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From: edelmare-at-muohio.edu
Date: Wed, 1 Aug 2007 08:34:01 -0500
Subject: [Microscopy] FFT Software

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Does anyone have a recommendation for software that will run an FFT
on an image to find the REPEATING information (i.e. not remove the
repeating noise)? We are collecting information on size and
uniformity of arrays - not acutally using it for filtering.

The FFT in Image Pro is for filtering out the repeating information.

Thanks


Richard E. Edelmann, Ph.D.
EXPO Editor, Microscopy and Microanalysis Supplement
Electron Microscopy Facility Director
364 Pearson Hall
Miami University, Oxford, OH 45056
Ph: 513.529.5712 Fax: 513.529.4243
E-mail: edelmare-at-muohio.edu
http://www.emf.muohio.edu


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From: sougratr-at-mail.nih.gov
Date: Wed, 1 Aug 2007 08:51:01 -0500
Subject: [Microscopy] Re: FFT Software

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

You could just use imageJ,
here is the link :
http://rsb.info.nih.gov/ij/

Rachid


edelmare-at-muohio.edu wrote:
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} Does anyone have a recommendation for software that will run an FFT
} on an image to find the REPEATING information (i.e. not remove the
} repeating noise)? We are collecting information on size and
} uniformity of arrays - not acutally using it for filtering.
}
} The FFT in Image Pro is for filtering out the repeating information.
}
} Thanks
}
--
Rachid SOUGRAT
Cell Biology and Metabolism Branch
NICHD, NIH
Bldg. 18T, Rm. 101
18 Library Drive
Bethesda, MD 20892-5430
USA

Tel.: 301-594-3944
FAX 301-402-0078

http://rsougrat.googlepages.com/


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From: mboucher-at-umn.edu
Date: Wed, 1 Aug 2007 09:30:20 -0500
Subject: [Microscopy] EDS computer for giveaway

Contents Retrieved from Microscopy Listserver Archives
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We have an old Link (Oxford) eXL computer, monitor, keyboard and mouse for
giveaway. It is a parts only deal as we believe the CPU is dead. No
detector.
Must come and get it or arrange for packing and shipping yourself.
Thanks

Mike
******************************************************************
Michael L. Boucher Sr. mboucher-at-tc.umn.edu
Lab Manager Rm 18 Office Ph 612-624-6590
I.T. Characterization Facility Rm 12 Main Off Ph 612-626-7594
MiNTeC node of the National Nanotechnology Infrastructure Network

University of MN Fax 612-625-5368
12 Shepherd Labs
100 Union Street S.E.
Minneapolis, MN 55455 http://www.charfac.umn.edu
********************************************************************



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From: Mike.Bode-at-olympus-sis.com
Date: Wed, 1 Aug 2007 11:01:35 -0500
Subject: [Microscopy] Re: FFT Software

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

If you have access to our iTEM software, you can set the filters to
either "opaque" (filtering out the periodic structures), or
"transparent", which filters out everything BUT the periodic information
relating to that specific filter.

Have you checked if you can set this attribute in Image Pro?


Michael Bode, Ph.D.

General Manager

OLYMPUS SOFT IMAGING SOLUTIONS
12596 West Bayaud Ave #300
Lakewood, CO 80228
USA
Tel.: +1 (303) 234-9270
Fax.: +1 (303) 234-9271
E-mail: Mike.Bode-at-olympus-sis.com
www.olympus-sis.com

-----Original Message-----
X-from: sougratr-at-mail.nih.gov [mailto:sougratr-at-mail.nih.gov]
Sent: Wednesday, August 01, 2007 07:56
To: Mike Bode

You could just use imageJ,
here is the link :
http://rsb.info.nih.gov/ij/

Rachid


edelmare-at-muohio.edu wrote:
} ----------------------------------------------------------------------
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} http://www.microscopy.com/MicroscopyListserver
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} ----------------------------------------------------------------------
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}
} Does anyone have a recommendation for software that will run an FFT on

} an image to find the REPEATING information (i.e. not remove the
} repeating noise)? We are collecting information on size and
} uniformity of arrays - not acutally using it for filtering.
}
} The FFT in Image Pro is for filtering out the repeating
information.
}
} Thanks
}
--
Rachid SOUGRAT
Cell Biology and Metabolism Branch
NICHD, NIH
Bldg. 18T, Rm. 101
18 Library Drive
Bethesda, MD 20892-5430
USA

Tel.: 301-594-3944
FAX 301-402-0078

http://rsougrat.googlepages.com/


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From: walck-at-southbaytech.com
Date: Wed, 1 Aug 2007 11:37:57 -0500
Subject: [Microscopy] FFT Software

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

You can use Fovea Pro or Image Processing Toolkit, both from John and Chris
Russ. Go to their website, http://www.reindeergraphics.com/. It will work
in Photoshop and I think Image. On the disc that comes with the software is
a complete tutorial on image processing and stereology. It's a good plug-in
addition to Photoshop.


-Scott

Scott D. Walck, Ph.D.
Technical Director
South Bay Technology, Inc.
1120 Via Callejon
San Clemente, CA 92673

US Toll Free: 1-800-728-2233
Tel: (949) 492-2600
Fax: (949) 492-1499

www.southbaytech.com
walck-at-southbaytech.com

-----Original Message-----
X-from: edelmare-at-muohio.edu [mailto:edelmare-at-muohio.edu]
Sent: Wednesday, August 01, 2007 6:41 AM
To: Walck-at-SouthBayTech.com

Does anyone have a recommendation for software that will run an FFT on an
image to find the REPEATING information (i.e. not remove the repeating
noise)? We are collecting information on size and uniformity of arrays -
not acutally using it for filtering.

The FFT in Image Pro is for filtering out the repeating information.

Thanks


Richard E. Edelmann, Ph.D.
EXPO Editor, Microscopy and Microanalysis Supplement Electron Microscopy
Facility Director
364 Pearson Hall
Miami University, Oxford, OH 45056
Ph: 513.529.5712 Fax: 513.529.4243
E-mail: edelmare-at-muohio.edu
http://www.emf.muohio.edu


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From: hkonishi-at-wisc.edu
Date: Wed, 1 Aug 2007 12:24:15 -0500
Subject: [Microscopy] electropolishing service

Contents Retrieved from Microscopy Listserver Archives
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Dear All:

I am looking for a lab offering electropolishing services. My sample
is alloy. I use ion milling, but I would like to see how
electropolishing better woks for my sample. If you have some
recommendation, please advise.

Thank you,
Hiromi Konishi, Ph.D.
UW-Madison

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From: susan.vanhorn-at-sunysb.edu
Date: Wed, 1 Aug 2007 12:33:33 -0500
Subject: [Microscopy] viaWWW: postembed with LR WHite

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This Question/Comment was submitted to the Microscopy Listserver
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Email: susan.vanhorn-at-sunysb.edu
Name: Susan C. Van Horn

Title-Subject: [Filtered] postembed with LR WHite

Question: I am doing postembed immuno on Ni formvar coated slot grids with sections embedded in LR White.....they seem to be falling off the grid before i get to counter stain them.....any reason why and how to avoid them coming off???
thanks,
sue

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From: javaidqazi-at-kemet.com
Date: Wed, 1 Aug 2007 12:45:42 -0500
Subject: [Microscopy] Free thermal papers to give away

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I have lot of thermal papers rolls (Sony, TYPE IV, Enhanced, UPP-110HA,
110mmx18mm. I got digital image capturing system on my JEOL 5800 and now
have no use of these. If you are interested, please contact me directly.
Dont want to throw so many rolls away.

Javaid





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From: javaidqazi-at-kemet.com
Date: Wed, 1 Aug 2007 12:47:25 -0500
Subject: [Microscopy] Oxford ISIS system available

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I have oxford ISIS system electronics along with the software, not the
detector. Upgraded to INCA. Anyone interested please contact me directly.

Javaid




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From: joe.p.neilly-at-abbott.com
Date: Wed, 1 Aug 2007 15:31:40 -0500
Subject: [Microscopy] Analytical Chemist/Microscopist Position at Abbott Laboratories

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Analytical Chemist

Job Description
Test physical and chemical characteristics of new active pharmaceutical
ingredients and drug products. Develop and validate analytical test
procedures. Perform test method transfers. Knowledge of forensic
microscopy techniques. Work in a cGMP laboratory. Strong emphasis on
microscopy, spectroscopy and data handling. Good written and verbal skill.

Skills
Must possess solid microscopy and microanalysis skills including polarized
light microscopy, scanning electron microscopy, energy dispersive x-ray
spectroscopy, and Fourier transform infrared spectroscopy in addition to
basic analytical laboratory skills. Knowledge of and experience in drug
development and working in accordance with GLP and GMP requirements is
required. Additional skills in electron microscopy, energy dispersive
x-ray spectroscopy and vibrational spectroscopy is desired. Excellent
written and verbal communication is required. Please note: This position
may be filled at a grade 13 or grade 15, depending on experience.

Education:
BS with a minimum of 5 years directly related experience. Preferred
Education. MS, chemistry is preferred.

Qualified applicants should send resume/CV to joe.neilly-at-abbott.com

==============================Original Headers==============================
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From: gary-at-gaugler.com
Date: Wed, 1 Aug 2007 16:48:33 -0500
Subject: [Microscopy] Ovarian cancer

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Hello group:

Does anyone know of a source of prepared LM slide
and/or SEM prepared specimens of ovarian cancer?

Prostate and colon cancer specimens are also
desirable.

Not asking for free specimens.

gary g.


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From: fulton.2-at-osu.edu
Date: Wed, 1 Aug 2007 22:16:49 -0500
Subject: [Microscopy] viaWWW: Imaging Campylobacter flagella

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Email: fulton.2-at-osu.edu
Name: Dave Fulton

Organization: OSU/OARDC

Title-Subject: [Filtered] Imaging Campylobacter flagella

Question: Hello fellow listers,

We need to produce SEM and TEM images of Campylobacter flagella. Just wondering if anyone has experience with this and has a favorite protocol they might share with us. We have produced good images using uranyl acetate as a negative stain, but we are unsure of the proper buffer, stains, etc., for SEM and TEM that would give us good images of the cells with unbroken flagella. Thanks in advance for your time and trouble.

---------------------------------------------------------------------------

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From: jpshield-at-uga.edu
Date: Fri, 3 Aug 2007 09:30:33 -0500
Subject: [Microscopy] mat sci position at UGA

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Dave,
Working with a number of different bacteria I have found that for negative staining, fixation prior to staining gives better morphology, something like 2%PF + 2% GA in 0.1 M cacodylate (on the grid after adsorption) for 5-10 min. I also like to use fresh carbon coated grids, no parlodion. This will ensure that you see the flagella and pili with the thin carbon substrate. I have had success with both UA and PTA, remember though no phosphate when using UA to avoid precipitants. As for SEM it is difficult to avoid breakage of thin structures like membrane attachments and flagella, caused by dehydration. Perhaps a non-flexible substrate like silica chips or coverslips would be better than say formvar coated grids. Also you can try a chemical alternative to critical point drying like HMDS.
Good Luck.

