elisa Fornero and I doing my Degree thesis, at Turin University -
Italy- (Dept. of Mineralogical and Petrologic Sciences), on "INORGANIC
FIBERS IN LUNG TISSUES: MINERALOGICAL CHARACTERIZATION, COMPARISION WITH
NATURAL ASBESTOS AND CALCULATION OF DIFFERENT FIBROUS MINERALOGICAL SPECIES"
(the samples of tissues derived from people not professionally exsposed in
order to value the environmental pollution of fibrous minerals).
During my thesis I extensively worked with SEM and EDS and I learned to
prepare the samples from lungs tissues filtrated.
I would like to have some international experience taking part, about for
two months between April and June 2001, to a stage in a foreigner
University. I would like found a laboratory where develop my knowledge in
this field.
If there is anyone interested to host me, I can send my curriculum vitae,
Thank you
Elisa Fornero



----------------------------------------------------
Elena BELLUSO
Dipartimento di Scienze Mineralogiche e Petrologiche
Via Valperga Caluso, 35
I-10125 TORINO - ITALIA
tel:(39) 011 670 7135 - fax: (39) 011 670 7128
e-mail: belluso-at-dsmp.unito.it
http://www.dsmp.unito.it
----------------------------------------------------


"I've... seen things you people wouldn't believe.
Attack ships on fire off the shoulder of Orion.
I watched C-beams... glitter in the dark near the Tanhauser Gate.
All those... moments will be lost... in time...,
like... tears... in... rain."

Blade Runner




From daemon Wed Mar 7 09:47:39 2001



From: Staman, John :      jstaman-at-lsil.com
Date: Wed, 7 Mar 2001 08:37:58 -0700
Subject: How to measure film thickness?

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Jonathan,

My vote would be a TEM. Of course, if the film is patterned in any way,
an AFM measurement of the step would be very quick and much cheaper.

Regards,

John Staman
LSI Logic. Colorado
Analytical Services
719-573-3282

-----Original Message-----
} From: jmkrupp-at-cats.ucsc.edu [mailto:jmkrupp-at-cats.ucsc.edu]
Sent: Tuesday, March 06, 2001 2:55 PM
To: Microscopy-at-sparc5.microscopy.com


Hi:

How does one measure the thickness of an estimated 20 to 100 nm titanium
dioxide film on glass?

Can it be done via TEM or SEM, or do we need a completely different
approach?

Thanks

Jonathan Krupp
Microscopy & Imaging Lab
University of California
Santa Cruz, CA 95064
(831) 459-2477
jmkrupp-at-cats.ucsc.edu





From daemon Wed Mar 7 09:47:44 2001



From: Tyrone L. Daulton :      tdaulton-at-nrlssc.navy.mil
Date: Wed, 07 Mar 2001 09:44:48 -0600
Subject: DTSA info

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Dear Corneliu Sarbu,

You can find information about DTSA at the NIST web site

http://www.cstl.nist.gov/div837/837.02/dtsa.html

There is only a Macintosh version of this software, so it may not be
of use for you if you are looking for software for a PC. NIST has
officially withdrawn DTSA as a Standard Reference Data product and has
abrogated its patent. NIST is now releasing the software free from
charge, however no longer officially supports the software except for
internal development as an internal research tool for NIST. The NIST
web site I directed you to has links to download the software
application and the Pascal source code.

Tyrone Daulton

} Dear fellows microscopists,

} ...
} we are interested in purchasing a good software for desktop-
} analysis (on a PC) of X-ray EDS spectra, previously acquired
} on an analytical TEM and transferred to other computer.

} In the book of Williams and Carter is mentioned only one such
} program, i.e. the DTSA, from NIST. Does anyone of you know
} a web address where I could get more informations about this
} software ? ...

--
_____________________________________________________
Tyrone L. Daulton
Director: Marine Geosciences - Electron Microscopy Center
Physicist and Senior Electron Microscopist

Naval Research Laboratory
Marine Geosciences Division (Code 7400)
Stennis Space Center, MS 39529-5004

Voice (228)-688-4877
Fax (228)-688-4093
email tdaulton-at-nrlssc.navy.mil
tld-at-howdy.wustl.edu




From daemon Wed Mar 7 10:04:25 2001



From: Sara Miller :      saram-at-duke.edu
Date: Wed, 7 Mar 2001 10:57:10 -0500 (EST)
Subject: Re: I've got the screws loose

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Paula,

Jon Pett at TekNet in NJ has worked on a lot of different kinds of
microtomes. You might call him for service/information. (908) 905-5530.

Sara



Sara E. Miller, Ph. D.
P. O. Box 3712
Duke University Medical Center
Durham, NC 27710
Ph: 919 684-3452
FAX: 919 684-3265



From daemon Wed Mar 7 10:49:03 2001



From: Sara Miller :      saram-at-duke.edu
Date: Wed, 7 Mar 2001 11:38:30 -0500 (EST)
Subject: Histotechnologist Position Open (fwd)

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


I am reposting this for a colleague. If interested, please reply directly to

Ms. Linda McGuire
lmcguire-at-downstate.edu


------------------------------------------------------------------------
The Microscopy ListServer -- Sponsor: The Microscopy Society of America



Experienced Histotechnologist to work in Neuropathology Research
Laboratory of Department of Pathology

The person we seek will be responsible for maintaining a neuropathology
research laboratory in the Department of Pathology at SUNY Downstate
Medical Center. Knowledge of immunohistochemistry, special stains, and
histopathology is required. Previous experience in handling central
nervous system tissue preferred. The individual will work with only
minimum supervision.

Position Requirements

Minimum of five years experience working in a laboratory with hands-on
experience in tissue processing, histochemistry, immunohistochemistry,
and operation of a light microscope. Experience with technical aspects of
neuropathology and performing special stains including silver
(Bielschowsky) and myelin stains.

Two years experience working on immunohistochemistry of CNS tissue
specimens with knowledge of immunoreagents and experimental protocols.

BachelorUs degree in science desirable.

Laboratory skills including communications, ability to comply with safety
and laboratory regulations, maintenance of laboratory equipment and
resources, operation of computers and office equipment.

Advanced computer skills (word processing and database management) essential.

Desirable Experience

Confocal microscopy desirable.

Salary commensurate with experience


Responsibilities

Purchasing supplies and equipment, budget reports, laboratory maintenance
and brain banking.

Will operate all microscopic, photographic and computer equipment, and
keep accurate records of all laboratory experiments and procedures. Light
and fluorescent microscopy; tissue processing for paraffin embedding,
sectioning and slide stainer for immunohistochemical procedures; computer
imaging (PhotoShop); general photography; and library and web searches

Familiarity with computer software for keeping records, report
preparation and table/figure construction using Microsoft Office software
(Word, Excel, PowerPoint) as well as Endnote and Adobe PhotoShop.

Send resume to:

Suzanne Mirra, M.D., Chair
Department of Pathology
Box 25
SUNY-Brooklyn
450 Clarkson Av.
Brooklyn, NY 11203-2098

-------------------
Submitted by
Sara E. Miller, Ph. D.
P. O. Box 3712
Duke University Medical Center
Durham, NC 27710
Ph: 919 684-3452
FAX: 919 684-3265







From daemon Wed Mar 7 10:49:07 2001



From: Sara Miller :      saram-at-duke.edu
Date: Wed, 7 Mar 2001 11:43:51 -0500 (EST)
Subject: Confocal Technical Position Open (fwd)

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


I am reposting this for a colleague. If interested, please reply
directly to

Ms. Linda McGuire
lmcguire-at-downstate.edu
------------------------------------------------------------------------

Experienced Confocal Microscopy/Electron Microscopy Technologist to work
in Research Laboratory of Department of Pathology


The person we seek will be responsible for organization of a new facility
that includes a confocal microscope and an electron microscope. The
position includes overall management of the microscopy facility, user
training, and user supervision. Requirements for the position include
experience with light and transmission electron microscopy. This
individual will oversee all aspects of specimen accession and processing,
operation of the microscopes, photography, record keeping, and
supervision of a technician. Knowledge of EM, biology, and pathology, as
well as photographic procedures is required. The individual will work
with only minimum supervision.

Position Requirements

Experience with confocal and digital imaging techniques, microinjection,
visualization of living cells containing fluorescent probes,
photobleaching, and fluorescence in situ hybridization.

Minimum of five years experience working in an electron microscopy
laboratory with hands-on experience in tissue processing, dark room
photography, and operation and maintenance of electron microscope.

Two years experience working on electron microscopy of human tissue
specimens with knowledge of histology and pathology.

Excellent interpersonal and organizational skills are essential.

BachelorUs degree in science desirable.

Desirable Experience

Expertise in training in the operation of confocal microscope systems is
a distinct advantage.

Familiarity with light microscopy methods, immunofluorescent staining,
use of fluorescent probes for physiologic measurements and the general
principles of cell biological research are critical. Significant facility
with computers is desired.

Responsibilities

Serve as the technical manager of the facility and be responsible for the
operation and maintenance of the confocal and EM microscope facility.

Perform routine transmission EM, including tissue processing,
ultramicrotomy, and examination; do preventative maintenance on the
equipment; maintain the lab, order supplies, schedule instruments, and
oversee billing.

Image analysis at the light, confocal and electron microscopic levels and
preparation of micrographs for publication.


Send resume to:
Suzanne Mirra, M.D., Chair
Department of Pathology
Box 25
SUNY-Brooklyn
450 Clarkson Av.
Brooklyn, NY 11203-2098

-----------------
Submitted by
Sara E. Miller, Ph. D.
P. O. Box 3712
Duke University Medical Center
Durham, NC 27710
Ph: 919 684-3452
FAX: 919 684-3265







From daemon Wed Mar 7 10:53:43 2001



From: Sara Miller :      saram-at-duke.edu
Date: Wed, 7 Mar 2001 11:44:31 -0500 (EST)
Subject: EM Tech Position Open

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html



I am reposting this for a colleague. If interested, please reply
directly to

Ms. Linda McGuire
lmcguire-at-downstate.edu

-----------------------------------------------------------------------
Experienced Electron Microscopy Technologist to work in Research
Laboratory of Department of Pathology


The person we seek will be responsible for the overall operation of the
EM laboratory in the Department of Pathology at SUNY Downstate Medical
Center. This individual will oversee all aspects of specimen accession
and processing, operation of the microscope, photography, record keeping,
and supervision of a technician. Knowledge of EM, biology, and pathology,
as well as photographic procedures is required. The individual will work
with only minimum supervision.

Position Requirements

Minimum of five years experience working in an electron microscopy
laboratory with hands-on experience in tissue processing, dark room
photography, and operation and maintenance of electron microscope.

Two years experience working on electron microscopy of human tissue
specimens with knowledge of histology and pathology.

BachelorUs degree in science desirable.

Laboratory management skills including effective written/verbal
communication skills to interact with a diverse group, ability to comply
with safety and laboratory regulations, maintenance of laboratory
equipment and resources, and operation of computers and office equipment.

Desirable Experience

Previous experience in confocal microscopy highly desirable.

Previous experience in performing immunocytochemical staining and
advanced computer skills usage (e.g. image analysis) is also desirable.

Salary commensurate with experience

Responsibilities

Maintain electron microscope in operating condition. Process clinical and
research tissues for "thick" and "thin" sectioning. Darkroom management
of photographic printing.


Send resume to:
Suzanne Mirra, M.D., Chair
Department of Pathology
Box 25
SUNY-Brooklyn
450 Clarkson Av.
Brooklyn, NY 11203-2098

-----------------
Submitted by:
Sara E. Miller, Ph. D.
P. O. Box 3712
Duke University Medical Center
Durham, NC 27710
Ph: 919 684-3452
FAX: 919 684-3265







From daemon Wed Mar 7 10:55:22 2001



From: allen-at-aaem.amc.anl.gov (Charles W. Allen)
Date: Wed, 7 Mar 2001 10:53:44 -0600
Subject: MidWest Microscopy and Microanalysis Society and ASM Joint

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


{fontfamily} {param} Times {/param} {bigger} SCANNING ELECTRON MICROSCOPY
(SEM) AND ENERGY DISPERSIVE

X-RAY SPECTROSCOPY (EDS)

WITH APPLICATIONS AT VARIOUS PRESSURES AND ATMOSPHERES


AN EDUCATIONAL SEMINAR-FRIDAY, APRIL 27, 2001

MOTOROLA GALVIN CENTER-SCHAUMBERG, IL

8:30 AM - 5:00 PM


{underline} Instructors {/underline} : Vern Robertson, JEOL-USA, and
Nestor Zaluzec, Argonne National Laboratory.

{underline} Time {/underline} : Check-in at Galvin Center 8:30-9:00 am.
Seminar 9:00-12:30 and 1:30-5:00.

{underline} Preregistration Required {/underline} : Deadline April 20,
2001; no walk-ins.

{underline} Cost {/underline} : Members of ASM-International and of the
Midwest Microscopy and Microanalysis Society-$30; Non-members-$50;
Students: $10. Registration includes lunch and refreshments at breaks.
Check or money order to accompany preregistration form (below).

{underline} Exhibits {/underline} : Representatives from the following
industrial co-sponsors will be present to discuss your applications and
their products: EDAX, FEI, Hitachi, JEOL-USA, LEO, Noran, Oxford, and
PGT.

{underline} Directions to Seminar Site {/underline} : Please see the other
side.

{underline} Preregistration {/underline} : Please complete the following
form. Mail it with your check or money order made out to "Chicago
Regional Chapter of ASM-I" to Ms. Sheila Jungman, MSD 212, Argonne
National Laboratory, Argonne, IL 60439 {bold} . {/bold} Deadline for
receipt of the form is April 20, 2001. If you require a receipt for the
preregistration cost, please so indicate below for pick-up at the
Seminar Check-In desk. Questions? Phone 630-252-4157 or e-mail
allen-at-aaem.amc.anl.gov.



{bold} SEM/EDS Educational Seminar-Friday, April 27, 2001

{/bold} Name (please print
clearly)________________________________________________________

Affiliation_______________________________________Phone_________________________

Address_______________________________________________________________________

________________________________________________________________________

ASM-I Member ($30)_______; MMMS Member ($30)________; Non-Member
($50)________; Student ($10)______If student,
where_______________________________________________

Please enclose check or money order made payable to "Chicago Regional
Chapter ASM-I". Do you need a receipt ?______. Mail form and payment
to

Ms. Sheila Jungman, MSD 212, Argonne National Laboratory, Argonne, IL
60439



{/bigger} {/fontfamily} ========================================

Charles W. Allen

Electron Microscopy Center-HVEM-Tandem Facility

MSD 212/E211

9700 South Cass Avenue

Argonne National Laboratory

Argonne. IL 60439 USA


Email:allen-at-aaem.amc.anl.gov

Tel: 630-252-4157 Fax:630-252-4798 or -4298


Home: Niles, MI. allen.42-at-nd.edu


========================================




From daemon Wed Mar 7 12:26:15 2001



From: L. D. Marks :      ldm-at-risc4.numis.nwu.edu
Date: Wed, 7 Mar 2001 12:21:35 -0600 (CST)
Subject: Brittle samples

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


We are having problems with preparing brittle TEM sample of (single
crystal) sapphire and magnesium orthovanadate via dimpling & PIPS. Any
suggestions beyond a kid-gloves approach?

-------------------------------------------------------
Laurence Marks
Department of Materials Science and Engineering
Northwestern University
Tel: (847) 491-3996 Fax: (847) 491-7820
mailto:ldm-at-risc4.numis.nwu.edu http://www.numis.nwu.edu
-------------------------------------------------------

Workshop May 17-19 2001 "New approaches to the Phase Problem"
http://xraysweb.lbl.gov/esg/phasing/index.html



From daemon Wed Mar 7 12:45:32 2001



From: allen-at-aaem.amc.anl.gov (Charles W. Allen)
Date: Wed, 7 Mar 2001 12:43:26 -0600
Subject: MMS and ASM Joint Meeting : Driving Directions

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


{fontfamily} {param} Times {/param} {bigger} Direction to the MMMS and ASM
meeting in Schaumburg Il on April 27, 2001




LOCATION: Motorola Galvin Center Auditorium. Motorola Center

occupies the Southwest corner at the intersection of Algonquin and

Meacham Roads, Schaumberg, IL


{underline} All attendees {/underline} must enter at the Algonquin Road
"A" Entrance.

Do not stop at the Visitors Center. Proceed to the guard station

in the center of the roadway and inform the guard that you are

going to the Galvin Center Auditorium. Go straight until making

a right turn onto Center Drive. Then make a left turn into the Galvin

Center parking lot. Enter through the {underline} Museum
Entrance {/underline} near the

east side of the building.


ADDITIONAL DIRECTIONS: From the Northwest Tollway (I-90).

Exit I-90 at Roselle Road and turn right (north). Follow Roselle Road


to Algonquin Road (Rte 62) and turn right (east). Proceed east past

several stoplights to the Motorola Center campus. Turn right at
Entrance

A (West Drive). (If you pass Meachem Road, you have gone too far on

Algonquin Road.) OR From Rte 53, take Algonquin Road (Rte 62)

west. After passing Meachem Road, turn left at the second entrance

(Entrance A-West Drive) to Motorola Center.


ABOUT THE SEMINAR AND ITS INSTRUCTORS:

Both Vern Robertson and Nestor Zaluzec are well known for their clear

and informative presentations in the areas of SEM and EDS. Both topics


will be developed from the basics with an abundance of helpful visual

aides. Special emphasis will be placed by both instructors on
instrumentation,

techniques and problems of interpretation and quantitation, including

when the specimen environment is not vacuum. During the morning

and afternoon breaks and during a portion of the lunch hour,
representatives

of eight co-sponsoring manufacturers will be available for interaction
with

other attendees.


This seminar has been organized by members of the

Chicago Regional Chapter of ASM-International in cooperation

with the Midwest Microscopy and Microanalysis Society, the

Materials Science Division of Argonne National Laboratory, JEOL-USA and
Motorola.



{/bigger} {/fontfamily}



From daemon Wed Mar 7 13:16:36 2001



From: John Hunt :      hunt-at-ccmr.cornell.edu
Date: Wed, 07 Mar 2001 14:16:09 -0500
Subject: Re: forensic microscopy course

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Mary-Jacque,
Several years ago at a used book library sale, I found a copy of
Forensic Geology-Earth Sciences and Criminal Investigation by Raymond C.
Murray and John C.F. Tedrow. It dates from 1975 and looks interesting. I
hope to read more of it.
Another title which came from a special session at the MAS-MSA
meeting in 1985 is titled Electron Microscopy in Forensic, occupational and
environmental health sciences by Samarendra Basu and James R. Millette.
I still lament that the Microbeam Analysis Society dropped
Sherlock Holmes' hat and pipe from their logo.




John Hunt
CCMR Microscopy Facility
255-0108



From daemon Wed Mar 7 13:22:01 2001



From: Walck, Scott D. :      walck-at-ppg.com
Date: Wed, 7 Mar 2001 14:03:48 -0500
Subject: RE: Brittle samples

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Lawry,
I don't know about magnesium orthovanadate, but sapphire will work using the small angle cleavage technique. I have done cross sections of GaN on sapphire when I taught some students at Univ. of Illinois how to do it. John McCaffrey has done YBCO on cerium oxide on sapphire. If you are only interested in the bulk, that is even easier. If the magnesium orthovanadate is as brittle as you say, then SACT will probably work on that also. If you want, I can send you an image of the GaN/sapphire.


-Scott

Scott D. Walck, Ph.D.
PPG Industries, Inc.
Glass Technology Center
Guys Run Rd. (packages)
P. O. Box 11472 (letters)
Pittsburgh, PA 15238-0472

Walck-at-PPG.com

(412) 820-8651 (office)
(412) 820-8161 (fax)



} -----Original Message-----
} From: L. D. Marks [mailto:ldm-at-risc4.numis.nwu.edu]
} Sent: Wednesday, March 07, 2001 1:22 PM
} To: Microscopy List
} Subject: Brittle samples
}
}
} --------------------------------------------------------------
} ----------
} The Microscopy ListServer -- Sponsor: The Microscopy Society
} of America
} To Subscribe/Unsubscribe -- Send Email to
} ListServer-at-MSA.Microscopy.Com
} On-Line Help
} } http://www.msa.microscopy.com/MicroscopyLists } erver/FAQ.html
}
}
}
} --------------------------------------------------------------
} ---------.
}
}
} We are having problems with preparing brittle TEM sample of (single
} crystal) sapphire and magnesium orthovanadate via dimpling & PIPS. Any
} suggestions beyond a kid-gloves approach?
}
} -------------------------------------------------------
} Laurence Marks
} Department of Materials Science and Engineering
} Northwestern University
} Tel: (847) 491-3996 Fax: (847) 491-7820
} mailto:ldm-at-risc4.numis.nwu.edu http://www.numis.nwu.edu
} -------------------------------------------------------
}
} Workshop May 17-19 2001 "New approaches to the Phase Problem"
} http://xraysweb.lbl.gov/esg/phasing/index.html
}
}


From daemon Wed Mar 7 13:42:20 2001



From: L. D. Marks :      ldm-at-risc4.numis.nwu.edu
Date: Wed, 7 Mar 2001 13:38:12 -0600 (CST)
Subject: Brittle samples - NOT CROSS-SECTION

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


A quick clarification before I get deluged with responses about
how to do cross-sections; we are not trying to do this. All (?)
we want is a "conventional" 3mm disc sample of sapphire or
magnesium orthovanadate. No glue, no mounting on a Cu ring,
no nothing.

-------------------------------------------------------
Laurence Marks
Department of Materials Science and Engineering
Northwestern University
Tel: (847) 491-3996 Fax: (847) 491-7820
mailto:ldm-at-risc4.numis.nwu.edu http://www.numis.nwu.edu
-------------------------------------------------------

Workshop May 17-19 2001 "New approaches to the Phase Problem"
http://xraysweb.lbl.gov/esg/phasing/index.html



From daemon Wed Mar 7 13:45:53 2001



From: David Henriks :      henriks-at-southbaytech.com
Date: Wed, 07 Mar 2001 12:32:58 -0800
Subject: Re: Brittle samples

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


} Dear Dr. Marks:

I think a good solution may be Tripod Polishing. We have an application note on preparing samples
of sapphire with a GaN film which may be useful. Let me know if you would like a copy of the note
and I can email it to you.

Best regards-

David Henriks TEL: +1-949-492-2600
South Bay Technology, Inc. FAX: +1-949-492-1499
1120 Via Callejon
San Clemente, CA 92673 USA e-mail: henriks-at-southbaytech.com

*** www.southbaytech.com ***


} RE: Brittle samples
} ------------------------------------------------------------------------
} The Microscopy ListServer -- Sponsor: The Microscopy Society of America
} To Subscribe/Unsubscribe -- Send Email to ListServer-at-MSA.Microscopy.Com
} On-Line Help http://www.msa.microscopy.com/MicroscopyListserver/FAQ.html
} -----------------------------------------------------------------------.
}
} We are having problems with preparing brittle TEM sample of (single
} crystal) sapphire and magnesium orthovanadate via dimpling & PIPS. Any
} suggestions beyond a kid-gloves approach?
}
} -------------------------------------------------------
} Laurence Marks
} Department of Materials Science and Engineering
} Northwestern University
} Tel: (847) 491-3996 Fax: (847) 491-7820
} mailto:ldm-at-risc4.numis.nwu.edu http://www.numis.nwu.edu
} -------------------------------------------------------

--



From daemon Wed Mar 7 13:53:29 2001



From: James M. Ehrman :      jehrman-at-mta.ca
Date: Wed, 07 Mar 2001 15:53:04 -0400
Subject: homemade transmitted electron detector

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Hi Listers,

Has anybody out there had any experiences with making your
own transmitted electron detector for SEM? I'm interested in
sharing ideas, references, etc. I've made one for myself and
am fairly happy with its performance, but am wondering if
there is more that I can do.

Thanks in advance,

Jim



--

James M. Ehrman
Digital Microscopy Facility
Mount Allison University
Sackville, NB E4L 1G7
CANADA

phone: 506-364-2519
fax: 506-364-2505
email: jehrman-at-mta.ca
www: http://www.mta.ca/~jehrman




From daemon Wed Mar 7 13:58:34 2001



From: Tina Carvalho :      tina-at-pbrc.hawaii.edu
Date: Wed, 7 Mar 2001 09:55:21 -1000 (HST)
Subject: TEM - immunolabeling

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


I have two questions for you immunolabeling experts.

First, a client has some precious and irreplaceable histological sections
of human hippocampus that have been labeled with ABC - DAB. Will it be
possible for me to de-paraffinize the sections, expose them to osmium
vapor and re-embed them in resin on the slide and pop them off and
resection them and see the DAB precipitate? Anyone have a protocol that
has worked?

Second, these researchers plan to use Vibratome sections of mouse brain
and immunolabel them for light microscopy using an ABC kit. I have done
on-ultrathin-section colloidal gold immunolabeling for TEM. However, for
this new project we would like to try pre-embedding labeling of 50-60
micrometer Vibratome sections, then embed and resection them for
TEM. Knowing what works for light microscopy, we'd like to use
streptavidin/colloidal gold or whatever for TEM visualization. My question
is, of course, does anyone have a favorite protocol they would be willing
to share? How do I keep the sections from curling? If we stick them on a
glass slide to embed in resin and (hopefully) pop off later for
resectioning, when and how do I get the to adhere?

Mahalo!

Tina

http://www.pbrc.hawaii.edu/bemf/microangela
****************************************************************************
* Tina (Weatherby) Carvalho * tina-at-pbrc.hawaii.edu *
* Biological Electron Microscope Facility * (808) 956-6251 *
* University of Hawaii at Manoa * http://www.pbrc.hawaii.edu/bemf*
****************************************************************************



From daemon Wed Mar 7 14:54:12 2001



From: Anita Garg :      Anita.Garg-at-grc.nasa.gov
Date: Wed, 07 Mar 2001 15:48:39 -0500
Subject: Cerius2 from MSI

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Dear Colleagues
Has anybody used Cerius2 software from Molecular Simulations Inc. for new
alloy development? Any comments would be appreciated.



From daemon Wed Mar 7 15:20:48 2001



From: John Henry J. Scott :      johnhenry.scott-at-nist.gov
Date: Wed, 07 Mar 2001 16:17:15 -0500
Subject: new URL for DTSA

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


The URL I gave this morning for DTSA was correct, but not memorable. A few
hours ago an alias was created to make it easier to navigate to the NIST
Microanalysis Software web page. DTSA can now be accessed from:

http://www.nist.gov/dtsa

This page also contains links to Lispix, Dave Bright's excellent image
processing application (now available for Win9x/WinNT/Win2k) and the NIST
Monte Carlo codes. Lispix can be accessed directly at

http://www.nist.gov/lispix


-- John Henry

John Henry J. Scott Bldg 222/Rm A113
NIST Microanalysis Research Group 100 Bureau Drive Stop 8371
(301) 975-4981; (301) 417-1321 FAX Gaithersburg, MD 20899-8371



From daemon Wed Mar 7 15:30:27 2001



From: Thomas, Larry (PNNL) :      Larry.Thomas-at-pnl.gov
Date: Wed, 07 Mar 2001 13:25:58 -0800
Subject: RE: Brittle samples

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Try epoxying a thin metal washer on one side of the sample, and dimple from the
washer side.


Larry Thomas
Pacific Northwest National Laboratory
Richland, WA 99352
Phone: (509)372-0793 Fax: (509)376-6308
Email: mailto:Larry.Thomas-at-pnl.gov


----------
From: L. D. Marks
Sent: Wednesday, March 7, 2001 10:21 AM
To: Microscopy List
Subject: Brittle samples

------------------------------------------------------------------------
The Microscopy ListServer -- Sponsor: The Microscopy Society of America
To Subscribe/Unsubscribe -- Send Email to ListServer-at-MSA.Microscopy.Com
On-Line Help http://www.msa.microscopy.com/MicroscopyListserver/FAQ.html
-----------------------------------------------------------------------.


We are having problems with preparing brittle TEM sample of (single
crystal) sapphire and magnesium orthovanadate via dimpling & PIPS. Any
suggestions beyond a kid-gloves approach?

