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From: modla-at-dbi.udel.edu
Date: Fri, 1 Jun 2007 07:50:14 -0500
Subject: [Microscopy] viaWWW: Metal Shadow Casting of DNA

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Email: modla-at-dbi.udel.edu
Name: Shannon Modla

Organization: Delaware Biotechnology Institute

Title-Subject: [Filtered] Metal Shadow Casting of DNA

Question: We are currently trying to rotary shadow cast DNA but are having problems obtaining consistent results with the metal shadowing. We are using an 80:20 platinum palladium wire purchased from EMS and a Denton Bench Top Turbo III sputter coater. The platinum palladium wire was wrapped around a 2-3 cm portion of a hairpin loop formed with tungsten wire. When the filament power is increased, the platinum palladium wire will either heat up without melting and evaporating or else the tungsten wire breaks without appreciable metal shadowing. I was wondering if anyone had any experience with this technique and could offer suggestions about how to obtain more consistent results.

Thanks,

Shannon Modla
Delware Biotechnology Institute
BioImaging Center


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From: xyang-at-SMU.CA
Date: Fri, 1 Jun 2007 08:32:08 -0500
Subject: [Microscopy] vendors on CL-microscope

Contents Retrieved from Microscopy Listserver Archives
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Hello all,

The geology department is looking for recommendation on getting a
Cathodoluminescence-Optical Microscope for geological research purpose.
Samples to be view would include but not limited to Zircon, Quartz, and
carbonates. We appreciate any recommendations and experiences you may have
on such instrumentation. Thanks in advance!

Best Regards,
----------------------------------------------
Xiang Yang
Electron Microscopy Center
Saint Mary's University
Science Building, Suite 135
Halifax, NS Canada B3H 3C3
Tel: (902) 496-8292 (lab)
(902) 420-5709 (off)
http://fgsr.smu.ca/emc/


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From: DusevichV-at-umkc.edu
Date: Fri, 1 Jun 2007 08:54:07 -0500
Subject: [Microscopy] RE: viaWWW: Question about image on Glass

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Allen,

Our UC-4 has never been re-evacuated. It has a yellow plastic cap over
the port, the port is filled with a pink grease, and under the pink
grease it looks like a metal ball. I can't say any more, but it looks
like the metal ball is original.

Diane Ciaburri

-----Original Message-----
X-from: oddioeng-at-aol.com [mailto:oddioeng-at-aol.com]
Sent: Thursday, May 31, 2007 10:53 PM
To: Ciaburri, Diane A.

What for did you "spin 200nm PMMA on the surface?"
As I understand, you have just glassy flat surface of resin on your
specimen, with no topography and nothing to observe.

Vladimir

Vladimir M. Dusevich, Ph.D.
Electron Microscope Lab Manager
371 School of Dentistry
650 E. 25th Street
Kansas City, MO 64108-2784

Phone: (816) 235-2072
Fax: (816) 235-5524
Web: http://www.umkc.edu/dentistry/microscopy


}
} Email: yitianp-at-ece.arizona.edu
} Name: Yitian Peng
}
} Organization: University of Arizona
}
} Title-Subject: [Filtered] Question about image on Glass.
}
} Question: Hi everyone,
} I have some patterned Cr structure(width:100micro,
} height:60nm) on Glass.
} Then I spin 200nm PMMA on the surface.
} Then I Sputter 10nm Cr on the PMMA.
} I want to using JSM 6400 SEM to look at the structure.
} But I can't see anything?/
} What's the problem?/
} Thank you very much.
} Yitian
}
}
} --------------------------------------------------------------
} -------------
}
} ==============================Original
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From: kraftpiano-at-gmail.com
Date: Fri, 1 Jun 2007 09:06:48 -0500
Subject: [Microscopy] Unfortunate announcement.

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

I'm not entirely sure if this is appropriate for this list, and if it
isn't I apologize in advance. I was just informed yesterday that my
position as science teacher at Atlantis Academy has been eliminated,
and that the math teacher will be teaching both subjects. It is
unfortunately a sad commentary on the direction that our world is
headed in.

I am making an appeal to anyone in the south Florida area who may need
some extra lab help, or anything that I can do. My prospects for
getting a new teaching job are not good until later in the summer, but
I would really like to start working somewhere locally as a lab
assistant so I can start working on my masters degree.

I know this is a bit of a shot in the dark, but I figured there'd be
no harm in asking.

Thank you all for your kind support over the last few months on our
SEM project. I am truly sorry that I will not be able to see it come
to fruition.

--Justin A. Kraft

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From: smalinskas-at-yahoo.com
Date: Fri, 1 Jun 2007 09:44:16 -0500
Subject: [Microscopy] RE: viaWWW: Question about image on Glass

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

I was once given the task of looking at a glassy
surface in the SEM. Just to rough in the focus was a
challenge. I sprinkled some powder on the surface to
provide a starting point for focus. Maybe this would
help you get started.

Otherwise, I agree with Vladimir... that PMMA - though
optically transparent - is not electron transparent,
and all you'll see is the Cr-sputter-coated polymer
surface.

Stu Smalinskas, P.E.
Metallurgist
SKF USA
Plymouth, Michigan
(734)414-6862

~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~
Vladimir wrote:

What for did you "spin 200nm PMMA on the surface?"
As I understand, you have just glassy flat surface of
resin on your specimen, with no topography and nothing
to observe.

Vladimir

Vladimir M. Dusevich, Ph.D.
Electron Microscope Lab Manager
371 School of Dentistry
650 E. 25th Street
Kansas City, MO 64108-2784

Phone: (816) 235-2072
Fax: (816) 235-5524
Web: http://www.umkc.edu/dentistry/microscopy

~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~

Yitian wrote:

Title-Subject: [Filtered] Question about image on
Glass.

Question:
Hi everyone, I have some patterned Cr structure
(width: 100micro, height: 60nm) on Glass. Then I spin
200nm PMMA on the surface. Then I Sputter 10nm Cr on
the PMMA. I want to using JSM 6400 SEM to look at the
structure. But I can't see anything? What's the
problem?

Thank you very much.

Yitian

Email: yitianp-at-ece.arizona.edu
Name: Yitian Peng
Organization: University of Arizona




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Go to the Yahoo! Mail Q&A for great tips from Yahoo! Answers users.
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From: dac-at-research.umass.edu
Date: Fri, 1 Jun 2007 09:55:16 -0500
Subject: [Microscopy] Re: viaWWW: Metal Shadow Casting of DNA

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Shannon,

I don't know the particulars of operation of the evaporator unit and my
knowledge is for pure gold or platinum (some metals will alloy with the
tungsten and cause problems - maybe someone else knows).

Platinum MP = 1772 C
Tungsten MP = 3410 C

If the Pt wire is not melting, then the tungsten temperature is too low.
If you advance the filament heating slowly (a few seconds for work, but
slower in testing until you know the behaviour) you should first see the
Pt:Pd wire melt and flow to the bottom of the hairpin (the point of the
V is down) and the droplet will evaporate at a slightly higher
temperature. Actually you only need to put the wire near the tip of the V.

Just remember to heat the filament over a few seconds, not instantly.
Tungsten has a positive temperature coefficient and the filament
resistance is initially low and a large surge will occur if full voltage
is applied directly - it can cause the evaporant wire to spit or the
filament to burn out; but you shouldn't need to be that close to the
tungten melting point.

You don't specify distances but it sounds like you are using a lot of
wire. You probably only need 10-20Å. 0.5 cm of 8 mil wire at 10 cm
distance will give ~13 Å (at normal incidence, or the sides of DNA so
disposed....)

Å = (40.3 * diameter^2 * Length) / distance^2

diameter in "mils" (0.001"), 8 mils is a standard size, 0.008" dia
length of wire evaporant, distance to sample in cm

I have an Excel spreadsheet with a "calculator" for this formula that I
can send if you want - can't go to the Microscopy Listserver..... Just ask.

Hope this helps.

Dale Callaham
Univ. of Massachusetts, Amherst


modla-at-dbi.udel.edu wrote:
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} ---------------------------------------------------------------------------
}
} Email: modla-at-dbi.udel.edu
} Name: Shannon Modla
}
} Organization: Delaware Biotechnology Institute
}
} Title-Subject: [Filtered] Metal Shadow Casting of DNA
}
} Question: We are currently trying to rotary shadow cast DNA but are having problems
obtaining consistent results with the metal shadowing. We are using an
80:20
platinum-palladium wire purchased from EMS and a Denton Bench Top Turbo
III sputter coater.
The platinum palladium wire was wrapped around a 2-3 cm portion of a
hairpin loop formed
with tungsten wire. When the filament power is increased, the platinum
palladium wire will
either heat up without melting and evaporating or else the tungsten wire
breaks without
appreciable metal shadowing. I was wondering if anyone had any
experience with
this technique and could offer suggestions about how to obtain more
consistent results.
}
} Thanks,
}
} Shannon Modla
} Delware Biotechnology Institute
} BioImaging Center
}
}
} ---------------------------------------------------------------------------
}
} ==============================Original Headers==============================
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From: kenconverse-at-qualityimages.biz
Date: Fri, 1 Jun 2007 10:14:02 -0500
Subject: [Microscopy] test

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Sorry to occupy your mailbox, but I've had a couple of posts that didn't.
Ken


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Since 1981
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207-647-4348
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kenconverse-at-qualityimages.biz
qualityimages.biz






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From: kross-at-laurentian.ca
Date: Fri, 1 Jun 2007 10:15:10 -0500
Subject: [Microscopy] Oxford, EDS deadtime

Contents Retrieved from Microscopy Listserver Archives
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I have recently had a power outage and when I re-started my JEOL 6400 equipped OXFORD INCA X-sight the INCA software gave me an error stating "(1426)DSPP Failed Board" and my deadtime is 99% even with no beam. Can anyone help? Are the two errors related?
Thanks
Kirk


==============================Original Headers==============================
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From: kross-at-laurentian.ca
Date: Fri, 1 Jun 2007 11:01:03 -0500
Subject: [Microscopy] Oxford, EDS deadtime, problem solved

Contents Retrieved from Microscopy Listserver Archives
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when all else fails, reboot and your problems will be solved
thanks
Kirk


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From: gary-at-gaugler.com
Date: Fri, 1 Jun 2007 11:06:06 -0500
Subject: [Microscopy] Re: Oxford, EDS deadtime

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

They might be related. However, first thing to do is
to home the stage. There should be an option in the
SEM control to initialize the stage. Do this. If the
stage uses LEDs, this will drive the EDS nuts with high
cps and high DT. Restart PC.

If this does not fix the problem, then you might have
a damaged board from the power outage.

gary g.


At 07:16 AM 6/1/2007, you wrote:




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From: mdufraine-at-ebsciences.com
Date: Fri, 1 Jun 2007 11:21:42 -0500
Subject: [Microscopy] Re: viaWWW: Advice on critical point dryers

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Margret-

Energy Beam Sciences is the US distributor for Quorum Technologies,
which handles both the Polaron, and Emitech line of preparation
equipment, including Critical Point Dryers.

Quorum offers both a horizontal and vertical style CPD system, with the
horizontal style the user has the advantage of working with small or
large samples based on the chamber set-up, with the vertical system
offering more of the automatic features.

I'll look to contact you off-line to share details on the systems and
your needs.

Regards,

Mike Dufraine
Energy Beam Sciences,Inc.

mdienelt-at-msn.com wrote:
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} Email: mdienelt-at-msn.com
} Name: Margaret Dienelt
}
} Organization: USDA, ARS, National Arboretum
}
} Title-Subject: [Filtered] Advice on critical point dryers
}
} Question: Hello everyone,
}
} I've just learned we might have funds to replace our ancient,
} tempermental critical point dryer and would greatly appreciate any
} feedback anyone can give me on their CPD. I'm especially interested
} in reliability - the valves in our current unit have been a problem
} for years, requiring numerous repairs (usually after destroying a few
} samples).
}
} In addition to information anyone can share on specific models, I
} also have two general questions:
}
} What the pros and cons are to the two profiles, i.e. horizontal (like
} Tousimis) and vertical (like Polaron)?
}
} What are pros and cons to automatic vs manual models?
}
} Basically, any wisdom you'd like to share about purchasing a new
} critical point dryer will be more than welcome. Our new one will be
} used in a plant pathology lab and will be used to process primarily
} plant tissue. We don't need one for a clean room or one with the
} jumbo chamber.
}
} I'm sending this from my personal e-mail account since I'm having
} problems with my government e-mail, but if replies are sent to
} mdienelt-at-msn.com or margaret.dienelt-at-ars.usda.gov. I'll receive them
} one way or the other.
}
} Thank you!
}
} Margaret
}
}
}
} Margaret Dienelt
} Plant Pathologist/Electron Microscopist
} Floral and Nursery Plants Research Unit
} National Arboretum, ARS, USDA
}
} 10300 Baltimore Avenue
} Beltsville, MD 20705
}
} (301)504-6097
}
}
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} ==============================Original Headers==============================
} 20, 11 -- From zaluzec-at-microscopy.com Thu May 31 15:08:33 2007
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} ==============================End of - Headers==============================
}

--
Michael F. Dufraine
EM - Product Manager
TEL 800-992-9037 X340
MDufraine-at-ebsciences.com
www.ebsciences.com


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From: beaurega-at-westol.com
Date: Fri, 1 Jun 2007 12:00:14 -0500
Subject: [Microscopy] Re: test

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Ken,

No problem but you bring up a good point. I sent a posting and it didn't
show up on the list server. A recent one involved a person in IL. I sent
him a direct posting and a dseparate email posting to the list server.
Nothing bounced back from either email but the later posting never made it
to the list.

I fact, I see replies to postings before I ever see the original posting.
I know things get delayed and that delays happen. It's not Nestor's fault.
'It's a server time slicing or sharing thing', IMO.
In the next day or two, I might get the original posting. I have no
problem there. My problem is that sometimes I never get or will ever
receive the original posting (even my own).

So the other day after my posting failed, I sent a short posting to test my
ability to still post to the list. I relied to:
Re: [Microscopy] Re: AskAMicroscopist: Image Pro Analysis Question - URL
with an Image and micrscopy-at-microscopy.com.
My reply was posted and my posting received a reply from Mike Bode.

After a week and a half, my first posting still has never showed up.

I can see why some postings come through in double postings. I figure
members know this 'lack of posting' problem and so they send double postings.

Paul

At 10:14 AM 6/1/07 -0500, you wrote:
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From: info-at-nomadmet.com
Date: Fri, 1 Jun 2007 17:45:12 -0500
Subject: [Microscopy] viaWWW: looking for Image Analysis software

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

I apologize if I was supposed to post this response to the list. Sometimes
I don't see if a message comes from the group or an individual...

dj

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Email: info-at-nomadmet.com
Name: Tom Doggart

Organization: Nomad Metallurgy, Inc

Title-Subject: [Filtered] Image Analysis software

Question: I am looking for a user friendly image analysis package to use with my Spot and Nikon cameras and/or their JPEG files. I would like it to do the following at a minimum:



A) Various linear and area measurement
B) Phase % calculations for at least 3 phases in a structure
C) Image Montague or stitching
D) Expanded focus capabilities



Do you have any experience with any system that can do this?


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From: phillipst-at-missouri.edu
Date: Fri, 1 Jun 2007 17:50:22 -0500
Subject: [Microscopy] Re: viaWWW: looking for Image Analysis software

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Regardless of which software package you go with, my recommendation for
your first step is to save your images as TIFFs!


At 05:47 PM 06/01/07, you wrote:



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Thomas E. Phillips, PhD
Professor of Biological Sciences
Director, Molecular Cytology Core
2 Tucker Hall
University of Missouri
Columbia, MO 65211-7400

573-882-4712 (office)
573-882-0123 (fax)
PhillipsT-at-missouri.edu
http://www.biology.missouri.edu/faculty/phillips.html
http://www.biotech.missouri.edu/mcc/


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From: gary-at-gaugler.com
Date: Fri, 1 Jun 2007 17:55:26 -0500
Subject: [Microscopy] Re: viaWWW: looking for Image Analysis software

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

I use analySIS Opti s/w with Prior E103 Z control
to do slice stacking. I don't know if Opti will
control your cameras. I use Pixera 600CL and Olympus
DP-70 (same driver). Opti controls the Prior stage.

There are several stitching programs. They all have
plusses and minusses.

gary g.


At 02:47 PM 6/1/2007, you wrote:




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10, 20 -- Subject: Re: [Microscopy] viaWWW: looking for Image Analysis software
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From: jquinn-at-www.matscieng.sunysb.edu
Date: Sat, 2 Jun 2007 11:51:44 -0500
Subject: [Microscopy] Re: viaWWW: looking for Image Analysis software

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

ImageJ
http://rsb.info.nih.gov/ij/


--
Shawn Mikula, Ph.D.,
Postdoctoral Scholar
Center for Neuroscience
University of California-Davis,
1544 Newton Court,
Davis, CA 95618,
Phone: 530-754-9209
Fax: 530-754-9136
mail: samikula-at-ucdavis.edu
web: http://brainmaps.org



----- Original Message -----
X-from: {info-at-nomadmet.com}
To: {samikula-at-ucdavis.edu}
Sent: Friday, June 01, 2007 3:53 PM

I have used VIS by Visiopharm. It has incredible segmentation capabilities
that are attached to a database. You can build essentially a program to
separate an image into the regions of interest and then to all sorts of
calculations. This is all done by simple clicking.

----- Original Message -----
X-from: {info-at-nomadmet.com}
To: {rboehrin-at-vt.edu}
Sent: Friday, June 01, 2007 6:53 PM

Tom

Definitely do not use JPEG. Why spend the
money on a quality microscope and quality camera,
and then save the image in a bad file-format?

For "expanded (sic extended) focus", you should
consider using CombineZ5 (or ZM) and/or Helicon
Focus. Each has excellent support and cost.

I would also plug ImageJ and the excellent support/cost.

regards,

Jim


} From mail-at-ns.microscopy.com Fri Jun 1 18:44:41 2007
} Date: Fri, 1 Jun 2007 17:46:48 -0500
} To: jquinn-at-www.matscieng.sunysb.edu
} From: info-at-nomadmet.com
} Reply-to: info-at-nomadmet.com
} X-Resent-From: "Microscopy Listserver" {microscopy-at-microscopy.com}
} Subject: [Microscopy] viaWWW: looking for Image Analysis software
} Errors-To: MicroscopyListSpamFilter-at-microscopy.com
} X-lewp: MicroscopyListSpam NAGS
}
}
}
}
} ----------------------------------------------------------------------------
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} ----------------------------------------------------------------------------
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} ---------------------------------------------------------------------------
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} please copy both info-at-nomadmet.com as well as the MIcroscopy Listserver
} ---------------------------------------------------------------------------
}
} Email: info-at-nomadmet.com
} Name: Tom Doggart
}
} Organization: Nomad Metallurgy, Inc
}
} Title-Subject: [Filtered] Image Analysis software
}
} Question: I am looking for a user friendly image analysis package to use with my Spot and Nikon cameras and/or their JPEG files. I would like it to do the following at a minimum:
}
}
}
} A) Various linear and area measurement
} B) Phase % calculations for at least 3 phases in a structure
} C) Image Montague or stitching
} D) Expanded focus capabilities
}
}
}
} Do you have any experience with any system that can do this?
}
}
} ---------------------------------------------------------------------------
}
} ==============================Original Headers==============================
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}


==============================Original Headers==============================
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9, 12 -- Received: from www.matscieng.sunysb.edu (www.matscieng.sunysb.edu [129.49.36.33])
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9, 12 -- To: info-at-nomadmet.com, microscopy-at-microscopy.com
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==============================End of - Headers==============================




From: bfoster-at-mme1.com
Date: Mon, 4 Jun 2007 00:17:14 -0500
Subject: [Microscopy] viaWWW: Metal Shadow Casting of DNA

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Sharon,

If the DNA is already attached to a substrate,
I'd really suggest that you try AFM instead. It
will give you essentially atomic level
resolution, without any disruptive coating.

Contact me off line if you need more info.

Thanks
Barbara

At 12:12 AM 6/4/2007, dac-at-research.umass.edu wrote:



} ----------------------------------------------------------------------------
} The Microscopy ListServer -- CoSponsor: The Microscopy Society of America




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From: cgarber-at-2spi.com
Date: Mon, 4 Jun 2007 00:59:12 -0500
Subject: [Microscopy] Shadowing with Pt for TEM

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Dale Callaham wrote:
==================================================================
} I don't know the particulars of operation of the evaporator unit and my
} knowledge is for pure gold or platinum (some metals will alloy with the
} tungsten and cause problems - maybe someone else knows).
}
} Platinum MP = 1772 C
} Tungsten MP = 3410 C
}
} If the Pt wire is not melting, then the tungsten temperature is too low.
} If you advance the filament heating slowly (a few seconds for work, but
} slower in testing until you know the behaviour) you should first see the
} Pt:Pd wire melt and flow to the bottom of the hairpin (the point of the
} V is down) and the droplet will evaporate at a slightly higher
} temperature. Actually you only need to put the wire near the tip of the V.
}
} Just remember to heat the filament over a few seconds, not instantly.
} Tungsten has a positive temperature coefficient and the filament
} resistance is initially low and a large surge will occur if full voltage
} is applied directly - it can cause the evaporant wire to spit or the
} filament to burn out; but you shouldn't need to be that close to the
} tungten melting point.
}
} You don't specify distances but it sounds like you are using a lot of
} wire. You probably only need 10-20Å. 0.5 cm of 8 mil wire at 10 cm
} distance will give ~13 Å (at normal incidence, or the sides of DNA so
} disposed....)
}
} Å = (40.3 * diameter^2 * Length) / distance^2
}
} diameter in "mils" (0.001"), 8 mils is a standard size, 0.008" dia
} length of wire evaporant, distance to sample in cm
=================================================================
I have always thought that the best way to "shadow" was to use the "Pt/C sesile drop" method. I learned about it many
years ago in graduate school and don't know who used it originally. But one gets a finer grain if Pt/C is evaporated
simultaneously than if Pt alone is evaporated. The way to do this is to take a carbon rod that has been sharpened down
to a "neck", wrap about the "neck" not more than 30-40 mm of 8 mil Pt wire, put the bell jar onto the vacuum evaporator
but don't pump down. Slowly increase the current through the carbon rods to the point where, just beyond cherry red,
the Pt melts and because of surface tension effects, and the fact that liquid Pt does not want to wet carbon, it "beads
up", just as water does on a freshly waxed car. Once this happens, turn off the current, and when it cools down, rotate
the bead so that it is facing the surface to be shadowed.

Then the bell jar is put in place, the chamber pumped down, and the carbon rod is evaporated but what really comes off
is a combination of Pt and C.

Note: The optimum amount of wire to be used depends on a)distance to the substrate to be coated and b) shadowing angle.

Since Pt wants to alloy readily with W, this approach avoids all those other issues as well.

Disclaimer: SPI Supplies offers on our website Pt wire and presharpened carbon rods so we would have a vested interest
in seeing this technique used more rather than less frequently.

Chuck

===================================================
Charles A. Garber, Ph. D. Ph: 1-(610)-436-5400
President
SPI SUPPLIES FAX: 1-(610)-436-5755
PO BOX 656 e-mail: cgarber-at-2spi.com
West Chester, PA 19381-0656 USA Cust. Service: spi2spi-at-2spi.com


Look for us!
############################
WWW: http://www.2spi.com
############################
==================================================

==============================Original Headers==============================
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From: donc-at-asmicro.com
Date: Mon, 4 Jun 2007 08:29:44 -0500
Subject: [Microscopy] Re: [a] viaWWW: Metal Shadow Casting of DNA

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

I second Barbara Foster's suggestion. For an example of DNA imaging by AFM,
see our website:
http://www.asmicro.com/Applications/DNA_Molecules.htm

regards,
Don
=============================================
Don Chernoff, Ph.D., President
Advanced Surface Microscopy, Inc. E-Mail: donc-at-asmicro.com
3250 N. Post Rd., Ste. 120 Voice: 317-895-5630
INDIANAPOLIS IN 46226 USA Toll free: 800-374-8557 (in USA & Canada)
web: http://www.asmicro.com Fax: 317-895-5652
[business activities: analytical services in AFM, AFM probes, consulting,
training,
calibration and test specimens, calibration and measurement software,
used NanoScope equipment.]
=============================================
----- Original Message -----
From: bfoster-at-mme1.com
To: donc-at-asmicro.com
Sent: Monday, June 04, 2007 1:21 AM
Subject: [a] [Microscopy] viaWWW: Metal Shadow Casting of DNA





----------------------------------------------------------------------------
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Sharon,

If the DNA is already attached to a substrate,
I'd really suggest that you try AFM instead. It
will give you essentially atomic level
resolution, without any disruptive coating.

Contact me off line if you need more info.

