My comment to add to the discussion having examined both LV and ESEM microscopes prior to purchasing an ESEM.
The strength of the LV SEM's is their ability to view SEM specimens without the need for coating. This they do very well and it is an enormously useful feature. Their ability to view wet specimens is limited by the fact that you cannot hold a particular RH (relative humidity) state for any length of time - as you can in the ESEM. In the LVSEM the water from a wet specimen would tend to leave the specimen rapidly. That said, we often use our ESEM in the 2 torr range for the examination of damp and/or greasy uncoated specimens where the maintanance of exact, or higher, water saturation levels is not critical.
Tony Bruton University of Natal South Africa
} } } "Richard Edelmann" {edelmare-at-muohio.edu} 02/28/02 07:02PM } } } ------------------------------------------------------------------------ The Microscopy ListServer -- Sponsor: The Microscopy Society of America
This is a beautiful low (lousy) vacuum SEM. Its sounds like the "restricted to study uncoated dry samples, preferably mineral" was put on the microscope by someone at the SEM Lab who didn't want any other samples/users using the scope.
I've often seen where the "Materials People" and the Geology people fobid messy unstable biological samples in their EM's in order to keep the scopes clean (particularly when dealing with analytical systems). (Now, where do the clays and rubber people fit in??)
Now, before you get someone upset you might find out the history of the "restricted to study uncoated dry samples, preferably mineral" and who paid for the scope (got the grant). But an EM is a terrible thing to waste.
On 28 Feb 2002, at 9:02, Legendre Olivier wrote:
} Hi all, } } I have been in charge recently of our SEM lab, in which there is a rather } idle JEOL5400LV (with a Kevex EDS) microscope. According to the person who } is in charge of running this machine, the capabilities of this SEM are } restricted to study uncoated dry samples, preferably mineral. } Does anybody have further experience on this machine (or an upgraded one?) } like imaging wet samples, etc.? } } Thank you for helping } } Olivier Legendre } BRGM } 3, avenue C. Guillemin } 45060 ORLEANS CEDEX 2 FRANCE } Tel: (33) 0 238 64 38 03 } Fax: (33) 0 238 64 37 11 } e-mail: o.legendre-at-brgm.fr } } } } } }
Richard E. Edelmann, Ph.D. Electron Microscopy Facility Supervisor 352 Pearson Hall Miami University, Oxford, OH 45056 Ph: 513.529.5712 Fax: 513.529.4243 E-mail: edelmare-at-muohio.edu http://www.emf.muohio.edu
Hello, We met also the problem with the continuous one direction de-focusing with a heavy 16-slides Maerzhaeuser stage. We solved it in the software. Simply the drift was time calibrated. The time lapse experiment is running while the stage Z-drive compensates the drift according to the calibration. We are able to adapt this procedure almost to any motorised microscope.
-----Original Message----- } From: Andrew Ochalski [mailto:AOCHALSK-at-science.uottawa.ca] Sent: Thursday, February 28, 2002 5:24 PM To: Microscopy-at-sparc5.microscopy.com
Tony, I can't answer why it would be used, except that Cu-Be is much harder than Cu. The main danger from Cu-Be is if you grind it or burn it, but the grids are so small that grinding is fairly unlikely. As used in non-magnetic tools, etc., you're right. It's very safe.
Ken Converse owner Quality Images third party SEM service Delta, PA
Tony Garratt-Reed wrote:
} ------------------------------------------------------------------------ } The Microscopy ListServer -- Sponsor: The Microscopy Society of America } To Subscribe/Unsubscribe -- Send Email to ListServer-at-MSA.Microscopy.Com } On-Line Help http://www.msa.microscopy.com/MicroscopyListserver/FAQ.html } -----------------------------------------------------------------------. } } } This is not a "reply" to the post, but perhaps an extension of the } question. } } Why would Cu-Be grids be used? Cu-Be is an interesting and quite } widely-used class of alloys (see http://microstructure.copper.org), } but I don't see why it would be used for EM grids - unless, that is, } the grids we loosely call "copper" are in fact all made of Cu-Be? } } On the subject of the posting, I can't imagine that Cu-Be would be as } widely used as it is if it were as toxic as Be-metal. I'm sure the } alloying must drastically reduce the hazard, but this is not my area } of expertise. } } Tony } } } At 10:31 AM 2/28/2002 -0600, you wrote: } } } ------------------------------------------------------------------------ } } The Microscopy ListServer -- Sponsor: The Microscopy Society of America } } To Subscribe/Unsubscribe -- Send Email to ListServer-at-MSA.Microscopy.Com } } On-Line Help http://www.msa.microscopy.com/MicroscopyListserver/FAQ.html } } -----------------------------------------------------------------------. } } } } } } An individual new to EM wanted to learn from me how to formvar-carbon } } coat } } slotted grids. The person bought grids made of a Berylium-Copper } } alloy. I } } called the vendor and was warned about the danger of Berylium and it's } } vapor. I told the invidual to get copper grids for our use. Now in } } all my } } years in EM I have not worked with Berylium. Would someone out there } } send } } me some information on the hazards of Berylium? Also what } } applications are } } Berylium-Copper or Berylium only grids used for? Any information is } } appreciated, thanks. } } } } Tom Bargar } } EM Lab, UNMC } } tbargar-at-unmc.edu } } 402-559-7347 } } } } * * * * * * * * * * * * * * * * * * * * * * * * * * } * Anthony J. Garratt-Reed M.A., D.Phil. } * MIT, Room 13-1027 } * 77 Massachusetts Avenue } * Cambridge, MA 02139-4307 } * USA } * Phone: (617) 253-4622 } * Fax: (617) 258-6478 } * } } } }
You are correct in your 'secret cult' image, Gary. SIMS is largely a well-kept secret of both the geoscience and semiconductor communities, with the vast majority of materials scientists being unaware of its capabilities in trace element detection (including even hydrogen), sputter depth profiling, elemental imaging, isotope ratio age-dating and so forth. We here in Ottawa at a federal materials science-oriented lab have had a SIMS for nearly 15 years as a complement to our SEM, TEM and electron microprobe. Like our XPS and Auger, however, the SIMS is not used nearly as much as the EMs, but clients in the above two materials communities use it regularly. Let me note that the 'new kid on the block' in the SIMS community is something called a nanoSIMS, with a 50 nm beam (as opposed to the micron-ish beam of a regular SIMS) and simultaneous detection of up to 5 elements (much like a microprobe with WDX detectors). To date there are only two in North America, no surprise given the ~$2M+ US price tag.
However, I believe that Diane was referring to the differences between a SIMS and a focused ion beam (FIB) system, which is essentially a scanning ion microscope. In a FIB a much higher energy ion beam (30-50 keV as opposed to only several keV for a SIMS) is focused by electrostatic lens down to as little as 5 nm and scanned as in an SEM. The ion beam generates both secondary ions and secondary electrons, which can be captured to form the corresponding two types of images. Generally speaking, the resolution is intermediate between an LaB6 emitter SEM and a field emission (FE) SEM. The use of an electron flood gun permits good imaging of insulating materials. The most important difference between a SIMS and a FIB is that, while the former uses the scanned beam to sputter a crater for depth profiling, the latter uses its more energetic beam to accomplish in-situ 'micromachining'. Thus FIBs had their inception in the microelectronics community to conduct fine-scale repairs on devices. More recently, they have impacted seriously on general materials science via use of this micromachining capability to prepare parallel-sided thin sections for TEM in various ways. Finally, alas, FIBs have no analytical (EDXS) capability to date, save for a few models that combine both a ion beam column and an electron beam column (thus called dual beam FIBS), wherein an EDXS detector can be used in conjunction with the latter.
Attendees of M&M 2002 in Quebec City should check out the FIB session chaired by Lucille Gianuzzi and Mike Phaneuf. I guarantee you'll be impressed.
Tom
Tom Malis Group Leader - Characterization Materials Technology Laboratory Natural Resources Canada (Govt. of Canada) 568 Booth St., Ottawa, Canada
} ---------- } From: Gary Gaugler } Sent: Thursday, February 28, 2002 6:20 PM } To: Diane G. Miller } Cc: MSA listserver } Subject: Re: SIMS } } ------------------------------------------------------------------------ } The Microscopy ListServer -- Sponsor: The Microscopy Society of America } To Subscribe/Unsubscribe -- Send Email to ListServer-at-MSA.Microscopy.Com } On-Line Help http://www.msa.microscopy.com/MicroscopyListserver/FAQ.html } -----------------------------------------------------------------------. } } } Did not see any response yet so I'll give it a try. } } A good reference for SIMS is Wilson, R., Stevie, F. } and Magee, C. (1989). Secondary ion mass spectrometry. } New York: John wiley & Sons. ISBN 0-471-51945-6 } } Ion beam microscopy is a mode which is available in } some, if not all (not sure) SIMS units. The distinction } is made between depth profiles, side wall ion contributions } and other effects. Large area ratios are typically } required for probe mode to exclude secondary ions } from the sidewalls when the beam is in the center } of the crater. Alternatively, secondary ions are } rejected outside the center of the crater "with an } aperture for the ion microscope mode" (p. 1.5-1). } } I haven't seen much other SIMS reference material either. } Maybe it is a secret cult? } } gary g. } } } At 04:57 PM 2/27/2002, you wrote: } } } Hello All, } } } } I need some information. I hope I will get some responses from you. I } was } } wondering what the difference is between a SIMS Secondary Ion Mass } } Spectrometer and an Ion Beam Electron Microscope. Please excuse my } } ignorance, but I've tried looking on the web, and I haven't found the } } explanation that I need. } } } } Any help would be appreciated. } } } } Thank you in Advance. } } } } Diane } } } } {mailto:millerd-at-coho.net} millerd-at-coho.net } } } }
-----Original Message----- } From: Nestor J. Zaluzec [mailto:zaluzec-at-sparc5.microscopy.com] Sent: Thursday, February 28, 2002 9:41 AM To: NewSub-at-sparc5.microscopy.com
********************************************* This Email contains Important Information about the Microscopy Listserver. Please read it all then SAVE a copy for future reference. - Nestor **************************************** To: NewSub-at-MSA.Microscopy.Com } From: "Nestor J. Zaluzec" {zaluzec-at-microscopy.com}
As an occasional practitioner of the cult of SIMS, let me pass along an excellent web resource on the area.
http://www.simsworkshop.org
There is a good series of books on SIMS in the Springer Series in Chemical Physics, Secondary Ion Mass Spectrometry, ed. by Benninghoven, Colton, and Simons, but as these are conference proceedings more than strictly a reference book their value may initially not be as great as the one you suggested.
-----Original Message----- } From: Gary Gaugler [mailto:gary-at-gaugler.com] Sent: Thursday, February 28, 2002 6:21 PM To: Diane G. Miller Cc: MSA listserver
Did not see any response yet so I'll give it a try.
A good reference for SIMS is Wilson, R., Stevie, F. and Magee, C. (1989). Secondary ion mass spectrometry. New York: John wiley & Sons. ISBN 0-471-51945-6
Ion beam microscopy is a mode which is available in some, if not all (not sure) SIMS units. The distinction is made between depth profiles, side wall ion contributions and other effects. Large area ratios are typically required for probe mode to exclude secondary ions from the sidewalls when the beam is in the center of the crater. Alternatively, secondary ions are rejected outside the center of the crater "with an aperture for the ion microscope mode" (p. 1.5-1).
I haven't seen much other SIMS reference material either. Maybe it is a secret cult?
gary g.
At 04:57 PM 2/27/2002, you wrote:
} Hello All, } } I need some information. I hope I will get some responses from you. I was } wondering what the difference is between a SIMS Secondary Ion Mass } Spectrometer and an Ion Beam Electron Microscope. Please excuse my } ignorance, but I've tried looking on the web, and I haven't found the } explanation that I need. } } Any help would be appreciated. } } Thank you in Advance. } } Diane } } {mailto:millerd-at-coho.net} millerd-at-coho.net }
Morning Goren (sorry for the missing um- [I'm just a] -lout?),
Now, I'm going to take you at your word and venture into an area which is NOT really mine yet. Briefly, I would suggest that you consult with Oxford Instruments for information on on a product they call "INCA Crystal" (no stock, no family and other companies such as Thermo NORAN also have such systems in the $50-$100k price range). These systems can be linked to the ICDD database for mineral identification and permit collection of diffracted X-rays phases within the specimen to determine both phase identification and crystal orientation as well as elemental mapping from EDS. I hope a practitioner responds, but here is the email of a vendor rep: Glenn Kinnear (Oxford): kinnear-at-ma.oxinst.com.
Hope this helps,
Fred Monson
Frederick C. Monson, PhD Center for Advanced Scientific Imaging West Chester University West Chester, Pennsylvania, USA, 19383 610-738-0437 fmonson-at-wcupa.edu
} ---------- } From: Göran Axelsson } Sent: Thursday, February 28, 2002 6:08 PM } To: Microscopy-at-sparc5.microscopy.com } Subject: SEM books on mineral analysis } } ------------------------------------------------------------------------ } The Microscopy ListServer -- Sponsor: The Microscopy Society of America } To Subscribe/Unsubscribe -- Send Email to ListServer-at-MSA.Microscopy.Com } On-Line Help http://www.msa.microscopy.com/MicroscopyListserver/FAQ.html } -----------------------------------------------------------------------. } } } Hello! } } I'm looking for a book or some other resources on mineral analysis with } EDS. } } I have read a lot of information on the net about SEM / TEM and other } instruments so I have a good theoretical knowledge about the process } behind EDS but lacks the practical bit. } } My background is a MS in physics, some chemistry and some geology. } I have had some mineral samples analysed in a Russian lab and now I } want to learn more about the practical side. } How to interprete the results, how to prepare specimens, which problems } could occur.... } } Is there a book or some other information source that you could recommend } for me? } } I will try to visit a lab for some hands on experience during the spring, } but I } would like to be well prepared so I could get the most out of the visit. } } My final goal is to find a cheap used SEM with EDS to set up a small lab } for } mineral analyses. } } Regards, Göran Axelsson, Sweden } } } }
62 glorious pages that advertise the dangers of Be from the DOE, probably its largest user!
URL:http://tis-nt.eh.doe.gov/be/berule.pdf (WARNING! You should have the Adobe Acrobat Reader before trying this URL)
Hope this helps. You can also try the ToxNet on National Library of Medicine gateway to MEDLINE: http://gateway.nlm.nih.gov/gw/Cmd.
Fred Monson
Frederick C. Monson, PhD Center for Advanced Scientific Imaging West Chester University West Chester, Pennsylvania, USA, 19383 610-738-0437 fmonson-at-wcupa.edu
} ---------- } From: "tbargar-at-unmc.edu"-at-sparc5.microscopy.com } Sent: Thursday, February 28, 2002 11:31 AM } To: Microscopy-at-sparc5.microscopy.com } Subject: Need Info. about Berylium and Berylium-Copper slotted grids } } ------------------------------------------------------------------------ } The Microscopy ListServer -- Sponsor: The Microscopy Society of America } To Subscribe/Unsubscribe -- Send Email to ListServer-at-MSA.Microscopy.Com } On-Line Help http://www.msa.microscopy.com/MicroscopyListserver/FAQ.html } -----------------------------------------------------------------------. } } } An individual new to EM wanted to learn from me how to formvar-carbon coat } slotted grids. The person bought grids made of a Berylium-Copper alloy. } I } called the vendor and was warned about the danger of Berylium and it's } vapor. I told the invidual to get copper grids for our use. Now in all } my } years in EM I have not worked with Berylium. Would someone out there send } me some information on the hazards of Berylium? Also what applications } are } Berylium-Copper or Berylium only grids used for? Any information is } appreciated, thanks. } } Tom Bargar } EM Lab, UNMC } tbargar-at-unmc.edu } 402-559-7347 } } }
We have a JEOL JSM5400LV that, as far as I now, was one of the very first of this model. It is true that it is not a true environmental SEM, if you define that as a SEM in which you can study wet samples.
However, we have great use for the low vacuum mode of the instrument for looking at insulating samples without coating. The insulating samples are f.x. polymers, corrosion products and various dusts and contaminations.
The main limitation compared to an environmental SEM is that we are not able to use the secondaary electron detector in LV mode. Instead we use the backscatter detector that does quite a good job of "topographic" imaging as long as we do not need high magnification (~} 5000x).
Yours sincerely,
Henning Sund Sřrensen Materials- and Process Consultant
Danfoss A/S Central Service Technology Centre Nordborgvej 81, L7-S40 6430 Nordborg Denmark
-----Original Message----- } From: Legendre Olivier [mailto:Legendre-at-exchange.brgm.fr] Sent: 28. februar 2002 09:02 To: 'Microscopy-at-MSA.Microscopy.Com'
Hi all,
I have been in charge recently of our SEM lab, in which there is a rather idle JEOL5400LV (with a Kevex EDS) microscope. According to the person who is in charge of running this machine, the capabilities of this SEM are restricted to study uncoated dry samples, preferably mineral. Does anybody have further experience on this machine (or an upgraded one?) like imaging wet samples, etc.?
About 8-10 years ago we had upgraded our Kevex Sesame/Microspec system by replacing the Sesame system with a 386 PC and card/software we purchased from Microspec. We don't use the system often but when we need the better energy resolution because of peak overlap in the XEDS it is the only way to go. We had dealt with Steve Carr (really streching my memory) at Microspec back then. Microspec was taken over by Oxford Instruments, I believe. This is a link to the appropriate location in their web site; http://www.oxford-instruments.com/ANLPDP177.htm
There are other third party systems available as well; http://www.advancedmicrobeam.com/micro3wd.htm
I have no financial interest in any of these companies.
At the moment we have no plans to excess our Microspec so sorry no spare boards. Within the last two years we did have a problem with the high voltage to the detector and we were able to trace the problem to a bad capacitor on the high voltage board. Otherwise the detector has performed well.
} } } Greetings all, } } I would be interested to hear from anyone who is still using a Kevex } Sesame24/Microspec 2A WDS system. If you have one that is retired, I would } especially have an interest in the possibility of obtaining spare cards. } Mine is working but have no spares... } } Another question about the Sesame... I no longer have the Kevex 8000/Delta } EDS to which the WDS sent data for quantitation. Has anyone mated the } Sesame to a different EDS/software package to do quantitation? } } Thanks, Woody } -------------- } Woody White } McDermott Technology, inc } nwwhite-at-mcdermott.com
-- David R. Hull NASA Glenn Research Center at Lewis Field Advanced Metallics Branch Mail Stop 49-1 21000 Brookpark Road Cleveland, OH 44135
The book I have used for years is called "SEM Petrology Atlas" by Joann E. Welton. It was published in 1984 by the American Association of Petroleum Geologists (Tulsa, OK 74101) as part of the Methods in Exploration Series. Not sure if it still available, but the ISBN # is 0-89181-653-4.
It contains images and EDS spectra of a variety of minerals - silicates, carbonates, phosphates, halides, sulfides, sulfates, and oxides.
Hope this helps, Lou Ross
} ------------------------------------------------------------------------ } The Microscopy ListServer -- Sponsor: The Microscopy Society of America
Senior Electron Microscope Specialist Electron Microscopy Core Facility W136 Veterinary Medicine University of Missouri Columbia, MO 65211-5120 (573) 882-4777, fax 884=5414 email: rosslm-at-missouri.edu web: www.biotech.missouri.edu/emc
_SEM Petrology Atlas_ by Joann E. Welton, published by The American Association of Petroleum Geologists, Tulsa, OK 74101 USA; Copyright 1984, ISBN 0-89181-653-4.
It contains SEM micrographs and EDS spectra of various minerals associated with oil and gas exploration. I am a metallurgist, not a geologist, and this book has saved my... day... a number of times.
Regards, Andrew T. Werner Chief Metallurgist Shaped Charge Research - Metallurgy Laboratory Schlumberger Reservoir Completions Technology Center 14910 Airline Road, Rosharon, TX 77583-1590 Voice (281) 285-5272 Fax (281) 285-5273
"We shoot the hippopotamus with bullets made of platinum 'cause if we used the leaden ones his hide would surely flatten 'em" - Author Unknown
At 12:08 AM 3/1/2002 +0100, Göran Axelsson wrote: } ------------------------------------------------------------------------ } The Microscopy ListServer -- Sponsor: The Microscopy Society of America
Could be she was refering to SIMS and FIB. Based on my experience with FEI FIB (old model 611), it has poor imaging resolution. Their newer models, like the 830, are as you say, dual beam--ion and electron. The electron beam is used for imaging while the ion beam is used for micro machining, etc. FIBs are great for making microcircuit cross sections and changing runners on the planar area of a chip.
Supposedly, the FEI dual beam FIB will accept a SIMS "detector." So it would do a whole bunch of good tasks. Maybe there is only one spare port. Either a SIMS detector or x-ray detector could be fitted.
gary g.
At 05:05 AM 3/1/2002, you wrote: } You are correct in your 'secret cult' image, Gary. SIMS is largely a } well-kept secret of both the geoscience and semiconductor communities, with } the vast majority of materials scientists being unaware of its capabilities } in trace element detection (including even hydrogen), sputter depth } profiling, elemental imaging, isotope ratio age-dating and so forth. We } here in Ottawa at a federal materials science-oriented lab have had a SIMS } for nearly 15 years as a complement to our SEM, TEM and electron microprobe. } Like our XPS and Auger, however, the SIMS is not used nearly as much as the } EMs, but clients in the above two materials communities use it regularly. } Let me note that the 'new kid on the block' in the SIMS community is } something called a nanoSIMS, with a 50 nm beam (as opposed to the micron-ish } beam of a regular SIMS) and simultaneous detection of up to 5 elements (much } like a microprobe with WDX detectors). To date there are only two in North } America, no surprise given the ~$2M+ US price tag. } } However, I believe that Diane was referring to the differences between a } SIMS and a focused ion beam (FIB) system, which is essentially a scanning } ion microscope. In a FIB a much higher energy ion beam (30-50 keV as } opposed to only several keV for a SIMS) is focused by electrostatic lens } down to as little as 5 nm and scanned as in an SEM. The ion beam generates } both secondary ions and secondary electrons, which can be captured to form } the corresponding two types of images. Generally speaking, the resolution } is intermediate between an LaB6 emitter SEM and a field emission (FE) SEM. } The use of an electron flood gun permits good imaging of insulating } materials. The most important difference between a SIMS and a FIB is that, } while the former uses the scanned beam to sputter a crater for depth } profiling, the latter uses its more energetic beam to accomplish in-situ } 'micromachining'. Thus FIBs had their inception in the microelectronics } community to conduct fine-scale repairs on devices. More recently, they } have impacted seriously on general materials science via use of this } micromachining capability to prepare parallel-sided thin sections for TEM in } various ways. Finally, alas, FIBs have no analytical (EDXS) capability to } date, save for a few models that combine both a ion beam column and an } electron beam column (thus called dual beam FIBS), wherein an EDXS detector } can be used in conjunction with the latter. } } Attendees of M&M 2002 in Quebec City should check out the FIB session } chaired by Lucille Gianuzzi and Mike Phaneuf. I guarantee you'll be } impressed. } } Tom } } Tom Malis } Group Leader - Characterization } Materials Technology Laboratory } Natural Resources Canada (Govt. of Canada) } 568 Booth St., Ottawa, Canada } } } ---------- } } From: Gary Gaugler } } Sent: Thursday, February 28, 2002 6:20 PM } } To: Diane G. Miller } } Cc: MSA listserver } } Subject: Re: SIMS } } } } ------------------------------------------------------------------------ } } The Microscopy ListServer -- Sponsor: The Microscopy Society of America } } To Subscribe/Unsubscribe -- Send Email to ListServer-at-MSA.Microscopy.Com } } On-Line Help http://www.msa.microscopy.com/MicroscopyListserver/FAQ.html } } -----------------------------------------------------------------------. } } } } } } Did not see any response yet so I'll give it a try. } } } } A good reference for SIMS is Wilson, R., Stevie, F. } } and Magee, C. (1989). Secondary ion mass spectrometry. } } New York: John wiley & Sons. ISBN 0-471-51945-6 } } } } Ion beam microscopy is a mode which is available in } } some, if not all (not sure) SIMS units. The distinction } } is made between depth profiles, side wall ion contributions } } and other effects. Large area ratios are typically } } required for probe mode to exclude secondary ions } } from the sidewalls when the beam is in the center } } of the crater. Alternatively, secondary ions are } } rejected outside the center of the crater "with an } } aperture for the ion microscope mode" (p. 1.5-1). } } } } I haven't seen much other SIMS reference material either. } } Maybe it is a secret cult? } } } } gary g. } } } } } } At 04:57 PM 2/27/2002, you wrote: } } } } } Hello All, } } } } } } I need some information. I hope I will get some responses from you. I } } was } } } wondering what the difference is between a SIMS Secondary Ion Mass } } } Spectrometer and an Ion Beam Electron Microscope. Please excuse my } } } ignorance, but I've tried looking on the web, and I haven't found the } } } explanation that I need. } } } } } } Any help would be appreciated. } } } } } } Thank you in Advance. } } } } } } Diane } } } } } } {mailto:millerd-at-coho.net} millerd-at-coho.net } } } } } } }
Is anyone interested in purchasing a Bio-Rad MRC 600 confocal microscope system? Included are: 1. Krypton-Argon Laser (low hours) and power source exciting at 488 568 and 655 nm. 2. Nikon optiphot upright epifluorescence microscope with 10 20 and 60x Plan Apo objective lens', mercury arc lamp and power source. 3. Fine focus control stepping motor. 4. Compaq Desktop Pro pentium pc platform wtih Comos and Som software, and two color monitors. 5. Mitsubishi Dye-sublimation printer.
This system is operational and available for $10,000.000. We will ship, set-up and train the buyer. Please contact Michael Delannoy at (410) 955-1365 or via e-mail.
Thank you, Michael Delannoy Assist. Direct. Microscopy Facility JHMI
P.S. Does anyone have the confocal listserver address?
Since I have many years of SIMS experience, I responded to the recent question on this subject directly. I would like to let the group know that there is a SIMS list at sims-at-sims.arl.army.mil. There is also a Web site at http://www.simsworkshop.org/default.nclk with lots of information. SIMS is an expensive technique to own so the user community is small compared to SEM but if you are looking for low level elemental information its the best technique for the job.
Roy Beavers Southern Methodist University Dept. of Geological Sciences Electron Microprobe Lab P.O. Box 750395 Dallas, Tx 75275 voice: 214-768-2756 fax: 214-768-2701 E-mail: rbeavers-at-mail.smu.edu
I can only imagine Cu-Be grids are used for there superior stiffness compared to Cu grids. The amount of Be in these alloys is typically 1-2 wt%. The alloy is used to manufacture non-magnetic tools, springs (it can sustain a greater deflection before permanently deforming than spring steel up to 200degC) and in the chemical and electrical industry fields where there is a risk of explosion as the alloy is non-sparking.
Be grids were available for a time although I do not think they are now. The low atomic number meant that there was no stray x-rays detected from the grid material. Be is still extensively used in Materials Science TEM specimen holders (low background) for X-ray analysis because of this.
The dangers of Be and its alloys and compounds can be found on the SIRI MSDS website:-
siri.org/msds/index.php
Certain precautions are necessary when using Be. Any ingestion of the metal or its compounds should be avoided. Gloves should be worn at all times when handling Be or Be containing alloys. There is significantly less risk of symptoms from Cu-Be alloys although the effects of exposure to Be is cumulative (and delayed). Be dust is particularly dangerous it should not be inhaled or ingested, it is a carcinogen causes beryllium disease, a particularly chronic lung disease, and is an explosion hazard in air in high concentrations. Be containing parts should not be machined or filed. Companies machining parts out of Be do so in carefully monitored glove boxes with special filters to avoid the dust being dispersed in the atmosphere.
For occasional exposure to Be typical of life in an EM lab, as long as people are made aware of the dangers and use gloves, do not swallow the parts (!) and certainly do not take a file to them (!!) they are safe. Care must be taken however not to lose Be parts and if they are to be disposed of, they must not just be thrown away!
Regards
Alan
At 04:06 PM 2/28/2002 -0500, Tony Garratt-Reed wrote: } ------------------------------------------------------------------------ } The Microscopy ListServer -- Sponsor: The Microscopy Society of America
Alan W Nicholls, PhD Director of Research Service Facility (Electron Microscopy) Research Resources Center - East (M/C 337) Room 100 Science and Engineering South Building The University of Illinois at Chicago 845 West Taylor St Chicago, IL 60607-7058
Anyone out there with experience using a cooled digital camera to capture the luminescence of luciferase? We are looking at a macroscopic specimen expressing a luciferase tag using a 20x NA = 0.7 objective and a Sensys camera. I am assuming a don't need to have a filter in the path since the sample is only source of light. Does this seem practical? SO far we have had no luck. Any tips or tricks would be greatly appreciated. -- Thomas E. Phillips, Ph.D. Associate Professor of Biological Sciences Director, Molecular Cytology Core Facility
3 Tucker Hall Division of Biological Sciences University of Missouri Columbia, MO 65211-7400 (573)-882-4712 (voice) (573)-882-0123 (fax)
Tom; Beryllium is very potent at hardening copper without significantly reducing it's electrical conductivity. It is commonly used for springs and contacts in electrical switches, and is present at such a low concentration (~0.5%) that it is not considered a hazard. It also does not introduce any background that would intrude on EDX analysis. We use Be Cu slotted grids as substrates for 20 micron thick silicon slivers that will be milled in a focused ion beam tool. The substrate should resist bending because that would lead to fracture of the silicon. Unalloyed copper would bend too easily and would not be suitable.
John Mardinly Intel
-----Original Message----- } From: "tbargar%unmc.edu"-at-sparc5.microscopy.com [mailto:"tbargar%unmc.edu"-at-sparc5.microscopy.com] Sent: Thursday, February 28, 2002 8:31 AM To: Microscopy-at-sparc5.microscopy.com
An individual new to EM wanted to learn from me how to formvar-carbon coat slotted grids. The person bought grids made of a Berylium-Copper alloy. I called the vendor and was warned about the danger of Berylium and it's vapor. I told the invidual to get copper grids for our use. Now in all my years in EM I have not worked with Berylium. Would someone out there send me some information on the hazards of Berylium? Also what applications are Berylium-Copper or Berylium only grids used for? Any information is appreciated, thanks.
Tom Bargar EM Lab, UNMC tbargar-at-unmc.edu 402-559-7347
Dear Tom, Berylium-copper is an expensive alloy that allows a higher strength and hardness than most copper alloys while keeping the non-magnetic and non-sparking properties of copper. I used to have a set of tools for my ETEC SEM made of Be-Cu. The Be is less than 2.0 weight percent of the alloy and it is very tightly bound in the copper, so I don't think there is any danger of Be exposure on normal use or mild heating. The main danger of Be is the inhalation of BeO in the dust if Be is ground. At 10:31 AM 2/28/02 -0600, you wrote: } } An individual new to EM wanted to learn from me how to formvar-carbon coat } slotted grids. The person bought grids made of a Berylium-Copper alloy. I } called the vendor and was warned about the danger of Berylium and it's } vapor. I told the invidual to get copper grids for our use. Now in all my } years in EM I have not worked with Berylium. Would someone out there send } me some information on the hazards of Berylium? Also what applications are } Berylium-Copper or Berylium only grids used for? Any information is } appreciated, thanks. } } Tom Bargar } EM Lab, UNMC } tbargar-at-unmc.edu } 402-559-7347 Regards, Mary
Mary Mager Electron Microscopist Metals and Materials Engineering University of British Columbia 6350 Stores Road Vancouver, B.C. V6T 1Z4 CANADA tel: 604-822-5648 e-mail: mager-at-interchange.ubc.ca
I would like to solicit any info about automated grid stainers. I have been always staining by hand. Need to know pros and cons about the different ones that are in use. Any information, such as; initial cost, size, reproducibility, quality, open/closed system, reagents utilized, waste disposal, and etc., etc., will be appreciated.
Thank you TEM netters,
Donald G. Awbrey, HT(ASCP) QIHC Electron Microscopy / Image Analysis 817-878-5647 donaldawbrey-at-texashealth.org
US Census 2000 data is now available from GeoLytics
The U.S. Census Bureau has recently released the first two major sets of data from the 2000 Census: Redistricting and the "Short Form" (SF1).
GeoLytics offers these products in two easy-to-use formats either at the Block level or at the Block Group level and larger geographies. The data has been compressed so that it generally fits on 1 disk and it comes with built-in mapping capabilities, based upon the new Census 2000 boundaries. With a few quick keystrokes you can generate full-blown maps or tables. You can also export the data into a statistical software package, mapping or other software package.
Below I have listed information and pricing for the most popular products. For more information about GeoLytics or our full line of products call us at 1- 800-577-6717 or visit us online at http://www.uscensus.info
CensuSmart - Includes all four of the data sets described below. This is our "bundled" product, you get a copy of each of the data sets (Short Form, Short Form Blocks, Redistricting, Redistricting Blocks) and you save a lot of money too. Cost: $995 (all four items purchased separately would be $2280) http://www.uscensus.info/census2000.htm
CensusCD 2000 / Short Form - Includes all of the data released by the U.S. Census Bureau from the SHORT FORM, including 3,000 variables at the BLOCK GROUP level and 8,000 variables at the TRACT Level and above. The program also includes Zip Code Tabulation Arrays offered by the Census Bureau. Cost: $695 http://www.uscensus.info/census2000.htm
CensusCD 2000 / Short Form BLOCKS - Includes all of the data released by the U.S. Census Bureau from the SHORT FORM at the BLOCK level, all 8+ million of them. Cost $595 http://www.uscensus.info/census2000.htm
CensusCD 2000 / Redistricting - It has the complete Census 2000 redistricting data along with 1990 redistricting data (for easy timeline comparisons). Included with the data sets are the 1990 and 2000 mapping boundaries for 19 levels of geography: United States, Region, Division, State, County, Tract, Block Group, MSA/CMSA, PMSA, Indian Reservation & Trust lands, MCD/CCD, Place, Elementary Schools, Secondary Schools, Unified Schools, 106th Congressional, State Legislative Districts Upper, State Legislative Districts Lower and Voter Districts. Cost: $395. http://www.uscensus.info/census2000.htm
CensusCD 2000 / Redistricting BLOCKS - Includes all of the Redistricting data released at the BLOCK level, all 8+ million of them. Cost: $595 http://www.uscensus.info/census2000.htm
We also produce packages for the 1970, 1980 and 1990 Census http://www.uscensus.info/CensusCD708090/census708090.htm as well as a 40 Year (1970, 1980, 1990 and 2000) Tract data product. http://www.uscensus.info/CensusCD40Years/censuscd40.htm
If you do not wish to receive further emails, please send an email to remove-at-USCensus.info with 'Remove' in the subject line. To be added to the newsletter subscription list and to make sure that you receive an update when the Long Form data is released, send an email to info-at-USCensus.info with 'Add' in the subject line.
Anyone know where I can buy some Euparal? It's a mounting medium for light microscopy, often used by entomologists et al. WWW search and other tries here have turned up nil.
Thanks
Jonathan Krupp Microscopy & Imaging Lab University of California Santa Cruz, CA 95064 (831) 459-2477 jmkrupp-at-cats.ucsc.edu
on 2/28/02 11:31 AM, "tbargar-at-unmc.edu"-at-sparc5.microscopy.com at "tbargar-at-unmc.edu"-at-sparc5.microscopy.com wrote:
} Also what applications are } Berylium-Copper or Berylium only grids used for? Any information is } appreciated, thanks. } Dear Tom, Be grids are used for EDS, since their lower Z means that they scatter fewer electrons and produce fewer brehmsstrahlung x-rays than other materials, so they give a very low background count for x-ray analysis. Also, the only characteristic x-rays they produce are very low energy and do not interfere with most analyses. Yours, Bill Tivol
on 2/28/02 4:06 PM, Tony Garratt-Reed at tonygr-at-mit.edu wrote: } } This is not a "reply" to the post, but perhaps an extension of the question. } } Why would Cu-Be grids be used? Cu-Be is an interesting and quite } widely-used class of alloys (see http://microstructure.copper.org), but I } don't see why it would be used for EM grids - unless, that is, the grids we } loosely call "copper" are in fact all made of Cu-Be? } } On the subject of the posting, I can't imagine that Cu-Be would be as } widely used as it is if it were as toxic as Be-metal. I'm sure the } alloying must drastically reduce the hazard, but this is not my area of } expertise. } } Tony } } } } } An individual new to EM wanted to learn from me how to formvar-carbon coat } } slotted grids. The person bought grids made of a Berylium-Copper alloy. I } } called the vendor and was warned about the danger of Berylium and it's } } vapor. I told the invidual to get copper grids for our use. Now in all my } } years in EM I have not worked with Berylium. Would someone out there send } } me some information on the hazards of Berylium? Also what applications are } } Berylium-Copper or Berylium only grids used for? Any information is } } appreciated, thanks. } } } } Tom Bargar
Dear Tony & Tom, Cu-Be is used to make non-magnetic tools, and I'm sure it is used in preference to copper or bronze because of its strength and toughness. I suspect that the same qualities would make the Cu-Be grids more durable. Be metal is toxic in the Be++ form, so the oxide or other compounds are more toxic than the metal itself. The reason one should be careful handling the metal is that it can dissolve in the fluid in breaks in the skin, etc., and be introduced into the blood in the toxic form. Apparently, this does not happen with the Cu-Be alloy--at least, I've never seen warnings about using the tools, which often are used by people with cuts or abrasions on the skin. I'd be interested if anyone knows differently. Yours, Bill Tivol
Ken; When I worked at Lockheed, all beryllium alloys that were cut, ground, or polished had to be prepared in a special lab with numerous special safety precautions. Beryllium copper alloys (0.5%) were never subject to these safety rules, and could be cut, ground and polished without special precautions in any lab.