-------------------------------------------------------
Laurence Marks
Department of Materials Science and Engineering
Northwestern University
Tel: (847) 491-3996 Fax: (847) 491-7820
mailto:ldm-at-risc4.numis.nwu.edu http://www.numis.nwu.edu
-------------------------------------------------------

Workshop May 17-19 2001 "New approaches to the Phase Problem"
http://xraysweb.lbl.gov/esg/phasing/index.html





From daemon Wed Mar 7 17:49:20 2001



From: Thomas, Larry (PNNL) :      Larry.Thomas-at-pnl.gov
Date: Wed, 07 Mar 2001 15:44:23 -0800
Subject: RE: Brittle samples - NOT CROSS-SECTION

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Laurie,

The purpose of gluing a metal ring to brittle samples before dimpling is
to support the sample. The sample is then waxed to the dimple grinding support
stub and dimpled through the washer. We use this method routinely with brittle
samples and not just cross sections. It's a good idea to carefullly clean the
sample and washer so the epoxy bonds well. One- or two-mil Mo hole or slot
washers usually work well for us, but we sometimes use other washer materials to
avoid confusing Mo in the sample with Mo deposition artifacts.

Larry

----------
From: L. D. Marks
Sent: Wednesday, March 7, 2001 11:38 AM
To: Microscopy List
Subject: Brittle samples - NOT CROSS-SECTION

------------------------------------------------------------------------
The Microscopy ListServer -- Sponsor: The Microscopy Society of America
To Subscribe/Unsubscribe -- Send Email to ListServer-at-MSA.Microscopy.Com
On-Line Help http://www.msa.microscopy.com/MicroscopyListserver/FAQ.html
-----------------------------------------------------------------------.


A quick clarification before I get deluged with responses about
how to do cross-sections; we are not trying to do this. All (?)
we want is a "conventional" 3mm disc sample of sapphire or
magnesium orthovanadate. No glue, no mounting on a Cu ring,
no nothing.

-------------------------------------------------------
Laurence Marks
Department of Materials Science and Engineering
Northwestern University
Tel: (847) 491-3996 Fax: (847) 491-7820
mailto:ldm-at-risc4.numis.nwu.edu http://www.numis.nwu.edu
-------------------------------------------------------

Workshop May 17-19 2001 "New approaches to the Phase Problem"
http://xraysweb.lbl.gov/esg/phasing/index.html





From daemon Wed Mar 7 18:11:31 2001



From: Purdy, Sam :      SPurdy-at-nationalsteel.com
Date: Wed, 7 Mar 2001 18:11:16 -0600
Subject: RE: countig grain size in archaeological iron samples

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


James Clatk:

the metallurgy or materials science group in your university should
be able to tell you all about grain size measurements.

Best regards

Sam Purdy
Technical Center
National Steel Corp.
Trenton Mi USA
spurdy-at-nationalsteel.com

} ----------
} From: James Clarke
} Sent: Wednesday, March 7, 2001 11:45 AM
} To: NIH-IMAGE-at-LIST.NIH.GOV
} Subject: countig grain size in archaeological iron samples
}
} IMAGERS!
} Hope some one can point me in the right direction. I need to be
} able to measure the grain size of metal samples which are of a
} heterogenous nature. I am using a PC and Scion image seems to
} have some of the things I need but some advice would be nice.
}
} ---------------------------------
} James Clarke
} J.Clarke1-at-bradford.ac.uk
}




From daemon Wed Mar 7 18:13:28 2001



From: Emma Lou Cardell :      cardelel-at-email.uc.edu
Date: Wed, 7 Mar 2001 18:13:41 -0600
Subject: MT2B Ultramicrotome

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Fellow Microtomists:
I am seeking information regarding 2 Sorvall MT2B ultramicrotomes that
still are in use and in good working condition for both semi-thin sections
and ultrathin sections. However, the faster speed of the return stroke of
the cutting cycle no longer engages, even though the duration and position
control belts are in tact for the slow-speed (cutting phase) of the cycle.
Is this a relatively simple repair, and is there a company in the
Cincinnati, Ohio, area that provides such repair service? [The serial
numbers of these microtomes are 7701673 and 7800584. Do the first 2 digits
reflect the year of manufacture (1977 and 1978 respectively)?] What would
be a fair price for microtomes of this ventage?
Thanks in advance for your assistance.
EL Cardell




From daemon Wed Mar 7 18:20:39 2001



From: De McKeown :      de-at-payload.com
Date: Wed, 7 Mar 2001 18:20:41 -0600
Subject: Question: Resolution and TV Lines

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html



}
}
} Email: de-at-payload.com
} Name: De McKeown
}
} Organization: Payload Systems
}
} Education: Graduate College
}
} Location: Cambridge, MA, USA
}
} Question: I need to determine the number of TV lines my microscope is
} giving me. I have a test target but it only goes to 266 l/mm and I have
} better resolution than that. I can't find a 'better' target and am stuck
} trying to get an answer. How can I do this or where can I go for a new
} target?
}
} I also have to find a contrast, but haven't got enough information yet to
} ask a good question.
}
} Thank you!!
}




From daemon Wed Mar 7 18:36:07 2001



From: Nestor J. Zaluzec :      zaluzec-at-microscopy.com
Date: Wed, 7 Mar 2001 18:36:04 -0600
Subject: Administrivia: Subject Lines & Viruses

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Colleagues.....

There is a rash of virus mail out on the net again, a number
of which are using "suggestive names" in the subject line.
As a precaution some people trash messages which appear
out of context.

While Humorous Titles are good for the soul (especially mine) and bring
a smile especially when one gets the implied joke, let me remind you
to at least add in the Subject Line with some standard notation so that
individuals can more easily judge source of the mail. After all, we know
that my Email filtering system is not perfect and suspect mail leaks
through every so often.

Some Keywords include: TEM, SEM, EDS, .Confocal, LM, SamPrep, etc...
check the FAQ site if you need idea's, but you can easily see what
I mean.

For example: the posting on "I've got the screws loose" could have be
preceeded or prepended by an appropriate Keyword like Microtome,
even if the word Microtome was in () or abbreviated as uTome.

Cheers....

Nestor
Your Friendly Neighborhood SysOp





From daemon Wed Mar 7 18:38:52 2001



From: L. D. Marks :      ldm-at-risc4.numis.nwu.edu
Date: Wed, 7 Mar 2001 18:36:36 -0600 (CST)
Subject: RE: Brittle samples - NOT CROSS-SECTION

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Unfortunately getting Mo (or anything else) on the sample destroys it
as far as I am concerned. So, we have to rule out anything like this
unless we can safely remove the metal with an acid (and not dissolve
the oxide in the process).

On Wed, 7 Mar 2001, Thomas, Larry (PNNL) wrote:

} Laurie,
}
} The purpose of gluing a metal ring to brittle samples before dimpling is
} to support the sample. The sample is then waxed to the dimple grinding support
} stub and dimpled through the washer. We use this method routinely with brittle
} samples and not just cross sections. It's a good idea to carefullly clean the
} sample and washer so the epoxy bonds well. One- or two-mil Mo hole or slot
} washers usually work well for us, but we sometimes use other washer materials to
} avoid confusing Mo in the sample with Mo deposition artifacts.
}
} Larry
}
} ----------
} From: L. D. Marks
} Sent: Wednesday, March 7, 2001 11:38 AM
} To: Microscopy List
} Subject: Brittle samples - NOT CROSS-SECTION
}
} ------------------------------------------------------------------------
} The Microscopy ListServer -- Sponsor: The Microscopy Society of America
} To Subscribe/Unsubscribe -- Send Email to ListServer-at-MSA.Microscopy.Com
} On-Line Help http://www.msa.microscopy.com/MicroscopyListserver/FAQ.html
} -----------------------------------------------------------------------.
}
}
} A quick clarification before I get deluged with responses about
} how to do cross-sections; we are not trying to do this. All (?)
} we want is a "conventional" 3mm disc sample of sapphire or
} magnesium orthovanadate. No glue, no mounting on a Cu ring,
} no nothing.
}
} -------------------------------------------------------
} Laurence Marks
} Department of Materials Science and Engineering
} Northwestern University
} Tel: (847) 491-3996 Fax: (847) 491-7820
} mailto:ldm-at-risc4.numis.nwu.edu http://www.numis.nwu.edu
} -------------------------------------------------------
}
} Workshop May 17-19 2001 "New approaches to the Phase Problem"
} http://xraysweb.lbl.gov/esg/phasing/index.html
}
}
}
}

-------------------------------------------------------
Laurence Marks
Department of Materials Science and Engineering
Northwestern University
Tel: (847) 491-3996 Fax: (847) 491-7820
mailto:ldm-at-risc4.numis.nwu.edu http://www.numis.nwu.edu
-------------------------------------------------------

Workshop May 17-19 2001 "New approaches to the Phase Problem"
http://xraysweb.lbl.gov/esg/phasing/index.html



From daemon Wed Mar 7 18:53:29 2001



From: Michelle Peiffer :      mlk101-at-psu.edu
Date: Wed, 07 Mar 2001 19:47:14 -0500
Subject: IEM high background

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Hi Listers,

A researcher has asked me to localize gluconase (a protein) in plant roots.
They provided me with antibody (sera) and preimmune, which they have used
in westerns. The problem is the preimmune is labelling the cell wall; the
labeling is quite impressive and very specific. Now they tell me (alas I
didn't ask before) that yes they have background on the westerns, but the
preimmune never labels the 32 Kd protein they are interested in. What is
the best approach to localize this 32 Kd protein? Should we cross absorb
everything else out, or would it be better to affinity purify for the
desired antibody. And why does this rabbit have such good antibodies to
cell wall?

Thank you,
Michelle


Michelle Peiffer
*************************************************************
Electron Microscope Facility for the Life Sciences
Penn State University Biotechnology Institute
001 South Frear Lab
University Park PA 16802

phone: 814-865-0212
email: mlk101-at-psu.edu
**************************************************************



From daemon Wed Mar 7 21:55:46 2001



From: Gordon Nord :      gnord-at-mindspring.com
Date: Wed, 07 Mar 2001 22:52:18 -0500
Subject: Re: Brittle samples - NOT CROSS-SECTION

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


The key to thinning brittle hard samples is to start with a doubly polished thin
section 30 micrometers thick.
Cut out 3 mm diameter discs with an ultrasonic probe.
Glue these to a glass slide with crystalbond, a thermal plastic cement that dissolves
in acetone.
Mechanically thin and polish to less than 10 micrometers or thinner.
Ion thin until satisfied.

Start thinning a thin sample. Don't break it. One good sample is all you need.

I have made many ion thinned samples of brittle materials, mainly shocked minerals,
for over thirty years.
Also this method is not for those in a hurry.

Gordon Nord
USGS Emeritus Scientist

"L. D. Marks" wrote:

} ------------------------------------------------------------------------
} The Microscopy ListServer -- Sponsor: The Microscopy Society of America
} To Subscribe/Unsubscribe -- Send Email to ListServer-at-MSA.Microscopy.Com
} On-Line Help http://www.msa.microscopy.com/MicroscopyListserver/FAQ.html
} -----------------------------------------------------------------------.
}
} Unfortunately getting Mo (or anything else) on the sample destroys it
} as far as I am concerned. So, we have to rule out anything like this
} unless we can safely remove the metal with an acid (and not dissolve
} the oxide in the process).
}
} On Wed, 7 Mar 2001, Thomas, Larry (PNNL) wrote:
}
} } Laurie,
} }
} } The purpose of gluing a metal ring to brittle samples before dimpling is
} } to support the sample. The sample is then waxed to the dimple grinding support
} } stub and dimpled through the washer. We use this method routinely with brittle
} } samples and not just cross sections. It's a good idea to carefullly clean the
} } sample and washer so the epoxy bonds well. One- or two-mil Mo hole or slot
} } washers usually work well for us, but we sometimes use other washer materials to
} } avoid confusing Mo in the sample with Mo deposition artifacts.
} }
} } Larry
} }
} } ----------
} } From: L. D. Marks
} } Sent: Wednesday, March 7, 2001 11:38 AM
} } To: Microscopy List
} } Subject: Brittle samples - NOT CROSS-SECTION
} }
} } ------------------------------------------------------------------------
} } The Microscopy ListServer -- Sponsor: The Microscopy Society of America
} } To Subscribe/Unsubscribe -- Send Email to ListServer-at-MSA.Microscopy.Com
} } On-Line Help http://www.msa.microscopy.com/MicroscopyListserver/FAQ.html
} } -----------------------------------------------------------------------.
} }
} }
} } A quick clarification before I get deluged with responses about
} } how to do cross-sections; we are not trying to do this. All (?)
} } we want is a "conventional" 3mm disc sample of sapphire or
} } magnesium orthovanadate. No glue, no mounting on a Cu ring,
} } no nothing.
} }
} } -------------------------------------------------------
} } Laurence Marks
} } Department of Materials Science and Engineering
} } Northwestern University
} } Tel: (847) 491-3996 Fax: (847) 491-7820
} } mailto:ldm-at-risc4.numis.nwu.edu http://www.numis.nwu.edu
} } -------------------------------------------------------
} }
} } Workshop May 17-19 2001 "New approaches to the Phase Problem"
} } http://xraysweb.lbl.gov/esg/phasing/index.html
} }
} }
} }
} }
}
} -------------------------------------------------------
} Laurence Marks
} Department of Materials Science and Engineering
} Northwestern University
} Tel: (847) 491-3996 Fax: (847) 491-7820
} mailto:ldm-at-risc4.numis.nwu.edu http://www.numis.nwu.edu
} -------------------------------------------------------
}
} Workshop May 17-19 2001 "New approaches to the Phase Problem"
} http://xraysweb.lbl.gov/esg/phasing/index.html

--
Gordon Nord
Small Business Network Design and Construction
Macintosh and Windows - Solutions and Conflicts

Nord Consultants
20594 Cornstalk Terrace
Ashburn VA 20147

Voice 703-723-2798 (Home Office)
Cell 703-403-2776 (Mobile Office)
Email gnord-at-mindspring.com




From daemon Wed Mar 7 22:59:12 2001



From: linda_knoll-at-msn.com
Date: Wed, 7 Mar 2001 22:57:12 -0600
Subject: Ask-A-Microscopist: cells of humans and apes

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Below is the result of your feedback form. It was submitted by
(linda_knoll-at-msn.com) from
http://www.msa.microscopy.com/Ask-A-Microscopist.html on Wednesday, March
7, 2001 at 18:43:01
---------------------------------------------------------------------------

Email: linda_knoll-at-msn.com
Name: Linda Knoll

Organization: St.Joseph'sAcademy

Education: Graduate College

Location: St. Louis, MO USA

Question: How do the cells of humans and apes differ when looked at under a
microscope?

---------------------------------------------------------------------------




From daemon Wed Mar 7 23:46:31 2001



From: georgas1-at-home.com
Date: Wed, 7 Mar 2001 23:46:13 -0600
Subject: Ask-A-Microscopist: fractal geometry to diagnose chronic

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Below is the result of your feedback form. It was submitted by
(georgas1-at-home.com) from
http://www.msa.microscopy.com/Ask-A-Microscopist.html on Wednesday, March
7, 2001 at 20:29:09
---------------------------------------------------------------------------

Email: georgas1-at-home.com
Name: Adam Georgas

Organization: UMS-Wright Preparatory School

Education: 9-12th Grade High School

Location: Mobile, Alabama, USA

Question: Dear Microscopist:
I am a 10th grade student working on my science fair project. My project
deals with a computer program I wrote using fractal geometry to diagnose
chronic lymphocytic leukemia. I obtained 25 pictures of normal cells taken
from a Phillips electron microscope and 25 pictures of leukemic cells taken
with the same microscope. I obtained these photographs from my mentor, a
physician/professor at the University of South Alabama. My concern with my
project is that the 25 healthy cells came from only one patient, and the 25
leukemic cells came from another patient. So, I have 50 cell pictures, 25
healthy, 25 leukemic, from only 2 patients. All of the research I have
read use 25 different patients with only one cell from each patient. I am
wondering if my study is valid? I posed this question to a local
pathologist. She told me that since the pictures were taken from an
electorn microscope, it was actually better to have more cells from just 2
patients. Is this true? If it is true, what is the rationale

---------------------------------------------------------------------------




From daemon Thu Mar 8 03:52:10 2001



From: Shu-You Li :      syli-at-mail.uni-mainz.de
Date: Thu, 8 Mar 2001 10:56:26 +0100
Subject: Re: JEOL 2000fxII aberration coefficients

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Hi Mark,

Here is some parameters of 2000FX with AHP2OL polepiece:
---------------------------------------------
Point resolution 0.31nm
Lattice resolution 0.14nm
OL focal length 4.1mm
Cs 3.4mm
Cc 3.1mm
---------------------------------------------

As to the question of beam semi-convergence angle, Prof. O'Keef has given a perfect note. I learnt a lot there as well.

Yours,
Shu-You Li
~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~
Shu-You Li, Dr.
Institut fuer Physikalische Chemie
Johannes Guttenberg Universitaet
Jakob-Welder-Weg 11
D-55099 Mainz, Germany

Fax: +49-6131-3923768 Tel: +49-6131-3923148(O)
E-mail: syli-at-mail.uni-mainz.de; syli16-at-hotmail.com
URL: http://syli.homepage.com/
(This URL contains my resume, SCI journal informations, JobList,
TEMAlert, as well as other useful informations related to Transmission
Electron Microscopy)
~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~





From daemon Thu Mar 8 03:58:50 2001



From: Richard M Langford :      richard.langford-at-materials.oxford.ac.uk
Date: Thu, 8 Mar 2001 09:51:45 -0000
Subject: 3-D reconstruction

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Dear All

Can anyone suggest suitable software for 3-D reconstruction of grains and
cracks from a sequential set of focused ion beam cross-sections.

Regards

Richard
--------------------------------------------------------------
Richard M Langford

Department of Materials, University of Oxford
Parks Road, Oxford, OX1 3PH, UK

Tel: +44 (0)1865 273799, Fax: +44 (0)1865 273789
email: richard.langford-at-materials.oxford.ac.uk
----------------------------------------------------------------------------



From daemon Thu Mar 8 06:30:14 2001



From: Roger Moretz :      rcmoretz-at-excite.com
Date: Thu, 8 Mar 2001 04:23:52 -0800 (PST)
Subject: Re: I've got the screws loose

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Paula:
Get in touch with Helmut Patzig at MOC, Spring Valley, NY. His email is
Mocleica-at-aol.com. If anybody has the know-how and parts, I am pretty sure
he does. Sorry I don't know of anyone closer to DC, but I have dealt with
Helmut over the years with obsolete Reichert and LKB equipment.

Roger Moretz, Ph.D.
Dept of Toxicology
Boehringer Ingelheim Pharmaceuticals, Inc.

On Wed, 07 Mar 2001 08:31:14 -0500, Paula Sicurello wrote:

| ------------------------------------------------------------------------
| The Microscopy ListServer -- Sponsor: The Microscopy Society of America
| To Subscribe/Unsubscribe -- Send Email to ListServer-at-MSA.Microscopy.Com
| On-Line Help http://www.msa.microscopy.com/MicroscopyListserver/FAQ.html
| -----------------------------------------------------------------------.
|
|
| Hi Listers,
|
| I have a LKB Bromma 11800 Pyramitome whose belt has come loos and it
needs to be replaced. I can't find the instruction manual or the slip of
paper that my predecessor wrote the service person's name on.
|
| Does anybody out there have a source for the instruction manual? I
called Leica but they told me this machine was absolete when they acquired
the LKB line.
|
| I'll fix this thing myself if anyone can send me a copy of the manual
(I'll glaly pay for the cost of copying and shipping).
|
| If anyone knows of a repair person who still works on these ancient
beasties, please let me know. It would be good to have someone who could
give them tune-ups every now & then.
|
| My screws are loose and I've got the hammer, blow torch sosme bubble gum
and bailing wire....now all I need is the manual.
|
|
| Pretty please??
|
| Paula :-)
|
| Paula Sicurello
| George Washington Univ. Medical Center
| Dept. of Pathology, Ross Hall rm 505
| Electron Microscope Lab
| 2300 Eye St.
| Washington, DC 20037
| 202-994-2930 phone
| 202-994-2518 fax
|
|


Roger Moretz, Ph.D.
Dept of Toxicology
Boehringer Ingelheim Pharmaceuticals, Inc.
900 Rigdebury Road
Ridgefield, CT 06877
203-798-5448





_______________________________________________________
Send a cool gift with your E-Card
http://www.bluemountain.com/giftcenter/




From daemon Thu Mar 8 07:07:50 2001



From: White, Woody N. :      nwwhite-at-mcdermott.com
Date: Thu, 8 Mar 2001 06:56:30 -0600
Subject: RE: Question: Resolution and TV Lines

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


The answer depends on the details of the "TV" system and microscope used.
At this point I don't even know if it is an optical or electron microscope,
etc... It should be noted that actual microscope resolution and the
displayed resolution via TV have little in common.

NTSC (US) TV is 525 lines vertical (total, and the equevelant of 280 to over
640 horizontal (bandwidth dependent). Note that not all 525 lines are used
for the image.

PAL, a standard used in many other areas of the world is slightly higher
vertical resolution, but not much.

There are other "non-brodcast standard" resolutions used by custom
instrumentation.

Woody

} --------------------------------------------------------------
} ----------
} The Microscopy ListServer -- Sponsor: The Microscopy Society
} of America
} To Subscribe/Unsubscribe -- Send Email to
} ListServer-at-MSA.Microscopy.Com
} On-Line Help
} http://www.msa.microscopy.com/MicroscopyListserver/FAQ.html
} --------------------------------------------------------------
} ---------.
}
}
}
} }
} }
} } Email: de-at-payload.com
} } Name: De McKeown
} }
} } Organization: Payload Systems
} }
} } Education: Graduate College
} }
} } Location: Cambridge, MA, USA
} }
} } Question: I need to determine the number of TV lines my
} microscope is
} } giving me. I have a test target but it only goes to 266
} l/mm and I have
} } better resolution than that. I can't find a 'better'
} target and am stuck
} } trying to get an answer. How can I do this or where can I
} go for a new
} } target?
} }
} } I also have to find a contrast, but haven't got enough
} information yet to
} } ask a good question.
} }
} } Thank you!!
} }
}
}
}


From daemon Thu Mar 8 07:20:27 2001



From: Debby Sherman :      dsherman-at-purdue.edu
Date: Wednesday, March 7, 2001 2:55 PM
Subject: Fwd: TEM - immunolabeling

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

------------------------------------------------------------------------
The Microscopy ListServer -- Sponsor: The Microscopy Society of America


Tina,
Check the following reference for your answer to your second question:

Liposits, Zs., D. Sherman, C. Phelix and W.K. Paull. (1986). A combined light and electron microscopic immunocytochemical method for the simultaneous localization of multiple tissue antigens. Histochemistry 85:95-106.

We very successfully used vibraotomed sections of brain to do light and EM ICC. Becuase of the penetration problems for the gold conjugates available at that time, we used PAP-DAB for visualization on the light level followed by silver intensification of the material for EM visualization. The study involved serial sectioning of the material to locate synapses so flat embedding of the sections was manditory. The method is fully discribed in the paper but feel free to contact me if you have questions.

I would also try using the ultra small gold colloids presently on the market followed by silver intensification as an alternative to the PAP-DAB technique.

Debby

Debby Sherman Phone: 765-494-6666
Life Science Microscopy Facility FAX: 765-494-5896
Purdue University E-mail: dsherman-at-purdue.edu
S-099e Whistler Building
West Lafayette, IN 47907


--------------------------------------


I have two questions for you immunolabeling experts.

First, a client has some precious and irreplaceable histological sections
of human hippocampus that have been labeled with ABC - DAB. Will it be
possible for me to de-paraffinize the sections, expose them to osmium
vapor and re-embed them in resin on the slide and pop them off and
resection them and see the DAB precipitate? Anyone have a protocol that
has worked?

Second, these researchers plan to use Vibratome sections of mouse brain
and immunolabel them for light microscopy using an ABC kit. I have done
on-ultrathin-section colloidal gold immunolabeling for TEM. However, for
this new project we would like to try pre-embedding labeling of 50-60
micrometer Vibratome sections, then embed and resection them for
TEM. Knowing what works for light microscopy, we'd like to use
streptavidin/colloidal gold or whatever for TEM visualization. My question
is, of course, does anyone have a favorite protocol they would be willing
to share? How do I keep the sections from curling? If we stick them on a
glass slide to embed in resin and (hopefully) pop off later for
resectioning, when and how do I get the to adhere?

Mahalo!

Tina

http://www.pbrc.hawaii.edu/bemf/microangela
****************************************************************************
* Tina (Weatherby) Carvalho * tina-at-pbrc.hawaii.edu *
* Biological Electron Microscope Facility * (808) 956-6251 *
* University of Hawaii at Manoa * http://www.pbrc.hawaii.edu/bemf*
****************************************************************************





From daemon Thu Mar 8 08:24:10 2001



From: Tobias Baskin :      BaskinT-at-missouri.edu
Date: Thu, 8 Mar 2001 08:17:36 -0600
Subject: Re: IEM high background

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Michelle,
The answer to the last question is easy. Remember Bugs Bunny
munching his carrot? Rabbits eat plants so it is not too surprising
that a preimmune serum recognizes a plant antigen, if not several.

What we have done in situations like this is to incubate the
serum with the protein of interest (in this case, the 32kD glucanase)
and then stain with that. This removes the specific glucanse
staining. It is a kind of guilt by subtraction. It is not as nice as
doing affinity purification, but it is a lot faster, and conserves
the serum.

Hope this helps,
Tobias Baskin


} ------------------------------------------------------------------------
} The Microscopy ListServer -- Sponsor: The Microscopy Society of America

--
_ ____ __ ____ Tobias I. Baskin
/ \ / / \ / \ \ 109 Tucker Hall
/ / / / \ \ \ Biological Sciences
/_ / __ /__ \ \ \__ University of Missouri
/ / / \ \ \ Columbia, MO USA
/ / / \ \ \ 65211-7400
/ / ___ / \ \__/ \ ____ voice: 573-882-0173
fax: 573-882-0123


From daemon Thu Mar 8 08:24:12 2001



From: Massimo Catalano :      massimo.catalano-at-ime.le.cnr.it
Date: Thu, 8 Mar 2001 08:18:50 -0600
Subject: CERIUS2: HREM simulation of quantum dots

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Dear Listservers,
we have been recently working on structural and compositional
characterization of InGaAs/GaAs quantum dots grown by MOVPE, achieving
interesting results.
We have tried to use CERIUS2 to obtain simulations of cross sectional HREM
images of these dots, but we experienced several problems.
Is there anyone who has spent time on similar matters. We would like to
discuss and compare our experiences, to understand if our problems are due
to a bad construction of the supercell or to limitations of the software.
Thanks
Massimo




From daemon Thu Mar 8 08:42:12 2001



From: James M. Ehrman :      jehrman-at-mta.ca
Date: Thu, 08 Mar 2001 10:40:28 -0400
Subject: Re: homemade transmitted electron detector

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Hello again listers,

Thanks for all the responses to my original query. At the suggestion
of Bart Cannon, you can check out my detector design at:

http://www.mta.ca/~jehrman/ted.htm

I perhaps should have clarified originally that this is a very simple
design, and does not require any additional electronics, light pipes,
PMT, etc. My machinist made it for me in an afternoon. I took
inspiration
from a single sentence in Goldstein, et. al (SEM and X-ray
Microanalysis,
2nd edition, p. 267):

"A simple, inexpensive detector can be made from a high-atomic-number
scattering surface placed below the specimen and tilted so that the
transmitted electrons are scattered toward the conventional E-T
detector in the specimen chamber"

} From my experience with one commercially available "real" TED a number
of years ago, the homemade detector seems to perform as well (or better)

than the real thing.

No reference was given in the text, so I'm rather curious who came up
with
the idea originally. Are there any co-authors of the text lurking nearby
who
could shed any light?