} Michael Delannoy
} Dept of Cell Biology
} Johns Hopkins School of Medicine
} 725 N.Wolfe St. Physiology Bldg G-04
} Baltimore, Md 21205

----- Original Message -----
X-from: fulton.2-at-osu.edu

Position Description
Academic Professional Associate in Physical, Material, and Geosciences

The Center for Ultrastructural Research (CUR) is seeking a scientist in materials characterization at the Ph.D. level. This individual will function at the professional/faculty level, collaborating with physical sciences users in experimental design, implementation, and analysis.

The individual to be hired will be expected to have accomplished original research, as witnessed by a publication record in materials sciences and/or related areas. He or she will be responsible for training and supervising users in TEM, SEM, electron diffraction, X-ray emission analysis, and X-ray microtomography. The individual will work to deliver pedagogic instruction in course offerings such as Electron Microscopy, Cellular Biology (i.e., Techniques in Modern Microscopy), and Clay Mineralogy.

The individual will assist physical sciences users of the CUR and share responsibility for the maintenance of instruments including: two TEM’s, two SEM’s, a confocal fluorescence microscope equipped for multiphoton microscopy with a femtosecond pulsed IR laser, a micro-computed tomography apparatus, and a deconvolution microscopy-capable inverted light microscope.

The individual to be hired will have the opportunity to conduct and publish independent research in his or her area of expertise and to submit grants both to support their own research and to augment the instrumentation at the CUR. Entry level salary will be around $47,000, with an increase commensurate with demonstrated experience. Inquiries and application should be directed to Dr. Paul A. Schroeder, Center for Ultrastructural Research, 151 Barrow Hall, University of Georgia, Athens, GA 30602 USA. (706) 542-4080 mailto:caur-at-uga.edu. Please include a curriculum vitae, statement of interest, and contact information for at least three references. Applications received before Aug. 24, 2007 will receive full consideration.
The University of Georgia is an Equal Opportunity/Affirmative Action Institution.
John P. Shields
Center for Ultrastructural Research
151 Barrow Hall
University of Georgia
Athens, GA 30602

706-542-4080


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From: rcommon-at-msu.edu
Date: Fri, 3 Aug 2007 10:46:40 -0500
Subject: [Microscopy] Freezing 4489 Film

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Does anyone have experience freezing 4489 TEM film for long-term storage? I
have stored many types of film at -20C with no problems, but haven't tried
it with 4489. Can this cause condensation or other problems?

Ralph Common
Michigan State University


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From: cdavis-at-deltacollege.edu
Date: Fri, 3 Aug 2007 10:59:35 -0500
Subject: [Microscopy] 4489 Film

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I am posting this on behalf of a colleague. This is a wafer fab
in-line SEM I believe.
Please send any responses to Ron or Donna.
=========================================================================================

We have received the following request concerning the need for
field service support for a "down" AMAT Opal 7830 SEM tool. I
was wondering if any of you were aware of a field service
engineer, or field service team that could provide repair on this
tool.
Please contact Donna Pistotti at dpistot1-at-irf.com if you have a
solution or recommendation for her and cc me
(ron.kee-at-avagotech.com) on your response so I can know if there
is solution forthcoming, sooner than AMAT
can respond on September 10...

Regards,
Ron Kee
Analysis Lab R&D manager
Avago Technologies
Ft. Collins, CO
(970) 288-9389

-----Original Message-----
X-from: Donna Pistotti [mailto:DPISTOT1-at-irf.com]
Sent: Thursday, August 02, 2007 8:48 AM
To: LT-at-waferfabs.org
Cc: Sharon Noyes

We have had no problems feezing 4489 film at our school for long periods
of time. Sometimes for several years. There has never been any problem
with condensation.

Cathy Davis
San Joaquin Delta College
EM Lab


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From: frank.karl-at-degussa.com
Date: Fri, 3 Aug 2007 11:29:12 -0500
Subject: [Microscopy] TEM Calibration details (sort of)

Contents Retrieved from Microscopy Listserver Archives
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The votes are in and here's the partial summary of what people use to
calibrate their TEM:
My informal survey is based on 24 responses:
63% (14 people) use a grating replica,
68% (15 people) use crystal spacing.

26% of the respondents indicated they use a commercial product called
Mag*I*Cal.

For more details and a little verbiage visit Microscopy Society of
Northeastern Ohio Blog at:
http://www.msneo.org/2007/08/scales-and-distance.html (my face will be
really red, if this link doesn’t work!) You can also find what I think is
the most unique TEM calibration I've ever read.

Have a great week-end

Frank


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From: jpshield-at-uga.edu
Date: Fri, 3 Aug 2007 13:28:13 -0500
Subject: [Microscopy] date correction on UGA position

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Note that deadline is Nov. 1, 2007 not Aug. 24
Thanks

Position Description
Academic Professional Associate in Physical, Material, and Geosciences

The Center for Ultrastructural Research (CUR) is seeking a scientist in materials characterization at the Ph.D. level. This individual will function at the professional/faculty level, collaborating with physical sciences users in experimental design, implementation, and analysis.

The individual to be hired will be expected to have accomplished original research, as witnessed by a publication record in materials sciences and/or related areas. He or she will be responsible for training and supervising users in TEM, SEM, electron diffraction, X-ray emission analysis, and X-ray microtomography. The individual will work to deliver pedagogic instruction in course offerings such as Electron Microscopy, Cellular Biology (i.e., Techniques in Modern Microscopy), and Clay Mineralogy.

The individual will assist physical sciences users of the CUR and share responsibility for the maintenance of instruments including: two TEM’s, two SEM’s, a confocal fluorescence microscope equipped for multiphoton microscopy with a femtosecond pulsed IR laser, a micro-computed tomography apparatus, and a deconvolution microscopy-capable inverted light microscope.

The individual to be hired will have the opportunity to conduct and publish independent research in his or her area of expertise and to submit grants both to support their own research and to augment the instrumentation at the CUR. Entry level salary will be around $47,000, with an increase commensurate with demonstrated experience. Inquiries and application should be directed to Dr. Paul A. Schroeder, Center for Ultrastructural Research, 151 Barrow Hall, University of Georgia, Athens, GA 30602 USA. (706) 542-4080 mailto:caur-at-uga.edu. Please include a curriculum vitae, statement of interest, and contact information for at least three references. Applications received before Nov. 1, 2007 will receive full consideration.
The University of Georgia is an Equal Opportunity/Affirmative Action Institution.
John P. Shields
Center for Ultrastructural Research
151 Barrow Hall
University of Georgia
Athens, GA 30602

706-542-4080


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From: frank.karl-at-degussa.com
Date: Fri, 3 Aug 2007 13:59:48 -0500
Subject: [Microscopy] Re: TEM Calibration details (sort of)

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Hi Pat,
I may have missed that note, our server somehow misplaces things. I
checked on Mag*I*Cal and you are correct. NIST doesn't calibrate "
fundamental constants of nature." Seems a shame.

Thanks for the note!

Enjoy the week-end!




Patricia Connelly
{connellyps-at-nhlbi To: {frank.karl-at-degussa.com}
.nih.gov} cc:
Subject: Re: [Microscopy] TEM Calibration details (sort of)
08/03/2007 02:34
PM





Frank,
I think that there was a correction by the microscopist who gave the
message about the NIST traceability. If I remember correctly he wrote
"now"
and corrected it to "not".

Pat Connelly






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From: afong-at-olinet.com
Date: Fri, 3 Aug 2007 16:23:41 -0500
Subject: [Microscopy] Job Posting: Product Marketing/Sales Manager

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Title: Product Marketing/Sales Manager

Job Summary: Chromodynamics Inc. is seeking a Product/Sales Management
candidate with a science background and knowledge of the microscope
community, strong computer skills and at least one year of hands-on
experience using a Confocal or similar advanced light microscope for its new
hyperspectral imaging product line.

Location: Orlando, FL or Lakewood, NJ

Responsibilities:

- Customer visits and analysis of customer's imaging needs
- Demonstration of products and onsite work with the customer
- Sales support of existing customers
- Identifying potential new customers via web searches, literature searches,
marketing campaigns, trade shows, and customer referrals
- Introduction of Chromodynamics products and services to potential
customers via in person visits, email and phone
- Understanding potential customers needs related to products offered by
Chromodynamics Inc.
- Organizing workshops and demonstrations for regional sales
representatives, distributors and VARs (value-added resellers)
- Monitor daily/monthly orders and provide information in regards to account
details
- Expand sales channels to increase market penetration in designated product
areas and markets.
- Attain maximum sales and appropriate product mix.
- Uncover new sales opportunities through cold calling, networking and other
proven marketing strategies
- Relay leads to dealer personnel, follow up and monitor outcome
- Watch for and identify new markets
- Set and achieve established sales goals
- Develop thorough knowledge of all frequently encountered applications and
their appropriate solutions for which related products are required
- Report significant changes or trends in area sales.
- Provide feedback on product quality, needs, competition, business trends
and unique product applications to management team
- Complete required reports
- Maintain files and records of customer names, orders and locations
- Develop strategic marketing plan and coordinate the sales activities in
conjunction with Engineering and Operations to achieve stated goals

Reporting directly to the Vice-President of Marketing and Sales, this key
contributor will work with our potential and existing clients, through
direct and indirect channels, to meet their life science imaging needs with
Chromodynamics Inc. leading solutions and expertise.

As the customer's point of contact, they must be able to provide
applications assistance, product support and sales of Chromodynamics Inc.
products and services to technical buyers. Must have experience responding
to tenders, RFPs, RFQs, generating contracts, bid proposals and supporting
the negotiation and closing sales with our distributors and representatives.
They will follow up on quotations, drive processing of orders and maintain
adequate records to document price quotations, decisions, progress and
results of activity. They will use available resources such as sales leads,
literature, samples and demos, telephones, Internet and email, computers and
support staff and services to produce the most effective results and
exercise strong administrative, organizational and communication skills.

Minimum Desired Qualifications:

A Bachelors degree in the sciences (i.e. biology, chemistry, physics or
equivalent) and a minimum of 4 years experience or a graduate degree or
equivalent and a minimum of 2 years of applicable laboratory and sales
experience required. Proficient use of personal computers: Windows 95/98,
NT, XP, MS Word, Excel, PowerPoint, Internet Explorer, Outlook, etc.
Must demonstrate the ability to simplify problems, articulate solutions,
lead and delegate, have excellent communication skills and be a highly
motivated team oriented self-starter. Travel required up to 25%.