Thanks
Barbara

At 12:12 AM 6/4/2007, dac-at-research.umass.edu wrote:



} ----------------------------------------------------------------------------
} The Microscopy ListServer -- CoSponsor: The Microscopy Society of
America
} To Subscribe/Unsubscribe --
http://www.microscopy.com/MicroscopyListserver
} On-Line Help http://www.microscopy.com/MicroscopyListserver/FAQ.html
} ----------------------------------------------------------------------------
}
} Shannon,
}
} I don't know the particulars of operation of the evaporator unit and my
} knowledge is for pure gold or platinum (some metals will alloy with the
} tungsten and cause problems - maybe someone else knows).
}
} Platinum MP = 1772 C
} Tungsten MP = 3410 C
}
} If the Pt wire is not melting, then the tungsten temperature is too low.
} If you advance the filament heating slowly (a few seconds for work, but
} slower in testing until you know the behaviour) you should first see the
} Pt:Pd wire melt and flow to the bottom of the hairpin (the point of the
} V is down) and the droplet will evaporate at a slightly higher
} temperature. Actually you only need to put the wire near the tip of the
V.
}
} Just remember to heat the filament over a few seconds, not instantly.
} Tungsten has a positive temperature coefficient and the filament
} resistance is initially low and a large surge will occur if full voltage
} is applied directly - it can cause the evaporant wire to spit or the
} filament to burn out; but you shouldn't need to be that close to the
} tungten melting point.
}
} You don't specify distances but it sounds like you are using a lot of
} wire. You probably only need 10-20Å. 0.5 cm of 8 mil wire at 10 cm
} distance will give ~13 Å (at normal incidence, or the sides of DNA so
} disposed....)
}
} Å = (40.3 * diameter^2 * Length) / distance^2
}
} diameter in "mils" (0.001"), 8 mils is a standard size, 0.008" dia
} length of wire evaporant, distance to sample in cm
}
} I have an Excel spreadsheet with a "calculator" for this formula that I
} can send if you want - can't go to the Microscopy Listserver..... Just
ask.
}
} Hope this helps.
}
} Dale Callaham
} Univ. of Massachusetts, Amherst
}
}
} modla-at-dbi.udel.edu wrote:
} }
} ----------------------------------------------------------------------------
} } The Microscopy ListServer -- CoSponsor: The Microscopy Society of
America
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} ----------------------------------------------------------------------------
} }
} } This Question/Comment was submitted to the Microscopy Listserver
} } using the WWW based Form at http://ns.microscopy.com/MLFormMail.html
}
} ---------------------------------------------------------------------------
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} a Subscriber, so when replying
} } please copy both modla-at-dbi.udel.edu as well
} as the MIcroscopy Listserver
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} ---------------------------------------------------------------------------
} }
} } Email: modla-at-dbi.udel.edu
} } Name: Shannon Modla
} }
} } Organization: Delaware Biotechnology Institute
} }
} } Title-Subject: [Filtered] Metal Shadow Casting of DNA
} }
} } Question: We are currently trying to rotary
} shadow cast DNA but are having problems
} obtaining consistent results with the metal shadowing. We are using an
} 80:20
} platinum-palladium wire purchased from EMS and a Denton Bench Top Turbo
} III sputter coater.
} The platinum palladium wire was wrapped around a 2-3 cm portion of a
} hairpin loop formed
} with tungsten wire. When the filament power is increased, the platinum
} palladium wire will
} either heat up without melting and evaporating or else the tungsten wire
} breaks without
} appreciable metal shadowing. I was wondering if anyone had any
} experience with
} this technique and could offer suggestions about how to obtain more
} consistent results.
} }
} } Thanks,
} }
} } Shannon Modla
} } Delware Biotechnology Institute
} } BioImaging Center
} }
} }
}
} ---------------------------------------------------------------------------
} }
} } ==============================Original
} Headers==============================
...
} } 9, 11 -- Date: Fri, 1 Jun 2007 07:50:12 -0500
} } 9, 11 -- To: microscopy-at-microscopy.com
} } 9, 11 -- From: modla-at-dbi.udel.edu (by way of MicroscopyListserver)
} } 9, 11 -- Subject: viaWWW: Metal Shadow Casting of DNA
} } 9, 11 -- Content-Type: text/plain; charset="us-ascii"
} } ==============================End of -
} Headers==============================
...
} 14, 21 -- From dac-at-research.umass.edu Fri Jun 1 09:55:15 2007
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} (race4.oit.umass.edu [128.119.101.40])
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} Fri, 1 Jun 2007 09:55:15 -0500



==============================Original Headers==============================
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From: kleopullin-at-pacbell.net
Date: Mon, 4 Jun 2007 14:48:57 -0500
Subject: [Microscopy] LM Optical physics text -- recommendations?

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

I'm reading Falk, Brill and Stork's "Seeing the Light:
Optics in Nature, Photography, Color, Vision, and
Holography." I like the book, in fact love it, but I
want something more dedicated to the physics/math. I
did order the Schaum's outline for problems.

Can someone recommend a good undergraduate level
optics text? My college level math and physics are
fine.

Has anyone used Eugene Hecht's Optics either as a
student or instructor for a course? Is it good enough
to actually buy, or are there better texts?

Thanks,

K. Leo Pullin

==============================Original Headers==============================
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From: gary-at-gaugler.com
Date: Mon, 4 Jun 2007 15:25:11 -0500
Subject: [Microscopy] viaWWW: looking for Image Analysis

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Please feel free to chastise me if I am wrong.

ImageJ is free and you get what you paid for.
I do not know whether it will control the Prior
stage controllers. If it does, great. Problem
solved.

However, if not, then you need industrial strength
software like analySIS--or current generation.
This controls the Z axis stepper and automatically
collects Z stacks and then assembles them into a
high depth of focus final image. I typically do
20 slices. OK....do this yourself manually and
try to get a good result. I did and after beating
my head against the wall too many times, it was
obvious that another method was necessary.

The focus assembly method is based on contrast.
So many small increments of Z are ideal. analySIS
and the Prior stage controller are seamlessly integrated.

gary g.




At 03:04 PM 6/1/2007, you wrote:
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From: mmiralles-at-pi.ac.ae
Date: Tue, 5 Jun 2007 00:06:07 -0500
Subject: [Microscopy] Sputter & Carbon Coater

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Hello everyone,

Is there anybody here who has used the SPI Combined Sputter and Carbon Coater System? Any feedback? For those who have combined systems, have you encountered any contamination issues? How can this best be avoided?

Aside from good sputtering/coating capability, we are also considering having a dual system with smaller footprint since we have a very crowded lab. Any brand/model you can suggest?

Thank you so much.

Melina Miralles
Lab Technician
The Petroleum Institute
Abu Dhabi, UAE
 


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From: mike.reedy-at-cellbio.duke.edu
Date: Tue, 5 Jun 2007 11:24:22 -0500
Subject: [Microscopy] Re: lead citrate and block staining - correction

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Hi Diana and others who were interested,

Dr Peters gives me permission today by email to quote on the
LisServer her clarification/correction, sent to me earlier today,
that only UrAc, but not Pb Citrate, was used as a block stain in her
work. Personally, I am quite grateful we were briefly misled,
because it brought in David Elliott's response on his use of lead
acetate block stain (in EtOH-acetone 50:50) following aqueous UrAc.

Here is Dr Peter's clarification/correction:
"Our method is as follows: We use uranyl acetate in 70% ethanol as a
block stain ....... then [after] the tissue is embedded in Epon and
polymerized..... We use the lead citrate only for the ready prepared
sections. I am sorry if my phrasing [turned out to] be kind of
misleading."

I plan continued exploration of both lead salts. Use as a block
stain in organic solvent after UrAc especially interests me for
freeze-substitution. So far, I find both are insoluble or nearly so
in 100% acetone, so the EtOH-containing vehicle in Elliott's
procedure seems necessary. Does anyone know or remember if the
extreme alkalinity of aqueous lead citrate section stains is
essential for releasing the Pb from the strongly sequestering
citrate? I'm not sure that pH 11 can be approached in pure organic
solvent, but why not try....?

I would guess that prolonging the exposure of tissue blocks to
organic solvent for extended block-staining is NOT likely to cause
additional shrinkage or extraction of cells, because I think the
binding of metals tends to stabilizes the components. ---not
completely against shrinkage however; I find that freeze-substitution
in acetone-TA followed by acetone UrAc fails to prevent variable
amounts of shrinkage, 5-12%, of the myofilament lattice spacing in
striated muscle; I'd like someday to see the process monitored by
x-ray cryo-diffraction to identify the stage where this occurs and
seek ways to prevent or minimize the shrinkage.

-mike reedy-

***************************
At 10:07 PM -0500 5/27/07, dianavd-at-eye.usyd.edu.au wrote:
----------------------------------------------------------------------------
The Microscopy ListServer -- CoSponsor: The Microscopy Society of America

Geoff McA asked for the reference to the paper I mentioned. It's
Peters S et al; American Journal of Ophthalmology (2007)
143:995-1002; Ultrastructural findings in the primate eye after
intravitreal injection of Bevacizumab. All it says is

"postfixed with 1% OsO4 at room temperature
in 0.1 M cacodylate buffer (pH 7.4) for three hours,
bloc-stained with uranyl acetate and lead citrate, and embedded
in Epon after dehydration in a graded series of acetones"

I've Emailed asking for more details. I have the PDF if anyone would
like to see the pics.


Diana

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}
} I've just read a paper where the author talks about block staining
} with uranyl acetate and lead citrate. UAc yes, but Pbcitrate? Has
} anyone heard of this? Does it work? The pictures in the paper were
} very nice; good contrast and detail. With the recent talk about
} general lack of contrast in specimens these days (I quite agree on
} that; I find contrast poorer now than in the past), could this be
} a new method?
}
} All opinions please!
}
} Cheers,
}
} Diana
}

--
-mike reedy-

************************
Michael K. Reedy, M.D.
Duke Univ. Med. Center
Dept. Cell Biology, Box 3011 (for U.S. Mail)
458 Alex Sands Bldg, Research Dr (courier)
Durham, NC 27710

Office 919-668-2534
Lab 919-684-5674
Fax 919-681-9929
mike.reedy-at-cellbio.duke.edu
http://note.cellbio.duke.edu/Faculty/Research/Reedy.html

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From: dianavd-at-eye.usyd.edu.au
Date: Tue, 5 Jun 2007 19:23:45 -0500
Subject: [Microscopy] Pb citrate block staining - followup

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Hi all,

For those of you following the use of lead citrate as a block stain
discussion, I had a reply from the author of the paper where the
method was described. It turns out to have been incorrect; PbC was
not used as a block stain. It was an English usage problem - the
author is German - she actually used the PbC in the usual way as a
section stain. Still, the idea got us here on the List thinking!

Cheers,

Diana

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From: pcduncan-at-cyllene.uwa.edu.au
Date: Tue, 5 Jun 2007 20:41:03 -0500
Subject: [Microscopy] SEM - Electroscan E3 problem - require service engineer manual for initial setup procedure.

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Hi - We have an old Electroscan which has proved to be fairly reliable
over the years, but lately it has been having problems. Recently, the
CPU board died and we were fortunate enough to have a spare (we
basically have a spare for everything with this machine). This spare
worked in that I could communicate with the CPU via its RS232 port and
have full access to its command set. With the self test the CPU board
says its OK. Unfortunately, we now seem to have no image coming
through. I've played with the command set menu hoping to get an image.
At one point I was able to see an extremely weak signal but I'm not
sure how I really achieved it simply because there are so many
different command options. What I want is Volume 6 - APPENDICES, from
the ElectroScan manual set (we have the others). This manual goes into
depth about the system software structure. What I also want, if
possible, is the service-engineer manual which would detail the actual
initial setup of the E3, and any advice in regard to my E3 problem is
really welcome.

Thanks

Peter Duncan
Senior Technician


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From: donovan.leonard-at-gmail.com
Date: Tue, 5 Jun 2007 22:13:59 -0500
Subject: [Microscopy] Table Top SEM & High School Nano Course

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Hello Listsers -

Some days ago there was a question posed about the educational benefits
of table top SEM and nano-scale samples. In a few weeks I'll post my
experiences using a Hitachi TM-1000 table top SEM in a Nanotechnology
course for high schoolers as part of the Duke University Talent
Identification Program (TIP). More about the program can be found at
'www.tip.duke.edu'. I've chosen the TM-1000 to introduce the students
to the micro and nanoscale, and we will be using the SEM, in addition to
AFM and HRTEM to characterize Au and Ag nanoparticles the students
synthesize as part of a experiential learning activity.

In my opinion the table top SEM will allow the students hands-on
experience with an electron microscope. Not that it will resolve atomic
columns in nanoparticles, but as a way to introduce them to the scale of
things. The intention is to let the students choose ANY samples they
are interested in and let them discover the detail of features on the
micro and nanoscale.

If anyone has had experience integrating these microscopies into a high
school course on nanotechnology I would be most interested in learning
more about how it was accomplished and the outcomes. I would also be
more than happy to share the syllabus created for the course if requested.

Stay tuned, I'll post the student's data and feedback on the table top
SEM, AFM and TEM.

Donovan








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From: dljones-at-bestweb.net
Date: Wed, 6 Jun 2007 08:07:59 -0500
Subject: [Microscopy] Re: Table Top SEM & High School Nano Course

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Donovan,

I have helped get a SEM put into my local high school. The science teacher
there now is able to offer 8 college credits to students that take his
advanced program related to this instrument. Mark would be able to talk to
you more about that aspect and how he integrates it into his curriculum. I
have cc'd him with this email so you'll have his email address. This is
still in the beginning stages so there is a lot yet to know and learn. But
I think it is an absolutely fabulous opportunity for learning...

In the process of getting the SEM into my local high school, I have
learned a fair amount about SEM usage in high schools in the US and a bit
internationally. There are pockets of high schools around the USA that
have this kind of technology operating in high schools, but not a lot.
Germany has some high schools using it, apparently Japan has it
extensively used throughout their high school system.

You are using Au and Ag particles. My experience indicates high school
students seem more interested in biological samples rather than materials.
It would be very useful if a materials curriculum could be developed that
would interest students at this level.

Finding teachers and school systems that are open to this and have the
science background to make it work well, I think is a large hurdle. If a
solid curriculm could be put together that would work as a framework for
teachers to use, I think that would be very helpful.

Schools are, justifiably, reluctant to use this technology as maintaining
these machines is quite expensive and most schools run on very tight
budgets. In the cases where I have seen SEM's working in high schools,
there has usually been someone that is knowledgable about the instruments
and can maintain them for the school pro-bono. These individuals have been
key in getting SEM's into high schools. (There may be a program in western
PA that's an exception to this, but I've not had any luck contacting
them.)

Do send me your curriculum and further information about what you are
doing. I can give you more details of programs I've discovered if you
wish, but I don't think those details are of general interest to the list
(do correct me if I'm wrong).

dj

On Tue, 5 Jun 2007, donovan.leonard-at-gmail.com wrote:

} Hello Listsers -
}
} Some days ago there was a question posed about the educational benefits
} of table top SEM and nano-scale samples. In a few weeks I'll post my
} experiences using a Hitachi TM-1000 table top SEM in a Nanotechnology
} course for high schoolers as part of the Duke University Talent
} Identification Program (TIP). More about the program can be found at
} 'www.tip.duke.edu'. I've chosen the TM-1000 to introduce the students
} to the micro and nanoscale, and we will be using the SEM, in addition to
} AFM and HRTEM to characterize Au and Ag nanoparticles the students
} synthesize as part of a experiential learning activity.
}
} In my opinion the table top SEM will allow the students hands-on
} experience with an electron microscope. Not that it will resolve atomic
} columns in nanoparticles, but as a way to introduce them to the scale of
} things. The intention is to let the students choose ANY samples they
} are interested in and let them discover the detail of features on the
} micro and nanoscale.
}
} If anyone has had experience integrating these microscopies into a high
} school course on nanotechnology I would be most interested in learning
} more about how it was accomplished and the outcomes. I would also be
} more than happy to share the syllabus created for the course if requested.
}
} Stay tuned, I'll post the student's data and feedback on the table top
} SEM, AFM and TEM.
}
} Donovan


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From: Robert.Zonis-at-sanford.com
Date: Wed, 6 Jun 2007 10:48:53 -0500
Subject: [Microscopy] New microscope purchase advice

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Fellow Listers,

We unexpectedly have about $150,000 - $180,000 to potentially spend on a new microscope/digital vision system, and we are trying to determine which type of system would give us more relevant information about our product's components. We want to examine the following materials: the tips of ball point, fountain and roller ball pens (iron, tungsten carbide, brass, nickel-coated brass, nickel silver alloys, ceramic), plastic tip holders and ink reservoirs (polyethylene/polypropylene, nylon, PET), absorbent materials of various sizes and porosities (cellulosic, natural or artificial fibers). We are also interested in examining high-concentration micronized pigment dispersions to determine particle size (approximately 1 micron), shape and/or particle size distribution.

We are trying to decide between a tabletop SEM (either the Hitachi TM-1000 or the FEI Phenom) or a scanning laser microscope (Keyence VK-9700). We have a very limited amount of space to work with - anything larger than a desktop unit would require part of the budget to be spent on building a new room - and that is virtually impossible to get approved. Practically speaking, it's a desktop unit or nothing.

So, my questions are: Is there any way, short of sending many samples off to be examined, and then evaluating the results, to eliminate one or more of these units? Is there one that stands out for versatility or ease of use? How big a task is sample prep for these units? Additionally, have we missed a system to consider?

Please note that we have never looked at any of these components at higher than optical magnification before, so I can't tell you what features I need to see, because I have no idea what, if anything, that there is to see, or even whether or not the nanoscale detail makes a difference in the performance of our products. We will not be able to dedicate a person to the operation and maintenance of the system, so anything that takes much more than an hour or so of maintenance a week is going to be a big problem. I also need to point out that the closer the price gets to $100,000, the more competitive it is among all the instrumentation options we're considering, and the more likely it is to get approved.

Robert Zonis
Product Development Chemist, LMTC
Sanford L.P. - A Newell Rubbermaid Company
3 Sharpie Way
Shelbyville, TN 37160
robert.zonis-at-sanford.com
www.papermate.com


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From: bfoster-at-mme1.com
Date: Wed, 6 Jun 2007 12:23:44 -0500
Subject: [Microscopy] Re: New microscope purchase advice

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Dear Robert,

I would encourage you to investigate NT-MDT's Tomo, a unique
combination of AFM and ultramicrotome, fitted with Media Cybernetics
3D constructor. It will provide the 3D information you need for
accurate particle sizing/shape characterization as well as
distribution calculations. Depending on how they are mounted, you
can also use the AFM to characterize the surfaces you described,
without having to coat or pump down a vacuum. Their new dealer in
the US is Abeam, in Castro Valley, CA.

Also, depending on the size of the surface features, a good reflected
light optical microscope, preferably fitted DIC or Hoffman Modulation
Contrast, and Polarizers, would go a long way toward routine
evaluations. MME provides specialized courses in both these
areas. If you are interested, please contact me off-line.

CAVEAT: MME no longer has any financial relationship with NT-MDT but
does make its living through customized, on-site courses.

Hope this was helpful,
Barbara Foster, President

Microscopy/Microscopy Education
313 S Jupiter Rd, Suite 100
Allen, TX 75002
P: 972-954-8011
W: www.MicroscopyEducation.com


MME is now scheduling customized, on-site courses through
September. Call us today for details.

P. S.
Need a good general reference or light microscopy text for next
semester? Call us today to learn more about "Optimizing LIght
Microscopy". Copies still available through MME... even for
class-room lots ... and we give quantity discounts. Call Ken Piel at
(972)954-8011.



At 10:57 AM 6/6/2007, Robert.Zonis-at-sanford.com wrote:



} ----------------------------------------------------------------------------
} The Microscopy ListServer -- CoSponsor: The Microscopy Society of America


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From: TindallR-at-missouri.edu
Date: Wed, 6 Jun 2007 15:14:44 -0500
Subject: [Microscopy] Carbon nanos in tissue: SEM/TEM

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Dear Listers,

Every once in a while we get a request to image particles which have
been ingested by organisms, but this latest one seems especially tricky.

We are being asked to image carbon nanomaterials, such as nanowires, and
how they distribute themselves in the tissues and organs of living
organisms. My first search of the literature (ongoing, by the way)
indicates that I'm not the only one having trouble with this. Aside
from the obvious problems of differentiating 3-D structures in
nanometers-thick sections, there is the problem of seeing low-contrast
carbon in carbon-rich tissues.

My first thoughts were that adding electron density to the carbon
nanothingys would make them easier to see, both in thin sections and in
fractured specimens for SEM. At least this could help localize them,
even if seeing their true shapes remains a problem. How to do this is
another thing. Probably the particles would have to be augmented with
metals before being released into the organisms' environment, and that
would be a task for the makers and users of the nanoparticles. And
would that affect their final distribution in the creatures? From our
end, I'm trying to think of how to adapt immunolabeling techniques to
this.

Has anybody run across this problem and have thoughts they'd be willing
to share? The PI on this one has high hopes that we can put the
nano-rabbit of this tiny, little hat.

Cheers,
Randy

Randy Tindall
Senior EM Specialist
Electron Microscopy Core Facility---We Do Small Well!
W125 Veterinary Medicine
University of Missouri
Columbia, MO 65211
Tel: (573) 882-8304
Fax: (573) 884-2227
Email: tindallr-at-missouri.edu
Web: http://www.emc.missouri.edu
On-line calendar:
http://biotech.rnet.missouri.edu/cgi-bin/Calcium310.pl?Op=Splash&Amount=
Week&NavType=Both&Type=TimePlan


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From: bfoster-at-mme1.com
Date: Wed, 6 Jun 2007 15:34:13 -0500
Subject: [Microscopy] Re: Carbon nanos in tissue: SEM/TEM

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Randy,

This is another one of those "TOMO" applications.

As mentioned earlier, I have a movie made by Dr.deWith of the Dutch Polymer Institute (TU/E) showing the distribution of carbon nanotubes in epoxy. Because the AFM uses local differences in elasticity, there is none of the CNT in C-based tissue problem described below. Again, although I am no longer involved in this project, I am happy to forward a copy of the film to anyone who is interested. (It will come via www.YouSendIt.com, because of the large file size).

Dr. Anton Efimov of NT-MDT is the developer of this technique and is usually willing to run samples, schedule permitting. See his email in the CC: above.

NTA is no longer NT-MDT's agent here in the US. If you are interested in following this further, I recommend that you contact Dr. Yuri Bobrov, who is now with ABeam (Dealer principle, Dr. Sergey Babin - see email above).

As always, if there are further questions, please don't hesitate to call/email.

(Note: MME is no longer involved with this vendor).

Hope this was helpful,
Barbara Foster, President

Microscopy/Microscopy Education
313 S Jupiter Rd, Suite 100
Allen, TX 75002
P: 972-954-8011
W: www.MicroscopyEducation.com


MME is now scheduling customized, on-site courses through September. Call us today for details.

P. S.
Need a good general reference or light microscopy text for next semester? Call us today to learn more about "Optimizing LIght Microscopy". Copies still available through MME... even for class-room lots ... and we give quantity discounts. Call Ken Piel at (972)954-8011.




At 03:27 PM 6/6/2007, TindallR-at-missouri.edu wrote:



} ----------------------------------------------------------------------------
} The Microscopy ListServer -- CoSponsor: The Microscopy Society of America


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From: schooley-at-mcn.org
Date: Wed, 6 Jun 2007 16:16:28 -0500
Subject: [Microscopy] Re: Table Top SEM & High School Nano Course

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

I'm VERY interested. We need a database of dedicated people who are
doing high school SEM, so that experience, problems, curricula, etc.
can be shared. Will either of you be at M&M in Ft. Lauderdale?
Please come to the MICRO booth so that we can try to organize
something. Or send me an Email. If anyone else who is doing HS SEM,
including those associated with the FEI & RJ Lee school SEM programs,
is reading this, we need to talk to you too!

What is my motive, other than trying to get you together? Project
MICRO is MSA's outreach program for middle schools (see URL below).
I'd like to convince all of you to encourage introductory LM in your
"feeder" middle schools; SEM is an abrupt way to begin.

Caroline

} ----------------------------------------------------------------------------
} The Microscopy ListServer -- CoSponsor: The Microscopy Society of America

==============================Original Headers==============================
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From: colijn.1-at-osu.edu
Date: Wed, 6 Jun 2007 16:18:27 -0500
Subject: [Microscopy] M&M 2007 detailed program

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Hi all,

Has the M&M 2007 daily schedule of papers and symposia been published
yet? I didn't find it on the meeting web site?

thanks,
Henk


Hendrik O. Colijn colijn.1-at-osu.edu
Campus Electron Optics Facility Ohio State University
(614) 292-0674 http://www.ceof.ohio-state.edu
Time is that quality of nature which keeps events from happening all
at once. Lately it doesn't seem to be working.


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From: jenniferwal-at-cs.com
Date: Wed, 6 Jun 2007 19:16:34 -0500
Subject: [Microscopy] AskAMicroscopist: High school student looking for internship in

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Below is the result of your feedback form (NJZFM-ultra-55). It was submitted by (jenniferwal-at-cs.com) from http://www.microscopy.com/Ask-A-Microscopist/Ask-A-Microscopist.html on Wednesday, June 6, 2007 at 13:16:12
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Email: jenniferwal-at-cs.com
Name: Jennifer Wallace

Organization: Academic Coaching

Education: 9-12th Grade High School

Location: Evanston, IL USA

Question: I am working with a junior in high school who is very interested in this field. We are trying to find an internship or volunteer experience for her and need help! She is in the most rigorous science program at her high school and is an excellent photographer, which is why she is interested in this field in college and beyond.

