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From: edelmare-at-muohio.edu
Date: Wed, 1 Aug 2007 08:34:01 -0500
Subject: [Microscopy] FFT Software

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopylistserver.com/MicroscopyListserver/MicroscopyArchives.html

Does anyone have a recommendation for software that will run an FFT
on an image to find the REPEATING information (i.e. not remove the
repeating noise)? We are collecting information on size and
uniformity of arrays - not acutally using it for filtering.

The FFT in Image Pro is for filtering out the repeating information.

Thanks


Richard E. Edelmann, Ph.D.
EXPO Editor, Microscopy and Microanalysis Supplement
Electron Microscopy Facility Director
364 Pearson Hall
Miami University, Oxford, OH 45056
Ph: 513.529.5712 Fax: 513.529.4243
E-mail: edelmare-at-muohio.edu
http://www.emf.muohio.edu


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From: sougratr-at-mail.nih.gov
Date: Wed, 1 Aug 2007 08:51:01 -0500
Subject: [Microscopy] Re: FFT Software

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopylistserver.com/MicroscopyListserver/MicroscopyArchives.html

You could just use imageJ,
here is the link :
http://rsb.info.nih.gov/ij/

Rachid


edelmare-at-muohio.edu wrote:
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} Does anyone have a recommendation for software that will run an FFT
} on an image to find the REPEATING information (i.e. not remove the
} repeating noise)? We are collecting information on size and
} uniformity of arrays - not acutally using it for filtering.
}
} The FFT in Image Pro is for filtering out the repeating information.
}
} Thanks
}
--
Rachid SOUGRAT
Cell Biology and Metabolism Branch
NICHD, NIH
Bldg. 18T, Rm. 101
18 Library Drive
Bethesda, MD 20892-5430
USA

Tel.: 301-594-3944
FAX 301-402-0078

http://rsougrat.googlepages.com/


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From: mboucher-at-umn.edu
Date: Wed, 1 Aug 2007 09:30:20 -0500
Subject: [Microscopy] EDS computer for giveaway

Contents Retrieved from Microscopy Listserver Archives
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We have an old Link (Oxford) eXL computer, monitor, keyboard and mouse for
giveaway. It is a parts only deal as we believe the CPU is dead. No
detector.
Must come and get it or arrange for packing and shipping yourself.
Thanks

Mike
******************************************************************
Michael L. Boucher Sr. mboucher-at-tc.umn.edu
Lab Manager Rm 18 Office Ph 612-624-6590
I.T. Characterization Facility Rm 12 Main Off Ph 612-626-7594
MiNTeC node of the National Nanotechnology Infrastructure Network

University of MN Fax 612-625-5368
12 Shepherd Labs
100 Union Street S.E.
Minneapolis, MN 55455 http://www.charfac.umn.edu
********************************************************************



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From: Mike.Bode-at-olympus-sis.com
Date: Wed, 1 Aug 2007 11:01:35 -0500
Subject: [Microscopy] Re: FFT Software

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopylistserver.com/MicroscopyListserver/MicroscopyArchives.html

If you have access to our iTEM software, you can set the filters to
either "opaque" (filtering out the periodic structures), or
"transparent", which filters out everything BUT the periodic information
relating to that specific filter.

Have you checked if you can set this attribute in Image Pro?


Michael Bode, Ph.D.

General Manager

OLYMPUS SOFT IMAGING SOLUTIONS
12596 West Bayaud Ave #300
Lakewood, CO 80228
USA
Tel.: +1 (303) 234-9270
Fax.: +1 (303) 234-9271
E-mail: Mike.Bode-at-olympus-sis.com
www.olympus-sis.com

-----Original Message-----
X-from: sougratr-at-mail.nih.gov [mailto:sougratr-at-mail.nih.gov]
Sent: Wednesday, August 01, 2007 07:56
To: Mike Bode

You could just use imageJ,
here is the link :
http://rsb.info.nih.gov/ij/

Rachid


edelmare-at-muohio.edu wrote:
} ----------------------------------------------------------------------
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} http://www.microscopy.com/MicroscopyListserver
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} ----------------------------------------------------------------------
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}
} Does anyone have a recommendation for software that will run an FFT on

} an image to find the REPEATING information (i.e. not remove the
} repeating noise)? We are collecting information on size and
} uniformity of arrays - not acutally using it for filtering.
}
} The FFT in Image Pro is for filtering out the repeating
information.
}
} Thanks
}
--
Rachid SOUGRAT
Cell Biology and Metabolism Branch
NICHD, NIH
Bldg. 18T, Rm. 101
18 Library Drive
Bethesda, MD 20892-5430
USA

Tel.: 301-594-3944
FAX 301-402-0078

http://rsougrat.googlepages.com/


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From: walck-at-southbaytech.com
Date: Wed, 1 Aug 2007 11:37:57 -0500
Subject: [Microscopy] FFT Software

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopylistserver.com/MicroscopyListserver/MicroscopyArchives.html

You can use Fovea Pro or Image Processing Toolkit, both from John and Chris
Russ. Go to their website, http://www.reindeergraphics.com/. It will work
in Photoshop and I think Image. On the disc that comes with the software is
a complete tutorial on image processing and stereology. It's a good plug-in
addition to Photoshop.


-Scott

Scott D. Walck, Ph.D.
Technical Director
South Bay Technology, Inc.
1120 Via Callejon
San Clemente, CA 92673

US Toll Free: 1-800-728-2233
Tel: (949) 492-2600
Fax: (949) 492-1499

www.southbaytech.com
walck-at-southbaytech.com

-----Original Message-----
X-from: edelmare-at-muohio.edu [mailto:edelmare-at-muohio.edu]
Sent: Wednesday, August 01, 2007 6:41 AM
To: Walck-at-SouthBayTech.com

Does anyone have a recommendation for software that will run an FFT on an
image to find the REPEATING information (i.e. not remove the repeating
noise)? We are collecting information on size and uniformity of arrays -
not acutally using it for filtering.

The FFT in Image Pro is for filtering out the repeating information.

Thanks


Richard E. Edelmann, Ph.D.
EXPO Editor, Microscopy and Microanalysis Supplement Electron Microscopy
Facility Director
364 Pearson Hall
Miami University, Oxford, OH 45056
Ph: 513.529.5712 Fax: 513.529.4243
E-mail: edelmare-at-muohio.edu
http://www.emf.muohio.edu


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From: hkonishi-at-wisc.edu
Date: Wed, 1 Aug 2007 12:24:15 -0500
Subject: [Microscopy] electropolishing service

Contents Retrieved from Microscopy Listserver Archives
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Dear All:

I am looking for a lab offering electropolishing services. My sample
is alloy. I use ion milling, but I would like to see how
electropolishing better woks for my sample. If you have some
recommendation, please advise.

Thank you,
Hiromi Konishi, Ph.D.
UW-Madison

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From: susan.vanhorn-at-sunysb.edu
Date: Wed, 1 Aug 2007 12:33:33 -0500
Subject: [Microscopy] viaWWW: postembed with LR WHite

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This Question/Comment was submitted to the Microscopy Listserver
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Email: susan.vanhorn-at-sunysb.edu
Name: Susan C. Van Horn

Title-Subject: [Filtered] postembed with LR WHite

Question: I am doing postembed immuno on Ni formvar coated slot grids with sections embedded in LR White.....they seem to be falling off the grid before i get to counter stain them.....any reason why and how to avoid them coming off???
thanks,
sue

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From: javaidqazi-at-kemet.com
Date: Wed, 1 Aug 2007 12:45:42 -0500
Subject: [Microscopy] Free thermal papers to give away

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I have lot of thermal papers rolls (Sony, TYPE IV, Enhanced, UPP-110HA,
110mmx18mm. I got digital image capturing system on my JEOL 5800 and now
have no use of these. If you are interested, please contact me directly.
Dont want to throw so many rolls away.

Javaid





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From: javaidqazi-at-kemet.com
Date: Wed, 1 Aug 2007 12:47:25 -0500
Subject: [Microscopy] Oxford ISIS system available

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I have oxford ISIS system electronics along with the software, not the
detector. Upgraded to INCA. Anyone interested please contact me directly.

Javaid




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From: joe.p.neilly-at-abbott.com
Date: Wed, 1 Aug 2007 15:31:40 -0500
Subject: [Microscopy] Analytical Chemist/Microscopist Position at Abbott Laboratories

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Analytical Chemist

Job Description
Test physical and chemical characteristics of new active pharmaceutical
ingredients and drug products. Develop and validate analytical test
procedures. Perform test method transfers. Knowledge of forensic
microscopy techniques. Work in a cGMP laboratory. Strong emphasis on
microscopy, spectroscopy and data handling. Good written and verbal skill.

Skills
Must possess solid microscopy and microanalysis skills including polarized
light microscopy, scanning electron microscopy, energy dispersive x-ray
spectroscopy, and Fourier transform infrared spectroscopy in addition to
basic analytical laboratory skills. Knowledge of and experience in drug
development and working in accordance with GLP and GMP requirements is
required. Additional skills in electron microscopy, energy dispersive
x-ray spectroscopy and vibrational spectroscopy is desired. Excellent
written and verbal communication is required. Please note: This position
may be filled at a grade 13 or grade 15, depending on experience.

Education:
BS with a minimum of 5 years directly related experience. Preferred
Education. MS, chemistry is preferred.

Qualified applicants should send resume/CV to joe.neilly-at-abbott.com

==============================Original Headers==============================
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From: gary-at-gaugler.com
Date: Wed, 1 Aug 2007 16:48:33 -0500
Subject: [Microscopy] Ovarian cancer

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Hello group:

Does anyone know of a source of prepared LM slide
and/or SEM prepared specimens of ovarian cancer?

Prostate and colon cancer specimens are also
desirable.

Not asking for free specimens.

gary g.


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From: fulton.2-at-osu.edu
Date: Wed, 1 Aug 2007 22:16:49 -0500
Subject: [Microscopy] viaWWW: Imaging Campylobacter flagella

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Email: fulton.2-at-osu.edu
Name: Dave Fulton

Organization: OSU/OARDC

Title-Subject: [Filtered] Imaging Campylobacter flagella

Question: Hello fellow listers,

We need to produce SEM and TEM images of Campylobacter flagella. Just wondering if anyone has experience with this and has a favorite protocol they might share with us. We have produced good images using uranyl acetate as a negative stain, but we are unsure of the proper buffer, stains, etc., for SEM and TEM that would give us good images of the cells with unbroken flagella. Thanks in advance for your time and trouble.

---------------------------------------------------------------------------

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From: jpshield-at-uga.edu
Date: Fri, 3 Aug 2007 09:30:33 -0500
Subject: [Microscopy] mat sci position at UGA

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Dave,
Working with a number of different bacteria I have found that for negative staining, fixation prior to staining gives better morphology, something like 2%PF + 2% GA in 0.1 M cacodylate (on the grid after adsorption) for 5-10 min. I also like to use fresh carbon coated grids, no parlodion. This will ensure that you see the flagella and pili with the thin carbon substrate. I have had success with both UA and PTA, remember though no phosphate when using UA to avoid precipitants. As for SEM it is difficult to avoid breakage of thin structures like membrane attachments and flagella, caused by dehydration. Perhaps a non-flexible substrate like silica chips or coverslips would be better than say formvar coated grids. Also you can try a chemical alternative to critical point drying like HMDS.
Good Luck.

} Michael Delannoy
} Dept of Cell Biology
} Johns Hopkins School of Medicine
} 725 N.Wolfe St. Physiology Bldg G-04
} Baltimore, Md 21205

----- Original Message -----
X-from: fulton.2-at-osu.edu

Position Description
Academic Professional Associate in Physical, Material, and Geosciences

The Center for Ultrastructural Research (CUR) is seeking a scientist in materials characterization at the Ph.D. level. This individual will function at the professional/faculty level, collaborating with physical sciences users in experimental design, implementation, and analysis.

The individual to be hired will be expected to have accomplished original research, as witnessed by a publication record in materials sciences and/or related areas. He or she will be responsible for training and supervising users in TEM, SEM, electron diffraction, X-ray emission analysis, and X-ray microtomography. The individual will work to deliver pedagogic instruction in course offerings such as Electron Microscopy, Cellular Biology (i.e., Techniques in Modern Microscopy), and Clay Mineralogy.

The individual will assist physical sciences users of the CUR and share responsibility for the maintenance of instruments including: two TEM’s, two SEM’s, a confocal fluorescence microscope equipped for multiphoton microscopy with a femtosecond pulsed IR laser, a micro-computed tomography apparatus, and a deconvolution microscopy-capable inverted light microscope.

The individual to be hired will have the opportunity to conduct and publish independent research in his or her area of expertise and to submit grants both to support their own research and to augment the instrumentation at the CUR. Entry level salary will be around $47,000, with an increase commensurate with demonstrated experience. Inquiries and application should be directed to Dr. Paul A. Schroeder, Center for Ultrastructural Research, 151 Barrow Hall, University of Georgia, Athens, GA 30602 USA. (706) 542-4080 mailto:caur-at-uga.edu. Please include a curriculum vitae, statement of interest, and contact information for at least three references. Applications received before Aug. 24, 2007 will receive full consideration.
The University of Georgia is an Equal Opportunity/Affirmative Action Institution.
John P. Shields
Center for Ultrastructural Research
151 Barrow Hall
University of Georgia
Athens, GA 30602

706-542-4080


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From: rcommon-at-msu.edu
Date: Fri, 3 Aug 2007 10:46:40 -0500
Subject: [Microscopy] Freezing 4489 Film

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Does anyone have experience freezing 4489 TEM film for long-term storage? I
have stored many types of film at -20C with no problems, but haven't tried
it with 4489. Can this cause condensation or other problems?

Ralph Common
Michigan State University


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From: cdavis-at-deltacollege.edu
Date: Fri, 3 Aug 2007 10:59:35 -0500
Subject: [Microscopy] 4489 Film

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I am posting this on behalf of a colleague. This is a wafer fab
in-line SEM I believe.
Please send any responses to Ron or Donna.
=========================================================================================

We have received the following request concerning the need for
field service support for a "down" AMAT Opal 7830 SEM tool. I
was wondering if any of you were aware of a field service
engineer, or field service team that could provide repair on this
tool.
Please contact Donna Pistotti at dpistot1-at-irf.com if you have a
solution or recommendation for her and cc me
(ron.kee-at-avagotech.com) on your response so I can know if there
is solution forthcoming, sooner than AMAT
can respond on September 10...

Regards,
Ron Kee
Analysis Lab R&D manager
Avago Technologies
Ft. Collins, CO
(970) 288-9389

-----Original Message-----
X-from: Donna Pistotti [mailto:DPISTOT1-at-irf.com]
Sent: Thursday, August 02, 2007 8:48 AM
To: LT-at-waferfabs.org
Cc: Sharon Noyes

We have had no problems feezing 4489 film at our school for long periods
of time. Sometimes for several years. There has never been any problem
with condensation.

Cathy Davis
San Joaquin Delta College
EM Lab


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From: frank.karl-at-degussa.com
Date: Fri, 3 Aug 2007 11:29:12 -0500
Subject: [Microscopy] TEM Calibration details (sort of)

Contents Retrieved from Microscopy Listserver Archives
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The votes are in and here's the partial summary of what people use to
calibrate their TEM:
My informal survey is based on 24 responses:
63% (14 people) use a grating replica,
68% (15 people) use crystal spacing.

26% of the respondents indicated they use a commercial product called
Mag*I*Cal.

For more details and a little verbiage visit Microscopy Society of
Northeastern Ohio Blog at:
http://www.msneo.org/2007/08/scales-and-distance.html (my face will be
really red, if this link doesn’t work!) You can also find what I think is
the most unique TEM calibration I've ever read.

Have a great week-end

Frank


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From: jpshield-at-uga.edu
Date: Fri, 3 Aug 2007 13:28:13 -0500
Subject: [Microscopy] date correction on UGA position

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Note that deadline is Nov. 1, 2007 not Aug. 24
Thanks

Position Description
Academic Professional Associate in Physical, Material, and Geosciences

The Center for Ultrastructural Research (CUR) is seeking a scientist in materials characterization at the Ph.D. level. This individual will function at the professional/faculty level, collaborating with physical sciences users in experimental design, implementation, and analysis.

The individual to be hired will be expected to have accomplished original research, as witnessed by a publication record in materials sciences and/or related areas. He or she will be responsible for training and supervising users in TEM, SEM, electron diffraction, X-ray emission analysis, and X-ray microtomography. The individual will work to deliver pedagogic instruction in course offerings such as Electron Microscopy, Cellular Biology (i.e., Techniques in Modern Microscopy), and Clay Mineralogy.

The individual will assist physical sciences users of the CUR and share responsibility for the maintenance of instruments including: two TEM’s, two SEM’s, a confocal fluorescence microscope equipped for multiphoton microscopy with a femtosecond pulsed IR laser, a micro-computed tomography apparatus, and a deconvolution microscopy-capable inverted light microscope.

The individual to be hired will have the opportunity to conduct and publish independent research in his or her area of expertise and to submit grants both to support their own research and to augment the instrumentation at the CUR. Entry level salary will be around $47,000, with an increase commensurate with demonstrated experience. Inquiries and application should be directed to Dr. Paul A. Schroeder, Center for Ultrastructural Research, 151 Barrow Hall, University of Georgia, Athens, GA 30602 USA. (706) 542-4080 mailto:caur-at-uga.edu. Please include a curriculum vitae, statement of interest, and contact information for at least three references. Applications received before Nov. 1, 2007 will receive full consideration.
The University of Georgia is an Equal Opportunity/Affirmative Action Institution.
John P. Shields
Center for Ultrastructural Research
151 Barrow Hall
University of Georgia
Athens, GA 30602

706-542-4080


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From: frank.karl-at-degussa.com
Date: Fri, 3 Aug 2007 13:59:48 -0500
Subject: [Microscopy] Re: TEM Calibration details (sort of)

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopylistserver.com/MicroscopyListserver/MicroscopyArchives.html

Hi Pat,
I may have missed that note, our server somehow misplaces things. I
checked on Mag*I*Cal and you are correct. NIST doesn't calibrate "
fundamental constants of nature." Seems a shame.

Thanks for the note!

Enjoy the week-end!




Patricia Connelly
{connellyps-at-nhlbi To: {frank.karl-at-degussa.com}
.nih.gov} cc:
Subject: Re: [Microscopy] TEM Calibration details (sort of)
08/03/2007 02:34
PM





Frank,
I think that there was a correction by the microscopist who gave the
message about the NIST traceability. If I remember correctly he wrote
"now"
and corrected it to "not".

Pat Connelly






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From: afong-at-olinet.com
Date: Fri, 3 Aug 2007 16:23:41 -0500
Subject: [Microscopy] Job Posting: Product Marketing/Sales Manager

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopylistserver.com/MicroscopyListserver/MicroscopyArchives.html

Title: Product Marketing/Sales Manager

Job Summary: Chromodynamics Inc. is seeking a Product/Sales Management
candidate with a science background and knowledge of the microscope
community, strong computer skills and at least one year of hands-on
experience using a Confocal or similar advanced light microscope for its new
hyperspectral imaging product line.

Location: Orlando, FL or Lakewood, NJ

Responsibilities:

- Customer visits and analysis of customer's imaging needs
- Demonstration of products and onsite work with the customer
- Sales support of existing customers
- Identifying potential new customers via web searches, literature searches,
marketing campaigns, trade shows, and customer referrals
- Introduction of Chromodynamics products and services to potential
customers via in person visits, email and phone
- Understanding potential customers needs related to products offered by
Chromodynamics Inc.
- Organizing workshops and demonstrations for regional sales
representatives, distributors and VARs (value-added resellers)
- Monitor daily/monthly orders and provide information in regards to account
details
- Expand sales channels to increase market penetration in designated product
areas and markets.
- Attain maximum sales and appropriate product mix.
- Uncover new sales opportunities through cold calling, networking and other
proven marketing strategies
- Relay leads to dealer personnel, follow up and monitor outcome
- Watch for and identify new markets
- Set and achieve established sales goals
- Develop thorough knowledge of all frequently encountered applications and
their appropriate solutions for which related products are required
- Report significant changes or trends in area sales.
- Provide feedback on product quality, needs, competition, business trends
and unique product applications to management team
- Complete required reports
- Maintain files and records of customer names, orders and locations
- Develop strategic marketing plan and coordinate the sales activities in
conjunction with Engineering and Operations to achieve stated goals

Reporting directly to the Vice-President of Marketing and Sales, this key
contributor will work with our potential and existing clients, through
direct and indirect channels, to meet their life science imaging needs with
Chromodynamics Inc. leading solutions and expertise.

As the customer's point of contact, they must be able to provide
applications assistance, product support and sales of Chromodynamics Inc.
products and services to technical buyers. Must have experience responding
to tenders, RFPs, RFQs, generating contracts, bid proposals and supporting
the negotiation and closing sales with our distributors and representatives.
They will follow up on quotations, drive processing of orders and maintain
adequate records to document price quotations, decisions, progress and
results of activity. They will use available resources such as sales leads,
literature, samples and demos, telephones, Internet and email, computers and
support staff and services to produce the most effective results and
exercise strong administrative, organizational and communication skills.

Minimum Desired Qualifications:

A Bachelors degree in the sciences (i.e. biology, chemistry, physics or
equivalent) and a minimum of 4 years experience or a graduate degree or
equivalent and a minimum of 2 years of applicable laboratory and sales
experience required. Proficient use of personal computers: Windows 95/98,
NT, XP, MS Word, Excel, PowerPoint, Internet Explorer, Outlook, etc.
Must demonstrate the ability to simplify problems, articulate solutions,
lead and delegate, have excellent communication skills and be a highly
motivated team oriented self-starter. Travel required up to 25%.

Contact:

ChromoDynamics, Inc.
1195 Airport Road, #1
Lakewood, New Jersey 08701
Fax: 732.730.3547
Email: careers-at-olinet.com
Web: http://www.chromodynamics.net/


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From: smithj-at-exchange.winthrop.edu
Date: Mon, 6 Aug 2007 08:14:10 -0500
Subject: [Microscopy] LM: Axioskop uneven illumination

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopylistserver.com/MicroscopyListserver/MicroscopyArchives.html

LM and imaging folk--we have a first-generation zeiss axioskop that
we've just set up with a scion digital camera and diagnostic
instruments coupler for transmitted-light photomicrography.
The illuminated field is hideously uneven, with a central hot-spot.
The Scion doesn't do shading correction, so, aside from flat-field
correction in ImageJ, has anyone else experienced/solved this
problem? Will a diffuser in the beam path help?
TIA
Julian
--
Julian P.S. Smith III
Dept. of Biology
Winthrop University
520 Cherry Rd.
Rock Hill, SC 29733

803-323-2111 x6427 (vox)
803-323-3448 (fax)
803-524-2347 (cell)

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From: pmoeck-at-pdx.edu
Date: Mon, 6 Aug 2007 11:33:12 -0500
Subject: [Microscopy] viaWWW: Postdoc Position Open @ Portland State

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This Question/Comment was submitted to the Microscopy Listserver
using the WWW based Form at http://microscopy.com/MLFormMail.html
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Email: pmoeck-at-pdx.edu
Name: Peter Moeck

Organization: Portland State University

Title-Subject: [Filtered] Postdoc up to 3 years, Crystallographic and
spectroscopic analyses of ferromagnetic semiconducting nanoparticle
aggregates

Question: Postdoc (USA, University of Davis, California and west
coast based) for a collaboration between Portland State University,
the University of California at Davis, the University of Washington
at Seattle, and the Pacific NorthWest National Laboratory

Initially for one year at $35,500 plus the typical fringe benefits
(health insurance, retirement benefits, etc. ... package that
ammounts to about $17,500 annually) available from September 1st,
2007, onwards, extendable up to 3 years by mutual agreement.

A group of collaborators from Portland State University, the
University of California at Davis, and the University of Washington
at Seattle is seeking a postdoc for a project on Crystallographic and
spectroscopic analyses of ferromagnetic semiconducting nanoparticle
aggregates with Curie temperatures well above room temperature.

A background in materials physics, materials chemistry,
crystallography, or materials science and engineering is required.
Familiarity with Z-contrast (HAADF) imaging in scanning transmission
electron microscopes and associated electron energy loss spectroscopy
are essential. Skills in high resolution phase-contrast transmission
electron microscopy, electron diffraction and crystallography, and
crystallographic image processing will be appreciated.

The search will be open until the position has been filled.
Applications (CV, list of referees, reasons for coming to the US for
applicants from aboard, list of publications, etc.) should be sent to
both

Prof. Peter Moeck
Department of Physics
Portland State University
P.O. Box 751
Portland, Oregon 97207-0751
Tel.: 503 725 4227
Fax: 503 725 2815
e-mail: pmoeck-at-pdx.edu

and

Prof. Nigel D. Browning
Department of Chemical Engineering and Materials Science
University of California-Davis
One Shields Ave
Davis, CA 95616
Tel: 530-754-5358 (Davis)
Fax: 530-752-9554 (Davis)
e-mail: nbrowning-at-ucdavis.edu

---------------------------------------------------------------------------

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13, 11 -- Subject: viaWWW: Postdoc Position Open -at- Portland State
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From: sergei2-at-ornl.gov
Date: Mon, 6 Aug 2007 14:20:50 -0500
Subject: [Microscopy] PFM Workshop - Oak Ridge, October 8,9

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopylistserver.com/MicroscopyListserver/MicroscopyArchives.html

Dear colleagues

We are bringing to your attention the workshop
"Piezoresponse Force Microscopy: Instrumentation, Techniques, and
Applications" to be held at Oak Ridge, TN on October 8-9, 2007, in
conjunction with the CNMS User Meeting (http://cnms.ornl.gov/). The
workshop focuses on electromechanical coupling in inorganic and
macromolecular materials and biological systems and will feature invited
tutorials on emergent phenomena in nanoscale ferroelectrics and
ferroelectric surfaces, polarization-mediated surface phenomena in polar
materials, and piezoelectricity and electrophysiology of biosystems. The
central theme of the workshop - Piezoresponse Force Microscopy - will be
discussed in a series of tutorials by S.V. Kalinin (ORNL) and A.
Gruverman (UNL), that will introduce basic principles of PFM operation,
relevant instrumental aspects, and recent advances in PFM imaging of
switching ferroelectric films and nanostructures, biological materials
and macromolecular systems, and PFM in liquid and ultra high vacuum
environment. The tutorials will be complemented by a poster session.

The 2 day workshop will be followed by 3 days of
experimental demonstrations of PFM, Switching Spectroscopy PFM, and
band-excitation PFM by CNMS staff members and Asylum Research
representatives, held in parallel with the CNMS user meeting (October
10-12). The participants are welcome to bring their own samples. The
workshop abstract and outline are available on line at
http://cnms.ornl.gov/workshops/CNMS_PFM_Workshop.pdf. The registration
information will be available shortly at
http://neutrons.ornl.gov/workshops/users2007/

The invited speakers include:

M. Gregg (U. Belfast), "Nanoscale Ferroelectrics: Where Size Really Does
Matter"

S. Streiffer (Argonne National Lab.), "Phase transitions, domain
structure & dynamics, and surface chemistry in ferroelectrics studied by
x-rays"

Andrew M. Rappe (University of Pennsylvania), "First-principles and
multiscale modeling of ferroelectrics"

Andrew Marino (LSU), "Electromechanics of biosystems"

Due to the space limit, please contact workshop organizers
[sergei2-at-ornl.gov] by August 31 if you are interested in attending.

Yours

Sergei V. Kalinin and Arthur P. Baddorf


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From: frank.karl-at-degussa.com
Date: Tue, 7 Aug 2007 06:36:21 -0500
Subject: [Microscopy] Test - Please delete

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopylistserver.com/MicroscopyListserver/MicroscopyArchives.html

tets


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From: nizets2-at-yahoo.com
Date: Tue, 7 Aug 2007 07:29:52 -0500
Subject: [Microscopy] MC 2007 in Saarbrücken, Germany

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopylistserver.com/MicroscopyListserver/MicroscopyArchives.html

Dear listers,

Please forgive me for using the list to try and solve
a personal problem, but I cannot obtain an answer to
my question by the official route, so I send this
message in a bottle in the hope that some personality
involved in the conference will read it and answer it.

I simply would like to know the subjects of the
different workshops planned during the conference.

Regards,

Stephane


____________________________________________________________________________________
Shape Yahoo! in your own image. Join our Network Research Panel today! http://surveylink.yahoo.com/gmrs/yahoo_panel_invite.asp?a=7



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From: reznik-at-ict.uni-karlsruhe.de
Date: Tue, 7 Aug 2007 13:06:55 -0500
Subject: [Microscopy] viaWWW: SEM_S570_1

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Email: reznik-at-ict.uni-karlsruhe.de
Name: Boris

Title-Subject: [Filtered] SEM_S570_1

Question: I have an old Hitachi SEM, S-570 with a digital photocamera
NikonD100 attached to the camera unit. At the observation CRT the
SEM-images are sharp while at the CCD the images are not sharp at
different camera positions. I checked the CCD camera as I took
pictures directly from the observation CRT, and the pictures are
sharp. I think that something is wrong with the justage or quality of
the photo CRT.
Does anybody know, how can I overcome my problem?

Boris

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From: bozzola-at-siu.edu
Date: Tue, 7 Aug 2007 13:59:02 -0500
Subject: [Microscopy] Re: viaWWW: SEM_S570_1

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http://www.microscopylistserver.com/MicroscopyListserver/MicroscopyArchives.html

Hello Boris,

First thing to do, if you possibly can, is to check the quality of
the photo CRT by shooting some conventional film (say Polaroid). This
is fairly important since it will tell you if its a problem with the
photo CRT.

Is this the first time setting up the 570 with a digital camera or
was it working fine and then became unsharp?

We have a Hitachi S2460N to which I attached a Nikon D70S digital
camera. It works fine but one must be very careful setting the
camera focus on the CRT is critical. Is it possible that the camera
is slipping out of focus (loose components)?

JB

} Question: I have an old Hitachi SEM, S-570 with a digital photocamera
} NikonD100 attached to the camera unit. At the observation CRT the
} SEM-images are sharp while at the CCD the images are not sharp at
} different camera positions. I checked the CCD camera as I took
} pictures directly from the observation CRT, and the pictures are
} sharp. I think that something is wrong with the justage or quality of
} the photo CRT.
} Does anybody know, how can I overcome my problem?
}
} Boris
}
} ---------------------------------------------------------------------------
}
} ==============================Original Headers==============================
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} 6, 11 -- Subject: viaWWW: SEM_S570_1
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--
+++++++++++++++++++++++++++++++++++++++++++++++++++++++

John J. Bozzola, Ph.D., Director
Integrated Microscopy & Graphics Expertise (IMAGE)
Southern Illinois University
750 Communications Drive - MC 4402
Carbondale, IL 62901
Telephone: 618-453-3730

+++++++++++++++++++++++++++++++++++++++++++++++++++++++

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From: David.Llewellyn-at-anu.edu.au
Date: Wed, 8 Aug 2007 08:20:15 -0500
Subject: [Microscopy] viaWWW: sloan thickness monitor DTM200

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Email: David.Llewellyn-at-anu.edu.au
Name: David Llewellyn

Organization: Australian National University

Title-Subject: [Filtered] sloan thickness monitor DTM200

Question: Hi all, would anyone have a manual for the thickness coater
complete with circuit diagrams, I need to carry out a fix on one of
these devices, thanks, David.

---------------------------------------------------------------------------

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From: TMurray-at-uamail.albany.edu
Date: Wed, 8 Aug 2007 09:12:24 -0500
Subject: [Microscopy] Seeking 200CX Double Tilt Holder

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopylistserver.com/MicroscopyListserver/MicroscopyArchives.html

I am looking for a double tilt holder for a JEOL 200CX TEM.  OEM or Gatan is fine, I'm not picky.
 
If you know of any out there please let me know.
 
Thanks,
 
Tom
 
Thomas M. Murray
Senior Research Support Specialist / Instructor
College of Nanoscale Science & Engineering
University at Albany-SUNY
251 Fuller Rd.
Albany, NY 12203
 
Phone: (518) 437-8636
Fax: (518) 437-8687
cell: (518) 487-9535
tmurray-at-uamail.albany.edu
 


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From: nizets2-at-yahoo.com
Date: Thu, 9 Aug 2007 07:44:44 -0500
Subject: [Microscopy] question about EDX signal saturation

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopylistserver.com/MicroscopyListserver/MicroscopyArchives.html

Hi all!

I am having a too strong signal in EDX (in SEM).
The dead time is usually between 70-80%.
I wondered how I could reduce the signal without
changing the HT.
Changing the size of the beam is one way.
Would it be wise to move the stage in the Z axis to be
sub-optimal with respect to the EDX detector?
Any other idea?

Stephane



____________________________________________________________________________________
Got a little couch potato?
Check out fun summer activities for kids.
http://search.yahoo.com/search?fr=oni_on_mail&p=summer+activities+for+kids&cs=bz

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From: maryflet-at-interchange.ubc.ca
Date: Thu, 9 Aug 2007 12:08:18 -0500
Subject: [Microscopy] question about EDX signal saturation

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http://www.microscopylistserver.com/MicroscopyListserver/MicroscopyArchives.html

Dear Stephane,
It is not a good idea to move the Z axis of the SEM stage for EDX, this will
upset the geometry of the beam-detector system and affect quantitation.
There are three possibilities: get an SDD detector, which is much more
tolerant of high beam currents, use a higher condenser lens setting (smaller
beam spot size) or a smaller final aperture, if your SEM has a movable final
aperture. You could also move the EDX detector back along its track (retract
it), which will change the solid angle but not the geometry. You may have to
re-enter the geometry in the EDX setup if you do that.
If you change the HT of the SEM, you may not detect all the elements.
Good luck,

Mary Fletcher (nee Mager)
Electron Microscopist
Materials Eng. UBC
#309 - 6350 Stores Road
Vancouver, B.C. V6T 1Z4
Canada
Tel: 604-822-5648
Fax: 604-822-3619
email: maryflet-at-interchange.ubc.ca


-----Original Message-----
X-from: nizets2-at-yahoo.com [mailto:nizets2-at-yahoo.com]
Sent: August 9, 2007 5:54 AM
To: maryflet-at-interchange.ubc.ca

Hi all!

