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From: a.d.mckinnon-at-abdn.ac.uk
Date: Tue, 1 Aug 2006 03:32:51 -0500
Subject: [Microscopy] Re: JB-4 resin problems

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At 13:16 25/07/2006 -0500, you wrote:
Hi Dorota,
I have a few things to suggest, possibly not required but this is not
obvious from the information you provide.

Although the blocks seem hard the fact that they are sticky indicates that
there is a polymerisation issue.

I would firstly check out the catalyst. It is supplied by many
manufacturers in a very much different condition than previously and would
probably be improved if you were to routinely dry it just prior to use
(30mins in a c. 45'C oven). You may also be using a 'bad batch of catalyst.
We routinely and regularly make our own GMA (JB4 equivalent) and had to
return a recent batch of benzoyle peroxide (catalyst) to Sigma as
polymerisation was drastically altered following a recent change in
production method (despite assurances that it was a direct replacement for
the previous chemical).

Your accelerator may have been contaminated or deteriorated during a
lengthy period following initial opening of the bottle. We buy the minimum
volume available, and replace all our accelerators on a 6 monthly basis -
they definitely deteriotrate on storage and the purchase cost is negligible.

Polymerisation - you don't mention restricting air contact. Despite using
vacuum, air contact should be minimised by capping or sealing the molds, or
by polymerisation in an inert gas atmosphere (such as nitrogen).

Hope this helps,
Alastair



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Alastair McKinnon
Histology & EM Facility Manager
University of Aberdeen, Institute of Medical Science
Foresterhill, Aberdeen, AB25 2ZD
tel: +44(0) 1224 552923 (office); +44(0) 1224 555911 (lab)
fax: +44(0) 1224 559533; email: a.d.mckinnon-at-abdn.ac.uk
www.abdn.ac.uk/ims/h-em



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From: P.Rudolf-at-rug.nl
Date: Tue, 1 Aug 2006 10:36:27 -0500
Subject: [Microscopy] STM: vacancy tenure track professor Surface Science/STM

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Dear Colleague,

The Faculty of Mathematics and Natural Sciences of the
University of Groningen invites applications for a tenure
track assistant professorship in Surface Science, with
specialisation in scanning tunneling microscopy - for
details about the position, requirements and application
procedure see
http://www.rug.nl/fwn/vacatures/vacaturesfwn/206151.

I would most grateful if you could kindly alert suitable
candidates to this oppurtunity.Deadline is September 15th,
2006.

Please kindly note that this kind of position foresees the
promotion to associate and further on to full professor if
certain criteria are fullfilled.

Thank you very much in advance for your help.

Sincerely yours,
Petra Rudolf

Prof. Dr. Petra Rudolf
Materials Science Centre
University of Groningen
Nijenborgh 4
9747 AG Groningen, the Netherlands
phone: +(31)50-363 4736
e-mail: P.Rudolf-at-rug.nl
web page: http://www.surfacesthinfilms.fmns.rug.nl/

secretary: Renate Hekkema-Nieborg
e-mail: R.A.Hekkema-Nieborg-at-rug.nl
phone: +(31)50-363 4974
FAX: +(31)50-363 4879

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From: lkrupp-at-us.ibm.com
Date: Tue, 1 Aug 2006 16:05:11 -0500
Subject: [Microscopy] quality/shelf life of G-1 epoxy, epo-tek, etc.

Contents Retrieved from Microscopy Listserver Archives
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Hello listers-

I have been curious for some time now about how the quality/age of a
certain batch of G-1 (or its equivalents) affects cross-sectioning
properties for TEM samples. The shelf life listed on the small bottles
purchased from Gatan indicate 1 year, as well as the larger bottles from
epo-tek. Has anyone been able to relate poor adhesion, poor ion-milling,
etc. to the age or quality of the epoxy? I know people who have used the
same bottles of epo-tek for years with no problems.

Thanks,
Leslie

Leslie Krupp (Thompson)
IBM Almaden Research
650 Harry Road, K19/D1
San Jose, CA 95120-6099
(408) 927-3856

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From: walck-at-southbaytech.com
Date: Wed, 2 Aug 2006 00:24:03 -0500
Subject: [Microscopy] re: quality/shelf life of G-1 epoxy, epo-tek, etc.

Contents Retrieved from Microscopy Listserver Archives
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Leslie,

I have used batches of Epo-Tek 353ND that I purchased for longer than two years. I started to increase the amount of harder (as measured by drops) when it got older. Actually, what I did was decrease the number of resin drops and kept the hardner drops to 1.

Finally I mixed what was left and cured it on a hot plate. Warning, if you do this, use a big enough container to catch the boil out. I destroyed the surface of a good hot plate.

If you store it at room temp and not in direct sunlight, I think that you can go about 2 years. After that replace it. I did not see a fall off in the adhesion capability of the epoxy as it aged.

In a past life, I've used the G1, with the same results. Since I believe that it is the same stuff as the 353-ND, I will not say any more about it.

SBT does not sell the Epo-Tek 353-ND, we refer our customers to Epoxy Technology, Inc whose website is www.epotek.com.

-Scott

Scott D. Walck, Ph.D.
Technical Director
South Bay Technology, Inc.
1120 Via Callejon
San Clemente, CA 92673

TEL: +1-949-492-2600
FAX: +1-949-492-1499
walck-at-southbaytech.com

-------- Original Message --------
} From: lkrupp-at-us.ibm.com
} Sent: Tuesday, August 01, 2006 5:09 PM
} To: Walck-at-SouthBayTech.com
} Subject: [Microscopy] quality/shelf life of G-1 epoxy, epo-tek, etc.
}
} ----------------------------------------------------------------------------
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} ----------------------------------------------------------------------------
}
} Hello listers-
}
} I have been curious for some time now about how the quality/age of a
} certain batch of G-1 (or its equivalents) affects cross-sectioning
} properties for TEM samples. The shelf life listed on the small bottles
} purchased from Gatan indicate 1 year, as well as the larger bottles from
} epo-tek. Has anyone been able to relate poor adhesion, poor ion-milling,
} etc. to the age or quality of the epoxy? I know people who have used the
} same bottles of epo-tek for years with no problems.
}
} Thanks,
} Leslie
}
} Leslie Krupp (Thompson)
} IBM Almaden Research
} 650 Harry Road, K19/D1
} San Jose, CA 95120-6099
} (408) 927-3856
}
} ==============================Original Headers==============================
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} 4, 29 -- Subject: quality/shelf life of G-1 epoxy, epo-tek, etc.
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From: aFong-at-olinet.com
Date: Thu, 3 Aug 2006 12:14:52 -0500
Subject: [Microscopy] LM Need technical and business resources on hyper/multi-spectral imaging microscopy

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Hi Everyone,

I'm new to this group and the industry and am still on a learning curve. I
want to learn about the field and need a good place to start. With that in
mind, I'm hoping someone can refer me to some good sources of information in
the field of confocal and in particular, imaging spectral microscopy.

X-from the technical side, I would like to get some overviews of the
technology, the applications the suppliers and the pros and the cons. From
the business side I'm looking for any reports on market sizes and where can
I find general pricing information to get a sense of what things cost?
Thanks in advance! I'm interested in any sources of information (i.e.
people, websites, specific magazine issues and other literature).

Thanks in advance!

Alexandre Fong, Optronic Laboratories, Inc.



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From: j.riches-at-uq.edu.au
Date: Fri, 4 Aug 2006 00:04:58 -0500
Subject: [Microscopy] Job Opening: Scientific Officer at Uni. of Queensland, Australia

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

The Centre for Microscopy and Microanalysis at the University of Queensland
(Brisbane, Australia) is seeking a Scientific Officer to work in the Cryo
Electron Microscopy facility. The facility is well equipped with a Tecnai
F30 (300kV, FEG, GIF), a Tecnai 12 (120kV, LaB6) and a JEOL 1011 TEM, and
also a range of ancillary sample preparation equipment (High Pressure
Freezers, Vitrobot, etc). The research performed here includes room
temperature and cryo tomography, single particle analysis, energy filtered
imaging of biological and some materials samples and routine biological TEM
imaging.

The full job description can be obtained online at
http://www.seek.com.au/users/apply/index.ascx?Sequence=10&PageNumber=1&JobID
=7358227&msid=1&Keywords=




The closing date for applications is the 25th of August, 2006. Any questions
regarding the position should be directed to me by email
(j.riches-at-uq.edu.au).

Regards,
Jamie




Jamie Riches
Scientific/Technical Manager
Centre for Microscopy and Microanalysis
University of Queensland
Ph: +61 7 3346 2935
Fax: +61 7 3346 2101
Email: j.riches-at-uq.edu.au




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14, 22 -- Cc: "'Jill Lumsdale'" {j.lumsdale-at-uq.edu.au}
14, 22 -- Subject: Job Opening: Scientific Officer at Uni. of Queensland, Australia
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From: cammer-at-aecom.yu.edu
Date: Fri, 4 Aug 2006 08:11:03 -0500
Subject: [Microscopy] HRI Picostar, Lavision software question

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

If anybody out there is using an HRI delay unit with the Picostar image
intensifier, we would very much like to speak with you to compare technical
details and to seek assistance on troubleshooting.

We'd be happy to communicate by email or to set up a time to call you.

Thank you!!
____________________________________________________________________________
Michael Cammer Analytical Imaging Facility Albert Einstein Coll. of Med.
URL: http://www.aecom.yu.edu/aif/


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From: javaidqazi-at-kemet.com
Date: Fri, 4 Aug 2006 17:51:42 -0500
Subject: [Microscopy] viaWWW: 3D stereo microscopy, Height/Roughness profile

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Email: javaidqazi-at-kemet.com
Name: javaid qazi

Organization: Kemet Electronics

Title-Subject: [Filtered] 3D stereo microscopy, Height/Roughness profile

Question: I am looking for a commercial lab which can do height profiles by optical/digital stereo microscopy on samples. Basically can give the depth/height of different features on the surface of a part. I know Keyence VHX series can do it, certainly there are other manufacturers as well. Just looking for a place where I can get this done. Preferably on east coast. Thanks a lot.




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From: fisher.phyllis-at-mayo.edu
Date: Fri, 4 Aug 2006 17:52:05 -0500
Subject: [Microscopy] viaWWW: microwave fixation

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Email: fisher.phyllis-at-mayo.edu
Name: Phyllis Fisher

Organization: Mayo Foundation

Title-Subject: [Filtered] microwave fixation

Question: Re: Gordon Ante Vrodoljak / microwave fixation tests
I am interested in your results with regard to fixation on isolated animal cells without the usual chemical fixatives.

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==============================Original Headers==============================
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From: smythen-at-musc.edu
Date: Fri, 4 Aug 2006 17:52:26 -0500
Subject: [Microscopy] viaWWW: Processing tissue for light microscopy

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Email: smythen-at-musc.edu
Name: Nancy Smythe

Organization: Medical University of South Carolina

Title-Subject: [Filtered] Processing tissue for light microscopy

Question: I need to process and section whole neonate mice for pariffin. Anyone have a protocol? I am also open for suggestions. I will be fixing over the weekend.

Thanks for your help.

Nancy

Nancy Smythe
Department of Otolaryngology
Head and Neck Surgery
Medical University of South Carolina
843-792-8835
843-792-0368 Fax

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From: bernard-at-bearinc.com
Date: Sun, 6 Aug 2006 12:46:24 -0500
Subject: [Microscopy] Jeol JSM-6100 electronics troubleshooting

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Dear SEM techs:
My 6100 has an intermittent in which the on-screen characters freeze up,
the coarse probe current will not respond, but the focus and
magnification controls still operate normally. Pressing the reset button
only makes the CRT flicker once but nothing resets--i.e. the
magnification and focus don't change, and the on-screen characters stay
frozen. Typically, after powering the console off and on, the CRT is
covered in random characters, and no image can be formed (i.e. the
magnification and focus controls are unresponsive). The problem can
disappear for hours at a time, or it can occur almost constantly.

We have tried all manner of reseating PCBs, reconnecting connectors,
using freeze spray on the ICs, etc. Nothing affects it in any
consistent way.

The Jeol schematics are similar to the actual circuits, but when
examined more closely, actual the display circuit boards, for example,
are quite different from the schematics, with more than double the
number of ICs actually present than shown in the drawings.

Questions:
1. Is there a systematic methodology for isolating the trouble?
2. The local Jeol service office has advised that replacement PCBs are
unavailable due to the age of the scope. Are there dealers in used SEM
parts? I.e. SEM parts recyclers?
3. Does anyone have a service manual?
4. Are accurate schematics available?
5. Is there such a thing as a replacement console with modern electronics?
6. Is there a list server just for SEM techs?

I have nicely organized and annotated pdf versions of the schematics and
the operator's manual that I can offer as a token of my appreciation for
any help.

Thanks!
Bernard Cuzzillo
Berkeley, CA
USA

==============================Original Headers==============================
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From: larry-at-cymru.freewire.co.uk
Date: Sun, 6 Aug 2006 14:22:20 -0500
Subject: [Microscopy] Re: Jeol JSM-6100 electronics troubleshooting

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} ----------------------------------------------------------------------------
} The Microscopy ListServer -- CoSponsor: The Microscopy Society of America

I obviously have a vested interest but why don't you contact JEOL USA?

Regards
--
Larry Stoter
JEOL (UK) Ltd
tel: +44-(0)1707-377117, fax: +44-(0)1707-373254, e-mail: larrys-at-jeoleuro.com

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4, 17 -- Subject: Re: [Microscopy] Jeol JSM-6100 electronics troubleshooting
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From: tom-at-tomkaye.com
Date: Sun, 6 Aug 2006 19:09:22 -0500
Subject: [Microscopy] Jeol JSM-6100 electronics troubleshooting

Contents Retrieved from Microscopy Listserver Archives
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Bernard,

If you run out of options try these guys. They do component level repair on
almost everything. I had a problem with my Kevex monitor and they fixed it
for a flat fee. They also fix all the old crap for the FAA. I have no
association with them. I am setting up a JEOL 6300F and am looking for a
manual if you come across any.

Thanks!

Tom Kaye

SMH Electronics
West Wareham MA
508-291-7447

-----Original Message-----
X-from: bernard-at-bearinc.com [mailto:bernard-at-bearinc.com]
Sent: Sunday, August 06, 2006 12:54 PM
To: tom-at-tomkaye.com

Dear SEM techs:
My 6100 has an intermittent in which the on-screen characters freeze up,
the coarse probe current will not respond, but the focus and
magnification controls still operate normally. Pressing the reset button
only makes the CRT flicker once but nothing resets--i.e. the
magnification and focus don't change, and the on-screen characters stay
frozen. Typically, after powering the console off and on, the CRT is
covered in random characters, and no image can be formed (i.e. the
magnification and focus controls are unresponsive). The problem can
disappear for hours at a time, or it can occur almost constantly.

We have tried all manner of reseating PCBs, reconnecting connectors,
using freeze spray on the ICs, etc. Nothing affects it in any
consistent way.

The Jeol schematics are similar to the actual circuits, but when
examined more closely, actual the display circuit boards, for example,
are quite different from the schematics, with more than double the
number of ICs actually present than shown in the drawings.

Questions:
1. Is there a systematic methodology for isolating the trouble?
2. The local Jeol service office has advised that replacement PCBs are
unavailable due to the age of the scope. Are there dealers in used SEM
parts? I.e. SEM parts recyclers?
3. Does anyone have a service manual?
4. Are accurate schematics available?
5. Is there such a thing as a replacement console with modern electronics?
6. Is there a list server just for SEM techs?

I have nicely organized and annotated pdf versions of the schematics and
the operator's manual that I can offer as a token of my appreciation for
any help.

Thanks!
Bernard Cuzzillo
Berkeley, CA
USA

==============================Original Headers==============================
6, 14 -- From bernard-at-bearinc.com Sun Aug 6 12:46:24 2006
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==============================Original Headers==============================
17, 21 -- From tom-at-tomkaye.com Sun Aug 6 19:09:22 2006
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17, 21 -- From: "Tom" {tom-at-tomkaye.com}
17, 21 -- To: {Microscopy-at-microscopy.com}
17, 21 -- Subject: RE: [Microscopy] Jeol JSM-6100 electronics troubleshooting
17, 21 -- Date: Sun, 6 Aug 2006 19:09:19 -0500
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From: john.mardinly-at-intel.com
Date: Sun, 6 Aug 2006 22:40:08 -0500
Subject: [Microscopy] re: quality/shelf life of G-1 epoxy, epo-tek, etc.

Contents Retrieved from Microscopy Listserver Archives
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All,
Sorry about that, I guess the way I listed it you could interpret it both
ways. Yes that's the company and I don't have any involvement with SMH
other than being a customer.

Tom


-----Original Message-----
X-from: Ritchie Sims [mailto:r.sims-at-auckland.ac.nz]
Sent: Sunday, August 06, 2006 8:28 PM
To: tom-at-tomkaye.com

Scott, Leslie;
Two years may be OK if you do not examine the specimen. We have
repeatedly seen problems with surface reactions that produces contrast
of apparent layers along the surface, and also blobs of dark contrast in
the epoxy above the surface when it is over six months old. These
epoxies cured fine, and did not delaminate or show other signs of
reduced strength, but the specimens had to be prepped over again due to
the artifact visible in the microscope.

John Mardinly
Intel Corporation

The opinion of this author does not necessarily represent the opinion of
Intel corporation.

-----Original Message-----
X-from: walck-at-southbaytech.com [mailto:walck-at-southbaytech.com]
Sent: Tuesday, August 01, 2006 10:24 PM
To: Mardinly, John

Leslie,

I have used batches of Epo-Tek 353ND that I purchased for longer than
two years. I started to increase the amount of harder (as measured by
drops) when it got older. Actually, what I did was decrease the number
of resin drops and kept the hardner drops to 1.

Finally I mixed what was left and cured it on a hot plate. Warning, if
you do this, use a big enough container to catch the boil out. I
destroyed the surface of a good hot plate.

If you store it at room temp and not in direct sunlight, I think that
you can go about 2 years. After that replace it. I did not see a fall
off in the adhesion capability of the epoxy as it aged.

In a past life, I've used the G1, with the same results. Since I
believe that it is the same stuff as the 353-ND, I will not say any more
about it.

SBT does not sell the Epo-Tek 353-ND, we refer our customers to Epoxy
Technology, Inc whose website is www.epotek.com.

-Scott

Scott D. Walck, Ph.D.
Technical Director
South Bay Technology, Inc.
1120 Via Callejon
San Clemente, CA 92673

TEL: +1-949-492-2600
FAX: +1-949-492-1499
walck-at-southbaytech.com

-------- Original Message --------
} From: lkrupp-at-us.ibm.com
} Sent: Tuesday, August 01, 2006 5:09 PM
} To: Walck-at-SouthBayTech.com
} Subject: [Microscopy] quality/shelf life of G-1 epoxy, epo-tek, etc.
}
}
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}
} Hello listers-
}
} I have been curious for some time now about how the quality/age of a
} certain batch of G-1 (or its equivalents) affects cross-sectioning
} properties for TEM samples. The shelf life listed on the small
bottles
} purchased from Gatan indicate 1 year, as well as the larger bottles
from
} epo-tek. Has anyone been able to relate poor adhesion, poor
ion-milling,
} etc. to the age or quality of the epoxy? I know people who have used
the
} same bottles of epo-tek for years with no problems.
}
} Thanks,
} Leslie
}
} Leslie Krupp (Thompson)
} IBM Almaden Research
} 650 Harry Road, K19/D1
} San Jose, CA 95120-6099
} (408) 927-3856
}
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Headers==============================
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From: polo-at-cameron.net
Date: Mon, 7 Aug 2006 08:39:21 -0500
Subject: [Microscopy] viaWWW: Acridine Orange stain

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Email: polo-at-cameron.net
Name: doug

Title-Subject: [Filtered] Acridine Orange and wet mounts

Question: I would be most grateful for any help in formulating an Acridine Orange stain which I can use on blood wet mounts. Any suggestions will be most appreciated. thanks.

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From: Steven.Vandebril-at-cit.kuleuven.be
Date: Mon, 7 Aug 2006 09:16:43 -0500
Subject: [Microscopy] TEM: sample preparation polymer blend

Contents Retrieved from Microscopy Listserver Archives
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Hi all,

I'm a PhD student from the catholic university of Leuven, Belgium and
I want to do a TEM on a blend of 2 polymers, filled with particles.
The problem is that I have no expercience with this so that's why I
send this message. Can somebody help me with my problem? I don't know
how I have to prepare my sample. I will give some more information.
First I want to put my sample in an oven under N2 for about 7 hours at
220°C. Thereafter, the sample must be cooled down very quickly to
freeze the microstructure. After his, I would like to take a TEM
picture of the structure. How do I have to prepare my sample to do
this? If somebody can explain this in detail, thanks a lot!!

Kind regards,

Steven


Disclaimer: http://www.kuleuven.be/cwis/email_disclaimer.htm


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From: gwe-at-ufl.edu
Date: Mon, 7 Aug 2006 10:44:21 -0500
Subject: [Microscopy] Tutorial videos

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

ITEM 1:
Tutorial videos from M&M 2006 in Chicago will not be available for
about two months. I will post a notice on this list when they are ready
for sale.

ITEM 2:
At the insistence of MSA leadership, prices for ALL videos will go up
on August 15, 2006. Orders recieved prior to that date will be billed
at the current price. Orders recieved after that date will be billed at
the new prices.

Greg Erdos, MSA Video Wrangler
--
Gregory W. Erdos, Ph.D.
Assistant Director, Biotechnology Program
Scientific Director, EM Core Lab
P.O. Box 118525
University of Florida
Gainesville, FL 32611
gwe-at-ufl.edu
Phone: 352-392-1295
Fax: 352-846-0251

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From: damien.chong-at-adelaide.edu.au
Date: Mon, 7 Aug 2006 22:52:21 -0500
Subject: [Microscopy] Fluorescence: ER-Tracker Red background

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Hello Listers,

I'm trying to label the ER of my cell line using ER-Tracker Red (a
glibenclamide molecule labelled with BODIP-TR from Molecular Probes). Cells
are grown on round coverslips and stained with ER-Tracker and fixed as per the
instructions. Unfortunately, I have found that although the ER-Tracker labels
the ER it also sticks to the entire coverslip creating a bright red field.
Reducing the ER-Tracker concentration reduces the background, but also the ER
staining. Blocking with a range of reagents (eg. BSA, FCS, human sera, junk
proteins, skim milk etc.) does not seem to reduce this non-specific binding to
the coverslip at all.

Does anyone have any advice on how to reduce the background? If so, please let
me know.

Thanks in advance,
Damien Chong

Molecular Life Sciences Building
Gate 8, Victoria Drive
The University of Adelaide
South Australia 5005

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From: petra.wahlbring-at-goodyear.com
Date: Tue, 8 Aug 2006 01:41:33 -0500
Subject: [Microscopy] Re: TEM: sample preparation polymer blend

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Dear Steve,

some more info would be useful, e.g. is it a bulk specimen or a film, what
kind of polymers are used and what kind of particles (soft/hard) of which
size are incorporated?

Best regards,

Petra

---------------------------------------
Dr. Petra Wahlbring
Goodyear S.A. Technical Center
Analytical Test Laboratories
L-7750 Colmar-Berg
Luxembourg
Tel +352 8199 3725
Fax +352 8199 3905
e-mail: petra.wahlbring-at-goodyear.com

- May Contain Confidential and/or Proprietary Information. May not be
copied or disseminated without the expressed written consent of The
Goodyear Tire & Rubber Company. -




Steven.Vandebril-at-
cit.kuleuven.be
To
08/07/06 04:20 PM petra.wahlbring-at-goodyear.com
cc

Please respond to Subject
Steven.Vandebril-at- [Microscopy] TEM: sample
cit.kuleuven.be preparation polymer blend













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Hi all,

I'm a PhD student from the catholic university of Leuven, Belgium and
I want to do a TEM on a blend of 2 polymers, filled with particles.
The problem is that I have no expercience with this so that's why I
send this message. Can somebody help me with my problem? I don't know
how I have to prepare my sample. I will give some more information.
First I want to put my sample in an oven under N2 for about 7 hours at
220°C. Thereafter, the sample must be cooled down very quickly to
freeze the microstructure. After his, I would like to take a TEM
picture of the structure. How do I have to prepare my sample to do
this? If somebody can explain this in detail, thanks a lot!!

