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From: Philip.Koeck-at-biosci.ki.se
Date: Fri, 1 Sep 2006 05:22:40 -0500
Subject: [Microscopy] Question: pixels, pixels, little pixels....

Contents Retrieved from Microscopy Listserver Archives
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Hi,

I respectfully refuse to buy what you say in point 1.

I agree that a wave at Nyquist frequency, which is aligned with
the rows of pixels will in general be downweighted (and in the worst
case deleted completely) due to the phase-mismatch you describe.
However, this applies to exactly two plane waves in the entire
spectrum, assuming that the scene to be digitized has a maximum
frequency equal to Nyquist.
Waves that run at an angle to the rows of pixels will be perfectly
reconstructable (given all the relevant transfer functions).
This is a minor problem, in my opinion, and doesn't require 1.5-fold
oversampling. (1.1-fold would be plenty if you insist on fixing it.)

Any other ideas?

Philip

-----Original Message-----
X-from: kevin-at-mediacy.com [mailto:kevin-at-mediacy.com]
Sent: 31 August 2006 16:06
To: Philip.Koeck-at-biosci.ki.se

Two replies to different aspects of this question:


(1) Well, the reason for oversampling above Nyquist is actually fairly
simple.

Think of the spatial frequencies (edges) as sine waves. Sampling at the
Nyquist level of 2x the highest frequency allows you to sample the highest
frequency incoming sine wave at peak and trough. Anything less and you will
instead get a beat frequency from your samples. This is the _minimum_
sampling to get that high frequency.

Here's where I start reaching for the white-board pens...

However, if the high frequency is _out of phase_ with your samples, you
might be perfectly sampling exactly where the input is crossing zero,
resulting in no output data. Sampling right in phase gives maximum response,
90 degrees out of phase gives zero response. Hence the idea of sampling a
little faster, as in 1.5x Nyquist, so that you get some peaks, some troughs,
and can estimate the high frequency better.



-- Kevin Ryan
Media Cybernetics, Inc.
www.mediacy.com


} -----Original Message-----
} From: Philip.Koeck-at-biosci.ki.se [mailto:Philip.Koeck-at-biosci.ki.se]
} Sent: Thursday, August 31, 2006 5:55 AM
} To: kevin-at-mediacy.com
} Subject: [Microscopy] RE: Question: pixels, pixels, little pixels....
}
} ...
}
} In summary: I don't think more pixels is better, but it might be
} worse.
} Choose the pixel size based on the contents of the scene you want to
} digitize.
}
} If somebody can explain the merits of oversampling 1.5-fold to me
} (beyond the simple explanation I've offered) I would be grateful.
}
} Philip
}




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From: keith.morris-at-ucl.ac.uk
Date: Fri, 1 Sep 2006 06:21:53 -0500
Subject: [Microscopy] Question: pixels, pixels, little pixels....

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html




Hi Frank,

In order to get measure of perimeter the image analyser software must be
able to recognise a corner as distinct from a horizontal or vertical row of
pixels, and apply a weighting factor when it encounters a corner (otherwise
a D shape would give the same perimeter as an O shape if perimeter is
calculated merely by pixel count).

However, even more importantly, perimeter is a measurement that truly varies
with magnification, and hence resolution, of the measuring conditions. If
you measure lung tissue alveolar wall area & perimeter by light microscopy
and then by TEM, you will get roughly the same area measurement for both,
but the perimeter value will be far higher. This is because under very high
magnification you will encounter further tiny small scale convolutions that
mirror the larger ones seen under light microscopy. Likewise if you measure
the perimeter of UK on a map, you will naturally get an incredibly small
perimeter value compared the very very large value you would measure if you
actually walked round all of the coastline with a treadmill.

Object area can vary also with magnification as well, if the lower
magnification fails to resolve many small objects amongst larger ones, but
even in this case the area differences due to magnification would still be
relatively small.

Regards

Keith


----------------------------------------------------------
Dr Keith J Morris
Imaging Facilities Manager
Cell Biology Division
Institute of Ophthalmology
University College London
11-43 Bath Street
London EC1V 9EL

Tel: 020 7608 4050
Fax: 020 7608 4034
email: keith.morris-at-ucl.ac.uk

-----Original Message-----
X-from: frank.karl-at-degussa.com [mailto:frank.karl-at-degussa.com]
Sent: 30 August 2006 16:30
To: keith.morris-at-ucl.ac.uk

Hello Everyone,
Recently I been in a discussion about how many pixels a feature should
contain to provide meaningful results from image analysis. For example, if
I threshold an image or measure a perimeter how many pixels do I need a
feature to have as to insure I have "statistical meaningful" data. It seem
intuitive that I should have as many as possible, but what about a particle
or feature that has only 12 pixels maximum in one direction (say a fiber)?

I realize I could have a rectangle 9 by 7 pixels which would give me a
diagonal of 11 pixels, but if I could only measure features that had at
least 10 pixels would this feature have meaning?

I think I've expressed myself as clearly as my current understand is will
allow me, I'll turn this question loose on the high tension thinkers out
there!

Thanks

Frank Karl
Degussa Corporation
Akron Technical Center
3500 Embassy Parkway
Suite 100
Akron, Ohio 44333


330-668-2235 Ext. 238


This e-mail transmission, and any documents, files or previous e-mail
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in or attached to this transmission is STRICTLY PROHIBITED. If you have
received this transmission in error, please immediately notify the sender
by telephone or return e-mail and delete the original transmission and its
attachments without reading or saving in any manner. Thank you.


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From: Mike.Bode-at-olympus-sis.com
Date: Fri, 1 Sep 2006 10:29:40 -0500
Subject: [Microscopy] Question: pixels, pixels, little pixels....

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Mark,
If you can move the cabinets away from the wall, even a half inch, the
vibrations should lessen considerably.
Pat Connelly
NIH/NHLBI
Bethesda, MD
connellyps-at-mail.nih.gov

-----Original Message-----
X-from: mbush-at-fit.edu [mailto:mbush-at-fit.edu]
Sent: Thursday, August 31, 2006 6:53 PM
To: Connelly, Patricia (NIH/NHLBI) [E]

Hi Keith,

The fact that the length of, say the coast of the UK, depends on the
scale you are using is known as "fractal dimansion". A lot of work has
been done on fractal dimensions, and it is not limited to digital
images.

Regarding the original question about errors and reliability of
measurements of digital images, I think that the answer is determined by
applying the Nyquist-Shannon theorem to digital images. There is
actually a very good explanation of this in Wikipedia (for the
mathematically inclined):

http://en.wikipedia.org/wiki/Nyquist-Shannon_sampling_theorem

If you read the article, it says that this theorem is valid for certain
types of signals (band limited, "infinite sample", etc.) and that there
are several practical considerations that need to be taken into account
for real world signals and may require some oversampling:

"The sampling theorem does not say what happens when the conditions and
procedures are not exactly met, but its proof suggests an analytical
framework in which the non-ideality can be studied. A designer of a
system that deals with sampling and reconstruction processes needs a
thorough understanding of the signal to be sampled, in particular its
frequency content, the sampling frequency, how the signal is
reconstructed in terms of interpolation, and the requirement for the
total reconstruction error, including aliasing and interpolation error.
These properties and parameters may need to be carefully tuned in order
to obtain a useful system."

Michael Bode, Ph.D.

General Manager

OLYMPUS SOFT IMAGING SOLUTIONS
12596 West Bayaud Ave #300
Lakewood, CO 80228
USA
Tel.: +1 (303) 234-9270
Fax.: +1 (303) 234-9271
E-mail: Mike.Bode-at-olympus-sis.com
www.olympus-sis.com

-----Original Message-----
X-from: keith.morris-at-ucl.ac.uk [mailto:keith.morris-at-ucl.ac.uk]
Sent: Friday, September 01, 2006 05:27
To: Mike Bode




Hi Frank,

In order to get measure of perimeter the image analyser software must be
able to recognise a corner as distinct from a horizontal or vertical row
of pixels, and apply a weighting factor when it encounters a corner
(otherwise a D shape would give the same perimeter as an O shape if
perimeter is calculated merely by pixel count).

However, even more importantly, perimeter is a measurement that truly
varies with magnification, and hence resolution, of the measuring
conditions. If you measure lung tissue alveolar wall area & perimeter by
light microscopy and then by TEM, you will get roughly the same area
measurement for both, but the perimeter value will be far higher. This
is because under very high magnification you will encounter further tiny
small scale convolutions that mirror the larger ones seen under light
microscopy. Likewise if you measure the perimeter of UK on a map, you
will naturally get an incredibly small perimeter value compared the very
very large value you would measure if you actually walked round all of
the coastline with a treadmill.

Object area can vary also with magnification as well, if the lower
magnification fails to resolve many small objects amongst larger ones,
but even in this case the area differences due to magnification would
still be relatively small.

Regards

Keith


----------------------------------------------------------
Dr Keith J Morris
Imaging Facilities Manager
Cell Biology Division
Institute of Ophthalmology
University College London
11-43 Bath Street
London EC1V 9EL

Tel: 020 7608 4050
Fax: 020 7608 4034
email: keith.morris-at-ucl.ac.uk

-----Original Message-----
X-from: frank.karl-at-degussa.com [mailto:frank.karl-at-degussa.com]
Sent: 30 August 2006 16:30
To: keith.morris-at-ucl.ac.uk

Hello Everyone,
Recently I been in a discussion about how many pixels a feature should
contain to provide meaningful results from image analysis. For example,
if
I threshold an image or measure a perimeter how many pixels do I need a
feature to have as to insure I have "statistical meaningful" data. It
seem
intuitive that I should have as many as possible, but what about a
particle
or feature that has only 12 pixels maximum in one direction (say a
fiber)?

I realize I could have a rectangle 9 by 7 pixels which would give me a
diagonal of 11 pixels, but if I could only measure features that had at
least 10 pixels would this feature have meaning?

I think I've expressed myself as clearly as my current understand is
will
allow me, I'll turn this question loose on the high tension thinkers out
there!

Thanks

Frank Karl
Degussa Corporation
Akron Technical Center
3500 Embassy Parkway
Suite 100
Akron, Ohio 44333


330-668-2235 Ext. 238


This e-mail transmission, and any documents, files or previous e-mail
messages attached to it may contain information that is confidential or
legally privileged. If you are not the intended recipient, or a person
responsible for delivering it to the intended recipient, you are hereby
notified that you must not read this transmission and that any
disclosure,
copying, printing, distribution or use of any of the information
contained
in or attached to this transmission is STRICTLY PROHIBITED. If you have
received this transmission in error, please immediately notify the
sender
by telephone or return e-mail and delete the original transmission and
its
attachments without reading or saving in any manner. Thank you.


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From: eschumacher-at-mccrone.com
Date: Fri, 1 Sep 2006 10:42:19 -0500
Subject: [Microscopy] Short Course Announcement: SEM and TEM

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Fellow Listers,

The College of Microscopy will be offering the following electron
microscopy short courses this fall:

October 16-20 - Scanning Electron Microscopy

October 31-November 2 - Transmission Electron Microscopy

Both will be held at our Westmont, IL facility.
In addition to lectures, these courses emphasize hands-on training using
state of the art equipment.
For further details and registration information, please follow the link
below.

www.collegeofmicroscopy.com


Elaine Schumacher
Senior Research Scientist
McCrone Associates, Inc.
850 Pasquinelli Drive
Westmont, IL 60559-5539 USA
630-887-7100 (tel)
630-887-7417 (fax)
E-mail: eschumacher-at-mccrone.com
Web Site: www.mccrone.com



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From: nizets2-at-yahoo.com
Date: Mon, 4 Sep 2006 03:22:21 -0500
Subject: [Microscopy] basic questions about Ni grids

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Mark,

If possible, it might be interesting to try the following:

In a circle, put three golf-balls in such a way that they touch each other
and cannot move away. In the middle of these three, put a golf-ball on top
of the three balls, as if you create a pyramid of golf-balls. Do this for
three / four mounting places and mount the table / microscope stand on the
top-balls. You'd be amazed how well golf-balls can absorb vibrations.

If the equipment is not too heavy, you can also consider tennis-balls,
however, they will lift the table with about 5-6 inches, whereas the
golf-balls will only add about 3 inches...

Obviously in this way you reduce the ergonomics by putting the microscope
higher, but you'll also reduce the vibrations.
Hope it works out, for me it did a few years ago.
Best,

Sven Terclavers

-----Original Message-----
X-from: mbush-at-fit.edu [mailto:mbush-at-fit.edu]
Sent: Thursday, August 31, 2006 6:53 PM
To: Connelly, Patricia (NIH/NHLBI) [E]

Dear listers,

I have some basic questions about the observation of
minerals on nickel grids in TEM.
I use formvar-carbon-coated nickel grids (I would have
prefered copper but we have nickel grids in stock) and
I deposit fine powder of crystal mineral onto them.
When I observe the particles, even with the
diffraction aperture inserted, the surface illuminated
by the beam darkens pretty quickly. Sometimes I even
have dark rings imprinted on the coating film (if I
leave the beam for some minutes). If I take the
diffrac. aperture out of the way for EDX analysis the
surface becomes quickly complety black (in a matter of
minutes).

1) What is black? Does the mineral melt?
2) If I heat the mineral to make it amorphous before
the observation I sometimes still see dark rings. Are
they diffraction rings? (in normal mode, not
diffraction mode). Is there any diffraction in
amorphous material?
3) In EDX I see a peak for copper, just after the
nickel peak (at 8,070 keV) and I don’t expect copper
in my material. Is there copper in the nickel grids?

Regards,

Stephane

__________________________________________________
Do You Yahoo!?
Tired of spam? Yahoo! Mail has the best spam protection around
http://mail.yahoo.com

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From: ludo.rossou-at-ua.ac.be
Date: Mon, 4 Sep 2006 08:35:54 -0500
Subject: [Microscopy] ./viaWWW: specimen polishing

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Email: ludo.rossou-at-ua.ac.be
Name: Ludo Rossou

Organization: University of Antwerp Belgium

Title-Subject: [Filtered] specimen polishing

Question: Does anyone have some experience with the MULTIPREP SYSTEM of Allied High Tech Products?

Regards,
Ludo

ludo.rossou-at-ua.ac.be

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From: Henrik.Kaker-at-guest.arnes.si
Date: Mon, 4 Sep 2006 08:36:28 -0500
Subject: [Microscopy] viaWWW: Gresham (e2v) detector installation manual

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Email: Henrik.Kaker-at-guest.arnes.si
Name: Henrik Kaker

Organization: SEM-EDS Lab, Metal Ravne, Slovenia

Title-Subject: [Filtered] Gresham (e2v) detector installation manual

Question: Dear All,

I am looking for a Gresham (now is e2v) Si(Li) detector installation manual. Thanks.

Henrik Kaker

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From: colijn.1-at-osu.edu
Date: Mon, 4 Sep 2006 14:43:05 -0500
Subject: [Microscopy] Re: basic questions about Ni grids

Contents Retrieved from Microscopy Listserver Archives
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Stephane,

} 1) What is black? Does the mineral melt?

The black is most likely carbonaceous contamination. Volatile
organic molecules diffuse across the sample surface under the
influence of the beam's electric field. When they hit the beam they
"polymerize" and form a thick layer which appears dark in the
image. In TEM, the contamination layer usually appears as a ring
around the perimeter of the beam. As you decrease the size of the
beam (e.g. STEM), the contamination problem increases.

} 2) If I heat the mineral to make it amorphous before
} the observation I sometimes still see dark rings. Are
} they diffraction rings? (in normal mode, not
} diffraction mode). Is there any diffraction in
} amorphous material?

You will see diffraction rings from amorphous material. They will be
diffuse, not sharp like the rings from most crystalline
materials. The carbonaceous contamination will also give rise to
diffuse diffraction rings


} 3) In EDX I see a peak for copper, just after the
} nickel peak (at 8,070 keV) and I don't expect copper
} in my material. Is there copper in the nickel grids?

My suspicion is that you are seeing the Ni K beta peak,although the
Ni Kbeta is at 8.265keV. The K beta is ~20% of the intensity of the
K alpha peak. The 1st row transition metal K lines have the
characteristic that an element Z's K beta falls under the (Z+1) K alpha.

At 04:25 AM 9/4/2006, you wrote:



} ----------------------------------------------------------------------------
} The Microscopy ListServer -- CoSponsor: The Microscopy Society of America

Hendrik O. Colijn colijn.1-at-osu.edu
OSU Campus Electron Optics Facility www.ceof.ohio-state.edu
040 Fontana Labs, 116 W. 19th Ave


==============================Original Headers==============================
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14, 26 -- Date: Mon, 04 Sep 2006 15:39:23 -0400
14, 26 -- From: "Hendrik O. Colijn" {colijn.1-at-osu.edu}
14, 26 -- Subject: Re: [Microscopy] basic questions about Ni grids
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From: walck-at-southbaytech.com
Date: Mon, 4 Sep 2006 16:59:00 -0500
Subject: [Microscopy] basic questions about Ni grids

Contents Retrieved from Microscopy Listserver Archives
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Stephane,
I agree with Henk that it is probably contamination on your samples.
To make sure, if you tilt the samples at a high angle, you should see a split of the rings where you are seeing the top and bottom surfaces.
This used to be a way of measuring the thickness of a TEM sample.
You can download a copy of the paper from our website on contamination of samples. The URL is http://www.southbaytech.com/app_index.cfm?main_action=tech_papers"
and the title is "Surface Science Aspects of Contamination in TEM Sample Prep" by John Grant et al. and it is paper number 225. (I am one of the authors.) In that paper, you will
see a tilted sample with heavy contamination. To avoid contamination like this, you should plasma clean your sample prior to putting it into the TEM.

Disclaimer: South Bay Technology makes and sells a Plasma Cleaner.

-Scott

Scott D. Walck, Ph.D.
Technical Director
South Bay Technology, Inc.
1120 Via Callejon
San Clemente, CA 92673

TEL: +1-949-492-2600
FAX: +1-949-492-1499
walck-at-southbaytech.com

-------- Original Message --------
} From: colijn.1-at-osu.edu
} Sent: Monday, September 04, 2006 3:47 PM
} To: Walck-at-SouthBayTech.com
} Subject: [Microscopy] Re: basic questions about Ni grids
}
} ----------------------------------------------------------------------------
} The Microscopy ListServer -- CoSponsor: The Microscopy Society of America
} To Subscribe/Unsubscribe -- http://www.microscopy.com/MicroscopyListserver
} On-Line Help http://www.microscopy.com/MicroscopyListserver/FAQ.html
} ----------------------------------------------------------------------------
}
} Stephane,
}
} } 1) What is black? Does the mineral melt?
}
} The black is most likely carbonaceous contamination. Volatile
} organic molecules diffuse across the sample surface under the
} influence of the beam's electric field. When they hit the beam they
} "polymerize" and form a thick layer which appears dark in the
} image. In TEM, the contamination layer usually appears as a ring
} around the perimeter of the beam. As you decrease the size of the
} beam (e.g. STEM), the contamination problem increases.
}
} } 2) If I heat the mineral to make it amorphous before
} } the observation I sometimes still see dark rings. Are
} } they diffraction rings? (in normal mode, not
} } diffraction mode). Is there any diffraction in
} } amorphous material?
}
} You will see diffraction rings from amorphous material. They will be
} diffuse, not sharp like the rings from most crystalline
} materials. The carbonaceous contamination will also give rise to
} diffuse diffraction rings
}
}
} } 3) In EDX I see a peak for copper, just after the
} } nickel peak (at 8,070 keV) and I don't expect copper
} } in my material. Is there copper in the nickel grids?
}
} My suspicion is that you are seeing the Ni K beta peak,although the
} Ni Kbeta is at 8.265keV. The K beta is ~20% of the intensity of the
} K alpha peak. The 1st row transition metal K lines have the
} characteristic that an element Z's K beta falls under the (Z+1) K alpha.
}
} At 04:25 AM 9/4/2006, you wrote:
}
}
}
} } ----------------------------------------------------------------------------
} } The Microscopy ListServer -- CoSponsor: The Microscopy Society of America
} } To Subscribe/Unsubscribe -- http://www.microscopy.com/MicroscopyListserver
} } On-Line Help http://www.microscopy.com/MicroscopyListserver/FAQ.html
} } ----------------------------------------------------------------------------
} }
} } Dear listers,
} }
} } I have some basic questions about the observation of
} } minerals on nickel grids in TEM.
} } I use formvar-carbon-coated nickel grids (I would have
} } prefered copper but we have nickel grids in stock) and
} } I deposit fine powder of crystal mineral onto them.
} } When I observe the particles, even with the
} } diffraction aperture inserted, the surface illuminated
} } by the beam darkens pretty quickly. Sometimes I even
} } have dark rings imprinted on the coating film (if I
} } leave the beam for some minutes). If I take the
} } diffrac. aperture out of the way for EDX analysis the
} } surface becomes quickly complety black (in a matter of
} } minutes).
} }
} } 1) What is black? Does the mineral melt?
} } 2) If I heat the mineral to make it amorphous before
} } the observation I sometimes still see dark rings. Are
} } they diffraction rings? (in normal mode, not
} } diffraction mode). Is there any diffraction in
} } amorphous material?
} } 3) In EDX I see a peak for copper, just after the
} } nickel peak (at 8,070 keV) and I don't expect copper
} } in my material. Is there copper in the nickel grids?
} }
} } Regards,
} }
} } Stephane
} }
} } __________________________________________________
} } Do You Yahoo!?
} } Tired of spam? Yahoo! Mail has the best spam protection around
} } http://mail.yahoo.com
} }
} } ==============================Original Headers==============================
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} } 6, 18 -- Date: Mon, 4 Sep 2006 01:22:21 -0700 (PDT)
} } 6, 18 -- From: Stephane Nizet {nizets2-at-yahoo.com}
} } 6, 18 -- Subject: basic questions about Ni grids
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}
} Hendrik O. Colijn colijn.1-at-osu.edu
} OSU Campus Electron Optics Facility www.ceof.ohio-state.edu
} 040 Fontana Labs, 116 W. 19th Ave
}
}
} ==============================Original Headers==============================
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From: colijn.1-at-osu.edu
Date: Mon, 4 Sep 2006 19:24:45 -0500
Subject: [Microscopy] basic questions about Ni grids

Contents Retrieved from Microscopy Listserver Archives
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Stephane,

Just a comment on Scott's email...

Be careful about putting a carbon coated formvar grid into an oxygen
plasma cleaner. The oxygen plasma does a great job of removing
carbon from your sample, including the carbon containing support
film!. You may clean the support film completely away. That said, a
plasma cleaner is a great thing to have available for the right type
of sample and is almost a necessity for FEG STEM work.

I have often reduced (though not eliminated) carbon contamination by
warming the TEM grid to ~100C just before putting it into the
scope. It seems to be enough to desorb most of the organic
contaminants. Obviously you should be careful to keep the microscope
and sample rods absolutely clean (no fingerprints, organic solvents,
etc.) Cleaning the sample rod in a plasma cleaner really helps.