John Mardinly Intel
-----Original Message----- } From: Ken Converse [mailto:qualityimages-at-netrax.net] Sent: Friday, March 01, 2002 3:38 AM To: Tony Garratt-Reed; MSA, listserver
Tony, I can't answer why it would be used, except that Cu-Be is much harder than Cu. The main danger from Cu-Be is if you grind it or burn it, but the grids are so small that grinding is fairly unlikely. As used in non-magnetic tools, etc., you're right. It's very safe.
Ken Converse owner Quality Images third party SEM service Delta, PA
Tony Garratt-Reed wrote:
} ------------------------------------------------------------------------ } The Microscopy ListServer -- Sponsor: The Microscopy Society of America } To Subscribe/Unsubscribe -- Send Email to ListServer-at-MSA.Microscopy.Com } On-Line Help http://www.msa.microscopy.com/MicroscopyListserver/FAQ.html } -----------------------------------------------------------------------. } } } This is not a "reply" to the post, but perhaps an extension of the } question. } } Why would Cu-Be grids be used? Cu-Be is an interesting and quite } widely-used class of alloys (see http://microstructure.copper.org), } but I don't see why it would be used for EM grids - unless, that is, } the grids we loosely call "copper" are in fact all made of Cu-Be? } } On the subject of the posting, I can't imagine that Cu-Be would be as } widely used as it is if it were as toxic as Be-metal. I'm sure the } alloying must drastically reduce the hazard, but this is not my area } of expertise. } } Tony } } } At 10:31 AM 2/28/2002 -0600, you wrote: } } } ------------------------------------------------------------------------ } } The Microscopy ListServer -- Sponsor: The Microscopy Society of America } } To Subscribe/Unsubscribe -- Send Email to ListServer-at-MSA.Microscopy.Com } } On-Line Help http://www.msa.microscopy.com/MicroscopyListserver/FAQ.html } } -----------------------------------------------------------------------. } } } } } } An individual new to EM wanted to learn from me how to formvar-carbon } } coat } } slotted grids. The person bought grids made of a Berylium-Copper } } alloy. I } } called the vendor and was warned about the danger of Berylium and it's } } vapor. I told the invidual to get copper grids for our use. Now in } } all my } } years in EM I have not worked with Berylium. Would someone out there } } send } } me some information on the hazards of Berylium? Also what } } applications are } } Berylium-Copper or Berylium only grids used for? Any information is } } appreciated, thanks. } } } } Tom Bargar } } EM Lab, UNMC } } tbargar-at-unmc.edu } } 402-559-7347 } } } } * * * * * * * * * * * * * * * * * * * * * * * * * * } * Anthony J. Garratt-Reed M.A., D.Phil. } * MIT, Room 13-1027 } * 77 Massachusetts Avenue } * Cambridge, MA 02139-4307 } * USA } * Phone: (617) 253-4622 } * Fax: (617) 258-6478 } * } } } }
A clarification is probably in order. The INCA Crystal software actually works with scattered electrons (rather than x-rays) to determine the crystallography of the phase.
EDS is good for identifying most minerals, especially given some background of the likely candidates. But there are many cases of ambiguity until crystallographic information is available.
I know that EDS systems are available out there for around $60K. I am practically certain that would not include the INCA Crystal hardware and software. I would expect that to nearly double the cost of the system, but I haven't priced one yet.
Warren
At 08:39 AM 3/1/02 -0500, you wrote:
} Morning Goren (sorry for the missing um- [I'm just a] -lout?), } } Now, I'm going to take you at your word and venture into an area } which is NOT really mine yet. } Briefly, I would suggest that you consult with Oxford Instruments } for information on on a product they call "INCA Crystal" (no stock, no } family and other companies such as Thermo NORAN also have such systems in } the $50-$100k price range). These systems can be linked to the ICDD } database for mineral identification and permit collection of diffracted } X-rays phases within the specimen to determine both phase identification and } crystal orientation as well as elemental mapping from EDS. } I hope a practitioner responds, but here is the email of a vendor } rep: Glenn Kinnear (Oxford): kinnear-at-ma.oxinst.com. } } Hope this helps, } } Fred Monson } } Frederick C. Monson, PhD } Center for Advanced Scientific Imaging } West Chester University } West Chester, Pennsylvania, USA, 19383 } 610-738-0437 } fmonson-at-wcupa.edu } } } ---------- } } From: Göran Axelsson } } Sent: Thursday, February 28, 2002 6:08 PM } } To: Microscopy-at-sparc5.microscopy.com } } Subject: SEM books on mineral analysis } } } } Hello! } } } } I'm looking for a book or some other resources on mineral analysis with } } EDS. } } } } I have read a lot of information on the net about SEM / TEM and other } } instruments so I have a good theoretical knowledge about the process } } behind EDS but lacks the practical bit. } } } } My background is a MS in physics, some chemistry and some geology. } } I have had some mineral samples analysed in a Russian lab and now I } } want to learn more about the practical side. } } How to interprete the results, how to prepare specimens, which problems } } could occur.... } } } } Is there a book or some other information source that you could recommend } } for me? } } } } I will try to visit a lab for some hands on experience during the spring, } } but I } } would like to be well prepared so I could get the most out of the visit. } } } } My final goal is to find a cheap used SEM with EDS to set up a small lab } } for } } mineral analyses. } } } } Regards, Göran Axelsson, Sweden
Director, Core Imaging Facility American Museum of Natural History Central Park West at 79th Street New York, NY 10024 USA
Email: avklaus-at-amnh.org Tel: 212-769-5977
On Fri, 1 Mar 2002, Jon Krupp wrote:
} ------------------------------------------------------------------------ } The Microscopy ListServer -- Sponsor: The Microscopy Society of America } To Subscribe/Unsubscribe -- Send Email to ListServer-at-MSA.Microscopy.Com } On-Line Help http://www.msa.microscopy.com/MicroscopyListserver/FAQ.html } -----------------------------------------------------------------------. } } } Hi: } } Anyone know where I can buy some Euparal? It's a mounting medium for light } microscopy, often used by entomologists et al. WWW search and other tries } here have turned up nil. } } Thanks } } Jonathan Krupp } Microscopy & Imaging Lab } University of California } Santa Cruz, CA 95064 } (831) 459-2477 } jmkrupp-at-cats.ucsc.edu } } } }
Below is the result of your feedback form (NJZFM-ultra-55). It was submitted by (dan-at-isaacson.net) from http://www.msa.microscopy.com/Ask-A-Microscopist.html on Friday, March 1, 2002 at 17:27:04 ---------------------------------------------------------------------------
Email: dan-at-isaacson.net Name: Dan Isaacson
Organization: Seattle Central Community College
Education: Undergraduate College
Location: Seattle, Washington
Question: I live in Seattle and I was wondering what would be the best place/microscope/technique to observe cellular mitosis. More specifically I'm looking to observe the mitoic spindles through interphase, prophase, prometaphase, metaphase, anaphase, and telophase. Considering the size of spindles and the microtubule fibers that connect to the chromosomes it may be very difficult to observe. But any help you can give me would be greatly appriciated.
We need a cooled chamber large enough to hold a multiwell plate, 3"X6" (approximately), able to hold the temperature at 4 degrees C. This chamber will be used with a stereo zoom microscope at relatively high power and we must be able to pipette the multiwell plate through a port in the chamber. If you have any information on manufacturers of a device like this, or know of someone who has built one, please share the information with us. We would like to avoid reinventing the wheel on this project and hope somebody has done this already. We are are about to start fabricating one because we haven't found a source for one.
We are able to make any modifications needed to make a chamber that is close to what we need. This research previously has been done with the microscope and researcher inside a large refrigerater! Burr...
Thanks for your help. Dave Burton University of Washington, Seattle
The "SEM Petrology Atlas" by Joann Welton is out of print. I tried to find a copy several months ago but was unable to. I checked Amazon.com today and there is one copy available from a used book dealer for US $371. A bit pricy but if you plan on looking at a lot of rocks, especially sedimentary rocks, this is an excellent reference. You might want to search Amazon.com to find some more recent (and less expensive) books.
Most of my work is X-ray diffraction on rocks but I do some SEM work. The sample prep is pretty simple. If you have any specific questions, feel free to contact me off-list.
Sincerely, James Talbot
K/T GeoServices, Inc. Bulk and Clay Mineralogy by X-ray Diffraction (940) 597-9076 web site: http://www.ktgeo.com/
Lou Ross wrote:
} ------------------------------------------------------------------------ } The Microscopy ListServer -- Sponsor: The Microscopy Society of America } To Subscribe/Unsubscribe -- Send Email to ListServer-at-MSA.Microscopy.Com } On-Line Help http://www.msa.microscopy.com/MicroscopyListserver/FAQ.html } -----------------------------------------------------------------------. } } Hi Goran, } } The book I have used for years is called "SEM Petrology Atlas" by Joann E. } Welton. It was published in 1984 by the American Association of Petroleum } Geologists (Tulsa, OK 74101) as part of the Methods in Exploration Series. } Not sure if it still available, but the ISBN # is 0-89181-653-4. } } It contains images and EDS spectra of a variety of minerals - silicates, } carbonates, phosphates, halides, sulfides, sulfates, and oxides. } } Hope this helps, } Lou Ross } } } ------------------------------------------------------------------------ } } The Microscopy ListServer -- Sponsor: The Microscopy Society of America } } To Subscribe/Unsubscribe -- Send Email to ListServer-at-MSA.Microscopy.Com } } On-Line Help http://www.msa.microscopy.com/MicroscopyListserver/FAQ.html } } -----------------------------------------------------------------------. } } } } } } Hello! } } } } I'm looking for a book or some other resources on mineral analysis with } } EDS. } } } } I have read a lot of information on the net about SEM / TEM and other } } instruments so I have a good theoretical knowledge about the process } } behind EDS but lacks the practical bit. } } } } My background is a MS in physics, some chemistry and some geology. } } I have had some mineral samples analysed in a Russian lab and now I } } want to learn more about the practical side. } } How to interprete the results, how to prepare specimens, which problems } } could occur.... } } } } Is there a book or some other information source that you could } } recommend } } for me? } } } } I will try to visit a lab for some hands on experience during the } } spring, but I } } would like to be well prepared so I could get the most out of the visit. } } } } My final goal is to find a cheap used SEM with EDS to set up a small lab } } for } } mineral analyses. } } } } Regards, Göran Axelsson, Sweden } } Senior Electron Microscope Specialist } Electron Microscopy Core Facility } W136 Veterinary Medicine } University of Missouri } Columbia, MO 65211-5120 } (573) 882-4777, fax 884=5414 } email: rosslm-at-missouri.edu } web: www.biotech.missouri.edu/emc
I have questions pertaining to practical applications for this BSE/CL detector. Would any of you who have practical experience please contact me directly.
genuinely ... michael shaffer :o) Avalon Peninsula, Newfoundland www.micro-investigations.com
I have questions pertaining to practical applications for this BSE/CL detector. Would any of you who have practical experience please contact me directly.
genuinely ... michael shaffer :o) Avalon Peninsula, Newfoundland www.micro-investigations.com
Many years ago (1986) we were attempting to clean Formvar coating and epoxy resin sections from slotted beryllium grids. Since, for safety reasons, acid could not be used to clean beryllium, we were following the suppplier's suggestion to use either acetone or ethanol. When an initial wash in acetone did not do a satisfactory job, the grids were placed in 100% ethanol. Shortly thereafter, examination of the grids under a dissecting microscope revealed distinct signs of corrosion: holes appeared in one grid, and pieces broke from the edges of two others.
We immediately contacted the supplier, who immediately called the manufacturer, who was of the opinion that the formaldehyde in Formvar, in conjunction with an organic solvent, could indeed initiate corrosive action on the beryllium. Proper disposal consisted of pouring the grids and the ethanol solution onto filter paper in a funnel; the wet filter paper with the grids on it was placed in a plastic bag (to prevent drying out and subsequent release of dust) for pick-up by the biological safaety office, and the liquid was poured down the sink.
At that time beryllium itself was not considered nearly as toxic as it had once been, but beryllium salts were still very bad news. As a result of our experience, the supplier (Ted Pella) decided to suggest to all customers that NO attempt be made to clean beryllium grids, but that they be discarded in a safe manner after use.
Alan Nicholls wrote: ========================================== I can only imagine Cu-Be grids are used for there superior stiffness compared to Cu grids. The amount of Be in these alloys is typically 1-2 wt%. The alloy is used to manufacture non-magnetic tools, springs (it can sustain a greater deflection before permanently deforming than spring steel up to 200degC) and in the chemical and electrical industry fields where there is a risk of explosion as the alloy is non-sparking.
Be grids were available for a time although I do not think they are now. The low atomic number meant that there was no stray x-rays detected from the grid material. Be is still extensively used in Materials Science TEM specimen holders (low background) for X-ray analysis because of this. =========================================== We might be comparing apples with oranges here.
What is referred to as "copper/beryllium alloy" indeed is mainly copper with a little bit of beryllium added. I have worked in the M&M field for more years than I will admit and I have never heard of anyone making either grids or planchettes out of that alloy. After all, it would be self-defeating and would serve no useful purpose in EM.
There are alloys of Be that are 98 and 99% Be and the non-Be content can be Cu and/or other impurities. Over the years, grids and planchettes have been offered of the 98 and 99% purity alloys, and they were somewhat cheaper than the higher purity 99.8% Be that have been offered now for some years by SPI Supplies. If you have grids where no statement of purity was given, we believe that you can probably assume they were 98% or possibly 99% but not the 99.8% level.
At one time, and they might still be offered, were essentially copper grids that had a sputter coated layer of Be. I think the theory was that the Be coating approach could lead to a lower priced product that could do the same thing. We always had the idea that they did not work very well in terms of keeping Cu lines out of the EDS spectra. That might not be the experience of others, however. We also heard reports of the Be layer flaking off as the grid was flexed, which could lead to an inhalation hazard.
A full range of 99.8% purity Be grids is described on URL http://www.2spi.com/catalog/grids/beryl.html
They are very much still available off-the-shelf from SPI Supplies. For those who are in institutions that have banned Be in any form, the above URL mentions and provides links to product alternatives.
Chuck
============================================
Charles A. Garber, Ph. D. Ph: 1-610-436-5400 President 1-800-2424-SPI SPI SUPPLIES FAX: 1-610-436-5755 PO BOX 656 e-mail:cgarber-at-2spi.com West Chester, PA 19381-0656 USA Cust.Service: spi2spi-at-2spi.com
Look for us! ######################## WWW: http://www.2spi.com ######################## ============================================
Joanne Whallon wrote: ================================================================= Many years ago (1986) we were attempting to clean Formvar coating and epoxy resin sections from slotted beryllium grids. Since, for safety reasons, acid could not be used to clean beryllium, we were following the supplier's suggestion to use either acetone or ethanol. When an initial wash in acetone did not do a satisfactory job, the grids were placed in 100% ethanol . Shortly thereafter, examination of the grids under a dissecting microscope revealed distinct signs of corrosion: holes appeared in one grid, and pieces broke from the edges of two others.
We immediately contacted the supplier, who immediately called the manufacturer, who was of the opinion that the formaldehyde in Formvar, in conjunction with an organic solvent, could indeed initiate corrosive action on the beryllium. Proper disposal consisted of pouring the grids and the ethanol solution onto filter paper in a funnel; the wet filter paper with the grids on it was placed in a plastic bag (to prevent drying out and subsequent release of dust) for pick-up by the biological safety office, and the liquid was poured down the sink.
At that time beryllium itself was not considered nearly as toxic as it had once been, but beryllium salts were still very bad news. As a result of our experience, the supplier (Ted Pella) decided to suggest to all customers that NO attempt be made to clean beryllium grids, but that they be discarded in a safe manner after use. ========================================================== A minute or less in an oxygen plasma, such as what is produced in the SPI Plasma Prep II plasma etcher will "etch" away anything organic in the way of a TEM thickness section. I am talking about seconds. Because of the isotropic nature of the etching process in the Plasma Prep II (as opposed to anisotropic etchers), both sides seemed to get cleaned, although if it was me, I would try to put the section side up.
One never knows for sure of course, but the etching rate with oxygen on Beryllium metal would be essentially zero when compared to anything organic.
And while it might be a digression from the main thread of the topic, let me point out that the hazard is an inhalation hazard, namely beryllium oxide (BeO). Beryllium metal is about as inert and innocuous as anything you can find. A dangerous situation does not arise just have having the grid (or planchette) sitting there, or for that matter, putting the grid in the TEM (or SEM) but from the processing of the item. For example, those who might try "repolishing" a Be planchette take on an especially high risk because if their polishing table is allowed to dry out, there could result a dry powder that has become BeO and it would indeed become a hazard if the polishing media was dislodged and the entrapped particulates became air borne. I have not heard of an analogous situation with regard to the cleaning, mechanically, the grids.
If one was concerned about beryllium in any form exiting the mechanical pump being used with a plasma etcher, and if a standard oil mist filter was deemed to not be enough protection, then the pump can be vented directly to the laboratory's fume exhaust system (or operated inside of the fume hood).
Finally, contrary to conventional wisdom in M&M land, many of these products , including Be grids are not all the same, especially with regard to non- breyllium content, such as copper. Additional information can be found on URL http://www.2spi.com/catalog/grids/note.html
The chemical resistance of beryllium alloyed with copper will be considerably less, and therefore explaining the pitting, than the higher purity preferred by those who use these kinds of grids on a regular basis. The point is that your experience with the etching suggests the non- beryllium content of the grids was high and such experience could not be expected to be reproduced by someone using the higher purity (and more expensive beryllium foil) that is used in the making of the higher Be content grids.
Disclaimer: SPI Supplies is a supplier of high purity beryllium grids so we would have a vested interest in seeing more people use SPI SuppliesŽ brand of beryllium grids than grids offered by others.
Chuck
============================================
Charles A. Garber, Ph. D. Ph: 1-610-436-5400 President 1-800-2424-SPI SPI SUPPLIES FAX: 1-610-436-5755 PO BOX 656 e-mail:cgarber-at-2spi.com West Chester, PA 19381-0656 USA Cust.Service: spi2spi-at-2spi.com
Look for us! ######################## WWW: http://www.2spi.com ######################## ============================================
Below is the result of your feedback form (NJZFM-ultra-55). It was submitted by (lisa.monaco-at-msfc.nasa.gov) from http://www.msa.microscopy.com/Ask-A-Microscopist.html on Friday, March 1, 2002 at 13:27:42 ---------------------------------------------------------------------------
Email: lisa.monaco-at-msfc.nasa.gov Name: lisa monaco
Organization: MSFC
Education: Graduate College
Location: Hunstville Alabama
Question: What would be the some of the best optical techniques for high resolution imaging of transparent cubic crystals in solution.
The are 20 microns on edge, at high resolution (i.e., we want to be able to make measurements on crystal dimensions within about 5-10 microns) and they are in transparent solution from which they grew. In some cases, just a phase separation (for example SCN crystals out of SCN solution)
I think you need to look at the International Chemical Safety Card (ICSC) for Beryllium (not the oxide) in POWDER form. The main points are:-
Fire - combustable Explosion - finely dispersed particles form explosive mixtures in air
EXPOSURE - PREVENT DISPERSION OF DUST! AVOID ALL CONTACT! (their capitals). Effects of short-term exposure to high quantities of the dust are irritation of the respiratory tract. Inhalation of the dust or fumes causes chemical pneumonitis. Exposure may result in death. Effects may be delayed. (The Chicago Tribune ran another article yesterday about the effects of Be machining in the armed forces and nuclear industries. Effects of exposure may not be obvious for 20-35 years)
Repeated or long term contact may cause skin sensitization. Lungs may be affected resulting in chronic beryllium disease. Be powder is carcinogenic and should not be ingested. Finally Be powder is very toxic to aquatic organisms.
I agree with you that Solid "Beryllium metal is about as inert and innocuous as anything you can find" and that using Be grids, Be planchets and Be low background holders is safe as long as "people are made aware of the dangers and use gloves, do not swallow the parts (!) and certainly do not take a file to them (!!)" as I said in my original posting.
However, both the metal and its compounds in powder/ particle form are dangerous and should not be released to the environment in air or water. As it says in the spillage disposal notes in the ICSC "Do NOT let this chemical enter the environment"
Regards
Alan
At 12:19 AM 3/3/2002 -0500, Garber, Charles A. wrote: } ------------------------------------------------------------------------ } The Microscopy ListServer -- Sponsor: The Microscopy Society of America
Alan W Nicholls, PhD Director of Research Service Facility (Electron Microscopy) Research Resources Center - East (M/C 337) Room 100 Science and Engineering South Building The University of Illinois at Chicago 845 West Taylor St Chicago, IL 60607-7058
I would like to hear from any APEX WDS owners out there to see how many are still active (maybe we can establish a user's group?) or if any inactive systems are available for parts. Please respond to me directly.
Thanks, Lou Ross -- Senior Electron Microscope Specialist Electron Microscopy Core Facility W136 Veterinary Medicine University of Missouri Columbia, MO 65211-5120 (573) 882-4777, fax 884=5414 email: rosslm-at-missouri.edu web: www.biotech.missouri.edu/emc
There are several permutations, most covered nicely, just a thought or two:
I believe you could also consider a ToF-SIMS as a "ion beam microscope" but not as an "ion beam electron microscope" since the former generates highly surface sensitive ion-based chemical information (including images) and the latter implies electron images generated from ions (ions in and electrons out). The contrast mechanism and the image information volume would be different from standard electron images.
ToF-SIMS utilizes a FIB ion beam and a mass/charge analyzer to obtain information from ~submonolayer regions because the ion beam flux is in the static regime. It can produce "chemical signature images" with a spatial resolution that varies, but can reach sub-micron.
Quadrapole SIMS detectors have been installed on standard dual beam FIB instruments, the primary benefit is enhanced detection limits and speed with respect to some other forms of analysis available in such systems. Fred Stevie (now at the university of North Carolina, I think...but definitely not with Agere(lucent) any longer) has done quite a bit in that area.
Regards, Ed
Gary Gaugler {gary-at-gaugler.com} on 03/01/2002 07:28:51 AM
To: "Malis, Tom" {malis-at-nrcan.gc.ca} cc: MSA listserver {Microscopy-at-sparc5.microscopy.com}
Could be she was refering to SIMS and FIB. Based on my experience with FEI FIB (old model 611), it has poor imaging resolution. Their newer models, like the 830, are as you say, dual beam--ion and electron. The electron beam is used for imaging while the ion beam is used for micro machining, etc. FIBs are great for making microcircuit cross sections and changing runners on the planar area of a chip.
Supposedly, the FEI dual beam FIB will accept a SIMS "detector." So it would do a whole bunch of good tasks. Maybe there is only one spare port. Either a SIMS detector or x-ray detector could be fitted.
gary g.
At 05:05 AM 3/1/2002, you wrote: } You are correct in your 'secret cult' image, Gary. SIMS is largely a } well-kept secret of both the geoscience and semiconductor communities, with } the vast majority of materials scientists being unaware of its capabilities } in trace element detection (including even hydrogen), sputter depth } profiling, elemental imaging, isotope ratio age-dating and so forth. We } here in Ottawa at a federal materials science-oriented lab have had a SIMS } for nearly 15 years as a complement to our SEM, TEM and electron microprobe. } Like our XPS and Auger, however, the SIMS is not used nearly as much as the } EMs, but clients in the above two materials communities use it regularly. } Let me note that the 'new kid on the block' in the SIMS community is } something called a nanoSIMS, with a 50 nm beam (as opposed to the micron-ish } beam of a regular SIMS) and simultaneous detection of up to 5 elements (much } like a microprobe with WDX detectors). To date there are only two in North } America, no surprise given the ~$2M+ US price tag. } } However, I believe that Diane was referring to the differences between a } SIMS and a focused ion beam (FIB) system, which is essentially a scanning } ion microscope. In a FIB a much higher energy ion beam (30-50 keV as } opposed to only several keV for a SIMS) is focused by electrostatic lens } down to as little as 5 nm and scanned as in an SEM. The ion beam generates } both secondary ions and secondary electrons, which can be captured to form } the corresponding two types of images. Generally speaking, the resolution } is intermediate between an LaB6 emitter SEM and a field emission (FE) SEM. } The use of an electron flood gun permits good imaging of insulating } materials. The most important difference between a SIMS and a FIB is that, } while the former uses the scanned beam to sputter a crater for depth } profiling, the latter uses its more energetic beam to accomplish in-situ } 'micromachining'. Thus FIBs had their inception in the microelectronics } community to conduct fine-scale repairs on devices. More recently, they } have impacted seriously on general materials science via use of this } micromachining capability to prepare parallel-sided thin sections for TEM in } various ways. Finally, alas, FIBs have no analytical (EDXS) capability to } date, save for a few models that combine both a ion beam column and an } electron beam column (thus called dual beam FIBS), wherein an EDXS detector } can be used in conjunction with the latter. } } Attendees of M&M 2002 in Quebec City should check out the FIB session } chaired by Lucille Gianuzzi and Mike Phaneuf. I guarantee you'll be } impressed. } } Tom } } Tom Malis } Group Leader - Characterization } Materials Technology Laboratory } Natural Resources Canada (Govt. of Canada) } 568 Booth St., Ottawa, Canada } } } ---------- } } From: Gary Gaugler } } Sent: Thursday, February 28, 2002 6:20 PM } } To: Diane G. Miller } } Cc: MSA listserver } } Subject: Re: SIMS } } } } ------------------------------------------------------------------------ } } The Microscopy ListServer -- Sponsor: The Microscopy Society of America } } To Subscribe/Unsubscribe -- Send Email to ListServer-at-MSA.Microscopy.Com } } On-Line Help http://www.msa.microscopy.com/MicroscopyListserver/FAQ.html } } -----------------------------------------------------------------------. } } } } } } Did not see any response yet so I'll give it a try. } } } } A good reference for SIMS is Wilson, R., Stevie, F. } } and Magee, C. (1989). Secondary ion mass spectrometry. } } New York: John wiley & Sons. ISBN 0-471-51945-6 } } } } Ion beam microscopy is a mode which is available in } } some, if not all (not sure) SIMS units. The distinction } } is made between depth profiles, side wall ion contributions } } and other effects. Large area ratios are typically } } required for probe mode to exclude secondary ions } } from the sidewalls when the beam is in the center } } of the crater. Alternatively, secondary ions are } } rejected outside the center of the crater "with an } } aperture for the ion microscope mode" (p. 1.5-1). } } } } I haven't seen much other SIMS reference material either. } } Maybe it is a secret cult? } } } } gary g. } } } } } } At 04:57 PM 2/27/2002, you wrote: } } } } } Hello All, } } } } } } I need some information. I hope I will get some responses from you. I } } was } } } wondering what the difference is between a SIMS Secondary Ion Mass } } } Spectrometer and an Ion Beam Electron Microscope. Please excuse my } } } ignorance, but I've tried looking on the web, and I haven't found the } } } explanation that I need. } } } } } } Any help would be appreciated. } } } } } } Thank you in Advance. } } } } } } Diane } } } } } } {mailto:millerd-at-coho.net} millerd-at-coho.net } } } } } } }
I just found out about a spiffy new freeware called IrfanView (pronounced earfan-view).
We were having trouble capturing H&E colors using PhotoShop. I then heard from the guy who does tech support for the RGB camera that we use about IrfanView. It is GREAT! We capture our images and the colors are pretty true.
We haven't figured it all out yet, so we still use PhotoShop for other stuff, but I recommend that you take a look at the program
Go to www.irfanview.com
Has anybody else used this software? What's your opinion?
Paula :-)
p.s. I have no connection to this product I'm just a happy user.
Paula Sicurello George Washington Univ. Medical Center Dept. of Pathology, Ross Hall rm 505 Electron Microscope Lab 2300 Eye St. Washington, DC 20037 202-994-2930 phone 202-994-2518 fax
Can anyone suggest a source of cover slips for light microscopy that have some type of grid pattern on the surface? Ideally we are looking for No. 1.5 square cover slips.
Thanks, Louie
-- Louie Kerr Research and Education Support Coordinator Marine Biological Laboratory 7 MBL Street Woods Hole, MA 02543 508-289-7273 508-540-6902 (FAX) 508-292-0289 (Cell phone)
VISIT OUR WEB SITE: http://www.mbl.edu/ http://www.courses.mbl.edu/
I get evangelical about this one too - as a fast-loading basic 8/24-bit image handling package its great.
Sally Stowe
} } } "Paula Sicurello" {patpxs-at-gwumc.edu} 03/05/02 07:27AM } } } ------------------------------------------------------------------------ The Microscopy ListServer -- Sponsor: The Microscopy Society of America
Hi Listers,
I just found out about a spiffy new freeware called IrfanView (pronounced earfan-view).
We were having trouble capturing H&E colors using PhotoShop. I then heard from the guy who does tech support for the RGB camera that we use about IrfanView. It is GREAT! We capture our images and the colors are pretty true.
We haven't figured it all out yet, so we still use PhotoShop for other stuff, but I recommend that you take a look at the program
Go to www.irfanview.com
Has anybody else used this software? What's your opinion?
Paula :-)
p.s. I have no connection to this product I'm just a happy user.
Paula Sicurello George Washington Univ. Medical Center Dept. of Pathology, Ross Hall rm 505 Electron Microscope Lab 2300 Eye St. Washington, DC 20037 202-994-2930 phone 202-994-2518 fax
Dear Listers- I am trying to determine the resolution using x-ray diffraction for thin film texture determinations, (i.e. smallest grain size and film thickness which can be investigated). When I read books like Cullity, it appears that the resolution will be limited to about 100 nm based on diffraction peak broadening due to the particle size, (although I have not found any books published recently on the technique, those in the 1980's, quote the spatial resolution as high as 500nm). However, I seem to recall discussions of XRD measurements on films down to 5nm in thickness. I have never used this technique, but my suspicion is that it would be very difficult to deconvolve the substrate from the film. I would be greatful to hear any comments on the 'practical resolution' of this technique. Thank You, Mark Williamson Mark Williamson mjw4b-at-virginia.edu
Does anyone know of a company located in the San Francisco Bay Area (California) that performs TEM's on biologics? I need a TEM of an air filled double-walled microsphere.
Thank You, Erica Steadman POINT Biomedical Corp. San Carlos, California
Below is the result of your feedback form (NJZFM-ultra-55). It was submitted by (n-alem-at-northwestern.edu) from http://www.msa.microscopy.com/Ask-A-Microscopist.html on Monday, March 4, 2002 at 12:54:52 ---------------------------------------------------------------------------
Question: I am trying to make a TEM Sample out of the eutectic Ceramic oxide NiO/ZrO2. I was wondering what would be the most appropriate paste and polishing paper to mechanically thin down the sample.
I have been trying fine SiC paper, however it is not very effective in thining down the sample. The sample is also very brittle. I have had crack initiation and prpapagation on the surface of the sample, while using coarse SiC paper.
Below is the result of your feedback form (NJZFM-ultra-55). It was submitted by (w-ding-at-northwestern.edu) from http://www.msa.microscopy.com/Ask-A-Microscopist.html on Monday, March 4, 2002 at 17:17:11 ---------------------------------------------------------------------------
Question: I am a user of Hitachi S 4500 SEM. I want to know the relationship of the second electron detector output signal and CRT display signal. As you know, the SEM has different scan mode,including TV mode, and more slow modes. I want to know the time for each line scan on CRT and also for whole frame corresponding to the electron beam scan on sample. Is there any relationship or simple equations for calculation.
I am using IrfanViewer for many years since their first release. I am using it as a 'general-purpose' viewer for the most image formats. It's very quick and has a lot of very nice functions. It's small and very efficient. It's one of the best viewers I ever seen. No interest in company, but happy user. Sergey
At 12:27 PM 3/4/02, you wrote: } ------------------------------------------------------------------------ } The Microscopy ListServer -- Sponsor: The Microscopy Society of America
_____________________________________
Sergey Ryazantsev Ph. D. Electron Microscopy UCLA School of Medicine Department of Biological Chemistry Box 951737 Los Angeles, CA 90095-1737
} } Dear Listers- } I am trying to determine the resolution using x-ray diffraction for } thin film texture determinations, (i.e. smallest grain size and film } thickness which can be investigated). When I read books like Cullity, it } appears that the resolution will be limited to about 100 nm based on } diffraction peak broadening due to the particle size, (although I have } not found any books published recently on the technique, those in the } 1980's, quote the spatial resolution as high as 500nm). However, I seem } to recall discussions of XRD measurements on films down to 5nm in } thickness. I have never used this technique, but my suspicion is that it } would be very difficult to deconvolve the substrate from the film. I } would be greatful to hear any comments on the 'practical resolution' of } this technique. } Thank You, } Mark Williamson
I also find Irfanview very useful, and use it as my default image viewer. It is small and fast with a good number of facilities. Batch conversion (and / or file renaming) from one format to another is especially efficient. It displays, manipulates and saves a large variety of image formats. Setting up a slideshow is quick. Really useful software. The freeware version is for home use, the author requests a registration fee of 10 US dollars for non-personal use.
(No connection with the author or program, just a satisfied user).
Jan Coetzee Lab for Microscopy and Microanalysis University of Pretoria, South Africa. Tel: 012-420-2075, Fax 012-362-5150 www.up.ac.za/academic/electron/emunit1.htm
Paula Sicurello wrote: } } ------------------------------------------------------------------------ } The Microscopy ListServer -- Sponsor: The Microscopy Society of America } To Subscribe/Unsubscribe -- Send Email to ListServer-at-MSA.Microscopy.Com } On-Line Help http://www.msa.microscopy.com/MicroscopyListserver/FAQ.html } -----------------------------------------------------------------------. } } Hi Listers, } } I just found out about a spiffy new freeware called IrfanView (pronounced earfan-view). } } We were having trouble capturing H&E colors using PhotoShop. I then heard from the guy who does tech support for the RGB camera that we use about IrfanView. It is GREAT! We capture our images and the colors are pretty true. } } We haven't figured it all out yet, so we still use PhotoShop for other stuff, but I recommend that you take a look at the program } } Go to www.irfanview.com } } Has anybody else used this software? What's your opinion? } } Paula :-) } } p.s. I have no connection to this product I'm just a happy user. } } Paula Sicurello } George Washington Univ. Medical Center } Dept. of Pathology, Ross Hall rm 505 } Electron Microscope Lab } 2300 Eye St. } Washington, DC 20037 } 202-994-2930 phone } 202-994-2518 fax
I read your email about coverslips with grids on the microscopy. I believe a good place to look for grids is the website of "Edmund Optics" (http://www.edmundoptics.com/). They have several types of grids for micrscopy.
If the grid is needed for calibrating a digital microscopy setup, this can also be done without a grid if you know some of the "physical" properties of the CCD-camera and the digitizer.
Best regards,
Peter
P.S. I have no commercial relation with Edmund Optics, I only know about their grids because I have used some of them for my own work.
-- Dr. Peter Van Osta
Union Biometrica N.V./S.A. European Scientific Operations
======================================================= Louis Kerr wrote: } } ------------------------------------------------------------------------ } The Microscopy ListServer -- Sponsor: The Microscopy Society of America } To Subscribe/Unsubscribe -- Send Email to ListServer-at-MSA.Microscopy.Com } On-Line Help http://www.msa.microscopy.com/MicroscopyListserver/FAQ.html } -----------------------------------------------------------------------. } } Hello all, } } Can anyone suggest a source of cover slips for light microscopy that } have some type of grid pattern on the surface? Ideally we are looking } for No. 1.5 square cover slips. } } Thanks, } Louie } } -- } Louie Kerr } Research and Education Support Coordinator } Marine Biological Laboratory } 7 MBL Street } Woods Hole, MA 02543 } 508-289-7273 } 508-540-6902 (FAX) } 508-292-0289 (Cell phone) } } VISIT OUR WEB SITE: } http://www.mbl.edu/ } http://www.courses.mbl.edu/
Thanks Warren, I am reading the literature again, hoping the RAM works better next time. I knew I was going to get in trouble, but, nothing ventured nothing learned. Now I understand the purpose of the CCD camera - - - - I think!
No confusion about the cost, and it is NOT included with EDS.
Are all the phase identification/analysis systems the same?