Kind regards,

Steven


Disclaimer: http://www.kuleuven.be/cwis/email_disclaimer.htm


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From: Steven.Vandebril-at-cit.kuleuven.be
Date: Tue, 8 Aug 2006 02:08:44 -0500
Subject: [Microscopy] Re: TEM: sample preparation polymer blend

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Hello,

I will give some more information about my sample. Tha particles that
I use are carbon black particles with a diameter of 20 nm, so TEM is
actually the only option to visualize them. The blend is made of PMMA
and PaMSAN, a phase separating blend.
Thank you for your reactions!




Citeren petra.wahlbring-at-goodyear.com:

} Dear Steve,
}
} some more info would be useful, e.g. is it a bulk specimen or a film,
} what
} kind of polymers are used and what kind of particles (soft/hard) of
} which
} size are incorporated?
}
} Best regards,
}
} Petra
}
} ---------------------------------------
} Dr. Petra Wahlbring
} Goodyear S.A. Technical Center
} Analytical Test Laboratories
} L-7750 Colmar-Berg
} Luxembourg
} Tel +352 8199 3725
} Fax +352 8199 3905
} e-mail: petra.wahlbring-at-goodyear.com
}
} - May Contain Confidential and/or Proprietary Information. May not
} be
} copied or disseminated without the expressed written consent of The
} Goodyear Tire & Rubber Company. -
}
}
}
}
}
} Steven.Vandebril-at-
}
} cit.kuleuven.be
}
}
} To
} 08/07/06 04:20 PM petra.wahlbring-at-goodyear.com
}
}
} cc
}
}
} Please respond to
} Subject
} Steven.Vandebril-at- [Microscopy] TEM: sample
}
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} Hi all,
}
} I'm a PhD student from the catholic university of Leuven, Belgium
} and
} I want to do a TEM on a blend of 2 polymers, filled with particles.
} The problem is that I have no expercience with this so that's why I
} send this message. Can somebody help me with my problem? I don't
} know
} how I have to prepare my sample. I will give some more information.
} First I want to put my sample in an oven under N2 for about 7 hours
} at
} 220°C. Thereafter, the sample must be cooled down very quickly to
} freeze the microstructure. After his, I would like to take a TEM
} picture of the structure. How do I have to prepare my sample to do
} this? If somebody can explain this in detail, thanks a lot!!
}
} Kind regards,
}
} Steven
}
}
} Disclaimer: http://www.kuleuven.be/cwis/email_disclaimer.htm
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--
Steven Vandebril
Lab of applied rheology and polymer processing
Chemical Engineering Department - K.U.Leuven
W. de Croylaan 46
3001 Heverlee
Tel.:0476 231925
Email:steven.vandebril-at-cit.kuleuven.be



Disclaimer: http://www.kuleuven.be/cwis/email_disclaimer.htm


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From: petra.wahlbring-at-goodyear.com
Date: Tue, 8 Aug 2006 02:43:16 -0500
Subject: [Microscopy] Re: TEM: sample preparation polymer blend

Contents Retrieved from Microscopy Listserver Archives
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Dear Steven,

with a soft filler like CB, I think that ultra-microtome cutting of thin
sections (at room temperature since Tg's of both polymers are } 100°C) is
the method of choice, followed by a Ruthenium Tetroxide staining in order
to achieve a contrast between the PaMSAN (stained by RuO4 due to the
aromatic ring in the a-methylstyrene) and the PMMA (less stained by RuO4).
If you need more detailed information on RuO4 staining, you can contact me
again.

With best regards,

Petra

P.S. This report might be of interest for you:
http://sunsite.online.globule.org/iupac/publications/pac/1998/pdf/7008x1547.pdf

---------------------------------------
Dr. Petra Wahlbring
Goodyear S.A. Technical Center
Analytical Test Laboratories
L-7750 Colmar-Berg
Luxembourg
Tel +352 8199 3725
Fax +352 8199 3905
e-mail: petra.wahlbring-at-goodyear.com

- May Contain Confidential and/or Proprietary Information. May not be
copied or disseminated without the expressed written consent of The
Goodyear Tire & Rubber Company. -





Steven Vandebril
{Steven.Vandebril
-at-cit.kuleuven.be} To
petra.wahlbring-at-goodyear.com
08/08/06 09:08 AM cc
Microscopy-at-Microscopy.Com
Subject
Re: [Microscopy] TEM: sample
preparation polymer blend










Hello,

I will give some more information about my sample. Tha particles that
I use are carbon black particles with a diameter of 20 nm, so TEM is
actually the only option to visualize them. The blend is made of PMMA
and PaMSAN, a phase separating blend.
Thank you for your reactions!




Citeren petra.wahlbring-at-goodyear.com:

} Dear Steve,
}
} some more info would be useful, e.g. is it a bulk specimen or a film,
} what
} kind of polymers are used and what kind of particles (soft/hard) of
} which
} size are incorporated?
}
} Best regards,
}
} Petra
}
} ---------------------------------------
} Dr. Petra Wahlbring
} Goodyear S.A. Technical Center
} Analytical Test Laboratories
} L-7750 Colmar-Berg
} Luxembourg
} Tel +352 8199 3725
} Fax +352 8199 3905
} e-mail: petra.wahlbring-at-goodyear.com
}
} - May Contain Confidential and/or Proprietary Information. May not
} be
} copied or disseminated without the expressed written consent of The
} Goodyear Tire & Rubber Company. -
}
}
}
}
}
} Steven.Vandebril-at-
}
} cit.kuleuven.be
}
}
} To
} 08/07/06 04:20 PM petra.wahlbring-at-goodyear.com
}
}
} cc
}
}
} Please respond to
} Subject
} Steven.Vandebril-at- [Microscopy] TEM: sample
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} Hi all,
}
} I'm a PhD student from the catholic university of Leuven, Belgium
} and
} I want to do a TEM on a blend of 2 polymers, filled with particles.
} The problem is that I have no expercience with this so that's why I
} send this message. Can somebody help me with my problem? I don't
} know
} how I have to prepare my sample. I will give some more information.
} First I want to put my sample in an oven under N2 for about 7 hours
} at
} 220°C. Thereafter, the sample must be cooled down very quickly to
} freeze the microstructure. After his, I would like to take a TEM
} picture of the structure. How do I have to prepare my sample to do
} this? If somebody can explain this in detail, thanks a lot!!
}
} Kind regards,
}
} Steven
}
}
} Disclaimer: http://www.kuleuven.be/cwis/email_disclaimer.htm
}
}
} ==============================Original
} Headers==============================
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} 2006
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--
Steven Vandebril
Lab of applied rheology and polymer processing
Chemical Engineering Department - K.U.Leuven
W. de Croylaan 46
3001 Heverlee
Tel.:0476 231925
Email:steven.vandebril-at-cit.kuleuven.be



Disclaimer: http://www.kuleuven.be/cwis/email_disclaimer.htm





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From: kderr-at-nysbc.org
Date: Tue, 8 Aug 2006 13:54:15 -0500
Subject: [Microscopy] CryoEM Manager Position

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http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

MANAGER IN CRYOELECTRON MICROSCOPY
NEW YORK STRUCTURAL BIOLOGY CENTER

The New York Structural Biology Center seeks a technical manager for a
high-end, state or the art facility in Cryoelectron Microscopy. The
facility includes four cryoelectron microscopes at 120, 200(2), and 300
kV, the last with a liquid-helium stage and an energy filter, as well as
all necessary ancillary equipment. The facility is used by
investigators from ten New York academic research institutions on a
broad range of biological targets employing all of three CryoEM
methodologies: tomography, single-particle analysis, and
crystallography. The appointee will work with manufacturers in
maintaining optimal performance of the instruments and will work with
scientists in pursuing a broad range of biomedical applications, some of
which are likely to require new developments. The appointee will
supervise an existing team of technical staff with expertise in sample
preparation and computational analysis. A strong technical background
in electron microscopy is essential including familiarity with
biological applications. Compensation will be appropriate and
competitive for the candidate's level of experience and training. Send
a biographical sketch, a brief statement of previous research
experience, together with names and addresses of three individuals who
can provide letters of recommendation. Applications should be sent as
soon as possible to: David Stokes, at stokes-at-nysbc.org. For more
information, see http://www.nysbc.org/facilities/CEM

--
David L. Stokes
New York Structural Biology Center
tel: 212-939-0660 x116
http://nysbc.org/
fax: 646-219-0300




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From: wim.vandenbroeck-at-UGent.be
Date: Wed, 9 Aug 2006 08:13:32 -0500
Subject: [Microscopy] viaWWW: TEM lab: organization

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Email: wim.vandenbroeck-at-UGent.be
Name: Wim Van den Broeck

Organization: Department of Morphology, Ghent University

Title-Subject: [Filtered] TEM lab: organization

Question: Dear colleagues,

In the next months, I will have the budget to set up a TEM lab with the following instruments: EM tissue processor, knife maker, ultramicrotome and table, EM trimming instrument, EM staining instrument.
In Belgium, as far as I know, Leica is the only company that distributes these instruments. Please, can you tell me if there are other companies, and what the the proís and conís are of the different instruments / different companies.
A second question deals with the organization of the lab. I have a room of about 30 m¾ at my disposal with a solid lab table in the centre and two units with fumehoods at one side. Can you give my some tips how to organize the lab as efficiently as possible ?

Thanks in advance for your kind help.
Wim Van den Broeck.

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From: MoreauD-at-AGR.GC.CA
Date: Wed, 9 Aug 2006 08:33:53 -0500
Subject: [Microscopy] Re: cleaning a Penning gauge

Contents Retrieved from Microscopy Listserver Archives
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Good morning.

I am unable to maintain a high vacuum and the failure message on my
Quanta 200 SEM reads that there is a gauge failure and the source is the
vacuum. I suspect that it is the Penning gauge and would like to clean
it. It is a Pfeiffer model that operates at approximately 2kV. The FEI
service rep. refers to this particular gauge as being 'active'. Has
anyone had success at dismantling and cleaning this type of gauge. The
cost of having it serviced is considerable. Any advice or suggestions on
how to proceed with cleaning, etc. can be made to me directly and
'off-line'.

Regards
Deb

Debra L. Moreau, Ph.D.
Electron Microscopy and Imaging
Agriculture and Agri-Food Canada/
Agriculture et Agroalimentaire Canada
Telephone/Téléphone: 902 679-6513
Facsimile/Télécopieur: 902 679-2311
32 Main Street Kentville, Nova Scotia
B4N 1J5
moreaud-at-agr.gc.ca




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From: lcgould-at-med.cornell.edu
Date: Wed, 9 Aug 2006 08:35:36 -0500
Subject: [Microscopy] Re: viaWWW: TEM lab: organization

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Dear Wim
First, let me congratulate you. In these times of slashed budgets
its very good to hear of someone being able to set up a lab, rather
than dismantle one!
Try to get your hands on a copy of volume 4 of the "Practical
Methods in Electron Microscopy" series edited by Audrey M. Glauert:
Design of the Electron Microscope Laboratory" by Ronald H. Alderson.
I think that its out of print (original copyright was 1975) but it is
still an excellent guide and addresses the set up of labs of varying
sizes.

Lee Cohen-Gould
--
Leona Cohen-Gould, M.S.
Sr. Staff Associate
Director, Electron Microscopy & Histology Core Facility
Manager, Optical Microscopy Core Facility
Joan & Sanford I. Weill Medical College
of Cornell University
voice (212)746-6146
fax (212)746-8175
http://www.cornellcelldevbiology.org
http://www.cornellbiochem.org

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From: stefan.diller-at-t-online.de
Date: Wed, 9 Aug 2006 13:48:49 -0500
Subject: [Microscopy] Layouts for EDAX 184 Pre-Amp

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Dear All,
is there anybody out there who has some layouts for the EDAX 184 pre-amp?
I got an EDAX ECON detector which will be attached to an EDAX 9100.
I need to know for which pots I need for trimming the pre-amp. There are two
pots, one is black, the other gray...
I also need a hint where to find the Gain and the Zero pots on the ADC
board.

Thanks in advance,
Stefan




----------------------------------------------------------------------------
-----------------------------------------
Stefan Diller - Photography
Arndtstrasse 22
D - 97072 Wuerzburg Germany
++49 - 931 - 7848700 Phone
++49 - 931 - 7848701 Fax
++49 - 175 - 717 70 51 Cell-Phone

Websites:
www.stefan-diller.com
www.elektronenmikroskopie.info
www.assisi.de
Anfahrt: http://mail.map24.com/stefan.diller
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From: thoward-at-unm.edu
Date: Wed, 9 Aug 2006 15:01:39 -0500
Subject: [Microscopy] color digital for histology?

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Listers: We would like to upgrade our color imaging system
for histological slides - does anybody have any camera
systems that they hate/love and could comment on? The
Nikon CoolPix seems to be quite popular; how is the
software? Can it be convinced to talk to MetaMorph? Has
anybody used the MotiCam 2000? It looks spiffy, but I
didn't see any references to it in the archives. What
about the Orion astronomy camera? We have an old Kodak now
that is no longer supported and the software is kind of
hopeless, so the users are agitating for an upgrade. We
don't want to spend a ton of money, of course...this is
just for plain old histo.

Thanks!

Tamara

-----------------------------
Tamara Howard
Cell Biology & Physiology
UNM-HSC
Albuquerque, NM
-----------------------------

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From: donovan-at-uoregon.edu
Date: Wed, 9 Aug 2006 22:52:49 -0500
Subject: [Microscopy] EDS/Spectrum Imaging/Low Voltage Analysis Workshop, Eugene, OR

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Dear Deb,
If your Penning gauge is the usual type: cold, with a strong magnet wrapped
around it, then you need to take it off the SEM, disassemble it and clean
all the bits inside. Whiskers form on the inside over time and these
interfere with the ion flow that measures the vacuum. I cannot be more
specific because I don't have one of that particular brand. The Edwards ones
I have consist of several plates and a needle up the middle. The ion flow is
between the needle and plates. The magnet extends the range of the vacuum
reading. I just clean the plates and needle and inside of the cylindrical
body with fine emery paper and metal polish and wash everything clean with
acetone or lab alcohol, dry and re-assemble. Usually works. If you have the
instruction manual that comes with the gauge, it may tell you how to clean
it, or the SEM maintenance instructions.
I hope this helps. Please feel free to contact me if you have any other
questions.
Regards,
Mary Mager
Electron Microscopist
Department of Materials Engineering
University of British Columbia
6350 Stores Road
Vancouver, B.C. V6T 1Z4
CANADA
Tel: 604-822-5648
Fax: 604-822-3619
e-mail: mager-at-interchange.ubc.ca
----- Original Message -----
X-from: {MoreauD-at-AGR.GC.CA}
To: {mager-at-interchange.ubc.ca}
Sent: Wednesday, August 09, 2006 6:39 AM

Attendance is limited! Additional morning presentations are welcome-
please contact John Donovan directly.

EDS Spectrum Imaging and Low Voltage (High Resolution) Analysis, University
of Oregon, Eugene, OR

3 day workshop by Dale Newbury (National Institute of Standards &
Technology), September, 12-14, 2006

Morning 1 talk: "Silicon Drift Detectors: Energy Dispersive X-ray
Spectrometry and X-ray Spectrum Imaging at Output Count Rates Above 100
kHz, and What to Do with All This Data"

Afternoon Demos:
Spectral Imaging and Mapping with a conventional EDS (Oxford and Thermo)
Bruker Quad SDD and Thermo SDD doing high speed x-ray spectrum image
mapping on an FEI Quanta SEM
LISPIX hands-on software lab, with pre-recorded x-ray spectrum image data
sets.

Morning 2 talk: "Challenges to Successful EDS X-ray Microanalysis in the
Low Beam Energy (E0 { 5 keV) Regime"

Afternoon demos:
Low Beam Energy SEM/EDS on selected specimens, e.g., SiC, BaTiO3, etc.
Demonstration of conventional WDS in the low beam energy regime with BaTiO3
scanning the TiL-O K and BaM spectral regions.

Morning 3 talk: "The Perils of Automatic EDS Analysis: Blunders in
Automated Peak Identification of Major, Minor, and Trace Constituents and
the Reality of Standardless Analysis"

Afternoon demo:
Testing Automatic Peak ID and Standardless Analysis with commercial
software in the Laboratory
User suggestions for testing (bring your own samples)

Check this page for registration and further details:
http://epmalab.uoregon.edu/eds_workshop.htm

Respond to John Donovan (donovan-at-uoregon.edu) to confirm your
participation. Registration is required by September 1, 2006.
More to come...

John J. Donovan donovan-at-uoregon.edu
University of Oregon (541) 346-4632 (office)
1260 Franklin Blvd (541) 346-4655 (probe)
Eugene, OR (541) 346-4778 (SEM)
97403-1272 (541) 346-4692 (FAX)
Lab Web: http://epmalab.uoregon.edu/


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From: stefan.diller-at-t-online.de
Date: Thu, 10 Aug 2006 01:30:57 -0500
Subject: [Microscopy] RE: Layouts for 184 EDAX Pre-Amp

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Dear All,
thanks for your help. I got everything I need.

Stefan


----------------------------------------------------------------------------
-----------------------------------------
Stefan Diller - Photographie
Arndtstrasse 22
D - 97072 Wuerzburg Germany
++49 - 931 - 7848700 Phone
++49 - 931 - 7848701 Fax
++49 - 175 - 717 70 51 Cell-Phone

Websites:
www.stefan-diller.com
www.elektronenmikroskopie.info
www.assisi.de
Anfahrt: http://mail.map24.com/stefan.diller
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From: dirk.durinck-at-mtm.kuleuven.be
Date: Thu, 10 Aug 2006 08:24:47 -0500
Subject: [Microscopy] AskAMicroscopist: CSLM to observe in-situ the high temperature

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Below is the result of your feedback form (NJZFM-ultra-55). It was submitted by (dirk.durinck-at-mtm.kuleuven.be) from http://www.microscopy.com/Ask-A-Microscopist/Ask-A-Microscopist.html on Thursday, August 10, 2006 at 04:46:59
---------------------------------------------------------------------------

Email: dirk.durinck-at-mtm.kuleuven.be
Name: Dirk Durinck

Organization: KULeuven

Education: Graduate College

Location: Leuven, Belgium

Question: Dear,

I am a PhD student at the Catholic University of Leuven (Belgium) in material sciences with a question about microscopy.

One of my collegues is exploring the capabilities of a CSLM to observe in-situ the high temperature behaviour of refractory materials. The material is not transparent to the laser light, so he can only see the surface of the sample. He is using the cslm because our institute does not have a optical microscope with a heating stage.

A problem he faces is that the image quality deteriorates quite rapidly when the sample reaches high temperatures (1600ƒC). The explanation we are thinking of, is that the sample roughens during the experiment. Measurement has shown that before the tests the roughness was about 0.2µm; after the tests is was 5µm. The small focus plane of the CSLM could thus cause blurring of the image.

In order to elaborate this explanation, we would like to have an idea about the axial (depth, vertical) resolution of the CSLM equipment and other imaging techniques (LOM, SEM). Can someone please suggest a good reference where we can find such data?

Regards,

Dirk

---------------------------------------------------------------------------


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From: vray-at-partbeamsystech.com
Date: Thu, 10 Aug 2006 11:04:21 -0500
Subject: [Microscopy] Re: cleaning a Penning gauge

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Dear Debra,

Usual failure mode of CCIG gages in SEM and FIB tools is dielectric
deposition from hydrocarbon oils and precursor gases on electrodes of the
sensor tube, and removal of these deposits fully restores work resource of
gage. So far I cleaned hundreds (literally) of Edwards and Varian CCIG
sensors by following procedure:

1. Dismount CCIG from the tool, remove magnet, and carefully take sensor
tube apart.

2. Soak all the metal parts of the sensor tube overnight in 50/50 solution
of Micro 90 and DI or distilled water. Micro 90 is available from Cole
Parmer http://www.coleparmer.ca/catalog/product_view.asp?sku=1810001&pfx=EW
and if you do not have DI then distilled water from supermarket works. Avoid
tap water though.

3. In the morning sonic metal parts for 10 min. in the same solution in
which they were soaking. At this point all deposits would be removed from
the electrodes and you should see nice shiny metal surfaces.

4. Thoroughly rinse the parts, dry them (hot plate or oven to speed up), and
put the sensor tube together - done.

Micro 90 cleaning is very gentle, does not scratch electrodes, and takes
minimum of your own time - you can do other things while gage is soaking or
drying.

If you do not mind time investment, cleaning by hand-polishing of the
electrodes, which was already suggested, will also work.

The only thing I can not help you with is how to take apart Pfeiffer gage; I
did cleaning of only Edwards and Varian gages so far.

The best for you would probably be to pre-clean one or two old gages, which
you most likely have laying around the lab, and replace gage on the tool as
needed.

Cheers,
Valery



-----Original Message-----
X-from: MoreauD-at-AGR.GC.CA [mailto:MoreauD-at-AGR.GC.CA]
Sent: Wednesday, August 09, 2006 9:35 AM
To: vray-at-partbeamsystech.com

Good morning.

I am unable to maintain a high vacuum and the failure message on my
Quanta 200 SEM reads that there is a gauge failure and the source is the
vacuum. I suspect that it is the Penning gauge and would like to clean
it. It is a Pfeiffer model that operates at approximately 2kV. The FEI
service rep. refers to this particular gauge as being 'active'. Has
anyone had success at dismantling and cleaning this type of gauge. The
cost of having it serviced is considerable. Any advice or suggestions on
how to proceed with cleaning, etc. can be made to me directly and
'off-line'.

Regards
Deb

Debra L. Moreau, Ph.D.
Electron Microscopy and Imaging
Agriculture and Agri-Food Canada/
Agriculture et Agroalimentaire Canada
Telephone/Téléphone: 902 679-6513
Facsimile/Télécopieur: 902 679-2311
32 Main Street Kentville, Nova Scotia
B4N 1J5
moreaud-at-agr.gc.ca




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From: cbennett-at-tulane.edu
Date: Thu, 10 Aug 2006 17:33:57 -0500
Subject: [Microscopy] AskAMicroscopist: cryoSEM of leukemia cell surface (membrane)

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from on Thursday, August 10, 2006 at 14:45:53
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Email: cbennett-at-tulane.edu
Name: Cecily Bennett

Organization: Tulane University

Education: Graduate College

Location: New Orleans, LA, USA

Title: cryoSEM of leukemia cell surface (membrane)

Question: I am attempting to visualize the cellular surface of leukemia cells (~10um) after treatment with a peptide using cryoSEM. I am interested in noting the changes in the membrane such as membrane blebbing or the formation of pores. Currently, I am incubating the cells with peptide in RPMI 1640 in the presence of polyK coated slides. After the assay is completed I transfer the slides to fresh RPMI. (I have tried tranferring into water, but the images are of poorer quality - more ice crystals) I perform a 10min sublimation at -95C for the samples. The images that I get vary from day to day and I was wondering if there was a better way to prepare my samples just prior to loading. Thank you.

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From: phillipst-at-missouri.edu
Date: Fri, 11 Aug 2006 08:59:53 -0500
Subject: [Microscopy] Associate Director position LM facility opening

Contents Retrieved from Microscopy Listserver Archives
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The University of Missouri is looking for an ASSOCIATE DIRECTOR for a
campus-wide light microscopy imaging facility.