Cheers,

Jim

--

James M. Ehrman
Digital Microscopy Facility
Mount Allison University
Sackville, NB E4L 1G7
CANADA

phone: 506-364-2519
fax: 506-364-2505
email: jehrman-at-mta.ca
www: http://www.mta.ca/~jehrman




From daemon Thu Mar 8 11:54:23 2001



From: William F. Tivol :      wft03-at-health.state.ny.us
Date: Thu, 8 Mar 2001 12:46:00 -0500
Subject: Re: Ask-A-Microscopist: fractal geometry to diagnose chronic

Contents Retrieved from Microscopy Listserver Archives
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Email: georgas1-at-home.com
Name: Adam Georgas

Organization: UMS-Wright Preparatory School

Education: 9-12th Grade High School

Location: Mobile, Alabama, USA

Question: Dear Microscopist:
I am a 10th grade student working on my science fair project. My project
deals with a computer program I wrote using fractal geometry to diagnose
chronic lymphocytic leukemia. I obtained 25 pictures of normal cells taken
from a Phillips electron microscope and 25 pictures of leukemic cells taken
with the same microscope. I obtained these photographs from my mentor, a
physician/professor at the University of South Alabama. My concern with my
project is that the 25 healthy cells came from only one patient, and the 25
leukemic cells came from another patient. So, I have 50 cell pictures, 25
healthy, 25 leukemic, from only 2 patients. All of the research I have
read use 25 different patients with only one cell from each patient. I am
wondering if my study is valid? I posed this question to a local
pathologist. She told me that since the pictures were taken from an
electorn microscope, it was actually better to have more cells from just 2
patients. Is this true? If it is true, what is the rationale

---------------------------------------------------------------------------

Dear Adam,
First, there is nothing about data from an electron microscope that makes
sample selection any different from that used with other forms of data. The
idea is that the population in your sample--in this case the normal and leukemic
cells--should be representative of the larger population--all human normal
lymphocytes and all human leukemic lymphocytes. If all normal lymphocytes in
any one person have identical morphology, then any one cell will represent the
population; if lymphocytes vary within an individual, then you would need a
selection having the same distribution of types as exist in the whole person.
This is usually obtained by selecting a small sample volume "at random". You
might imagine how this could go wrong; e.g., if certain types were not present
in arterial blood to the same extent as in venous blood.
The next consideration is whether either normal lymphocytes or leukemic
lymphocytes differ from person to person. I can see no reason that this would
not be the case--especially if different forms of leukemia result from different
transformation processes; e.g., different mutations or different extents of gene
expression.
In order to be sure that your sample is relevant, you would need to know
whether there were different types of normal and leukemic cells both within and
among individuals. This is an area where I am completely ignorant, but there is
probably an extensive literature on this. There could also be differences
arising from the preparation of the cells for EM, such as variation in fixation
or staining, which can give apparent differences from nomonally identical cells.
Good luck.
Yours,

Bill Tivol
Wadsworth Center
Albany NY
(518) 473-7399 WFT02-at-health.state.ny.us




From daemon Thu Mar 8 12:32:37 2001



From: Vu Phan :      vtp_adi-at-yahoo.com
Date: Thu, 8 Mar 2001 10:28:57 -0800 (PST)
Subject: Secondary Electron Detector - ISI 50A

Contents Retrieved from Microscopy Listserver Archives
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Hi,
I just started to bring up an ISI-SR50A. Followed the procedure to replace
the filament, saturate beam current and aligment correctly but I could not
get a decent image on the CRT even at low mag, 200x. Is there a way to
check the detector?
I varied the applied voltage from 5KV to 20KV and WD from 7mm to 40mm
without any success.
Any suggestions are welcome.
-Vu.

__________________________________________________
Do You Yahoo!?
Get email at your own domain with Yahoo! Mail.
http://personal.mail.yahoo.com/


From daemon Thu Mar 8 15:16:29 2001



From: thoma226-at-msu.edu
Date: Thu, 8 Mar 2001 15:14:24 -0600
Subject: Ask-A-Microscopist: zooxanthellae from Cnidarians

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Email: thoma226-at-msu.edu
Name: James Thomas

Organization: Michigan State University

Education: Graduate College

Location: East Lansing, MI USA

Question: How do I attach zooxanthellae from Cnidarians to a stub to view
in SEM? Centrifuging? Fixing? etc?

---------------------------------------------------------------------------




From daemon Thu Mar 8 15:16:30 2001



From: Walck, Scott D. :      walck-at-ppg.com
Date: Thu, 8 Mar 2001 16:12:38 -0500
Subject: top hat filter vs background subtraction for integrated peak inte

Contents Retrieved from Microscopy Listserver Archives
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Here are two questions that I am pondering at the moment for thin film analysis in the TEM.

If you take the integrated intensities of the center portions of the peaks (zero crossing to zero crossing) of a top hat filtered spectrum to use for quantification, will you get the same results as you would if you do a background subtraction and take the integrated intensities from the peaks themselves?

For the integrated intensities of a top hat filtered spectrum, is it more appropriate to include the two negative lobes of the filtered peak added to the center portion?

-Scott

Scott D. Walck, Ph.D.
PPG Industries, Inc.
Glass Technology Center
Guys Run Rd. (packages)
P. O. Box 11472 (letters)
Pittsburgh, PA 15238-0472

Walck-at-PPG.com

(412) 820-8651 (office)
(412) 820-8161 (fax)




From daemon Thu Mar 8 15:24:09 2001



From: Edward_Principe-at-amat.com
Date: Thu, 8 Mar 2001 13:20:23 -0800
Subject: 3-D reconstruction

Contents Retrieved from Microscopy Listserver Archives
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There are two freeware software packages that can accomplish this effort.

An IBM inspired software called OpenDX (for Unix), which is quite advanced.
Start here (I have just installed this software but not worked with it yet):

http://www.opendx.org/

and through scion image, which is a PC version of NIH image. Start at the link
below

http://rsb.info.nih.gov/nih-image/

You must install the ImageJ plugin, which you can obtain from:

http://www.isi.uu.nl/people/michael/vr.htm

This site also has other links for related information.

I am pursuing similar work with FIB/ Auger on particles and I would love to know
about your progress.
I believe this area has interesting and useful applications and I have found
only
very limited publications in this area. I would appreciate any additional
information
you might have.

Good Luck !

Regards,
Ed


************************************************************
Edward Principe, Ph.D.
Member of Technical Staff
Defect & Thin Film Characterization Laboratory
Applied Materials
408-986-3882



"Richard M Langford" {richard.langford-at-materials.oxford.ac.uk} on 03/08/2001
01:51:45 AM


To: microscopy-at-sparc5.microscopy.com
cc: (bcc: Edward Principe/APPLIED MATERIALS)


Dear All

Can anyone suggest suitable software for 3-D reconstruction of grains and
cracks from a sequential set of focused ion beam cross-sections.

Regards

Richard
--------------------------------------------------------------
Richard M Langford

Department of Materials, University of Oxford
Parks Road, Oxford, OX1 3PH, UK

Tel: +44 (0)1865 273799, Fax: +44 (0)1865 273789
email: richard.langford-at-materials.oxford.ac.uk
----------------------------------------------------------------------------






From daemon Thu Mar 8 16:48:49 2001



From: John J. Bozzola :      bozzola-at-siu.edu
Date: Thu, 8 Mar 2001 16:50:32 -0600
Subject: TEM: cholesterol crystals

Contents Retrieved from Microscopy Listserver Archives
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Dear Richard,

If you only need to do reconstruction, download our free VoxBlast Light
software at www.vaytek.com. Go to VoxBlast 3D software, then VoxBlast Light
3.0.

If you need any help or want more functionality, feel free to contact us
directly.


Best regards,

Steve Niemela
Sales
sniemela-at-vaytek.com
Ph: 641-472-2227
Fax: 641-472-8131

VayTek, Inc.
305 West Lowe Avenue
Fairfield IA 52556
www.vaytek.com
----- Original Message -----
} From: "Richard M Langford" {richard.langford-at-materials.oxford.ac.uk}
To: {microscopy-at-sparc5.microscopy.com}
Sent: Thursday, March 08, 2001 3:51 AM


A colleague is looking for a published reference that describes
cholesterol crystals using transmission electron microscopy. We have
searched the web but found only light microscopy of the crystals. Any
help would be appreciated.

Thank you,

--
##############################################################
John J. Bozzola, Ph.D., Director
I.M.A.G.E. (Integrated Microscopy & Graphics Expertise)
750 Communications Drive - MC 4402
Southern Illinois University
Carbondale, IL 62901 U.S.A.
Phone: 618-453-3730
Fax: 618-453-2665
Email: bozzola-at-siu.edu
Web: http://www.siu.edu/departments/shops/cem.html
##############################################################


From daemon Thu Mar 8 17:14:23 2001



From: David Knecht :      knecht-at-uconn.edu
Date: Thu, 8 Mar 2001 18:11:04 -0500
Subject: Job posting-Flow Cytometry/Microscopy Facility Scientist

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Facility Scientist (Academic Assistant III)
Flow Cytometry and Confocal Imaging Facility, Biotechnology Center

The Biotechnology Center and the Department of Molecular and Cell
Biology at the University of Connecticut invite applications for the
position of Facility Scientist for the Flow Cytometry and Confocal
Imaging Facility. This Facility houses a Becton Dickson FACSCalibur
Flow Cytometer/cell sorter, a Leica SP2 laser scanning confocal
microscope and several other microscope and image processing
workstations. The facility scientist will be responsible for working
with University faculty and students to develop research projects
that utilize these instruments and related technologies. The
facility scientist will also organize periodic training sessions and
workshops to familiarize new users with the instruments. This
individual will also be encouraged to develop collaborative research
projects with University faculty and with local biotechnology
businesses. We seek an individual who is excited by the challenges
of an interdisciplinary research group and who enjoys interacting
with people in an active scientific environment. The preferred
candidate will have a Ph.D. in the biological sciences and
familiarity with one or both of the core technologies. This is a
full-time, annually renewable position. Salary will be commensurate
with experience and education. Submit curriculum vitae, a statement
of experience and interests, and the names, addresses, telephone
numbers and e-mail addresses of at least three references to:
Biotechnology Center, Confocal Search Committee, University of
Connecticut, 184 Auditorium Rd., Unit 3149, Storrs, CT 06269-3149.
Applications may also be faxed to (860) 486-5005 or sent
electronically to biotctr1-at-uconnvm.uconn.edu. Screening of
applications will begin immediately and continue until the position
is filled.

We encourage applications from under-represented groups including
minorities, women and people with disabilities. (Search #01A372)
--

************************************************************
Dr. David Knecht
Department of Molecular and Cell Biology
University of Connecticut
75 N. Eagleville Rd. U-125
Storrs, CT 06269-3125
Knecht-at-uconnvm.uconn.edu
860-486-2200 860-486-4331 (fax)
home page: http://www.sp.uconn.edu/~mcbstaff/knecht/knecht.html
************************************************************


From daemon Thu Mar 8 17:47:13 2001



From: Thomas, Larry (PNNL) :      Larry.Thomas-at-pnl.gov
Date: Thu, 08 Mar 2001 15:43:36 -0800
Subject: jet electropolisher fire

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The following posting is for a colleague who is not on the listserver.

Larry Thomas
Pacific Northwest National Laboratory
Richland, WA 99352
Phone: (509)372-0793 Fax: (509)376-6308
Email: mailto:Larry.Thomas-at-pnl.gov


We recently experienced a fire using a 5% perchloric acid - methanol electrolyte
in a commercial jet electropolisher, and request information on similar
experiences.

During operation of the electropolishing unit at room temperature and moderate
pump speed, when turning up the voltage towards 30 V a loud pop was heard and
the reservoir was found to be in flames. The fire was quickly extinguished
using a dry fire extinguisher, but the reservoir and cable shielding melted.

We would appreciate any input on similar experiences using electropolishers with
this or similar electrolytes. Any explanations for this behavior that you can
provide would also be appreciated.

David S. Gelles
Structural Materials Research
Pacific Northwest National Laboratory
Richland, WA 99353
Tel: (509) 376-3141
Fax: (509) 376-0418
E-mail: ds_gelles-at-pnl.gov



From daemon Thu Mar 8 19:59:02 2001



From: Frederick Schamber :      fhscham-at-stargate.net
Date: Thu, 08 Mar 2001 21:07:01 -0500
Subject: Re: top hat filter vs background subtraction for integrated peak

Contents Retrieved from Microscopy Listserver Archives
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There are two ways that the top-hat filter has been used for quantifying EDS spectra:

(1) One can simply apply the filter to the spectrum as you suggest -- what results looks much like the second derivative of the original spectrum and each peak is represented by a central positive lobe with a negative lobe on either side. The slowly varying (continuum) components of the spectrum are
suppressed. With care, one can relate the area of the positive lobe to the area of the original peak, however, there are some issues which make this simple concept a less than satisfactory quantitative method: (1) the area of the positive lobe is proportional to the area of the original peak, but the
proportionality is a function of both peak area and filter shape. Thus the proportionality varies with the peak energy since the peak width varies with energy. (2) overlapping and adjacent peaks will interfere with each other, and this interference is actually increased by the broadening effect of the
filter. Oddly enough, I have seen a number of familiar reference works which seem to give me credit for inventing the "top hat filter" used in this way -- I didn't. I saw it used this way for nuclear gamma ray spectra in the early '70s and after trying it myself, realized that it really wasn't
satisfactory. But this experience did lead to the "filter-fit" method which follows.

(2) The"right" way for using the top-hat filter for continuum suppression is to use it in conjunction with linear-least squares fitting. One simply filters the unknown and each of the reference spectra to be fitted to it and then applies a conventional linear fit between them. When one fits the filtered
references to the filtered unknown, the fact that the spectra have been distorted by the filter is immaterial (since the filter operator is linear), the overlaps are accurately unfolded, and the continuum basically drops out of the problem. Properly implemented, this is a very good quantitiative technique
and has been employed productively for almost 30 years. If interested, the technique is published in NBS 604 (P273) or interested parties could contact me for references to several other papers describing it.

Fred Schamber


"Walck, Scott D." wrote:

} ------------------------------------------------------------------------
} The Microscopy ListServer -- Sponsor: The Microscopy Society of America
} To Subscribe/Unsubscribe -- Send Email to ListServer-at-MSA.Microscopy.Com
} On-Line Help http://www.msa.microscopy.com/MicroscopyListserver/FAQ.html
} -----------------------------------------------------------------------.
}
} Here are two questions that I am pondering at the moment for thin film analysis in the TEM.
}
} If you take the integrated intensities of the center portions of the peaks (zero crossing to zero crossing) of a top hat filtered spectrum to use for quantification, will you get the same results as you would if you do a background subtraction and take the integrated intensities from the peaks themselves?
}
} For the integrated intensities of a top hat filtered spectrum, is it more appropriate to include the two negative lobes of the filtered peak added to the center portion?
}
} -Scott
}
} Scott D. Walck, Ph.D.
} PPG Industries, Inc.
} Glass Technology Center
} Guys Run Rd. (packages)
} P. O. Box 11472 (letters)
} Pittsburgh, PA 15238-0472
}
} Walck-at-PPG.com
}
} (412) 820-8651 (office)
} (412) 820-8161 (fax)



From daemon Thu Mar 8 20:59:35 2001



From: Diana van Driel :      dianavd-at-eye.usyd.edu.au
Date: Fri, 9 Mar 2001 13:56:15 +1000
Subject: re: TEM - immunolabeling

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Hi Tina,

I've been gold immunolabelling whole retina pieces - 300um thick
sheets - with great success (LM and EM) for years. I react the tissue
in small vials, floating around loose. Briefly, you need a fixative
like PLP or paraformaldehyde - any glut in the fix and antibody
access to the tissue is decreased and you just get labelling on the
cut edges. Use saponin in all solutions for penetration enhancement.
Use an Fab2 anti Ig conjugated to 1 nm gold. Silver enhance then gold
tone. Pop tissue in a silicon mould for embedding. If this sounds
useful I can send you the full method.

As for rescuing paraffin sections, I did some a long time ago. From
memory the resulting tissue looked like squashed newspaper - a mushy
black mess with a hint of structure. I can't imagine even being able
to distinguish the DAB from the rest, let alone see what was
labelling. However, maybe methods have improved.

Cheers,

Diana
--



Diana van Driel
Department of Clinical Ophthalmology
Sydney University
GPO Box 4337
Sydney NSW
AUSTRALIA 2001

Phone 61 2 938 27278/27395
Mob 0412 165 075
Fax 61 2 938 27318


From daemon Fri Mar 9 03:47:39 2001



From: Steven Celotto :      s.celotto-at-liverpool.ac.uk
Date: Fri, 09 Mar 2001 09:42:22 +0000
Subject: Re: jet electropolisher fire

Contents Retrieved from Microscopy Listserver Archives
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In my opinion what happened was that a spark between the cathode and specimen, which
often occurs at those voltages during electropolishing, ignited the electrolyte. I
have used other electrolytes at voltages greater than 30V and I have also head a
crackling noise which indicated to me that was sparking. Fortunately the electrolyte
was not as ignitable as a 5% perchloric acid - methanol electrolyte. Nevertheless, I
kept the voltage below that just in case for the electrolyte was still based on
organic solvents.

You are going to be bombarded by horror stories and cautions about electrolytes
containing perchloric acid. And they are right. I will not say that I have used
electrolytes containing up to 30 vol.% in ethanol without problems because that
would be tempting fate and I have enough Sicilian blood in me to make me a bit
superstitious.

I have some recommendations.

1. As far as I know, perchloric acid electrolytes only require a voltage of 15V max.
It is rare that I have used voltages in excess of 25V for any electrolyte and that
was with an electrolyte of methanol, Butoxy-ethanol, magnesium perchlorate and
lithium chloride (LiCl). This was the electrolyte where above 30V I was getting
sparking. I have used water based electrolytes above 30V sometimes, but ignition is
not an issue there.

2. Whenever making up or using an electrolyte containing perchloric acid, cool it
down. When making it up, this prevents ignition due to heat of dissolution of the
concentrate acid as it mixes. This may be paranoia. Cooling during electropolishing
is necessary because it also reduces the risk if ignition and it improves the
electropolishing process. I have found that most organic based electrolytes,
especially those based on ethanol and methanol require cooling to {20°C in order to
achieve the correct electropolishing conditions. So the necessity of cooling is two
fold.

I hope this is useful.


"Thomas, Larry (PNNL)" wrote:

} ------------------------------------------------------------------------
} The Microscopy ListServer -- Sponsor: The Microscopy Society of America
} To Subscribe/Unsubscribe -- Send Email to ListServer-at-MSA.Microscopy.Com
} On-Line Help http://www.msa.microscopy.com/MicroscopyListserver/FAQ.html
} -----------------------------------------------------------------------.
}
} The following posting is for a colleague who is not on the listserver.
}
} Larry Thomas
} Pacific Northwest National Laboratory
} Richland, WA 99352
} Phone: (509)372-0793 Fax: (509)376-6308
} Email: mailto:Larry.Thomas-at-pnl.gov
}
} We recently experienced a fire using a 5% perchloric acid - methanol electrolyte
} in a commercial jet electropolisher, and request information on similar
} experiences.
}
} During operation of the electropolishing unit at room temperature and moderate
} pump speed, when turning up the voltage towards 30 V a loud pop was heard and
} the reservoir was found to be in flames. The fire was quickly extinguished
} using a dry fire extinguisher, but the reservoir and cable shielding melted.
}
} We would appreciate any input on similar experiences using electropolishers with
} this or similar electrolytes. Any explanations for this behavior that you can
} provide would also be appreciated.
}
} David S. Gelles
} Structural Materials Research
} Pacific Northwest National Laboratory
} Richland, WA 99353
} Tel: (509) 376-3141
} Fax: (509) 376-0418
} E-mail: ds_gelles-at-pnl.gov

--
Dr. Steven Celotto
Department of Engineering
Materials Science & Engineering
University of Liverpool
Brownlow Hill
Liverpool L69 3BX
UNITED KINGDOM

Telephone (UK) 0151-794-4692 (Int.) +44-151-794-4692
Fax. (UK) 0151-794-4675 (Int.) +44-151-794-4675
email: s.celotto-at-liv.ac.uk




From daemon Fri Mar 9 06:14:57 2001



From: Diego :      diegoalv-at-incar.csic.es
Date: Fri, 9 Mar 2001 14:42:18 +0100
Subject: Re: Secondary Electron Detector - ISI 50A

Contents Retrieved from Microscopy Listserver Archives
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I don´t know about the ISI50A but, assuming that it has the typical
Everhard-Thornley design, isn´t it just possible that the bias voltage is
inverted in your detector?. If the bias voltage is set negative, it´ll be
rejecting all the secondary electrons, and you would only get a generally
noisy image composed of the primary electrons backscattered in the very
direction of the detector´s position. Quite nice for topographic information
about flat specimens, but far worse quality than in "normal" SE images.
Pardon me if I raised a too obvious explanation, but it occurred to me
sometimes to get puzzled with a bad functioning of my SE detector just
because another user of the microscope had been playing with the knobs.

Cheers

Diego


Diego Alvarez
Instituto Nacional del Carbón
INCAR-CSIC
Spain



From daemon Fri Mar 9 07:42:00 2001



From: Paula Sicurello :      patpxs-at-gwumc.edu
Date: Fri, 09 Mar 2001 08:36:17 -0500
Subject: My pyramitome has many heroes

Contents Retrieved from Microscopy Listserver Archives
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Hi Listers,

Thanks to all who responded to may plea for help in finding either a manual or a service person for the wee beastie.

Slowly but surely I will tighten the screws.....


Thanks again!


Paula :-)

Paula Sicurello
George Washington Univ. Medical Center
Dept. of Pathology, Ross Hall rm 505
Electron Microscope Lab
2300 Eye St.
Washington, DC 20037
202-994-2930 phone
202-994-2518 fax



From daemon Fri Mar 9 08:26:51 2001



From: Tim E. Harper :      tim-at-cmp-cientifica.com
Date: Fri, 9 Mar 2001 15:22:37 +0100
Subject: TNT2k1

Contents Retrieved from Microscopy Listserver Archives
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Dear All,

Full details of Trends in Nanotechnology (TNT) 2001, Segovia, Spain,
September 2001, are now available. Based on the same format as last year,
the conference aims to bring together researchers from all disciplines
relating to nanotechnology, in a setting with ample time for interaction. A
new feature this year will be the availability of grants to enable graduate
students to attend and present posters.

Full details can be found at www.cmp-cientifica.com/tnt2001

Regards

Tim

*****************************************************************
Tim E. Harper CEO
CMP Cientifica s.l.
Space & NanoTechnology Division
Phone +34 91 640 71 85 Fax +34 91 640 71 86
http://www.cmp-cientifica.com/




From daemon Fri Mar 9 09:03:41 2001



From: Eric Steel :      eric.steel-at-nist.gov
Date: Fri, 09 Mar 2001 09:58:36 -0500
Subject: Re: analysis of EDS X-ray spectra

Contents Retrieved from Microscopy Listserver Archives
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The NIST's web link to DTSA can be found at:
http://www.cstl.nist.gov/div837/837.02/MicroscopySoftware.html

This program is free and available for the Macintosh only.


Eric B. Steel, Leader e-mail: eric.steel-at-nist.gov
Microanalysis Research Group Office: 301-975-3902
N.I.S.T. FAX: 301-417-1321
100 Bureau Drive, Stop 8371
Gaithersburg, MD 20899-8371
http://www.nist.gov/cstl/div837/837.02/


From daemon Fri Mar 9 10:29:52 2001



From: Edmund Gierlik :      gierlik-at-delta.sggw.waw.pl
Date: Fri, 09 Mar 2001 17:24:27 +0100
Subject: ESEM-Need presentation of phase transition.

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Email: gierlik-at-delta.sggw.waw.pl
Name: Edmund Gierlik

Organization: Electron Microscopy Lab.

Education: professor

Location: Warsaw, Poland

Question: Can anybody show the source of nice presentation of ESEM
application in
a phase transition investigation (water - ice, liquid - solid)?


From daemon Fri Mar 9 15:05:07 2001



From: Ellen S. Morgan :      emorgan-at-caregroup.harvard.edu
Date: Fri, 9 Mar 2001 16:02:53 -0500
Subject: Formvar Coated grids

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Any advice for a novice about using formvar coated slot grids for
biological Epon sections? Thanks


From daemon Sun Mar 11 13:43:55 2001



From: Ellen S. Morgan :      emorgan-at-caregroup.harvard.edu
Date: Sun, 11 Mar 2001 14:31:50 -0500
Subject: Using Formvar Grids

Contents Retrieved from Microscopy Listserver Archives
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TO be more specific, any advice on using formvar coated slot grids for
serial sections. They seem to crinkle, or get blobby, right on the vessel
I want to look at.


From daemon Mon Mar 12 06:51:53 2001



From: Roger Moretz :      rcmoretz-at-excite.com
Date: Mon, 12 Mar 2001 04:36:11 -0800 (PST)
Subject: Re: Using Formvar Grids

Contents Retrieved from Microscopy Listserver Archives
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Ellen:
Another question: are you using bare formvar or have you coated with
carbon? Bare formvar will pucker, but the addition of a little carbon does
wonders for stabilization and strength of the films. My experience is using
0.5% formvar, stabilized with about 10nm of evaporated carbon. These films
aren't too thick, allowing good image resolution at 80kV. BTW: if the
formvar films are puckered, they will show it prior to picking up sections.
(Another vagrant neuron just fired.) One way to deal with the puckered
formvar is to use chloroform or carbon tet. Simply pass the grid over the
mouth of an open bottle, or, as a last resort, put the grid into the neck of
the bottle (NOT into the fluid--just the vapors). Please be careful with
this. (Exposure to these chemicals.) I may have the beginnings of
interstitial pulmonary fibrosis--a not uncommon result of exposure to
chemicals.

Roger Moretz, Ph.D.
Dept of Toxicology
Boehringer Ingelheim Pharmaceuticals

On Sun, 11 Mar 2001 14:31:50 -0500, Ellen S. Morgan wrote:

| ------------------------------------------------------------------------
| The Microscopy ListServer -- Sponsor: The Microscopy Society of America
| To Subscribe/Unsubscribe -- Send Email to ListServer-at-MSA.Microscopy.Com
| On-Line Help http://www.msa.microscopy.com/MicroscopyListserver/FAQ.html
| -----------------------------------------------------------------------.
|
|
| TO be more specific, any advice on using formvar coated slot grids for
| serial sections. They seem to crinkle, or get blobby, right on the
vessel
| I want to look at.
|


Roger Moretz, Ph.D.
Dept of Toxicology
Boehringer Ingelheim Pharmaceuticals, Inc.
900 Rigdebury Road
Ridgefield, CT 06877
203-798-5448





_______________________________________________________
Send a cool gift with your E-Card
http://www.bluemountain.com/giftcenter/




From daemon Mon Mar 12 07:18:25 2001



From: Mick Thomas :      mgt3-at-ccmr.cornell.edu
Date: Mon, 12 Mar 2001 08:18:27 -0800
Subject: buildings with low magnetic fields

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Fellow microscopists,

Does anyone know of any buildings/laboratories recently constructed that
house instruments (not necessarily EM's) requiring very low ( {0.5 mG) 60 Hz
stray magnetic fields? I am interested in contacting someone (scientist,
building manager, architect, etc.) who might know the details of how that
building was constructed.

Thank you for your time and help,

Sincerely,

Mick Thomas
-------------------------------------------------
Mick Thomas
UHV-STEM Laboratory
E-1 Clark Hall
Cornell University
Ithaca, NY 14853

Phone: 607-255-0650
Fax: 607-255-7658
e-mail: mgt3-at-ccmr.cornell.edu


From daemon Mon Mar 12 08:37:38 2001



From: Leslie Eibest :      leibest-at-duke.edu
Date: Mon, 12 Mar 2001 09:32:41 -0500
Subject: ESEM-Need presentation of phase transition.

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


At 5:24 PM +0100 3/9/01, Edmund Gierlik wrote:
} Email: gierlik-at-delta.sggw.waw.pl
} Name: Edmund Gierlik
} Organization: Electron Microscopy Lab.
} Education: professor
} Location: Warsaw, Poland
}
} Question: Can anybody show the source of nice presentation of ESEM
} application in a phase transition investigation (water - ice, liquid - solid)?