Regards,
Fred
} ---------- } From: Warren E Straszheim } Sent: Friday, March 1, 2002 5:34 PM } To: Microscopy-at-sparc5.microscopy.com } Cc: Göran Axelsson } Subject: RE: SEM books on mineral analysis } } ------------------------------------------------------------------------ } The Microscopy ListServer -- Sponsor: The Microscopy Society of America } To Subscribe/Unsubscribe -- Send Email to ListServer-at-MSA.Microscopy.Com } On-Line Help http://www.msa.microscopy.com/MicroscopyListserver/FAQ.html } -----------------------------------------------------------------------. } } } A clarification is probably in order. The INCA Crystal software actually } works with scattered electrons (rather than x-rays) to determine the } crystallography of the phase. } } EDS is good for identifying most minerals, especially given some } background } of the likely candidates. But there are many cases of ambiguity until } crystallographic information is available. } } I know that EDS systems are available out there for around $60K. I am } practically certain that would not include the INCA Crystal hardware and } software. I would expect that to nearly double the cost of the system, but } } I haven't priced one yet. } } Warren } } At 08:39 AM 3/1/02 -0500, you wrote: } } } Morning Goren (sorry for the missing um- [I'm just a] -lout?), } } } } Now, I'm going to take you at your word and venture into an area } } which is NOT really mine yet. } } Briefly, I would suggest that you consult with Oxford } Instruments } } for information on on a product they call "INCA Crystal" (no stock, no } } family and other companies such as Thermo NORAN also have such systems in } } the $50-$100k price range). These systems can be linked to the ICDD } } database for mineral identification and permit collection of diffracted } } X-rays phases within the specimen to determine both phase identification } and } } crystal orientation as well as elemental mapping from EDS. } } I hope a practitioner responds, but here is the email of a } vendor } } rep: Glenn Kinnear (Oxford): kinnear-at-ma.oxinst.com. } } } } Hope this helps, } } } } Fred Monson } } } } Frederick C. Monson, PhD } } Center for Advanced Scientific Imaging } } West Chester University } } West Chester, Pennsylvania, USA, 19383 } } 610-738-0437 } } fmonson-at-wcupa.edu } } } } } ---------- } } } From: Göran Axelsson } } } Sent: Thursday, February 28, 2002 6:08 PM } } } To: Microscopy-at-sparc5.microscopy.com } } } Subject: SEM books on mineral analysis } } } } } } Hello! } } } } } } I'm looking for a book or some other resources on mineral analysis } with } } } EDS. } } } } } } I have read a lot of information on the net about SEM / TEM and other } } } instruments so I have a good theoretical knowledge about the process } } } behind EDS but lacks the practical bit. } } } } } } My background is a MS in physics, some chemistry and some geology. } } } I have had some mineral samples analysed in a Russian lab and now I } } } want to learn more about the practical side. } } } How to interprete the results, how to prepare specimens, which } problems } } } could occur.... } } } } } } Is there a book or some other information source that you could } recommend } } } for me? } } } } } } I will try to visit a lab for some hands on experience during the } spring, } } } but I } } } would like to be well prepared so I could get the most out of the } visit. } } } } } } My final goal is to find a cheap used SEM with EDS to set up a small } lab } } } for } } } mineral analyses. } } } } } } Regards, Göran Axelsson, Sweden } } } }
Differential Interference Contrast (DIC)! or barring that, phase coupled with timed-sequence photography or just a plain video camera. Normal cells get thru the process in under 30min.
Get on the net and query Google with the following: "mitosis university of washington".
Frederick C. Monson, PhD Center for Advanced Scientific Imaging West Chester University West Chester, Pennsylvania, USA, 19383 610-738-0437 fmonson-at-wcupa.edu
} ---------- } From: dan-at-isaacson.net } Sent: Saturday, March 2, 2002 10:42 AM } To: Microscopy-at-sparc5.microscopy.com } Subject: Ask-A-Microscopist:How to observe Cellular Mitosis? } } ------------------------------------------------------------------------ } The Microscopy ListServer -- Sponsor: The Microscopy Society of America } To Subscribe/Unsubscribe -- Send Email to ListServer-at-MSA.Microscopy.Com } On-Line Help http://www.msa.microscopy.com/MicroscopyListserver/FAQ.html } -----------------------------------------------------------------------. } } } Below is the result of your feedback form (NJZFM-ultra-55). It was } submitted by (dan-at-isaacson.net) from } http://www.msa.microscopy.com/Ask-A-Microscopist.html on Friday, } March 1, 2002 at 17:27:04 } -------------------------------------------------------------------------- } - } } Email: dan-at-isaacson.net } Name: Dan Isaacson } } Organization: Seattle Central Community College } } Education: Undergraduate College } } Location: Seattle, Washington } } Question: I live in Seattle and I was wondering what would be the } best place/microscope/technique to observe cellular mitosis. More } specifically I'm looking to observe the mitoic spindles through } interphase, prophase, prometaphase, metaphase, anaphase, and } telophase. Considering the size of spindles and the microtubule } fibers that connect to the chromosomes it may be very difficult to } observe. But any help you can give me would be greatly appriciated. } } Thanks, } Dan Isaacson } } -------------------------------------------------------------------------- } - } }
At the risk of redundancy I can't help but add to the praise for Irfanview.
I've wished vainly for a few years for a replacement for the classic Mac 'GraphicConverter' sofwtare, and this appears to have all the elements (possibly more - I'm just getting acquainted). It's free (yes, doesn't self-destruct after 30 days, and doesn't bombard you with registration warnings). It's also fast and has numerous useful features (support of 16 bit grey scale images; full screen viewing mode; also check out the feature which allows you to scroll through the entire contents of a directory by simply hitting spacebar - nifty!).
Wharton
********************************************************************* Wharton Sinkler UOP LLC Des Plaines, IL 60017-5017
} -----Original Message----- } From: Paula Sicurello [SMTP:patpxs-at-gwumc.edu] } Sent: Monday, March 04, 2002 2:28 PM } To: microscopy-at-sparc5.microscopy.com } Subject: Spiffy Freeware for H & E imaging } } ------------------------------------------------------------------------ } The Microscopy ListServer -- Sponsor: The Microscopy Society of America } To Subscribe/Unsubscribe -- Send Email to ListServer-at-MSA.Microscopy.Com } On-Line Help http://www.msa.microscopy.com/MicroscopyListserver/FAQ.html } -----------------------------------------------------------------------. } } } Hi Listers, } } I just found out about a spiffy new freeware called IrfanView (pronounced } earfan-view). } } We were having trouble capturing H&E colors using PhotoShop. I then heard } from the guy who does tech support for the RGB camera that we use about } IrfanView. It is GREAT! We capture our images and the colors are pretty } true. } } We haven't figured it all out yet, so we still use PhotoShop for other } stuff, but I recommend that you take a look at the program } } Go to www.irfanview.com } } Has anybody else used this software? What's your opinion? } } } Paula :-) } } p.s. I have no connection to this product I'm just a happy user. } } } Paula Sicurello } George Washington Univ. Medical Center } Dept. of Pathology, Ross Hall rm 505 } Electron Microscope Lab } 2300 Eye St. } Washington, DC 20037 } 202-994-2930 phone } 202-994-2518 fax }
This is a reminder of the New England Society for Microscopy evening meeting to be held at the Lexington Laboratories of Raytheon Corp., in Lexington, MA, on Tuesday March 12th. 2002, buffet supper at 6.00 p.m., scientific session 7:15 p.m.
Speakers will be:
John Thornton (Veeco Metrology Group) "Scanned Probe Microscopies: Applications and Innovations"
and
Eric Hudson (MIT Dept. of Physics) "Scanning Tunneling Microscopy: A Tool for Atomic Scale Measurement and Manipulation"
Abstracts and full meeting information, including travel directions, and other information about the society are available on the NESM Web Pages, at http://www.msa.microscopy.com/MSALAS/NESM/NESMHome.htm
All interested people are invited and will be welcome to attend. Preregistration is encouraged but not required.
Tony Garratt-Reed President-elect
** Anthony J. Garratt-Reed ** MIT Room # 13-1027 ** 77 Massachusetts Avenue ** Cambridge, MA 02139-4307 ** USA ** ** Phone: (+) 1-617-253-4622 ** Fax: (+) 1-617-258-6478 **
If I may chime in with a "me too". We also use Irfanview, and I recommend to our users who have PCs. There's a similar (but more developed and so more capable) program for Macs, "Graphic Converter" ( http://www.lemkesoft.com ). This one is shareware, $35, I think, which is cheap for what it does. GC also converts many proprietary image formats to standard formats, such as Bio-Rad pict or Gatan Digital Micrograph to whatever is desired. We use and recommend both.
Phil
} I also find Irfanview very useful, and use it as my default image } viewer. It is small and fast with a good number of facilities. Batch } conversion (and / or file renaming) from one format to another is } especially efficient. It displays, manipulates and saves a large } variety of image formats. Setting up a slideshow is quick. } Really useful software. } The freeware version is for home use, the author requests a } registration fee of 10 US dollars for non-personal use. } } (No connection with the author or program, just a satisfied user). } } } Jan Coetzee } Lab for Microscopy and Microanalysis } University of Pretoria, South Africa. } Tel: 012-420-2075, Fax 012-362-5150 } www.up.ac.za/academic/electron/emunit1.htm } } } } } Paula Sicurello wrote: } } } } ------------------------------------------------------------------------ } } The Microscopy ListServer -- Sponsor: The Microscopy Society of America } } To Subscribe/Unsubscribe -- Send Email to ListServer-at-MSA.Microscopy.Com } } On-Line Help http://www.msa.microscopy.com/MicroscopyListserver/FAQ.html } } -----------------------------------------------------------------------. } } } } Hi Listers, } } } } I just found out about a spiffy new freeware called IrfanView } } (pronounced earfan-view). } } } } We were having trouble capturing H&E colors using PhotoShop. I } } then heard from the guy who does tech support for the RGB camera } } that we use about IrfanView. It is GREAT! We capture our images } } and the colors are pretty true. } } } } We haven't figured it all out yet, so we still use PhotoShop for } } other stuff, but I recommend that you take a look at the program } } } } Go to www.irfanview.com } } } } Has anybody else used this software? What's your opinion? } } } } Paula :-) } } } } p.s. I have no connection to this product I'm just a happy user. } } } } Paula Sicurello } } George Washington Univ. Medical Center } } Dept. of Pathology, Ross Hall rm 505 } } Electron Microscope Lab } } 2300 Eye St. } } Washington, DC 20037 } } 202-994-2930 phone } } 202-994-2518 fax
-- Philip Oshel Supervisor, BBPIC microscopy facility Department of Animal Sciences University of Wisconsin 1675 Observatory Drive Madison, WI 53706 - 1284 voice: (608) 263-4162 fax: (608) 262-5157 (dept. fax)
IrfanView is great software. However, it is not new. It dates back to 1996, with continual upgrades. The current version is 3.61. You can get it from the IrfanView site or WinSite. WinSite is usually quicker. The "zip" file will fit on a floppy, it is amazingly small and powerful.
At the bottom of this response is the "about" file, which contains the supported file types.
JQuinn
PS: ........also no connection to Irfan, just a happy user!
} From Microscopy-request-at-sparc5.microscopy.com Tue Mar 5 02:52:24 2002 } Date: Mon, 04 Mar 2002 15:27:49 -0500 } From: "Paula Sicurello" {patpxs-at-gwumc.edu} } To: {microscopy-at-sparc5.microscopy.com} } Subject: Spiffy Freeware for H & E imaging } } ------------------------------------------------------------------------ } The Microscopy ListServer -- Sponsor: The Microscopy Society of America } To Subscribe/Unsubscribe -- Send Email to ListServer-at-MSA.Microscopy.Com } On-Line Help http://www.msa.microscopy.com/MicroscopyListserver/FAQ.html } -----------------------------------------------------------------------. } } } Hi Listers, } } I just found out about a spiffy new freeware called IrfanView (pronounced earfan-view). } } We were having trouble capturing H&E colors using PhotoShop. I then heard from the } guy who does tech support for the RGB camera that we use about IrfanView. It is GREAT! } We capture our images and the colors are pretty true. } } We haven't figured it all out yet, so we still use PhotoShop for other stuff, but } I recommend that you take a look at the program } } Go to www.irfanview.com } } Has anybody else used this software? What's your opinion? } } } Paula :-) } } p.s. I have no connection to this product I'm just a happy user. } } } Paula Sicurello } George Washington Univ. Medical Center } Dept. of Pathology, Ross Hall rm 505 } Electron Microscope Lab } 2300 Eye St. } Washington, DC 20037 } 202-994-2930 phone } 202-994-2518 fax } } ------------------------------------------------------------------------------- File : 'about.txt' - Info about IrfanView Author: Irfan Skiljan E-Mail: irfan-at-linux.tuwien.ac.at WWW : http://www.irfanview.com -------------------------------------------------------------------------------
What is IrfanView ?
IrfanView is a fast FREEWARE image viewer/converter for Win9x/NT, Windows 2000 and Windows XP.
Support for Apple QuickTime: allows IrfanView to read following formats: MOV, QTIF, Mac PICT, FLI/FLC.
Microsoft Media Player PlugIn: allows IrfanView to read following formats: ASF, AU/SND/AIF, AVI, DAT (VideoCD), MID/RMI, MOV, MP3, MPG/MPEG, WAV, WMA, WMF, etc.
Some features of IrfanView: Multi language support, Thumbnail option, preview option, slideshow, drag & drop support, fast directory view (fast moving through directory), batch conversion, email option, audio CD player, print option, change color depth, scan support, cut/crop, effects (sharpen, blur, Photoshop filter factory), capturing, extract icons from EXE/DLLs, lossless JPG rotation, many hotkeys, many command line options ...
IrfanView was the first Windows graphic viewer (worldwide) with Animated-GIF support !
FREEWARE for non commercial use !
Enjoy ! :-)
------------------------------------------------------------------------------- IrfanView software is provided "as-is". No warranty of any kind is expressed or implied. -------------------------------------------------------------------------------
Short Course ?Specific localisation methods and microscopy in Food Research.?
Sunday May 5th, 2002, 8:00 am - 6:00 PM Electron Microscopy Centre, McGill University Montréal, Québec, Canada
Sponsored by the Food Structure & Functionality Forum Division of the AOCS
Short Course Organizer: Marcel Paques, Wageningen Centre for Food Sciences / Unilever R&D Vlaardingen, The Netherlands
Spreadability, shelve life, fracture behaviour, and creaminess are examples of functional properties of food products. These properties originate from the microscopic structure of products. Specific localisation techniques and microscopy are powerful tools to facilitate intelligent modification of ingredient composition or processing to obtain targeted food product properties. The short course is aimed at R&D personnel in the Foods area (fundamental research, innovation, and product development). The course consists of lectures and an intensive hands-on practical section providing participants with sufficient basic knowledge and skills to set-up and implement the methods in their own work. Registered participants are encouraged to submit application-related questions to the instructors by email prior to the short. In addition a personal consultation is offered to each participant scheduled (by appointment) during the AOCS Annual Symposium 2002 in the days directly following the short course. Contact Marcel Paques at paques-at-nizo.nl with questions.
Programme topics include:
ˇ Pre-course consultation (by email) with participants to ensure the course content is relevant and applicable to participants? interests ˇ Introduction to specific localisation methods and principles ˇ Localisation strategies, marking options, and imaging approaches ˇ Experimental set-up, preparation and incubation procedures ˇ Demonstration examples ˇ Hands-on practical sessions ˇ Tailored help and advice during private consultation session following short course
Course contributors: Jan Leunissen (Aurion: immuno Gold Reagents & accessories, custom labeling, The Netherlands) Hong Yi (Emory Neurology Microscopy Core Laboratory, Emory University Department of Neurology, USA) Marcel Paques (Wageningen Centre for Food Sciences/Unilever Research Vlaardingen, The Netherlands) Registration Fee: $375. The registration fee includes complete course materials, continental breakfast, lunch, two refreshment breaks, and transportation to and from McGill University.
Space is limited so register online today! http://www.aocs.org/meetings/am2002/fscourse.htm
This electronic message is sent by NIZO food research to its business partner and may contain confidential information only to be used by the client. The contents may not be used by, copied or revealed to any other person than the addressee. In case this message was mistakenly addressed to you, please return the message to info-at-nizo.nl or call +31 (0)318 659 511
Dear Dr. Ding, If you have the instruction book that came with the S-4500, it should list the X and Y scan times for each of the scanning and photo speeds. The nature of the imaging of the SEM means that the scanning of the view or photo CRT and the scanning of the electron beam on the sample surface must be the same. The output signal of the secondary electron detector is continuous, modulated by the number of secondary electron that strike it, so the SEM's scan generator generates the raster of the electron beam on the sample surface and puts the secondary electron signal where it belongs on the viewing CRT. I hope this answers your question. At 06:02 PM 3/4/02 -0600, you wrote: } } Below is the result of your feedback form (NJZFM-ultra-55). It was } submitted by (w-ding-at-northwestern.edu) from } http://www.msa.microscopy.com/Ask-A-Microscopist.html on Monday, } March 4, 2002 at 17:17:11 } --------------------------------------------------------------------------- } } Email: w-ding-at-northwestern.edu } Name: Weiqiang Ding } } Organization: Northwestern univ } } Education: Graduate College } } Location: Evanston,IL, US } } Question: I am a user of Hitachi S 4500 SEM. } I want to know the relationship of the second electron detector } output signal and CRT display signal. As you know, the SEM has } different scan mode,including TV mode, and more slow modes. I want to } know the time for each line scan on CRT and also for whole frame } corresponding to the electron beam scan on sample. Is there any } relationship or simple equations for calculation. } } Thanks. } Regards, Mary
Mary Mager Electron Microscopist Metals and Materials Engineering University of British Columbia 6350 Stores Road Vancouver, B.C. V6T 1Z4 CANADA tel: 604-822-5648 e-mail: mager-at-interchange.ubc.ca
In discussing the location of the z-axis information yesterday I made a mistake, confusing a figure number for a note number. The Z-step size is the last (15th) value in the first line of the notes. the Z-start and z-stop are the 1st and 2nd values in the second note, respectively.
This info is presented in Image/J with the Edit/Info command after using the Bio-Rad plug-in.
Sorry, Glen -- Glen MacDonald Microscopy and Imaging Facility University of Washington Core for Communication Research Virginia Merrill Bloedel Hearing Research Center Box 357923 University of Washington Seattle, WA 98195-7923 glenmac-at-u.washington.edu (206) 616-4156 (206) 616-1828 fax ************************************************************************** C:} The box said "Requires Windows95 or better". So I bought a Macintosh. **************************************************************************
Hi all, I need to find someone who can fix an Oxford vibratome Model G. The motor appears to be running but the cutting motion isn't happening. Any suggestions for service would be greatly appreciated. thanks, Beth Richardson
********************************************************************** Beth Richardson EM Lab Coordinator Plant Biology Department University of Georgia Athens, GA 30602-7271
Phone - (706) 542-1790 & FAX - (706) 542-1805
"Between the two evils, I always pick the one I never tried before". Mae West (1893-1980) **********************************************************************
"And it's only the giving that makes you what you are". Wond'ring Aloud, Jethro Tull (Aqualung)
I am looking at the possibilities of using an environmental SEM equipped with a tensile stage to look at plant tissue and foodstuffs. At present none of the ESEMs in Australasia appear to have such a stage.
I would appreciate information on instruments elsewhere that we could use or alternatively the cost, and any technical difficulties, in the purchase or construction of a tensile stage to fit into an existing ESEM.
Currently I anticipate we will need access to a system in around 12 to 18 months.
Best
Ian
Ian Hallett HortResearch Mt Albert Research Centre Private Bag 92 169 Auckland, New Zealand Fax 64-9-815 4201 Telephone 64-9-815 4200 EMail ihallett-at-hortresearch.co.nz
______________________________________________________ The contents of this e-mail are privileged and/or confidential to the named recipient and are not to be used by any other person and/or organisation. If you have received this e-mail in error, please notify the sender and delete all material pertaining to this e-mail. ______________________________________________________
A colleague is considering purchasing a STIL (Sciences et Techniques Industrielle de la Lumiere) Micromeasure Multi Axes Measuring System and has asked for any opinions on the device.
It seems to be a cross between a confocal and SNOM system but doesn't have the resolution of either. The lower resolution is not an issue.
If anyone has had experience and or knowledge of this device, I (and my colleague) would appreciate some input.
Thank you in advance.
Colin Veitch
Instrumentation Scientist Late Stage Innovation Group CSIRO Textile and Fibre Technology PO Box 21, BELMONT, Vic. 3216. Australia.
The information contained in this e-mail message may be privileged or confidential information. If you are not an intended recipient, you may not copy, distribute or take any action in reliance on it. If you have received this message in error, please telephone CSIRO Textile and Fibre Technology on +61 3 5246 4000.
Hey guys, Greetings! Just looking through the discussions and although I am not too up on this discussion, I would like to invite you to view the QPm product by IATIA. It permits digital imaging through a 10 bit camera and bright field microscope and creates intensity free quantitative phase imaging, as well as virtual modalities of DF, DIC, Hoffman and Zerniky Phase contrast. This technique allows stain free and contrast enhances BF imaging and then the creation of DIC, and Phase contrast, etc.. You can measure much more accurately because of the exclusion of the halo effect on the fringes of the sample architecture. Also great for imaging facility since you can take an image and send through the net to a collogue or group of students to view and analyze. We call it a digital slide. Can explain more later if you wish. Thanks and best regards,
Roberto Casillas General Manager, Americas Region Iatia Group P.O. Box 1087 Salida, CA 95368 United States Tel (209) 545-4483 Fax (209) 545-4518 Mobile (209) 614-4135 Email rcasillas-at-iatia.com.au Website www.iatia.com.au This message and any files transmitted with it are confidential and are intended solely for the use of those persons to whom the message is addressed. If you have received this message in error, please destroy and delete this message from your computer. Any unauthorised form of reproduction of this message or any files transmitted with it is strictly prohibited. Iatia Group does not make any warranty concerning the accuracy of or security of any information electronically transmitted and disclaims all liability for the accuracy of or proper and complete transmission of any information contained or purportedly contained in this message, and for any delay in its receipt. If you have received this message in error, please notify: rcasillas-at-iatia.com.au
-----Original Message----- } From: Monson, Frederick C. [mailto:fmonson-at-wcupa.edu] Sent: Monday, March 04, 2002 9:58 AM To: 'dan-at-isaacson.net' Cc: 'List-Microscopy'
Hi Dan,
Differential Interference Contrast (DIC)! or barring that, phase coupled with timed-sequence photography or just a plain video camera. Normal cells get thru the process in under 30min.
Get on the net and query Google with the following: "mitosis university of washington".
Frederick C. Monson, PhD Center for Advanced Scientific Imaging West Chester University West Chester, Pennsylvania, USA, 19383 610-738-0437 fmonson-at-wcupa.edu
} ---------- } From: dan-at-isaacson.net } Sent: Saturday, March 2, 2002 10:42 AM } To: Microscopy-at-sparc5.microscopy.com } Subject: Ask-A-Microscopist:How to observe Cellular Mitosis? } } ------------------------------------------------------------------------ } The Microscopy ListServer -- Sponsor: The Microscopy Society of America } To Subscribe/Unsubscribe -- Send Email to ListServer-at-MSA.Microscopy.Com } On-Line Help http://www.msa.microscopy.com/MicroscopyListserver/FAQ.html } -----------------------------------------------------------------------. } } } Below is the result of your feedback form (NJZFM-ultra-55). It was } submitted by (dan-at-isaacson.net) from } http://www.msa.microscopy.com/Ask-A-Microscopist.html on Friday, } March 1, 2002 at 17:27:04 } ------------------------------------------------------------------------ -- } - } } Email: dan-at-isaacson.net } Name: Dan Isaacson } } Organization: Seattle Central Community College } } Education: Undergraduate College } } Location: Seattle, Washington } } Question: I live in Seattle and I was wondering what would be the } best place/microscope/technique to observe cellular mitosis. More } specifically I'm looking to observe the mitoic spindles through } interphase, prophase, prometaphase, metaphase, anaphase, and } telophase. Considering the size of spindles and the microtubule } fibers that connect to the chromosomes it may be very difficult to } observe. But any help you can give me would be greatly appriciated. } } Thanks, } Dan Isaacson } } ------------------------------------------------------------------------ -- } - } }
Silicon carbide papers generally are not very good at handling brittle materials that tend to crack during fine grinding and polishing. The SiC papers are typically made of a thick paper substrate that is irregular in shape with small undulations, even at the fine grit sizes. These tend to cause cracking of small, thin samples as you might have seen.
To reduce this type of cracking the use of abrasive films (plastic sheets with abrasive embedded in the surface) can help eliminate this effect and will give you a smoother, more uniform surface. This is especially critical in TEM applications where you are trying to thin the sample down. I would suggest using SiC abrasive films (plain backed) on a glass plate where you should see a marked improvement in the cracking problem you are experiencing. Polishing on a cloth (Nylon or Rayon) with 1 micron aluminum oxide after you thin the sample should give you a nice surface to finish the sample with, followed by whatever technique you are using. I might also suggest using a Tripod PolisherTM tool where you have close control of the load applied to the sample during the polishing process, this could also greatly improve your results.
I hope this helps and good luck.
Best Regards,
Shane Roberts South Bay Technology, Inc.
Note: South Bay Technology is a manufacturer of the Tripod PolisherTM and is a supplier of consumables.
Take a look at reticle.com (Klarmann Rulings. Inc)
It is a good source of information, even if they may not have the cover slips you need...
----- Original Message ----- } From: "Peter Van Osta" {pvosta-at-unionbio-eu.com} To: "MSA" {Microscopy-at-sparc5.microscopy.com} Sent: Tuesday, March 05, 2002 1:23 AM
on 2/4/02 5:21 PM, Jensen, Karen at Karen_Jensen-at-urmc.rochester.edu wrote: } } Dear Listers: } } I have been trying to image with negative stain, protein chains and protein } dimers with 2.0% Uranyl Acetate. It seems when I pipet onto the grid, } various dilutions (10-100x) of the buffered protein dimer sample, I get alot } of protein chain formation. I want the dimer form to stay in that } configuration-- not link up into chains. I am photographing at 100,000 } using 75 kv on a traditional Hitachi 7100 TEM. } } Does anyone out there work with these types of specimen? Is there a special } way to prep the grid, dry the grid, etc.? Should I use some other type of } grid besides the formvar/carbon coated copper grid? Should I sonicate the } specimen before I place the sample on the grid? } } Thanks for any help you can provide. } Dear Karen, UO2 is very acid, so maybe the buffering capacity of your sample is being overwhelmed, and the resulting low pH causes the chain formation. In that case, try a negative stain with a more neutral pH, such as NH4MoO4. The carbon on your grids may be hydrophyllic or hydrophobic depending on how fresh it is and whether it has been glow-discharged before use. This can greatly affect the behavior of the protein in a way which varies for different proteins, so must be determined for each case. Sonication could also do either harm or good depending on the properties of the individual protein (of course, heating due to the sonication will [almost] always be harmful). The answers to the questions in your second paragraph are all "yes". That is, special preparation may be required to get the appropriate value for a critical parameter so your protein remains dimer; try other types of grid, sonication, etc., to see the effects of varying parameters such as surface, pH, etc.. Cryo-preparation, followed by cryosubstitution or lyophyllization, might also be advantageous. Good luck. Yours, Bill Tivol
Where can I download this free software for non-comnercial use?
Regards,
Xianglin Li
Center for Advanced Material Department of Chemical Engineering University of Massachusetts, Lowell Xianglin_Li-at-student.uml.edu Tel: 978-934-3411
----- Original Message ----- } From: Jim Quinn {jquinn-at-www.matscieng.sunysb.edu}
Dear Karen,
Proteins are 'biochemical samples' and should be treated accordingly: - what is the protein concentration? -what ionic conditions for this protein and how you know that it's optimal for dimerization? - how you know that the chains formed during negative staining procedure? - and so on...
In general, protein's oligomerization depends from ionic conditions and concentration. You, probably better to use gel-filtration to see in which form your protein are. As soon as you know conditions for protein, determine optimal dilution for EM. I would recommend to use Valentine-technique: adsorb protein on the carbon film and then move it to the drop with staining solution. 2% UA is to much I think. 1% is very standard for proteins. You may try freshly prepared uranyl formiate if protein could not survive in UA. Mixing protein with staining solution is very bad idea I think. Good luck, Sergey
At 02:18 PM 3/5/02, you wrote: } ------------------------------------------------------------------------ } The Microscopy ListServer -- Sponsor: The Microscopy Society of America
_____________________________________
Sergey Ryazantsev Ph. D. Electron Microscopy UCLA School of Medicine Department of Biological Chemistry Box 951737 Los Angeles, CA 90095-1737
I have seen a product from the company "Cambridge Research & Instruments" (CRI) to visualize microtubuli. I believe it is called "spindleview" which enables viewing mitotic spindles, microtubuli, etc. You can have a look at their website:
http://www.cri-inc.com/
Best regards,
Peter
P.S. I have no commercial relation with CRI.
-- Dr. Peter Van Osta
Union Biometrica N.V./S.A. European Scientific Operations (ESO)
Cipalstraat 3 B-2440 Geel Belgium
tel.: +32 (0)14 570 619 fax.: +32 (0)14 570 621
http://www.unionbio.com/
====================================================== "Monson, Frederick C." wrote: } } ------------------------------------------------------------------------ } The Microscopy ListServer -- Sponsor: The Microscopy Society of America } To Subscribe/Unsubscribe -- Send Email to ListServer-at-MSA.Microscopy.Com } On-Line Help http://www.msa.microscopy.com/MicroscopyListserver/FAQ.html } -----------------------------------------------------------------------. } } Hi Dan, } } Differential Interference Contrast (DIC)! or barring that, phase coupled } with timed-sequence photography or just a plain video camera. Normal cells } get thru the process in under 30min. } } Get on the net and query Google with the following: "mitosis university of } washington". } } Look what I found in just a minute: } } http://www.science.smith.edu/departments/Biology/Bio112/mitosislab.html } } Regards, } } Fred Monson } } Frederick C. Monson, PhD } Center for Advanced Scientific Imaging } West Chester University } West Chester, Pennsylvania, USA, 19383 } 610-738-0437 } fmonson-at-wcupa.edu
In April last year I saw an ESEM at a research lab in Denmark that was equipped with a tensile stage, they were looking at wood. The system worked well in demos of wood fractures, I believe that they constructed it themselves.
I don't remember the name of the lab but our host for the User Group meeting, Lief Hoslet Christensen at Leif.H.Christensen-at-teknologisk.dk , will be able to tell you where he took us when we went walkabout during the meeting.
Regards
Tony
Tony Bruton Head, Centre for Electron Microscopy University of Natal, Pietermaritzburg Tel +27 (0) 33 260 5155 Fax +27 (0) 33 260 5776 website: www.nu.ac.za/microscopy.asp Email: bruton-at-nu.ac.za Postal address; Private Bag X01, Scottsville, 3209 KwaZulu-Natal South Africa
} } } "IAN HALLETT" {ihallett-at-hortresearch.co.nz} 03/06/02 12:17AM } } } ------------------------------------------------------------------------ The Microscopy ListServer -- Sponsor: The Microscopy Society of America
Dear All
I am looking at the possibilities of using an environmental SEM equipped with a tensile stage to look at plant tissue and foodstuffs. At present none of the ESEMs in Australasia appear to have such a stage.
I would appreciate information on instruments elsewhere that we could use or alternatively the cost, and any technical difficulties, in
the purchase or construction of a tensile stage to fit into an existing ESEM.
Currently I anticipate we will need access to a system in around 12 to 18 months.
Best
Ian
Ian Hallett HortResearch Mt Albert Research Centre Private Bag 92 169 Auckland, New Zealand Fax 64-9-815 4201 Telephone 64-9-815 4200 EMail ihallett-at-hortresearch.co.nz
______________________________________________________ The contents of this e-mail are privileged and/or confidential to the named recipient and are not to be used by any other person and/or organisation. If you have received this e-mail in error, please notify
the sender and delete all material pertaining to this e-mail. ______________________________________________________
There is a "Photo Conditions" set-up screen on the 4500 that will give you these conditions. Top row of buttons.
Peter Tomic Anadigics
-----Original Message----- } From: Mary Mager [mailto:mager-at-interchange.ubc.ca] Sent: Tuesday, March 05, 2002 12:26 PM To: w-ding-at-northwestern.edu Cc: Microscopy-at-sparc5.microscopy.com
Dear Dr. Ding, If you have the instruction book that came with the S-4500, it should list the X and Y scan times for each of the scanning and photo speeds. The nature of the imaging of the SEM means that the scanning of the view or photo CRT and the scanning of the electron beam on the sample surface must be the same. The output signal of the secondary electron detector is continuous, modulated by the number of secondary electron that strike it, so the SEM's scan generator generates the raster of the electron beam on the sample surface and puts the secondary electron signal where it belongs on the viewing CRT. I hope this answers your question. At 06:02 PM 3/4/02 -0600, you wrote: } } Below is the result of your feedback form (NJZFM-ultra-55). It was } submitted by (w-ding-at-northwestern.edu) from } http://www.msa.microscopy.com/Ask-A-Microscopist.html on Monday, } March 4, 2002 at 17:17:11 } --------------------------------------------------------------------------- } } Email: w-ding-at-northwestern.edu } Name: Weiqiang Ding } } Organization: Northwestern univ } } Education: Graduate College } } Location: Evanston,IL, US } } Question: I am a user of Hitachi S 4500 SEM. } I want to know the relationship of the second electron detector } output signal and CRT display signal. As you know, the SEM has } different scan mode,including TV mode, and more slow modes. I want to } know the time for each line scan on CRT and also for whole frame } corresponding to the electron beam scan on sample. Is there any } relationship or simple equations for calculation. } } Thanks. } Regards, Mary
Mary Mager Electron Microscopist Metals and Materials Engineering University of British Columbia 6350 Stores Road Vancouver, B.C. V6T 1Z4 CANADA tel: 604-822-5648 e-mail: mager-at-interchange.ubc.ca
I have a mid-level EM tech position open. The title is EM Tech, Senior.
Our laboratory is responsible for all the electron microscopy surgical pathology and diagnostic virology by EM for Duke Hospital. We have 5 techs who share the duties which include tissue processing and thin sectioning as well as fluid specimen preparation (e.g., cerebrospinal fluid, stool, urine) for the identification of viruses. We process over 1200 clinical specimens per year and do a modest amount of research microscopy. The new person would need to be proficient in electron microscopy and ultramicrotomy but could learn virus identification and tissue morphology on the job. If you are interested, please contact me off line for details.
Sara Miller
Sara E. Miller, Ph. D. P. O. Box 3712 Duke University Medical Center Durham, NC 27710 Ph: 919 684-3452 FAX: 919 684-3265
I am doing some work of XPS data interpretation. I met a problem that some peaks were overlapped there. I want to separate them and find out the information I need for each of them.
Somebody recommend me to use software DTSA, which could be used in SEM EDX analysis to dissolve the peaks. But I donĄŻt know how to import a XPS spectrum into DTSA.
Or, if somebody has some good idea of how to separate two or more overlapped peak, could you please share with me?
Thank you in advance!
Sincerely, Xianglin Li
Center for Advanced Material Department of Chemical Engineering University of Massachusetts, Lowell Xianglin_Li-at-student.uml.edu Tel: 978-934-3411
At 04:59 PM 03/04/2002 -0500, you wrote: } ------------------------------------------------------------------------ } The Microscopy ListServer -- Sponsor: The Microscopy Society of America
I tried the link that had been cited in the original post and it does appear to be dead. There was another link listed for Winsite. Instead, I tried a search for IrfanView and found several locations that offer it besides the home page. One is given below. It eventually led me to Tucows.com for the files.
http://www.ryansimmons.com/users/irfanview/
It will be nice to see the homepage back up, because I presume that it would be the source of more information
Warren
At 11:34 PM 3/5/02 -0500, you wrote:
} Hi JQuinn: } } Where can I download this free software for non-comnercial use? } } Regards, } } Xianglin Li } } Center for Advanced Material } Department of Chemical Engineering } University of Massachusetts, Lowell } Xianglin_Li-at-student.uml.edu } Tel: 978-934-3411
------------------------------------------- No files should be attached to this message ------------------------------------------- Warren E. Straszheim, Ph.D. Materials Analysis and Research Lab Iowa State University 23 Town Engineering Ames IA, 50011-3232
I'm back and digging for gold (information on pre-embed gold labelling that is) on adherent cells in culture. I have someone who wants to look for labelling in 3 areas, depending on the cell type (mutants, controls, knock-outs) all of which have a gfp worked into them. The label can be on either the plasma membrane surface, on the mitochodrial membrane surface, or floating around in the cytoplasm. What is the easiest and best way to pre-embed label for these babies?
I've done post embed labelling using LR White and the traditional ways of immuno, which we might try first. But I would like to know the best way to permeabilize the cells and maintain ultrastructure at the same time. I know there are nanoprobes and other tiny golds out there, I don't know if there are any pick your creature anti-gfp golds out there.
Any information you can pass my way will be greatly appreciated.
Mining for gold on the web,
Paula :-)
Paula Sicurello George Washington Univ. Medical Center Dept. of Pathology, Ross Hall rm 505 Electron Microscope Lab 2300 Eye St. Washington, DC 20037 202-994-2930 phone 202-994-2518 fax
Dear listers, Does anyone have recommendation for embedding cleared / stained* undecalcified bone stored in 100% glycerol in resin for LM and EM imaging. Rosemary
* alizarin red-bone + alcian blue (collagen) -- Rosemary Walsh, Manager The Electron Microscope Facility for the Life Sciences, A Shared Technology Facility, The Life Sciences Consortium 1 South FrearLab Penn State University University Park, PA 16802 (814) 865-0212 rw9-at-psu.edu http://www.lsc.psu.edu/stf/em/home.html
------------------------------------------------------------------------ The Microscopy ListServer -- Sponsor: The Microscopy Society of America
Listers, Does anyone in North America have a FEG-SEM with cryostage who could look at a couple of hydrated samples for us in the next week? We have tungsten filament and cryo but it doesn't do the job.