Cheers,
Henk


At 05:58 PM 9/4/2006, Scott Walck wrote:
} Stephane,
} I agree with Henk that it is probably contamination on your samples.
} To make sure, if you tilt the samples at a high angle, you should
} see a split of the rings where you are seeing the top and bottom surfaces.
} This used to be a way of measuring the thickness of a TEM sample.
} You can download a copy of the paper from our website on
} contamination of samples. The URL is
} http://www.southbaytech.com/app_index.cfm?main_action=tech_papers"
} and the title is "Surface Science Aspects of Contamination in TEM
} Sample Prep" by John Grant et al. and it is paper number 225. (I
} am one of the authors.) In that paper, you will
} see a tilted sample with heavy contamination. To avoid
} contamination like this, you should plasma clean your sample prior
} to putting it into the TEM.
}
} Disclaimer: South Bay Technology makes and sells a Plasma Cleaner.
}
} -Scott
}
} Scott D. Walck, Ph.D.
} Technical Director
} South Bay Technology, Inc.
} 1120 Via Callejon
} San Clemente, CA 92673
}
} TEL: +1-949-492-2600
} FAX: +1-949-492-1499
} walck-at-southbaytech.com
}
} -------- Original Message --------
} } From: colijn.1-at-osu.edu
} } Sent: Monday, September 04, 2006 3:47 PM
} } To: Walck-at-SouthBayTech.com
} } Subject: [Microscopy] Re: basic questions about Ni grids
} }
} }
} ----------------------------------------------------------------------------
} } The Microscopy ListServer -- CoSponsor: The Microscopy Society of America
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} }
} } Stephane,
} }
} } } 1) What is black? Does the mineral melt?
} }
} } The black is most likely carbonaceous contamination. Volatile
} } organic molecules diffuse across the sample surface under the
} } influence of the beam's electric field. When they hit the beam they
} } "polymerize" and form a thick layer which appears dark in the
} } image. In TEM, the contamination layer usually appears as a ring
} } around the perimeter of the beam. As you decrease the size of the
} } beam (e.g. STEM), the contamination problem increases.
} }
} } } 2) If I heat the mineral to make it amorphous before
} } } the observation I sometimes still see dark rings. Are
} } } they diffraction rings? (in normal mode, not
} } } diffraction mode). Is there any diffraction in
} } } amorphous material?
} }
} } You will see diffraction rings from amorphous material. They will be
} } diffuse, not sharp like the rings from most crystalline
} } materials. The carbonaceous contamination will also give rise to
} } diffuse diffraction rings
} }
} }
} } } 3) In EDX I see a peak for copper, just after the
} } } nickel peak (at 8,070 keV) and I don't expect copper
} } } in my material. Is there copper in the nickel grids?
} }
} } My suspicion is that you are seeing the Ni K beta peak,although the
} } Ni Kbeta is at 8.265keV. The K beta is ~20% of the intensity of the
} } K alpha peak. The 1st row transition metal K lines have the
} } characteristic that an element Z's K beta falls under the (Z+1) K alpha.
} }
} } At 04:25 AM 9/4/2006, you wrote:
} }
} }
} }
} } } -----------------------------------------------------------------
} -----------
} } } The Microscopy ListServer -- CoSponsor: The Microscopy Society of America
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} } }
} } } Dear listers,
} } }
} } } I have some basic questions about the observation of
} } } minerals on nickel grids in TEM.
} } } I use formvar-carbon-coated nickel grids (I would have
} } } prefered copper but we have nickel grids in stock) and
} } } I deposit fine powder of crystal mineral onto them.
} } } When I observe the particles, even with the
} } } diffraction aperture inserted, the surface illuminated
} } } by the beam darkens pretty quickly. Sometimes I even
} } } have dark rings imprinted on the coating film (if I
} } } leave the beam for some minutes). If I take the
} } } diffrac. aperture out of the way for EDX analysis the
} } } surface becomes quickly complety black (in a matter of
} } } minutes).
} } }
} } } 1) What is black? Does the mineral melt?
} } } 2) If I heat the mineral to make it amorphous before
} } } the observation I sometimes still see dark rings. Are
} } } they diffraction rings? (in normal mode, not
} } } diffraction mode). Is there any diffraction in
} } } amorphous material?
} } } 3) In EDX I see a peak for copper, just after the
} } } nickel peak (at 8,070 keV) and I don't expect copper
} } } in my material. Is there copper in the nickel grids?
} } }
} } } Regards,
} } }
} } } Stephane
} } }
} } } __________________________________________________
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} }
} } Hendrik O. Colijn colijn.1-at-osu.edu
} } OSU Campus Electron Optics Facility www.ceof.ohio-state.edu
} } 040 Fontana Labs, 116 W. 19th Ave
} }
} }
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Hendrik O. Colijn colijn.1-at-osu.edu
OSU Campus Electron Optics Facility www.ceof.ohio-state.edu
040 Fontana Labs, 116 W. 19th Ave


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From: keith.morris-at-ucl.ac.uk
Date: Tue, 5 Sep 2006 04:23:02 -0500
Subject: [Microscopy] Looking for some video capture recommendations

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Hi Richard,

As no-one seems to have replied to your post, I'll pass on my thoughts and
experience now I'm back from my hols.

I don't have the professional experience with video I have with microscope
and SLR camera systems (on microscopes even our 'video' is essentially
multi-tiff time-lapse photographic sequences rather than MP4, VOB etc.
However I am a regular user of Adobe Premiere for video compression and home
use, plus I now use DVD regularly to backup film and vinyl LP HIFI audio (to
MP3).

I have an elderly 'consumer' Hi8 (PAL though) and now MiniDV camcorders at
home (not a pro Hi8 granted). Despite investing in Adobe Premiere Pro,
various ATI AGP graphic AD converters (for Hi8) and USB2 streaming/firewire
for MiniDV, with transfer to a PC I always seem to get 'compression'
effects. This is a quite poor video image after capturing to the PC, editing
and writing to DVD, compared to what I get just feeding the image directly
into a TV via the camera's inbuilt AV out (when the image quality is
excellent). This poorer image quality is evident whether on the PC VDU or on
viewing on a TV via DVD players after PC writing. Granted (other than Adobe
Premiere that came via work), I have done this on the cheap compared to pro
TV recording studio systems, being my money. However the PC always seems to
convert the edited video to noticeably compressed formats, and it showed.

However if I ignore the PC and simply feed the camcorder straight into my
high quality TV Panasonic DVD recorder via analogue AV3 and record to -R
DVD's at XP (1h super quality mode), I get always get a superb picture as
good as 610 lines PAL. This is despite going though the MiniDV camcorder and
DVD recorder AD converters, and being fed out via the standard
red/black/yellow phono plugs. I know NTSC has a different 'analogue out' to
my PAL, but I'm sure it will work as well using the NTSC analogue into the
TV DVD recorder. Besides image quality on Hi8 isn't that great compared to
MiniDV (~20% better pixel quality), and it below even normal PAL resolution.

It may be that TV just shows video better than my PC CRT's but video written
via Adobe Premiere and Nero from PC digital capture always looks far far
worse than the direct to DVD recorder method (I just can't get rid of
compression effects even if ask for super duper plus quality). It's possible
that a TV DVD recorder is just really good at one thing and the PC is a bit
worse at many things. Also writing to DVD is real-time via the DVD recorder,
as you play the tape, it records the DVD. I assume you can edit the standard
DVD-R video (once finalised) on the PC if you want afterwards. Viewing the
DVD is obviously no problem on a DVD player.

Anyway give it a try if you have a spare quality TV DVD recorder (mine's a
Panasonic for £250). Just avoid DVD RAM and stick to finalised DVD-R's (or
+R's). I'm sure you could get better with expensive professional analogue to
digital converters etc, but given your source is an NTSC (Never The Same
Colour twice) old analogue Hi8 tape perhaps markedly better isn't really
possible anyway. Modern TV DVD recorders can also have a digital Firewire in
port as well s analogue if you use MiniDV. Digital 'walkman's' seem
expensive for what they offer (ie. portability).

I have read letters into PC Pro saying the same as above and the editor
hasn't offered a better alternative. Your 'time lapse' motion capture does
complicate the issue though, as cheap video editing on the PC will probably
bring in compression problems again.

I note that Hi8 video tape cassettes have a projected serviceable life-time
of 10 years before the plastic components of the tape guide start to fail,
plus the tape will be Deteriorating each year due to print-through
etc..(fast forward/rewind them occasionally), so now is the time for all of
us to archive to DVD.

Hope this helps.

Keith

----------------------------------------------------------
Dr Keith J Morris
Imaging Facilities Manager
Cell Biology Division
Institute of Ophthalmology
University College London
11-43 Bath Street
London EC1V 9EL

Tel: 020 7608 4050
Fax: 020 7608 4034
email: keith.morris-at-ucl.ac.uk

-----Original Message-----
X-from: edelmare-at-muohio.edu [mailto:edelmare-at-muohio.edu]
Sent: 22 August 2006 21:15
To: keith.morris-at-ucl.ac.uk

Looking to digitize analog NTSC video tape (Hi-8 and VHS, so composite
video, not S-video or component). Would like to stream the analog signal
right in to digital format for later image analysis (so only need the video
data no sound), and would like to work whole 60min tapes at a time. Since
we’re looking to collect measurement data from video still images the higher
the quality preserved the better. So looking for *specific* recommend
ations as to the best method for doing this (specific as in model numbers).

Computer system (Windows PC) we have for this: has 1394, USB, 16x PCIe, x4
PCIe, 64-bit PCI, and 32-Bit PCI, with a RAID Array. Adobe Premiere reports
system can sustain over 35MB/sec throughput.

Possible solutions:

1) A/D capture card, o.k., which one for running under Windows XP?
Capturing composite NTSC video seems to be “old-tech” these days. Seemingly
easy to find HDTV capture cards but not NTSC.

2) A/D capture “widgets” = Composite video in and IEEE 1394 output or USB?
Seems like a very cost effective solution, can anyone recommend a model?

3) Using either a Digital8 camcorder or something like a Sony Digital8 Video
Walkman to play the “tapes” out to 1394 and input the 1394 to the computer.
(Note: Digital8 Players will play Hi-8 tapes). Will this work?


More details:

Computer Specs: Supermicro X6DA8-G2: Dual Xeon 3.4GHz, 1
(x16) & 1 (x4) PCI-Ex, 1 x 64-bit 133MHz PCI-X, 2 x 64-bit 100MHz
PCI-X, 1 x 32-bit 33MHz PCI 800FSB, U320 Adaptec SCSI.

Video / Image Analysis: Once digitized the “video” will be broken
up into digital stills (yes, 18 hours of still images at 29 frames /
sec.). We actually only need 1 image from approximately every 4
seconds of video. Every 4 seconds the video image changes to
one of 16 “views”. We will then sort the images into the individual
16 “views”. Each of the 16 “views” shows 7 developing seedlings.
We will then analyze each of the 16 “views” (or sets of seedlings)
for growth changes through time. Oh, yes after each set of 16
“views” the tape is “paused” for 10 mins, and then repeats the 16
view capture sequence again. So basically it is time lapse
imaging, of 16 different subjects, all interleaved on one video
stream.

And why collect data this way you ask? Because the data
collection is all done automatically and remotely . . . From a
minimum of 355 miles up in orbit on the International Space
Station, on an automated growth and imaging system, which does
not have room for 16 video cameras and video capture systems.

Any suggestions would be greatly appreciated.


Richard E. Edelmann, Ph.D.
Electron Microscopy Facility Director
364 Pearson Hall
Miami University, Oxford, OH 45056
Ph: 513.529.5712 Fax: 513.529.4243
E-mail: edelmare-at-muohio.edu
http://www.emf.muohio.edu

"A main-frame: The biggest PC peripheral available."


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From: dainis-at-red5wood.com
Date: Tue, 5 Sep 2006 08:00:47 -0500
Subject: [Microscopy] viaWWW: Using RGB filters with monochrome camera

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Email: dainis-at-red5wood.com
Name: Dainis Dauksta

Title-Subject: [Filtered] Using RGB filters with monochrome camera

Question: Dear Listers

I intend using a high resolution (Basler) monochrome camera on a Leica DMLM materials microscope with epi illumination. If I take successive images using red, green & blue filters in turn (mounted in the filter magazine between lamp & cube), can I then assemble good quality colour images using something like ImageJ?
I notice that there are a few papers on the technique but I'm not clear where it's possible to use the colour filters.

Regards

Dainis

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From: thomas-moninger-at-uiowa.edu
Date: Tue, 5 Sep 2006 09:18:59 -0500
Subject: [Microscopy] FW: RE: Looking for some video capture recommendations

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Richard,

I have had good luck with a Plextor ConvertX PX-M402U. Got it a couple
years ago for around $130. Not sure if they still make it. It outputs in
several formats and resolutions including mpeg, divx etc. You can copy
to a hard drive or burn a DVD on the fly. RCA video and audio in, USB2
data out.

Regards,

Tom


------------------------------------------------------------------------
----
The Microscopy ListServer -- CoSponsor: The Microscopy Society of
America

Looking to digitize analog NTSC video tape (Hi-8 and VHS, so composite
video, not S-video or component). Would like to stream the analog
signal
right in to digital format for later image analysis (so only need the
video
data no sound), and would like to work whole 60min tapes at a time.
Since
we're looking to collect measurement data from video still images the
higher
the quality preserved the better. So looking for *specific* recommend
ations as to the best method for doing this (specific as in model
numbers).

Computer system (Windows PC) we have for this: has 1394, USB, 16x PCIe,
x4
PCIe, 64-bit PCI, and 32-Bit PCI, with a RAID Array. Adobe Premiere
reports
system can sustain over 35MB/sec throughput.

Possible solutions:

1) A/D capture card, o.k., which one for running under Windows XP?
Capturing composite NTSC video seems to be "old-tech" these days.
Seemingly
easy to find HDTV capture cards but not NTSC.

2) A/D capture "widgets" = Composite video in and IEEE 1394 output or
USB?
Seems like a very cost effective solution, can anyone recommend a model?

3) Using either a Digital8 camcorder or something like a Sony Digital8
Video
Walkman to play the "tapes" out to 1394 and input the 1394 to the
computer.
(Note: Digital8 Players will play Hi-8 tapes). Will this work?


More details:

Computer Specs: Supermicro X6DA8-G2: Dual Xeon 3.4GHz, 1
(x16) & 1 (x4) PCI-Ex, 1 x 64-bit 133MHz PCI-X, 2 x 64-bit 100MHz
PCI-X, 1 x 32-bit 33MHz PCI 800FSB, U320 Adaptec SCSI.

Video / Image Analysis: Once digitized the "video" will be broken
up into digital stills (yes, 18 hours of still images at 29 frames /
sec.). We actually only need 1 image from approximately every 4
seconds of video. Every 4 seconds the video image changes to
one of 16 "views". We will then sort the images into the individual
16 "views". Each of the 16 "views" shows 7 developing seedlings.
We will then analyze each of the 16 "views" (or sets of seedlings)
for growth changes through time. Oh, yes after each set of 16
"views" the tape is "paused" for 10 mins, and then repeats the 16
view capture sequence again. So basically it is time lapse
imaging, of 16 different subjects, all interleaved on one video
stream.

And why collect data this way you ask? Because the data
collection is all done automatically and remotely . . . From a
minimum of 355 miles up in orbit on the International Space
Station, on an automated growth and imaging system, which does
not have room for 16 video cameras and video capture systems.

Any suggestions would be greatly appreciated.


Richard E. Edelmann, Ph.D.
Electron Microscopy Facility Director
364 Pearson Hall
Miami University, Oxford, OH 45056
Ph: 513.529.5712 Fax: 513.529.4243
E-mail: edelmare-at-muohio.edu
http://www.emf.muohio.edu

"A main-frame: The biggest PC peripheral available."


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From: keith.morris-at-ucl.ac.uk
Date: Tue, 5 Sep 2006 09:47:52 -0500
Subject: [Microscopy] viaWWW: Using RGB filters with monochrome camera

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Hi Dainis,

Yes this RGB filter method works well (in the old B&W tube camera days we
used to have filter wheels to move the red, green and blue filter in
automatically during image capture). You just put the filter in a suitable
place in the light path (i.e. where there's a filter holder) or just rest
the filter on the 'light in' point below the condensor (on an inverted
system). Capture a red, green & blue B&W 8-bit transmission image and use
imageJ or photoshop (in the 'channels' window) to combine the three 8-bit
B&W images back into full 24-bit RGB colour. I'll email you a little pdf on
how to do it.

The only problem is that you need decent R,G & B filters, and these cost
£100 each from Zeiss (not far off a digital camera system). I have the Zeiss
filter numbers somewhere if you are interested. I did try a few cheap (sub
£20) glass filters from Agar Scientific but filters weren't spectrally good
enough for a quality colour picture. Kodak used to make suitable gelatin
filters :

http://www.kodak.com/US/en/motion/products/wratten/specialDye.jhtml?id=0.1.4
.30.6&lc=en.

But I have never actually tried them (probably it’s the deep blue tri-colour
type ones you want).

It also takes a while to swop filters over if you change filters manually
(hence the advantage of a filter wheel). Naturally you must not jog anything
when collecting the sequence. You can get reasonable colour images resting a
compact digital camera against the eyepiece (but its naturally not as good
as this RGB filter method with a half decent B&W camera).

Regards

Keith

----------------------------------------------------------
Dr Keith J Morris
Imaging Facilities Manager
Cell Biology Division
Institute of Ophthalmology
University College London
11-43 Bath Street
London EC1V 9EL

Tel: 020 7608 4050
Fax: 020 7608 4034
email: keith.morris-at-ucl.ac.uk


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Email: dainis-at-red5wood.com
Name: Dainis Dauksta

Title-Subject: [Filtered] Using RGB filters with monochrome camera

Question: Dear Listers

I intend using a high resolution (Basler) monochrome camera on a Leica DMLM
materials microscope with epi illumination. If I take successive images
using red, green & blue filters in turn (mounted in the filter magazine
between lamp & cube), can I then assemble good quality colour images using
something like ImageJ?
I notice that there are a few papers on the technique but I'm not clear
where it's possible to use the colour filters.

Regards

Dainis

---------------------------------------------------------------------------

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From: microscopytoday-at-tampabay.rr.com
Date: Tue, 5 Sep 2006 13:46:32 -0500
Subject: [Microscopy] Microscopy Today September 2006 Table of Contents

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Listers,

Here is the September 2006 Microscopy Today table of contents. I will
close the subscription list for this issue on Friday September 7th, 2006.

Microscopists in North America and MSA members anywhere can subscribe
for free. Anyone else may subscribe for US$50 per year (to PARTIALLY
cover postage). All subscriptions at http://www.microscopy-today.com
Thank you.

Ron Anderson, Editor
==============================
When Did Agriculture Begin?
Stephen W. Carmichael, Mayo Clinic

Microscopy and Microanalysis of Nano-Scale Materials
J. R. Michael, L. N. Brewer, D. C. Miller, K. R. Zavadil, S. V. Prasad
and P. G. Kotula, Sandia National Lab., Albuquerque, NM

Imaging Gas-Solid Interactions in an Atomic Resolution Environmental TEM
Xiao Feng Zhang* and Takeo Kamino,** *Hitachi High Technologies America,
Pleasanton, CA, **Hitachi High Technologies Corp., Ibaraki, Japan

Improved Sectioning of Polymers Using an Oscillating Diamond Knife for
Transmission Electron Microscopy
J.D. Harris* and J.S. Vastenhout,** * The Dow Chemical Company, Midland,
MI, ** Dow Benelux B.V., Terneuzen, Netherlands

Applications for Automated Particle Analysis
Robert Anderhalt and Lara Swenson, EDAX Inc., Mahwah, NJ

Electromagnetic Simulation Optimizes Design of a Sub-20 nm Resolution
Optical Microscope
Erik J. Sanchez, Portland State University, Portland, OR

JECP—a Java Electron Crystallography Project
X.Z. Li, University of Nebraska, Lincoln, NE

Preparation of the Yeast Pichia pastoris for Transmission Electron
Microscopy
Benjamin A. Yount, Joan Lin-Cereghino, Geoff P. Lin-Cereghino, and
Marcia M. Fox, U. of the Pacific, Stockton, CA

Fly Microdroplets Viewed Big: a Cryo-SEM Approach
Stanislav N. Gorb, Max Planck Institute for Metals Research, Stuttgart,
Germany

Quantification of Virus Suspensions by Direct Particle Counting
Paul R. Hazelton, University of Manitoba, Winnipeg, Canada

Olympus E330 DSLR for Photomicrography with Older Design Microscopes
Theodore M. Clarke, Metallurgical Failure Analysis Consultant

Multi-Axial Stage for a Stereo Dissecting Microscope
Zhaojie Zhang, University of Wyoming

A Simplified Method for Formulation of Epoxy Resin Embedding Media
E. Ann Ellis, Texas A&M University, College Station, TX

A Simple Cleaning Method for Penning Gauges
Valery Ray, PBS&T, MEO Engineering Co., Methuen, MA

Negative Stains/Staining 2.5 mM Phosphotungstic Acid, 25µg/mL
Bacitracin, pH 7.0
Paul R. Hazelton, University of Manitoba, Winnipeg, Canada

Agar Diffusion
Paul R. Hazelton, University of Manitoba, Winnipeg, Canada

New and Interesting at M&M-2007

Industry News

NetNotes
IMMUNOCYTOCHEMISTRY – Colloidal gold
IMMUNOCYTOCHEMISTRY - Hydrofluoric acid and LR White
SAMPLE PREPARATION - Flat embedding
SAMPLE PREPARATION - glow discharge
SAMPLE PREPARATION - microwave processing
SPECIMEN PREPARATION – high vacuum issues with carbon evaporator
TEM - Image diffraction pattern rotation
TEM - Darkfield imaging
TEM - Wehnelt assembly
TEM – Powder sample preparation
SEM - Critical point drying insects
SEM - Observation of polymers morphology
SEM - Electromagnetic fields
SEM - Critical Point Drier solvents
MICROANALYSIS - X-ray emission table

Index of Advertisers



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From: frank.karl-at-degussa.com
Date: Tue, 5 Sep 2006 14:45:41 -0500
Subject: [Microscopy] Thanks for responce on: pixels, pixels, little pixels....

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

A tip of the hat and my thanks to everyone who contacted me or contributed
to the discussion on pixels and image analysis.

Frank Karl
Degussa Corporation
Akron Technical Center
3500 Embassy Parkway
Suite 100
Akron, Ohio 44333


330-668-2235 Ext. 238


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From: jmkrupp-at-ucsc.edu
Date: Wed, 6 Sep 2006 13:11:22 -0500
Subject: [Microscopy] SEM prep from 70% EtOH

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Hi:

Just double checking on my ideas.

We have been given a small mussel lava preserved in 70% ethanol and
salt. Not sure about the salt, maybe from seawater, maybe part of a
molecular protocol these researchers are doing.

They want to see it in the SEM. At first I was thinking just run it
back to water and do a conventional fix/dehyd/CPD and coat. But then
someone asked me about OsO4 in ethanol and skipping the rehydrating
steps.

So any ideas? Just do the Os in the 70% or do something different.
Not sure what to do about the salt, maybe we can get rid of that
another way.

Jon
--


Jonathan Krupp
Microscopy & Imaging Lab
C230 Earth & Marine Science
University of California
Santa Cruz, CA 95064
(831) 459-2477
jmkrupp-at-ucsc.edu

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From: antropos-at-misis.ru
Date: Wed, 6 Sep 2006 18:09:32 -0500
Subject: [Microscopy] viaWWW: high temperature microscope

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Email: antropos-at-misis.ru
Name: Ilya Kushneryov

Organization: Moscow Institute of Steel and Alloys

Title-Subject: [Filtered] Where can buy a high temperature microscope?

Question: Hello!
Please give me an advice corresponding with Subject!
Our Institute need to improve a labor base in part of high temperature electronic microscopy. It is important for us varios high temperature processes to investigate: cristallisation of steel, alloys, non-ferrous metalls, formation of non-metallic inclusions, segregation and others.
Where can we find some technical information? We need a list of firms or producer, which can us a such microscope to sell.

Thanks in advance,
Ilya Kushneryov
Moscow Institute of Steel and Alloys
Chair of steel metallurgy

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From: palladineus-at-yahoo.com
Date: Thu, 7 Sep 2006 20:41:46 -0500
Subject: [Microscopy] Fontana-Masson Staining

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Hi Ilya,

I have a Oxford made cold/hot stage installed in LEO SEM. It is working
really good from +100C to -100C. I guess you only need a hot stage that
could reach much higher temperature. Gatan has taken over the cold/hot
stage business from OXford and the temperature could reach +1250¡ãC. The
website is below:
http://www.gatan.com/sem/heating_stages.html

Wish this helps.
Xiang



----- Original Message -----
X-from: {antropos-at-misis.ru}
To: {xyang-at-SMU.CA}
Sent: Wednesday, September 06, 2006 8:13 PM

Dear All,

I hope someone can help me out here. I read that
alcohol will dissolve the argentaffin granules. How
does the chemistry work here? Is it only because of
beta-carboline formation or are there other reactions
taking place as well? Is the disappearance of
argentaffin granules under alcohol fixation
confirmatory of its presence if compared to a parallel
formaldehyde staining showing its presence?