Trisha Rice at the ESEM applications lab might be able to
provide this. She can be reached at either trice-at-feico.com or
trice-at-electroscan.com (I'm not sure if this last address is still
valid).

Leslie Eibest


From daemon Mon Mar 12 08:45:20 2001



From: William F. Tivol :      wft03-at-health.state.ny.us
Date: Mon, 12 Mar 2001 09:41:50 -0500
Subject: Re: TEM: Focusing

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Dear Randy,
I have just a few points to add to Steve's excellent advice.

1. "It is too dim to focus" - then
i) increase the emission current, many people run at too low a
current and make the task of optimising the instrument settings much more
difficult
ii) increase the kV which would increase the intensity too
ii) re calibrate the photographic system to allow a focus intensity
that is suitable for most operators

I often use LoDose film, which is more than an order of magnitude more
sensitive than SO163, so I can barely see the beam on the screen. Fortunately,
we have an intensified CCD, which is so sensitive that I can still focus. In
fact, using the minimum-contrast method works very well with this system, since
the contrast can be electronically enhanced.

6. To focus at low magnifications try removing the objective aperture
and focus without a binocular, or a wobbler, looking for the very strong
minimum contrast effect.

Furthermore, I discovered that inserting the diffraction aperture (with the
objective aperture out) allows this method to be used at up to 63kx (and
possibly higher). Since minimum contrast can easily be found within one second,
this is well suited to radiolabile specimens.

Yours,

Bill Tivol
Wadsworth Center
Albany NY
(518) 473-7399 WFT02-at-health.state.ny.us




From daemon Mon Mar 12 09:02:31 2001



From: beth-at-dogwood.botany.uga.edu (Beth Richardson)
Date: Mon, 12 Mar 2001 10:06:35 -0500
Subject: Re: Using Formvar Grids

Contents Retrieved from Microscopy Listserver Archives
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This is a different procedure from the Formvar-coated grids that you are using
but it's one of my favorite journal articles/techniques - J. C. Rowley and
D.T. Moran, A Simple Procedure for Mounting Wrinkle-Free Sections on
Formvar-Coated Slot Grids. Ultramicrotomy 1 (1975) 151-155. They use
Formvar-coated aluminum supporting racks. We use this method for slot grids
all the time rather than Formvar-coated grids.
good luck,
Beth
} TO be more specific, any advice on using formvar coated slot grids for
} serial sections. They seem to crinkle, or get blobby, right on the vessel
} I want to look at.

**************************************
Beth Richardson
EM Lab Coordinator
Botany Department
University of Georgia
Athens, GA 30602

Phone - (706) 542-1790
FAX - (706) 542-1805
Email - beth-at-dogwood.botany.uga.edu

"Between the two evils,
I always pick the one I never tried before". Mae West (1893-1980)
**************************************




From daemon Mon Mar 12 09:38:08 2001



From: Timothy Schneider :      Timothy.Schneider-at-mail.tju.edu
Date: Mon, 12 Mar 2001 10:15:57 -0500
Subject: SERIAL SECTIONS

Contents Retrieved from Microscopy Listserver Archives
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Dear Ellen:

I do quite a bit of serial sectioning and would like to offer you the
following advice:

1) Cut your sections as small as possible, they can be as much as 1mm wide,
but try to make them something like 0.1mm high. This will allow you to get
you as many as 20 sections on a 2mm slotted grid.

2) Get a bunch of locking tweezers and from the time you pick up the grid
until you put it in the microscope, do not put the grid down onto filter
paper (as you would for a normal grid). So, after you pick up the ribbon of
sections, leave the grid in the tweezers to dry, and then when you post
stain the grids, leave them in the tweezers to dry. If you put them down
onto filter paper the formvar may rupture.

3) Maintain a positive attitude, and if things aren't going your way, stop
and come back to it another day (the blocks will always be there for you,
but if you get burned out you won't be there for the blocks).

Best of Luck, Tim

Timothy G. Schneider
Director of Electron Microscopy
Department of Pathology
Room 229 Jefferson Hall
Thomas Jefferson University
1020 Locust St.
Philadelphia Pa. 19107
215-503-4798 work
610-613-8170 cellular
timothy.schneider-at-mail.tju.edu



From daemon Mon Mar 12 09:58:42 2001



From: Richard Leapman :      leapman-at-helix.nih.gov
Date: Mon, 12 Mar 2001 11:00:24 -0400
Subject: Biologist/Technician position available at NIH

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


*** BIOLOGIST POSITION AVAILABLE ***

NATIONAL INSTITUTES OF HEALTH
Bethesda, Maryland
Division of Bioengineering & Physical Science
Supramolecular Structure & Function Lab.

Biologist GS9/GS11/GS12 trained in life sciences and/or physical sciences
at BS or MS level with solid technical experience in thin-section
transmission electron microscopy. Experience in advanced techniques in
analytical electron microscopy and structural biology (cryosectioning,
high-pressure freezing, and macromolecular preparation methods) is
desirable, although on-the-job training is possible for an experienced
microscopist. PROOF OF U.S. CITIZENSHIP IS REQUIRED for this appointment.


For further information please contact:

Dr. Richard Leapman
Division of Bioengineering & Physical Science
Bldg. 13, Rm. 3N17
National Institutes of Health
Bethesda, MD 20892
Tel: (301) 496-2599
FAX: (301) 496-6608
E-mail: leapman-at-helix.nih.gov


Applications (with curriculum vitae or federal employment form SF-171)
should include the reference number ORS-01-0044, and should be post marked
by April 9, 2001 and sent to:

Attention: Mr. Harold Atkins
National Institutes of Health
ORS Human Resources Office
31 Center Drive Msc 2157
Bldg 31, Room 4b41
Bethesda
MD 20892-2157

E-mail: orspersonnel-at-mail.nih.gov
Phone: 301-496-5623
FAX: 301-402-1057

Detailed information about the position is available at

http://careerhere.nih.gov/CHPublic/HRShowVac.taf?&VACANCY_uid1=7257







From daemon Mon Mar 12 10:10:27 2001



From: Tindall, Randy D. :      TindallR-at-missouri.edu
Date: Mon, 12 Mar 2001 10:04:38 -0600
Subject: TEM:Focusing

Contents Retrieved from Microscopy Listserver Archives
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Many thanks to everyone who responded to my question about focusing.
Although my actual question was answered almost immediately, the ensuing
replies were very enlightening. In EM work, it seems, even the "simplest"
things have dimensions that aren't always obvious.

My initial question arose from the fact that I was curious about something I
had always done as a matter of course because I had been taught to do it
that way. That is, I have spent years focusing TEM's with the beam at the
crossover point because I believed that I'd been taught to do so because of
some property of electron "optics" that made it the preferred method to
ensure best focus. Turns out, though, that the reason was something else
entirely, involving an earlier generation of microscopes that simply had a
beam that was too dim for focusing at the intensity needed for recording an
image.

It's always educational to question old assumptions. Embarrassing, too,
sometimes....

Thanks again, listers.

Randy

Randy Tindall
EM Specialist
Electron Microscopy Core Facility
W122 Veterinary Medicine
University of Missouri
Columbia, MO 65211
Tel: (573) 882-8304
Fax: (573) 884-5414
Email: tindallr-at-missouri.edu
Web: http://www.biotech.missouri.edu/emc/





From daemon Mon Mar 12 11:19:18 2001



From: Hong Yi :      hyi-at-emory.edu
Date: Mon, 12 Mar 2001 12:35:37 -0500
Subject: Re: TEM - immunolabeling

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Dear Tina:

Technically, re-embedding paraffin sections for EM is perfectly
feasible. The way I have done it is to separate the sections from slides
after re-hydration and before further fixation with glutaraldehyde and
osmium. Since both glutaraldehyde and osmium treatment cause sections to
shrink and be brittle, sections might get further torn if they are still
attached to the slides. Another step you should be careful about is to keep
sections flat when applying glutaraldehyde and osmium. This ensures
sections not to curl or wrinkle later. You can float your sections in 0.1 M
phosphate buffer in a Petri dish, and let sections lie flat on the bottom.
Then you gently remove buffer and add fixative with a glass pipet without
disturbing the sections. Do not shake sections for a while after adding
fixative. To flat-embed the sections, you can sandwich sections that have
been fully infiltrated with resin between two sheets of Aclar film, then
place this sandwich between two glass slides and apply some weight on top
while polymerizing the resin.
As someone already pointed out, even though you can re-embed paraffin
sections for EM, ultrastructural will not be adequate anymore. This is
particularly a problem for examining brain tissue in which membrane outline
is essential for identifying different neuronal elements. However, if the
tissue is precious, I would say it is still worth trying. We work with
post-mortem brain tissue often. Sometimes the brains were over twenty-four
hours post-mortem, fixed with only formalin and stored in cryoprotectant in
a freezer for a long time. I am often surprised how much information we can
still obtain from such tissue at EM level. I would be happy to help you
to evaluate your micrographs if you like.

Good luck, Tina, let me know if you need more detailed answers.

Hong

==============
Hong Yi
Supervisor
Emory University School of Medicine
Neurology Microscopy Core Laboratory
Rm 6215 Woodruff Memorial Research Building
1639 Pierce Dr.
Atlanta, GA 30322
Phone: (404) 727-8692
Fax: (404) 727-3157
Email: hyi-at-emory.edu


----------
} From: Tina Carvalho {tina-at-pbrc.hawaii.edu}
} To: Microscopy Listserver {Microscopy-at-sparc5.microscopy.com}
} Subject: TEM - immunolabeling
} Date: Wed, Mar 7, 2001, 2:55 PM
}

} ------------------------------------------------------------------------
} The Microscopy ListServer -- Sponsor: The Microscopy Society of America
} To Subscribe/Unsubscribe -- Send Email to ListServer-at-MSA.Microscopy.Com
} On-Line Help http://www.msa.microscopy.com/MicroscopyListserver/FAQ.html
} -----------------------------------------------------------------------.
}
}
} I have two questions for you immunolabeling experts.
}
} First, a client has some precious and irreplaceable histological sections
} of human hippocampus that have been labeled with ABC - DAB. Will it be
} possible for me to de-paraffinize the sections, expose them to osmium
} vapor and re-embed them in resin on the slide and pop them off and
} resection them and see the DAB precipitate? Anyone have a protocol that
} has worked?
}
} Second, these researchers plan to use Vibratome sections of mouse brain
} and immunolabel them for light microscopy using an ABC kit. I have done
} on-ultrathin-section colloidal gold immunolabeling for TEM. However, for
} this new project we would like to try pre-embedding labeling of 50-60
} micrometer Vibratome sections, then embed and resection them for
} TEM. Knowing what works for light microscopy, we'd like to use
} streptavidin/colloidal gold or whatever for TEM visualization. My question
} is, of course, does anyone have a favorite protocol they would be willing
} to share? How do I keep the sections from curling? If we stick them on a
} glass slide to embed in resin and (hopefully) pop off later for
} resectioning, when and how do I get the to adhere?
}
} Mahalo!
}
} Tina
}
} http://www.pbrc.hawaii.edu/bemf/microangela
} ****************************************************************************
} * Tina (Weatherby) Carvalho * tina-at-pbrc.hawaii.edu *
} * Biological Electron Microscope Facility * (808) 956-6251 *
} * University of Hawaii at Manoa * http://www.pbrc.hawaii.edu/bemf*
} ****************************************************************************
}


From daemon Mon Mar 12 11:33:20 2001



From: Hong Yi :      hyi-at-emory.edu
Date: Mon, 12 Mar 2001 12:52:18 -0500
Subject: Re: TEM - immunolabeling

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Dear Tina:

Regarding your question about pre-embedding immunolabeling of vibratomed
brain sections, the type of labeling to use depends on the questions the
researchers are trying to answer. Immunoperoxidase gives greater labeling
depth, but limited spatial resolution. If they simply want to know what
neuronal elements are labeled, then immunoperoxidase is fine. Otherwise,
imunogold should be considered because it provides much more precise
localization.

The methods for pre-embedding immunogold labeling using vibratomed brain
sections have been very well documented. One of the first publications was
by Chan, Aoki and Pickel (1) at Cornell University in 1990, shortly after
ultrasmall gold conjugates were introduced. Many brain researchers have
adapted their protocol. The characteristics of this protocol are the use of
acrolein in the fixative for perfusion, using little or no detergent
treatment for permeabilization and using a 1 nm colloidal gold conjugated
IgG secondary probe in conjunction with a light insensitive, low viscosity,
but fast reacting silver enhancement reagent. I have seen many beautiful
results using this protocol. However, the particle size tends to be big,
and irregular in shape. The cause of this is mainly in the silver
enhancement reagent. In 1999, a new EM grade silver enhancement reagent was
introduced to the market. Because of the improved enhancement homogeneity in
particle size and shape, this silver enhancement reagent allowed us to
conduct for the first time the pre-embedding double immunogold labeling in
brain tissue using only ultrasmall gold conjugates (2).

To avoid a lengthy posting, I will send you the protocol, along with
images off-line.

1. Chan J. Aoki C. Pickel VM. (1990) Optimization of differential
immunogold-silver and peroxidase labeling with maintenance of ultrastructure
in brain sections before plastic embedding. Journal of Neuroscience Methods.
33(2-3):113-27,

2. Hong Yi, Jan L.M. Leunissen, Ge-Ming Shi, Claire-Anne Gutekunst, and
Steven M. Hersch (2001) A Novel Procedure for Pre-embedding Double
ImmunogoldSilver Labeling at the Ultrastructural Level J. Histochem.
Cytochem. 2001 49: 279-284.

Hong


==============
Hong Yi
Supervisor
Emory University School of Medicine
Neurology Microscopy Core Laboratory
Rm 6215 Woodruff Memorial Research Building
1639 Pierce Dr.
Atlanta, GA 30322
Phone: (404) 727-8692
Fax: (404) 727-3157
Email: hyi-at-emory.edu


----------
} From: Tina Carvalho {tina-at-pbrc.hawaii.edu}
} To: Microscopy Listserver {Microscopy-at-sparc5.microscopy.com}
} Subject: TEM - immunolabeling
} Date: Wed, Mar 7, 2001, 2:55 PM
}

} ------------------------------------------------------------------------
} The Microscopy ListServer -- Sponsor: The Microscopy Society of America
} To Subscribe/Unsubscribe -- Send Email to ListServer-at-MSA.Microscopy.Com
} On-Line Help http://www.msa.microscopy.com/MicroscopyListserver/FAQ.html
} -----------------------------------------------------------------------.
}
}
} I have two questions for you immunolabeling experts.
}
} First, a client has some precious and irreplaceable histological sections
} of human hippocampus that have been labeled with ABC - DAB. Will it be
} possible for me to de-paraffinize the sections, expose them to osmium
} vapor and re-embed them in resin on the slide and pop them off and
} resection them and see the DAB precipitate? Anyone have a protocol that
} has worked?
}
} Second, these researchers plan to use Vibratome sections of mouse brain
} and immunolabel them for light microscopy using an ABC kit. I have done
} on-ultrathin-section colloidal gold immunolabeling for TEM. However, for
} this new project we would like to try pre-embedding labeling of 50-60
} micrometer Vibratome sections, then embed and resection them for
} TEM. Knowing what works for light microscopy, we'd like to use
} streptavidin/colloidal gold or whatever for TEM visualization. My question
} is, of course, does anyone have a favorite protocol they would be willing
} to share? How do I keep the sections from curling? If we stick them on a
} glass slide to embed in resin and (hopefully) pop off later for
} resectioning, when and how do I get the to adhere?
}
} Mahalo!
}
} Tina
}
} http://www.pbrc.hawaii.edu/bemf/microangela
} ****************************************************************************
} * Tina (Weatherby) Carvalho * tina-at-pbrc.hawaii.edu *
} * Biological Electron Microscope Facility * (808) 956-6251 *
} * University of Hawaii at Manoa * http://www.pbrc.hawaii.edu/bemf*
} ****************************************************************************
}


From daemon Mon Mar 12 13:03:37 2001



From: Bruce Cutler :      bcutler-at-eureka.idl.ukans.edu
Date: 12 Mar 2001 12:58:48 -0600
Subject: Agarose enrobed cells

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------------------------------------------------------------------------
The Microscopy ListServer -- Sponsor: The Microscopy Society of America


A user has encountered an interesting problem . When cells are scraped and
pelleted and embedded directly in epoxy they appear OK under the scope. When
they are enrobed in agarose and then embedded the appearance becomes variable,
although most cells appear very dense with contrast between organelles very low.
This variability in appearance can be on the same grid square.
Any ideas?
Thanks
Bruce
Bruce Cutler
Director, Microscopy & Electronic Imaging Laboratory
University of Kansas





From daemon Mon Mar 12 13:48:58 2001



From: Dusevich, Vladimir :      DusevichV-at-umkc.edu
Date: Mon, 12 Mar 2001 13:45:29 -0600
Subject: ESEM-Need presentation of phase transition.

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"'Microscopy-at-sparc5.microscopy.com '" {Microscopy-at-sparc5.microscopy.com}


May be it's not really a phase transition, but you can
find pictures of dissolution and crystallization of
table salt at our web page:
http://www.umkc.edu/dentistry/microscopy/Esemimg.htm

Vladimir

-----Original Message-----
} From: Edmund Gierlik
To: Microscopy-at-sparc5.microscopy.com
Sent: 3/9/01 10:24 AM



Email: gierlik-at-delta.sggw.waw.pl
Name: Edmund Gierlik

Organization: Electron Microscopy Lab.

Education: professor

Location: Warsaw, Poland

Question: Can anybody show the source of nice presentation of ESEM
application in
a phase transition investigation (water - ice, liquid - solid)?


From daemon Mon Mar 12 14:10:50 2001



From: Mary Gail Engle :      mgengle-at-pop.uky.edu
Date: Mon, 12 Mar 2001 15:05:41 -0500
Subject: TEM on cellulose and iron

Contents Retrieved from Microscopy Listserver Archives
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Dear listers,
I have a customer who wants TEM on a section of cellulose that is coated
with a layer of Fe2. I have no idea about how to go about accomplishing
this. He wants to see where the Fe2 is located in the cellulose matrix,
and how deep it has penetrated. The sample is a layer of cellulose about
1/2 mm thick with a visible layer of Fe on the surface and it's in
submerged in water.
Any ideas out there?
Thanks so much,

Mary Gail Engle
Sr. Research Laboratory Manager
Electron Microscopy & Imaging Facility
Health Sciences Research Bldg. 001
University of Kentucky
Lexington, KY 40536-0305

phone 859-323-6108
fax 859-257-5700


From daemon Mon Mar 12 14:16:06 2001



From: James M. Ehrman :      jehrman-at-mta.ca
Date: Mon, 12 Mar 2001 16:15:20 -0400
Subject: schematic for transmitted electron detector

Contents Retrieved from Microscopy Listserver Archives
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Yo listers,

After several requests, I've posted a measured schematic of my
transmitted electron adapter, which can be reached via a link
from the page mentioned previously:

http://www.mta.ca/~jehrman/ted.htm

I had the adapter made of aluminum and brass (just because
the machinist likes to work with these). The angled surface
below the specimen grid is polished brass, and as mentioned
by several respondents, could be plated/coated/covered with
something that generates more secondaries. Signal, however,
has not been a problem in our applications - more than enough
even at the smallest spot sizes.

Cheers,

Jim

--

James M. Ehrman
Digital Microscopy Facility
Mount Allison University
Sackville, NB E4L 1G7
CANADA

phone: 506-364-2519
fax: 506-364-2505
email: jehrman-at-mta.ca
www: http://www.mta.ca/~jehrman




From daemon Mon Mar 12 16:01:30 2001



From: Dick Briggs :      rbriggs-at-Science.Smith.edu
Date: Mon, 12 Mar 2001 16:55:53 -0500
Subject: LKB microtome repair

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


I have a LKB Ultrotome V which has given many years of faithful
service to me and my students until today, when the band that raises
and lowers the cutting arm snapped. I am in the middle of the
semester class on EM techniques and hence am a bit desperate to get
it repaired. Does anyone know where I might find a replacement part
for this - and is it possible to replace and adjust it myself? There
are no instructions in my manual for this procedure; are there any
out there somewhere? Is there any company that will service this
instrument? I am located in New England.

Many thanks in advance for any leads.

Sincerely,

Dick Briggs
Biology Department
Smith College
Northampton, MA 01063


From daemon Mon Mar 12 17:59:55 2001



From: Susan Belfry :      belfry-at-unb.ca
Date: Mon, 12 Mar 2001 19:55:17 -0400
Subject: MSC2001 Conference

Contents Retrieved from Microscopy Listserver Archives
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This notice is to invite you to attend and participate in the 28th Annual
Meeting of the Microscopical Society of Canada. This three day meeting
will be held at the University of New Brunswick, Fredericton, New
Brunswick, Canada on 6-8 June, 2001.
The Scientific Program features invited speakers from the environmental
sciences, plant sciences, material sciences, EELS applications, confocal
microscopy and magnetic resonance imaging (MRI). Workshops will focus on
specimen preparation techniques for both the biological and material
sciences, including ultramicrotomy, polishing methods, high-pressure
freezing techniques and a workshop on preparation of digital images for
publication. Vendors and manufacturers will be demonstrating the latest
developments in the field of microscopy.
Presentations can be in either platform or poster format and the Abstract
Deadline is March 30, 2001. The deadline for Pre-registration is April 30,
2001. All information and required forms for registration and submission
of abstracts are available at the conference website at:
http://www.unb.ca/msc2001.
************
Keynote Speakers and topics include:
Dr. Bruce Balcom, Department of Physics, University of New
Brunswick. Title of talk: "Magnetic Resonance Imaging of Materials".
Dr. Ron Gronsky, Materials Science and Engineering, University of
California, Berkeley. Title of talk: TBA.
Dr. Michael Hochella, Dept. of Geological Sciences, Virginia Polytechnic
Institute & State University, Blacksburg, Virginia. Title of talk:
"Contributions of Microscopy to the Environmental Sciences: From Bacteria
to Atoms"
Dr. Richard Howard, DuPont Agricultural Products, Experimental Station,
Wilmington, Delaware. Title of talk: "Trends in imaging fungal pathogens
for understanding the cell biology of plant disease"
Dr. Peter Ottensmeyer, Medical Biophysics, University of Toronto. Title of
talk: "3-D Reconstruction of Macromolecules from single-particle STEM
images: Transmembrane signalling of the insulin receptor"

Invited Speakers include:
Mr. Jason Davis, Medical Biophysics, University of Toronto. Title of Talk:
"EM of Chromophores: Very Low Energy-Loss Imaging of Green Fluorescent
Protein and other Coloured Denizens."
Dr. Gianluigi Botton, Materials Technology Laboratory, Natural Resources
Canada. Title of Talk: "Analytical TEM of Macrostructures and Nanostructures".
Dr. Elaine Humphrey, Biosciences EM Facility, University of British
Columbia. Topic: "Confocal Microscopy"
Dr. John McCaffrey, Institute for Microstructural Sciences, National
Research Council Canada. Title of talk: "Structural Characterisation of
InAs/GaAs and InAs/InP Quantum Dots by TEM"
Dr. Doug Perovic, Dept. of Metallurgy & Materials Science, University of
Toronto. Topic: "EM of Semiconductors".
************
Fredericton, New Brunswick is a three hour drive north from
Bangor, Maine and an eight hour drive from Boston or Montreal. June is a
beautiful time in New Brunswick and you can find interesting things to do
and see through the conference website tourism links.



From daemon Tue Mar 13 02:14:16 2001



From: Patton, David :      David.Patton-at-uwe.ac.uk
Date: Tue, 13 Mar 2001 08:07:13 +0000 (GMT Standard Time)
Subject: Re: RE: ESEM-Need presentation of phase transition.

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


We turned water to ice on plant surfaces using the Peltier
stage. We did not take any nice pictures (I have a few
ugly ones!). It was an idea re ice nucleation on plants
for a student project idea that we did not follow up.

Dave


On Mon, 12 Mar 2001 13:45:29 -0600 "Dusevich, Vladimir"
{DusevichV-at-umkc.edu} wrote:

} ------------------------------------------------------------------------
} The Microscopy ListServer -- Sponsor: The Microscopy Society of America
} To Subscribe/Unsubscribe -- Send Email to ListServer-at-MSA.Microscopy.Com
} On-Line Help http://www.msa.microscopy.com/MicroscopyListserver/FAQ.html
} -----------------------------------------------------------------------.
}
}
} May be it's not really a phase transition, but you can
} find pictures of dissolution and crystallization of
} table salt at our web page:
} http://www.umkc.edu/dentistry/microscopy/Esemimg.htm
}
} Vladimir
}
} -----Original Message-----
} } From: Edmund Gierlik
} To: Microscopy-at-sparc5.microscopy.com
} Sent: 3/9/01 10:24 AM
} Subject: ESEM-Need presentation of phase transition.
}
} ------------------------------------------------------------------------
} The Microscopy ListServer -- Sponsor: The Microscopy Society of America
} To Subscribe/Unsubscribe -- Send Email to ListServer-at-MSA.Microscopy.Com
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} -----------------------------------------------------------------------.
}
}
}
} Email: gierlik-at-delta.sggw.waw.pl
} Name: Edmund Gierlik
}
} Organization: Electron Microscopy Lab.
}
} Education: professor
}
} Location: Warsaw, Poland
}
} Question: Can anybody show the source of nice presentation of ESEM
} application in
} a phase transition investigation (water - ice, liquid - solid)?
}

----------------------------------------
Patton, David
Email: David.Patton-at-uwe.ac.uk
"University of the West of England"



From daemon Tue Mar 13 03:51:48 2001



From: Dmitri Lapotko :      Ld-at-hmti.ac.by
Date: Tue, 13 Mar 2001 11:54:50 +0300
Subject: LM live cell preparation

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Hi Group,

I need to fix live cells (mainly blood cells) on a microscope glass
slide to prevent them from movement but to maintain their
viability for 1-3 hrs. Also it should be non-stained with any dye
cells in mono-layer.
Material to fix cells should be optically transparent in 500-700 nm.
Room temperature is asssumed.

Any input about applicable technologies (gels etc) with references
about suppliers of materials that are involved and sources for description
of those techniques will be highly appreciated.

Thanks in advance

Dmitri Lapotko, Ph.D.

Luikov Heat and Mass Transfer Institute
15, Brovka Street
Minsk, 220072
Belarus

Tel: (375172)842483
Fax: (375172)842486
ld-at-hmti.ac.by




From daemon Tue Mar 13 06:25:13 2001



From: David Knecht :      knecht-at-uconn.edu
Date: Tue, 13 Mar 2001 09:27:18 -0500
Subject: Ca ratio imaging and arc source

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html



----- Original Message -----
} From: "Patton, David" {David.Patton-at-uwe.ac.uk}
To: "Dusevich, Vladimir" {DusevichV-at-umkc.edu}
Cc: "'Edmund Gierlik '" {gierlik-at-delta.sggw.waw.pl} ;
{Microscopy-at-sparc5.microscopy.com}
Sent: Tuesday, March 13, 2001 4:07 AM


} I am getting confused about light sources and Ca ratio imaging. I
} have talked to people who use standard Hg arc sources and seem to
} have no problems. Others seem to feel that you need a stabilized
} power supply or a Xenon source for stability (see below). Are we
} talking about line voltage variations (which a line
} conditioner/voltage regulator ought to deal with) or actual arc
} source variation? Any opinions out there? Thanks- Dave



} From my observations of using both types of light source, the Xenon seems
} far more stable with time. You don't notice the fluctuations that you get
} with Hg bulbs. This is important for quantification, such as dual excitation
} ratio methods (eg. Fura-2).
}
} Stephen H. Cody,
} Colon Molecular and Cell Biology Laboratory,
} Ludwig Institute for Cancer Research,
} Post Office Royal Melbourne Hospital,
} Parkville, Victoria 3050, Australia.
}
} Tel: 61 3 9341 3155 Fax: 61 3 9341 3104
} email: stephen.cody-at-ludwig.edu.au
} www.ludwig.edu.au/confocal
}
}
} } ----------
} } From: Tom Phillips[SMTP:PhillipsT-at-MISSOURI.EDU]
} } Reply To: Confocal Microscopy List
} } Sent: Wednesday, 28 February 2001 2:08
} } To: CONFOCAL-at-LISTSERV.ACSU.BUFFALO.EDU
} } Subject: Re: Xenon lamps
} }
} } All true but I believe one disadvantage is the peak illumination is
} } less for some fluorochromes such as DAPI. We see a difference in our
} } two systems that have Hg or Xe.
} }
} }

--

************************************************************
Dr. David Knecht
Department of Molecular and Cell Biology
University of Connecticut
75 N. Eagleville Rd. U-125
Storrs, CT 06269-3125
Knecht-at-uconnvm.uconn.edu
860-486-2200 860-486-4331 (fax)
home page: http://www.sp.uconn.edu/~mcbstaff/knecht/knecht.html
************************************************************


From daemon Tue Mar 13 09:13:43 2001



From: Tobias Baskin :      BaskinT-at-missouri.edu
Date: Tue, 13 Mar 2001 09:09:16 -0600
Subject: Re: Ca ratio imaging and arc source

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Greetings,
Two standard points. These are not about power output but do
relate to the choice of arc type (archtype??) which seemed to be on
the questioner's mind. Forgive me if this is too obvious.