Debby
Debby Sherman Phone: 765-494-6666 Life Science Microscopy Facility FAX: 765-494-5896 Purdue University E-mail: dsherman-at-purdue.edu S-052 Whistler Building West Lafayette, IN 47907
by sparc5.microscopy.com (8.9.3+Sun/8.9.3) id QAA11399 for dist-Microscopy; Wed, 6 Mar 2002 16:35:26 -0600 (CST) Received: from njz_spm_filter (sparc5 [206.69.208.10]) by sparc5.microscopy.com (8.9.3+Sun/8.9.3) with SMTP id QAA11396 for "MicroscopyFilteredEmail1-at-msa.microscopy.com"; Wed, 6 Mar 2002 16:34:56 -0600 (CST) Received: from dogwood.botany.uga.edu (dogwood.botany.uga.edu [128.192.26.2]) by sparc5.microscopy.com (8.9.3+Sun/8.9.3) with ESMTP id QAA11389 for {microscopy-at-sparc5.microscopy.com} ; Wed, 6 Mar 2002 16:34:39 -0600 (CST) Received: from [128.192.26.25] (bot2625 [128.192.26.25]) by dogwood.botany.uga.edu (8.11.0/8.11.0) with ESMTP id g26MUSv03972 for {microscopy-at-msa.microscopy.com} ; Wed, 6 Mar 2002 17:30:28 -0500 Message-Id: {l0313031eb8ac71cafa6e-at-[128.192.26.25]} Mime-Version: 1.0 Content-Type: text/plain; charset="us-ascii"
Hi all, Special thanks to those who replied to my question about vibratome repair service. Thanks to y'all we have help. best regards, Beth
********************************************************************** Beth Richardson EM Lab Coordinator Plant Biology Department University of Georgia Athens, GA 30602-7271
Phone - (706) 542-1790 & FAX - (706) 542-1805
"Between the two evils, I always pick the one I never tried before". Mae West (1893-1980) **********************************************************************
"And it's only the giving that makes you what you are". Wond'ring Aloud, Jethro Tull (Aqualung)
No, this is not your dream job unless you are planning to come live in Honolulu anyway! It is a low-level (Research Associate II), half-time job in the Biological EM Facility. We may have enough for full-time soon, and for at least three years.
We are bascially looking for someone to help out the Facility Supervisor/Senior Tech/the only tech/(me) in this core facility. We have a LEO 912 EFTEM, a Hitachi S-800 FESEM, a Bio-Rad 1024 laser scanning confocal microsocpe, and we are purchasing an upright fluorescence compound microscope, a stereo zoom microscope, and a Magnafire SP digital camera, plus PC and Mac imaging stations. We train users, perform all tasks as a service, or any combination thereof.
Minimum qualifications include a BA or BS in biological science with coursework in cell biology. Any experience with light or electron microscopes is desireable, and I really would like to find someone with fluorescence experience.
I can supply the complete duties and qualifications upon request.
Aloha, Tina
**************************************************************************** * Tina (Weatherby) Carvalho * tina-at-pbrc.hawaii.edu * * Biological Electron Microscope Facility * (808) 956-6251 * * University of Hawaii at Manoa * http://www.pbrc.hawaii.edu/bemf* ****************************************************************************
You can import files into DTSA in the EMSA format mode. You can find that info at the EMMPDL software library. You will have to put your data in ASCII mode and put in the appropriate headers. That would not be difficult. There is a software analysis program available for XPS analysis that is not too expensive. It can be found at the following web site: http://www.xpsdata.com/ and is called "Spectral Data Processor".
-Scott
Scott D. Walck, Ph.D. PPG Industries, Inc. Glass Technology Center P. O. Box 11472 (letters) Guys Run Rd. (packages) Pittsburgh, PA 15238-0472
Walck-at-PPG.com
(412) 820-8651 (office) (412) 820-8515 (fax)
-----Original Message----- } From: Xianglin Li [mailto:Xianglin_Li-at-student.uml.edu] Sent: Wednesday, March 06, 2002 12:53 PM To: Microscopy-at-sparc5.microscopy.com
Hi, all,
I am doing some work of XPS data interpretation. I met a problem that some peaks were overlapped there. I want to separate them and find out the information I need for each of them.
Somebody recommend me to use software DTSA, which could be used in SEM EDX analysis to dissolve the peaks. But I donĄŻt know how to import a XPS spectrum into DTSA.
Or, if somebody has some good idea of how to separate two or more overlapped peak, could you please share with me?
Thank you in advance!
Sincerely, Xianglin Li
Center for Advanced Material Department of Chemical Engineering University of Massachusetts, Lowell Xianglin_Li-at-student.uml.edu Tel: 978-934-3411
Dr. Straszheim: the www.irfanview.com link worked for me (using Netscape Communicator 4.72). The site listed in your message is a mirror for the IrfanView site and looks and works just like the original. So you're not missing any information by using the link you found.
Warren E Straszheim wrote:
} ------------------------------------------------------------------------ } The Microscopy ListServer -- Sponsor: The Microscopy Society of America } To Subscribe/Unsubscribe -- Send Email to ListServer-at-MSA.Microscopy.Com } On-Line Help http://www.msa.microscopy.com/MicroscopyListserver/FAQ.html } -----------------------------------------------------------------------. } } I tried the link that had been cited in the original post and it does } appear to be dead. There was another link listed for Winsite. Instead, I } tried a search for IrfanView and found several locations that offer it } besides the home page. One is given below. It eventually led me to } Tucows.com for the files. } } http://www.ryansimmons.com/users/irfanview/ } } It will be nice to see the homepage back up, because I presume that it } would be the source of more information } } Warren } } At 11:34 PM 3/5/02 -0500, you wrote: } } } Hi JQuinn: } } } } Where can I download this free software for non-comnercial use? } } } } Regards, } } } } Xianglin Li } } } } Center for Advanced Material } } Department of Chemical Engineering } } University of Massachusetts, Lowell } } Xianglin_Li-at-student.uml.edu } } Tel: 978-934-3411 } } ------------------------------------------- } No files should be attached to this message } ------------------------------------------- } Warren E. Straszheim, Ph.D. } Materials Analysis and Research Lab } Iowa State University } 23 Town Engineering } Ames IA, 50011-3232 } } Ph: 515-294-8187 } FAX: 515-294-4563 } } E-Mail: wesaia-at-iastate.edu } Web: www.marl.iastate.edu } } Scanning electron microscopy, x-ray analysis, and image analysis of materials } Computer applications and networking
-- ~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~ Becky Holdford (r-holdford-at-ti.com) 972-995-2360 972-598-1291 (pager) SC Packaging FA Development Texas Instruments, Inc. Dallas, TX ~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~
Following the thread on ESEM with tensile stage, referred to by Tony Bruton
"In April last year I saw an ESEM at a research lab in Denmark that was equipped with a tensile stage, they were looking at wood. The system worked well in demos of wood fractures, I believe that they constructed it themselves. I don't remember the name of the lab but..."
The name of the lab is Risoe National Laboratory, Department of Materials Research. The tensile stage is indeed home built, in close collaboration between myself and Alan Heaver of Cambridge Engineering Dept., UK. We built the stage in 1995, and did indeed use it to look at tensile testing of wood (post fatigue damage in mahogany windmill wings together with Clare Hacker from the University of Bath). We also looked at bamboo and grasses, again tensile testing (with Ulrike Wegst, Cambridge Engineering).
The rig is still being used for in-situ tensile testing of a variety of materials that we do not want to carbon- or gold-coat because large deformations or cracks cause local peeling of the coating. The latest materials to be studied are high Tc superconducting tape (BSSCO in Ag) see:
A. Horsewell, B.F. Sřrensen & P. Skov-Hansen Materials Congress 2002, IoM, London, April 2002 "In-situ observation of crack formation in BSSCO tapes".
The original rig can also be use to produced 3-point bending and indentation, see: O. Jřrgensen & A. Horsewell (1997) Acta Mater., 45, 3431-3444 "On the indentation failure of carbon-epoxy crossply laminates, and its suppression by elasto-plastic interleaves".
What's more, a new rig was designed by myself and B. F. Sřrensen to do controlled crack growth experiments in brittle ceramics, again in-situ in the ESEM. See for example: Sřrensen, B.F. and Horsewell. A., (2001) J. Am. Ceram. Soc. 84 (9), 2051-2059 Crack growth along interfaces in porous ceramic layers.
I left the Risoe lab. 3 years ago to return to university teaching, at DTU Denmark, and still collaborate closely with Risoe. Current questions on the Risoe ESEM should be addressed to Jřrgen Bilde-Sřrensen.
Hope this information is useful. Regards,
Andy Horsewell Technical University of Denmark Materials & Process Technology Building 204 DK-2800 Lyngby, Denmark
Dear Listers, Anyone who can help me out here, could you please email me privately at - alexander.black-at-nuigalway.ie
I need to get two DiATOME ultramicrotomy, 45o 3mm knives sharpened, and would like to get as many quotes regarding cost (and time period) as possible, as they seem to vary. So, if you are in this area of expertise, please let me know!
Thanks
Alexander Black Department of Anatomy National University of Ireland, Galway Republic of Ireland
Ian Hallett wrote: I am looking at the possibilities of using an environmental SEM equipped with a tensile stage to look at plant tissue and foodstuffs. At present none of the ESEMs in Australasia appear to have such a stage. I would appreciate information on instruments elsewhere that we could use or alternatively the cost, and any technical difficulties, in the purchase or construction of a tensile stage to fit into an existing ESEM.
Tony Bruton answered: In April last year I saw an ESEM at a research lab in Denmark that was equipped with a tensile stage, they were looking at wood. The system worked well in demos of wood fractures, I believe that they constructed it themselves.
Hi Ian and Tony, It was the Materials Research Department at Risoe National Laboratory in Denmark that Tony visited last year. And yes, we do have a stage for in-situ stress-strain experiments in tension, compression or bending. The stage was developed and constructed in a collaboraton between our laboratory and the Engineering Department at University of Cambridge. The guy who knows most about this stage is out of town for the moment, but I will ask him to contact Ian for details when he comes back.
Best regards, Jorgen.
{:::} ¤ {:::} ¤ {:::} ¤ {:::} ¤ {:::} ¤ {:::}
Joergen B. Bilde-Soerensen Senior Research Scientist, Ph. D. Materials Research Department Risoe National Laboratory DK-4000 Roskilde Denmark
I believe GATAN is selling tensile stages for various types of microscopes, and I was told some of them have Peltier cooling sells, so that they could be used in ESEM. But I have not seen these stages at work.
Vladimir
Vladimir M. Dusevich, Ph.D. Electron Microscope Lab Manager 3127 School of Dentistry 650 E. 25th Street Kansas City, MO 64108-2784
} -----Original Message----- } From: IAN HALLETT [mailto:ihallett-at-hortresearch.co.nz] } Sent: Tuesday, March 05, 2002 4:17 PM } To: Microscopy-at-sparc5.microscopy.com } Subject: ESEM with tensile stage } } } -------------------------------------------------------------- } ---------- } The Microscopy ListServer -- Sponsor: The Microscopy Society } of America } To Subscribe/Unsubscribe -- Send Email to } ListServer-at-MSA.Microscopy.Com } On-Line Help } http://www.msa.microscopy.com/MicroscopyListserver/FAQ.html } -------------------------------------------------------------- } ---------. } } } Dear All } } I am looking at the possibilities of using an environmental SEM } equipped with a tensile stage to look at plant tissue and foodstuffs. } At present none of the ESEMs in Australasia appear to have such } a stage. } } I would appreciate information on instruments elsewhere that we } could use or alternatively the cost, and any technical } difficulties, in } the purchase or construction of a tensile stage to fit into an } existing ESEM. } } Currently I anticipate we will need access to a system in around 12 } to 18 months. } } } Best } } Ian } } } Ian Hallett } HortResearch } Mt Albert Research Centre } Private Bag 92 169 } Auckland, New Zealand } Fax 64-9-815 4201 } Telephone 64-9-815 4200 } EMail ihallett-at-hortresearch.co.nz } } } ______________________________________________________ } The contents of this e-mail are privileged and/or confidential to the } named recipient and are not to be used by any other person and/or } organisation. If you have received this e-mail in error, } please notify } the sender and delete all material pertaining to this e-mail. } ______________________________________________________ } }
The Electron Microscopy Core Facility at the University of Missouri is hosting a three-day workshop on immunogold techniques from May 13-15, 2002. Dr. Jan Luenissen from Aurion Immunogold Reagents & Accessories, an internationally known expert in the field, will be the instructor for the workshop. The workshop will include lectures, hands-on training, round table discussions, and presentations on applications. Also, participants of the workshop will be able to work on their own samples during the workshop. The workshop main curriculum is detailed below. If you are interested in attending or need more information about the workshop, please contact the workshop technical coordinator Hong Yi by phone (404-727-8692) or email (hyi-at-emory.edu).
MAIN CURRICULUM
The properties of gold particles and their protein conjugates. Theories underlying immunogold labeling protocols. Silver enhancement of gold particles Immunogold labeling on a variety of sample preparations for LM. Immunogold labeling for EM a. Pre-embedding immunogold labeling using ultrasmall gold conjugates and silver enhancement. b. Post-embedding immunogold labeling using conventional colloidal gold conjugates and ultrasmalll gold conjugates. Pre- and post-embedding double immunogold labeling. Background minimization in immunogold labeling Signal amplification in immunogold labeling.
Thanks and we hope to see you in Columbia!
Randy
Randy Tindall EM Specialist Electron Microscopy Core Facility W122 Veterinary Medicine University of Missouri Columbia, MO 65211 Tel: (573) 882-8304 Fax: (573) 884-5414 Email: tindallr-at-missouri.edu Web: http://www.biotech.missouri.edu/emc/
A stereology course approved by the International Society for Stereology will be held May 26-30, 2002 at Hawks Nest State Park, West Virginia, USA. The course will provide a practical and theoretical introduction to recent advances in stereolgy.
The price for full registration including course fee, materials, single-room accommodation, and all meals is US$1200.
The instructors are: HJG Gundersen, B Bakkenberg, JR Nyengaard, Karsten Nielsen, and Dallas Hyde.
See the website of the International Soceity for Stereology (http://www.stereologysociety.org) for more information or contact Jens Nyengaard (nyengaard-at-iekf.au.dk).
.
John M. Basgen Department of Pediatrics University of Minnesota Mayo Mail Code 491 420 Delaware Street SE Minneapolis, MN 55455 USA Phone: 612-625-7979 FAX: 612-626-2791 E-mail: basgen-at-umn.edu
I just tried my original URL: http://stud1.tuwien.ac.at/~e9227474/menu.html which worked, automatically linking to: http://irfanview.tuwien.ac.at/menu.html Also this URL workied: http://www.irfanview.com/
Phil
} I tried the link that had been cited in the original post and it } does appear to be dead. There was another link listed for Winsite. } Instead, I tried a search for IrfanView and found several locations } that offer it besides the home page. One is given below. It } eventually led me to Tucows.com for the files. } } http://www.ryansimmons.com/users/irfanview/ } } It will be nice to see the homepage back up, because I presume that } it would be the source of more information } } Warren } } At 11:34 PM 3/5/02 -0500, you wrote: } } } Hi JQuinn: } } } } Where can I download this free software for non-comnercial use? } } } } Regards, } } } } Xianglin Li } } } } Center for Advanced Material } } Department of Chemical Engineering } } University of Massachusetts, Lowell } } Xianglin_Li-at-student.uml.edu } } Tel: 978-934-3411 } } ------------------------------------------- } No files should be attached to this message } ------------------------------------------- } Warren E. Straszheim, Ph.D. } Materials Analysis and Research Lab } Iowa State University } 23 Town Engineering } Ames IA, 50011-3232 } } Ph: 515-294-8187 } FAX: 515-294-4563 } } E-Mail: wesaia-at-iastate.edu } Web: www.marl.iastate.edu } } Scanning electron microscopy, x-ray analysis, and image analysis of materials } Computer applications and networking
-- Philip Oshel Supervisor, BBPIC microscopy facility Department of Animal Sciences University of Wisconsin 1675 Observatory Drive Madison, WI 53706 - 1284 voice: (608) 263-4162 fax: (608) 262-5157 (dept. fax)
I can't get www.irfanview.com to load either, but it looks like http://irfanview.tuwien.ac.at/english.htm works and it's in the author's home country (Austria). It has links to multiple download sites.
Dave Harrison
On 6 Mar 2002 at 20:57, Becky Holdford wrote:
} Dr. Straszheim: the www.irfanview.com link worked for me (using Netscape } Communicator 4.72). The site listed in your message is a mirror for the } IrfanView site and looks and works just like the original. So you're not missing } any information by using the link you found.
} } Warren E Straszheim wrote: } } I tried the link that had been cited in the original post and it does } } appear to be dead. There was another link listed for Winsite. Instead, I } } tried a search for IrfanView and found several locations that offer it } } besides the home page. One is given below. It eventually led me to } } Tucows.com for the files.
Thanks to Becky and Phil for the replies. I was at least able to get through with IE 5.5 this morning to the regular site. It is still alive, but it was running slow. My guess is that the longer connection (to Europe) along with increased traffic (lots of microscopists checking out the program?) might lead to the slower (or broken) connection. I guess that is why mirror sites are setup in the first place.
Now to get around to checking out the program for myself...
Warren
At 08:57 PM 3/6/02 -0600, you wrote: } ------------------------------------------------------------------------ } The Microscopy ListServer -- Sponsor: The Microscopy Society of America
Listers: We need to be able to quantify the space *between* Ni grains in a metal film. Would grain size analysis software be able to handle this? Or would some other type of image analysis program be more useful? If this is a silly question, I apologize for my ignorance. I'm not familiar with the capabilities of either type of software.
-- ~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~ Becky Holdford (r-holdford-at-ti.com) 972-995-2360 972-598-1291 (pager) SC Packaging FA Development Texas Instruments, Inc. Dallas, TX ~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~
Dear Ian, We are just about to take delivery of a variable pressure SEM for tensile testing and three-point bending of epoxy-fibre composites. In this case we bought a VPSEM that fit the stage we built for this research four years ago. This stage was not easy or inexpensive to build. However, I remember that Deben of the UK (www.deben.co.uk) make a variety of tensile and bending stages and other accessories to fit in SEM's. They might be a good place to start. At 10:17 AM 3/6/02 +1200, you wrote:
} Dear All } } I am looking at the possibilities of using an environmental SEM } equipped with a tensile stage to look at plant tissue and foodstuffs. } At present none of the ESEMs in Australasia appear to have such } a stage. } } I would appreciate information on instruments elsewhere that we } could use or alternatively the cost, and any technical difficulties, in } the purchase or construction of a tensile stage to fit into an } existing ESEM. } } Currently I anticipate we will need access to a system in around 12 } to 18 months. } } } Best } } Ian Regards, Mary
Mary Mager Electron Microscopist Metals and Materials Engineering University of British Columbia 6350 Stores Road Vancouver, B.C. V6T 1Z4 CANADA tel: 604-822-5648 e-mail: mager-at-interchange.ubc.ca
I suppose it all depends on what you mean by "between". In my years of image analysis, I have seen many definitions for terms we use in everyday conversation, but without a clear idea of what we mean.
I could interpret your question as determining the nearest neighbor distance. I could also see approaching the issue by measuring grain size. I could also see estimating it by counting the number of grains in a given area. In many cases, the three approaches could give similar results, probably in the cases where there is a single mode to the size distribution. However, I can imagine some situations where the results would be quite different, for example, where smaller grains are found at the boundaries of much larger grains.
I have a few ideas of what algorithms might be applied and how. But I would be interested to hear what might be suggested by those who are directly involved with grain size analysis.
Warren
At 11:02 AM 3/7/02 -0600, Becky Holdford wrote:
} Listers: We need to be able to quantify the space *between* } Ni grains in a metal film. Would grain size analysis } software be able to handle this? Or would some other type of } image analysis program be more useful? If this is a silly } question, I apologize for my ignorance. I'm not familiar } with the capabilities of either type of software. } } -- } ~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~ } Becky Holdford (r-holdford-at-ti.com) } 972-995-2360 } 972-598-1291 (pager) } SC Packaging FA Development } Texas Instruments, Inc. } Dallas, TX } ~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~
Why do you want to look at a cleared and stained specimens with the electron microscope?
I don't think that these specimens can be prepared for EM and if they could, I don't think they could yield any useful information. Cleared and stained specimens are "cleared" by immersing them in a trypsin solution for several weeks and then by immersing them in a KOH solution. This process digests the soft tissue away so that the remnant muscle is transparent when immersed in glycerol. The purpose of this procedure is to be able to visualize the three dimensional relationships of the skeleton of small organisms such as fish, amphibians, and developing fetuses. Depending on the intensity of the treatment the specimens can easily fall apart and the individual bones while still demonstrating their shape are almost certainly decalcified. The KOH and trypsin should also destroy the ultrastructure of the bone and cartilage cells as well as significantly degrade the proteins in the matrix of these tissues. If the cellular structure of the tissues is destroyed, why would you want to look at specimen's prepared in this way with EM?
In my work on skeletal structure and ultrastructure in fishes I have fixed the tissue with a conventional Karnovsky fixative, decalcified with EDTA and post-fixed with osmium. I understand that some people think that citric acid is a better decalcifying agent, but I haven't seen a paper describing this technique yet. (it is also very important to remove all of the EDTA before post-fixing with osmium). Check out one of my papers J. Morph. 226:1-24 (1996) for further details
Bob Robert J. Schmitz Department of Biology University of Wisconsin Stevens Point Stevens Point, WI 54481 715-346-2420 Email: rschmitz-at-uwsp.edu http://biology.uwsp.edu/faculty/RSchmitz/home.html
} ---------- } From: Rosemary Walsh } Sent: Wednesday, March 6, 2002 5:09 PM } To: Microscopy-at-sparc5.microscopy.com } Subject: Embedding cleared undecalcified bone } } ------------------------------------------------------------------------ } The Microscopy ListServer -- Sponsor: The Microscopy Society of America } To Subscribe/Unsubscribe -- Send Email to ListServer-at-MSA.Microscopy.Com } On-Line Help http://www.msa.microscopy.com/MicroscopyListserver/FAQ.html } -----------------------------------------------------------------------. } } } Dear listers, } Does anyone have recommendation for embedding cleared / } stained* undecalcified bone stored in 100% glycerol in resin for LM } and EM imaging. } Rosemary } } * alizarin red-bone + alcian blue (collagen) } -- } Rosemary Walsh, Manager } The Electron Microscope Facility for the Life Sciences, } A Shared Technology Facility, The Life Sciences Consortium } 1 South FrearLab } Penn State University } University Park, PA 16802 } (814) 865-0212 } rw9-at-psu.edu } http://www.lsc.psu.edu/stf/em/home.html } } }
I'm looking for a cold cathode luminescence (CL) stage for personal use. Anyone have an obsolete, or presently unused Luminoscope or Technosyn unit they would like to sell? Of course, if you have a real junker that you would like to get rid of, let me know. I would be interested in rebuilding such an item.
Always try and send diamond knives for repolishing back to the manufacturer, since they made it originally by their polishing techniques which were developed for the specific diamond orientation that they think is best, a most important factor. It's not that the others will aways do a terrible job (but might), so the one who made it will likely do the best job. It might be a bit more expensive, but that money should be recouped through longer acceptable sectioning behaviour.
Tom } ---------- } From: Alexander Black } Sent: Thursday, March 07, 2002 7:20 AM } To: microscopy-at-sparc5.microscopy.com } Subject: DiATOME knife sharpening } } ------------------------------------------------------------------------ } The Microscopy ListServer -- Sponsor: The Microscopy Society of America } To Subscribe/Unsubscribe -- Send Email to ListServer-at-MSA.Microscopy.Com } On-Line Help http://www.msa.microscopy.com/MicroscopyListserver/FAQ.html } -----------------------------------------------------------------------. } } } Dear Listers, } Anyone who can help me out here, could you please email me privately } at - } alexander.black-at-nuigalway.ie } } } I need to get two DiATOME ultramicrotomy, 45o 3mm knives sharpened, and } would like to get as many quotes regarding cost (and } time period) as possible, as they seem to vary. So, if you are in this } area of expertise, please let me know! } } Thanks } } Alexander Black } Department of Anatomy } National University of Ireland, Galway } Republic of Ireland } }
Unless you have some really bizarre form of Ni film, you are talking about the interface between adjacent crystallites, called a grain boundary. Unfortunately, the conventionally accepted width of grain boundaries in metallic systems is of the order of 1 nm or less, too low even for a FE-SEM. So, could one take very high mag TEM images and subject same to image analysis? Not with much accuracy, as the boundary has to be exactly parallel to the electron beam or else geometric (tilt) effects will make it appear much wider.
It sounds as though you might have some form of very fine-grained Ni, perhaps even nanocrystalline in scale, say 2-20 nm, where there has been good evidence that the grain boundaries are wider, and thus constitute a significant volume fraction of the material. I'm not aware of any that used direct imaging and image analysis, because the above effect is even worse, since the grains may overlap in even the thinnest of TEM specimens. Check 'grain boundaries/nanocrystalline' in a search to see what methodology they used to estimate interface volume. Maybe projecting from atomic resolution imaging?
Tom
Dr. Tom Malis Group Leader - Characterization Materials Technology Laboratory Natural Resources Canada (Govt. of Canada) 568 Booth St., Ottawa, Canada K1A 0G1
ph. 613-992-2310 FAX 613-992-8735
email: malis-at-nrcan.gc.ca (currently on assignment as Science Advisor to DG/MTB, can be reached at 613-995-7358, same email)
} ---------- } From: Becky Holdford } Sent: Thursday, March 07, 2002 12:02 PM } To: Microscopy ListServer } Subject: need rceommendations for measuring space between grains } } ------------------------------------------------------------------------ } The Microscopy ListServer -- Sponsor: The Microscopy Society of America } To Subscribe/Unsubscribe -- Send Email to ListServer-at-MSA.Microscopy.Com } On-Line Help http://www.msa.microscopy.com/MicroscopyListserver/FAQ.html } -----------------------------------------------------------------------. } } } Listers: We need to be able to quantify the space *between* } Ni grains in a metal film. Would grain size analysis } software be able to handle this? Or would some other type of } image analysis program be more useful? If this is a silly } question, I apologize for my ignorance. I'm not familiar } with the capabilities of either type of software. } } -- } ~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~ } Becky Holdford (r-holdford-at-ti.com) } 972-995-2360 } 972-598-1291 (pager) } SC Packaging FA Development } Texas Instruments, Inc. } Dallas, TX } ~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~ } } }
One of our specialists is trying to build a cooled sample holder for an accelerator. He thinks that an old EDS dewar complete with coldfinger might be usable to make one. Anyone in the U.S. got an old one lying about? We would reimburse you for shipping and it wouldn't have to be packed the same way a working one would be shipped. Let me know. Thanks. Mike ******************************************************************** Michael L. Boucher Sr. mboucher-at-tc.umn.edu Lab Manager Rm 55 Office Ph 612-624-6590 I.T. Characterization Facility Rm 12 Main Off Ph 612-626-7594 University of MN Fax 612-625-5368 12 Shepherd Labs 100 Union Street S.E. Minneapolis, MN 55455 http://resolution.umn.edu ********************************************************************
I do have a really bizarre Ni film. I guess it's not really a film, but a electroless Ni deposited layer. This layer has a columnar form when seen in cross-section. Sometimes the plating process is not good and there are gaps between these columns which are visible from the top surface. The boss wants to know if there is some way of quantifying the area of the gaps.
I should have spelled this out more in my original post. My ignorance is really showing now.
"Malis, Tom" wrote:
} Unless you have some really bizarre form of Ni film, you are talking about } the interface between adjacent crystallites, called a grain boundary. } Unfortunately, the conventionally accepted width of grain boundaries in } metallic systems is of the order of 1 nm or less, too low even for a FE-SEM. } So, could one take very high mag TEM images and subject same to image } analysis? Not with much accuracy, as the boundary has to be exactly } parallel to the electron beam or else geometric (tilt) effects will make it } appear much wider. } } It sounds as though you might have some form of very fine-grained Ni, } perhaps even nanocrystalline in scale, say 2-20 nm, where there has been } good evidence that the grain boundaries are wider, and thus constitute a } significant volume fraction of the material. I'm not aware of any that used } direct imaging and image analysis, because the above effect is even worse, } since the grains may overlap in even the thinnest of TEM specimens. Check } 'grain boundaries/nanocrystalline' in a search to see what methodology they } used to estimate interface volume. Maybe projecting from atomic resolution } imaging? } } Tom } } Dr. Tom Malis } Group Leader - Characterization } Materials Technology Laboratory } Natural Resources Canada (Govt. of Canada) } 568 Booth St., Ottawa, Canada K1A 0G1 } } ph. 613-992-2310 } FAX 613-992-8735 } } email: malis-at-nrcan.gc.ca } (currently on assignment as Science Advisor to DG/MTB, can be reached at } 613-995-7358, same email) } } } ---------- } } From: Becky Holdford } } Sent: Thursday, March 07, 2002 12:02 PM } } To: Microscopy ListServer } } Subject: need rceommendations for measuring space between grains } } } } ------------------------------------------------------------------------ } } The Microscopy ListServer -- Sponsor: The Microscopy Society of America } } To Subscribe/Unsubscribe -- Send Email to ListServer-at-MSA.Microscopy.Com } } On-Line Help http://www.msa.microscopy.com/MicroscopyListserver/FAQ.html } } -----------------------------------------------------------------------. } } } } } } Listers: We need to be able to quantify the space *between* } } Ni grains in a metal film. Would grain size analysis } } software be able to handle this? Or would some other type of } } image analysis program be more useful? If this is a silly } } question, I apologize for my ignorance. I'm not familiar } } with the capabilities of either type of software. } } } } -- } } ~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~ } } Becky Holdford (r-holdford-at-ti.com) } } 972-995-2360 } } 972-598-1291 (pager) } } SC Packaging FA Development } } Texas Instruments, Inc. } } Dallas, TX } } ~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~ } } } } } }
-- ~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~ Becky Holdford (r-holdford-at-ti.com) 972-995-2360 972-598-1291 (pager) SC Packaging FA Development Texas Instruments, Inc. Dallas, TX ~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~
I worked with a similar porous columnar structure once. If you can differentiate the "gaps", i.e. porosity in your films from the grains, then you can do a simple point count which would give you the area fraction of porosity when viewed from the top. That would be a quantitative measure of the quality of the films. If you do not know how to do the stereological measurements, visit John Russ' tutorial website, http://www.reindeergraphics.com/tutorial/chap7/global01.html for the Image Processing Toolkit and Fovea Pro software. There are relatively simple statistical tests to determine how many areas you would have to sample. See his handbook which is also cited on the web site.
-Scott
Scott D. Walck, Ph.D. PPG Industries, Inc. Glass Technology Center P. O. Box 11472 (letters) Guys Run Rd. (packages) Pittsburgh, PA 15238-0472
Walck-at-PPG.com
(412) 820-8651 (office) (412) 820-8515 (fax)
-----Original Message----- } From: Becky Holdford [mailto:r-holdford-at-ti.com] Sent: Thursday, March 07, 2002 5:38 PM To: Malis, Tom Cc: Microscopy ListServer
I do have a really bizarre Ni film. I guess it's not really a film, but a electroless Ni deposited layer. This layer has a columnar form when seen in cross-section. Sometimes the plating process is not good and there are gaps between these columns which are visible from the top surface. The boss wants to know if there is some way of quantifying the area of the gaps.
I should have spelled this out more in my original post. My ignorance is really showing now.
"Malis, Tom" wrote:
} Unless you have some really bizarre form of Ni film, you are talking about } the interface between adjacent crystallites, called a grain boundary. } Unfortunately, the conventionally accepted width of grain boundaries in } metallic systems is of the order of 1 nm or less, too low even for a FE-SEM. } So, could one take very high mag TEM images and subject same to image } analysis? Not with much accuracy, as the boundary has to be exactly } parallel to the electron beam or else geometric (tilt) effects will make it } appear much wider. } } It sounds as though you might have some form of very fine-grained Ni, } perhaps even nanocrystalline in scale, say 2-20 nm, where there has been } good evidence that the grain boundaries are wider, and thus constitute a } significant volume fraction of the material. I'm not aware of any that used } direct imaging and image analysis, because the above effect is even worse, } since the grains may overlap in even the thinnest of TEM specimens. Check } 'grain boundaries/nanocrystalline' in a search to see what methodology they } used to estimate interface volume. Maybe projecting from atomic resolution } imaging? } } Tom } } Dr. Tom Malis } Group Leader - Characterization } Materials Technology Laboratory } Natural Resources Canada (Govt. of Canada) } 568 Booth St., Ottawa, Canada K1A 0G1 } } ph. 613-992-2310 } FAX 613-992-8735 } } email: malis-at-nrcan.gc.ca } (currently on assignment as Science Advisor to DG/MTB, can be reached at } 613-995-7358, same email) } } } ---------- } } From: Becky Holdford } } Sent: Thursday, March 07, 2002 12:02 PM } } To: Microscopy ListServer } } Subject: need rceommendations for measuring space between grains } } } } ------------------------------------------------------------------------ } } The Microscopy ListServer -- Sponsor: The Microscopy Society of America } } To Subscribe/Unsubscribe -- Send Email to ListServer-at-MSA.Microscopy.Com } } On-Line Help http://www.msa.microscopy.com/MicroscopyListserver/FAQ.html } } -----------------------------------------------------------------------. } } } } } } Listers: We need to be able to quantify the space *between* } } Ni grains in a metal film. Would grain size analysis } } software be able to handle this? Or would some other type of } } image analysis program be more useful? If this is a silly } } question, I apologize for my ignorance. I'm not familiar } } with the capabilities of either type of software. } } } } -- } } ~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~ } } Becky Holdford (r-holdford-at-ti.com) } } 972-995-2360 } } 972-598-1291 (pager) } } SC Packaging FA Development } } Texas Instruments, Inc. } } Dallas, TX } } ~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~ } } } } } }
-- ~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~ Becky Holdford (r-holdford-at-ti.com) 972-995-2360 972-598-1291 (pager) SC Packaging FA Development Texas Instruments, Inc. Dallas, TX ~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~
There is a web guide of available surface analysis software at the website of the UK ESCA Users Group at
http://www.uksaf.org/software.html
XPSPEAK 4.1 by Raymund Kwok is a free download and may help get you started.
Have fun,
John
John A. Rotole, Ph.D. Project Engineer Coatings & Surface Technology Ispat Inland Product Research 3001 E. Columbus Drive East Chicago, Indiana 46312 Tel: 219-399-6308 Fax: 219-399-6562
-----Original Message----- } From: Xianglin Li [mailto:Xianglin_Li-at-student.uml.edu] Sent: Wednesday, March 06, 2002 11:53 AM To: Microscopy-at-sparc5.microscopy.com
Hi, all,
I am doing some work of XPS data interpretation. I met a problem that some peaks were overlapped there. I want to separate them and find out the information I need for each of them.
Somebody recommend me to use software DTSA, which could be used in SEM EDX analysis to dissolve the peaks. But I donĄŻt know how to import a XPS spectrum into DTSA.
Or, if somebody has some good idea of how to separate two or more overlapped peak, could you please share with me?
Thank you in advance!
Sincerely, Xianglin Li
Center for Advanced Material Department of Chemical Engineering University of Massachusetts, Lowell Xianglin_Li-at-student.uml.edu Tel: 978-934-3411
I agree: as soon as you choose manufacturer, you, probably, should use their re-sharpening service. I don't think you may save $$ negotiating re-sharpening price, but you could ask them about exchange program when they offer to you brand new knife at the price of re-sharpening in exchange on your old one. The good things about this program, that you could change the knife type: exchange your 45o on new 35o or even on cryo and so on. It works for Diatome. Have no inmterest in Diatome, but happy user. Sergey
At 12:29 PM 3/7/02, you wrote: } ------------------------------------------------------------------------ } The Microscopy ListServer -- Sponsor: The Microscopy Society of America
_____________________________________
Sergey Ryazantsev Ph. D. Electron Microscopy UCLA School of Medicine Department of Biological Chemistry Box 951737 Los Angeles, CA 90095-1737
I am looking for GE bulb BEV for an Omega D5 microfilm point source. It is out of production and calls to a variety of sources have proved fruitless. If anyone can help please contact Dr. Rick Bizzoco at (619) 594-5396 or rbizzoco-at-sunstroke.sdsu.edu
What is your favorite method for treating glass slides for thick sections such that they can then be re-embedded? We re-embed by standing a polymerized BEEM block on top of the section with a drop of epoxy between the two. Without treating the slide first, it is often difficult to remove the newly joined section and block.
TIA
Rick A. Harris, Director Microscopy and Imaging Facility Section of Molecular and Cellular Biology 1241 Life Sciences Addition University of California Davis, CA 530 752 2914 530 754 7536 fax http://katie.ucdavis.edu raharris-at-ucdavis.edu
In a message dated 3/7/02 6:24:00 PM, walck-at-ppg.com writes:
} I worked with a similar porous columnar structure once. If you can differentiate } the "gaps", i.e. porosity in your films from the grains, then you can do } a simple point count which would give you the area fraction of porosity } when viewed from the top. That would be a quantitative measure of the } quality of the films. If you do not know how to do the stereological measurements, } visit John Russ' tutorial website, http://www.reindeergraphics.com/tutorial/chap7/global01.html } for the Image Processing Toolkit and Fovea Pro software. There are relatively } simple statistical tests to determine how many areas you would have to } sample. See his handbook which is also cited on the web site
Thanks for the plug, Scott. The biggest problem with structures like this is not the quantification of the image, but the sample prep. If the columns/grains/etc. are significantly different in hardness than the stuff in the gaps (or worse, if there is nothing in the gaps), then in sample preparation there tends to be some dragging of the material that changes the dimensions, usually making the gaps narrower in appearance than they really are. It is difficult to overcome this. Even ion beam milling can cause the effect.