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7, 12 -- Illinois
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From: dac-at-research.umass.edu
Date: Thu, 7 Jun 2007 10:40:53 -0500
Subject: [Microscopy] Carbon nanos in tissue: SEM/TEM

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Dear Microscopists,

I know that vendors/vendor employees are active and involved in the MSA
and contribute greatly to the dialogs here. However, I personally feel
that this message reply is a bit over the top in commercializing the
List. Every question to the List can't be answered "you should try AFM"
and go on to plug the company and it's products. The response seems only
slightly related to the essence of the original question. How is AFM
going to visualize carbon nanotubes inside a cell that is inside a
tissue? This was a repeat of the response to recent technical questions
on vacuum metal shadowing technical problems. It is fine to bring
attention to alternate methods, but primarily we should be good
listeners and try to help people with the problem they have asked about.
Metal shadowing is a proven technique - with limitations, same as ALL
techniques - that people use routinely; one can scan relatively large
areas at high resolution for the best area. It is a method suitable to
the purpose. The DNA is already bulked up artificially by the
preparation method and the metal shadowing adds a known factor to that
size. But {visualizing} the DNA/plasmid is often the key, not the exact
molecular size. One vendor sent a link to an image of a 1um square scan
of DNA; the image was quite blurry, 2 nm/pixel resolution. I'm sure this
is a "display" result - the best they have. Finding a plasmid on a sheet
of carbon/mica for AFM scanning can't be as routine as the "traditional"
method of viewing the shadowed material in a TEM. It is a bit of
comparing apples and oranges.

So AFM is not the one answer to all questions, and please go light on
the commercial plugs. It seems that vendors were more respectful of this
"line" in the past.

Thanks for allowing my rant,

Dale Callaham



bfoster-at-mme1.com wrote:
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}
} Randy,
}
} This is another one of those "TOMO" applications.
}
} As mentioned earlier, I have a movie made by Dr.deWith of the Dutch Polymer Institute (TU/E) showing the distribution of carbon nanotubes in epoxy. Because the AFM uses local differences in elasticity, there is none of the CNT in C-based tissue problem described below. Again, although I am no longer involved in this project, I am happy to forward a copy of the film to anyone who is interested. (It will come via www.YouSendIt.com, because of the large file size).
}
} Dr. Anton Efimov of NT-MDT is the developer of this technique and is usually willing to run samples, schedule permitting. See his email in the CC: above.
}
} NTA is no longer NT-MDT's agent here in the US. If you are interested in following this further, I recommend that you contact Dr. Yuri Bobrov, who is now with ABeam (Dealer principle, Dr. Sergey Babin - see email above).
}
} As always, if there are further questions, please don't hesitate to call/email.
}
} (Note: MME is no longer involved with this vendor).
}
} Hope this was helpful,
} Barbara Foster, President
}
} Microscopy/Microscopy Education
} 313 S Jupiter Rd, Suite 100
} Allen, TX 75002
} P: 972-954-8011
} W: www.MicroscopyEducation.com
}
}
} MME is now scheduling customized, on-site courses through September. Call us today for details.
}
} P. S.
} Need a good general reference or light microscopy text for next semester? Call us today to learn more about "Optimizing LIght Microscopy". Copies still available through MME... even for class-room lots ... and we give quantity discounts. Call Ken Piel at (972)954-8011.
}
}
}
}
} At 03:27 PM 6/6/2007, TindallR-at-missouri.edu wrote:
}
}
}
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} } Dear Listers,
} }
} } Every once in a while we get a request to image particles which have
} } been ingested by organisms, but this latest one seems especially tricky.
} }
} } We are being asked to image carbon nanomaterials, such as nanowires, and
} } how they distribute themselves in the tissues and organs of living
} } organisms. My first search of the literature (ongoing, by the way)
} } indicates that I'm not the only one having trouble with this. Aside
} } from the obvious problems of differentiating 3-D structures in
} } nanometers-thick sections, there is the problem of seeing low-contrast
} } carbon in carbon-rich tissues.
} }
} } My first thoughts were that adding electron density to the carbon
} } nanothingys would make them easier to see, both in thin sections and in
} } fractured specimens for SEM. At least this could help localize them,
} } even if seeing their true shapes remains a problem. How to do this is
} } another thing. Probably the particles would have to be augmented with
} } metals before being released into the organisms' environment, and that
} } would be a task for the makers and users of the nanoparticles. And
} } would that affect their final distribution in the creatures? From our
} } end, I'm trying to think of how to adapt immunolabeling techniques to
} } this.
} }
} } Has anybody run across this problem and have thoughts they'd be willing
} } to share? The PI on this one has high hopes that we can put the
} } nano-rabbit of this tiny, little hat.
} }
} } Cheers,
} } Randy
} }
} } Randy Tindall
} } Senior EM Specialist
} } Electron Microscopy Core Facility---We Do Small Well!
} } W125 Veterinary Medicine
} } University of Missouri
} } Columbia, MO 65211
} } Tel: (573) 882-8304
} } Fax: (573) 884-2227
} } Email: tindallr-at-missouri.edu
} } Web: http://www.emc.missouri.edu
} } On-line calendar:
} } http://biotech.rnet.missouri.edu/cgi-bin/Calcium310.pl?Op=Splash&Amount=
} } Week&NavType=Both&Type=TimePlan
} }
} }
} } ==============================Original Headers==============================
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} } 8, 23 -- Subject: Carbon nanos in tissue: SEM/TEM
} } 8, 23 -- Date: Wed, 6 Jun 2007 15:14:43 -0500
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} } 8, 23 -- From: "Tindall, Randy D." {TindallR-at-missouri.edu}
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} ==============================Original Headers==============================
} 20, 17 -- From bfoster-at-mme1.com Wed Jun 6 15:34:13 2007
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} 20, 17 -- To: TindallR-at-missouri.edu, microscopy-at-microscopy.com
} 20, 17 -- From: Barbara Foster {bfoster-at-mme1.com}
} 20, 17 -- Subject: Re: [Microscopy] Carbon nanos in tissue: SEM/TEM
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==============================Original Headers==============================
8, 21 -- From dac-at-research.umass.edu Thu Jun 7 10:40:53 2007
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From: monroe-at-emcenter.msstate.edu
Date: Thu, 7 Jun 2007 10:52:13 -0500
Subject: [Microscopy] MSA 2007 Meeting: Request for Student and Other Volunteers

Contents Retrieved from Microscopy Listserver Archives
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Greetings,

MSA 2007 is just a short 8 weeks away in beautiful Ft. Lauderdale, Florida !!!!

The reduced rate registration deadline is July 6, so please register early.

This is the second announcement for students who will attend the
Microscopy and Microanalysis Meeting in Ft. Lauderdale, Fl, August
5-9, 2007 and would like to apply for a Student Bursary to help
defray meeting costs. The complete description of the Bursary is
listed below, including the registration process.

In addition, technicians, post-docs, faculty and presenters may also
apply for a bursary in exchange for working to support the meeting.

The contact persons this year who will coordinate the student volunteers are;

Bill Monroe monroe-at-emcenter.msstate.edu
Amanda Lawrence alawrence-at-emcenter.msstate.edu
Mike Miller millem1-at-auburn.edu


STUDENT BURSARIES

The Microscopy Society of America values student members and
recognizes that they are the future of both the society and the field
of microscopy in general. MSA is therefore pleased to offer student
bur-saries of $200 to registered students. The most important purpose
of these bursaries is to encourage students to attend the annual
MSA/MAS Microscopy and Microanalysis meeting, where these young
sci-entists can meet and interact with the established microscopy
community as well as assisting with the meeting.

Each bursary recipient will be expected to work for a minimum of 20
hours during the meeting and/or at the pre-meeting weekend events. A
student may work up to an additional 20 hours, for a total of 40
hours. These extra hours will add to the bursary total at a rate of
$10 per hour. The maximum bursary will therefore be $400. The duties
will involve, but are not necessarily limited to, providing support
in symposia (helping with audio-visual needs, maintaining an
attendance count, and helping speakers set up for their
presentation), staffing the MSA Megabooth, and monitoring use of the
Internet Cafe. Applicants for the bursaries must be members of MSA or
MAS, and enrolled as students at a recognized educational
institution. All MSA or MAS student members are eligible for
bursaries, including those who are recipients of MSA Presidential
Scholars Awards and MAS Distinguished Scholar Awards. Eligible
students may apply for bursaries when registering for the conference
on the conference website, or at on-site registration. Bursaries are
limited and early application is encouraged.
How it works:

The registration form for the meeting will have a check box
indicating that the applicant is a registered student and is
requesting a bursary. The check box will have a note beside it
reminding the applicant that the bursary requires them to work at the
meeting. Students who have applied for bursaries will receive letters
from MSA explaining the conditions that they need to satisfy in order
to receive the bursaries. The tasks at the meeting will be allocated
by the Student Worker Organizers Sub-Committee of the Education
Committee. When students pick up their registration materials at the
meeting, they will receive assignment forms indicating the specific
tasks they are to perform, and the person(s) they need to contact in
order to carry out those tasks. Each stu-dent's assignment forms must
be signed by all of the contact persons listed, indicating that all
assigned tasks have been performed. Upon completion of assignments
and submission of the signed forms, the bursary check will be issued
by the appropriate representative at the registration desk.


Should you have questions concerning the process, please contact:

Bill Monroe monroe-at-emcenter.msstate.edu


--
Bill Monroe
Electron Microscope Center
103 Clay Lyle Entomology Building
Mississippi State University
Mississippi State, MS 39762
(662)-325-3019 Work
(662)-323-5246 Home
(662)-325-0246 Fax

==============================Original Headers==============================
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17, 15 -- To: "Microscopy-at-microscopy.com"-at-Ra.MsState.Edu
17, 15 -- From: "William A. Monroe" {monroe-at-emcenter.msstate.edu}
17, 15 -- Subject: MSA 2007 Meeting: Request for Student and Other Volunteers
17, 15 -- (Bursaries Available)
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From: bfoster-at-mme1.com
Date: Thu, 7 Jun 2007 11:11:00 -0500
Subject: [Microscopy] Re: Carbon nanos in tissue: SEM/TEM

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Dear Dale,

To clarify: I am a consultant who has exposure to new technology
and, if you review my messages over the years, you will find a large
number of different technologies and vendors mentioned.

I did have a chance to work with NT-MDT (no longer)... and found that
AFM, like other technologies (ex: interferometry) was under-utilized.

Regarding giving a plug to one vendor: TOMO is unique. There is no
one else has integrated an AFM with an ultramicrotome for serial
sections... so there IS no one else to mention.

Hope this is helpful.

Barbara




At 10:44 AM 6/7/2007, you wrote:



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14, 17 -- From: Barbara Foster {bfoster-at-mme1.com}
14, 17 -- Subject: Re: [Microscopy] Carbon nanos in tissue: SEM/TEM
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From: oddioeng-at-aol.com
Date: Thu, 7 Jun 2007 11:14:25 -0500
Subject: [Microscopy] viaWWW: UPDATE of UC-4 Dewar Re-evacuation port

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

This Question/Comment was submitted to the Microscopy Listserver
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Email: oddioeng-at-aol.com
Name: J. Allen Williams, Jr.

Organization: ORDELA, Inc.

Title-Subject: [Filtered] UPDATE of UC-4 Dewar Re-evacuation port

Question: Hello, I have discovered the answer to my question from yesterday, the ball in the evacuation port is the vacuum valve for the Dewar. If the Dewar is near atmosphere and if one needs to re-evacuate, you may use either a specified valve or what I did - (which is somewhat unorthodox) - connect your evaluation pump to the port and the ball
'magically levitates' from the o-ring seal. (This is also true of smaller LINDE Dewars). Therefore, the main seal of this type Dewar re-evacuation port seals the vacuum inside of the vacuum insulator by the atmospheric pressure on the ball and the o-ring seat.

I found this out by connecting my old Welch 1402 vacuum pump to the Dewar port and heard a click, and the click was a sound of the ball being sucked towards the vacuum pump. Mystery solvÈd. Thought I would let everyone know. It is amazing that atmospheric pressure can seal the vacuum in a liquid nitrogen/argon Dewar. Thanks for all the suggestions and hope this may help for reference in the future.

---------------------------------------------------------------------------


==============================Original Headers==============================
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8, 13 -- From: oddioeng-at-aol.com (by way of MicroscopyListserver)
8, 13 -- Subject: viaWWW: UPDATE of UC-4 Dewar Re-evacuation port
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From: K.venner-at-ion.ucl.ac.uk
Date: Thu, 7 Jun 2007 11:15:05 -0500
Subject: [Microscopy] viaWWW: ultrathin sectioning of tissue containing nanotubes

Contents Retrieved from Microscopy Listserver Archives
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This Question/Comment was submitted to the Microscopy Listserver
using the WWW based Form at http://microscopy.com/MicroscopyListserver/MLFormMail.html
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Email: K.venner-at-ion.ucl.ac.uk
Name: kerrie Venner

Organization: Institute of Neurology London UK

Title-Subject: [Filtered] ultrathin sectioning of tissue containing nanotubes

Question: Has anyone any experience of ultrathin sectioning of tissue containing nanotubes? Specifically the effect of nanotubes on diamond knives?

---------------------------------------------------------------------------

==============================Original Headers==============================
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6, 11 -- From: K.venner-at-ion.ucl.ac.uk (by way of MicroscopyListserver)
6, 11 -- Subject: viaWWW: ultrathin sectioning of tissue containing nanotubes
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From: ecd10-at-psu.edu
Date: Thu, 7 Jun 2007 11:15:44 -0500
Subject: [Microscopy] viaWWW: Postdoctoral Position Open PSU

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

This Question/Comment was submitted to the Microscopy Listserver
using the WWW based Form at http://www.msa.microscopy.org/MicroscopyListserver/MLFormMail.html
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Email: ecd10-at-psu.edu
Name: Elizabeth Dickey

Organization: Pennsylvania State University

Title-Subject: [Filtered] Postdoctoral Position Open

Question: POST-DOCTORAL POSITION
in
Transmission Electron Microscopy
at
The Pennsylvania State University



A postdoctoral position is available in the area of transmission electron microscopy of amorphous dielectrics beginning July 1, 2007. The research project focuses on understanding structure and chemistry of amorphous metal oxides for capacitor applications. Through a variety of electron imaging, spectroscopy and diffraction techniques, including fluctuation electron microscopy, we aim to quantify structure and chemistry of amorphous metal-oxide layers to help establish processing/structure/property relationships for this class of materials. Most of the research will be conducted on a JEOL 2010F Field Emission TEM/STEM outfitted with an EDAX energy dispersive x-ray spectrometer (EDS), Gatan Enfina electron energy loss spectrometer (EELS), high-angle annular dark field STEM detector, and acquisition hardware and software for spectrum imaging. The ideal candidate for this position will have experience in HREM, STEM, EDS and EELS. The salary will be commensurate with qualifications and experience.

Please forward questions or send applications to:

Professor Elizabeth Dickey
Department of Materials Science and Engineering
The Pennsylvania State University
223 Materials Research Building
University Park, PA 16802
USA

tel: (814) 865-9067
FAX: (814) 865-2326
email: ecd10-at-psu.edu


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From: skooi-at-mit.edu
Date: Thu, 7 Jun 2007 11:16:50 -0500
Subject: [Microscopy] viaWWW: Research Specialist Position MIT

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Email: skooi-at-mit.edu
Name: Steven Kooi

Organization: ISN -at- MIT

Title-Subject: [Filtered] Research Specialist Position

Question: The Institute for Soldier Nanotechnologies (ISN) at MIT is looking for a research specialist to handle multiple responsibilities including transmission electron microscopy (TEM), scanning electron microscopy (SEM), focused ion beam (FIB), and atomic force microscopy (AFM). Primary responsibilities include providing introductory and more advanced training of users on electron microscopes, and assisting ISN researchers with sample preparation and characterization using electron and surface microscopy techniques. Other responsibilities may include daily operation, maintenance, and upkeep of several pieces of advanced nano-characterization instrumentation and related sample preparation tools; and serving as the primary contact with the equipment manufacturer's service personnel to quickly resolve any serious instrumentation issues.

The position announcement can be found at http://sh.webhire.com/servlet/av/jd?ai=631&ji=2025576&sn=I

Additional information on ISN is available at http://web.mit.edu/isn.

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From: TindallR-at-missouri.edu
Date: Thu, 7 Jun 2007 11:55:56 -0500
Subject: [Microscopy] Carbon nanos in tissue: SEM/TEM

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


I agree that keeping the list as "commercial free" as possible is a
good thing. However, I didn't really interpret Barbara's response to my
question as a commercial plug as much as pointing out a potentially
useful technology. In fact, I believe she pointed out that MME is no
longer affiliated with that vendor. Personally, I'll take any advice
that helps our lab help our clients with their research, whether from
consultants, vendors, or fellow techs.

I have had many vendors contact me off-list with suggestions involving
their products, when they thought their responses might be seen as too
commercial. To me that's a very courteous and professional response.
That said, I hope that those who are not formally affiliated with a
vendor won't hesitate to point out useful techniques or gizmos to the
list at large.

My personal opinion is that this particular response was not out of
line.

It's good to bring these issues up occasionally, so this is not a dig at
Dale, by any means.

Cheers,
Randy

-----Original Message-----
X-from: dac-at-research.umass.edu [mailto:dac-at-research.umass.edu]
Sent: Thursday, June 07, 2007 10:42 AM
To: Tindall, Randy D.

Dear Microscopists,

I know that vendors/vendor employees are active and involved in the MSA
and contribute greatly to the dialogs here. However, I personally feel
that this message reply is a bit over the top in commercializing the
List. Every question to the List can't be answered "you should try AFM"
and go on to plug the company and it's products. The response seems only
slightly related to the essence of the original question. How is AFM
going to visualize carbon nanotubes inside a cell that is inside a
tissue? This was a repeat of the response to recent technical questions
on vacuum metal shadowing technical problems. It is fine to bring
attention to alternate methods, but primarily we should be good
listeners and try to help people with the problem they have asked about.

Metal shadowing is a proven technique - with limitations, same as ALL
techniques - that people use routinely; one can scan relatively large
areas at high resolution for the best area. It is a method suitable to
the purpose. The DNA is already bulked up artificially by the
preparation method and the metal shadowing adds a known factor to that
size. But {visualizing} the DNA/plasmid is often the key, not the exact
molecular size. One vendor sent a link to an image of a 1um square scan
of DNA; the image was quite blurry, 2 nm/pixel resolution. I'm sure this
is a "display" result - the best they have. Finding a plasmid on a sheet
of carbon/mica for AFM scanning can't be as routine as the "traditional"

method of viewing the shadowed material in a TEM. It is a bit of
comparing apples and oranges.

So AFM is not the one answer to all questions, and please go light on
the commercial plugs. It seems that vendors were more respectful of this
"line" in the past.

Thanks for allowing my rant,

Dale Callaham



bfoster-at-mme1.com wrote:
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}
} Randy,
}
} This is another one of those "TOMO" applications.
}
} As mentioned earlier, I have a movie made by Dr.deWith of the Dutch
Polymer Institute (TU/E) showing the distribution of carbon nanotubes in
epoxy. Because the AFM uses local differences in elasticity, there is
none of the CNT in C-based tissue problem described below. Again,
although I am no longer involved in this project, I am happy to forward
a copy of the film to anyone who is interested. (It will come via
www.YouSendIt.com, because of the large file size).
}
} Dr. Anton Efimov of NT-MDT is the developer of this technique and is
usually willing to run samples, schedule permitting. See his email in
the CC: above.
}
} NTA is no longer NT-MDT's agent here in the US. If you are interested
in following this further, I recommend that you contact Dr. Yuri Bobrov,
who is now with ABeam (Dealer principle, Dr. Sergey Babin - see email
above).
}
} As always, if there are further questions, please don't hesitate to
call/email.
}
} (Note: MME is no longer involved with this vendor).
}
} Hope this was helpful,
} Barbara Foster, President
}
} Microscopy/Microscopy Education
} 313 S Jupiter Rd, Suite 100
} Allen, TX 75002
} P: 972-954-8011
} W: www.MicroscopyEducation.com
}
}
} MME is now scheduling customized, on-site courses through September.
Call us today for details.
}
} P. S.
} Need a good general reference or light microscopy text for next
semester? Call us today to learn more about "Optimizing LIght
Microscopy". Copies still available through MME... even for class-room
lots ... and we give quantity discounts. Call Ken Piel at (972)954-8011.
}
}
}
}
} At 03:27 PM 6/6/2007, TindallR-at-missouri.edu wrote:
}
}
}
} } ---------------------------------------------------------------------
} } ------- The Microscopy ListServer -- CoSponsor: The Microscopy
} } Society of America To Subscribe/Unsubscribe --
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} }
} } Dear Listers,
} }
} } Every once in a while we get a request to image particles which have
} } been ingested by organisms, but this latest one seems especially
tricky.
} }
} } We are being asked to image carbon nanomaterials, such as nanowires,
} } and how they distribute themselves in the tissues and organs of
} } living organisms. My first search of the literature (ongoing, by the

} } way) indicates that I'm not the only one having trouble with this.
} } Aside from the obvious problems of differentiating 3-D structures in
} } nanometers-thick sections, there is the problem of seeing low-contrast

} } carbon in carbon-rich tissues.
} }
} } My first thoughts were that adding electron density to the carbon
} } nanothingys would make them easier to see, both in thin sections and
} } in fractured specimens for SEM. At least this could help localize
} } them, even if seeing their true shapes remains a problem. How to do
} } this is another thing. Probably the particles would have to be
} } augmented with metals before being released into the organisms'
} } environment, and that would be a task for the makers and users of the

} } nanoparticles. And would that affect their final distribution in the

} } creatures? From our end, I'm trying to think of how to adapt
} } immunolabeling techniques to this.
} }
} } Has anybody run across this problem and have thoughts they'd be
} } willing to share? The PI on this one has high hopes that we can put
} } the nano-rabbit of this tiny, little hat.
} }
} } Cheers,
} } Randy
} }
} } Randy Tindall
} } Senior EM Specialist
} } Electron Microscopy Core Facility---We Do Small Well!
} } W125 Veterinary Medicine
} } University of Missouri
} } Columbia, MO 65211
} } Tel: (573) 882-8304
} } Fax: (573) 884-2227
} } Email: tindallr-at-missouri.edu
} } Web: http://www.emc.missouri.edu
} } On-line calendar:
} } http://biotech.rnet.missouri.edu/cgi-bin/Calcium310.pl?Op=Splash&Amou
} } nt=
} } Week&NavType=Both&Type=TimePlan
} }
} }
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From: jquinn-at-www.matscieng.sunysb.edu
Date: Thu, 7 Jun 2007 12:58:22 -0500
Subject: [Microscopy] Re: Re: Table Top SEM & High School Nano Course

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Caroline and everyone -

I'd like to convince all of you to encourage inductory imaging and
measurement in your "feeder" middle schools. It has been my
experience that too few students understand anything about
shape and size. Those who are unable to measure the diameter
and length of a broomstick are going to have a difficult time
on a nano-rod.

just my two cents............

JQuinn


PS...........OoO away........




} From mail-at-ns.microscopy.com Wed Jun 6 17:14:41 2007
} Date: Wed, 6 Jun 2007 16:17:10 -0500
} To: jquinn-at-www.matscieng.sunysb.edu
} From: schooley-at-mcn.org
} Reply-to: schooley-at-mcn.org
} X-Resent-From: "Microscopy Listserver" {microscopy-at-microscopy.com}
} Subject: [Microscopy] Re: Table Top SEM & High School Nano Course
} Errors-To: MicroscopyListSpamFilter-at-microscopy.com
} X-lewp: MicroscopyListSpam NAGS
}
}
}
}
} ----------------------------------------------------------------------------
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} ----------------------------------------------------------------------------
}
} I'm VERY interested. We need a database of dedicated people who are
} doing high school SEM, so that experience, problems, curricula, etc.
} can be shared. Will either of you be at M&M in Ft. Lauderdale?
} Please come to the MICRO booth so that we can try to organize
} something. Or send me an Email. If anyone else who is doing HS SEM,
} including those associated with the FEI & RJ Lee school SEM programs,
} is reading this, we need to talk to you too!
}
} What is my motive, other than trying to get you together? Project
} MICRO is MSA's outreach program for middle schools (see URL below).
} I'd like to convince all of you to encourage introductory LM in your
} "feeder" middle schools; SEM is an abrupt way to begin.
}
} Caroline
}
} } ----------------------------------------------------------------------------
} } The Microscopy ListServer -- CoSponsor: The Microscopy Society of America
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} } ----------------------------------------------------------------------------
} }
} } Donovan,
} }
} } I have helped get a SEM put into my local high school. The science teacher
} } there now is able to offer 8 college credits to students that take his
} } advanced program related to this instrument. Mark would be able to talk to
} } you more about that aspect and how he integrates it into his curriculum. I
} } have cc'd him with this email so you'll have his email address. This is
} } still in the beginning stages so there is a lot yet to know and learn. But
} } I think it is an absolutely fabulous opportunity for learning...
} }
} } In the process of getting the SEM into my local high school, I have
} } learned a fair amount about SEM usage in high schools in the US and a bit
} } internationally. There are pockets of high schools around the USA that
} } have this kind of technology operating in high schools, but not a lot.
} } Germany has some high schools using it, apparently Japan has it
} } extensively used throughout their high school system.
} }
} } You are using Au and Ag particles. My experience indicates high school
} } students seem more interested in biological samples rather than materials.
} } It would be very useful if a materials curriculum could be developed that
} } would interest students at this level.
} }
} } Finding teachers and school systems that are open to this and have the
} } science background to make it work well, I think is a large hurdle. If a
} } solid curriculm could be put together that would work as a framework for
} } teachers to use, I think that would be very helpful.
} }
} } Schools are, justifiably, reluctant to use this technology as maintaining
} } these machines is quite expensive and most schools run on very tight
} } budgets. In the cases where I have seen SEM's working in high schools,
} } there has usually been someone that is knowledgable about the instruments
} } and can maintain them for the school pro-bono. These individuals have been
} } key in getting SEM's into high schools. (There may be a program in western
} } PA that's an exception to this, but I've not had any luck contacting
} } them.)
} }
} } Do send me your curriculum and further information about what you are
} } doing. I can give you more details of programs I've discovered if you
} } wish, but I don't think those details are of general interest to the list
} } (do correct me if I'm wrong).
} }
} } dj
} }
} } On Tue, 5 Jun 2007, donovan.leonard-at-gmail.com wrote:
} }
} } } Hello Listsers -
} } }
} } } Some days ago there was a question posed about the educational benefits
} } } of table top SEM and nano-scale samples. In a few weeks I'll post my
} } } experiences using a Hitachi TM-1000 table top SEM in a Nanotechnology
} } } course for high schoolers as part of the Duke University Talent
} } } Identification Program (TIP). More about the program can be found at
} } } 'www.tip.duke.edu'. I've chosen the TM-1000 to introduce the students
} } } to the micro and nanoscale, and we will be using the SEM, in addition to
} } } AFM and HRTEM to characterize Au and Ag nanoparticles the students
} } } synthesize as part of a experiential learning activity.
} } }
} } } In my opinion the table top SEM will allow the students hands-on
} } } experience with an electron microscope. Not that it will resolve atomic
} } } columns in nanoparticles, but as a way to introduce them to the scale of
} } } things. The intention is to let the students choose ANY samples they
} } } are interested in and let them discover the detail of features on the
} } } micro and nanoscale.
} } }
} } } If anyone has had experience integrating these microscopies into a high
} } } school course on nanotechnology I would be most interested in learning
} } } more about how it was accomplished and the outcomes. I would also be
} } } more than happy to share the syllabus created for the course if requested.
} } }
} } } Stay tuned, I'll post the student's data and feedback on the table top
} } } SEM, AFM and TEM.
} } }
} } Donovan
} --
} Caroline Schooley
} Project MICRO Coordinator
} Microscopy Society of America
} Box 117, 45301 Caspar Point Road
} Caspar, CA 95420
} Phone/FAX (707)964-9460
} Project MICRO: http://www.microscopy.org/ProjectMICRO
}
} ==============================Original Headers==============================
} 4, 19 -- From schooley-at-mcn.org Wed Jun 6 16:16:27 2007
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} 4, 19 -- To: dljones-at-bestweb.net, donovan.leonard-at-gmail.com
} 4, 19 -- From: Caroline Schooley {schooley-at-mcn.org}
} 4, 19 -- Subject: [Microscopy] Re: Table Top SEM & High School Nano Course
} 4, 19 -- Cc: Microscopy-at-MSA.Microscopy.Com, john_mackenzie-at-ncsu.edu,
} 4, 19 -- tpepper-at-iastate.edu, murphyjudy-at-comcast.net
} 4, 19 -- Content-Type: text/plain; charset="us-ascii" ; format="flowed"
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12, 12 -- From jquinn-at-www.matscieng.sunysb.edu Thu Jun 7 12:58:22 2007
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12, 12 -- Message-Id: {200706071755.l57Hthw01791-at-www.matscieng.sunysb.edu}
12, 12 -- To: microscopy-at-microscopy.com
12, 12 -- Subject: Re: [Microscopy] Re: Table Top SEM & High School Nano Course
==============================End of - Headers==============================




From: Rosemary.White-at-csiro.au
Date: Thu, 7 Jun 2007 18:06:13 -0500
Subject: [Microscopy] fibre-optic probes/cameras?