Also, if I use alcohol fixation, the cells tend to
shrink and shrivel. Is there any way I can preserve
the morphology with alcohol fixation (ie any other
components I can add to alcohol)?


Thanks in advance.

Randy

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From: FChu-at-mrl.ubc.ca
Date: Fri, 8 Sep 2006 19:23:36 -0500
Subject: [Microscopy] Position: Imaging Specialist - UBC iCAPTURE Centre, Vancouver,

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Dear Colleagues,

We are hiring an Imaging Specialist to work especially on two confocal
microscopes, the new one-of-a-kind multiphoton/confocal microscope,
calcium imaging and electrophysiological instrumentation. The James C
Hogg iCAPTURE Centre of the University of British Columbia is located
downtown of Vancouver, in the beautiful province of British Columbia in
Canada. Please see the job posting below for more details.

Job Title: Core 3 Imaging Technical Specialist
Division: The iCAPTURE Centre, UBC
Salary: $48,425 - 51,944

Job summary
The primary purpose of this position is to coordinate the iCAPTURE
Centre Imaging CORE. This includes supporting all of the iCAPTURE
investigators, staff, and trainees in their imaging and biophysical
needs using a wide variety of instruments, as well as any external users
of the Core. This support includes research and development of new
methods, experimental design, sample preparation, instrument
optimization for acquisition and analysis, data interpretation, and
training of all personnel.

Work performed
* Proficient use of all imaging and biophysical instrumentation
located in this specialized laboratory. This instrumentation includes
two confocal microscopes, the new one-of-a-kind multiphoton/confocal
microscope, calcium imaging and electrophysiological instrumentation,
all vessel function equipment including myogenic tone instrumentation or
other technology as it becomes available and installed in the Core.
* Responsible for day-to-day operation of the facility including
scheduling, data acquisition, and analysis, data management, instrument
maintenance and troubleshooting and providing general support for
scientists using the facility.
* Train and supervise all other users.
* Provide consultation and direct involvement in diverse research
projects including data interpretation, trouble shooting for sample
preparation, and experimental design.
* Remain current on instrumentation, data acquisition and analysis
as well as imaging and vessel function techniques and transfer new
technology to the Centre. This is done by attending regional user group
meetings, workshops, symposia and networking within the flow community.
* Experience with and knowledge of many techniques for sample
preparation including multi-color imaging, stem cell enumeration, rare
event analysis and functional studies of cells, vessels, or organs.
* Create new protocols or programs to recognize any particular
cell type in an image in consultation with the researcher
* Assist or responsible for running large studies which may
include organization with other hospital departments as well as
recruiting subjects and troubleshooting problems with sample collection.

* Updates on the progress of the study are presented regularly at
research group meetings.
* Participation in the preparation of manuscripts, grants, and
material presented at International Conferences.

Qualifications
University Degree (BSc preferred) in Science
Minimum 5 years related experience in a laboratory setting
Experience with independently conducting specialized experiments
related to imaging, particularly with confocal microscopy
Computer experience required
Accuracy and attention to detail required
Effective oral and written communication, interpersonal, multi-tasking
and organizational skills
Sense of humor a must

Please send your resume to:
Kelly Ceron, Human Resources Manager
kceron-at-mrl.ubc.ca
Only those applicants short listed will be contacted
Deadline for application - Sept 15, 2006






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From: llmccorm-at-yahoo.com
Date: Sat, 9 Sep 2006 08:11:57 -0500
Subject: [Microscopy] viaWWW: Digital imaging and analysis

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Email: llmccorm-at-yahoo.com
Name: Lindsey

Organization: Henry Ford Hospital

Title-Subject: [Filtered] Digital imaging and analysis

Question: We are working with the Nikon DXM 1200C scope and camera and I saved images in the "fine" setting but we need to do our analysis in the "quick" mode, is there any way to convert between the settings without losing resolution and iamge size? Any suggestions or adivce would be greatly appreciated.

Thanks
Lindsey

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From: mganger-at-optonline.net
Date: Sun, 10 Sep 2006 19:05:57 -0500
Subject: [Microscopy] Old EM Images

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Greetings Everyone,

I've tried looking online, but I need to get pictures of the following scopes for a presentation and have had little success:

Hitachi 11DS
RCA EMU 2-C
RCA EMU 3-F
RCA EMU 3-F
Phillips 100B

If you have a photograph of any of these, I would be most grateful. Photos of the microscopes alone would be fantastic and preferable, but any photograph would be great.

Thanks so much for your help,

Mike Ganger
Weill Cornell Medical College
New York NY



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From: mzeldin-at-richmond.edu
Date: Mon, 11 Sep 2006 17:31:29 -0500
Subject: [Microscopy] AskAMicroscopist: starter microscope for a grammar school

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Below is the result of your feedback form (NJZFM-ultra-55). It was submitted by (mzeldin-at-richmond.edu) from http://www.microscopy.com/Ask-A-Microscopist/Ask-A-Microscopist.html on Monday, September 11, 2006 at 14:43:05
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Email: mzeldin-at-richmond.edu
Name: marty zeldin

Education: K-8 Grade Grammar School

Location: richmond, VA

Question: I'm interested in buying a "started" microscope for a grammar school grandchild. I'd like to keep the cost below $100. Is that possible? If yes, what are your recommendations -- make, model, supplier?

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From: nizets2-at-yahoo.com
Date: Tue, 12 Sep 2006 04:19:55 -0500
Subject: [Microscopy] real magnification

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Dear listers,

I have a question about magnification and manipulation
of pictures in digital format.
I am a little bit confused because until now I used
photo films, and when they were printed on paper I
knew the magnification, which makes the calculation of
the "real" magnification of printed pictures taken in
TEM easy to know. But now I am using the Megaview III
with Analysis and when I save the picture in picture
format (to insert in Word reports) I don't know the
real magnification.
All pictures are 23.3 cm by 17.48 cm. So if I print
without rescaling, there is a factor of approx. 2,5x
magnification compared to the mag. given by the
microscope (a picture taken at 55 000x, when printed
on paper, will result in a magnification 130 000x).

Please help me on this issue. Is there a way to easily
calculate the real magnification when printing digital
images on paper (other than measuring)?

Stephane


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From: keith.morris-at-ucl.ac.uk
Date: Tue, 12 Sep 2006 04:22:40 -0500
Subject: [Microscopy] AskAMicroscopist: starter microscope for a grammar

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Hi Marty,

We get asked this fairly regularly by schools and parents (so we have stock
replies). Often professional microscopists aren't the best source of
information for cheap microscope's as all our optical systems are always
over £10,000, and most lab mainstays like our three confocal microscopes
come in at nearer £200,000 each (and users still complain about image
quality). I assume you are asking about home use with your own
kids/grandkids. I would first check out the fun Digital Blue QX-5 I
mentioned below - but you need a Windows computer to run it and it's not got
fantastic resolution. Generally kids do get very bored with microscopes very
quickly when they run out of things to view and soon get fed up with the
poor quality of the images (rather unlike their Playstation PS2s, GameCubes
& Nintendo DS Lites).

Cheap microscopes under £100 are always a disappointment and toy (often
called student) microscopes can be very poor. You can easily buy second-hand
via ebay, but again there are risks that the optics will be damaged or
simply very dirty and difficult to clean and you may make an expensive
mistake. Look for old branded 'laboratory' microscopes e.g. Bausch & Lomb,
Prior, Leitz, Reichert, Baker, but probably not Tasco toys. Famous existing
brands like Zeiss and Olympus attract a high premium. The sellers are often
not microscopists though, and many are sold as collector's items and not for
'scientific' use. Also try any local microscope enthusiast clubs - they
aren't as common as the many excellent astronomy [telescope] clubs but they
are about and have knowledgeable enthusiasts with an eye for low cost
quality systems.

There are suppliers geared up to providing cheaper microscopes for schools,
so you can ask around at school's science departments, but expect to pay
nearer £500 each for a quality setup (although with those like bottom end
Meade [www.meade.com] at around £100 you can see something at low mag (~20x
objective i.e. around 180x mag) with a quality stained section.

For pond life etc. a stereoscopic 'dissecting' microscope (40x to 120x mag)
is ideal, and of course you can get a really long way with a good large
magnifying glass (not the really small hi-mag cheap folding lens ones, try
before you buy) - I have a few excellent ones at home for £1 and a good low
mag Osram one that includes an illuminating halogen bulb at £8. In general I
would say a good stereo dissecting microscope is a good choice (if not the
best) for kids as it's great for viewing living things and enlarges what you
can see already - look for 40x rather than 4x though. They are a bit
expensive though so you would probably have to buy secondhand (look out for
branded ones like Bausch & Lomb, and Prior).

Generally prepared slides can rapidly get very boring for under 14s, but
living or unusual things (even hamster fur) always attract an audience. Also
try your flatbed film scanner, (not the LiDe types that have a very limited
depth of focus, and any from around £60 upwards) that will be good for
looking at soft static things: leaves, fruit, nuts, household objects (scan
at max resolution and try reflected and 'film' mode). In the UK there are
sites like
http://www.wedgwood-group.com/microscopes_digital.htm that cater for schools
and colleges, providing standard compound and stereo microscopes as well as
cheap PC video based microscope solutions where the whole class can look at
a computer screen with some pushing and shoving. Best to try them on
'approval' as many cheap microscopes can be disappointing if you expect too
much.

Excellent pre-prepared stained slides of plant stems and leaves or bits of
rats, insects etc.. can be bought via ebay, but they tend to be expensive
and are easily broken by any age-group. Mounted slides keep well though, so
'vintage' ones even from 50 years ago can still look OK - most schools will
have some specimen slides knocking about.

At home and our Primary school (under 11) we use the Digital Blue QX-5 (£70)
- it's fun but pretty useless for serious microscope work as it's so low res
(but at 640 x 480 better than the old Intel QX-3 it replaced). It puts the
image on a PC screen. I have one at home for my kids (boy 10 and girl 12)
but it only gets occasional use now the novelty has worn off. See
http://micro.magnet.fsu.edu/optics/intelplay/index.html (not updated for the
QX-5 but all applies - the site even discusses ways of contrast enhancement
etc..). Once on the PC the 640x480 images can be manipulated and pasted etc,
and the QX-5 does time-lapse for things like crystal growth. Living plants
growing and small animals. The similar but far better built Olympus MIC-D
was great but being over £500 it was just too expensive for most schools and
is now discontinued - there are other similar budget systems about though.

The macro on a good digital camera (like the image stabilised 5MP Canon S2IS
going cheap at £200 over here - http://www.dpreview.com/reviews/canons2is)
is also worth a try, particularly with a small tripod and halogen bendy desk
lamp if very close-up, but I'm not sure I'd like a class with 20 boys near
my Olympus E500 digital SLR system though. You can get quite reasonable
pictures by resting a small compact digital camera lens against the eyepiece
of a microscope. Plus you can the camera for normal photography when you get
bored with microscopy.

By the way, if you get a microscope, do try growing crystals on a slide, a
few drops of a saturated solution of salt (NaCl) or copper sulphate will
grow superb crystals on the surface of a slide when viewed under a
microscope (but it takes a few hours for the crystals to form and they often
look best before the liquids all gone). Just make sure they don't drive the
objective tips into the solution.
It's not biology but its fun.

Regards


Keith

Try looking in Amazon.com for decent microscope books with lots of pictures
(and they have a good customer review system for books and even microscopes
- I have a detailed review on the Digital Blue QX-5 at www.amazon.co.uk).
Plus try web searches for general sites like these (and for more specific
topics) :

http://www.101science.com/Microscope.htm
http://micro.magnet.fsu.edu/
http://www.microscopy-uk.org.uk/index.html
http://www.btinternet.com/~stephen.durr/
http://www.mccroneatlas.com
http://www.diatoms.co.uk [for fun images made of diatoms]

----------------------------------------------------------
Dr Keith J Morris
Imaging Facilities Manager
Cell Biology Division
Institute of Ophthalmology
University College London
11-43 Bath Street
London EC1V 9EL

Tel: 020 7608 4050
Fax: 020 7608 4034
email: keith.morris-at-ucl.ac.uk


-----Original Message-----
X-from: mzeldin-at-richmond.edu [mailto:mzeldin-at-richmond.edu]
Sent: 11 September 2006 23:38
To: keith.morris-at-ucl.ac.uk

Below is the result of your feedback form (NJZFM-ultra-55). It was
submitted by (mzeldin-at-richmond.edu) from
http://www.microscopy.com/Ask-A-Microscopist/Ask-A-Microscopist.html on
Monday, September 11, 2006 at 14:43:05
---------------------------------------------------------------------------

Email: mzeldin-at-richmond.edu
Name: marty zeldin

Education: K-8 Grade Grammar School

Location: richmond, VA

Question: I'm interested in buying a "started" microscope for a grammar
school grandchild. I'd like to keep the cost below $100. Is that possible?
If yes, what are your recommendations -- make, model, supplier?

---------------------------------------------------------------------------

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From: michael-at-shaffer.net
Date: Tue, 12 Sep 2006 04:47:36 -0500
Subject: [Microscopy] RE: real magnification

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


The magnification should be relative to the original microscope's print (or
negative) size, if and only if the Megaview captures 100% of the original
field of view. If so, the EM's magnification will be correct if you print
at the original print size (e.g., 4x5). Any other print size will scale the
magnification linearally (i.e., not by area). The math is simple, but
entirely dependent on what field size the Megaview captures (again use a
scale that is linear, e.g., the horizontal field percentage). Another
method would be to image a magnification standard, but I am not a TEM'er and
cannot suggest one.

Once you have the mag figured out calculate a relationship that will provide
the size (pixels) of a variety of microbars for your microscope's choice of
magnifications, e.g., a spreadsheet.

HTH, Michael Shaffer :o)

SEM/MLA Research Coordinator
http://www.mun.ca/creait/maf/
Inco Innovation Centre
c/o Memorial University
St. John's, NL A1C 5S7


} -----Original Message-----
} From: nizets2-at-yahoo.com [mailto:nizets2-at-yahoo.com]
} Sent: September 12, 2006 6:52 AM
} To: michael-at-shaffer.net
} Subject: [Microscopy] real magnification
}
}
}
}
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}
} Dear listers,
}
} I have a question about magnification and manipulation of
} pictures in digital format.
} I am a little bit confused because until now I used photo
} films, and when they were printed on paper I knew the
} magnification, which makes the calculation of the "real"
} magnification of printed pictures taken in TEM easy to know.
} But now I am using the Megaview III with Analysis and when I
} save the picture in picture format (to insert in Word
} reports) I don't know the real magnification.
} All pictures are 23.3 cm by 17.48 cm. So if I print without
} rescaling, there is a factor of approx. 2,5x magnification
} compared to the mag. given by the microscope (a picture taken
} at 55 000x, when printed on paper, will result in a
} magnification 130 000x).
}
} Please help me on this issue. Is there a way to easily
} calculate the real magnification when printing digital images
} on paper (other than measuring)?
}
} Stephane
}
}
} __________________________________________________
} Do You Yahoo!?
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From: StevenLe-at-BaylorHealth.edu
Date: Tue, 12 Sep 2006 06:46:07 -0500
Subject: [Microscopy] real magnification

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Stephane,

The easiest solution to this, if it would work for you, is to use the
report function in Analysis. Any images printed can have the
magnification displayed and calculated automatically. Another option,
since you print your images at the same size each time, would be to
print an image from all of your common mags from Analysis and use it as
a reference when importing them into Word.

Hope this helps,
Steve

Steven Lee
Chief Technologist
Electron Microscopy Laboratory
Baylor University Medical Center
3500 Gaston Ave
Dallas, TX 75246
Ph: 214.820.3302
Fx: 214.820.4110
Em: stevenle-at-baylorhealth.edu

-----Original Message-----
X-from: nizets2-at-yahoo.com [mailto:nizets2-at-yahoo.com]
Sent: Tuesday, September 12, 2006 4:31 AM
To: Lee, Steven

Dear listers,

I have a question about magnification and manipulation
of pictures in digital format.
I am a little bit confused because until now I used
photo films, and when they were printed on paper I
knew the magnification, which makes the calculation of
the "real" magnification of printed pictures taken in
TEM easy to know. But now I am using the Megaview III
with Analysis and when I save the picture in picture
format (to insert in Word reports) I don't know the
real magnification.
All pictures are 23.3 cm by 17.48 cm. So if I print
without rescaling, there is a factor of approx. 2,5x
magnification compared to the mag. given by the
microscope (a picture taken at 55 000x, when printed
on paper, will result in a magnification 130 000x).

Please help me on this issue. Is there a way to easily
calculate the real magnification when printing digital
images on paper (other than measuring)?

Stephane


__________________________________________________
Do You Yahoo!?
Tired of spam? Yahoo! Mail has the best spam protection around
http://mail.yahoo.com

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From: jchalcro-at-neuro.mpg.de
Date: Tue, 12 Sep 2006 07:59:52 -0500
Subject: [Microscopy] real magnification

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Stephane

would it not be simpler in the long run to incorporate a scale bar in
all of your originally scanned or captured images? Then when they are
manipulated the scale bar will still be accurate. It's also useful for
publications and general measurement of detail.

Our TEM has a fixed number of magnification steps and it's a
relatively trivial task to keep stock images of the scale bars in a
folder on the computer then superimpose them. I scan images from
negatives at fixed resolutions and have made up scale bars for the
most common scan settings. If the scale bar is 10um, 1um, 01.um then
measure it in mms and multiply by 100, 1000, 10000 respectively to
give you your magnification.

Malcolm

Malcolm Haswell
School of Health, Natural and Social Sciences
Fleming Building
University of Sunderland
Tyne & Wear
SR1 3SD
UK
e-mail: malcolm.haswell-at-sunderland.ac.uk


----- Original Message -----
X-from: nizets2-at-yahoo.com

Dear Stephane,

I think that if the accuracy of your digital micrograph magnification is
important, there is no substitute for recording images of a standard
certified stage micrometer (usually oriented along the major image
dimension) under exactly the same optical settings (e.g. zoom!) as your
specimens. From these calibration images you can easily calculate the
length of each pixel, or the number of pixels per measurement unit (e.g.
pixels per micrometer).
I once wrote a small program using these data to create a small "micron
bar" as a TIFF file for insertion (pasting) into the appropriate digital
images. This has the advantage over some commercial systems in that the
bar can be placed wherever you like, so as not to obscure any important
specimen details.
Best wishes,

Jim



-----Original Message-----
X-from: nizets2-at-yahoo.com [mailto:nizets2-at-yahoo.com]
Sent: 12 September 2006 11:30
To: James Chalcroft

Dear listers,

I have a question about magnification and manipulation of pictures in
digital format.
I am a little bit confused because until now I used photo films, and
when they were printed on paper I knew the magnification, which makes
the calculation of the "real" magnification of printed pictures taken in
TEM easy to know. But now I am using the Megaview III with Analysis and
when I save the picture in picture format (to insert in Word reports) I
don't know the real magnification.
All pictures are 23.3 cm by 17.48 cm. So if I print without rescaling,
there is a factor of approx. 2,5x magnification compared to the mag.
given by the microscope (a picture taken at 55 000x, when printed on
paper, will result in a magnification 130 000x).

Please help me on this issue. Is there a way to easily calculate the
real magnification when printing digital images on paper (other than
measuring)?

Stephane


__________________________________________________
Do You Yahoo!?
Tired of spam? Yahoo! Mail has the best spam protection around
http://mail.yahoo.com

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From: zaluzec-at-microscopy.com
Date: Tue, 12 Sep 2006 08:08:12 -0500
Subject: [Microscopy] Re: real magnification - Use scale bars!

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Stephane

The correct approach is to use a scale bar on each image, in
this way there is no abiguity of the dimensions of a micrograph
regardless of how it is printed. Using magnification will just
lead to errors when documents are printed or copied.
Think of your report just like a paper in a Journal. It has
to survive any number of reproduction processes from
simple printing, to photocopying, scanning and/or faxing. You have
no control over the size of the image once it has left
your computer, so an absolute scale bar should be embedded
permananetly in your image.

Just as you don't trust the nominal magnification of your
microscope & film negative , you will need to calibrate the magnification of
your microscope & digital negative.

Calibrating the magnification of your digital image would
be done the same way you do a negative. Put in a calibrated
object, record the "digital" image at a preset pixel resolution at
each magnification setting and then calculate the true scale/magnification.
The units simply become the scaling dimension (cm, mm, um, nm, pm)/pixel
based upon your instruments indicated magnification setting.

Once you have this done you can put any "scale" bar you want on
an image since you have a calibration in units/pixel at each
magnification. Remember if your camera allows several different
resolutions (1K x1K vs 4Kx4K) you will have to compensate for
this in your calibration/pixel.

Some digital image capture systems have an option to interface
to the microscope and read an apparent magnfication and
from this it can calculate and embedd a scale marker
on each image. Beware that you should check such calibrations
here too, don't blindly trust marker which the imaging system
places on your image, it should be close, but there may be errors.



Nestor
Your Friendly Neighborhood SysOp

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From: jacques.faerber-at-ipcms.u-strasbg.fr
Date: Tue, 12 Sep 2006 09:09:59 -0500
Subject: [Microscopy] Re: real magnification

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

In addition to Nestor's advice, one can add a second help to the
indispensable scale bar, in the form of a text file, which has the same
name than the image, and which encloses all the parameters about the
sample, the microscope, the acquisition conditions, and among these, the
original magnification, in form of the original microscope magnification
(x?0000, calibrated or uncalibrated, film or CCD size, etc), and of the
pixel size from the original numerical image (?nm/pixel). The first
indicates the conditions in which the image was taken, the second helps
for all image processings. Of coarse, it must be corrected if one
perform a rescale of the image !

J. Faerber
IPCMS-GSI
(Institut de Physique et Chimie des Matériaux de Strasbourg
Groupe Surface et Interfaces)
23, rue de Loess ; BP43
67034 Strasbourg CEDEX 2
France

Tel 00 33(0)3 88 10 71 01
Fax 00 33(0)3 88 10 72 48
E-mail Jacques.Faerber-at-ipcms.u-strasbg.fr



nizets2-at-yahoo.com a écrit :
} ----------------------------------------------------------------------------
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} ----------------------------------------------------------------------------
}
} Dear listers,
}
} I have a question about magnification and manipulation
} of pictures in digital format.
} I am a little bit confused because until now I used
} photo films, and when they were printed on paper I
} knew the magnification, which makes the calculation of
} the "real" magnification of printed pictures taken in
} TEM easy to know. But now I am using the Megaview III
} with Analysis and when I save the picture in picture
} format (to insert in Word reports) I don't know the
} real magnification.
} All pictures are 23.3 cm by 17.48 cm. So if I print
} without rescaling, there is a factor of approx. 2,5x
} magnification compared to the mag. given by the
} microscope (a picture taken at 55 000x, when printed
} on paper, will result in a magnification 130 000x).
}
} Please help me on this issue. Is there a way to easily
} calculate the real magnification when printing digital
} images on paper (other than measuring)?
}
} Stephane
}
}
} __________________________________________________
} Do You Yahoo!?
} Tired of spam? Yahoo! Mail has the best spam protection around
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From: Mike.Bode-at-olympus-sis.com
Date: Tue, 12 Sep 2006 10:13:31 -0500
Subject: [Microscopy] real magnification

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Since the original poster mentioned that he is using our camera and
therefore also our software, let me weigh in on the issue.

Everyone who has answered to the original posting is correct. The
magnification is in fact dependent on what size the images have that you
look at (be it on print or on the viewing screen, and also if you are
looking at the whole image, or perhaps only a part of it. In the old
days of film, this was typically taken care of by printing the entire
negative at a fixed image size. It was then just a single conversion
factor that had to be taken into account to measure something.

In the digital age, nobody wants to be limited that way anymore. Users
want to zoom in on certain areas, they may want a small image or a large
print, and it is very easy to do. Calibration then becomes an issue that
one has to deal with.