If the structure that she has is similar to what I had, then the porosity between the columnar grains is about constant through the thickness of the deposited coating. We had a structure that you could see dark spaces between grains that appeared "star-like". We modified the chemistry of our films and the porosity closed up as the films got denser and you could see it in the SEM from the surface. No sample preparation was done. However, I never quantified the porosity from these images, but it could be observed qualitatively.
____ Thanks for the plug, Scott. The biggest problem with structures like this is not the quantification of the image, but the sample prep. If the columns/grains/etc. are significantly different in hardness than the stuff in the gaps (or worse, if there is nothing in the gaps), then in sample preparation there tends to be some dragging of the material that changes the dimensions, usually making the gaps narrower in appearance than they really are. It is difficult to overcome this. Even ion beam milling can cause the effect.
You could try the software "scion image" to see whether it works or not.
Xianglin
Center for Advanced Material Department of Chemical Engineering University of Massachusetts, Lowell Xianglin_Li-at-student.uml.edu Tel: 978-934-3411
----- Original Message ----- } From: Becky Holdford {r-holdford-at-ti.com}
------------------------------------------------------------------------ The Microscopy ListServer -- Sponsor: The Microscopy Society of America
Expand Your Universe on the Research Network.
Research Network is a job site devoted exclusively to professional Researchers and companies who need Researchers. It doesn't matter what industry you specialize in. Research Network encompasses a broad spectrum of industries and we continue to add more every day. For a comprehensive list of industries we work in like Pharmaceutical Research, Marketing Research, Clinical Research, Financial Research, Health Care Research, (to name a few), log on to http://www.researchnetwork.com and discover the infinite possibilities.
If your an Employer, stop wasting your valuable time by posting your jobs on generalized job sites that inundate you with inappropriate candidates. If your looking for Scientists, Project Managers, Analysts, Statisticians, Clinical Researchers, Engineers, Planners, Developers, Upper Level Management within a Research function, (to name a few), go to the source and get your research job posting in front of over 1/2 million researchers on our Network. Click on the link below to find the exact research talent you need.
http://www.researchnetwork.com/emplogin.cfm
If your a professional Researcher and wish to be considered for positions by employers on our network, click on the link below to join the network.
http://www.researchnetwork.com
Expand Your Universe
_______________________________________________________________________ Powered by List Builder To unsubscribe follow the link: http://lb.bcentral.com/ex/manage/subscriberprefs?customerid=20467&subid=60504F97CA27D6BC&msgnum=1
by sparc5.microscopy.com (8.9.3+Sun/8.9.3) id DAA16416 for dist-Microscopy; Fri, 8 Mar 2002 03:56:12 -0600 (CST) Received: from njz_spm_filter (sparc5 [206.69.208.10]) by sparc5.microscopy.com (8.9.3+Sun/8.9.3) with SMTP id DAA16413 for "MicroscopyFilteredEmail1-at-msa.microscopy.com"; Fri, 8 Mar 2002 03:55:42 -0600 (CST) Received: from unionbio-eu.com ([213.193.139.10]) by sparc5.microscopy.com (8.9.3+Sun/8.9.3) with SMTP id DAA16406 for {Microscopy-at-sparc5.microscopy.com} ; Fri, 8 Mar 2002 03:55:30 -0600 (CST) Received: (qmail 27891 invoked from network); 8 Mar 2002 09:46:46 -0000 Received: from linux-1.unionbio-eu.com (HELO unionbio-eu.com) (192.168.0.20) by server.unionbio-eu.com with SMTP; 8 Mar 2002 09:46:46 -0000 Sender: pvosta Message-ID: {3C888926.AA49351A-at-unionbio-eu.com}
Hi,
I agree that it mught be necessary to define the question more precise, but for measuring interdistances between "objects" in order to quantify the space *between* Ni grains in a metal film, there is an article which describes a method to analyze distances between neighbours.
The method can be applied to any field where "regular" patterns have to be detected, as long as the directional distribution of neighbours may be neglected.
J. M. Geusebroek, A. W. M. Smeulders, F. Cornelissen, and H. Geerts. Segmentation of tissue architecture by distance graph matching. Cytometry, 35(1):12-22, 1999.
Best regards,
Dr. Peter Van Osta
Union Biometrica N.V./S.A. European Scientific Operations (ESO)
Cipalstraat 3 B-2440 Geel Belgium
tel.: +32 (0)14 570 619 fax.: +32 (0)14 570 621
http://www.unionbio.com/
================================================================ Warren E Straszheim wrote: } } ------------------------------------------------------------------------ } The Microscopy ListServer -- Sponsor: The Microscopy Society of America } To Subscribe/Unsubscribe -- Send Email to ListServer-at-MSA.Microscopy.Com } On-Line Help http://www.msa.microscopy.com/MicroscopyListserver/FAQ.html } -----------------------------------------------------------------------. } } I suppose it all depends on what you mean by "between". In my years of } image analysis, I have seen many definitions for terms we use in everyday } conversation, but without a clear idea of what we mean. } } I could interpret your question as determining the nearest neighbor } distance. I could also see approaching the issue by measuring grain size. I } could also see estimating it by counting the number of grains in a given } area. In many cases, the three approaches could give similar results, } probably in the cases where there is a single mode to the size } distribution. However, I can imagine some situations where the results } would be quite different, for example, where smaller grains are found at } the boundaries of much larger grains. } } I have a few ideas of what algorithms might be applied and how. But I would } be interested to hear what might be suggested by those who are directly } involved with grain size analysis. } } Warren
a simpler way might be make up resin slides if you know in advance. You should be able to buy a mould from one of the e.m. suppliers.
We got one from Agar Scientific UK a few years ago although we've never had much need for it so I can't tell you how well it works.
Malcolm
PS My apologies to Nestor - I keep switching off my signature card to send to the list. But I don't think it turns off if a message is already composed so I keep getting bounced for attachments. I will try harder ..
Malcolm Haswell Electron Microscopy School of Sciences Fleming Building University of Sunderland SUNDERLAND SR1 3SD Tyne and Wear UK
Tel +44 (0)191 515 2872 e-mail: malcolm.haswell-at-sunderland.ac.uk
I have read that liquid nitrogen can be used to separate slides from blocks.
Dave
On Thu, 7 Mar 2002 16:05:32 -0800 Rick Harris {raharris-at-ucdavis.edu} wrote:
} ------------------------------------------------------------------------ } The Microscopy ListServer -- Sponsor: The Microscopy Society of America } To Subscribe/Unsubscribe -- Send Email to ListServer-at-MSA.Microscopy.Com } On-Line Help http://www.msa.microscopy.com/MicroscopyListserver/FAQ.html } -----------------------------------------------------------------------. } } } What is your favorite method for treating glass slides for thick sections } such that they can then be re-embedded? We re-embed by standing a } polymerized BEEM block on top of the section with a drop of epoxy between } the two. Without treating the slide first, it is often difficult to remove } the newly joined section and block. } } TIA } } Rick A. Harris, Director } Microscopy and Imaging Facility } Section of Molecular and Cellular Biology } 1241 Life Sciences Addition } University of California } Davis, CA } 530 752 2914 } 530 754 7536 fax } http://katie.ucdavis.edu } raharris-at-ucdavis.edu } }
---------------------------------------- Patton, David Email: David.Patton-at-uwe.ac.uk "University of the West of England"
Just a cautionary note, possibly only pertaining to digitally captured SEM images. I just began using this plug-in, figuring it would be much easier than accessing my spreadsheet values. I noticed out-of-the-gate, they were in disagreement.
The problem became obvious when I noticed the TIFF's pixel/inch (dpi) setting was incorrect. I believe the acquisition software failed to embed any resolution at all, and Photoshop assumed 72dpi. This would be wrong for this SEM, because the dpi setting implies a 14" wide image when the given magnification is for a 4by5 image. Therefore it would be important to know for what size image your SEM's mag is appropriate (is 4x5 still a standard size?), and make that change before applying the plug-in.
Works great! ... but I would apply the plugin to a new layer (so you can move the bar to a preferred location), or build your preferred type of micron bar based on it.
cheerios ... shAf :o) Avalon Peninsula, Newfoundland www.micro-investigations.com (in progress)
It looks like your gaps are big ehough, so you could try electroplating with Cu. After polishing out the Cu layer you (may be) could measure a size of the Cu islands in Ni.
Vladimir
Vladimir M. Dusevich, Ph.D. Electron Microscope Lab Manager 3127 School of Dentistry 650 E. 25th Street Kansas City, MO 64108-2784
} } I do have a really bizarre Ni film. I guess it's not really } a film, but a } electroless Ni deposited layer. } This layer has a columnar form when seen in cross-section. } Sometimes the } plating process is not } good and there are gaps between these columns which are } visible from the top } surface. } The boss wants to know if there is some way of quantifying } the area of the gaps. } } I should have spelled this out more in my original post. My } ignorance is really } showing now. }
The electroless plated Ni usually contains impurities such as P (5-15%), or even Teflon (~5-20%) for some purpose. If you could, TOF-SIMS is an alternative method to try. TOF-SIMS can directly "see" the elemental distribution on the very surface of sample with ~100nm resolution. Of course, sample needs to be polished so that the surface film does not give you wrong information. On SEM images, there are a lot of story on the boundary between the dark and the bright area (no matter what sample) and it depends on many many variables. I do not think you can exclude these artifacts from SEM imaging and get really true distance on SEM image if your goal is set on {100 nanometer level.
Thanks,
Zhiyu Wang
----- Original Message ----- } From: "Becky Holdford" {r-holdford-at-ti.com} To: "Malis, Tom" {malis-at-nrcan.gc.ca} Cc: "Microscopy ListServer" {microscopy-at-sparc5.microscopy.com} Sent: Thursday, March 07, 2002 10:38 PM
2002 MICROSCOPY TECHNICIAN SUMMER POSITION AVAILABLE
The Marine Biological Laboratory has a summer position available for 10 to 15 weeks (June, July, and August) for a microscopy oriented technician. We would like to attract someone with some knowledge of biological preparative techniques and experience in any of the following: laser scanning confocal microscopy, TEM, SEM, and/or LM.
The technician will assist in the Central Microscopy Facility. The technician's duties will be to check out incoming investigators in the usage of our equipment and then to supervise its continuing usage and to perform contract work for investigators. This may include fixation, embedding, sectioning, scope use, darkroom work, etc. The technician will also provide routine maintenance.
This is a short term and scientifically rewarding position. Salary will be in the $8 to $10/hour range. Housing may be available to rent through MBL.
For more information, including a more detailed position description, please contact Louis Kerr at: MBL, 7 MBL Street, Woods Hole, MA 02543. Telephone, 508-289-7273; or at Email: lkerr-at-mbl.edu.
Please apply to: Human Resources, MBL, 7 MBL Street, Woods Hole, MA 02543. or resume-at-mbl.edu.
You can visit our web site for online employment information and general information regarding the Marine Biological Laboratory - http://www.mbl.edu/
An Equal Opportunity/Affirmative Action Employer/ Non-smoking workplace.
I agree with the postings that recommend using the same knife maker for resharpening. I sent two Diatomes to be resharpened by another manufacturer and when the knives were returned they didn't wet properly and I had to send them back a 2nd time. I don't know if the problem has been resolved since I don't have them back, but that was a least 4 months without them. Fortunately, I had other knives to use and they sent a loaner to use in the meantime. Apparently, the two manufacturers use different wetting processes.
Hank Adams Core Manager Microscopy Facility Department of Molecular Genetics MD Anderson Cancer Center Houston, TX.
Good morning group- I am looking for an EDS program that can calculate a spectrum from a chemical composition. I know that DTSA does that calculation but it appears that the analyses must be entered one at a time. I'd like to enter data in batch from a spreadsheet. Any ideas on this?? thanks, scott
************************************************ ....amphiboles do violence to history... T. Feininger, 2001. (taken out of context) ****************************
Dr. Scott Kuehner kuehner-at-u.washington.edu Dept. of Geological Sciences ph.206-543-8393 Box 351310 Fax 206-616-6873 The University of Washington Seattle, Washington 98195-1310 ************************************************
------------------------------------------------------------------------ The Microscopy ListServer -- Sponsor: The Microscopy Society of America
Listers' We are searching for recent papers which use FEG-SEM or cryo FEG-SEM to image mammalian tissues....preferably cytoskeleton and even more preferably drosophila...but any tissue will do. I will be hitting the normal journals but do not expect to find a lot and, with the possibility that I might miss some, would appreciate your sending me any references you have readily at hand. This is to help convince a group of researchers, who use TEM but have no experience with SEM, that this instrumentation may be useful to them for their research. Most of our users are plant or materials people.
Many thanks, Debby
Debby Sherman Phone: 765-494-6666 Life Science Microscopy Facility FAX: 765-494-5896 Purdue University E-mail: dsherman-at-purdue.edu S-052 Whistler Building West Lafayette, IN 47907
by sparc5.microscopy.com (8.9.3+Sun/8.9.3) id KAA17399 for dist-Microscopy; Fri, 8 Mar 2002 10:43:09 -0600 (CST) Received: from njz_spm_filter (sparc5 [206.69.208.10]) by sparc5.microscopy.com (8.9.3+Sun/8.9.3) with SMTP id KAA17396 for "MicroscopyFilteredEmail1-at-msa.microscopy.com"; Fri, 8 Mar 2002 10:42:38 -0600 (CST) Received: from smtp05.retemail.es (smtp05.iddeo.es [62.81.186.15]) by sparc5.microscopy.com (8.9.3+Sun/8.9.3) with ESMTP id KAA17389 for {Microscopy-at-MSA.Microscopy.Com} ; Fri, 8 Mar 2002 10:42:26 -0600 (CST) Received: from GANESH.CMPCIENTIFICA ([80.224.104.29]) by smtp05.retemail.es (InterMail vM.5.01.03.02 201-253-122-118-102-20010403) with ESMTP id {20020308163815.RVJB1525.smtp05.retemail.es-at-GANESH.CMPCIENTIFICA} for {Microscopy-at-MSA.Microscopy.Com} ; Fri, 8 Mar 2002 17:38:15 +0100 Received: by GANESH with Internet Mail Service (5.5.2650.21) id {FKNBXTAZ} ; Fri, 8 Mar 2002 17:50:35 +0100 Message-ID: {706D62280CE7D411959A009027AC7EB012C602-at-GANESH}
Dear Colleague,
On behalf of the Organising Committee, I take great pleasure in announcing you the third "Trends in NanoTechnology" International Conference (TNT2002) which will be held in the City of Santiago de Compostela (Spain): September 09-13, 2002.The aim of TNT2002 is to focus on the applications of Nanotechnology by bringing together various groups working in this field from the USA, Japan and Europe. This year, a one day SRC/TNT Nanoelectronic workshop will be organised and be an integrated part of TNT conference. The workshop will be structured to encourage an active interchange of ideas among participants. Six major nanoelectronics themes have been identified, each of which will be addressed by a speaker from industry and a speaker from a university. - at this stage speakers from IBM, HP, Samsung or Intel already accepted to participate.
Full details available at: http://www.cmp-cientifica.com/TNT2002.html
Regards
Antonio
KEYNOTE LECTURES (confirmed): 1. Masakasu Aono (Riken, Japan), 2. Phaedon Avouris (IBM, USA), 3. Flemming Besenbacher (Aarhus University, Denmark), 4. Guillermo Bozzolo (NASA Glenn Research Center, USA), 5. George Bourianoff (Intel, USA), 6. Roberto Car (Princeton University, USA), 7. Ignacio Cirac (University of Innsbruck, Austria), 8. Dongmin Chen (Rowland Institute for Science, Cambridge, MA, USA), 9. Wonbong Choi (Samsung, Korea), 10. Harold Craighead (Cornell University, USA), 11. Supriyo Datta (Purdue University, USA), 12. Cees Dekker (Delft University, Netherlands), 13. Pedro Echenique (DIPC, Spain), 14. Andreas Engel (Basel University, Switzerland), 15. Leo Esaki (Shibaura Institute of Technology, Japan), 16. Fernando Flores (Universidad Autonoma de Madrid, Spain), 17. Harald Fuchs (Munster University, Germany), 18. Christoph Gerber (IBM, Switzerland), 19. James Gimzewski (UCLA, USA), 20. James Heath (UCLA, USA), 21. Christian Joachim (CEMES/CNRS, France), 22. Sajeev John (University of Toronto, Canada), 23. Dieter Kern (Tuebingen University, Germany), 24. Uzi Landman (Georgia Institute of Technology, USA), 25. Daniel Loss (Basel University, Switzerland), 26. Ramesh G. Mani (Harvard University, USA), 27. Neil D. Mathur (University of Cambridge, UK), 28. Meyya Meyyappan (NASA, USA), 29. Seizo Morita (Osaka University, Japan), 30. Rodolfo Miranda (Universidad Autónoma de Madrid, Spain), 31. Jan van Ruitenbeek (Leiden University, Netherlands), 32. Lars Samuelson (Lund University, Sweden), 33. Christian Schoenenberger (Basel University, Switzerland), 34. Ivan Schuller (University of California, USA), 35. Clivia Sotomayor Torres (Wuppertal University, Germany), 36. Christian Urbina (CEA-Saclay, France), 37. Luis Vina (Universidad Autonoma de Madrid, Spain), 38. Mark Welland (University of Cambridge, UK), 39. Stanley Williams (HP, USA)
Dr. Antonio CORREIA - Coordinator of the IST Nanoelectronics Network (PHANTOMS) CMP Cientifica S.L. Phone: +34 91 6407187 Fax: +34 91 6407186 mailto:antonio-at-cmp-cientifica.com WEB site: http://www.cmp-cientifica.com/ PHANTOMS WEB site: http://www.phantomsnet.com/
On PubMed you might want to search for some of the work of Keiichi Tanaka, who over the years has published some remarkable FEG-SEM of organelles inside cells. A recent example is: Tanaka K, Fukudome H, 1991, 3-Dimensional organization of the Golgi complex observed by scanning electron microscopy, J Electron Microsc Technique 17(1):15-23.
Kent
~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~ A. Kent Christensen, Professor Emeritus Department of Cell and Developmental Biology, Medical Science II Building University of Michigan Medical School, Ann Arbor, MI 48109-0616 Tel (work) (734) 763-1287, Fax (work) (734) 763-1166 akc-at-umich.edu http://www.umich.edu/~akc/ ~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~
--On Friday, March 08, 2002 11:05 AM -0500 Debby Sherman {dsherman-at-purdue.edu} wrote:
} Listers' } We are searching for recent papers which use FEG-SEM or cryo FEG-SEM } to image mammalian tissues....preferably cytoskeleton and even more } preferably drosophila...but any tissue will do. I will be hitting the } normal journals but do not expect to find a lot and, with the possibility } that I might miss some, would appreciate your sending me any references } you have readily at hand. This is to help convince a group of } researchers, who use TEM but have no experience with SEM, that this } instrumentation may be useful to them for their research. Most of our } users are plant or materials people. } } Many thanks, } Debby } } Debby Sherman Phone: 765-494-6666 } Life Science Microscopy Facility FAX: 765-494-5896 } Purdue University E-mail: dsherman-at-purdue.edu } S-052 Whistler Building } West Lafayette, IN 47907 }
We inherited an Edwards E306A vacuum evaporator awhile ago. Over the years, we have tried to get it going using suggestions from the list and particularly from Chris Smith (thanks, Chris!). Our in-house engineers and local electricians finally figured out that the rheostat module was not working. Of course that's the most expensive bit. We cannot afford to replace the whole coating unit but would like to try to repair the old one if possible.
My question: does anyone have a rheostat module for the E306A that they are willing to donate/sell? If so, please contact me offline with a price and other details.
Thanks in advance.
Paula.
Paula Allan-Wojtas Research Scientist - Food Microstructure Agriculture and Agri-Food Canada Atlantic Food and Horticulture Research Centre Kentville, Nova Scotia Canada B4N 1J5
Don Chernoff at "Small World" sells Electron Flight Simulator (windows pgm) which can construct a spectrum from a hypothetical matrix. The www link is not handy, but if you can't find it let me know. If memory serves, it is about $800.
Regards, Woody Woody White SEM-EDS-WDS McDermott Technology, Inc ------------------------- McDermott site: http://www.mtiresearch.com/ Personal site: http://woody.white.home.att.net
} -----Original Message----- } From: S. Kuehner [mailto:kuehner-at-u.washington.edu] } Sent: Friday, March 08, 2002 11:10 AM } To: microscopy-at-sparc5.microscopy.com } Subject: EDS software } } } -------------------------------------------------------------- } ---------- } The Microscopy ListServer -- Sponsor: The Microscopy Society } of America } To Subscribe/Unsubscribe -- Send Email to } ListServer-at-MSA.Microscopy.Com } On-Line Help } http://www.msa.microscopy.com/MicroscopyListserver/FAQ.html } -------------------------------------------------------------- } ---------. } } } } Good morning group- I am looking for an EDS program that can } calculate a } spectrum from a chemical composition. I know that DTSA does that } calculation but it appears that the analyses must be entered one at a } time. I'd like to enter data in batch from a spreadsheet. } Any ideas on } this?? thanks, scott } } ************************************************ } ....amphiboles do violence to history... } T. Feininger, 2001. (taken out of context) } **************************** } } Dr. Scott Kuehner kuehner-at-u.washington.edu } Dept. of Geological Sciences ph.206-543-8393 } Box 351310 Fax 206-616-6873 } The University of Washington } Seattle, Washington 98195-1310 } ************************************************ } }
So, the compressor on the cooling unit for our SEM conked out. Now I need to look into a replacement. Here are some details:
We were using a Neslab CFT-75 until it flaked out. The SEM is an ISI WB-6, a medium sized SEM. ISI called for 2 l/min, 20 C. The tech who told me the Neslab was toast said it was a 9000BTU/hr unit and was hardly working to keep up with the load. It was actually working constantly, these units run the compressor all the time and control the temp by using a hot gas bypass system to keep the temp = +/- 0.1 C.
I can repair the Neslab with a new compressor for about $1K. Still will have all the other old parts, pump, electronics etc., it is 20 years old, and a way over capacity unit for the job.
I can buy a new refrigerated unit, but not sure how low I can go on the BTU capacity. I am a cheapskate and would like to keep the cost as low as possible while still getting adequate cooling. I have looked around for different units and have found several sources and brands. Prices are from $2+K to $4K. Let me know if you have a preferred source I may have overlooked.
A real cheap way to go is a self-contained liquid to air cooling unit from McMaster-Carr. It is less than half the cost of the other recirculators, but it does not use a compressor for cooling. Kind of like an independent radiator and fan as found in your automobile.
I have another CFT-75 I have put on the ISI for now. It used to be used for a Denton VE. One thought I had was to keep the second CFT-75 on the SEM, better cooling, more controlled temp., etc. and get a cheapo cooling unit for the VE. Maybe the McMaster unit would handle the VE, after all, some DP's are simply air cooled. The heat load and temp. requirements for a simple VE aren't to strict, at least I don't think so. Denton only specified 200 cc/min. I cna't find any info. calling out the heat loads for the SEM or VE in BTU/hr terms.
Any brainiac heating/cooling experts want to put your 2 cents in?
Thanks
Jonathan Krupp Microscopy & Imaging Lab University of California Santa Cruz, CA 95064 (831) 459-2477 jmkrupp-at-cats.ucsc.edu
I am getting a number of emails where I am promised millions of Dollars. These emails seem to be connected with the list server as I have seen email addresses from other listers also in the header. Perhaps somebody is collecting email addresses from the postings. If you receive the same type of emails (its' usually someone in Nigeria who wants to transfer illicit money into the US and requires your help for a good chunk of the money), there is a web site that explains the whole scam.
http://home.rica.net/alphae/419coal/
Have a nice weekend, everybody.
mike
} } } } } } } } } } WE HAVE MOVED { { { { { { { { { please make a note of the new address below
Michael Bode, Ph.D. Soft Imaging System Corp. 12596 West Bayaud Avenue Suite 300 Lakewood, CO 80228 =================================== phone: (888) FIND SIS (303) 234-9270 fax: (303) 234-9271 email: mailto:info-at-soft-imaging.com web: http://www.soft-imaging.com ===================================
I am setting up an SEM lab for a Biology Dept. I have been advised that a Manual Critical Point Dryer is easier to maintain than the Automatic kind, and allows one to control the drying process more readily. But I have also heard that some specimens (insect?!?) can take hours rather than minutes to process, making the automatic CPD worth having for the Dept. Is this true?
Hello All, We are hoping to add a High Pressure Freezer instrument to our stable of techniques. We are looking for any and all feedback people might have in regards to the systems currently available on the market. Thanks in advance for your time,
Randy Nessler CMRF Associate Director University of Iowa Iowa City, IA 52242 Phone 319-335-8142 http://www.uiowa.edu/~cemrf
Greg Barclay wrote: ========================================================= I am setting up an SEM lab for a Biology Dept. I have been advised that a Manual Critical Point Dryer is easier to maintain than the Automatic kind, and allows one to control the drying process more readily. But I have also heard that some specimens (insect?!?) can take hours rather than minutes to process, making the automatic CPD worth having for the Dept. Is this true? ======================================================== I have never heard of anyone finding that an "automatic" was faster in that respect than a "manual" unit. After all, the same "physics" in terms of the exchange of the liquids is going to apply in either case.
Some models of "automatic" units come with "agitation" (which could lead to faster exchange times). I came out of the "old school" believing that this should all be done under conditions of laminar flow, and the desirability of having a large sight glass was in part to be able to confirm that indeed there was no turbulence and only laminar flow. Now am I wrong about this and that all of a sudden agitation (sort of the antithesis of laminar flow) is desirable? I would have thought that for fragile biological samples, for example, this would be potentially detrimental and at the least, would cause potential uncertainty in one's final results.
Disclaimer: Although our firm now offers both, I am myself interested in knowing the actual experience of others when comparing units with agitation vs. no agitation.
Chuck
============================================
Charles A. Garber, Ph. D. Ph: 1-610-436-5400 President 1-800-2424-SPI SPI SUPPLIES FAX: 1-610-436-5755 PO BOX 656 e-mail:cgarber-at-2spi.com West Chester, PA 19381-0656 USA Cust.Service: spi2spi-at-2spi.com
Look for us! ######################## WWW: http://www.2spi.com ######################## ============================================
Below is the result of your feedback form (NJZFM-ultra-55). It was submitted by (josvarelas-at-netscape.net) from http://www.msa.microscopy.com/Ask-A-Microscopist.html on Thursday, March 7, 2002 at 15:38:57 ---------------------------------------------------------------------------
Email: josvarelas-at-netscape.net Name: Joseph Varelas
Organization: Lockheed-Martin
Education: Undergraduate College
Location: Mountain View, CA
Question: How would I go about incorporating dimethyl sulfoxide (DMSO) into a fixation protocol for TEM? Do I use a percentage of the solvent in the fixative and subsequent buffer washes?
No spares, sorry, but mine, at least, has no rheostat, and I doubt that yours has, unless they changed it markedly for the US market..
Mine has a variable transformer to control the evaporation current, which is a much more practicable way to do it than a rheostat.
You should be able to buy a new one that will work OK from a local electrical supply house, it may not fit into where the original does but you could wire it external to the coater. I would guess that it would cost around $100, not that expensive, certainly cheaper than a new rotary pump or a new bell jar! I know because I broke my bell jar a little while back.
Have you priced a replacement one from Edwards?
It may be your best option.
cheers
rtch
} Date: Fri, 08 Mar 2002 14:28:52 -0500 } From: "Paula Allan-Wojtas" {AllanWojtasP-at-EM.AGR.CA} } To: {microscopy-at-sparc5.microscopy.com} } Subject: Parts for an old coating unit
} -------------------------------------------------------------------- } ---- The Microscopy ListServer -- Sponsor: The Microscopy Society } of America To Subscribe/Unsubscribe -- Send Email to } ListServer-at-MSA.Microscopy.Com On-Line Help } http://www.msa.microscopy.com/MicroscopyListserver/FAQ.html } -------------------------------------------------------------------- } ---. } } } Hi, all, } } We inherited an Edwards E306A vacuum evaporator awhile ago. Over the } years, we have tried to get it going using suggestions from the list } and particularly from Chris Smith (thanks, Chris!). Our in-house } engineers and local electricians finally figured out that the } rheostat module was not working. Of course that's the most expensive } bit. We cannot afford to replace the whole coating unit but would } like to try to repair the old one if possible. } } My question: does anyone have a rheostat module for the E306A that } they are willing to donate/sell? If so, please contact me offline } with a price and other details. } } Thanks in advance. } } Paula. } } } } Paula Allan-Wojtas } Research Scientist - Food Microstructure } Agriculture and Agri-Food Canada } Atlantic Food and Horticulture Research Centre } Kentville, Nova Scotia Canada B4N 1J5 } } Tel: (902) 679-5566 } FAX: (902) 679-2311 } } email: allanwojtasp-at-em.agr.ca } } Dr Ritchie Sims Phone : 64 9 3737599 ext 7713 Department of Geology Fax : 64 9 3737435 The University of Auckland email : r.sims-at-auckland.ac.nz Private Bag 92019 Auckland New Zealand
on 3/8/02 7:28 PM, Jon Krupp at jmkrupp-at-cats.ucsc.edu wrote: } } So, the compressor on the cooling unit for our SEM conked out. Now I need } to look into a replacement. Here are some details: } } We were using a Neslab CFT-75 until it flaked out. The SEM is an ISI WB-6, } a medium sized SEM. ISI called for 2 l/min, 20 C. The tech who told me the } Neslab was toast said it was a 9000BTU/hr unit and was hardly working to } keep up with the load. It was actually working constantly, these units run } the compressor all the time and control the temp by using a hot gas bypass } system to keep the temp = +/- 0.1 C. } } I can repair the Neslab with a new compressor for about $1K. Still will } have all the other old parts, pump, electronics etc., it is 20 years old, } and a way over capacity unit for the job. } Just as the old mechanical vacuum pumps on the HVEM have been working steadily for over 20 years, and the newer, direct-drive ones do not last nearly that long, I suspect the same will be true of your old cooling unit. My inclination would be to replace the compressor, and, of course, keep up preventive maintenance on the system. The hot-gas bypass is an excellent thermostabilizer, and, like many other pieces of equipment, running the unit continually under light load conditions is vastly easier on the components than any other regime.
} I can buy a new refrigerated unit, but not sure how low I can go on the BTU } capacity.
This can, of course, be calculated from the heat output of your SEM and the flow rate. Don't run a (say) 1 kBTU/hr unit at anywhere that heat flow, or it will wear out faster, fail to give good thermal stability, and be unable to cope with changes in the heat generated by the SEM, should anything go wrong. Replacing a smaller cooling unit every few years is a false economy. } } A real cheap way to go is a self-contained liquid to air cooling unit from } McMaster-Carr. It is less than half the cost of the other recirculators, } but it does not use a compressor for cooling. Kind of like an independent } radiator and fan as found in your automobile. } Does it give +/- 0.1 C? The more stable the temp, the better the images.
} I have another CFT-75 I have put on the ISI for now. It used to be used for } a Denton VE. One thought I had was to keep the second CFT-75 on the SEM, } better cooling, more controlled temp., etc. and get a cheapo cooling unit } for the VE. Maybe the McMaster unit would handle the VE, after all, some } DP's are simply air cooled. The heat load and temp. requirements for a } simple VE aren't to strict, at least I don't think so. Denton only } specified 200 cc/min. I cna't find any info. calling out the heat loads for } the SEM or VE in BTU/hr terms.
Perhaps the manufacturer or a service person would know the appropriate numbers. } } Any brainiac heating/cooling experts want to put your 2 cents in? } Done. Yours, Bill Tivol
Rheostat, potentiometer, and variable autotransformer are three different devices whose names are commonly (and incorrectly) interchanged.
As the other poster said, it is most likely a "variable autotransformer". You will need to confirm what is actually being used.
The most common failure mode for this device is a worn brush (contact).
Woody
--------------
} -----Original Message----- } From: Paula Allan-Wojtas [mailto:AllanWojtasP-at-EM.AGR.CA] } Sent: Friday, March 08, 2002 2:29 PM } To: microscopy-at-sparc5.microscopy.com } Subject: Parts for an old coating unit } } } -------------------------------------------------------------- } ---------- } The Microscopy ListServer -- Sponsor: The Microscopy Society } of America } To Subscribe/Unsubscribe -- Send Email to } ListServer-at-MSA.Microscopy.Com } On-Line Help } http://www.msa.microscopy.com/MicroscopyListserver/FAQ.html } -------------------------------------------------------------- } ---------. } } } Hi, all, } } We inherited an Edwards E306A vacuum evaporator awhile ago. } Over the years, we have tried to get it going using } suggestions from the list and particularly from Chris Smith } (thanks, Chris!). Our in-house engineers and local } electricians finally figured out that the rheostat module was } not working. Of course that's the most expensive bit. We } cannot afford to replace the whole coating unit but would } like to try to repair the old one if possible. } } My question: does anyone have a rheostat module for the E306A } that they are willing to donate/sell? If so, please contact } me offline with a price and other details. } } Thanks in advance. } } Paula. } } } } Paula Allan-Wojtas } Research Scientist - Food Microstructure } Agriculture and Agri-Food Canada } Atlantic Food and Horticulture Research Centre } Kentville, Nova Scotia Canada B4N 1J5 } } Tel: (902) 679-5566 } FAX: (902) 679-2311 } } email: allanwojtasp-at-em.agr.ca } }
Rick asked the following: } What is your favorite method for treating glass slides for thick sections } such that they can then be re-embedded? We re-embed by standing a } polymerized BEEM block on top of the section with a drop of epoxy between } the two. Without treating the slide first, it is often difficult to remove } the newly joined section and block. Rick, whenever our EM Lab has to re-embedding the "thick" section we use a BOJAK MOLD. This BOJAK MOLD was also used in our STAT Microwave technique. REF:The Journal of Histotechnology /Vol 21, No. 3 September 1998. The coverslip of the "thick" section must be removed first then the section is aligned with the area needed in thick section and epoxy is placed in well needed, slide is slid into place, where the section is, right over the epoxy well and then bojak mold with slide on top is placed in a 70oC oven overnight and in the AM is just popped off and area needed on thick section remains on the hardened epoxy block ready for thin sections. We also use this technique when TEM is needed and only an H&E slide is available and no tissue for EM.
wetting of a diamond knife is a common problem and not really related to the sharping process. it's a feature of diamonds tover glass they are hydrophobic by nature. it's one way of telling diamonds from glass. a trick i learned manu moons ago, i am sure will be lookded down on, is to wet your eyelash with a little salivia and run it along the edge of the knofe before filling the boat with water. if you just havn't finished eating lunch the boat water will remain free of contamination and the edge will wet nicely. john
} Rheostat, potentiometer, and variable autotransformer are three } different devices whose names are commonly (and incorrectly) } interchanged. } } As the other poster said, it is most likely a "variable } autotransformer". You will need to confirm what is actually being used. } } The most common failure mode for this device is a worn brush (contact). } } Woody
If it is one of the larger autotransformers (diameter greater than about six inches), it has an internal fuse underneath the black plastic plate on which the electrical connections are mounted. Burnout of this fuse is, in my experience, the usual cause of abrupt & 'quiet' failure. The wearout of the sliding contact will result in a long period of increasingly-erratic operation before failure; burnout of the winding will fill the lab with the odor of scorched insulation. If your fuse has blown, and you cannot find a replacement (I couldn't), just wire in an external fuse & holder, and jumper over the blown internal fuse. But its 'bad luck' to operate without any fuse.
These autotransformers are pretty much alike in their manufacture; any two units of the same physical size will have nearly the same power & current ratings. If you need a new unit, just match the size & the operating voltage (both things you can measure), and you needn't worry about discovering the other specs. The only 'strangeness' that you might run into is that a very few military surplus autotransformers were made for 400-Hz power; they won't do on 50/60-Hz power (without 'derating'). You can save big money buying these on the surplus market, but stay away from custom & military production items; the touchstone is that the unit should state on the connection plate its voltage, current, & frequency ratings. You're gambling on anything that is labelled with only a part number.
I have an LKB Ultrotome Nova. It needs a couple of minor repairs and is overdue for a general cleaning. Can anyone tell me who is still servicing LKB microtomes?
Thanks
Martin A. Levin Director of the Center for Educational Excellence (CEE) and Professor of Biology Eastern Connecticut State University J. Eugene Smith Library, Room 431 Willimantic, Connecticut 06226 (860)465-5589/4324 FAX (860)465-5522/5213 Email: levin-at-easternct.edu
WANTED: We are hoping to keep our old Philips 300 operational. To do so we need a conversion kit to remove the Mercury Pump. If anyone knows of a kit that's available or possibly an entire Hg-less EM300 please let me know. Thank you, bob Bob Harris NSERC Regional STEM Facility Dep't of Microbiology University of Guelph Guelph Ontario Canada N1G 2W1 Phone: 519-824-4120 ext 6409 Fax: 519-837-1802
I was given this address as a source for EM information, but I am not trained in EM _at all_...so please forgive what may be basic questions:
1. What is the procedure used for taking EM pictures of poliovirus (RNA virus)? 2. Is it possible to calibrate the number of genomes (capsulated RNA viruses as well as free floating RNA) in a known aliquot of virus dilution? 3. Is it difficult to recognize poliovirus RNA in its capsulated and free floating forms in an EM picture?