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Dear all,

Are there any really tiny cameras about, or at least, fibre-optic
lenses/objectives? I ask because we have a couple of applications that
could use one. We're interested in roots growing down pre-existing soil
pores, and would like to watch what they're doing down there, either with a
moving imaging device of some kind, or a series of portholes to watch roots
growing past. Another group is screening different lines of cereals, in
particular, looking at development of the floral meristem. This object of
desire is enclosed in many leaves at ground level in a cereal plant, we'd
like to poke a small fibre-optic in to watch its development over 3-6 days,
rather than having to destroy many plants to follow the stages of
development.

I've had a rummage through numerous websites, and sent off some email
enquiries, but wondered if any on this list were aware of available
technology to do this.

cheers,
Rosemary

Dr Rosemary White rosemary.white-at-csiro.au
CSIRO Plant Industry ph. 61 (0)2-6246 5475
GPO Box 1600 fax. 61 (0)2-6246 5334
Canberra, ACT 2601
Australia

==============================Original Headers==============================
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5, 22 -- Subject: fibre-optic probes/cameras?
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From: robby2-at-asu.edu
Date: Thu, 7 Jun 2007 18:34:42 -0500
Subject: [Microscopy] viaWWW: Position Available - ASU

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

This Question/Comment was submitted to the Microscopy Listserver
using the WWW based Form at http://www.microscopy.com/MicroscopyListserver/MLFormMail.html
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Email: robby2-at-asu.edu
Name: Robert W. Roberson

Organization: Arizona State University

Title-Subject: [Filtered] Position Available

Question: Research Scientist

An individual is sought, at the PhD level, who is skilled in methods of light and electron microscopy. He or she will play a key bioimaging role in a recently funded project for the development of biofuels through the manipulation of the cyanobacterium Synechocystis sp. PCC 6803. The individual will interact closely with a group of investigators within the School of Life Science and Biodesign Institute at Arizona State University. Specifically, the individual will be responsible for designing and implementing suitable protocols for microscopic analysis of strains that have been genetically modified and/or grown under conditions that favor the over production of fatty acids. The successful candidate will be able to perform basic and advanced bioimaging protocols such as: confocal microscopy, cryofixation and freeze substitution, ultramicrotomy, standard TEM and SEM imaging and electron tomography, and immuno-cytochemistry at both the light and EM levels. The School of Life Sciences Bioimaging Facility (http://sols.asu.edu/klab/index.php; http://sols.asu.edu/lsem/index.php) and associated imaging facilities at Arizona State University maintain the equipment required to fulfill the goals of the project.


Contact:
Dr. Robert Roberson
School of Life Sciences
PO Box874501
Arizona State University
Tempe, AZ 85287-4501

Phone: 480-965-8618
Email: Robert. Roberson-at-asu.edu


---------------------------------------------------------------------------


==============================Original Headers==============================
12, 13 -- From zaluzec-at-microscopy.com Thu Jun 7 18:34:41 2007
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12, 13 -- From: robby2-at-asu.edu (by way of MicroscopyListserver)
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From: kraftpiano-at-gmail.com
Date: Thu, 7 Jun 2007 18:43:38 -0500
Subject: [Microscopy] Re: fibre-optic probes/cameras?

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

I've used different sized boroscopes before, like the ones at
www.uxr.com (I have no affiliation with this company, I've just seen
their products in action before)

I would say that a small boroscope would be your best bet, as you can
port it out to video, and some come with a light source, but others
may need a separate light source. I know they make both a flexible
and a rigid boroscope, the rigid one being slightly less expensive.

What is the size diameter you are looking for?

--Justin A. Kraft

On 6/7/07, Rosemary.White-at-csiro.au {Rosemary.White-at-csiro.au} wrote:
}
}
}
} ----------------------------------------------------------------------------
} The Microscopy ListServer -- CoSponsor: The Microscopy Society of America
} To Subscribe/Unsubscribe -- http://www.microscopy.com/MicroscopyListserver
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} ----------------------------------------------------------------------------
}
} Dear all,
}
} Are there any really tiny cameras about, or at least, fibre-optic
} lenses/objectives? I ask because we have a couple of applications that
} could use one. We're interested in roots growing down pre-existing soil
} pores, and would like to watch what they're doing down there, either with a
} moving imaging device of some kind, or a series of portholes to watch roots
} growing past. Another group is screening different lines of cereals, in
} particular, looking at development of the floral meristem. This object of
} desire is enclosed in many leaves at ground level in a cereal plant, we'd
} like to poke a small fibre-optic in to watch its development over 3-6 days,
} rather than having to destroy many plants to follow the stages of
} development.
}
} I've had a rummage through numerous websites, and sent off some email
} enquiries, but wondered if any on this list were aware of available
} technology to do this.
}
} cheers,
} Rosemary
}
} Dr Rosemary White rosemary.white-at-csiro.au
} CSIRO Plant Industry ph. 61 (0)2-6246 5475
} GPO Box 1600 fax. 61 (0)2-6246 5334
} Canberra, ACT 2601
} Australia
}
} ==============================Original Headers==============================
} 5, 22 -- From Rosemary.White-at-csiro.au Thu Jun 7 18:06:13 2007
} 5, 22 -- Received: from act-MTAout1.csiro.au (act-MTAout1.csiro.au [150.229.7.37])
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} 5, 22 -- User-Agent: Microsoft-Entourage/10.1.4.030702.0
} 5, 22 -- Date: Fri, 08 Jun 2007 09:09:44 +1000
} 5, 22 -- Subject: fibre-optic probes/cameras?
} 5, 22 -- From: Rosemary White {Rosemary.White-at-csiro.au}
} 5, 22 -- To: {microscopy-at-microscopy.com}
} 5, 22 -- Message-ID: {C28ECD58.1DFA3%Rosemary.White-at-csiro.au}
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5, 29 -- From kraftpiano-at-gmail.com Thu Jun 7 18:43:38 2007
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5, 29 -- From: "Justin Kraft" {kraftpiano-at-gmail.com}
5, 29 -- To: Rosemary.White-at-csiro.au
5, 29 -- Subject: Re: [Microscopy] fibre-optic probes/cameras?
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From: Rosey.VanDriel-at-csiro.au
Date: Thu, 7 Jun 2007 18:50:28 -0500
Subject: [Microscopy] fibre-optic probes/cameras?

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Hi Rosemary!
Have you contacted Optiscan? They have some pretty small endoscopic
microscopy devices which are really powerful. I'm sure they'd be as good
for your application as they are for animal work.
www.optiscan.com

Cheers,
Roseys

I have no affiliation with Optiscan, just impressed by the demos I've
seen


Rosemary van Driel
Electron Microscopy
New and Emerging Zoonotic Diseases
Australian Animal Health Laboratory
CSIRO Livestock Industries
Private Bag 24
Geelong Vic 3220
Australia

International Phone: +61 3 5227 5209
International Fax: +61 3 5227 5555
email: Rosey.VanDriel-at-csiro.au






-----Original Message-----
X-from: White, Rosemary (PI, Black Mountain)
Sent: Friday, 8 June 2007 09:08
To: Van Driel, Rosey (LI, Geelong)

Dear all,

Are there any really tiny cameras about, or at least, fibre-optic
lenses/objectives? I ask because we have a couple of applications that
could use one. We're interested in roots growing down pre-existing soil
pores, and would like to watch what they're doing down there, either
with a
moving imaging device of some kind, or a series of portholes to watch
roots
growing past. Another group is screening different lines of cereals, in
particular, looking at development of the floral meristem. This object
of
desire is enclosed in many leaves at ground level in a cereal plant,
we'd
like to poke a small fibre-optic in to watch its development over 3-6
days,
rather than having to destroy many plants to follow the stages of
development.

I've had a rummage through numerous websites, and sent off some email
enquiries, but wondered if any on this list were aware of available
technology to do this.

cheers,
Rosemary

Dr Rosemary White rosemary.white-at-csiro.au
CSIRO Plant Industry ph. 61 (0)2-6246 5475
GPO Box 1600 fax. 61 (0)2-6246 5334
Canberra, ACT 2601
Australia

==============================Original
Headers==============================
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5, 22 -- Subject: fibre-optic probes/cameras?
5, 22 -- From: Rosemary White {Rosemary.White-at-csiro.au}
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From: Rosemary.White-at-csiro.au
Date: Thu, 7 Jun 2007 19:22:22 -0500
Subject: [Microscopy] Re: fibre-optic probes/cameras?

Contents Retrieved from Microscopy Listserver Archives
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The diameter - as small as possible..... ideally 1mm or less, which I know
is smaller than most catheter imaging systems, for example. However, for
the root project, the boroscopes look pretty good.
And of course, I got more web results using fiber-optics rather than
fibre-optics.....the boroscope site didn¹t show up before...
thanks,
cheers,
Rosemary

} From: "Justin Kraft" {kraftpiano-at-gmail.com}
} Date: Thu, 7 Jun 2007 19:43:36 -0400
} To: Rosemary.White-at-csiro.au
} Cc: microscopy-at-microscopy.com
} Subject: Re: [Microscopy] fibre-optic probes/cameras?
}
} I've used different sized boroscopes before, like the ones at
} www.uxr.com (I have no affiliation with this company, I've just seen
} their products in action before)
}
} I would say that a small boroscope would be your best bet, as you can
} port it out to video, and some come with a light source, but others
} may need a separate light source. I know they make both a flexible
} and a rigid boroscope, the rigid one being slightly less expensive.
}
} What is the size diameter you are looking for?
}
} --Justin A. Kraft
}
} On 6/7/07, Rosemary.White-at-csiro.au {Rosemary.White-at-csiro.au} wrote:
} }
} }
} }
} } ----------------------------------------------------------------------------
} } The Microscopy ListServer -- CoSponsor: The Microscopy Society of America
} } To Subscribe/Unsubscribe -- http://www.microscopy.com/MicroscopyListserver
} } On-Line Help http://www.microscopy.com/MicroscopyListserver/FAQ.html
} } ----------------------------------------------------------------------------
} }
} } Dear all,
} }
} } Are there any really tiny cameras about, or at least, fibre-optic
} } lenses/objectives? I ask because we have a couple of applications that
} } could use one. We're interested in roots growing down pre-existing soil
} } pores, and would like to watch what they're doing down there, either with a
} } moving imaging device of some kind, or a series of portholes to watch roots
} } growing past. Another group is screening different lines of cereals, in
} } particular, looking at development of the floral meristem. This object of
} } desire is enclosed in many leaves at ground level in a cereal plant, we'd
} } like to poke a small fibre-optic in to watch its development over 3-6 days,
} } rather than having to destroy many plants to follow the stages of
} } development.
} }
} } I've had a rummage through numerous websites, and sent off some email
} } enquiries, but wondered if any on this list were aware of available
} } technology to do this.
} }
} } cheers,
} } Rosemary
} }
} } Dr Rosemary White rosemary.white-at-csiro.au
} } CSIRO Plant Industry ph. 61 (0)2-6246 5475
} } GPO Box 1600 fax. 61 (0)2-6246 5334
} } Canberra, ACT 2601
} } Australia
} }
} } ==============================Original Headers==============================
} } 5, 22 -- From Rosemary.White-at-csiro.au Thu Jun 7 18:06:13 2007
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} } 5, 22 -- Subject: fibre-optic probes/cameras?
} } 5, 22 -- From: Rosemary White {Rosemary.White-at-csiro.au}
} } 5, 22 -- To: {microscopy-at-microscopy.com}
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3, 26 -- Subject: Re: [Microscopy] fibre-optic probes/cameras?
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From: tstrixnerharvey-at-qmag.com.au
Date: Thu, 7 Jun 2007 19:36:01 -0500
Subject: [Microscopy] viaWWW: Purchasing an entry level SEM

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Email: tstrixnerharvey-at-qmag.com.au
Name: Tania Strixner-Harvey

Organization: Queensland Magnesia

Title-Subject: [Filtered] Purchasing an entry level SEM

Question: Good Morning Everyone,

I have been given the task of purchasing an "entry level" SEM capable of doing surface analaysis and elemental mapping of mineralogical samples.

Unfortunately may knowledge of SEM extends to sending samples away to a university and getting beautiful reports and photographs back.

What I need is an instrument able to do EDS measurements of light elements Z=11 and above. My samples need to be carbon coated and have an approximate minimum crystal size of 5 micron.

I want to use the instrument to look at gross crystal structures (at 5 micron) such as nicely layered or random etc.

Also I want to do elemental mapping of different products at larger crystal sizes (30-5000um).

I have a reasonable budget but not extensive.

I would appreciate some pointers.

Thank you kindly.

Kind Regards,


Tania Strixner-Harvey
Principal - Research and Development

Queensland Magnesia
246 Boundary Road
Parkhurst, 4702
Australia

Tel: 61 (0) 7 49 200 241
Fax: 61 (0) 7 49 361 380

Mobile: 0408 716 988


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From: alex.titkov-at-millenniumchem.com
Date: Thu, 7 Jun 2007 20:36:54 -0500
Subject: [Microscopy] Re: viaWWW: Purchasing an entry level SEM

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Tania,

X-from what you describe, you need not an "entry level" SEM, but a
conventional SEM (high vacuum, W filament) and a reasonable EDS with high
count rate and software to be able to do mapping.

I have JEOL 6400 with Oxford INCA EDS, it comfortably does what you
describe. The only complication is that the largest map it can do at a time
is about 6 mm. So, to acquire an elemental map of 5 mm crystals and have
several of them in the field of view you will also need a motorised stage
controlled by the EDS software. An alternative would be to collect several
maps and stitch them together.

You will also need to budget for some cutting/polishing equipment a carbon
coater.

Alex

==============
Alexander Titkov
Senior Scientist
Millennium Inorganic Chemicals
a Cristal Company
Lot 4 Old Coast Road
Australind WA 6233
AUSTRALIA





tstrixnerharvey-at-q
mag.com.au To: alex.titkov-at-millenniumchem.com
cc:
08/06/2007 08:38 Subject: [Microscopy] viaWWW: Purchasing an entry level SEM
AM
Please respond to
tstrixnerharvey









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Email: tstrixnerharvey-at-qmag.com.au
Name: Tania Strixner-Harvey

Organization: Queensland Magnesia

Title-Subject: [Filtered] Purchasing an entry level SEM

Question: Good Morning Everyone,

I have been given the task of purchasing an "entry level" SEM capable of
doing surface analaysis and elemental mapping of mineralogical samples.

Unfortunately may knowledge of SEM extends to sending samples away to a
university and getting beautiful reports and photographs back.

What I need is an instrument able to do EDS measurements of light elements
Z=11 and above. My samples need to be carbon coated and have an
approximate minimum crystal size of 5 micron.

I want to use the instrument to look at gross crystal structures (at 5
micron) such as nicely layered or random etc.

Also I want to do elemental mapping of different products at larger crystal
sizes (30-5000um).

I have a reasonable budget but not extensive.

I would appreciate some pointers.

Thank you kindly.

Kind Regards,


Tania Strixner-Harvey
Principal - Research and Development

Queensland Magnesia
246 Boundary Road
Parkhurst, 4702
Australia

Tel: 61 (0) 7 49 200 241
Fax: 61 (0) 7 49 361 380

Mobile: 0408 716 988


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From: ardnek2-at-att.net
Date: Thu, 7 Jun 2007 21:13:24 -0500
Subject: [Microscopy] AskAMicroscopist: Syringes with spores

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Name: Kendra Orr

Organization: ARDNEK TUTORING

Education: 6-8th Grade Middle School

Location: Fort Lauderdale, FL 33334

Title: Re: Syringes with spores

Question: This may seem like a stupid question. However, I want to be precise. May I order a spore syringe and it will spit out spores tiny enough to see on a microscope? I am sorry........I am doing a presentation and I usually use spores from real plants that I cultivate.

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From: gcouger-at-science-info.net
Date: Fri, 8 Jun 2007 02:50:52 -0500
Subject: [Microscopy] fibre-optic probes/cameras?

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Dear Dr. White,

Do you or anyone else know if a large fiber optic strand of .25 to 1.0
mm can conduct an image that can be viewed with am 20x to 50x microscope
objective on the polished end of the fiber away form the subject in this
case roots.

I believe a lens could melted on the other end of a single fiber and
computer software could correct the distortions.

In a project such are yours I would think having a great number of low
cost lenses wold give much better coverage and allow you to cut years of
the time it takes to get results.

Gordon Couger
Stillwater OK
405 624 2855
Rosemary.White-at-csiro.au wrote:
}
} The diameter - as small as possible..... ideally 1mm or less, which I know
} is smaller than most catheter imaging systems, for example. However, for
} the root project, the boroscopes look pretty good.
} And of course, I got more web results using fiber-optics rather than
} fibre-optics.....the boroscope site didn¹t show up before...
} thanks,
} cheers,
} Rosemary
}
}
} } From: "Justin Kraft" {kraftpiano-at-gmail.com}
} } Date: Thu, 7 Jun 2007 19:43:36 -0400
} } To: Rosemary.White-at-csiro.au
} } Cc: microscopy-at-microscopy.com
} } Subject: Re: [Microscopy] fibre-optic probes/cameras?
} }
} } I've used different sized boroscopes before, like the ones at
} } www.uxr.com (I have no affiliation with this company, I've just seen
} } their products in action before)
} }
} } I would say that a small boroscope would be your best bet, as you can
} } port it out to video, and some come with a light source, but others
} } may need a separate light source. I know they make both a flexible
} } and a rigid boroscope, the rigid one being slightly less expensive.
} }
} } What is the size diameter you are looking for?
} }
} } --Justin A. Kraft
} }
} } On 6/7/07, Rosemary.White-at-csiro.au {Rosemary.White-at-csiro.au} wrote:
} }
} } }
} } } ----------------------------------------------------------------------------
} } } The Microscopy ListServer -- CoSponsor: The Microscopy Society of America
} } } To Subscribe/Unsubscribe -- http://www.microscopy.com/MicroscopyListserver
} } } On-Line Help http://www.microscopy.com/MicroscopyListserver/FAQ.html
} } } ----------------------------------------------------------------------------
} } }
} } } Dear all,
} } }
} } } Are there any really tiny cameras about, or at least, fibre-optic
} } } lenses/objectives? I ask because we have a couple of applications that
} } } could use one. We're interested in roots growing down pre-existing soil
} } } pores, and would like to watch what they're doing down there, either with a
} } } moving imaging device of some kind, or a series of portholes to watch roots
} } } growing past. Another group is screening different lines of cereals, in
} } } particular, looking at development of the floral meristem. This object of
} } } desire is enclosed in many leaves at ground level in a cereal plant, we'd
} } } like to poke a small fibre-optic in to watch its development over 3-6 days,
} } } rather than having to destroy many plants to follow the stages of
} } } development.
} } }
} } } I've had a rummage through numerous websites, and sent off some email
} } } enquiries, but wondered if any on this list were aware of available
} } } technology to do this.
} } }
} } } cheers,
} } } Rosemary
} } }
} } } Dr Rosemary White rosemary.white-at-csiro.au
} } } CSIRO Plant Industry ph. 61 (0)2-6246 5475
} } } GPO Box 1600 fax. 61 (0)2-6246 5334
} } } Canberra, ACT 2601
} } } Australia
}




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From: nizets2-at-yahoo.com
Date: Fri, 8 Jun 2007 05:52:37 -0500
Subject: [Microscopy] Carbon nanos in tissue: SEM/TEM

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Hi Randy,

Been not involved in carbon nanotube research I dont
know exactly how dense they are under the beam of a
TEM. However I don't think you can compare the density
of the carbon present in a tissue with the density of
carbon in nanotubes. The difference MUST be visible.
I wouldn't modify the nanotubes themselves because you
will definitely modify their behaviour in an
uncontrolled manner.
Now here is what I would do:
I would incubate cell monolayers with the
nanoparticles and flat embed them (control=cells
incubated at 4°C, no uptake) after ferrocyanide-osmium
post-fixation. I am pretty sure the cells will
internalize the particles (take hepatocytes like HepG2
they are very effecient at uptaking and very nice to
show). After sectionning, I would try different
contrasting intensities and also without any
contrasting at all!
This way you can define your technical parameters to
obtain the best contrast possible in "control"
samples.

Finding these particles in organs is another story,
requiring mainly eternities of patience and
dedication.
But, if I may give my personal opinion, this is a very
interesting study and probably a very rewarding one.
Few have had the heart to start it.

Regards and good luck,

Stephane





____________________________________________________________________________________
Need a vacation? Get great deals
to amazing places on Yahoo! Travel.
http://travel.yahoo.com/

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From: maryflet-at-interchange.ubc.ca
Date: Fri, 8 Jun 2007 11:32:35 -0500
Subject: [Microscopy] viaWWW: Purchasing an entry level SEM

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Dear Tania,
You should consider a basic variable-pressure SEM. They are very good for
mineralogical work and have the added bonus of not requiring a carbon
coating. For what you want to do, the new, simple table-top SEMs, such as
the Hitachi TM-1000 or the FEI Phenom-Ed might be ideal, if they do EDS.
They are very fast, simple and low cost. They use BSE imaging, which shows
up the grains on polished minerals very well. Otherwise , a simple, low-cost
variable-pressure SEM will be your best bet. I didn't think that the
variable-pressure SEM's had much to offer materials engineering
applications, but we are using it all the time and finding new uses for it
every day.
BTW, all the modern EDS systems will do the elements Z=5 (boron) and above.
Regards,

Mary Fletcher (nee Mager)
Electron Microscopist
Materials Eng. UBC
#309 - 6350 Stores Road
Vancouver, B.C. V6T 1Z4
Canada
Tel: 604-822-5648
Fax: 604-822-3619
email: maryflet-at-interchange.ubc.ca


-----Original Message-----
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Email: tstrixnerharvey-at-qmag.com.au
Name: Tania Strixner-Harvey

Organization: Queensland Magnesia

Title-Subject: [Filtered] Purchasing an entry level SEM

Question: Good Morning Everyone,

I have been given the task of purchasing an "entry level" SEM capable of
doing surface analaysis and elemental mapping of mineralogical samples.

Unfortunately may knowledge of SEM extends to sending samples away to a
university and getting beautiful reports and photographs back.

What I need is an instrument able to do EDS measurements of light elements
Z=11 and above. My samples need to be carbon coated and have an approximate
minimum crystal size of 5 micron.

I want to use the instrument to look at gross crystal structures (at 5
micron) such as nicely layered or random etc.

Also I want to do elemental mapping of different products at larger crystal
sizes (30-5000um).

I have a reasonable budget but not extensive.

I would appreciate some pointers.

Thank you kindly.