In our software we implemented it the following way:

1) You go through a calibration routine to calibrate a number of
magnification settings of the microscope. This is easily done. You put a
calibration sample into the scope, take a picture at a given
configuration of the camera (full sensor, partial sensor, etc.), and
then point out on the screen what the calibration measurement is. From
that the software can calculate the pixel calibration (for example 10
nm/pixel) and from then on the software can accurately keep track of the
calibration. You can do that for several magnification settings and the
software will inter/extrapolate for other magnification settings. We
have thus created a fixed link between magnification and calibration.
Note: this does not require the magnification of the microscope to be
calibrated, only to be reproducible.

2) Once you have an image acquired, you can enter the magnification
(either manually or automatically) and the software automatically
calibrates the image.

3) You can now display calibration bars on the image or print, and for a
print you can also print the magnification. As one of the posters
mentioned, you do that with "report" function. A magnification on the
screen is not useful, as the computer does not really know what size
monitor you are using, and the magnification depends on that. Also, you
can use the software directly to make measurements, and don't need to
resort to conversion factors and such.

4) We think that it is best to display a scale bar on the image, as that
changes with the image when you manipulate the image. For example, if
you print an image from the software, both scale bar and magnification
will be correct. If you then somehow copy the image and make it, say,
smaller, the magnification will be wrong, but the scale bar is still
correct.

5) If you want to get information about the acquisition parameters, open
the image in our software and press "Alt-Enter". Click on "channel" and
it will show you what magnification the images was acquired at, what the
exposure time was, etc. This information is stored in the TIF header and
thus stays with the image. Unfortunately there are no public TIF tags
that can be used for this, so it will only be visible in our software,
unless another software writes an import filter for that.

Stephane, look at the scale bar options and the report functionality to
set up the software the way you need it. If you have trouble, please
call our support. They can help you.


Michael Bode, Ph.D.

General Manager

OLYMPUS SOFT IMAGING SOLUTIONS
12596 West Bayaud Ave #300
Lakewood, CO 80228
USA
Tel.: +1 (303) 234-9270
Fax.: +1 (303) 234-9271
E-mail: Mike.Bode-at-olympus-sis.com
www.olympus-sis.com

-----Original Message-----
X-from: nizets2-at-yahoo.com [mailto:nizets2-at-yahoo.com]
Sent: Tuesday, September 12, 2006 03:30
To: Mike Bode

Dear listers,

I have a question about magnification and manipulation of pictures in
digital format.
I am a little bit confused because until now I used photo films, and
when they were printed on paper I knew the magnification, which makes
the calculation of the "real" magnification of printed pictures taken in
TEM easy to know. But now I am using the Megaview III with Analysis and
when I save the picture in picture format (to insert in Word reports) I
don't know the real magnification.
All pictures are 23.3 cm by 17.48 cm. So if I print without rescaling,
there is a factor of approx. 2,5x magnification compared to the mag.
given by the microscope (a picture taken at 55 000x, when printed on
paper, will result in a magnification 130 000x).

Please help me on this issue. Is there a way to easily calculate the
real magnification when printing digital images on paper (other than
measuring)?

Stephane


__________________________________________________
Do You Yahoo!?
Tired of spam? Yahoo! Mail has the best spam protection around
http://mail.yahoo.com

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From: jrminter-at-rochester.rr.com
Date: Tue, 12 Sep 2006 10:42:17 -0500
Subject: [Microscopy] real magnification

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

I agree with J. Faerber. It is important to save all the parameters
in a readily accessible file. I suggest that this file should be
both easily readible in any text editor and reasonably easily parsed
on any computer platform. The 'non-standard' TIF headers in analySIS
(mentioned by Mike Bode) and the tag groups in DigitalMicrograph
are only really useful in those programs. The two formats that come
to mind are the .ini format and XML. Because of the easy readability
of '.ini' files and built in or freely available parsers for every
platform / software package I use, I write my parameters to an '.ini'
file with the same name as the image. I use this to process images
in DigitalMicrograh, analySIS, SPIDER, EMAN, and EMAN2.

John Minter

J. Faerber wrote (exerpted):

} In addition to Nestor's advice, one can add a second help to the
} indispensable scale bar, in the form of a text file, which has the same
} name than the image, and which encloses all the parameters about the
} sample, the microscope,


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From: cammer-at-aecom.yu.edu
Date: Tue, 12 Sep 2006 12:42:30 -0500
Subject: [Microscopy] AskAMicroscopist: starter microscope for

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

The easiest thing is a scale bar instead of magnification, as if you use a
map. No magnification there, and no problem. Scale bar is part of the
image. It always provides correct reference, regardless of print or display
size.

Vitaly Feingold
SIA
2773 Heath Line
Duluth GA 30096
Ph. 770-232-7785
Fax 770-232-1791
www.sia-cam.com
----- Original Message -----
X-from: {michael-at-shaffer.net}
To: {vitalylazar-at-att.net}
Sent: Tuesday, September 12, 2006 5:48 AM

I found that taping a magnifying lens to the front of a digital camera
(Sony DSC-P32) and setting the focus fixed (if there is the option) yields
good pics. Not quite micro, but certainly as good as many dissecting
scopes. Some example images may be found at
http://flickr.com/photos/mcammer/tags/macro/
Pictures of things like mold and bugs mostly.


} The macro on a good digital camera (like the image stabilised 5MP Canon S2IS
} going cheap at £200 over here - http://www.dpreview.com/reviews/canons2is)
} is also worth a try, particularly with a small tripod and halogen bendy desk
} lamp if very close-up, but I'm not sure I'd like a class with 20 boys near
} my Olympus E500 digital SLR system though. You can get quite reasonable
} pictures by resting a small compact digital camera lens against the eyepiece
} of a microscope. Plus you can the camera for normal photography when you get
} bored with microscopy.

____________________________________________________________________________
Michael Cammer Analytical Imaging Facility Albert Einstein Coll. of Med.
URL: http://www.aecom.yu.edu/aif/



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From: larry-at-cymru.freewire.co.uk
Date: Tue, 12 Sep 2006 14:30:55 -0500
Subject: [Microscopy] Real Magnification

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

I would suggest that in the age of digital imaging, 'magnification'
is a useless concept. An image has only to be displayed on, for
example, a 21" screen instead of a 19" screen and the magnification
changes.

As Nestor says, a scale bar is much more useful, since it is always
correct (provided it has been calibrated) however the image is
displayed. From my time as Technical Editor at Microscopy & Analysis,
I remember the continual frustration with many contributors sending
in images without scale bars and refering to the 'magnification' in
the figure caption. Considering not only the processing the image
might have gone through before it reached me and since the author
didn't know what size the image would be printed at, any reference to
'magnification' was meaningless.

It is interesting to consider scanning probe microscopes. Since they
only ever generated digital images, from the very begining, almost
nobody involved in SPM uses the term 'magnification'. Images are
generally described in terms of the 'field of view' and, as far as
I'm aware, all commercial SPM diplay images with either scale bars or
'field of view' data.
--
Larry Stoter
JEOL (UK) Ltd
tel: +44-(0)1707-377117, fax: +44-(0)1707-373254, e-mail: larrys-at-jeoleuro.com

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From: garsha-at-itg.uiuc.edu
Date: Tue, 12 Sep 2006 17:19:39 -0500
Subject: [Microscopy] commercial posting: **Position Announcement**

Contents Retrieved from Microscopy Listserver Archives
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Greetings,

The Photometrics Applications Group is seeking creative and experienced
candidates for the position of Applications Scientist. Among a variety
of activities, the Applications Group provides bio-imaging applications
oriented support internally and externally, helps to guide product
development, produces and refines technical literature, tracks and
communicates technology trends and new product opportunities in
bio-imaging and opens/maintains lines of communication with the academic
sector.

The successful candidate will serve as an essential part of a
close-knit, dynamic team of biological imaging experts for cameras,
systems, and related products that Photometrics and sister companies
supply to the life science community. Duties include identification and
monitoring of technology and applications trends, identification of
customer requirements and opportunities for new product development.
Interface with sales and other marketing personnel to provide on-going
product sales training and customer support and understand customer
needs and product acceptance. Act as an industry spokesperson for
customers, press, and analysts. Identify, establish and manage strategic
partnerships, including relationships with customers, suppliers and
industry opinion leaders. Candidates should be capable of global travel
up to 25% of the time.

Qualifications include skills and knowledge consistent with that usually
obtained through an advanced degree, advanced technical knowledge of
biological imaging hardware and/or software, experience with
bio-chemical and bio-physical methods with a particular emphasis on
imaging technologies, and excellent written and verbal communications
skills. An in-depth knowledge and understanding of advanced image
processing algorithms such as those used in spectral un-mixing, 3-D
spatial deconvolution, fluorescence lifetime analysis, fluorescence
correlation spectroscopy, FRAP, optical tomography etc. is a plus.
Practical knowledge in one or more areas of classical microscopy and/or
laser scanning optics, electrical engineering, live cell imaging,
whole-animal imaging and/or high-throughput imaging or high-content
screening are also a plus.

Interested persons are encouraged to send thier CV/resume and cover
letter to:

Karl Garsha
Head Applications Scientist
Photometrics
3440 E. Brittania Drive
Tucson, AZ 85706
kgarsha-at-roperscientific.com

I’m happy to answer informal questions related to the position as well.
Please feel free to contact me offlist.

Best,
Karl

--
Karl Garsha
Applications Scientist
Roper Scientific
3440 E. Brittania Drive
Tucson, AZ 85706
Office: 520-547-2704


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From: tivol-at-caltech.edu
Date: Tue, 12 Sep 2006 19:07:13 -0500
Subject: [Microscopy] Re: real magnification

Contents Retrieved from Microscopy Listserver Archives
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On Sep 12, 2006, at 2:20 AM, nizets2-at-yahoo.com wrote:

} Please help me on this issue. Is there a way to easily
} calculate the real magnification when printing digital
} images on paper (other than measuring)?
}
Dear Stephane,
I agree with those who suggest using a scale bar--in fact that is
required for publication in some journals. To calculate the proper
size of the scale bar in pixels, you need to take images of a standard
at each mag, and the Mag*I*Cal is the best standard I've used. I have
no connection with this standard except as a satisfied user.
Yours,
Bill Tivol, PhD
EM Scientist and Manager
Cryo-Electron Microscopy Facility
Broad Center, Mail Code 114-96
California Institute of Technology
Pasadena CA 91125
(626) 395-8833
tivol-at-caltech.edu


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From: batchelder-at-wi.mit.edu
Date: Tue, 12 Sep 2006 21:29:37 -0500
Subject: [Microscopy] AskAMicroscopist: immunolabeling & dehydrating of a tissue

Contents Retrieved from Microscopy Listserver Archives
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Below is the result of your feedback form (NJZFM-ultra-55). It was submitted by (batchelder-at-wi.mit.edu) from http://www.microscopy.com/Ask-A-Microscopist/Ask-A-Microscopist.html on Tuesday, September 12, 2006 at 12:48:19
---------------------------------------------------------------------------

Email: batchelder-at-wi.mit.edu
Name: Erika Batchelder

Organization: Keck Microscope Facility, Whitehead Institute

Education: Graduate College

Location: Cambridge, MA, USA

Question: What effect on immunolabeling will dehydrating of a tissue have? Is it possible to immunolabel a tissue then dehydrate it for embedding in paraffin?

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From: patrick.fairley-at-csauh.com
Date: Tue, 12 Sep 2006 21:30:16 -0500
Subject: [Microscopy] AskAMicroscopist: B&L KHS teaching binocular microscope

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Below is the result of your feedback form (NJZFM-ultra-55). It was submitted by (patrick.fairley-at-csauh.com) from http://www.microscopy.com/Ask-A-Microscopist/Ask-A-Microscopist.html on Tuesday, September 12, 2006 at 20:38:46
---------------------------------------------------------------------------

Email: patrick.fairley-at-csauh.com
Name: patrick fairley

Organization: ohio university college of medicine

Education: Graduate College

Location: St. John Westshore Hospital, Westlake, OH

Question: I am trying to use/salvage a B&L KHS teaching binocular microscope. The optics are in quite good shape but the fine focus adjustment and the variable illumination don't work.
Do you know of any resource for details on repairing the fine focus and a wiring/troubleshooting/replacement parts for the electrical?
thank you very much
pf

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From: lamiller-at-uiuc.edu
Date: Tue, 12 Sep 2006 21:31:43 -0500
Subject: [Microscopy] viaWWW: Micron Bar Tool -- RE: Real Magnification

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Email: lamiller-at-uiuc.edu
Name: Lou Ann Miller

Organization: UIUC

Title-Subject: [Filtered] Micron Bar Tool -- RE: Real Magnification

Question: Just a side note on a useful web tool.


For those who have their calibrations done at the scope...


And who scan negatives and have scanned in a ruler with the identical
specs of the negative scanning, or actually still printing...


Below is a calculator to help you figure the magnification part with
micron bars.


http://treefrog.cvm.uiuc.edu/cgi-bin/Microna.pl


For example, you scan in a mm ruler and a 15000x negative, plug in
15000, and the calculator will tell you how many mm on the scanned in
ruler to make your micron bar for various micron values. Make the
micron bar in a layer on top of the ruler image, then pull the layer
over and onto your final image. ***** All dpi, scan area, any size
change etc must be identical between the 2 files however.


This does not solve your calibration issues, nor is it helpful with
many instruments..... but it does help if your scanning negs or
printing prints and to keep a lot of clients happy for not having to
re-recalculate how to do this over and over and over.