Applicants should have experience in some or all of the following areas:
* confocal scanning laser microscopy
* bright field microscopy
* wide field fluorescence microscopy
* deconvolution
* FRET/FLIM
* image processing/analysis
* all types of microtomy
* immunocytochemistry
* in situ hybridization

The Associate Director will be responsible for training users, maintaining
instruments and developing protocols for a campus-wide multi-user facility.
PhD desirable but not required for individuals with extensive experience.
Although an ideal candidate would have experience in all of the areas
listed above, candidates with extensive experience in selected areas and
who have the desire and capacity to learn the additional areas will be
considered. Excellent oral and written communication skills are essential.
Experience in a multi-user core facility would be viewed positively.
Electron microscopy is not a component of this core facility. Women and
minority candidates are especially encouraged to apply. Review of
applications will begin immediately and continue until an appropriate
candidate is hired. This is a full-time, benefit eligible
position. Opportunities for professional development will be encouraged.

The Core's web site can be viewed at
www.biotech.missouri.edu/mcc/index.html--|http://www.biotech.missouri.edu/mcc/index.html

Available instrumentation includes:
* Zeiss Meta NLO 2 Photon confocal system
* BioRad Radiance 2000 confocal system
* Leica DMI4000 B and Eppendorf microjection system
* Olympus IX70 and Nikon Optiphot 2 widefield systems
* Leica stereoscope equipped with epi-fluorescence excitation
* Intavis InsituPro VS in situ hybridization robotic system
* Autodeblur deconvolution software (Autoquant Inc.).
* Metamorph, Imaris Suite, ImagePro image analysis and processing
software.
* Leica ultramicrotome, cryostat, paraffin microtomes
Address applications (CV and 3 letters of reference) or inquires to:

Thomas E. Phillips, Ph.D.
Division of Biological Sciences
2 Tucker Hall
University of Missouri
Columbia, MO 65211-7400
573-882-4712 (office)
573-882-0123 (fax)
PhillipsT-at-missouri.edu


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From: jmkrupp-at-ucsc.edu
Date: Fri, 11 Aug 2006 15:47:42 -0500
Subject: [Microscopy] Diffraction on protein fibril?

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Hi:

I have a guy who wants to do diffraction on a protein fibril. We
usually look at these things negatively stained with UA and just
check for fibrils or no fibrils in the sample. The samples can be
kind of variable and junky.

The fibrils are about 12 nm (can this be right?) wide by much longer.
I'm not much good with diffraction so I told him I would scout around
for someone who could help him.

We are located near the SF bay area. If you could help us with this
project, let me know and I will pass along the info.

Thanks

Jon
--


Jonathan Krupp
Microscopy & Imaging Lab
C230 Earth & Marine Science
University of California
Santa Cruz, CA 95064
(831) 459-2477
jmkrupp-at-ucsc.edu

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From: sawyert-at-science.oregonstate.edu
Date: Fri, 11 Aug 2006 18:09:43 -0500
Subject: [Microscopy] AskAMicroscopist: gfp inserted into plant pathogenic bacterial

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This Question was submitted to Ask-A-Microscopist by (sawyert-at-science.oregonstate.edu)
from http://www.microscopy.org/Ask-A-Microscopist/Ask-A-Microscopist.html on Friday, August 11, 2006 at 10:38:32
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Email: sawyert-at-science.oregonstate.edu
Name: Teresa Sawyer

Organization: Oregon State University

Education: Graduate College

Location: Corvallis OR, USA

Title: gfp

Question: I have been working with gfp inserted into plant pathogenic bacterial. My current problem is photo bleaching. The cells have been fixed in para formaldehyde and washed but while trying to capture the image electronically the gfp rapidly bleaches. To quantify data I need an image so any suggestion will be helpful.

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From: gmerkiso-at-iupui.edu
Date: Sat, 12 Aug 2006 12:17:44 -0500
Subject: [Microscopy] AskAMicroscopist: light microscope & fluids

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Below is the result of your feedback form (NJZFM-ultra-55). It was submitted by (gmerkiso-at-iupui.edu) from http://www.microscopy.com/Ask-A-Microscopist/Ask-A-Microscopist.html on Saturday, August 12, 2006 at 12:09:54
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Email: gmerkiso-at-iupui.edu
Name: George Merkison

Organization: Indiana Blood Centter

Education: Undergraduate College

Location: Indianapolis,IN

Question: When using a light microscope, I was taught to keep the condenser down for fluids, including urine sediment and cell counts on hemacytometer, and Nagoette chambers. Is this true and is there a reference to show other individuals? I can't find a reference. Thanks for your reply.


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From: nizets2-at-yahoo.com
Date: Mon, 14 Aug 2006 06:30:17 -0500
Subject: [Microscopy] need infos about e diffraction in TEM

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Dear listers,

Although I understand the principle behind electron
diffraction in TEM I have no idea about the kind of
informations this technique gives and how to interpret
the diffraction pattern.
If you could give me a www address which explains that
I would be much grateful.

Now a very practical problem could be perhaps used as
an example: we have a mixture of aluminosilicate
mineral (I have cut 70 nm sections) with approx. 90%
of mordenite and 10% quarz.
1) Can I use e diffraction to distinguish both types
of particles? (to verify the purity of the powder)
2) What kind of information about the cristal
structure can e diffraction give me in this case?
3) Can I detect a change -and which change- to the
cristal structure using this technique if the mineral
is heat and treated with strong acids? (which actually
modifies the structure)

We have also a tilt stage for tomography. Can this
bring further informations?

Regards,

Stephane


__________________________________________________
Do You Yahoo!?
Tired of spam? Yahoo! Mail has the best spam protection around
http://mail.yahoo.com

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8, 18 -- From: Stephane Nizet {nizets2-at-yahoo.com}
8, 18 -- Subject: need infos about e diffraction in TEM
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From: Wharton.Sinkler-at-uop.com
Date: Mon, 14 Aug 2006 07:37:31 -0500
Subject: [Microscopy] need infos about e diffraction in TEM

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Stephane,

The example you give, distinguishing between two phases of different
structure in a single sample, is the most common use of electron
diffraction. This is essentially a fingerprinting of a structure using
a measure of angles and spacings provided by the pattern and fitting
these to the geometry of a known unit cell. Strictly speaking, this can
only reject a candidate phase by failure to fit, because you aren't
really proving the presence of a particular structure, just showing that
it's a plausible match to the data. This is nicely suited to your case
of only having two structures to choose from.

If you've never done this before, you should try it first on a
single-phase material (for example a finely ground silicon). This will
give you some practice at orienting a zone axis (you will need to use a
double-tilt holder, so this will eliminate the tomography holder unless
yours can tilt on two axes). Once you have done this you will also know
the camera constant of the microscope for a given camera length, which
will provide essential information for distinguishing phases (relates
the spacing in A to the distance of a reflection from the pattern
origin).

One thing working to your advantage will be the large spacings present
in mordenite and the absence of any very large spacings in (alpha)
quartz. Because of this, any time you see a reflection indicating a
spacing greater than about 4.5 A it must be the mordenite.

Structural changes may be difficult to detect depending on what they
are. They would have to involve a fairly large change in the size and
shape of the unit cell in order to detect with 'spot pattern'
diffraction. If you have a material amenable to convergent beam
diffraction you can have a lot more sensitivity to structural changes
but your sample must be quite beam stable and have relatively small unit
cell (neither is likely to be the case for your mordenite).

As far as references go, the old standard Hirsch et al (Electron
Microscopy of Thin Crystals) is pretty good on basic spot pattern
indexing - see chapter 5 and appendices 5 and 6 which show some worked
examples. In fact, any TEM textbook should have at least some
discussion of how to acquire and index spot patterns.

Good Luck,
Wharton

*************************************************************
Wharton Sinkler, PhD.
UOP LLC
50 E. Algonquin Rd.
Des Plaines IL 60017-5017
mailto: wharton.sinkler-at-uop.com
tel 847-391-3878
fax 847-391-3719


-----Original Message-----
X-from: nizets2-at-yahoo.com [mailto:nizets2-at-yahoo.com]
Sent: Monday, August 14, 2006 6:36 AM
To: Sinkler, Wharton

Dear listers,

Although I understand the principle behind electron
diffraction in TEM I have no idea about the kind of
informations this technique gives and how to interpret
the diffraction pattern.
If you could give me a www address which explains that
I would be much grateful.

Now a very practical problem could be perhaps used as
an example: we have a mixture of aluminosilicate
mineral (I have cut 70 nm sections) with approx. 90%
of mordenite and 10% quarz.
1) Can I use e diffraction to distinguish both types
of particles? (to verify the purity of the powder)
2) What kind of information about the cristal
structure can e diffraction give me in this case?
3) Can I detect a change -and which change- to the
cristal structure using this technique if the mineral
is heat and treated with strong acids? (which actually
modifies the structure)

We have also a tilt stage for tomography. Can this
bring further informations?

Regards,

Stephane


__________________________________________________
Do You Yahoo!?
Tired of spam? Yahoo! Mail has the best spam protection around
http://mail.yahoo.com

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From: edelmare-at-muohio.edu
Date: Mon, 14 Aug 2006 07:59:56 -0500
Subject: [Microscopy] Re: AskAMicroscopist: light microscope & fluids

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

George:

I am interested to see if someone else from the list chimes in
with an alternitive immulination setting specific for histo/path
applications, but as far as I know, in terms of training, experiences,
and how I teach my students you always set the illumination
(condensor lens) for Köhler illumination. This will result in the best
resolution.

Steps:

1) Focus sample

2) stop down the field diaphram until you can see it in through the
eyepieces (the one closest to the lamp bulb, may not be present on
lower cost scopes like general teaching lab scopes. The aperture
closest to the condensrr lens is the stage diaphram or aperture
diaphram). Note: If the condensor is extremely far from the sample
as you indicate move it very close to the sample.

3) Move the condenor lens up and down to focus on the edges of
the field diaphram.

4) Spread the field diaphram out to just inside the field of view
through the eyepieces. And center it with the condensor centering
knobs.

5) Spread the aperture just outside the filed of view.

---- You are now setup for Köhler illumination on that lens, You wil
need to repeat this as you change lenses ----

6) For brightfield: Open the Stage Diaphram all the way. While
watching through eyepieces close the stage diaphram until you just
see a contrast change and stop (If you remove an eyepiece you will
note that the stage diaphram will have cropped 20-30% of the filed
of view, this is the 70-80% referred to in some texts)



Additional information can be found at:

http://www.microscopyu.com/tutorials/java/kohler/index.html

Or

http://www.olympusmicro.com/primer/anatomy/kohler.html

Good Luck


On 12 Aug 2006, at 12:19, gmerkiso-at-iupui.edu wrote:

}
} Email: gmerkiso-at-iupui.edu
} Name: George Merkison
}
} Organization: Indiana Blood Centter
}
} Education: Undergraduate College
}
} Location: Indianapolis,IN
}
} Question: When using a light microscope, I was taught to keep the
} condenser down for fluids, including urine sediment and cell counts on
} hemacytometer, and Nagoette chambers. Is this true and is there a
} reference to show other individuals? I can't find a reference. Thanks
} for your reply.
}
}
} ----------------------------------------------------------------------
} -----
}
} ==============================Original
} Headers============================== 8, 12 -- From
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} Subject: AskAMicroscopist: light microscope & fluids 8, 12 --
} Content-Type: text/plain; charset="us-ascii"
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} Headers==============================



Richard E. Edelmann, Ph.D.
Electron Microscopy Facility Director
364 Pearson Hall
Miami University, Oxford, OH 45056
Ph: 513.529.5712 Fax: 513.529.4243
E-mail: edelmare-at-muohio.edu
http://www.emf.muohio.edu

"A main-frame: The biggest PC peripheral available."


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From: gwe-at-ufl.edu
Date: Mon, 14 Aug 2006 08:57:08 -0500
Subject: [Microscopy] Re: Thanks for Attending MM2006

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Congratulations on a great meeting!

Nestor J. Zaluzec wrote:
} Colleagues...
}
} As Local Arrangements Co-Chair for the Microscopy & Microanalysis 2006 Meeting
} I would like to take a moment on behalf of the LAC, your local host (MMMS)
} and the Co-sponsoring societies (MSA, MAS, IMS, MSC/SMC)
} to thank you for attending our meeting in Chicago.
}
} Attendance at the meeting broke all our records for the last decade with
} 1873 Scientific registrants and 3173 total attendee's from 33 countries
} discussing 938 presentations. Our exhibit featured over 110 companies presenting
} the largest state-of-the-art instrumentation exhibit for microscopy and microanalysis
} in the world.
}
} I hope you found the program stimulating, and the venue and ammenties in Chicagoland
} to be both exciting and entertaining. The various committee's and meeting personnel
} worked hard to make the conference a success and your participation in the symposia
} and scientific exhibition was an essential part of this.
}
} If you have any suggestions and/or comments on any aspect of the meeting, please
} feel free to email them to me (zaluzec-at-aaem.amc.anl.gov) and I will insure they
} get collected and passed along to future organizers.
}
} In reminiscence of the meeting, one of the members of our LAC Team (Byran Rabatic)
} has created a s video/slide show which superbly captures the spirit of the
} MM2006 meeting . If you have a moment you might enjoy
} viewing it. Please feel free to download a copy at the following URL:
}
} http://mm2006.microscopy.org/MM2006large.mov (~ 115 Mb)
} or
} http://mm2006.microscopy.org/MM2006small.mov ( ~ 28 Mb)
}
} make sure you have your audio on when you watch it, it is very well done.
}
} Again, thanks to all of you for attending MM2006 and we hope to see you
} next year in Ft. Lauderdale, Florida (http://mm2007.microscopy.org) .
}
} Cheers....
}
} Nestor Zaluzec
} Your Friendly Neighborhood LAC Co-Chair
} zaluzec-at-aaem.amc.anl.gov
}
}
} -----------------------------------------------------------------------------------
} It's a 106 miles to Chicago. We got a full tank of gas, half a pack of cigarettes, it's dark and we're wearing sunglasses.
} -----------------------------------------------------------------------------------
}
}
}

--
Gregory W. Erdos, Ph.D.
Assistant Director, Biotechnology Program
Scientific Director, EM Core Lab
P.O. Box 118525
University of Florida
Gainesville, FL 32611
gwe-at-ufl.edu
Phone: 352-392-1295
Fax: 352-846-0251

==============================Original Headers==============================
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From: frank.karl-at-degussa.com
Date: Mon, 14 Aug 2006 09:13:44 -0500
Subject: [Microscopy] AskAMicroscopist: light microscope & fluids

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Nice summary, but ...
The lamp filament should be centered and in focus in the back focal plane
of the objective. This can be done by using the Bertrand lens which places
an additional lens in the light path. If you don't have one, an ocular can
be removed and the back focal plane examined. A centered pin hole in a tube
cap or covering of foil can be used to sharpen the image as can a focusing
telescope used in phase contrast.

This is done with the specimen in place and in focus. After focusing and
centering the filament, you perform the rest. Unfortunately many modern
scope have no provision for this operation.

If you have a rotating stage or objectives which can be centered, life gets
a little more complex, but the reward of good illumination is worth it!


Frank Karl
Degussa Corporation
Akron Technical Center
3500 Embassy Parkway
Suite 100
Akron, Ohio 44333


330-668-2235 Ext. 238


This e-mail transmission, and any documents, files or previous e-mail
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edelmare-at-muohio.e
du To: frank.karl-at-degussa.com
cc:
08/14/2006 09:02 Subject: [Microscopy] Re: AskAMicroscopist: light microscope & fluids
AM
Please respond to
edelmare








----------------------------------------------------------------------------

The Microscopy ListServer -- CoSponsor: The Microscopy Society of America


George:

I am interested to see if someone else from the list chimes in

with an alternitive immulination setting specific for histo/path
applications, but as far as I know, in terms of training, experiences,
and how I teach my students you always set the illumination
(condensor lens) for Köhler illumination. This will result in the best
resolution.

Steps:

1) Focus sample

2) stop down the field diaphram until you can see it in through the
eyepieces (the one closest to the lamp bulb, may not be present on
lower cost scopes like general teaching lab scopes. The aperture
closest to the condensrr lens is the stage diaphram or aperture
diaphram). Note: If the condensor is extremely far from the sample
as you indicate move it very close to the sample.

3) Move the condenor lens up and down to focus on the edges of
the field diaphram.

4) Spread the field diaphram out to just inside the field of view
through the eyepieces. And center it with the condensor centering
knobs.

5) Spread the aperture just outside the filed of view.

---- You are now setup for Köhler illumination on that lens, You wil
need to repeat this as you change lenses ----

6) For brightfield: Open the Stage Diaphram all the way. While
watching through eyepieces close the stage diaphram until you just
see a contrast change and stop (If you remove an eyepiece you will
note that the stage diaphram will have cropped 20-30% of the filed
of view, this is the 70-80% referred to in some texts)



Additional information can be found at:

http://www.microscopyu.com/tutorials/java/kohler/index.html

Or

http://www.olympusmicro.com/primer/anatomy/kohler.html

Good Luck


On 12 Aug 2006, at 12:19, gmerkiso-at-iupui.edu wrote:

}
} Email: gmerkiso-at-iupui.edu
} Name: George Merkison
}
} Organization: Indiana Blood Centter
}
} Education: Undergraduate College
}
} Location: Indianapolis,IN
}
} Question: When using a light microscope, I was taught to keep the
} condenser down for fluids, including urine sediment and cell counts on
} hemacytometer, and Nagoette chambers. Is this true and is there a
} reference to show other individuals? I can't find a reference. Thanks
} for your reply.
}
}
} ----------------------------------------------------------------------
} -----
}
} ==============================Original
} Headers============================== 8, 12 -- From
} zaluzec-at-microscopy.com Sat Aug 12 12:17:44 2006 8, 12 -- Received:
} from [206.69.208.22] (mac22.zaluzec.com [206.69.208.22]) 8, 12 --
by
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} k7CHHgWP017031 8, 12 -- for {microscopy-at-microscopy.com} ; Sat,
12 Aug
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} 2006 12:17:41 -0500 8, 12 -- To: microscopy-at-microscopy.com 8, 12 --
} From: gmerkiso-at-iupui.edu (by way of MicroscopyListserver) 8, 12 --
} Subject: AskAMicroscopist: light microscope & fluids 8, 12 --
} Content-Type: text/plain; charset="us-ascii"
} ==============================End of -
} Headers==============================



Richard E. Edelmann, Ph.D.
Electron Microscopy Facility Director
364 Pearson Hall
Miami University, Oxford, OH 45056
Ph: 513.529.5712 Fax: 513.529.4243
E-mail: edelmare-at-muohio.edu
http://www.emf.muohio.edu

"A main-frame: The biggest PC peripheral available."


==============================Original
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From: ph2-at-sprynet.com
Date: Mon, 14 Aug 2006 09:39:06 -0500
Subject: [Microscopy] RE: AskAMicroscopist: light microscope & fluids

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

I tried to send this in html with my comments in red but the server doesn't allow html so:

REGARDING:

Email: gmerkiso-at-iupui.edu
Name: George Merkison
Organization: Indiana Blood Centter
Education: Undergraduate College
Location: Indianapolis,IN

Question: When using a light microscope, I was taught to keep the condenser down for fluids, including urine sediment and cell counts on hemacytometer, and Nagoette chambers. Is this true and is there a reference to show other individuals? I can't find a reference. Thanks for your reply.


MY RESPONSE
Are you speaking of a flip out condenser or the whole condenser?

1) Flip-out top piece (a separate lens over the main condenser):

If a flip out - it is useful at low mag (10-20X Obj) because it a) lets the light become more parallel to the axis increasing depth of field, and b) increases contrast, and c) allows the main condenser to stay at the appropriate height (condenser height should allow one to close the field diaphram at the base of the scope and have the edges of this iris clearly in view). However, the gain in contrast (which makes things appear to the eye better - enhances refractve index differences between the crystal or biological specimen and the fluid) through the effective lowering of the numerical aperature (cone of light) will decrease resolution of fine details. Generally one flips out the lens because the gross contrast is more important.

2) Whole condenser:

If it is the whole condenser - the answer is no. The condenser should be set at a particular height to properly converge the light upon the specimen in the correct plane. Lowering the condenser does allow the light to become more parallel to the axis as it penetrates the specimen - which then increases contrast, increases depth of field, but it does not do this as well as a flip out lens. It then places the condenser at the wrong height when switching back to do finer detail work. Also, lowering the whole condenser has a tendency to exaggerate speherical and chromatic aberrations in the lens, allow more scattering of light problems, lower overall light intensity and decrease even-ness (sp?) of background lighting. Not recomended. And certainly don't do it if you have a phase contrast scope as the phase ring and annulus aligment will not match in size and may not be axially aligned either.

3) Bottom Line:

If you don't have a flip-out condenser, just use the iris in the condenser to stop down the cone of light to the specimen (this lowers the effective numerical aperature). You will lose resolution, but gain contrast to see objects easier. You can move it back and forth as necessary.

4) As a side note, with the thickness of some hemacytometers and other chambers, you'll probably not be able to get the condenser close enough (high enough) to the specimen for perfection and lowering the condenser just makes it worse.

Tony

Ps After edelmare-at-muohio.edu's message: Most bioscopes do not allow Kohler illumination, they utilize diffuse illumination which is slightly different and attempts to even the light distribution in the image plane by scattering the light at the field diaphram plane (using ground glass or a diffuser over the light bulb). Kohler uses the plane of the light filament itself projected in the plane of the image. A better form of illumination is to remove the diffuser and place a fiberoptic head at the same location as the light bulb (this is what I do sometimes). It provides cool (thus protects filters) pretty even illumination.


..........................................................................
Andrew Anthony "Tony" Havics, CHMM, CIH, PE
pH2, LLC
PO Box 34140
Indianapolis, IN 46234
(317) 752-6386
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90% of Risk Management is knowing where to place the decimal point...any consultant can give you the other 10%â„ 

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From: jpshield-at-uga.edu
Date: Mon, 14 Aug 2006 14:21:17 -0500
Subject: [Microscopy] TEM serial section 3D

Contents Retrieved from Microscopy Listserver Archives
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Live Webinar:

"CCD Cameras for Ultra Low Light Microscopy: Technology Overview and Issues
to Consider Before Buying."

This Friday (18-August) at 11:30 AM (New York time). See details below.

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Cameras utilizing Intensification and Electron-Multiplication technologies
are used by life and physical science microscopists to enable the imaging of
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presenting a free, live, interactive, web-based seminar on these two signal
amplification technologies on Friday (18-August) at 11:30 AM (New York
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Who should attend:
Anyone interested in learning how these technologies work, what their
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----------------------------------------
MEETING SUMMARY
----------------------------------------
Name: "CCD Cameras for Ultra Low Light Microscopy: Technology Overview and
Issues to Consider Before Buying."

Hi Everyone,
Can anyone recommend a good, easy to use, software package for creating reconstructions from serial TEM sections that will run a PC platform?
Would prefer public domain but am open to inexpensive commercial options as well.

Please reply directly and not to the listserve.

Thanks
John Shields
EM Lab
UGA Athens, GA
jpshield-at-uga.edu
John P. Shields
Center for Ultrastructural Research
151 Barrow Hall
University of Georgia
Athens, GA 30602

706-542-4080

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From: oshel1pe-at-cmich.edu
Date: Mon, 14 Aug 2006 14:33:52 -0500
Subject: [Microscopy] LKB 2208 wax heater

Contents Retrieved from Microscopy Listserver Archives
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Listers,

Anyone have a working LKB Bromma 2208 multiplate wax heater/hot plate
warmer for donation or (cheap) sale?
Thanks.