Our lab is trying to find the number of genomes of poliovirus in a stock solution of 10^8 TCID50/1ml. Any help or advice I could get would be greatly appreciated!!
Thanks, Christina Chan -- LSRA - Lab Manager Maldonado Lab Pediatrics, Infectious Disease Stanford University Medical Center lab: (650) 736-1310 cell: (650) 996-0098
I have an older SWIFT 960 Ser. straight microscope, that i do not know anything about, it has a #822941 on scope, the eyepiece has 10x on it but the objectives that screw into the turret have no numbers on them, their is only 2 objectives, the third is open, i am going to sell the scope but i do not know how to describe the magnifications. can anyone help me with this problem? TIA Harold
When I built my own vacuum evaporator system, I was using standard laboratory 'variable autotransformer' and another standard two-coils power transformer. Autotransformer powered the primary 'coil' of the transformer. Secondary coil (100A max) is connected to the evaporation device. I got autotransformer from the our university 'junk-yard' and got power transformer for $20 from some electrical supplier. Autotransformer is 4.5" dia and fuse is 12A. Perhaps, your system utilized the same two-transformer design (very popular in the past). If so, it's very unlikely that power transformer is fail and as mentioned other colleagues, you may replace 'variable autotransformer' using any kind with suitable characteristics... If you need details, you could contact me off-line. Sergey
At 05:55 AM 3/11/02, you wrote: } ------------------------------------------------------------------------ } The Microscopy ListServer -- Sponsor: The Microscopy Society of America
_____________________________________
Sergey Ryazantsev Ph. D. Electron Microscopy UCLA School of Medicine Department of Biological Chemistry Box 951737 Los Angeles, CA 90095-1737
Thanks to those who responded. Included in this email are helpful comments from Mark P. Running, Fred Monson and Tamara Howard. We are using a bioslicer and have had some success with inflorescences embedded in 7% agarose. Rosemary
} I am familiar with the technique and met the woman who invented it at a } Keystone meeting last year. I'm quite certain she'd be happy to answer } any questions directly; her name is Hinanit Koltai, and her email is } hinanit_koltai-at-ncsu.edu. If I recall she was aiming for sections of } 40-100 um thickness, but used a standard paraffin microtome. I'm not sure } if you have the full reference for the protocol, but it is: Hinanit Koltai } and David McKenzie Bird (2000). High Throughput Cellular Localization of } Specific Plant mRNAs by Liquid-Phase in Situ Reverse } Transcription-Polymerase Chain Reaction of Tissue Sections. Plant } Physiol. 123: 1203-1212. } } While it is rapid, there is some concern that this technique shows overly } broad expression patterns when compared to traditional in situs on fine } sectioned tissue. } } Hope this helps. } } Mark P. Running, Ph.D. } Assistant Member, Principal Investigator } Donald Danforth Plant Sciences Center } 975 N Warson Rd } Saint Louis MO 63132 } Phone(314) 587-1641 } Cell(314)359-9344 } Fax(314) 587-1741 } mrunning-at-danforthcenter.org Hi Rosemary, As many times as I have been called to a cryostat to help with a problem with variable section thicknesses forces me to respond to your query. In almost every case, the problem was relieved by increasing the stability of the specimen-block axis. That is, tightening up the vices and holders. In one case, I removed the microtome, which had not been cleaned for years and cleaned and oiled it with low-Temp oil. On that microtome, much was loose, including the bearings on the vertical support of the specimen arm. I even tightened the specimen arm a little after trying the sectioning. Most of the time, if the microtome has been used regularly, and the operator is practiced, there is something about the mount. Now about the agarose. It's an interesting choice, and I understand it for the purpose, but it creates a very fragile gel. I am led to ask a couple questions. 1. Any chance to query the publisher of the method for the specifics of his/her system. Knife? Cryostat? 2. What kind of knife are you using? If you are using a disposable, you might find a hollow-ground non-disposable knife better. I have used these in the past to section specimens embedded in 1-4% acrylamide gels and have been pleased with the results. The downside, of course, is that the knife dulls more quickly that non-hollow ground edges. 3. Another thing is that users tend to take a chunk of embedded (tissue and just 'glue' it to the specimen mount on the cryotome holder. Sometimes, the sequence leaves the specimen unstable, and there is a requirement to change the method by which the specimen is attached. I don't know what prohibitions there are at this point, but a rectangular block of agarose frozen to a stub with water will NOT provide the kind of stability for the block that is normally recommended. 4. Finally, the 40um section suggests that for each sectioning stroke there is a collision of the knife edge with the block. Frozen will be OK, but on the edge of the thaw would be better. For sections that thick, I would be running the cryostat at -10 or -8. Also, I would permit the block lots of time - 2hr - to come to equilibrium with the chamber temperature. You might also want to consider using a sledge microtome, because there are two knife approach angles to set. The sectioning stroke brings the knife in a slicing motion through the specimen, and both angles are variable. Frederick C. Monson, PhD Center for Advanced Scientific Imaging West Chester University West Chester, Pennsylvania, USA, 19383 610-738-0437 fmonson-at-wcupa.edu
Is is probably a protocol for a vibratome...if you don't have access to one, maybe make sections by hand? You can get those rodent brain slicing molds (they have little grooves for the blade to go in at set distances apart) from the EM supply companies, or do the homemade version several ways - quick and dirty would be to attach several sharp blades at set distances on a handle of some kind. I've seen homemade choppers of several double-edge blades broken in 2, taped to a heavy stick with spacers in between each blade. Then just cut as usual. Or go fancier - someone showed me a homemade chopper that was pretty much a mini-hand-vibratome....they had a micrometer advance thingy (there is a word for this but my memory is toast) hooked up on a sort of a seesaw over a pivot point, with the blade on the other end of the seesaw, such that you could put this gizmo down on a surface (wax) with your piece of tissue under the blade, rock the blade down and make a cut, then advance the blade using the micrometer thingy a defined distance, cut again, etc. Good luck! Tamara Howard Department of Cell Biology and Physiology University of New Mexico - Health Sciences Center Albuquerque, NM 87131 thoward-at-unm.edu
} Date: Mon, 11 Mar 2002 16:47:49 -0600 (CST) } To: Zaluzec-at-sparc5.microscopy.com } From: michelbruneau-at-hotmail.com () } Subject: Ask-A-Microscopist } Status: } } Below is the result of your feedback form (NJZFM-ultra-55). It was } submitted by (michelbruneau-at-hotmail.com) from } http://www.msa.microscopy.com/Ask-A-Microscopist.html on Monday, } March 11, 2002 at 16:47:48 } --------------------------------------------------------------------------- } } Email: michelbruneau-at-hotmail.com } Name: michel bruneau } } Organization: high school } } Education: 9-12th Grade High School } } Location: Canada } } Question: I am a high school science teacher. I require either a } website or a protocol to have high school kids be able to make } permanent mount glass slides for the old fashion microscope in orcer } to create a permanent collection for the school. All I have found } so far is wet mount slides which is not the type I require. Any } suggestion would be helpful. Thanks. } Mike } michelbruneau-at-hotmail.com } } --------------------------------------------------------------------------- }
Have a colleague that is in the process of setting up a lab and is in the need of an used inverted microscope. Any person or company that may have one please respond to this list or to me and I will forward all.
I asked the list for information on the resistance of nitrile gloves to unpolymerized embedding media; I got no response. Anyone with an interest in their resistance to other chemicals will find a useful table at http://www.cdc.gov/od/ohs/manual/pprotect.htm
Caroline Schooley Project MICRO Coordinator Microscopy Society of America Box 117, 45301 Caspar Point Road Caspar, CA 95420 Phone/FAX (707)964-9460 Project MICRO: http://www.msa.microscopy.com/ProjectMicro/PMHomePage.html Intertidal invertebrates: http://www.fortbragg.k12.ca.us/AG/marinelab.html
I am overwhelmed by all the responses and helpful information which you sent - thanks! I am presently trying to arrange some time with the person who spent the most time trying to repair it to go through your replies. The first contact we had when we tried to enquire about buying the variable transformer (yes, that was what I meant) was that the part was way out of our price range, and that it might not be available any longer because the unit was so old. It was nice to hear that we can use "generic" parts which are relatively inexpensive.
Yes I have schematics for the unit. I will see what we can do with the resources you have provided, and if we have additional problems or questions, we will contact those of you who have offered.
Wish us luck!
Thanks again.
Paula.
Paula Allan-Wojtas Research Scientist - Food Microstructure Agriculture and Agri-Food Canada Atlantic Food and Horticulture Research Centre Kentville, Nova Scotia Canada B4N 1J5
We have an operational, Series 1, JEOL 100CX, with STEM attachments and an operating,but barely, JEOL 35C that will be decommissioned in the near future and are available. If you are interested please contact me directly. bob Bob Harris NSERC Regional STEM Facility Dep't of Microbiology University of Guelph Guelph Ontario Canada N1G 2W1 Phone: 519-824-4120 ext 6409 Fax: 519-837-1802
Greetings, I am interested in refurbishing some of the mechanical components in one of our Zeiss Axiovert 100 microscopes. The focusing mechanism has taken some abuse through the years and it appears that a savage managed to strip some teeth on the focusing rack. I would like to replace the brass rack, and the coarse/fine focus spindle. Our fine focus is manipulated using a motorized z-control-it appears that the fine focus is coupled to the course focus gearing through a ball bearing friction mechanism. This mechanism slips-I would be interested in replacing it with a planetary gear assembly for better z-control precision/repeatability if I could find the parts. If this proves to be unpractical I will be interested in simply replacing/tuning the assembly. The Zeiss Axiovert 100 is a discontinued microscope base, and I have been reassured by our sales rep that parts are available, however I have had little success getting any quotes or getting a call-back from a service rep over the past couple of months. I would like to find out if any resources for obtaining remanufactured (cannibalized), new but discontinued, or third party engineered (or re engineered) parts for Zeiss microscopes. I would be interested in hearing from independent microscope service engineers who work with Zeiss products as well. Thanks in advance for your kind assistance. Sincerely, Karl G.
_______________________________________________ Karl Garsha Light Microscopy Specialist Imaging Technology Group Beckman Institute for Advanced Science and Technology University of Illiniois at Urbana-Champaign 405 North Mathews Avenue Urbana, IL 61801 Room B650J Tel: (217) 244-6292 Fax: (217) 244-6219 www.itg.uiuc.edu
Does anyone still have manuals for the old Edwards Model EPTD 3 "tissue dryer" freeze-dryer? We've just scavenge one, but need to find a copy of the manual(s).
Thanks!
Phil -- Philip Oshel Supervisor, BBPIC microscopy facility Department of Animal Sciences University of Wisconsin 1675 Observatory Drive Madison, WI 53706 - 1284 voice: (608) 263-4162 fax: (608) 262-5157 (dept. fax)
Another request: does anyone have service manuals (not operator -we've got that) for the old H-Nu EDX system? And -- I hope I hope -- copies of the System 5000, version 3.7 software on 3.5" floppies?
Thanks again!
Phil -- Philip Oshel Supervisor, BBPIC microscopy facility Department of Animal Sciences University of Wisconsin 1675 Observatory Drive Madison, WI 53706 - 1284 voice: (608) 263-4162 fax: (608) 262-5157 (dept. fax)
} } Email: michelbruneau-at-hotmail.com } } Name: michel bruneau } } } } Organization: high school } } } } Education: 9-12th Grade High School } } } } Location: Canada } } } } Question: I am a high school science teacher. I require either a } } website or a protocol to have high school kids be able to make } } permanent mount glass slides for the old fashion microscope in orcer } } to create a permanent collection for the school. All I have found } } so far is wet mount slides which is not the type I require. Any } } suggestion would be helpful. Thanks. } } Mike } } michelbruneau-at-hotmail.com } } } } --------------------------------------------------------------------------- Mike - -
If you're hoping for fixed, sectioned, stained mammalian tissues, that will probably be beyond your students' capabilities. If you want whole mounts of things like insect wings, diatoms, etc., that's possible. I suggest that you get a copy of: ----------------------- Nachtigall, W. 1995 Exploring With the Microscope 160 pp. hardbound. 6.5x9.5". $19.95. ISBN 0-8069-0866-1 Sterling Publishing Co., NY. Although this book is intended for adult amateur microscopists, it is well written and will provide teachers and classroom volunteers with much useful information on "serious" light microscopy; it's unequalled as a basic reference for beginners. Almost half of the book is devoted to simple preparation methods for biological specimens and descriptions (with good illustrations) of commonly encountered organisms. Adult. RECOMMENDED ----------------------- It will also tell you about your "old fashion microscope". The book description is taken from the Project MICRO bibliography (URL below); you'll find a lot of useful websites there too.
Where are you located in Canada? Perhaps we can find a member of the Microscopy Society of Canada who can advise you.
Caroline Schooley Project MICRO Coordinator Microscopy Society of America Box 117, 45301 Caspar Point Road Caspar, CA 95420 Phone/FAX (707)964-9460 Project MICRO: http://www.msa.microscopy.com/ProjectMicro/PMHomePage.html Intertidal invertebrates: http://www.fortbragg.k12.ca.us/AG/marinelab.html
I am using an FESEM (Hitachi S-4000). I've noticed a disparity in magnification calibration between the X and Y directions. I get about 1.5 percent error in the Y direction, and almost 5 percent in the X direction. Because the percentages still fall within 10 percent, the field service engineer believes that this is not a problem.
What do you think? Thanks in advance for your input.
Nancy Zjaba, Technical Staff Alfalight Inc. 1832 Wright Street Madison, WI 53704 (608) 240-4875 nzjaba-at-alfalight.com
It's not going to get fixed unless you bitch about it. But do it in a nice way so that they you know that it is an issue with you and be insistent. If they can adjust it, they should do it during the next routine.
In the interim, you can make the calibration perfect with digital processing. Just adjust the size in pixels appropriately in any of a number of software programs, e.g. Photoshop, ThumbsPlus, etc. If you paste the image into a word-processing or presentation program, you can also change the aspect ratios and sizes to make them perfect.
BTW, you do have the tilt correction off, right? I don't know which direction the Hitachi stage tilts, but if you have the correction on and no tilt, you can get an error.
-Scott
Scott D. Walck, Ph.D. PPG Industries, Inc. Glass Technology Center P. O. Box 11472 (letters) Guys Run Rd. (packages) Pittsburgh, PA 15238-0472
Walck-at-PPG.com
(412) 820-8651 (office) (412) 820-8515 (fax)
-----Original Message----- } From: Nancy Zjaba [mailto:nzjaba-at-alfalight.com] Sent: Wednesday, March 13, 2002 3:33 PM To: 'Microscopy-at-MSA.Microscopy.Com'
Hello, listers,
I am using an FESEM (Hitachi S-4000). I've noticed a disparity in magnification calibration between the X and Y directions. I get about 1.5 percent error in the Y direction, and almost 5 percent in the X direction. Because the percentages still fall within 10 percent, the field service engineer believes that this is not a problem.
What do you think? Thanks in advance for your input.
Nancy Zjaba, Technical Staff Alfalight Inc. 1832 Wright Street Madison, WI 53704 (608) 240-4875 nzjaba-at-alfalight.com
We have an old ETEC Autoscan SEM (1974) which we would like to covert from analog to digital. There are a number of companies that will do this conversion for around $10,000. I have heard that the hardware needed is actually minimal and can be accomplished for far less. I would appreciate any advice on this matter especially since money is an issue.
Robin
Robin W. Scribailo Ph.D. Associate Professor of Biological Sciences Director of the Aquatic Plant Herbarium Biological Sciences Purdue University North Central 1401 S. U.S. 421 Westville, IN 46391-9528 (219) 785-5255 Fax (219) 785-5483 rscrib-at-purduenc.edu
Monsanto values diversity and is an equal opportunity affirmative action employer.
Department: Research & Development Title: Postdoctoral Research Associate Req Number: mons-00000241 Location(s): St. Louis MO Responsibilities:
A two-year postdoctoral fellow position is available immediately for developing, implementing, and applying advanced microscopy techniques to elucidating the ultrastructure of plants, seeds, weeds and other biological systems. Additionally, the selected individual is responsible for developing new methods to improve the sample preparation protocols of biological systems. The selected candidate will interact with multifunctional groups of scientists working on biotechnology projects. Required Skills:
The position requires a Ph.D. in plant biology or a related field with experience in advanced electron and light microscopy techniques. A strong background and extensive experience in TEM, high-resolution cryo-SEM, and confocal laser scanning microscopy techniques are essential. Experience with gene transformation in plants is a strong plus. The following key competencies are desired: highly motivated and interested in developing new imaging technologies; good interpersonal, verbal and written communication skills; innovative and seeking opportunity to improve existing techniques and processes.
Doesn't ISO-9000 allow up to 5% error? My ISO standard from Geller says that it will do 5% or better.
It is odd though that your difference between X and Y is so large. The Geller standard is calibrated in X and Y.
gary g.
At 12:33 PM 3/13/2002, you wrote: } ------------------------------------------------------------------------ } The Microscopy ListServer -- Sponsor: The Microscopy Society of America
Nancy, It sounds to me like your FE is taking the average of the two errors, which is NOT correct. I would be very persistent that they correct the error. If you received this response while the FE was there on a service visit, I would place a call the service office and demand that someone return to perform the calibrations that should have been done in the first place. Just my $.02 worth from someone who has been servicing SEM's for 20 + years.
Gary M. Easton, President Scanners Corporation 410.857.7633
----- Original Message ----- } From: "Nancy Zjaba" {nzjaba-at-alfalight.com} To: "'Microscopy-at-MSA.Microscopy.Com'" {Microscopy-at-sparc5.microscopy.com} Sent: Wednesday, March 13, 2002 3:33 PM
Dear Microscopists, We are considering purchasing a high resolution FE-SEM equipped with a high resolution cryo prep & cryo transfer system. We are thinking of either Gatan's Alto 2500 or the Baltec VCT 100.
We have two questions: 1) Does anybody have experiences they would like to share (positive or negative experiences welcome!) regarding these two cryo systems.
2) Would either of these two systems (on a FE-SEM), in your opinion, replace our dedicated freeze etch machine? Our present freeze etch device is a Balzers BAF 300. Its old and we would dearly like to recover the space occupied by this large instrument but are not sure whether the SEM cryo systems we are considering will fully replace it.
Any thoughts garnered from experience would be gratefully received. Opinions sent directly to me will be kept confidential.
Regards,
Richard Easingwood
Richard Easingwood Otago Centre for Electron Microscopy Department of Anatomy and Structural Biology School of Medical Sciences, University of Otago PO Box 913, Dunedin NEW ZEALAND Telephone: office: 0064 3 479 7301 Facsimile: 0064 3 479 7254 GSM: 0064 21 222 4759 mailto:richard.easingwood-at-stonebow.otago.ac.nz Web site: http://www.otago.ac.nz/anatomy/emunit/
EMBO Practical Course on Electron Microscopy, Immunocytochemistry and Stereology for Cell Biology at EMBL, Heidelberg, May 22 - June 01, 2002
This is a course about the production of thin sections of biological material and their use in studying ultrastructure in the context of molecular cell biology. The course will introduce the techniques of cryosectioning, rapid freezing methods as an alternative to chemical fixation, freeze substitution and resin embedding. It will instruct participants in the sectioning of suitably prepared material and will then concentrate on the use of these sections for localizing specific molecules within cells. Ample time will be given to hands on practical work as well as formal and informal discussion of available techniques for the localization of subcellular molecules.
More details at http://www.embl-heidelberg.de/courses/ElectronMicroscopy02/
Regards,
Paul Webster.
Paul Webster, Ph.D. Scientist II and Director Ahmanson Center for Advanced EM & Imaging House Ear Institute 2100 West 3rd Street Los Angeles CA 90057
Loctite Glass Bond is available in 3ml tubes which are convenient for schoolkids to handle. It is a glass-clear UV-curing adhesive, used for bonding e.g. automobile mirrors to windscreens, which can be used to mount all manner of *small* dry items like pollen grains, diatoms, mosquito wings, butterfly wing scales, mineral grains, microfossils, isolated plant cuticles, fibres etc. under a coverslip
You don't need a UV source - daylight will do fine. Just place a drop on the slide, arrange your specimens, cover with a coverslip and leave on a window ledge for 15-30 minutes. Pollen etc. can be collected and mounted in the field, the mounts hardening quickly in full daylight, so that there is no risk of messy slippage of coverslips during subsequent transport. The mount is permanent, and the adhesive will not harden on fingers etc., only in situations where oxygen is excluded. Clean up can be done with alcohol or soap and water. Toxicity of the acrylic resin is no doubt finite but is probably quite low. Sources - auto spares dealers may stock this, otherwise try Loctite Glass Bond RS Components Product Number 693-810 3ml tube http://www.rs-components.com/
A similar product is available from RS Components in larger dispensers described as Loctite Engineering Adhesive
I have no commercial interest, but all donations gratefully received!
Best wishes Chris
} } Question: I am a high school science teacher. I require either a } } website or a protocol to have high school kids be able to make } } permanent mount glass slides for the old fashion microscope in orcer } } to create a permanent collection for the school. All I have found } } so far is wet mount slides which is not the type I require. Any } } suggestion would be helpful. Thanks. } } Mike } } michelbruneau-at-hotmail.com } } } } --------------------------------------------------------------------------- Mike - -
If you're hoping for fixed, sectioned, stained mammalian tissues, that will probably be beyond your students' capabilities. If you want whole mounts of things like insect wings, diatoms, etc., that's possible. I suggest that you get a copy of: ----------------------- Nachtigall, W. 1995 Exploring With the Microscope 160 pp. hardbound. 6.5x9.5". $19.95. ISBN 0-8069-0866-1 Sterling Publishing Co., NY. Although this book is intended for adult amateur microscopists, it is well written and will provide teachers and classroom volunteers with much useful information on "serious" light microscopy; it's unequalled as a basic reference for beginners. Almost half of the book is devoted to simple preparation methods for biological specimens and descriptions (with good illustrations) of commonly encountered organisms. Adult. RECOMMENDED ----------------------- It will also tell you about your "old fashion microscope". The book description is taken from the Project MICRO bibliography (URL below); you'll find a lot of useful websites there too.
Where are you located in Canada? Perhaps we can find a member of the Microscopy Society of Canada who can advise you.
Caroline Schooley Project MICRO Coordinator Microscopy Society of America Box 117, 45301 Caspar Point Road Caspar, CA 95420 Phone/FAX (707)964-9460 Project MICRO: http://www.msa.microscopy.com/ProjectMicro/PMHomePage.html Intertidal invertebrates: http://www.fortbragg.k12.ca.us/AG/marinelab.html
------- End of forwarded message ------- ========================================== Dr. Chris Jeffree University of Edinburgh BIOSEM - Biological Sciences Electron Microscope Facility Institute of Cell and Molecular Biology Waddington Building King's Buildings, Mayfield Road EDINBURGH, EH9 3JN, Scotland, UK Tel. #44 (0) 131 650 5554 FAX. #44 (0) 131 650 6563 Mobile 07710 585 401 email c.jeffree-at-ed.ac.uk =========================================
A good starting place to find more information about stereology software could be the website of the International Society for Stereology (ISS):
http://www.stereologysociety.org/
Best regards,
Peter
-- Dr. Peter Van Osta
Union Biometrica N.V./S.A. European Scientific Operations (ESO)
Cipalstraat 3 B-2440 Geel Belgium
tel.: +32 (0)14 570 619 fax.: +32 (0)14 570 621
http://www.unionbio.com/
=============================================== Ken Bart wrote: } } ------------------------------------------------------------------------ } The Microscopy ListServer -- Sponsor: The Microscopy Society of America } To Subscribe/Unsubscribe -- Send Email to ListServer-at-MSA.Microscopy.Com } On-Line Help http://www.msa.microscopy.com/MicroscopyListserver/FAQ.html } -----------------------------------------------------------------------. } } Hi Folks: } Can anyone make a recommend software to make 3D } reconstructions from serial TEM and LM images? Thanks for all } suggestions! } } Ken } -- } } Kenneth M. Bart } Director, Electron Microscopy Facility } Hamilton College } Clinton, New York 13323 } } Phone:315-859-4715 } Fax: 315-859-4807 } email: kbart-at-hamilton.edu } http://academics.hamilton.edu/biology/kbart/
You've received a number of answers already, but there is a simple answer to your problem and the service engineer's response. Manufacturer's specifications for magnification are generally 'within 10%'. The instruments are normally able to maintain 1 or 2%, assuming appropriate conditions are met, but in setting their specifications the manufacturers have to face the large dynamic range of the magnification (5 orders of magnitude), accelerating voltage, condensor lens settings and working distances. Couple that with the fact that their service engineers don't carry NIST primary or secondary standards and they have little ability to provide better calibration than you have received.
Your best chance would be to purchase and maintain your own NIST or derived standard and either negotiate a contract to calibrate the instrument to a certain percentage to that or use software based corrections in your image processing software that you measure and document yourself. Of course, you could also consider the services of a third party maintenance service that may happily provide these services (all right, I happen to be one of those third party services, but even if I weren't I would make this suggestion).
Seriously, if you want or need any traceability in magnification calibration to any particular standard, you really have to maintain your own standards. A service engineer travels many places in many ways making the constant certification of any standards he carries impossible to adequately certify. While the previous (current? I haven't checked to see if NIST has introduced their next generation SEM mag calibration standard) NIST standard essentially required recertification only if it were subjected to re-polishing, standards organizations would also like some documentation of the storage and condition of the standard beyond this.
I happen to carry both the NIST magnification and resolution standards, but I still suggest to customers who have a need for tight specs to buy and maintain their own standards. While I will provide ISO certification based on these standards, these certs will include a statement of additional and unknown uncertainties based on my inability to fully document the handling and environmental conditions they may have been exposed to since certification.
OK, that goes beyond most user's needs, but given the ongoing insidious spread of ISO, it had to be stated. For most users, just knowing that the magnification in each dimension is within a few percent is comforting. Frankly, your field engineer is being lazy. Please feel free to show him this response, or perhaps forward it to his service department. It may have some effect, but probably not.
More modern instruments have less of an ability to adjust the calibration for the full range of conditions, so a reasonable alternative is to define a set of conditions that represent the area you are normally working within. Establish a particular set of accelerating voltage, condensor lens setting and working distance that you work at on average and request that at that point, calibration be done within a certain percentage. Realize also, that modern digital image capture systems add another problem. If your system includes a photographic device, the calibration is probably done to that image size, whether you use it or not. Since magnification data is often not included in the digitally captured image, other than a micron marker, and display or printing aspect ratios can vary, calibration of digital images is a whole other mater.
Allen R. Sampson Advanced Research Systems 317 North 4th. Street St. Charles, Illinois 60174
On Wednesday, March 13, 2002 12:33 PM, Nancy Zjaba [SMTP:nzjaba-at-alfalight.com] wrote: } } Hello, listers, } } I am using an FESEM (Hitachi S-4000). I've noticed a disparity in } magnification calibration between the X and Y directions. I get about 1.5 } percent error in the Y direction, and almost 5 percent in the X direction. } Because the percentages still fall within 10 percent, the field service } engineer believes that this is not a problem. } } What do you think? Thanks in advance for your input. } } Nancy Zjaba, Technical Staff } Alfalight Inc. } 1832 Wright Street } Madison, WI 53704 } (608) 240-4875 } nzjaba-at-alfalight.com } }
I am also looking for such a solution, b/c right now I am cutting lots of serial semithin sections. So far I collected this information:
Some people at my department use regular CAD-Software or other 3D rendering software like "Alias Wavefront 3D studio tools", but that is a lot of work, because the software was not designed for such a task. As far as I know they redraw every single picture by hand... http://www.aliaswavefront.com/en/Home/homepage.shtml
Amira 2.3 is a software for 3D reconstruction of confocal images, but with the new version 2.3 they integrated functionality for using the same functions with single pictures, which can be automatically (or manually) aligned in a stack. 14 day trial download: www.amiravis.com
"AnalySIS 3.1 3D reconstruction" does the same, but was especially designed for TEM and LM. www.soft-imaging.net for information, but no trial software.
Personally I have not reconstructed a 3D model from serial sections yet. I am not affiliated with any of the mentioned brands, but recommend to buy Amira for our confocal microscope.
:-) Torsten
} } Hi Folks: } Can anyone make a recommend software to make 3D } reconstructions from serial TEM and LM images? Thanks for all } suggestions! } } Ken } -- }
Torsten Fregin
Universität Hamburg - Zoologisches Institut Abt. Neurophysiologie AG Wiese - Raum 413 Martin-Luther-King-Platz 3 20146 Hamburg, Germany Telefon *49-(0)40-42838-3931 Fax *49-(0)40-42838-3937 eMail Torsten.Fregin-at-zoologie.uni-hamburg.de oder TorstenFregin-at-gmx.de
On a similar note: We discovered yesterday that our SEM magnification calibration is out by about 25 % !! We are working on recalibrating but according to our best estimate it has been this way for about 3 weeks. My question(s) is this. How often do people check the magnification on their SEM's. How often do you calibrate. Like the temperature of my oven .. I always assume the magnification of my SEM is pretty close to the stated value. Anyway ..back to redoing the last 3 weeks of work !!
Cheers
Paul D. Nolan
Nancy Zjaba {nzjaba-at-alfaligh To: "'Microscopy-at-MSA.Microscopy.Com'" {Microscopy-at-sparc5.microscopy.com} t.com} cc: Subject: SEM magnification calibration 03/13/2002 03:33 PM
------------------------------------------------------------------------ The Microscopy ListServer -- Sponsor: The Microscopy Society of America
Hello, listers,
I am using an FESEM (Hitachi S-4000). I've noticed a disparity in magnification calibration between the X and Y directions. I get about 1.5 percent error in the Y direction, and almost 5 percent in the X direction. Because the percentages still fall within 10 percent, the field service engineer believes that this is not a problem.
What do you think? Thanks in advance for your input.
Nancy Zjaba, Technical Staff Alfalight Inc. 1832 Wright Street Madison, WI 53704 (608) 240-4875 nzjaba-at-alfalight.com
I remember that a few months ago ( or years perhaps) there was a debate on the list concerning burns with liquid nitrogen. Since I cannot find the summary on my computer I address all of you the question : do you wear gloves to work with and "in" liquid nitrogen ? I do not because I was a student of H. Sitte and know by heart his safety rules. I invited Keith Ryan a few years ago, and he too told us the rules but nevertheless my boss does not agree with me and wants to force me to wear gloves etc... I am a member of the safety commettee in the lab and we have a meeting next week. My second inquiry is : Could you tell me about your experience with liquid nitrogen or send the web site where I can find the information? (as I remember there were some funny stories on this list. In one somebody takes off all his clothes running away from a leaky, exploding container, and was not burned....) Thanks } Daniele } } } Veuillez noter qu'en cas de problčme d'envoi d'e-mail vous pouvez aussi } m'adresser votre message ŕ daniele.spehner-at-efs-alsace.fr } If you have problem sending me an e-mail please try my other address as } follows : daniele.spehner-at-efs-alsace.fr } } Daničle Spehner, } Head of the EM Department } INSERM EPI 99-08, } Etablissement Français du Sang-Alsace, } 10 rue Spielmann, 67065 STRASBOURG } FRANCE
Veuillez noter qu'en cas de problčme d'envoi d'e-mail vous pouvez aussi m'adresser votre message ŕ daniele.spehner-at-efs-alsace.fr If you have problem sending me an e-mail please try my other address as follows : daniele.spehner-at-efs-alsace.fr
Daničle Spehner, INSERM EPI 99-08, Etablissement Français du Sang-Alsace, 10 rue Spielmann, 67065 STRASBOURG FRANCE
Insulating gloves (with gauntlets) should be worn, as should full-face shields. The gloves should be over-sized, however, so that they can be flung free if LN2 somehow gets inside. Snug gloves, especially those with gauntlets, can entrap LN2 next to the skin, leading many to abandon the practice.
The single biggest danger with LN2 (or other cryogenics, is insufficient air exchange). It kills with alarming frequency, especially in enclosures like tanks, "pits" or poorly-ventilated basement labs (where microscopists frequently toil).
Jeffrey A Fortner Argonne National Laboratory CMT/205 9700 S. Cass Avenue Argonne, IL 60439 (630) 252-5594 FAX: (630) 972-4438
} ---------- } From: Daniele Spehner } Sent: Thursday, March 14, 2002 8:24 AM } To: microscopy-at-sparc5.microscopy.com } Subject: Liquid nitrogen } } ------------------------------------------------------------------------ } The Microscopy ListServer -- Sponsor: The Microscopy Society of America } To Subscribe/Unsubscribe -- Send Email to ListServer-at-MSA.Microscopy.Com } On-Line Help http://www.msa.microscopy.com/MicroscopyListserver/FAQ.html } -----------------------------------------------------------------------. } } } Objet : liquid nitrogen } } } To all the cyomicroscopists arround, } } I remember that a few months ago ( or years perhaps) there was a debate } on } the list concerning burns with liquid nitrogen. Since I cannot find the } summary on my computer I address all of you the question : do you wear } gloves to work with and "in" liquid nitrogen ? } I do not because I was a student of H. Sitte and know by heart his safety } rules. I invited Keith Ryan a few years ago, and he too told us the rules } but nevertheless my boss does not agree with me and wants to force me to } wear gloves etc... } I am a member of the safety commettee in the lab and we have a meeting } next week. } My second inquiry is : Could you tell me about your experience with } liquid } nitrogen or send the } web site where I can find the information? (as I remember there were some } funny stories on this list. In one somebody takes off all his clothes } running } away from a leaky, exploding container, and was not burned....) Thanks } } Daniele } } } } } } Veuillez noter qu'en cas de problčme d'envoi d'e-mail vous pouvez aussi } } m'adresser votre message ŕ daniele.spehner-at-efs-alsace.fr } } If you have problem sending me an e-mail please try my other address as } } follows : daniele.spehner-at-efs-alsace.fr } } } } Daničle Spehner, } } Head of the EM Department } } INSERM EPI 99-08, } } Etablissement Français du Sang-Alsace, } } 10 rue Spielmann, 67065 STRASBOURG } } FRANCE } } Veuillez noter qu'en cas de problčme d'envoi d'e-mail vous pouvez aussi } m'adresser votre message ŕ daniele.spehner-at-efs-alsace.fr } If you have problem sending me an e-mail please try my other address as } follows : daniele.spehner-at-efs-alsace.fr } } Daničle Spehner, } INSERM EPI 99-08, } Etablissement Français du Sang-Alsace, } 10 rue Spielmann, 67065 STRASBOURG } FRANCE } } }
The suggestion with the digital processing is definitely a good one. However, you may have to maintain a large calibration table, as the calibration can change from one voltage to another, different working distances, etc. If the software can't do that, you'd have to keep that calibration table somewhere else on the computer.
For highest accuracy, some of our customers actually keep a calibration sample on the sample holder. When they acquire images, they also acquire an image of the calibration sample (they move there only by moving the stage as to maintain identical conditions). Then they calibrate the image of the calibration standard and transfer that calibration to the first image. Sounds a bit cumbersome, but it gives them calibration independent of the microscope parameters.
mike
} } } } } } } } } } WE HAVE MOVED { { { { { { { { { please make a note of the new address below
Michael Bode, Ph.D. Soft Imaging System Corp. 12596 West Bayaud Avenue Suite 300 Lakewood, CO 80228 =================================== phone: (888) FIND SIS (303) 234-9270 fax: (303) 234-9271 email: mailto:info-at-soft-imaging.com web: http://www.soft-imaging.com ===================================
-----Original Message----- } From: Walck, Scott D. [mailto:walck-at-ppg.com] Sent: Wednesday, March 13, 2002 2:17 PM To: 'Nancy Zjaba'; Microscopy (E-mail)
It's not going to get fixed unless you bitch about it. But do it in a nice way so that they you know that it is an issue with you and be insistent. If they can adjust it, they should do it during the next routine.
In the interim, you can make the calibration perfect with digital processing. Just adjust the size in pixels appropriately in any of a number of software programs, e.g. Photoshop, ThumbsPlus, etc. If you paste the image into a word-processing or presentation program, you can also change the aspect ratios and sizes to make them perfect.
BTW, you do have the tilt correction off, right? I don't know which direction the Hitachi stage tilts, but if you have the correction on and no tilt, you can get an error.
-Scott
Scott D. Walck, Ph.D. PPG Industries, Inc. Glass Technology Center P. O. Box 11472 (letters) Guys Run Rd. (packages) Pittsburgh, PA 15238-0472
Walck-at-PPG.com
(412) 820-8651 (office) (412) 820-8515 (fax)
-----Original Message----- } From: Nancy Zjaba [mailto:nzjaba-at-alfalight.com] Sent: Wednesday, March 13, 2002 3:33 PM To: 'Microscopy-at-MSA.Microscopy.Com'
Hello, listers,
I am using an FESEM (Hitachi S-4000). I've noticed a disparity in magnification calibration between the X and Y directions. I get about 1.5 percent error in the Y direction, and almost 5 percent in the X direction. Because the percentages still fall within 10 percent, the field service engineer believes that this is not a problem.