Lou Ann




~~~~~~~~~~~~~~~~~~~~~~~~~~~~
Lou Ann Miller, MT(ASCP)
Service Supervisor
Center for Microscopic Imaging
College of Veterinary Medicine
Rm 1204 VMBSB
2001 S Lincoln Ave
Urbana, IL 61802

217/244-1567
http://treefrog.cvm.uiuc.edu

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From: rstiger-at-ppg.com
Date: Tue, 12 Sep 2006 21:32:17 -0500
Subject: [Microscopy] viaWWW: Relocating TEM

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Email: rstiger-at-ppg.com
Name: Rebecca M. Stiger

Organization: PPG

Title-Subject: [Filtered] Relocating TEM

Question: Hello Microscopists:

We are interested in moving our Phillips CM-12 from one facility to another. Having the vendor assist is, of course, one option, but we're interested in exploring other resources as well. Do you know of companies or consultants that manage taking the instrument down, packing, and bringing it back up?

Please feel free to contact me off-list if you'd like.

Thanks,

Rebecca



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From: nizets2-at-yahoo.com
Date: Wed, 13 Sep 2006 06:47:40 -0500
Subject: [Microscopy] Re: AskAMicroscopist: immunolabeling & dehydrating of a tissue

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Dear Erika,

Your questions pertains to the so-called
"pre-embedding" techniques. You will probably find
informations related to your exact problem on the web
using these key-words.
One major disadvantage though is the lack of
accessibility of tissues or cells by antibodies.
If your target is extracellular your chances are
better, but there may still be steric problems. If
your antigen is intracellular you have to permeabilize
the cells before reacting with the antibodies.
Permeabilization has always an effect on the
cell/tissue morphology, you have to take this into
account.
Another point is the label you use. If your secondary
antibody is coupled to an enzyme (as it is usually the
case in histology) there is a chance that it won't
survive the post-labeling treatment.
Actually (IMHO) post-embedding techniques are usually
preferred because of these heavy drawbacks.

Now I notice that I did not answer your question :-D
Yes it is possible, but please consider the above
remarks.

Regards,

Stephane

--- batchelder-at-wi.mit.edu wrote:

}
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} on Tuesday, September 12, 2006 at 12:48:19
}
---------------------------------------------------------------------------
}
} Email: batchelder-at-wi.mit.edu
} Name: Erika Batchelder
}
} Organization: Keck Microscope Facility, Whitehead
} Institute
}
} Education: Graduate College
}
} Location: Cambridge, MA, USA
}
} Question: What effect on immunolabeling will
} dehydrating of a tissue have? Is it possible to
} immunolabel a tissue then dehydrate it for embedding
} in paraffin?
}
}
---------------------------------------------------------------------------
}
} ==============================Original
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From: gvrdolja-at-nature.berkeley.edu
Date: Wed, 13 Sep 2006 07:32:16 -0500
Subject: [Microscopy] c-flash attachments for sputter coaters

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Hello,
I was wondering if anyone was familiar with using the Carbon-flash
attachments to the Emitech and Denton desktop sputter coaters. Are you
able to get a nice even film of carbon, as well as you can get from using
a vacuum evaporator?

Any preference of Emitech versus Denton? We are looking at the turbo
version of both units.
Thanks.

\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\
Gordon Ante Vrdoljak Electron Microscope Lab
AOL/IM rakhasha http://nature.berkeley.edu/~gvrdolja 26 Giannini Hall
gvrdolja-at-nature.berkeley.edu UC Berkeley
phone (510) 642-2085 Berkeley CA 94720-3330
fax (510) 643-6207 cell (510) 290-6793

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From: nizets2-at-yahoo.com
Date: Wed, 13 Sep 2006 07:33:15 -0500
Subject: [Microscopy] local temperature in TEM

Contents Retrieved from Microscopy Listserver Archives
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Dear listers,

I was wondering what temperature a sample may reach
under the electron beam of a TEM.
I think that for ediffractometry analysis one have to
pull the diffraction aperture out of the way, which
means no protection for your sample. But crystals
melt, and then they lose their crystallinity!

Lets say I use a LAB6 at 200 kV and on a crystal
approx. 500 nm in diameter (usually observed around a
MAG of 50kx). I know it all depends on the spot size
and I don't know if the spot size is standardized
between the different microscopes. Lets say I use the
smallest spot size. What temperature could reach the
crystal if it was deposited on a formavar-coated
copper grid (200 mesh)? On a formvar/carbon copper
grid? On a Nickel grid? Would the sample be better
protected if we sputter coat carbon over the sample
instead of over the formvar film?

I wondered how you TEM specialists who work on
minerals and crystals, how you know if your material
is still crystalline or armorphous under the
conditions of observation?

Stephane


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From: lon.nelson-at-leica-microsystems.com
Date: Wed, 13 Sep 2006 08:41:39 -0500
Subject: [Microscopy] viaWWW: B&L KHS teaching binocular microscope

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Email: lon.nelson-at-leica-microsystems.com
Name: Lon Nelson

Organization: Leica Microsystems, Inc.

Title-Subject: [Filtered] B&L KHS teaching binocular microscope

Question: Patrick, if memory serves, this microscope was originally manufactured by Olympus for Bausch & Lomb. Some time ago, Leica Microsystems, Inc. purchased Bausch & Lomb's stereomicroscope line, but did not purchase rights to their compound microscopes (which would include the KHS). This entire compound microscope line has since been discontinued.

Currently, Reichert, Inc. in Buffalo, NY handles service / repair of discontinued B&L stereomicroscopes and they MIGHT be able to help you with the KHS...no guarantees. A contact phone number there is 716 686-3143.

Additionally, you might try I. Miller Precision Optical Instruments in Philadelphia at 215 925-2285.

As a last resort, Google may lead you to someone with repair parts.

Best regards,

Lon M. Nelson
Marketing Manager - Life Sciences
Leica Microsystems, Inc.


Email: patrick.fairley-at-csauh.com
Name: patrick fairley

Organization: ohio university college of medicine

Education: Graduate College

Location: St. John Westshore Hospital, Westlake, OH

Question: I am trying to use/salvage a B&L KHS teaching binocular microscope. The optics are in quite good shape but the fine focus adjustment and the variable illumination don't work.
Do you know of any resource for details on repairing the fine focus and a wiring/troubleshooting/replacement parts for the electrical?
thank you very much
pf

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From: swtkeller-at-yahoo.com
Date: Wed, 13 Sep 2006 08:42:43 -0500
Subject: [Microscopy] viaWWW: Looking for a TEM/HRTEM lab in Dallas Fort Worth metroplex

Contents Retrieved from Microscopy Listserver Archives
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Email: swtkeller-at-yahoo.com
Name: Sandra Keller

Organization: TA/SICCO

Title-Subject: [Filtered] TEM: Looking for a TEM/HRTEM lab in Dallas Fort Worth metroplex

Question: Hi:
I am urgently looking for any lab with a TEM/HRTEM that rents to outside users in the Dallas Fort Worth area.
Best Regards,
Sandra Keller
TA/SICCO

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From: matsumot-at-lifesci.ucsb.edu
Date: Wed, 13 Sep 2006 12:23:09 -0500
Subject: [Microscopy] Microscopy course in Santa Barbara CA November 13-17

Contents Retrieved from Microscopy Listserver Archives
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The Department of Molecular, Cellular, and Developmental Biology and the
Neuroscience Research Institute are sponsoring an advance course on
light microscopy. This 4 ½ day workshop will be offered from November 13
through November 17, 2006 and will consist of lectures and laboratory
exercises that will run from 9 am to approximately 5 pm each day. The
seminar/workshop will be intensive, enabling participants to develop
theoretical and hands-on expertise with light microscopes. Attendees
will interact closely with the instructors while using modern research
grade microscopes, cameras, and computers. The seminars and laboratories
will cover basic optical theory and how it pertains to increasing
contrast (signal to noise ratio) in biological samples. Fundamental
techniques such as fluorescence, phase contrast, Nomarski Differential
Interference Contrast, and darkfield imaging will be taught and
attendees will use microscopes equipped with these optical enhancement
accessories. In addition, the theory and practice of electronic image
acquisition (analog and digital) will be presented and attendees will
work with low-light cameras, digital image processing computers, and
morphometric programs. There are five research grade microscopes, five
electronic imaging cameras, two computer workstations, and one confocal
microscope. With a maximum enrollment of 10 students, there will be
ample opportunity to work with all of the microscopes and cameras. For
those so interested, intensive hands-on instruction and guidance on the
confocal microscope will be provided. For a fuller description of the
workshop please check the web address below. Enrollment forms can be
completed online and this workshop provides an opportunity to have a
working-vacation in Santa Barbara, California.


For further information on the course please go to the URL address:

http://www.lifesci.ucsb.edu/mcdb/events/imaging_workshop/index.html

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From: tivol-at-caltech.edu
Date: Wed, 13 Sep 2006 12:30:18 -0500
Subject: [Microscopy] Re: local temperature in TEM

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On Sep 13, 2006, at 5:33 AM, nizets2-at-yahoo.com wrote:

} I was wondering what temperature a sample may reach
} under the electron beam of a TEM.
} I think that for ediffractometry analysis one have to
} pull the diffraction aperture out of the way, which
} means no protection for your sample. But crystals
} melt, and then they lose their crystallinity!
}
} Lets say I use a LAB6 at 200 kV and on a crystal
} approx. 500 nm in diameter (usually observed around a
} MAG of 50kx). I know it all depends on the spot size
} and I don't know if the spot size is standardized
} between the different microscopes. Lets say I use the
} smallest spot size. What temperature could reach the
} crystal if it was deposited on a formavar-coated
} copper grid (200 mesh)? On a formvar/carbon copper
} grid? On a Nickel grid? Would the sample be better
} protected if we sputter coat carbon over the sample
} instead of over the formvar film?
}
} I wondered how you TEM specialists who work on
} minerals and crystals, how you know if your material
} is still crystalline or armorphous under the
} conditions of observation?
}
Dear Stephane,
The final temperature of the sample can be calculated by balancing the
energy input to the sample by the beam against the energy that leaves
the sample through heat conduction and radiation. Energy is also
removed from the sample by secondary electrons and x-rays, but I think
that this can be ignored. The energy deposited is equal to the beam
current density times the stopping power times the thickness of the
sample times the area of the sample. The stopping powers for various
substances have been determined and tabulated, but I don't have that
table with me. The amount of heat radiated is equal to the
Stephan-Boltzman constant times the surface area of the sample times
the 4th power of the temperature (in Kelvins), and the amount of heat
conducted is equal to the difference in temperature between the sample
and the substrate times the thermal conductivity times the effective
area of contact, which is somewhere between the projected area of the
sample and the perimeter times a "depth of contact", depending on just
how well the heat can be carried away from the sample through the
substrate. So if you set the energy in (which is not a function of the
temperature) equal to the energy out, you can solve for the temperature
at steady state, which will be the maximum temperature of the sample.
The diffraction aperture is located below the sample, so the sample is
exposed to the same amount of beam whether it is in or out. The best
way to protect your sample is to use a small beam that can be turned
off when images or diffraction patterns are not being taken; a low dose
set-up is designed to do precisely that, so use that feature if you
have it. (The reason for using a small beam is so that parts of the
sample that are not being examined are not being irradiated.) A LaB6
filament can be operated in tip mode, which greatly reduces the
intensity of the beam, so you can try this if low dose operation with
the largest spot size number (= smallest beam current) still causes
your sample to melt. Insert the selected area aperture and spread the
beam to a size just larger than the area of the sample defined by that
aperture. Carbon coated formvar is a much better conductor than plain
formvar, and it is a small benefit to coat with more carbon after the
sample is applied to the grid, but the presence of the extra carbon can
add background to either the image or diffraction pattern, so it may
not be worthwhile, depending on the nature of the sample. Copper is a
better conductor than nickel (but not too much better), so there is no
advantage to using a nickel grid. I have successfully obtained ED
patterns from a variety of crystals without any problems due to
melting, including anthracene, which will sublime in the microscope
column at room temperature and was examined in a LN2-cooled stage. You
should be successful obtaining ED patterns and images from your sample
with the proper beam conditions, and you can tell if the sample is
still crystalline from the ED pattern or by the FT of an image. Good
luck.
Yours,
Bill Tivol, PhD
EM Scientist and Manager
Cryo-Electron Microscopy Facility
Broad Center, Mail Code 114-96
California Institute of Technology
Pasadena CA 91125
(626) 395-8833
tivol-at-caltech.edu


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From: edelmare-at-muohio.edu
Date: Wed, 13 Sep 2006 12:48:12 -0500
Subject: [Microscopy] Looking for site survey providers.

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We are looking to relocate our EM Facility (SEM´s, TEM´s, Confocal, LM´s) to
elsewhere on campus, but before any remodeling or scope moving occurs
we need an environmental survey performed. Any suggestions or
recommendations as to service providers for doing this in southwest Ohio?

Please, commercial vendors feel free to contact me directly.

Thank you.




Richard E. Edelmann, Ph.D.
Electron Microscopy Facility Director
364 Pearson Hall
Miami University, Oxford, OH 45056
Ph: 513.529.5712 Fax: 513.529.4243
E-mail: edelmare-at-muohio.edu
http://www.emf.muohio.edu

"A main-frame: The biggest PC peripheral available."



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From: gary-at-gaugler.com
Date: Thu, 14 Sep 2006 10:42:56 -0500
Subject: [Microscopy] Re: c-flash attachments for sputter coaters

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Stephane,

You need to look at the schmeatic diagrams of the TEM and where the sample
sits relative to the objective and diffraction apertures. These are below
the sample and as such do not protect your sample. The only things that can
protect your sample from heating is minimizing the current density on your
sample or minimizing the amount of energy dumped into your sample through
inelastic scattering. Your options for the first are several: 1) spread
your beam out, 2) use a smaller spot size, 3) use a smaller condenser
aperture, or 4) desaturate the filament a little. For minimizing the
heating of your sample, you have several options there too: 1) use a cold
stage, 2) use a thinner sample, or 3) use a higher accelerating voltage.

I know that when I used 120 kV on glass samples before I had access to a 200
kV machine, coating them with a thin coating of carbon on both sides did
help them from softening in the microscope. So I would say yes, carbon
coating helps, but it is not the best solution.

You can tell if your sample changes under the beam. While in diffraction
mode, simply move the sample to a previously unexposed area and watch the
diffraction pattern. If the pattern goes crystalline from amorphous or vice
versa, you have a problem and you should call Houston.



-Scott

Scott D. Walck, Ph.D.
Technical Director
South Bay Technology, Inc.
1120 Via Callejon
San Clemente, CA 92673

US Toll Free: 1-800-728-2233
Tel: (949) 492-2600
Fax: (949) 492-1499

www.southbaytech.com
walck-at-southbaytech.com

-----Original Message-----
X-from: nizets2-at-yahoo.com [mailto:nizets2-at-yahoo.com]
Sent: Wednesday, September 13, 2006 5:36 AM
To: Walck-at-SouthBayTech.com

Dear listers,

I was wondering what temperature a sample may reach under the electron beam
of a TEM.
I think that for ediffractometry analysis one have to pull the diffraction
aperture out of the way, which means no protection for your sample. But
crystals melt, and then they lose their crystallinity!

Lets say I use a LAB6 at 200 kV and on a crystal approx. 500 nm in diameter
(usually observed around a MAG of 50kx). I know it all depends on the spot
size and I don't know if the spot size is standardized between the different
microscopes. Lets say I use the smallest spot size. What temperature could
reach the crystal if it was deposited on a formavar-coated copper grid (200
mesh)? On a formvar/carbon copper grid? On a Nickel grid? Would the sample
be better protected if we sputter coat carbon over the sample instead of
over the formvar film?

I wondered how you TEM specialists who work on minerals and crystals, how
you know if your material is still crystalline or armorphous under the
conditions of observation?

Stephane


__________________________________________________
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Position Available:
Associate Analytical Microscopist/Chemist
Abbott Laboratories, North Chicago, IL

Job Description
Abbott Laboratories has an opening of an Associate Analytical
Microscopist/ Chemist in a central microscopy facility. The qualified
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Qualifications
Candidate should have experience with polarized light microscopy, SEM, and
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Joe Neilly
Abbott Laboratories
D-R4R9, AP31
200 Abbott Park Rd.
Abbott Park, IL 60064-6212
Email: joe.neilly-at-abbott.com

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From sinosteeloffice37-at-rediffmail.com Wed Sep 13 14:40:27 2006
Return-Path: {sinosteeloffice37-at-rediffmail.com}
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Reply-To: "Sinosteel Corporation" {info_sinosteel23-at-yahoo.com.cn}

Some of the answer depends on the characteristics of
the coating you need. Why would you lean towards
a turbo unit? There are reasons.

I use a Denton Desk II with C fiber attachment.
Works great. No turbo. I have used Emitech units
before and got no/zero support for them in huge
contrast to big support from Denton. My current
metal coater is a Denton Desk IV TSC with Au/Pd,
Pt, Ir or Pd targets. I asked for and got an
Edwards XDS5 dry scroll pump so that the whole
metal coating system is without oil. Excellent.
This is not such a problem with C coating.

gary g.


At 05:33 AM 9/13/2006, you wrote:



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From: johnf-at-geology.wisc.edu
Date: Thu, 14 Sep 2006 14:20:06 -0500
Subject: [Microscopy] Proceedings M&M volumes

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Could someone tell me what year the Proceedings of M&M changed from
fully paper printed, to having a CD attached with most of the
abstracts? I know it was sometime between 2000 and 2003...

thanks.

John
--
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From: r-holdford-at-ti.com
Date: Thu, 14 Sep 2006 14:29:08 -0500
Subject: [Microscopy] c-flash attachments for sputter coaters

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Gordon: I use a Denton Desk II with carbon rod, no turbo. I've also
used the Emitech K675 which is one of their 8" wafer tools set up for
carbon rod. It has a turbo. Both give good coverage; I usually coat
for FIB work so I don't have the same criteria as SEM or TEM work
would. As Gary says, it will depend on what want and what you're doing
with the coating. Ask your sales reps who in your area has coaters you
can demo and then you can see if the coatings are what you want.

By the way, I've had the opposite service experience compared with
Gary's. (I'm in Texas and I think Gary's on the west coast.)

gary-at-gaugler.com wrote:
} ----------------------------------------------------------------------------
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}
} Some of the answer depends on the characteristics of
} the coating you need. Why would you lean towards
} a turbo unit? There are reasons.
}
} I use a Denton Desk II with C fiber attachment.
} Works great. No turbo. I have used Emitech units
} before and got no/zero support for them in huge
} contrast to big support from Denton. My current
} metal coater is a Denton Desk IV TSC with Au/Pd,
} Pt, Ir or Pd targets. I asked for and got an
} Edwards XDS5 dry scroll pump so that the whole
} metal coating system is without oil. Excellent.
} This is not such a problem with C coating.
}
} gary g.
}
}
} At 05:33 AM 9/13/2006, you wrote:
}
}
}
}
} } ----------------------------------------------------------------------------
} } The Microscopy ListServer -- CoSponsor: The Microscopy Society of America
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} } ----------------------------------------------------------------------------
} }
} } Hello,
} } I was wondering if anyone was familiar with using the Carbon-flash
} } attachments to the Emitech and Denton desktop sputter coaters. Are you
} } able to get a nice even film of carbon, as well as you can get from using
} } a vacuum evaporator?
} }
} } Any preference of Emitech versus Denton? We are looking at the turbo
} } version of both units.
} } Thanks.
} }
} } \/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\
} } Gordon Ante Vrdoljak Electron Microscope Lab
} } AOL/IM rakhasha http://nature.berkeley.edu/~gvrdolja 26 Giannini Hall
} } gvrdolja-at-nature.berkeley.edu UC Berkeley
} } phone (510) 642-2085 Berkeley CA 94720-3330
} } fax (510) 643-6207 cell (510) 290-6793
} }
} } ==============================Original Headers==============================
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--
~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~
Becky Holdford (r-holdford-at-ti.com)
972-995-2360
972-648-8743 (pager)
SC Packaging FA Development
Texas Instruments, Inc.
Dallas, TX
~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~


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From: allardlfjr-at-ornl.gov
Date: Thu, 14 Sep 2006 14:34:46 -0500
Subject: [Microscopy] Re: Proceedings M&M volumes

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2002




At 2:21 PM -0500 9/14/06, johnf-at-geology.wisc.edu wrote:
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From: dsherman-at-purdue.edu
Date: Thu, 14 Sep 2006 16:02:05 -0500
Subject: [Microscopy] BS electrons and edge effects

Contents Retrieved from Microscopy Listserver Archives
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Edge effects are common in secondary electron images of samples having the
appropriate topography. However, on a flat sample, do you think there may
be something equivalent to edge effects in a back scattered electron image?
In this case there would be no topography effects but could areas of
concentrated mineral give an enhanced signal due to not just the additional
high atomic number atoms but also due to the particle distribution?

Debby


Debby Sherman, Manager Phone: 765-494-6666
Life Science Microscopy Facility FAX: 765-494-5896
Purdue University E-mail: dsherman-at-purdue.edu
S-052 Whistler Building
170 S. University Street
West Lafayette, IN 47907
http://www.agriculture.purdue.edu/microscopy


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From: oshel1pe-at-cmich.edu
Date: Thu, 14 Sep 2006 16:26:57 -0500
Subject: [Microscopy] Re: BS electrons and edge effects

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Debby,

Yes.
BSE generation is a bulk property of the atoms within the interaction
volume, therefore variations in local element distribution will cause
variation in BSE. I have seen this for instance in crustacean
cuticle, where the edges of pores were brighter in BSE imaging
because of an increase in Ca concentration at the pore edges.
One way to detect this is to compare compositional and topographic
images. Which can be confusing if there is both a topographic feature
(like, say, a pore) and a compositional feature (like, say, an
increase in Ca concentration at the edge of the pore). Then EDS
mapping comes in handy.
Not to mention changes in BSE images caused by elements migrating due
to beam-specimen interactions ...

Phil
P.S. "BSE generation is a bulk property of the atoms within the
interaction volume." Makes for a great exam question: how can it be
truthful to say that a BSE detector can resolve 0.1 Z (atomic
number), if Z is always an integer?

} Edge effects are common in secondary electron images of samples having the
} appropriate topography. However, on a flat sample, do you think there may
} be something equivalent to edge effects in a back scattered electron image?
} In this case there would be no topography effects but could areas of
} concentrated mineral give an enhanced signal due to not just the additional
} high atomic number atoms but also due to the particle distribution?
}
} Debby
}
}
} Debby Sherman, Manager Phone: 765-494-6666
} Life Science Microscopy Facility FAX: 765-494-5896
} Purdue University E-mail: dsherman-at-purdue.edu
} S-052 Whistler Building
} 170 S. University Street
} West Lafayette, IN 47907
} http://www.agriculture.purdue.edu/microscopy
--
Philip Oshel
Microscopy Facility Supervisor
Biology Department
Central Michigan University
024C Brooks Hall
Mt. Pleasant, MI 48859
voice: (989) 774-3576
dept. fax: (989) 774-3462

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From: m.aindow-at-uconn.edu
Date: Thu, 14 Sep 2006 18:37:15 -0500
Subject: [Microscopy] viaWWW: Opening: SEM/OM Specialist

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Email: m.aindow-at-uconn.edu
Name: Mark Aindow

Organization: University of Connecticut

Title-Subject: [Filtered] Opening: SEM/OM Specialist

Question: University of Connecticut
Institute of Materials Science

Position in Scanning Electron Microscopy and Optical Microscopy


The Institute of Materials Science (IMS) at UConn is an interdisciplinary center with the threefold mission of fostering education, research and outreach in all areas of the materials sciences. The Microscopy Laboratory is a user facility which houses the main research microscopes (optical, SEM and TEM) for the IMS. There is an opening in the Laboratory for a Scanning Electron Microscopy / Optical Microscopy specialist. The appointee will be involved in a range of academic and industrial projects, and will assist in the operation of the Laboratory including performing routine maintenance and training/assisting users of the microscopes.

Candidates should hold a higher degree (MS or PhD) in Materials Science or a related discipline and must have extensive hands-on SEM and optical microscopy experience. Experience in maintenance of electron microscopes, use of transmission electron microscopy, microscopy of soft materials and/or microtomy would also be beneficial. This is a fixed-term appointment and is available from October 1st. Screening of the applications will begin immediately and will continue until the post is filled. Applications from under-represented groups, including minorities, women and persons with disabilities are encouraged.

Interested candidates should send a curriculum vitae and the names of at least three referees with postal addresses, telephone numbers and Email addresses to: Prof. Mark Aindow, Institute of Materials Science, University of Connecticut, 97 North Eagleville Road, Unit 3136, Storrs, CT 06269-3136 USA. Email: m.aindow-at-uconn.edu

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From: dcrippen-at-buckinstitute.org
Date: Thu, 14 Sep 2006 18:37:45 -0500
Subject: [Microscopy] viaWWW: Confocal--Chameleon XR service contract

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Email: dcrippen-at-buckinstitute.org
Name: Danielle Crippen

Organization: Buck Institute for Age Research

Title-Subject: [Filtered] Confocal--Chameleon XR service contract

Question: Dear All,

I'm hoping to poll those of you out there who have a 2p laser, specifically Chameleon XR users...do you recommend the service contract?? Our warranty is expiring in a few months and we're weighing our financial options around this issue. Unfortunately, we have already had to have our laser replaced...so we are wary of being without coverage. But of course, the service contract is so expensive, it's hard to swallow the idea of spending the money and not needing any service for the year as well.

So I'm hoping 2p users out there might be able to tell me their experiences with and without a service contract to help us better make this decision.

Many thanks in advance!

danielle

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From: zfr_sn-at-yahoo.com
Date: Thu, 14 Sep 2006 18:38:22 -0500
Subject: [Microscopy] AskAMicroscopist: ceramic sample for TEM analysis

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Below is the result of your feedback form (NJZFM-ultra-55). It was submitted by (zfr_sn-at-yahoo.com) from http://microscopy.com/Ask-A-Microscopist/Ask-A-Microscopist.html on Thursday, September 14, 2006 at 13:00:00