Phil
--
Philip Oshel
Microscopy Facility Supervisor
Department of Biology
Central Michigan University
024C Brooks Hall
Mt. Pleasant, MI 48859
voice: (989) 774-3576
dept. fax: (989) 774-3462

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From: Bplowman-at-Pacific.edu
Date: Mon, 14 Aug 2006 14:55:18 -0500
Subject: [Microscopy] Converting to digital

Contents Retrieved from Microscopy Listserver Archives
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Dear Listserver:
We have a very small electron microscopy laboratory with 1970;s state
of the art equipment (Philips 201 and ETEC Autoscan). I am concerned
about the dwindling shortage and increased costs of film, chemistry and
paper. I would like to know if either or both of these instruments
could be easily converted to digial from film recording. I have not
kept up with the ccd camera prices and someone told me they wondered if
a good digital camera with an adapter would be available. What kind of
reasonable options are there for the old but very functional TEM and
SEM? Thanks for your advice. Barbara Plowman

Barbara L. Plowman
University of the Pacific
Arthur A. Dugoni School of Dentistry
2155 Webster St. Rm 636B
San Francisco, CA 94115
ph: 415-929-6692
email: Bplowman-at-pacific.edu


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From: Elliott-at-arizona.edu
Date: Mon, 14 Aug 2006 15:03:41 -0500
Subject: [Microscopy] Re: TEM serial section 3D

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Hi
We do hundreds of 3D reconstruction from TEM. Just to make a stack
of images I use QuickTime. That way people can 'scrub' through the
data to see the TEMs. There is no package available (that I know of)
that will take raw TEM data and output a 3D rendering that is
useful. I use Volocity (not public domain, nor cheep) to do the 3D
reconstructions and analytical work. Unless others have ideas, I
think you will have to be doing some work with the raw data before
the 3D work can be done. Feel free to contact me in you have any
questions. If you are only doing a small number, I could do it for you.
David



_____________________

David Elliott Ph.D.
Assistant Professor
Department of Cell Biology and Anatomy
University of Arizona College of Medicine
PO Box 245004
Tucson, AZ 85724

Voice: 520-626-7870
Fax: 520-626-2097


On Aug 14, 2006, at 12:37 PM, jpshield-at-uga.edu wrote:

}
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}
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} Hi Everyone,
} Can anyone recommend a good, easy to use, software package for
} creating reconstructions from serial TEM sections that will run a
} PC platform?
} Would prefer public domain but am open to inexpensive commercial
} options as well.
}
} Please reply directly and not to the listserve.
}
} Thanks
} John Shields
} EM Lab
} UGA Athens, GA
} jpshield-at-uga.edu
} John P. Shields
} Center for Ultrastructural Research
} 151 Barrow Hall
} University of Georgia
} Athens, GA 30602
}
} 706-542-4080
}
} ==============================Original
} Headers==============================
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From: Bplowman-at-Pacific.edu
Date: Mon, 14 Aug 2006 15:14:40 -0500
Subject: [Microscopy] Converting to digital

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Dear Listserver:
We have a very small electron microscopy laboratory with 1970;s state
of the art equipment (Philips 201 and ETEC Autoscan). I am concerned
about the dwindling shortage and increased costs of film, chemistry and
paper. I would like to know if either or both of these instruments
could be easily converted to digial from film recording. I have not
kept up with the ccd camera prices and someone told me they wondered if
a good digital camera with an adapter would be available. What kind of
reasonable options are there for the old but very functional TEM and
SEM? Thanks for your advice. Barbara Plowman

Barbara L. Plowman
University of the Pacific
Arthur A. Dugoni School of Dentistry
2155 Webster St. Rm 636B
San Francisco, CA 94115
ph: 415-929-6692
email: Bplowman-at-pacific.edu


==============================Original Headers==============================
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From: as-at-astonmet.com
Date: Mon, 14 Aug 2006 20:19:24 -0500
Subject: [Microscopy] lkb 2188 microtome information

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html



We prepare thin sections of epoxy embedded samples and came across an LKB
2188 microtome. We currently cut these with a wafering blade with great
difficulty.

Would anyone be familiar with this unit? Can we get blades to section
samples upwards of approximately 1/2 inch in diameter?

Thanks for any help.

Alan Stone


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From: alerch-at-mcw.edu
Date: Mon, 14 Aug 2006 20:56:31 -0500
Subject: [Microscopy] viaWWW: 568nm laser output decrease

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Email: alerch-at-mcw.edu
Name: Alexandra Lerch-Gaggl

Organization: Medical College of Wisconsin

Title-Subject: [Filtered] 568nm laser output decrease

Question: We have a Leica TCS SP2 with a 568nm laser in our facility. We had the tube remanufactured recently and I find now that over the time of an experiment the laser output decreases significantly, so that the intense signal i had at the beginning of the session is so deminished that I completely loose the image. When I open the box, which houses the laser, the power supply and the ventilator (remark on the side: I am allowed to do that, since I direct the facility and take care of our equipment), I see the signal return to its original intensity in a matter of a minute. My question is now: Is this related to overheating due to unsufficient ventilation or ... what else?
I would appreciate if you could share your ideas/solutions with me. Thank you.

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From: cgarber-at-2spi.com
Date: Mon, 14 Aug 2006 21:33:50 -0500
Subject: [Microscopy] converting to digital

Contents Retrieved from Microscopy Listserver Archives
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Barbara L. Plowman wrote:
=====================================================
We have a very small electron microscopy laboratory with 1970;s state
of the art equipment (Philips 201 and ETEC Autoscan). I am concerned
about the dwindling shortage and increased costs of film, chemistry and
paper. I would like to know if either or both of these instruments
could be easily converted to digial from film recording. I have not
kept up with the ccd camera prices and someone told me they wondered if
a good digital camera with an adapter would be available. What kind of
reasonable options are there for the old but very functional TEM and
SEM? Thanks for your advice.
=====================================================

These are really two different issues. For the Philips 201 TEM, there are
cameras available from several different manufacturers. For example, see
URL
http://www.sia-cam.com/ There is also the possibility of digial imaging
plates. http://www.ditabis.de/

For the ETEC SEM, you can convert from analog to digital with a number of
different software/hardware products, one being the Orion Frame Grabber
System for SEMs. See URL
http://www.2spi.com/catalog/instruments/ORION_Digital_Image_Acquisition_System.html

As is the case with most products in EM, there is a wide range of product
pricing, depending on budget and application.

It is off the topic but these two instruments are excellent for teaching
purposes. When a student learns how to master the operation of either, they
really do know how a TEM or SEM really "works". There is no software to do
the thinking for you........

Chuck

Disclaimer: SPI Supplies offers the Orion Frame Grabber System for SEMs via
the website indicated above.

===================================================
Charles A. Garber, Ph. D. Ph: 1-(610)-436-5400
President 1-(800)-2424-SPI
SPI SUPPLIES FAX: 1-(610)-436-5755
PO BOX 656 e-mail: cgarber-at-2spi.com
West Chester, PA 19381-0656 USA Cust. Service: spi2spi-at-2spi.com


Look for us!
############################
WWW: http://www.2spi.com
############################
==================================================



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From: kmoulton-at-usm.maine.edu
Date: Tue, 15 Aug 2006 08:15:01 -0500
Subject: [Microscopy] viaWWW: Capping or Patching

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Email: kmoulton-at-usm.maine.edu
Name: Karen Moulton

Organization: University of Southern Maine

Title-Subject: [Filtered] Capping or Patching

Question: I am using Aurion protein-A conjugated to 10 nm gold beads to detect viral antigens in an infected cell line - ultrathin sectioned and immnunostained. I am seeing a capping at the poles of cell sections and am wondering if this can be due to the beads and/or to the presence of serum blocking antibodies. The EMS Immnunogold Product Newsletter talks of Ultra-small reagent use for "No capping or patching, each probe unit consists of a single ligand". By the way, I am not seeing capping with IgM conjugated to 10nm beads and am unsure at this time about IgG conjugated beads.

Thank you, Karen Moulton

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From: tivol-at-caltech.edu
Date: Tue, 15 Aug 2006 15:55:23 -0500
Subject: [Microscopy] Re: need infos about e diffraction in TEM

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On Aug 14, 2006, at 4:30 AM, nizets2-at-yahoo.com wrote:

} 1) Can I use e diffraction to distinguish both types
} of particles? (to verify the purity of the powder)
} 2) What kind of information about the cristal
} structure can e diffraction give me in this case?
} 3) Can I detect a change -and which change- to the
} cristal structure using this technique if the mineral
} is heat and treated with strong acids? (which actually
} modifies the structure)
}
Dear Stephane,
Just an addition to Wharton's excellent response. If your specimen
consists of crystals too small to isolate one or two, you will likely
have a ring pattern--either a solid ring if the selected area contains
very many crystals or a series of spots arranged on a ring if there are
fewer crystals. Measuring the diameter of the ring and comparing it to
that for a known substance will give you spacings, which you can fit to
those in model structures, and changes in the relative intensities of
the rings can give structural information also (This could be due to
slight atomic displacements that do not affect the unit cell, but
change the relationships of the scattering from the atoms in the
crystal.) One of the recent publications from our lab (Wright, E. R.,
Iancu, C. V., Tivol, W. F., and Jensen, G. J., Observations on the
Behavior of Vitreous Ice at ~82 and ~12 K. Journal of Structural
Biology, (2006) in press.) used ED to determine the dose at which low
density amorphous ice underwent a transition to high density amorphous
ice, so you could expect to see similar changes.
Yours,
Bill Tivol, PhD
EM Scientist and Manager
Cryo-Electron Microscopy Facility
Broad Center, Mail Code 114-96
California Institute of Technology
Pasadena CA 91125
(626) 395-8833
tivol-at-caltech.edu


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From: g-leser-at-northwestern.edu
Date: Tue, 15 Aug 2006 16:25:56 -0500
Subject: [Microscopy] deconvolution of negatively stained EM images

Contents Retrieved from Microscopy Listserver Archives
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Hi All,

I have been imaging negatively stained virions and isolated viral proteins
and was wondering if anyone has ever applied blind deconvolution to images
of negatively stained samples? Are there any references or caveats?
Thanks!

George


George P. Leser, PhD
Dept. Biochemistry, Molecular Biology, and Cell Biology
Northwestern University
Hogan 2-100
2153 North Campus Drive
Evanston, IL 60208

g-leser-at-northwestern.edu



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From: jchampagne-at-caseforensicscorp.com
Date: Tue, 15 Aug 2006 20:12:33 -0500
Subject: [Microscopy] [Filtered] AskAMicroscopist: Used Microscopes with my high school

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Below is the result of your feedback form (NJZFM-ultra-55). It was submitted by (jchampagne-at-caseforensicscorp.com) from http://microscopy.com/Ask-A-Microscopist/Ask-A-Microscopist.html on Tuesday, August 15, 2006 at 14:06:51
---------------------------------------------------------------------------

Email: jchampagne-at-caseforensicscorp.com
Name: Joseph Champagne

Organization: CASE Forensics - Used Microscopes

Education: 9-12th Grade High School

Location: Leavenworth, WA

Question: I would like some advise and/or recommendations on purchasing a good used microscope. What manufacturer(s), magnification power, light capability, where to buy, etc? Mono vs. Stereo?

I want to use it with my high school age children to look at plant and animal cells, and disected samples.

I appreciate your assistance,

Joe

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From: leunissen-at-aurion.nl
Date: Tue, 15 Aug 2006 20:44:48 -0500
Subject: [Microscopy] Re: viaWWW: Capping or Patching

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Dear Karen

In theory, any conjugate which has more than one binding site, could
induce capping or patching. This is true for all the conventional
immuno-reagents, i.e. the big particles that likely have more than
one specific binding molecule adsorbed or bound to the particle's
surface. Ultra small particle based reagents, as quoted from the EMS
Newsletter, are of a different built: they are proteins bound with
one (or more) ultra small particles as opposed to a 10nm particle
which is coated with more than one protein molecule.
If you used serum in your blocking/incubation solutions the protein A
gold reagent may have reacted with available immunoglobulins, which
in the end may be causing the phenomenon as well.

Capping and patching may also be induced by the primary antibody,
especially when more than 1 epitope is involved.

With more info I may be able to give you a better idea. Please
contact me off-list.

Jan Leunissen



Aurion - President Electron Microscopy Research Advisor
Costerweg 5 Dept Anatomy and Structural Biology
6702 A Wageningen Otago School of Medicine
The Netherlands Dunedin, New Zealand
phone 31-317-497676 phone 64-3-4795465
fax 31-317-415955 fax 64-3-4797254
http://www.aurion.nl http://anatomy.otago.ac.nz
------------------------------------------------------------------------
--------






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From: jal490-at-nyu.edu
Date: Tue, 15 Aug 2006 20:51:02 -0500
Subject: [Microscopy] TEM - lymph node processing

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Hi I need help in processing lymph nodes for TEM.
I need a specific protocol for Lymph Nodes. The protocol that I'm using hasn't worked for this
tissue.
This protocol works with other tissues such as skin and heart
1- chemical fixation (glutaraldehyde + formaldehyde + tannic acid in cacodylate buffer for
one hour)
2- secondary fixation with osmium
3- uranyl acetate overnight
4- dehydrations with increasing concentrations of ethanol (20 minutes each step)
5- resin infiltration with increasing concentration of resin (1 hour each step)
6- overnight incubation with 100% resin
7- next day 1 hour incubation with 100% resin
8- polymerization of the blocks containing the samples for 2 days at 60 degrees celsius.

Thanks!

Jaime

Jaime Llodra
Graduate Student
Sackler Institute
NYU School of Medicine
NY, NY 10016

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From: amich-at-ufl.edu
Date: Tue, 15 Aug 2006 21:45:27 -0500
Subject: [Microscopy] thioflavin-S

Contents Retrieved from Microscopy Listserver Archives
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Hi,
I would appreciate the advice on the thioflavin-S staining.
I have two precious sections which were previously studied for
presence of inorganic deposits. The 40 micron thick sections from
4% PFA fixed brain tissue were mounted on slide, air-dried, and
evaluated by x-ray spectroscopy. Now I would like to demonstrate
amyloid but do not want to take any chances with the very
important sample. I am looking for the best protocol to use on the
sections ?abused? by air-drying.
Thank you for your consideration,
Albina


--
MIKHAYLOVA,ALBINA, PhD
Post Doctoral Research Associate
Materials Science and Engineering
University of Florida


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From: schooley-at-mcn.org
Date: Tue, 15 Aug 2006 23:50:48 -0500
Subject: [Microscopy] Re: [Filtered] AskAMicroscopist: Used Microscopes

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I'll be happy to provide specific advice, but I need to know more
about your needs & experience. I'm reluctant to recommend a used
scope unless you have enough experience to recognize problems, and to
fix them. Does "plant and animal cells" mean purchased, prepared
slides? And what do you mean by "dissected samples"? What is your
budget?

Although the microscope-buying advice on the MICRO website (URL
below) is intended for a younger age group, you may find it a useful
place to begin. There are several books in the MICRO bibliography
that can help; again, I need to know more to make suggestions.

Caroline

--
Caroline Schooley
Project MICRO Coordinator
Microscopy Society of America
Box 117, 45301 Caspar Point Road
Caspar, CA 95420
Phone/FAX (707)964-9460
Project MICRO: http://www.microscopy.org/ProjectMICRO

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From: a.d.mckinnon-at-abdn.ac.uk
Date: Wed, 16 Aug 2006 03:01:35 -0500
Subject: [Microscopy] Re: TEM - lymph node processing

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At 20:54 15/08/2006 -0500, you wrote:
hi Jaime,
If you were more specific it would be easier to help.

In what way has your current protocol not worked, e.g. did the blocks not
section well? Is the ultrastructural preservation poor? Was there a lot of
deposit on the sections?

I presume you are using epoxy resin processing, in which case I suggest the
following:

Make sure you are working with tissue of the correct dimensions,
particularly the thickness which should not exceed 1mm. Next I would leave
out the tanic acid and formaldehyde and fix in fresh ultrastructural grade
gluteraldehyde (2 - 2.5% in 0.1 M phosphtae or cac buffer) overnight at
4'C. Buffer rinse and secondary fix in 1% OsO4. Cut way down on the U/A
time to about 30mins in 1% aqueous. Your dehydrations times are OK if you
are using thin slices of node but make sure the final dehydrant is dry by
keeping your ethanol or acetone over a molecular seive. If you are using
ethanol you must follow this with a link reagent such as proylene oxide and
use this to mix with the resin for your infiltrations. If using acetone you
dont need a link reagent as you can dilute your resin infiltration solns
with acetone. If you are having sectioning problems, a bit of heat (but
don't exceed 30 mins at 60'C) plus vacuum helps with the infiltration.

Hope this helps, but get back to me with specifics if you need any more
guidance.

Alastair



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Alastair McKinnon
Histology & EM Facility Manager
University of Aberdeen, Institute of Medical Science
Foresterhill, Aberdeen, AB25 2ZD
tel: +44(0) 1224 552923 (office); +44(0) 1224 555911 (lab)
fax: +44(0) 1224 559533; email: a.d.mckinnon-at-abdn.ac.uk
www.abdn.ac.uk/ims/h-em



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12, 18 -- From: Alastair McKinnon {a.d.mckinnon-at-abdn.ac.uk}
12, 18 -- Subject: Re: [Microscopy] TEM - lymph node processing
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From: nizets2-at-yahoo.com
Date: Thu, 17 Aug 2006 01:48:40 -0500
Subject: [Microscopy] Re: need infos about e diffraction in TEM

Contents Retrieved from Microscopy Listserver Archives
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Thanks for the tip, but this book is not available at
Amazon. I did a search on the www but I cannot find a
distributor (it is probably too old).

I already spent one day on the link given by Sousan
(very nice).

Would there be another good reference book (more
recent perhaps) which does the same job as Hirsch's?

Regards,

Stephane

--- Jim Quinn {jquinn-at-www.matscieng.sunysb.edu} wrote:

} Stephane
}
} Purchase a copy of Hirsch's book.
} Go to Amazon.com.
} Search for "transmission electron hirsch".
}
} regards,
}
} Jim
}
} } From mail-at-ns.microscopy.com Mon Aug 14 07:30:49
} 2006
} } Date: Mon, 14 Aug 2006 06:33:44 -0500
} } To: jquinn-at-www.matscieng.sunysb.edu
} } From: nizets2-at-yahoo.com
} } Reply-to: nizets2-at-yahoo.com
} } X-Resent-From: "Microscopy Listserver"
} {microscopy-at-microscopy.com}
} } Subject: [Microscopy] need infos about e
} diffraction in TEM
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} } Dear listers,
} }
} } Although I understand the principle behind
} electron
} } diffraction in TEM I have no idea about the kind
} of
} } informations this technique gives and how to
} interpret
} } the diffraction pattern.
} } If you could give me a www address which explains
} that
} } I would be much grateful.
} }
} } Now a very practical problem could be perhaps
} used as
} } an example: we have a mixture of aluminosilicate
} } mineral (I have cut 70 nm sections) with approx.
} 90%
} } of mordenite and 10% quarz.
} } 1) Can I use e diffraction to distinguish both
} types
} } of particles? (to verify the purity of the
} powder)
} } 2) What kind of information about the cristal
} } structure can e diffraction give me in this case?
} } 3) Can I detect a change -and which change- to
} the
} } cristal structure using this technique if the
} mineral
} } is heat and treated with strong acids? (which
} actually
} } modifies the structure)
} }
} } We have also a tilt stage for tomography. Can
} this
} } bring further informations?
} }
} } Regards,
} }
} } Stephane
} }
} }
} }
} __________________________________________________
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} (PDT)
} } 8, 18 -- From: Stephane Nizet {nizets2-at-yahoo.com}
} } 8, 18 -- Subject: need infos about e diffraction
} in TEM
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From: keith.morris-at-ucl.ac.uk
Date: Thu, 17 Aug 2006 04:23:34 -0500
Subject: [Microscopy] Re: [Filtered] AskAMicroscopist: Used Microscopes

Contents Retrieved from Microscopy Listserver Archives
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Hi Joe,

We get asked this fairly regularly by schools and parents (so we have stock
replies). Often professional microscopists aren't the best source of
information for cheap microscope's as all our optical systems are always
over £10,000, and most lab mainstays like our three confocal microscopes
come in at nearer £200,000 each (and users still complain about image
quality). I assume you are asking about home use with your own kids.

Cheap microscopes under £100 are always a disappointment and toy (often
called student) microscopes can be very poor. You can easily buy second-hand
via ebay, but again there are risks that the optics will be damaged or
simply very dirty and difficult to clean and you may make an expensive
mistake. Look for old branded 'laboratory' microscopes e.g. Bausch & Lomb,
Prior, Leitz, Reichert, Baker, but probably not Tasco toys. Famous existing
brands like Zeiss and Olympus attract a high premium. The sellers are often
not microscopists though, and many are sold as collector's items and not for
'scientific' use. Also try any local microscope enthusiast clubs - they
aren't as common as the many excellent astronomy [telescope] clubs but they
are about and have knowledgeable enthusiasts with an eye for low cost
quality systems.

There are suppliers geared up to providing cheaper microscopes for schools,
so you can ask around at school's science departments, but expect to pay
nearer £500 each for a quality setup (although with those like bottom end
Meade [www.meade.com] at around £100 you can see something at low mag (~20x
objective i.e. around 180x mag) with a quality stained section.

For pond life etc. a stereoscopic 'dissecting' microscope (40x to 120x mag)
is ideal, and of course you can get a really long way with a good magnifying
glass (not the really small hi-mag cheap lens ones, try before you buy) - I
have a few excellent ones at home for £1 and a good low mag Osram one that
includes an illuminating halogen bulb at £8. In general I would say a good
stereo dissecting microscope is a good choice for kids as it's great for
viewing living things and enlarges what you can see already - look for 40x
rather than 4x though.

Generally prepared slides can rapidly get very boring for under 14s, but
living or unusual things (even hamster fur) always attract an audience. Also
try your flatbed film scanner (not LiDe and from around £60 upwards) that
will be good for looking at soft static things: leaves, fruit, nuts,
household objects (scan at max resolution and try reflected and 'film'
mode). In the UK there are sites like
http://www.wedgwood-group.com/microscopes_digital.htm that cater for schools
and colleges, providing standard compound and stereo microscopes as well as
cheap PC video based microscope solutions where the whole class can look at
a computer screen with some pushing and shoving. Best to try them on
'approval' as many cheap microscopes can be disappointing if you expect too
much.

Excellent pre-prepared stained slides of plant stems and leaves or bits of
rats, insects etc.. can be bought via ebay, but they tend to be expensive
and are easily broken by any age-group. Mounted slides keep well though, so
'vintage' ones even from 50 years ago can still look OK - most schools will
have some specimen slides knocking about.

At home and our Primary school (under 11) we use the Digital Blue QX-5 (£70)
- it's fun but pretty useless for serious microscope work as it's so low res
(but at 640 x 480 better than the old Intel QX-3 it replaced). It puts the
image on a PC screen. I have one at home for my kids (boy 10 and girl 12)
but it only gets occasional use now the novelty has worn off. See
http://micro.magnet.fsu.edu/optics/intelplay/index.html (not updated for the
QX-5 but all applies - the site even discusses ways of contrast enhancement
etc..). Once on the PC the 640x480 images can be manipulated and pasted etc,
and the QX-5 does time-lapse for things like crystal growth. living plants
growing and small animals. The similar but far better built Olympus MIC-D
was great but being over £500 it was just too expensive for most schools and
is now discontinued - there are other similar budget systems about though.

The macro on a good digital camera (like the image stabilised 5MP Canon S2IS
going cheap at £200 over here - http://www.dpreview.com/reviews/canons2is)
is also worth a try, particularly with a small tripod and halogen bendy desk
lamp if very close-up, but I'm not sure I'd like a class with 20 boys near
my Olympus E500 digital SLR system though. You can get quite reasonable
pictures by resting a small compact digital camera lens against the eyepiece
of a microscope. Plus you can the camera for normal photography when you
bored with microscopy.

By the way, if you get a microscope, do try growing crystals on a slide, a
few drops of a saturated solution of salt (NaCl) or copper sulphate will
grow superb crystals on the surface of a slide when viewed under a
microscope (but it takes a few hours for the crystals to form and they often
look best before the liquids all gone). Just make sure they don't drive the
objective tips into the solution.
It's not biology but its fun.