I am having a too strong signal in EDX (in SEM).
The dead time is usually between 70-80%.
I wondered how I could reduce the signal without
changing the HT.
Changing the size of the beam is one way.
Would it be wise to move the stage in the Z axis to be
sub-optimal with respect to the EDX detector?
Any other idea?

Stephane



____________________________________________________________________________
________
Got a little couch potato?
Check out fun summer activities for kids.
http://search.yahoo.com/search?fr=oni_on_mail&p=summer+activities+for+kids&c
s=bz

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From: chunfei-at-pdx.edu
Date: Sept. 13 (Thursday)-14 (Friday), 2007
Subject: [Microscopy] microtomy workshop at Portland State University, Sept. 13-14

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopylistserver.com/MicroscopyListserver/MicroscopyArchives.html

Dear all,

Please see the announcement for a free workshop on microtomy. Thanks.


Chunfei Li
Portland State University






Agenda
Unless specified, lecture and training will be conducted by Dave
Roberts/Greg Becker from RMC Products

Sep. 13 (Thursday), 2007
8:30AM Introduction: Goals and schedule. Get acquainted with
participants and their projects (Chunfei Li, PSU; Dave Roberts/Greg
Becker, RMC)
9:00AM Short PowerPoint presentation on ultramicrotomy for materials
and biological applications
10:00AM Ultramicrotomy of very hard specimens. Presentation and
discussion (Unity Semiconductor, Phil Swab)
11:00AM Practical demonstration of room temperature ultramicrotomy
12:00AM Lunch Break
1:00PM Hands-on workshop for room temperature ultramicrotomy
3:00PM Glass knife making demonstration and discussion on
ultramicrotomy knives
3:30PM Further hands-on room temperature ultramicrotomy
5:00PM Discussion of the days results


Sept. 14 (Friday), 2007
08:30 FIB specimen preparation of softmaterial and Tomography (FEI,
Richard Gursky)
09:30 High pressure freezing (Shriner Hospital, Doug Keene)
10:30 Practical cryoultramicrotomy demonstration
11:00 Hands-on cryoultramicrotomy
12:00 Lunch
1:00 Further hands-on cryoultramicrotomy
4:30 Discussion of cryoultramicrotomy results. Ultramicrotomy
problem solving.
5:00 Conclusion of workshop


Pre-registration Form
Although drop-in attendants are welcome, pre-registration is strongly
suggested for better coordination.
Name:
Affiliation: phone/e-mail:
Do you intend to bring in a sample for demonstration/training? Yes/No
Do you need parking? Yes/No
Please E-mail back to mazzio-at-pdx.edu or mail to
Portland State University, Department of Physics
Attn: Katherine Mazzio/Chunfei Li
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From: nizets2-at-yahoo.com
Date: Fri, 10 Aug 2007 06:10:15 -0500
Subject: [Microscopy] RE: question about EDX signal saturation

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Fri, 10 Aug 2007 06:10:15 -0500

Thank you Mary (and Austin too and all the others) for
your valuable opinion.
As someone pointed out, when I decrease the beam size
my signal immediately disappears under the noise in
BSE(i am at step 2 on a scale of 20). As for the "time
constant", I think on my SEM (it is a Tescan) it is
called "process time", I will check this parameter but
I don't think it will change much, I must keep it
quite high otherwise I lose the resolution of the
peaks (high process time=high dead time, lower counts
and better resolution). However it is probably the
main parameter I'll be able to modify.

I cannot change the apertures.

I could retract the detector, but it is immmobilized
in this position and I do not dare to do it. What do
you mean by "reenter the geometry of the EDX setup"?
Do you mean make a new calibration?

regards,

Stephane

--- Mary Fletcher {maryflet-at-interchange.ubc.ca} wrote:

} Dear Stephane,
} It is not a good idea to move the Z axis of the SEM
} stage for EDX, this will
} upset the geometry of the beam-detector system and
} affect quantitation.
} There are three possibilities: get an SDD detector,
} which is much more
} tolerant of high beam currents, use a higher
} condenser lens setting (smaller
} beam spot size) or a smaller final aperture, if your
} SEM has a movable final
} aperture. You could also move the EDX detector back
} along its track (retract
} it), which will change the solid angle but not the
} geometry. You may have to
} re-enter the geometry in the EDX setup if you do
} that.
} If you change the HT of the SEM, you may not detect
} all the elements.
} Good luck,
}
} Mary Fletcher (nee Mager)
} Electron Microscopist
} Materials Eng. UBC
} #309 - 6350 Stores Road
} Vancouver, B.C. V6T 1Z4
} Canada
} Tel: 604-822-5648
} Fax: 604-822-3619
} email: maryflet-at-interchange.ubc.ca
}
}
} -----Original Message-----
} From: nizets2-at-yahoo.com [mailto:nizets2-at-yahoo.com]
} Sent: August 9, 2007 5:54 AM
} To: maryflet-at-interchange.ubc.ca
} Subject: [Microscopy] question about EDX signal
} saturation
}
}
}
}
}
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}
} Hi all!
}
} I am having a too strong signal in EDX (in SEM).
} The dead time is usually between 70-80%.
} I wondered how I could reduce the signal without
} changing the HT.
} Changing the size of the beam is one way.
} Would it be wise to move the stage in the Z axis to
} be
} sub-optimal with respect to the EDX detector?
} Any other idea?
}
} Stephane
}
}
}
}
____________________________________________________________________________
} ________
} Got a little couch potato?
} Check out fun summer activities for kids.
}
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} saturation
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____________________________________________________________________________________
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From: David.Llewellyn-at-anu.edu.au
Date: Fri, 10 Aug 2007 08:42:12 -0500
Subject: [Microscopy] viaWWW: sloan thickness monitor DTM200

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Email: David.Llewellyn-at-anu.edu.au
Name: David Llewellyn

Organization: Australian National University

Title-Subject: [Filtered] sloan thickness monitor DTM200

Question: Hi all, would anyone have a manual for the thickness coater
complete with circuit diagrams, I need to carry out a fix on one of
these devices, thanks, David.

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6, 11 -- Subject: viaWWW: sloan thickness monitor DTM200
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From: modla-at-dbi.udel.edu
Date: Fri, 10 Aug 2007 08:42:40 -0500
Subject: [Microscopy] viaWWW: Beetle Cuticle for TEM

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Email: modla-at-dbi.udel.edu
Name: Shannon Modla

Organization: Delaware Biotechnology Institute

Title-Subject: [Filtered] Beetle Cuticle for TEM

Question: I am attempting to examine beetle cuticle (the wing cover)
by TEM but with limited success. In past efforts, I fixed the
cuticle overnight in 2.5% glutaraldehyde in sodium cacodylate buffer
and post-fixed it in 0.5% osmium tetroxide for 2 hours. Following a
standard dehydration in acetone, I slowly infiltrated in Spurr's over
the course of a week to ensure full penetration of the resin into the
cuticle. I was able to obtain ultrathin sections, but I could not
get them to completely flatten. I used both chloroform vapors and a
heat pen, but neither would flatten the sections completely.

I know that insect cuticle has a very elastic protein called resilin.
I've heard of people dissolving protein from the cuticle by using a
KOH solution. I thought that removing this protein could resolve the
wrinkle problem, but I am concerned that it would disrupt the
ultrastructure.

I was wondering if anyone has had any experience with processing
insect cuticle for the TEM and if they could offer any suggestions.

Any feedback would be greatly appreciated!


Sincerely,

Shannon Modla
Research Associate
Delaware Biotechnology Institute, BioImaging Center
15 Innovation Way
Newark, DE 19711


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From: teresa.boes-at-hp.com
Date: Fri, 10 Aug 2007 09:12:38 -0500
Subject: [Microscopy] viaWWW: Epoxy in ultra-high vacuum TEM

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Email: teresa.boes-at-hp.com
Name: Teresa Boes

Organization: Hewlett Packard

Title-Subject: [Filtered] Epoxy in ultra-high vacuum TEM

Question: We are occasionally using Epoxy Bond 110 and sometimes
M-Bond 610 to prepare samples and to attach wedge-polished sections
to TEM grids. After following the prescribed time and temperature
curves for curing, we ion mill and image in an ultra-high vacuum,
high resolution TEM. We have more beam contamination on
wedge-polished samples than on FIB prepared samples (our most usual
method of sample prep), and there is a small, but noticable
degredation in vacuum for about a week after imaging wedge-polished
samples. We are thinking the contamination and vacuum degredation
may be due to an incomplete cure of the epoxy.

Has anyone else had experience with having to adjust adhesive cure
times for ultra-high vacuum TEM work? Does anyone have a
recommendation for an epoxy that may cure more throughly and cause
less contamination? Also, we have always assumed that using as
little epoxy as possible is a good thing, but is there a minimum
volume necessary for the initiation of cross-linking during the cure?

Thanks for your help.

Teresa

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9, 11 -- Subject: viaWWW: Epoxy in ultra-high vacuum TEM
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From: kerem.uenal-at-uci.edu
Date: Fri, 10 Aug 2007 09:13:21 -0500
Subject: [Microscopy] viaWWW: two postdoctoral scholar positions at the UC Irvine

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Email: kerem.uenal-at-uci.edu
Name: Kerem Unal

Organization: UC Irvine

Title-Subject: [Filtered] two postdoctoral scholar positions at the UC Irvine

Question: Two postdoctoral scholar positions are open in the Prof.
Wickramasinghe Lab at the UC Irvine :

- One postdoctoral scholar in the general area of instrument
development with a strong background in optics
to assist with the development of novel instrumentation for
genome sequencing.

http://www.eng.uci.edu/node/1287

- One postdoctoral scholar in the general area of
microfabrication with strong background in micromechanics and
lithography
to assist in the development of micromechanical sensors for
novel genome sequencing devices.

http://www.eng.uci.edu/node/1286

Please send your curriculum vitae, a list of publications, and names
of at least three references to:

Professor H. Kumar Wickramasinghe
Department of Electrical Engineering and Computer Science
325 Engineering Tower
University of California, Irvine
Irvine, CA 92696-2175

Alternatively, materials may be submitted electronically to:
Professor H. Kumar Wickramasinghe at: hkwick-at-uci.edu


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From: xiaohutang-at-gmail.com
Date: Fri, 10 Aug 2007 09:14:08 -0500
Subject: [Microscopy] viaWWW: Thin film thickness measurement by SEM/EDX

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Email: xiaohutang-at-gmail.com
Name: Xiaohu Tang

Organization: Delft University of Technology

Title-Subject: [Filtered] Thin film thickness measurement by SEM/EDX

Question: Dear listeners,

I am trying to measure the thickness of Mo film (about 100nm) on Si
substrate by SEM/EDX and Wincasino simulation. From my understanding,
Wincasino can simulate a calibration curve of film thickness vs. the
x-ray peak ratio of Mo/Si with the same parameters used in experiment
(beam energy, TOA, etc.). The real thickness can be located on the
calibration curve based on the experimentally measured Mo/Si ratio.
It supposed to be an accurate method but I have two questions:

1. Is this method sensitive to the experiment settings (beam energy)
and how accurate is it?

2. In Wincasino, which x-ray intensity can be used for peak ratio
calculation, absorbed or non-absorbed intensity, or the difference of
them? I tried some measurements but they are not promising.

Please also correct me if the procedure I described is wrong.

Xiaohu

Microlab
Delft University of Technology

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From: maryflet-at-interchange.ubc.ca
Date: Fri, 10 Aug 2007 11:38:10 -0500
Subject: [Microscopy] viaWWW: Epoxy in ultra-high vacuum TEM

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Dear Teresa,
My experience in studying contamination in the SEM was that the
contamination was bad for three days after the electron beam hit and
"burned" or vapourized the epoxy around a sample. I don't think it was
incomplete cure, just that the energy of the beam was high enough to
disintegrate the epoxy and put the carbonaceous vapour all through the
chamber vacuum.
Using as small an amount as possible and keeping the epoxy away from the
beam would be my suggestion. Also, you need to mix enough of the components
to get the ratios correct and to allow thorough mixing. I find most of my
epoxy failures are because of inaccurate ratios or less that complete
mixing.
Good luck.

Mary Fletcher (nee Mager)
Electron Microscopist
Materials Eng. UBC
#309 - 6350 Stores Road
Vancouver, B.C. V6T 1Z4
Canada
Tel: 604-822-5648
Fax: 604-822-3619
email: maryflet-at-interchange.ubc.ca


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Email: teresa.boes-at-hp.com
Name: Teresa Boes

Organization: Hewlett Packard

Title-Subject: [Filtered] Epoxy in ultra-high vacuum TEM

Question: We are occasionally using Epoxy Bond 110 and sometimes
M-Bond 610 to prepare samples and to attach wedge-polished sections
to TEM grids. After following the prescribed time and temperature
curves for curing, we ion mill and image in an ultra-high vacuum,
high resolution TEM. We have more beam contamination on
wedge-polished samples than on FIB prepared samples (our most usual
method of sample prep), and there is a small, but noticable
degredation in vacuum for about a week after imaging wedge-polished
samples. We are thinking the contamination and vacuum degredation
may be due to an incomplete cure of the epoxy.

Has anyone else had experience with having to adjust adhesive cure
times for ultra-high vacuum TEM work? Does anyone have a
recommendation for an epoxy that may cure more throughly and cause
less contamination? Also, we have always assumed that using as
little epoxy as possible is a good thing, but is there a minimum
volume necessary for the initiation of cross-linking during the cure?

Thanks for your help.

Teresa

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From: donovan-at-uoregon.edu
Date: Fri, 10 Aug 2007 12:30:07 -0500
Subject: [Microscopy] Re: viaWWW: Thin film thickness measurement by

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http://www.microscopylistserver.com/MicroscopyListserver/MicroscopyArchives.html

Xiaohu,
If you only need thickness (not composition), this thickness is
perfect for x-ray reflectivity measurements and is very accurate
because it looks at the constructive/destructive interference pattern.
john

At 07:20 AM 8/10/2007, you wrote:



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6, 19 -- SEM/EDX
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From: nicholas.ritchie-at-nist.gov
Date: Fri, 10 Aug 2007 12:45:52 -0500
Subject: [Microscopy] Re: viaWWW: Thin film thickness measurement by SEM/EDX

Contents Retrieved from Microscopy Listserver Archives
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Be careful interpreting the results. Microanalytical experiments like
this measure the mass-thickness not the thickness. If you believe you
know the density of your film then you are ok and you can then calculate
the thickness. If the film density is different from you assumed
density (often bulk densities) then you may run into problems.

Nicholas Ritchie

xiaohutang-at-gmail.com wrote:
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}
} Email: xiaohutang-at-gmail.com
} Name: Xiaohu Tang
}
} Organization: Delft University of Technology
}
} Title-Subject: [Filtered] Thin film thickness measurement by SEM/EDX
}
} Question: Dear listeners,
}
} I am trying to measure the thickness of Mo film (about 100nm) on Si
} substrate by SEM/EDX and Wincasino simulation. From my understanding,
} Wincasino can simulate a calibration curve of film thickness vs. the
} x-ray peak ratio of Mo/Si with the same parameters used in experiment
} (beam energy, TOA, etc.). The real thickness can be located on the
} calibration curve based on the experimentally measured Mo/Si ratio.
} It supposed to be an accurate method but I have two questions:
}
} 1. Is this method sensitive to the experiment settings (beam energy)
} and how accurate is it?
}
} 2. In Wincasino, which x-ray intensity can be used for peak ratio
} calculation, absorbed or non-absorbed intensity, or the difference of
} them? I tried some measurements but they are not promising.
}
} Please also correct me if the procedure I described is wrong.
}
} Xiaohu
}
} Microlab
} Delft University of Technology
}
} ---------------------------------------------------------------------------
}
} ==============================Original Headers==============================
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}



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From: peter.tomic-at-renwireless.com
Date: Fri, 10 Aug 2007 15:23:33 -0500
Subject: [Microscopy] viaWWW: Measuring Film Thickness With EDX

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopylistserver.com/MicroscopyListserver/MicroscopyArchives.html


Xiaohu,

If I may ask a question, why do you want to measure film thickness
using EDX when you can simply take a cross-section and image it? It
seems like a long route to the answer, and it won't be very reliable
for all the reasons stated on the list. Is this just an experiment
or do you plan on using EDX as a method for process control of some
kind?

Peter



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Email: peter.tomic-at-renwireless.com
Name: Peter Tomic

Title-Subject: [Filtered] Measuring Film Thickness With EDX

Question: Question: Dear listeners,
}
} I am trying to measure the thickness of Mo film (about 100nm) on Si
} substrate by SEM/EDX and Wincasino simulation. From my understanding,
} Wincasino can simulate a calibration curve of film thickness vs. the
} x-ray peak ratio of Mo/Si with the same parameters used in experiment
} (beam energy, TOA, etc.). The real thickness can be located on the
} calibration curve based on the experimentally measured Mo/Si ratio.
} It supposed to be an accurate method but I have two questions:
}
} 1. Is this method sensitive to the experiment settings (beam energy)
} and how accurate is it?
}
} 2. In Wincasino, which x-ray intensity can be used for peak ratio
} calculation, absorbed or non-absorbed intensity, or the difference of
} them? I tried some measurements but they are not promising.
}
} Please also correct me if the procedure I described is wrong.
}
} Xiaohu

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From: Walck-at-SouthBayTech.com
Date: Sat, 11 Aug 2007 01:46:18 -0500
Subject: [Microscopy] Re: viaWWW: Epoxy in ultra-high vacuum TEM

Contents Retrieved from Microscopy Listserver Archives
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Teresa,
I have not used the Epoxy Bond 110. I have used the M-Bond 610 and I
don't like it for a number of reasons, but primarily because of its shelf
life and the need to be refrigerated. I prefer the Epoxy Technology
EpoTek 353ND (www.epotek.com). My trick to make sure that my cross
sections are completely cured is to put a drop of epoxy on each Teflon®
jaw of my vise that I place on my hot plate. When the drop hardens, I put
another drop on the other end of the jaws and wait for those to harden.
Then I know that the epoxy that I used is fully cured. It takes longer,
but I absolutely know that it is cured.

I suspect that you are right and that you are not getting a full cure. I
can't imagine that there is enough material that you expose to the beam to
cause a noticeable degradation of the vacuum. Besides, the beam would
have a tendency to polymerize anything that it hits into a carbonaceous
junk.


-Scott

Scott Walck, Ph.D.
Technical Director
South Bay Technology, Inc.
1120 Via Calejon
San Clemente, CA 92673

1-800-728-2233
www.SouthBayTech.com
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} Email: teresa.boes-at-hp.com
} Name: Teresa Boes
}
} Organization: Hewlett Packard
}
} Title-Subject: [Filtered] Epoxy in ultra-high vacuum TEM
}
} Question: We are occasionally using Epoxy Bond 110 and sometimes
} M-Bond 610 to prepare samples and to attach wedge-polished sections
} to TEM grids. After following the prescribed time and temperature
} curves for curing, we ion mill and image in an ultra-high vacuum,
} high resolution TEM. We have more beam contamination on
} wedge-polished samples than on FIB prepared samples (our most usual
} method of sample prep), and there is a small, but noticable
} degredation in vacuum for about a week after imaging wedge-polished
} samples. We are thinking the contamination and vacuum degredation
} may be due to an incomplete cure of the epoxy.
}
} Has anyone else had experience with having to adjust adhesive cure
} times for ultra-high vacuum TEM work? Does anyone have a
} recommendation for an epoxy that may cure more throughly and cause
} less contamination? Also, we have always assumed that using as
} little epoxy as possible is a good thing, but is there a minimum
} volume necessary for the initiation of cross-linking during the cure?
}
} Thanks for your help.
}
} Teresa
}
} ---------------------------------------------------------------------------
}
} ==============================Original
} Headers==============================
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}





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From: kraftpiano-at-gmail.com
Date: Sat, 11 Aug 2007 08:28:38 -0500
Subject: [Microscopy] JEOL Beam Interceptor wiring

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopylistserver.com/MicroscopyListserver/MicroscopyArchives.html

I've got the JSM-35 put together, but I have one last component to
connect. It is a "JEOL Beam Interceptor" made by Krisel Control, Inc.
It is a digital picoammeter which connects to a black solenoid that
inserts a Faraday cup directly under the beam to measure beam current.
It has three connectors on the back, labeled "J1-Power" "J2- Beam
Current" and "J3- Sample Current."

I have a cable that goes to the J2-Beam Current connector, and this
cable goes to a small box with a switch on it, which in turn connects
to the solenoid and Faraday cup. Can anyone tell me where the power
cable connects to? I have a bunch of the blue "Stick and twist" cable
connectors that I can make a cable with, but I need to know where to
get the power from, or at least what voltage to use.

The "Sample current" plug is actually using four wires, so I'm not
entirely sure how to convert that to connect to the insulated plug on
the outside of the chamber door. Again, a pinout or reference would
be greatly appreciated.

Thank you,

Justin A. Kraft

==============================Original Headers==============================
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From: ZAMTM-at-AOL.COM
Date: Sat, 11 Aug 2007 11:16:47 -0500
Subject: [Microscopy] AskAMicroscopist: Light microscope/digital image camera?

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This Question was submitted to Ask-A-Microscopist by (ZAMTM-at-AOL.COM)
from http://www.microscopy.org/Ask-A-Microscopist/Ask-A-Microscopist.html on Saturday, August 11, 2007 at 10:50:35
Remember to consider the Grade/Age of the student when considering the Question
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Email: ZAMTM-at-AOL.COM
Name: Michael T. Masnik

Organization: Hobbist

Education: Graduate College

Location: Vienna, VA 22180 USA

Title: Light microscope/digital image

Question: I have over the past couple of years amassed a AO Series 10 phase contrast microscope that gives a great image. I would like to hook it up to a digital camera (I have a triocular head) and be able to download images to my PC. I am an aquatic ecologist and interested in images of aquatic microorganisms. I am at a loss as to what kind, resolution, manufacturer to approach for the digital camera. I want to spend no more than 2 to 3 hundred dollars for the camera an software. Any recommendations, any articles that might help me decide?

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From: cammer-at-aecom.yu.edu
Date: Sat, 11 Aug 2007 11:26:35 -0500
Subject: [Microscopy] recovery after a fire

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopylistserver.com/MicroscopyListserver/MicroscopyArchives.html

There was a serious electrical fire in rooms adjacent to our laboratory.
None of our equipment was damaged by heat, water, powder or foam, but many
of our electrical and optical components ranging from high end lasers to
microscopes and cameras etc. were essentially submerged in a sea of smoke,
fumes and soot to varying degrees.

If anybody has personal experience with this, would you please email me
off-list or could we please set up a telephone call to discuss how you
dealt with this problem.

Thank you.

-Michael


_________________________________________
Michael Cammer http://www.aecom.yu.edu/aif/



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From: gwe-at-ufl.edu
Date: Sun, 12 Aug 2007 12:47:46 -0500
Subject: [Microscopy] MSA Tutorial DVDs - Prices Slashed

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopylistserver.com/MicroscopyListserver/MicroscopyArchives.html

The MSA Education Committee has reduced the prices on all Tutorial
DVDs. They are now priced at $8.00 for older ones and $15.00 for more
recent issues.
Get 'em while they are hot! The current catalog can be viewed at :
http://www.msa.microscopy.org/MSAUnits/Education/VideoCatalogue.html
--
Greg Erdos
University of Florida, Retired
Micanopy, Florida

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From: glenmac-at-u.washington.edu
Date: Sun, 12 Aug 2007 17:49:31 -0500
Subject: [Microscopy] Osram vs Ushio

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopylistserver.com/MicroscopyListserver/MicroscopyArchives.html

Hello,
Does anyone have data or experience comparing the Osram 103W2 mercury
bulb to the Ushio 102D with regards to excitation of GFP?

Thanks,
Glen


Glen MacDonald
Core for Communication Research
Virginia Merrill Bloedel Hearing Research Center
Box 357923
University of Washington
Seattle, WA 98195-7923 USA
(206) 616-4156
glenmac-at-u.washington.edu

************************************************************************
******
The box said "Requires WindowsXP or better", so I bought a Macintosh.
************************************************************************
******



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From: ab78-at-esc.cam.ac.uk
Date: Mon, 13 Aug 2007 04:05:03 -0500
Subject: [Microscopy] Re: recovery after a fire

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopylistserver.com/MicroscopyListserver/MicroscopyArchives.html

Insurance ?

When this happened to one of our labs we called the equipment
manufacturers, arranged to ship the stuff back to them and they cleaned
up the internals. It seemed that it was a standard procedure for them. A
particular concern was that smoke/soot deposits might lead to electrical
short circuits.

All covered by the fire insurance.



cammer-at-aecom.yu.edu wrote:
} ----------------------------------------------------------------------------
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} There was a serious electrical fire in rooms adjacent to our laboratory.
} None of our equipment was damaged by heat, water, powder or foam, but many
} of our electrical and optical components ranging from high end lasers to
} microscopes and cameras etc. were essentially submerged in a sea of smoke,
} fumes and soot to varying degrees.
}
} If anybody has personal experience with this, would you please email me
} off-list or could we please set up a telephone call to discuss how you
} dealt with this problem.
}
} Thank you.
}
} -Michael
}
}
} _________________________________________
} Michael Cammer http://www.aecom.yu.edu/aif/
}
}
}
} ==============================Original Headers==============================
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--
AB78-at-ESC.CAM.AC.UK
DEPARTMENT OF EARTH SCIENCES
UNIVERSITY OF CAMBRIDGE Tel +44 1223 333469
DOWNING STREET +44 1223 333400
CAMBRIDGE FAX +44 1223 333450
CB2 3EQ

Manager of XRD discussion list:
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VirtualWDS: For the synthesis of wavelength-dispersive electron probe
spectra.
http://www.esc.cam.ac.uk/astaff/buckley/VirtualWDS.html

==============================Original Headers==============================
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From: edelmare-at-muohio.edu
Date: Mon, 13 Aug 2007 10:14:58 -0500
Subject: [Microscopy] Re: Freezing 4489 Film

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopylistserver.com/MicroscopyListserver/MicroscopyArchives.html

Ralph:

We freeze 4489 all the time. Been doing it for decades with out a
problem. Have not noticed any issues with any of the "Re-
formulations" (that are sensitive to developing issues). As for
condensation the 4489 comes vacuum packed in mylar bags (50/sheets
per package), allow them to come to room temp before opening
(Completely including the middle of the stack not just the surfaces).

(Remember 4489 must be developed with gas burst agitation).


On 3 Aug 2007 at 11:47, rcommon-at-msu.edu wrote:

}
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} Does anyone have experience freezing 4489 TEM film for long-term storage? I
} have stored many types of film at -20C with no problems, but haven't tried
} it with 4489. Can this cause condensation or other problems?
}
} Ralph Common
} Michigan State University
}
}
} ==============================Original Headers==============================
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Richard E. Edelmann, Ph.D.
EXPO Editor, Microscopy and Microanalysis Supplement
Electron Microscopy Facility Director
364 Pearson Hall
Miami University, Oxford, OH 45056
Ph: 513.529.5712 Fax: 513.529.4243
E-mail: edelmare-at-muohio.edu
http://www.emf.muohio.edu


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From: slc6-at-lehigh.edu
Date: Mon, 13 Aug 2007 18:01:11 -0500
Subject: [Microscopy] viaWWW: Faculty Position in Analytical Electron Microscopy Lehigh

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopylistserver.com/MicroscopyListserver/MicroscopyArchives.html

Thanks to all who responded. After receiving answers we went back
and beat on Image-J again, and figgured out our mistakes.


Richard E. Edelmann, Ph.D.
EXPO Editor, Microscopy and Microanalysis Supplement
Electron Microscopy Facility Director
364 Pearson Hall
Miami University, Oxford, OH 45056
Ph: 513.529.5712 Fax: 513.529.4243
E-mail: edelmare-at-muohio.edu
http://www.emf.muohio.edu


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From awhitake-at-columbus.rr.com Mon Aug 13 14:39:27 2007
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Email: slc6-at-lehigh.edu
Name: Sharon Coe

Organization: Lehigh University Department of Materials Science & Engineering

Title-Subject: [Filtered] Faculty Position in Analytical Electron Microscopy Lehigh University

Question: Lehigh University (Bethlehem, PA) seeks to fill a tenure track position at the level of Assistant or Associate Professor in Materials Science and Engineering. The department is searching for an outstanding individual who develops new analytical electron microscopy (AEM) techniques and applies these methodologies to solve cutting edge nanocharacterization problems in the fields of Materials Science, Nanotechnology or Electronic Materials. An earned doctorate is required, as well as demonstrated ability in teaching and research. The successful candidate will be responsible for teaching undergraduate and graduate courses in the Materials Science and Engineering curriculum, and establishing a vibrant, high-quality research program. This will include participation in multidisciplinary activities such as those coordinated by the Center for Advanced Materials and Nanotechnology, the International Materials Institute for New Functionality in Glasses, the Sherman Fairchild Center for Solid State Physics, and the Center for Optical Technologies. The Nanocharacterization Laboratory at Lehigh University has an excellent suite of electron-optical instrumentation (www.lehigh.edu/~inmicro) including two state-of-the-art aberration corrected analytical electron microscopes, and is home to the world renowned Lehigh Microscopy School. The successful applicant would be expected to provide leadership in the area of aberration corrected AEM and to champion its application to the study of interfaces on the nanoscale. A strong desire to perform interdisciplinary research and a willingness to collaborate across departmental boundaries are essential. Please submit a CV by October 30, 2007, along with a Teaching Proposal describing instructional philosophy and interests at undergraduate and graduate levels, and a 3-6 page Research Proposal describing an externally fundable research program, to Sharon Coe, Lehigh University, 5 E. Packer Ave., Bethlehem, PA 18015-3195. Lehigh is committed to recruiting, retaining and !
tenuring
women and members of minority groups.

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From: xiaohutang-at-gmail.com
Date: Tue, 14 Aug 2007 07:45:05 -0500
Subject: [Microscopy] viaWWW: Secondary electron yield detection

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Email: xiaohutang-at-gmail.com
Name: Xiaohu Tang

Organization: TU Delft

Title-Subject: [Filtered] Secondary electron yield detection

Question: Hello Listeners,

Here I want to in-situ monitor the secondary electron yield under e-beam irradiation. Could anybody recommend one such SE detector or instrument with such function? Another question is what the extent of gas pressure change (say, changes from 10E-6 to 10E-8mbar) affects SE yield and the detector readings. Thank you.

Regards,

Xiaohu

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From: eschumacher-at-mccrone.com
Date: Tue, 14 Aug 2007 08:32:20 -0500
Subject: [Microscopy] Short Course Announcement: TEM and SEM

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopylistserver.com/MicroscopyListserver/MicroscopyArchives.html

Greetings Colleagues,

The College of Microscopy located in Westmont, IL will be offering the
following electron microscopy short courses this fall:

September 25-27 - Transmission Electron Microscopy

October 15-19 - Scanning Electron Microscopy

In addition to lectures, these courses emphasize hands-on training using
state of the art equipment. For further details and registration
information, please follow the link below.

www.collegeofmicroscopy.com


Elaine Schumacher
Senior Research Scientist
McCrone Associates, Inc.
850 Pasquinelli Drive
Westmont, IL 60559-5539 USA
630-887-7100 (tel)
630-887-7417 (fax)
E-mail: eschumacher-at-mccrone.com
Web Site: www.mccrone.com




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From: voyles-at-engr.wisc.edu
Date: Tue, 14 Aug 2007 20:44:17 -0500
Subject: [Microscopy] database of teaching examples for TEM and STEM

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopylistserver.com/MicroscopyListserver/MicroscopyArchives.html

Dear Colleagues,

I have begun to build a database of examples for use in teaching TEM and
STEM. This project grew out of my need for classroom and homework
examples from techniques that I do not employ in my own research. My
hobby-horse that TEM measurements should be treated as data, not just
pictures, left me unsatisfied with scanning images out of journals, and
the result is now on the web at

http://tem.msae.wisc.edu/emdb/

Please take a look. The coverage at the moment is limited to
materials-oriented TEM and STEM, since those are my areas of expertise,
and remains spotty even within that realm. I therefor also appeal for
contributions to the database, especially interesting EDS spectra and
diffraction contrast images of crystal defects. For those of you in the
US, this is an easy way to leverage "broader impact" from your
NSF-funded research: simply send me an interesting but unpublished
example from your research. Instructions on how to contribute are on
the web site under "About EMdb".

When you access the database, you will be asked for your email address.
This is used only as an easy-to-remember unique identifier so that I
can do some rudimentary tracking of the database use for the purpose of
reporting to NSF.

Please direct any questions, comments, and contributions to me.

Best wishes,
Paul Voyles

Paul Voyles
Materials Science and Engineering
University of Wisconsin, Madison
1509 University Ave, Rm 223
Madison, WI 53706-1595
voice: (608) 265-6740
fax: (608) 262-8353
voyles-at-engr.wisc.edu
http://tem.msae.wisc.edu

==============================Original Headers==============================
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From: reznik-at-ict.uni-karlsruhe.de
Date: Wed, 15 Aug 2007 08:26:15 -0500
Subject: [Microscopy] viaWWW: FFT_Software

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Email: reznik-at-ict.uni-karlsruhe.de
Name: Boris Reznik

Organization: University of Karlsruhe,Germany

Title-Subject: [Filtered] FFT_Software

Question: I am looking for a simple free-software allowing FFT-Analysis of HRTEM images. Any recommendations that might help me?
Thank you


---------------------------------------------------------------------------

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From: Elliott-at-arizona.edu
Date: Wed, 15 Aug 2007 09:23:11 -0500
Subject: [Microscopy] Re: viaWWW: FFT_Software

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopylistserver.com/MicroscopyListserver/MicroscopyArchives.html

Depending on what you want to do, NIH image will do FFT.
The price is right!
David


On Aug 15, 2007, at 6:30 AM, reznik-at-ict.uni-karlsruhe.de wrote:

}
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} Email: reznik-at-ict.uni-karlsruhe.de
} Name: Boris Reznik
}
} Organization: University of Karlsruhe,Germany
}
} Title-Subject: [Filtered] FFT_Software
}
} Question: I am looking for a simple free-software allowing FFT-
} Analysis of HRTEM images. Any recommendations that might help me?
} Thank you
}
}
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} -----
}
} ==============================Original
} Headers==============================
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From: gmartens-at-interchange.ubc.ca
Date: Wed, 15 Aug 2007 12:49:37 -0500
Subject: [Microscopy] equipment for sale

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopylistserver.com/MicroscopyListserver/MicroscopyArchives.html

Hey everyone,

We are continuing to purge some of our non-used equipment and have
the following items available for sale.