Contact:

ChromoDynamics, Inc.
1195 Airport Road, #1
Lakewood, New Jersey 08701
Fax: 732.730.3547
Email: careers-at-olinet.com
Web: http://www.chromodynamics.net/


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From: smithj-at-exchange.winthrop.edu
Date: Mon, 6 Aug 2007 08:14:10 -0500
Subject: [Microscopy] LM: Axioskop uneven illumination

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

LM and imaging folk--we have a first-generation zeiss axioskop that
we've just set up with a scion digital camera and diagnostic
instruments coupler for transmitted-light photomicrography.
The illuminated field is hideously uneven, with a central hot-spot.
The Scion doesn't do shading correction, so, aside from flat-field
correction in ImageJ, has anyone else experienced/solved this
problem? Will a diffuser in the beam path help?
TIA
Julian
--
Julian P.S. Smith III
Dept. of Biology
Winthrop University
520 Cherry Rd.
Rock Hill, SC 29733

803-323-2111 x6427 (vox)
803-323-3448 (fax)
803-524-2347 (cell)

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From: pmoeck-at-pdx.edu
Date: Mon, 6 Aug 2007 11:33:12 -0500
Subject: [Microscopy] viaWWW: Postdoc Position Open @ Portland State

Contents Retrieved from Microscopy Listserver Archives
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This Question/Comment was submitted to the Microscopy Listserver
using the WWW based Form at http://microscopy.com/MLFormMail.html
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Email: pmoeck-at-pdx.edu
Name: Peter Moeck

Organization: Portland State University

Title-Subject: [Filtered] Postdoc up to 3 years, Crystallographic and
spectroscopic analyses of ferromagnetic semiconducting nanoparticle
aggregates

Question: Postdoc (USA, University of Davis, California and west
coast based) for a collaboration between Portland State University,
the University of California at Davis, the University of Washington
at Seattle, and the Pacific NorthWest National Laboratory

Initially for one year at $35,500 plus the typical fringe benefits
(health insurance, retirement benefits, etc. ... package that
ammounts to about $17,500 annually) available from September 1st,
2007, onwards, extendable up to 3 years by mutual agreement.

A group of collaborators from Portland State University, the
University of California at Davis, and the University of Washington
at Seattle is seeking a postdoc for a project on Crystallographic and
spectroscopic analyses of ferromagnetic semiconducting nanoparticle
aggregates with Curie temperatures well above room temperature.

A background in materials physics, materials chemistry,
crystallography, or materials science and engineering is required.
Familiarity with Z-contrast (HAADF) imaging in scanning transmission
electron microscopes and associated electron energy loss spectroscopy
are essential. Skills in high resolution phase-contrast transmission
electron microscopy, electron diffraction and crystallography, and
crystallographic image processing will be appreciated.

The search will be open until the position has been filled.
Applications (CV, list of referees, reasons for coming to the US for
applicants from aboard, list of publications, etc.) should be sent to
both

Prof. Peter Moeck
Department of Physics
Portland State University
P.O. Box 751
Portland, Oregon 97207-0751
Tel.: 503 725 4227
Fax: 503 725 2815
e-mail: pmoeck-at-pdx.edu

and

Prof. Nigel D. Browning
Department of Chemical Engineering and Materials Science
University of California-Davis
One Shields Ave
Davis, CA 95616
Tel: 530-754-5358 (Davis)
Fax: 530-752-9554 (Davis)
e-mail: nbrowning-at-ucdavis.edu

---------------------------------------------------------------------------

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13, 11 -- Subject: viaWWW: Postdoc Position Open -at- Portland State
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From: sergei2-at-ornl.gov
Date: Mon, 6 Aug 2007 14:20:50 -0500
Subject: [Microscopy] PFM Workshop - Oak Ridge, October 8,9

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Dear colleagues

We are bringing to your attention the workshop
"Piezoresponse Force Microscopy: Instrumentation, Techniques, and
Applications" to be held at Oak Ridge, TN on October 8-9, 2007, in
conjunction with the CNMS User Meeting (http://cnms.ornl.gov/). The
workshop focuses on electromechanical coupling in inorganic and
macromolecular materials and biological systems and will feature invited
tutorials on emergent phenomena in nanoscale ferroelectrics and
ferroelectric surfaces, polarization-mediated surface phenomena in polar
materials, and piezoelectricity and electrophysiology of biosystems. The
central theme of the workshop - Piezoresponse Force Microscopy - will be
discussed in a series of tutorials by S.V. Kalinin (ORNL) and A.
Gruverman (UNL), that will introduce basic principles of PFM operation,
relevant instrumental aspects, and recent advances in PFM imaging of
switching ferroelectric films and nanostructures, biological materials
and macromolecular systems, and PFM in liquid and ultra high vacuum
environment. The tutorials will be complemented by a poster session.

The 2 day workshop will be followed by 3 days of
experimental demonstrations of PFM, Switching Spectroscopy PFM, and
band-excitation PFM by CNMS staff members and Asylum Research
representatives, held in parallel with the CNMS user meeting (October
10-12). The participants are welcome to bring their own samples. The
workshop abstract and outline are available on line at
http://cnms.ornl.gov/workshops/CNMS_PFM_Workshop.pdf. The registration
information will be available shortly at
http://neutrons.ornl.gov/workshops/users2007/

The invited speakers include:

M. Gregg (U. Belfast), "Nanoscale Ferroelectrics: Where Size Really Does
Matter"

S. Streiffer (Argonne National Lab.), "Phase transitions, domain
structure & dynamics, and surface chemistry in ferroelectrics studied by
x-rays"

Andrew M. Rappe (University of Pennsylvania), "First-principles and
multiscale modeling of ferroelectrics"

Andrew Marino (LSU), "Electromechanics of biosystems"

Due to the space limit, please contact workshop organizers
[sergei2-at-ornl.gov] by August 31 if you are interested in attending.

Yours

Sergei V. Kalinin and Arthur P. Baddorf


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From: frank.karl-at-degussa.com
Date: Tue, 7 Aug 2007 06:36:21 -0500
Subject: [Microscopy] Test - Please delete

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

tets


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From: nizets2-at-yahoo.com
Date: Tue, 7 Aug 2007 07:29:52 -0500
Subject: [Microscopy] MC 2007 in Saarbrücken, Germany

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Dear listers,

Please forgive me for using the list to try and solve
a personal problem, but I cannot obtain an answer to
my question by the official route, so I send this
message in a bottle in the hope that some personality
involved in the conference will read it and answer it.

I simply would like to know the subjects of the
different workshops planned during the conference.

Regards,

Stephane


____________________________________________________________________________________
Shape Yahoo! in your own image. Join our Network Research Panel today! http://surveylink.yahoo.com/gmrs/yahoo_panel_invite.asp?a=7



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From: reznik-at-ict.uni-karlsruhe.de
Date: Tue, 7 Aug 2007 13:06:55 -0500
Subject: [Microscopy] viaWWW: SEM_S570_1

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Email: reznik-at-ict.uni-karlsruhe.de
Name: Boris

Title-Subject: [Filtered] SEM_S570_1

Question: I have an old Hitachi SEM, S-570 with a digital photocamera
NikonD100 attached to the camera unit. At the observation CRT the
SEM-images are sharp while at the CCD the images are not sharp at
different camera positions. I checked the CCD camera as I took
pictures directly from the observation CRT, and the pictures are
sharp. I think that something is wrong with the justage or quality of
the photo CRT.
Does anybody know, how can I overcome my problem?

Boris

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From: bozzola-at-siu.edu
Date: Tue, 7 Aug 2007 13:59:02 -0500
Subject: [Microscopy] Re: viaWWW: SEM_S570_1

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Hello Boris,

First thing to do, if you possibly can, is to check the quality of
the photo CRT by shooting some conventional film (say Polaroid). This
is fairly important since it will tell you if its a problem with the
photo CRT.

Is this the first time setting up the 570 with a digital camera or
was it working fine and then became unsharp?

We have a Hitachi S2460N to which I attached a Nikon D70S digital
camera. It works fine but one must be very careful setting the
camera focus on the CRT is critical. Is it possible that the camera
is slipping out of focus (loose components)?

JB

} Question: I have an old Hitachi SEM, S-570 with a digital photocamera
} NikonD100 attached to the camera unit. At the observation CRT the
} SEM-images are sharp while at the CCD the images are not sharp at
} different camera positions. I checked the CCD camera as I took
} pictures directly from the observation CRT, and the pictures are
} sharp. I think that something is wrong with the justage or quality of
} the photo CRT.
} Does anybody know, how can I overcome my problem?
}
} Boris
}
} ---------------------------------------------------------------------------
}
} ==============================Original Headers==============================
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} 6, 11 -- Subject: viaWWW: SEM_S570_1
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--
+++++++++++++++++++++++++++++++++++++++++++++++++++++++

John J. Bozzola, Ph.D., Director
Integrated Microscopy & Graphics Expertise (IMAGE)
Southern Illinois University
750 Communications Drive - MC 4402
Carbondale, IL 62901
Telephone: 618-453-3730

+++++++++++++++++++++++++++++++++++++++++++++++++++++++

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From: David.Llewellyn-at-anu.edu.au
Date: Wed, 8 Aug 2007 08:20:15 -0500
Subject: [Microscopy] viaWWW: sloan thickness monitor DTM200

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Email: David.Llewellyn-at-anu.edu.au
Name: David Llewellyn

Organization: Australian National University

Title-Subject: [Filtered] sloan thickness monitor DTM200

Question: Hi all, would anyone have a manual for the thickness coater
complete with circuit diagrams, I need to carry out a fix on one of
these devices, thanks, David.

---------------------------------------------------------------------------

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From: TMurray-at-uamail.albany.edu
Date: Wed, 8 Aug 2007 09:12:24 -0500
Subject: [Microscopy] Seeking 200CX Double Tilt Holder

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

I am looking for a double tilt holder for a JEOL 200CX TEM.  OEM or Gatan is fine, I'm not picky.
 
If you know of any out there please let me know.
 
Thanks,
 
Tom
 
Thomas M. Murray
Senior Research Support Specialist / Instructor
College of Nanoscale Science & Engineering
University at Albany-SUNY
251 Fuller Rd.
Albany, NY 12203
 
Phone: (518) 437-8636
Fax: (518) 437-8687
cell: (518) 487-9535
tmurray-at-uamail.albany.edu
 


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From: nizets2-at-yahoo.com
Date: Thu, 9 Aug 2007 07:44:44 -0500
Subject: [Microscopy] question about EDX signal saturation

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Hi all!

I am having a too strong signal in EDX (in SEM).
The dead time is usually between 70-80%.
I wondered how I could reduce the signal without
changing the HT.
Changing the size of the beam is one way.
Would it be wise to move the stage in the Z axis to be
sub-optimal with respect to the EDX detector?
Any other idea?

Stephane



____________________________________________________________________________________
Got a little couch potato?
Check out fun summer activities for kids.
http://search.yahoo.com/search?fr=oni_on_mail&p=summer+activities+for+kids&cs=bz

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From: maryflet-at-interchange.ubc.ca
Date: Thu, 9 Aug 2007 12:08:18 -0500
Subject: [Microscopy] question about EDX signal saturation

Contents Retrieved from Microscopy Listserver Archives
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Dear Stephane,
It is not a good idea to move the Z axis of the SEM stage for EDX, this will
upset the geometry of the beam-detector system and affect quantitation.
There are three possibilities: get an SDD detector, which is much more
tolerant of high beam currents, use a higher condenser lens setting (smaller
beam spot size) or a smaller final aperture, if your SEM has a movable final
aperture. You could also move the EDX detector back along its track (retract
it), which will change the solid angle but not the geometry. You may have to
re-enter the geometry in the EDX setup if you do that.
If you change the HT of the SEM, you may not detect all the elements.
Good luck,

Mary Fletcher (nee Mager)
Electron Microscopist
Materials Eng. UBC
#309 - 6350 Stores Road
Vancouver, B.C. V6T 1Z4
Canada
Tel: 604-822-5648
Fax: 604-822-3619
email: maryflet-at-interchange.ubc.ca


-----Original Message-----
X-from: nizets2-at-yahoo.com [mailto:nizets2-at-yahoo.com]
Sent: August 9, 2007 5:54 AM
To: maryflet-at-interchange.ubc.ca

Hi all!