Regards


Keith

Try looking in Amazon.com for decent microscope books with lots of pictures
(and they have a good customer review system). Plus try web searches for
general sites like these (and for more specific topics) :

http://www.101science.com/Microscope.htm
http://micro.magnet.fsu.edu/
http://www.microscopy-uk.org.uk/index.html
http://www.btinternet.com/~stephen.durr/
http://www.mccroneatlas.com
http://www.diatoms.co.uk [for fun images made of diatoms]

----------------------------------------------------------
Dr Keith J Morris
Imaging Facilities Manager
Cell Biology Division
Institute of Ophthalmology
University College London
11-43 Bath Street
London EC1V 9EL

Tel: 020 7608 4050
Fax: 020 7608 4034
email: keith.morris-at-ucl.ac.uk





-----Original Message-----
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Sent: 16 August 2006 05:55
To: keith.morris-at-ucl.ac.uk

} ---------------------------------------------------------------------------
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} The Microscopy ListServer -- CoSponsor: The Microscopy Society of America

I'll be happy to provide specific advice, but I need to know more
about your needs & experience. I'm reluctant to recommend a used
scope unless you have enough experience to recognize problems, and to
fix them. Does "plant and animal cells" mean purchased, prepared
slides? And what do you mean by "dissected samples"? What is your
budget?

Although the microscope-buying advice on the MICRO website (URL
below) is intended for a younger age group, you may find it a useful
place to begin. There are several books in the MICRO bibliography
that can help; again, I need to know more to make suggestions.

Caroline

--
Caroline Schooley
Project MICRO Coordinator
Microscopy Society of America
Box 117, 45301 Caspar Point Road
Caspar, CA 95420
Phone/FAX (707)964-9460
Project MICRO: http://www.microscopy.org/ProjectMICRO

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5, 19 -- From: Caroline Schooley {schooley-at-mcn.org}
5, 19 -- Subject: Re: [Microscopy] [Filtered] AskAMicroscopist: Used
Microscopes
5, 19 -- with my high school
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From: lcgould-at-med.cornell.edu
Date: Thu, 17 Aug 2006 08:15:40 -0500
Subject: [Microscopy] Re: [Filtered] AskAMicroscopist: Used Microscopes

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

A cautionary note about buying lab equipment on e-bay,etc:

A few years ago, we had a rash of small and not-so-small
instrumentation going missing (pipettors, and microscope components).
An astute pot-doc who was playing "let's see if e-bay any any _____"
came across listings of items for sale, all by one seller, that very
closely matched the missing material. He reported it to the med
school's security department who investigated. It turned out that
another post-doc had been spiriting items out of his lab and the labs
of his PI's collaborators and supplementing his income by selling
them on e-bay.
e-bay was EXTREMELY cooperative about helping with the investigation
and, needless to say that fellow's career was brought to a crashing
halt.
e-bay has grown so large that although it makes efforts to control
what's on its site, clearly, it cannot do so 100%.
I don't know the final outcome with regard to the stolen materials.

Lee
--
Leona Cohen-Gould, M.S.
Sr. Staff Associate
Director, Electron Microscopy & Histology Core Facility
Manager, Optical Microscopy Core Facility
Joan & Sanford I. Weill Medical College
of Cornell University
voice (212)746-6146
fax (212)746-8175
http://www.cornellcelldevbiology.org
http://www.cornellbiochem.org

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From: addlvirology-at-mail.agri.state.oh.us
Date: Thu, 17 Aug 2006 08:36:10 -0500
Subject: [Microscopy] EM-109

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Has anyone used this particular microscope EM-109 (Zeiss) and have had any
problems with it? I can't seem to get the filament to work, and the
condenser moves when I go to spread the beam out. Anyone have any
suggestions as to how to fix it?

Yarn
Dept of Agriculture


==============================Original Headers==============================
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From: paul_hazelton-at-umanitoba.ca
Date: Thu, 17 Aug 2006 09:46:21 -0500
Subject: [Microscopy] [Filtered] AskAMicroscopist: Used Microscopes

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Regards purchase on eBay of 'hot' items, always ask the seller for
serial number information. This can provide information about the age
and legitimacy of the item. If the seller will not provide information,
it's probably best to not purchase.


As a further cautionary note - you have no guarantee that the equipment
you purchase will work properly. Make sure that the seller is reputable
and that you can service or repair whatever you buy. We recently
purchased a microcentrifuge using eBay to replace equipment which went
to another lab - totally legitimately, the other person had paid for it
and the group was growing. The microcentrifuge works well. As a
result, I am now thinking about purchasing variable volume pipetters.
Again, to replace equipment which was moved to the other lab. In the
first case, I followed the caveats of getting a history before bidding,
knowing what the item cost new, knowing what it may cost to repair or
calibrate the equipment, and establishing a maximum amount I'm was
willing to bid. I will do the same if we decide to actually purchase
pipetters.


Finally, remember that in many ways eBay is a game where people may get
caught up in the thrill of the chase, and most of that chase occurs in
the last 10 minutes. Stick to that maximum you set or you may get
caught up in the game and pay too much.

Paul



Paul R. Hazelton, PhD
Electron Microscope Unit
University of Manitoba
Department of Medical Microbiology
531 Basic Medical Sciences Building
730 William Avenue
Winnipeg, Manitoba, Canada, R3E 0W3
e-mail: paul_hazelton-at-umanitoba.ca
Phone:204-789-3313
Pager:204-931-9354
Cell:204-781-1502
Fax: 204-789-3926


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From: dsherman-at-purdue.edu
Date: Thu, 17 Aug 2006 10:26:48 -0500
Subject: [Microscopy] Cryo-protectant for cement

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Does anyone know if dispersants used in making cement (yup...new sample for
us biologists!) can act as cryo-protectants when freezing the sample using
HPS? The dispersants are proprietary comb-type polycarboxylates with
straight backbones and parallel short chains extending outward.

Debby

Debby Sherman, Manager Phone: 765-494-6666
Life Science Microscopy Facility FAX: 765-494-5896
Purdue University E-mail: dsherman-at-purdue.edu
S-052 Whistler Building
170 S. University Street
West Lafayette, IN 47907
http://www.agriculture.purdue.edu/microscopy


==============================Original Headers==============================
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From: donovan-at-uoregon.edu
Date: Thu, 17 Aug 2006 16:30:24 -0500
Subject: [Microscopy] EDS/Spectrum Imaging/Low Voltage Analysis Workshop, Eugene, OR

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

We have room for several more attendees.

The University of Oregon is hosting a workshop for Energy Dispersive
Analysis (EDS) which will focus of quantitative phase mapping and low
voltage (high resolution) analysis of materials on the scanning
electron microscope and electron microprobe analyzer. Topics will
include identification of minor and trace phases and contaminates,
phase distribution and modal abundance and quantitation of small
particles and other embedded phases. This workshop will be a hands on
exploration of the state of the art on several instruments offering
the latest instrumental breakthroughs for quantitative analysis and
x-ray mapping capabilities with one of the world's leading experts:
Dale Newbury from the National Institute of Standards and Technology.

1. Zeiss Ultra with Oxford Inca
2. FEI Quanta with Bruker XFlash
3. Cameca SX100 with Thermo System Six

Attendance is limited! Additional morning presentations are welcome-
please contact John Donovan directly.

EDS Spectrum Imaging and Low Voltage (High Resolution) Analysis,
University of Oregon, Eugene, OR

3 day workshop by Dale Newbury (National Institute of Standards &
Technology), September, 12-14, 2006

Morning 1 talk: "Silicon Drift Detectors: Energy Dispersive X-ray
Spectrometry and X-ray Spectrum Imaging at Output Count Rates Above
100 kHz, and What to Do with All This Data"

Afternoon Demos:
* Spectral Imaging and Mapping with a conventional EDS (Oxford and Thermo)
* Bruker Quad SDD and Thermo SDD doing high speed x-ray spectrum
image mapping on an FEI Quanta SEM
* LISPIX hands-on software lab, with pre-recorded x-ray spectrum
image data sets.

Morning 2 talk: "Challenges to Successful EDS X-ray Microanalysis in
the Low Beam Energy (E0 { 5 keV) Regime"

Afternoon demos:
* Low Beam Energy SEM/EDS on selected specimens, e.g., SiC, BaTiO3, etc.
* Demonstration of conventional WDS in the low beam energy regime
with BaTiO3 scanning the TiL-O K and BaM spectral regions.

Morning 3 talk: "The Perils of Automatic EDS Analysis: Blunders in
Automated Peak Identification of Major, Minor, and Trace Constituents
and the Reality of Standardless Analysis"

Afternoon demo:
* Testing Automatic Peak ID and Standardless Analysis with
commercial software in the Laboratory
* User suggestions for testing (bring your own samples)

Check this page for registration and further details:
http://epmalab.uoregon.edu/eds_workshop.htm

Respond to John Donovan (donovan-at-uoregon.edu) to confirm your
participation. Registration is required by September 1, 2006.
More to come...


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From: nizets2-at-yahoo.com
Date: Fri, 18 Aug 2006 01:57:03 -0500
Subject: [Microscopy] workshop/courses about electron diffractometry

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Dear listers,

We are looking for opportunities to learn the
techniques of electron diffractometry (by TEM). We are
working with a Tecnai G20 and the main purpose is the
analysis of natural mineral samples.
We will consider any proposition from workshop to
on-site training. A very important limitation is
geography: we have no desire to leave our good old
Europa (we are based in Austria).

Stephane


__________________________________________________
Do You Yahoo!?
Tired of spam? Yahoo! Mail has the best spam protection around
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==============================Original Headers==============================
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5, 18 -- Date: Thu, 17 Aug 2006 23:57:02 -0700 (PDT)
5, 18 -- From: Stephane Nizet {nizets2-at-yahoo.com}
5, 18 -- Subject: workshop/courses about electron diffractometry
5, 18 -- To: microscopy-at-microscopy.com
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From: ab78-at-esc.cam.ac.uk
Date: Fri, 18 Aug 2006 04:04:14 -0500
Subject: [Microscopy] need infos about e diffraction in TEM

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Not sure which Hirsch book jim had in mind but maybe one of :

TOPICS IN ELECTRON DIFFRACTION AND MICROSCOPY OF MATERIALS (1999)
Electron Microscopy of Thin Crystals (1965)

(transmission isn't in the title..)


nizets2-at-yahoo.com wrote:
} ----------------------------------------------------------------------------
} The Microscopy ListServer -- CoSponsor: The Microscopy Society of America
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} On-Line Help http://www.microscopy.com/MicroscopyListserver/FAQ.html
} ----------------------------------------------------------------------------
}
} Thanks for the tip, but this book is not available at
} Amazon. I did a search on the www but I cannot find a
} distributor (it is probably too old).
}
} I already spent one day on the link given by Sousan
} (very nice).
}
} Would there be another good reference book (more
} recent perhaps) which does the same job as Hirsch's?
}
} Regards,
}
} Stephane
}
} --- Jim Quinn {jquinn-at-www.matscieng.sunysb.edu} wrote:
}
} } Stephane
} }
} } Purchase a copy of Hirsch's book.
} } Go to Amazon.com.
} } Search for "transmission electron hirsch".
} }
} } regards,
} }
} } Jim
} }
} } } From mail-at-ns.microscopy.com Mon Aug 14 07:30:49
} } 2006
} } } Date: Mon, 14 Aug 2006 06:33:44 -0500
} } } To: jquinn-at-www.matscieng.sunysb.edu
} } } From: nizets2-at-yahoo.com
} } } Reply-to: nizets2-at-yahoo.com
} } } X-Resent-From: "Microscopy Listserver"
} } {microscopy-at-microscopy.com}
} } } Subject: [Microscopy] need infos about e
} } diffraction in TEM
} } } Errors-To:
} } MicroscopyListSpamFilter-at-microscopy.com
} } } X-lewp: MicroscopyListSpam NAGS
} } }
} } }
} } }
} } }
} } }
} }
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} ----------------------------------------------------------------------------
} } }
} } } Dear listers,
} } }
} } } Although I understand the principle behind
} } electron
} } } diffraction in TEM I have no idea about the kind
} } of
} } } informations this technique gives and how to
} } interpret
} } } the diffraction pattern.
} } } If you could give me a www address which explains
} } that
} } } I would be much grateful.
} } }
} } } Now a very practical problem could be perhaps
} } used as
} } } an example: we have a mixture of aluminosilicate
} } } mineral (I have cut 70 nm sections) with approx.
} } 90%
} } } of mordenite and 10% quarz.
} } } 1) Can I use e diffraction to distinguish both
} } types
} } } of particles? (to verify the purity of the
} } powder)
} } } 2) What kind of information about the cristal
} } } structure can e diffraction give me in this case?
} } } 3) Can I detect a change -and which change- to
} } the
} } } cristal structure using this technique if the
} } mineral
} } } is heat and treated with strong acids? (which
} } actually
} } } modifies the structure)
} } }
} } } We have also a tilt stage for tomography. Can
} } this
} } } bring further informations?
} } }
} } } Regards,
} } }
} } } Stephane
} } }
} } }
} } }
} } __________________________________________________
} } } Do You Yahoo!?
} } } Tired of spam? Yahoo! Mail has the best spam
} } protection around
} } } http://mail.yahoo.com
} } }
} } } ==============================Original
} } Headers==============================
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} } 06:30:17 2006
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} } 2006 04:30:15 PDT
} } } 8, 18 -- Date: Mon, 14 Aug 2006 04:30:15 -0700
} } (PDT)
} } } 8, 18 -- From: Stephane Nizet {nizets2-at-yahoo.com}
} } } 8, 18 -- Subject: need infos about e diffraction
} } in TEM
} } } 8, 18 -- To: microscopy-at-microscopy.com
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} 9, 20 -- Date: Wed, 16 Aug 2006 23:48:39 -0700 (PDT)
} 9, 20 -- From: Stephane Nizet {nizets2-at-yahoo.com}
} 9, 20 -- Subject: Re: [Microscopy] need infos about e diffraction in TEM
} 9, 20 -- To: Jim Quinn {jquinn-at-www.matscieng.sunysb.edu}
} 9, 20 -- Cc: microscopy-at-microscopy.com
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--


Andy Buckley

AB78-at-ESC.CAM.AC.UK
DEPARTMENT OF EARTH SCIENCES
UNIVERSITY OF CAMBRIDGE Tel +44 1223 333469
DOWNING STREET +44 1223 333400
CAMBRIDGE FAX +44 1223 333450
CB2 3EQ

Manager of XRD discussion list:
http://www.jiscmail.ac.uk/lists/xrd.html

==============================Original Headers==============================
10, 22 -- From ab78-at-esc.cam.ac.uk Fri Aug 18 04:04:14 2006
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From: raristau-at-ims.uconn.edu
Date: Fri, 18 Aug 2006 09:02:33 -0500
Subject: [Microscopy] need infos about e diffraction in TEM

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

All:

I was able to obtain a reprint of
ELECTRON MICROSCOPY OF THIN CRYSTALS by Hirsch, et al.
from Krieger Publishing Company, Malabar, Florida

Cheers

Roger A. Ristau, PhD
Electron Microscopy Specialist
Institute of Materials Science
97 North Eagleville Road
University of Connecticut
Storrs, CT 06269
vox: 860-486-5379
fax: 860-486-4745



} From: nizets2-at-yahoo.com
} Reply-To: nizets2-at-yahoo.com
} Date: Thu, 17 Aug 2006 01:57:38 -0500
} To: raristau-at-ims.uconn.edu
} Subject: [Microscopy] Re: need infos about e diffraction in TEM
}
}
}
}
} ----------------------------------------------------------------------------
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}
} Thanks for the tip, but this book is not available at
} Amazon. I did a search on the www but I cannot find a
} distributor (it is probably too old).
}
} I already spent one day on the link given by Sousan
} (very nice).
}
} Would there be another good reference book (more
} recent perhaps) which does the same job as Hirsch's?
}
} Regards,
}
} Stephane
}
} --- Jim Quinn {jquinn-at-www.matscieng.sunysb.edu} wrote:
}
} } Stephane
} }
} } Purchase a copy of Hirsch's book.
} } Go to Amazon.com.
} } Search for "transmission electron hirsch".
} }
} } regards,
} }
} } Jim
} }
} } } From mail-at-ns.microscopy.com Mon Aug 14 07:30:49
} } 2006
} } } Date: Mon, 14 Aug 2006 06:33:44 -0500
} } } To: jquinn-at-www.matscieng.sunysb.edu
} } } From: nizets2-at-yahoo.com
} } } Reply-to: nizets2-at-yahoo.com
} } } X-Resent-From: "Microscopy Listserver"
} } {microscopy-at-microscopy.com}
} } } Subject: [Microscopy] need infos about e
} } diffraction in TEM
} } } Errors-To:
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} } }
} } }
} } }
} } }
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} } }
} } } Dear listers,
} } }
} } } Although I understand the principle behind
} } electron
} } } diffraction in TEM I have no idea about the kind
} } of
} } } informations this technique gives and how to
} } interpret
} } } the diffraction pattern.
} } } If you could give me a www address which explains
} } that
} } } I would be much grateful.
} } }
} } } Now a very practical problem could be perhaps
} } used as
} } } an example: we have a mixture of aluminosilicate
} } } mineral (I have cut 70 nm sections) with approx.
} } 90%
} } } of mordenite and 10% quarz.
} } } 1) Can I use e diffraction to distinguish both
} } types
} } } of particles? (to verify the purity of the
} } powder)
} } } 2) What kind of information about the cristal
} } } structure can e diffraction give me in this case?
} } } 3) Can I detect a change -and which change- to
} } the
} } } cristal structure using this technique if the
} } mineral
} } } is heat and treated with strong acids? (which
} } actually
} } } modifies the structure)
} } }
} } } We have also a tilt stage for tomography. Can
} } this
} } } bring further informations?
} } }
} } } Regards,
} } }
} } } Stephane
} } }
} } }
} } }
} } __________________________________________________
} } } Do You Yahoo!?
} } } Tired of spam? Yahoo! Mail has the best spam
} } protection around
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} } } ==============================Original
} } Headers==============================
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} } 06:30:17 2006
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} } 2006 04:30:15 PDT
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} } (PDT)
} } } 8, 18 -- From: Stephane Nizet {nizets2-at-yahoo.com}
} } } 8, 18 -- Subject: need infos about e diffraction
} } in TEM
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} 9, 20 -- From: Stephane Nizet {nizets2-at-yahoo.com}
} 9, 20 -- Subject: Re: [Microscopy] need infos about e diffraction in TEM
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==============================Original Headers==============================
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7, 20 -- From: Roger Ristau {raristau-at-ims.uconn.edu}
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From: joe.wang-at-hermes-microvision.com
Date: Fri, 18 Aug 2006 12:10:48 -0500
Subject: [Microscopy] Secondary electron detector

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Dear listers,

We are looking for solid state secondary electron detector that is similar
to Si PIN type, but more sensitive (higher gain) than Si (not scintillator
type (E-T type).

Joe Wang

Project Manager
Hermes Microvision, Inc.
1595 McVandless Drive
Milpitas, CA 95035
e-Mail: joe.wang-at-hermes-microvision.com

Office: (408)273-5855




==============================Original Headers==============================
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From: Mike.Bode-at-olympus-sis.com
Date: Fri, 18 Aug 2006 17:17:57 -0500
Subject: [Microscopy] FW: Anybody interested in a JEOL 100CX

Contents Retrieved from Microscopy Listserver Archives
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For a few days I have been trying to post a message that we are giving
away our JEOL 100CX, but I guess it was always filtered as SPAM. So here
it is again:

We are giving away our JEOL 100CX STEM. It is in running condition (or I
should say was until about 9 months ago, we haven't used it since). We
will keep the chiller. The new owner will be responsible for packing and
shipping. The STEM is located in Lakewood, Colorado. No warranties or
guarantees.

Let me know if you are interested. I'll make a decision next week.

Michael Bode, Ph.D.

General Manager

OLYMPUS SOFT IMAGING SOLUTIONS
12596 West Bayaud Ave #300
Lakewood, CO 80228
USA
Tel.: +1 (303) 234-9270
Fax.: +1 (303) 234-9271
E-mail: Mike.Bode-at-olympus-sis.com
www.olympus-sis.com



==============================Original Headers==============================
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From: zzhang-at-uwyo.edu
Date: Fri, 18 Aug 2006 18:05:30 -0500
Subject: [Microscopy] viaWWW: Question-Immuno-gold test

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Email: zzhang-at-uwyo.edu
Name: Zhaojie Zhang

Organization: University of Wyoming

Title-Subject: [Filtered] Question-Immuno-gold test

Question: Dear Listers:

I am having a problem with the secondary antibody - Immuno-gold conjugate (6 nm from Electron Microscopy Sciences). Here is what I did -

I run a test with a LR White embeded sample following the "standard" protocol for immuno-gold labeling. I could not find any gold particles - no labeling, no background. Trying to figure out what is wrong, I tested the secondary antibody alone - put a small drop of the original antibody (no dilution) directly onto a TEM grid, air dry and viewed with TEM. I could not find any 6 nm gold particles. I did find a few particles ranging from 50 nm to 150 nm.

I then called the company, explained my problem. I was told that that is NOT the way I should test the secondary antibody, instead, I should do a dot-spot test (with silver enhancement?)

My Question is: Has anyone had this problem before? How do you check if the secondary antibody (immuno-gold) works or not?

Thank you,

Zhaojie Zhang
Microscopy Core Facility
University of Wyoming


---------------------------------------------------------------------------

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From: KLRadke-at-ucdavis.edu
Date: Fri, 18 Aug 2006 18:05:52 -0500
Subject: [Microscopy] viaWWW: LM - coupling digital camera back to Nikon Diaphot

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Email: KLRadke-at-ucdavis.edu
Name: Kathryn Radke

Organization: Univ. California, Davis

Title-Subject: [Filtered] LM - coupling digital camera back to Nikon Diaphot

Question: I'd like to use my Nikon D70s camera back on my lab's 1985 Nikon Diaphot inverted cell culture microscope. The Diaphot front port has a fitting that couples to Nikon film backs (e.g. FE2, FTN) having Nikon F bayonet type lens mount. When the microscope is set up properly, the image viewed through the eyepieces focused on the film.

The D70S back won't fit directly onto the Diaphot. A local camera store tells me that I could use a T mount adapter that is designed to couple a digital back with a telescope. With the T mount adapter in place, the digital back can be used in Manual mode and the shutter speed can be set using the "command dial" on the camera back. I would also need to purchase a remote cord to operate the back without shaking the microscope.

I would be most grateful if anyone can give some feedback about necessary parts, operation, etc. Are there websites that have relevant information?

Thank you.
Kathryn


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From: connie.a.cummings-at-gsk.com
Date: Fri, 18 Aug 2006 18:06:15 -0500
Subject: [Microscopy] viaWWW: EM tech certification

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Email: connie.a.cummings-at-gsk.com
Name: Connie Cummings

Organization: GSK

Title-Subject: [Filtered] EM tech certification

Question: I was wondering where do you get information on certification on EM certification.

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From: kmoulton-at-usm.maine.edu
Date: Fri, 18 Aug 2006 18:06:42 -0500
Subject: [Microscopy] viaWWW: 6mm Truffs

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Email: kmoulton-at-usm.maine.edu
Name: Karen Moulton

Title-Subject: [Filtered] 6mm Truffs

Question: Does anyone know where I can purchase 6mm truffs?

Karen Moulton

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From: murphyjudy-at-comcast.net
Date: Fri, 18 Aug 2006 18:30:31 -0500
Subject: [Microscopy] Re: viaWWW: EM tech certification

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Hi Connie,
On the web, go to

http://www.msa.colostate.edu/certboard/

and it gives the info about certification.