1. 3 Reichert OM3 ultramicrotomes, still in great shape and fully functional.
2. 1 Reichert OM2 ultramicrotome, still in great shape and fully functional
3. 1 Sorvall ultramicrotome
4. 1 Spencer 820 microtome, great for thick sections on resins like JB4
5. a variety of compound microscopes for sale (mostly Zeiss) and a
variety of lenses to accompany
6. we still have the beautiful orange Zeiss EM10C for sale. With it
comes a second 10C to be used for parts. A great deal at only $10K
(canadian dollars to boot), no it does not include shipping.

Look for more great deals in the near future. Give me a call
604-822-3354 for prices and a list of the compound scopes for sale.


--
Garnet Martens

Research Manager
BioImaging Facility
University of British Columbia
6270 University Blvd.
Vancouver, B.C.
Canada
V6T 1Z4

phone 604-822-3354

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From: ph2-at-sprynet.com
Date: Thu, 16 Aug 2007 00:48:08 -0500
Subject: [Microscopy] FYI - Nanotechnology Research Spurs Growth in the Global Microscopes Market

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopylistserver.com/MicroscopyListserver/MicroscopyArchives.html

I meant to send this earlier.

Just an FYI.

Nanotechnology Research Spurs Growth in the Global Microscopes Market
Source:PRNewswire
Author:n/a

Global consulting firm Frost & Sullivan has released new analysis indicating
that nanotechnology applications in bioscience and material science research
are likely to increase demand for microscopic imaging and analysis systems
and contribute to a rise in the global microscope market's revenues from
US$1.87 billion in 2006 to US$3.54 billion in 2013. Frost & Sullivan
research analyst Lakshman Koundinya said: "With the continued
miniaturization of semiconductors and electronicproducts, there exists a
growing need for easier and more accurate material inspection. Consequently,
there has been a significant increase in funds allocated for research into
fields such as nanotechnology and nanosciences, thereby creating significant
demand opportunities for microscopes." The article says growth in the
microscope market, however, is limited by a lack of technological innovation
and other factors that have resulted in the rise of other analytical
techniques. The article also says that high cost of manufacturing and
significant research and development investment requirements can create
barriers to entry in the microscope market. Koundinya said: "Since financial
limitations hamper manufacturers' response to the industry's continued
technology advancements, consolidation in certain industries such as the
disk drive industry has resulted in fewer manufacturers with high financial
stability." The article says that manufacturers must create more
user-friendly and easy to operate microscopes in order to compensate for a
decline in technical expertise. The article can be viewed online at the link
below.

http://www.advancedimagingpro.com/online/article.jsp?siteSection=3&id=4284


Tony

......................................................................
Andrew Anthony "Tony" Havics, CHMM, CIH, PE
pH2, LLC
5250 E US 36, Suite 830
Avon, IN 46123
(317) 718-7020 off
(317) 718-7038 fax
(317) 409-3238 cell

90% of Risk Management is knowing where to place the decimal point...any
consultant can give you the other 10%(SM)

This message is from pH2. This message and any attachments may contain
legally privileged or confidential information, and are intended only for
the individual or entity identified above as the addressee. If you are not
the addressee, or if this message has been addressed to you in error, you
are not authorized to read, copy, or distribute this message and any
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the sender, which are not to be attributed to pH2 and may not be copied or
distributed without this statement.




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From: kraftpiano-at-gmail.com
Date: Thu, 16 Aug 2007 06:49:34 -0500
Subject: [Microscopy] Polarizing microscope recommendation.

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopylistserver.com/MicroscopyListserver/MicroscopyArchives.html

I am looking for a reasonably priced, reasonable quality polarizing
microscope to round out my equipment for my class. Right now I have a
quote for a Leica DM EP, but I thought I'd ask if anyone has a
recommendation on other brands that have relatively good optics.

I am also looking for a reasonable digital camera to use for the
purpose of sharing live microscope images via a data projector. Any
recommendations on models there would be helpful as well. I've looked
into the Kenavision scope cameras, but I've heard that the goose neck
stand can be a little unwieldy at times.

I'm trying to get the best balance between budget and quality. I
don't want an instrument that is cheaply made (As a good portion of
the "school grade" microscopes are) but I don't want to break the bank
on a $9K instrument.

Thanks in advance for your recommendations,

Justin A. Kraft

==============================Original Headers==============================
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5, 26 -- Subject: Polarizing microscope recommendation.
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From: maloneyb-at-fiu.edu
Date: Thu, 16 Aug 2007 07:35:53 -0500
Subject: [Microscopy] Need of evaluation of two instruments - TEM and SEM

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopylistserver.com/MicroscopyListserver/MicroscopyArchives.html

Dear Group: does anyone know somebody up in the Savannah area that
would be able to give us a value of two instruments that will be given
as a tax donation? Currently both instruments are not running. Please
contact me ASAP, via email redsponger-at-yahoo.com or call me on my cell
(954) 401-4542. Thanks so much,

1. JEOL JEM 1200EX II - TEM
2. ISI DS-130S - SEM w/PGT EDS and Image Analysis System

Barbara Maloney
FIU/FCAEM
11200 SW 8th Street
PC50
Miami, FL 33199
(305) 348-2714
Fax (305) 348-3580


==============================Original Headers==============================
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From: maloneyb-at-fiu.edu
Date: Thu, 16 Aug 2007 07:59:59 -0500
Subject: [Microscopy] Need an evaluation of a TEM and SEM in the Savannah, Georgia area

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopylistserver.com/MicroscopyListserver/MicroscopyArchives.html

Dear Group: does anyone know somebody up in the Savannah area that
would be able to give us a value of two instruments that will be given
as a tax donation after viewing the instruments? Currently both instruments are not running. Please
contact me ASAP, via email redsponger-at-yahoo.com or call me on my cell
(954) 401-4542. Thanks so much,

1. JEOL JEM 1200EX II - TEM
2. ISI DS-130S - SEM w/PGT EDS and Image Analysis System

Barbara Maloney
FIU/FCAEM
11200 SW 8th Street
PC50
Miami, FL 33199
(305) 348-2714
Fax (305) 348-3580


==============================Original Headers==============================
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From: opto-at-klughammer.de
Date: Thu, 16 Aug 2007 08:02:59 -0500
Subject: [Microscopy] Re: Polarizing microscope recommendation.

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopylistserver.com/MicroscopyListserver/MicroscopyArchives.html

Dear Justin,

have a look at Meiji microscopes (japanese brand) and Lumenera
Infinitiy cameras. Both have very good quality and the price is mid
ranged.

If you need more information you can contact me off-line.

Regards
Anneliese
opto-at-klughammer.de

2007/8/16, kraftpiano-at-gmail.com {kraftpiano-at-gmail.com} :
}
}
}
} ----------------------------------------------------------------------------
} The Microscopy ListServer -- CoSponsor: The Microscopy Society of America
} To Subscribe/Unsubscribe -- http://www.microscopy.com/MicroscopyListserver
} On-Line Help http://www.microscopy.com/MicroscopyListserver/FAQ.html
} ----------------------------------------------------------------------------
}
} I am looking for a reasonably priced, reasonable quality polarizing
} microscope to round out my equipment for my class. Right now I have a
} quote for a Leica DM EP, but I thought I'd ask if anyone has a
} recommendation on other brands that have relatively good optics.
}
} I am also looking for a reasonable digital camera to use for the
} purpose of sharing live microscope images via a data projector. Any
} recommendations on models there would be helpful as well. I've looked
} into the Kenavision scope cameras, but I've heard that the goose neck
} stand can be a little unwieldy at times.
}
} I'm trying to get the best balance between budget and quality. I
} don't want an instrument that is cheaply made (As a good portion of
} the "school grade" microscopes are) but I don't want to break the bank
} on a $9K instrument.
}
} Thanks in advance for your recommendations,
}
} Justin A. Kraft
}
} ==============================Original Headers==============================
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} 5, 26 -- Date: Thu, 16 Aug 2007 07:52:34 -0400
} 5, 26 -- From: "Justin Kraft" {kraftpiano-at-gmail.com}
} 5, 26 -- To: microscopy-at-microscopy.com
} 5, 26 -- Subject: Polarizing microscope recommendation.
} 5, 26 -- MIME-Version: 1.0
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} ==============================End of - Headers==============================
}


--
Anneliese Schmaus
Product Manager
________________________
Klughammer Industrie GmbH
Strassbach 9
85229 Markt Indersdorf

Tel. +49 (0)8136 6011
Fax +49 (0)8136 7098
opto-at-klughammer.de

Amtsgericht München HRB 101952
Geschäftsführer Anna E. Schmaus-Klughammer





Anneliese Schmaus
Product Manager
____________________
Klughammer Bio GmbH
Strassbach 9
85229 Markt Indersdorf

Tel. +49 (0)8136 6011
Fax +49 (0)8136 7098
opto-at-klughammer.de

Amtsgericht München HRB 89767
Geschäftsführer Anna E. Schmaus-Klughammer


==============================Original Headers==============================
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From: gary.m.brown-at-exxonmobil.com
Date: Thu, 16 Aug 2007 09:31:19 -0500
Subject: [Microscopy] Polarizing microscope recommendation.

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopylistserver.com/MicroscopyListserver/MicroscopyArchives.html

Justin,

I suggest you contact John Mackenzie at North Carolina State University for
suggestions on cameras. He is a wealth of information on all aspects of
digital imaging. See his address in copy list.

Best regards,

Gary M. Brown
Microscopy Specialist
ExxonMobil Chemical Company
Baytown Technology & Engineering - West
5200 Bayway Drive
Baytown, Texas 77520-2101
phone: 281 834 2387
fax: 281 834 2395
e-mail: Gary.M.Brown-at-ExxonMobil.com

"Happiness equals reality minus expectations." Tom Magliozzi





opto-at-klughamme
r.de
To
gary.m.brown-at-exxonmobil.com
08/16/07 08:06 cc
AM
Subject
[Microscopy] Re: Polarizing
Please respond microscope recommendation.
to
opto-at-klughamme
r.de











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Dear Justin,

have a look at Meiji microscopes (japanese brand) and Lumenera
Infinitiy cameras. Both have very good quality and the price is mid
ranged.

If you need more information you can contact me off-line.

Regards
Anneliese
opto-at-klughammer.de

2007/8/16, kraftpiano-at-gmail.com {kraftpiano-at-gmail.com} :
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}
} I am looking for a reasonably priced, reasonable quality polarizing
} microscope to round out my equipment for my class. Right now I have a
} quote for a Leica DM EP, but I thought I'd ask if anyone has a
} recommendation on other brands that have relatively good optics.
}
} I am also looking for a reasonable digital camera to use for the
} purpose of sharing live microscope images via a data projector. Any
} recommendations on models there would be helpful as well. I've looked
} into the Kenavision scope cameras, but I've heard that the goose neck
} stand can be a little unwieldy at times.
}
} I'm trying to get the best balance between budget and quality. I
} don't want an instrument that is cheaply made (As a good portion of
} the "school grade" microscopes are) but I don't want to break the bank
} on a $9K instrument.
}
} Thanks in advance for your recommendations,
}
} Justin A. Kraft
}
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--
Anneliese Schmaus
Product Manager
________________________
Klughammer Industrie GmbH
Strassbach 9
85229 Markt Indersdorf

Tel. +49 (0)8136 6011
Fax +49 (0)8136 7098
opto-at-klughammer.de

Amtsgericht München HRB 101952
Geschäftsführer Anna E. Schmaus-Klughammer





Anneliese Schmaus
Product Manager
____________________
Klughammer Bio GmbH
Strassbach 9
85229 Markt Indersdorf

Tel. +49 (0)8136 6011
Fax +49 (0)8136 7098
opto-at-klughammer.de

Amtsgericht München HRB 89767
Geschäftsführer Anna E. Schmaus-Klughammer


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49, 22 -- Subject: Re: [Microscopy] Re: Polarizing microscope recommendation.
49, 22 -- Importance:
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From: maloneyb-at-fiu.edu
Date: Thu, 16 Aug 2007 11:31:41 -0500
Subject: [Microscopy] Evaluation of instruments

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopylistserver.com/MicroscopyListserver/MicroscopyArchives.html

We have done this inexpensively (~$2.00) by buying sheets of
polarizing material from Edmunds Scientific. We cut a square that we
mount on the condenser, and a circle that we insert somewhere in the
light path. You then rotate the condenser polarizer until you get
extinction. Unless you want more sophistication, this works quite
well for things like crystalline materials and even muscle fibers.
It does suck up light though.

Joel


Date sent: Thu, 16 Aug 2007 06:49:42 -0500
To: jbs-at-temple.edu
X-from: kraftpiano-at-gmail.com
Send reply to: kraftpiano-at-gmail.com

Dear Group - thanks so much for your quick responses - I have found
someone to do this.
Thanks so much.
Barbara




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From: xin-at-magnet.fsu.edu
Date: Thu, 16 Aug 2007 14:42:14 -0500
Subject: [Microscopy] recommendation for a UPS

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopylistserver.com/MicroscopyListserver/MicroscopyArchives.html

Hi,

We are in need of an uninterrupted power system(UPS) for our high-end
Field Emission SEM.

I would appreciate if anyone could suggest a good one with reasonable
price. The main purpose of the UPS for us is to keep the SEM running
when there is a power outage.

Thanks

Yan Xin
NHMFL/FSU
Tallahassee, FL


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From: gary-at-gaugler.com
Date: Thu, 16 Aug 2007 15:19:57 -0500
Subject: [Microscopy] Re: recommendation for a UPS

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopylistserver.com/MicroscopyListserver/MicroscopyArchives.html

I highly recommend Liebert Nfinity double conversion
UPS. These can have redundant conversion modules
(4KVA each) and redundant control modules. At a
full load of batteries, each unit (I have two identical
units) has a backup run time of 288 minutes at 22%
load. SEM, EDS, EBSD, other PCs are on one unit.
Chiller and air compressor are on another unit.

Loaded, each unit costs about $10K and are well worth it.
No sag, no drop outs, no sweat. They can also be monitored
via HTTP web browser.

gary g.


At 11:47 AM 8/16/2007, you wrote:




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From: Andrew.Bowling-at-ARS.USDA.GOV
Date: Thu, 16 Aug 2007 15:39:22 -0500
Subject: [Microscopy] SEM image acquisition hardware recommendations

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopylistserver.com/MicroscopyListserver/MicroscopyArchives.html

Hello listers,

We have an older JEOL 840 SEM with a Kevex Sigma setup that we use to
acquire digital images. This system seems to have broken - the images
on the compter are distorted and noisy, so we want to replace it. Do
any of you have opinions as to what system we should get (or not)? We
just need digital imaging capability on this instrument - we're not
looking to get the EDX back up.

Thanks in advance,

Andy Bowling


==============================Original Headers==============================
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From: bozzola-at-siu.edu
Date: Thu, 16 Aug 2007 15:56:00 -0500
Subject: [Microscopy] Re: SEM image acquisition hardware recommendations

Contents Retrieved from Microscopy Listserver Archives
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We've been very pleased with our 4pi system on our older Hitachi S570 SEM.


} We have an older JEOL 840 SEM with a Kevex Sigma setup that we use to
} acquire digital images. This system seems to have broken - the images
} on the compter are distorted and noisy, so we want to replace it. Do
} any of you have opinions as to what system we should get (or not)? We
} just need digital imaging capability on this instrument - we're not
} looking to get the EDX back up.

--
+++++++++++++++++++++++++++++++++++++++++++++++++++++++

John J. Bozzola, Ph.D., Director
Integrated Microscopy & Graphics Expertise (IMAGE)
Southern Illinois University
750 Communications Drive - MC 4402
Carbondale, IL 62901
Telephone: 618-453-3730

+++++++++++++++++++++++++++++++++++++++++++++++++++++++

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From: sirapa-at-optonline.net
Date: Thu, 16 Aug 2007 22:04:36 -0500
Subject: [Microscopy] viaWWW: Metal Samples for Light Microscopy

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Email: sirapa-at-optonline.net
Name: Alan Paris

Organization: Leica Microsystems

Title-Subject: [Filtered] Metal Samples for Microscopy

Question: I am looking to purchase a set of reference polished metal samples for reflected light microscopy.

Can anyone refer me to a source?
Thank you

---------------------------------------------------------------------------

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From: alternate.questions-at-gmail.com
Date: Thu, 16 Aug 2007 22:04:59 -0500
Subject: [Microscopy] viaWWW: MITOS IN PRP

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Email: alternate.questions-at-gmail.com
Name: Simcha

Title-Subject: [Filtered] MITOS IN PRP

Question: Hi All:
I am attempting to stain mitochondria from PRP (using CD41 to stain platelets and looking for an efficient stain for the mitos). Any ideas what to use for minimum background and maximum affinity/efficiency?


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From: dljones-at-bestweb.net
Date: Fri, 17 Aug 2007 07:57:00 -0500
Subject: [Microscopy] Re: viaWWW: Metal Samples for Light Microscopy

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Alan,

I wish I could answer your question. I'd like to know myself. Buehler used
to make some very nice sets, but I think they stopped making them. I've
seen them from time to time come up for auction on ebay. I have also seen
some coming out of Bangalore, India that appear to be newly made. I
couldn't find them right now looking on google. I have made quite a few
for my own use in house, I don't know what kind of facilities you have to
do this. It's a fair amount of work, but it depends upon how many alloys
you need to have.

Do let me know what you find out.

Good luck.

dj

On Thu, 16 Aug 2007, sirapa-at-optonline.net wrote:

}
}
}
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}
} Email: sirapa-at-optonline.net
} Name: Alan Paris
}
} Organization: Leica Microsystems
}
} Title-Subject: [Filtered] Metal Samples for Microscopy
}
} Question: I am looking to purchase a set of reference polished metal samples for reflected light microscopy.
}
} Can anyone refer me to a source?
} Thank you
}
} ---------------------------------------------------------------------------
}
} ==============================Original Headers==============================
} 7, 11 -- From zaluzec-at-microscopy.com Thu Aug 16 22:04:36 2007
} 7, 11 -- Received: from [206.69.208.22] (mac22.zaluzec.com [206.69.208.22])
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} 7, 11 -- Subject: viaWWW: Metal Samples for Light Microscopy
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From: eschumacher-at-mccrone.com
Date: Fri, 17 Aug 2007 09:13:39 -0500
Subject: [Microscopy] Short Course Announcement: Raman Microspectroscopy

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Greetings Colleagues,

The College of Microscopy located in Westmont, IL, will offer a course
in Raman microspectroscopy October 2-4, 2007, designed to provide
practical instruction in "real world" use of the Raman microscope. The
class will utilize demonstrations and laboratory exercises supplemented
with lectures. The role of Raman microspectroscopy in the overall
scheme of industrial problem solving will be addressed. Students are
strongly encouraged to bring their own samples for analysis. Class size
is limited to eight students to allow for maximum participation.

For further details and registration information, please follow the link
below.

www.collegeofmicroscopy.com


*********************************************************************
Elaine F.Schumacher
Senior Research Scientist
McCrone Associates, Inc.
850 Pasquinelli Drive
Westmont, IL 60559-5539 USA
630-887-7100 (tel)
630-887-7417 (fax)
E-mail: eschumacher-at-mccrone.com
Web Site: www.mccrone.com



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From: eschumacher-at-mccrone.com
Date: Fri, 17 Aug 2007 13:24:55 -0500
Subject: [Microscopy] Meeting Announcement: Midwest Microscopy & Microanalysis Society 50th Anniversary Event

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Greetings Colleagues,

The Midwest Microscopy and Microanalysis Society will celebrate our 50th
anniversary with a meeting on September 18 and 19, 2007, to be held at
the College of Microscopy in Westmont, IL. Details, registration
information and a preliminary program can be found on our website under
Meetings:

www.midwestmicroscopy.org

Details will be updated on the website as plans are finalized. We hope
to see you there!

Elaine Schumacher
President, Midwest Microscopy and Microanalysis Society


*********************************************************************
Elaine F.Schumacher
Senior Research Scientist
McCrone Associates, Inc.
850 Pasquinelli Drive
Westmont, IL 60559-5539 USA
630-887-7100 (tel)
630-887-7417 (fax)
E-mail: eschumacher-at-mccrone.com
Web Site: www.mccrone.com



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From: lukeclaire-at-yahoo.com
Date: Sat, 18 Aug 2007 11:11:45 -0500
Subject: [Microscopy] Monostep K4M lowicryl for Low Embed Polymerization

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Dear Microscopists,

I would like to ask for your advice on cutting K4M
lowicryl and assessing the polymerized blocks. It is
my first time to cut lowicryls embedded in low
temperature. I embedded drosophila tissue samples
using the supplier's recommended schedule for low
temperature embedding. Samples were fixed in 4%
paraformaldehyde, 0.2% glutaraldehyde in 0.1M
Phosphate buffer, dehydrated in progressive lowering
of temperature (PLT) in ethanol, infiltrated and
embedded with monostep K4M lowicryl. The resin and
sample were cured in a commercial UV cryochamber at
-35 degree celsius.

The blocks are hard but I noticed during trimming with
a razor blade that it is softer than what I usually
deal with in Epon sections. In resin areas close to
the trimmed pyramid block face, I can see a slight
indentation left after pressing my nail on the resin.
I was able to cut 1.2 micron thick sections although
it compressed at some areas and later flattened out.
The color of the thick sections is not uniform
throughout. I get pink, green colors randomly
throughout the sections. When I tried to collect thin
sections, the sections come with horizontal shreds and
do not get a full section. I tried to cut 50-100 nm
at 5mm/s then to 2mm/s hoping I could get a full
section with these softer blocks. The water in the
trough is low enough that kept the diamond knife edge
wet. A few times I got water on the block surface,
wicked it off with kimwipe and proceeded in
sectioning.

Is there a way to make the polymerized blocks harder?
When a drop of water got in contact with the trimmed
block face, is it necessary to dry it by putting in
dessicator before sectioning? I plan on using this
resin in the near future with PLT dehydration and UV
cryopolymerization. I would like to hear your
suggestions to have better sectioning next time.

I look forward to your helpful advice.

Thank you for the time to read my email.

Sincerely,

Claire




____________________________________________________________________________________
Pinpoint customers who are looking for what you sell.
http://searchmarketing.yahoo.com/

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From: wpchan-at-u.washington.edu
Date: Sat, 18 Aug 2007 18:58:22 -0500
Subject: [Microscopy] Re: gatan camera

Contents Retrieved from Microscopy Listserver Archives
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Within days of the posting, I received a call from Gatan to help me
diagnose the malfunction. A flex cable between the CCD and the camera
head electronics was probably cracked such that connection was open only
when the camera was inserted and the cable was stretched. This cable is
part of the carrier module that slides back and forth holding the CCD.
Gatan will actually sell this module (about $3K) for field replacement by
the user. But with no other means to further diagnose this 12-yr old
camera, I opted to send the camera back to Gatan for repair. I have the
camera back this past friday and it's performing fine.

According to Gatan, this flex cable should last about 7 years or so and
that certainly will depend on how often the camera is inserted and
retracted. If anybody is interested in seeing the inside of this camera,
I have some pictures that I can put up on our website. Thanks for all who
offered help and advice.

--
Pang (Wai Pang Chan, wpchan-at-u.washington.edu, PAB A087, 206-685-1519)
The Biology Imaging Facility (http://staff.washington.edu/wpchan/if/)

On Tue, 17 Jul 2007, wpchan-at-u.washington.edu wrote:

} I encountered a strange problem with a Gatan 689 Slow-Scan CCD camera
} mounted in the 35 mm port above the viewing chamber of a Philips CM100
} TEM. When I insert the camera, I can only see a uniform grey image. The
} histogram shows a single line in the middle. Changing the exposure time
} or increasing the illumination via condenser 2 has no effect. Allowing
} the shutter to be normally closed, or putting the shutter to open also has
} no effect.
}
} There seemed to be no mechanical problem for inserting or retracting the
} camera because the beam was blocked and blank as it should be.
}
} We are still using DigitalMicrograph 2.5 on an old quadra 840 with system
} 7.1. I have trashed the preferences and used another copy of the software
} with no improvement. When the camera is out, I can see the raw image in
} unprocessed view; basically the dark reference image. With high tension
} off, I used to see the same image when I insert the camera. But now I
} only see a grey image. I don't think there is anything wrong with the CCD
} or scintillator because I can see an after-image of the image I should be
} seeing when I retract the camera. This suggested that the CCD was
} exposed and formed an image but somehow not transferred to the computer.
}
} Any suggestion or insight to solve this problem will be much appreciated.

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From: jacques.faerber-at-ipcms.u-strasbg.fr
Date: Mon, 20 Aug 2007 07:37:28 -0500
Subject: [Microscopy] Re: Glue without carbon (SEM)

Contents Retrieved from Microscopy Listserver Archives
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Hi all

Late but hoping not too late ! I come back from holliday...

A way to "glue" without carbon which has not been cited, is to use as
substrate an Indium foil. In is very soft, and one can press the powder
in the In film. In is conductive too, if not oxyded. Depending of the
grain size of the powder, one may have overlapping from In-L lines with
elements from the samples such as Ca-K, but for a carbon search, it
should work. It's a way much used in XPS analysis of powders, in UHV
environement, where glue outgas to much.

And as In is expensive, it's easy to save monney by re-melt it (in a
glas tube) to purify it and separate the last used powder, and laminate
it again.

Hope it helps

J. Faerber
IPCMS-GSI
(Institut de Physique et Chimie des Matériaux de Strasbourg
Groupe Surface et Interfaces)
23, rue de Loess ; BP43
67034 Strasbourg CEDEX 2
France

Tel 00 33(0)3 88 10 71 01
Fax 00 33(0)3 88 10 72 48
E-mail Jacques.Faerber-at-ipcms.u-strasbg.fr



nizets2-at-yahoo.com a écrit :
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} Hi all!
}
} I am trying to detect organic contamination on/in
} aluminosilicate material by SEM+EDX, so it is very
} important for me to eliminate any source of carbon.
} As the specimen holders are made whether of carbon,
} silicium or aluminium (what a luck ;-)), I am planning
} to use copper disks as support but I still have to fix
} the powder on the disks. Is there anywhere in the
} known universe a glue which does not contain carbon?
}
} Best regards,
}
} Stephane
}
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From: chao.wang-at-materials.ox.ac.uk
Date: Mon, 20 Aug 2007 08:54:29 -0500
Subject: [Microscopy] viaWWW: estimate roughness of HREM images

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Email: chao.wang-at-materials.ox.ac.uk
Name: Chao Wang

Organization: Department of Materials, Oxford

Title-Subject: [Filtered] estimate roughness of HREM images

Question: Dear All

Could anyone tell me how to estimate the roughness of epitaxial layers by MBE growth like the roughness between Fe and MgO,from both HREM images and ADF images?

There are two main concerns.
1. From HREM, it's hard to see the where is the interface sometime.
2. Because the layer are epitaxial, how to estimate several Amstrong roughness?

Thank you very much for your help

All the best

Chao Wang
Oxford Materials

---------------------------------------------------------------------------

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From: ZZhang-at-uwyo.edu
Date: Mon, 20 Aug 2007 12:43:09 -0500
Subject: [Microscopy]

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopylistserver.com/MicroscopyListserver/MicroscopyArchives.html

Hi everyone:

The Microscopy Core Facility I am directing is heavily funded by a
couple of NIH institutional grants. As a result, I am able to keep most
of my microscopes updated and people pay less user fees. I need to,
however, to have the PIs acknowledge these grants in their publications.

I keep sending letters to the PIs to request this but without great
success. I am sure I am not alone and I wonder how other
people/facilities do this?

Thank you for your help.



Zhaojie Zhang, Ph.D.
Director, Microscopy Core Facility
Department of Zoology and Physiology
University of Wyoming
Laramie, WY 82071
TEL: 307-766-3038
FAX: 307-766-5625
zzhang-at-uwyo.edu
http://www.uwyo.edu/microscopy





==============================Original Headers==============================
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From: Elliott-at-arizona.edu
Date: Mon, 20 Aug 2007 13:17:40 -0500
Subject: [Microscopy] Re:

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopylistserver.com/MicroscopyListserver/MicroscopyArchives.html

Hi Zhaojie

My first thought upon reading your question was "good luck getting
people to acknowledge your facility in their papers", but then I
started thinking. Would it work to send a letter out saying that
unacknowledged work will be retroactively billed to labs at the
'unsubsidized' (MUCH higher) rate? Just make the case that if they
want subsidies they have to help get them.

I don't know if it would work as I have not tried it, but I think I
will try it.

David


_____________________

David Elliott Ph.D.
Assistant Professor - Department of Cell Biology and Anatomy
Director, Research Microscopy Core Service
University of Arizona College of Medicine
PO Box 245004
Tucson, AZ 85724

Voice: 520-626-7870
Fax: 520-626-2097


On Aug 20, 2007, at 10:47 AM, ZZhang-at-uwyo.edu wrote:

}
}
}
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} Hi everyone:
}
} The Microscopy Core Facility I am directing is heavily funded by a
} couple of NIH institutional grants. As a result, I am able to keep
} most
} of my microscopes updated and people pay less user fees. I need to,
} however, to have the PIs acknowledge these grants in their
} publications.
}
} I keep sending letters to the PIs to request this but without great
} success. I am sure I am not alone and I wonder how other
} people/facilities do this?
}
} Thank you for your help.
}
}
}
} Zhaojie Zhang, Ph.D.
} Director, Microscopy Core Facility
} Department of Zoology and Physiology
} University of Wyoming
} Laramie, WY 82071
} TEL: 307-766-3038
} FAX: 307-766-5625
} zzhang-at-uwyo.edu
} http://www.uwyo.edu/microscopy
}
}
}
}
}
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} Headers==============================
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From: kenconverse-at-qualityimages.biz
Date: Mon, 20 Aug 2007 14:46:45 -0500
Subject: [Microscopy] recipe for Au on C and Al/W dendrites

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopylistserver.com/MicroscopyListserver/MicroscopyArchives.html

Dear Zhaojie Zhang,

I have found that when I ask someone to do something for me that I get
more cooperation when I make it easy for them to comply. In your request
letter, you might want to include the wording that you would like them to
use. In other words, write the acknowledgement for them. You could then
suggest that they copy your sentences directly onto their document.

Bob


----- Original Message -----
X-from: {ZZhang-at-uwyo.edu}
To: {bob-at-rockisland.com}
Sent: Monday, August 20, 2007 10:44 AM

Dear listers,
I've spent quite a good deal of time googling for some clues as to how one
goes about making a Au on C (also sometimes called gold islands) resolution
sample and also an Al/W dendrite sample (which I tried once and didn't seem
to get what I was expecting). I couldn't come up with anything about the
processes. Does one evaporate or sputter the Au? What type or grade of C
is the best substrate? Does one cool the Al/W mixture quickly, slowly, or
doesn't it make a difference? I'm going to play with these some, but
sometimes it's nice to not have to reinvent the wheel.

Ken Converse
owner

QUALITY IMAGES
Servicing Scanning Electron Microscopes
Since 1981
474 So. Bridgton Rd.
Bridgton, ME 04009
207-647-4348
Fax 207-647-2688
kenconverse-at-qualityimages.biz
qualityimages.biz




_________________________________________________________________
Need personalized email and website? Look no further. It's easy
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From: maryflet-at-interchange.ubc.ca
Date: Mon, 20 Aug 2007 15:34:21 -0500
Subject: [Microscopy] recipe for Au on C and Al/W dendrites

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopylistserver.com/MicroscopyListserver/MicroscopyArchives.html

Dear Ken,
It has been a while since I made these, but I will try to remember. To make
the best gold-on-carbon islands, you evaporate pure gold onto polished
spectrographic-grade graphite, then post-heat the sample to make the islands
coalesce a bit. Takes a few tries to get both the amount of gold and the
post heating right. Some of the ones I've seen also have a bit of evaporated
tin on top of that; it makes little balls decorating the big balls and is
better for a FESEM and high resolution testing.
To make the Al-W phase, just put pure Al in a W basket and heat it up until
the aluminum melts, then evaporates. Soon after that, the W basket will
break at one of the arms, because the Al-W alloy formed is very brittle. The
basket with the cooled Al in it will show the dendrites and a pretty Al-W
phase. I'm not sure if cooling fast or slow matters, it cools pretty fast
when the wire breaks.
Good luck,

Mary Fletcher
Electron Microscopist
Materials Eng. UBC
#309 - 6350 Stores Road
Vancouver, B.C. V6T 1Z4
Canada
Tel: 604-822-5648
Fax: 604-822-3619
email: maryflet-at-interchange.ubc.ca


-----Original Message-----
X-from: kenconverse-at-qualityimages.biz [mailto:kenconverse-at-qualityimages.biz]
Sent: August 20, 2007 12:54 PM
To: maryflet-at-interchange.ubc.ca

Dear listers,
I've spent quite a good deal of time googling for some clues as to how one
goes about making a Au on C (also sometimes called gold islands) resolution
sample and also an Al/W dendrite sample (which I tried once and didn't seem
to get what I was expecting). I couldn't come up with anything about the
processes. Does one evaporate or sputter the Au? What type or grade of C
is the best substrate? Does one cool the Al/W mixture quickly, slowly, or
doesn't it make a difference? I'm going to play with these some, but
sometimes it's nice to not have to reinvent the wheel.