I am having a too strong signal in EDX (in SEM).
The dead time is usually between 70-80%.
I wondered how I could reduce the signal without
changing the HT.
Changing the size of the beam is one way.
Would it be wise to move the stage in the Z axis to be
sub-optimal with respect to the EDX detector?
Any other idea?

Stephane



____________________________________________________________________________
________
Got a little couch potato?
Check out fun summer activities for kids.
http://search.yahoo.com/search?fr=oni_on_mail&p=summer+activities+for+kids&c
s=bz

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From: chunfei-at-pdx.edu
Date: Sept. 13 (Thursday)-14 (Friday), 2007
Subject: [Microscopy] microtomy workshop at Portland State University, Sept. 13-14

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Dear all,

Please see the announcement for a free workshop on microtomy. Thanks.


Chunfei Li
Portland State University






Agenda
Unless specified, lecture and training will be conducted by Dave
Roberts/Greg Becker from RMC Products

Sep. 13 (Thursday), 2007
8:30AM Introduction: Goals and schedule. Get acquainted with
participants and their projects (Chunfei Li, PSU; Dave Roberts/Greg
Becker, RMC)
9:00AM Short PowerPoint presentation on ultramicrotomy for materials
and biological applications
10:00AM Ultramicrotomy of very hard specimens. Presentation and
discussion (Unity Semiconductor, Phil Swab)
11:00AM Practical demonstration of room temperature ultramicrotomy
12:00AM Lunch Break
1:00PM Hands-on workshop for room temperature ultramicrotomy
3:00PM Glass knife making demonstration and discussion on
ultramicrotomy knives
3:30PM Further hands-on room temperature ultramicrotomy
5:00PM Discussion of the days results


Sept. 14 (Friday), 2007
08:30 FIB specimen preparation of softmaterial and Tomography (FEI,
Richard Gursky)
09:30 High pressure freezing (Shriner Hospital, Doug Keene)
10:30 Practical cryoultramicrotomy demonstration
11:00 Hands-on cryoultramicrotomy
12:00 Lunch
1:00 Further hands-on cryoultramicrotomy
4:30 Discussion of cryoultramicrotomy results. Ultramicrotomy
problem solving.
5:00 Conclusion of workshop


Pre-registration Form
Although drop-in attendants are welcome, pre-registration is strongly
suggested for better coordination.
Name:
Affiliation: phone/e-mail:
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From: nizets2-at-yahoo.com
Date: Fri, 10 Aug 2007 06:10:15 -0500
Subject: [Microscopy] RE: question about EDX signal saturation

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Fri, 10 Aug 2007 06:10:15 -0500

Thank you Mary (and Austin too and all the others) for
your valuable opinion.
As someone pointed out, when I decrease the beam size
my signal immediately disappears under the noise in
BSE(i am at step 2 on a scale of 20). As for the "time
constant", I think on my SEM (it is a Tescan) it is
called "process time", I will check this parameter but
I don't think it will change much, I must keep it
quite high otherwise I lose the resolution of the
peaks (high process time=high dead time, lower counts
and better resolution). However it is probably the
main parameter I'll be able to modify.

I cannot change the apertures.

I could retract the detector, but it is immmobilized
in this position and I do not dare to do it. What do
you mean by "reenter the geometry of the EDX setup"?
Do you mean make a new calibration?

regards,

Stephane

--- Mary Fletcher {maryflet-at-interchange.ubc.ca} wrote:

} Dear Stephane,
} It is not a good idea to move the Z axis of the SEM
} stage for EDX, this will
} upset the geometry of the beam-detector system and
} affect quantitation.
} There are three possibilities: get an SDD detector,
} which is much more
} tolerant of high beam currents, use a higher
} condenser lens setting (smaller
} beam spot size) or a smaller final aperture, if your
} SEM has a movable final
} aperture. You could also move the EDX detector back
} along its track (retract
} it), which will change the solid angle but not the
} geometry. You may have to
} re-enter the geometry in the EDX setup if you do
} that.
} If you change the HT of the SEM, you may not detect
} all the elements.
} Good luck,
}
} Mary Fletcher (nee Mager)
} Electron Microscopist
} Materials Eng. UBC
} #309 - 6350 Stores Road
} Vancouver, B.C. V6T 1Z4
} Canada
} Tel: 604-822-5648
} Fax: 604-822-3619
} email: maryflet-at-interchange.ubc.ca
}
}
} -----Original Message-----
} From: nizets2-at-yahoo.com [mailto:nizets2-at-yahoo.com]
} Sent: August 9, 2007 5:54 AM
} To: maryflet-at-interchange.ubc.ca
} Subject: [Microscopy] question about EDX signal
} saturation
}
}
}
}
}
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}
} Hi all!
}
} I am having a too strong signal in EDX (in SEM).
} The dead time is usually between 70-80%.
} I wondered how I could reduce the signal without
} changing the HT.
} Changing the size of the beam is one way.
} Would it be wise to move the stage in the Z axis to
} be
} sub-optimal with respect to the EDX detector?
} Any other idea?
}
} Stephane
}
}
}
}
____________________________________________________________________________
} ________
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} Check out fun summer activities for kids.
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} saturation
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____________________________________________________________________________________
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From: David.Llewellyn-at-anu.edu.au
Date: Fri, 10 Aug 2007 08:42:12 -0500
Subject: [Microscopy] viaWWW: sloan thickness monitor DTM200

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Email: David.Llewellyn-at-anu.edu.au
Name: David Llewellyn

Organization: Australian National University

Title-Subject: [Filtered] sloan thickness monitor DTM200

Question: Hi all, would anyone have a manual for the thickness coater
complete with circuit diagrams, I need to carry out a fix on one of
these devices, thanks, David.

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6, 11 -- Subject: viaWWW: sloan thickness monitor DTM200
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From: modla-at-dbi.udel.edu
Date: Fri, 10 Aug 2007 08:42:40 -0500
Subject: [Microscopy] viaWWW: Beetle Cuticle for TEM

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Email: modla-at-dbi.udel.edu
Name: Shannon Modla

Organization: Delaware Biotechnology Institute

Title-Subject: [Filtered] Beetle Cuticle for TEM

Question: I am attempting to examine beetle cuticle (the wing cover)
by TEM but with limited success. In past efforts, I fixed the
cuticle overnight in 2.5% glutaraldehyde in sodium cacodylate buffer
and post-fixed it in 0.5% osmium tetroxide for 2 hours. Following a
standard dehydration in acetone, I slowly infiltrated in Spurr's over
the course of a week to ensure full penetration of the resin into the
cuticle. I was able to obtain ultrathin sections, but I could not
get them to completely flatten. I used both chloroform vapors and a
heat pen, but neither would flatten the sections completely.

I know that insect cuticle has a very elastic protein called resilin.
I've heard of people dissolving protein from the cuticle by using a
KOH solution. I thought that removing this protein could resolve the
wrinkle problem, but I am concerned that it would disrupt the
ultrastructure.

I was wondering if anyone has had any experience with processing
insect cuticle for the TEM and if they could offer any suggestions.

Any feedback would be greatly appreciated!


Sincerely,

Shannon Modla
Research Associate
Delaware Biotechnology Institute, BioImaging Center
15 Innovation Way
Newark, DE 19711


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From: teresa.boes-at-hp.com
Date: Fri, 10 Aug 2007 09:12:38 -0500
Subject: [Microscopy] viaWWW: Epoxy in ultra-high vacuum TEM

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Email: teresa.boes-at-hp.com
Name: Teresa Boes

Organization: Hewlett Packard

Title-Subject: [Filtered] Epoxy in ultra-high vacuum TEM

Question: We are occasionally using Epoxy Bond 110 and sometimes
M-Bond 610 to prepare samples and to attach wedge-polished sections
to TEM grids. After following the prescribed time and temperature
curves for curing, we ion mill and image in an ultra-high vacuum,
high resolution TEM. We have more beam contamination on
wedge-polished samples than on FIB prepared samples (our most usual
method of sample prep), and there is a small, but noticable
degredation in vacuum for about a week after imaging wedge-polished
samples. We are thinking the contamination and vacuum degredation
may be due to an incomplete cure of the epoxy.

Has anyone else had experience with having to adjust adhesive cure
times for ultra-high vacuum TEM work? Does anyone have a
recommendation for an epoxy that may cure more throughly and cause
less contamination? Also, we have always assumed that using as
little epoxy as possible is a good thing, but is there a minimum
volume necessary for the initiation of cross-linking during the cure?

Thanks for your help.

Teresa

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9, 11 -- Subject: viaWWW: Epoxy in ultra-high vacuum TEM
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From: kerem.uenal-at-uci.edu
Date: Fri, 10 Aug 2007 09:13:21 -0500
Subject: [Microscopy] viaWWW: two postdoctoral scholar positions at the UC Irvine

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Email: kerem.uenal-at-uci.edu
Name: Kerem Unal

Organization: UC Irvine

Title-Subject: [Filtered] two postdoctoral scholar positions at the UC Irvine

Question: Two postdoctoral scholar positions are open in the Prof.
Wickramasinghe Lab at the UC Irvine :

- One postdoctoral scholar in the general area of instrument
development with a strong background in optics
to assist with the development of novel instrumentation for
genome sequencing.

http://www.eng.uci.edu/node/1287

- One postdoctoral scholar in the general area of
microfabrication with strong background in micromechanics and
lithography
to assist in the development of micromechanical sensors for
novel genome sequencing devices.

http://www.eng.uci.edu/node/1286

Please send your curriculum vitae, a list of publications, and names
of at least three references to:

Professor H. Kumar Wickramasinghe
Department of Electrical Engineering and Computer Science
325 Engineering Tower
University of California, Irvine
Irvine, CA 92696-2175

Alternatively, materials may be submitted electronically to:
Professor H. Kumar Wickramasinghe at: hkwick-at-uci.edu


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From: xiaohutang-at-gmail.com
Date: Fri, 10 Aug 2007 09:14:08 -0500
Subject: [Microscopy] viaWWW: Thin film thickness measurement by SEM/EDX

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Email: xiaohutang-at-gmail.com
Name: Xiaohu Tang

Organization: Delft University of Technology

Title-Subject: [Filtered] Thin film thickness measurement by SEM/EDX

Question: Dear listeners,

I am trying to measure the thickness of Mo film (about 100nm) on Si
substrate by SEM/EDX and Wincasino simulation. From my understanding,
Wincasino can simulate a calibration curve of film thickness vs. the
x-ray peak ratio of Mo/Si with the same parameters used in experiment
(beam energy, TOA, etc.). The real thickness can be located on the
calibration curve based on the experimentally measured Mo/Si ratio.
It supposed to be an accurate method but I have two questions:

1. Is this method sensitive to the experiment settings (beam energy)
and how accurate is it?

2. In Wincasino, which x-ray intensity can be used for peak ratio
calculation, absorbed or non-absorbed intensity, or the difference of
them? I tried some measurements but they are not promising.