What do you think? Thanks in advance for your input.
Nancy Zjaba, Technical Staff Alfalight Inc. 1832 Wright Street Madison, WI 53704 (608) 240-4875 nzjaba-at-alfalight.com
i need a quick answer to a quick question. our lab is considering a tissue processor. need to know what the users of processors think. only users please. any info would be helpful. john
This is an inquiry to anyone with experience in immunocytochemistry.
I am preparing LR White embedded material for immunocytochemistry studies and would appreciate some opinions on the use of 5% or 10% hydrogen peroxide as an enchant. Is it too aggressive or does it really improve the availability of antigenic sites?
Can anyone tell me if there is a freeze-sub unit, preferably with a high-pressure freezer associated with it, anywhere in the vicinity of central Missouri (like within a day's drive)? We're working on getting one, but we're not there, yet, and a client needs one pretty soon.
Thanks in advance.
Randy
Randy Tindall EM Specialist Electron Microscopy Core Facility W122 Veterinary Medicine University of Missouri Columbia, MO 65211 Tel: (573) 882-8304 Fax: (573) 884-5414 Email: tindallr-at-missouri.edu Web: http://www.biotech.missouri.edu/emc/
Hi George (and everyone), Yes, I received this info yesterday from AOCS Marketing via email. Since it only had to do with announcing "Courses" on feed analysis I took the liberty to post it on the Aglabs email list server. It should reach about 365 feed/fert/pest/chemists throughout North America. Hope it helps to drum up some new students. Hope you all are doing well these daze, Best Wishes Mike
Mike Bucker Consolidated Labs of Virginia Richmond, Va
} } } "George Falb" {gfalb-at-buckeyenutrition.com} 03/14/02 01:26PM } } } Have you received the e-mail information below regarding the 2002 Microscopy short courses? Hopefully I didn't miss any of you. Please forward on to any of your work associates or colleagues that may be interested. I will be doing the same.
Thanks...George S. Falb
----- Original Message ----- } From: "AOCS" {marketingmm-at-aocs.org} To: "George Falb" {gfalb-at-buckeyenutrition.com} Sent: Tuesday, March 12, 2002 11:52 AM
In addition to Fortner's comments, while using LN2, do not use thin latex (or similar) gloves. LN2 can quickly freeze these thin gloves, holding the cold tightly against the skin, causing a more serious burn.
As far as eschewing all protection, that is not a good idea. Incidental or momentary contact is not particularly dangerous because a layer of gas forms between the skin and the LN2, insulating the skin from damage. However sustained contact will result in burns.
One more danger of LN2 and nudity...it upsets some sensitive types on the List. Been there....been burned.
------------------------------------------------------------------------ The Microscopy ListServer -- Sponsor: The Microscopy Society of America
Insulating gloves (with gauntlets) should be worn, as should full-face shields. The gloves should be over-sized, however, so that they can be flung free if LN2 somehow gets inside. Snug gloves, especially those with gauntlets, can entrap LN2 next to the skin, leading many to abandon the practice.
The single biggest danger with LN2 (or other cryogenics, is insufficient air exchange). It kills with alarming frequency, especially in enclosures like tanks, "pits" or poorly-ventilated basement labs (where microscopists frequently toil).
Jeffrey A Fortner Argonne National Laboratory CMT/205 9700 S. Cass Avenue Argonne, IL 60439 (630) 252-5594 FAX: (630) 972-4438
} ---------- } From: Daniele Spehner } Sent: Thursday, March 14, 2002 8:24 AM } To: microscopy-at-sparc5.microscopy.com } Subject: Liquid nitrogen } } ------------------------------------------------------------------------ } The Microscopy ListServer -- Sponsor: The Microscopy Society of America } To Subscribe/Unsubscribe -- Send Email to ListServer-at-MSA.Microscopy.Com } On-Line Help http://www.msa.microscopy.com/MicroscopyListserver/FAQ.html } -----------------------------------------------------------------------. } } } Objet : liquid nitrogen } } } To all the cyomicroscopists arround, } } I remember that a few months ago ( or years perhaps) there was a debate } on } the list concerning burns with liquid nitrogen. Since I cannot find the } summary on my computer I address all of you the question : do you wear } gloves to work with and "in" liquid nitrogen ? } I do not because I was a student of H. Sitte and know by heart his safety } rules. I invited Keith Ryan a few years ago, and he too told us the rules } but nevertheless my boss does not agree with me and wants to force me to } wear gloves etc... } I am a member of the safety commettee in the lab and we have a meeting } next week. } My second inquiry is : Could you tell me about your experience with } liquid } nitrogen or send the } web site where I can find the information? (as I remember there were some } funny stories on this list. In one somebody takes off all his clothes } running } away from a leaky, exploding container, and was not burned....) Thanks } } Daniele } } } } } } Veuillez noter qu'en cas de problčme d'envoi d'e-mail vous pouvez aussi } } m'adresser votre message ŕ daniele.spehner-at-efs-alsace.fr } } If you have problem sending me an e-mail please try my other address as } } follows : daniele.spehner-at-efs-alsace.fr } } } } Daničle Spehner, } } Head of the EM Department } } INSERM EPI 99-08, } } Etablissement Français du Sang-Alsace, } } 10 rue Spielmann, 67065 STRASBOURG } } FRANCE } } Veuillez noter qu'en cas de problčme d'envoi d'e-mail vous pouvez aussi } m'adresser votre message ŕ daniele.spehner-at-efs-alsace.fr } If you have problem sending me an e-mail please try my other address as } follows : daniele.spehner-at-efs-alsace.fr } } Daničle Spehner, } INSERM EPI 99-08, } Etablissement Français du Sang-Alsace, } 10 rue Spielmann, 67065 STRASBOURG } FRANCE } } }
by sparc5.microscopy.com (8.9.3+Sun/8.9.3) id OAA13078 for dist-Microscopy; Thu, 14 Mar 2002 14:26:19 -0600 (CST) Received: from njz_spm_filter (sparc5 [206.69.208.10]) by sparc5.microscopy.com (8.9.3+Sun/8.9.3) with SMTP id OAA13075 for "MicroscopyFilteredEmail1-at-msa.microscopy.com"; Thu, 14 Mar 2002 14:25:48 -0600 (CST) Received: from tmpnt702.Honeywell.com (tmpsmtp702.honeywell.com [199.64.7.102]) by sparc5.microscopy.com (8.9.3+Sun/8.9.3) with SMTP id OAA13068 for {microscopy-at-sparc5.microscopy.com} ; Thu, 14 Mar 2002 14:25:37 -0600 (CST) Received: from 131.127.249.102 by tmpnt702.Honeywell.com (InterScan E-Mail VirusWall NT); Thu, 14 Mar 2002 13:21:12 -0700 Received: by smtp.allied.com with Internet Mail Service (5.5.2653.19) id {G7ZZGY9J} ; Thu, 14 Mar 2002 13:21:08 -0700 Message-ID: {3348B4357E7FD4118DAE00508B0749500AC29C3F-at-tmpex177.allied.com} microscopy-at-sparc5.microscopy.com
Despite all the facts that are out there concerning the safe handling of LN i.e.. the film of oil on the skin is a protectant in and of itself and clothing just absorbs the LN and thus could cause burns to the skin below....we still use cryoprotective gloves, a full face shield and a cryo bib type apron to protect clothing.
Seems a little hard to convince the safety people that the protective gear we need when handling LN is none or no clothing.
Dear listers, The following Postdoctoral Research Associate position is available immediately at Monsanto Company in St. Louis, Missouri. Potential candidates please respond on line at the Monsanto website provided below. ---------------------------------------------------------------------------- -------------------------------------------------------
Monsanto Company Department: Research & Development Title: Postdoctoral Research Associate Req Number: mons-00000241 Location(s): St. Louis MO Responsibilities: A two-year postdoctoral fellow position is available immediately for developing, implementing, and applying advanced microscopy techniques to elucidating the ultrastructure of plants, seeds, weeds and other biological systems. Additionally, the selected individual is responsible for developing new methods to improve the sample preparation protocols of biological systems. The selected candidate will interact with multifunctional groups of scientists working on biotechnology projects. Required Skills: The position requires a Ph.D. in plant biology or a related field with experience in advanced electron and light microscopy techniques. A strong background and extensive experience in TEM, high-resolution cryo-SEM, and confocal laser scanning microscopy techniques are essential. Experience with gene transformation in plants is a strong plus. The following key competencies are desired: highly motivated and interested in developing new imaging technologies; good interpersonal, verbal and written communication skills; innovative and seeking opportunity to improve existing techniques and processes. To respond to this job, access our website -at-: www.monsanto.com Please be sure to select the proper source! Monsanto values diversity and is an equal opportunity affirmative action employer.
.. and make sure not to trap any LN2 in your shoes!!
mike
-----Original Message----- } From: Fortner, Jeffrey A. [mailto:fortner-at-cmt.anl.gov] Sent: Thursday, March 14, 2002 8:33 AM To: 'Daniele Spehner'; microscopy-at-sparc5.microscopy.com (E-mail)
Insulating gloves (with gauntlets) should be worn, as should full-face shields. The gloves should be over-sized, however, so that they can be flung free if LN2 somehow gets inside. Snug gloves, especially those with gauntlets, can entrap LN2 next to the skin, leading many to abandon the practice.
The single biggest danger with LN2 (or other cryogenics, is insufficient air exchange). It kills with alarming frequency, especially in enclosures like tanks, "pits" or poorly-ventilated basement labs (where microscopists frequently toil).
Jeffrey A Fortner Argonne National Laboratory CMT/205 9700 S. Cass Avenue Argonne, IL 60439 (630) 252-5594 FAX: (630) 972-4438
} ---------- } From: Daniele Spehner } Sent: Thursday, March 14, 2002 8:24 AM } To: microscopy-at-sparc5.microscopy.com } Subject: Liquid nitrogen } } ------------------------------------------------------------------------ } The Microscopy ListServer -- Sponsor: The Microscopy Society of America } To Subscribe/Unsubscribe -- Send Email to ListServer-at-MSA.Microscopy.Com } On-Line Help http://www.msa.microscopy.com/MicroscopyListserver/FAQ.html } -----------------------------------------------------------------------. } } } Objet : liquid nitrogen } } } To all the cyomicroscopists arround, } } I remember that a few months ago ( or years perhaps) there was a debate } on } the list concerning burns with liquid nitrogen. Since I cannot find the } summary on my computer I address all of you the question : do you wear } gloves to work with and "in" liquid nitrogen ? } I do not because I was a student of H. Sitte and know by heart his safety } rules. I invited Keith Ryan a few years ago, and he too told us the rules } but nevertheless my boss does not agree with me and wants to force me to } wear gloves etc... } I am a member of the safety commettee in the lab and we have a meeting } next week. } My second inquiry is : Could you tell me about your experience with } liquid } nitrogen or send the } web site where I can find the information? (as I remember there were some } funny stories on this list. In one somebody takes off all his clothes } running } away from a leaky, exploding container, and was not burned....) Thanks } } Daniele } } } } } } Veuillez noter qu'en cas de problčme d'envoi d'e-mail vous pouvez aussi } } m'adresser votre message ŕ daniele.spehner-at-efs-alsace.fr } } If you have problem sending me an e-mail please try my other address as } } follows : daniele.spehner-at-efs-alsace.fr } } } } Daničle Spehner, } } Head of the EM Department } } INSERM EPI 99-08, } } Etablissement Français du Sang-Alsace, } } 10 rue Spielmann, 67065 STRASBOURG } } FRANCE } } Veuillez noter qu'en cas de problčme d'envoi d'e-mail vous pouvez aussi } m'adresser votre message ŕ daniele.spehner-at-efs-alsace.fr } If you have problem sending me an e-mail please try my other address as } follows : daniele.spehner-at-efs-alsace.fr } } Daničle Spehner, } INSERM EPI 99-08, } Etablissement Français du Sang-Alsace, } 10 rue Spielmann, 67065 STRASBOURG } FRANCE } } }
That is one good reason for having standards such as ISO9000 and QS9000. We have the calibration requirements and magnification calibration performed when a routine is done. On a TEM, whenever the column is split it should be checked, and otherwise once or twice a year with service routines is sufficient. You do need a traceable standard if your lab is certified. Otherwise, you can get very good standards that are not traceable that are accurate for most work and relatively inexpensive.
An important point that is being missed, but that was pointed out in the original question is that both directions, X and Y, should be checked. This is very important for TEM diffraction patterns. Here the easy check is to take two ring patterns acquired back-to-back and rotate one 90 degrees with respect to the other and check that the patterns are still coincident. Otherwise you have to take the aspect ratio difference into account
-Scott
Scott D. Walck, Ph.D. PPG Industries, Inc. Glass Technology Center P. O. Box 11472 (letters) Guys Run Rd. (packages) Pittsburgh, PA 15238-0472
Walck-at-PPG.com
(412) 820-8651 (office) (412) 820-8515 (fax)
-----Original Message----- } From: "Paul.Nolan-at-alcan.com"-at-sparc5.microscopy.com [mailto:"Paul.Nolan-at-alcan.com"-at-sparc5.microscopy.com] Sent: Thursday, March 14, 2002 9:00 AM To: Microscopy-at-sparc5.microscopy.com
On a similar note: We discovered yesterday that our SEM magnification calibration is out by about 25 % !! We are working on recalibrating but according to our best estimate it has been this way for about 3 weeks. My question(s) is this. How often do people check the magnification on their SEM's. How often do you calibrate. Like the temperature of my oven .. I always assume the magnification of my SEM is pretty close to the stated value. Anyway ..back to redoing the last 3 weeks of work !!
Cheers
Paul D. Nolan
Nancy Zjaba {nzjaba-at-alfaligh To: "'Microscopy-at-MSA.Microscopy.Com'" {Microscopy-at-sparc5.microscopy.com} t.com} cc: Subject: SEM magnification calibration 03/13/2002 03:33 PM
------------------------------------------------------------------------ The Microscopy ListServer -- Sponsor: The Microscopy Society of America
Hello, listers,
I am using an FESEM (Hitachi S-4000). I've noticed a disparity in magnification calibration between the X and Y directions. I get about 1.5 percent error in the Y direction, and almost 5 percent in the X direction. Because the percentages still fall within 10 percent, the field service engineer believes that this is not a problem.
What do you think? Thanks in advance for your input.
Nancy Zjaba, Technical Staff Alfalight Inc. 1832 Wright Street Madison, WI 53704 (608) 240-4875 nzjaba-at-alfalight.com
I am comparing a series of SEM images of steel samples with surfaces that vary from lightly to severely etched (pickled in acid). As the severity of the etching increases, the number of exposed metal grains observed increases. Continued etching shows surfaces with mild to severe grain boundary attack. Can anyone recommend an effective way to objectively compare a large series of such images? Is there a basic text or are there any particular references that may apply?
Cheers,
John
John A. Rotole, Ph.D. Project Engineer Coatings & Surface Technology Ispat Inland Product Research 3001 E. Columbus Drive East Chicago, Indiana 46312 Tel: 219-399-6308 Fax: 219-399-6562
I am comparing a series of SEM images of steel samples with surfaces that vary from lightly to severely etched (pickled in acid). As the severity of the etching increases, the number of exposed metal grains observed increases. Continued etching shows surfaces with mild to severe grain boundary attack. Can anyone recommend an effective way to objectively compare a large series of such images? Is there a basic text or are there any particular references that may apply?
Cheers,
John
John A. Rotole, Ph.D. Project Engineer Coatings & Surface Technology Ispat Inland Product Research 3001 E. Columbus Drive East Chicago, Indiana 46312 Tel: 219-399-6308 Fax: 219-399-6562
Hi Randy, is atlanta too far? try Rob Apakarian at Emory {rapkari-at-emory.edu} Beth
} Can anyone tell me if there is a freeze-sub unit, preferably with a } high-pressure freezer associated with it, anywhere in the vicinity of } central Missouri (like within a day's drive)? We're working on getting } one, but we're not there, yet, and a client needs one pretty soon. } } Thanks in advance. } } Randy
********************************************************************** Beth Richardson EM Lab Coordinator Plant Biology Department University of Georgia Athens, GA 30602-7271
Phone - (706) 542-1790 & FAX - (706) 542-1805
"Between the two evils, I always pick the one I never tried before". Mae West (1893-1980) **********************************************************************
"And it's only the giving that makes you what you are". Wond'ring Aloud, Jethro Tull (Aqualung)
It is my understanding that, since LR White is hydrophilic and not highly cross-linked, etching is not necessary. However, as anyone who has done immuno will tell you, a lot depends on what you are looking for. I never had much luck with LR White, but mainly because the morphology was not good enough for what we were trying to do.
Jeannette Taylor wrote:
} This is an inquiry to anyone with experience in immunocytochemistry. } } I am preparing LR White embedded material for immunocytochemistry } studies and would appreciate some opinions on } the use of 5% or 10% hydrogen peroxide as an enchant. Is it too } aggressive or does it really improve the availability of antigenic } sites? } } Thank you, } } Jeannette Taylor } jvtaylo-at-emory.edu
Geoff -- ********************************************** Geoff McAuliffe, Ph.D. Neuroscience and Cell Biology Robert Wood Johnson Medical School 675 Hoes Lane, Piscataway, NJ 08854 voice: (732)-235-4583; fax: -4029 mcauliff-at-umdnj.edu **********************************************
It has been my experience that the dangers of LN2 are blown all out of proportion. Have you ever seen a picture of the "OSHA Cowboy"? As the previous posted stated, the biggest danger is asphyxiation.
I use gloves when handling something (especially the fill hose and cryo valve) that has been chilled by LN2. To keep H&S happy, I use a face shield when filling my detector from my 4LD flask. It is at eye level.
LN2 in limited quantities (as in a spatter) will near instantly blow itself off bare skin. Like dripping water on a red hot stove, it almost instantly flashes to vapor at the contact point leaving in a hurry. Sustained contact is a totally different matter and should be avoided.
IMHO, The safest clothing for work with LN2 is none at all. This can present some (other) problems in most labs. {g}
I don't have the address, but did once locate a study by Union Carbide which indicated no corneal damage when a limited amount of LN2 was dripped into rabbit's eyes.
I wish I had a copy of a picture showing the late Chuck Fiori pouring a gush of LN2 (from a 4LD held over his head) into his open mouth. Chuck was a bit more adventuresome than I! I would probably hiccup...
Most handling rules I have seen seem to have been written by someone who has read the MSDS and has no practical experience. One of our company divisions (to paraphrase) states you should use a rubber apron, gauntlet cryo gloves, high-top boots, face shield, etc, etc. After all that the final sentence is the "punch line" - ...and don't wear anything that can trap LN2 against your body. Go figure...
The above are my personal opinions, not those of my employer.
Woody } -------------------------------------------------------------- } ---------- } The Microscopy ListServer -- Sponsor: The Microscopy Society } of America } To Subscribe/Unsubscribe -- Send Email to } ListServer-at-MSA.Microscopy.Com } On-Line Help } http://www.msa.microscopy.com/MicroscopyListserver/FAQ.html } -------------------------------------------------------------- } ---------. } } } Objet : liquid nitrogen } } } To all the cyomicroscopists arround, } } I remember that a few months ago ( or years perhaps) there } was a debate on } the list concerning burns with liquid nitrogen. Since I } cannot find the } summary on my computer I address all of you the question : } do you wear } gloves to work with and "in" liquid nitrogen ? } I do not because I was a student of H. Sitte and know by } heart his safety } rules. I invited Keith Ryan a few years ago, and he too told } us the rules } but nevertheless my boss does not agree with me and wants to } force me to } wear gloves etc... } I am a member of the safety commettee in the lab and we have } a meeting } next week. } My second inquiry is : Could you tell me about your } experience with liquid } nitrogen or send the } web site where I can find the information? (as I remember } there were some } funny stories on this list. In one somebody takes off all his clothes } running } away from a leaky, exploding container, and was not burned....) Thanks } } Daniele } } } } } } Veuillez noter qu'en cas de problčme d'envoi d'e-mail vous } pouvez aussi } } m'adresser votre message ŕ daniele.spehner-at-efs-alsace.fr } } If you have problem sending me an e-mail please try my } other address as } } follows : daniele.spehner-at-efs-alsace.fr } } } } Daničle Spehner, } } Head of the EM Department } } INSERM EPI 99-08, } } Etablissement Français du Sang-Alsace, } } 10 rue Spielmann, 67065 STRASBOURG } } FRANCE } } Veuillez noter qu'en cas de problčme d'envoi d'e-mail vous } pouvez aussi } m'adresser votre message ŕ daniele.spehner-at-efs-alsace.fr } If you have problem sending me an e-mail please try my other } address as } follows : daniele.spehner-at-efs-alsace.fr } } Daničle Spehner, } INSERM EPI 99-08, } Etablissement Français du Sang-Alsace, } 10 rue Spielmann, 67065 STRASBOURG } FRANCE } }
All, Just a reminder for those interested. We will begin evaluating applications soon for the position outlined below, but there is still time if you would like to apply...
The Department of Geosciences at the University of Massachusetts invites applications for a Post-Doctoral Position in Geology. This two-year position is specifically aimed at the rapidly emerging techniques of electron microprobe analysis in geochronologic applications. UMass is currently developing an optimized electron microprobe with Cameca, France that is specifically designed for the exploration of techniques for age mapping and dating of minerals (e.g. monazite, zircon) and trace element analysis. This project includes optimization on virtually all fronts, hardware, software, and technique development. One future direction will involve synthesis and analysis of standards for calibration and background measurement studies. The successful applicant will collaborate with UMass Geosciences faculty (and associates) and with Cameca, and will be directly involved with improvements and modifications to software, continued evaluation of analytical techniques, synthesis and characterization of standard materials, and application of the new techniques to geologic problems. Applicants must have completed a Ph.D. in Geology, materials science, or other physical science, with preference given to those with significant experience in electron microprobe analysis, x-ray spectrometry, materials microanalysis, and/or scientific programming.
Please send a letter of application, resume, and two reference letters to Michael L. Williams, Dept. of Geosciences, University of Massachusetts, 611 North Pleasant Street, Amherst, MA 01003-9279. The University of Massachusetts is an Equal-Opportunity Affirmative -Action Employer; women and members of minority groups are encouraged to apply.
Review of applicants will begin March 15th; the position will remain open until a successful candidate is identified.
**************** Michael J. Jercinovic Assistant Professor Department of Geosciences University of Massachusetts 611 North Pleasant Street Amherst, MA 01003-9297 E-Mail: mjj-at-geo.umass.edu Phone: (413) 545-2431 http://www.geo.umass.edu/faculty/jercinovic.html
Electron Microprobe Laboratory http://www.geo.umass.edu/probe/probe.html
Thanks to all who replied to my question. The new NIST-traceable sample is due to arrive tomorrow, so we will proceed from there. The service engineer will be working with me to try to get better agreement between the X and Y directions, although I guess the pot adjustments are somewhat tricky.
I did have the sample in the scope untilted. One lister suggested having the calibration sample in the SEM with the sample of interest to do the calibration, take the measurement, and do the calibration again. But most of my samples are cross sections. Anyone have a fancy holder to accommodate a cross section at 90 degrees, plus a calibration sample? That could be useful.
Thanks again for your help.
Nancy Zjaba, Technical Staff Alfalight Inc. 1832 Wright Street Madison, WI 53704 (608) 240-4875 nzjaba-at-alfalight.com
I am trying to locate a book on digital imaging/publishing and color balancing/printing published recently by a MSA member. Hopefully, someone will remember a presentation given a couple years ago at our M&M meeting in Philadelphia. The speaker included a good discussion on color balancing especially for publication and printing. I belive the fellow was a faculty member (molecular biologist?) and had just completed writing the book that was to go to press shortly. I certainly remember the presentation but (blush-blush) not the guys name. I do recall that it was not John Russ or John Mackenzie..
They say that the mind is the second thing to go...... Send ginseng.......
John B.
-- ############################################################## John J. Bozzola, Ph.D., Director I.M.A.G.E. (Integrated Microscopy & Graphics Expertise) 750 Communications Drive - MC 4402 Southern Illinois University Carbondale, IL 62901 U.S.A. Phone: 618-453-3730 Fax: 618-453-2665 Email: bozzola-at-siu.edu Web: http://www.siu.edu/departments/shops/cem.html ##############################################################
Could anyone who has an Oxford MonoCL2 or a Gatan MonoCl3 installed on an Hitachi S-4700 FE-SEM contact me offline? It would be much appreciated.
Best,
Angela
----------------------------------------- **Please note new department name**
Angela V. Klaus, Ph.D. Director, Microscopy and Imaging Facility American Museum of Natural History Central Park West at 79th Street New York, NY 10024 USA Email: avklaus-at-amnh.org Tel: 212-769-5977 Fax: 212-496-3480 -----------------------------------------
I run a daily performance check using a calibrated secondary standard for measurements in both X and Y direction. The measured dimensions in both X and Y as well as the ratio of the two must be within spec before the instrument is used. I wrote a Standard Operating Procedure for this and the same will become the standard for a daily performance check of our digital cameras on optical microscopes and LSCM. What you experienced is the very reason we have to do this!
Damian Neuberger
----- Original Message ----- } From: {"Paul.Nolan-at-alcan.com"-at-sparc5.microscopy.com} To: {Microscopy-at-sparc5.microscopy.com} Sent: Thursday, March 14, 2002 7:59 AM
Below is the result of your feedback form (NJZFM-ultra-55). It was submitted by (jwagner-at-remc12.k12.mi.us) from http://www.msa.microscopy.com/Ask-A-Microscopist.html on Thursday, March 14, 2002 at 21:09:46 ---------------------------------------------------------------------------
Email: jwagner-at-remc12.k12.mi.us Name: John Wagner
Organization: Just me
Education: Graduate College
Location: City, State, Country
Question: I used to spend hours as a child looking through my microscope. Now I have children and I have just purched two microscopes thru ebay. One is a Bausch & Lomb binocular Dynoptic, the other is a Fisher student model. I am having a hard time finding literature about the Dynoptic. Even though there is a head a base that I can bid on to get the better light source for Koehler lighting. I want to know more about the type of objectives...this isn't an infinity corrected scope is it? Stuff like that, you know!
Although I would have to agree that the effect of asphixiation is the most serious it is certainly not the most common.
Problems with asphixiation can be dealt with by building design, forced ventilation and environmental conditions around the area.
Problems with burns are more common and are often caused by over familiarity. Users are normally wary of liquid N2 the first time they see it, lots of steam and boiling, but they can then become cavalier in their handling. They find that the occasional splash does not hurt so they don't worry when they get several splashes until they find it trapped in their sleeve or bracelet. They forget that the high pressure jet of steam when filling from the main storage dewar has a jet of N2 in the core, so they get burnt.
I am on our dept safety committee and I see the accident/incident reports, probably averaging 1 every 2 years, from our ever changing base of some 60 N2 users.
I use cryo gloves to handle cold objects but not when handling dewars or buckets. I tell people all the hazards and try to teach them the real dangers - burns and complacency: liquid N2 hurts so avoid it.
I would also like to cover another effect (I cannot spell phenomenon). When filling some EDX or ACD dewars from room temperature they can throw out a large amount of N2 shortly after filling. This is caused by the N2 boiling on the bottom of the dewar creating a N2 gas layer which insulates, as the dewar gets colder there is less boiling and a smaller gas insulation layer. When the liquid N2 finally touches the bottom of the dewar the boiling rate increases and suddenly you get a lot of gas given off. If the dewar is fairly full of liquid N2 then liquid is ejected from the dewar with the gas. When filling from cold only put a small amount of N2 in the dewar until it is properly cooled. This will prevent you getting showered with N2 a few minutes after filling the dewar.
Ron
} } } } Objet : liquid nitrogen } } } } } } To all the cyomicroscopists arround, } } } } I remember that a few months ago ( or years perhaps) there } } was a debate on } } the list concerning burns with liquid nitrogen. Since I } } cannot find the } } summary on my computer I address all of you the question : } } do you wear } } gloves to work with and "in" liquid nitrogen ? } } I do not because I was a student of H. Sitte and know by } } heart his safety } } rules. I invited Keith Ryan a few years ago, and he too told } } us the rules } } but nevertheless my boss does not agree with me and wants to } } force me to } } wear gloves etc... } } I am a member of the safety commettee in the lab and we have } } a meeting } } next week. } } My second inquiry is : Could you tell me about your } } experience with liquid } } nitrogen or send the } } web site where I can find the information? (as I remember } } there were some } } funny stories on this list. In one somebody takes off all his clothes } } running } } away from a leaky, exploding container, and was not burned....) Thanks } } } Daniele } } } } } } } } } Veuillez noter qu'en cas de problčme d'envoi d'e-mail vous } } pouvez aussi } } } m'adresser votre message ŕ daniele.spehner-at-efs-alsace.fr } } } If you have problem sending me an e-mail please try my } } other address as } } } follows : daniele.spehner-at-efs-alsace.fr } } } } } } Daničle Spehner, } } } Head of the EM Department } } } INSERM EPI 99-08, } } } Etablissement Français du Sang-Alsace, } } } 10 rue Spielmann, 67065 STRASBOURG } } } FRANCE } } } } Veuillez noter qu'en cas de problčme d'envoi d'e-mail vous } } pouvez aussi } } m'adresser votre message ŕ daniele.spehner-at-efs-alsace.fr } } If you have problem sending me an e-mail please try my other } } address as } } follows : daniele.spehner-at-efs-alsace.fr } } } } Daničle Spehner, } } INSERM EPI 99-08, } } Etablissement Français du Sang-Alsace, } } 10 rue Spielmann, 67065 STRASBOURG } } FRANCE } } } } }
---------------------- Mr. R.C. Doole Department of Materials, University of Oxford. Parks Road, Oxford. OX1 3PH. UK. Phone +44 (0) 1865 273701 Fax +44 (0) 1865 283333 ron.doole-at-materials.ox.ac.uk
Someone who knows a lot about stereology and could probably help you out on stereology software is Professor Hans Jřrgen G. Gundersen from the University of Aarhus in Denmark.
You can find more information on the website of the Stereological Research Laboratory of the University of Aarhus:
http://www.health.au.dk/dept/stereol.htm
Best regards,
Peter
-- Dr. Peter Van Osta
Union Biometrica N.V./S.A. European Scientific Operations (ESO)
The discussion seems to be focused around contact with the LN2, however, in my experience one is more likely to be injured from handling the transfer equipment. i.e. an extremely cold transfer line or a frozen valve handle. My vote is to wear very loose fitting gauntlet style gloves.
} John A. Robson } _____________________________________________________ } } Boehringer Ingelheim Pharmaceuticals, Inc. } Research and Development } 900 Ridgebury Road / P. O. Box 368 } Ridgefield, CT 06877-0368 } } phone: 203.798.5640 } fax: 203.798.5698 } email: jrobson-at-rdg.boehringer-ingelheim.com } } } } } -----Original Message----- } From: Ekstrom, Harry [SMTP:harry.ekstrom-at-honeywell.com] } Sent: Thursday, March 14, 2002 3:21 PM } To: 'Daniele Spehner'; microscopy-at-sparc5.microscopy.com } Subject: RE:Liquid nitrogen } } ------------------------------------------------------------------------ } The Microscopy ListServer -- Sponsor: The Microscopy Society of America } To Subscribe/Unsubscribe -- Send Email to ListServer-at-MSA.Microscopy.Com } On-Line Help http://www.msa.microscopy.com/MicroscopyListserver/FAQ.html } -----------------------------------------------------------------------. } } } Despite all the facts that are out there concerning the safe handling of } LN i.e.. the film of oil on the skin is a } protectant in and of itself and clothing just absorbs the LN and thus } could cause burns to the skin below....we still } use cryoprotective gloves, a full face shield and a cryo bib type apron to } protect clothing. } } Seems a little hard to convince the safety people that the protective gear } we need when handling LN is none or no } clothing. } } } Harry Ekstrom } Materials Laboratory } } *Phone: (602) 231-2744 } ?Fax: (602) 231-1547 } *e-mail: harry.ekstrom-at-honeywell.com } {mailto:harry.ekstrom-at-honeywell.com} } } } } } }
1. How does the shape of the beam affect X and Y magnifications? AND, 2. How about SED's or other detectors that are placed symmetrically or asymmetrically with respect to the specimen and multi-image registration?
Regards,
Frederick C. Monson, PhD Center for Advanced Scientific Imaging West Chester University West Chester, Pennsylvania, USA, 19383 610-738-0437 fmonson-at-wcupa.edu
Thanks Scott. Parts of our lab are ISO certified but not our electron optics department. I do have several (non traceable) standards that i used to find out that we did indeed have a problem. Its just that it never occurred to me to think about doing a check. (bad practice on my part i guess) I think it may be a monthly check from now often We do have our instrument calibrated twice a year when we have our routine done. This is the first time in my 15 years in EM that i have seen an SEM go that far out of whack. It may have been because we were fiddling around hooking up some new peripherals.
PS If anyone happens to know who i am and know my equipment manufacturer is, i must say that the service engineers are top notch and got me up and running the next morning.
Paul D. Nolan Electron Optics
Alcan International Limited Kingston Research and Development Centre P.O.Box 8400, 945 Princess Street Kingston, Ontario K7L 5L9
"Walck, Scott D." To: "Microscopy (E-mail)" {microscopy-at-sparc5.microscopy.com} {walck-at-ppg.com} cc: Subject: RE: SEM magnification calibration AND TEM 03/14/2002 04:29 PM
------------------------------------------------------------------------ The Microscopy ListServer -- Sponsor: The Microscopy Society of America
That is one good reason for having standards such as ISO9000 and QS9000. We have the calibration requirements and magnification calibration performed when a routine is done. On a TEM, whenever the column is split it should be checked, and otherwise once or twice a year with service routines is sufficient. You do need a traceable standard if your lab is certified. Otherwise, you can get very good standards that are not traceable that are accurate for most work and relatively inexpensive.
An important point that is being missed, but that was pointed out in the original question is that both directions, X and Y, should be checked. This is very important for TEM diffraction patterns. Here the easy check is to take two ring patterns acquired back-to-back and rotate one 90 degrees with respect to the other and check that the patterns are still coincident. Otherwise you have to take the aspect ratio difference into account
-Scott
Scott D. Walck, Ph.D. PPG Industries, Inc. Glass Technology Center P. O. Box 11472 (letters) Guys Run Rd. (packages) Pittsburgh, PA 15238-0472
Walck-at-PPG.com
(412) 820-8651 (office) (412) 820-8515 (fax)
-----Original Message----- } From: "Paul.Nolan-at-alcan.com"-at-sparc5.microscopy.com [mailto:"Paul.Nolan-at-alcan.com"-at-sparc5.microscopy.com] Sent: Thursday, March 14, 2002 9:00 AM To: Microscopy-at-sparc5.microscopy.com
On a similar note: We discovered yesterday that our SEM magnification calibration is out by about 25 % !! We are working on recalibrating but according to our best estimate it has been this way for about 3 weeks. My question(s) is this. How often do people check the magnification on their SEM's. How often do you calibrate. Like the temperature of my oven .. I always assume the magnification of my SEM is pretty close to the stated value. Anyway ..back to redoing the last 3 weeks of work !!
Cheers
Paul D. Nolan
Nancy Zjaba
{nzjaba-at-alfaligh To: "'Microscopy-at-MSA.Microscopy.Com'" {Microscopy-at-sparc5.microscopy.com}
t.com} cc:
Subject: SEM magnification calibration 03/13/2002 03:33
PM
------------------------------------------------------------------------ The Microscopy ListServer -- Sponsor: The Microscopy Society of America
Hello, listers,
I am using an FESEM (Hitachi S-4000). I've noticed a disparity in magnification calibration between the X and Y directions. I get about 1.5 percent error in the Y direction, and almost 5 percent in the X direction. Because the percentages still fall within 10 percent, the field service engineer believes that this is not a problem.
What do you think? Thanks in advance for your input.
Nancy Zjaba, Technical Staff Alfalight Inc. 1832 Wright Street Madison, WI 53704 (608) 240-4875 nzjaba-at-alfalight.com
From an old guy who only thinks he can find his way out of a cinched paper bag,
The TCID 50 tells it all. Even the infectivity has to be measured at the 50% error level. Is there an absolute morphological method that can exceed even that poor level of precision? I don't know.
Answers to questions:
My best Answer to all 3 questions, IF they were mine. The Salk institute is just down the road from you.
My answers.
1. negative stain 2. tritiated (or otherwise labeled) oligomers that will bind exclusively with free, genomic RNA, and will NOT bind with complete virus, encapsulated or not. Scintillation counting (my first choice) or EM autoradiography (more statistics). 3. I suspect not, but they are very small. I would NOT start such an investigation unless I first acquired a Beckman Airfuge with an EM head, because you are demanding the capacity to count ALL particles in a known volume.
I have NO relationship to the Airfuge except as a satisfied user, and the Airfuge is the only part of my response that I didn't capture by free-thinking.