Ken Converse
owner

QUALITY IMAGES
Servicing Scanning Electron Microscopes
Since 1981
474 So. Bridgton Rd.
Bridgton, ME 04009
207-647-4348
Fax 207-647-2688
kenconverse-at-qualityimages.biz
qualityimages.biz




_________________________________________________________________
Need personalized email and website? Look no further. It's easy
with Doteasy $0 Web Hosting! Learn more at www.doteasy.com

==============================Original Headers==============================
7, 29 -- From kenconverse-at-qualityimages.biz Mon Aug 20 14:46:44 2007
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7, 29 -- Subject: recipe for Au on C and Al/W dendrites
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==============================Original Headers==============================
16, 35 -- From maryflet-at-interchange.ubc.ca Mon Aug 20 15:34:20 2007
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16, 35 -- From: Mary Fletcher {maryflet-at-interchange.ubc.ca}
16, 35 -- Subject: RE: [Microscopy] recipe for Au on C and Al/W dendrites
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From: walck-at-southbaytech.com
Date: Mon, 20 Aug 2007 15:52:43 -0500
Subject: [Microscopy] recipe for Au on C and Al/W dendrites

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopylistserver.com/MicroscopyListserver/MicroscopyArchives.html

I once saw a beautiful, albeit unintentional, resolution sample of someone
who evaporated gold onto an anthracite coal sample. I thought that the gold
on carbon were made by evaporating gold onto a warm polished graphite
surface. The gold doesn't wet the carbon and forms islands. If you stop
the deposition just before coalescence of the Au islands, you have your
resolution sample. Gold has a tendency to films by island coalescence on
most substrates. That is why it has a rough structure and is not a good
choice for high resolution SEM imaging.

For an alloy that forms a dendritic structure, the microstructure will be
finer with a higher cooling rate.


-Scott

Scott D. Walck, Ph.D.
Technical Director
South Bay Technology, Inc.
1120 Via Callejon
San Clemente, CA 92673

US Toll Free: 1-800-728-2233
Tel: (949) 492-2600
Fax: (949) 492-1499

www.southbaytech.com
walck-at-southbaytech.com

-----Original Message-----
X-from: maryflet-at-interchange.ubc.ca [mailto:maryflet-at-interchange.ubc.ca]
Sent: Monday, August 20, 2007 1:37 PM
To: Walck-at-SouthBayTech.com

Dear Ken,
It has been a while since I made these, but I will try to remember. To make
the best gold-on-carbon islands, you evaporate pure gold onto polished
spectrographic-grade graphite, then post-heat the sample to make the islands
coalesce a bit. Takes a few tries to get both the amount of gold and the
post heating right. Some of the ones I've seen also have a bit of evaporated
tin on top of that; it makes little balls decorating the big balls and is
better for a FESEM and high resolution testing.
To make the Al-W phase, just put pure Al in a W basket and heat it up until
the aluminum melts, then evaporates. Soon after that, the W basket will
break at one of the arms, because the Al-W alloy formed is very brittle. The
basket with the cooled Al in it will show the dendrites and a pretty Al-W
phase. I'm not sure if cooling fast or slow matters, it cools pretty fast
when the wire breaks.
Good luck,

Mary Fletcher
Electron Microscopist
Materials Eng. UBC
#309 - 6350 Stores Road
Vancouver, B.C. V6T 1Z4
Canada
Tel: 604-822-5648
Fax: 604-822-3619
email: maryflet-at-interchange.ubc.ca


-----Original Message-----
X-from: kenconverse-at-qualityimages.biz [mailto:kenconverse-at-qualityimages.biz]
Sent: August 20, 2007 12:54 PM
To: maryflet-at-interchange.ubc.ca

Dear listers,
I've spent quite a good deal of time googling for some clues as to how one
goes about making a Au on C (also sometimes called gold islands) resolution
sample and also an Al/W dendrite sample (which I tried once and didn't seem
to get what I was expecting). I couldn't come up with anything about the
processes. Does one evaporate or sputter the Au? What type or grade of C
is the best substrate? Does one cool the Al/W mixture quickly, slowly, or
doesn't it make a difference? I'm going to play with these some, but
sometimes it's nice to not have to reinvent the wheel.

Ken Converse
owner

QUALITY IMAGES
Servicing Scanning Electron Microscopes
Since 1981
474 So. Bridgton Rd.
Bridgton, ME 04009
207-647-4348
Fax 207-647-2688
kenconverse-at-qualityimages.biz
qualityimages.biz




_________________________________________________________________
Need personalized email and website? Look no further. It's easy
with Doteasy $0 Web Hosting! Learn more at www.doteasy.com

==============================Original Headers==============================
7, 29 -- From kenconverse-at-qualityimages.biz Mon Aug 20 14:46:44 2007
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From: Elliott-at-arizona.edu
Date: Mon, 20 Aug 2007 19:20:51 -0500
Subject: [Microscopy] Re: OoO

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopylistserver.com/MicroscopyListserver/MicroscopyArchives.html

I would like to thank the following people for letting me know that
they are out of their offices and will not be reading my last post to
the list serve (until they get back).

Margaret Casey

Richard Doelle

Mario Gislao

Mark Riggs

Wharton Sinkler

Paul VANDERLINDEN

Neil Vincent




Now, let the next round of OoO mail come my way!

David


On Aug 20, 2007, at 11:20 AM, Elliott-at-arizona.edu wrote:

}
}
}
} ----------------------------------------------------------------------
} ------
} The Microscopy ListServer -- CoSponsor: The Microscopy Society of
} America
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} MicroscopyListserver
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}
} Hi Zhaojie
}
} My first thought upon reading your question was "good luck getting
} people to acknowledge your facility in their papers", but then I
} started thinking. Would it work to send a letter out saying that
} unacknowledged work will be retroactively billed to labs at the
} 'unsubsidized' (MUCH higher) rate? Just make the case that if they
} want subsidies they have to help get them.
}
} I don't know if it would work as I have not tried it, but I think I
} will try it.
}
} David
}
}
} _____________________
}
} David Elliott Ph.D.
} Assistant Professor - Department of Cell Biology and Anatomy
} Director, Research Microscopy Core Service
} University of Arizona College of Medicine
} PO Box 245004
} Tucson, AZ 85724
}
} Voice: 520-626-7870
} Fax: 520-626-2097
}
}
} On Aug 20, 2007, at 10:47 AM, ZZhang-at-uwyo.edu wrote:
}
} }
} }
} }
} } ---------------------------------------------------------------------
} } -
} } ------
} } The Microscopy ListServer -- CoSponsor: The Microscopy Society of
} } America
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} }
} } Hi everyone:
} }
} } The Microscopy Core Facility I am directing is heavily funded by a
} } couple of NIH institutional grants. As a result, I am able to keep
} } most
} } of my microscopes updated and people pay less user fees. I need to,
} } however, to have the PIs acknowledge these grants in their
} } publications.
} }
} } I keep sending letters to the PIs to request this but without great
} } success. I am sure I am not alone and I wonder how other
} } people/facilities do this?
} }
} } Thank you for your help.
} }
} }
} }
} } Zhaojie Zhang, Ph.D.
} } Director, Microscopy Core Facility
} } Department of Zoology and Physiology
} } University of Wyoming
} } Laramie, WY 82071
} } TEL: 307-766-3038
} } FAX: 307-766-5625
} } zzhang-at-uwyo.edu
} } http://www.uwyo.edu/microscopy
} }
} }
} }
} }
} }
} } ==============================Original
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From: gnf3-at-cdc.gov
Date: Tue, 21 Aug 2007 08:23:15 -0500
Subject: [Microscopy] viaWWW: References In Situ and Electron Microscopy

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Email: gnf3-at-cdc.gov
Name: Maureen Metcalfe

Organization: CDC

Title-Subject: [Filtered] In Situ and Electron Microscopy

Question: Could someone recommend books and/or articles relating to the application of in situ hybridization for electron microscopy?

---------------------------------------------------------------------------

==============================Original Headers==============================
6, 11 -- From zaluzec-at-microscopy.com Tue Aug 21 08:23:15 2007
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6, 11 -- Subject: viaWWW: References In Situ and Electron Microscopy
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From: pwang-at-ues.com
Date: Tue, 21 Aug 2007 08:23:41 -0500
Subject: [Microscopy] viaWWW: CCD camera for Hitachi H-600 TEM

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Email: pwang-at-ues.com
Name: Ping Wang

Organization: ues

Title-Subject: [Filtered] CCD camera for Hitachi H-600 TEM

Question:
Hello!

We have an old Hitachi H-600 TEM and we would like to purchase a CCD camera (new or used) for it.

Please forward the imformation about the compatability of ANY CCD camera (new or used) to Hitachi H-600 TEM.

Thank You Very Much!

Ping Wang

pwang-at-ues.com


---------------------------------------------------------------------------

==============================Original Headers==============================
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From: rcommon-at-msu.edu
Date: Tue, 21 Aug 2007 09:32:50 -0500
Subject: [Microscopy] Re: OoO

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The Out of Office replies I will get for this posting will take maybe 2 or 3
seconds to delete, but I had to open this message to see what it was about.
Frankly I find the complaints about OoO replies much more annoying than the
OoOs themselves.

Ralph Common
Michigan State University


==============================Original Headers==============================
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From: sergei2-at-ornl.gov
Date: Tue, 21 Aug 2007 17:49:21 -0500
Subject: [Microscopy] PFM Workshop - October 8,9

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Dear colleagues
Registration is now open for a new Workshop on Piezoresponse Force
Microscopy, focusing on nanoscale electromechanics in ferroelectrics,
polar materials, and biological systems, which will be held at ORNL on
October 8-9 in conjunction with the CNMS User Meeting. Registration is
available at the ORNL Users Week website
http://neutrons.ornl.gov/workshops/users2007/index.shtml. When
registering, please (a) choose option $150 (Microscopy + Share) and (b)
mark PFM Workshop [checkmark on the bottom ofthe registration form].
Workshop details are available at
http://www.cnms.ornl.gov/workshops/CNMS_PFM_Workshop.pdf
In addition to tutorials, the workshop will include poster sessions
by attendees. A limited number of registration fee wavers and partial
compensation of travel expenses will be available for student attendees.
Please contact Sergei Kalinin (sergei2-at-ornl.gov) for additional details.
Yours
Sergei Kalinin and Art Baddorf

==============================Original Headers==============================
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From: mike.reedy-at-cellbio.duke.edu
Date: Tue, 21 Aug 2007 18:16:39 -0500
Subject: [Microscopy] Transformer replacement needed for Reichert OMU3 Ultramicrotome

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopylistserver.com/MicroscopyListserver/MicroscopyArchives.html

The free-standing ATF Transformator EA22 110 to 220V step-up
transformer required for our Reichert OMU3 ultramicrotome has gone
missing and stayed missing sometime in the last year. We know the
exact part because we have 2 OMU3 instruments, and only one is now
missing the transformer. Does anyone have one they might sell us, or
have experience with a serviceable replacement?
--
-mike reedy-

************************
Michael K. Reedy, M.D.
Duke Univ. Med. Center
Dept. Cell Biology, Box 3011 (for U.S. Mail)
458 Alex Sands Bldg, Research Dr (courier)
Durham, NC 27710

Office 919-668-2534
Lab 919-684-5674
Fax 919-681-9929
mike.reedy-at-cellbio.duke.edu
http://note.cellbio.duke.edu/Faculty/Research/Reedy.html

==============================Original Headers==============================
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From: atn5613-at-rit.edu
Date: Wed, 22 Aug 2007 08:45:55 -0500
Subject: [Microscopy] viaWWW: manual for ion sputtering system IBS TM200S

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Email: atn5613-at-rit.edu
Name: Algis Naujokas

Organization: Rochester Institute of Technology

Title-Subject: [Filtered] In need of manual for ion sputtering system IBS TM200S

Question: Hello All,
I am a graduate student at Rochester Institute of Technology and am trying get an IBS TM200S sputter device up and running. The problem is we do not have the exact manual for this device. We would be willing to purchase a copy if possible. It would be greatly appreciated as getting this instrument running is key to me starting my research. Please e-mail me off-list. Thank you for your time.

Algis Naujokas
atn5613-at-rit.edu

---------------------------------------------------------------------------

==============================Original Headers==============================
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From: gmartens-at-interchange.ubc.ca
Date: Wed, 22 Aug 2007 09:59:22 -0500
Subject: [Microscopy] job opportunity

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopylistserver.com/MicroscopyListserver/MicroscopyArchives.html

Hello everyone,

We have a position for a microscopy technician at the UBC BioImaging
Facility in Vancouver, British Columbia.

JOB SUMMARY:

To provide assistance with projects performed in the Bio-Imaging
facility. Duties include: maintaining laboratory supplies and
equipment; maintaining electron and optical microscopes; assisting in
developing protocols for new techniques; ordering supplies and
equipment; training and performing other related duties.

QUALIFICATIONS:

University degree in Science or equivalent diploma in microscopy
(Masters preferred) plus minimum three years microscopy experience.
Experience in image processing. Computer experience required
(Macintosh and PC). Effective oral and written communication, problem
solving, supervisory, interpersonal, organizational skills. Ability
to plan and complete work assignments independently. Ability to
follow instructions and teach.

Visit the following link if you are interested.

http://www.hr.ubc.ca/files/postings/trade.html#job47

Regards,

--
Garnet Martens

Research Manager
BioImaging Facility
University of British Columbia
6270 University Blvd.
Vancouver, B.C.
Canada
V6T 1Z4

phone 604-822-3354

==============================Original Headers==============================
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From: henriks-at-cox.net
Date: Wed, 22 Aug 2007 11:09:33 -0500
Subject: [Microscopy] viaWWW: manual for ion sputtering system IBS TM200S

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Algis:

I would suggest that you contact Scott Walck at South Bay Technology. You
can reach him by email at walck-at-southbaytech.com or at 800-728-2233.

South Bay Technology acquired VCR Group several years ago and has some of
the documentation for those older systems. He may be able to come up with a
manual for you.

Good luck.

Best regards-

David

David Henriks
henriks-at-cox.net

-----Original Message-----
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Sent: Wednesday, August 22, 2007 6:55 AM
To: Henriks-at-cox.net

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Email: atn5613-at-rit.edu
Name: Algis Naujokas

Organization: Rochester Institute of Technology

Title-Subject: [Filtered] In need of manual for ion sputtering system IBS
TM200S

Question: Hello All,
I am a graduate student at Rochester Institute of Technology and am trying
get an IBS TM200S sputter device up and running. The problem is we do not
have the exact manual for this device. We would be willing to purchase a
copy if possible. It would be greatly appreciated as getting this instrument
running is key to me starting my research. Please e-mail me off-list. Thank
you for your time.

Algis Naujokas
atn5613-at-rit.edu

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From: rnichols-at-bcm.edu
Date: Wed, 22 Aug 2007 13:47:30 -0500
Subject: [Microscopy] viaWWW: Manual for Coolwell Water Chiller Unit

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Email: rnichols-at-bcm.edu
Name: Ralph Nichols

Organization: Baylor College of Medicine

Title-Subject: [Filtered] Manual for Coolwell Water Chiller Unit

Question: I have a Coolwell water chiller that chill the water for
a Zeiss 902 TEM. It is in need of repair but there is no
manual for our facilities engineers to repair it. They
have been replacing parts on it that they think will repair it. I try
to get manual from Coolwell but they have been out business
for a while now. If anyone could send a copy of it,it would
be greatly appriciated. The model # is SE 0 80W CZ.

Ralph Nichols
Baylor College of Medicine
Houston, TX
713 798-5415

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From: k.sader-at-leeds.ac.uk
Date: Wed, 22 Aug 2007 13:48:13 -0500
Subject: [Microscopy] viaWWW: Thin crystals of vermiculite

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Email: k.sader-at-leeds.ac.uk
Name: Kasim Sader

Organization: SuperSTEM, UK

Title-Subject: [Filtered] Thin crystals of vermiculite

Question: Dear list,


Does anyone have any thin crystals of vermiculite suitable for electron microscopy that they might be willing to lend? Also, does anyone know which type of vermiculite is the most beam insensitive (or which types are beam sensitive)?

I am looking for a beam insensitive thin crystal and have found a few papers using vermiculite, but if anyone has suggestions of other beam insensitive thin crystals, possibly with larger unit cells, I would appreciate these also.

Thanks,

Kasim Sader
Postdoc
SuperSTEM
Daresbury Laboratories
Warrington
WA4 4AD
UK

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From: eq23-at-rice.edu
Date: Wed, 22 Aug 2007 18:30:44 -0500
Subject: [Microscopy] viaWWW: TEM--any concerns while pregnant

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Email: eq23-at-rice.edu
Name: Elizabeth

Organization: Rice university

Title-Subject: [Filtered] TEM--any concerns while pregnant?

Question: Greetings,

A graduate student, I'm a frequent user on the Jeol 2010 and 1230 TEMs at the university. I also found out that I'm 2 months pregnant. Should I be concern of any x-ray or other ionizing energy that may leak from the TEMs? Should I wait after the first trimester (a few more weeks) to get back on the TEM? Does anybody have any good information or advice?

Thanks for your time.

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From: nizets2-at-yahoo.com
Date: Thu, 23 Aug 2007 02:22:16 -0500
Subject: [Microscopy] SEM: wt% or atom% ?

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Dear listers,

I will post soon a summary of all the interesting
answers I got for the problem of carbon-free
preparation of samples for SEM-EDX (not a lot of
solution, though).

Now I face a pretty stupid problem that my pair of
neurons can't resolve. When I perform an EDX analysis
in SEM (Oxford Instrument's INCA software), I obtain 2
values for each peak: weight % and atom %.
I guess that weight % represents the integration of
each peak area, whereas atom% represents
weight%/atomic weight. Now the 2 values can
significantly differ, and thus the element ratio of my
samples can also be significantly different. And that
is precisely what I want to know!

Now, please allow to ask some questions:

- why is the integration of the peaks in the EDX
spectrum called "weight %"?
- Does the intensity if the peaks in EDX depend on the
atomic weight? In other words, do heavier elements
produce more x-rays than lighter elements? It is a
hard for me to believe this, because electron shells
are the same for light and heavy elements (a K shell
is a K shell), however it is the only reason I can see
to calculate an atom% value.
- Which one of the 2 values to use, in which case and
why?

Thank you in advance.

Stephane






____________________________________________________________________________________
Yahoo! oneSearch: Finally, mobile search
that gives answers, not web links.
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From: kenconverse-at-qualityimages.biz
Date: Thu, 23 Aug 2007 05:57:45 -0500
Subject: [Microscopy] Re: recipe for Au on C and Al/W dendrites

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Dear listers,
Here are the replies I got. Very helpful. Thank you all.
Ken Converse
owner

QUALITY IMAGES
Servicing Scanning Electron Microscopes
Since 1981
474 So. Bridgton Rd.
Bridgton, ME 04009
207-647-4348
Fax 207-647-2688
kenconverse-at-qualityimages.biz
qualityimages.biz


I inadvertently made a Al/W dendrite sample by heating Al foil (or
wire, I don't remember) in a W coil basket in my vacuum evaporator
when making a telescope mirror. The Al embrittles the W and as you
evaporate the Al, eventually the W wire breaks and you are left with
a glob of Al in the basket. Looks great in BSE mode.
Henk
****************************************************************************
***

I have made the Al-W dendritic structures in an evaporator. From my
observations;
1. Use excess Al for the charge.
2. Heat the charge until the Al is molten. I usually cut-back on heating
power, you need just enough to keep the Al molten for about 3 minutes,
without evaporating it all away. 3. Cool the molten blob rapidly by just
shutting off the heater power. 4. The dendritic structures are located in
small "pockets" near the top of the now solidified blob.
Joseph M. Oparowski
****************************************************************************
*****

I don't know the answer to your question but as far as dendritic grow is
concerned, here is what I do know...

Dendritic growth is a process where one constituent of an alloy begins to
solidfy before another. This leaves the liquid with a compostion lower in
the first constituent and higher in the second. The process of the growing
is limited by a diffusion process of the two components in the liquid.
This means you get smaller dendrites with faster cooling rates and larger
dendrites with slower cooling rates. However, if you cool fast enough, you
can't get the diffusion process happening, and so then you don't get any
dendritic growth. If you cool really slow, well, then it depends upon the
alloy....

You have asked about Al/W. Now those two have really different melting
points so I'd think you'd get darned good dentritic growth with those two
just about no matter how you cooled it... If you went slow, I'd bet you'd
get a lot of interdendritic shrinkage cavities though....

Also, I don't know how big of a structure you want, but it would be my
guess that you could cool that alloy pretty quick and have some nice
dendritic growth...

What did you do the first time you tried that? And how did it turn out?

If someone does answer you with a lot more info, I'd like to find out
myself...If you don't mind sending along the info..

Dj
***************************************************************************

It has been a while since I made these, but I will try to remember. To make
the best gold-on-carbon islands, you evaporate pure gold onto polished
spectrographic-grade graphite, then post-heat the sample to make the islands
coalesce a bit. Takes a few tries to get both the amount of gold and the
post heating right. Some of the ones I've seen also have a bit of evaporated
tin on top of that; it makes little balls decorating the big balls and is
better for a FESEM and high resolution testing. To make the Al-W phase, just
put pure Al in a W basket and heat it up until the aluminum melts, then
evaporates. Soon after that, the W basket will break at one of the arms,
because the Al-W alloy formed is very brittle. The basket with the cooled Al
in it will show the dendrites and a pretty Al-W phase. I'm not sure if
cooling fast or slow matters, it cools pretty fast when the wire breaks.
Good luck,

Mary Fletcher
****************************************************************************
**

I once saw a beautiful, albeit unintentional, resolution sample of someone
who evaporated gold onto an anthracite coal sample. I thought that the gold
on carbon were made by evaporating gold onto a warm polished graphite
surface. The gold doesn't wet the carbon and forms islands. If you stop
the deposition just before coalescence of the Au islands, you have your
resolution sample. Gold has a tendency to films by island coalescence on
most substrates. That is why it has a rough structure and is not a good
choice for high resolution SEM imaging.

For an alloy that forms a dendritic structure, the microstructure will be
finer with a higher cooling rate.

Scott D. Walck, Ph.D.
****************************************************************************
****




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From: mmiralles-at-pi.ac.ae
Date: Thu, 23 Aug 2007 06:12:31 -0500
Subject: [Microscopy] Differentiating CaCO3 using BSE

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Hi everyone,

Being new in geology environment, can someone enlighten me on how can I
differentiate calcite, aragonite and dolomite using BSE?
Reference to a title/name of a publication is also welcome.

Thanks,

Melina Miralles
The Petroleum Institute
Abu Dhabi, UAE
PGSc Lab Technician
The Petroleum Institute
Abu Dhabi, UAE


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From: holpc-at-firstenergycorp.com
Date: Thu, 23 Aug 2007 08:11:57 -0500
Subject: [Microscopy] SEM, considerations for medical devices

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Good morning everyone,

I have been requested to look at a medical item surgically removed from a
(living) person and need to determine whether or not to accept this job.
Being a materials person, I am quite unexperienced at biological issues.
What are some considerations to be aware of to help me decide if this job
is appropriate for us or not? I don't know how (or if) it has been cleaned
so far, but I've been told that I won't be allowed to do anything to it
other than examine it. Sorry, but at this time I can not be more specific.

I have already gotten some valuable and much appreciated input from one
local member, but thought I would pose this to the larger community as
well.

As always, TIA.

Chris Holp
FirstEnergy Corp.
BETA Labs
Mayfield Village, OH 44143
440-604-9704
holpc-at-firstenergycorp.com


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From: frah0010-at-umn.edu
Date: Thu, 23 Aug 2007 08:22:38 -0500
Subject: [Microscopy] Re: Differentiating CaCO3 using BSE

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopylistserver.com/MicroscopyListserver/MicroscopyArchives.html

Hi Melina,

I don't think one can reliably distinguish calcite and aragonite
using BSE alone unless their morphologies are diagnostic. On the
other hand, distinguishing dolomite should be possible because it has
about 20% MgO.

The mean atomic numbers for calcite and aragonite are the same, and
both have a backscatter coefficient of about 0.142. Dolomite,
though, is less dense and has a backscatter coefficient of about
0.124, so it should appear darker than calcite and aragonite.

This does not mean that there will be absolutely no contrast
difference between calcite and aragonite -- it simply will not be
clear which mineral is which, though. Both minerals can have various
impurities (Mn, Mg, Fe, etc) and crystal orientations that will add
variation to the backscatter signal.

As I mentioned, you might have to rely on their morphologies if
you're working only with BSE. The crystal lattice of aragonite is
different than that of calcite, resulting in different shapes.
Aragonite has an orthorhombic system with usually needle-like
crystals. Calcite is trigonal-rhombohedral and has a variety of
habits: fibrous, granular, lamellar, etc -- more than are easily
described here. You can either use the web or consult an
introductory textbook on mineralogy or petrography to view examples
of the different morphologies of calcite and aragonite.

If the morphologies in your samples don't lend themselves to clearly
identifying calcite vs aragonite, you'll have to something like XRD
or EBSD to differentiate the crystal lattices.

Best,
Ellery

--------------------
Ellery E. Frahm
Research Fellow & Manager
Electron Microprobe Laboratory
University of Minnesota - Twin Cities
Department of Geology & Geophysics
Lab Website: http://probelab.geo.umn.edu
Personal Website: http://umn.edu/~frah0010




On Aug 23, 2007, at 6:16 AM, mmiralles-at-pi.ac.ae wrote:

} Hi everyone,
}
} Being new in geology environment, can someone enlighten me on how
} can I
} differentiate calcite, aragonite and dolomite using BSE?
} Reference to a title/name of a publication is also welcome.
}
} Thanks,
}
} Melina Miralles
} The Petroleum Institute
} Abu Dhabi, UAE
} PGSc Lab Technician
} The Petroleum Institute
} Abu Dhabi, UAE

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From: oshel1pe-at-cmich.edu
Date: Thu, 23 Aug 2007 08:31:30 -0500
Subject: [Microscopy] Re: SEM, considerations for medical devices

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopylistserver.com/MicroscopyListserver/MicroscopyArchives.html

Chris,

The first thing I'd do is go to http://www.histonet.org and sign up
on the histonet mailing list and post your question. That list is
full of people who do this sort of work clinically and in research
labs. Including authors of some of the standard histotechnique texts.

Second, check with the people who want to send you the sample and get
the details of what they've done and what you can do. At the very
least, make certain there was no infection associated with the device
or that there is otherwise zero chance of any pathogen coming along
with it. Since you're in a materials lab, you will not have any
provisions with dealing with any live bacteria/fungi, etc. You should
get the sample either fixed, cleaned of biological materials, or if
neither, then guaranteed to be healthy.
What sorts of microscopy are they looking for? "... won't be allowed
to do anything to it other than examine it." really limits what you
can do.

Phil

} Good morning everyone,
}
} I have been requested to look at a medical item surgically removed from a
} (living) person and need to determine whether or not to accept this job.
} Being a materials person, I am quite unexperienced at biological issues.
} What are some considerations to be aware of to help me decide if this job
} is appropriate for us or not? I don't know how (or if) it has been cleaned
} so far, but I've been told that I won't be allowed to do anything to it
} other than examine it. Sorry, but at this time I can not be more specific.
}
} I have already gotten some valuable and much appreciated input from one
} local member, but thought I would pose this to the larger community as
} well.
}
} As always, TIA.
}
} Chris Holp
} FirstEnergy Corp.
} BETA Labs
} Mayfield Village, OH 44143
} 440-604-9704
} holpc-at-firstenergycorp.com
--
Philip Oshel
Microscopy Facility Supervisor
Biology Department
024C Brooks Hall
Central Michigan University
Mt. Pleasant, MI 48859

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From: frah0010-at-umn.edu
Date: Thu, 23 Aug 2007 08:42:45 -0500
Subject: [Microscopy] Re: SEM, considerations for medical devices

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopylistserver.com/MicroscopyListserver/MicroscopyArchives.html

Hi Chris,

Let's assume that you're being asked to look at is either a medical
device like a pacemaker or an electrical lead from one or an implant
like an artificial joint or tooth filling -- I won't ask you to
confirm or deny that -- but that's what I'm assuming for this comment.

We've analyzed such items before (although usually before
implantation). Hospitals have strict procedures for anything that
doesn't go into the medical waste, usually involving autoclave
sterilization. If you are worried about biological hazards or
anything like that, you should feel absolutely free to ask the
company exactly what has been done to clean it. If it shows up in
your laboratory, though, in a biohazard bag, feel free to send it
back to them and say "No way." But since medical devices are made to
be sterilized before being placed in a human body, they can be
cleaned very well, probably cleaner than most other samples.

In the past, we've been assured of cleanliness, and I handle most
samples with medical gloves anyway because there are plenty of toxic
geological or mat sci samples too. Basically, medical devices can be
sterilized -- ask them to do that or find someone else.

Best,
Ellery

--------------------
Ellery E. Frahm
Research Fellow & Manager
Electron Microprobe Laboratory
University of Minnesota - Twin Cities
Department of Geology & Geophysics
Lab Website: http://probelab.geo.umn.edu
Personal Website: http://umn.edu/~frah0010



On Aug 23, 2007, at 8:17 AM, holpc-at-firstenergycorp.com wrote:

} Good morning everyone,
}
} I have been requested to look at a medical item surgically removed
} from a
} (living) person and need to determine whether or not to accept this
} job.
} Being a materials person, I am quite unexperienced at biological
} issues.
} What are some considerations to be aware of to help me decide if
} this job
} is appropriate for us or not? I don't know how (or if) it has been
} cleaned
} so far, but I've been told that I won't be allowed to do anything
} to it
} other than examine it. Sorry, but at this time I can not be more
} specific.
}
} I have already gotten some valuable and much appreciated input from
} one
} local member, but thought I would pose this to the larger community as
} well.
}
} As always, TIA.
}
} Chris Holp
} FirstEnergy Corp.
} BETA Labs
} Mayfield Village, OH 44143
} 440-604-9704
} holpc-at-firstenergycorp.com

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From: rcommon-at-msu.edu
Date: Thu, 23 Aug 2007 09:03:04 -0500
Subject: [Microscopy] SEM, considerations for medical devices

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopylistserver.com/MicroscopyListserver/MicroscopyArchives.html


The principal axiom of "universal precautions", required for handling human
biological material, is to assume that ALL samples are potentially
infectious and treat them as such. Unless you can positively confirm that
the objects have been sterilized or fixed, they should be handled as if they
are infectious, and not accept any assurances that there is no infection
involved.

Ralph Common
Division of Human Pathology
Michigan State University


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From: frah0010-at-umn.edu
Date: Thu, 23 Aug 2007 09:09:04 -0500
Subject: [Microscopy] Re: SEM: wt% or atom% ?

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopylistserver.com/MicroscopyListserver/MicroscopyArchives.html

Hi Stephanie,

Let me address your questions (as I understand them):

} 1: why is the integration of the peaks in the EDX
} spectrum called "weight %"?

We have the problem of two uses of the term "weight percent" in X-ray
analysis. There is the use of "weight" to describe the relative
intensities of the X-ray lines themselves -- that is, the relative
intensities of, say, L-alpha and L-beta X-rays -- and this value can
be reported as a "weight percent" or coefficient. There is also the
use of "weight percent" to refer to the resulting data, calculated in
terms of the mass fraction of the elements in a sample. These two
uses are creating confusion here. It sounds to me like the software
is integrating the area of the peaks to calculate your element
concentrations which are being reported in terms of "weight
percent" (mass fraction) and "atomic percent" (atom fraction) -- does
that make sense with what you're seeing?

} 2; Does the intensity if the peaks in EDX depend on the
} atomic weight? In other words, do heavier elements
} produce more x-rays than lighter elements?

It is not that simple, and the accelerating voltage how efficiently X-
rays are produced from different elements (see "overvoltage ratio"),
so it differs at, say, 10 kV and 20 kV. The simple answer is no.
The not-so-simple answer involves a lot more than I am willing to
type at the moment -- try consulting the section on characteristic X-
ray production in Goldstein et al.

} 3; Which one of the 2 values to use, in which case and why?

If you are asking about asking about reporting your results in terms
of atomic fraction or mass fraction, that depends on your application
or research question and the "standard" format for your field. Why
not record or report both? You can also convert data from one form
to the other at a later date using Excel and a periodic table. So
the answer is "it depends."

I apologize if I've misunderstood any of your questions or problem
descriptions.

Best,
Ellery

--------------------
Ellery E. Frahm
Research Fellow & Manager
Electron Microprobe Laboratory
University of Minnesota - Twin Cities
Department of Geology & Geophysics
Lab Website: http://probelab.geo.umn.edu
Personal Website: http://umn.edu/~frah0010

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From: freym2-at-rpi.edu
Date: Thu, 23 Aug 2007 09:22:54 -0500
Subject: [Microscopy] e-Beam lithography Negative Resists

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopylistserver.com/MicroscopyListserver/MicroscopyArchives.html

Has anyone on the list had experience using H.S.Q. (hydrogen silsesquioxane)
as a negative e-beam resist? If so has it been useful, any tips you can
share as to ease of use, a good source for the material. Thanks for any help
you can offer.

David


M. David Frey
Senior Application Engineer
Rensselaer Polytechnic Institute
Low Center for Industrial Inn.
Center for Integrated Electronics
110 8th Street
CII 4161 (Office)
CII 6015 (Packages and Mail)
Troy, NY 12180
518-276-3323 (office)
518-698-2288 (mobile)




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From: James.Passmore-at-sealedair.com
Date: Thu, 23 Aug 2007 11:00:14 -0500
Subject: [Microscopy] SEM -- S4500 video monitors

Contents Retrieved from Microscopy Listserver Archives
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We have an Oxford system here so I think I can comment on this with
authority.

The weight% and atom% labels DEFINITELY refer to the two ways of
expressing results.

Weight% is synonymous with mass%. It is only roughly proportional to
peak intensity. As Ellery pointed out, there are many things that affect
the conversion of raw peak intensity to weight fraction. The only time I
make use of the correlation is if I am estimating compositions by eye. A
1 wt% S Ka peak and a 1 wt% Au Ma peak have _roughly_ the same integral
where the atomic fractions would be widely different.

Atomic% is synonymous with mole%. It is directly related to weight% by
the atomic weight of the species. It can be easily calculated using a
spreadsheet; however, every (computerized) EDS system I have seen offers
atomic% as an output option.

The two numbers are often widely different, so which do you use? It
depends. If you are interested in stoichiometry and formulas, you want
atomic fractions. If you are checking a sample against its formulation,
the sample was undoubtedly weighed out and you likely want mass
fraction. For example, I was working on a sample of EuAl2 for a
researcher yesterday. The mole (or atomic) fraction of Eu is 33.3%.
However, the mass fraction is 73.8%. Both answers are "right".