Kind Regards,


Tania Strixner-Harvey
Principal - Research and Development

Queensland Magnesia
246 Boundary Road
Parkhurst, 4702
Australia

Tel: 61 (0) 7 49 200 241
Fax: 61 (0) 7 49 361 380

Mobile: 0408 716 988


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From: peggybryson-at-kemet.com
Date: Fri, 8 Jun 2007 17:27:46 -0500
Subject: [Microscopy] viaWWW: Voltage contrast

Contents Retrieved from Microscopy Listserver Archives
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Email: peggybryson-at-kemet.com
Name: Peggy Bryson

Organization: Kemet Electronics.com

Title-Subject: [Filtered] Voltage contrast

Question: I have a Cambridge SEM and I am trying to preform voltage contrast on a multi-layer ceramic capacitor. It has been well over 10 years since I've used VC and I must have forgotten something. I can blow them up, but can get them to light up. Does anyone have a guess on what I'm doing wrong. My parameters are 5 acceleration voltage. Power supply positive wire connected capacitor and negative connected to ground. SEM bias turned off. Thanks for any suggestions.

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From: zaluzec-at-microscopy.com
Date: Sat, 9 Jun 2007 11:49:38 -0500
Subject: [Microscopy] Administrivia: May 2007 Archives on-line

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Colleagues

The May Archives for the Microscopy Listserver are now on-line at

http://www.microscopy.com


In addition, you will notice I have written the output format
routines for the search engine. Hopefully the awkward long
bits of text which occassionaly caused the display to be skewed
will no longer cause problems.


Cheers,

Nestor
Your Friendly Neighborhood SysOp

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From: goodlg-at-matthey.com
Date: Mon, 11 Jun 2007 04:39:40 -0500
Subject: [Microscopy] SEM/TEM Position JM (U.K.)

Contents Retrieved from Microscopy Listserver Archives
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Electron Microscopist

Johnson Matthey PLC is a specialist chemicals company focused on its core skills in catalysts, precious metals and fine chemicals. The Technology Centre, based at Sonning Common (approximately 40 miles West of London), undertakes research work for the group.

A vacancy has arisen at the Technology Centre for an Electron Microscopist to join our team working with both Scanning and Transmission microscopes.

The successful candidate is expected to have experience in several of the following areas of expertise:

SEM and TEM sample preparation: (Coating; Ultramicrotomy; Cryo-sample preparation)
Electron Microscope technical knowledge: (FEG sources, vacuum systems; electronics; fault finding and diagnosis)
SEM and TEM Characterisation methods: (HRTEM; STEM; HAADF Imaging; EDX; EELS; Electron diffraction analysis)

The job is based on the analysis of a variety of samples from our research groups and operating divisions, thus prior exposure to multidisciplinary subjects as well as catalysis and materials would be an advantage.

The successful candidate will be educated to HNC/Degree level as a minimum.
Applications must be made in writing with full CV and current salary details to:
Georgie Floyd, Personnel Officer, Johnson Matthey Technology Centre, Blounts Court, Sonning Common, Reading, RG4 9NH or e-mail hrjmtc-at-matthey.com

Closing date for applications: Friday 6th July 2007






If the reader of this email is not the intended recipient(s), please be advised that any dissemination, distribution or copying of this information is strictly prohibited. Johnson Matthey PLC has its main place of business at 40-42 Hatton Garden, London (020 7269 8400).

Johnson Matthey Public Limited Company
Registered Office: 40-42 Hatton Garden, London EC1N 8EE
Registered in England No 33774

Whilst Johnson Matthey aims to keep its network free from viruses you should note that we are unable to scan certain emails, particularly if any part is encrypted or password-protected, and accordingly you are strongly advised to check this email and any attachments for viruses. The company shall NOT ACCEPT any liability with regard to computer viruses transferred by way of email.

Please note that your communication may be monitored in accordance with Johnson Matthey internal policy documentation.


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From: krensing-at-ucalgary.ca
Date: Mon, 11 Jun 2007 10:11:38 -0500
Subject: [Microscopy] aluminum evaporation

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Hello all,
I have been asked what the voltage and current conditions are for
evaporation of aluminum in a tungsten basket in a vacuum evaporator. Is
this sort of information available in a reference? I don't have much
experience with metal evaporation, so any advice would be appreciated.
Thanks,
Kim


--
Kim Rensing Ph.D.
Assistant Research Professor
Manager, Microscopy and Imaging Facility

University of Calgary
Health Sciences Centre
B129 - 3330 Hospital Drive NW
Calgary, AB, Canada T2N 4N1
403-220-3488
krensing-at-ucalgary.ca

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From: dale_batchelor-at-ncsu.edu
Date: Mon, 11 Jun 2007 12:26:52 -0500
Subject: [Microscopy] SEM: Peltier Cooled Stage

Contents Retrieved from Microscopy Listserver Archives
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Can anyone recommend or otherwise provide information on an
affordable(few thousand $) Peltier cold stage suitable for use in an SEM
level vacuum (we will modify to fit several instruments)? If you know
of suitable components, our machine shop can build or modify as needed.
Thanks,

Dale Batchelor, Ph.D.
Associate Director
Analytical Instrumentation Facility
N.C. State University
Monteith Research Center room 318A
Campus Box 7531
Raleigh, NC 27695
Office 919-515-3841
FAX 919-515-6965
E-Mail dale_batchelor-at-ncsu.edu
Website www.ncsu.edu/aif


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From: mdufraine-at-ebsciences.com
Date: Mon, 11 Jun 2007 12:43:04 -0500
Subject: [Microscopy] Re: SEM: Peltier Cooled Stage

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Dale-

Emitech has a Peltier Cold Stage for SEM, the K25X, however, you'll pay
more than a few thousand dollars for the unit.
Energy Beam Sciences is the US Master Distributor for Emitech
Instruments, and we'd be happy to review your needs for this instrument
with you.

Regards,

Mike Dufraine
EM-Product Manager

dale_batchelor-at-ncsu.edu wrote:
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} Can anyone recommend or otherwise provide information on an
} affordable(few thousand $) Peltier cold stage suitable for use in an SEM
} level vacuum (we will modify to fit several instruments)? If you know
} of suitable components, our machine shop can build or modify as needed.
} Thanks,
}
} Dale Batchelor, Ph.D.
} Associate Director
} Analytical Instrumentation Facility
} N.C. State University
} Monteith Research Center room 318A
} Campus Box 7531
} Raleigh, NC 27695
} Office 919-515-3841
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} E-Mail dale_batchelor-at-ncsu.edu
} Website www.ncsu.edu/aif
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--
Michael F. Dufraine
EM - Product Manager
TEL 800-992-9037 X340
MDufraine-at-ebsciences.com
www.ebsciences.com


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From: gary-at-gaugler.com
Date: Mon, 11 Jun 2007 13:34:35 -0500
Subject: [Microscopy] Re: SEM: Peltier Cooled Stage

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

I use a Deben XP stage and am very happy with it.
The XP does extended temperature at high end which
if not needed, would suggest a different model.

Deben is in the UK.

gary g.


At 09:28 AM 6/11/2007, you wrote:




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From: jd-at-laddresearch.com
Date: Mon, 11 Jun 2007 16:07:06 -0500
Subject: [Microscopy] Re: aluminum evaporation

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Voltage and current requirements vary depending upon the volume of
aluminum you are evaporating. We coat substrates in the Ladd
evaporator by starting out with a very low voltage and adjusting it
higher till the aluminum starts to evaporate.

If you wish you can call Mike Bouchard at Ladd - 1-800-451-3406 to
discuss particulars. He has many years of experience in the
manufacture of the Ladd evaporator and substrate coating.

John Arnott

Disclaimer: Ladd sells electron microscopy supplies including a
vacuum evaporator, coated grids and substrates.

Ladd Research
83 Holly Court
Williston, VT 05495

On-line Catalog: www.laddresearch.com

Telephone: 1-802-658-4961 (anywhere)
Toll Free 1-800-451-3406 (US)
Fax: 1-802-660-8859

e-mail: sales-at-laddresearch.com

At 11:18 AM 6/11/2007, you wrote:



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From: Joe.Williamson-at-fei.com
Date: Mon, 11 Jun 2007 16:28:37 -0500
Subject: [Microscopy] FW: FEI Job Opportunity Circuit Edit Applications Engineer

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


FEI Company has a current opening for a Sr. Applications Engineer with a
background in front and back side circuit edit. This position is
located in Hillsboro, Oregon and would be responsible for providing
equipment testing, acceptance, demonstration, training, marketing, and
sales support to current and potential customers. If you are
interested, please follow the link to see the entire job description.
Feel free to apply directly online and I will see every resume that
comes in. We also have several other openings listed on our website as
well.

http://careers.fei.com/DetailFEI.asp?fei891-HBO

Thanks,


Joe Williamson
Corporate Recruiter
FEI Company
joe.williamson-at-fei.com
Direct Ph: 503-726-2639
Toll Free: 800-334-1403
Fax: 503-726-7509
www.fei.com



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From: sergei2-at-ornl.gov
Date: Mon, 11 Jun 2007 17:02:08 -0500
Subject: [Microscopy] MRS 2007 Fall Meeting - Symposium on Scanning Probe Microscopy

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Dear colleagues
We would like to bring to your attention the symposium on Nanoscale
Phenomena in Functional Materials by Scanning Probe Microscopy, to be
held at the Materials Research Society 2007 Fall meeting in Boston, MA.
The symposium description is attached below and can also be accessed on
the MRS web-site (http://www.mrs.org/s_mrs/sec.asp?CID=8005&DID=192095).
The deadline for abstract submission is June 20.
Looking forward to seeing you in Boston
On behalf of the organizers
Sergei V. Kalinin




Symposium B: Nanoscale Phenomena in Functional Materials by Scanning
Probe Microscopy

The last decade has witnessed spectacular progress in the development
and applications of scanning probe microscopy (SPM)-based nanoscale
imaging techniques. The combination of high spatial resolution and
sensitivity to local electronic, optical, and mechanical properties
places these techniques among the most versatile tools for nanoscience,
biology, physics, and materials science. Atomic and electronic structure
of surfaces, vibrational excitations, energy flow, and local materials
properties on the molecular level has become accessible with the advent
of high-resolution SPMs. Electrostatic SPMs are being established as
powerful techniques for spatially resolved studies of electronic
transport on the nanometer level at electroactive interfaces and in
molecular electronic devices such as carbon nanotubes. Dynamic SPM modes
and scanning indentation techniques allow mechanical compliance and
surface energy to be investigated at the nanoscale with applications to
the emerging fields of nanotribology, nanofluidics, nanocomposites, and
NEMS. Novel optical imaging modes, such as tip-enhanced spectroscopy,
solid immersion microscopy, and apertureless scanning optical
microscopy, have joined the now-established near-field scanning optical
microscopy (NSOM), bringing the resolution of optical spectroscopy into
the nanoscale regime and complementing local electronic measurements of
materials with the STM family of instruments. These new measurement
techniques were necessitated by the growing need for materials
characterization on the nanoscale and have in turn led to the discovery
of new nanoscale phenomena. Finally, the SPM has been used to manipulate
and fabricate materials at the nanoscale.

It is the goal of this symposium to provide a multidisciplinary forum
for scanning-probe-based materials and nanoscience in order to
demonstrate the latest achievements in technique developments and
materials applications that have led to scientific discoveries. The
symposium will include two types of sessions: One will be dedicated to
the recent advances in technique development of interest to the
materials community and will bring together specialists in practical and
theoretical aspects of SPM imaging. The second will focus on specific
materials-related phenomena, including nanotubes and nanowires, quantum
dots, surfaces, interfaces, and biological systems studied by local
probe techniques.

The topics of the symposium will include, but not be limited to:

* Imaging, manipulation, and energy transfer on the atomic and
molecular level by atomic resolution NC-AFM and STM
* Local optical and electronic properties and excitations, e.g.,
plasmons measured with SPMs
* Defects, impurities, dopants, and transport in semiconductor
nanostructures, nanotubes, and nanowires
* Mechanics and electromechanics on the nanoscale by SPM and
nanoindentation
* Mechanical and voltage nanolithography and surface modification
* Energy flows and dissipation in materials, devices, and
nanostructures
* Transport in single-molecule devices and carbon nanotubes
* Imaging and characterization of ferroelectric materials
* Electronic properties of semiconductor heterostructures
* Imaging and characterization of biological systems
* Dynamics and imaging of polymers and soft materials

Invited speakers include: *Robert Carpick* (Univ. of Pennsylvania),
*Levent Degertekin* (Georgia Inst. of Technology), *Dennis Discher*
(Univ. of Pennsylvania), *Ricardo Garcia* (Univ. Madrid, Spain), *Franz
Giessibl* (Univ. Augsburg, Germany), *Venkat Gopalan* (Pennsylvania
State Univ.), *Jan Hoh* (Johns Hopkins Univ.), *Ernesto Joselevich*
(Weizmann Inst. of Science, Israel), *Maki Kawai* (RIKEN, Japan), *L.
Kuipers* (FOM, The Netherlands), *Alexander Malkin* (Lawrence Livermore
National Lab), *Lukas Novotny* (Univ. of Rochester), *E. Ward* *Plummer*
(Univ. of Tennessee/Oak Ridge National Lab), *V. Sandoghdar* (ETH
Zurich, Switzerland), *M. Tomitori* (JAIST, Japan), and *S. Wilks*
(Swansea Univ., United Kingdom).

*Symposium Organizers*

*Dawn** Bonnell*
University of Pennsylvania, Nano/Bio Interface Center, 3231 Walnut St.,
Philadelphia, PA 19104
Tel 215-898-6231, Fax 215-746-3204, bonnell-at-lrsm.upenn.edu
{mailto:bonnell-at-lrsm.upenn.edu}

*Sergei V. Kalinin*
Oak Ridge National Laboratory, Materials Sciences and Technology
Division and Center for Nanophase Materials Sciences, 1 Bethel Valley
Rd., Oak Ridge, TN 37831
Tel 865-241-0236, Fax 865-574-4143, sergei2-at-ornl.gov
{mailto:sergei2-at-ornl.gov}

*Sidney R. Cohen*
Weizmann Institute of Science, Surface Analysis Laboratory, Rehovot
76100 Israel
Tel 972-8-934-2703/3422, Fax 972-8-934-4137, sidney.cohen-at-weizmann.ac.il
{mailto:sidney.cohen-at-weizmann.ac.il}

*Richard E. Palmer*
University of Birmingham, School of Physics and Astronomy, Nanoscale
Physics Research Laboratory, Birmingham B15 2TT, United Kingdom
Tel 44-121-414-4653, Fax 44-121-414-7327, r.e.palmer-at-bham.ac.uk
{mailto:r.e.palmer-at-bham.ac.uk}


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From: L.Ryves-at-physics.usyd.edu.au
Date: Mon, 11 Jun 2007 19:25:06 -0500
Subject: [Microscopy] AskAMicroscopist: Beam voltage choice to minimise charging

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This Question was submitted to Ask-A-Microscopist by (L.Ryves-at-physics.usyd.edu.au)
from http://www.msa.microscopy.org/Ask-A-Microscopist/Ask-A-Microscopist.html on Monday, June 11, 2007 at 09:13:35
Remember to consider the Grade/Age of the student when considering the Question
---------------------------------------------------------------------------
Please reply to both L.Ryves-at-physics.usyd.edu.au as well as to the Microscopy Listserver
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Email: L.Ryves-at-physics.usyd.edu.au
Name: Luke Ryves

Organization: School of Physics / University of Sydney

Education: Graduate College

Location: Sydney, NSW, Australia

Title: Beam voltage choice to minimise charging

Question: Hi,

I'm just writing up my thesis and want to include some SEM images that were acquired for me ages ago. The samples were metal particles on SiO2 surfaces. At the time that we were taking the images I remember the microscopist explaining that the correct energy (2 to 5kV on a FEG SEM) can reduce charging, but I can't find a reference to this effect. Can you help me out by explaining how to choose the beam energy, and perhaps point me in the direction of some references?

---------------------------------------------------------------------------

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From: gary-at-gaugler.com
Date: Mon, 11 Jun 2007 19:45:16 -0500
Subject: [Microscopy] Re: AskAMicroscopist: Beam voltage choice to

Contents Retrieved from Microscopy Listserver Archives
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It is a fundamental principle that lower KV reduces
charging. Joy, Goldstein and Newbury, et. al. have
written about this factor. In practice, we see it
all the time.

The actual KV value depends on the specimen and the
ability of the SEM to image what you want to see.
I use 500V to 2KV on SiO2 and Hf oxides. This is
useful up to about 60KX with Zeiss Supra 55VP in HV
mode. Other systems will likely differ.

Hope this helps.

gary g.


At 04:26 PM 6/11/2007, you wrote:




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From: alex.titkov-at-millenniumchem.com
Date: Mon, 11 Jun 2007 19:53:38 -0500
Subject: [Microscopy] Re: aluminum evaporation

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Kim,

There is no set voltage/current to evaporate aluminium. A variable power
source is used to achieve this. A current is gradually increased until
aluminium melts and then a little bit more increase starts the evaporation.

We achieved good results using a tungsten wire with v-shaped bend on which
a small v-shaped piece of Al wire was hung.

Alex

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11/06/2007 11:15 Subject: [Microscopy] aluminum evaporation
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Hello all,
I have been asked what the voltage and current conditions are for
evaporation of aluminum in a tungsten basket in a vacuum evaporator. Is
this sort of information available in a reference? I don't have much
experience with metal evaporation, so any advice would be appreciated.
Thanks,
Kim


--
Kim Rensing Ph.D.
Assistant Research Professor
Manager, Microscopy and Imaging Facility

University of Calgary
Health Sciences Centre
B129 - 3330 Hospital Drive NW
Calgary, AB, Canada T2N 4N1
403-220-3488
krensing-at-ucalgary.ca

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From: colijn.1-at-osu.edu
Date: Mon, 11 Jun 2007 20:41:01 -0500
Subject: [Microscopy] Re: AskAMicroscopist: Beam voltage choice to minimise

Contents Retrieved from Microscopy Listserver Archives
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Luke,

You can find information about varying the beam voltage in most any
edition of "Scanning Electron Microscopy and X-Ray Microanalysis"
(usually referred to as "SEMXM") by Goldstein, Newbury, Echlin, Joy,
Fiori, and Lifshin. Look for information on the production
efficiency of Secondary Electrons as a function of beam voltage. If
I remember correctly, the SE coefficient went above 1 roughly between
800V and 1.5kV for SiO2 (anyone want to correct me?).

Cheers,
Henk

At 08:26 PM 6/11/2007, you wrote:



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From: gary-at-gaugler.com
Date: Mon, 11 Jun 2007 20:48:41 -0500
Subject: [Microscopy] AskAMicroscopist: Beam voltage choice to

Contents Retrieved from Microscopy Listserver Archives
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That is quite probably true. That is why I use 1KV
and then 2KV. Beyond these values, specimens charge
too much to be of use....IMO.

Other ILDs besides SiO2 are quite interesting and
challenging. Of course, the gate oxides are another
challenge.

gary g.


At 05:42 PM 6/11/2007, you wrote:




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From: walck-at-southbaytech.com
Date: Mon, 11 Jun 2007 23:38:47 -0500
Subject: [Microscopy] Re: AskAMicroscopist: Beam voltage choice to minimise

Contents Retrieved from Microscopy Listserver Archives
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First, you want to use a fast scan and average the frames. Just use enough
frames in the average so that the updated image doesn't take too long. This
is a dynamic affect and helps a lot. Slow scans are more difficult to set
up the low voltage imaging. I can tell you that from personal experience on
an older non-digital Hitachi S-900. When you went to slow scan to shoot the
picture on Polaroid after using TV rates to set up a good charge balance
image, you got charging in the recorded image.

Secondly, you need to find the correct voltage for charge balance. This is
where the number of electrons (BSE and SE) is the same as incident number of
electrons, i.e. beam current. For most insulators, as mentioned before, the
voltage will be somewhere between 1 and 2 kV for a flat sample at zero tilt.
If I remember correctly, go to a mag of about 1000 X, stay there for a
little bit, then up the mag to 5000 X and stay there for about 20-30
seconds, then return quickly back to 1000 X. If you don't have charge
balance, you will see a box in the lower mag image. Look quickly, because
it will change. If the contrast of the box is bright relative to the low
mag area, then your box had charged negatively and you are above the balance
accelerating voltage. If the box was dark, then you were below the voltage
and you have to increase the voltage. If it doesn't change contrast, you
were JUST right. Eat your porridge and go take some nice pictures after
your nap.

Also note, that for tilted samples the voltage value will increase. For
example, on the JEOL Auger system, you could take uncoated insulators and do
analysis at a beam voltage of 3 kV if the sample was tilted to an angle of
about 70 degrees. This is because of the increase in both BSE and SE
signals at the higher tilt angles. Essentially, the voltage shifted from
about 1 kV at zero tilt to 3 kV at 70 degrees.

Hope this helps.


-Scott

Scott D. Walck, Ph.D.
Technical Director
South Bay Technology, Inc.
1120 Via Callejon
San Clemente, CA 92673

US Toll Free: 1-800-728-2233
Tel: (949) 492-2600
Fax: (949) 492-1499

www.southbaytech.com
walck-at-southbaytech.com



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From: bernard-at-berkeleyrc.com
Date: Tue, 12 Jun 2007 01:07:07 -0500
Subject: [Microscopy] Re: Specimen charging reference

Contents Retrieved from Microscopy Listserver Archives
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This is summarized in Goldstein's section 4.8.2., which is titled Charging.

Scanning Electron Microscopy and X-Ray Microanalysis, A Text for
Biologists, Materials Scientists, and Geologists, 2nd Ed., Goldstein,
J.I., et al., 1992.

--
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President, Mechanical Engineer, and Fire Scientist
Berkeley Research Company (BRC)
600 Addison Street
Berkeley, CA 94710-1920
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From: nizets2-at-yahoo.com
Date: Tue, 12 Jun 2007 02:51:24 -0500
Subject: [Microscopy] Specimen charging reference

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

After an internet search I found this book. Is this
the last edition of the same book?

Scanning Electron Microscopy and X-ray Microanalysis
Goldstein, J., Newbury, D.E., Joy, D.C., Lyman, C.E.,
Echlin, P., Lifshin, E., Sawyer, L.C., Michael, J.R.

3rd ed. 2003. Corr. 4th printing, 2007, 586 p., with 5
pg 4/C insert, Hardcover

Best regards,

Stephane

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} This is summarized in Goldstein's section 4.8.2.,
} which is titled Charging.
}
} Scanning Electron Microscopy and X-Ray
} Microanalysis, A Text for
} Biologists, Materials Scientists, and Geologists,
} 2nd Ed., Goldstein,
} J.I., et al., 1992.
}
} --
} Bernard R. Cuzzillo, Ph.D., P.E.
} President, Mechanical Engineer, and Fire Scientist
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} 600 Addison Street
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From: j.bilde-at-risoe.dk
Date: Tue, 12 Jun 2007 08:28:16 -0500
Subject: [Microscopy] AskAMicroscopist: Beam voltage choice to minimise charging

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

A number of people have already explained the basic ideas and given you relevant references. I just wish to add that you can find experimental curves of secondary yield vs. acceleration voltage (including curves for SiO2) at the webaddress

http://www.mc-set.com/bse/

Best regards,

Jørgen B. Bilde-Sørensen
senior scientist, ph.d.
Phone direct +45 4677 5802
j.bilde-at-risoe.dk


Materials Research Department
Risø National Laboratory
Technical University of Denmark - DTU
Building 228, P.O. Box 49
DK-4000 Roskilde, Denmark
Tel +45 4677 5700
Fax +45 4677 5758
www.risoe.dk

X-from 1 January 2007, Risø National Laboratory, the Danish Institute for Food and Veterinary Research,
the Danish Institute for Fisheries Research, the Danish National Space Center and
the Danish Transport Research Institute have been merged with
the Technical University of Denmark (DTU) with DTU as the continuing unit.











-----Original Message-----
X-from: L.Ryves-at-physics.usyd.edu.au [mailto:L.Ryves-at-physics.usyd.edu.au]
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To: j.bilde-at-risoe.dk

This Question was submitted to Ask-A-Microscopist by (L.Ryves-at-physics.usyd.edu.au)
from http://www.msa.microscopy.org/Ask-A-Microscopist/Ask-A-Microscopist.html on Monday, June 11, 2007 at 09:13:35
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Email: L.Ryves-at-physics.usyd.edu.au
Name: Luke Ryves

Organization: School of Physics / University of Sydney

Education: Graduate College

Location: Sydney, NSW, Australia

Title: Beam voltage choice to minimise charging

Question: Hi,

I'm just writing up my thesis and want to include some SEM images that were acquired for me ages ago. The samples were metal particles on SiO2 surfaces. At the time that we were taking the images I remember the microscopist explaining that the correct energy (2 to 5kV on a FEG SEM) can reduce charging, but I can't find a reference to this effect. Can you help me out by explaining how to choose the beam energy, and perhaps point me in the direction of some references?

---------------------------------------------------------------------------

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From: TindallR-at-missouri.edu
Date: Tue, 12 Jun 2007 08:43:12 -0500
Subject: [Microscopy] Carbon nanos in tissue

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Thanks to everybody who replied to my query about imaging carbon
nanoparticles in tissue. I will prepare a summary of the replies soon
and post it for the list.

As usual, this list has been a great resource. Thanks again.