Good luck,
Judy

Judy Murphy, PhD
Microscopy Training, Imaging, and Lab Design
Stockton, CA 95219
murphyjudy-at-comcast.net


connie.a.cummings-at-gsk.com wrote:
Organization: GSK
--|
--|Title-Subject: [Filtered] EM tech certification
--|
--|Question: I was wondering where do you get information on certification on EM certification.
--|


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From: leunissen-at-aurion.nl
Date: Fri, 18 Aug 2006 18:43:14 -0500
Subject: [Microscopy] Re: viaWWW: Question-Immuno-gold test

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Dear Zhaojie Zhang,

There are two tests you can do when you don't get a positive result
im immuno gold labelling and when you want to check whether the
conjugate performs up to standards:

1. An activity test, using a dot-spot system
In this test a dilution series of corresponding IgG (Rabbit IgG in
the present case) is spotted on a strip of nitrocellulose, and after
blocking the strip is incubated with the gold conjugate. Silver
enhancement is only required if you would test an ultra small
particle conjugate in which the gold does not significantly
contribute to otain colored dots. A 6nm conjugate has 'sufficient
color' and does not need enhancement.
We can supply you with a procedure if you like, they are described
extensively in our Newsletter 4.
2. A TEM test in which the gold conjugate is adsorbed (not dried from
the stock solution) onto a grid that is filmed and coated with poly-L-
lysine which by its positive charge will bind negatively charged gold
particles. Grids are washed on distilled water after adsorption.
Again, we can supply you with a procedure if you like.

Drying a small drop of undiluted conjugated onto a filmed grid makes
it not easy, if not impossible, to see particles or to evaluate what
particle sizes you have. After all there is buffer components and
protecting protein in the conjugate solution that all dry onto the
grid. Also, upon drying particles tend to aggregate and form clumps
(that are usually not easy to dissolve completely again, so they are
pretty solid) and which will give erroneous readings.

I will be happy to help trying to stablish whether antigens may have
been damaged preventing positive results or whether the primary
antibody or secondary antibody have lost activity.

Cheers, hope this helps, get in touch if you like. New Zealand is
still good fun!!

Jan Leunissen


Aurion - President Electron Microscopy Research Advisor
Costerweg 5 Dept Anatomy and Structural Biology
6702 A Wageningen Otago School of Medicine
The Netherlands Dunedin, New Zealand
phone 31-317-497676 phone 64-3-4795465
fax 31-317-415955 fax 64-3-4797254
http://www.aurion.nl http://anatomy.otago.ac.nz


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From: gary-at-gaugler.com
Date: Fri, 18 Aug 2006 23:06:32 -0500
Subject: [Microscopy] New subject-service life of new SEMs

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Hi Listers:

I have a new topic that is not particularly relevant
today but probably will be in the foreseeable future.

The newer SEMs are very advanced and make maximum use
of PC interfacing. The PCs will age but should work OK
or be replaced by faster models if necessary or due to
supportability factors.

What about the SEM itself? These are now made with
surface mount technology, flip chip BGAs and FPGAs.

Some makers are saying that they will support a specific
product line for 5-10 more years, or less. After that, one needs
to buy a new SEM. This is what they are saying....not
all SEM makers. But enough to trigger the sensitivity of
a potentially big bow wave of problems. The up-front cost
of a tool really does not put it in the disposable category.
Plus, in an industrial setting, how would depreciation factor in?
But if the tool cannot be supported after say ten years, then
it a disposable item if there are no other service resources.
The dearth of schematics is a huge issue with me since I cannot
talk to the service folks with knowledge and also impacts the
future cut off of service. One is basically buying a $500K
boat anchor that needs replacing every ten year or so. Yep,
sounds like a boat problem.

Recall that the Amray and early JEOL tools were relatively
easy to fix... electronics-wise. These newer systems are not
at all easy to fix or troubleshoot.

I'm just blowing the whistle on what I think is a pending
huge problem.

Alternate opinions?

gary g.



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From: mike.reedy-at-cellbio.duke.edu
Date: Sat, 19 Aug 2006 00:42:54 -0500
Subject: [Microscopy] Re: need infos about e diffraction in TEM

Contents Retrieved from Microscopy Listserver Archives
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All:
Abebooks.com had several copies of both Hirsch books available, found by
Advanced search on---
Author: hirsch
Keywords: electron microscopy

-mike reedy
.

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Michael K. Reedy, M.D.
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From: bernard-at-bearinc.com
Date: Sat, 19 Aug 2006 00:59:21 -0500
Subject: [Microscopy] Service life of new SEMs -- Agreed!

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Gary,
As a co-owner of a Jeol 6100 with an intermittent problem, and a
soon-to-be owner of an 840F, I could not agree more. My 6100 does have
schematics, but at the board level they are not even the correct boards.
In defense of the manufacturers, they have high development costs and
very low unit sales. Plus, the market size is very limited. If they
were making a big profit, many other competitors would jump in.

I wonder why there are not specialty shops that take existing SEMs,
strip them down to the column and other mechanical hardware, and couple
up wholly new electronics. (Maybe there are. If so, I'd like to hear
about them.) Isn't it just a more (ok, way more) complicated version of
taking an old loudspeaker and hooking up a new amplifier?

With the technical service info secret, the customer is really leasing
the tool, not buying it, since the customer is entirely dependent on the
manufacturer to keep it running, and the manufacturer can define its
useful life.

Is there a SEM manufacturer who sells complete service literature?

Bernard Cuzzillo
Berkeley, CA
USA

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From: tom-at-tomkaye.com
Date: Sat, 19 Aug 2006 01:18:00 -0500
Subject: [Microscopy] RE: Service life of new SEMs -- Agreed!

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As one of the guys who can't afford the 500k for a new unit, I am looking
forward to all of you dumping out of your 10 year old units when the time
comes. My solution is simple, if the price is cheap enough you buy several
for spares. Then you can remove-and-replace as required. I am currently
keeping an old Kevex system running this way and have backup boards
purchased for nothing on Ebay. I have also just purchased a complete JEOL
6100F for 800 bucks and am keeping an eye out for another. As a hobbyist
this is my only choice so the less service the better for me.

On the other side of the coin, I would be blowing a fuse knowing my half
mill investment would be worthless in 10 years. I agree with Gary that the
schematics make all the difference.

Tom Kaye


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From: randerson20-at-tampabay.rr.com
Date: Sat, 19 Aug 2006 07:50:07 -0500
Subject: [Microscopy] Re: viaWWW: EM tech certification

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The chair of the Microscopy Society of America Certification Board is E.
Ann Ellis at eann.ellis-at-worldnet.att.com

Good Luck!

connie.a.cummings-at-gsk.com wrote:
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} Organization: GSK
}
} Title-Subject: [Filtered] EM tech certification
}
} Question: I was wondering where do you get information on certification on EM certification.
}
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From: classyjay247-at-yahoo.com
Date: Sat, 19 Aug 2006 09:13:12 -0500
Subject: [Microscopy] AskAMicroscopist: electron gun

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Below is the result of your feedback form (NJZFM-ultra-55). It was submitted by (classyjay247-at-yahoo.com) from http://www.microscopy.com/Ask-A-Microscopist/Ask-A-Microscopist.html on Saturday, August 19, 2006 at 08:46:19
---------------------------------------------------------------------------

Email: classyjay247-at-yahoo.com
Name: Uchenna Victor

Organization: federal university of technology Owerri

Education: Undergraduate College

Location: Abuja Nigeria

Question: what are the transmission patterns of electron gun

---------------------------------------------------------------------------

==============================Original Headers==============================
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From: murphyjudy-at-comcast.net
Date: Sat, 19 Aug 2006 12:19:15 -0500
Subject: [Microscopy] need infos about e diffraction in TEM

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Hirsch has also just listed at amazon.com along with several other
diffraction books.
Interesting tidbit: there are over 750 titles on electron microscopy on
amazon!!! I was amazed. Below are a few with links on diffraction that
one lister asked about.
Cheers,
Judy

Judy Murphy, PhD
Microscopy Training, Imaging, and Lab Design
Stockton, CA 95219
murphyjudy-at-comcast.net


Hirsch
EM of Thin Crystals
http://s1.amazon.com/exec/varzea/ts/exchange-glance/Y04Y5461265Y9057909/002-0880518-7016064

Modern Crystallography
http://www.amazon.com/exec/obidos/ASIN/0387100520/002-0880518-7016064

Diffraction (Student Micrograph in Physics)
http://www.amazon.com/exec/obidos/ASIN/0852745796/002-0880518-7016064

Andrews
Interpretation of Electron Diffraction Patterns
http://www.amazon.com/exec/obidos/ASIN/0306305348/002-0880518-7016064

McCall
Interpretive Techniques for Microstructural Analysis
http://www.amazon.com/exec/obidos/ASIN/0306310368/002-0880518-7016064

Rostoker
Interpretation of Metallographic Structures
http://www.amazon.com/exec/obidos/ASIN/0125982550/002-0880518-7016064

RMS Series
Intro to Crystallography
http://www.amazon.com/exec/obidos/ASIN/0198564333/002-0880518-7016064

Transmission Electron Microscopy of Minerals and Rocks
http://www.amazon.com/exec/obidos/ASIN/0521350980/002-0880518-7016064


mike.reedy-at-cellbio.duke.edu wrote:

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From: jfactor-at-ns.purchase.edu
Date: Sat, 19 Aug 2006 16:53:28 -0500
Subject: [Microscopy] Re: New subject-service life of new SEMs

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

You are right when you say that these are not disposable items. If
manufacturers have the attitude that we in the academic world can simply
conjure up $250-500,000 because they determine that the lifespan of
their EM is 10 years, then the EM community collectively should send a
strong message to the contrary. My attitude is this: if an EM
manufacturer will not continue to support and keep my EM going until I
am ready (and able) to replace it, then (when I do find the funds for a
replacement) my next microscope will definitely not be one of theirs.
There are companies that apparently stand up for their microscopes for
the extended lifetimes they should be proud of. As an example, the lab I
was trained in still has the microscope that I was trained on some 30
years ago (they added a digital camera, and I'm told it's one of the
favored TEMs in the lab).
--Jan Factor

---------------------------------------
Jan Robert Factor, Ph.D.
Professor of Biology
---------------------------------------
Natural Sciences
Purchase College
State University of New York
735 Anderson Hill Rd.
Purchase, NY 10577
USA
---------------------------------------
Office Tel: 914-251-6659
Office Fax: 914-251-6635
E-mail: jfactor-at-ns.purchase.edu
or- jan.factor-at-purchase.edu
---------------------------------------



gary-at-gaugler.com wrote:
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} ----------------------------------------------------------------------------
}
} Hi Listers:
}
} I have a new topic that is not particularly relevant
} today but probably will be in the foreseeable future.
}
} The newer SEMs are very advanced and make maximum use
} of PC interfacing. The PCs will age but should work OK
} or be replaced by faster models if necessary or due to
} supportability factors.
}
} What about the SEM itself? These are now made with
} surface mount technology, flip chip BGAs and FPGAs.
}
} Some makers are saying that they will support a specific
} product line for 5-10 more years, or less. After that, one needs
} to buy a new SEM. This is what they are saying....not
} all SEM makers. But enough to trigger the sensitivity of
} a potentially big bow wave of problems. The up-front cost
} of a tool really does not put it in the disposable category.
} Plus, in an industrial setting, how would depreciation factor in?
} But if the tool cannot be supported after say ten years, then
} it a disposable item if there are no other service resources.
} The dearth of schematics is a huge issue with me since I cannot
} talk to the service folks with knowledge and also impacts the
} future cut off of service. One is basically buying a $500K
} boat anchor that needs replacing every ten year or so. Yep,
} sounds like a boat problem.
}
} Recall that the Amray and early JEOL tools were relatively
} easy to fix... electronics-wise. These newer systems are not
} at all easy to fix or troubleshoot.
}
} I'm just blowing the whistle on what I think is a pending
} huge problem.
}
} Alternate opinions?
}
} gary g.
}
}
}
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6, 20 -- Date: Sat, 19 Aug 2006 17:53:39 -0400
6, 20 -- From: Jan Factor {jfactor-at-ns.purchase.edu}
6, 20 -- Subject: Re: [Microscopy] New subject-service life of new SEMs
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From: gary-at-gaugler.com
Date: Sat, 19 Aug 2006 19:36:32 -0500
Subject: [Microscopy] Re: New subject-service life of new SEMs

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Jan:

I agree as well. The problem is that the older systems were
easier to maintain in major part due to the way they were made
and the technology at that time--multiple pull out PC cards, socketed
ICs, etc. That is all going away now as the makers use TSOP
(small outline surface mount IC) ICs, chip resistors and capacitors
and pack more functions (FPGAs) onto a single PC board. Result....fewer
but more dense PC boards that are probably close to impossible or
at best, difficult to repair. However, the other side of this more
hands-off manufacturing is greater consistency. This results in
fewer failures. The other detrimental factor though is the out-sourcing
of portions of the system. The SEM makers build the frame, column
and associated parts but have some other company do the electronics
or portions of the electronics and/or software. In many cases, the
field service
folks do not have schematics that accurately reflect the machine
they are working on--not to mention that they can no longer replace
individual components. It is a replace the whole thing scenario now.
The advent of advanced computer control seems to be to keep fixing
bugs and adding new or different features to justify the software
engineering department or source. Some of these software updates
fix things that are so stupid and obvious it seems that software
debugging is the job of the customer. That is very bad.

The Devil is in the details. The Devil here is dollars. If the
systems are more reliable, people can keep them running for longer
periods of time. Remember that most companies have two major
cost centers--sales and service. So the sales side sells a new
system which is then covered under a maintenance contract by the
service side. With a reliable system, the service side makes a
nice profit since there are fewer service calls than before. In
the mean time, the sales side complains that they are not selling
enough systems. The solution? Stop supporting fielded systems
to force users to buy a new SEM.

Since I have no financial interest any more with KLA-Tencor I can
use them as a good example of how I perceive the internal thinking
(or lack thereof) is seen in action. I owned multiple Amray SEMs
over the years and at first had Amray contracts. Then, when KLA
bought out Amray, service moved to KLA. Over time, KLA began to
drop service contracts for their thermionic SEMs. Since my last
Amray SEM was an FE, I did not get dropped. Their support prices
were quite reasonable compared to today's FESEM maintenance cost.
Anyway, as they began dropping thermionic support they also started
to lay off service personnel. An obvious cost cutting mentality.
Then, as more Amray FE optics were put into KLA inspection tools,
the Amray techs got pulled (sucked) into the tool side. Then, behold--
less support for Amray FE SEMs and less support for KLA tools since
the techs left leaving a support vacuum. This was in 2003-2004.
I suspect that since then, they have either stopped supporting
FESEMs or soon will. That is too bad since the later systems
were real work horses. I had very few problems with any of my
Amray systems. But eventually, the performance just was not there.
This was because Amray stopped developing new systems. Software
development also stopped (it always was out-sourced). The current
manufacturers are not in this non-developmental mode at all.

So the business model of continuous introduction of new models of
SEMs and other systems is to "have a growth path" when in fact,
earlier models do the intended job just fine, thank you. But they
do need support from time to time. Agreed....some need a lot more
support than others. But are they newer or older systems? Some
are newer or newest, unfortunately. So the service side complains
and the reaction from corporate is to cull their product line to
simplify the field complement of systems. Optimal in their view
is probably that every installation has the exact same system.
This would reduce parts logistics, documentation deviations, software
option switches, etc. Of course it would. But not all customers'
needs are identical.

My gut feeling is--don't count on more than 7-10 years of support
from the OEM. And there probably won't be second or third party
options. Like I said initially--you are going to be stuck with a
boat anchor. It is just a matter of time. This is true for older
systems. But I think the time frame to become an anchor is getting
shorter. I'm not sure that my crystal ball is any better than
any one else's. But I came away from M&M 2006 with this gnawing
uncomfortable feeling. Newer isn't always better or best. But in
a competitive world, not producing newer may be fatal. If the
OEM manufacturers don't survive, one certainly cannot get a
service contract from them! It is a horrible business situation.

When buying a new system, you cannot count on determining how long
they will support the system. The sales side will tell you whatever
you want to hear. The only viable option IMO is to find out what
and how old of systems they are currently supporting. Are the postings
on this list for SEM/TEM support due to cost reduction at the customer
side or lack of support options from the manufacturers? I don't know.
That is a good question to ask.

It just seems to me that what has been rather common in the past
is pretty quickly being obsoleted. This pertains to how systems
are supported, for how long and by whom. But the business model
seems to be the same. The issue or point of equipment saturation
is quite valid. If all auto makers made cars that lasted 30 years,
then who would be the volume new car buyers? As long as the car
gets you from point A to point B and back, what is the advantage of
a new car? The discriminator is gas mileage, features, etc. With
SEM/TEM it is performance. As long as they do what is needed, a
newer model might be nice but is not necessary to get the job done.

gary g.



At 02:53 PM 8/19/2006, you wrote:
} You are right when you say that these are not disposable items. If
} manufacturers have the attitude that we in the academic world can
} simply conjure up $250-500,000 because they determine that the
} lifespan of their EM is 10 years, then the EM community collectively
} should send a strong message to the contrary. My attitude is this:
} if an EM manufacturer will not continue to support and keep my EM
} going until I am ready (and able) to replace it, then (when I do
} find the funds for a
} replacement) my next microscope will definitely not be one of
} theirs. There are companies that apparently stand up for their
} microscopes for the extended lifetimes they should be proud of. As
} an example, the lab I was trained in still has the microscope that I
} was trained on some 30 years ago (they added a digital camera, and
} I'm told it's one of the favored TEMs in the lab).
} --Jan Factor
}
} ---------------------------------------
} Jan Robert Factor, Ph.D.
} Professor of Biology
} ---------------------------------------
} Natural Sciences
} Purchase College
} State University of New York
} 735 Anderson Hill Rd.
} Purchase, NY 10577
} USA
} ---------------------------------------
} Office Tel: 914-251-6659
} Office Fax: 914-251-6635
} E-mail: jfactor-at-ns.purchase.edu
} or- jan.factor-at-purchase.edu
} ---------------------------------------
}
}
}
} gary-at-gaugler.com wrote:
} } ----------------------------------------------------------------------------
} } The Microscopy ListServer -- CoSponsor: The Microscopy Society of America


==============================Original Headers==============================
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13, 21 -- To: Jan Factor {jfactor-at-ns.purchase.edu}
13, 21 -- From: Gary Gaugler {gary-at-gaugler.com}
13, 21 -- Subject: Re: [Microscopy] New subject-service life of new SEMs
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From: jds451-at-psu.edu
Date: Sun, 20 Aug 2006 09:51:57 -0500
Subject: [Microscopy] Software: Montage

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Hi all,
I have a friend who needs to make a montage of a large number of optical
micrographs. He has about 500 images. Can anybody suggest a PC software
package that is easy to use? He is currently using Photoshop. Freeware or
something that can be paid for and downloaded would be especially useful.
Thanks for any suggestions,

Jennifer Ray Sloppy
Materials Science & Engineering,
Ph.D. Candidate
Pennsylvania State University


==============================Original Headers==============================
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3, 17 -- Subject: Software: Montage
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From: colijn.1-at-osu.edu
Date: Sun, 20 Aug 2006 20:19:14 -0500
Subject: [Microscopy] Re: Software: Montage

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Jennifer,

I have used Panavue ImageAssembler (http://www.panavue.com/) with
some success. You do have to load the images in row order. I've
sometimes had to stitch the rows first then assemble the rows into
the final image rather than assembling the whole image in one
pass. ImageAssembler can use either automatic or manual registration
for the stitching. The auto registration works reasonably well for
image sets with reasonable overlap (20-25%) in the images and if the
features are easily distinguishable and not too complex. (I suspect
that it just does a cross-correlation.) It will do some image
warping and brightness/contrast adjustment to better blend the photos
in the stitching process.

The software is pretty easy to use and the price is reasonable ($64
for the standard edition and $129 for the professional edition). The
professional version will handle larger images.

The software has worked for me. Your mileage may vary!

Usual disclaimer: I have no vested interest in the product or company.

Good Luck,
Henk Colijn


At 10:55 AM 8/20/2006, jds451-at-psu.edu wrote:



} ----------------------------------------------------------------------------
} The Microscopy ListServer -- CoSponsor: The Microscopy Society of America

Hendrik O. Colijn colijn.1-at-osu.edu
OSU Campus Electron Optics Facility www.ceof.ohio-state.edu
040 Fontana Labs, 116 W. 19th Ave


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From: protrain-at-emcourses.com
Date: Mon, 21 Aug 2006 07:24:34 -0500
Subject: [Microscopy] Re: New subject-service life of new SEMs

Contents Retrieved from Microscopy Listserver Archives
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Hi All

As you may know we run maintenance courses for all types of SEM and TEM and
whilst I agree with most of what has been said may I add a point that may
help those who are into the first few years of an instrument?

Today you may have PCs, memory, mice, keyboards, printers that are the same
as your "new" microscope. In a few years or even weeks the PC you have will
become obsolete - DO NOT THROW IT AWAY! In a few years time you may need
parts for your microscope that will no longer be available - PCs, memory,
mice, keyboards, printers - see what I mean?

Good luck enjoy your new machine, but think ahead!

Steve Chapman
Senior Consultant Protrain
For electron microscopy consultancy and training world wide
Tel +44 1280 816512 Fax +44 1280 814007
Mobile +44 7711 606967 Web www.emcourses.com

----- Original Message -----
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To: {protrain-at-emcourses.com}
Sent: Sunday, August 20, 2006 1:37 AM


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From: edelmare-at-muohio.edu
Date: Mon, 21 Aug 2006 08:14:58 -0500
Subject: [Microscopy] Re: viaWWW: LM - coupling digital camera back to Nikon Diaphot

Contents Retrieved from Microscopy Listserver Archives
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Kathryn:

Something sound wrong. We have a D50, a D200, and an FE
these all use the standard nikon F-mount, and we have routinely
switched between these without any problems. The D70 also has
an F-mount, I have not tried it specifically but it should be a straight
mount. You should NOT need a T-mount adapter (unless you
actually have F-mount to T-mount adapters on your FE2 and FTN
already), and your microscope phototube mount is a T-mount.

Now, what you will find is that the D70 (like the D50, D80, and
D100), will only work in manual exposure mode, as it will treat the
microscope mount as a Non-CPU lens.

Now for the D50 and D200, what we have are f-mounts on our
phototubes (off of Nikon and Olympus scopes), 2X or 2.5X photo-
eye pieces work well, and Nikon right-angle viewfinders. We use
the cameras in tethered mode: AC-adapters, USB connections to
computers, and run the Nikon Capture 4 software. The nikon
software runs the camera directly from the computer (exposure,
download, and shutter release). The software is not cheap
(Capture 4 is $99, Capture NX is $149). The alternative is an
electronic cable release, about $25, (You do NOT need the $150
Nikon remote release) but you still need to down load the images
from the memory card.

Now a warning: The D50 has signifcant vibration due to the
mirror, and like the D70, it does not have a mirror lock-up feature.
When using the D50 on our Nikon Optiphot (very similar to the
Diaphot) the vibrations are such that the images with 60X and
100X objectives are not useable, 40X is poor but useable. I do not
know about the D70's vibration. We just got through testing the
D200, and it inherently has much much lower vibration than the
D50, and secondly it does have a "Mirror up, shutter delay".

Good luck.


On 18 Aug 2006, at 18:06, KLRadke-at-ucdavis.edu wrote:

}
} Email: KLRadke-at-ucdavis.edu
} Name: Kathryn Radke
}
} Organization: Univ. California, Davis
}
} Title-Subject: [Filtered] LM - coupling digital camera back to Nikon
} Diaphot
}
} Question: I'd like to use my Nikon D70s camera back on my lab's 1985
} Nikon Diaphot inverted cell culture microscope. The Diaphot front port
} has a fitting that couples to Nikon film backs (e.g. FE2, FTN) having
} Nikon F bayonet type lens mount. When the microscope is set up
} properly, the image viewed through the eyepieces focused on the film.
}
} The D70S back won't fit directly onto the Diaphot. A local camera
} store tells me that I could use a T mount adapter that is designed to
} couple a digital back with a telescope. With the T mount adapter in
} place, the digital back can be used in Manual mode and the shutter
} speed can be set using the "command dial" on the camera back. I would
} also need to purchase a remote cord to operate the back without
} shaking the microscope.
}
} I would be most grateful if anyone can give some feedback about
} necessary parts, operation, etc. Are there websites that have
} relevant information?
}
} Thank you.
} Kathryn
}
}
} ----------------------------------------------------------------------
} -----
}
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Richard E. Edelmann, Ph.D.
EXPO Editor, Microscopy and Microanalysis Supplement
Electron Microscopy Facility Director
364 Pearson Hall
Miami University, Oxford, OH 45056
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E-mail: edelmare-at-muohio.edu
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From: aleb-at-nhm.ac.uk
Date: Mon, 21 Aug 2006 08:43:07 -0500
Subject: [Microscopy] viaWWW: Suppliers of EM chemicals, specifically fixatives

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Email: aleb-at-nhm.ac.uk
Name: Alex Ball

Organization: the Natural history Museum, London

Title-Subject: [Filtered] US - based EM suppliers

Question: Dear all,

With the current restrictions on flying with liquids/gels I am trying to get a list of US and European suppliers of EM chemicals, specifically fixatives.