Regarding your question of why does intensity depend on weight fraction
more than atomic fraction, I would have to dig back into the texts to
say for sure. Weight depends (essentially) on the mass of the nucleus
and that tells you the number of protons and neutrons and thus the
number of electrons. Now whether it is the number of electrons or the
mass of the nucleus that determines the x-ray intensity from an atom, I
would have to go look. The answer could be a combination of factors.

Warren

-----Original Message-----
X-from: nizets2-at-yahoo.com [mailto:nizets2-at-yahoo.com]
Sent: Thursday, August 23, 2007 2:23 AM
To: wesaia-at-iastate.edu


Hello all,

We have an Hitachi S4500, vintage ~1993. We recently added a digital
acquisition & EDX system. The acquisition system sits by idle while you
tune up the image (select area, magnification, focus, etc.) on the scope's
video monitors, then takes over to acquire the image. Everything works
beautifully, but the ergonomics are not very good. We have our PC monitors
sitting on top of the console, so they are uncomfortably high to look at.

I would like to simply remove the console CRTs and replace either with a
small monitor, or even better, pipe the video signal into an image capture
board to display in a window on the acquisition PC. That's where my
question lies--how to pull the video signal out. I realize the console has
a video out BNC connector which I have tried, but the quality isn't quite
there. (Maybe a sync problem? the image is somewhat distorted.) Our
electronics guys say the old CRTs are hardwired into the system. Does
anyone know if this is a standard video signal? If so, we'll simply remove
the old CRTs (replacing the hard-wired connections with a standard
connection) and cut down the console, leaving a place for the PC monitors.
If there is no standard video signal, then things get substantially more
complicated, of course.

Any suggestions or insight would be appreciated.

Jim

----------------------------------------------
Jim Passmore
Research Associate
Sealed Air Corporation
james.passmore-at-sealedair.com
864-433-2927 voice
864-433-2205 fax
----------------------------------------------


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From: BVandenberg-at-inco.com
Date: Thu, 23 Aug 2007 11:02:34 -0500
Subject: [Microscopy] Tracor PAC 5600 stage control

Contents Retrieved from Microscopy Listserver Archives
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probably just wishful thinking but... Has anyone had any experience with
getting a PC to interface to the antiquated Tracor Northern PAC stage/
spectro controller???

Regards,

B. Vanden Berg


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From: maryflet-at-interchange.ubc.ca
Date: Thu, 23 Aug 2007 11:09:10 -0500
Subject: [Microscopy] viaWWW: TEM--any concerns while pregnant

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Dear Elizabeth,
I have had various graduate students and technicians working in my lab while
pregnant and on my 200 kV Hitachi TEM. The instrument was checked by the
university's Radiation Control Officer with a Geiger counter when it was
first installed and periodically after, particularly after the gun was
disassembled and serviced. The pregnant ladies also wore film badges, which
are much more sensitive to accumulated radiation than a Geiger counter. No
significant leakage was ever found, in fact, the bricks in the walls turned
out to emit more background radiation than the TEM operating at 200kV.
Having said that, you can check that the TEM is operating within radiation
emission limits by:
1. Having it checked while it is operating normally, with you in the
position where you normally operate the TEM
2. Always make sure all apertures, particularly the moveable condenser
aperture, are in place before turning on the beam. Let someone else align
the beam with the C aperture out, if necessary.
I think the modern microscopes are very well shielded and do not leak
significant radiation.
Regards,

Mary Fletcher (nee Mager)
Electron Microscopist
Materials Eng. UBC
#309 - 6350 Stores Road
Vancouver, B.C. V6T 1Z4
Canada
Tel: 604-822-5648
Fax: 604-822-3619
email: maryflet-at-interchange.ubc.ca

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Email: eq23-at-rice.edu
Name: Elizabeth

Organization: Rice university

Title-Subject: [Filtered] TEM--any concerns while pregnant?

Question: Greetings,

A graduate student, I'm a frequent user on the Jeol 2010 and 1230 TEMs at
the university. I also found out that I'm 2 months pregnant. Should I be
concern of any x-ray or other ionizing energy that may leak from the TEMs?
Should I wait after the first trimester (a few more weeks) to get back on
the TEM? Does anybody have any good information or advice?

Thanks for your time.

---------------------------------------------------------------------------

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From: Rob.Bowen-at-caddock.com
Date: Thu, 23 Aug 2007 12:28:51 -0500
Subject: [Microscopy] Re: e-Beam lithography Negative Resists

Contents Retrieved from Microscopy Listserver Archives
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--
David,
Haven't used any for e-beam resist, but www.gelest.com would be a source
for lab size amounts. They'd also be a good place to ask for advice.
HTH

Rob Bowen

Robert C. Bowen
Research Scientist
Caddock Electronics, Inc
rob.bowen-at-caddock.com
http://www.caddock.com


} From: {freym2-at-rpi.edu}
} Reply-To: {freym2-at-rpi.edu}
} Date: Thu, 23 Aug 2007 09:28:32 -0500
} To: {rob.bowen-at-caddock.com}
} Subject: [Microscopy] e-Beam lithography Negative Resists
}
}
}
}
} ----------------------------------------------------------------------------
} The Microscopy ListServer -- CoSponsor: The Microscopy Society of America
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}
} Has anyone on the list had experience using H.S.Q. (hydrogen silsesquioxane)
} as a negative e-beam resist? If so has it been useful, any tips you can
} share as to ease of use, a good source for the material. Thanks for any help
} you can offer.
}
} David
}
}
} M. David Frey
} Senior Application Engineer
} Rensselaer Polytechnic Institute
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}
}
}
}
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From: tivol-at-caltech.edu
Date: Thu, 23 Aug 2007 13:34:50 -0500
Subject: [Microscopy] Re: viaWWW: TEM--any concerns while pregnant

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopylistserver.com/MicroscopyListserver/MicroscopyArchives.html


On Aug 22, 2007, at 4:30 PM, eq23-at-rice.edu wrote:

} A graduate student, I'm a frequent user on the Jeol 2010 and 1230
} TEMs at the university. I also found out that I'm 2 months
} pregnant. Should I be concern of any x-ray or other ionizing
} energy that may leak from the TEMs? Should I wait after the first
} trimester (a few more weeks) to get back on the TEM? Does anybody
} have any good information or advice?

Dear Elizabeth,
Modern EMs are well-designed so that they emit very little
radiation, and the safety officer at your institution should make
frequent checks to see that the EM meets the spec. That said, you
could wear a dosimeter to measure your exposure. I would hope that
you would be reassured that your exposure is minimal--probably below
the limit of detection.
Yours,
Bill Tivol, PhD
EM Scientist
Electron Cryo-Microscopy Facility
Broad Center, Mail Code 114-96
California Institute of Technology
Pasadena CA 91125
(626) 395-8833
tivol-at-caltech.edu


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From: rdg-at-uab.edu
Date: Thu, 23 Aug 2007 13:35:08 -0500
Subject: [Microscopy] viaWWW: TEM--any concerns while pregnant

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopylistserver.com/MicroscopyListserver/MicroscopyArchives.html

Many, many moons ago, I had our TEM surveyed by our radiation safety
guys when I was pregnant (JEOL 2000FX) and what they discovered was that
there was absolutely no radiation leakage EXCEPT when the condenser
aperture was out. Ours has two sets of apertures - top hat and regular
and there is an intermediate setting with no aperature in. We tried
messing up the centering on the apertures and everything to see if
anything leaked and it didn't except as I stated above. I recommend a
similar check for you. I'm sure someone on campus at Rice has a
detector. I worked at Hanford laboratory and had some extra radiation
training and developing cells are very sensitive to radiation. Along
the same lines, you need to be very careful about what chemicals and
biological hazards you handle when you do sample preparation. We've had
lots of female graduate students, employees and faculty pregnant in my
18 years here and I've never had trouble getting people to cover for a
pregnant woman. Of course, I'm in the south and southern gentlemen are
wonderfully polite so maybe that is why it was so easy for us!! I'm
sure there are rules that protect you from being forced to do stuff that
is hazardous now if you find out there are issues in your lab. Check
with your safety department and congratulations.....




-----Original Message-----
X-from: eq23-at-rice.edu [mailto:eq23-at-rice.edu]
Sent: Wednesday, August 22, 2007 6:38 PM
To: Robin D Griffin

This Question/Comment was submitted to the Microscopy Listserver using
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Email: eq23-at-rice.edu
Name: Elizabeth

Organization: Rice university

Title-Subject: [Filtered] TEM--any concerns while pregnant?

Question: Greetings,

A graduate student, I'm a frequent user on the Jeol 2010 and 1230 TEMs
at the university. I also found out that I'm 2 months pregnant. Should I
be concern of any x-ray or other ionizing energy that may leak from the
TEMs? Should I wait after the first trimester (a few more weeks) to get
back on the TEM? Does anybody have any good information or advice?

Thanks for your time.

------------------------------------------------------------------------
---

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From: bozzola-at-siu.edu
Date: Thu, 23 Aug 2007 16:41:40 -0500
Subject: [Microscopy] CM Taylor Corp Standard

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I am trying to locate the C.M. Taylor Corporation, specialists in
microbeam standards.
We were given one of their standards (NO. 202) but need a map of the
minerals present.
Any help would be appreciated.

Thank you,

JB
--
+++++++++++++++++++++++++++++++++++++++++++++++++++++++

John J. Bozzola, Ph.D., Director
Integrated Microscopy & Graphics Expertise (IMAGE)
Southern Illinois University
750 Communications Drive - MC 4402
Carbondale, IL 62901
Telephone: 618-453-3730

+++++++++++++++++++++++++++++++++++++++++++++++++++++++

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From: kdunnerj-at-mdanderson.org
Date: Thu, 23 Aug 2007 17:45:09 -0500
Subject: [Microscopy] viaWWW: Osmium tetroxide on Lowicryl Sections

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Email: kdunnerj-at-mdanderson.org
Name: Kenneth Dunner Jr

Organization: MD Anderson Cancer Center

Title-Subject: [Filtered] Osmium tetroxide on Lowicryl Sections

Question: A colleague I know wants to know has anyone used osmium tetroxide on post embedded immunogold labeled Lowicryl sections to make microtubules or other membranes stand out?

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From: dlowry-at-asu.edu
Date: Thu, 23 Aug 2007 17:45:38 -0500
Subject: [Microscopy] viaWWW: negative staining problem

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Email: dlowry-at-asu.edu
Name: David Lowry

Organization: Arizona State University

Title-Subject: [Filtered] negative staining problem

Question: I believe there was a previous discussion on the List concerning this issue, but I could not locate the subject in the archives. I am having a negative staining problem with what is commonly referred to as 'champagning' or tiny bubble-like areas around specimens and other particles on the grid. I observe this frequently with all stains I use--UA, PTA and amm molybdate--and at different concentrations and pH values. It also doesn't appear to be affected by surfactants or time duration of stain application. I seem to recall this phenomenon is not well understood as to its cause, but I was wondering if anyone may have any information or ideas on how to minimize or eliminate this from occurring. Thanks,


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From: michael-at-shaffer.net
Date: Fri, 24 Aug 2007 06:47:12 -0500
Subject: [Microscopy] RE: SEM: wt% or atom% ?

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Elizabeth

if the electron microscopes are well maintained and have the usual
safety checks, there should be no problem during normal operation.

I would be much more concerned about chemical and biohazard risks in the
lab, which of course should normally be assessed.

In the UK it would be possible to ask if a risk assessment for the lab
would identify specific risks to pregnant women.

Congratulations and I hope all goes well in March/April next year.

Malcolm Haswell
e.m. unit
School of Health, Natural and Social Sciences
Fleming Building
University of Sunderland
Tyne & Wear
SR1 3SD
UK
e-mail: malcolm.haswell-at-sunderland.ac.uk


----- Original Message -----
X-from: eq23-at-rice.edu

Stephane asks ...

} - why is the integration of the peaks in the EDX spectrum
} called "weight %"?
} - Does the intensity if the peaks in EDX depend on the atomic
} weight? In other words, do heavier elements produce more
} x-rays than lighter elements? It is a hard for me to believe
} this, because electron shells are the same for light and
} heavy elements (a K shell is a K shell), however it is the
} only reason I can see to calculate an atom% value.

The EPMA technique, whether EDX or WDX, is more sensitive to mass% than
atom%. I know this is somewhat counter-intuitive and I remember having the
same conceptual problems myself. However, you can do simple tests with
stoichometric compounds that include heavy and lighter atomic numbers. A
good example would be to compare Fe metal and FeO. If you integrate the Fe
Ka peak for both you'll see that for FeO it almost directly calculates the
mass fraction rather than the atom fraction.

Therefore mass fractions are always the direct result of EPMA, while atom
fractions are calculated secondarily. Most analysts will always report the
mass% because it will include the actual total of all elements, while the
atom% will always be a result of having normalized to 100%.

HTH & cheerios, michael shaffer :o)
SEM-MLA Research Coodinator
INCO Innovation Centre
Memorial University
St. John's Newfoundland
http://www.mun.ca/creait/maf/


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From: dsherman-at-purdue.edu
Date: Fri, 24 Aug 2007 09:10:59 -0500
Subject: [Microscopy] Safety issues with microwave

Contents Retrieved from Microscopy Listserver Archives
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Folks,

We currently have and use heavily an older scientific microwave for EM
sample preparation. It currently sits in a fume hood so that not only will
vapors be vented efficiently from the microwave vent but also when the door
is opened. Samples are handled exclusively in the hood and all reagents are
kept in the hood adjacent to the microwave so that at no time does hazardous
materials have to be transported through the open room during sample
preparation.

I have been asked to relinquish the hood. This will require placing the
microwave on the bench in an open lab. The top of the microwave would have
to be vented into an adjacent hood and all reagents and samples would need
to be moved between this hood and the microwave through the open lab space.

My concern is a safety one. We already had one technician who had an
adverse reaction to fumes (gloved fingers swelling, numbness) when we tried
a similar configuration some years ago. We had the microwave on a table at
90o from the hood so the distance to move samples and chemicals between the
two were as short as possible. The microwave vent tube was run into the
hood. This technician has not had any adverse reactions since the
microwave and all processing is done in the same hood.

I would like to hear from others as to what your feeling are concerning the
safety issues involved and what you feel is the appropriate way to deal with
these safety issues.

Debby

Debby Sherman, Director Phone: 765-494-6666
Life Science Microscopy Facility FAX: 765-494-5896
Purdue University E-mail: dsherman-at-purdue.edu
S-052 Whistler Building
170 S. University Street
West Lafayette, IN 47907
http://www.agriculture.purdue.edu/microscopy


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From: lkerr-at-mbl.edu
Date: Fri, 24 Aug 2007 09:14:11 -0500
Subject: [Microscopy] recipe for Au on C and Al/W dendrites

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Ken,

While filing your summary I came across the following technical article
that describes the gold on carbon sample as well as others.

Humenansky, John. (1987). Manufacture and use of test samples to adjust
and evaluate the SEM, TEM and STEM. EMSA Bulletin 17:1 68-72.

Hope all is well,
Louie

kenconverse-at-qualityimages.biz wrote:

} ----------------------------------------------------------------------------
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} Dear listers,
} Here are the replies I got. Very helpful. Thank you all.
} Ken Converse
} owner
}
} QUALITY IMAGES
} Servicing Scanning Electron Microscopes
} Since 1981
} 474 So. Bridgton Rd.
} Bridgton, ME 04009
} 207-647-4348
} Fax 207-647-2688
} kenconverse-at-qualityimages.biz
} qualityimages.biz
}
}
} I inadvertently made a Al/W dendrite sample by heating Al foil (or
} wire, I don't remember) in a W coil basket in my vacuum evaporator
} when making a telescope mirror. The Al embrittles the W and as you
} evaporate the Al, eventually the W wire breaks and you are left with
} a glob of Al in the basket. Looks great in BSE mode.
} Henk
} ****************************************************************************
} ***
}
} I have made the Al-W dendritic structures in an evaporator. From my
} observations;
} 1. Use excess Al for the charge.
} 2. Heat the charge until the Al is molten. I usually cut-back on heating
} power, you need just enough to keep the Al molten for about 3 minutes,
} without evaporating it all away. 3. Cool the molten blob rapidly by just
} shutting off the heater power. 4. The dendritic structures are located in
} small "pockets" near the top of the now solidified blob.
} Joseph M. Oparowski
} ****************************************************************************
} *****
}
} I don't know the answer to your question but as far as dendritic grow is
} concerned, here is what I do know...
}
} Dendritic growth is a process where one constituent of an alloy begins to
} solidfy before another. This leaves the liquid with a compostion lower in
} the first constituent and higher in the second. The process of the growing
} is limited by a diffusion process of the two components in the liquid.
} This means you get smaller dendrites with faster cooling rates and larger
} dendrites with slower cooling rates. However, if you cool fast enough, you
} can't get the diffusion process happening, and so then you don't get any
} dendritic growth. If you cool really slow, well, then it depends upon the
} alloy....
}
} You have asked about Al/W. Now those two have really different melting
} points so I'd think you'd get darned good dentritic growth with those two
} just about no matter how you cooled it... If you went slow, I'd bet you'd
} get a lot of interdendritic shrinkage cavities though....
}
} Also, I don't know how big of a structure you want, but it would be my
} guess that you could cool that alloy pretty quick and have some nice
} dendritic growth...
}
} What did you do the first time you tried that? And how did it turn out?
}
} If someone does answer you with a lot more info, I'd like to find out
} myself...If you don't mind sending along the info..
}
} Dj
} ***************************************************************************
}
} It has been a while since I made these, but I will try to remember. To make
} the best gold-on-carbon islands, you evaporate pure gold onto polished
} spectrographic-grade graphite, then post-heat the sample to make the islands
} coalesce a bit. Takes a few tries to get both the amount of gold and the
} post heating right. Some of the ones I've seen also have a bit of evaporated
} tin on top of that; it makes little balls decorating the big balls and is
} better for a FESEM and high resolution testing. To make the Al-W phase, just
} put pure Al in a W basket and heat it up until the aluminum melts, then
} evaporates. Soon after that, the W basket will break at one of the arms,
} because the Al-W alloy formed is very brittle. The basket with the cooled Al
} in it will show the dendrites and a pretty Al-W phase. I'm not sure if
} cooling fast or slow matters, it cools pretty fast when the wire breaks.
} Good luck,
}
} Mary Fletcher
} ****************************************************************************
} **
}
} I once saw a beautiful, albeit unintentional, resolution sample of someone
} who evaporated gold onto an anthracite coal sample. I thought that the gold
} on carbon were made by evaporating gold onto a warm polished graphite
} surface. The gold doesn't wet the carbon and forms islands. If you stop
} the deposition just before coalescence of the Au islands, you have your
} resolution sample. Gold has a tendency to films by island coalescence on
} most substrates. That is why it has a rough structure and is not a good
} choice for high resolution SEM imaging.
}
} For an alloy that forms a dendritic structure, the microstructure will be
} finer with a higher cooling rate.
}
} Scott D. Walck, Ph.D.
} ****************************************************************************
} ****
}
}
}
}
} _________________________________________________________________
} Need personalized email and website? Look no further. It's easy
} with Doteasy $0 Web Hosting! Learn more at www.doteasy.com
}
}
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--
Louie Kerr
Research and Education Support Coordinator
Marine Biological Laboratory
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VISIT OUR WEB SITES:
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From: Walter.Bobrowski-at-pfizer.com
Date: Fri, 24 Aug 2007 09:31:32 -0500
Subject: [Microscopy] Safety issues with microwave

Contents Retrieved from Microscopy Listserver Archives
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Hi Deb.
That microwave should be under a portable hooded enclosure which can be
vented to the main hood, with sufficient adjoining work space for
reagent handling.
Check out the vented bench top workstations from Flow Sciences:
http://www.flowsciences.com

Also, you didn't state the protective wear your colleague was wearing. I
highly recommend the use of non-powdered Nitrile gloves (double up and
discard the outer layer if they become fairly contaminated with resin).

Best regards,

Walter F. Bobrowski
Sr. Scientist
Pfizer Global R&D
2800 Plymouth Rd.
Ann Arbor, MI 48105

TEL: 734-622-7814
FAX: 734-622-5718

"Like the strength of a steel rod, the true character of a person can
only be known under extreme stress." - Leslie Fieger




-----Original Message-----
X-from: dsherman-at-purdue.edu [mailto:dsherman-at-purdue.edu]
Sent: Friday, August 24, 2007 10:20 AM
To: Bobrowski, Walter

Folks,

We currently have and use heavily an older scientific microwave for EM
sample preparation. It currently sits in a fume hood so that not only
will
vapors be vented efficiently from the microwave vent but also when the
door
is opened. Samples are handled exclusively in the hood and all reagents
are
kept in the hood adjacent to the microwave so that at no time does
hazardous
materials have to be transported through the open room during sample
preparation.

I have been asked to relinquish the hood. This will require placing the
microwave on the bench in an open lab. The top of the microwave would
have
to be vented into an adjacent hood and all reagents and samples would
need
to be moved between this hood and the microwave through the open lab
space.

My concern is a safety one. We already had one technician who had an
adverse reaction to fumes (gloved fingers swelling, numbness) when we
tried
a similar configuration some years ago. We had the microwave on a table
at
90o from the hood so the distance to move samples and chemicals between
the
two were as short as possible. The microwave vent tube was run into the
hood. This technician has not had any adverse reactions since the
microwave and all processing is done in the same hood.

I would like to hear from others as to what your feeling are concerning
the
safety issues involved and what you feel is the appropriate way to deal
with
these safety issues.

Debby

Debby Sherman, Director Phone: 765-494-6666
Life Science Microscopy Facility FAX: 765-494-5896
Purdue University E-mail: dsherman-at-purdue.edu
S-052 Whistler Building
170 S. University Street
West Lafayette, IN 47907
http://www.agriculture.purdue.edu/microscopy


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From: gmartens-at-interchange.ubc.ca
Date: Fri, 24 Aug 2007 10:14:31 -0500
Subject: [Microscopy] Re: Safety issues with microwave

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopylistserver.com/MicroscopyListserver/MicroscopyArchives.html

Hi Debby,

We have similar situation to your original situation. Our main
processing microwave sits right next to the hood and is vented
through a properly taped duct system. We try to train our clients to
always use the vacuum chamber, regardless if they are applying vacuum
or not. The chamber can be closed during the transfer from the hood
to the microwave.

Our main issue is getting people to clean up after themselves. If
anyone has a nice way to convince your clients to clean up after they
finish processing I would love to hear it. The usual threats of
taking away privileges does not seem to work.

Garnet

--
Garnet Martens

Research Manager
BioImaging Facility
University of British Columbia
6270 University Blvd.
Vancouver, B.C.
Canada
V6T 1Z4

phone 604-822-3354

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From: heckman-at-bgnet.bgsu.edu
Date: Fri, 24 Aug 2007 10:17:14 -0500
Subject: [Microscopy] Re: viaWWW: Osmium tetroxide on Lowicryl Sections

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Kenneth-
I have never tried this, but I would be surpised if it would work.
Lowicrl resin is itself quite reactive, and I would expect it to have
reacted with a lot of the primary and secondary amines that OsO4
reacts with. This may be worth a try though. It has never been
reported, to my knowledge, so it would be new knowledge.
Carol


} ----------------------------------------------------------------------------
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--
Carol A. Heckman, Ph.D.
Director, Center for Microscopy & Microanalysis
and Professor of Biological Sciences
Bowling Green State University
Bowling Green, OH 43403
USA
website: http://www.bgsu.edu/departments/biology/facilities/MnM

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From: Elliott-at-arizona.edu
Date: Fri, 24 Aug 2007 10:29:24 -0500
Subject: [Microscopy] cleaning up [was - Safety issues with microwave]

Contents Retrieved from Microscopy Listserver Archives
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How about billing them for the cleanup time (at the extra-special
unsubsidized billing rate)? Call it a 'service' for those too busy
to be good citizens.
David


On Aug 24, 2007, at 8:17 AM, gmartens-at-interchange.ubc.ca wrote:

} Our main issue is getting people to clean up after themselves. If
} anyone has a nice way to convince your clients to clean up after they
} finish processing I would love to hear it. The usual threats of
} taking away privileges does not seem to work.


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From: Andrew.Bowling-at-ARS.USDA.GOV
Date: Fri, 24 Aug 2007 10:40:47 -0500
Subject: [Microscopy] Re: viaWWW: Osmium tetroxide on Lowicryl Sections

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopylistserver.com/MicroscopyListserver/MicroscopyArchives.html

Hello Kenneth,

2 minutes in 2% UA and 30 seconds in lead citrate give strong staining
with LR and Lowicryl. This will give negative contrast on membranes and
positive contrast of microtubules. Ribosomes stand out very clearly,
too.

Also, I would recommend 2% (unbuffered) potassium permanganate for 2
minutes. This will give good positive contrast of membranes. (My
experiences are mostly with plant material, however.)

Pre-embedding treatment of tissue with 2% UA overnight before lowicryl
will preserve/stabilize the membrane as well as give them some contrast
after sectioning.

Kevin Vaughn


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From: tstephen-at-mic.tamu.edu
Date: Fri, 24 Aug 2007 11:44:36 -0500
Subject: [Microscopy] SEM of hydrogels, anyone have contamination problems?

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopylistserver.com/MicroscopyListserver/MicroscopyArchives.html

Hi,

Has anyone had contamination problems when looking at PEGDA (polyethylene
glycol-diacrylate) hydrogels using SEM?

Many thanks!

Tom

Tom Stephens
Assistant Research Scientist
Microscopy and Imaging Center
Texas A&M University
College Station, TX 77843
phone:979-845-1129
fax:979-847-8933
email:tstephen-at-mic.tamu.edu


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From: jvtaylo-at-emory.edu
Date: Fri, 24 Aug 2007 16:14:43 -0500
Subject: [Microscopy] dark field STEM

Contents Retrieved from Microscopy Listserver Archives
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I have observed gold islands before that resulted from heating
gold-coated silica at several hundred degrees (a client's project).
Prompted by the current discussion and our own need for such a sample, I
decided to go low-tech and try replicating the result with gold on
carbon.

I sputtered several garden-variety graphite stubs with about 20 nm of
gold and heated the samples in a muffle furnace at about 500 C for about
two hours. I was busy with other things and did not control the time
well. I also did not experiment with the temperature or the thickness of
gold. (I probably should go read Humenansky's note.)

I got decent islands of gold on all samples. I have posted images on our
server at ftp://www.marl.iastate.edu/Gold-on-C/. The images were
comparable to those from our service engineers gold-on-carbon samples.
Now I wonder why I didn't try this sooner.

Warren Straszheim

-----Original Message-----
X-from: lkerr-at-mbl.edu [mailto:lkerr-at-mbl.edu]
Sent: Friday, August 24, 2007 9:15 AM
To: wesaia-at-iastate.edu

I have a question for the List. What is Dark Field STEM? I have a
student in our department who wants to use Dark Field STEM to image some
fibers and use it to calculate mass per unit length. Mass is directly
proportional to the density of the fiber. This is in reference to an
article by C. S. Goldsbury in 2000. I need help in understanding how
this is not just SEM imaging or inverted STEM imaging and in
understanding what programs were used to make the measurements and
calculations. Any comments and advice would be welcome.

Thanks, Jeannette

--
Jeannette Taylor, Technologist II
IM&MF
Cherry L. Emerson Hall, Room E106
Emory University
1515 Dickey Drive
Atlanta, Georgia 30322

Phone: 404-712-8674
FAX: 404-727-7760
jvtaylo-at-emory.edu
http://www.electronmicroscopy.emory.edu/


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From: jpchandl-at-mines.edu
Date: Fri, 24 Aug 2007 17:20:14 -0500
Subject: [Microscopy] Gatan DuoMill maintenance question

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopylistserver.com/MicroscopyListserver/MicroscopyArchives.html

We're trying to "resurrect" an old Gatan DuoMill and have a problem.
Basically, the back guns on both sides have a "dark current" of ~0.5mA when
the voltage is set at 6kV and there is no gas flow. When you introduce gas,
you can get a beam that looks almost normal. The front guns appear to work
correctly but when you select both guns, the back gun appears to be the only
one working. Thus, we're trying to identify the source of the "dark
current" as that appears to make milling from both sides impossible. Any
veterans with experience on these things with suggestions?

Thanks very much for any suggestions.

--John
John Chandler, Ph.D.
Manager, Electron Microscopy Lab
Colorado School of Mines
1500 Illinois Street
Golden, CO 80401-1887
jpchandl-at-mines.edu
303.384.2203




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From: tivol-at-caltech.edu
Date: Fri, 24 Aug 2007 17:54:49 -0500
Subject: [Microscopy] Re: dark field STEM

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopylistserver.com/MicroscopyListserver/MicroscopyArchives.html


On Aug 24, 2007, at 2:14 PM, jvtaylo-at-emory.edu wrote:

} I have a question for the List. What is Dark Field STEM? I have a
} student in our department who wants to use Dark Field STEM to image
} some
} fibers and use it to calculate mass per unit length. Mass is directly
} proportional to the density of the fiber. This is in reference to an
} article by C. S. Goldsbury in 2000. I need help in understanding how
} this is not just SEM imaging or inverted STEM imaging and in
} understanding what programs were used to make the measurements and
} calculations. Any comments and advice would be welcome.

Dear Jeanette,
Dark field STEM uses a focussed beam rastered across the specimen to
produce an image consisting only of scattered electrons. This is
realized by having a detector that does not detect the unscattered
beam. For example, a small dot of absorbing material can be put in
the objective lens back focal plane where the unscattered beam goes,
i.e., in the center of the diffraction pattern, and the unabsorbed
electrons can continue on to the detector, or a detector with a hole
in the center can be placed in a plane conjugate to the diffraction
plane. A practical method that can be used with some specimens is to
put the objective aperture off-center to block the unscattered beam.
This method produces an image that includes only some of the Fourier
components, but if the fiber has the same composition along its
length, the proportion of the total scattered beam to that which
passes through the aperture and is detected will be constant, so
relative measurements of the mass per unit length should be OK.
Yours,
Bill Tivol, PhD
EM Scientist
Electron Cryo-Microscopy Facility
Broad Center, Mail Code 114-96
California Institute of Technology
Pasadena CA 91125
(626) 395-8833
tivol-at-caltech.edu


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From: walck-at-southbaytech.com
Date: Fri, 24 Aug 2007 18:01:05 -0500
Subject: [Microscopy] Gatan DuoMill maintenance question

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopylistserver.com/MicroscopyListserver/MicroscopyArchives.html

I haven't worked on a DuoMill in a long time, but here are some things that
I would look for.

What's the color of the plasma that you can see in the gun? If it is not
purple, then you have a vacuum leak. Nitrogen will look pinkish. Nitrogen
will ionize much more easily than Ar and if you set it up for both guns,
your current will be the one with N2, not the Ar. If it is purple, then you
have a short. It might be a carbon track short or a thin film metallization
short which will only be seen at a higher voltage. Slowly bring the gun up
and see if there is a point where there is a big jump in your current. Your
solution there is to take the gun apart and thoroughly clean it, paying
particular attention to the ceramics. Any metallization or carburization
must be removed or replace the ceramic.


-Scott

Scott D. Walck, Ph.D.
Technical Director
South Bay Technology, Inc.
1120 Via Callejon
San Clemente, CA 92673

US Toll Free: 1-800-728-2233
Tel: (949) 492-2600
Fax: (949) 492-1499

www.southbaytech.com
walck-at-southbaytech.com

-----Original Message-----
X-from: jpchandl-at-mines.edu [mailto:jpchandl-at-mines.edu]
Sent: Friday, August 24, 2007 3:23 PM
To: Walck-at-SouthBayTech.com

We're trying to "resurrect" an old Gatan DuoMill and have a problem.
Basically, the back guns on both sides have a "dark current" of ~0.5mA when
the voltage is set at 6kV and there is no gas flow. When you introduce gas,
you can get a beam that looks almost normal. The front guns appear to work
correctly but when you select both guns, the back gun appears to be the only
one working. Thus, we're trying to identify the source of the "dark
current" as that appears to make milling from both sides impossible. Any
veterans with experience on these things with suggestions?

Thanks very much for any suggestions.

--John
John Chandler, Ph.D.
Manager, Electron Microscopy Lab
Colorado School of Mines
1500 Illinois Street
Golden, CO 80401-1887
jpchandl-at-mines.edu
303.384.2203




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{microscopy-at-microscopy.com} 6, 19 -- Subject: Gatan DuoMill maintenance
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From: walck-at-southbaytech.com
Date: Fri, 24 Aug 2007 19:42:49 -0500
Subject: [Microscopy] SEM: wt% or atom% ?

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopylistserver.com/MicroscopyListserver/MicroscopyArchives.html

I haven't seen a response to this, but you are way off-base on your
assumptions.

The wt% and at.% are simply two ways of expressing compositions. The wt% is
typically output because materials scientist will almost universally use
wt.% to express phase diagrams. The area under an X-ray peak is called the
integrated peak intensity (after the background intensity is subtracted.)
All of the X-ray microanalysis techniques for bulk samples have to account
for atomic number, density, and fluorescence effects. These corrections
correct for the production of X-rays as a function of depth (the phi-rho-z
curve), absorption of X-rays as a function of depth, fluorescence as a
function of depth. Now all of these corrections depend on the composition.
The integrated peak intensities for the elements are used to iteratively
calculate the compositions. These calculations in the various correction
routines are easier to perform using the wt% values for concentrations. I
suggest that you look at the Goldstein et al. book for SEM and
Microanalysis.

To calculate the at.% of Fe in FeO is easy. It is 1/(1+1) = 0.5 or 50 at.%.
For Fe2O3 it is 2/(2+3)= 0.4 or 40%.

To calculate the wt.%, you need to use the atomic weights of the elements.

For Fe in FeO, you have 1*55.85/(1*55.85+1*16.00) = 0.777 or 77.7 wt.%. For
Fe2O3 it is (2*55.85)/(2*55.85 + 3*16.00) = 0.699 or 69.9 wt.%.

Once the software finds the wt%, it uses a relatively simple algorithm to
calulate the at.%.

You should check any introductory materials science book having a chapter on
phase diagrams to see how it is done.

To answer your third question, they are equivalent. When you do an oxide,
doing the oxide by ratio, it is easier to do it by at.%.