Regards,
Fred Monson
Frederick C. Monson, PhD Center for Advanced Scientific Imaging West Chester University West Chester, Pennsylvania, USA, 19383 610-738-0437 fmonson-at-wcupa.edu
} ---------- } From: Christina Chan } Sent: Monday, March 11, 2002 5:51 PM } To: Microscopy-at-sparc5.microscopy.com } Subject: EM pics of Poliovirus } } ------------------------------------------------------------------------ } The Microscopy ListServer -- Sponsor: The Microscopy Society of America } To Subscribe/Unsubscribe -- Send Email to ListServer-at-MSA.Microscopy.Com } On-Line Help http://www.msa.microscopy.com/MicroscopyListserver/FAQ.html } -----------------------------------------------------------------------. } } } I was given this address as a source for EM information, but I am not } trained in EM _at all_...so please forgive what may be basic } questions: } } 1. What is the procedure used for taking EM pictures of poliovirus } (RNA virus)? } 2. Is it possible to calibrate the number of genomes (capsulated RNA } viruses as well as free floating RNA) in a known aliquot of virus } dilution? } 3. Is it difficult to recognize poliovirus RNA in its capsulated and } free floating forms in an EM picture? } } Our lab is trying to find the number of genomes of poliovirus in a } stock solution of 10^8 TCID50/1ml. Any help or advice I could get } would be greatly appreciated!! } } Thanks, } Christina Chan } -- } LSRA - Lab Manager } Maldonado Lab } Pediatrics, Infectious Disease } Stanford University Medical Center } lab: (650) 736-1310 } cell: (650) 996-0098 } }
i am a firm believer that no gloves are better than any gloves the risk is to great. while in dallas a not to bright tech wore the wrong gloves and was badly burned. the liendefrost effect will protect from the momentary contact with LN2. the key is to keep all contact to a minimum. john
Regarding liquid nitrogen safety, I do not use gloves (except when handling supercold transfer lines from the big dewars)for the same reasons that others have stated. Getting LN2 down inside a glove is no fun and the bulky cryo gloves make this clumsy tech even clumsier.
However, I have had two plastic funnels explode violently and scatter sharp plastic shards over quite a distance while transferring LN2 between dewars. I managed to locate metal funnels at a farm and home store, the only local source I was able to find, so that problem was solved. But I shudder to think of the hundreds of times I filled an eye level plastic funnel on the back of a Hitachi H500 to put nitrogen on the pumps.
Also, I nearly beaned myself one time through stupidity when I loosened the spigot on a 50L dewar without bleeding the pressure off first. The spigot popped out of the dewar like a huge champagne cork with surprising force, straight at my face. It was stopped about an inch from my nose by the safety cable attached to the dewar handle.
Randy
Randy Tindall EM Specialist Electron Microscopy Core Facility W122 Veterinary Medicine University of Missouri Columbia, MO 65211 Tel: (573) 882-8304 Fax: (573) 884-5414 Email: tindallr-at-missouri.edu Web: http://www.biotech.missouri.edu/emc/
} } I am trying to locate a book on digital imaging/publishing and color } balancing/printing published recently by a MSA member. Hopefully, } someone will remember a presentation given a couple years ago at our } M&M meeting in Philadelphia. The speaker included a good discussion } on color balancing especially for publication and printing. I belive } the fellow was a faculty member (molecular biologist?) and had just } completed writing the book that was to go to press shortly. I } certainly remember the presentation but (blush-blush) not the guys } name. I do recall that it was not John Russ or John Mackenzie.. } } They say that the mind is the second thing to go...... Send ginseng....... } } John B. } } -- } ############################################################# Hi John, Was is M. Joseph Costello and/or John J. Lemasters? (UNC-Chapel Hill) I have a73 page handout from them entitled "The Digital Darkroom" that I got at the Philadelphia meeting session of the same name. Lee -- Lee Cohen-Gould Electron & Optical Microscopy Facilities Weill Medical College of Cornell U. (212)746-6146 Rms A-105, LC-207
1. The shape of the beam affects the astigmatism that you see in the image, not the magnification. Of course, you should have a perfectly conical beam after correcting for astigmatism.
2. Detectors can have an affect on the position of the beam. They can shift the beam when they are inserted of parameters are changed. This is particularly noticeable at lower beam energies. As an example, if you change the bias on your E-T detector while operating at low voltage, you will see the image shift. This is because the beam is shifted on your sample. Images in the SEM are created from the signal created at the position where the beam hits the sample, therefore, all of your images from different detectors will be in registration if you take them at the same time or under the same conditions. That is why you do not turn off the bias voltage on the E-T detector when you use another detector such as a backscatter or in-lens detector. Because the shift is small, these shifts will not have any affect on the magnification.
-Scott
Scott D. Walck, Ph.D. PPG Industries, Inc. Glass Technology Center P. O. Box 11472 (letters) Guys Run Rd. (packages) Pittsburgh, PA 15238-0472
Walck-at-PPG.com
(412) 820-8651 (office) (412) 820-8515 (fax)
-----Original Message----- } From: Monson, Frederick C. [mailto:fmonson-at-wcupa.edu] Sent: Friday, March 15, 2002 8:26 AM To: 'List-Microscopy'
Question.
1. How does the shape of the beam affect X and Y magnifications? AND, 2. How about SED's or other detectors that are placed symmetrically or asymmetrically with respect to the specimen and multi-image registration?
Regards,
Frederick C. Monson, PhD Center for Advanced Scientific Imaging West Chester University West Chester, Pennsylvania, USA, 19383 610-738-0437 fmonson-at-wcupa.edu
Hello Listers, I have a question regarding sample prep for silicon IC's. Has anyone out there used an automated polisher for flat, planar surface polishing? I've been asked to look into them, but i would like to get a broad cross section of users input to go along with my own conclusions (when i get some). For any of you who have used them, I would like to know what make/model, ease of use, and does it do what it is supposed to do? Thank you all very much for your time Nick
Digital Image Capture and Management in Microscopy
May 3, 2002
A course on Digital imaging in light microscopy which will cover the following topics:
Optical Limitations in Light Microscopy...Photographic Imaging Strategies... Digital Imaging Strategies...Selection of Digital Capture (Camera vs. Scanner)...
Image Processing of Captured Images...Image File Formats...Printing Images... Color Management Systems...Database Management Software...Presentation Software for Oral Reports...Website Performance...Integration of Image Data with Sample Information, Calibration, Other Data & Reports...Acrobat and html Software for Written Reports and Archives...Examples of Efficient, Low Cost Image Handling Systems...
Examples of Electronic Microscopy Reports and Databases
The course instructors are Mary and John McCann of McCann Imaging.
Jeannette, I find 5% sodium meta-periodate to work well on reduced osmium postfixed samples in LR White for immuno. Mike D.
Jeannette Taylor wrote:
} ------------------------------------------------------------------------ } The Microscopy ListServer -- Sponsor: The Microscopy Society of America } To Subscribe/Unsubscribe -- Send Email to ListServer-at-MSA.Microscopy.Com } On-Line Help http://www.msa.microscopy.com/MicroscopyListserver/FAQ.html } -----------------------------------------------------------------------. } } This is an inquiry to anyone with experience in immunocytochemistry. } } I am preparing LR White embedded material for immunocytochemistry } studies and would appreciate some opinions on } the use of 5% or 10% hydrogen peroxide as an enchant. Is it too } aggressive or does it really improve the availability of antigenic } sites? } } Thank you, } } Jeannette Taylor } jvtaylo-at-emory.edu
If you are successful in persuading your safety management to your way of thinking about clothing, will you be posting invitations to your company safety meetings where the proper safety attire will be demonstrated?
With anticipation,
Nathan Haese Lafayette, CA
************* Your message ******************
"Despite all the facts that are out there concerning the safe handling of LN ... Seems a little hard to convince the safety people that the protective gear we need when handling LN is none or no clothing."
Harry Ekstrom Materials Laboratory
*Phone: (602) 231-2744 ?Fax: (602) 231-1547
__________________________________________________ Do You Yahoo!? Yahoo! Sports - live college hoops coverage http://sports.yahoo.com/
This posting makes an important point: The use of a face shield is primarily to protect oneself from flying debris- small explosions or violent fracture of embrittled hoses, funnels, etc. are a common hazard. LN2 splashed in the face would probably be harmless (unless a jet under pressure).
I would insist that gloves are still a good idea. Sometimes one is confronted with unexpected problems- an iced-over valve, super-cold components that are somehow in the way, etc. Without those gloves handy, it may be difficult to respond properly when things go wrong. Safety equipment also serves to remind us that we are doing hazardous operation, and its proper use limits hazards and (our own and our employers') liabilities.
-Another $.02
Jeffrey A Fortner Argonne National Laboratory CMT/205 9700 S. Cass Avenue Argonne, IL 60439 (630) 252-5594 FAX: (630) 972-4438
} Regarding liquid nitrogen safety, I do not use gloves (except when } handling supercold transfer lines from the big dewars)for the same reasons } that others have stated. Getting LN2 down inside a glove is no fun and } the bulky cryo gloves make this clumsy tech even clumsier. } } However, I have had two plastic funnels explode violently and scatter } sharp plastic shards over quite a distance while transferring LN2 between } dewars. I managed to locate metal funnels at a farm and home store, the } only local source I was able to find, so that problem was solved. But I } shudder to think of the hundreds of times I filled an eye level plastic } funnel on the back of a Hitachi H500 to put nitrogen on the pumps. } } Also, I nearly beaned myself one time through stupidity when I loosened } the spigot on a 50L dewar without bleeding the pressure off first. The } spigot popped out of the dewar like a huge champagne cork with surprising } force, straight at my face. It was stopped about an inch from my nose by } the safety cable attached to the dewar handle. } } Randy } } Randy Tindall } EM Specialist } Electron Microscopy Core Facility } W122 Veterinary Medicine } University of Missouri } Columbia, MO 65211 } Tel: (573) 882-8304 } Fax: (573) 884-5414 } Email: tindallr-at-missouri.edu } Web: http://www.biotech.missouri.edu/emc/ } } } }
1) In an SEM the magnification is determined (in X) by the ratio of the length scanned to the length displayed on the video unit. Similarly in Y. The shape of the beam is irrelevant. It is, of course, relevant for resolution. If your beam is not circular, you get different resolution in X and Y (also known as astigmatism).
2) Detector position: as the image on the screen is correlated with the beam position and not the detector position, it has no effect on magnification. You should be able to place your detector anywhere in the chamber (maybe not directly in the beam path :-) and it has no effect on the magnification. Same for multiple detectors.
mike
} } } } } } } } } } WE HAVE MOVED { { { { { { { { { please make a note of the new address below
Michael Bode, Ph.D. Soft Imaging System Corp. 12596 West Bayaud Avenue Suite 300 Lakewood, CO 80228 =================================== phone: (888) FIND SIS (303) 234-9270 fax: (303) 234-9271 email: mailto:info-at-soft-imaging.com web: http://www.soft-imaging.com ===================================
-----Original Message----- } From: Monson, Frederick C. [mailto:fmonson-at-wcupa.edu] Sent: Friday, March 15, 2002 6:26 AM To: 'List-Microscopy'
Question.
1. How does the shape of the beam affect X and Y magnifications? AND, 2. How about SED's or other detectors that are placed symmetrically or asymmetrically with respect to the specimen and multi-image registration?
Regards,
Frederick C. Monson, PhD Center for Advanced Scientific Imaging West Chester University West Chester, Pennsylvania, USA, 19383 610-738-0437 fmonson-at-wcupa.edu
Listers: Many thanks for all the input I got on this topic. I now have many more options to pursue. The Listserver is a great knowledge base and my thanks to Nestor for keeping it running.
-- ~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~ Becky Holdford (r-holdford-at-ti.com) 972-995-2360 972-598-1291 (pager) SC Packaging FA Development Texas Instruments, Inc. Dallas, TX ~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~
I would think that, at least for the users of LN2 in the US, there are OSHA regulations regarding what can be used and what not. Although the OSHA regulations may be a bit ambiguous, your employers or yourself may be held responsible if you act against those regulations and something happens. I went to the OSHA site (www.OSHA.gov) and looked up Nitrogen. Most of it dealt with gaseous N2, but there was this chapter:
PERSONAL PROTECTIVE EQUIPMENT
Workers should use appropriate personal protective clothing and equipment that must be carefully selected, used, and maintained to be effective in preventing skin contact with liquid nitrogen. The selection of the appropriate personal protective equipment (PPE) (e.g., gloves, sleeves, encapsulating suits) should be based on the extent of the worker's potential exposure to liquid nitrogen. There are no published reports on the resistance of various materials to permeation by liquid nitrogen.
As I said, it is ambiguous, but it clearly says, that "protective clothing .. must worn to prevent skin contact"
} } } } } } } } } } WE HAVE MOVED { { { { { { { { { please make a note of the new address below
Michael Bode, Ph.D. Soft Imaging System Corp. 12596 West Bayaud Avenue Suite 300 Lakewood, CO 80228 =================================== phone: (888) FIND SIS (303) 234-9270 fax: (303) 234-9271 email: mailto:info-at-soft-imaging.com web: http://www.soft-imaging.com ===================================
-----Original Message----- } From: John Hoffpauir [mailto:John.Hoffpauir-at-mail.tju.edu] Sent: Friday, March 15, 2002 7:09 AM To: cbutte-at-ameripol.com Cc: daniele.spehner-at-efs-alsace.fr; fortner-at-cmt.anl.gov; microscopy-at-sparc5.microscopy.com
i am a firm believer that no gloves are better than any gloves the risk is to great. while in dallas a not to bright tech wore the wrong gloves and was badly burned. the liendefrost effect will protect from the momentary contact with LN2. the key is to keep all contact to a minimum. john
The following Postdoctoral Research Associate position is available immediately at Monsanto Company in St. Louis, Missouri. Potential candidates please respond on line at the Monsanto website provided below. ----------------------------------------------------------------------
Monsanto Company Department: Research & Development Title: Postdoctoral Research Associate Req Number: mons-00000241 Location(s): St. Louis MO
Responsibilities: A two-year postdoctoral fellow position is available immediately for developing, implementing, and applying advanced microscopy techniques to elucidating the ultrastructure of plants, seeds, weeds and other biologicalsystems. Additionally, the selected individual is responsible for developing new methods to improve the sample preparation protocols of biological systems. The selected candidate will interact with multifunctional groups of scientists working on biotechnology projects.
Required Skills: The position requires a Ph.D. in plant biology or a related field with experience in advanced electron and light microscopy techniques. A strong background and extensive experience in TEM, high-resolution cryo-SEM, and confocal laser scanning microscopy techniques are essential. Experience with gene transformation in plants is a strong plus. The following key competencies are desired: highly motivated and interested in developing new imaging technologies; good interpersonal, verbal and written communication skills; innovative and seeking opportunity to improve existing techniques and processes.
To respond to this job, access our website -at-: www.monsanto.com Please be sure to select the proper source!
Monsanto values diversity and is an equal opportunity affirmative action employer.
Benefits include: 100 nm pitch Highly Uniform Small Line Edge Roughness High Image contrast Wafer or die formats Cleanable NIST-Traceable Low defectivity {1% accuracy (95% confidence)
Click on "Applications Notes" for more details.
Regards -
Marc Helvey Strategic Accounts Manager VLSI Standards, Inc. 3087 North First Street San Jose, CA 95134-2006 Phone: (408) 428-1800, ext. 108 FAX: (408) 428-9555 E-Mail: marc.helvey-at-vlsistd.com {mailto:marc.helvey-at-vlsistd.com} Internet: http://www.vlsistandards.com
-----Original Message----- } From: "Paul.Nolan-at-alcan.com"-at-sparc5.microscopy.com [mailto:"Paul.Nolan-at-alcan.com"-at-sparc5.microscopy.com] Sent: Thursday, March 14, 2002 6:00 AM To: Microscopy-at-sparc5.microscopy.com
On a similar note: We discovered yesterday that our SEM magnification calibration is out by about 25 % !! We are working on recalibrating but according to our best estimate it has been this way for about 3 weeks. My question(s) is this. How often do people check the magnification on their SEM's. How often do you calibrate. Like the temperature of my oven .. I always assume the magnification of my SEM is pretty close to the stated value. Anyway ..back to redoing the last 3 weeks of work !!
Cheers
Paul D. Nolan
Nancy Zjaba
{nzjaba-at-alfaligh To: "'Microscopy-at-MSA.Microscopy.Com'" {Microscopy-at-sparc5.microscopy.com}
t.com} cc:
Subject: SEM magnification calibration 03/13/2002 03:33
PM
------------------------------------------------------------------------ The Microscopy ListServer -- Sponsor: The Microscopy Society of America
Hello, listers,
I am using an FESEM (Hitachi S-4000). I've noticed a disparity in magnification calibration between the X and Y directions. I get about 1.5 percent error in the Y direction, and almost 5 percent in the X direction. Because the percentages still fall within 10 percent, the field service engineer believes that this is not a problem.
What do you think? Thanks in advance for your input.
Nancy Zjaba, Technical Staff Alfalight Inc. 1832 Wright Street Madison, WI 53704 (608) 240-4875 nzjaba-at-alfalight.com
Frederick, On an SEM, the magnification is determined by the strength of the scan coil deflection. The deflection is a function of the scan coil geometry and the current driving the scan coil. Since the scan coil geometry is essentially fixed but not necessarily perfectly balanced between the x and y axes, an SEM will typically have potentiometers to fine tune the scan coil current. You should be careful when adjusting these potentiometers. Since many (?most/?all) SEMs compensate for the rotation of the image due to the objective lens, you must be careful that you differentiate between a rotation compensated image and a non-compensated image. If you try to adjust the relative magnification on a rotation compensated image you will probably find the process very confusing. The x and y axes on the image will not correspond directly to the x and y scan coils. More than likely the image axes will be a linear combination of the x and y coils. The shape of the beam does not affect the x and y magnifications just the sharpness of the image. Likewise, the placement of the detectors would not effect the x and y magnifications. If you observe a shift in your image when you select different detectors it is more than likely this results from fields generated by the detectors interacting with the beam. For example, the secondary detector uses a many kV potential to pull electrons from the sample. Turn this potential on and off while observing a back-scatter image and you may notice an image shift.
Sincerely,
Nicholas W M Ritchie
~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~ ~\ Nicholas W. M. Ritchie, Ph.D. /~ | Aspex Instruments | \ _ 175 Sheffield Drive _ / / Delmont, PA 15626 \ | (724) 468-5400 | ~/ nritchie-at-aspexllc.com \~ ~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~
-----BEGIN PGP SIGNATURE----- Version: PGP Personal Privacy 6.5.8
Your story reminded me of a concern our safety dept. discovered many years ago. We had two valves in series on our 160 liter LN2 tanks. We never thought of the remote possibility of getting liquid trapped between these valves. I can only imagine the sound that would make.
Russ Gillmeister Xerox ~~~~~~~~~~~~~
-----Original Message----- } From: Tindall, Randy D. [mailto:TindallR-at-missouri.edu] Sent: Friday, March 15, 2002 9:37 AM To: microscopy-at-sparc5.microscopy.com
Regarding liquid nitrogen safety, I do not use gloves (except when handling supercold transfer lines from the big dewars)for the same reasons that others have stated. Getting LN2 down inside a glove is no fun and the bulky cryo gloves make this clumsy tech even clumsier.
However, I have had two plastic funnels explode violently and scatter sharp plastic shards over quite a distance while transferring LN2 between dewars. I managed to locate metal funnels at a farm and home store, the only local source I was able to find, so that problem was solved. But I shudder to think of the hundreds of times I filled an eye level plastic funnel on the back of a Hitachi H500 to put nitrogen on the pumps.
Also, I nearly beaned myself one time through stupidity when I loosened the spigot on a 50L dewar without bleeding the pressure off first. The spigot popped out of the dewar like a huge champagne cork with surprising force, straight at my face. It was stopped about an inch from my nose by the safety cable attached to the dewar handle.
Randy
Randy Tindall EM Specialist Electron Microscopy Core Facility W122 Veterinary Medicine University of Missouri Columbia, MO 65211 Tel: (573) 882-8304 Fax: (573) 884-5414 Email: tindallr-at-missouri.edu Web: http://www.biotech.missouri.edu/emc/
After several decades of handling liquid nitrogen in what I then thought was a safe manner (although I'm horrified to think of some of the things that I've done over the years before I knew better), I recently had a chance to learn more than I ever wanted to know about liquid nitrogen handling in general and gloves in particular as I did an evaluation of additions to the product line of SPI Supplies. The result of the effort can be found on the following URL
http://www.2spi.com/catalog/supp/cryo-gloves.html
and the pages linked to it. There are a couple of points that I think add to the overall discussion of liquid nitrogen handling safety:
1. There are a variety of designs of gloves, and one shouldn't draw general conclusions about gloves from experience with one design. For example, people who might pour liquid nitrogen into the gloves can use those with wrist bands or those that extend up the arm.
2. Modern materials offer better protection against liquid nitrogen than leather, and either offers infinitely more protection than bare skin. Given the same spill, it takes longer for you to feel the effect of the liquid nitrogen with the man-made materials than with leather. Yes, you can safely pour small amounts of liquid nitrogen on your skin; the vapor blanket due to the high vapor pressure of nitrogen at its boiling point will protect you **if** you do not get any on your clothes or rings or watches or anything else that will transmit heat (or in this case cold). You can get severely burned if rings or clothes are cooled to a low temperature, as several listers have pointed out.
3. Safety equipment is designed to protect against accidents, not to enable you to do things that you shouldn't do. Sticking your hand into liquid nitrogen, no matter what you're wearing, is a bad idea.
4. The material from which modern protective gloves are made offers excellent protection against liquid nitrogen. Seams in that material (and a glove has several seams in it) are another matter. While all gloves made from the modern materials can be called "waterproof" because the material from which they are made is waterproof, for the best protection, gloves are available with a continuous internal layer which prevents liquid penetration through the seams.
5. Gloves offer protection against things that might have been cooled by the flowing stream of liquid nitrogen, like valves and hoses. A couple of weeks ago, I caught myself about to shut off a valve that someone else had opened. Why should I be wearing gloves; I was just walking down the hall.
6. Gloves can protect you from cryoburns, which can do a lot of damage to you. No glove, however, will protect you against the hazard of asphyxiation, which can kill you.
Disclaimer: I am the Laboratory Director of Structure Probe, Inc. which is the parent company of SPI Supplies. We have an obvious interest in promoting the use of the safety equipment which we sell, but we have an even greater interest in keeping our customers, and those of our competitors, alive, well and whole.
Andy
Andrew W. Blackwood, Ph.D. Structure Probe, Inc. P.O. Box 656 West Chester, PA 19381-0656 Ph: 1 610 436 5400 FAX: 1 610 436 5755 e-mail: ablackwood-at-2spi.com WWW: http://www.2spi.com
-------- REPLY, Original message follows --------
} Date: Thursday, 14-Mar-02 03:24 PM } } From: Daniele Spehner \ Internet: (daniele.spehner-at-efs-alsace. fr) } To: MICROSCOPY BB \ Internet: } (microscopy-at-sparc5.microscopy.com) } } Subject: Liquid nitrogen } } ------------------------------------------------------------------------ } The Microscopy ListServer -- Sponsor: The Microscopy Society of America To
We use LN2 that is plumbed to our lab. from a large tank outside of our building. The tank is several thousand gallons when full. There are no cryogenic pumps between the tank and our hose in the lab. It is merely the gas prssure derived thru a heat exchanger outside that pushes the LN2 thru the line. That pressure can be as high as 150 psi. at times so I have to agree with Jeffrey that there are considerations other than "burns." At LN2 temperature, many things get very brittle and prone to fracture, as described by Jeff.
It is better to be safe than to fill out all the paperwork and insurance forms, not to mention the visit from "The Safety Guy."
Regards,
Peter Tomic Anadigics, inc.
-----Original Message----- } From: Fortner, Jeffrey A. [mailto:fortner-at-cmt.anl.gov] Sent: Friday, March 15, 2002 12:03 PM To: microscopy-at-sparc5.microscopy.com
This posting makes an important point: The use of a face shield is primarily to protect oneself from flying debris- small explosions or violent fracture of embrittled hoses, funnels, etc. are a common hazard. LN2 splashed in the face would probably be harmless (unless a jet under pressure).
I would insist that gloves are still a good idea. Sometimes one is confronted with unexpected problems- an iced-over valve, super-cold components that are somehow in the way, etc. Without those gloves handy, it may be difficult to respond properly when things go wrong. Safety equipment also serves to remind us that we are doing hazardous operation, and its proper use limits hazards and (our own and our employers') liabilities.
-Another $.02
Jeffrey A Fortner Argonne National Laboratory CMT/205 9700 S. Cass Avenue Argonne, IL 60439 (630) 252-5594 FAX: (630) 972-4438
} Regarding liquid nitrogen safety, I do not use gloves (except when } handling supercold transfer lines from the big dewars)for the same reasons } that others have stated. Getting LN2 down inside a glove is no fun and } the bulky cryo gloves make this clumsy tech even clumsier. } } However, I have had two plastic funnels explode violently and scatter } sharp plastic shards over quite a distance while transferring LN2 between } dewars. I managed to locate metal funnels at a farm and home store, the } only local source I was able to find, so that problem was solved. But I } shudder to think of the hundreds of times I filled an eye level plastic } funnel on the back of a Hitachi H500 to put nitrogen on the pumps. } } Also, I nearly beaned myself one time through stupidity when I loosened } the spigot on a 50L dewar without bleeding the pressure off first. The } spigot popped out of the dewar like a huge champagne cork with surprising } force, straight at my face. It was stopped about an inch from my nose by } the safety cable attached to the dewar handle. } } Randy } } Randy Tindall } EM Specialist } Electron Microscopy Core Facility } W122 Veterinary Medicine } University of Missouri } Columbia, MO 65211 } Tel: (573) 882-8304 } Fax: (573) 884-5414 } Email: tindallr-at-missouri.edu } Web: http://www.biotech.missouri.edu/emc/ } } } }
1. The shape of the beam is a basically a result of the irregularities in the generation and shaping of the beam within the gun and column and are termed astigmatism (to be more correct, a collection of aberrations that we collectively refer to as astigmatism). However, your second question also points to a form of astigmatism that is caused by irregularities in the electrical fields within the sample chamber. The same sample chamber electrical field irregularities can cause additional complications to the compensations for x and y magnifications.
2. All secondary electron detectors, and most modern BSE detectors, introduce into the sample chamber, in close proximity to the beam, high voltage electrical fields. SE detectors can vary widely, but most are asymmetrical to the beam. Most use a voltage of around +10,000 Volts on the scintillator face to provide increased efficiency of scintillation. Most, but not all, are further surrounded by a screen that is maintained at around +300 Volts. This two stage voltage not only provides for efficient collection of secondary electrons, but also helps to shield the beam from the influence of the higher voltage fields from the scintillator surface. Any electrical field gradient within the sample chamber will affect the position of the beam as well as the resultant shape of the beam itself. These fields are a problem primarily when the accelerating voltage changes, as their effect will be in proportion to the energy of the electrons in the beam. Due to the beam energy narrowing effects of greater condenser currents, the astigmatic effects of these electrical fields can be reduced, but their effects on beam position will remain.
As always, in these complex instruments, the resultant image is a balance of many influences that may, or may not, be optimized for a particular situation. My prior point about the number of compensations available to service engineers in various instruments relates to this point in particular. If adequate adjustments are available for the compensation of the accelerating voltage, these magnification related effects can also be canceled out. However, modern instruments are moving away from the multitude of adjustments available previously. In doing so, the manufacturers are limiting the ultimate precision available over the full range of operating conditions of their instruments. Doing so also reduces the training required for their service staff, so to their bottom line it is attractive; and in the more production oriented usage of today may be acceptable.
Allen R. Sampson Advanced Research Systems 317 North 4th. Street St. Charles, Illinois 60174
} } Question. } } 1. How does the shape of the beam affect X and Y magnifications? } AND, } 2. How about SED's or other detectors that are placed symmetrically } or asymmetrically with respect to the specimen and multi-image registration? } } Regards, } } Frederick C. Monson, PhD } Center for Advanced Scientific Imaging } West Chester University } West Chester, Pennsylvania, USA, 19383 } 610-738-0437 } fmonson-at-wcupa.edu }
Fred, In an SEM neither the shape of the beam nor the detectors have any effect on magnification. However, because of the double deflection scan system used by most SEMs, working distance can have a considerable effect on the X to Y ratio if the "knees" aren't set correctly.
Ken Converse owner Quality Images third party SEM service Delta, PA
Monson, Frederick C. wrote:
} ------------------------------------------------------------------------ } The Microscopy ListServer -- Sponsor: The Microscopy Society of America
I just got my emails to you bounced back after 3 days with "permanent fatal errors". This was copy/pasting in your email address from your message. Please contact me.
Apologies to the list.
Phil -- }}}}}}}}}}}}}}}}}{{{{{{{{{{{{{{{{{ Philip Oshel Supervisor, AMFSC and BBPIC microscopy facilities Department of Animal Sciences University of Wisconsin 1675 Observatory Drive Madison, WI 53706 - 1284 voice: (608) 263-4162 fax: (608) 262-5157 (dept. fax)
I have some used SEM sample prep equipment to pass along to a new home. The following units were all purchased in 1983; the first three were refurbished by the sales/service rep just before being replaced in late 2001 and all were working fine as of that time:
1. Denton 502 floor model vacuum evaporator with large diff pump, configured with one post for carbon rods and two posts (one high, one low) for carbon fiber or metal wire (or baskets), rotating/tilting stage
2. Denton Desk-1 sputter coater fitted with (still-useable) Au/Pd target
3. Denton DCP Critical Point Dryer 4. Kevex horizontally-mounted Si(Li) detector with rotating window turret, used on a Cambridge 250 Mark 2 SEM. Stored dry, still working fine when boxed in late 2001.
Please contact me offline if you're interested. Thanks, Dee
*************************************************************** Please do not publicly post any of my correspondence without permission
Dee Breger Mgr. SEM/EDX Facility Lamont-Doherty Earth Observatory 61 Route 9W Palisades, NY 10964 USA T: 845/365-8640 F: 845/365-8155
http://www.ldeo.columbia.edu/micro http://www.discovery.com/area/science/micro/micro1.html http://www.lsc.org/antarctica/front.html Journeys in Microspace (Columbia University Press, 1995)
Even graduate work 50 yards uphill from Goldstein and Joy didn't give me access to the etherized esoterica of their engineer's understanding of these matters many years ago. After all these years, I finally got it. Thanks to all participants, and those kinder souls who might have felt the urge to 'slap me upside the head' with my ignorance.
Regards,
Fred Monson
Frederick C. Monson, PhD Center for Advanced Scientific Imaging West Chester University West Chester, Pennsylvania, USA, 19383 610-738-0437 fmonson-at-wcupa.edu
I'm trying to set up an old Kevex 4505 pulse processor for use on a pin-diode x-ray detector. (New NIM bin pulse processors seem to run ~$2k.) Does anyone have the documentation on this unit? I would like to know how to set up the various adjustments so that we can run the output into an Ortec 490A SCA.
Thanks, Henk Colijn
Hendrik O. Colijn colijn.1-at-osu.edu Campus Electron Optics Facility Ohio State University (614) 292-0674 http://www.ceof.ohio-state.edu Fools are pleased when they discover error. The wise are pleased when they discover truth.
Mac/PC Softare packages (Digital Imaging and Crystallography). I need suggested resources to do research for a final project at school on what is available, what do they do, differences between, and applications for. Any lists of companies that make the software that I could contact or literature that relates to this subject matter would be greatly appreciated.
we are about to undertake a materials characterisation project where we will want to match internal structures - could anyone recommend some simple image matching software eg fingerprint recognition, preferably for MAC but PC is OK
I have web-searched and many options appear present - hence the request for an experienced-based comment
thank you
Brendan --
Brendan J. Griffin Acting Director & Assoc. Professor in Electron Microscopy Centre for Microscopy and Microanalysis The University of Western Australia First floor, Physics Building, 35 Stirling Highway CRAWLEY, WA, AUSTRALIA 6009 ph 61-8-9380-2739 fax 61-8-9380-1087 mobile 0409-104-096 bjg-at-cmm.uwa.edu.au http://cmm.uwa.edu.au/
There have been a number of postings referring to gloves to be worn when handling liquid nitrogen.
I would like to point out that there are any number of gloves that might pass as being suitable for this application, and they vary in terms of
a) length (mid-arm, up to elbow, up to shoulder) and b) structure (some now are available with an inner bladder for extra protection)
I understand the arguments against wearing any gloves. I see them as being analogous to the arguments put forth for not wearing seat belts. However, a glove with this extra liner (bladder) is clearly more protective than one without such a liner.
I don't know if this is over-kill or not but if there are such concerns, then by all means, one should be specifying a glove with a bladder, and this is the style we describe as being "100% waterproof". The ones that do not have this extra bladder, and the type that are now mainly used in EM labs, do not have this extra bladder protection.
Additional information about these gloves can be found on URL http://www. 2spi.com/catalog/supp/cryo-gloves.html
Charles A. Garber, Ph. D. Ph: 1-610-436-5400 President 1-800-2424-SPI SPI SUPPLIES FAX: 1-610-436-5755 PO BOX 656 e-mail:cgarber-at-2spi.com West Chester, PA 19381-0656 USA Cust.Service: spi2spi-at-2spi.com
Look for us! ######################## WWW: http://www.2spi.com ######################## ============================================
Sorry to all, my question is not on a typicall topic of this list, but I have often seen that a lot of us like to do tinkering.
A collegue want to know if it is possible to remove a Be window from an old broken X-ray tube. He want to re-use it as window for diffraction cameras and he has a dozen broken tubes. Yes I know, Be, BeO etc. is very very toxic, we spoke about that a few weeks ago on the list. And he knows it too.
So, does some know what kind of glue, soldering, etc is used to fix these windows and what kind of solvant could be used to disolve this glue (or all other possible way), without danger for the one who do it, and without dammage for the window.
Thanks to all
J. Faerber IPCMS-GSI (Institut de Physique et Chimie des Matériaux de Strasbourg Groupe Surface et Interfaces) 23, rue de Loess 67037 Strasbourg CEDEX France
I have used lens paper and EtOH or lens cleaner with good results.
Bob U of Washington Seattle
On Tue, 19 Mar 2002, Richard Edelmann wrote:
} ------------------------------------------------------------------------ } The Microscopy ListServer -- Sponsor: The Microscopy Society of America } To Subscribe/Unsubscribe -- Send Email to ListServer-at-MSA.Microscopy.Com } On-Line Help http://www.msa.microscopy.com/MicroscopyListserver/FAQ.html } -----------------------------------------------------------------------. } } } Is it o.k., to remove (student) finger prints from a Hg bulb (for a Epi- } illuminator lamp) with a solvent (EtOH or Acetone) and a lint free cloth? } } The bulb has NOT yet been installed or subjected to current/heat (i.e. the } finger prints haven't been burned on to the glass). } } I'd rather not simply dispose of the new bulb (though diposing of the } student who can't be bothered to read is a possibility). } } } } Richard E. Edelmann, Ph.D. } Electron Microscopy Facility Supervisor } 352 Pearson Hall } Miami University, Oxford, OH 45056 } Ph: 513.529.5712 Fax: 513.529.4243 } E-mail: edelmare-at-muohio.edu } http://www.emf.muohio.edu } } "RAM disk is NOT an installation procedure." } }
Should be OK - didn't (or don't) some manufacturers send the new bulbs with a solvent based, lint-free towlette? I'd not use much force when wiping, but it should be fine.
Tamara
On Tue, 19 Mar 2002, Richard Edelmann wrote:
} ------------------------------------------------------------------------ } The Microscopy ListServer -- Sponsor: The Microscopy Society of America } To Subscribe/Unsubscribe -- Send Email to ListServer-at-MSA.Microscopy.Com } On-Line Help http://www.msa.microscopy.com/MicroscopyListserver/FAQ.html } -----------------------------------------------------------------------. } } } Is it o.k., to remove (student) finger prints from a Hg bulb (for a Epi- } illuminator lamp) with a solvent (EtOH or Acetone) and a lint free cloth? } } The bulb has NOT yet been installed or subjected to current/heat (i.e. the } finger prints haven't been burned on to the glass). } } I'd rather not simply dispose of the new bulb (though diposing of the } student who can't be bothered to read is a possibility). } } } } Richard E. Edelmann, Ph.D. } Electron Microscopy Facility Supervisor } 352 Pearson Hall } Miami University, Oxford, OH 45056 } Ph: 513.529.5712 Fax: 513.529.4243 } E-mail: edelmare-at-muohio.edu } http://www.emf.muohio.edu } } "RAM disk is NOT an installation procedure." } }
|--------------------------------------------------| Tamara Howard Department of Cell Biology and Physiology University of New Mexico - Health Sciences Center Albuquerque, NM 87131 thoward-at-unm.edu |--------------------------------------------------|
Dear Listmembers, First of all, a very belated happy St. Patrick's Day (March 17th) to you all. Secondly, as (I hope) that at least one thought about Ireland or things Irish have passed through many people's minds this weekend, why not consider taking a trip over this summer, and participating in the Microscopical Society of Ireland's annual symposium. It is intended to take place this August 28, 29 & 30th in the National University of Ireland, Galway (http://www.nuigalway.ie) and is a relatively informal forum for anything involving microscopes & research. It would certainly be excellent to see some overseas visitors, and to hear what you are doing in your labs. In fact, it might be a nice way to sneak in a holiday and a conference!
See what you'll miss if you don't attend...(http://www.irishholidays.com/ggtest.shtml)
A more formal announcement will be made next month, following the launch
of the society's website.
Sincerely,
Alexander Black President, The Microscopical Society of Ireland
From daemon Tue Mar 19 21:32:22 2002
Contents Retrieved from Microscopy Listserver Archives