Please also correct me if the procedure I described is wrong.

Xiaohu

Microlab
Delft University of Technology

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From: maryflet-at-interchange.ubc.ca
Date: Fri, 10 Aug 2007 11:38:10 -0500
Subject: [Microscopy] viaWWW: Epoxy in ultra-high vacuum TEM

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Dear Teresa,
My experience in studying contamination in the SEM was that the
contamination was bad for three days after the electron beam hit and
"burned" or vapourized the epoxy around a sample. I don't think it was
incomplete cure, just that the energy of the beam was high enough to
disintegrate the epoxy and put the carbonaceous vapour all through the
chamber vacuum.
Using as small an amount as possible and keeping the epoxy away from the
beam would be my suggestion. Also, you need to mix enough of the components
to get the ratios correct and to allow thorough mixing. I find most of my
epoxy failures are because of inaccurate ratios or less that complete
mixing.
Good luck.

Mary Fletcher (nee Mager)
Electron Microscopist
Materials Eng. UBC
#309 - 6350 Stores Road
Vancouver, B.C. V6T 1Z4
Canada
Tel: 604-822-5648
Fax: 604-822-3619
email: maryflet-at-interchange.ubc.ca


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Email: teresa.boes-at-hp.com
Name: Teresa Boes

Organization: Hewlett Packard

Title-Subject: [Filtered] Epoxy in ultra-high vacuum TEM

Question: We are occasionally using Epoxy Bond 110 and sometimes
M-Bond 610 to prepare samples and to attach wedge-polished sections
to TEM grids. After following the prescribed time and temperature
curves for curing, we ion mill and image in an ultra-high vacuum,
high resolution TEM. We have more beam contamination on
wedge-polished samples than on FIB prepared samples (our most usual
method of sample prep), and there is a small, but noticable
degredation in vacuum for about a week after imaging wedge-polished
samples. We are thinking the contamination and vacuum degredation
may be due to an incomplete cure of the epoxy.

Has anyone else had experience with having to adjust adhesive cure
times for ultra-high vacuum TEM work? Does anyone have a
recommendation for an epoxy that may cure more throughly and cause
less contamination? Also, we have always assumed that using as
little epoxy as possible is a good thing, but is there a minimum
volume necessary for the initiation of cross-linking during the cure?

Thanks for your help.

Teresa

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From: donovan-at-uoregon.edu
Date: Fri, 10 Aug 2007 12:30:07 -0500
Subject: [Microscopy] Re: viaWWW: Thin film thickness measurement by

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Xiaohu,
If you only need thickness (not composition), this thickness is
perfect for x-ray reflectivity measurements and is very accurate
because it looks at the constructive/destructive interference pattern.
john

At 07:20 AM 8/10/2007, you wrote:



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6, 19 -- SEM/EDX
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From: nicholas.ritchie-at-nist.gov
Date: Fri, 10 Aug 2007 12:45:52 -0500
Subject: [Microscopy] Re: viaWWW: Thin film thickness measurement by SEM/EDX

Contents Retrieved from Microscopy Listserver Archives
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Be careful interpreting the results. Microanalytical experiments like
this measure the mass-thickness not the thickness. If you believe you
know the density of your film then you are ok and you can then calculate
the thickness. If the film density is different from you assumed
density (often bulk densities) then you may run into problems.

Nicholas Ritchie

xiaohutang-at-gmail.com wrote:
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} Email: xiaohutang-at-gmail.com
} Name: Xiaohu Tang
}
} Organization: Delft University of Technology
}
} Title-Subject: [Filtered] Thin film thickness measurement by SEM/EDX
}
} Question: Dear listeners,
}
} I am trying to measure the thickness of Mo film (about 100nm) on Si
} substrate by SEM/EDX and Wincasino simulation. From my understanding,
} Wincasino can simulate a calibration curve of film thickness vs. the
} x-ray peak ratio of Mo/Si with the same parameters used in experiment
} (beam energy, TOA, etc.). The real thickness can be located on the
} calibration curve based on the experimentally measured Mo/Si ratio.
} It supposed to be an accurate method but I have two questions:
}
} 1. Is this method sensitive to the experiment settings (beam energy)
} and how accurate is it?
}
} 2. In Wincasino, which x-ray intensity can be used for peak ratio
} calculation, absorbed or non-absorbed intensity, or the difference of
} them? I tried some measurements but they are not promising.
}
} Please also correct me if the procedure I described is wrong.
}
} Xiaohu
}
} Microlab
} Delft University of Technology
}
} ---------------------------------------------------------------------------
}
} ==============================Original Headers==============================
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}



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From: peter.tomic-at-renwireless.com
Date: Fri, 10 Aug 2007 15:23:33 -0500
Subject: [Microscopy] viaWWW: Measuring Film Thickness With EDX

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


Xiaohu,

If I may ask a question, why do you want to measure film thickness
using EDX when you can simply take a cross-section and image it? It
seems like a long route to the answer, and it won't be very reliable
for all the reasons stated on the list. Is this just an experiment
or do you plan on using EDX as a method for process control of some
kind?

Peter



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Email: peter.tomic-at-renwireless.com
Name: Peter Tomic

Title-Subject: [Filtered] Measuring Film Thickness With EDX

Question: Question: Dear listeners,
}
} I am trying to measure the thickness of Mo film (about 100nm) on Si
} substrate by SEM/EDX and Wincasino simulation. From my understanding,
} Wincasino can simulate a calibration curve of film thickness vs. the
} x-ray peak ratio of Mo/Si with the same parameters used in experiment
} (beam energy, TOA, etc.). The real thickness can be located on the
} calibration curve based on the experimentally measured Mo/Si ratio.
} It supposed to be an accurate method but I have two questions:
}
} 1. Is this method sensitive to the experiment settings (beam energy)
} and how accurate is it?
}
} 2. In Wincasino, which x-ray intensity can be used for peak ratio
} calculation, absorbed or non-absorbed intensity, or the difference of
} them? I tried some measurements but they are not promising.
}
} Please also correct me if the procedure I described is wrong.
}
} Xiaohu

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From: Walck-at-SouthBayTech.com
Date: Sat, 11 Aug 2007 01:46:18 -0500
Subject: [Microscopy] Re: viaWWW: Epoxy in ultra-high vacuum TEM

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Teresa,
I have not used the Epoxy Bond 110. I have used the M-Bond 610 and I
don't like it for a number of reasons, but primarily because of its shelf
life and the need to be refrigerated. I prefer the Epoxy Technology
EpoTek 353ND (www.epotek.com). My trick to make sure that my cross
sections are completely cured is to put a drop of epoxy on each Teflon®
jaw of my vise that I place on my hot plate. When the drop hardens, I put
another drop on the other end of the jaws and wait for those to harden.
Then I know that the epoxy that I used is fully cured. It takes longer,
but I absolutely know that it is cured.

I suspect that you are right and that you are not getting a full cure. I
can't imagine that there is enough material that you expose to the beam to
cause a noticeable degradation of the vacuum. Besides, the beam would
have a tendency to polymerize anything that it hits into a carbonaceous
junk.


-Scott

Scott Walck, Ph.D.
Technical Director
South Bay Technology, Inc.
1120 Via Calejon
San Clemente, CA 92673

1-800-728-2233
www.SouthBayTech.com
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} Email: teresa.boes-at-hp.com
} Name: Teresa Boes
}
} Organization: Hewlett Packard
}
} Title-Subject: [Filtered] Epoxy in ultra-high vacuum TEM
}
} Question: We are occasionally using Epoxy Bond 110 and sometimes
} M-Bond 610 to prepare samples and to attach wedge-polished sections
} to TEM grids. After following the prescribed time and temperature
} curves for curing, we ion mill and image in an ultra-high vacuum,
} high resolution TEM. We have more beam contamination on
} wedge-polished samples than on FIB prepared samples (our most usual
} method of sample prep), and there is a small, but noticable
} degredation in vacuum for about a week after imaging wedge-polished
} samples. We are thinking the contamination and vacuum degredation
} may be due to an incomplete cure of the epoxy.
}
} Has anyone else had experience with having to adjust adhesive cure
} times for ultra-high vacuum TEM work? Does anyone have a
} recommendation for an epoxy that may cure more throughly and cause
} less contamination? Also, we have always assumed that using as
} little epoxy as possible is a good thing, but is there a minimum
} volume necessary for the initiation of cross-linking during the cure?
}
} Thanks for your help.
}
} Teresa
}
} ---------------------------------------------------------------------------
}
} ==============================Original
} Headers==============================
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}





==============================Original Headers==============================
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From: kraftpiano-at-gmail.com
Date: Sat, 11 Aug 2007 08:28:38 -0500
Subject: [Microscopy] JEOL Beam Interceptor wiring

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

I've got the JSM-35 put together, but I have one last component to
connect. It is a "JEOL Beam Interceptor" made by Krisel Control, Inc.
It is a digital picoammeter which connects to a black solenoid that
inserts a Faraday cup directly under the beam to measure beam current.
It has three connectors on the back, labeled "J1-Power" "J2- Beam
Current" and "J3- Sample Current."

I have a cable that goes to the J2-Beam Current connector, and this
cable goes to a small box with a switch on it, which in turn connects
to the solenoid and Faraday cup. Can anyone tell me where the power
cable connects to? I have a bunch of the blue "Stick and twist" cable
connectors that I can make a cable with, but I need to know where to
get the power from, or at least what voltage to use.

The "Sample current" plug is actually using four wires, so I'm not
entirely sure how to convert that to connect to the insulated plug on
the outside of the chamber door. Again, a pinout or reference would
be greatly appreciated.

Thank you,

Justin A. Kraft

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From: ZAMTM-at-AOL.COM
Date: Sat, 11 Aug 2007 11:16:47 -0500
Subject: [Microscopy] AskAMicroscopist: Light microscope/digital image camera?

Contents Retrieved from Microscopy Listserver Archives
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This Question was submitted to Ask-A-Microscopist by (ZAMTM-at-AOL.COM)
from http://www.microscopy.org/Ask-A-Microscopist/Ask-A-Microscopist.html on Saturday, August 11, 2007 at 10:50:35
Remember to consider the Grade/Age of the student when considering the Question
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Please reply to both ZAMTM-at-AOL.COM as well as to the Microscopy Listserver
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Email: ZAMTM-at-AOL.COM
Name: Michael T. Masnik

Organization: Hobbist

Education: Graduate College

Location: Vienna, VA 22180 USA

Title: Light microscope/digital image

Question: I have over the past couple of years amassed a AO Series 10 phase contrast microscope that gives a great image. I would like to hook it up to a digital camera (I have a triocular head) and be able to download images to my PC. I am an aquatic ecologist and interested in images of aquatic microorganisms. I am at a loss as to what kind, resolution, manufacturer to approach for the digital camera. I want to spend no more than 2 to 3 hundred dollars for the camera an software. Any recommendations, any articles that might help me decide?