Now the other question that you asked is again tied up in the stuff that I
said above, but there is another thing that you should be aware of and that
is the issue of fluorescence yield. There are two competing physical
processes that can occur to relieve the excess energy in an atom when a core
electron is ejected from that atom. The first is X-ray emission which you
are familiar with. The second is Auger electron emission (After Pierre
Auger). Auger electron emission is a two electron emission process. Let's
take a K shell excitation example. Just as in the emission of a K-alpha
X-ray, an electron from the L shell drops into the K shell, but instead of
the excess energy coming off in the form of a an X-ray, the excess energy
left is enough to ionize another L shell electron. This would be the
emission of a KLL Auger electron. Auger electron spectroscopy if a surface
analytical technique since the Auger electrons will loose an indeterminate
amount of energy if it is emitted within the bulk of the sample and it is
just added to the backscattered electron background. X-rays and Auger are
competing processes. The X-ray fluorescence yield is the probability of an
X-ray being generated when a core shell electron is ionized. The X-ray
fluorescence yield is higher for heavier elements than lighter ones. The
auger yield is more prevalent for light elements. This is just another
natural physical thing that the analyst is fighting against when doing light
element X-ray microanalysis.




-Scott

Scott D. Walck, Ph.D.
Technical Director
South Bay Technology, Inc.
1120 Via Callejon
San Clemente, CA 92673

US Toll Free: 1-800-728-2233
Tel: (949) 492-2600
Fax: (949) 492-1499

www.southbaytech.com
walck-at-southbaytech.com

-----Original Message-----
X-from: nizets2-at-yahoo.com [mailto:nizets2-at-yahoo.com]
Sent: Thursday, August 23, 2007 12:26 AM
To: Walck-at-SouthBayTech.com

Dear listers,

I will post soon a summary of all the interesting answers I got for the
problem of carbon-free preparation of samples for SEM-EDX (not a lot of
solution, though).

Now I face a pretty stupid problem that my pair of neurons can't resolve.
When I perform an EDX analysis in SEM (Oxford Instrument's INCA software), I
obtain 2 values for each peak: weight % and atom %.
I guess that weight % represents the integration of each peak area, whereas
atom% represents weight%/atomic weight. Now the 2 values can significantly
differ, and thus the element ratio of my samples can also be significantly
different. And that is precisely what I want to know!

Now, please allow to ask some questions:

- why is the integration of the peaks in the EDX spectrum called "weight %"?
- Does the intensity if the peaks in EDX depend on the atomic weight? In
other words, do heavier elements produce more x-rays than lighter elements?
It is a hard for me to believe this, because electron shells are the same
for light and heavy elements (a K shell is a K shell), however it is the
only reason I can see to calculate an atom% value.
- Which one of the 2 values to use, in which case and why?

Thank you in advance.

Stephane






____________________________________________________________________________
________
Yahoo! oneSearch: Finally, mobile search that gives answers, not web links.
http://mobile.yahoo.com/mobileweb/onesearch?refer=1ONXIC

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From: cni-at-udel.edu
Date: Fri, 24 Aug 2007 22:13:13 -0500
Subject: [Microscopy] SEM: wt% or atom% ?

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopylistserver.com/MicroscopyListserver/MicroscopyArchives.html

Hi Stephane,

I'm in complete agreement with Scott. Also, you can learn a bit more
from any textbooks of Modern Physics.

The Answer to your question at the end is "Yes". The K shell of atom A
is different of the K shell of atom B as far as their binding energy is
concerned. Also given the fact of the existence of ONE vacancy in the K
shell, the probability to generate X-ray photons is deferent from Z1
(element one) to Z2 (element two), so are the energy amount of any
individual X-rays dictated by characteristic orbit energy differences.

Please note, when you do quantification, you need to take into
consideration of a factor called "ZAF", standing for "atomic number",
"absorption", and "florescence". For example, a total integral of a
lighter element A peak generally carries more weight than the same total
integral of a corresponding heavier element B beak assuming the primary
energy of the e-beam is sufficient.

Wt% and at% are equivalent (please find that in any General Chemistry
book.)

Yes, reading some more books shall help!

Chaoying Ni
http://eml.masc.udel.edu



------------
- Does the intensity if the peaks in EDX depend on the atomic weight? In
other words, do heavier elements produce more x-rays than lighter
elements? It is a hard for me to believe this, because electron shells
are the same for light and heavy elements (a K shell is a K shell),
however it is the only reason I can see to calculate an atom% value.



-----Original Message-----
X-from: walck-at-southbaytech.com [mailto:walck-at-southbaytech.com]
Sent: Friday, August 24, 2007 8:45 PM
To: cni-at-UDel.Edu

I haven't seen a response to this, but you are way off-base on your
assumptions.

The wt% and at.% are simply two ways of expressing compositions. The
wt% is
typically output because materials scientist will almost universally use
wt.% to express phase diagrams. The area under an X-ray peak is called
the
integrated peak intensity (after the background intensity is
subtracted.)
All of the X-ray microanalysis techniques for bulk samples have to
account
for atomic number, density, and fluorescence effects. These corrections
correct for the production of X-rays as a function of depth (the
phi-rho-z
curve), absorption of X-rays as a function of depth, fluorescence as a
function of depth. Now all of these corrections depend on the
composition.
The integrated peak intensities for the elements are used to iteratively
calculate the compositions. These calculations in the various
correction
routines are easier to perform using the wt% values for concentrations.
I
suggest that you look at the Goldstein et al. book for SEM and
Microanalysis.

To calculate the at.% of Fe in FeO is easy. It is 1/(1+1) = 0.5 or 50
at.%.
For Fe2O3 it is 2/(2+3)= 0.4 or 40%.

To calculate the wt.%, you need to use the atomic weights of the
elements.

For Fe in FeO, you have 1*55.85/(1*55.85+1*16.00) = 0.777 or 77.7 wt.%.
For
Fe2O3 it is (2*55.85)/(2*55.85 + 3*16.00) = 0.699 or 69.9 wt.%.

Once the software finds the wt%, it uses a relatively simple algorithm
to
calulate the at.%.

You should check any introductory materials science book having a
chapter on
phase diagrams to see how it is done.

To answer your third question, they are equivalent. When you do an
oxide,
doing the oxide by ratio, it is easier to do it by at.%.



Now the other question that you asked is again tied up in the stuff that
I
said above, but there is another thing that you should be aware of and
that
is the issue of fluorescence yield. There are two competing physical
processes that can occur to relieve the excess energy in an atom when a
core
electron is ejected from that atom. The first is X-ray emission which
you
are familiar with. The second is Auger electron emission (After Pierre
Auger). Auger electron emission is a two electron emission process.
Let's
take a K shell excitation example. Just as in the emission of a K-alpha
X-ray, an electron from the L shell drops into the K shell, but instead
of
the excess energy coming off in the form of a an X-ray, the excess
energy
left is enough to ionize another L shell electron. This would be the
emission of a KLL Auger electron. Auger electron spectroscopy if a
surface
analytical technique since the Auger electrons will loose an
indeterminate
amount of energy if it is emitted within the bulk of the sample and it
is
just added to the backscattered electron background. X-rays and Auger
are
competing processes. The X-ray fluorescence yield is the probability of
an
X-ray being generated when a core shell electron is ionized. The X-ray
fluorescence yield is higher for heavier elements than lighter ones.
The
auger yield is more prevalent for light elements. This is just another
natural physical thing that the analyst is fighting against when doing
light
element X-ray microanalysis.




-Scott

Scott D. Walck, Ph.D.
Technical Director
South Bay Technology, Inc.
1120 Via Callejon
San Clemente, CA 92673

US Toll Free: 1-800-728-2233
Tel: (949) 492-2600
Fax: (949) 492-1499

www.southbaytech.com
walck-at-southbaytech.com

-----Original Message-----
X-from: nizets2-at-yahoo.com [mailto:c]
Sent: Thursday, August 23, 2007 12:26 AM
To: Walck-at-SouthBayTech.com

Dear listers,

I will post soon a summary of all the interesting answers I got for the
problem of carbon-free preparation of samples for SEM-EDX (not a lot of
solution, though).

Now I face a pretty stupid problem that my pair of neurons can't
resolve.
When I perform an EDX analysis in SEM (Oxford Instrument's INCA
software), I
obtain 2 values for each peak: weight % and atom %.
I guess that weight % represents the integration of each peak area,
whereas
atom% represents weight%/atomic weight. Now the 2 values can
significantly
differ, and thus the element ratio of my samples can also be
significantly
different. And that is precisely what I want to know!

Now, please allow to ask some questions:

- why is the integration of the peaks in the EDX spectrum called "weight
%"?
- Does the intensity if the peaks in EDX depend on the atomic weight? In
other words, do heavier elements produce more x-rays than lighter
elements?
It is a hard for me to believe this, because electron shells are the
same
for light and heavy elements (a K shell is a K shell), however it is the
only reason I can see to calculate an atom% value.
- Which one of the 2 values to use, in which case and why?

Thank you in advance.

Stephane






________________________________________________________________________
____
________
Yahoo! oneSearch: Finally, mobile search that gives answers, not web
links.
http://mobile.yahoo.com/mobileweb/onesearch?refer=1ONXIC

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From: cni-at-udel.edu
Date: Sat, 25 Aug 2007 06:10:46 -0500
Subject: [Microscopy] SEM: wt% or atom% ?

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopylistserver.com/MicroscopyListserver/MicroscopyArchives.html

I meant given wt%'s of elements A, B, C., their at%'s can be calculated,
or vice versa, of course, unless you would definitely prefer a specific
stoichiometry for some elements among the A, B, C.. -cni

-----Original Message-----
X-from: Straszheim, Warren E [M S E] [mailto:wesaia-at-iastate.edu]
Sent: Saturday, August 25, 2007 12:17 AM
To: cni-at-UDel.Edu

Hi Stephane,

I'm in complete agreement with Scott. Also, you can learn a bit more
from any textbooks of Modern Physics.

The Answer to your question at the end is "Yes". The K shell of atom A
is different of the K shell of atom B as far as their binding energy is
concerned. Also given the fact of the existence of ONE vacancy in the K
shell, the probability to generate X-ray photons is deferent from Z1
(element one) to Z2 (element two), so are the energy amount of any
individual X-rays dictated by characteristic orbit energy differences.

Please note, when you do quantification, you need to take into
consideration of a factor called "ZAF", standing for "atomic number",
"absorption", and "florescence". For example, a total integral of a
lighter element A peak generally carries more weight than the same total
integral of a corresponding heavier element B beak assuming the primary
energy of the e-beam is sufficient.

Wt% and at% are equivalent (please find that in any General Chemistry
book.)

Yes, reading some more books shall help!

Chaoying Ni
http://eml.masc.udel.edu



------------
- Does the intensity if the peaks in EDX depend on the atomic weight? In
other words, do heavier elements produce more x-rays than lighter
elements? It is a hard for me to believe this, because electron shells
are the same for light and heavy elements (a K shell is a K shell),
however it is the only reason I can see to calculate an atom% value.



-----Original Message-----
X-from: walck-at-southbaytech.com [mailto:walck-at-southbaytech.com]
Sent: Friday, August 24, 2007 8:45 PM
To: cni-at-UDel.Edu

I haven't seen a response to this, but you are way off-base on your
assumptions.

The wt% and at.% are simply two ways of expressing compositions.  The
wt% is
typically output because materials scientist will almost universally use
wt.% to express phase diagrams.  The area under an X-ray peak is called
the
integrated peak intensity (after the background intensity is
subtracted.)
All of the X-ray microanalysis techniques for bulk samples have to
account
for atomic number, density, and fluorescence effects.  These corrections
correct for the production of X-rays as a function of depth (the
phi-rho-z
curve), absorption of X-rays as a function of depth, fluorescence as a
function of depth.  Now all of these corrections depend on the
composition.
The integrated peak intensities for the elements are used to iteratively
calculate the compositions.  These calculations in the various
correction
routines are easier to perform using the wt% values for concentrations.
I
suggest that you look at the Goldstein et al. book for SEM and
Microanalysis.

To calculate the at.% of Fe in FeO is easy.  It is 1/(1+1) = 0.5 or 50
at.%.
For Fe2O3 it is 2/(2+3)= 0.4 or 40%.

To calculate the wt.%, you need to use the atomic weights of the
elements. 

For Fe in FeO, you have 1*55.85/(1*55.85+1*16.00) = 0.777 or 77.7 wt.%.
For
Fe2O3 it is (2*55.85)/(2*55.85 + 3*16.00) = 0.699 or 69.9 wt.%.

Once the software finds the wt%, it uses a relatively simple algorithm
to
calulate the at.%. 

You should check any introductory materials science book having a
chapter on
phase diagrams to see how it is done.

To answer your third question, they are equivalent.  When you do an
oxide,
doing the oxide by ratio, it is easier to do it by at.%.



Now the other question that you asked is again tied up in the stuff that
I
said above, but there is another thing that you should be aware of and
that
is the issue of fluorescence yield.  There are two competing physical
processes that can occur to relieve the excess energy in an atom when a
core
electron is ejected from that atom.  The first is X-ray emission which
you
are familiar with.  The second is Auger electron emission (After Pierre
Auger).  Auger electron emission is a two electron emission process.
Let's
take a K shell excitation example.  Just as in the emission of a K-alpha
X-ray, an electron from the L shell drops into the K shell, but instead
of
the excess energy coming off in the form of a an X-ray, the excess
energy
left is enough to ionize another L shell electron.  This would be the
emission of a KLL Auger electron.  Auger electron spectroscopy if a
surface
analytical technique since the Auger electrons will loose an
indeterminate
amount of energy if it is emitted within the bulk of the sample and it
is
just added to the backscattered electron background.  X-rays and Auger
are
competing processes.  The X-ray fluorescence yield is the probability of
an
X-ray being generated when a core shell electron is ionized.  The X-ray
fluorescence yield is higher for heavier elements than lighter ones.
The
auger yield is more prevalent for light elements.  This is just another
natural physical thing that the analyst is fighting against when doing
light
element X-ray microanalysis.




-Scott

Scott D. Walck, Ph.D.
Technical Director
South Bay Technology, Inc.
1120 Via Callejon
San Clemente, CA  92673

US Toll Free: 1-800-728-2233
Tel: (949) 492-2600
Fax: (949) 492-1499

www.southbaytech.com
walck-at-southbaytech.com

-----Original Message-----
X-from: nizets2-at-yahoo.com [mailto:c]
Sent: Thursday, August 23, 2007 12:26 AM
To: Walck-at-SouthBayTech.com

Dear listers,

I will post soon a summary of all the interesting answers I got for the
problem of carbon-free preparation of samples for SEM-EDX (not a lot of
solution, though).

Now I face a pretty stupid problem that my pair of neurons can't
resolve.
When I perform an EDX analysis in SEM (Oxford Instrument's INCA
software), I
obtain 2 values for each peak: weight % and atom %.
I guess that weight % represents the integration of each peak area,
whereas
atom% represents weight%/atomic weight. Now the 2 values can
significantly
differ, and thus the element ratio of my samples can also be
significantly
different. And that is precisely what I want to know!

Now, please allow to ask some questions:

- why is the integration of the peaks in the EDX spectrum called "weight
%"?
- Does the intensity if the peaks in EDX depend on the atomic weight? In
other words, do heavier elements produce more x-rays than lighter
elements?
It is a hard for me to believe this, because electron shells are the
same
for light and heavy elements (a K shell is a K shell), however it is the
only reason I can see to calculate an atom% value.
- Which one of the 2 values to use, in which case and why?

Thank you in advance.

Stephane





      
________________________________________________________________________
____
________
Yahoo! oneSearch: Finally, mobile search that gives answers, not web
links.
http://mobile.yahoo.com/mobileweb/onesearch?refer=1ONXIC

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From: jrichards-at-macslab.com
Date: Sat, 25 Aug 2007 11:39:48 -0500
Subject: [Microscopy] [Filtered] AskAMicroscopist: Electron diffraction

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This Question was submitted to Ask-A-Microscopist by (jrichards-at-macslab.com)
from http://www.microscopy.org/Ask-A-Microscopist/Ask-A-Microscopist.html on Saturday, August 25, 2007 at 11:29:01
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Email: jrichards-at-macslab.com
Name: Jim Richards

Organization: San Juan Delta College

Education: Undergraduate College

Location: Stockton, CA

Title: Electron diffraction

Question: When looking at a single crystal and obtaining a diffraction pattern (SAED) obviously the electron beam enters the crystal at some angles relative to the crystal's lattice. The d spacing changes as a result of tilting. From this one can determine the zone axis. Therefore one must tilt (single or double) to get a specific zone axis or even get a diffraction pattern that will yield d spacing for a zone axis. How then do people claim that the d spacing will always be the same regardless of the tilt of the sample or how the sample is positioned in the objective lens on the sample holder? Example, we were looking at a gunerite crystal and it was claimed that the d spacing was X and therefore this was enough evidence to conclude that the crystal was gunerite. I don't understand.

Don't you have to find a zone axis by determine the d spacing and the interplaner angle then consult literature or a computer program to determine what zone axis you have and if the spacing matches then you might have that mineral?

Thanks for the help.

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From: jquinn-at-www.matscieng.sunysb.edu
Date: Sat, 25 Aug 2007 12:21:51 -0500
Subject: [Microscopy] re: Gatan DuoMill maintenance question

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John and folks -

If you have a turbo on that DuoMill, then you
are best off swapping front/back parts until
you isolate the problem.

If you have a diff-pump, then you need to
just be more patient.

This should save you the cost of replacinng
every oring, ceramic, octa-tube, gun casing, etc.....

JQuinn


} From mail-at-ns.microscopy.com Fri Aug 24 18:21:37 2007
} Date: Fri, 24 Aug 2007 17:20:55 -0500
} To: jquinn-at-www.matscieng.sunysb.edu
} From: jpchandl-at-mines.edu
} Reply-to: jpchandl-at-mines.edu
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} Subject: [Microscopy] Gatan DuoMill maintenance question
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} We're trying to "resurrect" an old Gatan DuoMill and have a problem.
} Basically, the back guns on both sides have a "dark current" of ~0.5mA when
} the voltage is set at 6kV and there is no gas flow. When you introduce gas,
} you can get a beam that looks almost normal. The front guns appear to work
} correctly but when you select both guns, the back gun appears to be the only
} one working. Thus, we're trying to identify the source of the "dark
} current" as that appears to make milling from both sides impossible. Any
} veterans with experience on these things with suggestions?
}
} Thanks very much for any suggestions.
}
} --John
} John Chandler, Ph.D.
} Manager, Electron Microscopy Lab
} Colorado School of Mines
} 1500 Illinois Street
} Golden, CO 80401-1887
} jpchandl-at-mines.edu
} 303.384.2203
}
}
}
}
} ==============================Original Headers==============================
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From: bgowen-at-uvic.ca
Date: Sat, 25 Aug 2007 12:56:07 -0500
Subject: [Microscopy] Re: viaWWW: Osmium tetroxide on Lowicryl Sections

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Howdi;

Our solution to the common poor section contrasting of fast frozen, freeze
substituted, and low temperature HM20 Lowicryl embedded material was first
presented (on microtubule barrels of isolated centrosomes) in the
(completely obscure) paper… Histochemical Journal 27, 240-246 (1995).

Treating Lowicryl HM20 sections like fresh tissue (= post sectioning
fixation) can produce sections with contrast and morphological
preservation equivalent to epon sections using standard TEM stains.

This technique was then applied to whole mammalian cells low temperature
processed into HM20, resulting in “epon-like’ contrast of whole cells with
well defined membranes and microtubules… Current Biology 5 (12): 1384–1393
(1995).

The technique applied to isolated virus samples… Journal of Virology
73(3): 1931–1940 (1999).

The technique has also been applied to low temperature processed yeast,
bacteria, and plant cells with equally good results (no published images).

“Post-Sectioning fixation” (after sections immunolabelled and in final
water rinse)
1) freshly prepared and filtered 2% tannic acid, pH 7.2 for 10 minutes
2) rinsed three times in 1.0% sodium sulphate, 5 seconds each
3) distilled water rinses, three times for 1 minute each
4) 2% glutaraldehyde in water, 10 minutes
5) distilled water rinses, three times for 1 minute each
6) 1.0% osmium tetroxide in water, 10 minutes
7) distilled water rinses, 4 times for 1 minute each
8) 5% uranyl acetate in 50% ethanol for 10 minutes
9) distilled water rinses, three times for 1 minute each
10) repeat steps 1) – 3) = optional (only if you want to enhance
microtubules to the maximum).
11) 5.0% lead citrate in water, 4 minutes
12) distilled water rinses, four times for 1 minute each

I have only used HM20 and so do not know if this will work with the polar
Lowicryl K4M.

Material lightly aldehyde fixed and processed using the Progressive
Lowering Temperature method often benefits from the post-sectioning
fixation for section contrast as well.

Cheers

B




----------------------------------------------------------------------------
}
} Kenneth-
} I have never tried this, but I would be surpised if it would work.
} Lowicrl resin is itself quite reactive, and I would expect it to have
} reacted with a lot of the primary and secondary amines that OsO4
} reacts with. This may be worth a try though. It has never been
} reported, to my knowledge, so it would be new knowledge.
} Carol
}
}

} } Email: kdunnerj-at-mdanderson.org
} } Name: Kenneth Dunner Jr
} }
} } Organization: MD Anderson Cancer Center
} }
} } Title-Subject: [Filtered] Osmium tetroxide on Lowicryl Sections
} }
} } Question: A colleague I know wants to know has anyone used osmium
} } tetroxide on post embedded immunogold labeled Lowicryl sections to
} } make microtubules or other membranes stand out?
} }
} } ---------------------------------------------------------------------------


**********************************************************************
Brent Gowen
Electron Microscopy Laboratory
Department of Biology
University of Victoria
P.O. Box 3020 STN CSC
Victoria, BC, Canada
V8W 3N5
Tel: (250)-721-7132
http://web.uvic.ca/em-lab/



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From: larry-at-cymru666.plus.com
Date: Sun, 26 Aug 2007 03:35:22 -0500
Subject: [Microscopy] Re: [Filtered] AskAMicroscopist: Electron diffraction

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As you tilt a crystal, different lattice plane sets diffract. So, the
d-spacings of lattice planes is 'fixed', it's just that at different
crystal tilts, different d-spacings appear in the diffraction pattern.

Having said that, unless you are very careful, identifying phases on
the basis of simple selected area diffraction patterns is asking for
trouble bigtime:

1. SAED can only reliably 'select' a known area down to regions of ~1
um. If you do SAED on smaller areas, aberations in the imaging lens
mean that higher order reflections come from regions different from
the lower order reflections. So, SAED with multi-phase samples and
small crystal will be asking for the wrong answer.

2. The calibration of any TEM camera length is only accurate to ~5%,
unless you use an internal calibration with known d-spacings.

3. Taking into consideration the above, you should really do exactly
as you say - find a zone axis, identify the axis and measure
interplanar spacings/angles. Even so, you need to keep in mind that
the accuracy of measurement is ~5%, so you then need to be able to
exclude other possible phases with similar crystal structures and
d-spacings.

4. EDS analysis is a big help - knowing the approximate composition
allows you to exclude many possible phases quickly.

5. Personally, I would never use SAED - small probe diffraction
methods are much better, allowing you to reliably do electron
diffraction from small regions. If you use convergent beam electron
diffraction, the pattern symmetries allow you to identify the
crystallography very reliably.

--
Larry Stoter

PLEASE NOTE - Agressive SPAM filtering is employed. If you don't get
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From: dsherman-at-purdue.edu
Date: Sun, 26 Aug 2007 16:39:58 -0500
Subject: [Microscopy] Fume hood for confocal

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Hi all,

I do not work with confocals so am unfamiliar with many of the staining
procedures used for plant as well as animal samples. I would like to know
if it is necessary or even desirable to have a fume hood in the same room
with a high-end confocal.

Also, providing there are the reagents that may require a fume hood, can
this need be satisfied with one of the movable hoods that use filters such
as are used in many light microscope/histology labs?

Does anyone have a source they can recommend for such hoods?

Debby

Debby Sherman, Director Phone: 765-494-6666
Life Science Microscopy Facility FAX: 765-494-5896
Purdue University E-mail: dsherman-at-purdue.edu
S-052 Whistler Building
170 S. University Street
West Lafayette, IN 47907
http://www.agriculture.purdue.edu/microscopy


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From: phillipst-at-missouri.edu
Date: Sun, 26 Aug 2007 20:24:27 -0500
Subject: [Microscopy] Re: Fume hood for confocal

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I have 2 confocals (and about to order my 3rd) and very happy that I don't
have a hood in the same room. the noise and possibly vibration would be
annoying. some older confocals required a blower motor to pull heat away
from the lasers but came with a small fan that blew the air via a dryer
hose into the plenum (i.e., space above the ceiling). the staining for
confocal is no different than any other immunostaining procedure. we have a
hood in a prep room next to our 2 confocals and our clients never use it.
one generally prepares the tissue offsite and brings it to the confocal
room. Good luck, Tom

At 04:42 PM 08/26/07, you wrote:



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Thomas E. Phillips, PhD
Professor of Biological Sciences
Director, Molecular Cytology Core
2 Tucker Hall
University of Missouri
Columbia, MO 65211-7400

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573-882-0123 (fax)
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From: Stuart.McClure-at-csiro.au
Date: Sun, 26 Aug 2007 21:22:01 -0500
Subject: [Microscopy] RE: SEM: wt% or atom% ?

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With respect to at% and wt% you maybe able to
Convert between them using the gravimetric factors

================================================
Stuart McClure
CSIRO Land and Water
Post: P.B#2, Glen Osmond, SA, Australia, 5064
Street: Waite Rd, Urrbrae, SA, Australia, 5064
Site: via Gate #5, Building Taylor-3A, Room 218
International [ x ] National ( x )
Tel-W:  [ 618 ] ( 08 ) 8303 8484
Fax-W:  [ 618 ] ( 08 ) 8303 8550
Tel-H:   [ 618 ] ( 08 ) 8297 3452
Mob-H: [ 61 ]  ( 0 )  428 100 796
Email1: stuart.mcclure-at-csiro.au
Email2: stuart.mcclure-at-gmail.com
Email3: stuart.mcclure-at-adelaide.edu.au
================================================




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From: Stuart.McClure-at-csiro.au
Date: Sun, 26 Aug 2007 21:22:34 -0500
Subject: [Microscopy] Recall: RE: SEM: wt% or atom% ?

Contents Retrieved from Microscopy Listserver Archives
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McClure, Stuart (CLW, Urrbrae) would like to recall the message, "[Microscopy] RE: SEM: wt% or atom% ?".


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From: Stuart.McClure-at-csiro.au
Date: Sun, 26 Aug 2007 21:36:14 -0500
Subject: [Microscopy] RE: SEM: wt% or atom% ?

Contents Retrieved from Microscopy Listserver Archives
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With respect to at% and wt% you may be able to convert between them using the gravimetric factors.  However if you calculate your values based on at% and wt% then you will end up with different values because of the assumption about the unmeasured O - one calculation will normalize the ZAF calculations on the bases of stoichiometry the other on the O difference these may converge to different values for none ideal samples
Stuart

================================================
Stuart McClure
CSIRO Land and Water
Post: P.B#2, Glen Osmond, SA, Australia, 5064
Street: Waite Rd, Urrbrae, SA, Australia, 5064
Site: via Gate #5, Building Taylor-3A, Room 218
International [ x ] National ( x )
Tel-W:  [ 618 ] ( 08 ) 8303 8484
Fax-W:  [ 618 ] ( 08 ) 8303 8550
Tel-H:   [ 618 ] ( 08 ) 8297 3452
Mob-H: [ 61 ]  ( 0 )  428 100 796
Email1: stuart.mcclure-at-csiro.au
Email2: stuart.mcclure-at-gmail.com
Email3: stuart.mcclure-at-adelaide.edu.au
================================================




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From: wim.vandenbroeck-at-UGent.be
Date: Mon, 27 Aug 2007 08:19:09 -0500
Subject: [Microscopy] viaWWW: Leica EM TP programmes

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Email: wim.vandenbroeck-at-UGent.be
Name: Wim Van den Broeck

Organization: Ghent University, Department of Morphology

Title-Subject: [Filtered] Leica EM TP programmes

Question: Dear Colleagues,

We have just installed the Leica EM tissue processor (TP), and I was wondering if programmes for the TP are available for processing animal tissues in Spurr's embedding medium.
Thanks in advance.

Kind regards,
Wim.

---------------------------------------------------------------------------

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From: pdcrystals-at-aol.com
Date: Mon, 27 Aug 2007 08:19:37 -0500
Subject: [Microscopy] viaWWW: Surching for SEM spareparts

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Email: pdcrystals-at-aol.com
Name: Peter Droste

Organization: Surfacenet GmbH

Title-Subject: [Filtered] Surching for SEM spareparts

Question: Hallo to all,

I am surching for a power supply for a Philips 525 SEM stage system. It is labeled PE 1141/52 220V 5V +-15V

Is there any one who has such a part used or unused??

Thank¥s

Peter

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From: dmyates-at-seas.upenn.edu
Date: Mon, 27 Aug 2007 10:00:36 -0500
Subject: [Microscopy] Position Announcement: University of Pennsylvania

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The Penn Regional Nanotechnology Facility is seeking to hire a research
scientist with specialization in electron microscopy. The PRNTF is a
central facilities laboratory for the University of Pennsylvania. We
maintain a wide range of instrumentation, featuring a JEOL 2010F
TEM/STEM, an FEI DB235 FIB, and a 5.1 MeV ion accelerator (see a
complete facility description at www.seas.upenn.edu/nanotechfacility).

Principle duties of the research scientist will include assisting and
training users, maintaining electron and ion beam instruments and
developing new analytical techniques. Other duties include assisting
with the teaching of laboratory classes, maintaining the user database
and billing records, as well as maintaining the lab.

Requirements for this position include a BS in physical science or
engineering (Masters or Ph.D. preferred), three to five years experience
with the operation and maintenance of electron and ion beam instruments,
and excellent communication skills. Preference will be given to
individuals with experience using focused ion beam instruments and to
those with experience in the development of analytical techniques.

Please note - This is not a postdoctoral position. Position is
contingent upon funding.

For consideration, send resume/cv to:

Douglas Yates, Ph.D.
Technical Director
Penn Regional Nanotechnology Facility
University of Pennsylvania
3231 Walnut Street
Philadelphia, PA 19104
dmyates-at-seas.upenn.edu.

Additional information about the position may be viewed at:
http://www.hr.upenn.edu/jobs/ (reference number: 070822872)

--
*******************************************************
Douglas M. Yates, Ph.D.

Technical Director
Penn Regional Nanotechnology Facility
University of Pennsylvania
3231 Walnut Street
Philadelphia, PA 19104
http://www.seas.upenn.edu/nanotechfacility/

dmyates-at-seas.upenn.edu
*******************************************************

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From: nizets2-at-yahoo.com
Date: Mon, 27 Aug 2007 10:38:12 -0500
Subject: [Microscopy] Safety issues with microwave

Contents Retrieved from Microscopy Listserver Archives
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Hi Garnet!

Include a check-out precedure, where you have to check
the cleanliness of the place and undersign before they
can leave.

Regards,

Stephane

--- gmartens-at-interchange.ubc.ca wrote:

}
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} Hi Debby,
}
} We have similar situation to your original
} situation. Our main
} processing microwave sits right next to the hood and
} is vented
} through a properly taped duct system. We try to
} train our clients to
} always use the vacuum chamber, regardless if they
} are applying vacuum
} or not. The chamber can be closed during the
} transfer from the hood
} to the microwave.
}
} Our main issue is getting people to clean up after
} themselves. If
} anyone has a nice way to convince your clients to
} clean up after they
} finish processing I would love to hear it. The
} usual threats of
} taking away privileges does not seem to work.
}
} Garnet
}
} --
} Garnet Martens
}
} Research Manager
} BioImaging Facility
} University of British Columbia
} 6270 University Blvd.
} Vancouver, B.C.
} Canada
} V6T 1Z4
}
} phone 604-822-3354
}
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==============================Original Headers==============================
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From: gwe-at-ufl.edu
Date: Mon, 27 Aug 2007 13:00:38 -0500
Subject: [Microscopy] [Fwd: Re Russia]

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopylistserver.com/MicroscopyListserver/MicroscopyArchives.html

I am forwarding this for Dr. Koltovoy


I am interesting in microscope history, and collect some information
about microscope history. I am going to create CD-ROM about microscope
history.
Is it interesting for anybody in Microscopiy Society of America?

Best regards
Nikolay Koltovoy




} } my e-mail koltovoi-at-mail.ru



--
Greg Erdos
University of Florida, Retired
Micanopy, Florida

==============================Original Headers==============================
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From: dcromey-at-email.arizona.edu
Date: Mon, 27 Aug 2007 13:11:33 -0500
Subject: [Microscopy] special stains - methacrylate

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We have a group here studying calcified bone. They came into our
histology core with sections from methacrylate-embedded bone and asked
if we could perform special stains on the sections. The EM lab here
doesn't work with methacrylates, so we got the job.

A LONG time ago I did a little work with these plastics, and I recall
that they are better than epoxy plastics for a variety of stains. I
also recall that the protocols had to be modified from the standard
paraffin/frozen section recipes to compensate for the methacrylate.

They would like to do:
Safronin O
Fast Green
Methylene Blue
Picosirus Red

My histotech is working her connections and I'm hoping that there's
someone on this list that can give me some pointers.

Thanks
Doug

--
^^^^^^^^^^^^^^^^^^^^^^^^^^^^^^^^^^^^^^^^^^^^^^^^^^^^^^^^^^^
Douglas W. Cromey, M.S. - Assistant Scientific Investigator
Dept. of Cell Biology & Anatomy, University of Arizona
1501 N. Campbell Ave, Tucson, AZ 85724-5044 USA

office: AHSC 4212 email: Cromey-at-Arizona.edu
voice: 520-626-2824 fax: 520-626-2097

http://swehsc.pharmacy.arizona.edu/exppath/
Home of: "Microscopy and Imaging Resources on the WWW"




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From: phillipst-at-missouri.edu
Date: Mon, 27 Aug 2007 13:16:22 -0500
Subject: [Microscopy] Re: special stains - methacrylate

Contents Retrieved from Microscopy Listserver Archives
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Check out this book:


Burns WA, Bretschneider A (1981) Thin is In: Plastic Embedding of Tissue
for Light Microscopy. Chicago, American Society of Clinical Pathologists

I am pretty sure that I remember it has a lot of stains for methacrylates

At 01:12 PM 08/27/07, you wrote:



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Thomas E. Phillips, PhD
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From: filipi-at-pucrs.br
Date: Mon, 27 Aug 2007 14:09:00 -0500
Subject: [Microscopy] Ion pump needed

Contents Retrieved from Microscopy Listserver Archives
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Hi Folks,

Where can I find an Ion Pump suitable to replace the one
used on an old Amray 2030L?