One is that the output of a xenon arc is much more uniform
across the spectrum compared to the steep peaks of the mercury arc.
For ratios with different excitation wavelengths, in principle
difference in intensity between the two wavelengths doesn't matter,
but in practice when the intensities differ alot, there can be
problems. Therefore, if you are going to be working with a variety of
wavelength pairs (lots of different dyes and applications) the
continuity of the xenon will probably be helpful; whereas, if you
will stick to a single pair of wavelengths, or ratio emitted light,
then even spectral quality might not matter.

The other issue is that xeon arcs tend to give off lots more
ozone than mercury arcs and so usually require significant venting.
This can be a nuisance depdending on the lay of the land, etc.

As ever,
Tobias Baskin

}
} } I am getting confused about light sources and Ca ratio imaging. I
} } have talked to people who use standard Hg arc sources and seem to
} } have no problems. Others seem to feel that you need a stabilized
} } power supply or a Xenon source for stability (see below). Are we
} } talking about line voltage variations (which a line
} } conditioner/voltage regulator ought to deal with) or actual arc
} } source variation? Any opinions out there? Thanks- Dave
}
}
}
} } From my observations of using both types of light source, the Xenon seems
} } far more stable with time. You don't notice the fluctuations that you get
} } with Hg bulbs. This is important for quantification, such as dual excitation
} } ratio methods (eg. Fura-2).
} }
} } Stephen H. Cody,
} } Colon Molecular and Cell Biology Laboratory,
} } Ludwig Institute for Cancer Research,
} } Post Office Royal Melbourne Hospital,
} } Parkville, Victoria 3050, Australia.
} }
} } Tel: 61 3 9341 3155 Fax: 61 3 9341 3104
} } email: stephen.cody-at-ludwig.edu.au
} } www.ludwig.edu.au/confocal
} }
} } } ----------
} } } From: Tom Phillips[SMTP:PhillipsT-at-MISSOURI.EDU]
} } } Reply To: Confocal Microscopy List
} } } Sent: Wednesday, 28 February 2001 2:08
} } } To: CONFOCAL-at-LISTSERV.ACSU.BUFFALO.EDU
} } } Subject: Re: Xenon lamps
} } }
} } } All true but I believe one disadvantage is the peak illumination is
} } } less for some fluorochromes such as DAPI. We see a difference in our
} } } two systems that have Hg or Xe.
} } }
} } }
}
} --
}
} ************************************************************
} Dr. David Knecht
} Department of Molecular and Cell Biology
} University of Connecticut
} 75 N. Eagleville Rd. U-125
} Storrs, CT 06269-3125
} Knecht-at-uconnvm.uconn.edu
} 860-486-2200 860-486-4331 (fax)
} home page: http://www.sp.uconn.edu/~mcbstaff/knecht/knecht.html
} ************************************************************

--
_ ____ __ ____ Tobias I. Baskin
/ \ / / \ / \ \ 109 Tucker Hall
/ / / / \ \ \ Biological Sciences
/_ / __ /__ \ \ \__ University of Missouri
/ / / \ \ \ Columbia, MO USA
/ / / \ \ \ 65211-7400
/ / ___ / \ \__/ \ ____ voice: 573-882-0173
fax: 573-882-0123


From daemon Tue Mar 13 09:58:44 2001



From: Sara Miller :      saram-at-duke.edu
Date: Tue, 13 Mar 2001 10:46:01 -0500 (EST)
Subject: Re: Agarose enrobed cells

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


It could be a problem with penetration through the agar if cells are fixed
in glutaraldehyde after the agar is added. Glut crosslinks the agar so
that other solutions, including osmium and washes, can't penetrate
properly. (I know this from experience.) We rinse the monolayer briefly
and gently with warmed buffer (pour on, swirl, pour off). The buffer
should be 300 mOsm (check with an osmometer) and pH 7.2-7.4 (check with a
pH meter). Pour on the glut in buffer and let sit about 3 min (no more
than 5); scrape, pellet cells in the glut and let sit for another 30 min.
The pellets should be small (2 mm or so). If pellets are large, you can
loosen them with the applicator stick so that the glut can get around to
the underneath side. Just try not to disturb the clump too much. Remove
glut with pipette. Scrape out pellet with flattened end of applicator
stick. Enrobe with agar and then wash and stain as you would a piece of
tissue. If there's a lot of excess agar, you can trim it away with a
razor blade. This keeps them together and makes life much easier.

Some folks suspend cells in warm agar or gelatin before fixation and spin
them down in the agar or gelatin and then fix. We have had variable
staining this way, particularly if there is a lot of excess agar or the
agar solidifies before the cells get to the bottom of the tube. If you
can get a tight pellet by centrifuging fast in a warmed centrifuge (or
jacketed tube) before the agar solidifies so that the layer of agar
around each cell is thin, it will work. Do cut away the excess agar at
the top of the tube, and make cell blocks small.

We centrifuge in a microfuge tube that looks like this:

| |
| |
| |
| |
| |
\ /
| |
| |
U

(Sorry about the graphics.) I think they come from PGC Scientific (800
424 3300). Sorry, I don't have the catelog number; our bag has been
emptied, and our catelog has been "borrowed." They are about 2 " long
and 3 mm in dia; the inside of the very tip is the diameter of a paper
clip. This info was provided a while back, and maybe you can find it in
the archives.

Centrifuge at right angles so that the pellet doesn't get stuck on the
slanted neck of the tube. Then cut off the very bottom (below the cells)
and then cut off the tube above the cells. Push out the cell "log" with
a straightened paper clip. Chop into smaller logs.

Good luck. Address below if further questions.




On 12 Mar 2001, Bruce Cutler wrote:

} Date: 12 Mar 2001 12:58:48 -0600
} From: Bruce Cutler {bcutler-at-eureka.idl.ukans.edu}
} To: Microscopy-at-sparc5.microscopy.com
} Subject: Agarose enrobed cells
}
} ------------------------------------------------------------------------
} The Microscopy ListServer -- Sponsor: The Microscopy Society of America
} To Subscribe/Unsubscribe -- Send Email to ListServer-at-MSA.Microscopy.Com
} On-Line Help http://www.msa.microscopy.com/MicroscopyListserver/FAQ.html
} -----------------------------------------------------------------------.
}
}
} A user has encountered an interesting problem . When cells are scraped and
} pelleted and embedded directly in epoxy they appear OK under the scope. When
} they are enrobed in agarose and then embedded the appearance becomes variable,
} although most cells appear very dense with contrast between organelles very low.
} This variability in appearance can be on the same grid square.
} Any ideas?
} Thanks
} Bruce
} Bruce Cutler
} Director, Microscopy & Electronic Imaging Laboratory
} University of Kansas
}
}
}
}
}

Sara E. Miller, Ph. D.
P. O. Box 3712
Duke University Medical Center
Durham, NC 27710
Ph: 919 684-3452
FAX: 919 684-3265



From daemon Tue Mar 13 10:32:10 2001



From: Mary Mager :      mager-at-interchange.ubc.ca
Date: Tue, 13 Mar 2001 08:26:24 -0800
Subject: Re: TEM on cellulose and iron

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Dear Mary Gail,
Do you mean a layer of metallic iron? I think you should treat the cellulose
as wood or plant tissue and fix and embed, then cut a cross-section as you
would a plant stem. No staining necessary. You need a TEM or STEM with an
EDX on it and it will easily locate the iron to the ten nanometer scale.
At 03:05 PM 3/12/01 -0500, you wrote:
}
} Dear listers,
} I have a customer who wants TEM on a section of cellulose that is coated
} with a layer of Fe2. I have no idea about how to go about accomplishing
} this. He wants to see where the Fe2 is located in the cellulose matrix,
} and how deep it has penetrated. The sample is a layer of cellulose about
} 1/2 mm thick with a visible layer of Fe on the surface and it's in
} submerged in water.
} Any ideas out there?
} Thanks so much,
}
} Mary Gail Engle

Regards,
Mary

Mary Mager
Electron Microscopist
Metals and Materials Engineering
University of British Columbia
6350 Stores Road
Vancouver, B.C. V6T 1Z4
CANADA
tel: 604-822-5648
e-mail: mager-at-interchg.ubc.ca



From daemon Tue Mar 13 18:17:01 2001



From: Earl Weltmer :      earlw-at-pacbell.net
Date: Tue, 13 Mar 2001 16:02:14 -0800
Subject: Amray service

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Hi Listers,

I am manufacturing a numnber of items related to Amray service: extender
cards, etc.

Would any interested parties please contact me if you want any or have a
request for a service fixture.

I will be making these items available for "our cost". In other words, I
just want ot be re-imbursed for my expenses fro manufacturing these.

Regards,

Earl



From daemon Tue Mar 13 21:42:41 2001



From: Gordon Vrololjak :      gvrdolja-at-nature.Berkeley.EDU
Date: Tue, 13 Mar 2001 19:37:27 -0800 (PST)
Subject: asbestos tests

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Hello,
I was looking at some piping in our lab while sitting on the windowsill
and noticed a sign painted over. Looking closer it was a sign for
asbestos insulation that has been 80% painted over. I was told earlier
that there was no asbestos pipe insulation in the lab. I collected some
dust samples from near the fraying pipe insulation, on top of shelves,
floor, and the windowsill and imaged them in our SEM.

Can anyone with some experience with asbestos take a look at the images
at: http://wilfred.berkeley.edu/~gordon/webdust and see if any of the
images looks like a candidate for asbestos? I think only fd6, fd7, and
fd8 are asbestos, and the rest of the fibrous materials imaged are
cellulose binding agents used in the insulation.

I will examine the material by TEM and electron diffraction, but I was
wondering if someone could post the techniques they use for sampling from
the dust, and any other hints and techniques I should be aware of.

Thanks for your help,
Gordon.

\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\
Gordon Ante Vrdoljak Electron Microscope Lab
ICQ 23243541 http://nature.berkeley.edu/~gvrdolja 26 Giannini Hall
gvrdolja-at-nature.berkeley.edu UC Berkeley
phone (510) 642-2085 Berkeley CA 94720-3330
fax (510) 643-6207 cell (510) 290-6793





From daemon Tue Mar 13 22:59:48 2001



From: Markus F. Meyenhofer :      micro-at-mail.superlink.net
Date: Tue, 13 Mar 2001 22:58:07 -0600
Subject: Looking for parts for JEOL 100C URGENT

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Looking for parts in the "left control panel housing B" for a JEOL 100C.
Please contact me off line.
Regards.
Markus F. Meyenhofer




From daemon Wed Mar 14 06:45:08 2001



From: Tim E. Harper :      tim-at-cmp-cientifica.com
Date: Wed, 14 Mar 2001 10:51:56 +0100
Subject: Wyko Profilometer Data Formats

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Hi,

We have some data from a Wyko optical profilometer which we would like to
work with offline & import into MATLAB for some further analysis. The lab
tells me that the Wyko data can be output in "OPD" format. Does anyone know
how we can covert this to a format we can work with.

Thanks

Tim

-------------------------------------------------------------------------
Tim E. Harper CEO CMP Cientifica
Tel. +34 91 640 7185
Fax. +34 91 640 7186



From daemon Wed Mar 14 07:50:19 2001



From: Chuck Butterick :      cbutte-at-ameripol.com
Date: 3/13/01 7:37 PM
Subject: asbestos tests

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html



Gordon's comments concern me on several levels. The SEM, especially
without EDX, is not the best tool to identify asbestos fibers. The TEM and
diffraction can be absolutely definitive. However, I'm unaware of any EPA
or NIOSH protocol for taking dust to the TEM grid, though one could be
developed easily enough for Gordon's purposes. Gordon described friable
pipe insulation with an asbestos warning. Seems wiser to bring his
administration in on this situation. Does the UC system have some in-house
personnel that can run a PLM for him? The lack of such in house personnel
or an office dealing with asbestos abatement would be surprising for such a
large university. Even a commercial lab PLM is faily inexpensive. While
the amount of dust given off the pipe, barring some regular banging on the
pipe, is probably minimal, the wiser course of action is bringing in
someone who is well trained in dealing with asbestos pipe insulation. It
doesn't have to be removed, just managed.

Chuck Butterick
Engineered Carbons,Inc.


______________________________ Reply Separator _________________________________


------------------------------------------------------------------------
The Microscopy ListServer -- Sponsor: The Microscopy Society of America


Hello,
I was looking at some piping in our lab while sitting on the windowsill
and noticed a sign painted over. Looking closer it was a sign for
asbestos insulation that has been 80% painted over. I was told earlier
that there was no asbestos pipe insulation in the lab. I collected some
dust samples from near the fraying pipe insulation, on top of shelves,
floor, and the windowsill and imaged them in our SEM.

Can anyone with some experience with asbestos take a look at the images
at: http://wilfred.berkeley.edu/~gordon/webdust and see if any of the
images looks like a candidate for asbestos? I think only fd6, fd7, and
fd8 are asbestos, and the rest of the fibrous materials imaged are
cellulose binding agents used in the insulation.

I will examine the material by TEM and electron diffraction, but I was
wondering if someone could post the techniques they use for sampling from
the dust, and any other hints and techniques I should be aware of.

Thanks for your help,
Gordon.

\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\
Gordon Ante Vrdoljak Electron
MicroscopeLab
ICQ 23243541 http://nature.berkeley.edu/~gvrdolja 26 Giannini Hall
gvrdolja-at-nature.berkeley.edu UC Berkeley
phone (510) 642-2085 Berkeley CA 94720-3330
fax (510) 643-6207 cell (510) 290-6793








From daemon Wed Mar 14 08:35:56 2001



From: Kristi Snell :      snell-at-metabolix.com
Date: Wed, 14 Mar 2001 09:29:54 -0500
Subject: LM-thin sectioning and staining

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Message-ID: {3AAF8061.D94223EE-at-metabolix.com}


I am trying to develop a procedure to thin section plant leaves,
stain them with Nile blue, and visualize the stained leaves
by light microscopy.

I assume that a microtome would be the best way to perform
the thin sectioning but have I have no experience with
microtomes. Does anyone have suggestions on suitable
microtomes to purchase for such a procedure? If so,
where is the best place to purchase them?

Thank you.

-Kristi Snell

--
Dr. Kristi D. Snell
Metabolix, Inc.
303 Third St.
Cambridge, MA 02142
Fax: 617-492-1996
Phone: 617-492-0505 x 229




From daemon Wed Mar 14 08:44:43 2001



From: Brian Wajdyk :      Brian.Wajdyk-at-onsemi.com
Date: Wed, 14 Mar 2001 07:40:51 -0700
Subject: EDS detector chracterization: sensitivity/efficiency

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Fellow Microscopists,

Fellow Microscopists,

I want to track the performance of our EDS detector over time. We
currently
check: peak to background ratios via peak-to-tail of Mn k-alpha,
symmetry
via Full Width Tenth Max, peak offset via centeroid of the Mn k-alpha
and
L-alpha to known values, and resolution via Full Width Half Max. What I
don't have is a good way to determine sensitivity of the detector to
determine when to remove ice/hydrocarbon build up. In the past I used a
80%Mn 20%Cu standard and looked at the ratio of Cu k-alpha to Mn l-alpha
because at 10kV accelerating voltage, the peaks are nearly a 1:1 ratio.
Unfortunately I no longer have this standard or the means to acquire a
new
one thanks to the slow down in the e semiconductor industry. My best
guess
would to be to clean the detector then use the k-alpha to l-alpha ratio
of
Cu. However I know that we have the best microscopists in the world at
our
disposal. Any suggestions for sensitivity tracking, or other useful
detector characterizations I may have missed, would be greatly
appreciated.

Sincerely,

Brian Wajdyk
Sr. Electron Microscopist
On Semiconductor
brian.wajdyk-at-onsemi.com
602-244-4883


From daemon Wed Mar 14 09:35:41 2001



From: Dusevich, Vladimir :      DusevichV-at-umkc.edu
Date: Wed, 14 Mar 2001 10:17:38 -0600
Subject: RE: RE: ESEM-Need presentation of phase transition.

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Brian -

A few years back when I took an EDS course put on by NORAN, they said
keeping track of those K-alpha: L-alpha ratios should give you a running
record of your detector sensitivity. I've been doing that ever since, and
you can actually see those ratios change over time, as your detector window
gets dirty.
Another trick they mentioned (though I've never tried it myself) is to
run a spectrum on some ordinary Teflon tape (yes, the kind you use for
plumbing repairs). Teflon, apparently, contains no oxygen, so the presence
of O in the resulting spectrum can only be from ice buildup. Clever, no?
I also routinely do the Full Width Half Max test whenever I do a
calibration.
Good luck.

Frank Thomas
Geological Survey of Canada (Atlantic)
Bedford Institute of Oceanography
Dartmouth, Nova Scotia

----- Original Message -----
} From: "Brian Wajdyk" {Brian.Wajdyk-at-onsemi.com}
To: {Microscopy-at-sparc5.microscopy.com}
Sent: Wednesday, March 14, 2001 10:40 AM


I do not recall any problems with salt/water imaging.

Vladimir


Vladimir M. Dusevich, Ph.D.
Electron Microscope Lab Manager
3127 School of Dentistry
650 E. 25th Street
Kansas City, MO 64108-2784

Phone: (816) 235-2072
Fax: (816) 235-5524
Web: http://www.umkc.edu/dentistry/microscopy

} -----------------------------------------------------------------------.
}
}
} We turned water to ice on plant surfaces using the Peltier
} stage. We did not take any nice pictures (I have a few
} ugly ones!). It was an idea re ice nucleation on plants
} for a student project idea that we did not follow up.
}
} Dave
}
Like Dave, I've sometimes taken pictures of ice/water etc in our ESEM, but
ice is such a good insulator, (I guess), the images never seem to come out
well. So, I've never saved any. Also, salt/water interactions can be
difficult too, since the salt really seems to want to charge a lot, to the
detriment of image acquisition. Yes, you can play around with KeV and all
that to minimize these effects, but it's still a very challenging "shoot" to
get useable images.

Frank Thomas
Geological Survey of Canada (Atlantic)
Dartmouth, Nova Scotia



From daemon Wed Mar 14 10:35:34 2001



From: Martin J. Roe :      m.roe-at-mluri.sari.ac.uk
Date: Wed, 14 Mar 2001 16:30:56 +0000
Subject: Re: EDS detector chracterization: sensitivity/efficiency

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Brian,
We work in a UKAS accredited laboratory and have a Pentafet light
element detector with rotating turret device for windowless and thin
window analysis. I perform a test with a Ni sample every month
using the detector in its windowless mode. We monitor the ratio of
the counts in the Ni L and Ni K peaks (NiL/NiL+NiK) (knowing what
the value should be immediately after reconditioning). When the
monthly value falls below a certain predetermined value, we simply
perform the reconditioning routine.
I suppose if you don't have a light element detector then the Cu
standard you suggest is much better for a decent sized L line.
I find that the above works very well for tracking the detector's
sensitivity over a period of time.
Best of luck
Martin Roe

What I don't have is a good way to determine
sensitivity of the detector to determine when to remove
ice/hydrocarbon build up. In the past I used a 80%Mn 20%Cu
standard
and looked at the ratio of Cu k-alpha to Mn l-alpha because at 10kV
accelerating voltage, the peaks are nearly a 1:1 ratio. Unfortunately
I no longer have this standard or the means to acquire a new one
thanks to the slow down in the e semiconductor industry. My best
guess would to be to clean the detector then use the k-alpha to
l-alpha ratio of Cu. However I know that we have the best
microscopists in the world at our disposal. Any suggestions for
sensitivity tracking, or other useful detector characterizations I may
have missed, would be greatly appreciated.

Sincerely,

Brian Wajdyk
Sr. Electron Microscopist
On Semiconductor
brian.wajdyk-at-onsemi.com
602-244-4883


Martin J. Roe
Macaulay Land Use Research Institute
Craigiebuckler
Aberdeen
Scotland
UK
Phone 01224 318611
e-mail m.roe-at-mluri.sari.ac.uk


From daemon Wed Mar 14 10:52:16 2001



From: Matthew Lynn :      mlynn-at-miami.edu
Date: Wed, 14 Mar 2001 11:50:46 -0500
Subject: RE: asbestos tests

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


I'd say some of those fibers are definitely "candidates". They are also large
enough that you could analyze by PLM. If you want to do the TEM for fun or for
the experience: dust samples are usually suspended in water and filtered onto a
PC or MCE filter. I'm sure someone will post the appropriate reference, I
can't seem to find it here.

Matt

On Tuesday, March 13, 2001 10:37 PM, Gordon Vrololjak
[SMTP:gvrdolja-at-nature.Berkeley.EDU] wrote:
} ------------------------------------------------------------------------
} The Microscopy ListServer -- Sponsor: The Microscopy Society of America
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} -----------------------------------------------------------------------.
}
}
} Hello,
} I was looking at some piping in our lab while sitting on the windowsill
} and noticed a sign painted over. Looking closer it was a sign for
} asbestos insulation that has been 80% painted over. I was told earlier
} that there was no asbestos pipe insulation in the lab. I collected some
} dust samples from near the fraying pipe insulation, on top of shelves,
} floor, and the windowsill and imaged them in our SEM.
}
} Can anyone with some experience with asbestos take a look at the images
} at: http://wilfred.berkeley.edu/~gordon/webdust and see if any of the
} images looks like a candidate for asbestos? I think only fd6, fd7, and
} fd8 are asbestos, and the rest of the fibrous materials imaged are
} cellulose binding agents used in the insulation.
}
} I will examine the material by TEM and electron diffraction, but I was
} wondering if someone could post the techniques they use for sampling from
} the dust, and any other hints and techniques I should be aware of.
}
} Thanks for your help,
} Gordon.
}
} \/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\
} Gordon Ante Vrdoljak Electron Microscope Lab
} ICQ 23243541 http://nature.berkeley.edu/~gvrdolja 26 Giannini Hall
} gvrdolja-at-nature.berkeley.edu UC Berkeley
} phone (510) 642-2085 Berkeley CA 94720-3330
} fax (510) 643-6207 cell (510) 290-6793
}
}



From daemon Wed Mar 14 11:12:35 2001



From: Rick Mott :      rickmott-at-alumni.princeton.edu
Date: Wed, 14 Mar 2001 12:14:24 -0500
Subject: SUMMARY -- laser vision correction for microscopists? (long)

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Many thanks to all those who answered my query on
laser vision correction. I received 17 responses:

9 were considering the procedure and expressed
interest in seeing the responses, hence this
summary.

1 provided the following informational site:

http://www.manufacturing.net/magazine/dn/archives/2001/dn0226.01/feature1.html

This is a general site for Design News magazine; search
that site for the term "lasik" to find an uncritical article
featuring the inventor of the laser-vision machine now
marketed by Visx. Even though it's a puff piece, it contains
a great deal of info on the process.

2 recommended against the surgery, citing the risk of
bad results for small gain if you have good correction
now with glasses or contacts. Here are sites they cited
with good info and extensive warnings of potential problems,
and some additional sites I found in my own searches:

http://www.americaneye.com/bbs3/

This is a bulletin board where you can read many
personal comments.

http://www.surgicaleyes.com/

This is a site founded by people who had unsuccessful
laser vision correction resulting in complications. Its
major point is that success defined by Snellen eye
chart acuity may be inadequate.

http://wakeup.to/lasik

The site's name should tell you its slant on the topic.

http://www-psy.ucsd.edu/~mm/eyeknowwhy/index.htm

Very well-organized site, balanced viewpoint, but
a bit out of date (last updated 1999). Well worth
a careful reading anyway.

http://www.vision-institute.com/director/article-prkvlasik.html

Detailed study results comparing PRK and LASIK
outcomes. 3 years old (1998, therefore procedures
done at least a year earlier). 220 eyes in the study.
Interesting point (for me): 11.8% of PRK eyes and
3.2% of LASIK eyes reported a loss of 2 Snellen
lines or more of best spectacle-corrected visual
acuity (in English, you can't see as well as before
even with glasses).

http://www.lasikwithprobst.com/lasik/fdastudy/default.htm

A more recent study (1999) with better outcomes.
Equipment and experience makes a significant
difference; be aware the technology changes
fairly rapidly. 2-line loss rates from 2% to 0.6%
in larger groups (1000+ and 700+ eyes).

http://www.allaboutvision.com/visionsurgery/outcomes.htm

More outcomes data; general, but recent.

http://www.ohioeye.com/refractive.html

A very good Feb. 2000 presentation of FDA pre-market
approval data for several laser systems. 2-line
loss is down to 0.3% with one system, but they
show glare and night-vision problems reported
by ~10% of patients. Remarkable Snellen acuity
results: 87% 20/20 post-op without lenses.

5 respondents to my query had actually had laser surgery.
All ultimately reported being satisfied with the results. 4
had no side effects at all. 3 reported good to excellent
results immediately with no side effects. One (57 years
old, farsighted) reported better post-op vision than previous
lens-corrected vision. 1 respondent cited trouble for
almost 1 year after surgery (couldn't see TEM images
properly, trouble adjusting astigmatism), and said he
was "initially devastated". However, he said he
adjusted and/or the problems corrected themselves after
a year. He can now handle all imaging tasks, and was
happier overall than with glasses.

My personal decision has been to wait and see. I'm still not
satisfied with the fairly high reported incidence of glare and
night-vision problems, which I think are related to limited
correction diameters compared to the dilated pupil of a
larger-than-average eye (mine are). The changes I saw
over just a few years of clinical trial results convinced me
this is still evolving technology. The risks, while small,
are still too high for me to accept in a purely elective
procedure.

Thank you for your patience with this long-winded
summary. Hope the info is useful to some of you.

Rick Mott (still reaching for his specs in the morning)




From daemon Wed Mar 14 11:12:36 2001



From: Mary Mager :      mager-at-interchange.ubc.ca
Date: Wed, 14 Mar 2001 09:08:13 -0800
Subject: Re: asbestos tests

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Dear Gordon,
As someone in an old building with asbestos floor tiling, asbestos fume
cupboard lining and old technicians who like to machine asbestos, I have
looked at lots of samples of asbestos insulation. First, when asbestos is
used, it is usally 30 % of the materials by volume, so it is very evident.
Second it is characterized by very long, fairly straight fibres that divide
down to smaller and smaller fibres, through and beyond the range of the SEM
magnification. By that critierion, none of your pictures look like they
contain asbestos. It helps to have looked at a sample so you can recognise
it. Third, I check all suspicious fibres by EDX. The crysotile asbestos used
in most insulation has a distictive Mg-Si spectrum, with a little Ca and Fe,
that isn't found in most minerals. If it has that signature, then I would
suspect asbestos and do the TEM. At 07:37 PM 3/13/01 -0800, you wrote:
} Hello,
} I was looking at some piping in our lab while sitting on the windowsill
} and noticed a sign painted over. Looking closer it was a sign for
} asbestos insulation that has been 80% painted over. I was told earlier
} that there was no asbestos pipe insulation in the lab. I collected some
} dust samples from near the fraying pipe insulation, on top of shelves,
} floor, and the windowsill and imaged them in our SEM.
}
} Can anyone with some experience with asbestos take a look at the images
} at: http://wilfred.berkeley.edu/~gordon/webdust and see if any of the
} images looks like a candidate for asbestos? I think only fd6, fd7, and
} fd8 are asbestos, and the rest of the fibrous materials imaged are
} cellulose binding agents used in the insulation.
}
} I will examine the material by TEM and electron diffraction, but I was
} wondering if someone could post the techniques they use for sampling from
} the dust, and any other hints and techniques I should be aware of.
}
} Thanks for your help,
} Gordon.
Regards,
Mary

Mary Mager
Electron Microscopist
Metals and Materials Engineering
University of British Columbia
6350 Stores Road
Vancouver, B.C. V6T 1Z4
CANADA
tel: 604-822-5648
e-mail: mager-at-interchg.ubc.ca



From daemon Wed Mar 14 11:30:34 2001



From: Richard Beanland +44 1327 356363 :      richard.beanland-at-marconi.com
Date: Wed, 14 Mar 2001 17:26:02 +0000 (GMT)
Subject: FIB machine - would like info

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Hello All,
I have the opportunity to obtain a Seiko SMI8300 focused ion beam machine. I can't find out very much about it (I didn't even know Seiko made them - I suspect they are usually native to Japan). Does anyone have any useful information or experience? Could I use one to make TEM specimens?