I would be very grateful if you could forward to me details of suppliers who you think might be willing to send out EM grade glutaraldehyde in 10ml aliquots (glass ampoules).

I am aware of EMS and Ted Pella, although I do not have either of their US catalogues (I'll be writing to them formally in the near future).

Also, one of my colleagues spent some time working in a marine lab and was able to source pre-buffered glutaraldehyde, ready mixed to 2.5% concentration and 0.1M buffered to 7.2pH. Of course he forgot to take details of the supplier!!!!
Has anyone seen this? I'd love to track this down as it would make supplying fixatives for our field researchers so easy.

Regards and thanks in advance,

Alex Ball
E M unit manager,
The Natural History Museum, London
(Formerly B.M.(N.H.))

0044 207 942 5263/ 5614

a.ball-at-nhm.ac.uk

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From: rcommon-at-msu.edu
Date: Mon, 21 Aug 2006 11:07:23 -0500
Subject: [Microscopy] LM - coupling digital camera back to Nikon Diaphot

Contents Retrieved from Microscopy Listserver Archives
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The coupling problem is probably caused by a ring around the camera mount
attached to the microscope or camera adapter unit. The ring does not
interfere with mounting the film cameras designed to mount on the
microscope, but prevents mounting of some digital SLR F-mount cameras. The
ring, which seems to be entirely cosmetic, is held in place with fine screws
and is easily removed. Once the ring is removed the digital camera should
lock in place properly.

The problem of camera vibration can be solved by setting the manual time
exposure to some large value like 4 seconds and using one of the exposure
control units made by Nikon (AFX, UFX etc) to control the exposure. Trigger
the camera, wait a second, then trigger the exposure control unit which
opens and closes the shutter in the camera adapter unit that was designed
for 35mm film cameras. If you don't have one of these adapters and control
units, they regularly show up on eBay.

The sensor unit of digital cameras is smaller than 35mm film format (except
for the Kodak DCS 14 megapixel cameras) so you should use the 2.5x photo
eyepiece rather than the 4x or 5x.

Ralph Common
Division of Human Pathology
Michigan State University


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From: bigelow-at-engin.umich.edu
Date: Mon, 21 Aug 2006 15:02:45 -0500
Subject: [Microscopy] RE: Cleaning Penning gauges

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The general construction and functioning of cold cathode discharge
gauges is discussed and illustrated in Sect. 3.2.2 (p. 99) of my book
Vacuum Methods in Electron Microscopy (available from SPI Supplies,
Ladd, M. E. Taylor, etc.). In particular, the photo of a
disassembled gauge tube shown on page 101 might be helpful in giving
you an idea of what to expect when taking your gauge tube apart for
cleaning. The cleaning of Penning gauges is a rather common
operation, so don't be afraid to undertake it - just be careful, and
proceed with caution. In particular, don't get steel wool or any
other magnetic cleaning agent in the neighborhood of the magnets that
are part of the gauge, or you'll have a VERY difficult time getting
the residue of the off.

The cleaning procedure recommended by Valery sounds like a simple
one, so give it a try. You might also want to look over the comments
about cleaning procedures in general given on page 70 of my book.

Good luck,
WCB
--
Wilbur C. Bigelow, Professor Emeritus
Materials Sci. & Engr., Univ. of Michigan
Ann Arbor, Michigan 48109-2136
e-mail: bigelow-at-engin.umich.edu;
Fx:734-763-4788; Ph:734-975-0858
Address mail to: 2911 Whittier Court
Ann Arbor, MI 48104-6731

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From: a.ball-at-nhm.ac.uk
Date: Mon, 21 Aug 2006 18:07:21 -0500
Subject: [Microscopy] viaWWW: US - based EM suppliers - revised question

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Email: a.ball-at-nhm.ac.uk
Name: Alex Ball

Organization: Natural history Museum, London

Title-Subject: [Filtered] US - based EM suppliers - revised question

Question: Dear all,

Earlier today i posted a question about EM fixatives and i have had several useful replies.
However, I don't think I was clear about why I wanted details of US suppliers.

Many of the researchers from the Natural History Museum conduct fieldwork overseas where they collect and fix specimens in the field or within other laboratories. In the past we supplied fixatives and buffers for them to take with them. The regulations over transport of small amounts of fixatives were sufficiently fuzzy for this type of material to be carried aboard aircraft without question.

Our post-911 world means this is no longer practical, so I was hoping to gather a list of useful contacts or suppliers so that researchers flying into the continental USA, including South America might be able to arrange for delivery of fixatives to them in order to still be able to fix material in the field.

Several people have sent me details of UK-based suppliers, but it's the the US-based ones that I really need to make contact with.

Sorry for the confusion and thanks for the leads sent to me so far,

Regards,

Alex

Dr Alex Ball
Electron Microscope Unit Manager
The Natural History Museum
London SW7 9BD

Tel: 0044 207 942 5263/5614
Fax: 0044 207 942 5811

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From: baskin-at-bio.umass.edu
Date: Tue, 22 Aug 2006 09:20:43 -0500
Subject: [Microscopy] staining starch in sections

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Greetings,
Can anyone tell me a reliable method to stain starch grains
in sections of plant tissue embedded in Spurr's resin? Also useful to
know whether polarized light would be suitable. I hope this is easy
and I get lots of replies!

As ever,
Tobias
--
_ ____ __ ____
/ \ / / \ / \ \ Tobias I. Baskin
/ / / / \ \ \ Biology Department
/_ / __ /__ \ \ \__ 611 N. Pleasant St.
/ / / \ \ \ University of Massachusetts
/ / / \ \ \ Amherst, MA, 01003
/ / ___ / \ \__/ \ ____
http://www.bio.umass.edu/biology/baskin/
Voice: 413 - 545 - 1533 Fax: 413 - 545 - 3243

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From: nizets2-at-yahoo.com
Date: Tue, 22 Aug 2006 10:22:56 -0500
Subject: [Microscopy] 16bit TIFF images in Photoshop

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Dear listers,

I think I have an easy solution for a common problem
and I just wanted to share it. I am sorry if I bring
nothing new, but perhaps it really helps. At least it
cannot harm :-)

When working with my TEMcam Megaview III and the
software AnalySIS (no personal interest blablabla...)
the pictures are saved in 16bit TIFF format. This is a
problem when you want to work with them because this
format is not recognized by most image processing
software (This problem is so common that it appears in
the FAQ of AnalySIS). However when this format is
loaded in Adobe Photoshop (no personal....) the
picture comes completely dark. A rather simple
solution to recover your picture is to use the "auto
contrast" and/or "auto level" option and your nice
picture appears in all its splendor right before your
eyes!

Hope this was helpful.
Have a nice day (for the american), a nice sleep (for
the australian) or a nice evening (for the european).

Stephane


__________________________________________________
Do You Yahoo!?
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From: Geoffrey_Williams-at-brown.edu
Date: Tue, 22 Aug 2006 10:32:17 -0500
Subject: [Microscopy] Sectioning Si Wafers

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Okay, 99% of all my ultra-microtomy has been done with epoxy/resin embedded 'biological' samples.

Recently I was asked about cutting a thin bi-metalic film on the surface of a silicon wafer.

My initial gut reaction to this was "cut a Si wafer in cross-section with one of our diamond knives? Are you kidding?"

For those out there more immersed in the materials side of TEM prep, can a Si wafer be cut in cross section with a regular 45º Ultra Diamond knife? Would thinning the wafer down prior to deposition make it easier to cut? Or easier on the knife? If possible to cut, would these sections just be floated off in water like standard samples? Or best to leave dry and manipulate with eye-lashes or Dalmatian hair.

Thank you for bearing with these questions on materials prep from a biological based pov. And no, this is the only way to get this specific film thin enough (cutting), Ion Mill, polishing, no other 'typical' thinning prep works.

Geoff Williams
Leduc Bioimaging Facility Manager
Brown University
 
http://www.brown.edu/Facilities/Leduc_Bioimaging_Facility/



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From: voyles-at-engr.wisc.edu
Date: Tue, 22 Aug 2006 10:45:08 -0500
Subject: [Microscopy] Re: 16bit TIFF images in Photoshop

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Dear Stephane,

16 bit TIFFs are a fairly common format for scientific image data, and
there are a variety of programs intended for scientific use which
support them. In addition to many commercial products both cheaper and
more expensive than Photoshop (DigitalMicrograph, IDL, Igor Pro, etc.
etc.) there is an excellent, free program called ImageJ available from

{http://rsb.info.nih.gov/ij/}

It reads and displays the 16 bit TIFF images from our MegaVIEW /
AnalySIS system with no additional steps.

There is also a potentially serious drawback to the Photoshop procedure
you suggest. Photoshop discards the original grey-scale values of the
image when you use "Auto Levels", which breaks the quantitative
connection between the grey-scale value in the image and the absolute
number of electrons that struck the detector. This will often make
quantitative analysis of the electron image or diffraction pattern
impossible and makes it difficult to even judge the relative average
brightness of two different images to guess, for example, the sample
thickness.

I apologize for the long reply, but this is one of my pet peeves: what
comes off the microscope has the potential to be quantitative data, not
just pictures. Software developed for photographs and desktop
publishing is not generally the best choice for dealing with scientific
data.

Best wishes,
Paul Voyles

Paul Voyles
Materials Science and Engineering
University of Wisconsin, Madison
1509 University Ave, Rm 223
Madison, WI 53706-1595
voice: (608) 265-6740
fax: (608) 262-8353
voyles-at-engr.wisc.edu
http://tem.msae.wisc.edu



nizets2-at-yahoo.com wrote:
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} To Subscribe/Unsubscribe -- http://www.microscopy.com/MicroscopyListserver
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} ----------------------------------------------------------------------------
}
} Dear listers,
}
} I think I have an easy solution for a common problem
} and I just wanted to share it. I am sorry if I bring
} nothing new, but perhaps it really helps. At least it
} cannot harm :-)
}
} When working with my TEMcam Megaview III and the
} software AnalySIS (no personal interest blablabla...)
} the pictures are saved in 16bit TIFF format. This is a
} problem when you want to work with them because this
} format is not recognized by most image processing
} software (This problem is so common that it appears in
} the FAQ of AnalySIS). However when this format is
} loaded in Adobe Photoshop (no personal....) the
} picture comes completely dark. A rather simple
} solution to recover your picture is to use the "auto
} contrast" and/or "auto level" option and your nice
} picture appears in all its splendor right before your
} eyes!
}
} Hope this was helpful.
} Have a nice day (for the american), a nice sleep (for
} the australian) or a nice evening (for the european).
}
} Stephane
}
}
} __________________________________________________
} Do You Yahoo!?
} Tired of spam? Yahoo! Mail has the best spam protection around
} http://mail.yahoo.com

==============================Original Headers==============================
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From: Geoffrey_Williams-at-brown.edu
Date: Tue, 22 Aug 2006 10:59:55 -0500
Subject: [Microscopy] Sectioning Si, clarification

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

I do not know exactly what I can divulge, but they have tried tripod polishing, and ion-milling but I am told they elevate the temperature and the layers need to be prepped and kept at room temps until imaging.

Does that say enough? I still feel it's a bit irrelevant to the initial question.

Is it possible to section a Si wafer? Am I correct in being skeptical? Or should I just kill a $4k knife or try an ancient already messed up and questionably anchored diamond in the attempt?

I just figured someone out there might be able to share a bit of practical experience.

Thanks!

Geoff Williams
Leduc Bioimaging Facility Manager
Brown University
 
http://www.brown.edu/Facilities/Leduc_Bioimaging_Facility/



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From: jean-paul.bailon-at-polymtl.ca
Date: Tue, 22 Aug 2006 11:04:58 -0500
Subject: [Microscopy] Software: Montage

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Jennifer,

Try the freeware Autostitch ( http://www.autostitch.net ). It is free, it
works very well even if the interface of the demo version is crude and
basic.



Jean-Paul Baïlon

++++++++++++++++++++++++++++++++++++++
Prof. Jean-Paul Baïlon jean-paul.bailon-at-polymtl.ca
Génie mécanique Tél: +1(514) 340 4711, p. 4260
École Polytechnique Fax: +1(514) 340 4468
CP 6079, Succursale Centre-Ville
Montréal (QC) Canada H3C 3A7
++++++++++++++++++++++++++++++++++++++



-----Message d'origine-----
De : colijn.1-at-osu.edu [mailto:colijn.1-at-osu.edu]
Envoyé : 20 août, 2006 21:21
À : jean-paul.bailon-at-polymtl.ca
Objet : [Microscopy] Re: Software: Montage




----------------------------------------------------------------------------
The Microscopy ListServer -- CoSponsor: The Microscopy Society of America

Jennifer,

I have used Panavue ImageAssembler (http://www.panavue.com/) with some
success. You do have to load the images in row order. I've sometimes had
to stitch the rows first then assemble the rows into the final image rather
than assembling the whole image in one pass. ImageAssembler can use either
automatic or manual registration for the stitching. The auto registration
works reasonably well for image sets with reasonable overlap (20-25%) in the
images and if the features are easily distinguishable and not too complex.
(I suspect that it just does a cross-correlation.) It will do some image
warping and brightness/contrast adjustment to better blend the photos in the
stitching process.

The software is pretty easy to use and the price is reasonable ($64 for the
standard edition and $129 for the professional edition). The professional
version will handle larger images.

The software has worked for me. Your mileage may vary!

Usual disclaimer: I have no vested interest in the product or company.

Good Luck,
Henk Colijn


At 10:55 AM 8/20/2006, jds451-at-psu.edu wrote:



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Hendrik O. Colijn colijn.1-at-osu.edu
OSU Campus Electron Optics Facility www.ceof.ohio-state.edu
040 Fontana Labs, 116 W. 19th Ave


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From: richard.beanland-at-bookham.com
Date: Tue, 22 Aug 2006 11:24:30 -0500
Subject: [Microscopy] Sectioning Si Wafers

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Hi Geoffrey,
A similar question came up a while ago about samples getting too hot during prep or in the TEM itself. I've managed to prepare Au:Ge and Pd:Zn:Au metal layers on III-Vs using fairly conventional techniques; these metals interdiffuse below 100C, so unless you have to keep the temperature really low for your samples it should be possible. The only difference to my standard protocol is to use superglue to mount the sample rather than thermoplastic wax, and soak the sample off in acetone (which I think is the standard practice for tripod polishing anyway?). Since I work with III-Vs like InP I always have to keep the energy going into the sample to a minimum during ion miling, but I find I can hit it with 6 kV Ar+ ions in a PIPS as long as I keep the incidence angle below 3 degrees. However when I was using an ion tech mill which didn't have a modulated beam or go below 10 degrees incidence I had to use LN2 cooling. Contact me off list if you want more details.
As for microtomy, I have no idea. I have heard of it being done and read a paper or two, but I haven't got any further than being envious of the idea of making an electron transparent TEM sample in less that 10 mins.. or perhaps that's just my fantasy of how quick microtomy can be..

All the best

Richard



________________________________________
Richard Beanland
Materials Analysis
Bookham
Caswell
Towcester
Northants
NN12 8EQ
United Kingdom
Tel. +44 1327 356362
Fax. +44 1327 356775
http://www.bookham.com
________________________________________


-----Original Message-----
X-from: Geoffrey_Williams-at-brown.edu [mailto:Geoffrey_Williams-at-brown.edu]
Sent: 22 August 2006 16:33
To: Richard Beanland

Okay, 99% of all my ultra-microtomy has been done with epoxy/resin embedded 'biological' samples.

Recently I was asked about cutting a thin bi-metalic film on the surface of a silicon wafer.

My initial gut reaction to this was "cut a Si wafer in cross-section with one of our diamond knives? Are you kidding?"

For those out there more immersed in the materials side of TEM prep, can a Si wafer be cut in cross section with a regular 45º Ultra Diamond knife? Would thinning the wafer down prior to deposition make it easier to cut? Or easier on the knife? If possible to cut, would these sections just be floated off in water like standard samples? Or best to leave dry and manipulate with eye-lashes or Dalmatian hair.

Thank you for bearing with these questions on materials prep from a biological based pov. And no, this is the only way to get this specific film thin enough (cutting), Ion Mill, polishing, no other 'typical' thinning prep works.

Geoff Williams
Leduc Bioimaging Facility Manager
Brown University
 
http://www.brown.edu/Facilities/Leduc_Bioimaging_Facility/



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From: colijn.1-at-osu.edu
Date: Tue, 22 Aug 2006 12:50:12 -0500
Subject: [Microscopy] Re: Sectioning Si, clarification

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Cryo ion-milling is one option, FIB liftout is another. A third
option is the small-angle cleavage technique that John McCaffrey and
Scott Walck developed. The cleavage technique requires some
practice, but if done right the fracture should propagate right
through the surface film and give you thin damage free samples
without heating.

Scott is now at Southbay Technology (walck-at-southbaytech.com) but
monitors the listserver. (Scott, Would you like to add anything?)

Cheers,
Henk Colijn



At 12:01 PM 08/22/06, Geoffrey_Williams-at-brown.edu wrote:



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Time is that quality of nature which keeps events from happening all
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From: lkrupp-at-us.ibm.com
Date: Tue, 22 Aug 2006 12:59:55 -0500
Subject: [Microscopy] RE: Sectioning Si Wafers

Contents Retrieved from Microscopy Listserver Archives
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Hi Geoff-

I was actually dumb enough to try microtoming thin films (non-metallic) on
silicon wafers for awhile. I got the best results (this is a relative
term) by first embedding small pieces of the wafer in epoxy (Embed 812),
then using a polisher and diamond films to polish away most of the silicon
from the back side. I think I wedged it slightly to obtain a red area of
silicon . I then re-embedded the whole thing to encapsulate it in epoxy,
then block trimmed to get to a nice thin area. You want to be cutting
through the least amount of silicon possible. I used fairly slow cutting
speeds and a water-filled boat. No problems picking up sections or
placing on filmed grids, but the material beats up the knife fast so I
kept having to move to another knife area.

As for the TEM results, we did get some useful pictures, but the silicon
does not cut per se, it's more like a repeatable fracture. So you just
look among the pieces for an intact place, which can take up some scope
time just finding a good area. If you really cannot prepare your material
with other methods (polishing/ion-milling, FIB), or you are trying to
assess sample preparation artifacts from ion energies, then it can be
useful. But it is tedious, both on the prep side and in the microscope.

I don't have experience with your type of material, but I would suggest
first trying tripod polishing or dimpling, and low-energy/low-angle
ion-milling.

Feel free to contact me offline if you would like more details.

Leslie

Leslie Krupp (Thompson)
IBM Almaden Research
650 Harry Road, K19/D1
San Jose, CA 95120-6099
(408) 927-3856

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From: randerson20-at-tampabay.rr.com
Date: Tue, 22 Aug 2006 13:16:47 -0500
Subject: [Microscopy] Re: Sectioning Si, clarification

Contents Retrieved from Microscopy Listserver Archives
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Geoff,

No you can't "cut" Si with a diamond knife. Si cleaves very easily. When
the knife touches the Si, the Si cleaves along one of its preferred
{111} crystallographic cleaving planes. That might be fine if you orient
the Si such that a Si {111} crystallographic direction is perpendicular
to the block face. Then if you are VERY lucky, you MIGHT get a cleaved
piece of Si oriented with {111} faces (at the risk of your knife). Any
article that I've seen that claims to have microtomed Si has shown lots
of pictures of tiny {111} Si sections.

Assuming that you are successful, so what! There is no, or very little
interest, in anything in the semiconductor world or in potentially
oriented thin films deposited on Si, that is best displayed on top of a
Si cross section with a {111} block face orientation. The angles are wrong.

Si wafers in semiconductor processing are almost all with (or very close
to) a Si {001} direction perpendicular to the Si wafer surface. Devices
fabricated in, or patterns deposited on, these wafers are not randomly
oriented. They are almost always aligned with {011} planes perpendicular
to the Si surface, i.e. the x, y orientations of the devices and
patterns are parallel to {011} directions in the Si surface. Cross
sections of interest for TEM or SEM analysis are oriented such that the
microscope looks down on a {011} "block face." If you orient the
specimen's block face so as to attempt to cut {011} cross sections, the
diamond knife will touch the Si and immediately propagate a cleave down
the nearest {111} plane despite the orientation of the block. As the
specimen in the block is constrained by the epoxy holding it, the result
is a flake of Si dust from just the surface. When the knife comes around
again you get more dust.

Using a microtome to make Si {011}cross sections is like using a screw
driver to drive a nail.

Instead of fighting the fact that Si cleaves, why not exploit this fact
and prepare really great thin specimens by the microcleaving technique
pioneered by McCaffrey and Igor. I'll copy them and invite them to
expand on this suggestion. They'll point out that you can make nice thin
sections of thin films on Si with a minimum of tools and at room
temperature. There is a videotape that shows how to do it.

Ron Anderson



Geoffrey_Williams-at-brown.edu wrote:
}
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} I do not know exactly what I can divulge, but they have tried tripod polishing, and ion-milling but I am told they elevate the temperature and the layers need to be prepped and kept at room temps until imaging.
}
} Does that say enough? I still feel it's a bit irrelevant to the initial question.
}
} Is it possible to section a Si wafer? Am I correct in being skeptical? Or should I just kill a $4k knife or try an ancient already messed up and questionably anchored diamond in the attempt?
}
} I just figured someone out there might be able to share a bit of practical experience.
}
} Thanks!
}
} Geoff Williams
} Leduc Bioimaging Facility Manager
} Brown University
}
} http://www.brown.edu/Facilities/Leduc_Bioimaging_Facility/
}
}
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Organization: Carl Zeiss SMT Inc.

Title-Subject: [Filtered] Seeking Applications Expert/Product Manager

Question: Carl Zeiss SMT Inc. is seeking experienced SEM/FIB product managers to work in Thornwood, NY and Irvine, CA. For additional information please contact Beth Bressan at bressan-at-smt.zeiss.com. All replies will remain confidential.

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From: delsignore-at-gmail.com
Date: Tue, 22 Aug 2006 13:49:34 -0500
Subject: [Microscopy] AskAMicroscopist: imaging of cellular aggregates

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This Question was submitted to Ask-A-Microscopist by (delsignore-at-gmail.com)
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Email: delsignore-at-gmail.com
Name: Anthony Del Signore

Organization: Brown University

Education: Graduate College

Location: Providence, RI, 02865

Title: imaging of cellular aggregates

Question: I am trying to image an aggregate of cells that are producing GFP. I am running into problems when trying to image with Epifluorescent ant Confocal microscopes. I was wondering if I am using the right equipment.
It seems that with the epifluor I get alot of deconvolved and out of focus light.
With the confocal I am only able to image about 30 microns into the 200 micron spherical aggregate. I get a rim around the spheroid and then black within the aggregate. I am using a 10x objective.
Are there any other methods for imaging... I have also heard of flow cytometry and two photon microscopy. Are these valid methods for imaging cellular aggregates emitting GFP?
Any help, suggestions would be greatly appreciated. If you need additional information or clarification please let me know as well. Thanks and have a great day.

Anthony

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From: LazarZ-at-mskcc.org
Date: Tue, 22 Aug 2006 14:28:47 -0500
Subject: [Microscopy] RE: Software: Montage

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Metamorph from Molecular Devices works excellent but it is expensive.

You can try ImageJ (free), I have used for less than 50 images.