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From: cammer-at-aecom.yu.edu
Date: Sat, 11 Aug 2007 11:26:35 -0500
Subject: [Microscopy] recovery after a fire

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

There was a serious electrical fire in rooms adjacent to our laboratory.
None of our equipment was damaged by heat, water, powder or foam, but many
of our electrical and optical components ranging from high end lasers to
microscopes and cameras etc. were essentially submerged in a sea of smoke,
fumes and soot to varying degrees.

If anybody has personal experience with this, would you please email me
off-list or could we please set up a telephone call to discuss how you
dealt with this problem.

Thank you.

-Michael


_________________________________________
Michael Cammer http://www.aecom.yu.edu/aif/



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From: gwe-at-ufl.edu
Date: Sun, 12 Aug 2007 12:47:46 -0500
Subject: [Microscopy] MSA Tutorial DVDs - Prices Slashed

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

The MSA Education Committee has reduced the prices on all Tutorial
DVDs. They are now priced at $8.00 for older ones and $15.00 for more
recent issues.
Get 'em while they are hot! The current catalog can be viewed at :
http://www.msa.microscopy.org/MSAUnits/Education/VideoCatalogue.html
--
Greg Erdos
University of Florida, Retired
Micanopy, Florida

==============================Original Headers==============================
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From: glenmac-at-u.washington.edu
Date: Sun, 12 Aug 2007 17:49:31 -0500
Subject: [Microscopy] Osram vs Ushio

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Hello,
Does anyone have data or experience comparing the Osram 103W2 mercury
bulb to the Ushio 102D with regards to excitation of GFP?

Thanks,
Glen


Glen MacDonald
Core for Communication Research
Virginia Merrill Bloedel Hearing Research Center
Box 357923
University of Washington
Seattle, WA 98195-7923 USA
(206) 616-4156
glenmac-at-u.washington.edu

************************************************************************
******
The box said "Requires WindowsXP or better", so I bought a Macintosh.
************************************************************************
******



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From: ab78-at-esc.cam.ac.uk
Date: Mon, 13 Aug 2007 04:05:03 -0500
Subject: [Microscopy] Re: recovery after a fire

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Insurance ?

When this happened to one of our labs we called the equipment
manufacturers, arranged to ship the stuff back to them and they cleaned
up the internals. It seemed that it was a standard procedure for them. A
particular concern was that smoke/soot deposits might lead to electrical
short circuits.

All covered by the fire insurance.



cammer-at-aecom.yu.edu wrote:
} ----------------------------------------------------------------------------
} The Microscopy ListServer -- CoSponsor: The Microscopy Society of America
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} There was a serious electrical fire in rooms adjacent to our laboratory.
} None of our equipment was damaged by heat, water, powder or foam, but many
} of our electrical and optical components ranging from high end lasers to
} microscopes and cameras etc. were essentially submerged in a sea of smoke,
} fumes and soot to varying degrees.
}
} If anybody has personal experience with this, would you please email me
} off-list or could we please set up a telephone call to discuss how you
} dealt with this problem.
}
} Thank you.
}
} -Michael
}
}
} _________________________________________
} Michael Cammer http://www.aecom.yu.edu/aif/
}
}
}
} ==============================Original Headers==============================
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--
AB78-at-ESC.CAM.AC.UK
DEPARTMENT OF EARTH SCIENCES
UNIVERSITY OF CAMBRIDGE Tel +44 1223 333469
DOWNING STREET +44 1223 333400
CAMBRIDGE FAX +44 1223 333450
CB2 3EQ

Manager of XRD discussion list:
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VirtualWDS: For the synthesis of wavelength-dispersive electron probe
spectra.
http://www.esc.cam.ac.uk/astaff/buckley/VirtualWDS.html

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From: edelmare-at-muohio.edu
Date: Mon, 13 Aug 2007 10:14:58 -0500
Subject: [Microscopy] Re: Freezing 4489 Film

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Ralph:

We freeze 4489 all the time. Been doing it for decades with out a
problem. Have not noticed any issues with any of the "Re-
formulations" (that are sensitive to developing issues). As for
condensation the 4489 comes vacuum packed in mylar bags (50/sheets
per package), allow them to come to room temp before opening
(Completely including the middle of the stack not just the surfaces).

(Remember 4489 must be developed with gas burst agitation).


On 3 Aug 2007 at 11:47, rcommon-at-msu.edu wrote:

}
}
}
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}
} Does anyone have experience freezing 4489 TEM film for long-term storage? I
} have stored many types of film at -20C with no problems, but haven't tried
} it with 4489. Can this cause condensation or other problems?
}
} Ralph Common
} Michigan State University
}
}
} ==============================Original Headers==============================
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} 4, 24 -- Subject: Freezing 4489 Film
} 4, 24 -- Date: Fri, 3 Aug 2007 11:48:08 -0400
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Richard E. Edelmann, Ph.D.
EXPO Editor, Microscopy and Microanalysis Supplement
Electron Microscopy Facility Director
364 Pearson Hall
Miami University, Oxford, OH 45056
Ph: 513.529.5712 Fax: 513.529.4243
E-mail: edelmare-at-muohio.edu
http://www.emf.muohio.edu


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From: slc6-at-lehigh.edu
Date: Mon, 13 Aug 2007 18:01:11 -0500
Subject: [Microscopy] viaWWW: Faculty Position in Analytical Electron Microscopy Lehigh

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Thanks to all who responded. After receiving answers we went back
and beat on Image-J again, and figgured out our mistakes.


Richard E. Edelmann, Ph.D.
EXPO Editor, Microscopy and Microanalysis Supplement
Electron Microscopy Facility Director
364 Pearson Hall
Miami University, Oxford, OH 45056
Ph: 513.529.5712 Fax: 513.529.4243
E-mail: edelmare-at-muohio.edu
http://www.emf.muohio.edu


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From awhitake-at-columbus.rr.com Mon Aug 13 14:39:27 2007
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Email: slc6-at-lehigh.edu
Name: Sharon Coe

Organization: Lehigh University Department of Materials Science & Engineering

Title-Subject: [Filtered] Faculty Position in Analytical Electron Microscopy Lehigh University

Question: Lehigh University (Bethlehem, PA) seeks to fill a tenure track position at the level of Assistant or Associate Professor in Materials Science and Engineering. The department is searching for an outstanding individual who develops new analytical electron microscopy (AEM) techniques and applies these methodologies to solve cutting edge nanocharacterization problems in the fields of Materials Science, Nanotechnology or Electronic Materials. An earned doctorate is required, as well as demonstrated ability in teaching and research. The successful candidate will be responsible for teaching undergraduate and graduate courses in the Materials Science and Engineering curriculum, and establishing a vibrant, high-quality research program. This will include participation in multidisciplinary activities such as those coordinated by the Center for Advanced Materials and Nanotechnology, the International Materials Institute for New Functionality in Glasses, the Sherman Fairchild Center for Solid State Physics, and the Center for Optical Technologies. The Nanocharacterization Laboratory at Lehigh University has an excellent suite of electron-optical instrumentation (www.lehigh.edu/~inmicro) including two state-of-the-art aberration corrected analytical electron microscopes, and is home to the world renowned Lehigh Microscopy School. The successful applicant would be expected to provide leadership in the area of aberration corrected AEM and to champion its application to the study of interfaces on the nanoscale. A strong desire to perform interdisciplinary research and a willingness to collaborate across departmental boundaries are essential. Please submit a CV by October 30, 2007, along with a Teaching Proposal describing instructional philosophy and interests at undergraduate and graduate levels, and a 3-6 page Research Proposal describing an externally fundable research program, to Sharon Coe, Lehigh University, 5 E. Packer Ave., Bethlehem, PA 18015-3195. Lehigh is committed to recruiting, retaining and !
tenuring
women and members of minority groups.

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From: xiaohutang-at-gmail.com
Date: Tue, 14 Aug 2007 07:45:05 -0500
Subject: [Microscopy] viaWWW: Secondary electron yield detection

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Email: xiaohutang-at-gmail.com
Name: Xiaohu Tang

Organization: TU Delft

Title-Subject: [Filtered] Secondary electron yield detection

Question: Hello Listeners,

Here I want to in-situ monitor the secondary electron yield under e-beam irradiation. Could anybody recommend one such SE detector or instrument with such function? Another question is what the extent of gas pressure change (say, changes from 10E-6 to 10E-8mbar) affects SE yield and the detector readings. Thank you.

Regards,

Xiaohu

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From: eschumacher-at-mccrone.com
Date: Tue, 14 Aug 2007 08:32:20 -0500
Subject: [Microscopy] Short Course Announcement: TEM and SEM

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Greetings Colleagues,

The College of Microscopy located in Westmont, IL will be offering the
following electron microscopy short courses this fall:

September 25-27 - Transmission Electron Microscopy

October 15-19 - Scanning Electron Microscopy

In addition to lectures, these courses emphasize hands-on training using
state of the art equipment. For further details and registration
information, please follow the link below.

www.collegeofmicroscopy.com


Elaine Schumacher
Senior Research Scientist
McCrone Associates, Inc.
850 Pasquinelli Drive
Westmont, IL 60559-5539 USA
630-887-7100 (tel)
630-887-7417 (fax)
E-mail: eschumacher-at-mccrone.com
Web Site: www.mccrone.com




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From: voyles-at-engr.wisc.edu
Date: Tue, 14 Aug 2007 20:44:17 -0500
Subject: [Microscopy] database of teaching examples for TEM and STEM

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Dear Colleagues,

I have begun to build a database of examples for use in teaching TEM and
STEM. This project grew out of my need for classroom and homework
examples from techniques that I do not employ in my own research. My
hobby-horse that TEM measurements should be treated as data, not just
pictures, left me unsatisfied with scanning images out of journals, and
the result is now on the web at

http://tem.msae.wisc.edu/emdb/

Please take a look. The coverage at the moment is limited to
materials-oriented TEM and STEM, since those are my areas of expertise,
and remains spotty even within that realm. I therefor also appeal for
contributions to the database, especially interesting EDS spectra and
diffraction contrast images of crystal defects. For those of you in the
US, this is an easy way to leverage "broader impact" from your
NSF-funded research: simply send me an interesting but unpublished
example from your research. Instructions on how to contribute are on
the web site under "About EMdb".

When you access the database, you will be asked for your email address.
This is used only as an easy-to-remember unique identifier so that I
can do some rudimentary tracking of the database use for the purpose of
reporting to NSF.

Please direct any questions, comments, and contributions to me.