Regards,
--
Filipi Vianna
Computational Mechanics Laboratory
College of Engineering - PUCRS
+55 51 33203525
http://www.em.pucrs.br/~filipi


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From: tina-at-pbrc.hawaii.edu
Date: Mon, 27 Aug 2007 14:26:43 -0500
Subject: [Microscopy] Deparaffinizing tissue for TEM embedding

Contents Retrieved from Microscopy Listserver Archives
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Hi, All-

Someone wants to know if I can use TEM to look for herpes virus in
paraffin embedded tissue. It was fixed in formalin. I told them it would
look like doo-doo (scientific term), but if they insisted, we could try.
If I rememer correctly, the way to go about this is to de-paraffinize with
xylene, then go into ethanol and/or propylene oxide, and embed in epoxy
resin (I use LX112). Am I on the right track? Any help appreciated.

Any for any of you virologists or anyone else who has tried this, what are
the chances of being able to recognize herpes in tumor nuclei after this
abuse? Will this be a big waste of time? No, can't re-do experiment.

Aloha,
Tina

****************************************************************************
* Tina (Weatherby) Carvalho * tina-at-pbrc.hawaii.edu *
* Biological Electron Microscope Facility * (808) 956-6251 *
* University of Hawaii at Manoa * http://www.pbrc.hawaii.edu/bemf*
****************************************************************************


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From: gary-at-gaugler.com
Date: Mon, 27 Aug 2007 14:57:41 -0500
Subject: [Microscopy] Re: Ion pump needed

Contents Retrieved from Microscopy Listserver Archives
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It is probably a 30L/s Varian pump. Duniway
Stock Room rebuilds and sells these for about
$500US. Pull the magnet off and repair or
exchange the core. Be sure to get a new Copper
gasket as well.

gary g.


At 11:10 AM 8/27/2007, you wrote:




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From: sergei2-at-ornl.gov
Date: Mon, 27 Aug 2007 17:19:06 -0500
Subject: [Microscopy] ORNL Postdoctoral position - Nanoscale Electromechanics

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Dear colleagues
I am looking for one [potentially two] postdoctoral fellows
interested in advanced applications of Piezoresponse Force Microscopy to
nanoelectromechanics of nanoscale ferroelectrics and multiferroics,
macromolecular systems, and biological systems. Please see the
announcement at: http://www.orau.gov/ORISE/edu/ornl/postneeds.htm
[position ORNL07-70-CNMS].
Sergei Kalinin

Project Description:

The Center for Nanophase Materials Science (CNMS) at Oak Ridge National
Laboratory (ORNL) is seeking a candidate to fill a postdoctoral position
in the field of scanning probe microscopy. This program takes advantage
of recently developed capabilities for Piezoresponse Force Microscopy
(PFM) in liquid and ultra-high vacuum environments, and new
spectroscopic modes for studies of polarization dynamics and correlated
phenomena in a wide range of materials, including oxides, polymers, and
biological systems. The CNMS (http://cnms.ornl.gov) is a collaborative
nanoscience user research facility established by the Office of Science,
U.S. Department of Energy. The CNMS has a diverse spectrum of
nanoscience research activities including a nanofabrication facility;
laboratory-based research on macromolecular materials, catalysts,
functional nanomaterials, and magnetism and transport; characterization
with electron microscopes, scanning probes, and x-ray diffraction and
scattering; and theory, modeling, and simulation.

The successful applicant must demonstrate experience in the experimental
application, development, and quantitative interpretation of modern
scanning probe techniques. This position provides an opportunity to join
an experienced team to develop methods and applications in directions
such as identification and control of static and dynamic ferroelectric
phenomena at the nanometer scale, electromechanical probing on the
single-molecule level, and time-resolved measurements. In addition, the
candidate will be involved in the CNMS user program, with wide
opportunities for scientific collaborations.

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From: wadowska-at-upei.ca
Date: Tue, 28 Aug 2007 06:20:25 -0500
Subject: [Microscopy] Deparaffinizing tissue for TEM embedding

Contents Retrieved from Microscopy Listserver Archives
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Hi Tina,
I am frequently asked to do the same task. I discourage the
pathologists because the preservation of the tissue is almost none.
However you can detect viral particles and if it is done solely for that
purpose it can work. Since there is no membrane preservation
nucleus can only be distinguished by the presence of a chromatin. I
prefer to process the tissue that has been stored in formalin even
for a long time.
Good luck.
Dorota.

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From: laable-at-solutia.com
Date: Tue, 28 Aug 2007 10:17:25 -0500
Subject: [Microscopy] Fluorescence Microscopy

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I am having trouble getting my power supply to strike my HBO 100. I checked the bulb on another microscope and the bulb is good. The power supply will come on but never strikes the bulb. I asked our electrician to help and he asked me what initial arc voltage is needed to start the bulb. I did not have an answer and can not seem to find the answer. I was hoping that someone on this list could help me.

Thanks in advance,
Lori Ables
laable-at-solutia.com


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From: underwoo-at-u.washington.edu
Date: Tue, 28 Aug 2007 11:03:10 -0500
Subject: [Microscopy] Re:Fluorescence Microscopy

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopylistserver.com/MicroscopyListserver/MicroscopyArchives.html

Lori,

I don't know the arc voltage but we have had a frequent similar problem. It actually ended up being the
saftey mechanism in the lamp housing that prevents the lamp from igniting when opened. The door
must close and complete a curcuit. This contact gets dirty and then prevents the lamp from igniting.
This is a easy fix if it is the scource of your problem and it doesn't require knowing any numbers. Hope
this solves it.

Robert Underwood
University of Washington


On Tue, 28 Aug 2007 laable-at-solutia.com wrote:

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} I am having trouble getting my power supply to strike my HBO 100. I checked the bulb on another
microscope and the bulb is good. The power supply will come on but never strikes the bulb. I asked
our electrician to help and he asked me what initial arc voltage is needed to start the bulb. I did not
have an answer and can not seem to find the answer. I was hoping that someone on this list could help
me.
}
} Thanks in advance,
} Lori Ables
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From: Walter.Bobrowski-at-pfizer.com
Date: Tue, 28 Aug 2007 11:37:38 -0500
Subject: [Microscopy] H&E Staining of Epoxy-embedded Tissues

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopylistserver.com/MicroscopyListserver/MicroscopyArchives.html

Could someone share some light and a protocol to achieve H&E staining on
epoxy-embedded tissue sections (heart muscle)? I simply cannot get the
hematoxylin to stain nuclei and yields a general "grayish" stain of
components. No heat yields absolutely no staining. Alcoholic eosin Y has
no problem yielding a bright pink. Maybe too well. Or this simply why I
never hear of H&E staining in EM?
Thanks!


Walter F. Bobrowski
Sr. Scientist
Pfizer Global R&D


"The ultimate human freedom is the ability to choose one's attitude in a
given set of circumstances." -Viktor Frankl

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From: rcommon-at-msu.edu
Date: Tue, 28 Aug 2007 11:48:01 -0500
Subject: [Microscopy] Extended depth of field photomacrography

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopylistserver.com/MicroscopyListserver/MicroscopyArchives.html


I have quite a bit of experience with an inexpensive program (Helicon Focus)
and a free program (CombineZ) and both can do an excellent job in many
instances. I have tried an ImageJ plug-in (Extended_Depth_Field.jar) with
less success. I know that software for combining the in-focus regions of
Z-stacks are available from microscope manufacturers and as part of image
analysis packages. Has any member of the group compared other programs to
Helicon Focus or CombineZ? Do any of them offer any significant
improvements in handling "problem stacks"? The main issues for me are areas
where features overlap in different planes of focus, ghost fringes around
edges, and specular highlights that spread as frames are combined.

Ralph Common
Michigan State University


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From: dac-at-research.umass.edu
Date: Tue, 28 Aug 2007 12:48:31 -0500
Subject: [Microscopy] H&E Staining of Epoxy-embedded Tissues

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopylistserver.com/MicroscopyListserver/MicroscopyArchives.html

We used to use .1-1% Toluidine Blue in Sodium Borate to stain epoxy
sections. It is not the same as Hematoxylin, but will certainly give
you a pretty blue in the nuclei.

Joel

Date sent: Tue, 28 Aug 2007 11:37:49 -0500
To: jbs-at-temple.edu
X-from: Walter.Bobrowski-at-pfizer.com
Send reply to: Walter.Bobrowski-at-pfizer.com

I would just add some details. I have used 0.05% Toluidine Blue O in 1%
sodium borate buffer. Dissolve with stirbar and filter through Whatman
#1 or equivalent paper. After flattening and drying down the sections in
a small drop of water at ~ 60C (can be over an alcohol lamp or heat
plate, don't boil), flood with a large drop of the stain and continue
heating - view white paper through the drop to see density; or time...;
rinse with dH2O from a squirt bottle gently to remove the excess stain,
and dry. Mount in a small drop of immersion oil with a coverglass for
40x and greater; seal edges with nail polish if needed. Keep slides from
strong light - it fades eventually but can last months to years.
Toluidine Blue is metachromatic and will show materials with chemistry
dependent characteristic colors - for plants, acidic polysaccharies as
pink-ish, lignified walls of plant vasculature is often ice-blue, etc.

dale callaham

jbs-at-temple.edu wrote:
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} We used to use .1-1% Toluidine Blue in Sodium Borate to stain epoxy
} sections. It is not the same as Hematoxylin, but will certainly give
} you a pretty blue in the nuclei.
}
} Joel
}
} Date sent: Tue, 28 Aug 2007 11:37:49 -0500
} To: jbs-at-temple.edu
} X-from: Walter.Bobrowski-at-pfizer.com
} Send reply to: Walter.Bobrowski-at-pfizer.com
} Subject: [Microscopy] H&E Staining of Epoxy-embedded Tissues
}
} }
} }
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} } Could someone share some light and a protocol to achieve H&E staining on
} } epoxy-embedded tissue sections (heart muscle)? I simply cannot get the
} } hematoxylin to stain nuclei and yields a general "grayish" stain of
} } components. No heat yields absolutely no staining. Alcoholic eosin Y has
} } no problem yielding a bright pink. Maybe too well. Or this simply why I
} } never hear of H&E staining in EM?
} } Thanks!
} }
} }
} } Walter F. Bobrowski
} } Sr. Scientist
} } Pfizer Global R&D
} }
} }
} } "The ultimate human freedom is the ability to choose one's attitude in a
} } given set of circumstances." -Viktor Frankl
} }
} } ----------------------------------------------------------------------
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}
}
} --
} Joel B. Sheffield, Ph.D.
} Biology Department, Temple University
} 1900 North 12th Street
} Philadelphia, PA 19122
} jbs-at-temple.edu
} (215) 204 8839, fax (215) 204 0486
} http://astro.temple.edu/~jbs
}
}
} ==============================Original Headers==============================
} 7, 21 -- From jbs-at-temple.edu Tue Aug 28 12:28:01 2007
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==============================Original Headers==============================
3, 22 -- From dac-at-research.umass.edu Tue Aug 28 12:48:30 2007
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From: holpc-at-firstenergycorp.com
Date: Tue, 28 Aug 2007 13:15:09 -0500
Subject: [Microscopy] SEM of medical device, part 2

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopylistserver.com/MicroscopyListserver/MicroscopyArchives.html


To one and all,

My thanks for everyone's invaluable input. With the responses provided, I
was able to make arguments with technical merit. The chain of custody was
unclear and consequently whether it has ever been sterilized is unknown. I
was able to tactfully decline the job, pending sterilization.

Chris


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From: connellyps-at-nhlbi.nih.gov
Date: Tue, 28 Aug 2007 14:02:11 -0500
Subject: [Microscopy] Re: H&E Staining of Epoxy-embedded Tissues

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopylistserver.com/MicroscopyListserver/MicroscopyArchives.html

Walter,

The following procedures give the typical H & E type staining that
Pathologists seem to want over the blue stain of the 0.05% Toluidine Blue O
in 1% sodium borate which I use all the time now.

In my notes I have the following procedure from the
28th Annual EMSA Meeting:

A Simple Dichromatic Stain for Plastic Embedded Tissues
G.R.Mackay and M.L.Mead

"MABF" Modification [original - Belanger, Stain Technology, 36:313 (1961)]

SOLUTION I.
0.065 grams Methylene blue
0.01 grams Azure II
mixed by magnetic stirring into a solution containing:
5.0 ml Glycerol
5.0 ml 100% Methyl alcohol
40.0 ml distilled water
Filter and store up to 6 months

SOLUTION II. PREPARED DAILY
50.0 ml distilled water
2.0 grams NaOH

SOLUTION III.
A. 0.5% BASIC FUCHSIN Stock
100 ml water + 0.2 grams Basic Fuchsin

B. WORKING SOLUTION III - Make and Filter DAILY
Into a covered Copland Jar
40.0 ml water + 10.0 ml Solution A (above)

Procedure:
Place slide with section onto a hot plate at 60-80 degrees C for 2-3 min.
Cool slide
Create a pool of 2 parts Solution I + 1 part Solution II - do NOT stir
After 5 - 10 min. rinse with running tap water
Check on LM and repeat if too light
Solution III - put slide in for 5 min.
Rinse with water and check on LM
Repeat if necessary

Corrections for over-staining:

Over-staining with Sol.I - decolorize with 100% Ethanol and re-stain for a
shorter time

Counter-stain dark - soak in water filled Copland jar for 10 - 15 min. then
re-stain from the start

Oil can be removed with xylene, air dry slide and re-stain

Joe Weible had taught me his "Quick Procedure" using the same solutions as
above at the Wistar Institute (now at SPI) back in the early 70's

1. Put 2 drops of Sol.I + 1 drop of Sol.II onto a section that had been
dried down onto a slide. Heat but do not dry, then water wash.
Dip into 95% Ethanol and wash off with water. Check on scope for color.
Too weak - stain again. Too dark - rinse in NaOH and water again.

2. Put 4 drops water onto slide and 1 drop Sol.III for 20 sec. on hotplate.
Water wash and check color.

Regards,

Patricia Stranen Connelly
Lead Technologist
NHLBI Electron Microscopy Core
National Institutes of Health
14 Service Road South
Bldg. 14E ­ Rm. 111B MSC 5570
Bethesda, MD 20892-5570
Phone 301-496-3491
FAX 301-480-65
connellyps-at-mail.nih.gov

=======
On 8/28/07 12:42 PM, "Walter.Bobrowski-at-pfizer.com"
{Walter.Bobrowski-at-pfizer.com} wrote:

} Could someone share some light and a protocol to achieve H&E staining on
} epoxy-embedded tissue sections (heart muscle)? I simply cannot get the
} hematoxylin to stain nuclei and yields a general "grayish" stain of
} components. No heat yields absolutely no staining. Alcoholic eosin Y has
} no problem yielding a bright pink. Maybe too well. Or this simply why I
} never hear of H&E staining in EM?
} Thanks!
}
} Walter F. Bobrowski
} Sr. Scientist
} Pfizer Global R&D



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From: bigelow-at-umich.edu
Date: Tue, 28 Aug 2007 14:28:24 -0500
Subject: [Microscopy] RE: Wt % or At %

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopylistserver.com/MicroscopyListserver/MicroscopyArchives.html

It has been more than fifteen years since I taught this subject;
however, if I remember correctly most programs for electron microbeam
analysis report analysis results in weight fraction (i.e. grams
unknown per gram total) rather than in either weight percent (gms
unknown per 100 gms total) or atom percent (atoms of unknown per 100
atoms total).

I believe the basic reason for this is that the fundamental equation
for the number of atoms of the unknown element that are ionized by an
incident electron, per centimeter the electron travels through the
specimen, is given by an equation of the form:

dn/dx = Q (N C d/A)

Where dn/dx = the number of atoms of unknown atoms ionized per cm the
electron travels in the specimen, Q is the ionization cross-section
of the unknown atoms, N = Avagadro's number, C = the concentration of
the unknown atoms U, d = the density of the sample, and A = the
atomic umber of the unknown U. To make the dimensions come out right
the quantity in parentheses has to have the dimensions of (atoms per
cubic centimeter), and this requires the concentration of the unknown
to be expressed in weight fraction, i.e.:

{atoms U/At Wt U x gms U/gm total x gms total/ cc)/( gms U/ At
Wt U) = atoms U/cc

This requirement for the use of weight fraction in the fundamental
equation for the ionization process then carries through to the
calculation of intensities and through all the subsequent ZAF
corrections (or other machinations) used to produce the final
results. Some programs may contain subroutines to convert to other
units of concentration, but I think fundamentally most yield results
in weight fraction.

You can find this matter discussed in more detail in various text
books on the subject such as 'Scanning Electron Microscopy and X-Ray
Microanalysis' by Goldstein, et. al.
--
Wilbur C. Bigelow, Professor Emeritus
Materials Sci. & Engr., Univ. of Michigan
Ann Arbor, Michigan 48109-2136
e-mail: bigelow-at-umich.edu;
Fx:734-763-4788; Ph:734-975-0858
Address mail to: 2911 Whittier Court
Ann Arbor, MI 48104-6731

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From: donovan-at-uoregon.edu
Date: Tue, 28 Aug 2007 15:00:19 -0500
Subject: [Microscopy] SEM: wt% or atom% ?

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopylistserver.com/MicroscopyListserver/MicroscopyArchives.html

Hi all,
I think Michael's earlier explanation is a little confusing,
especially the statement "EPMA... is more sensitive to mass% than atom%".

In fact since the column density actually defines x-ray generation
volume, Jim Bigelow is right, to calculate the number of ionizations,
not only weight fraction, but atomic weight, density and number of
atoms must all be included for a rigorous calculation of these
electronic (atomic number) dependent interactions in solid materials.
However, the fact remains that these atomic level interactions
(fluorescence, absorption, energy loss, etc) at these keV energies
are dominated by electronic (atomic number dependent) effects, not
mass effects.

X-ray excitation itself is essentially independent with respect to
atomic mass (the EPMA technique is not sensitive to mass). Most
atomic processes involving electron-solid interactions at energies
below 100 keV are well correlated with atomic number (and electron
energy) and only give the appearance (in compounds) of being more
related to mass fraction than atomic fraction because A/Z is
approximately a constant over the periodic table. And also involved
is the historical fact that we have terms for mass (weight) fraction
and atomic (number of atoms) fraction but no corresponding term
related to "Z" (atomic number) fraction of compounds.

If you do not agree, simply check any table of atomic properties and
note (for example) that x-ray fluorescent yields increase
monotonically with Z, even in the three places in the periodic table
where atomic mass decreases and atomic number increases. EPMA
calculations originally started with the mass based first
approximation simply because it gave a more accurate first
approximation than an atomic fraction first approximation (due to the
aforementioned relative constancy of A/Z) and eventually also because
most of the corrections (as Jim mentioned) to the intensity ratios
are based on mass normalized (e.g., mass absorption coefficients) or
mass unit (e.g., stopping power) calculations.

In the case of electron backscatter loss, there is no theoretical
physical basis for calculating average backscatter in compounds using
mass fraction. Pure momentum exchange occurs in the case of a
perfectly elastic interaction of an electron with a 180 degrees
scattering angle. The largest effect is elastic scattering off a
hydrogen nuclei (a 0.05% mass effect), and this effect decreases
further with increasing atomic mass. And of course in most cases the
scattering angle is not 180 degrees so the mass effect is even smaller.

The funny thing is that early models using mass fraction for average
backscatter in compounds not only did better than atomic fraction
averaging (this isn't surprising for reasons already mentioned), but
mass fraction models even did better than simple Z fraction averaging
because the A/Z ratio is not quite constant across the periodic table
(mass increases faster than Z of course). However, this entirely
unrelated effect (due to stellar nucleosynthesis s and r-processes
and nuclear stability properties) just so happens to push the
averaging calculation in the proper direction to serendipitously
account for effects of nuclear screening by inner orbital electrons
in larger atomic number atoms (which is why the backscatter curve
gets flatter at higher Z- because one measures fewer than expected
backscattered electrons due to screening effects). To obtain accurate
predictions of average backscatter using a Z based fraction, one must
also include a term for nuclear screening by inner orbital electrons.

More modern methods (e.g., monte carlo programs such as Penelope)
using actual scattering cross sections implicitly take these
considerations into account and are therefore even more accurate than
any simple fractional based models.

Gory details can be seen here:

http://epmalab.uoregon.edu/UCB_EPMA/download/Compositional%20Averaging%20of%20Backscatter%20Intensities%20in%20Compounds%20(M&M,%202003(.pdf

http://epmalab.uoregon.edu/UCB_EPMA/download/Compositional%20Averaging%20of%20Backscatter-%20Reed%20and%20Response%20to%20Reed%20(M&M,%202003).pdf

john

At 04:53 AM 8/24/2007, you wrote:
} Stephane asks ...
}
} } - why is the integration of the peaks in the EDX spectrum
} } called "weight %"?
} } - Does the intensity if the peaks in EDX depend on the atomic
} } weight? In other words, do heavier elements produce more
} } x-rays than lighter elements? It is a hard for me to believe
} } this, because electron shells are the same for light and
} } heavy elements (a K shell is a K shell), however it is the
} } only reason I can see to calculate an atom% value.
}
} Michael says: The EPMA technique, whether EDX or WDX, is more
} sensitive to mass% than
} atom%. I know this is somewhat counter-intuitive and I remember having the
} same conceptual problems myself. However, you can do simple tests with
} stoichometric compounds that include heavy and lighter atomic numbers. A
} good example would be to compare Fe metal and FeO. If you integrate the Fe
} Ka peak for both you'll see that for FeO it almost directly calculates the
} mass fraction rather than the atom fraction.
}
} Therefore mass fractions are always the direct result of EPMA, while atom
} fractions are calculated secondarily. Most analysts will always report the
} mass% because it will include the actual total of all elements, while the
} atom% will always be a result of having normalized to 100%.


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From: connellyps-at-nhlbi.nih.gov
Date: Tue, 28 Aug 2007 15:43:06 -0500
Subject: [Microscopy] Re: H&E Staining of Epoxy-embedded Tissues

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopylistserver.com/MicroscopyListserver/MicroscopyArchives.html

Walter,

It has been some time since I had needed to use this stain so my memory may
not be accurate.

I followed Joe's way instead of filling a whole Copland jar for a few
slides.
After washing the slide it was cool.
I put it onto the hotplate, added room temp. water and Sol. III right away
so the stain never got really hot - only warm before I washed it off, about
10-15 sec. after the addition of Sol.III.
This worked well.

As to the investigator wanting H&E, he seems to be coming from a medical
background and expects that H&E works on everything and does not know TEM
techniques.
Try to get a well stained slide with the MABF Stain (Methylene blue, Azure,
Basic Fuchsin) for him to look at then -
1. Politely ask if he has ever seen H&E on Epon sections.

2. If he answers YES, ask him for contact information so you can get the
procedure from that person (who may have given him MABF and not told him).

3. If he answers NO, mention that there is a reason that he hasn't and that
reason is that H&E does not work on plastic sections and suggest that if he
really wants it done in the future to send a portion of the tissue to the
Pathology/LM lab to work up when he sends TEM work to your lab. If you do
both, then he has to tell you when you receive the tissue so that you can
process the two portions differently.

Good luck,
Pat
=================
On 8/28/07 3:13 PM, "Bobrowski, Walter" {Walter.Bobrowski-at-pfizer.com} wrote:

} Thanks Patricia. I have that exact recipe (printed in Microscopy Today)
} and use as a special stain, though slightly different procedure. One
} quick question: is your staining done in coplin jars at RT, and NOT on a
} hotplate? I have done this on a hotplate and found that the basic
} fuchsin will destain the blue completely if left too long (} 20 seconds).
} Please let me know! Thanks
} Oh, and the investigator specifically wanted H&E staining, which doesn't
} work unless you go through the effort to deplasticizing, which I'm not
} about to do.
} Walt
}
} -----Original Message-----
} From: Patricia Connelly [mailto:connellyps-at-nhlbi.nih.gov]

} Walter,
}
} The following procedures give the typical H & E type staining that
} Pathologists seem to want over the blue stain of the 0.05% Toluidine
} Blue O in 1% sodium borate which I use all the time now.
}
} In my notes I have the following procedure from the
} 28th Annual EMSA Meeting:
}
} A Simple Dichromatic Stain for Plastic Embedded Tissues
} G.R.Mackay and M.L.Mead
}
} "MABF" Modification [original - Belanger, Stain Technology,
36:313 (1961)]
}
} SOLUTION I.
} 0.065 grams Methylene blue
} 0.01 grams Azure II
} mixed by magnetic stirring into a solution containing:
} 5.0 ml Glycerol
} 5.0 ml 100% Methyl alcohol
} 40.0 ml distilled water
} Filter and store up to 6 months
}
} SOLUTION II. PREPARED DAILY
} 50.0 ml distilled water
} 2.0 grams NaOH
}
} SOLUTION III.
} A. 0.5% BASIC FUCHSIN Stock
} 100 ml water + 0.2 grams Basic Fuchsin
}
} B. WORKING SOLUTION III - Make and Filter DAILY
} Into a covered Copland Jar
} 40.0 ml water + 10.0 ml Solution A (above)
}
} Procedure:
} Place slide with section onto a hot plate at 60-80 degrees C for
} 2-3 min.
} Cool slide
} Create a pool of 2 parts Solution I + 1 part Solution II - do NOT stir
} After 5 - 10 min. rinse with running tap water
} Check on LM and repeat if too light
} Solution III - put slide in for 5 min.
} Rinse with water and check on LM
} Repeat if necessary
}
} Corrections for over-staining:
}
} Over-staining with Sol.I - decolorize with 100% Ethanol and re-stain for
} a shorter time.
}
} Counter-stain dark - soak in water filled Copland jar for 10 - 15 min.
} then re-stain from the start.
}
} Oil can be removed with xylene, air dry slide and re-stain.
}
} Joe Weible had taught me his "Quick Procedure" using the same solutions
} as above at the Wistar Institute (now at SPI) back in the early 70's.
}
} 1. Put 2 drops of Sol.I + 1 drop of Sol.II onto a section that had been
} dried down onto a slide. Heat but do not dry, then water wash.
} Dip into 95% Ethanol and wash off with water. Check on scope for color.
} Too weak - stain again. Too dark - rinse in NaOH and water again.
}
} 2. Put 4 drops water onto slide and 1 drop Sol.III for 20 sec. on
} hotplate. Water wash and check color.
}
} Regards,
}
} Patricia Stranen Connelly
} Lead Technologist
} NHLBI Electron Microscopy Core
} National Institutes of Health
} 14 Service Road South
} Bldg. 14E - Rm. 111B MSC 5570
} Bethesda, MD 20892-5570
} Phone 301-496-3491
} FAX 301-480-65
} connellyps-at-mail.nih.gov
}
} =======
} On 8/28/07 12:42 PM, "Walter.Bobrowski-at-pfizer.com"
} {Walter.Bobrowski-at-pfizer.com} wrote:

Could someone share some light and a protocol to achieve H&E
staining on epoxy-embedded tissue sections (heart muscle)?
I simply cannot get the hematoxylin to stain nuclei and yields a general
"grayish" stain of components. No heat yields absolutely no staining.
Alcoholic eosin Y has no problem yielding a bright pink. Maybe too well.
Or this simply why I never hear of H&E staining in EM?
Thanks!

Walter F. Bobrowski
Sr. Scientist
Pfizer Global R&D

} LEGAL NOTICE
} Unless expressly stated otherwise, this message is confidential and may be
} privileged. It is intended for the addressee(s) only. Access to this E-mail
} by anyone else is unauthorized. If you are not an addressee, any disclosure
} or copying of the contents of this E-mail or any action taken (or not taken)
} in reliance on it is unauthorized and may be unlawful. If you are not an
} addressee, please inform the sender immediately.


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11, 23 -- Date: Tue, 28 Aug 2007 16:41:39 -0400
11, 23 -- Subject: Re: [Microscopy] H&E Staining of Epoxy-embedded Tissues
11, 23 -- From: Patricia Connelly {connellyps-at-nhlbi.nih.gov}
11, 23 -- To: "Bobrowski, Walter" {Walter.Bobrowski-at-pfizer.com}
11, 23 -- CC: "microscopy-at-microscopy.com" {microscopy-at-microscopy.com}
11, 23 -- Message-ID: {C2FA00C3.B50%connellyps-at-nhlbi.nih.gov}
11, 23 -- Thread-Topic: [Microscopy] H&E Staining of Epoxy-embedded Tissues
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From: rcmoretz-at-gmail.com
Date: Tue, 28 Aug 2007 19:53:55 -0500
Subject: [Microscopy] H&E Staining of Epoxy-embedded Tissues

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopylistserver.com/MicroscopyListserver/MicroscopyArchives.html

A quick search on PubMed gave a list of over 60 references--many of
which provide H&E type stains. I also remember a publication in the
1970s that listed many LM stains applied to sodium methoxide-etched
section, but can't locate either the paper or the reference due to my
recent retirement and the concomitant state of disarray of everything
that goes with changing one's life. Try several PubMed searches--I
didn't specifically search for H&E staining. I seem to remember the
paper was in Lab Invest or some such similar journal, altho' the ones
that came up in my search were J Ultrastruct Res, Stain Technology
plus other oldies but goodies. I have used (in the dim, dark, distant
past) a toludine blue/alcoholic basic fuchsin technique, but it was
fussy and inconsistent in my hands.

Roger Moretz

On 8/28/07, connellyps-at-nhlbi.nih.gov {connellyps-at-nhlbi.nih.gov} wrote:
}
}
}
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} Walter,
}
} It has been some time since I had needed to use this stain so my memory may
} not be accurate.
}
} I followed Joe's way instead of filling a whole Copland jar for a few
} slides.
} After washing the slide it was cool.
} I put it onto the hotplate, added room temp. water and Sol. III right away
} so the stain never got really hot - only warm before I washed it off, about
} 10-15 sec. after the addition of Sol.III.
} This worked well.
}
} As to the investigator wanting H&E, he seems to be coming from a medical
} background and expects that H&E works on everything and does not know TEM
} techniques.
} Try to get a well stained slide with the MABF Stain (Methylene blue, Azure,
} Basic Fuchsin) for him to look at then -
} 1. Politely ask if he has ever seen H&E on Epon sections.
}
} 2. If he answers YES, ask him for contact information so you can get the
} procedure from that person (who may have given him MABF and not told him).
}
} 3. If he answers NO, mention that there is a reason that he hasn't and that
} reason is that H&E does not work on plastic sections and suggest that if he
} really wants it done in the future to send a portion of the tissue to the
} Pathology/LM lab to work up when he sends TEM work to your lab. If you do
} both, then he has to tell you when you receive the tissue so that you can
} process the two portions differently.
}
} Good luck,
} Pat
} =================
} On 8/28/07 3:13 PM, "Bobrowski, Walter" {Walter.Bobrowski-at-pfizer.com} wrote:
}
} } Thanks Patricia. I have that exact recipe (printed in Microscopy Today)
} } and use as a special stain, though slightly different procedure. One
} } quick question: is your staining done in coplin jars at RT, and NOT on a
} } hotplate? I have done this on a hotplate and found that the basic
} } fuchsin will destain the blue completely if left too long (} 20 seconds).
} } Please let me know! Thanks
} } Oh, and the investigator specifically wanted H&E staining, which doesn't
} } work unless you go through the effort to deplasticizing, which I'm not
} } about to do.
} } Walt
} }
} } -----Original Message-----
} } From: Patricia Connelly [mailto:connellyps-at-nhlbi.nih.gov]
}
} } Walter,
} }
} } The following procedures give the typical H & E type staining that
} } Pathologists seem to want over the blue stain of the 0.05% Toluidine
} } Blue O in 1% sodium borate which I use all the time now.
} }
} } In my notes I have the following procedure from the
} } 28th Annual EMSA Meeting:
} }
} } A Simple Dichromatic Stain for Plastic Embedded Tissues
} } G.R.Mackay and M.L.Mead
} }
} } "MABF" Modification [original - Belanger, Stain Technology,
} 36:313 (1961)]
} }
} } SOLUTION I.
} } 0.065 grams Methylene blue
} } 0.01 grams Azure II
} } mixed by magnetic stirring into a solution containing:
} } 5.0 ml Glycerol
} } 5.0 ml 100% Methyl alcohol
} } 40.0 ml distilled water
} } Filter and store up to 6 months
} }
} } SOLUTION II. PREPARED DAILY
} } 50.0 ml distilled water
} } 2.0 grams NaOH
} }
} } SOLUTION III.
} } A. 0.5% BASIC FUCHSIN Stock
} } 100 ml water + 0.2 grams Basic Fuchsin
} }
} } B. WORKING SOLUTION III - Make and Filter DAILY
} } Into a covered Copland Jar
} } 40.0 ml water + 10.0 ml Solution A (above)
} }
} } Procedure:
} } Place slide with section onto a hot plate at 60-80 degrees C for
} } 2-3 min.
} } Cool slide
} } Create a pool of 2 parts Solution I + 1 part Solution II - do NOT stir
} } After 5 - 10 min. rinse with running tap water
} } Check on LM and repeat if too light
} } Solution III - put slide in for 5 min.
} } Rinse with water and check on LM
} } Repeat if necessary
} }
} } Corrections for over-staining:
} }
} } Over-staining with Sol.I - decolorize with 100% Ethanol and re-stain for
} } a shorter time.
} }
} } Counter-stain dark - soak in water filled Copland jar for 10 - 15 min.
} } then re-stain from the start.
} }
} } Oil can be removed with xylene, air dry slide and re-stain.
} }
} } Joe Weible had taught me his "Quick Procedure" using the same solutions
} } as above at the Wistar Institute (now at SPI) back in the early 70's.
} }
} } 1. Put 2 drops of Sol.I + 1 drop of Sol.II onto a section that had been
} } dried down onto a slide. Heat but do not dry, then water wash.
} } Dip into 95% Ethanol and wash off with water. Check on scope for color.
} } Too weak - stain again. Too dark - rinse in NaOH and water again.
} }
} } 2. Put 4 drops water onto slide and 1 drop Sol.III for 20 sec. on
} } hotplate. Water wash and check color.
} }
} } Regards,
} }
} } Patricia Stranen Connelly
} } Lead Technologist
} } NHLBI Electron Microscopy Core
} } National Institutes of Health
} } 14 Service Road South
} } Bldg. 14E - Rm. 111B MSC 5570
} } Bethesda, MD 20892-5570
} } Phone 301-496-3491
} } FAX 301-480-65
} } connellyps-at-mail.nih.gov
} }
} } =======
} } On 8/28/07 12:42 PM, "Walter.Bobrowski-at-pfizer.com"
} } {Walter.Bobrowski-at-pfizer.com} wrote:
}
} Could someone share some light and a protocol to achieve H&E
} staining on epoxy-embedded tissue sections (heart muscle)?
} I simply cannot get the hematoxylin to stain nuclei and yields a general
} "grayish" stain of components. No heat yields absolutely no staining.
} Alcoholic eosin Y has no problem yielding a bright pink. Maybe too well.
} Or this simply why I never hear of H&E staining in EM?
} Thanks!
}
} Walter F. Bobrowski
} Sr. Scientist
} Pfizer Global R&D
}
} } LEGAL NOTICE
} } Unless expressly stated otherwise, this message is confidential and may be
} } privileged. It is intended for the addressee(s) only. Access to this E-mail
} } by anyone else is unauthorized. If you are not an addressee, any disclosure
} } or copying of the contents of this E-mail or any action taken (or not taken)
} } in reliance on it is unauthorized and may be unlawful. If you are not an
} } addressee, please inform the sender immediately.
}
}
} ==============================Original Headers==============================
} 11, 23 -- From connellyps-at-nhlbi.nih.gov Tue Aug 28 15:43:06 2007
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} 11, 23 -- User-Agent: Microsoft-Entourage/11.3.6.070618
} 11, 23 -- Date: Tue, 28 Aug 2007 16:41:39 -0400
} 11, 23 -- Subject: Re: [Microscopy] H&E Staining of Epoxy-embedded Tissues
} 11, 23 -- From: Patricia Connelly {connellyps-at-nhlbi.nih.gov}
} 11, 23 -- To: "Bobrowski, Walter" {Walter.Bobrowski-at-pfizer.com}
} 11, 23 -- CC: "microscopy-at-microscopy.com" {microscopy-at-microscopy.com}
} 11, 23 -- Message-ID: {C2FA00C3.B50%connellyps-at-nhlbi.nih.gov}
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3, 29 -- From rcmoretz-at-gmail.com Tue Aug 28 19:53:55 2007
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3, 29 -- "Microscopy Listserv" {Microscopy-at-microscopy.com}
3, 29 -- Subject: Re: [Microscopy] Re: H&E Staining of Epoxy-embedded Tissues
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From: dsoren-at-umich.edu
Date: Wed, 29 Aug 2007 07:36:53 -0500
Subject: [Microscopy] Re: H&E Staining of Epoxy-embedded Tissues

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopylistserver.com/MicroscopyListserver/MicroscopyArchives.html

Hello Walter,

Here is a protocol for H&E staining of epoxy-embedded tissues that
was developed by K.A. Pasyk and C.A. Hassett, Path. Res. Pract. 184,
635-638 (1989).