Many thanks,

Richard


==============================================================
Richard Beanland,
Structural Analysis Lab,
Caswell Technology,
Caswell,
Towcester,
Northants NN12 8EQ

e-mail richard.beanland-at-marconi.com
Tel. +44 1327 356363
Fax. +44 1327 356398
==============================================================
"The information contained in this message is legally privileged and confidential information intended for the eyes of the individual or entity named above. If the reader of this message is not the intended recipient, you are hereby notified that any dissemination, distribution or copying of this message is strictly prohibited. If you have received this message in error, please notify us immediately by telephone.
Caswell Technology is the trading name of Marconi Caswell Limited. Registered in London No. 3694360 Registered Office: One Bruton Street London W1X 8AQ. Holding Company: Marconi plc."






From daemon Wed Mar 14 11:52:22 2001



From: Rick Mott :      rickmott-at-alumni.princeton.edu
Date: Wed, 14 Mar 2001 12:33:44 -0500
Subject: Brief PS: laser vision correction for microscopists?

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


One last note: of the 4 respondents who enthusiastically
recommended the procedure, all were in agreement on the
importance of finding a highly experienced surgeon.
Complication rates are inversely related to experience.

Thanks,

Rick Mott




From daemon Wed Mar 14 12:26:54 2001



From: Thomas, Larry (PNNL) :      Larry.Thomas-at-pnl.gov
Date: Wed, 14 Mar 2001 10:22:55 -0800
Subject: RE: EDS detector chracterization: sensitivity/efficiency

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Frank,

I've never tried this either, but doubt it should work for the stated reason. A
layer of ice on the detector (actually the oxygen in the ice) will act mostly as
an x-ray absorber rather than a source of O x-rays. In fact, the ice will be a
poor absorber for O-K x-rays because the oxygen x-ray energy is below its
absorption edge.

Larry Thomas
Pacific Northwest National Laboratory
Richland, WA 99352
Phone: (509)372-0793 Fax: (509)376-6308
Email: mailto:Larry.Thomas-at-pnl.gov




----------
From: Frank Thomas
Sent: Wednesday, March 14, 2001 7:30 AM
To: Brian Wajdyk; Microscopy-at-sparc5.microscopy.com
Subject: Re: EDS detector chracterization: sensitivity/efficiency

------------------------------------------------------------------------
The Microscopy ListServer -- Sponsor: The Microscopy Society of America
To Subscribe/Unsubscribe -- Send Email to ListServer-at-MSA.Microscopy.Com
On-Line Help http://www.msa.microscopy.com/MicroscopyListserver/FAQ.html
-----------------------------------------------------------------------.


Brian -

A few years back when I took an EDS course put on by NORAN, they
said
keeping track of those K-alpha: L-alpha ratios should give you a running
record of your detector sensitivity. I've been doing that ever since,
and
you can actually see those ratios change over time, as your detector
window
gets dirty.
Another trick they mentioned (though I've never tried it myself) is
to
run a spectrum on some ordinary Teflon tape (yes, the kind you use for
plumbing repairs). Teflon, apparently, contains no oxygen, so the
presence
of O in the resulting spectrum can only be from ice buildup. Clever, no?
I also routinely do the Full Width Half Max test whenever I do a
calibration.
Good luck.

Frank Thomas
Geological Survey of Canada (Atlantic)
Bedford Institute of Oceanography
Dartmouth, Nova Scotia

----- Original Message -----
} From: "Brian Wajdyk" {Brian.Wajdyk-at-onsemi.com}
To: {Microscopy-at-sparc5.microscopy.com}
Sent: Wednesday, March 14, 2001 10:40 AM
Subject: EDS detector chracterization: sensitivity/efficiency


}
------------------------------------------------------------------------
} The Microscopy ListServer -- Sponsor: The Microscopy Society of
America
} To Subscribe/Unsubscribe -- Send Email to
ListServer-at-MSA.Microscopy.Com
} On-Line Help
http://www.msa.microscopy.com/MicroscopyListserver/FAQ.html
}
-----------------------------------------------------------------------.
}
}
} Fellow Microscopists,
}
} Fellow Microscopists,
}
} I want to track the performance of our EDS detector over time. We
} currently
} check: peak to background ratios via peak-to-tail of Mn k-alpha,
} symmetry
} via Full Width Tenth Max, peak offset via centeroid of the Mn k-alpha
} and
} L-alpha to known values, and resolution via Full Width Half Max. What
I
} don't have is a good way to determine sensitivity of the detector to
} determine when to remove ice/hydrocarbon build up. In the past I used
a
} 80%Mn 20%Cu standard and looked at the ratio of Cu k-alpha to Mn
l-alpha
} because at 10kV accelerating voltage, the peaks are nearly a 1:1
ratio.
} Unfortunately I no longer have this standard or the means to acquire a
} new
} one thanks to the slow down in the e semiconductor industry. My best
} guess
} would to be to clean the detector then use the k-alpha to l-alpha
ratio
} of
} Cu. However I know that we have the best microscopists in the world
at
} our
} disposal. Any suggestions for sensitivity tracking, or other useful
} detector characterizations I may have missed, would be greatly
} appreciated.
}
} Sincerely,
}
} Brian Wajdyk
} Sr. Electron Microscopist
} On Semiconductor
} brian.wajdyk-at-onsemi.com
} 602-244-4883
}
}





From daemon Wed Mar 14 13:32:14 2001



From: John J. Bozzola :      bozzola-at-siu.edu
Date: Wed, 14 Mar 2001 13:26:40 -0600
Subject: Computer: JPEG binary problems on server

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Perhaps a Macintosh, computer guru could figure this one out.

We are capturing JPEG images from a standard (Sony, analog 470 line,
NTSC) video camera using a program called Reel Eyes. The images are
captured on a Mac 8500 via the built-in S-Video port and saved as
Quicktime JPG's (as mandated by the Reel Eyes program). When we put
these images on our server they now appear with ".bin" appended to
the file name so that the new image is described as a
"Application/x-macbinary". Mac folks can open the files after
processing through Stuffit but PC folks are unable to deal with the
files. Anyway, this is an additional step that should not be present.

We can remove this problem by re-opening each of the images in
Photoshop and saving them without the Thumbnail (or preview). So, I
conclude that Quicktime is always saving with the Thumbnails in
place. Does anyone know of a way that we can prevent the thumbnails
from occurring in Quicktime?

Any other suggestions would be most welcome.

Many thanks,

John B.

--
##############################################################
John J. Bozzola, Ph.D., Director
I.M.A.G.E. (Integrated Microscopy & Graphics Expertise)
750 Communications Drive - MC 4402
Southern Illinois University
Carbondale, IL 62901 U.S.A.
Phone: 618-453-3730
Fax: 618-453-2665
Email: bozzola-at-siu.edu
Web: http://www.siu.edu/departments/shops/cem.html
##############################################################


From daemon Wed Mar 14 15:54:24 2001



From: Gordon Nord :      gnord-at-mindspring.com
Date: Wed, 14 Mar 2001 16:51:20 -0500
Subject: Re: Computer: JPEG binary problems on server

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


John,

The problem is that your files are encoded as Macbinary (.bin) before
being stuffed. Windows machines can't decode .bin files unless they have the
windows version of Stuffit expander. Encourage them to get it.

To correct this you need to change a preference setting.

In Magic Menu or Dropstuff preferences, go to the "Cross-Platform" or
"MacBinary" icon and choose "Never" (instead of "Smart"). There is no
way to change this preference in the StuffIt Deluxe application.

The URL for this information is
{http://www.aladdinsys.com/support/techsupport/mac/dlx/dlx611.html}

Happy capturing.
Gordon Nord
"My real job is Mineralogy"

"John J. Bozzola" wrote:
}
} ------------------------------------------------------------------------
} The Microscopy ListServer -- Sponsor: The Microscopy Society of America
} To Subscribe/Unsubscribe -- Send Email to ListServer-at-MSA.Microscopy.Com
} On-Line Help http://www.msa.microscopy.com/MicroscopyListserver/FAQ.html
} -----------------------------------------------------------------------.
}
} Perhaps a Macintosh, computer guru could figure this one out.
}
} We are capturing JPEG images from a standard (Sony, analog 470 line,
} NTSC) video camera using a program called Reel Eyes. The images are
} captured on a Mac 8500 via the built-in S-Video port and saved as
} Quicktime JPG's (as mandated by the Reel Eyes program). When we put
} these images on our server they now appear with ".bin" appended to
} the file name so that the new image is described as a
} "Application/x-macbinary". Mac folks can open the files after
} processing through Stuffit but PC folks are unable to deal with the
} files. Anyway, this is an additional step that should not be present.
}
} We can remove this problem by re-opening each of the images in
} Photoshop and saving them without the Thumbnail (or preview). So, I
} conclude that Quicktime is always saving with the Thumbnails in
} place. Does anyone know of a way that we can prevent the thumbnails
} from occurring in Quicktime?
}
} Any other suggestions would be most welcome.
}
} Many thanks,
}
} John B.
}
} --
} ##############################################################
} John J. Bozzola, Ph.D., Director
} I.M.A.G.E. (Integrated Microscopy & Graphics Expertise)
} 750 Communications Drive - MC 4402
} Southern Illinois University
} Carbondale, IL 62901 U.S.A.
} Phone: 618-453-3730
} Fax: 618-453-2665
} Email: bozzola-at-siu.edu
} Web: http://www.siu.edu/departments/shops/cem.html
} ##############################################################

--
Gordon Nord
Small Business Network Design and Construction
Macintosh and Windows - Solutions and Conflicts

Nord Consultants
20594 Cornstalk Terrace
Ashburn VA 20147

Voice 703-723-2798 (Home Office)
Cell 703-403-2776 (Mobile Office)
Email gnord-at-mindspring.com


From daemon Wed Mar 14 16:11:25 2001



From: Zhenquan Liu :      zhenquan.liu-at-asu.edu
Date: Wed, 14 Mar 2001 15:07:17 -0700
Subject: Preparing cross-section of coated fibers

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Werner,

Yes, I did use Hitach 4500S and 3500N to study some coated fibers in the
recent past years. The coating layers were up to three.

General speaking, I think this kind of preparation needs patient and do it
properly at every step as the processing goes.

The steps I did for preparing the coated fibers for SEM are
1. Cut the fibers carefully into about 1 cm length of pieces
2. Arrange them in a longitudinal direction (do not hurt them)
3. Hold one end of the fibers by using a pair of tweezers
4. Apply thin M-Bond (16) on to the fibers
Since the M-bond is so thin, it will go along with the fibers and
surround almost every fiber very well.
5. Leave the fibers in the air (room temperature) overnight. Do not let the
wet part touch any solid surface such as metal or microscope slide.
Otherwise when it cures, it is very difficult to separate them. Another way
to cure it is putting the fiber with the tweezers on to a hot plate at 130
C for one hour. Do not let the wet part touch the hot plate.
6. When the fibers are cured, embed them into epoxy to make a big enough
piece so that you can hold and polish it for SEM.
At this step, you have to avoid trapping air in the epoxy. Especially
when a fabric of fibers is going to be embedded into epoxy, you have to use
a pump to get rid of air bobbles before curing.
You may choose a kind of epoxy which can be cured in couple of hours in
air (room temperature) or on a hot plate for about 1 to 2 hours at 130 C.
The epoxy I used is a kind of mixture of two parts.
7. Then you may follow the routing procedures for polishing SEM samples,
i.e., grinding first then polishing, from coarse to fine carefully.

Finally if you are going to study a fabric, then you can cut a size of 1 x
1 cm2, and hold it with a tweezers at a corner, and apply a layer of M-bond
(16) on both sides, put it onto a hot plate for curing. Then embed this
piece of fabric into epoxy. Again, you have to pump the air out before
curing.

Good luck.

Zhenquan Liu







} ------------------------------------------------------------------------
} The Microscopy ListServer -- Sponsor: The Microscopy Society of America



------------------------------------
Zhenquan Liu (Dr.)
Arizona State University
Center for Solid State Science
Room PSA213
Tempe, AZ 85287
Tel (480) 965 4544 (o)
(480) 775 7428 (h)
Fax (480) 965 9004 (o)
Email zhenquan.liu-at-asu.edu
------------------------------------




From daemon Wed Mar 14 16:13:40 2001



From: Zhenquan Liu :      zhenquan.liu-at-asu.edu
Date: Wed, 14 Mar 2001 15:10:12 -0700
Subject: Looking for Dr. Zhiping Wang

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Dr. Zhiping Wang,

I am sure you are checking with this listserver very often. Please tell me
your telephone number and address.

Cheers!

Zhenquan Liu (Dr.)

------------------------------------
Zhenquan Liu (Dr.)
Arizona State University
Center for Solid State Science
Room PSA213
Tempe, AZ 85287
Tel (480) 965 4544 (o)
(480) 775 7428 (h)
Fax (480) 965 9004 (o)
Email zhenquan.liu-at-asu.edu
------------------------------------




From daemon Wed Mar 14 16:48:32 2001



From: Pradyumna Prabhumirashi :      p-prabhumirashi-at-northwestern.edu
Date: Wed, 14 Mar 2001 16:47:13 -0600
Subject: Problems with Gatan IBT

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Hello,
We have a Gatan Duomill IBT Model 600. We have been having some problems
with it lately.
When I turn on the IBT, the vacuum in the main chamber works fine. When
pumping
down the specimen chambers, the left side does not pump at all. The right
side pumps to the proper level, but when you lower the sample into the
chamber, it takes a while for the vacuum to recover. There is no vacuum
instability during sample rotation. There is no arcing in the guns. The
argon flow is at the proper level.
We have done the following:
-cleaned, regreased and changed o-rings in the Whisperlock Assembly,
sample viewing port, sample chamber, vent/vac buttons, and ion guns
-changed the cathode tubes
-dusted out the main sample chamber
-check the vacuum pumps and topped off oil in the roughing pump
-DP seems to be running fine

Still it doesn't seem to help. We are lost. Any suggestions about what might
be going wrong here? Thanks.
Prad

Pradyumna Prabhumirashi
Department of Materials Science
Northwestern University
Phone: (847)-491-7798
Fax: (847)-491-7820
http://vpd.ms.northwestern.edu/prad.htm






From daemon Wed Mar 14 16:55:26 2001



From: Joseph Neilly :      joe.p.neilly-at-abbott.com
Date: Wed, 14 Mar 2001 16:51:06 -0600
Subject: EDS detector chracterization: sensitivity/efficiency

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


We have used the k:alpha:l-alpha ratio for copper and nickel for many years
as a measure of ice buildup on our detectors. Either ratio is very sensitive
to ice buildup. With single element standards you don't have to worry if the
mixture of two elements in your standard has changed. For sources we use
copper or nickel TEM grids which are cheap and available from all the EM
vendors.

Regards,
Joe Neilly
Abbott Laboratories
D-45M, AP31
200 Abbott Park Rd.
Abbott Park, IL 60064-6202

voice: (847)-938-5024
fax: (847)-938-5027
e-mail: joe.neilly-at-abbott.com



Brian.Wajdyk-at-onsemi.com on 03/14/2001 10:24:35 AM
To: Microscopy-at-sparc5.Microscopy.Com
cc:


Fellow Microscopists,

Fellow Microscopists,

I want to track the performance of our EDS detector over time. We
currently
check: peak to background ratios via peak-to-tail of Mn k-alpha,
symmetry
via Full Width Tenth Max, peak offset via centeroid of the Mn k-alpha
and
L-alpha to known values, and resolution via Full Width Half Max. What I
don't have is a good way to determine sensitivity of the detector to
determine when to remove ice/hydrocarbon build up. In the past I used a
80%Mn 20%Cu standard and looked at the ratio of Cu k-alpha to Mn l-alpha
because at 10kV accelerating voltage, the peaks are nearly a 1:1 ratio.
Unfortunately I no longer have this standard or the means to acquire a
new
one thanks to the slow down in the e semiconductor industry. My best
guess
would to be to clean the detector then use the k-alpha to l-alpha ratio
of
Cu. However I know that we have the best microscopists in the world at
our
disposal. Any suggestions for sensitivity tracking, or other useful
detector characterizations I may have missed, would be greatly
appreciated.

Sincerely,

Brian Wajdyk
Sr. Electron Microscopist
On Semiconductor
brian.wajdyk-at-onsemi.com
602-244-4883








From daemon Wed Mar 14 17:38:42 2001



From: Rick Harris :      raharris-at-ucdavis.edu
Date: Wed, 14 Mar 2001 15:35:16 -0800
Subject: Reichert Frigo-cut repairs

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Just got a call from a researcher on campus looking for service on a
Reichert Frigo-Cut type 2800, s/n 0110117 microtome. I am not familiar
with this piece of equipment (we don't do light level microtomy) and I do
not know this gentleman but he had already contacted one northern
California service and was quoted $130/hr p to p. He balked. I explained
that I had been quoted as much from services in New Hampshire. If anyone
has a resource for repairing one of these microtomes in the Northern
California region I will pass the info back to this person.

Thanks in advance.


Rick A. Harris, Director
Microscopy and Imaging Facility
Section of Molecular and Cellular Biology
1241 Life Sciences Addition
University of California
Davis, CA
530 752 2914
530 754 7536 fax
http://katie.ucdavis.edu
raharris-at-ucdavis.edu



From daemon Wed Mar 14 18:19:11 2001



From: Gordon Vrololjak :      gvrdolja-at-nature.Berkeley.EDU
Date: Wed, 14 Mar 2001 16:14:47 -0800 (PST)
Subject: Re: asbestos tests

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Thanks for all of your replies,
We had someone from our physical plant come in, and they revealed that the
colour of the painted over sign indicates asbestos - free - insulation.
Wierd scare for me since the painter covered the most important part of
the label - that the insulation was asbestos free, not asbestos. They'll
come back to tape back up all of the loose insulation tomorrow.

Since one of the specimens I looked at is very similar in morphology to
asbestos, they'll be doing some wipe tests and counts by polarized light
microscopy for asbestos particles to be sure. It likely was left behind
from when the original asbestos insulation was removed about 10 years ago
or so.

I appreciate all of the replies on the thread and supportive messages.
Gordon.

\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\
Gordon Ante Vrdoljak Electron Microscope Lab
ICQ 23243541 http://nature.berkeley.edu/~gvrdolja 26 Giannini Hall
gvrdolja-at-nature.berkeley.edu UC Berkeley
phone (510) 642-2085 Berkeley CA 94720-3330
fax (510) 643-6207 cell (510) 290-6793

On Wed, 14 Mar 2001, Mary Mager wrote:

} ------------------------------------------------------------------------
} The Microscopy ListServer -- Sponsor: The Microscopy Society of America
} To Subscribe/Unsubscribe -- Send Email to ListServer-at-MSA.Microscopy.Com
} On-Line Help http://www.msa.microscopy.com/MicroscopyListserver/FAQ.html
} -----------------------------------------------------------------------.
}
}
} Dear Gordon,
} As someone in an old building with asbestos floor tiling, asbestos fume
} cupboard lining and old technicians who like to machine asbestos, I have
} looked at lots of samples of asbestos insulation. First, when asbestos is
} used, it is usally 30 % of the materials by volume, so it is very evident.
} Second it is characterized by very long, fairly straight fibres that divide
} down to smaller and smaller fibres, through and beyond the range of the SEM
} magnification. By that critierion, none of your pictures look like they
} contain asbestos. It helps to have looked at a sample so you can recognise
} it. Third, I check all suspicious fibres by EDX. The crysotile asbestos used
} in most insulation has a distictive Mg-Si spectrum, with a little Ca and Fe,
} that isn't found in most minerals. If it has that signature, then I would
} suspect asbestos and do the TEM. At 07:37 PM 3/13/01 -0800, you wrote:
} } Hello,
} } I was looking at some piping in our lab while sitting on the windowsill
} } and noticed a sign painted over. Looking closer it was a sign for
} } asbestos insulation that has been 80% painted over. I was told earlier
} } that there was no asbestos pipe insulation in the lab. I collected some
} } dust samples from near the fraying pipe insulation, on top of shelves,
} } floor, and the windowsill and imaged them in our SEM.
} }
} } Can anyone with some experience with asbestos take a look at the images
} } at: http://wilfred.berkeley.edu/~gordon/webdust and see if any of the
} } images looks like a candidate for asbestos? I think only fd6, fd7, and
} } fd8 are asbestos, and the rest of the fibrous materials imaged are
} } cellulose binding agents used in the insulation.
} }
} } I will examine the material by TEM and electron diffraction, but I was
} } wondering if someone could post the techniques they use for sampling from
} } the dust, and any other hints and techniques I should be aware of.
} }
} } Thanks for your help,
} } Gordon.
} Regards,
} Mary
}
} Mary Mager
} Electron Microscopist
} Metals and Materials Engineering
} University of British Columbia
} 6350 Stores Road
} Vancouver, B.C. V6T 1Z4
} CANADA
} tel: 604-822-5648
} e-mail: mager-at-interchg.ubc.ca
}
}




From daemon Thu Mar 15 02:33:28 2001



From: Faerber Jacques :      Jacques.Faerber-at-ipcms.u-strasbg.fr
Date: Thu, 15 Mar 2001 09:26:11 +0100
Subject: re : EDS sensitivity

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Brian

A few years ago, a EDS reparer explain me a test, which seems to be
interresting, to check the "health" of a detector with UTW, but I never
have tried it.

With a fluorine (CaF2) sample at 10 keV, You should have a ratio of one
betwween F K alpha and Ca K alpha. When not, or when it diminish in the
time (less F), you have ice (absorbtion effect of F by O2). (Why 10 kev?
Is 10 keV not a bit high for F. It think it's a compromise between the
window caracteristics and the primary energy).

Same thing with quartz (SiO2), at 5 keV, and than, if O diminish, you have
oil on the window (absorbtion effect of O2 by C).

As I said, I never tried this test, the CaF2 and SiO2 samples are in my
drawer, waiting for polishing. I suppose that geologist should have an
advice about that, but of course they don't often work at 5 keV for EDS.

I usually use a aluminum sample holder, with a piece of carbon adhesive
tape and a copper foil, and I take a spectrum with a quarter of the SEM
screen on the copper, a quarter on the carbon, and the half on the
aluminium,at low mag, and at 5 keV. I adust the probe current to a preset
value (typically a few nA, and each time the same value) mesured on the
carbon tape (less SE and BSE, better would be a Faraday cup). So I see if
the sensitivity on C K, Cu L and Al K seems to diminish from on mesure to
an other. In such condition you'll see that the count rate (and of course,
the spectrum shape) is very sensitive to window or detector contamination
(with allways the same probe current, time constant, etc.). You can
imagine similar test with for exemple, Vandium L and silicon K, etc.

best regard

Jacques


J. Faerber
IPCMS-GSI
(Institut de Physique et Chimie des Matériaux de Strasbourg
Groupe Surface et Interfaces)
23, rue de Loess
67037 Strasbourg CEDEX
France

Tel 00 33(0)3 88 10 71 01
Fax 00 33(0)0 88 10 72 48
E-mail Jacques.Faerber-at-ipcms.u-strasbg.fr



From daemon Thu Mar 15 02:53:32 2001



From: Claudia Hayward-Costa :      LS_S562-at-crystal.kingston.ac.uk
Date: Thu, 15 Mar 2001 08:49:59 -0000
Subject: IEM: Double labelling of cells

Contents Retrieved from Microscopy Listserver Archives
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Dear Microscopists,

I was asked to perform double labelling of surface antigens on
leukaemia cell cultures and cord blood progenitors.

In the past I used a pre-embedding protocol for single labelling
which worked quite well.

I would like to continue with a pre-embedded protocol, but both
primary antibodies are raised in the same animal and I wonder how
I can block unspecific labelling in that case.

(I have a protocol for post-embedded double staining with primary
AB raised in the same animal, but would prefer to use that as a
last resort)

So far I used a 10 nm gold F(ab)2- AB - if I use a 5nm gold F(ab)2
AB will I be able to distinguish them in the TEM?

I would appreciate your input very much.

Many thanks

Claudia


Dr. C. Hayward-Costa
School of Life Sciences
Kingston University
Penrhyn Road, Kingston upon Thames
Surrey KT1 2EE, UK
44(0)208 547 2000 x 2240
Email: c.hayward-at-kingston.ac.uk


From daemon Thu Mar 15 04:01:26 2001



From: Steve Chapman :      PROTRAIN-at-CompuServe.COM
Date: Thu, 15 Mar 2001 04:56:05 -0500
Subject: Preparing cross-section of coated fibers

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Hi

I have a technique that I use with clients on a wide range of fibres which
takes very little time.

1. Drill two or three holes through two SEM stubs placed face to face.
2. Pass the fibres through the holes.
3. Fix in place with a water based carbon solution, make sure the
fibre/stub interface is well wetted.
4. When fully dry place in liquid nitrogen CARE!!.
5. When the bubbling stops lift out CARE!!
6. Place on an insulating surface and with a knife strike the
interface between the two stubs - the system will fracture.
7. When dried off you have two sets of surfaces to look at in LM or
SEM.

It works great on a number of differing media other than fibres, the only
snag is they must not be affected by the water base.

Steve Chapman
Senior Consultant Protrain
For professional training in SEM, TEM and EDX world wide
www.emcourses.com


From daemon Thu Mar 15 07:15:52 2001



From: Marco Arienti :      marienti-at-tiscalinet.it
Date: Thu, 15 Mar 2001 14:08:46 +0100
Subject: TEM maintenance CM10

Contents Retrieved from Microscopy Listserver Archives
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I have no big experience with Philips microscopes, but I need some
information.

A CM10 installed about 10 years ago have some vacuum problems.

Looks like the Ion Getter Pump is not working anymore.

As far as I understood the problem may be that there is no more Titanium in
the pump.

Is possible In this one to change the only grids (like in the Leibold pumps)
or the all pump have to be exchanged?

It is a pump manufactured from Edwards, any info about the model?

Thanks a lot.



Marco Arienti

www.electronrescue.com






From daemon Thu Mar 15 07:59:59 2001



From: John Bonevich :      john.bonevich-at-nist.gov
Date: Thu, 15 Mar 2001 08:55:45 -0500
Subject: Re: Computer: JPEG binary problems on server

Contents Retrieved from Microscopy Listserver Archives
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I imagine that the problem arises when you transfer the files to the
server. I'll assume that you are using some FTP program such as Fetch. In
the upload preferences, make sure that you are transferring non-text data
in the "raw data" format, as opposed to MacBinary, etc. Also, make sure
that the FTP doesn't append a ".bin" to raw data.

Remember you still need to have a ".jpg" at the end of the filename or else
the Windows boxes still won't know how to handle the file (sigh...). There
are numerous utilties on the Mac to batch process the renaming of files for
cross-platform compatibility.

Hope this helps,
John B.