Randy

Randy Tindall
Senior EM Specialist
Electron Microscopy Core Facility---We Do Small Well!
W125 Veterinary Medicine
University of Missouri
Columbia, MO 65211
Tel: (573) 882-8304
Fax: (573) 884-2227
Email: tindallr-at-missouri.edu
Web: http://www.emc.missouri.edu
On-line calendar:
http://biotech.rnet.missouri.edu/cgi-bin/Calcium310.pl?Op=Splash&Amount=
Week&NavType=Both&Type=TimePlan


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From: r-holdford-at-ti.com
Date: Tue, 12 Jun 2007 11:32:47 -0500
Subject: [Microscopy] Re: Specimen charging reference

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Stephanie: the 3rd edition is the most recent, but I think the 2nd
edition is more useful to the novice/intermediate user. The section
cited in the message by Dr. Cuzzillo is for the 2nd edition and is not
in the 3rd edition as its own section. The information may be scattered
around in Section 4 but I haven't sat down and looked for it.

Just an FYI: if you buy the 3rd edition as a used book, make sure it
has the CD with it.

nizets2-at-yahoo.com wrote:
} ----------------------------------------------------------------------------
} The Microscopy ListServer -- CoSponsor: The Microscopy Society of America
} To Subscribe/Unsubscribe -- http://www.microscopy.com/MicroscopyListserver
} On-Line Help http://www.microscopy.com/MicroscopyListserver/FAQ.html
} ----------------------------------------------------------------------------
}
} After an internet search I found this book. Is this
} the last edition of the same book?
}
} Scanning Electron Microscopy and X-ray Microanalysis
} Goldstein, J., Newbury, D.E., Joy, D.C., Lyman, C.E.,
} Echlin, P., Lifshin, E., Sawyer, L.C., Michael, J.R.
}
} 3rd ed. 2003. Corr. 4th printing, 2007, 586 p., with 5
} pg 4/C insert, Hardcover
}
} Best regards,
}
} Stephane
}
} --- bernard-at-berkeleyrc.com wrote:
}
} ----------------------------------------------------------------------------
} } This is summarized in Goldstein's section 4.8.2.,
} } which is titled Charging.
} }
} } Scanning Electron Microscopy and X-Ray
} } Microanalysis, A Text for
} } Biologists, Materials Scientists, and Geologists,
} } 2nd Ed., Goldstein,
} } J.I., et al., 1992.
} }
} } --
} } Bernard R. Cuzzillo, Ph.D., P.E.
} } President, Mechanical Engineer, and Fire Scientist
} } Berkeley Research Company (BRC)
} } 600 Addison Street
} } Berkeley, CA 94710-1920
} } USA
} }
} } bernard-at-berkeleyrc.com
} }
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From: glenmac-at-u.washington.edu
Date: Wed, 13 Jun 2007 12:50:47 -0500
Subject: [Microscopy] MandM roommate site

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Is there a website for attendees looking to share hotel rooms for the
MandM meeting in Ft. Lauderdale?

thanks,
Glen


Glen MacDonald
Core for Communication Research
Virginia Merrill Bloedel Hearing Research Center
Box 357923
University of Washington
Seattle, WA 98195-7923 USA
(206) 616-4156
glenmac-at-u.washington.edu

************************************************************************
******
The box said "Requires WindowsXP or better", so I bought a Macintosh.
************************************************************************
******



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From: zaluzec-at-aaem.amc.anl.gov
Date: Wed, 13 Jun 2007 13:04:40 -0500
Subject: [Microscopy] Re: This is no MandM roommate site

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Sorry Glen, but there is no site like this setup by the Meeting.


Nestor
Your Friendly Neighborhood SysOp




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--
===========================================
Dr. Nestor J. Zaluzec
Argonne National Lab
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The box said ...
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So I bought a Mac !

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From: laable-at-solutia.com
Date: Thu, 14 Jun 2007 08:50:39 -0500
Subject: [Microscopy] SEM Ground

Contents Retrieved from Microscopy Listserver Archives
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To All Listers,

I have recently been having problems with my field emission scope lately at magnifications above 50KX. The image seems to swim and sparkles are seen and the focus boundaries. A slow scan image impossible to acquire. The ground is suspected. It is currently grounded to the building at the same location as all the rest of the analytical equipment. Our electricians are in the process of rerunning a separate ground for the scope. They are going to put an eight foot copper rod in the earth outside of my lab drill hole in the wall for wires to go through and attach it to the ground wires to the back of the scope. I was wondering how the rest of have run the grounds for your scopes. Any advice would be appreciated.

Lori Ables
Solutia, Inc.
laable-at-solutia.com


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From: wesaia-at-iastate.edu
Date: Thu, 14 Jun 2007 10:37:09 -0500
Subject: [Microscopy] SEM Ground

Contents Retrieved from Microscopy Listserver Archives
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You have not described the operating conditions or the samples. Has anything changed in those regards? Perhaps the matter is one of sample charging more so that instrumentation problems. I would certainly address those issues first with an application specialist or the list before resorting to the wiring change. That is not likely to be cheap.
 
If it is the ground, it sounds like the remedy is reasonable. It sounds like your people are on the right path.
 
Warren

________________________________________
X-from: laable-at-solutia.com [mailto:laable-at-solutia.com]
Sent: Thu 6/14/2007 8:51 AM
To: wesaia-at-iastate.edu

To All Listers,

I have recently been having problems with my field emission scope lately at magnifications above 50KX.  The image seems to swim and sparkles are seen and the focus boundaries.  A slow scan image impossible to acquire.  The ground is suspected.  It is currently grounded to the building at the same location as all the rest of the analytical equipment.  Our electricians are in the process of rerunning a separate ground for the scope.  They are going to put an eight foot copper rod in the earth outside of my lab drill hole in the wall for wires to go through and attach it to the ground wires to the back of the scope.  I was wondering how the rest of have run the grounds for your scopes.  Any advice would be appreciated.

Lori Ables
Solutia, Inc.
laable-at-solutia.com


This electronic mail message is intended exclusively for the individual or entity to which it is addressed.
This message, together with any attachment, may contain Solutia confidential and privileged information.
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From: gary-at-gaugler.com
Date: Thu, 14 Jun 2007 11:54:48 -0500
Subject: [Microscopy] Carbon "contamination"

Contents Retrieved from Microscopy Listserver Archives
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Greetings all--I am seeking input on what appears
to be Carbon contamination. Here is the situation.

Take a Pella 16111-9 stub out of bag and put on
holder. Take another stub out of bag and sputter
coat with Pd and put on holder. Do EDS on both.

un-coated:
wt% at%
C 7.5 15
O 4.5 7
Al 88 78

coated:
C 23 38
O 6.5 8
Al 71 53

SEM is Zeiss Supra 55VP with Edwards XDS10 dry
scroll pump and turbo. Coater is Denton Desk IV
with Edwards XDS5 and turbo.

The goal of using non-oil pumps was to reduce hydrocarbon
contamination. So, where is the C coming from? Nothing
has been done to the scroll pumps since new. There are
kits for repairing them but when is this necessary and
what would indicate that it be done? Would high C
be an indicator?

I'm stumped on this one.

Any ideas?

gary g.


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From: johnf-at-geology.wisc.edu
Date: Thu, 14 Jun 2007 12:30:30 -0500
Subject: [Microscopy] Re: Carbon "contamination"

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} ----------------------------------------------------------------------------
} The Microscopy ListServer -- CoSponsor: The Microscopy Society of America

Can't help with the uncoated stub, but most of the "C Ka" you are
seeing is presumably from the Pd Mz line which is at 43.36 A (vs the
nominal 44.0 A for C Ka).

John
--
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From: david.knecht-at-uconn.edu
Date: Thu, 14 Jun 2007 12:40:46 -0500
Subject: [Microscopy] objective NA

Contents Retrieved from Microscopy Listserver Archives
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One can buy a 40-100x oil objective with an iris diaphram. What is
the theoretical difference in performance between imaging with a low
NA dry objective (.6NA for example) and an equivalent magnification,
high NA oil objective with the iris partially closed to reduce the NA
to .6? Should they be similar? Thanks- Dave


Dr. David Knecht
Department of Molecular and Cell Biology
Co-head Flow Cytometry and Confocal Microscopy Facility
U-3125
91 N. Eagleville Rd.
University of Connecticut
Storrs, CT 06269
860-486-2200
860-486-4331 (fax)



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From: bozzola-at-siu.edu
Date: Thu, 14 Jun 2007 13:11:28 -0500
Subject: [Microscopy] Re: Carbon "contamination"

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All,

The electricians have finished my ground and the result is amazing. I can now obtain a decent slow scan image at 500KX. Thanks to all who replied.

Lori

-----Original Message-----
X-from: Ables, Lori A
Sent: Thursday, June 14, 2007 8:50 AM
To: ' (Microscopy-at-Microscopy.Com)'

Gary,

You're pretty clever, Gary, and I'm sure you've already done this.
But......have you checked for any exposed wiring, gaskets or seals
near the target that might be degraded when the plasma is activated?
Are you using Argon gas to vent the system and as the source of
plasma? If so, how clean is the gas used to generate plasma?
Sometimes, gas cylinders contain traces of oil (as might the pressure
regulators). Check the threads for the presence of a lubricant.
Anyone else using the system? If so, they may have left some
contamination inside the chamber (like finger oils).

If you are still having problems, try putting a coated TEM grid
inside the chamber and examine it for traces of contamination.
Sometimes, "seeing" the contamination is a clue to where it may be
coming from.

Good luck.......

John B.

} Greetings all--I am seeking input on what appears
} to be Carbon contamination. Here is the situation.
}
} Take a Pella 16111-9 stub out of bag and put on
} holder. Take another stub out of bag and sputter
} coat with Pd and put on holder. Do EDS on both.
} The goal of using non-oil pumps was to reduce hydrocarbon
} contamination. So, where is the C coming from? Nothing
} has been done to the scroll pumps since new. There are
} kits for repairing them but when is this necessary and
} what would indicate that it be done? Would high C
} be an indicator?
}


--
+++++++++++++++++++++++++++++++++++++++++++++++++++++++

John J. Bozzola, Ph.D., Director
Integrated Microscopy & Graphics Expertise (IMAGE)
Southern Illinois University
750 Communications Drive - MC 4402
Carbondale, IL 62901
Telephone: 618-453-3730

+++++++++++++++++++++++++++++++++++++++++++++++++++++++

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From: donovan-at-uoregon.edu
Date: Thu, 14 Jun 2007 13:23:37 -0500
Subject: [Microscopy] Re: FW: SEM Ground

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Lori,
I am pleased that you saw such an improvement. Your original ground
connection must have been pretty bad!

Because of the importance of an electrically quiet and isolated
instrument ground, most instrument manufacturers won't install the
instrument unless one is available. For example FEI quotes a less
than 0.1 ohm resistance requirement and that doesn't even address the
electrical noise issue.

In the new integrated science complex (underground shared
instrumentation facilities) building that we are putting the
finishing touches on here at Univ of Oregon, we designed in separate
isolated, instrument grounds for each instrument. We had to negotiate
with the electrical inspector to get this through and it wasn't easy.
john


At 10:49 AM 6/14/2007, you wrote:

} All,
}
} The electricians have finished my ground and the result is
} amazing. I can now obtain a decent slow scan image at 500KX. Thanks
} to all who replied.
}
} Lori
}
} -----Original Message-----
} X-from: Ables, Lori A
} Sent: Thursday, June 14, 2007 8:50 AM
} To: ' (Microscopy-at-Microscopy.Com)'
} Subject: SEM Ground
}
} To All Listers,
}
} I have recently been having problems with my field emission scope
} lately at magnifications above 50KX. The image seems to swim and
} sparkles are seen and the focus boundaries. A slow scan image
} impossible to acquire. The ground is suspected. It is currently
} grounded to the building at the same location as all the rest of the
} analytical equipment. Our electricians are in the process of
} rerunning a separate ground for the scope. They are going to put an
} eight foot copper rod in the earth outside of my lab drill hole in
} the wall for wires to go through and attach it to the ground wires
} to the back of the scope. I was wondering how the rest of have run
} the grounds for your scopes. Any advice would be appreciated.
}
} Lori Ables
} Solutia, Inc.
} laable-at-solutia.com
}
}
} This electronic mail message is intended exclusively for the
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From: ph2-at-sprynet.com
Date: Thu, 14 Jun 2007 13:47:28 -0500
Subject: [Microscopy] objective NA

Contents Retrieved from Microscopy Listserver Archives
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Using basic theory the resolution should be the same [d =
(Wavelength)/(2*NA)]. The fourier plane would be slightly different but not
sure of the effects.

The depth of field should be (theoretically) better with an oil/water
immersion stopped down. I haven't tested this personally.

Practically, I've noticed that there is less noise (scattered) light with
both my oil and water immersion objectives.

Tony

......................................................................
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pH2, LLC
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-----Original Message-----
X-from: david.knecht-at-uconn.edu [mailto:david.knecht-at-uconn.edu]
Sent: Thursday, June 14, 2007 1:45 PM
To: ph2-at-sprynet.com

One can buy a 40-100x oil objective with an iris diaphram. What is
the theoretical difference in performance between imaging with a low
NA dry objective (.6NA for example) and an equivalent magnification,
high NA oil objective with the iris partially closed to reduce the NA
to .6? Should they be similar? Thanks- Dave


Dr. David Knecht
Department of Molecular and Cell Biology
Co-head Flow Cytometry and Confocal Microscopy Facility
U-3125
91 N. Eagleville Rd.
University of Connecticut
Storrs, CT 06269
860-486-2200
860-486-4331 (fax)



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From: gary-at-gaugler.com
Date: Thu, 14 Jun 2007 13:52:46 -0500
Subject: [Microscopy] Carbon "contamination"

Contents Retrieved from Microscopy Listserver Archives
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Thanks for the reply and to the others who have replied.

More data.

Gas is industrial welding Ar run through a Matheson
molecular sieve (to dry and filter). SEM chamber
uses industrial N2 also run through a molecular sieve.

Specimens are put in SEM chamber via Fjeld M-100
specimen load lock. This unit is pumped with small
oil pump and turbo. Main SEM door is rarely opened.
I have to check load lock pumps to see if it really
is an oil roughing pump. I thought I got a dry unit
for this too.

Pd target is from Refining Systems Las Vegas and is
99.5% pure. Trace elements do not include C. Coater
is only used by myself. Chamber of coater is stainless
steel (so it seems--but metal nevertheless). Only visible
seal is the L ring rubber, or whatever, at the top.

This C issue just came up while trying to quant TaN on
Si. It showed C that should not be there. So now I wonder
about all spectra work and quants that include C.
I can't think of a way to narrow down where the C is
coming from and how to negate it. I will try cleaning
the stubs and also try other stub types.

Exactly what are you saying about the TEM grid? The
procedure is not clear to me. Are you saying I should
coat it with Pd? Then what? I have STEM but not TEM.

gary g.





At 10:13 AM 6/14/2007, you wrote:
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From: stefan.diller-at-t-online.de
Date: Thu, 14 Jun 2007 14:15:13 -0500
Subject: [Microscopy] EDS problem - fluorescence ?

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Dear All,
I did some EDS spectra on small steel particles. Specimen is uncoated on a
adhesive C-tab.
Energy had been 15 KV. I used a Roentec SLEW window detector.
See images and spectra at www.elektronenmikroskopie.info/eds

Is there any other explaination for the titan peak to show up rather than
it really is there in the specimen?
Is there any possibility for fluorescense?
Sorry in advance if this question is too simple for the list. I am not very
experienced in interpreting eds spectra...

Best regards,
Stefan


----------------------------------------------------------------------------
-----------------------------------------
Stefan Diller - Scientific Photography
Arndtstrasse 22
D - 97072 Wuerzburg Germany
++49 - 931 - 7848700 Phone
++49 - 931 - 7848701 Fax
++49 - 175 - 717 70 51 Cell-Phone

Websites:
www.stefan-diller.com
www.elektronenmikroskopie.info
www.assisi.de
Anfahrt: http://mail.map24.com/stefan.diller
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From: wesaia-at-iastate.edu
Date: Thu, 14 Jun 2007 14:29:03 -0500
Subject: [Microscopy] EDS problem - fluorescence ?

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

My first impression is that the titanium is real. It would be a little
surprising for a regular stainless steel, but I see you also have cobalt
peaks present. The peak around 7 kV is too intense to be only Fe K-beta.
Co K-alpha is at 6.93 kV. You have a somewhat unusual specimen and Ti
might be in order.

I don't know your x-ray system. I would highly recommend deconvoluting
with the elements you know to be present and then examining the
residuals from the fit. (Hopefully your system can show you the
residuals. They are very helpful.) See what peaks or portions thereof
are unaccounted for. I have had several different flavors of EDS systems
over the years. They generally do a fair job of deconvolution _if_ you
give them the right elements to begin with. For example, if I have a
small mess around 2.3 kV and I let the EDS work with both S-K and Mo-L
and Pb-M, it will generally give me a fair idea of which element is
present if I have counted enough to well define my peaks.

The corollary is if you give the wrong elements or let the EDS pick the
wrong elements on its own, you can get some quite screwy answers. Mo can
turn into S. Ba can turn into Ti and Ag can turn into Ar.

Warren

-----Original Message-----
X-from: stefan.diller-at-t-online.de [mailto:stefan.diller-at-t-online.de]
Sent: Thursday, June 14, 2007 2:16 PM
To: wesaia-at-iastate.edu

Dear All,
I did some EDS spectra on small steel particles. Specimen is uncoated on
a
adhesive C-tab.
Energy had been 15 KV. I used a Roentec SLEW window detector.
See images and spectra at www.elektronenmikroskopie.info/eds

Is there any other explaination for the titan peak to show up rather
than
it really is there in the specimen?
Is there any possibility for fluorescense?
Sorry in advance if this question is too simple for the list. I am not
very
experienced in interpreting eds spectra...

Best regards,
Stefan


------------------------------------------------------------------------
----
-----------------------------------------
Stefan Diller - Scientific Photography
Arndtstrasse 22
D - 97072 Wuerzburg Germany
++49 - 931 - 7848700 Phone
++49 - 931 - 7848701 Fax
++49 - 175 - 717 70 51 Cell-Phone

Websites:
www.stefan-diller.com
www.elektronenmikroskopie.info
www.assisi.de
Anfahrt: http://mail.map24.com/stefan.diller
------------------------------------------------------------------------
----
-----------------------------------------



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From: jquinn-at-www.matscieng.sunysb.edu
Date: Thu, 14 Jun 2007 14:57:15 -0500
Subject: [Microscopy] re: Pd two main M lines

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Gary and company

http://www.matscieng.sunysb.edu/temp/gg/

The link will vanish is a few weeks.

The three spectra are calculations.

The first is for C-K and O-K with 100cts.

The second is for Pd-M with 100cts.

The third is them combined.

You would see the same with a real sample.

HPD from EDAX works okay at low energy, but
the labelling is not as sharp.

regards,

Jim

PS: OoO away.......

} From mail-at-ns.microscopy.com Thu Jun 14 12:52:28 2007
} Date: Thu, 14 Jun 2007 11:55:33 -0500
} To: jquinn-at-www.matscieng.sunysb.edu
} From: gary-at-gaugler.com
} Reply-to: gary-at-gaugler.com
} X-Resent-From: "Microscopy Listserver" {microscopy-at-microscopy.com}
} Subject: [Microscopy] Carbon "contamination"
} Errors-To: MicroscopyListSpamFilter-at-microscopy.com
} X-lewp: MicroscopyListSpam NAGS
}
}
}
}
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} Greetings all--I am seeking input on what appears
} to be Carbon contamination. Here is the situation.
}
} Take a Pella 16111-9 stub out of bag and put on
} holder. Take another stub out of bag and sputter
} coat with Pd and put on holder. Do EDS on both.
}
} un-coated:
} wt% at%
} C 7.5 15
} O 4.5 7
} Al 88 78
}
} coated:
} C 23 38
} O 6.5 8
} Al 71 53
}
} SEM is Zeiss Supra 55VP with Edwards XDS10 dry
} scroll pump and turbo. Coater is Denton Desk IV
} with Edwards XDS5 and turbo.
}
} The goal of using non-oil pumps was to reduce hydrocarbon
} contamination. So, where is the C coming from? Nothing
} has been done to the scroll pumps since new. There are
} kits for repairing them but when is this necessary and
} what would indicate that it be done? Would high C
} be an indicator?
}
} I'm stumped on this one.
}
} Any ideas?
}
} gary g.
}
}
} ==============================Original Headers==============================
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From: David.R.Hull-at-nasa.gov
Date: Thu, 14 Jun 2007 15:21:18 -0500
Subject: [Microscopy] Re: SEM Ground

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Lori,

Do you observe the same effect with all detectors, (ie. A back scattered
electron detector)? You might be having a problem with your secondary
electron detector.

On 6/14/07 9:51 AM, "laable-at-solutia.com" {laable-at-solutia.com} wrote:

}
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} To All Listers,
}
} I have recently been having problems with my field emission scope lately at
} magnifications above 50KX. The image seems to swim and sparkles are seen and
} the focus boundaries. A slow scan image impossible to acquire. The ground is
} suspected. It is currently grounded to the building at the same location as
} all the rest of the analytical equipment. Our electricians are in the process
} of rerunning a separate ground for the scope. They are going to put an eight
} foot copper rod in the earth outside of my lab drill hole in the wall for
} wires to go through and attach it to the ground wires to the back of the
} scope. I was wondering how the rest of have run the grounds for your scopes.
} Any advice would be appreciated.
}
} Lori Ables
} Solutia, Inc.
} laable-at-solutia.com
}
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From: donovan-at-uoregon.edu
Date: Thu, 14 Jun 2007 15:22:27 -0500
Subject: [Microscopy] Instrument Engineer Position at the University of Oregon

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Electron/Ion Beam Instrument Engineer
The University of Oregon's Center for Advanced Materials
Characterization in Oregon (CAMCOR) is seeking applications for a
full time staff position to begin September 2007. A strong background
in maintaining, trouble shooting and upgrading electron/ion beam
instruments and associated high voltage, vacuum, mechanical and
electrical systems is required. Experience with x-ray diffraction
instrumentation is also desirable. Salary range $60K-90K
commensurate with experience.

This position will be located in the new Lorry Lokey Integrated
Science Laboratory, a state of the art nano and micro science
analytical instrument facility designed specifically for exceptional
nano-science performance. It will house the latest electron, ion and
x-ray beam instrumentation available including a Zeiss Ultra TFEM,
FEI Quanta 200 E-SEM, Cameca SX50 and SX100 microprobes, Ion-TOF
SIMS, Philips Auger Spectrometer, Philips TEM, Kratos XPS and various
assorted coaters, etchers, and other vacuum deposition systems.

The successful candidate with have a BS in a beam microscopy related
field and an extensive background in instrument field service with
significant practical experience troubleshooting high vacuum electron
and ion beam instrumentation at both the system and PC board levels.
Must be able to read and understand schematics for electronic
circuits and systems. The successful applicant will be involved in
modifying/improving instrumentation capabilities to enable the
equipment to more fully support unique research needs and will be
expected to work intimately with the scientific staff and research
faculty. We seek candidates with a demonstrated commitment to working
effectively with students, faculty and staff from diverse backgrounds.

Interested persons should send a resume with a detailed description
of work experience and skills, and arrange for two letters of
recommendation to be sent to: CAMCOR Instrument Engineer Search
Committee, 1253 University of Oregon, Eugene, OR, 97403-1253. To be
assured of full consideration, application materials must be received
by July 31, 2007, but the search will remain open until the position
is filled. For further information, contact John Donovan (donovan-at-uoregon.edu).

University of Oregon is an AA/EEO employer committed to cultural diversity.


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From: Jane.LaGoy-at-Bodycote.com
Date: Thu, 14 Jun 2007 15:36:47 -0500
Subject: [Microscopy] Materials Engineer position opening

Contents Retrieved from Microscopy Listserver Archives
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Materials Engineer job opening -- Bodycote HIP (Hot Isostatic Pressing)
in Andover, Massachusetts, has an immediate opening for an entry-level
B.S. or M.S. materials or metallurgical engineer for our Technical
Services group. The ideal candidate will have a strong interest and/or
experience in metallography, microscopy and failure analysis. He/she
will interact with both internal and external customers, so good
communication skills are a must. A solid background in thermodynamics
and physical metallurgy is also desired. Powder metallurgy,
heat-treating and/or foundry knowledge is also a plus.

Andover, MA, is the North American headquarters of the Bodycote HIP
group. Bodycote HIP is part of the global metals processing
corporation, Bodycote International plc, the industry leader in both HIP
and heat-treating services with annual sales in excess of $800 million.
The Technical Services team in Andover supports all thermal processing
plants throughout North America. Long-term opportunities for
advancement within the corporation are possible. Bodycote is an equal
opportunity employer.

To submit a resume, or for further information, contact: Ms. Kathy
Barnett, Human Resources Mgr., Bodycote HIP, Inc., 155 River St.,
Andover, MA 01810, email: jobs-at-bodycote.com.



This Email and all attachments hereto, if any, are covered by the provisions of the U.S. Electronic Communications Privacy Act. Additionally, all contents of this communication and all attachments hereto shall be deemed to be confidential and the contents thereof are proprietary to Bodycote Thermal Processing, Inc. ("Bodycote"). If this communication has been sent to you in error, please reply to the sender that you received it and then delete the message immediately. Any dissemination, distribution, copying or reproduction of this message other than by its intended recipient is strictly prohibited.



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From: gary-at-gaugler.com
Date: Thu, 14 Jun 2007 15:53:30 -0500
Subject: [Microscopy] Pd two main M lines

Contents Retrieved from Microscopy Listserver Archives
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Check out the spectra at

http://www.gaugler.com/coatedstub.pdf

The only possible overlap with C and Pd is
at Pd Mz=0.286KeV. But at 5KV beam, I would
expect this Pd peak to be quite low.