1. Cover tissue sections on the slide with 4 % hydrogen peroxide (2
drops 30 % hydrogen peroxide in 48 drops dd H2O) for 4 minutes.
2. Rinse the slide with ddH2O and dry on a hot plate a few seconds.
Any sections that may have loosened will again adhere to the slide.
3. Flood the slide with Gill's III hematoxylin and place in moist
chamber at 37 degrees C for 90 minutes.
4. Rinse with water then flood with ammonia water (2 drops ammonium
hydroxide in 100 ml dd H2O).
5. Rinse with water then flood with 1 % alcoholic eosin Y for 5
minutes.
6. Rinse in 100 % ethanol to remove excess stain.
7. Dry the slide on a hot plate at 60 degrees C then coverslip using
Permount mounting medium.

I hope this helps.

Best regards,

Dotty Sorenson

On Aug 28, 2007, at 12:40 PM, Walter.Bobrowski-at-pfizer.com wrote:

}
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}
} Could someone share some light and a protocol to achieve H&E
} staining on
} epoxy-embedded tissue sections (heart muscle)? I simply cannot get the
} hematoxylin to stain nuclei and yields a general "grayish" stain of
} components. No heat yields absolutely no staining. Alcoholic eosin
} Y has
} no problem yielding a bright pink. Maybe too well. Or this simply
} why I
} never hear of H&E staining in EM?
} Thanks!
}
}
} Walter F. Bobrowski
} Sr. Scientist
} Pfizer Global R&D
}
}
} "The ultimate human freedom is the ability to choose one's attitude
} in a
} given set of circumstances." -Viktor Frankl
}
} ----------------------------------------------------------------------
} LEGAL NOTICE
} Unless expressly stated otherwise, this message is confidential and
} may be privileged. It is intended for the addressee(s) only.
} Access to this E-mail by anyone else is unauthorized. If you are
} not an addressee, any disclosure or copying of the contents of this
} E-mail or any action taken (or not taken) in reliance on it is
} unauthorized and may be unlawful. If you are not an addressee,
} please inform the sender immediately.
}
}
} ==============================Original
} Headers==============================
} 6, 30 -- From Walter.Bobrowski-at-pfizer.com Tue Aug 28 11:37:18 2007
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Dorothy Sorenson
Microscopy and Image-analysis Laboratory
Department of Cell and Developmental Biology
University Of Michigan Medical School
A807 BSRB
109 Zina Pitcher Place
Ann Arbor, MI 48109-2200
(734)763-1170
FAX (734)763-1166



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From: amartine-at-ee.ucr.edu
Date: Wed, 29 Aug 2007 08:25:43 -0500
Subject: [Microscopy] AskAMicroscopist: International Scientific Instrument SEM (DS-130

Contents Retrieved from Microscopy Listserver Archives
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This Question was submitted to Ask-A-Microscopist by (amartine-at-ee.ucr.edu)
from http://www.microscopy.org/Ask-A-Microscopist/Ask-A-Microscopist.html on Tuesday, August 28, 2007 at 20:59:12
Remember to consider the Grade/Age of the student when considering the Question
---------------------------------------------------------------------------
Please reply to both amartine-at-ee.ucr.edu as well as to the Microscopy Listserver
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Email: amartine-at-ee.ucr.edu
Name: Alfredo A. Martinez-Morales

Organization: University of California, Riverside

Education: Graduate College

Location: Riverside, CA 92525

Title: Inquiry about International Scientific Instrument SEM (DS-130 S)

Question: My research group at the University of California, Riverside received several years ago a SEM from the Navy. Our SEM is ISI DS130 model. I am trying to determine whether this SEM is of any value to our group, but unfortunately I have not been able to find someone who can put it together and tested to see if it still works. I was hoping someone could point me into the right direction in trying to find someone who is knowledgeable with ISI SEMs. Any information that you can provide is truly appreciated. Thank you for your time and attention.

---------------------------------------------------------------------------

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From: john.mardinly-at-intel.com
Date: Wed, 29 Aug 2007 11:04:33 -0500
Subject: [Microscopy] AskAMicroscopist: International Scientific

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopylistserver.com/MicroscopyListserver/MicroscopyArchives.html

Alfredo;
We have an amazing service engineer from MAS working on our
Topcon TEM who tells us that he works on DS-130's a lot, and my guess
would be that if he can't fix you DS-130, nobody can. I don't know if
you can contract Richard Murphy at 888-798-1867 or if you need to
contact his manager, Art McCanna at 800-421-8451.

John Mardinly
Intel

This is not an opinion of Intel Corporation.

-----Original Message-----
X-from: amartine-at-ee.ucr.edu [mailto:amartine-at-ee.ucr.edu]
Sent: Wednesday, August 29, 2007 6:26 AM
To: Mardinly, John

This Question was submitted to Ask-A-Microscopist by
(amartine-at-ee.ucr.edu)
from
http://www.microscopy.org/Ask-A-Microscopist/Ask-A-Microscopist.html on
Tuesday, August 28, 2007 at 20:59:12
Remember to consider the Grade/Age of the student when considering the
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Email: amartine-at-ee.ucr.edu
Name: Alfredo A. Martinez-Morales

Organization: University of California, Riverside

Education: Graduate College

Location: Riverside, CA 92525

Title: Inquiry about International Scientific Instrument SEM (DS-130 S)

Question: My research group at the University of California, Riverside
received several years ago a SEM from the Navy. Our SEM is ISI DS130
model. I am trying to determine whether this SEM is of any value to our
group, but unfortunately I have not been able to find someone who can
put it together and tested to see if it still works. I was hoping
someone could point me into the right direction in trying to find
someone who is knowledgeable with ISI SEMs. Any information that you can
provide is truly appreciated. Thank you for your time and attention.

------------------------------------------------------------------------
---

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From: murphyjudy-at-comcast.net
Date: Wed, 29 Aug 2007 13:26:25 -0500
Subject: [Microscopy] Kenneth Robert Lawless

Contents Retrieved from Microscopy Listserver Archives
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Another microscopy legend leaves the fold.

Kenneth R. Lawless, of Charlottesville, died at Norfolk General Hospital
on Friday, August 24, 2007, from respiratory failure following a sudden,
on-set lung infection.

I met Ken in the late 1960's at the Electron Microscopy Society of
America meetings. For those new to the society, it used to have
"Electron" in its title. He was Treasurer for EMSA seemingly forever.
I always remember his reports at the EMSA business meetings as they were
"short and sweet". He was one of the most enthusiastic persons about
teaching microscopy that I ever met. He was like an encyclopedia BUT he
made it all entertaining. He epitomized my expectations of a "southern
gentleman" in all areas of his life. Besides microscopy, he loved
nature, music and lots of other interests. We shall dearly miss him.

I am enclosing the obituary that appeared in the local paper.

He was born August 21, 1922, the son of the late Elma P. and William R.
Lawless of Key West, Florida. He was preceded in death by his wife,
Alois Y. Lawless of Charlottesville.

Kenneth is survived by his four children all of the
Charlottesville/Albemarle area, daughter, Nancy Lee Kozub, son, Stephen
C. Yowell and his wife, Susan, and their sons, L. Gordon Yowell II and
his wife, Melissa, of Hurt, Virginia, Lindsay S. Yowell of
Charlottesville, son, Kenneth W. Lawless, and his daughter, Lelia Anne
Lawless and her husband, Steve Hamilton, and their four children, Sarah
Hamilton, Cassidy Hamilton, Kenneth Hamilton, and Jessica Glackin and
her husband, Robert, of Orange Park, Florida, and their two children
Hannah and Andruw; and his sister, Virginia "Madge" DeLuca of Connecticut.

Spending most of his childhood in Lynchburg, Virginia, Kenneth received
a B.S. in Chemistry and Physics from Lynchburg College in 1946, having
also served nearly four years in the Army Air Corps, obtaining the rank
of Captain. Following graduate work at the University of California, Los
Angeles, he returned to Charlottesville and received his Ph.D. in
Chemistry from the University of Virginia in 1951. He received a
Fulbright Fellowship and spent a year conducting research at Norway's
Institute of Technology, Trondheim, Normandy. Returning to
Charlottesville, Kenneth went on to serve as a research scientist and
professor at the University of Virginia for over 40 years, retiring in
1992 with the honor of Professor Emeritus status.

Among his many other contributions to the University as a researcher and
professor, Kenneth was instrumental in creating the Department of
Materials Science and Engineering, eventually serving as Chairman for 10
years. The department rose steadily to national and international
prominence. A consummate teacher and brilliant scientist, Dr. Lawless
was greatly admired by students and faculty alike. His innate love of
learning was coupled with a keen desire to explore and discover the
wonders of the natural world. His enthusiasm was contagious as he
mentored dozens and dozens of Ph.D. candidates over the years. Former
students returned from around the country to honor and pay him tribute
when he retired.

Kenneth was an internationally recognized authority in the field of
Electron Microscopy, primarily the study of the molecular structure of
materials. Over the years, he served as guest lecturer and presenter in
Japan, China, Australia and Europe. He authored and coauthored numerous
papers, articles and textual contributions. Recognized widely for his
expertise and scholarship, Kenneth went on to hold many offices both
professional and honorary. Of particular note, he served as President of
the Virginia Academy of Sciences, and Councillor, Treasurer, and later,
Member Emeritus, of the Microscopy Society of America.

In 1989, Dr. Lawless was selected for membership in the "Fellows of the
Virginia Academy of Sciences" - a body of scholars selected because of
their outstanding contributions to scientific research, teaching and
leadership. Among many other awards and commendations, Kenneth received
the distinguished J. Shelton Horseley Research Award, the highest honor
bestowed by the Virginia Academy of Sciences for original research. He
also received the Morton D. Maser Distinguished Service Award from the
Microscopy Society of America in 1992. He was a member of Alpha Chi
Sigma chemistry fraternity, SigmaXl, Phi Beta Kappa, and the Raven
Society. At various times, Kenneth served on the Fulbright Fellowship
Selection Committee, and the University of Virginia Medical School
Admissions Committee.

In addition to his research and teaching at the University of Virginia,
Kenneth was widely known throughout the Commonwealth as an
ornithologist, field botanist, and nature photographer. His knowledge of
birds and Virginia wildflowers was legendary. An ardent naturalist and
long-term member of the Virginia Society of Ornithology and the Virginia
Native Plant Society, he was a mainstay participant in the
Charlottesville area Christmas Bird Count for the last 60 years. Kenneth
was also known for his outstanding photography of wildflowers,
conducting exhibits and lectures at the National Arboretum, the Nature
Conservancy, the Wintergreen Wildflower Symposium, and Camp Jeep. He
routinely conducted nature walks throughout central Virginia and also
served on the Flora of Virginia Project. In 2004, Kenneth was selected
to serve on the Albemarle County Biodiversity Work Group, organized in
part to protect and preserve the wildlife in the County.

Kenneth was a music lover all of his life. He sang with the University
Singers, the Oratorio Society, the AAUW Gilbert and Sullivan operettas,
and the Chancel Choir at First United Methodist Church. With his
beautiful tenor voice, he was a guest soloist and ensemble participant
at many area churches and other venues. Despite his extensive
contributions to The University and the Commonwealth, Kenneth always
maintained that the most important things to him were the love of his
family and friends. In the midst of an extensive teaching schedule and
frequent travel, it was rare for him to miss one of his children's piano
or dance recitals, or Little League baseball games. He took great joy in
introducing school children to the wonders of nature and was equally as
effective in engaging second graders as well as second-year grad
students. Brilliant and modest, principled and compassionate, Kenneth
Lawless modeled a life well-lived and he blessed and enriched the lives
of all he encountered.






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From: Williams-at-GENECTR.HUNTER.CUNY.EDU
Date: Wed, 29 Aug 2007 13:32:11 -0500
Subject: [Microscopy] Microscopy/Imaging Technician Job Posting

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopylistserver.com/MicroscopyListserver/MicroscopyArchives.html

The Center for the Study of Gene Structure and Function of Hunter
College of the City University of New York is seeking a talented and
dedicated technician for a position in the Digital Bio-Imaging Facility.
Job responsibilities include maintenance of confocal and wide field
microscopes, assisting in research, training users, and billing for use
of the facility. To be considered for this post an applicant should have
a background in the biological sciences, with some experience in
microscopy. More advanced training in image analysis techniques and
confocal microscopy can be provided. Computer expertise is a plus, as is
experience with electron microscopy. The position available is at the
technician level, salary will be in the range $35,000 to $43,000,
commensurate with experience and will include a full benefits package.
The position is available immediately. The successful applicant will
work with a group of highly successful researchers at Hunter College.
E-mail resume to techjob-at-genectr.hunter.cuny.edu

Dr. Lloyd Williams
Dept of Biology
Hunter College
695 Park Ave
New York, NY 10021


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From: graceyen8-at-yahoo.com
Date: Wed, 29 Aug 2007 17:01:05 -0500
Subject: [Microscopy] viaWWW: dark field image capture and analysis help needed

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Email: graceyen8-at-yahoo.com
Name: grace yen

Organization: QHRI

Title-Subject: [Filtered] dark field image capture and analysis help needed

Question: I am looking for any help in locating an imaging system for capturing and analyzing streaming videos and stills of live blood before and after treatment for research analysis in particular measuring density and motility changes and a system that will capture the field of view of the microscope. I have an olympus cx31 with df and phase condenser, currently a 0.45 c-mount with sony ccd attached that magnifies the field and df images contain much noise and is not clear. thank you.

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From: Jill.Verlander-at-medicine.ufl.edu
Date: Wed, 29 Aug 2007 17:02:11 -0500
Subject: [Microscopy] viaWWW: ISI DS-130C service

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Email: Jill.Verlander-at-medicine.ufl.edu
Name: Jill Verlander Reed

Organization: University of Florida

Title-Subject: [Filtered] ISI DS-130C service

Question: Dear Alfredo,

I suggest you contact Chuck Humphrey of Scanning Solutions, Inc.,in Orlando, FL. He is expert in caring for the DS-130. We had a DS-130C for years, and ultimately had to move it out because we needed the space for another TEM. Chuck was our ISI service engineer, then he started his own company after ISI/Topcon dropped their service division. We continued to have him service our scope as an independent and he always knew exactly what to do, not only to fix the scope, but also to optimize the performance. He's also great at training individuals to get the most out of the DS-130. He purchased our DS-130C and moved it to his facility. I haven't spoken to him in a couple of years, but you should be able to reach him at cchumph-at-aatglobal.net or (407) 234-0676.

Best of luck, Jill

Jill Verlander Reed, DVM
Associate Scientist
Division of Nephrology, Hypertension, and Renal Transplantation Director, College of Medicine Electron Microscopy Core Facility P.O. Box 100224 HSC 1600 SW Archer Road Room RB-167 Gainesville, FL 32610-0224

Telephone: (352) 846-0820
Facsimile: (352) 392-8996


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From: rra-at-stowers-institute.org
Date: Wed, 29 Aug 2007 17:02:32 -0500
Subject: [Microscopy] viaWWW: Lipids in c. elegans

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Email: rra-at-stowers-institute.org
Name: Rhonda Allen

Organization: Stowers Institute

Title-Subject: [Filtered] Lipids in c. elegans

Question: I am looking to visualize lipid droplets in c. elegans and keep them looking black. Has anyone tried methods as described by Boshier, 1984, in Stain Technology using 1% p-phenylenediamine in 70% ethanol during dehydration in order to prevent extraction and keep them black?

Or another method I am interested in trying is Tannic Acid-p-phenylenediamine as described by Guyton and Klemp in The Journal of Histochemistry and Cytochemistry, 1988?

I would like to keep them black and be able to see the mono or double membrane.

These articles are fairly old, so am wondering about the relivancy today. We have currently tried High Pressure Freezing with Freeze Substitution in 2% Osmium/0.1% Uranyl Acetate/Acetone. The results are varying colors of lipid droplets, that we would like to be able to see the membranes more clearly, and they are looking for the text book black lipid droplet.

I will be adding 5% water to the next batch of freeze substituted samples, but this will not keep the lipids from being extracted by subsequent processing.

Suggestions?

Thanks,

Rhonda Allen
rra-at-stowers-institute.org

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From: sujoy.hazra-at-gmail.com
Date: Wed, 29 Aug 2007 20:44:48 -0500
Subject: [Microscopy] viaWWW: Electroplishing and FESEM image

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Email: sujoy.hazra-at-gmail.com
Name: Sujoy S. Hazra

Organization: UOW

Title-Subject: [Filtered] Electroplishing and FESEM image

Question: I was wondering if anyone has an idea of the conditions in terms of Voltage, time , temp. and flow rate for eletroplishing ECAP-ed IF steel using standard A2 electrolyte and Letropol-5 (Struers).

Also, how the surface generally looks like after electropolishing in FESEM after huge cold deformation, e.g. for the above case.

Thanks very much,

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8, 11 -- Subject: viaWWW: Electroplishing and FESEM image
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From: mmcheath-at-syr.edu
Date: Thu, 30 Aug 2007 07:20:37 -0500
Subject: [Microscopy] Loss of counts on Al and Si

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Hi,
Sorry for the cross posting.
I have a problem that I need help in figuring out. First, instrument
parameters:
JEOL JXA 8600: 5 WDS's, EDS, CL, SEI, BEI
WDS 1: GFPC: TAP, PET, LDE1, LDEC
WDS 2: Xe: LIF, PET
WDS 3: Xe: LIF, PET
WDS 4: Xe: LIF, PET
WDS 5: GFPC: TAP, LDEB

20 kV, 10 nA, 10 um spot
Astimex 53 mineral Std grain mount
Astimex 44 Metal Std mount

Element Table:
Na TAP WDS5
Mg TAP WDS5
Al TAP WDS5
Si TAP WDS5
K PET WDS2
Ca PET WDS2
Ti LIF WDS4
Fe LIF WDS4
Cs PET WDS3

Geller Software: dSpec, dQuant, dPict, etc


A grad student is doing feldspar analyses. We are not using WDS1 right now
because it needs optimization and it is on the 'to-do' list. Student is
trying to get a handle on accuracy and precision. Using Astimex std
PlagAn65 and measuring it as an unknown. PHA's on the elements in the table
are optimized, all elements calibrated. Everything 'appears' to be normal.

Problem:
Analysis 1: Totals are good (97-99%) Individual concentrations are good.
Analysis 2: Totals are bad (21%) Individuals are OK except Si and Al - way
off!
Analysis 3: Totals are good (97-99%) Individual concentrations are good.
Analysis 4: Totals are bad (21%) Individuals are OK except Si and Al - way
off!
Analysis 5: Totals are good (97-99%) Individual concentrations are good.
Analysis 6: Totals are bad (21%) Individuals are OK except Si and Al - way
off!

On the 'bad' analyses, the reported conctration on Al and Si are consistent
across the three runs. It simply looks like the instrument can't find the
peak. I can't find anything wrong.

Have any of you ever seen anything like this before?

TIA
Mike
********************************************************************
Michael M. Cheatham
312 Heroy Geology Laboratory Phone (315)-443-1261
Syracuse University Fax (315)-443-3363
Syracuse, NY 13244-1070

email:mmcheath-at-syr.edu
http://earthsciences.syr.edu

owner of PLASMACHEM-L: http://listserv.syr.edu/archives/plasmachem-l.html
owner of XRF-L: http://listserv.syr.edu/archives/xrf-l.html
owner of TIMS-L: http://listserv.syr.edu/archives/tims-l.html
owner of SIRIS-L: http://listserv.syr.edu/archives/siris-l.html
********************************************************************


==============================Original Headers==============================
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13, 18 -- Subject: Loss of counts on Al and Si
13, 18 -- From: Michael Cheatham {mmcheath-at-syr.edu}
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From: R.I.Han-at-sms.ed.ac.uk
Date: Thu, 30 Aug 2007 09:40:36 -0500
Subject: [Microscopy] viaWWW: Analyze SEM images

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-----Original Message-----
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[mailto:nephrol-bounces-at-mailman.srv.ualberta.ca] On Behalf Of Nauman
Tarif,MD
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Email: R.I.Han-at-sms.ed.ac.uk
Name: Richard Han

Organization: University of Edinburgh

Title-Subject: [Filtered] Analyze SEM images

Question: Hi All

I would like to analyze SEM images of vascular connective tissue using ImageJ. I need some advice on how to go about in this type of analysis. Any suggestions on analyzing parameters? and how's it done? I remember someone has mentioned the SEM roughness and grey scale variation plugins before, but haven't managed to find them.

Thank you

Richard Han

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From: alvarobq-at-fcien.edu.uy
Date: Thu, 30 Aug 2007 13:28:15 -0500
Subject: [Microscopy] AskAMicroscopist: quetol 651

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This Question was submitted to Ask-A-Microscopist by (alvarobq-at-fcien.edu.uy)
from http://www.msa.microscopy.org/Ask-A-Microscopist/Ask-A-Microscopist.html on Thursday, August 30, 2007 at 13:05:08
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Email: alvarobq-at-fcien.edu.uy
Name: Alvaro Olivera

Organization: Sciences University

Education: Undergraduate College

Location: Montevideo, Uruguay

Title: quetol 651

Question: I¥m using Quetol 651 for a first time. I had bad results. The blocks (in gelatin capsules) are very soft. Data sheet says what I must alter the ratio of QUETOL 651 and NSA (NSA is not the hardener)but What must I increase? NSA or QUETOL?
If you have experience with this epoxi resin, please, send me a improved protocol.
Data sheet suggest gelatin capsules for embedding,
may I cure the resin in flats embedding molds?
Thank you very much.


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From: neerajg-at-CLEMSON.EDU
Date: Thu, 30 Aug 2007 16:17:08 -0500
Subject: [Microscopy] viaWWW: Lipids in c. elegans

Contents Retrieved from Microscopy Listserver Archives
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Hi Rhonda

Hope you are doing well, This reference might be of interest to you. I have
tried the technique discussed in the paper, it is quite straightforward, you
equilibrate the sample in an imidazole buffer and add osmium to the
solution, I have got really good lipid staining with the technique.


Here is the reference.

"Imidazole-buffered osmium tetroxide: an excellent stain for visualization
of lipids in transmission electron microscopy"
Authors: Sabine Angermuller and Dariush Fahimi.
Histochem J. 1982 Sep;14(5):823-35

http://www.ncbi.nlm.nih.gov/sites/entrez?cmd=Retrieve&db=PubMed&list_uids=61
82131&dopt=AbstractPlus

Regards,

Raj.


Neeraj V. Gohad
Graduate Research Assistant
Department of Biological Sciences
Clemson University,
Clemson, SC-29634
Phone: 864-656-3597 
Fax: 864-656-0435










-----Original Message-----
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Sent: Wednesday, August 29, 2007 6:11 PM
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Email: rra-at-stowers-institute.org
Name: Rhonda Allen

Organization: Stowers Institute

Title-Subject: [Filtered] Lipids in c. elegans

Question: I am looking to visualize lipid droplets in c. elegans and keep
them looking black. Has anyone tried methods as described by Boshier, 1984,
in Stain Technology using 1% p-phenylenediamine in 70% ethanol during
dehydration in order to prevent extraction and keep them black?

Or another method I am interested in trying is Tannic
Acid-p-phenylenediamine as described by Guyton and Klemp in The Journal of
Histochemistry and Cytochemistry, 1988?

I would like to keep them black and be able to see the mono or double
membrane.

These articles are fairly old, so am wondering about the relivancy today.
We have currently tried High Pressure Freezing with Freeze Substitution in
2% Osmium/0.1% Uranyl Acetate/Acetone. The results are varying colors of
lipid droplets, that we would like to be able to see the membranes more
clearly, and they are looking for the text book black lipid droplet.

I will be adding 5% water to the next batch of freeze substituted samples,
but this will not keep the lipids from being extracted by subsequent
processing.

Suggestions?

Thanks,

Rhonda Allen
rra-at-stowers-institute.org

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From: gary-at-gaugler.com
Date: Thu, 30 Aug 2007 19:19:20 -0500
Subject: [Microscopy] Useless canned air

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopylistserver.com/MicroscopyListserver/MicroscopyArchives.html

Hi all:

Have any of you run into the current bane of
canned air that includes anti-inhaling ingredients?
It is supposed to prevent "huffing." In so doing,
the cans basically deny all use for what is normal
for these. Like cleaning mirrors, specimen holders,
cover slips, etc. The most recent is Falcon Dust Off.
Useless.

Are there normal, historical canned air products
still available? Do these need a background check
and a ten day waiting period to purchase?

This is ridiculous.

gary g.


==============================Original Headers==============================
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From: kraftpiano-at-gmail.com
Date: Thu, 30 Aug 2007 21:24:31 -0500
Subject: [Microscopy] TV Scan module for a JSM-35C

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopylistserver.com/MicroscopyListserver/MicroscopyArchives.html

Does anybody have an extra TV scan module for a JSM-35C? I really
want to be able to capture images via a frame grabber on a computer to
be able to print them out for students, and this seems the most
economical method of doing so for the short term until grant writing
gets underway. I know that the resolution won't be that good, but it
doesn't matter- we just need to print out pictures of things that the
students can bring home and show their parents without blowing our
entire budget on Polaroid film.

Of course, if anybody has an old QuartzPCI or Orion system hanging
around that would digitize our scope, that would be preferable...

--Justin A. Kraft
Leadership Academy West

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From: NWWhite-at-bwxt.com
Date: Fri, 31 Aug 2007 07:05:18 -0500
Subject: [Microscopy] Useless canned air

Contents Retrieved from Microscopy Listserver Archives
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Hello Gary,

Unfortunately, I can't help directly. Was not aware that the "dusters"
are being corrupted. However, thanks for the heads-up.

For the most part, I quit using them a number of years ago. I added a
little plumbing in the lab and distribute compressed nitrogen to
quick-disconnects scattered about the lab. Plug in the nozzle
valve/hose and voila! I do regulate down the pressure a bit ;)

Woody


-----Original Message-----
X-from: gary-at-gaugler.com [mailto:gary-at-gaugler.com]
Sent: Thursday, August 30, 2007 8:20 PM
To: White, Woody N.

Hi all:

Have any of you run into the current bane of
canned air that includes anti-inhaling ingredients?
It is supposed to prevent "huffing." In so doing,
the cans basically deny all use for what is normal
for these. Like cleaning mirrors, specimen holders,
cover slips, etc. The most recent is Falcon Dust Off.
Useless.

Are there normal, historical canned air products
still available? Do these need a background check
and a ten day waiting period to purchase?

This is ridiculous.

gary g.


==============================Original
Headers==============================
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From: Walter.Bobrowski-at-pfizer.com
Date: Fri, 31 Aug 2007 07:43:23 -0500
Subject: [Microscopy] Useless canned air

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopylistserver.com/MicroscopyListserver/MicroscopyArchives.html

Gary, I concur with Woody. I too gave up on canned air 1 year ago and
now have a coiled air-line with pistol-type release valve dangling at my
workstation, attached to a tank of N2 (in an out of the way storage
closet) with a valve at the workstation to regulate pressure. Works
great!
Walt





Hello Gary,

Unfortunately, I can't help directly. Was not aware that the "dusters"
are being corrupted. However, thanks for the heads-up.

For the most part, I quit using them a number of years ago. I added a
little plumbing in the lab and distribute compressed nitrogen to
quick-disconnects scattered about the lab. Plug in the nozzle
valve/hose and voila! I do regulate down the pressure a bit ;)

Woody

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From: gary.m.brown-at-exxonmobil.com
Date: Fri, 31 Aug 2007 08:58:41 -0500
Subject: [Microscopy] Re: Useless canned air

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopylistserver.com/MicroscopyListserver/MicroscopyArchives.html

Gary,

I recommend using clean house nitrogen; no cleaner source of gas exists.
This is exceptionally easy if you have access to house nitrogen supplied by
your facility. Alternatively, place nitrogen outlets with around your lab
plumbed to 1A nitrogen cylinders.

Regards,'

Gary M. Brown
Microscopy Specialist
ExxonMobil Chemical Company
Baytown Technology & Engineering - West
5200 Bayway Drive
Baytown, Texas 77520-2101
phone: 281 834 2387
fax: 281 834 2395
e-mail: Gary.M.Brown-at-ExxonMobil.com

"Happiness equals reality minus expectations." Tom Magliozzi





gary-at-gaugler.c
om
To
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08/30/07 07:21 cc
PM
Subject
[Microscopy] Useless canned air
Please respond
to
gary-at-gaugler.c
om











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Hi all:

Have any of you run into the current bane of
canned air that includes anti-inhaling ingredients?
It is supposed to prevent "huffing." In so doing,
the cans basically deny all use for what is normal
for these. Like cleaning mirrors, specimen holders,
cover slips, etc. The most recent is Falcon Dust Off.
Useless.

Are there normal, historical canned air products
still available? Do these need a background check
and a ten day waiting period to purchase?

This is ridiculous.

gary g.


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From: werner-at-rosharon.oilfield.slb.com
Date: Fri, 31 Aug 2007 15:01:58 -0500
Subject: [Microscopy] Re: viaWWW: ISI DS-130C service

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopylistserver.com/MicroscopyListserver/MicroscopyArchives.html

Chuck is indeed an expert with the DS130. He maintains ours, and has
since he installed it in 1986. He is the person to call for help
with the DS130. Not to disparage anyone else - just agreeing that
Chuck is can repair your microscope if it is repairable at all.

His current e-mail address is: cchumph-at-bellsouth.net

Regards,
Andrew

At 05:02 PM 8/29/2007, Jill.Verlander-at-medicine.ufl.edu wrote:



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From: paul_hazelton-at-umanitoba.ca
Date: Fri, 31 Aug 2007 16:28:00 -0500
Subject: [Microscopy] Re: Useless canned air

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopylistserver.com/MicroscopyListserver/MicroscopyArchives.html

Gary et al

The idea of nitrogen gas is good, but may run afoul of the safety
people. about 20 years ago I convinced a new department chair that the
cost and inconvenience of the air cans dictated a change. Safety people
were very iffy about the use of Nitrogen, they felt it presented a
safety risk for oxygen deprivation from rooms it would be used in. They
suggested using the building's compressed air system. All we did was
put a filter in the line to remove oil and particulates - needed it for
our Airfuge anyway. Now I have three plug-ins around the lab, a coiled
line and a pistol with different nozzles that came from the local auto
supply store. Works great, no fees for nitrogen, or tank rentals.

Paul


Paul R. Hazelton, PhD
Electron Microscope Unit
University of Manitoba
Department of Medical Microbiology
531 Basic Medical Sciences Building
730 William Avenue
Winnipeg, Manitoba, Canada, R3E 0W3
e-mail: paul_hazelton-at-umanitoba.ca
Phone:204-789-3313
Pager:204-931-9354
Cell:204-781-1502
Fax:204-789-392

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