Best wishes,
Paul Voyles

Paul Voyles
Materials Science and Engineering
University of Wisconsin, Madison
1509 University Ave, Rm 223
Madison, WI 53706-1595
voice: (608) 265-6740
fax: (608) 262-8353
voyles-at-engr.wisc.edu
http://tem.msae.wisc.edu

==============================Original Headers==============================
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From: reznik-at-ict.uni-karlsruhe.de
Date: Wed, 15 Aug 2007 08:26:15 -0500
Subject: [Microscopy] viaWWW: FFT_Software

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Email: reznik-at-ict.uni-karlsruhe.de
Name: Boris Reznik

Organization: University of Karlsruhe,Germany

Title-Subject: [Filtered] FFT_Software

Question: I am looking for a simple free-software allowing FFT-Analysis of HRTEM images. Any recommendations that might help me?
Thank you


---------------------------------------------------------------------------

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From: Elliott-at-arizona.edu
Date: Wed, 15 Aug 2007 09:23:11 -0500
Subject: [Microscopy] Re: viaWWW: FFT_Software

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Depending on what you want to do, NIH image will do FFT.
The price is right!
David


On Aug 15, 2007, at 6:30 AM, reznik-at-ict.uni-karlsruhe.de wrote:

}
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} Email: reznik-at-ict.uni-karlsruhe.de
} Name: Boris Reznik
}
} Organization: University of Karlsruhe,Germany
}
} Title-Subject: [Filtered] FFT_Software
}
} Question: I am looking for a simple free-software allowing FFT-
} Analysis of HRTEM images. Any recommendations that might help me?
} Thank you
}
}
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}
} ==============================Original
} Headers==============================
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From: gmartens-at-interchange.ubc.ca
Date: Wed, 15 Aug 2007 12:49:37 -0500
Subject: [Microscopy] equipment for sale

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Hey everyone,

We are continuing to purge some of our non-used equipment and have
the following items available for sale.

1. 3 Reichert OM3 ultramicrotomes, still in great shape and fully functional.
2. 1 Reichert OM2 ultramicrotome, still in great shape and fully functional
3. 1 Sorvall ultramicrotome
4. 1 Spencer 820 microtome, great for thick sections on resins like JB4
5. a variety of compound microscopes for sale (mostly Zeiss) and a
variety of lenses to accompany
6. we still have the beautiful orange Zeiss EM10C for sale. With it
comes a second 10C to be used for parts. A great deal at only $10K
(canadian dollars to boot), no it does not include shipping.

Look for more great deals in the near future. Give me a call
604-822-3354 for prices and a list of the compound scopes for sale.


--
Garnet Martens

Research Manager
BioImaging Facility
University of British Columbia
6270 University Blvd.
Vancouver, B.C.
Canada
V6T 1Z4

phone 604-822-3354

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From: ph2-at-sprynet.com
Date: Thu, 16 Aug 2007 00:48:08 -0500
Subject: [Microscopy] FYI - Nanotechnology Research Spurs Growth in the Global Microscopes Market

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

I meant to send this earlier.

Just an FYI.

Nanotechnology Research Spurs Growth in the Global Microscopes Market
Source:PRNewswire
Author:n/a

Global consulting firm Frost & Sullivan has released new analysis indicating
that nanotechnology applications in bioscience and material science research
are likely to increase demand for microscopic imaging and analysis systems
and contribute to a rise in the global microscope market's revenues from
US$1.87 billion in 2006 to US$3.54 billion in 2013. Frost & Sullivan
research analyst Lakshman Koundinya said: "With the continued
miniaturization of semiconductors and electronicproducts, there exists a
growing need for easier and more accurate material inspection. Consequently,
there has been a significant increase in funds allocated for research into
fields such as nanotechnology and nanosciences, thereby creating significant
demand opportunities for microscopes." The article says growth in the
microscope market, however, is limited by a lack of technological innovation
and other factors that have resulted in the rise of other analytical
techniques. The article also says that high cost of manufacturing and
significant research and development investment requirements can create
barriers to entry in the microscope market. Koundinya said: "Since financial
limitations hamper manufacturers' response to the industry's continued
technology advancements, consolidation in certain industries such as the
disk drive industry has resulted in fewer manufacturers with high financial
stability." The article says that manufacturers must create more
user-friendly and easy to operate microscopes in order to compensate for a
decline in technical expertise. The article can be viewed online at the link
below.

http://www.advancedimagingpro.com/online/article.jsp?siteSection=3&id=4284


Tony

......................................................................
Andrew Anthony "Tony" Havics, CHMM, CIH, PE
pH2, LLC
5250 E US 36, Suite 830
Avon, IN 46123
(317) 718-7020 off
(317) 718-7038 fax
(317) 409-3238 cell

90% of Risk Management is knowing where to place the decimal point...any
consultant can give you the other 10%(SM)

This message is from pH2. This message and any attachments may contain
legally privileged or confidential information, and are intended only for
the individual or entity identified above as the addressee. If you are not
the addressee, or if this message has been addressed to you in error, you
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From: kraftpiano-at-gmail.com
Date: Thu, 16 Aug 2007 06:49:34 -0500
Subject: [Microscopy] Polarizing microscope recommendation.

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

I am looking for a reasonably priced, reasonable quality polarizing
microscope to round out my equipment for my class. Right now I have a
quote for a Leica DM EP, but I thought I'd ask if anyone has a
recommendation on other brands that have relatively good optics.

I am also looking for a reasonable digital camera to use for the
purpose of sharing live microscope images via a data projector. Any
recommendations on models there would be helpful as well. I've looked
into the Kenavision scope cameras, but I've heard that the goose neck
stand can be a little unwieldy at times.

I'm trying to get the best balance between budget and quality. I
don't want an instrument that is cheaply made (As a good portion of
the "school grade" microscopes are) but I don't want to break the bank
on a $9K instrument.

Thanks in advance for your recommendations,

Justin A. Kraft

==============================Original Headers==============================
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5, 26 -- Subject: Polarizing microscope recommendation.
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From: maloneyb-at-fiu.edu
Date: Thu, 16 Aug 2007 07:35:53 -0500
Subject: [Microscopy] Need of evaluation of two instruments - TEM and SEM

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Dear Group: does anyone know somebody up in the Savannah area that
would be able to give us a value of two instruments that will be given
as a tax donation? Currently both instruments are not running. Please
contact me ASAP, via email redsponger-at-yahoo.com or call me on my cell
(954) 401-4542. Thanks so much,

1. JEOL JEM 1200EX II - TEM
2. ISI DS-130S - SEM w/PGT EDS and Image Analysis System

Barbara Maloney
FIU/FCAEM
11200 SW 8th Street
PC50
Miami, FL 33199
(305) 348-2714
Fax (305) 348-3580


==============================Original Headers==============================
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From: maloneyb-at-fiu.edu
Date: Thu, 16 Aug 2007 07:59:59 -0500
Subject: [Microscopy] Need an evaluation of a TEM and SEM in the Savannah, Georgia area

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Dear Group: does anyone know somebody up in the Savannah area that
would be able to give us a value of two instruments that will be given
as a tax donation after viewing the instruments? Currently both instruments are not running. Please
contact me ASAP, via email redsponger-at-yahoo.com or call me on my cell
(954) 401-4542. Thanks so much,

1. JEOL JEM 1200EX II - TEM
2. ISI DS-130S - SEM w/PGT EDS and Image Analysis System

Barbara Maloney
FIU/FCAEM
11200 SW 8th Street
PC50
Miami, FL 33199
(305) 348-2714
Fax (305) 348-3580


==============================Original Headers==============================
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From: opto-at-klughammer.de
Date: Thu, 16 Aug 2007 08:02:59 -0500
Subject: [Microscopy] Re: Polarizing microscope recommendation.

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Dear Justin,

have a look at Meiji microscopes (japanese brand) and Lumenera
Infinitiy cameras. Both have very good quality and the price is mid
ranged.

If you need more information you can contact me off-line.

Regards
Anneliese
opto-at-klughammer.de

2007/8/16, kraftpiano-at-gmail.com {kraftpiano-at-gmail.com} :
}
}
}
} ----------------------------------------------------------------------------
} The Microscopy ListServer -- CoSponsor: The Microscopy Society of America
} To Subscribe/Unsubscribe -- http://www.microscopy.com/MicroscopyListserver
} On-Line Help http://www.microscopy.com/MicroscopyListserver/FAQ.html
} ----------------------------------------------------------------------------
}
} I am looking for a reasonably priced, reasonable quality polarizing
} microscope to round out my equipment for my class. Right now I have a
} quote for a Leica DM EP, but I thought I'd ask if anyone has a
} recommendation on other brands that have relatively good optics.
}
} I am also looking for a reasonable digital camera to use for the
} purpose of sharing live microscope images via a data projector. Any
} recommendations on models there would be helpful as well. I've looked
} into the Kenavision scope cameras, but I've heard that the goose neck
} stand can be a little unwieldy at times.
}
} I'm trying to get the best balance between budget and quality. I
} don't want an instrument that is cheaply made (As a good portion of
} the "school grade" microscopes are) but I don't want to break the bank
} on a $9K instrument.
}
} Thanks in advance for your recommendations,
}
} Justin A. Kraft
}
} ==============================Original Headers==============================
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} 5, 26 -- Date: Thu, 16 Aug 2007 07:52:34 -0400
} 5, 26 -- From: "Justin Kraft" {kraftpiano-at-gmail.com}
} 5, 26 -- To: microscopy-at-microscopy.com
} 5, 26 -- Subject: Polarizing microscope recommendation.
} 5, 26 -- MIME-Version: 1.0
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} ==============================End of - Headers==============================
}


--
Anneliese Schmaus
Product Manager
________________________
Klughammer Industrie GmbH
Strassbach 9
85229 Markt Indersdorf

Tel. +49 (0)8136 6011
Fax +49 (0)8136 7098
opto-at-klughammer.de

Amtsgericht München HRB 101952
Geschäftsführer Anna E. Schmaus-Klughammer





Anneliese Schmaus
Product Manager
____________________
Klughammer Bio GmbH
Strassbach 9
85229 Markt Indersdorf

Tel. +49 (0)8136 6011
Fax +49 (0)8136 7098
opto-at-klughammer.de

Amtsgericht München HRB 89767
Geschäftsführer Anna E. Schmaus-Klughammer


==============================Original Headers==============================
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From: gary.m.brown-at-exxonmobil.com
Date: Thu, 16 Aug 2007 09:31:19 -0500
Subject: [Microscopy] Polarizing microscope recommendation.

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Justin,

I suggest you contact John Mackenzie at North Carolina State University for
suggestions on cameras. He is a wealth of information on all aspects of
digital imaging. See his address in copy list.

Best regards,

Gary M. Brown
Microscopy Specialist
ExxonMobil Chemical Company
Baytown Technology & Engineering - West
5200 Bayway Drive
Baytown, Texas 77520-2101
phone: 281 834 2387
fax: 281 834 2395
e-mail: Gary.M.Brown-at-ExxonMobil.com

"Happiness equals reality minus expectations." Tom Magliozzi





opto-at-klughamme
r.de
To
gary.m.brown-at-exxonmobil.com
08/16/07 08:06 cc
AM
Subject
[Microscopy] Re: Polarizing
Please respond microscope recommendation.
to
opto-at-klughamme
r.de











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Dear Justin,

have a look at Meiji microscopes (japanese brand) and Lumenera
Infinitiy cameras. Both have very good quality and the price is mid
ranged.

If you need more information you can contact me off-line.