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Email: zfr_sn-at-yahoo.com
Name: Sana Ullah

Organization: Govt. College

Education: Graduate College

Location: Lahore,Pakistan

Question: How to prepare a bulk ceramic sample for TEM analysis?

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From: michael-at-shaffer.net
Date: Fri, 15 Sep 2006 04:37:26 -0500
Subject: [Microscopy] RE: BS electrons and edge effects

Contents Retrieved from Microscopy Listserver Archives
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Debby writes ...

} Edge effects are common in secondary electron images of
} samples having the appropriate topography. However, on a
} flat sample, do you think there may be something equivalent
} to edge effects in a back scattered electron image?
} In this case there would be no topography effects but could
} areas of concentrated mineral give an enhanced signal due to
} not just the additional high atomic number atoms but also due
} to the particle distribution?

This is indeed possible, but you should also be careful that your BEI
detector isn't also the problem. Both (or all 4) BSED segments need to be
perfectly balanced, and I have often observed that putting the sample too
near the BSED (short WD) can also enhance edges. In this same regard, I
believe that the scintillator type BSED have a large enough acceptance angle
to enhance edges at short working distances.

HTH, Michael Shaffer :o)

SEM/MLA Research Coordinator
http://www.mun.ca/creait/maf/
Inco Innovation Centre
c/o Memorial University
St. John's, NL A1C 5S7



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7, 21 -- Subject: RE: [Microscopy] BS electrons and edge effects
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From: alvarobq-at-fcien.edu.uy
Date: Fri, 15 Sep 2006 08:47:52 -0500
Subject: [Microscopy] AskAMicroscopist: negative staining whith a small lipo protein

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Below is the result of your feedback form (NJZFM-ultra-55). It was submitted by (alvarobq-at-fcien.edu.uy) from http://www.microscopy.com/Ask-A-Microscopist/Ask-A-Microscopist.html on Friday, September 15, 2006 at 08:40:57
---------------------------------------------------------------------------

Email: alvarobq-at-fcien.edu.uy
Name: Alvaro D. Olivera

Organization: Science University

Education: Undergraduate College

Location: Montevideo - Uruguay

Question:

I'm TEM technician and advanced undergraduate in Biochemistry.
I'm trying negative staining whith a small lipo protein HDL like. I'm
using CARBON-FORMVAR COATED Cu GRIDS and PTA 2% and 3%. I can't see it.
What do you suggest?

Many thanks, Alvaro.

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From: DusevichV-at-umkc.edu
Date: Fri, 15 Sep 2006 10:31:26 -0500
Subject: [Microscopy] RE: BS electrons and edge effects

Contents Retrieved from Microscopy Listserver Archives
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If there is a significant difference in the hardness of phases of a
specimen, then "flat" specimen could be not really flat, especially if
it is prepared by polishing. In cases like this I did observed some
"edge effect" in BSE, which is due to the curvature of the edges of
phase boundaries.

Also I have observed strong edge effect on bone specimens embedded in a
resin (as for TEM) and cut with diamond knife.

Vladimir


Vladimir M. Dusevich, Ph.D.
Electron Microscope Lab Manager
371 School of Dentistry
650 E. 25th Street
Kansas City, MO 64108-2784

Phone: (816) 235-2072
Fax: (816) 235-5524
Web: http://www.umkc.edu/dentistry/microscopy



} -----Original Message-----
} From: dsherman-at-purdue.edu [mailto:dsherman-at-purdue.edu]
} Sent: Thursday, September 14, 2006 4:03 PM
} To: Dusevich, Vladimir
} Subject: [Microscopy] BS electrons and edge effects
}
}
}
}
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}
} Edge effects are common in secondary electron images of
} samples having the appropriate topography. However, on a
} flat sample, do you think there may be something equivalent
} to edge effects in a back scattered electron image?
} In this case there would be no topography effects but could
} areas of concentrated mineral give an enhanced signal due to
} not just the additional high atomic number atoms but also due
} to the particle distribution?
}
} Debby
}
}
} Debby Sherman, Manager Phone: 765-494-6666
} Life Science Microscopy Facility FAX: 765-494-5896
} Purdue University E-mail: dsherman-at-purdue.edu
} S-052 Whistler Building
} 170 S. University Street
} West Lafayette, IN 47907
} http://www.agriculture.purdue.edu/microscopy
}
}
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From: mnesta-at-ebsciences.com
Date: Fri, 15 Sep 2006 11:05:50 -0500
Subject: [Microscopy] c-flash attachments for sputter coaters

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Dear List Members,
}
} Let us start by saying that we truly hope this email isn't perceived
} as us using this medium as a vehicle for promotion. We also wish to
} state that this is in no way an admonishment of Gary for his comments.
} He is a valuable contributor to the List and we are in no way
} disputing the validity of his claim. However, his innocent comment
} about Emitech support has the potential to inflict significant damage
} to our businesses, thus we are compelled to respond.
} The circumstances have recently changed relative to the ownership of
} Emitech as well as their representation here in the US. In March 2005,
} Quorum Technologies purchased the ongoing business and assets of
} Emitech Ltd. Quorum is the UK manufacturer of Polaron, and both
} businesses are located in Southern England. Quorum/Polaron is and
} always has been a very Customer Service oriented Company. Since the
} acquisition, they have worked very hard and invested heavily in the
} Emitech Business, both in the product development and Customer facing
} areas. Energy Beam Sciences has been the US Distributor of the
} Quorum/Polaron product line for many years and in April 2006, were
} appointed the US master distributor for Emitech products as well. This
} happened as a result of their commitment to Customer Service as well
} as their Customer support capabilities. In January 2005, EBSciences
} was purchased by a group of its employees. Since that acquisition,
} They also have dedicated much effort and significant resources to
} making Customer Service a top priority. EBS has a dedicated Service
} Department with top notch technicians and in-house engineering support
} to diagnose and repair any problem at their Connecticut facility, or
} on-site for larger systems like Cryo-SEM stages. For Applications and
} Sales, EBS has a Product Manager who is dedicated exclusively to the
} needs of our mutual EM Customers.
}
} We at Quorum and EBS are united in our desire to serve our Customers
} and in our determination to become their first choice for sample
} preparation equipment. In fact, we offer any Customer that purchases
} or has purchased an instrument from us free telephone/email support
} for as long as they own that instument. While we cannot atone for the
} sins of the past, we can assure our Customers.of our commitment to
} providing the very best in service and support going forward.
Sincerely,

Bob Kenhard
Manging Director
Quorum Technologies

Mike Nesta
Managing Director
Energy Beam Sciences



gary-at-gaugler.com wrote:
} ----------------------------------------------------------------------------
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} ----------------------------------------------------------------------------
}
} Some of the answer depends on the characteristics of
} the coating you need. Why would you lean towards
} a turbo unit? There are reasons.
}
} I use a Denton Desk II with C fiber attachment.
} Works great. No turbo. I have used Emitech units
} before and got no/zero support for them in huge
} contrast to big support from Denton. My current
} metal coater is a Denton Desk IV TSC with Au/Pd,
} Pt, Ir or Pd targets. I asked for and got an
} Edwards XDS5 dry scroll pump so that the whole
} metal coating system is without oil. Excellent.
} This is not such a problem with C coating.
}
} gary g.
}
}
} At 05:33 AM 9/13/2006, you wrote:
}
}
}
}
} } ----------------------------------------------------------------------------
} } The Microscopy ListServer -- CoSponsor: The Microscopy Society of America
} } To Subscribe/Unsubscribe -- http://www.microscopy.com/MicroscopyListserver
} } On-Line Help http://www.microscopy.com/MicroscopyListserver/FAQ.html
} } ----------------------------------------------------------------------------
} }
} } Hello,
} } I was wondering if anyone was familiar with using the Carbon-flash
} } attachments to the Emitech and Denton desktop sputter coaters. Are you
} } able to get a nice even film of carbon, as well as you can get from using
} } a vacuum evaporator?
} }
} } Any preference of Emitech versus Denton? We are looking at the turbo
} } version of both units.
} } Thanks.
} }
} } \/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\
} } Gordon Ante Vrdoljak Electron Microscope Lab
} } AOL/IM rakhasha http://nature.berkeley.edu/~gvrdolja 26 Giannini Hall
} } gvrdolja-at-nature.berkeley.edu UC Berkeley
} } phone (510) 642-2085 Berkeley CA 94720-3330
} } fax (510) 643-6207 cell (510) 290-6793
} }
} } ==============================Original Headers==============================
} } 3, 24 -- From gvrdolja-at-nature.berkeley.edu Wed Sep 13 07:32:15 2006
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} } 05:32:12 -0700 (PDT)
} } 3, 24 -- Date: Wed, 13 Sep 2006 05:32:12 -0700 (PDT)
} } 3, 24 -- From: Gordon Vrololjak {gvrdolja-at-nature.berkeley.edu}
} } 3, 24 -- To: microscopy-at-microscopy.com
} } 3, 24 -- Subject: c-flash attachments for sputter coaters
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}
}
} ==============================Original Headers==============================
} 9, 20 -- From gary-at-gaugler.com Thu Sep 14 10:42:56 2006
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} 9, 20 -- From: Gary Gaugler {gary-at-gaugler.com}
} 9, 20 -- Subject: Re: [Microscopy] c-flash attachments for sputter coaters
} 9, 20 -- Cc: MSA listserver {microscopy-at-microscopy.com}
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}

--
Michael R. Nesta
Managing Director
Energy Beam Sciences, Inc.
Tel: 860 653-0411
Fax: 860 653-0422
MNesta-at-ebsciences.com
www.ebsciences.com
“ADDING BRILLIANCE TO YOUR VISION”


==============================Original Headers==============================
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From: larry-at-cymru.freewire.co.uk
Date: Fri, 15 Sep 2006 14:55:41 -0500
Subject: [Microscopy] Re: BS electrons and edge effects

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

} ----------------------------------------------------------------------------
} The Microscopy ListServer -- CoSponsor: The Microscopy Society of America

Personally, I would regard an 'edge effect' as a change in contrast
due to sample topography which I don't think occurs in BSE imaging.

However, you can get, in many types of sample, 'diffusion' of
elements towards morphological and topographical features - such as
edges, grain boundaries, etc. Such segregation is 'real' and is
revealed by BSE. The 'edge effects' observed in SE imaging are purely
a consequence of sample topography on the physics of the imaging
method.

As has already been mentioned, preparing a truly flat sample, is
difficult. In this case, SE imaging can reveal differences in sample
height but BSE imaging will tend to indicate compositional variations.

You should also keep in mind channeling effects, arising from sample
crystallography, which give rise to constrast variations unrelated to
to composition or topography. And while these are generally 'bulk',
that is the whole grain has a contrast determined by orientation and
crystallography, it is possible for crystal orientation to be
distroted at grain boundaries, leading to constrast changes which
could be interpreted as elemental segregation. To separate such
effect, you need BSE images plus EDS mapping.
--
Larry Stoter

PLEASE NOTE - Agressive SPAM filtering is employed. If you don't get
a reply to e-mails, try again, avoiding anything in the subject or
body which might trigger filtering. If you are in the address book,
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6, 16 -- Subject: [Microscopy] Re: BS electrons and edge effects
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From: gary-at-gaugler.com
Date: Fri, 15 Sep 2006 16:55:55 -0500
Subject: [Microscopy] c-flash attachments for sputter coaters

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

I'm at a quandary to respond to your msg.
I see your basis but disagree with it.

The original post was specifically about Emitech and Denton.

} } Hello,
} } I was wondering if anyone was familiar with using the Carbon-flash
} } attachments to the Emitech and Denton desktop sputter coaters. Are you
} } able to get a nice even film of carbon, as well as you can get from using
} } a vacuum evaporator?
} }
} } Any preference of Emitech versus Denton? We are looking at the turbo
} } version of both units.
} } Thanks.

I have experience with both brands. I think that he
is asking for and deserves first-hand feedback about
purchase options. But I need more application info
before making a more pointed suggestion.

Gordon's question did not, IMO include enough
detailed info to make a definitive answer.
Thus, all that I could do was to say what I
know first-hand at this time. I think that
I did so.

I have had pleasure with Denton and lack of
pleasure with Emitech. This is based on real
experience with both brands. Now, based on
my posting, I find that EBS is handling the
Emitech line. Having dealt with Mike Dufrane
from EBS, this is a very positive action.
I think that w/o my posting, many of us would
still be in the dark about this new engagement.
Blah, blah, EMS is a good supplier...disclaimers,
blah, blah.

I'm totally in favor of EBS going in competition
with Denton and others. EBS has treated me very
well. No complaints. And now I/we know that they
represent Emitech. Great. Denton has done great.
Thus, no easy binary answer.

The fact is that these units represent a significant
monetary investment, like other SEM aspects and begs,
if not requires, users to provide positive and negative
feedback about products to those organizations and
individuals in the process of purchasing capital
equipment. Do you advocate that users make purchase
decisions based on vague data? I presume not.
Thus, you should be able to put my reply in context.

If this reply is inappropriate for the list, I'm
sure that Nestor will kill it. Fine. Nevertheless,
you have a direct reply.

gary g.





At 09:47 AM 9/14/2006, you wrote:
} Gary:
}
} Your response does not seem to answer the question that Gordon
} asked. It seems you have used the question to express your great
} pleasure with Denton and your displeasure with Emitech. I do not
} think this is the proper forum for such comments. If you have
} personal opinions about a particular vendor, it would be more
} appropriate to make them off line to someone who asks. I have no
} financial interest in either Denton or Emitech.
}
} David
}
} {mailto:gary-at-gaugler.com} gary-at-gaugler.com wrote:
} }
} }
} }
} }
} }
} } ----------------------------------------------------------------------------
} } The Microscopy ListServer -- CoSponsor: The Microscopy Society of America


==============================Original Headers==============================
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16, 21 -- From: Gary Gaugler {gary-at-gaugler.com}
16, 21 -- Subject: Re: [Microscopy] Re: c-flash attachments for sputter coaters
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From: durainel-at-bsci.com
Date: Fri, 15 Sep 2006 18:33:37 -0500
Subject: [Microscopy] viaWWW: Gordon / Emitech Sputter Coaters

Contents Retrieved from Microscopy Listserver Archives
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Email: durainel-at-bsci.com
Name: Lita DuRaine

Organization: Boston Scientific

Title-Subject: [Filtered] Gordon / Emitech Sputter Coaters

Question: This is addressed to Gordon Ante Vrdoljak:
We have an Emitech K550X Sputter Coater with the carbon flash attachment and have been very satisfied with the results. The coatings so far have appeared evenly distributed on our samples. Customer service for our location in Fremont, CA has been great. I like the unit because we can sputter various metals as well.

Hope that helps,
Lita DuRaine
Boston Scientific
Manager Microscopy Lab

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From: W.Muss-at-salk.at
Date: Sun, 17 Sep 2006 08:22:58 -0500
Subject: [Microscopy] Re:AskAMicroscopist: negative staining whith a small lipo protein

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Dear Alvaro,
interesting question....& a } lazy sunday {.....

Normally (e.g. as I use it sometimes for negative staining of virus particles)
you will have at least two negative staining solutions:
i) hydrous PTA (1, 2 or other percentage)
ii) hydrous uranylacetate 1-4%.......and sometimes also you will be informed
also about a certain pH your solution should for such preparations....

For (small) lipoproteins (esp. for HDL-like) I am not quite sure about wether
} simply saying { so or } giving advice { in that way is helpful.

As I understand negative staing, (a) positive result(s) will also depend on a
given pH (and therefore [with WHAT ingredients?] buffering the solution
eventually to WHICH "special" pH), and (absorption/adhesion) technique of
specimen preparation. I'm not an expert on that field, but i don't think your
carbon-coated formvar-filmed copper grids are the biggest problem....but,. if I
remember correctly, there are several (also older)papers/articles on negative
staining techniques for e.g. liposomes (for an imagination on such, try the
search phrase } } "negative staining","liporotein" { {) on google, resulting in
a lot of papers and statements about some very specific caudeles for adhesion of
lipoprotein material....(for instance: see*) below.

Some prefer also prefixation of mixed particles with hydrous Osmium tetroxide
before negative staining with the heavy metal solution, sometimes only hydrous,
somtetimes with an additive (like sucrose).....
so it may depend also on the type of material you'd like to have demonstrated
and wether you are able to get the (macro-)molecule adhering in a stabilized
form to the formvar-carbon-surface of the grid or not (cf. *)

Once determined,
[by trial&error (perhaps, unluckily)] how to proceed with the
grids' properties = hydrophilization and immediate use or storage for
months...see *), adhesion time/technique, eventually prestabilization of the
specimen by additional fixation, the right negative staining solution (also in
terms of i) element [PTA, UO2, AmmMolybdat,Uranylformate, etc.],
ii)concentration, iii) pH of the solution, iv) specific additives necessary?)

the technique itself certainly yields reliable and rapid results, even within
5-10 minutes (as I have read in some papers) ==} THAT's what I would like to
wish you in overcoming your problem.

I am sure you will get more specific advice via this forum from experts on the
matter....

Best regards
Wolfgang Muss, Salzburg, AUSTRIA

cf:
*) Original paper in:
J Lipid Res. 1980 Nov;21(8):981-92.
Unilamellar liposomes made with the French pressure cell: a simple preparative
and semiquantitative technique.
Hamilton RL Jr, Goerke J, Guo LS, Williams MC,Havel RJ.
Ex Material & Methods-section:
Negative staining of liposomes often causes artifactual images resulting from
disruption of small liposomes that subsequently form larger multilamellar
structures. Although the mechanism of this process is not understood, it may be
caused in part by the intense hydrophobicity of freshly evaporated carbon on
grid surfaces. Our attempts to modify the surface film of freshly prepared
carbon-coated grids (200-300 mesh copper grids, Fullum, Schenectady,NY) by glow
discharge, polylysine, or addition of albumin to sample or grid did not prove
satisfactory. However, we have learned empirically that parlodioncovered
grids with carbon films made with a Siemens evaporator (VI3 G 500) permit even
spreading of liposomes without apparent structural changes, provided that the
grids have been aged 6- 12 months on the shelf. Carbon rods for filming were
obtained from Ringsdorff-Herke (Spektral Kohlen, Bonn-Bad Godesberg, West
Germany). With such “matured” carbon-coated grids, liposomes were prepared for
electron microscopy with 2% potassium phosphotungstate at pH 6.45-6.5 by the
drop procedure described previously (1 1). We found that the lipid
concentration in the sample was also important for preparing uniform spreads.
Optimal results were more consistently obtained with samples containing
1- 10 mg/ml PC. Improved results can be obtained for more dilute samples by
increasing contact time of the sample on the grid to 2-3 min, and by using
a tighter 400 mesh grid.......

308 results with a Google search phrase: } } "negative staining" "of HDL" { { :
some of them can be retrieved without charges (esp. older ones out from Journal
Lipid Res),

Cf. also (free download) at: http://www.jlr.org/cgi/reprint/41/2/285 :
J. Lipid Res. Chung and Dashti, 41 (2): 285.
Lipolytic remnants of human VLDL produced in vitro: effect of HDL levels in the
lipolysis mixtures on the apoCs to apoE ratio and metabolic properties of VLDL
core remnants

or another paper at:
http://www.pubmedcentral.gov/picrender.fcgi?artid=292037&blobtype=pdf



also see: http://em-outreach.ucsd.edu/web-course/Sec-III.F/Sec-III.F.html,
section c. Contrast enhancement....

NB/PS:
Performing an original search,
} "negative staining" "of HDL" {
in PubMed Central will retrieve 55 citations.



Zitat von alvarobq-at-fcien.edu.uy:

}
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} http://www.microscopy.com/Ask-A-Microscopist/Ask-A-Microscopist.html on
} Friday, September 15, 2006 at 08:40:57
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}
} Email: alvarobq-at-fcien.edu.uy
} Name: Alvaro D. Olivera
}
} Organization: Science University
}
} Education: Undergraduate College
}
} Location: Montevideo - Uruguay
}
} Question:
}
} I'm TEM technician and advanced undergraduate in Biochemistry.
} I'm trying negative staining whith a small lipo protein HDL like. I'm
} using CARBON-FORMVAR COATED Cu GRIDS and PTA 2% and 3%. I can't see it.
} What do you suggest?
}
} Many thanks, Alvaro.
}
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From: w_d_howell-at-yahoo.com
Date: Sun, 17 Sep 2006 12:55:04 -0500
Subject: [Microscopy] Zeiss 5X objectives

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Hello all,

I am choosing between two Zeiss 5x objectives
[Plan-Apochromat (420630-9900); EC Plan-Neofluar
(420330-9901)] to be used for both diagnostic
pathology and research. Most of the specimens I will
be examining are H&E or horse radish peroxidase
(diaminobenzidine) stained. The numerical aperatures
(0.16) and fields of view (25 mm) are identical for
both objectives. Zeiss claims better color correction
and flatness of field for the Plan-Apochromat versus
the EC Plan-Neofluar.

The Plan-Apochromat has a flatter % transmission/
wavelength curve than the EC Plan-Neofluart and
extends into the IR range (80% transmission -at- 1100
nm). The transmission of the EC Plan-Neofluar extends
a bit further into the near UV (about 325 nM) than
that of the Plan-Apochromat. For some reason, DIC is
not listed as a potential application of the
Plan-Apochromat, but not the EC Plan-Neofluar.

I'm sure that both are great objectives, but which one
would be the better choice for my applications? Also,
does anyone have experience using the Zeiss
Plan-Apochromat 40X/0.95 Corr (42066-9970) objective?

Thanks in advance for your responses,

Bill Howell, M.D., Ph.D.



__________________________________________________
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From: twigg-at-estd.nrl.navy.mil
Date: Mon, 18 Sep 2006 07:26:54 -0500
Subject: [Microscopy] viaWWW: Ghosted Image Window in Digital Micrograph

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Email: twigg-at-estd.nrl.navy.mil
Name: Mark Twigg

Organization: Naval Research Laboratory

Title-Subject: [Filtered] Ghosted Image Window in Digital Micrograph

Question: The Dell Dimension 8400 (running Windows XP) on which I am running Digital Micrograph recently crashed. After the crash the Image widow in Digital Micrograph has been ghosted, so that I cannot insert my Ultrascan CCD camera or attempt to record an image. I have rebooted the PC a number of times, but to no avail. Perhaps the PC-savy people among you have some suggestions for me here. I have mostly used Macs and am therefore not familiar with PC ailments. Also, would it help to restart or reset the First Light Digital Camera controller?

Thanks,

Mark

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From: sheila.blouin-at-umb.edu
Date: Mon, 18 Sep 2006 07:27:51 -0500
Subject: [Microscopy] AskAMicroscopist: What does a microscopist do all day?

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Email: sheila.blouin-at-umb.edu
Name: Sheila

Organization: University of Massachusetts, Boston

Education: Undergraduate College

Location: Boston, MA, USA

Question: What does a microscopist do all day? What kind of education do you have to have?

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From: stefan.diller-at-t-online.de
Date: Mon, 18 Sep 2006 07:29:00 -0500
Subject: [Microscopy] Remove drop of oil on EDS window

Contents Retrieved from Microscopy Listserver Archives
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Dear all,
is there anybody out there who has experience with removing a small drop of
diffusion pump (non silicone) oil from an EDS light element detector window?
Window is made of 4um Be... (SLEW window from Roentec).
I tried to remove the oil from the colliminator surface with multiple
washing in 100% alcohol and it seems that I succeeded but I don`t know if I
should use this "protocoll" on the more delicate Be-window...

Thanks in advance for your help
Stefan


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From: mjaffer-at-science.uct.ac.za
Date: Mon, 18 Sep 2006 07:58:37 -0500
Subject: [Microscopy] double tilt holder

Contents Retrieved from Microscopy Listserver Archives
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Dear All

We have a LEO 912 Omega TEM and would like to obtain a second-hand
double tilt holder (in any condition) for electron diffraction analysis
of crystalline specimens. Please contact me should you be able to help.

Thanks in advance.

Mohamed

************************************
Mohamed Jaffer
Electron Microscope Unit
University of Cape Town
Private Bag
Rondebosch, 7701
South Africa

Tel: +27 21 6503354
Fax: + 27 21 6891528

Email: mjaffer-at-science.uct.ac.za

************************************






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From: frank.karl-at-degussa.com
Date: Mon, 18 Sep 2006 08:22:05 -0500
Subject: [Microscopy] Re: AskAMicroscopist: What does a microscopist do all day?

Contents Retrieved from Microscopy Listserver Archives
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Sheila,
Mostly we try to stay out of trouble....

Microscopist are such a diverse group I suspect it is not possible to give
a clear cut answer.

Most of us spend time with a computer/notebook recording our results. Many
of us write reports documenting our results and in many cases interpreting
how the results dove-tail to provide a consistent, self-logical portrait of
our work.

For me, currently, it means isolating materials, sometimes particles,
sometime making big things into smaller "microscope-sized " specimens. I
typically use Energy Dispersion Spectroscopy (EDS) as well as SEM and TEM
examination. Other problems require the polarized light microscope (both
for determination of morphology as well as optical crystallography) and
microchemical test. These test run from the simple (cold dilute mineral
acid makes limestone bubble) to the more complex (test for sulfate with
barium chloride and sodium rhodizonate). In a former position it also
meant microtoming polymers, testing fillers for asbestos and alpha quartz
as well as running the IR microscope and interpreting IR spectra and entry
use of the GC/MS (I set-up runs with caned programs and matched results to
libraries).

Education?
First get a degree in a physical science. While your doing this take
courses and avail yourself of options to learn more about microscopy
related skills.

In geology you could learn about optical mineralogy, optical
crystallography, SEM/EDS and WDS.
Biology: pollen, diatoms, "pond water microscopy", TEM, hair, feathers and
other "biologicals" in the environment
Material sciences: SEM, TEM, AFM, EDS
Chemistry: chemistry, reactions, semiquantative test
Forensic science: all that "CSI" stuff, but without the glamor

We learn to think logical and self consistently. We use the scientific
method to gather and then challenge our data and results.

The list continues. Many of us are self-taught. That is, we study a book
or test procedure and worked at it until we understand it. Most of us
still take courses, many of us have either a scope at home, or a personal
project at work that we're fooling around with. We spend some of our free
time reading the journals and literature, both current and older classical
works. We develop some amount of computer skill, if not with the
ubiquitous computer that seems to run all our modern electron scopes, word,
powerpoint and excel as well as imaging software. We learn to compose
photomicrographs as to rival art works (I'm still working on this!!).

Can you program? Do you like sales? Most of the great optical salesmen
and women I know are excellent light microscopist. How do you feel about
field-work?

Life maybe a highway, but microscopy can be a road atlas. Where do you
want to go?


stay safe.........Frank




Frank Karl
Degussa Corporation