Then, it still does not explain why I see
C on an un-coated stub. The suggestion to
clean some is good and I will do that. I
checked the specimen holder and it is loaded
with organics and C--likely from machining.

I can also try X-Checker and do Cu at 5KV
and then try a Si die. This would eliminate
any low KeV peaks near C. If I still see C,
then...??? The low KV is necessary to analyze
TaN since the N is oddly bound to the Ta. Different
(higher) KV gives different results. I've done
routing EDS on TiN and it is quite different.

A possible coating factor is the Ar cylinder. It
is steel and is about seven years old. I wonder if
over time, it oozes C into the Ar? A 2,000psi
tank seems to last forever.

gary g.


At 11:58 AM 6/14/2007, you wrote:




} ----------------------------------------------------------------------------
} The Microscopy ListServer -- CoSponsor: The Microscopy Society of America


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14, 20 -- From: Gary Gaugler {gary-at-gaugler.com}
14, 20 -- Subject: Re: [Microscopy] re: Pd two main M lines
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From: jquinn-at-www.matscieng.sunysb.edu
Date: Thu, 14 Jun 2007 16:21:21 -0500
Subject: [Microscopy] Pd two main M lines

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

G^2

The thin Pd coating may enhance the M peaks over the L peaks

Run a simulation with WinXRay at 5kV.
See fourth image at this URL:
http://www.matscieng.sunysb.edu/temp/gg/

You will see two Pd-M peaks are nearly the size of
the Pd-Lb peak. You can tweak the thickness to
change the M/L ratio.

Also, with the weak signal, you may be seeing
secondary emission from your polymer window.

Also, carbon is everywhere. Fact of life.
HF etch a silicon a chip from a silicon wafer.
Take a spectrum. That will be your low limit
on cleanliness of carbon (not oxygen). You could
also Shirake etch the Si chip.

JQ


} From gary-at-gaugler.com Thu Jun 14 16:50:19 2007
} X-Mailer: QUALCOMM Windows Eudora Version 7.1.0.9
} Date: Thu, 14 Jun 2007 13:53:28 -0800
} To: jquinn-at-www.matscieng.sunysb.edu
} From: Gary Gaugler {gary-at-gaugler.com}
} Subject: Re: [Microscopy] re: Pd two main M lines
} Cc: MSA listserver {microscopy-at-microscopy.com}
} In-Reply-To: {200706141958.l5EJwkaB019860-at-ns.microscopy.com}
} References: {200706141958.l5EJwkaB019860-at-ns.microscopy.com}
} Mime-Version: 1.0
} Content-Type: text/plain; charset=us-ascii; format=flowed; x-avg-checked=avg-ok-46F525F
}
} Check out the spectra at
}
} http://www.gaugler.com/coatedstub.pdf
}
} The only possible overlap with C and Pd is
} at Pd Mz=0.286KeV. But at 5KV beam, I would
} expect this Pd peak to be quite low.
}
} Then, it still does not explain why I see
} C on an un-coated stub. The suggestion to
} clean some is good and I will do that. I
} checked the specimen holder and it is loaded
} with organics and C--likely from machining.
}
} I can also try X-Checker and do Cu at 5KV
} and then try a Si die. This would eliminate
} any low KeV peaks near C. If I still see C,
} then...??? The low KV is necessary to analyze
} TaN since the N is oddly bound to the Ta. Different
} (higher) KV gives different results. I've done
} routing EDS on TiN and it is quite different.
}
} A possible coating factor is the Ar cylinder. It
} is steel and is about seven years old. I wonder if
} over time, it oozes C into the Ar? A 2,000psi
} tank seems to last forever.
}
} gary g.
}
}
} At 11:58 AM 6/14/2007, you wrote:
}
}
}
}
} } ----------------------------------------------------------------------------
} } The Microscopy ListServer -- CoSponsor: The Microscopy Society of America
} } To Subscribe/Unsubscribe -- http://www.microscopy.com/MicroscopyListserver
} } On-Line Help http://www.microscopy.com/MicroscopyListserver/FAQ.html
} } ----------------------------------------------------------------------------
} }
} } Gary and company
} }
} } http://www.matscieng.sunysb.edu/temp/gg/
} }
} } The link will vanish is a few weeks.
} }
} } The three spectra are calculations.
} }
} } The first is for C-K and O-K with 100cts.
} }
} } The second is for Pd-M with 100cts.
} }
} } The third is them combined.
} }
} } You would see the same with a real sample.
} }
} } HPD from EDAX works okay at low energy, but
} } the labelling is not as sharp.
} }
} } regards,
} }
} } Jim
} }
} } PS: OoO away.......
} }
} } } From mail-at-ns.microscopy.com Thu Jun 14 12:52:28 2007
} } } Date: Thu, 14 Jun 2007 11:55:33 -0500
} } } To: jquinn-at-www.matscieng.sunysb.edu
} } } From: gary-at-gaugler.com
} } } Reply-to: gary-at-gaugler.com
} } } X-Resent-From: "Microscopy Listserver" {microscopy-at-microscopy.com}
} } } Subject: [Microscopy] Carbon "contamination"
} } } Errors-To: MicroscopyListSpamFilter-at-microscopy.com
} } } X-lewp: MicroscopyListSpam NAGS
} } }
} } }
} } }
} } }
} } }
} } ----------------------------------------------------------------------------
} } } The Microscopy ListServer -- CoSponsor: The Microscopy Society of America
} } } To Subscribe/Unsubscribe --
} } http://www.microscopy.com/MicroscopyListserver
} } } On-Line Help http://www.microscopy.com/MicroscopyListserver/FAQ.html
} } }
} } ----------------------------------------------------------------------------
} } }
} } } Greetings all--I am seeking input on what appears
} } } to be Carbon contamination. Here is the situation.
} } }
} } } Take a Pella 16111-9 stub out of bag and put on
} } } holder. Take another stub out of bag and sputter
} } } coat with Pd and put on holder. Do EDS on both.
} } }
} } } un-coated:
} } } wt% at%
} } } C 7.5 15
} } } O 4.5 7
} } } Al 88 78
} } }
} } } coated:
} } } C 23 38
} } } O 6.5 8
} } } Al 71 53
} } }
} } } SEM is Zeiss Supra 55VP with Edwards XDS10 dry
} } } scroll pump and turbo. Coater is Denton Desk IV
} } } with Edwards XDS5 and turbo.
} } }
} } } The goal of using non-oil pumps was to reduce hydrocarbon
} } } contamination. So, where is the C coming from? Nothing
} } } has been done to the scroll pumps since new. There are
} } } kits for repairing them but when is this necessary and
} } } what would indicate that it be done? Would high C
} } } be an indicator?
} } }
} } } I'm stumped on this one.
} } }
} } } Any ideas?
} } }
} } } gary g.
} }
}



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From: frah0010-at-umn.edu
Date: Thu, 14 Jun 2007 18:58:38 -0500
Subject: [Microscopy] Buehler IsoMet

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Microscopists,

Our lab has a Buehler IsoMet slow saw (model #11-1180, apparently
1980s vintage) that has ceased functioning. I've tracked the problem
down to broken gear teeth on the shaft perpendicular to the motor's
drive shaft. Does anyone else have a dead or unused IsoMet that they
wouldn't mind someone cannibalizing? We can pay shipping and/or
modestly for the equipment/parts. We also don't have the
instructions or specifications anymore. If someone else does and
there are good part descriptions, I'd be interested in a fax or scan
of that page to help track down a replacement part. Thanks in advance!

Cheers,
Ellery

--------------------
Ellery E. Frahm
Research Fellow & Manager
Electron Microprobe Laboratory
University of Minnesota - Twin Cities
Department of Geology & Geophysics
Lab Website: http://probelab.geo.umn.edu
Personal Website: http://umn.edu/~frah0010

Please note: Sometimes the University's spam filters are over-
protective and reject wanted messages, especially from free or
overseas accounts. If your message is rejected or you are concerned
that you did not receive a reply from me, please feel free to try my
alternate email account: elleryfrahm-at-mac.com


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From: nmedvitz-at-nephrocor.com
Date: Thu, 14 Jun 2007 19:18:49 -0500
Subject: [Microscopy] viaWWW: Advantages of having two TEMs in the same location rather

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Email: nmedvitz-at-nephrocor.com
Name: Neil Medvitz

Organization: Bostwick Laboratories

Title-Subject: [Filtered] Advantages of having two TEMs in the same location rather than having one EM in two locations

Question: I am writing justification for having two TEMs in the same location rather one EM in two locations. I have a lot of reasons but just want to make sure I am not overlooking anything. Could I please get some opinions?

Thanks to all who help,
Neil

Neil Medvitz
Electron Microscopy Technical Director

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From: drk-at-SHCC.org
Date: Thu, 14 Jun 2007 19:59:23 -0500
Subject: [Microscopy] UPS for TEMs

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Greetings, Fellow Microscopists:

We are renovating our lab to install an FEI Tecnai G2 20TEM. As we think
about the electrical needs, we wonder about the necessity of backing the
system with an uninterrupted power supply and generator. My understanding
is that in the event of a power outage, the system will shut down, the
pneumatic valves will close and the microscope will survive. But I wonder
about the support computers. I am asking for the advice of others in how
they have addressed UPS for their modern TEM systems.

Many thanks,

Doug

Douglas R. Keene
Assistant Investigator
Micro-Imaging Center
Shriners Hospital for Children
3102 S.W. Sam Jackson Park Road
Portland, Oregon 97239
503-221-3434
drk-at-shcc.org



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From: gary-at-gaugler.com
Date: Fri, 15 Jun 2007 00:08:06 -0500
Subject: [Microscopy] Re: UPS for TEMs

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If power goes off, your gun goes off. Of course,
if it is the same as an FESEM.

My solution is two 8KVA dual redundant Liebert
nFinity dual conversion UPS units. Split the
load between the two units. The SEM is on one
unit while the EDS, PCs, chiller and other stuff
are on the other unit. With redundant converters
and controllers, an 8KVA unit does 4KVA with half
of a unit. If one portion fails, the other half works.
Fix the failed unit and back to 100% redundant.

Bad power is a big problem here in CA. Dual conversion
is a huge benefit of these UPS. Steady, constant and
always there. With full set of batteries, I have
about 280 minutes of UPS backup for each UPS. each
unit sees about 22% load.

Full complement of batteries (no expansion unit), and redundant
controllers runs about $10K per unit. They are rock
solid. For about $300 each, you can hook them to a LAN
and monitor what is going on with power. You will be
surprised. Or, manually view the event log.

Liebert makes higher capacity units but these work for my
application.

gary g.


At 05:00 PM 6/14/2007, you wrote:




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From: jacques.faerber-at-ipcms.u-strasbg.fr
Date: Fri, 15 Jun 2007 02:33:11 -0500
Subject: [Microscopy] Re: Carbon "contamination"

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Hi Gary and all listers

I agrees with the different comments about Pd Mz line overlapping on
Carbon K. I had the same stuff with new polished and ion etched Pt
standards, where I found that intrusive carbon... which was Pd-N line !
And my software don't have the N lines tabulated ! I had too the
probleme with the Pd-M in Pd/Fe alloys.

Added to the overlapping probleme, in some situation one have catalysis
effect on carbon cracking. The carbon peak comes really from carbon, but
groes during the spectrum acquisition ! In such case you should see
these famous hated black squares after the analysis...

About the uncoated sample, a collegue now retired said me never to use
plastic bags or plasctic boxes for sample storage. Most plastics outgas
solvent continusly and polluate all the surfaces with solvent. He used
only glass ware. One need only a monolayer of hydrocarbon to have some
contamination ! People who make Auger spectroscopy know that one must
clean away the carbon before one see something else !

I've made some test, and my conclusion is that in most cases, the sample
and the sample hodler bring with them the major source of contamination.
The second source is the rotary-vane pump, and the last is the diff pump.

The two ways to limit contamination are first to use a lN2 cold trap
very near of the sample, in front of the OL, or beside , or around it
(one must have a fast entry lock), and second to put all parts which
comes to air, the holder and the sample in a plasma cleaner, before
putting them in the SEM (one must have much monney to buy one !). A
simple glow discharge in air can be suffisant, but is not very
reproductible.

About the Supra configuration, just a coment : as we bought our first
FE-SEM, I saw in the test round that the Supra (in that time it was a
1530) was the SEM which had the most contamination from the five SEM we
have seen. It was one raison for an other choice. Now we have bought a
Supra 40 since a few month, for E-beam lithography, a application where
one know that contamination cannot be avoided (one put in samples with a
fresh coating of PMMA or other durty stuffs !), I have seen that, before
performing any litho work, that contamination question was still the
same. People from Leo/Zeiss say that the good performences of their
SE-decteor reveal very thin contamination levels. My thought is that the
vacuum demand isn't high enough. One cannot vent to air inocently a
vaccum chamber with a so big specific surface and a turbo pump at each
sample change without consequences. With the time one catch organic
contamination from the environnement in the SEM itself. This can be one
more source of contamination.

Hope it helps

J. Faerber
IPCMS-GSI
(Institut de Physique et Chimie des Matériaux de Strasbourg
Groupe Surface et Interfaces)
23, rue de Loess ; BP43
67034 Strasbourg CEDEX 2
France

Tel 00 33(0)3 88 10 71 01
Fax 00 33(0)3 88 10 72 48
E-mail Jacques.Faerber-at-ipcms.u-strasbg.fr



gary-at-gaugler.com a écrit :
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}
} Greetings all--I am seeking input on what appears
} to be Carbon contamination. Here is the situation.
}
} Take a Pella 16111-9 stub out of bag and put on
} holder. Take another stub out of bag and sputter
} coat with Pd and put on holder. Do EDS on both.
}
} un-coated:
} wt% at%
} C 7.5 15
} O 4.5 7
} Al 88 78
}
} coated:
} C 23 38
} O 6.5 8
} Al 71 53
}
} SEM is Zeiss Supra 55VP with Edwards XDS10 dry
} scroll pump and turbo. Coater is Denton Desk IV
} with Edwards XDS5 and turbo.
}
} The goal of using non-oil pumps was to reduce hydrocarbon
} contamination. So, where is the C coming from? Nothing
} has been done to the scroll pumps since new. There are
} kits for repairing them but when is this necessary and
} what would indicate that it be done? Would high C
} be an indicator?
}
} I'm stumped on this one.
}
} Any ideas?
}
} gary g.
}
}
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From: jacques.faerber-at-ipcms.u-strasbg.fr
Date: Fri, 15 Jun 2007 02:40:45 -0500
Subject: [Microscopy] Carbon "contamination" additionnaly a new Quest

Contents Retrieved from Microscopy Listserver Archives
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Hi all

In my former mail, in answer to Gary's question, I have said somthing
from the use of the plasma cleaner. I take the opportunity to comme with
a new question.

Did some one still build a plasma cleaner in the SEM itself, or better
in the fast entry lock from the SEM. This would be the most drasctic way
to avoid the contamination coming with the sample/sample holder.

If some has tried, or know from some tests...

Thanks


J. Faerber
IPCMS-GSI
(Institut de Physique et Chimie des Matériaux de Strasbourg
Groupe Surface et Interfaces)
23, rue de Loess ; BP43
67034 Strasbourg CEDEX 2
France

Tel 00 33(0)3 88 10 71 01
Fax 00 33(0)3 88 10 72 48
E-mail Jacques.Faerber-at-ipcms.u-strasbg.fr



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From: jacques.faerber-at-ipcms.u-strasbg.fr
Date: Fri, 15 Jun 2007 07:05:12 -0500
Subject: [Microscopy] Carbon "contamination" oups...

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Dear Jaques,
have a look at http://www.semclean.com
It seems to work greatly and is used - to my knowledge - by some major sem
manufacturer - in Europe...

Best regards,
Stefan Diller




----- Original Message -----
X-from: {jacques.faerber-at-ipcms.u-strasbg.fr}
To: {stefan.diller-at-t-online.de}
Sent: Friday, June 15, 2007 9:44 AM

Hi all

Receving just my mail from this morning, I see that I that I have made
an error in the first paragraph. It is the Pt-N line and not the Pd-N
line, which interfer, like the Pd-M.


--
J. Faerber
IPCMS-GSI
(Institut de Physique et Chimie des Matériaux de Strasbourg
Groupe Surface et Interfaces)
23, rue de Loess ; BP43
67034 Strasbourg CEDEX 2
France

Tel 00 33(0)3 88 10 71 01
Fax 00 33(0)3 88 10 72 48
E-mail Jacques.Faerber-at-ipcms.u-strasbg.fr


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From: zaluzec-at-microscopy.com
Date: Fri, 15 Jun 2007 07:59:39 -0500
Subject: [Microscopy] Carbon contamination: Plasma Cleaners

Contents Retrieved from Microscopy Listserver Archives
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Jacque...

To answer your question.

Yes, a plasma cleaner for an EM Chamber is a commerical product.
There have been several papers written on this from both the SEM and TEM standpoint.

You should look at the following WWW site from XEI Scientific for the SEM info. They
have a number of papers on-line to download.

http://www.evactron.com/

Disclaimer:
Argonne National Lab, my daytime employer holds the basic patent on this
technology for EM applications and licenses it to a number of commerical
organizations, XEI being one of them.

Nestor
Your Friendly Neighborhood SysOp.



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Hi all

In my former mail, in answer to Gary's question, I have said somthing
from the use of the plasma cleaner. I take the opportunity to comme with
a new question.

Did some one still build a plasma cleaner in the SEM itself, or better
in the fast entry lock from the SEM. This would be the most drasctic way
to avoid the contamination coming with the sample/sample holder.

If some has tried, or know from some tests...

Thanks


J. Faerber
IPCMS-GSI
(Institut de Physique et Chimie des MatÈriaux de Strasbourg
Groupe Surface et Interfaces)
23, rue de Loess ; BP43
67034 Strasbourg CEDEX 2
France

Tel 00 33(0)3 88 10 71 01
Fax 00 33(0)3 88 10 72 48
E-mail Jacques.Faerber-at-ipcms.u-strasbg.fr



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From: keith.morris-at-ucl.ac.uk
Date: Fri, 15 Jun 2007 08:19:34 -0500
Subject: [Microscopy] objective NA

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Hi David,

Numerical Aperture: This is a critical value that indicates the light
acceptance angle, which in turn determines the light gathering power, the
resolving power, and depth of field of the objective.

Thus the higher the resolving power (NA) of an objective, the lower the
depth of field (and so working distance). So a high NA objective may not
suite all applications. Indeed a typical high magnification objective focus
point will only just penetrate through a standard 0.17mm glass coverslip. An
air objective will have a far greater (relatively) depth of field and thus a
far longer working distance, particularly an LD 'long working distance'
variety - but the image quality will be noticeably poorer (not a problem
though if you can't see squat with your high NA short working distance oil
immersion lens). This is all to do with airey disks and stuff, [and also a
lot to do with the price of the objective and how well it's made]. Image
contrast, as well as resolution, is also an important consideration here.


'Working distance' correction Collar

An adjustment [correction] collar for cover glass thickness (not NA) is
sometimes provided on high-NA microscope objective lenses. Rotation of the
collar adjusts the height of certain lens elements in the objective lens to
compensate for variations in coverslip thickness or immersion media. Thus it
provides an adjustable working distance. At high NAs, even a small deviation
of the coverslip thickness (by as little as a few micrometers in some
cases), or refractive index of the immersion medium from the designated
standard, can introduce significant aberrations.


Variable NA collar

Other objectives specifically designed for transmitted light fluorescence
and darkfield imaging are sometimes equipped with an internal iris diaphragm
that allows for adjustment of the effective numerical aperture [NA]. A 60x
apochromat objective can have a numerical aperture of 1.4, one of the
highest attainable in modern microscopes using immersion oil as an imaging
medium.

Variable Numerical Aperture Objectives: Specimens with unusually high
fluorescence quantum yields and/or very bright darkfield specimens often
induce image flare by light emitted from areas outside the focal plane. To
compensate for this artefact, manufacturers offer high numerical aperture
objectives that are equipped with an internal iris diaphragm to increase
image contrast during photomicrography or digital imaging. Opening or
closing the iris diaphragm determines the size of the objective rear
aperture yielding a variable numerical aperture range between 0.5 and the
objective's upper limit (up to 1.35-1.4 with apochromatic objectives).
Although iris diaphragms were once utilized in a wide variety of objective
designs, modern variable numerical aperture objectives are usually at the
high end (60x to 150x) of the magnification range.

A variable NA collar on an oil immersion thus help with contrast enhancement
when set to low NA, but it's not going to help it in any way achieve the
long working distance of a dry LD objective of the same magnification. I
must admit that I don't bother too much with the physics equations when
looking down the microscope, as any decent microscope rep should be able
provide you with a set of objectives to assess which one suites your needs
best before you buy. Typically you would go for the highest NA you can for
the given working distance required. Manufacturer's websites provide the
objectives working distance (in mm) and NA info. Modern ultra-high NA
objectives are required for TIRF applications and hi-res DIC contrast
enhancement.

To achieve higher NA than 0.95 for objectives they have to be used with
immersion media between front lens and specimen. Oil or water is mostly used
for that purpose. Because objectives have to be specially designed for this,
the type of immersion media is always mentioned on the objective like on the
UPlanFLN 60x/1.25 Oil Iris objective. This objective needs oil as an
immersion media and can not produce good image quality without it.

High NA objectives also collect more light and if you compare two objectives
with fluorescent samples, the high NA objective should produce a noticeably
brighter (and preferable) image. Again though the high NA objective is
generally far more expensive and it's better attention to quality
optics/coatings will also be factor in it's superior performance. An
objective also needs to be PLAN Apochromat and fluorescence friendly for
quality fluorophore imaging.

The only problem with using our variable NA collar objectives here is that
we use inverted optics and have no idea where the NA collar is actually set
[e.g. if it's moved accidentally or the previous user has adjusted it]. I do
put a chart on the wall telling users which way to turn the NA collar for
highest NA (viewed from above), but I'm not sure all users bother with this.
I have noticed slight changes in um/pixel calibration (less than 10%
difference, and it's linear) between the two NA extremes on some objectives.


To be told more than you probably want to know about resolving power and NA
see:

http://www.olympusmicro.com/primer/anatomy/specialobjectives.html
http://www.microscopy.olympus.eu/microscopes/About_Microscopy_7436.htm
[The resolving power]
http://www.charfac.umn.edu/glossary/c.html
http://www.oznet.ksu.edu/ed_agron645/lab/microscope_use.htm
http://www.olympusconfocal.com/theory/confocalobjectives.html
http://www.microscopyu.com/tutorials/java/objectives/nuaperture/index.html
http://www.microscopyu.com/articles/optics/objectivespecs.html
http://www.micro.magnet.fsu.edu/primer/java/aberrations/slipcorrection/index
.html

Regards

Keith

-----------------------
Dr Keith J Morris
[Formerly] Imaging Facilities Manager
Cell Biology
Institute of Ophthalmology
UCL, London EC1V 9EL




-----Original Message-----
X-from: david.knecht-at-uconn.edu [mailto:david.knecht-at-uconn.edu]
Sent: 14 June 2007 18:44
To: keith.morris-at-ucl.ac.uk

One can buy a 40-100x oil objective with an iris diaphram. What is
the theoretical difference in performance between imaging with a low
NA dry objective (.6NA for example) and an equivalent magnification,
high NA oil objective with the iris partially closed to reduce the NA
to .6? Should they be similar? Thanks- Dave


Dr. David Knecht
Department of Molecular and Cell Biology
Co-head Flow Cytometry and Confocal Microscopy Facility
U-3125
91 N. Eagleville Rd.
University of Connecticut
Storrs, CT 06269
860-486-2200
860-486-4331 (fax)



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From: paul_hazelton-at-umanitoba.ca
Date: Fri, 15 Jun 2007 08:40:21 -0500
Subject: [Microscopy] UPS for TEMs

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Thank you Gary.

Only saw someone's response to this question last evening and did not
get to respond immediately, but Gary has really hit a major point. It
is more than just protecting against the power outage. Most - if not
all - microscopes have all sorts of emergency backups which go in place
to prevent any real damage. Power outages are not common, butd they are
major irritations when they occur. A real problem is spikes in power -
the dirty power Gary refers to.

When I took over my current position it took me 18 months to figure out
that the separate and isolated power source for my lab was neither
separate nor isolated. The department had even put in (before me) a
nice Barrie anti vibration system - works great, didn't stop the
instability problems. We finally figured out what was happening when it
was noticed that the aberrations in beam and focus occurred whenever
someone was doing gel electrophoresis in a bank of labs in the next
hallway. When we put a monitor on the power in line we found over 130
spikes in power in excess of 5% over the normal 12hour daytime period.

Fluctuations in power - spikes - do occur regularly. Not just in
California, but in Winnipeg, Montreal, London, New York, Tokyo, etc.
Surge protectors kick in after the first cycle of a spike. As a result,
they do not protect against spikes with your computers and other 'not a
microscope' equipment, they . Other than the glowing little light and
giving you 5 plugs from 1 they probably do nothing to help.

Damage occurs in the first spike. This is true of the EM also. Dirty
lines mean pops in and out of focus. If you've ever seen one, you know
what this is. Imagine the fresnel fringe popping in and out
concentrically while you look at the image you are trying to see. It
may not bother you when you look at a section at 10,000, but it will
drive you nuts when looking at a virus at 100,000+.

I didn't put in a UPS at the time. 25 years ago the unit would have
cost } 10,000 and needed it's own room. But when we moved a microscope
recently during a lab consolidation I built into the cost $2500 to put
in a UPS. The best time to get things from administrators is when you
are building a new lab, moving, renovating, or putting in a new
microscope. Even if you have to spend Gary's $10-12,000US to protect
several microscopes, or my $2,200C to protect one microscope, it is
worth it.