}
} Perhaps a Macintosh, computer guru could figure this one out.
}
} We are capturing JPEG images from a standard (Sony, analog 470 line,
} NTSC) video camera using a program called Reel Eyes. The images are
} captured on a Mac 8500 via the built-in S-Video port and saved as
} Quicktime JPG's (as mandated by the Reel Eyes program). When we put
} these images on our server they now appear with ".bin" appended to
} the file name so that the new image is described as a
} "Application/x-macbinary". Mac folks can open the files after
} processing through Stuffit but PC folks are unable to deal with the
} files. Anyway, this is an additional step that should not be present.
}
} We can remove this problem by re-opening each of the images in
} Photoshop and saving them without the Thumbnail (or preview). So, I
} conclude that Quicktime is always saving with the Thumbnails in
} place. Does anyone know of a way that we can prevent the thumbnails
} from occurring in Quicktime?
}
} Any other suggestions would be most welcome.
}
} Many thanks,
}
} John B.
}
} --
} ##############################################################
} John J. Bozzola, Ph.D., Director
} I.M.A.G.E. (Integrated Microscopy & Graphics Expertise)
} 750 Communications Drive - MC 4402
} Southern Illinois University
} Carbondale, IL 62901 U.S.A.
} Phone: 618-453-3730
} Fax: 618-453-2665
} Email: bozzola-at-siu.edu
} Web: http://www.siu.edu/departments/shops/cem.html
} ##############################################################



From daemon Thu Mar 15 08:18:34 2001



From: John Foust :      jfoust-at-threedee.com
Date: Thu, 15 Mar 2001 08:13:36 -0600
Subject: Re: Computer: JPEG binary problems on server

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


At 01:26 PM 3/14/01 -0600, John J. Bozzola wrote:
} The images are captured on a Mac 8500 via the built-in S-Video port and saved as Quicktime JPG's (as mandated by the Reel Eyes program). When we put these images on our server they now appear with ".bin" appended to the file name so that the new image is described as a "Application/x-macbinary". Mac folks can open the files after processing through Stuffit but PC folks are unable to deal with the files. Anyway, this is an additional step that should not be present.
} We can remove this problem by re-opening each of the images in Photoshop and saving them without the Thumbnail (or preview). So, I conclude that Quicktime is always saving with the Thumbnails in place. Does anyone know of a way that we can prevent the thumbnails from occurring in Quicktime?

The Mac's file system is slightly different than that on a PC or a Unix server.
Mac files have two parts, known as forks. The icon or thumbnail image resides
in the "resource fork". The regular JPEG image data that a PC expects is in
the "data fork." The resource fork also holds the Mac's association
between the file and the program that made it, while the PC uses the
file extension for that purpose.

MacBinary files are a way of wrapping up the data and resource forks into
a single file, such as for transmission via an e-mail attachment, ftp site,
etc. or in your case, handy for putting on a server that doesn't speak
with forked tongue.

You didn't say much about your server. If it's a WinNT server, your
admin can install some AppleTalk extensions that can make PC {-} Mac file
exchange a bit easier. They automatically manage the resource fork,
hiding it for PC programs but allowing networked Macs to store
and access it.

You also didn't say much about which PC programs you were using.
I don't know of any that handle MacBinary files. (I've written a
few that did, once upon a time, but they're obscure.) You may be
forced to either strip the files on the Mac, or use a utility
on the PC side to convert the MacBinary files to data-only files.

I don't think Quicktime thumbnails are the problem, I think it's
a MacBinary problem.

- John



From daemon Thu Mar 15 09:39:15 2001



From: pjcb-at-hei.co.kr
Date: Thu, 15 Mar 2001 09:33:48 -0600
Subject: Ask-A-Microscopist: analyzing stress around STI (shallow trench

Contents Retrieved from Microscopy Listserver Archives
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Email: pjcb-at-hei.co.kr
Name: Ju-chul Park

Organization: Hyundai Electronics

Education: Graduate College

Location: CheongJu Korea

Question: I have been analyzing stress around STI (shallow trench
isolation) in DRAM. In general, stress is
higher at bottom corner and top corner of STI, which is probed by my data.
But, the strange thing is that HOLZ line split and blurring occurs in CBED
pattern at the bottom of FOX (field oxide). I know that the split and
blurring is the sign of high stress. And I don't think that stress is
higher at the bottom of FOX.
So, my question is what makes line split and blurring except stress. Have
you seen that kind of phenomenon? Thank you for your answer.

---------------------------------------------------------------------------




From daemon Thu Mar 15 11:02:32 2001



From: David Henriks :      henriks-at-southbaytech.com
Date: Thu, 15 Mar 2001 09:47:36 -0800
Subject: Re: Preparing cross-section of coated fibers

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


} Dear Werner:

If you go to our new website at www.southbaytech.com, you will find a listing of
technical papers that you can request. There are several there dealing with coated
fibers. Please take a look. If any look interesting, submit a request and we will
send them out to you at no charge.

When you get to the site, click on Applications support then technical papers.
There are a lot of papers there, so the easiest way to find the ones you are
interested in is to use the "find on page" function typically found under your edit
command. If you type in "fiber", you'll find some relevant papers.

I hope this helps.

--
David Henriks TEL: +1-949-492-2600
South Bay Technology, Inc. FAX: +1-949-492-1499
1120 Via Callejon
San Clemente, CA 92673 USA e-mail: henriks-at-southbaytech.com

*** www.southbaytech.com ***




From daemon Thu Mar 15 11:13:45 2001



From: Ron Doole :      ron.doole-at-materials.oxford.ac.uk
Date: Thu, 15 Mar 2001 17:19:39 +0000 (GMT Standard Time)
Subject: Re: TEM maintenance CM10

Contents Retrieved from Microscopy Listserver Archives
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Hi Marco,

The ion getter pump on the CM10 (12 and 20) does have a
finite life and if your machine is 10 years old with the
original IGP then I suspect that the pump could be
finished. I assume that it will not pump down properly on
the IGP but has a good penning gauge (P3) pressure.

The pump is not a standard Edwards pump as it has an extra
port so that it can pump both the column and the gun. As I
understand it the pump body is cut open to replace the
plates and then rewelded before being leak tested and baked.

There are companies that will do this for you but you are
without the pump while they do it, this may take two weeks
or more. FEI should hold replacement pumps that they would
swop in a day, more expensive but faster and more
convenient. It depends on your budget and facilities.

Good luck,
Ron



On Thu, 15 Mar 2001 14:08:46 +0100 Marco Arienti
{marienti-at-tiscalinet.it} wrote:

} ------------------------------------------------------------------------
} The Microscopy ListServer -- Sponsor: The Microscopy Society of America
} To Subscribe/Unsubscribe -- Send Email to ListServer-at-MSA.Microscopy.Com
} On-Line Help http://www.msa.microscopy.com/MicroscopyListserver/FAQ.html
} -----------------------------------------------------------------------.
}
}
} I have no big experience with Philips microscopes, but I need some
} information.
}
} A CM10 installed about 10 years ago have some vacuum problems.
}
} Looks like the Ion Getter Pump is not working anymore.
}
} As far as I understood the problem may be that there is no more Titanium in
} the pump.
}
} Is possible In this one to change the only grids (like in the Leibold pumps)
} or the all pump have to be exchanged?
}
} It is a pump manufactured from Edwards, any info about the model?
}
} Thanks a lot.
}
}
}
} Marco Arienti
}
} www.electronrescue.com
}
}
}
}
}

----------------------
Mr. R.C. Doole
Department of Materials,
University of Oxford.
Parks Road, Oxford. OX1 3PH. UK.
Phone +44 (0) 1865 273701
Fax +44 (0) 1865 283333
ron.doole-at-materials.ox.ac.uk



From daemon Thu Mar 15 11:19:40 2001



From: Patton, David :      David.Patton-at-uwe.ac.uk
Date: Thu, 15 Mar 2001 17:16:13 +0000 (GMT Standard Time)
Subject: Re: Preparing cross-section of coated fibers

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Could you recommend a water based carbon solution?

Dave

On Thu, 15 Mar 2001 04:56:05 -0500 Steve Chapman
{PROTRAIN-at-CompuServe.COM} wrote:

} ------------------------------------------------------------------------
} The Microscopy ListServer -- Sponsor: The Microscopy Society of America
} To Subscribe/Unsubscribe -- Send Email to ListServer-at-MSA.Microscopy.Com
} On-Line Help http://www.msa.microscopy.com/MicroscopyListserver/FAQ.html
} -----------------------------------------------------------------------.
}
}
} Hi
}
} I have a technique that I use with clients on a wide range of fibres which
} takes very little time.
}
} 1. Drill two or three holes through two SEM stubs placed face to face.
} 2. Pass the fibres through the holes.
} 3. Fix in place with a water based carbon solution, make sure the
} fibre/stub interface is well wetted.
} 4. When fully dry place in liquid nitrogen CARE!!.
} 5. When the bubbling stops lift out CARE!!
} 6. Place on an insulating surface and with a knife strike the
} interface between the two stubs - the system will fracture.
} 7. When dried off you have two sets of surfaces to look at in LM or
} SEM.
}
} It works great on a number of differing media other than fibres, the only
} snag is they must not be affected by the water base.
}
} Steve Chapman
} Senior Consultant Protrain
} For professional training in SEM, TEM and EDX world wide
} www.emcourses.com
}

----------------------------------------
Patton, David
Email: David.Patton-at-uwe.ac.uk
"University of the West of England"



From daemon Thu Mar 15 11:52:38 2001



From: Karen Schlueter :      kschlueter-at-salinas.ars.usda.gov
Date: Thu, 15 Mar 2001 09:50:49 -0800
Subject: TEM - Liquid Nitrogen storage

Contents Retrieved from Microscopy Listserver Archives
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I need some info on liquid nitrogen dispensing devices. Our EM lab has four
20 liter dewars for liquid nitrogen storage. A piece of styrofoam (2 x 6)
is attached to the lid. We would like to purchase a dispensing device
because it would be easier to use and less waste of liquid nitrogen.
Thanks in advance
Karen Schlueter
PWA, ARS, USDA
EM Lab
1636 East Alisal St.
Salinas, CA 93905
(831) 755-2847
FAX: (831) 755-2814
kschlueter-at-salinas.ars.usda.gov



From daemon Thu Mar 15 12:27:34 2001



From: Ziegler, David SBCCOM(N) :      David.Ziegler-at-Natick.Army.Mil
Date: Thu, 15 Mar 2001 13:22:09 -0500
Subject: TEM sample prep question: TEM of dehydrated meat

Contents Retrieved from Microscopy Listserver Archives
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Hello all

As a materials scientist, I haven't had any experience doing TEM sample prep
of biological samples, so I need some assistance in this.

I've been asked to look at in the TEM some dehydrated beef looking for the
changes in sarcomere length etc due to the dehydration process.

I have at my disposal staining solutions of 0.5% RuO4, and 2% methanolic UA
and need some procedures on how to go about preparing these specimens.
(Things like cut the dehydrated sample into cubes, stain with this for how
long at this temp then embed and microtome or such.)

Thanks in advance.

dz

David Ziegler
U.S. Army, SBCCOM
AMSSB-RSS-MS(N)
Materials Science Team, SS&T
Natick, MA 01760-5020
TEL: (508) 233-6484
FAX: (508) 233-5521
Email: David.Ziegler-at-Natick.Army.Mil



From daemon Thu Mar 15 12:43:25 2001



From: Arnold, Jim :      jim.arnold6-at-honeywell.com
Date: Thu, 15 Mar 2001 12:42:44 -0600
Subject: Sputter Coater for SEM

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


I am looking to purchase a sputter coater ~$5000. I currently have a
Polaron E5200 that is inoperable. I do Failure Analysis on semiconductors,
probably a 6 inch chamber & Au/Pd target. Can anyone in the list give me
some good tools that work for them.

Anyone familiar with BOC Scancoat Six?


Thanks in advance

Jim Arnold
Senior Quality Technician / Failure Analysis
Honeywell - Microelectronics and Technology Center
Columbia, MD 21045
email: jim.arnold6-at-honeywell.com




From daemon Thu Mar 15 12:52:58 2001



From: Norman_C_Miller-at-raytheon.com
Date: Thu, 15 Mar 2001 12:52:30 -0600
Subject: EDS detector chracterization: sensitivity/efficiency

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Brian,

For organic contamination, monitoring the ratio of TiKa to TiLa is good because
TiLa is absorbed heavily by organic layers on the detector window. For ice, a
spectrum from say calcium fluoride is good because again fluorine Ka is heavily
absorbed by oxygen containing layers such as ice.

Carl Miller
---------------------- Forwarded by Norman C Miller/RES/Raytheon/US on
03/14/2001 02:00 PM ---------------------------


"Brian Wajdyk" {Brian.Wajdyk-at-onsemi.com} on 03/14/2001 09:40:51 AM

To: Microscopy-at-sparc5.microscopy.com
cc: (bcc: Norman C Miller/RES/Raytheon/US)


Fellow Microscopists,

Fellow Microscopists,

I want to track the performance of our EDS detector over time. We
currently
check: peak to background ratios via peak-to-tail of Mn k-alpha,
symmetry
via Full Width Tenth Max, peak offset via centeroid of the Mn k-alpha
and
L-alpha to known values, and resolution via Full Width Half Max. What I
don't have is a good way to determine sensitivity of the detector to
determine when to remove ice/hydrocarbon build up. In the past I used a
80%Mn 20%Cu standard and looked at the ratio of Cu k-alpha to Mn l-alpha
because at 10kV accelerating voltage, the peaks are nearly a 1:1 ratio.
Unfortunately I no longer have this standard or the means to acquire a
new
one thanks to the slow down in the e semiconductor industry. My best
guess
would to be to clean the detector then use the k-alpha to l-alpha ratio
of
Cu. However I know that we have the best microscopists in the world at
our
disposal. Any suggestions for sensitivity tracking, or other useful
detector characterizations I may have missed, would be greatly
appreciated.

Sincerely,

Brian Wajdyk
Sr. Electron Microscopist
On Semiconductor
brian.wajdyk-at-onsemi.com
602-244-4883




From daemon Thu Mar 15 13:41:40 2001



From: drose-at-wlgore.com
Date: Thu, 15 Mar 2001 14:23:18 -0500
Subject: Sputter coating: Target thickness

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html




Dear List,

I am looking to replace my target on my sputter coater and would like to find
out if there is an optimal thickness for the target. Is it material dependant?
I had requested 2.5mil from the thickness of my old target but the vendor I
spoke with will only source a minimum 4mil thick target. I am looking at Pt and
Au/Pd. Will I have to increase current to get the same deposition rate for a
thicker target?

TIA

David B Rose
W. L. Gore and Associates
297 Blue Ball Road
Elkton, MD 21921
410-506-2958




From daemon Thu Mar 15 15:03:29 2001



From: Dick Briggs :      rbriggs-at-Science.Smith.edu
Date: Thu, 15 Mar 2001 15:57:45 -0500
Subject: My LKB microtome repair

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Many thanks to all of you who offered advice, assistance, consolation
and even a loan of the part or a used instrument for parts. I was
able to find a replacement ($100 - overpriced perhaps but worth every
penny!) and will get it installed next week with the directions from
another microscopy list reader.

Again my thanks to all and if anyone wants the names and addresses of
some LKB parts dealers and/or service folks, I will gladly provide
you with my new list off-line.

Regards,

Dick Briggs



From daemon Thu Mar 15 15:23:29 2001



From: Larry D. Ackerman :      mishot-at-itsa.ucsf.edu
Date: Thu, 15 Mar 2001 13:08:07 -0800
Subject: Re: Reichert Frigo-cut repairs

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Some years ago I had Melins (510-234-5749) repair our Reichert 2800. They
insisted on taking it to their shop and it needed a new compressor from
Europe. The bill was over $2000. $130/ hour is a typical charge for this
type of work in this area. When I the Reichert unit was destroyed in a
water flood I purchased a Microm cryostat. It uses standard easily
available refrigeration components. The cost and repair time is gresatly
reduced. Good luck.



At 03:35 PM 3/14/01 -0800, you wrote:
} ------------------------------------------------------------------------
} The Microscopy ListServer -- Sponsor: The Microscopy Society of America

Larry D. Ackerman
Lily & Yuh Nung Jan Laboratories
Howard Hughes Medical Institute
UCSF, Box 0725, Rm U226
533 Parnassus Ave.
San Francisco, CA 94143

(415) 476-8751 FAX (415) 476-5774
mishot-at-itsa.ucsf.edu
http://www.ucsf.edu/janlab


From daemon Thu Mar 15 16:47:15 2001



From: Dave Phelan :      emudp-at-mail.newcastle.edu.au
Date: Fri, 16 Mar 2001 11:35:54 +1100
Subject: Jeol 840 viewing screen replacement

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


No, thicker target = longer life, but it makes no difference to
deposition rate, current etc.
Chris


----- Original Message -----
} From: {"drose-at-wlgore.com"-at-sparc5.microscopy.com}
To: {microscopy-at-sparc5.microscopy.com}
Sent: Thursday, March 15, 2001 7:23 PM


No, thicker target = longer life, but it makes no difference to
deposition rate, current etc.
Chris


----- Original Message -----
} From: {"drose-at-wlgore.com"-at-sparc5.microscopy.com}
To: {microscopy-at-sparc5.microscopy.com}
Sent: Thursday, March 15, 2001 7:23 PM


G'day

I have an aging Jeol 840 and the monitor image is getting a bit dim
and noisy to the extent that I have to use large spot sizes that are
damaging some samples! Jeol tell me they cannot supply new
tubes. Does anyone know of compatible tubes that could be
utilised? Is there anything special about SEM monitor tubes?

Thanks
Dave





Dave Phelan
EM/X-Ray Unit
University of Newcastle
NSW 2308
AUSTRALIA
Ph 02 4921 5667
Fax 02 4921 7019
emudp-at-mail.newcastle.edu.au



From daemon Thu Mar 15 21:25:34 2001



From: Long Miao :      lmiao-at-bio.fsu.edu
Date: Thu, 15 Mar 2001 22:19:51 -0800
Subject: How to stick protein to the microscope slide

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Dear listers,

I have some difficulties to stick my protein (Mojor Sperm Protein, a basic
protein from Nematode Sperm ) to the microscope slide, therefore, it is
hard
to perform further perfusion experiment. When I try to do so, I lose
everything. Does anyone have experience in such a manipulation? Any
suggestion is highly appreciated.
Long



----------------------------------------------------------------------

Long Miao Postdoctoral Associate
e-mail: lmiao-at-bio.fsu.edu Dept of Biological Science
Voice: (850)644-9817(W) 334 Bio. Unit1,4370
(850)222-3280(H) Florida State University
FAX : (850)644-0481 Tallahassee, FL32306

----------------------------------------------------------------------




From daemon Thu Mar 15 22:26:42 2001



From: Vitaly Feingold :      vitalylazar-at-worldnet.att.net
Date: Thursday, March 15, 2001 10:28 PM
Subject: Jeol 840 viewing screen replacement

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


The CRTs can be rebuilt for about $600.00 to $800.00 USD by Richardson
Electronics in Georgia.

I have their number & can give it to you offline.

Earl weltmer

----- Original Message -----
} From: "Dave Phelan" {emudp-at-mail.newcastle.edu.au}
To: {Microscopy-at-sparc5.microscopy.com}
Sent: Thursday, March 15, 2001 4:35 PM


Try Richardson Electronics http://www.rell.com/ . Have CRT information handy
(labels on the CRT) when calling Richardson Electronic. Good luck.

Vitaly Feingold
Scientific Instruments and Applications
2773 Heath Lane, Duluth GA 30096
(770)232-7785 ph.
(770)232-1791 fax

This message is made of 100% recycled electrons.
-----Original Message-----
} From: Dave Phelan {emudp-at-mail.newcastle.edu.au}
To: Microscopy-at-sparc5.microscopy.com {Microscopy-at-sparc5.microscopy.com}


G'day

I have an aging Jeol 840 and the monitor image is getting a bit dim
and noisy to the extent that I have to use large spot sizes that are
damaging some samples! Jeol tell me they cannot supply new
tubes. Does anyone know of compatible tubes that could be
utilised? Is there anything special about SEM monitor tubes?

Thanks
Dave





Dave Phelan
EM/X-Ray Unit
University of Newcastle
NSW 2308
AUSTRALIA
Ph 02 4921 5667
Fax 02 4921 7019
emudp-at-mail.newcastle.edu.au






From daemon Thu Mar 15 22:54:16 2001



From: Peter Jordan :      emsi-at-pe.net
Date: Thu, 15 Mar 2001 21:23:37 -0800
Subject: Wanted: Zeiss 10C

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Hi:
We are lookng to purchase a Zeiss 10C TEM, preferable in working
condition but would consider one needing some work. Please contact us direct
via e-mail or call 909 301-9130 (Los Angeles area)
EMSI
Peter Jordan




From daemon Fri Mar 16 05:42:25 2001



From: drose-at-wlgore.com
Date: Fri, 16 Mar 2001 06:22:29 -0500
Subject: Re: Sputter coating: Target thickness

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html




Thank you all for your replies. There is certainly a great wealth of
information here.

In summary:

Target thickness does not have a adverse effect on deposition rate.
A thicker target is desirable from a cost to fabricate standpoint.

- david





From daemon Fri Mar 16 06:07:06 2001



From: Dr Malcolm Roberts :      m.roberts-at-ru.ac.za
Date: Fri, 16 Mar 2001 14:01:37 +0200
Subject: JEOL 733 - circuit diags XM-XCU

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Dear All,
I'm looking for circuit diags for J-TEC X-ray counting electronic
units XM-XCU. These were supplied with some JEOL 733 'probes although
most seem to have gone out with ORTEC. Can anyone help?
Thanks,
MAlc.

--
Dr MP Roberts Phone: [+27](0)46 603 8313
Dept of Geology Fax: [+27](0)46 622 9715
Rhodes University Cell: 083 4060 262 (usually off)
6140 Grahamstown e-mail: m.roberts-at-ru.ac.za
SOUTH AFRICA




From daemon Fri Mar 16 06:50:10 2001



From: Julian Smith III :      smithj-at-Winthrop.edu
Date: Fri, 16 Mar 2001 07:45:37 -0500
Subject: Re: Jeol 840 viewing screen replacement

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Both display and photo-monitor tubes can be recoated. We had our photo CRT
recoated by
Video display corp (Tucker, GA 800-241-5005) in 1993. I don't know if
they're still in business, but they did a good job.
JSIII

} Try Richardson Electronics http://www.rell.com/ . Have CRT information handy
} (labels on the CRT) when calling Richardson Electronic. Good luck.
}
} Vitaly Feingold
} Scientific Instruments and Applications
} 2773 Heath Lane, Duluth GA 30096
} (770)232-7785 ph.
} (770)232-1791 fax
}
} This message is made of 100% recycled electrons.
} -----Original Message-----
} } From: Dave Phelan {emudp-at-mail.newcastle.edu.au}
} To: Microscopy-at-sparc5.microscopy.com {Microscopy-at-sparc5.microscopy.com}
} Date: Thursday, March 15, 2001 10:28 PM
} Subject: Jeol 840 viewing screen replacement
}
}
} ------------------------------------------------------------------------
} The Microscopy ListServer -- Sponsor: The Microscopy Society of America


Julian P.S. Smith III
Dept. of Biology
Winthrop University
Rock Hill, SC 29733
803-323-2111 x6427 (vox)
803-323-3448 (fax)




From daemon Fri Mar 16 09:49:40 2001



From: Caroline Miller :      camiller-at-creighton.edu
Date: Tue, 16 Mar 1999 09:40:42 -0600
Subject: Durcupan ACM

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Does anyone use this resin and use it for antibody staining? We will be
using this resin for embedding. Also any suggestions on etching.
Thanks. Caroline Miller



From daemon Fri Mar 16 10:16:53 2001



From: Louis Kerr :      lkerr-at-mbl.edu
Date: Fri, 16 Mar 2001 11:14:00 -0500
Subject: EDS: TN-5400 monitor needed

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


I have a Tracor Northern TN-5402 EDS system mounted on a JEOL SEM. The
monitor just went up in smoke and I need to a) find a replacement or b)
try to replace the hardware. Since I don't have much money and we would
like to replace the whole system in a couple of years I can't spend much
to repair the monitor.

Does anyone have a monitor for sale/offer? Does anyone know of a
replacement monitor available on the market? A standard BNC type of
monitor does not work because of a proprietary modulation. Has anyone
successfully upgraded the hardware minus the detector?

Thanks,
Louie

--
Louie Kerr
Research and Education Support Coordinator
Marine Biological Laboratory
7 MBL Street
Woods Hole, MA 02543
508-289-7273
508-540-6902 (FAX)
508-292-0289 (Cell phone)

VISIT OUR WEB SITE:
http://www.mbl.edu/
http://www.courses.mbl.edu/


From daemon Fri Mar 16 11:08:02 2001



From: Craig Klotz :      cklotz-at-mcw.edu
Date: Fri, 16 Mar 2001 10:57:39 -0600
Subject: Service for MT2B

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html



Our Sorvall MT2B is having some problems, to say the least. I would very
much appreciate any info. concerning service of this machine. We are
located in Milwaukee, WI. I have contacted Boeckeler (new owners of RMC)
regarding service. They informed me they are no longer providing service
on these models. What other options do I have?