Akron Technical Center
3500 Embassy Parkway
Suite 100
Akron, Ohio 44333


330-668-2235 Ext. 238


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sheila.blouin-at-umb
.edu To: frank.karl-at-degussa.com
cc:
09/18/2006 08:29 Subject: [Microscopy] AskAMicroscopist: What does a microscopist do all day?
AM
Please respond to
sheila.blouin








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Email: sheila.blouin-at-umb.edu
Name: Sheila

Organization: University of Massachusetts, Boston

Education: Undergraduate College

Location: Boston, MA, USA

Question: What does a microscopist do all day? What kind of education do
you have to have?

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From: NWWhite-at-bwxt.com
Date: Mon, 18 Sep 2006 08:48:47 -0500
Subject: [Microscopy] BSE image response question

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Hello All,

I am trying to understand what is happening with a set of BSE images.
Your comments will be welcome!

Below are links to two images. The first (1.5 Mb) shows two BSE images
of a nickel based super alloy (Ni-Cr-Fe-Ti). Both were acquired using a
4-diode detector, 5 kV. beam, and as close to zero degrees tilt as I
could set the stage. The top of the first image is in the "as polished"
condition, the lower portion of the image is after a very light
electro-etch. Notice the difference in channeling contrast. Z-contrast
seems largely unaffected (e.g. Ti and Cr carbide inclusions). Perhaps
the difference is from my inability to set EXACTLY the same tilt, but
they should be within a few degrees (or better) of the same value.

Why the dramatic reversal of contrast for some grains????

The second image is simply a 60 degree tilt SE image of the same general
area to show relief of the carbides due to both polishing and the etch.
...Not much.


http://www.bwxt.com/operations/images/sem/126867_859.jpg


http://www.bwxt.com/operations/images/sem/126866.jpg


Thanks,
Woody White
BWXT Services
Lynchburg, VA




==============================Original Headers==============================
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From: David.R.Hull-at-nasa.gov
Date: Mon, 18 Sep 2006 09:18:08 -0500
Subject: [Microscopy] Re: BSE image response question

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Woody,

I would be willing to bet that an oxide film may have formed during etching
and the thickness of the film varies with grain orientation. I would try
collecting the BSE images at a higher voltage (20 KV) to minimize the effect
of the film.



On 9/18/06 9:49 AM, "NWWhite-at-bwxt.com" {NWWhite-at-bwxt.com} wrote:

}
}
}
} ----------------------------------------------------------------------------
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} To Subscribe/Unsubscribe -- http://www.microscopy.com/MicroscopyListserver
} On-Line Help http://www.microscopy.com/MicroscopyListserver/FAQ.html
} ----------------------------------------------------------------------------
}
} Hello All,
}
} I am trying to understand what is happening with a set of BSE images.
} Your comments will be welcome!
}
} Below are links to two images. The first (1.5 Mb) shows two BSE images
} of a nickel based super alloy (Ni-Cr-Fe-Ti). Both were acquired using a
} 4-diode detector, 5 kV. beam, and as close to zero degrees tilt as I
} could set the stage. The top of the first image is in the "as polished"
} condition, the lower portion of the image is after a very light
} electro-etch. Notice the difference in channeling contrast. Z-contrast
} seems largely unaffected (e.g. Ti and Cr carbide inclusions). Perhaps
} the difference is from my inability to set EXACTLY the same tilt, but
} they should be within a few degrees (or better) of the same value.
}
} Why the dramatic reversal of contrast for some grains????
}
} The second image is simply a 60 degree tilt SE image of the same general
} area to show relief of the carbides due to both polishing and the etch.
} ...Not much.
}
}
} http://www.bwxt.com/operations/images/sem/126867_859.jpg
}
}
} http://www.bwxt.com/operations/images/sem/126866.jpg
}
}
} Thanks,
} Woody White
} BWXT Services
} Lynchburg, VA
}
}
}
}
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From: cammer-at-aecom.yu.edu
Date: Mon, 18 Sep 2006 10:14:33 -0500
Subject: [Microscopy] AskAMicroscopist: What does a

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Orientation is the same. No raster rotate used. In general, I tired to
use identical operating parameters.

Woody

-----Original Message-----
X-from: Carl Henderson [mailto:chender-at-umich.edu]
Sent: Monday, September 18, 2006 10:04 AM
To: White, Woody N.

Mostly we spent our time figuring out how to appease administrators who
make us spend gross amounts of time justifying our budget at the expense of
actually doing microscopy.

____________________________________________________________________________
Michael Cammer Analytical Imaging Facility Albert Einstein Coll. of Med.
URL: http://www.aecom.yu.edu/aif/


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From: john.mardinly-at-intel.com
Date: Mon, 18 Sep 2006 12:05:33 -0500
Subject: [Microscopy] viaWWW: Ghosted Image Window in Digital Micrograph

Contents Retrieved from Microscopy Listserver Archives
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Mark;
Sounds like you may need to re-install DM.

John Mardinly
Intel

The opinion of the writer does not necessarily reflect the opinion of
Intel Corporation.

-----Original Message-----
X-from: twigg-at-estd.nrl.navy.mil [mailto:twigg-at-estd.nrl.navy.mil]
Sent: Monday, September 18, 2006 5:27 AM
To: Mardinly, John

This Question/Comment was submitted to the Microscopy Listserver
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Email: twigg-at-estd.nrl.navy.mil
Name: Mark Twigg

Organization: Naval Research Laboratory

Title-Subject: [Filtered] Ghosted Image Window in Digital Micrograph

Question: The Dell Dimension 8400 (running Windows XP) on which I am
running Digital Micrograph recently crashed. After the crash the Image
widow in Digital Micrograph has been ghosted, so that I cannot insert my
Ultrascan CCD camera or attempt to record an image. I have rebooted the
PC a number of times, but to no avail. Perhaps the PC-savy people among
you have some suggestions for me here. I have mostly used Macs and am
therefore not familiar with PC ailments. Also, would it help to restart
or reset the First Light Digital Camera controller?

Thanks,

Mark

------------------------------------------------------------------------
---

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From: DusevichV-at-umkc.edu
Date: Mon, 18 Sep 2006 13:14:09 -0500
Subject: [Microscopy] RE: Remove drop of oil on EDS window

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


To wash ultrathin windows (much more fragile than Be)
I use Vertel XF from Du Pont. It will not dissolve adhesive.
Using pipette put several drops of Vertel on the metal rim of
window, so it will flow across window's surface; do not submerge
or spray it, windows like gentle handling.

Vladimir

Vladimir M. Dusevich, Ph.D.
Electron Microscope Lab Manager
371 School of Dentistry
650 E. 25th Street
Kansas City, MO 64108-2784

Phone: (816) 235-2072
Fax: (816) 235-5524
Web: http://www.umkc.edu/dentistry/microscopy



} -----Original Message-----
} From: stefan.diller-at-t-online.de [mailto:stefan.diller-at-t-online.de]
} Sent: Monday, September 18, 2006 7:30 AM
} To: Dusevich, Vladimir
} Subject: [Microscopy] Remove drop of oil on EDS window
}
}
}
}
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} Dear all,
} is there anybody out there who has experience with removing a
} small drop of diffusion pump (non silicone) oil from an EDS
} light element detector window?
} Window is made of 4um Be... (SLEW window from Roentec).
} I tried to remove the oil from the colliminator surface with
} multiple washing in 100% alcohol and it seems that I
} succeeded but I don`t know if I should use this "protocoll"
} on the more delicate Be-window...
}
} Thanks in advance for your help
} Stefan
}
}
} --------------------------------------------------------------
} --------------
} -----------------------------------------
} Stefan Diller - Scientific Photography
} Arndtstrasse 22
} D - 97072 Wuerzburg Germany
} ++49 - 931 - 7848700 Phone
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From: drteddunne-at-yahoo.com
Date: Mon, 18 Sep 2006 13:38:02 -0500
Subject: [Microscopy] AskAMicroscopist: What does a microscopist do all day?

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

It is a great question and it is tempting to be funny
in the answer, but I will resist.

I agree that it would be difficult to give a general
picture since microscopists come from so many
different fields of study.

However I would like to say this about myself - What I
do every day (amongst other things) is marvel at how
incredible nature is when magnified to reveal
otherwise hidden detail. I have been involved in
electron microscopy since 1958 and I still feel a
thrill of excitement every time I pop a specimen in
the scope and turn on the beam.

Makes the many frustrations worthwhile.

Ted Dunn
The EMscope Company
Thailand

--- sheila.blouin-at-umb.edu wrote:

}
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From: wesaia-at-iastate.edu
Date: Mon, 18 Sep 2006 16:24:39 -0500
Subject: [Microscopy] BSE image response question

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

That's very interesting Woody.

I would echo the other comment and wonder if an oxide has formed or if
you have otherwise differentially affected the sample. Do you have an
x-ray map for the area? Are the areas of the same composition so that
contrast is only due to orientation? Are the samples taken with the same
amplifier settings (i.e., contrast and brightness)?

Warren

-----Original Message-----
X-from: NWWhite-at-bwxt.com [mailto:NWWhite-at-bwxt.com]
Sent: Monday, September 18, 2006 8:50 AM
To: wesaia-at-iastate.edu

Hello All,

I am trying to understand what is happening with a set of BSE images.
Your comments will be welcome!

Below are links to two images. The first (1.5 Mb) shows two BSE images
of a nickel based super alloy (Ni-Cr-Fe-Ti). Both were acquired using a
4-diode detector, 5 kV. beam, and as close to zero degrees tilt as I
could set the stage. The top of the first image is in the "as polished"
condition, the lower portion of the image is after a very light
electro-etch. Notice the difference in channeling contrast. Z-contrast
seems largely unaffected (e.g. Ti and Cr carbide inclusions). Perhaps
the difference is from my inability to set EXACTLY the same tilt, but
they should be within a few degrees (or better) of the same value.

Why the dramatic reversal of contrast for some grains????

The second image is simply a 60 degree tilt SE image of the same general
area to show relief of the carbides due to both polishing and the etch.
...Not much.


http://www.bwxt.com/operations/images/sem/126867_859.jpg


http://www.bwxt.com/operations/images/sem/126866.jpg


Thanks,
Woody White
BWXT Services
Lynchburg, VA


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From: expectedend-at-yahoo.com
Date: Mon, 18 Sep 2006 18:18:04 -0500
Subject: [Microscopy] viaWWW: EM from a paraffin slide

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Email: expectedend-at-yahoo.com
Name: Jireh

Organization: SBMC

Title-Subject: [Filtered] EM from a paraffin slide

Question: We are doing clinical EM. Does anybody have a protocol for specimen prepraration for TEM from a paraffin slide?

---------------------------------------------------------------------------

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From: johnpchandler-at-comcast.net
Date: Mon, 18 Sep 2006 18:33:49 -0500
Subject: [Microscopy] Re: BSE image response question

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Woody,

What a great puzzler. Have you tried tilting on purpose? Perhaps going through a tilt series would be informative. One degree increments, or even half a degree could show significant changes in grey level of some grains. Just a thought.

--John

John Chandler
jpchandl-at-mines.edu



-------------- Original message ----------------------
X-from: NWWhite-at-bwxt.com
}
}
} ----------------------------------------------------------------------------
} The Microscopy ListServer -- CoSponsor: The Microscopy Society of America
} To Subscribe/Unsubscribe -- http://www.microscopy.com/MicroscopyListserver
} On-Line Help http://www.microscopy.com/MicroscopyListserver/FAQ.html
} ----------------------------------------------------------------------------
}
} Hello All,
}
} I am trying to understand what is happening with a set of BSE images.
} Your comments will be welcome!
}
} Below are links to two images. The first (1.5 Mb) shows two BSE images
} of a nickel based super alloy (Ni-Cr-Fe-Ti). Both were acquired using a
} 4-diode detector, 5 kV. beam, and as close to zero degrees tilt as I
} could set the stage. The top of the first image is in the "as polished"
} condition, the lower portion of the image is after a very light
} electro-etch. Notice the difference in channeling contrast. Z-contrast
} seems largely unaffected (e.g. Ti and Cr carbide inclusions). Perhaps
} the difference is from my inability to set EXACTLY the same tilt, but
} they should be within a few degrees (or better) of the same value.
}
} Why the dramatic reversal of contrast for some grains????
}
} The second image is simply a 60 degree tilt SE image of the same general
} area to show relief of the carbides due to both polishing and the etch.
} ...Not much.
}
}
} http://www.bwxt.com/operations/images/sem/126867_859.jpg
}
}
} http://www.bwxt.com/operations/images/sem/126866.jpg
}
}
} Thanks,
} Woody White
} BWXT Services
} Lynchburg, VA

==============================Original Headers==============================
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7, 17 -- Subject: Re: [Microscopy] BSE image response question
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From: jacques.faerber-at-ipcms.u-strasbg.fr
Date: Tue, 19 Sep 2006 03:03:30 -0500
Subject: [Microscopy] Re: BSE image response question

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html



Dear Jireh....?....at expectedend yahoo......


X-from MSA-Listserver-Archives JAN 2005:

X-from: germaine_g_boucher-at-groton.pfizer.com (by way of MicroscopyListserver)

Woody


It looks as the cristallographic contrast would dominate on chemical
contrast. As John proposed, try with tilting. Channeling is very
sensitif to smale angle tilting, half a degree to a few degree. If the
contrast changes with so smale angles, it's channelling. Than try with
higer energy.

An other question : I've never worked with a 4 sector BSE detector, but
people from FEI talked me from artifacts arasing on these. Can you work
in two sector mode, combining the four sectors in two pairs ? Try with
different pairs. Maybe it helps to understand what happens.


J. Faerber
IPCMS-GSI
(Institut de Physique et Chimie des Matériaux de Strasbourg
Groupe Surface et Interfaces)
23, rue de Loess ; BP43
67034 Strasbourg CEDEX 2
France

Tel 00 33(0)3 88 10 71 01
Fax 00 33(0)3 88 10 72 48
E-mail Jacques.Faerber-at-ipcms.u-strasbg.fr



johnpchandler-at-comcast.net a écrit :
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} ----------------------------------------------------------------------------
}
} Woody,
}
} What a great puzzler. Have you tried tilting on purpose? Perhaps going through a tilt series would be informative. One degree increments, or even half a degree could show significant changes in grey level of some grains. Just a thought.
}
} --John
}
} John Chandler
} jpchandl-at-mines.edu
}
}
}
} -------------- Original message ----------------------
} X-from: NWWhite-at-bwxt.com
}
} } ----------------------------------------------------------------------------
} } The Microscopy ListServer -- CoSponsor: The Microscopy Society of America
} } To Subscribe/Unsubscribe -- http://www.microscopy.com/MicroscopyListserver
} } On-Line Help http://www.microscopy.com/MicroscopyListserver/FAQ.html
} } ----------------------------------------------------------------------------
} }
} } Hello All,
} }
} } I am trying to understand what is happening with a set of BSE images.
} } Your comments will be welcome!
} }
} } Below are links to two images. The first (1.5 Mb) shows two BSE images
} } of a nickel based super alloy (Ni-Cr-Fe-Ti). Both were acquired using a
} } 4-diode detector, 5 kV. beam, and as close to zero degrees tilt as I
} } could set the stage. The top of the first image is in the "as polished"
} } condition, the lower portion of the image is after a very light
} } electro-etch. Notice the difference in channeling contrast. Z-contrast
} } seems largely unaffected (e.g. Ti and Cr carbide inclusions). Perhaps
} } the difference is from my inability to set EXACTLY the same tilt, but
} } they should be within a few degrees (or better) of the same value.
} }
} } Why the dramatic reversal of contrast for some grains????
} }
} } The second image is simply a 60 degree tilt SE image of the same general
} } area to show relief of the carbides due to both polishing and the etch.
} } ...Not much.
} }
} }
} } http://www.bwxt.com/operations/images/sem/126867_859.jpg
} }
} }
} } http://www.bwxt.com/operations/images/sem/126866.jpg
} }
} }
} } Thanks,
} } Woody White
} } BWXT Services
} } Lynchburg, VA
} }
}
} ==============================Original Headers==============================
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} 7, 17 -- Subject: Re: [Microscopy] BSE image response question
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From: michael-at-Shaffer.net
Date: Tue, 19 Sep 2006 06:25:43 -0500
Subject: [Microscopy] RE: BSE image response question

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Woody :o)

Can you repeat these 2 images? If so, I'd suggest duplicating this, while
being particularly careful of the conditions. That is, I have seen a BSED
flip its BEI contrast for different beam currents. Which is still a
question in my mind why it happened, but it did happen with a Cameca
multichannel (5-pair) BSED, and I watched the BEI response flip in going
from 15 to ~20nA. I thought at the time it must have been a fluke with the
BEI video amplifier.

On another note, can you can play with the effect of tilt by rotating the
stage?

cheerios :o)
michael shaffer

SEM/MLA Research Coordinator
{http://www.mun.ca/creait/maf/}
Inco Innovation Centre
Memorial University
St. John's, Newfoundland



} I am trying to understand what is happening with a set of BSE images.
} Your comments will be welcome!
}
} Below are links to two images. The first (1.5 Mb) shows two
} BSE images of a nickel based super alloy (Ni-Cr-Fe-Ti). Both
} were acquired using a 4-diode detector, 5 kV. beam, and as
} close to zero degrees tilt as I could set the stage. The top
} of the first image is in the "as polished"
} condition, the lower portion of the image is after a very
} light electro-etch. Notice the difference in channeling
} contrast. Z-contrast seems largely unaffected (e.g. Ti and
} Cr carbide inclusions). Perhaps the difference is from my
} inability to set EXACTLY the same tilt, but they should be
} within a few degrees (or better) of the same value.
}
} Why the dramatic reversal of contrast for some grains????
}
} The second image is simply a 60 degree tilt SE image of the
} same general area to show relief of the carbides due to both
} polishing and the etch.
} ...Not much.
}
}
} http://www.bwxt.com/operations/images/sem/126867_859.jpg
}
}
} http://www.bwxt.com/operations/images/sem/126866.jpg
}
}
} Thanks,
} Woody White
} BWXT Services
} Lynchburg, VA
}
}
}
}
} ==============================Original
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From: jfmjfm-at-umich.edu
Date: Tue, 19 Sep 2006 09:41:53 -0500
Subject: [Microscopy] Straining stages for the SEM

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Has anyone got any opinions on the Fullam, Deben (Gatan) and Kammrath
and Weiss strainign stages for the SEM, which is the best?
Which is the best bang for the buck?
Are there any other manufacturers?
Any help welcome.
Thanks.

--
John Mansfield PhD Cphys CSci MInstP
North Campus Electron Microbeam Analysis Laboratory
417 SRB, University of Michigan
2455 Hayward, Ann Arbor MI 48109-2143 USA
Phone: (734) 936-3352 FAX (734) 763-2282
Cell. Phone: (734) 834-3913
(Leaving a phone message at 936-3352 is preferable to 834-3913)
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Location: Lat. 42° 16' 48" Long. 83° 43' 48"
AIM: thejfmjfm
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Home address:
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Phone (734) 994-3096

Please note: Electronic Mail is not secure, but should be read
several times every day, and should definiely be used for urgent or
sensitive issues.





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From: bozhilov-at-ucr.edu
Date: Tue, 19 Sep 2006 10:01:13 -0500
Subject: [Microscopy] Hitachi TM1000

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

A feedback of any experience with the Hitachi TM1000 low vacuum
desktop scanning electron microscope regarding resolution,
performance, reliability, costs, etc. will be appreciated.

Thank you,

Krassimir N. Bozhilov
Central Facility for Advanced Microscopy and Microanalysis
University of California
Riverside, CA 92521

tel 951 827 2998
fax 951 827 2489
bozhilov-at-ucr.edu




==============================Original Headers==============================
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From: r-holdford-at-ti.com
Date: Tue, 19 Sep 2006 10:56:03 -0500
Subject: [Microscopy] Re: Hitachi TM1000

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Krassimir: I've done a little work on this fun little SEM which bridges
the gap between light microscopy and high-resolution SEM. It's very
easy to use as it has a fixed working distance, fixed apertures, and a
fixed kV (15kV). It's a tungsten gun with a maximum magnification of
10kX. I'm not sure what the resolution spec actually is but it seems to
be adequate for at least 0.5 um. The only facilities it needs is
110-115V in a regular 3-prong (USA) wall outlet. It needs no compressed
air/nitrogen or water. It connects to any computer with a USB socket
and the user interface and imaging software is very easy to use. I
understand from the rep that it's a big hit with elementary kids as they
can image their own samples with minimal instruction. I don't have any
feel for the reliability because it hasn't been on the market that long
but there's not a lot to go wrong with it, other than filament changes.
The price seems to be around $US 65K. If you supply your own computer
it's a bit less. Of course it has no EDX detector port or any other
detector ports.
I have no financial interest in this tool or Hitachi. I just think it's
way cool and wish I had one on my desk.


bozhilov-at-ucr.edu wrote:
} ----------------------------------------------------------------------------
} The Microscopy ListServer -- CoSponsor: The Microscopy Society of America
} To Subscribe/Unsubscribe -- http://www.microscopy.com/MicroscopyListserver
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} ----------------------------------------------------------------------------
}
} A feedback of any experience with the Hitachi TM1000 low vacuum
} desktop scanning electron microscope regarding resolution,
} performance, reliability, costs, etc. will be appreciated.
}
} Thank you,
}
} Krassimir N. Bozhilov
} Central Facility for Advanced Microscopy and Microanalysis
} University of California
} Riverside, CA 92521
}
} tel 951 827 2998
} fax 951 827 2489
} bozhilov-at-ucr.edu
}
}
}
}
} ==============================Original Headers==============================
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}

--
~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~
Becky Holdford (r-holdford-at-ti.com)
972-995-2360
972-648-8743 (pager)
SC Packaging FA Development
Texas Instruments, Inc.
Dallas, TX
~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~


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From: sghoshro-at-nmsu.edu
Date: Tue, 19 Sep 2006 11:19:39 -0500
Subject: [Microscopy] Re: Hitachi TM1000

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Krassimir,

We just had one installed two weeks ago in our lab. We haven't really played
with it much. But it is indeed a nice tool, doesn't take up much space, pumps
down very quickly and fairly easy to use. You can insert fresh biological
samples and image it. The max magnification you can go to is 10k. We placed it
on a heavy microtome table to minimize any vibration problem. You can contact
Marine Reef International (Paul DeGeorge) in LA area and get some more info. I
believe they are the Hitachi distributor for this instrument.

No financial interest in Hitachi or Marine Reef.

Soumitra

Quoting bozhilov-at-ucr.edu:

}
}
}
} ----------------------------------------------------------------------------
} The Microscopy ListServer -- CoSponsor: The Microscopy Society of America
} To Subscribe/Unsubscribe -- http://www.microscopy.com/MicroscopyListserver
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} ----------------------------------------------------------------------------
}
} A feedback of any experience with the Hitachi TM1000 low vacuum
} desktop scanning electron microscope regarding resolution,
} performance, reliability, costs, etc. will be appreciated.
}
} Thank you,
}
} Krassimir N. Bozhilov
} Central Facility for Advanced Microscopy and Microanalysis
} University of California
} Riverside, CA 92521
}
} tel 951 827 2998
} fax 951 827 2489
} bozhilov-at-ucr.edu
}
}
}
}
} ==============================Original
} Headers==============================
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} 7, 19 -- From: KN Bozhilov {bozhilov-at-ucr.edu}
} 7, 19 -- Subject: Hitachi TM1000
} 7, 19 -- Date: Tue, 19 Sep 2006 08:01:04 -0700
} 7, 19 -- X-Mailer: Apple Mail (2.752.2)
} 7, 19 -- X-Junkmail-Status: score=0/65, host=sentry.ucr.edu
} ==============================End of -
} Headers==============================
}


Soumitra Ghoshroy
College Associate Professor, Biology
Director, Electron Microscopy Lab
New Mexico State University
Las Cruces, NM 88003
Tel: 505-646-3268 (office)
505-646-3283 (lab)
Fax: 505-646-3282
http://biology-web.nmsu.edu/ghoshroy/ghoshroy.htm
http://emldata.nmsu.edu

==============================Original Headers==============================
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From: drteddunne-at-yahoo.com
Date: Tue, 19 Sep 2006 11:28:50 -0500
Subject: [Microscopy] AskAMicroscopist: What does a microscopist do all day?

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

I was working as a research assistant in the electron
microscopy lab of Edinburgh University Zoology
Department in Scotland. This was Scotland's first TEM,
a beautiful space-age looking Siemens Elmiskop 1b.(It
was actually installed in 1956 not 58). The pumping
system was all controlled with manual valves (had a
mercury pump and an oil diff pump if I remember
correctly) and the lens and gun alignments were all
manual. It was quite a task to align after a filament
change.

This TEM produced excellent images and we could
routinely get about 12A resolution though it was
capable of better.

We had frequent visits from German engineers to begin
with but gradually tamed the instrument. The
electronics of course were all glass tubes which I
liked because once the circuits were understood it was
comparatively easy to locate faults.

Many of the specimen techniques we had to develop
ourselves since there wasn't much in the literature. I
was very fortunate to have David Bradley work in our
department for a while since he pioneered carbon
support films which revolutionized support film
technology.

For embedding we initially had no choice but
methacrylate - not all that good but it was still
exciting to get those pictures of cellular structure
and you could get published anywhere just because the
technology was so new!

It was fun and satisfying.

Ted

--- "David L. Jones" {dljones-at-bestweb.net} wrote:

} Ted,
}
} In 1958, electron microscopy was very difficult to
} do...Where were you
} working at that time? What microscope did you work
} on? Now those were early
} machines... I'd love to hear about working with such
} an early instrument.
} My first SEM experience was on an SEM that required
} manual alignment of
} the lenses...
}
} dj
}
} On Mon, 18 Sep 2006, drteddunne-at-yahoo.com wrote:
}
} }
} }
} }
} }
}
----------------------------------------------------------------------------
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} Microscopy Society of America
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}
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}
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} }
} } It is a great question and it is tempting to be
} funny
} } in the answer, but I will resist.
} }
} } I agree that it would be difficult to give a
} general
} } picture since microscopists come from so many
} } different fields of study.
} }
} } However I would like to say this about myself -
} What I
} } do every day (amongst other things) is marvel at
} how
} } incredible nature is when magnified to reveal
} } otherwise hidden detail. I have been involved in
} } electron microscopy since 1958 and I still feel a
} } thrill of excitement every time I pop a specimen
} in
} } the scope and turn on the beam.
} }
} } Makes the many frustrations worthwhile.
} }
} } Ted Dunn
} } The EMscope Company
} } Thailand
} }
} } --- sheila.blouin-at-umb.edu wrote:
} }
} } }
} } }
} } }
} } }
} }
}
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} } }
} } } Below is the result of your feedback form
} } } (NJZFM-ultra-55). It was submitted by
} } } (sheila.blouin-at-umb.edu) from
} } }
} }
}
http://www.microscopy.com/Ask-A-Microscopist/Ask-A-Microscopist.html
} } } on Sunday, September 17, 2006 at 21:25:08
} } }
} }
}
---------------------------------------------------------------------------