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From: dljones-at-bestweb.net
Date: Fri, 15 Jun 2007 09:02:44 -0500
Subject: [Microscopy] Re: Buehler IsoMet

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Ellery,

I have the same saw, functioning, and still have the original manual that came
with it. So if you'd like, I can send you a copy.

However, I would suggest that you just call Buehler. I'm sure thay have a .pdf
file with the manual and would send it to you. Buehler has sent me manuals,
calibration data, all kinds of information on older equipment that they
manufactured. They are really top notch in this regard, at least that has been
my experience.

dj

On Thu, 14 Jun 2007, frah0010-at-umn.edu wrote:

}
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} Microscopists,
}
} Our lab has a Buehler IsoMet slow saw (model #11-1180, apparently
} 1980s vintage) that has ceased functioning. I've tracked the problem
} down to broken gear teeth on the shaft perpendicular to the motor's
} drive shaft. Does anyone else have a dead or unused IsoMet that they
} wouldn't mind someone cannibalizing? We can pay shipping and/or
} modestly for the equipment/parts. We also don't have the
} instructions or specifications anymore. If someone else does and
} there are good part descriptions, I'd be interested in a fax or scan
} of that page to help track down a replacement part. Thanks in advance!
}
} Cheers,
} Ellery
}
} --------------------
} Ellery E. Frahm
} Research Fellow & Manager
} Electron Microprobe Laboratory
} University of Minnesota - Twin Cities
} Department of Geology & Geophysics
} Lab Website: http://probelab.geo.umn.edu
} Personal Website: http://umn.edu/~frah0010
}
} Please note: Sometimes the University's spam filters are over-
} protective and reject wanted messages, especially from free or
} overseas accounts. If your message is rejected or you are concerned
} that you did not receive a reply from me, please feel free to try my
} alternate email account: elleryfrahm-at-mac.com
}
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From: david.knecht-at-uconn.edu
Date: Fri, 15 Jun 2007 09:20:25 -0500
Subject: [Microscopy] objective NA

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Lots of useful information in the responses, but let me clarify the
question. A colleague is using his stopped down 40x oil objective in
order to visualize vesicles throughout the volume of the cell in one
image rather than confocal sectioning. I am trying to understand why
it works and whether it would work equivalently with a dry
objective. Obviously the light cone from a 1.4 NA 40x oil objective
(whether iris is closed or not) and a 40x long working distance dry
objective are different. The depth of field varies with numerical
aperture, so a 40x 1.4 oil immersion lens, should inherently have a
shallower depth of focus. Therefore, it makes no intuitive sense to
me that you would #1-increase the depth of focus, and #2- get the
same results with a 40x oil 1.4 in which you stop down the iris to .
5NA, as a .5NA LWD dry lens. The excitation spot profile of the 40x
oil objective is not going to enlarge as you stop down the iris with
the same input light path. So I am trying to understand how the
focal depth/resolution/xyz profile of the excitation/emission etc. is
for fluorescence in comparing those two situations. Dave

Dr. David Knecht
Department of Molecular and Cell Biology
Co-head Flow Cytometry and Confocal Microscopy Facility
U-3125
91 N. Eagleville Rd.
University of Connecticut
Storrs, CT 06269
860-486-2200
860-486-4331 (fax)


On Jun 15, 2007, at 9:19 AM, keith.morris-at-ucl.ac.uk wrote:

}
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} America
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} MicroscopyListserver
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} ----------------------------------------------------------------------
} ------
}
} Hi David,
}
} Numerical Aperture: This is a critical value that indicates the light
} acceptance angle, which in turn determines the light gathering
} power, the
} resolving power, and depth of field of the objective.
}
} Thus the higher the resolving power (NA) of an objective, the lower
} the
} depth of field (and so working distance). So a high NA objective
} may not
} suite all applications. Indeed a typical high magnification
} objective focus
} point will only just penetrate through a standard 0.17mm glass
} coverslip. An
} air objective will have a far greater (relatively) depth of field
} and thus a
} far longer working distance, particularly an LD 'long working
} distance'
} variety - but the image quality will be noticeably poorer (not a
} problem
} though if you can't see squat with your high NA short working
} distance oil
} immersion lens). This is all to do with airey disks and stuff, [and
} also a
} lot to do with the price of the objective and how well it's made].
} Image
} contrast, as well as resolution, is also an important consideration
} here.
}
}
} 'Working distance' correction Collar
}
} An adjustment [correction] collar for cover glass thickness (not
} NA) is
} sometimes provided on high-NA microscope objective lenses. Rotation
} of the
} collar adjusts the height of certain lens elements in the objective
} lens to
} compensate for variations in coverslip thickness or immersion
} media. Thus it
} provides an adjustable working distance. At high NAs, even a small
} deviation
} of the coverslip thickness (by as little as a few micrometers in some
} cases), or refractive index of the immersion medium from the
} designated
} standard, can introduce significant aberrations.
}
}
} Variable NA collar
}
} Other objectives specifically designed for transmitted light
} fluorescence
} and darkfield imaging are sometimes equipped with an internal iris
} diaphragm
} that allows for adjustment of the effective numerical aperture
} [NA]. A 60x
} apochromat objective can have a numerical aperture of 1.4, one of the
} highest attainable in modern microscopes using immersion oil as an
} imaging
} medium.
}
} Variable Numerical Aperture Objectives: Specimens with unusually high
} fluorescence quantum yields and/or very bright darkfield specimens
} often
} induce image flare by light emitted from areas outside the focal
} plane. To
} compensate for this artefact, manufacturers offer high numerical
} aperture
} objectives that are equipped with an internal iris diaphragm to
} increase
} image contrast during photomicrography or digital imaging. Opening or
} closing the iris diaphragm determines the size of the objective rear
} aperture yielding a variable numerical aperture range between 0.5
} and the
} objective's upper limit (up to 1.35-1.4 with apochromatic objectives).
} Although iris diaphragms were once utilized in a wide variety of
} objective
} designs, modern variable numerical aperture objectives are usually
} at the
} high end (60x to 150x) of the magnification range.
}
} A variable NA collar on an oil immersion thus help with contrast
} enhancement
} when set to low NA, but it's not going to help it in any way
} achieve the
} long working distance of a dry LD objective of the same
} magnification. I
} must admit that I don't bother too much with the physics equations
} when
} looking down the microscope, as any decent microscope rep should be
} able
} provide you with a set of objectives to assess which one suites
} your needs
} best before you buy. Typically you would go for the highest NA you
} can for
} the given working distance required. Manufacturer's websites
} provide the
} objectives working distance (in mm) and NA info. Modern ultra-high NA
} objectives are required for TIRF applications and hi-res DIC contrast
} enhancement.
}
} To achieve higher NA than 0.95 for objectives they have to be used
} with
} immersion media between front lens and specimen. Oil or water is
} mostly used
} for that purpose. Because objectives have to be specially designed
} for this,
} the type of immersion media is always mentioned on the objective
} like on the
} UPlanFLN 60x/1.25 Oil Iris objective. This objective needs oil as an
} immersion media and can not produce good image quality without it.
}
} High NA objectives also collect more light and if you compare two
} objectives
} with fluorescent samples, the high NA objective should produce a
} noticeably
} brighter (and preferable) image. Again though the high NA objective is
} generally far more expensive and it's better attention to quality
} optics/coatings will also be factor in it's superior performance. An
} objective also needs to be PLAN Apochromat and fluorescence
} friendly for
} quality fluorophore imaging.
}
} The only problem with using our variable NA collar objectives here
} is that
} we use inverted optics and have no idea where the NA collar is
} actually set
} [e.g. if it's moved accidentally or the previous user has adjusted
} it]. I do
} put a chart on the wall telling users which way to turn the NA
} collar for
} highest NA (viewed from above), but I'm not sure all users bother
} with this.
} I have noticed slight changes in um/pixel calibration (less than 10%
} difference, and it's linear) between the two NA extremes on some
} objectives.
}
}
} To be told more than you probably want to know about resolving
} power and NA
} see:
}
} http://www.olympusmicro.com/primer/anatomy/specialobjectives.html
} http://www.microscopy.olympus.eu/microscopes/About_Microscopy_7436.htm
} [The resolving power]
} http://www.charfac.umn.edu/glossary/c.html
} http://www.oznet.ksu.edu/ed_agron645/lab/microscope_use.htm
} http://www.olympusconfocal.com/theory/confocalobjectives.html
} http://www.microscopyu.com/tutorials/java/objectives/nuaperture/
} index.html
} http://www.microscopyu.com/articles/optics/objectivespecs.html
} http://www.micro.magnet.fsu.edu/primer/java/aberrations/
} slipcorrection/index
} .html
}
} Regards
}
} Keith
}
} -----------------------
} Dr Keith J Morris
} [Formerly] Imaging Facilities Manager
} Cell Biology
} Institute of Ophthalmology
} UCL, London EC1V 9EL
}
}
}
}
} -----Original Message-----
} X-from: david.knecht-at-uconn.edu [mailto:david.knecht-at-uconn.edu]
} Sent: 14 June 2007 18:44
} To: keith.morris-at-ucl.ac.uk
} Subject: [Microscopy] objective NA
}
}
}
}
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}
} One can buy a 40-100x oil objective with an iris diaphram. What is
} the theoretical difference in performance between imaging with a low
} NA dry objective (.6NA for example) and an equivalent magnification,
} high NA oil objective with the iris partially closed to reduce the NA
} to .6? Should they be similar? Thanks- Dave
}
}
} Dr. David Knecht
} Department of Molecular and Cell Biology
} Co-head Flow Cytometry and Confocal Microscopy Facility
} U-3125
} 91 N. Eagleville Rd.
} University of Connecticut
} Storrs, CT 06269
} 860-486-2200
} 860-486-4331 (fax)
}
}
}
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From: ph2-at-sprynet.com
Date: Fri, 15 Jun 2007 10:42:18 -0500
Subject: [Microscopy] Inter/Micro 2007

Contents Retrieved from Microscopy Listserver Archives
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I am forwarding an Extracted/Shortened section:


Inter/Micro 2007 Announcements - June 8th, 2007

See: http://www.mcri.org/IM_info_page.html

The Inter/Micro 2007 conference, scheduled for July 9-13, 2007, is rapidly
approaching!

Announcing the symposium's schedule for speakers:

2007 Schedule of Presentations

See http://www.mcri.org/2007ScheduleforSpeakers.pdf

Thursday Workshop:

'Working with Living Cells - Triumphs, Tribulations and Tragedies', Jeremy
Pickett-Heaps of the School of Botany, University of Melbourne, & Brian J.
Ford of Gonville & Caius College, Cambridge University.

Friday Workshop: 'Airborne & Settled Dust Particle Identification
Workshop', Andrew A. Havics, pH2 LLC., Randy Boltin, MVA Scientific
Consultants, & John D. Shane, Ph.D., PRO-LAB/SSPTM, Inc.



Tony

Ps Disclaimer - I receive no profits from this although I'm teaching part
of the one workshop on Friday.

......................................................................
Andrew Anthony "Tony" Havics, CHMM, CIH, PE
pH2, LLC
5250 E US 36, Suite 830
Avon, IN 46123
(317) 718-7020 off
(317) 718-7038 fax
(317) 409-3238 cell

90% of Risk Management is knowing where to place the decimal point...any
consultant can give you the other 10%(SM)

This message is from pH2. This message and any attachments may contain
legally privileged or confidential information, and are intended only for
the individual or entity identified above as the addressee. If you are not
the addressee, or if this message has been addressed to you in error, you
are not authorized to read, copy, or distribute this message and any
attachments, and we ask that you please delete this message and attachments
(including all copies) and notify the sender by return e-mail or by phone at
317-718-7020. Delivery of this message and any attachments to any person
other than the intended recipient(s) is not intended in any way to waive
confidentiality or a privilege. All personal messages express views only of
the sender, which are not to be attributed to pH2 and may not be copied or
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From: gary-at-gaugler.com
Date: Fri, 15 Jun 2007 11:20:12 -0500
Subject: [Microscopy] Re: UPS for TEMs

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Yes... I should have amplified about the UPS units.

Disregarding outages (that's what the UPS are for),
spikes and sags are bad and can have catastrophic
effects on the equipment (SEM, TEM, PCs, etc.).

There are basically two types of UPS. One is a simple
APC brand style that switches on an inverter when the
input power fails. These units can include spike clamps
but do not handle sags. The second type is double conversion.
This is the best method. This type takes input AC and
converts it to DC (usually around 240VDC) and inverts
it to AC via sine wave driver and LARGE output transformer.
This produces pure sine wave output voltage with about 3%
stability and total protection from sags and spikes.

If the input power fails, the unit instantly switches from
the rectified input AC--} DC to the battery bank. Perfect.
Plus, the Liebert has redundancy options. In my Amray
days, I used a pair of Toshiba 1400xl+ dual conversion
UPS. They worked well but did not have redundancy. The
problem with this is that when one failed, the whole system
went down. US service support for the Toshiba units was bad.
The Liebert units are US made and US supported. After almost
two years of continuous operation, neither of the Lieberts
has failed. For about $1K, extended warranty is available.
This covers the electronics and the batteries. Each battery
is actually a module itself and if the monitors think a
battery is bad, a light comes on on the battery module and
a message is posted about it.

Getting a good UPS at install is the way to go. For a
fraction of the cost of the SEM or TEM and accessories,
it is cheap insurance.

gary g.


At 05:41 AM 6/15/2007, you wrote:




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From: tivol-at-caltech.edu
Date: Fri, 15 Jun 2007 12:21:03 -0500
Subject: [Microscopy] Re: UPS for TEMs

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On Jun 14, 2007, at 5:59 PM, drk-at-SHCC.org wrote:

} We are renovating our lab to install an FEI Tecnai G2 20TEM. As we
} think
} about the electrical needs, we wonder about the necessity of backing
} the
} system with an uninterrupted power supply and generator. My
} understanding
} is that in the event of a power outage, the system will shut down, the
} pneumatic valves will close and the microscope will survive. But I
} wonder
} about the support computers. I am asking for the advice of others in
} how
} they have addressed UPS for their modern TEM systems.
}
Dear Doug,
We have a T12 and a TF30H, and we only have a UPS on the 30. We have
not had any power failures that affected the computers, but we did have
a failure in the UPS (fortunately, no power failures during the several
months it took to get the UPS repair booked and done).
Yours,
Bill Tivol, PhD
EM Scientist
Electron Cryo-Microscopy Facility
Broad Center, Mail Code 114-96
California Institute of Technology
Pasadena CA 91125
(626) 395-8833
tivol-at-caltech.edu


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From: rich_goodheart-at-agilent.com
Date: Fri, 15 Jun 2007 17:37:37 -0500
Subject: [Microscopy] viaWWW: Seminar on SPM, AFM, STM In Undergraduate Education

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Email: rich_goodheart-at-agilent.com
Name: Rich Goodheart

Organization: Agilent Technologies

Title-Subject: [Filtered] SPM, AFM, STM In Undergraduate Education

Question: On June 26, 2007, Agilent Technologies will be hosting a free web-based seminar on the Integration of AFM in Undergraduate Education. Jayne Garno, an assistant professor of chemistry at Louisiana State University, is working to integrate scanning probe experiments into junior and senior undergraduate laboratory courses in analytical and physical chemistry to give students hands-on experience with molecular imaging. In this informative eSeminar, she will describe her progress. Following Garno's presentation, Dr. Song Xu, an applications scientist with Agilent Technologies, will discuss research-grade AFM instrumentation appropriate for use in undergraduate education. There will also be a Q&A session in which all online attendees are welcome to query the presenters. More information, and to register, can be found at http://nano.tm.agilent.com

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From: keith.morris-at-ucl.ac.uk
Date: Sat, 16 Jun 2007 08:19:51 -0500
Subject: [Microscopy] objective NA

Contents Retrieved from Microscopy Listserver Archives
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Hi David,

I didn't get a copy of my reply in the in-box (you obviously did), so it's
also attached to the bottom here. Essentially the NA iris works like the
iris on the condenser and a camera (to the eye, I don't know about the
optical physics).

Using a camera with a macro lens, stopping [closing] the camera iris down to
F22 brings everything in the macro shot into focus (a big depth of field),
but at the expense of image brightness and probably a little resolution - so
you need a longer exposure time. You aren't actually moving the camera any
closer to the specimen though, so the 'working distance' hasn't changed.
Plus your point of focus is still in the same place (as the lenses/camera
haven't moved). See
http://www.cs.mtu.edu/~shene/DigiCam/User-Guide/950/depth-of-field.html.

Stopping the NA iris in the high mag oil objective down (to low NA)
increases the contrast and probably the depth of field around the focus
point, but no doubt at the expense of absolute resolution (hence the lower
NA). Naturally high resolution is pig all use without any contrast though to
actually see the specimen, hence the advantage of the iris. It probably
won't affect the maximum working distance at all though (you are still under
oil), other than perhaps a greater depth of focus around the area you are
focussed on (you can't physically move the objective into the sample any
more). To increase actual working distance you have move the internal lenses
(or one anyway) up and down, using a Working Distance [WD] collar if fitted
(I've never seen a variable NA iris and variable WD lens collar fitted
together on one objective though).

The increased contrast and greater depth of field at the lower NA iris
setting will bring out intra-cellular structures far better, and it works
with DIC as well. We use a Leica 63x [1.4-0.6 variable NA] HCX PL APO oil
objective, which cost around £5,000 I believe. Partly due to it being a
flash well made expensive objective, this Leica 'blue' variable NA 63x oil
objective's image quality will always be far better than that obtained our
long working distance Olympus LCPLFL 60x air objective [NA 0.7], the image
quality of which is relatively appalling - but of course it can see well
into the gels we use, unlike the Leica high NA oil version, and so is our
only choice for such things. The Olympus 60x also has a variable NA to
adjust the focus depth and contrast around the point of focus, but image
quality at either NA extreme is still quite poor compared to the Leica oil
(but it has that long working distance and can be physically moved to focus
far further into the specimen).

Well that’s how I see it anyway (and it must be true as another guy at a
conference I was at said a similar thing to me once). Unfortunately I don't
have access to these objectives any more, as I would like to investigate it
further (that’s the fun of this list-server it generates interesting
questions).

We generally use these variable NA 63x objectives with fluorescent samples
and z-slices under a laser confocal, so I doubt we'd notice any depth of
field improvements with the lower NA setting as we are sticking the centre
of the focus anyway.

Regards

Keith

-----------------------
Dr Keith J Morris
[Formerly] Imaging Facilities Manager
Cell Biology
Institute of Ophthalmology
UCL, London EC1V 9EL

----------------------------------------------------------------------------
-





Hi David,

Numerical Aperture: This is a critical value that indicates the light
acceptance angle, which in turn determines the light gathering power, the
resolving power, and depth of field of the objective.

Thus the higher the resolving power (NA) of an objective, the lower the
depth of field (and so working distance). So a high NA objective may not
suite all applications. Indeed a typical high magnification objective focus
point will only just penetrate through a standard 0.17mm glass coverslip. An
air objective will have a far greater (relatively) depth of field and thus a
far longer working distance, particularly an LD 'long working distance'
variety - but the image quality will be noticeably poorer (not a problem
though if you can't see squat with your high NA short working distance oil
immersion lens). This is all to do with airey disks and stuff, [and also a
lot to do with the price of the objective and how well it's made]. Image
contrast, as well as resolution, is also an important consideration here.


'Working distance' correction Collar

An adjustment [correction] collar for cover glass thickness (not NA) is
sometimes provided on high-NA microscope objective lenses. Rotation of the
collar adjusts the height of certain lens elements in the objective lens to
compensate for variations in coverslip thickness or immersion media. Thus it
provides an adjustable working distance. At high NAs, even a small deviation
of the coverslip thickness (by as little as a few micrometers in some
cases), or refractive index of the immersion medium from the designated
standard, can introduce significant aberrations.


Variable NA collar

Other objectives specifically designed for transmitted light fluorescence
and darkfield imaging are sometimes equipped with an internal iris diaphragm
that allows for adjustment of the effective numerical aperture [NA]. A 60x
apochromat objective can have a numerical aperture of 1.4, one of the
highest attainable in modern microscopes using immersion oil as an imaging
medium.

Variable Numerical Aperture Objectives: Specimens with unusually high
fluorescence quantum yields and/or very bright darkfield specimens often
induce image flare by light emitted from areas outside the focal plane. To
compensate for this artefact, manufacturers offer high numerical aperture
objectives that are equipped with an internal iris diaphragm to increase
image contrast during photomicrography or digital imaging. Opening or
closing the iris diaphragm determines the size of the objective rear
aperture yielding a variable numerical aperture range between 0.5 and the
objective's upper limit (up to 1.35-1.4 with apochromatic objectives).
Although iris diaphragms were once utilized in a wide variety of objective
designs, modern variable numerical aperture objectives are usually at the
high end (60x to 150x) of the magnification range.

A variable NA collar on an oil immersion thus help with contrast enhancement
when set to low NA, but it's not going to help it in any way achieve the
long working distance of a dry LD objective of the same magnification. I
must admit that I don't bother too much with the physics equations when
looking down the microscope, as any decent microscope rep should be able
provide you with a set of objectives to assess which one suites your needs
best before you buy. Typically you would go for the highest NA you can for
the given working distance required. Manufacturer's websites provide the
objectives working distance (in mm) and NA info. Modern ultra-high NA
objectives are required for TIRF applications and hi-res DIC contrast
enhancement.

To achieve higher NA than 0.95 for objectives they have to be used with
immersion media between front lens and specimen. Oil or water is mostly used
for that purpose. Because objectives have to be specially designed for this,
the type of immersion media is always mentioned on the objective like on the
UPlanFLN 60x/1.25 Oil Iris objective. This objective needs oil as an
immersion media and can not produce good image quality without it.

High NA objectives also collect more light and if you compare two objectives
with fluorescent samples, the high NA objective should produce a noticeably
brighter (and preferable) image. Again though the high NA objective is
generally far more expensive and it's better attention to quality
optics/coatings will also be factor in it's superior performance. An
objective also needs to be PLAN Apochromat and fluorescence friendly for
quality fluorophore imaging.

The only problem with using our variable NA collar objectives here is that
we use inverted optics and have no idea where the NA collar is actually set
[e.g. if it's moved accidentally or the previous user has adjusted it]. I do
put a chart on the wall telling users which way to turn the NA collar for
highest NA (viewed from above), but I'm not sure all users bother with this.
I have noticed slight changes in um/pixel calibration (less than 10%
difference, and it's linear) between the two NA extremes on some objectives.


To be told more than you probably want to know about resolving power and NA
see:

http://www.olympusmicro.com/primer/anatomy/specialobjectives.html
http://www.microscopy.olympus.eu/microscopes/About_Microscopy_7436.htm
[The resolving power]
http://www.charfac.umn.edu/glossary/c.html
http://www.oznet.ksu.edu/ed_agron645/lab/microscope_use.htm
http://www.olympusconfocal.com/theory/confocalobjectives.html
http://www.microscopyu.com/tutorials/java/objectives/nuaperture/index.html
http://www.microscopyu.com/articles/optics/objectivespecs.html
http://www.micro.magnet.fsu.edu/primer/java/aberrations/slipcorrection/index
.html

Regards

Keith

-----------------------
Dr Keith J Morris
[Formerly] Imaging Facilities Manager
Cell Biology
Institute of Ophthalmology
UCL, London EC1V 9EL


-----Original Message-----
X-from: david.knecht-at-uconn.edu [mailto:david.knecht-at-uconn.edu]
Sent: 15 June 2007 15:25
To: keith.morris-at-ucl.ac.uk

Lots of useful information in the responses, but let me clarify the
question. A colleague is using his stopped down 40x oil objective in
order to visualize vesicles throughout the volume of the cell in one
image rather than confocal sectioning. I am trying to understand why
it works and whether it would work equivalently with a dry
objective. Obviously the light cone from a 1.4 NA 40x oil objective
(whether iris is closed or not) and a 40x long working distance dry
objective are different. The depth of field varies with numerical
aperture, so a 40x 1.4 oil immersion lens, should inherently have a
shallower depth of focus. Therefore, it makes no intuitive sense to
me that you would #1-increase the depth of focus, and #2- get the
same results with a 40x oil 1.4 in which you stop down the iris to .
5NA, as a .5NA LWD dry lens. The excitation spot profile of the 40x
oil objective is not going to enlarge as you stop down the iris with
the same input light path. So I am trying to understand how the
focal depth/resolution/xyz profile of the excitation/emission etc. is
for fluorescence in comparing those two situations. Dave

Dr. David Knecht
Department of Molecular and Cell Biology
Co-head Flow Cytometry and Confocal Microscopy Facility
U-3125
91 N. Eagleville Rd.
University of Connecticut
Storrs, CT 06269
860-486-2200
860-486-4331 (fax)


On Jun 15, 2007, at 9:19 AM, keith.morris-at-ucl.ac.uk wrote:




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From: dljones-at-bestweb.net
Date: Mon, 18 Jun 2007 14:17:33 -0500
Subject: [Microscopy] unusual request

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Hello all,

OK, I've been looking around for a group that talks/works on/etc. older
microscopes. But I have not been successful in finding such a group.

I have just picked up an old Olympus PMG metallograph. It is an absolutely
fascinating piece of optical equipment. I've never seen one like it.
Anyway, as one of my (ever increasing number of) extra-curricula
activities, I've decided I'd like to either restore this instrument, or
alter it so that I can actually use it as a modern metallograph with
digital