Zsolt

**************************************
Zsolt Lazar
Molecular Cytology Core Facility
Memorial Sloan-Kettering Cancer Center
415 East 68th Street, ZRC-1838
New York, NY 10021



-----Eredeti üzenet-----
Feladó: jds451-at-psu.edu [mailto:jds451-at-psu.edu]
Küldve: V 8/20/06 11:04
Címzett: Lazar, Zsolt/Sloan-Kettering Institute
Másolatot kap:
Tárgy: [Microscopy] Software: Montage






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Hi all,
I have a friend who needs to make a montage of a large number of optical
micrographs. He has about 500 images. Can anybody suggest a PC software
package that is easy to use? He is currently using Photoshop. Freeware or
something that can be paid for and downloaded would be especially useful.
Thanks for any suggestions,

Jennifer Ray Sloppy
Materials Science & Engineering,
Ph.D. Candidate
Pennsylvania State University


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From: randerson20-at-tampabay.rr.com
Date: Tue, 22 Aug 2006 14:49:20 -0500
Subject: [Microscopy] Microtoming Silicon

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Listers, I had a response back on my Si microtoming tome from a
biologist who wrote: "People like me (and Geoff) read this and go
"OooKay ... what's a {111} plane and how would I know how I have such a
thing aligned for anything, much less microtomy?"

Answer: Any Si semiconductor wafer you find will most likely have a
{001} direction perpendicular to its surface. If it is a whole wafer
there is probably a flat and a notch ground into the wafers edge at
right angles to each other. The families of crystal {011} planes are
oriented at 45 and 90 degrees with respect to each other. The flat is
parallel to one of the {011} planes in the family. The notch is
perpendicular to a second {011} plane at 90 degrees wrt to the flat. If
it is a processed Si chip, look at the x, y coordinates defined on the
surface of the chip. They are parallel to {011} planes. {111} planes
are oriented at 35 and 90 degrees with respect to {011} planes. Try
cleaving the wafer at 45 or 90 degrees wrt to the flat or notch. When
you get a piece with a 35 degree slope wrt to the surface, the slope
part will be a {111} face. OR, just hit the Si wafer with a hammer and
look for a piece with shiny 35 degree sloped edges wrt the surface.

BUT, my biological friends, why are you making your heads hurt by
reading this? The point of my original post was to explain why you won't
want to fracture the edge of your diamond knife creating Si dust. Now
you know that the dust particles will have 35 degree sloped sides! You
can't microtome Si. Geoff, go read McCaffrey's paper on microcleaving.
When Scott weighs in, he'll provide the reference, I hope.

Ron Anderson


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From: youngre-at-interchange.ubc.ca
Date: Tue, 22 Aug 2006 15:04:55 -0500
Subject: [Microscopy] Re: staining starch in sections

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I've never tried it on embedded and sectioned tissue, but wouldn't
iodine work? It works well enough in fresh tissue, staining starch
grains purple in light microscopy.

I do know that we've had a lot of trouble imaging tissue with starch
granules in it, as they refract light, and mess up the signal in our
confocal and tomography images. So polarized light might also work
very well. Again I've never tried it.

I'm not sure if this helps, but there you go.
Robin

---------------------------------
Robin Young, M.Sc.
PhD Candidate
Samuels and Haughn Labs
Dept of Botany, UBC
6270 University Blvd.
Vancouver, BC
V6T 1Z4
fax: 604-822-6089

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From: edelmare-at-muohio.edu
Date: Tue, 22 Aug 2006 15:12:24 -0500
Subject: [Microscopy] Looking for some video capture recommendations

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Looking to digitize analog NTSC video tape (Hi-8 and VHS, so composite video, not S-video or component). Would like to stream the analog signal right in to digital format for later image analysis (so only need the video
data no sound), and would like to work whole 60min tapes at a time. Since we’re looking to collect measurement data from video still images the higher the quality preserved the better. So looking for *specific* recommend
ations as to the best method for doing this (specific as in model numbers).

Computer system (Windows PC) we have for this: has 1394, USB, 16x PCIe, x4 PCIe, 64-bit PCI, and 32-Bit PCI, with a RAID Array. Adobe Premiere reports system can sustain over 35MB/sec throughput.

Possible solutions:

1) A/D capture card, o.k., which one for running under Windows XP? Capturing composite NTSC video seems to be “old-tech” these days. Seemingly easy to find HDTV capture cards but not NTSC.

2) A/D capture “widgets” = Composite video in and IEEE 1394 output or USB? Seems like a very cost effective solution, can anyone recommend a model?

3) Using either a Digital8 camcorder or something like a Sony Digital8 Video Walkman to play the “tapes” out to 1394 and input the 1394 to the computer. (Note: Digital8 Players will play Hi-8 tapes). Will this work?


More details:

Computer Specs: Supermicro X6DA8-G2: Dual Xeon 3.4GHz, 1
(x16) & 1 (x4) PCI-Ex, 1 x 64-bit 133MHz PCI-X, 2 x 64-bit 100MHz
PCI-X, 1 x 32-bit 33MHz PCI 800FSB, U320 Adaptec SCSI.

Video / Image Analysis: Once digitized the “video” will be broken
up into digital stills (yes, 18 hours of still images at 29 frames /
sec.). We actually only need 1 image from approximately every 4
seconds of video. Every 4 seconds the video image changes to
one of 16 “views”. We will then sort the images into the individual
16 “views”. Each of the 16 “views” shows 7 developing seedlings.
We will then analyze each of the 16 “views” (or sets of seedlings)
for growth changes through time. Oh, yes after each set of 16
“views” the tape is “paused” for 10 mins, and then repeats the 16
view capture sequence again. So basically it is time lapse
imaging, of 16 different subjects, all interleaved on one video
stream.

And why collect data this way you ask? Because the data
collection is all done automatically and remotely . . . From a
minimum of 355 miles up in orbit on the International Space
Station, on an automated growth and imaging system, which does
not have room for 16 video cameras and video capture systems.

Any suggestions would be greatly appreciated.


Richard E. Edelmann, Ph.D.
Electron Microscopy Facility Director
364 Pearson Hall
Miami University, Oxford, OH 45056
Ph: 513.529.5712 Fax: 513.529.4243
E-mail: edelmare-at-muohio.edu
http://www.emf.muohio.edu

"A main-frame: The biggest PC peripheral available."


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From: IHallett-at-hortresearch.co.nz
Date: Tue, 22 Aug 2006 15:58:34 -0500
Subject: [Microscopy] staining starch in sections

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I've used Iodine-Potassium Iodide solution (dissolve 2g of potassium
iodide in 100 ml water then dissolve 0.2g of iodine in this).

Ian


Ian Hallett
Microscopy
HortResearch Mt Albert Research Centre
Private Bag 92 169, Mt Albert
Auckland, New Zealand
+64-9-815 4200 ext 7002

-----Original Message-----
X-from: baskin-at-bio.umass.edu [mailto:baskin-at-bio.umass.edu]
Sent: Wednesday, 23 August 2006 2:26 a.m.
To: Ian Hallett

Greetings,
Can anyone tell me a reliable method to stain starch grains in
sections of plant tissue embedded in Spurr's resin? Also useful to know
whether polarized light would be suitable. I hope this is easy and I get
lots of replies!

As ever,
Tobias
--
_ ____ __ ____
/ \ / / \ / \ \ Tobias I. Baskin
/ / / / \ \ \ Biology Department
/_ / __ /__ \ \ \__ 611 N. Pleasant St.
/ / / \ \ \ University of
Massachusetts
/ / / \ \ \ Amherst, MA, 01003
/ / ___ / \ \__/ \ ____
http://www.bio.umass.edu/biology/baskin/
Voice: 413 - 545 - 1533 Fax: 413 - 545 - 3243

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From: leunissen-at-aurion.nl
Date: Tue, 22 Aug 2006 16:05:31 -0500
Subject: [Microscopy] Re: staining starch in sections

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Dear Tobias,

Have you considered the Thièry method, using periodate oxidation of
vicinal hydroxyls in carbohydrates, reacting resulting aldehydes with
thiocarbohydrazide or thiosemicarbazide followed by silver
proteinate? It may not be the easiest method, though, but it works
really well.

I don't have the original reference (1964 I believe), but it is a.o.
described in JHC Volume 33, Issue 10, pp. 1007-1014, 1985

Jan Leunissen


Research Advisor Electron Microcopy
Dept Anatomy / Structural Biology
http://anatomy.otago.ac.nz/




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From: gary.m.brown-at-exxonmobil.com
Date: Tue, 22 Aug 2006 16:08:45 -0500
Subject: [Microscopy] staining starch in sections

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Robin,

Iodine would surely stain starch molecules. Many years ago, I used iodine
to stain blends of polypropylene and ethylene vinyl alcohol (EVOH) for
analysis by SEM and TEM. The iodine did provide excellent initial
selective contrast for the EVOH. Unfortunately, iodine is volatile in the
vacuum of the microscope. The iodine bound by the EVOH dissipated
sufficiently rapidly that I saw a significant reduction in contrast during
the microscopy session.

A better stain for examination of starch in electron microscopes probably
osmium tetroxide. Osmium binds the hydroxyl sites irreversibly, thus
providing excellent heavy metal contrast in the preparation.

Good luck,

Gary M. Brown
Microscopy Specialist
ExxonMobil Chemical Company
Baytown Technology & Engineering - West
5200 Bayway Drive
Baytown, Texas 77520-2101
phone: 281 834 2387
fax: 281 834 2395
e-mail: Gary.M.Brown-at-ExxonMobil.com



youngre-at-interc
hange.ubc.ca
To
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08/22/06 03:07 cc
PM
Subject
[Microscopy] Re: staining starch in
Please respond sections
to
youngre-at-interc
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I've never tried it on embedded and sectioned tissue, but wouldn't
iodine work? It works well enough in fresh tissue, staining starch
grains purple in light microscopy.

I do know that we've had a lot of trouble imaging tissue with starch
granules in it, as they refract light, and mess up the signal in our
confocal and tomography images. So polarized light might also work
very well. Again I've never tried it.

I'm not sure if this helps, but there you go.
Robin

---------------------------------
Robin Young, M.Sc.
PhD Candidate
Samuels and Haughn Labs
Dept of Botany, UBC
6270 University Blvd.
Vancouver, BC
V6T 1Z4
fax: 604-822-6089

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From: walck-at-southbaytech.com
Date: Tue, 22 Aug 2006 18:18:58 -0500
Subject: [Microscopy] Re: Sectioning Si, clarification

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Thank you, Ron and Henk, for the plug. Sorry, I was on vacation or else I
would have answered this.

I'd like to address the MicroCleave(TM) preparation at the end of this
discussion so that it is closest to the disclaimer that I am going to put on
it.

SDW on Microtoming:
I've seen some images that Tom Malis collected of microtomed Si samples from
different sources. True, you get a lot of mostly dust as Ron says, but
apparently when you hit it using the right conditions, you can get little
cracked pieces that compose the ribbon that have the film intact on them.
If you are interested in only the film, you have a chance of getting what
you need. However, for the most part, there are other methods for making Si
cross sections that are much easier and much more likely for producing a
usable sample.

SDW on Ion Milling:
I have worked with thin Au-Ge-Ni multi-layers on GaAs in the past and you do
have to worry about heating the sample as you indicate. You can use
superglue in place of wax; you just have to be patient to get rid of the
glue. If you ion mill your sample, you really have to worry about heating
the sample during ion milling. The answer there is to use low angle, low
energy, and it wouldn't hurt to cool the sample with a liquid nitrogen
cooled stage. Since it is a competitor's product, I will not mention the
name, but there is one popular ion mill on the market that you have to be
particularly careful with. This ion mill does not have a sample holder that
has a large heat sink and has a relatively poor thermal path through the
holder. If you have this type of ion mill, you must significantly de-tune
the ion guns or you can heat your samples very high even at low milling
angles. Unfortunately, this "de-tuning" by lowering the ion energy and
limiting the ion beam current will significantly impact the ion milling
rate. I have melted glass cross sections with this ion mill. I have used
other ion mills with the glass and for the most part, they are better in
terms of not heating the glass samples simply because the stages dissipate
the heat better, but you still have to be careful. In all of the
conventional ion mills, i.e. non low-energy types, the beam current drops to
essentially zero below about 3 kV. There are a number of studies that have
been done concerning the heating of samples in ion mills. You can contact
me off-line to talk about the low energy guns in the ion mills that we sell.

SDW on MicroCleaving:
OK, let me sound off for the MicroCleave(TM), also known as the Small Angle
Cleavage Technique. (You can even consider this coming from Igor Slobinsky
and Dr. Cleavinstein so maybe I won't get in trouble for being too
commercial.) I thought that this technique is the neatest thing since
sliced bread (or sliced samples) when I started using it and I still do.
This technique produces the best cross section samples of any available
technique because there is simply no ion damage produced. In fact, a major
disadvantage of these types of samples is that if the samples are fully
crystalline and you are using a field emission gun equipped microscope, then
there is no amorphous regions to help the microscopist focus and stigmate
with. I suspect that with the new C(s)-corrected machines, more and more
people will be discovering this technique.

For the metallization samples, the MicroCleave(TM) technique will work as
long as the layers are very thin. Generally, they should be less than
1000A. They also must be fully adherent to the substrate and to the other
layers. For as-deposited Au-Ge-Ni on GaAs samples with e-beam evaporated Ge
layers that I mentioned above, I found that the Ge layers were weak and
would split within the layer during the cleave. I've never looked at Ge
layers put down by other methods, so I don't know whether that is a
universal trait of Ge layers or not. If we heat treated them to alloy the
layers, I had no such problem. Even a slight anneal where there was no
apparent mixing of the layer materials would help prevent the Ge layer from
splitting. I suspect that we might have been getting a little densification
with the slight anneal. What happens with these samples during the
procedure is that the thinnest parts of the samples would consist of any
layers below the Ge and about half the Ge layer. Further back, all of the
layers would be intact, but thicker. I can send a copy of a presentation on
the MicroCleave technique that John McCaffrey and I did in "Cleave-Land" at
an M&M meeting in 1997 to anyone that wants one. There are two places in
the presentation that addresses temperature sensitive samples. First, as
you point out, use superglue and then wait for the superglue to dissolve
when finished instead of using the low temperature melting wax. The other
place is that for the mounting epoxy, you need a viscous and slow setting
epoxy to mount the samples onto the specially bent Veco 2x1 tabbed grids.
Normally, Epoxy Technology's H-22 silver filled epoxy is used, but that
requires heat to set. The 90 minute Super strength type of two part epoxies
work well, but you have to give them a full day to set up. They are also
nonconductive, but that didn't seem to be much of a problem. I've tried a
number of different brands, and they seemed to work, but they have to be the
90 minute working time ones. Other epoxies flowed too much and did not stay
in position to hold the sample. I also experimented with fillers for the
epoxy with no success at all. There is also a temperature spike when an
epoxy cures. When I used this on temperature sensitive samples, I tried to
minimize the amount of epoxy on the grids so that the grid could act as a
heat sink for the exothermic reaction and the samples would experience the
minimum of a thermal excursion.

One other point of caution for about Si samples prepared this way. The
samples can become very very thin and basically disappear into nothingness
at the edges. I had a pulsed laser deposited diamond like carbon film that
was deposited onto silicon and prepared this way that was too thin at the
edges to do electron energy loss spectroscopy on and get sufficient signal!
That's thin! What it means is that the samples prepared this way can be
heated by a focused beam because there isn't enough thermal path to extract
heat from the exposed area.

Here is a list of the references that I have. The "Update" paper by John
and me also has an accompanying presentation that I can send to people in a
PDF format that I can send to anyone that is interested. This presentation
and the MRS paper by us have a pictorial outline of the technique in it.
There are a lot of hands-on tips and tricks and details that we tried to put
into the paper so that someone could try the technique without reinventing
the wheel.

1) "Small Angle Cleavage of Semiconductors for TEM", J.P. McCaffrey,
Ultramicroscopy 38, 1991, pp:149-157
2) "TEM Samples of Semiconductors Prepared by a Small Angle Cleavage
Technique", J.P. McCaffrey, Mat. Res. Soc. Symp. Proc., Vol.254, 1992,
pp:109-120
3) John P. McCaffrey, Microscopy Research and Technique, 24, (1993) 180.
4) "A Simplified Method for Modifying TEM Copper Grids For Use with the
Small Angle Cleavage Technique", Scott D. Walck, Microscopy Today, (96-4),
(1996).
5) The Small Angle Cleavage Technique Applied to Coatings and Thin Films, S.
D. Walck and J. P. McCaffrey, Thin Solid Films, 308-309, (1997) 399.
6) "The Small Angle Cleavage Technique: An Update", Scott D. Walck, John P.
McCaffrey, Mat.Res.Soc.Symp.Proc., Vol.480,1997,pp:149-170

OK, here is the disclaimer that I hope will keep me out of trouble. South
Bay Technology Inc. makes and sells the Microcleave(TM) Kit. SBT also sells
the Technoorg-Linda line of ion mills with the low energy ion gun.


-Scott

Scott D. Walck, Ph.D.
Technical Director
South Bay Technology, Inc.
1120 Via Callejon
San Clemente, CA 92673

US Toll Free: 1-800-728-2233
Tel: (949) 492-2600
Fax: (949) 492-1499

www.southbaytech.com
walck-at-southbaytech.com

-----Original Message-----
X-from: randerson20-at-tampabay.rr.com [mailto:randerson20-at-tampabay.rr.com]
Sent: Tuesday, August 22, 2006 11:20 AM
To: Walck-at-SouthBayTech.com

Geoff,

No you can't "cut" Si with a diamond knife. Si cleaves very easily. When the
knife touches the Si, the Si cleaves along one of its preferred {111}
crystallographic cleaving planes. That might be fine if you orient the Si
such that a Si {111} crystallographic direction is perpendicular to the
block face. Then if you are VERY lucky, you MIGHT get a cleaved piece of Si
oriented with {111} faces (at the risk of your knife). Any article that I've
seen that claims to have microtomed Si has shown lots of pictures of tiny
{111} Si sections.

Assuming that you are successful, so what! There is no, or very little
interest, in anything in the semiconductor world or in potentially oriented
thin films deposited on Si, that is best displayed on top of a Si cross
section with a {111} block face orientation. The angles are wrong.

Si wafers in semiconductor processing are almost all with (or very close
to) a Si {001} direction perpendicular to the Si wafer surface. Devices
fabricated in, or patterns deposited on, these wafers are not randomly
oriented. They are almost always aligned with {011} planes perpendicular to
the Si surface, i.e. the x, y orientations of the devices and patterns are
parallel to {011} directions in the Si surface. Cross sections of interest
for TEM or SEM analysis are oriented such that the microscope looks down on
a {011} "block face." If you orient the specimen's block face so as to
attempt to cut {011} cross sections, the diamond knife will touch the Si and
immediately propagate a cleave down the nearest {111} plane despite the
orientation of the block. As the specimen in the block is constrained by the
epoxy holding it, the result is a flake of Si dust from just the surface.
When the knife comes around again you get more dust.

Using a microtome to make Si {011}cross sections is like using a screw
driver to drive a nail.

Instead of fighting the fact that Si cleaves, why not exploit this fact and
prepare really great thin specimens by the microcleaving technique pioneered
by McCaffrey and Igor. I'll copy them and invite them to expand on this
suggestion. They'll point out that you can make nice thin sections of thin
films on Si with a minimum of tools and at room temperature. There is a
videotape that shows how to do it.

Ron Anderson



Geoffrey_Williams-at-brown.edu wrote:
}
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}
} I do not know exactly what I can divulge, but they have tried tripod
polishing, and ion-milling but I am told they elevate the temperature and
the layers need to be prepped and kept at room temps until imaging.
}
} Does that say enough? I still feel it's a bit irrelevant to the initial
question.
}
} Is it possible to section a Si wafer? Am I correct in being skeptical?
Or should I just kill a $4k knife or try an ancient already messed up and
questionably anchored diamond in the attempt?
}
} I just figured someone out there might be able to share a bit of practical
experience.
}
} Thanks!
}
} Geoff Williams
} Leduc Bioimaging Facility Manager
} Brown University
}
} http://www.brown.edu/Facilities/Leduc_Bioimaging_Facility/
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From: gary-at-gaugler.com
Date: Tue, 22 Aug 2006 18:51:25 -0500
Subject: [Microscopy] Re: 16bit TIFF images in Photoshop

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

If you don't want 16-bit TIFF, why not just save it as 8-bits?
SaveAs/Options/Save16-bitAs8-bit.

Save the 16-bit as the original and save the 8-bit from analySIS
as the 8-bit version. Dynamic range will be reduced but pixel
loss will be reduced.

gary g.



At 08:24 AM 8/22/2006, you wrote:



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From: gary-at-gaugler.com
Date: Tue, 22 Aug 2006 18:58:22 -0500
Subject: [Microscopy] Re: Sectioning Si Wafers

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Not being a TEM person, I'm exactly sure what you need to
have done.

Si wafers are easy to cut using a carbide tip pens available
from Home Depot (~$6). You can buy pre-cut wafers from Ted
Pella but you will get a lot of little die--probably more than
you need.

The easiest way to cut coated Si material is to cleave it.
This is perfect for cross section analysis.

If you don't get the Si material's lattice lined up properly,
trying any variable cutting method will yield a pile of Si dust.
You must be parallel or perpendicular to the wafer flat.

gary g.


At 08:33 AM 8/22/2006, you wrote:



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From: gary-at-gaugler.com
Date: Tue, 22 Aug 2006 19:04:39 -0500
Subject: [Microscopy] Re: Software: Montage

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

I have a montage assembler that is based on Windows Explorer.
The individual images must be of consistent size, have overlap
between adjacent images and not exceed total available memory.

If you wish to see a sample, can you send me some files?
10x10 (100) images ought to show if this program will work.

The data so far has been collected on a Prior automated stage.

There is no user manual and the software could be free. But it
should be tested to be sure that it will work for your application.

gary g.


At 07:55 AM 8/20/2006, you wrote:



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From: brentn-at-freeshell.org
Date: Tue, 22 Aug 2006 21:00:33 -0500
Subject: [Microscopy] 16bit TIFF images in Photoshop

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


On Aug 22, 2006, at 11:46, voyles-at-engr.wisc.edu wrote:

} There is also a potentially serious drawback to the Photoshop
} procedure
} you suggest. Photoshop discards the original grey-scale values of the
} image when you use "Auto Levels", which breaks the quantitative
} connection between the grey-scale value in the image and the absolute
} number of electrons that struck the detector. This will often make
} quantitative analysis of the electron image or diffraction pattern
} impossible and makes it difficult to even judge the relative average
} brightness of two different images to guess, for example, the sample
} thickness.

This is true. However, it is trivial to rectify the problem that
he's having, which is that his system is saving 12-bit TIFFs. Simply
use the Convolve function in Photoshop to multiply the image by 16
uniformly. This preserves the quantitative connection while allowing
you to visually observe the image. (One notes that there was a very
simple tutorial for this in Microscopy Today about two years ago... *g*)


} Software developed for photographs and desktop
} publishing is not generally the best choice for dealing with
} scientific
} data.

I disagree with this statement. You can be perfectly quantitative in
Photoshop, and in fact many people are (see all the Fovea Pro users,
for example.) The issue at hand is one of needing to understand what
one is doing to an image. But that issue is true no matter what
software you're using. You can screw up data in ImagePro just as
easily as you can in Photoshop.

Brent


--
Brent Neal
Research Physicist
Milliken Research Corporation







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From: nizets2-at-yahoo.com
Date: Wed, 23 Aug 2006 01:26:03 -0500
Subject: [Microscopy] Re: 16bit TIFF images in Photoshop

Contents Retrieved from Microscopy Listserver Archives
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Hello,

Thanks to everybody for their remarks.

Although this remark is right when one considers the
auto-contrast option, I don't think you change the
relative values of the pixels by adjusting the levels.
As was described in another answer, reading this
format in Photoshop compresses the values of the left
side of the histogram. To recover a "normal"
histogram, one has just to adjust the limits to
exclude all the pixels with a 0 val