TIA
Craig M. Klotz, BS,CT(ASCP)
EM Tech II
Neuromuscular Lab
Medical College of Wisconsin
cklotz-at-mcw.edu


From daemon Fri Mar 16 16:54:00 2001



From: Jonathan Wilde :      jonathan-at-interactivedimension.com
Date: Fri, 16 Mar 2001 22:47:06 -0000
Subject: RE: Jeol 840 viewing screen replacement

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


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} -----Original Message-----
} From: Julian Smith III [mailto:smithj-at-Winthrop.edu]
} Sent: Friday, March 16, 2001 12:46 PM
} To: Microscopy-at-sparc5.microscopy.com
} Subject: Re: Jeol 840 viewing screen replacement
}
}
} --------------------------------------------------------------
} ----------
} The Microscopy ListServer -- Sponsor: The Microscopy Society
} of America
} To Subscribe/Unsubscribe -- Send Email to
} ListServer-at-MSA.Microscopy.Com
} On-Line Help
} http://www.msa.microscopy.com/MicroscopyListserver/FAQ.html
} --------------------------------------------------------------
} ---------.
}
}
} Both display and photo-monitor tubes can be recoated. We had
} our photo CRT
} recoated by
} Video display corp (Tucker, GA 800-241-5005) in 1993. I don't know if
} they're still in business, but they did a good job.
} JSIII
}
} } Try Richardson Electronics http://www.rell.com/ . Have CRT
} information handy
} } (labels on the CRT) when calling Richardson Electronic. Good luck.
} }
} } Vitaly Feingold
} } Scientific Instruments and Applications
} } 2773 Heath Lane, Duluth GA 30096
} } (770)232-7785 ph.
} } (770)232-1791 fax
} }
} } This message is made of 100% recycled electrons.
} } -----Original Message-----
} } } From: Dave Phelan {emudp-at-mail.newcastle.edu.au}
} } To: Microscopy-at-sparc5.microscopy.com
} {Microscopy-at-sparc5.microscopy.com}
} } Date: Thursday, March 15, 2001 10:28 PM
} } Subject: Jeol 840 viewing screen replacement
} }
} }
} } -------------------------------------------------------------
} -----------
} } The Microscopy ListServer -- Sponsor: The Microscopy Society
} of America
} } To Subscribe/Unsubscribe -- Send Email to
} ListServer-at-MSA.Microscopy.Com
} } On-Line Help
} http://www.msa.microscopy.com/MicroscopyListserver/FAQ.html
} } -------------------------------------------------------------
} ----------.
} }
} }
} } G'day
} }
} } I have an aging Jeol 840 and the monitor image is getting a bit dim
} } and noisy to the extent that I have to use large spot sizes that are
} } damaging some samples! Jeol tell me they cannot supply new
} } tubes. Does anyone know of compatible tubes that could be
} } utilised? Is there anything special about SEM monitor tubes?
} }
} } Thanks
} } Dave
} }
} }
} }
} }
} }
} } Dave Phelan
} } EM/X-Ray Unit
} } University of Newcastle
} } NSW 2308
} } AUSTRALIA
} } Ph 02 4921 5667
} } Fax 02 4921 7019
} } emudp-at-mail.newcastle.edu.au
}
}
} Julian P.S. Smith III
} Dept. of Biology
} Winthrop University
} Rock Hill, SC 29733
} 803-323-2111 x6427 (vox)
} 803-323-3448 (fax)
}
}
}


From daemon Fri Mar 16 16:54:00 2001



From: Jonathan Wilde :      jonathan-at-interactivedimension.com
Date: Fri, 16 Mar 2001 22:47:00 -0000
Subject: RE: Jeol 840 viewing screen replacement

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


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} -----Original Message-----
} From: Julian Smith III [mailto:smithj-at-Winthrop.edu]
} Sent: Friday, March 16, 2001 12:46 PM
} To: Microscopy-at-sparc5.microscopy.com
} Subject: Re: Jeol 840 viewing screen replacement
}
}
} --------------------------------------------------------------
} ----------
} The Microscopy ListServer -- Sponsor: The Microscopy Society
} of America
} To Subscribe/Unsubscribe -- Send Email to
} ListServer-at-MSA.Microscopy.Com
} On-Line Help
} http://www.msa.microscopy.com/MicroscopyListserver/FAQ.html
} --------------------------------------------------------------
} ---------.
}
}
} Both display and photo-monitor tubes can be recoated. We had
} our photo CRT
} recoated by
} Video display corp (Tucker, GA 800-241-5005) in 1993. I don't know if
} they're still in business, but they did a good job.
} JSIII
}
} } Try Richardson Electronics http://www.rell.com/ . Have CRT
} information handy
} } (labels on the CRT) when calling Richardson Electronic. Good luck.
} }
} } Vitaly Feingold
} } Scientific Instruments and Applications
} } 2773 Heath Lane, Duluth GA 30096
} } (770)232-7785 ph.
} } (770)232-1791 fax
} }
} } This message is made of 100% recycled electrons.
} } -----Original Message-----
} } } From: Dave Phelan {emudp-at-mail.newcastle.edu.au}
} } To: Microscopy-at-sparc5.microscopy.com
} {Microscopy-at-sparc5.microscopy.com}
} } Date: Thursday, March 15, 2001 10:28 PM
} } Subject: Jeol 840 viewing screen replacement
} }
} }
} } -------------------------------------------------------------
} -----------
} } The Microscopy ListServer -- Sponsor: The Microscopy Society
} of America
} } To Subscribe/Unsubscribe -- Send Email to
} ListServer-at-MSA.Microscopy.Com
} } On-Line Help
} http://www.msa.microscopy.com/MicroscopyListserver/FAQ.html
} } -------------------------------------------------------------
} ----------.
} }
} }
} } G'day
} }
} } I have an aging Jeol 840 and the monitor image is getting a bit dim
} } and noisy to the extent that I have to use large spot sizes that are
} } damaging some samples! Jeol tell me they cannot supply new
} } tubes. Does anyone know of compatible tubes that could be
} } utilised? Is there anything special about SEM monitor tubes?
} }
} } Thanks
} } Dave
} }
} }
} }
} }
} }
} } Dave Phelan
} } EM/X-Ray Unit
} } University of Newcastle
} } NSW 2308
} } AUSTRALIA
} } Ph 02 4921 5667
} } Fax 02 4921 7019
} } emudp-at-mail.newcastle.edu.au
}
}
} Julian P.S. Smith III
} Dept. of Biology
} Winthrop University
} Rock Hill, SC 29733
} 803-323-2111 x6427 (vox)
} 803-323-3448 (fax)
}
}
}


From daemon Fri Mar 16 16:54:01 2001



From: Springett, Margaret J. :      hukee.margaret-at-mayo.edu
Date: Fri, 16 Mar 2001 16:48:58 -0600
Subject: RE: Double labelling of cells

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Claudia, I would direct you to the March issue of journal of histochemistry
and cytochemistry, they have published a procedure to double-label with gold
at the pre-embedding stages, good luck
Marge

Margaret Springett
IEM Specialist
Electron Microscopy Core Facility
Mayo Foundation
email: springett.margaret-at-mayo.edu


} ----------
} From: Claudia Hayward-Costa
} Sent: Thursday, March 15, 2001 2:49 AM
} To: Microscopy-at-sparc5.microscopy.com
} Subject: IEM: Double labelling of cells
}
} ------------------------------------------------------------------------
} The Microscopy ListServer -- Sponsor: The Microscopy Society of America
} To Subscribe/Unsubscribe -- Send Email to ListServer-at-MSA.Microscopy.Com
} On-Line Help http://www.msa.microscopy.com/MicroscopyListserver/FAQ.html
} -----------------------------------------------------------------------.
}
}
}
} Dear Microscopists,
}
} I was asked to perform double labelling of surface antigens on
} leukaemia cell cultures and cord blood progenitors.
}
} In the past I used a pre-embedding protocol for single labelling
} which worked quite well.
}
} I would like to continue with a pre-embedded protocol, but both
} primary antibodies are raised in the same animal and I wonder how
} I can block unspecific labelling in that case.
}
} (I have a protocol for post-embedded double staining with primary
} AB raised in the same animal, but would prefer to use that as a
} last resort)
}
} So far I used a 10 nm gold F(ab)2- AB - if I use a 5nm gold F(ab)2
} AB will I be able to distinguish them in the TEM?
}
} I would appreciate your input very much.
}
} Many thanks
}
} Claudia
}
}
} Dr. C. Hayward-Costa
} School of Life Sciences
} Kingston University
} Penrhyn Road, Kingston upon Thames
} Surrey KT1 2EE, UK
} 44(0)208 547 2000 x 2240
} Email: c.hayward-at-kingston.ac.uk
}
}


From daemon Fri Mar 16 16:54:02 2001



From: Jonathan Wilde :      jonathan-at-interactivedimension.com
Date: Fri, 16 Mar 2001 22:47:12 -0000
Subject: RE: Jeol 840 viewing screen replacement

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Take me off the list...Take me off the list...Take me off the list...Take me
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} -----Original Message-----
} From: Julian Smith III [mailto:smithj-at-Winthrop.edu]
} Sent: Friday, March 16, 2001 12:46 PM
} To: Microscopy-at-sparc5.microscopy.com
} Subject: Re: Jeol 840 viewing screen replacement
}
}
} --------------------------------------------------------------
} ----------
} The Microscopy ListServer -- Sponsor: The Microscopy Society
} of America
} To Subscribe/Unsubscribe -- Send Email to
} ListServer-at-MSA.Microscopy.Com
} On-Line Help
} http://www.msa.microscopy.com/MicroscopyListserver/FAQ.html
} --------------------------------------------------------------
} ---------.
}
}
} Both display and photo-monitor tubes can be recoated. We had
} our photo CRT
} recoated by
} Video display corp (Tucker, GA 800-241-5005) in 1993. I don't know if
} they're still in business, but they did a good job.
} JSIII
}
} } Try Richardson Electronics http://www.rell.com/ . Have CRT
} information handy
} } (labels on the CRT) when calling Richardson Electronic. Good luck.
} }
} } Vitaly Feingold
} } Scientific Instruments and Applications
} } 2773 Heath Lane, Duluth GA 30096
} } (770)232-7785 ph.
} } (770)232-1791 fax
} }
} } This message is made of 100% recycled electrons.
} } -----Original Message-----
} } } From: Dave Phelan {emudp-at-mail.newcastle.edu.au}
} } To: Microscopy-at-sparc5.microscopy.com
} {Microscopy-at-sparc5.microscopy.com}
} } Date: Thursday, March 15, 2001 10:28 PM
} } Subject: Jeol 840 viewing screen replacement
} }
} }
} } -------------------------------------------------------------
} -----------
} } The Microscopy ListServer -- Sponsor: The Microscopy Society
} of America
} } To Subscribe/Unsubscribe -- Send Email to
} ListServer-at-MSA.Microscopy.Com
} } On-Line Help
} http://www.msa.microscopy.com/MicroscopyListserver/FAQ.html
} } -------------------------------------------------------------
} ----------.
} }
} }
} } G'day
} }
} } I have an aging Jeol 840 and the monitor image is getting a bit dim
} } and noisy to the extent that I have to use large spot sizes that are
} } damaging some samples! Jeol tell me they cannot supply new
} } tubes. Does anyone know of compatible tubes that could be
} } utilised? Is there anything special about SEM monitor tubes?
} }
} } Thanks
} } Dave
} }
} }
} }
} }
} }
} } Dave Phelan
} } EM/X-Ray Unit
} } University of Newcastle
} } NSW 2308
} } AUSTRALIA
} } Ph 02 4921 5667
} } Fax 02 4921 7019
} } emudp-at-mail.newcastle.edu.au
}
}
} Julian P.S. Smith III
} Dept. of Biology
} Winthrop University
} Rock Hill, SC 29733
} 803-323-2111 x6427 (vox)
} 803-323-3448 (fax)
}
}
}


From daemon Fri Mar 16 16:54:07 2001



From: Jonathan Wilde :      jonathan-at-interactivedimension.com
Date: Fri, 16 Mar 2001 22:46:49 -0000
Subject: RE: Jeol 840 viewing screen replacement

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


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} -----Original Message-----
} From: Julian Smith III [mailto:smithj-at-Winthrop.edu]
} Sent: Friday, March 16, 2001 12:46 PM
} To: Microscopy-at-sparc5.microscopy.com
} Subject: Re: Jeol 840 viewing screen replacement
}
}
} --------------------------------------------------------------
} ----------
} The Microscopy ListServer -- Sponsor: The Microscopy Society
} of America
} To Subscribe/Unsubscribe -- Send Email to
} ListServer-at-MSA.Microscopy.Com
} On-Line Help
} http://www.msa.microscopy.com/MicroscopyListserver/FAQ.html
} --------------------------------------------------------------
} ---------.
}
}
} Both display and photo-monitor tubes can be recoated. We had
} our photo CRT
} recoated by
} Video display corp (Tucker, GA 800-241-5005) in 1993. I don't know if
} they're still in business, but they did a good job.
} JSIII
}
} } Try Richardson Electronics http://www.rell.com/ . Have CRT
} information handy
} } (labels on the CRT) when calling Richardson Electronic. Good luck.
} }
} } Vitaly Feingold
} } Scientific Instruments and Applications
} } 2773 Heath Lane, Duluth GA 30096
} } (770)232-7785 ph.
} } (770)232-1791 fax
} }
} } This message is made of 100% recycled electrons.
} } -----Original Message-----
} } } From: Dave Phelan {emudp-at-mail.newcastle.edu.au}
} } To: Microscopy-at-sparc5.microscopy.com
} {Microscopy-at-sparc5.microscopy.com}
} } Date: Thursday, March 15, 2001 10:28 PM
} } Subject: Jeol 840 viewing screen replacement
} }
} }
} } -------------------------------------------------------------
} -----------
} } The Microscopy ListServer -- Sponsor: The Microscopy Society
} of America
} } To Subscribe/Unsubscribe -- Send Email to
} ListServer-at-MSA.Microscopy.Com
} } On-Line Help
} http://www.msa.microscopy.com/MicroscopyListserver/FAQ.html
} } -------------------------------------------------------------
} ----------.
} }
} }
} } G'day
} }
} } I have an aging Jeol 840 and the monitor image is getting a bit dim
} } and noisy to the extent that I have to use large spot sizes that are
} } damaging some samples! Jeol tell me they cannot supply new
} } tubes. Does anyone know of compatible tubes that could be
} } utilised? Is there anything special about SEM monitor tubes?
} }
} } Thanks
} } Dave
} }
} }
} }
} }
} }
} } Dave Phelan
} } EM/X-Ray Unit
} } University of Newcastle
} } NSW 2308
} } AUSTRALIA
} } Ph 02 4921 5667
} } Fax 02 4921 7019
} } emudp-at-mail.newcastle.edu.au
}
}
} Julian P.S. Smith III
} Dept. of Biology
} Winthrop University
} Rock Hill, SC 29733
} 803-323-2111 x6427 (vox)
} 803-323-3448 (fax)
}
}
}


From daemon Fri Mar 16 22:02:28 2001



From: Wentao Qin :      wentao-at-newton.umsl.edu
Date: Fri, 16 Mar 2001 21:44:38 -0600 (CST)
Subject: Unsubscribe

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html





From daemon Sat Mar 17 12:10:58 2001



From: Nestor J. Zaluzec :      zaluzec-at-microscopy.com
Date: Sat, 17 Mar 2001 12:02:46 -0600
Subject: Educational Outreach: Sands from around the World

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Colleagues...

As many of you know, I maintain the WWW pages for
Project Micro which is dedicated to Educational Outreach to pre-college
students. One of their projects is sand from around the world which
is used in the classroom activities section.

Today I uploaded their latest web page documenting their sand collection
administered by Joe Neilly of Abbott Labs . You can see this page at

http://microscopy.com/ProjectMicro/SandCollection.html

I could not help to notice that their supply of sands from outside the
USA has become sorely lacking. In particuliar

Europe, Africa and South America

are now all completely depleted. And

Australia and Asia

only have supplies from only one location left.

Can I suggest to members of this list particularly if you are
not from the USA, that if you have the opportunity this would
be an excellent and simple way that you can contribute to the
education of our next generation of microscopist's. The sand
is available to any educator, regardles of their affiliation and
location.

All the information you need to contribute "sand" from your local
beach is listed on that WWW page as well as the end of this message.

It will cost you a few $$ out of your pocket to send the sand ,
but remember, it is for a good cause. So spend a few minutes next time
you drive past a beach and fill up a small plastic bag, and send it to Joe.


Cheers....
Nestor
Your Friendly Neighborhood SysOp.


---------------------------
Here is an exerpt from the Sands WWW page

To Request Sand

Select the sands you would like from the list below and e-mail your request to
joe.neilly-at-abbott.com. Include your selection (limit 6 per request), where
the sands should be
sent, and how you plan to use them. This collection was created for
Microscopic Explorations but
how you ultimately use them is up to you. Great stories and photos about
how you used the
sands are always welcome!

To Donate Sand

Sand donations are what keeps this collection going. All donations are
appreciated and will be
shared with many educators. To send your sand, fill a Ziplock sandwich bag
half full and place it
in another Ziplock bag. Mail your donation to:

Joe Neilly
Abbott Laboratories
D-45M, AP31
200 Abbott Park Rd.
Abbott Park, IL 60064-6202




From daemon Sat Mar 17 14:04:28 2001



From: Michael Reiner :      Elektronenmikroskopie-at-web.de
Date: Sat, 17 Mar 2001 21:00:09 +0100
Subject: Microwave polymerisation of LR-White

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Dear Listservers,
recently there was a discussion about the stability of LR-White in the EM-beam. One distribtion mentioned a polymerization of LR-White by microwave treatment. I don´t remember who sent this mail.
I would be interested to test this procedure.
Who knows how to do this kind of LRW polymerization? What is the set-up?
How long does it take, how much Energy (Watt) is needed?
Maybe the colleague who posted this mail remembers the discussion and is able to give some information.

Thanks in advance,
with best regards,
Michael


Michael Reiner
University of Cologne, Germany
Dept. of Anatomy I
_______________________________________________________________________________
Alles unter einem Dach: Informationen, Fun, E-Mails. Bei WEB.DE: http://web.de
Die große Welt der Kommunikation: E-Mail, Fax, SMS, WAP: http://freemail.web.de



From daemon Sat Mar 17 18:52:51 2001



From: Ronald Austin :      rla-at-mindspring.com
Date: Sat, 17 Mar 2001 18:47:24 -0600
Subject: Microwave polymerization of LRW

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Dear Michael:
The following procedure for polymerization of LR-White has worked of me in
my microwave oven: I will start with the infiltration phase: The wattage
setting I used was about 700-750 watts.

1:1 95% ETOH / LR-White 50'C temperature restriction setting (trs) x2 for
10 minutes each.

100% LR-White 50'C (trs) x3 for 10 minutes each.

Polymerization in the oven: In this phase be sure to fill the beem capsule
to the very top and cap off with parafilm to make a tight seal to prevent
water from getting into the resin. Submerge the capsules in a water bath and
place the temperature probe in the bath to monitor the temp.

100% resin, 60'C (trs) x1 for 10 minutes.
" " 70'C (trs) x1 " " "
" " 80'C (trs) x1 " 20 minutes

The blocks will be firm and will cut very well.
For more information on this technique you can contact Rick Giberson at TED
PELLA CORP. USA using their toll free number, I don't know what that is in
Germany! He can give you many more details about LR-White and the microwave
oven. I understand that lesser wattage setting can be used to infiltrate and
polymerize LR-White but I have not experimented with them as yet!

Good Luck

Ron Austin (Research Associate)
Dept. of Pathology
L.S.U. Medical Ct.
Shreveport, LA
318-675-4775
rla-at-mindspring.com



From daemon Sun Mar 18 01:50:27 2001



From: toner2-at-atozasia.com
Date: Sat, 17 Mar 01 05:38:16 EST
Subject: toner supplies

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From daemon Sun Mar 18 12:04:17 2001



From: Nestor J. Zaluzec :      zaluzec-at-microscopy.com
Date: Sun, 18 Mar 2001 11:59:57 -0600
Subject: Sand Contributions: Nestor Errors...!!!

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Colleagues

A number of people have reminded me about the growing
problems with hoof and mouth disease around the world
and that sending possible organic material from country
to country should not be considered at this time.

I humbly acknowledge that you are all absolutely correct!

It simply did not occur to me to connect sand with this problem.
I guess my physics background is just showing it's
tunnel vision, since I think of sand as inorganic compounds
and neglect to think of organic "contaminants" which might be
included.

For the moment it would therfore certainly be prudent to hold off collecting
and/or send and sand samples for the Micro Project, even if it can
be documented that the samples have been properly sterilized.
Let's wait until this potential problem is controlled. It is better
to error on the safe side.

Thanks again, to everyone that pointed out my error.

Nestor
Your Friendly Neighborhood SysOp.







From daemon Mon Mar 19 06:44:10 2001



From: Veys Pascal :      Veys-at-bota.ucl.ac.be
Date: Mon, 19 Mar 2001 13:37:23 +0100
Subject: Unsubscribe

Contents Retrieved from Microscopy Listserver Archives
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==============================
Dr Pascal VEYS
Laboratory of Plant Biology
Faculty of Sciences
Catholic University of Louvain

Place Croix du Sud 5 bte 14
B-1348 Louvain-la-Neuve
Belgium
Phone: +32/10/473004
Fax: +32/10/473471
E-mail: Veys-at-bota.ucl.ac.be
==============================



From daemon Mon Mar 19 06:53:41 2001



From: Rinaldo Pires dos Santos :      rinaldop-at-uol.com.br
Date: Mon, 19 Mar 2001 09:49:24 -0300
Subject: LM: lignin extraction in seeds

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Dear Microscopists,
I am working with Ilex paraguariensis seeds. After dissection, with
mechanical extraction of the endocarp, the micropylar endosperm is enveloped
by a lignified cap. This one do not allow the cellular visualization, in
clarified material (Herr´s method), of the endosperm because the yellow
color of the lignin. Is there a non aggressive protocol for lignin
extraction?
Thank´s.

Rinaldo Pires dos Santos

Dr. Rinaldo Pires dos Santos - e-mail: rinaldop-at-uol.com.br
Lab. of Plant Anatomy - Dept. of Botany - UFRGS
Porto Alegre - RS - Brazil




From daemon Mon Mar 19 07:45:25 2001



From: James M. Ehrman :      jehrman-at-mta.ca
Date: Mon, 19 Mar 2001 09:44:43 -0400
Subject: dental amalgam in SEM?

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Hi listers,

Well, I stepped in it this time. I agreed to do some "gee-whiz" shots
for my dentist of a tooth with a rather large amalgam filling. Only
later
did it sink in that the mercury might be a problem under vacuum and the
beam. Has anybody out there done this? I'd be looking at the thing with
gold coating an a fairly light beam (say 10 kV), but unfortunately, not
with
a cold stage. I've checked the archives and found one brave soul who
said
that he's done this on old amalgams. I can't really say how old this one
is, but
I'm pretty sure it wasn't made yesterday. Call me paranoid, but I'd like
some
more opinions before I do something really stupid!

Cheers,

Jim

--

James M. Ehrman
Digital Microscopy Facility
Mount Allison University
Sackville, NB E4L 1G7
CANADA

phone: 506-364-2519
fax: 506-364-2505
email: jehrman-at-mta.ca
www: http://www.mta.ca/~jehrman




From daemon Mon Mar 19 09:06:50 2001



From: Brian J Laughlin :      brjlau18-at-US.ibm.com
Date: Mon, 19 Mar 2001 10:01:31 -0500
Subject: TEM: Automated Prep Tools

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I am trying to evaluate some tools that perform automated TEM sample prep
prior to FIB thinning. I am looking for some one that has experience using
Sela microcleaving tools in conjuction with the TEMstation. I work with
failure and material analysis in the IC industry so submicron accuracy and
relaibility are important concerns of mine. Also, we will soon be facing
chips with low K dielectrics which from what I have heard are extreme soft
and hard to polish. I am not sure if the sawing technique they employ will
be able to section this type of material.

If anyone on this list has any experience with these tools and can give me
insight into their worth as a prep technique please get in touch with me.

Sincerely,

Brian Laughlin

FIB/TEM Engineer
IBM, Burlington, VT
Microelectronics Division
Surface and Materials Science Laboratory (Dept. GP8)
bjlau18-at-us.ibm.com

Lab: Bldg. 967-1 N18, (802) 769-2865
Office: (802) 769-5224
Fax: (802) 769-1220
Mail: IBM Burlington, 1000 River St., Essex Junction, VT 05452 Mailstop
967L




From daemon Mon Mar 19 10:39:58 2001



From: Yan Xin :      xin-at-magnet.fsu.edu
Date: Mon, 19 Mar 2001 11:40:07 -0500
Subject: Liquid helium TEM cold stage

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Hi,

We are interested in buying a liquid helium TEM cold stage. Has anyone had
experience with it and how was it? Is there any other companies selling
this apart from Gatan?

I would appreciate very much for any input on this.

Best regards
Yan Xin
=======================================
Yan Xin (Ph.D)
Magnet Science & Technology
National High Magnetic Field Laboratory
Florida State University
1800 E. Paul Dirac Drive
Tallahassee, FL 32310
Tel: (850) 644 1529
Fax: (850) 644 0867
========================================





From daemon Mon Mar 19 13:01:51 2001



From: semcore-at-audumla.mdacc.tmc.edu
Date: Mon, 19 Mar 2001 12:57:04 -0600
Subject: Decalcifivation of bone for TEM

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Does anyone have a step by step protocol for decalcifying bone for
transmission electron microscopy using EDTA?

Thanks,

Kenn






Dr. Corazon D. Bucana, Ph.D.
Mr. Kenneth Dunner, Jr.
Department of Cancer Biology
U.T. M.D. Anderson Cancer Center
High Resolution Electron Microscopy Facility
7777 Knight Road, Box 173
Room SRB 1.660
Houston, Texas 77054
PH: 713-792-8106
FAX:713-792-8747


From daemon Mon Mar 19 13:58:17 2001



From: Edsworth-at-aol.com
Date: Mon, 19 Mar 2001 14:54:15 EST
Subject: JEOL 733

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I am in need of a gas flow proportional counter (GFPC) for a JEOL 733
microprobe. Alternately, I may also need some W wire of the appropriate size
to restring an existing unit. Thanks for any help/advice.

Ed Holdsworth
General Mgr.
SEMTEC Laboratories, Inc.


From daemon Mon Mar 19 14:56:24 2001



From: Dorothy Roak Sorenson :      dsoren-at-umich.edu
Date: Mon, 19 Mar 2001 15:51:49 -0500 (EST)
Subject: Re: Decalcifivation of bone for TEM

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Kenn,

I have had good luck decalcifying bone for TEM using this EDTA protocol:

Fix 1-2 mm sized bone pieces for two days in 2.5 percent glutaraldehyde in
0.1 M Sorensen's buffer.

Decalcify on a shaker for 3-7 days in 7.5 % disodium EDTA, 2.5 % glut. in
0.1 M Sorensen's buffer. (pH the decal solution to physiological pH with
NaOH.)

Change to fresh decal solution every couple of days.

Check for complete decalcification by taking before and after X-rays of
the tissue.

Rinse twice in buffer

Post fix in 1 % osmium in buffer.

Rinse once with buffer, then once with ddH2O

en bloc stain for 1 hour with aqueous 3% uranyl acetate.

Dehydrate in a graded series of EtOH, infiltrate, and embed in epon.


Good luck, and I hope this helps.

Dotty

Dotty Sorenson
Microscopy and Image Analysis Laboratory
Department of Cell and Developmental Biology
University of Michigan Medical School
Ann Arbor, Michigan
(734)763-1170
FAX (734)763-1166
dsoren-at-umich.edu

On Mon, 19 Mar 2001 semcore-at-audumla.mdacc.tmc.edu-at-sparc5.microscopy.com wrote:

} ------------------------------------------------------------------------
} The Microscopy ListServer -- Sponsor: The Microscopy Society of America
} To Subscribe/Unsubscribe -- Send Email to ListServer-at-MSA.Microscopy.Com
} On-Line Help http://www.msa.microscopy.com/MicroscopyListserver/FAQ.html
} -----------------------------------------------------------------------.
}
}
} Does anyone have a step by step protocol for decalcifying bone for
} transmission electron microscopy using EDTA?
}
} Thanks,
}
} Kenn
}
}
}
}
}
}
} Dr. Corazon D. Bucana, Ph.D.
} Mr. Kenneth Dunner, Jr.
} Department of Cancer Biology
} U.T. M.D. Anderson Cancer Center
} High Resolution Electron Microscopy Facility
} 7777 Knight Road, Box 173
} Room SRB 1.660
} Houston, Texas 77054
} PH: 713-792-8106
} FAX:713-792-8747
}



From daemon Mon Mar 19 15:34:18 2001



From: Philip Oshel :      peoshel-at-facstaff.wisc.edu
Date: Mon, 19 Mar 2001 15:32:57 -0600
Subject: Micro-g air table part

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Hello,

I'm looking for a part no longer available from the manufacturer. We
have a TMC Micro-g air table, and one of the black plastic parts that
holds together the leveling valve (at the ends of the table) has
broken.

I can't get one of these from TMC anymore -- the whole valve kit has
to be bought for $120, and the bloody things were special-made for
TMC.

Does anyone perchance have any of these things that they no longer need?

Thanks to all.

Phil
--
}}}}}}}}}}}}}}}}}{{{{{{{{{{{{{{{{{
Philip Oshel
Supervisor, AMFSC and BBPIC microscopy facilities
Department of Animal Sciences
University of Wisconsin
1675 Observatory Drive
Madison, WI 53706 - 1284
voice: (608) 263-4162
fax: (608) 262-5157 (dept. fax)


From daemon Mon Mar 19 15:48:32 2001



From: beth-at-dogwood.botany.uga.edu (Beth Richardson)
Date: Mon, 19 Mar 2001 16:53:14 -0500
Subject: TEM screens recoated - Grant Scientific?

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Hi all,
I need to have TEM screens recoated and heard that Grant Scientific is the
place to contact. I called 803-799-6716 (a # I found in my address
archives) and got the lovely fax machine scream sound.
any help?
thanks,
Beth

**************************************
Beth Richardson
EM Lab Coordinator
Botany Department
University of Georgia
Athens, GA 30602

Phone - (706) 542-1790
FAX - (706) 542-1805
Email - beth-at-dogwood.botany.uga.edu

"Between the two evils,
I always pick the one I never tried before". Mae West (1893-1980)
**************************************




From daemon Mon Mar 19 16:13:11 2001



From: SMancuso-at-specialmetals.com
Date: Mon, 19 Mar 2001 17:06:22 -0500
Subject: Re: dental amalgam in SEM?

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I have examined amalgams in the SEM in the past. There is little problem
with the mercury as it is amalgamated with silver.
I have even used pure mercury in the SEM as a standard for WDS with no
problem. I believe mercury is used in high vacuum
diffusion pumps.

Good luck!

Sam O. Mancuso
Group Leader, Physical Metallurgy
Special Metals Corporat