} } }
} } } Email: sheila.blouin-at-umb.edu
} } } Name: Sheila
} } }
} } } Organization: University of Massachusetts, Boston
} } }
} } } Education: Undergraduate College
} } }
} } } Location: Boston, MA, USA
} } }
} } } Question: What does a microscopist do all day?
} What
} } } kind of education do you have to have?
} } }
} } }
} }
}
---------------------------------------------------------------------------
} } }
} } } ==============================Original
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} Sep
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} } } 7, 12 -- From: sheila.blouin-at-umb.edu (by way of
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} }
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} 13:38:02 2006
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} (PDT)
} } 9, 20 -- From: ted dunn {drteddunne-at-yahoo.com}
} } 9, 20 -- Subject: AskAMicroscopist: What does a
} microscopist do all day?
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__________________________________________________
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==============================Original Headers==============================
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From: martimor-at-nmsu.edu
Date: Tue, 19 Sep 2006 18:31:54 -0500
Subject: [Microscopy] viaWWW: Spurrs's

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Dear Woody,
I would suspect that the reason for the difference has more to do with the
removal of the thin, amorphous layer left on the as-polished sample, but I
must admit that the contrast reversal is dramatic. BSE can be very strange
that way and I never get the same image contrast twice on the same sample.
Try tilting slightly and watch it change, particularly when you are viewing
channeling contrast on a homogenous, single-phase sample.
Good luck,
Mary Mager
Electron Microscopist
Department of Materials Engineering
University of British Columbia
6350 Stores Road
Vancouver, B.C. V6T 1Z4
CANADA
Tel: 604-822-5648
Fax: 604-822-3619
e-mail: mager-at-interchange.ubc.ca
----- Original Message -----
X-from: {NWWhite-at-bwxt.com}
To: {mager-at-interchange.ubc.ca}
Sent: Monday, September 18, 2006 6:55 AM

This Question/Comment was submitted to the Microscopy Listserver
using the WWW based Form at http://microscopy.com/MicroscopyListserver/MLFormMail.html
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Email: martimor-at-nmsu.edu
Name: Marti

Organization: NMSU

Title-Subject: [Filtered] RE: Spurrs's

Question: Just a quick question to the listserv please about Spurrís embedding media for anyone who may know. What was update (if there was one) of the Spurr's embedding media for TEM? I believe there were some changes with the new Spurrís mixture due to a new safer component added in and switched with one of the previous hazardous ingredients which caused some noticeable changes in peopleís research. Are researchers still using their old stashes and waiting still for word on the new Spurrís resin to be corrected?

Thanks in advance!
MM


---------------------------------------------------------------------------


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From: CHudson-at-slb.com
Date: Tue, 19 Sep 2006 18:32:21 -0500
Subject: [Microscopy] viaWWW: Hitachi TM1000

Contents Retrieved from Microscopy Listserver Archives
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This Question/Comment was submitted to the Microscopy Listserver
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Email: CHudson-at-slb.com
Name: Candi

Organization: Schlumberger

Title-Subject: [Filtered] Hitachi TM1000

Question: I have the same question. Would also like to know any information/feedback of any experience with the Hitachi TM1000 low vacuum
desktop scanning electron microscope regarding resolution,
performance, reliability, costs, etc. will be appreciated.

---------------------------------------------------------------------------

==============================Original Headers==============================
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From: Rosemary.White-at-csiro.au
Date: Tue, 19 Sep 2006 19:02:33 -0500
Subject: [Microscopy] Re: viaWWW: Hitachi TM1000

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

We had one of these in the lab for a week, have never had such a stream of
visitors wanting to use the SEM! For the price, it was great. I'd echo
earlier comments - it's very easy to use - no need to gold coat, quite good
images (we were pushing the limits of its low vacuum capacity), not bad
resolution, esp. for low mag work which is where many of our taxonomists
work, compact, no need for water cooling or nitrogen venting, etc. It
survived a whole stream of inexperienced users. If we'd had the spare cash,
we would have been very tempted. It'd be nice with a cooled stage because
the low vacuum wasn't quite low enough to prevent desiccation of the most
watery specimens. Good value!

cheers,
Rosemary

Dr Rosemary White rosemary.white-at-csiro.au
Microscopy Centre ph. 61-2-6246 5475
CSIRO Plant Industry mob. 61-0402 835 973
GPO Box 1600 fax. 61-2-6246 5334
Canberra, ACT 2601
Australia



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From: emlabservices-at-cox.net
Date: Tue, 19 Sep 2006 20:14:27 -0500
Subject: [Microscopy] Hitachi TM1000

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

In response to the table top sem thread:

I suppose if one could collect a secondary electron image this could be even
more useful. As far as a low vacuum, backscattered imaging microscope
representing a "bridge" between optical and a conventional SEM, I would say
a section of the bridge is missing; namely the SEI.

Bob Roberts
EM Lab Services, Inc.
449 NW 62nd St.
Topeka, Kansas 66617-1780
785.246.1232 voice
785.246.0168 fax
www.emlabservices.com


Email: CHudson-at-slb.com
Name: Candi

Organization: Schlumberger

Title-Subject: [Filtered] Hitachi TM1000

Question: I have the same question. Would also like to know any
information/feedback of any experience with the Hitachi TM1000 low vacuum
desktop scanning electron microscope regarding resolution,
performance, reliability, costs, etc. will be appreciated.



==============================Original Headers==============================
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From: U.J.Potter-at-bath.ac.uk
Date: Wed, 20 Sep 2006 03:25:56 -0500
Subject: [Microscopy] Ghosted Image Window in Digital Micrograph

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Dear Mark,

Had the computer processor or camera control box been moved at all just
before the problem? We had a similar experience of 'greyed-out' controls
after a user moved the computer processor to find a USB point (there was an
extension lead in place but they didn't notice it!) and in the process
stressed the cable from the camera to its PC board - a plastic clip
holding the board in place had snapped and the board was loose. On securing
the board in place with a screw all was OK. We had valuable help from Gatan
with the problem.

Hope this helps
Regards
Ursula
-------------


Ursula J. Potter
Centre for Electron Optical Studies (CEOS)
Building 3 West 2.15
The University of Bath
Claverton Down
Bath BA2 7AY
UK
Tel: 01225 385651
Email: U.J.Potter-at-bath.ac.uk

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From: oshel1pe-at-cmich.edu
Date: Wed, 20 Sep 2006 07:14:06 -0500
Subject: [Microscopy] Re: viaWWW: Spurrs's

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I forgot to mention when I sent the article
citation: we are using up our current stock of
ERL 4206 (VCD), and will change to 4221 when the
current stock is gone.
Phil

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}
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}
} Title-Subject: [Filtered] RE: Spurrs's
}
} Question: Just a quick question to the listserv
} please about SpurrÌs embedding media for anyone
} who may know. What was update (if there was one)
} of the Spurr's embedding media for TEM? I
} believe there were some changes with the new
} SpurrÌs mixture due to a new safer component
} added in and switched with one of the previous
} hazardous ingredients which caused some
} noticeable changes in peopleÌs research. Are
} researchers still using their old stashes and
} waiting still for word on the new SpurrÌs resin
} to be corrected?
}
} Thanks in advance!
} MM
--
Philip Oshel
Microscopy Facility Supervisor
Biology Department
Central Michigan University
024C Brooks Hall
Mt. Pleasant, MI 48859
voice: (989) 774-3576
dept. fax: (989) 774-3462


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From: oshel1pe-at-cmich.edu
Date: Wed, 20 Sep 2006 07:35:47 -0500
Subject: [Microscopy] RE: Spurrs's

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Marti,

See the July, 2006 edition of Microscopy Today
http://www.microscopy-today.com/cgi-bin/MTWWWListingSQL.pl

E. Ann Ellis, "Solutions to the Problem of=20
Substitution of ERL 4221 for Vinyl Cyclohexene=20
Dioxide in Spurr Low Viscosity Embedding=20
=46ormulations"

Phil

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} --|
} --|Title-Subject: [Filtered] RE: Spurrs's
} --|
} --|Question: Just a quick question to the listserv=20
} --|please about Spurr=CCs embedding media for anyone=20
} --|who may know. What was update (if there was one)=20
} --|of the Spurr's embedding media for TEM? I=20
} --|believe there were some changes with the new=20
} --|Spurr=CCs mixture due to a new safer component=20
} --|added in and switched with one of the previous=20
} --|hazardous ingredients which caused some=20
} --|noticeable changes in people=CCs research. Are=20
} --|researchers still using their old stashes and=20
} --|waiting still for word on the new Spurr=CCs resin=20
} --|to be corrected?
} --|
} --|Thanks in advance!
} --|MM
--
Philip Oshel
Technical Editor, Microscopy Today
Microscopy Facility Supervisor
Biology Department
Central Michigan University
024C Brooks Hall
Mt. Pleasant, MI 48859
voice: (989) 774-3576
fax: (989) 774-3462

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From: StevenLe-at-BaylorHealth.edu
Date: Wed, 20 Sep 2006 08:19:57 -0500
Subject: [Microscopy] viaWWW: Spurrs's

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Marti,

I have not read Ann's article, but after having trouble with the plastic being very brittle after switching to 4221 with the standard "firm" formulation. I experimented and found the following formulation to provide firm blocks, very reliably, that are not brittle:

ERL 4221 - 20g
DER 736 - 16g
NSA - 50g
DMAE - .6g

The blocks are cured overnight at 70C.

Hope this helps,
Steve

Steven Lee
Chief Technologist
Electron Microscopy Laboratory
Baylor University Medical Center
3500 Gaston Ave
Dallas, TX 75246
Ph: 214.820.3302
Fx: 214.820.4110
Em: stevenle-at-baylorhealth.edu

-----Original Message-----
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Sent: Tuesday, September 19, 2006 6:44 PM
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Email: martimor-at-nmsu.edu
Name: Marti

Organization: NMSU

Title-Subject: [Filtered] RE: Spurrs's

Question: Just a quick question to the listserv please about Spurrís embedding media for anyone who may know. What was update (if there was one) of the Spurr's embedding media for TEM? I believe there were some changes with the new Spurrís mixture due to a new safer component added in and switched with one of the previous hazardous ingredients which caused some noticeable changes in peopleís research. Are researchers still using their old stashes and waiting still for word on the new Spurrís resin to be corrected?

Thanks in advance!
MM


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From: joseph_woolman-at-raytheon.com
Date: Wed, 20 Sep 2006 08:20:54 -0500
Subject: [Microscopy] viaWWW: Used FE-SEM's

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Organization: Raytheon

Title-Subject: [Filtered] Used FE-SEM's

Question: Does anyone know where to purchase a "good" used FE-SEM or FE-ESEM?

Thanks!

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From: miza069-at-yahoo.com
Date: Wed, 20 Sep 2006 08:21:30 -0500
Subject: [Microscopy] viaWWW: Assistant Professor in (S)TEM, UC-Davis

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Email: miza069-at-yahoo.com
Name: Christoph Mitterbauer

Organization: UC Davis/CHMS

Title-Subject: [Filtered] Assistant Professor in (S)TEM, UC-Davis

Question: The Department of Chemical Engineering and Materials Science invites applications for a tenure-track position at the Assistant Professor level in the area of advanced (scanning) transmission electron microscopy ((S)TEM). In the last two years, UC Davis has made a significant investment in electron microscopy facilities for both the engineering and biological sciences (including three new field-emission (S)TEMs). The current position seeks a candidate to work within this environment who has expertise in the development and application of advanced methods of imaging and analysis in (S)TEM for the engineering sciences, and who has a strong commitment to applying these methods to soft/biological materials. The successful applicant will be expected to develop an externally funded research program, assist in the routine operation and management of the microscopy facilities, and have a commitment to cross-disciplinary education at both the undergraduate and graduate level. Candidates are expected to have a PhD in materials science, physics, chemistry or related engineering discipline.

Applicants should submit a letter of application, curriculum vitae (including list of publications), description of research and teaching plans, and names and contact information of at least three references online through the following link ( http://www.chms.ucdavis.edu/employment/recruitment/). The position is open until filled; but to assure full consideration, online applications should be submitted no later than November 30, 2006, for a targeted start date of July 1, 2007.

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From: WHITTAKS-at-si.edu
Date: Wed, 20 Sep 2006 08:42:46 -0500
Subject: [Microscopy] Hitachi TM1000

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Your jobs are in jeopardy ;-)

In all seriousness Hitachi has really done a good job with this little
machine. We were invited to host a 2 day demo and I agreed, though with
reservation considering the lack of options, control and detectors. From
crate to first image was about 1.5-2 hours. This happened to be during
our "bring your kids to work" day. I opened the lab up to the
researchers and their families and the traffic was non-stop. After 10
minutes of instruction, my 9yr old son ran all the demos the first day
on an astounding array of samples. It has extremely limited choice
(often none) in terms of the usual Kv, spotsize gas pressure etc. but it
produced publishable images of nearly every sample we threw at it from
single celled dinoflagellates to crystal skulls, to bellybutton lint,
almost all of it uncoated. At the end of the demo the only real negative
thing anyone could say was that the stage did not tilt. I understand
that has been rectified and that EDS capability has been added. While it
currently cannot fully replace a dedicated research tool I estimate it
could adequately image 75% or more of the biologic material our
taxonomists study with virtually guaranteed results, no steep learning
curve and minimal training. It required a simple wall outlet, and
minimal bench space. I actually considered putting it out on the exhibit
floor. We only had it two days but I was duly impressed. At the
conclusion, my son was speaking to the engineers and called it the
"easiest microscope in the world". Guess it's time to start looking for
a new profession...

Scott Whittaker
NMNH Imaging
Smithsonian Institution
National Museum of Natural History
PO Box 37012 MRC104
Washington DC 20013-7012
202-633-0891

-----Original Message-----
X-from: bozhilov-at-ucr.edu [mailto:bozhilov-at-ucr.edu]
Sent: Tuesday, September 19, 2006 11:03 AM
To: Whittaker, Scott

A feedback of any experience with the Hitachi TM1000 low vacuum
desktop scanning electron microscope regarding resolution,
performance, reliability, costs, etc. will be appreciated.

Thank you,

Krassimir N. Bozhilov
Central Facility for Advanced Microscopy and Microanalysis
University of California
Riverside, CA 92521

tel 951 827 2998
fax 951 827 2489
bozhilov-at-ucr.edu




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From: gary-at-gaugler.com
Date: Wed, 20 Sep 2006 09:21:08 -0500
Subject: [Microscopy] Re: viaWWW: Used FE-SEM's

Contents Retrieved from Microscopy Listserver Archives
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Try angstrom.us (various brands) or semtech solutions (Amray).

gary g.

At 06:22 AM 9/20/2006, you wrote:



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From: NWWhite-at-bwxt.com
Date: Wed, 20 Sep 2006 15:20:09 -0500
Subject: [Microscopy] BSE Image Response - Thanks!

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Thanks All, for the multitude of responses to my query. The majority
vote for a slight difference in tilt angle. It is no surprise to me
that tilt/incident beam angle makes quite a difference. ...Ever try to
assemble a low magnification mosaic from BSE grain channeling images?
Impossible to match/stitch! In this case, I *thought* I was close
enough to zero to minimize the problem, I guess not.

Apparently I cannot (easily) reproduce exactly zero degrees. I am very
busy here, but if time permits will try again, making minute tilt
changes and observing the result to confirm the effect. This will,
however, not be easy with my crude stage tilt mechanism. The relatively
new digital SEM stage tilt is not very precise or controllable; much
worse than my good old ETEC was. :(

Woody White
BWXT Services



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From: ckelloes-at-mastest.com
Date: Wed, 20 Sep 2006 18:58:39 -0500
Subject: [Microscopy] viaWWW: Dispersion of polystyrene spheres

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Email: ckelloes-at-mastest.com
Name: Cathy Kelloes

Organization: Materials Analytical Services

Title-Subject: [Filtered] Dispersion of polystyrene spheres

Question: I am trying to disperse a mixture of 5, 1, .5 micron polystyrene spheres to be used for calibration. I have tried several liquids, of which none have worked. Any help would be greatly appreciated. Thank you in advance.

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From: innap-at-savion.huji.ac.il
Date: Thu, 21 Sep 2006 04:37:05 -0500
Subject: [Microscopy] Nanoindentation on Veeco D3100

Contents Retrieved from Microscopy Listserver Archives
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Dear Listers,
Please, reply me if you ever succeeded to realize Nanoindentation (especially local hardness evaluation) with Veeco SPM DI D3100.
Thank you in advance,
Best,
Inna


Dr. Inna Popov
Head of the Unit for Nanoscopic Characterization
The Center for Nanoscience and Nanotechnology
Faculty of Natural Science
The Hebrew University of Jerusalem
E. Safra Campus Givat Ram
Jerusalem 91904
ISRAEL
Phone: +972 2 6584808
Fax:     +972 2 6584809
Email: innap-at-savion.huji.ac.il
Web:  www.nanoscience.huji.ac.il/unit
 



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From: donc-at-asmicro.com
Date: Thu, 21 Sep 2006 17:01:22 -0500
Subject: [Microscopy] Nanoindentation on Veeco D3100

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Inna Popov asked about NanoIndentation using the NanoScope Dimension 3100
AFM sold by Veeco. We have done this and include this in our AFM analysis
services. What would you like to know?
regards,
Don Chernoff
==================================
Advanced Surface Microscopy, Inc. E-Mail: donc-at-asmicro.com
3250 N. Post Rd., Ste. 120 Voice: 317-895-5630
INDIANAPOLIS IN 46226 USA Toll free: 800-374-8557 (in USA & Canada)
web: http://www.asmicro.com Fax: 317-895-5652
[business activities: analytical services in AFM, AFM probes, consulting,
training,
calibration and test specimens, calibration and measurement software,
used NanoScope equipment.]

----- Original Message -----
From: innap-at-savion.huji.ac.il
To: donc-at-asmicro.com
Sent: Thursday, September 21, 2006 5:40 AM
Subject: [a] [Microscopy] Nanoindentation on Veeco D3100





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Dear Listers,
Please, reply me if you ever succeeded to realize Nanoindentation
(especially local hardness evaluation) with Veeco SPM DI D3100.
Thank you in advance,
Best,
Inna


Dr. Inna Popov
Head of the Unit for Nanoscopic Characterization
The Center for Nanoscience and Nanotechnology
Faculty of Natural Science
The Hebrew University of Jerusalem
E. Safra Campus Givat Ram
Jerusalem 91904
ISRAEL
Phone: +972 2 6584808
Fax: +972 2 6584809
Email: innap-at-savion.huji.ac.il
Web: www.nanoscience.huji.ac.il/unit







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From: jacques.faerber-at-ipcms.u-strasbg.fr
Date: Fri, 22 Sep 2006 01:32:50 -0500
Subject: [Microscopy] KT4 Pyrometer instructions

Contents Retrieved from Microscopy Listserver Archives
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Hi all

My question is not about microscopy, but I put my question on the list
as a bottle in the sea !

I'm looking after the instructions manuel for an old pyrometer I've
descoverd here, a KT4 from Heimann GmbH (Germany, now Heitronic). It's a
nice infrared pyrometer, with a Cassegrain telescope as measuring head,
which cover the range from -100 to +300°C.

Does some know this tool, and could send me a copie of the instructions
manual ?

--
J. Faerber
IPCMS-GSI
(Institut de Physique et Chimie des Matériaux de Strasbourg
Groupe Surface et Interfaces)
23, rue de Loess ; BP43
67034 Strasbourg CEDEX 2
France

Tel 00 33(0)3 88 10 71 01
Fax 00 33(0)3 88 10 72 48
E-mail Jacques.Faerber-at-ipcms.u-strasbg.fr


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From: kca-at-soton.ac.uk
Date: Fri, 22 Sep 2006 17:46:11 -0500
Subject: [Microscopy] viaWWW: Softwares to solve 3D measurements of SEM

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Email: kca-at-soton.ac.uk
Name: KC ANG

Organization: Postgraduate Student,University of Southampton

Title-Subject: [Filtered] Softwares to solve 3D measurements of SEM

Question: Hi,

I wish to know about the softwares that can solve and present 3D images for SEM. Currently, I only manage to have 2D images captured. Is it possible to measure angles of features using SEM?

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From: andel-at-cperi.certh.gr
Date: Fri, 22 Sep 2006 17:46:41 -0500
Subject: [Microscopy] viaWWW: CCD cameras for TEM

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Email: andel-at-cperi.certh.gr
Name: Andreas Delimitis

Organization: Centre for Research & Technology Hellas - CPERI

Title-Subject: [Filtered] CCD cameras for TEM

Question: Dear Listers,

I am looking for suggestions (vendors are also welcome - off list) for a bottom mounted CCD camera to be installed on a JEOL 2010 TEM. The microscope is primarily used for characterisation of electron beam sensitive materials, such as zeolites, catalysts and biological samples, so low-dose imaging conditions are required.

I am aware of two models from two major competitors in the market -but any other suggestion is more than welcome: the first provides a full-frame, 16 bit, 4.2 Mpx slow scan camera with a pixel size of 13.5x13.5 microns, while the second gives an interline, 14 bit, 11Mpx fast rate camera with a pixel size of 9x9 microns. However, there is no information about low-dose imaging, along with SAD, microdiffraction and CBED pattern aquisition for these cameras.

User suggestions are especially welcome.

Thanks in advance,
Andreas


Dr. Andreas Delimitis
Centre for Research & TEchnology Hellas (CERTH)
Chemical Process Engineering Research Institute (CPERI)
Thermi, Thessaloniki
Greece

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From: bpletc-at-ufl.edu
Date: Fri, 22 Sep 2006 17:47:10 -0500
Subject: [Microscopy] viaWWW: Tenupol-2 Sample Holder

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Email: bpletc-at-ufl.edu
Name: Ben Pletcher

Organization: University of Florida

Title-Subject: [Filtered] Tenupol-2 Sample Holder

Question: I have just relocated to the University of Florida and am repairing a Tenupol-2 electro-jet polisher. There are no sample holders. Struers does have a few left, but wanted to know if anyone had an old system lying around with spare sample holders and/or parts. I would greatly appreciate any help as I have a very limited budget. The parts of greatest help would be the light and sensor unit for automatically shut-off.

Thank you in advance,

Ben Pletcher

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From: jmkrupp-at-ucsc.edu
Date: Fri, 22 Sep 2006 18:02:06 -0500
Subject: [Microscopy] microvolume measuring

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List:

Anyone have an idea about how I can help a researcher interested in
measuring microvolumes in his sample?

Here is the set up. Geologist laser drills holes into zircons and
captures the 'smoke'. He does some fancy analysis and gets the info
he needs, except, he wants to know the volume of the hole.

Holes are up to 40um in dia., between 5 and 20 um deep. Material is
zircon, ZrSiO2.

He has used something called a vertical scanning interferometer, but
the one he has used is broken or not longer available. He was looking
for some other solution.

He came asking about confocal microscopy. I'm not sure our confocal
will do anything for him, but we will give it a try. I suggested SEM,
but he doesn't want to coat the sample. I thought FIB type machine,
but we don't have one.

He says if he finds the right technique, he may be doing tens to
hundreds of holes, so some automation or at least quick and easy
procedure is what he is looking for.

Any ideas?

Thanks

Jon
--


Jonathan Krupp
Microscopy & Imaging Lab
C230 Earth & Marine Science
University of California
Santa Cruz, CA 95064
(831) 459-2477
jmkrupp-at-ucsc.edu

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From: donovan-at-uoregon.edu
Date: Fri, 22 Sep 2006 18:47:16 -0500
Subject: [Microscopy] Re: microvolume measuring

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This is easy with the Alicona Mex software. It allows "stereo" or
even tri SEM images to be mathematically combined to produce a DEM.
We use a VPSEM and there is no need to coat, one only needs a tilt stage.

john

At 04:06 PM 9/22/2006, you wrote:



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From: tivol-at-caltech.edu
Date: Fri, 22 Sep 2006 18:50:58 -0500
Subject: [Microscopy] Re: microvolume measuring

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On Sep 22, 2006, at 4:02 PM, jmkrupp-at-ucsc.edu wrote:

} Anyone have an idea about how I can help a researcher interested in
} measuring microvolumes in his sample?
}
} Here is the set up. Geologist laser drills holes into zircons and
} captures the 'smoke'. He does some fancy analysis and gets the info
} he needs, except, he wants to know the volume of the hole.
}
} Holes are up to 40um in dia., between 5 and 20 um deep. Material is
} zircon, ZrSiO2.
}
} He has used something called a vertical scanning interferometer, but
} the one he has used is broken or not longer available. He was looking
} for some other solution.
}
} He came asking about confocal microscopy. I'm not sure our confocal
} will do anything for him, but we will give it a try. I suggested SEM,
} but he doesn't want to coat the sample. I thought FIB type machine,
} but we don't have one.
}
} He says if he finds the right technique, he may be doing tens to
} hundreds of holes, so some automation or at least quick and easy
} procedure is what he is looking for.
}
} Any ideas?
}
Dear Jon,
If the confocal can generate a reflection mode signal from the surface
of the zircon, that should enable the estimation of the volumes of the
holes. If, further, you know that the walls are not undercut, then the
volumes will be measured pretty accurately. If the walls are
undercut--the hole is wider at the bottom than at the top--you will
have to tilt the specimen until the wall is visible all the way down,
and it will take more than one tilt direction to see the whole wall,
but the volume can be accurately measured. I have no good idea how to
automate the process except in the case where the walls are either
straight or converging, and where the holes are regularly spaced or can
be found automatically, then a program such as Leginon could be adapted
to collect confocal data. Good luck.
Yours,
Bill Tivol, PhD
EM Scientist and Manager
Cryo-Electron Microscopy Facility
Broad Center, Mail Code 114-96
California Institute of Technology
Pasadena CA 91125
(626) 395-8833
tivol-at-caltech.edu


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From: equine.scientist-at-yahoo.com
Date: Sun, 24 Sep 2006 17:05:40 -0500
Subject: [Microscopy] AskAMicroscopist: manual for a really old microscope

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-----Original Message-----
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Sent: Fri, 22 Sep 2006 6:47 PM

Below is the result of your feedback form (NJZFM-ultra-55). It was submitted by (equine.scientist-at-yahoo.com) from http://microscopy.com/Ask-A-Microscopist/Ask-A-Microscopist.html on Sunday, September 24, 2006 at 12:32:49
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Email: equine.scientist-at-yahoo.com
Name: Ryelei K. Sejavka

Organization: Kangaroo Valley Primary School

Education: K-8 Grade Grammar School

Location: Kangaroo Valley, New South Wales, Australia

Question: How do I find the manual for a really old microscope? On the front it says Sears 49-24364 400-1200 Power Z-O-O-M Microscope.

Thank you kindly.

Ryelei K.

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From: keith-jackson-at-tesco.net
Date: Sun, 24 Sep 2006 17:06:35 -0500
Subject: [Microscopy] AskAMicroscopist: raw data picked up from the electrons

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Below is the result of your feedback form (NJZFM-ultra-55). It was su