Regards
Anneliese
opto-at-klughammer.de

2007/8/16, kraftpiano-at-gmail.com {kraftpiano-at-gmail.com} :
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}
} I am looking for a reasonably priced, reasonable quality polarizing
} microscope to round out my equipment for my class. Right now I have a
} quote for a Leica DM EP, but I thought I'd ask if anyone has a
} recommendation on other brands that have relatively good optics.
}
} I am also looking for a reasonable digital camera to use for the
} purpose of sharing live microscope images via a data projector. Any
} recommendations on models there would be helpful as well. I've looked
} into the Kenavision scope cameras, but I've heard that the goose neck
} stand can be a little unwieldy at times.
}
} I'm trying to get the best balance between budget and quality. I
} don't want an instrument that is cheaply made (As a good portion of
} the "school grade" microscopes are) but I don't want to break the bank
} on a $9K instrument.
}
} Thanks in advance for your recommendations,
}
} Justin A. Kraft
}
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--
Anneliese Schmaus
Product Manager
________________________
Klughammer Industrie GmbH
Strassbach 9
85229 Markt Indersdorf

Tel. +49 (0)8136 6011
Fax +49 (0)8136 7098
opto-at-klughammer.de

Amtsgericht München HRB 101952
Geschäftsführer Anna E. Schmaus-Klughammer





Anneliese Schmaus
Product Manager
____________________
Klughammer Bio GmbH
Strassbach 9
85229 Markt Indersdorf

Tel. +49 (0)8136 6011
Fax +49 (0)8136 7098
opto-at-klughammer.de

Amtsgericht München HRB 89767
Geschäftsführer Anna E. Schmaus-Klughammer


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49, 22 -- Subject: Re: [Microscopy] Re: Polarizing microscope recommendation.
49, 22 -- Importance:
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From: maloneyb-at-fiu.edu
Date: Thu, 16 Aug 2007 11:31:41 -0500
Subject: [Microscopy] Evaluation of instruments

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

We have done this inexpensively (~$2.00) by buying sheets of
polarizing material from Edmunds Scientific. We cut a square that we
mount on the condenser, and a circle that we insert somewhere in the
light path. You then rotate the condenser polarizer until you get
extinction. Unless you want more sophistication, this works quite
well for things like crystalline materials and even muscle fibers.
It does suck up light though.

Joel


Date sent: Thu, 16 Aug 2007 06:49:42 -0500
To: jbs-at-temple.edu
X-from: kraftpiano-at-gmail.com
Send reply to: kraftpiano-at-gmail.com

Dear Group - thanks so much for your quick responses - I have found
someone to do this.
Thanks so much.
Barbara




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From: xin-at-magnet.fsu.edu
Date: Thu, 16 Aug 2007 14:42:14 -0500
Subject: [Microscopy] recommendation for a UPS

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Hi,

We are in need of an uninterrupted power system(UPS) for our high-end
Field Emission SEM.

I would appreciate if anyone could suggest a good one with reasonable
price. The main purpose of the UPS for us is to keep the SEM running
when there is a power outage.

Thanks

Yan Xin
NHMFL/FSU
Tallahassee, FL


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From: gary-at-gaugler.com
Date: Thu, 16 Aug 2007 15:19:57 -0500
Subject: [Microscopy] Re: recommendation for a UPS

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

I highly recommend Liebert Nfinity double conversion
UPS. These can have redundant conversion modules
(4KVA each) and redundant control modules. At a
full load of batteries, each unit (I have two identical
units) has a backup run time of 288 minutes at 22%
load. SEM, EDS, EBSD, other PCs are on one unit.
Chiller and air compressor are on another unit.

Loaded, each unit costs about $10K and are well worth it.
No sag, no drop outs, no sweat. They can also be monitored
via HTTP web browser.

gary g.


At 11:47 AM 8/16/2007, you wrote:




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From: Andrew.Bowling-at-ARS.USDA.GOV
Date: Thu, 16 Aug 2007 15:39:22 -0500
Subject: [Microscopy] SEM image acquisition hardware recommendations

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Hello listers,

We have an older JEOL 840 SEM with a Kevex Sigma setup that we use to
acquire digital images. This system seems to have broken - the images
on the compter are distorted and noisy, so we want to replace it. Do
any of you have opinions as to what system we should get (or not)? We
just need digital imaging capability on this instrument - we're not
looking to get the EDX back up.

Thanks in advance,

Andy Bowling


==============================Original Headers==============================
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From: bozzola-at-siu.edu
Date: Thu, 16 Aug 2007 15:56:00 -0500
Subject: [Microscopy] Re: SEM image acquisition hardware recommendations

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

We've been very pleased with our 4pi system on our older Hitachi S570 SEM.


} We have an older JEOL 840 SEM with a Kevex Sigma setup that we use to
} acquire digital images. This system seems to have broken - the images
} on the compter are distorted and noisy, so we want to replace it. Do
} any of you have opinions as to what system we should get (or not)? We
} just need digital imaging capability on this instrument - we're not
} looking to get the EDX back up.

--
+++++++++++++++++++++++++++++++++++++++++++++++++++++++

John J. Bozzola, Ph.D., Director
Integrated Microscopy & Graphics Expertise (IMAGE)
Southern Illinois University
750 Communications Drive - MC 4402
Carbondale, IL 62901
Telephone: 618-453-3730

+++++++++++++++++++++++++++++++++++++++++++++++++++++++

==============================Original Headers==============================
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From: sirapa-at-optonline.net
Date: Thu, 16 Aug 2007 22:04:36 -0500
Subject: [Microscopy] viaWWW: Metal Samples for Light Microscopy

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Email: sirapa-at-optonline.net
Name: Alan Paris

Organization: Leica Microsystems

Title-Subject: [Filtered] Metal Samples for Microscopy

Question: I am looking to purchase a set of reference polished metal samples for reflected light microscopy.

Can anyone refer me to a source?
Thank you

---------------------------------------------------------------------------

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From: alternate.questions-at-gmail.com
Date: Thu, 16 Aug 2007 22:04:59 -0500
Subject: [Microscopy] viaWWW: MITOS IN PRP

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Email: alternate.questions-at-gmail.com
Name: Simcha

Title-Subject: [Filtered] MITOS IN PRP

Question: Hi All:
I am attempting to stain mitochondria from PRP (using CD41 to stain platelets and looking for an efficient stain for the mitos). Any ideas what to use for minimum background and maximum affinity/efficiency?


---------------------------------------------------------------------------

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From: dljones-at-bestweb.net
Date: Fri, 17 Aug 2007 07:57:00 -0500
Subject: [Microscopy] Re: viaWWW: Metal Samples for Light Microscopy

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Alan,

I wish I could answer your question. I'd like to know myself. Buehler used
to make some very nice sets, but I think they stopped making them. I've
seen them from time to time come up for auction on ebay. I have also seen
some coming out of Bangalore, India that appear to be newly made. I
couldn't find them right now looking on google. I have made quite a few
for my own use in house, I don't know what kind of facilities you have to
do this. It's a fair amount of work, but it depends upon how many alloys
you need to have.

Do let me know what you find out.

Good luck.

dj

On Thu, 16 Aug 2007, sirapa-at-optonline.net wrote:

}
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}
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} Email: sirapa-at-optonline.net
} Name: Alan Paris
}
} Organization: Leica Microsystems
}
} Title-Subject: [Filtered] Metal Samples for Microscopy
}
} Question: I am looking to purchase a set of reference polished metal samples for reflected light microscopy.
}
} Can anyone refer me to a source?
} Thank you
}
} ---------------------------------------------------------------------------
}
} ==============================Original Headers==============================
} 7, 11 -- From zaluzec-at-microscopy.com Thu Aug 16 22:04:36 2007
} 7, 11 -- Received: from [206.69.208.22] (mac22.zaluzec.com [206.69.208.22])
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From: eschumacher-at-mccrone.com
Date: Fri, 17 Aug 2007 09:13:39 -0500
Subject: [Microscopy] Short Course Announcement: Raman Microspectroscopy

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Greetings Colleagues,

The College of Microscopy located in Westmont, IL, will offer a course
in Raman microspectroscopy October 2-4, 2007, designed to provide
practical instruction in "real world" use of the Raman microscope. The
class will utilize demonstrations and laboratory exercises supplemented
with lectures. The role of Raman microspectroscopy in the overall
scheme of industrial problem solving will be addressed. Students are
strongly encouraged to bring their own samples for analysis. Class size
is limited to eight students to allow for maximum participation.

For further details and registration information, please follow the link
below.

www.collegeofmicroscopy.com


*********************************************************************
Elaine F.Schumacher
Senior Research Scientist
McCrone Associates, Inc.
850 Pasquinelli Drive
Westmont, IL 60559-5539 USA
630-887-7100 (tel)
630-887-7417 (fax)
E-mail: eschumacher-at-mccrone.com
Web Site: www.mccrone.com



*********************************************************************
This message and any attachments are solely for the
intended recipient. If you are not the intended recipient,
disclosure, copying, use or distribution of the information
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From: eschumacher-at-mccrone.com
Date: Fri, 17 Aug 2007 13:24:55 -0500
Subject: [Microscopy] Meeting Announcement: Midwest Microscopy & Microanalysis Society 50th Anniversary Event

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Greetings Colleagues,

The Midwest Microscopy and Microanalysis Society will celebrate our 50th
anniversary with a meeting on September 18 and 19, 2007, to be held at
the College of Microscopy in Westmont, IL. Details, registration
information and a preliminary program can be found on our website under
Meetings:

www.midwestmicroscopy.org

Details will be updated on the website as plans are finalized. We hope
to see you there!

Elaine Schumacher
President, Midwest Microscopy and Microanalysis Society


*********************************************************************
Elaine F.Schumacher
Senior Research Scientist
McCrone Associates, Inc.
850 Pasquinelli Drive
Westmont, IL 60559-5539 USA
630-887-7100 (tel)
630-887-7417 (fax)
E-mail: eschumacher-at-mccrone.com
Web Site: www.mccrone.com



*********************************************************************
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From: lukeclaire-at-yahoo.com
Date: Sat, 18 Aug 2007 11:11:45 -0500
Subject: [Microscopy] Monostep K4M lowicryl for Low Embed Polymerization

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Dear Microscopists,

I would like to ask for your advice on cutting K4M
lowicryl and assessing the polymerized blocks. It is
my first time to cut lowicryls embedded in low
temperature. I embedded drosophila tissue samples
using the supplier's recommended schedule for low
temperature embedding. Samples were fixed in 4%
paraformaldehyde, 0.2% glutaraldehyde in 0.1M
Phosphate buffer, dehydrated in progressive lowering
of temperature (PLT) in ethanol, infiltrated and
embedded with monostep K4M lowicryl. The resin and
sample were cured in a commercial UV cryochamber at
-35 degree celsius.

The blocks are hard but I noticed during trimming with
a razor blade that it is softer than what I usually
deal with in Epon sections. In resin areas close to
the trimmed pyramid block face, I can see a slight
indentation left after pressing my nail on the resin.
I was able to cut 1.2 micron thick sections although
it compressed at some areas and later flattened out.
The color of the thick sections is not uniform
throughout. I get pink, green colors randomly
throughout the sections. When I tried to collect thin
sections, the sections come with horizontal shreds and
do not get a full section. I tried to cut 50-100 nm
at 5mm/s then to 2mm/s hoping I could get a full
section with these softer blocks. The water in the
trough is low enough that kept the diamond knife edge
wet. A few times I got water on the block surface,
wicked it off with kimwipe and proceeded in
sectioning.

Is there a way to make the polymerized blocks harder?
When a drop of water got in contact with the trimmed
block face, is it necessary to dry it by putting in
dessicator before sectioning? I plan on using this
resin in the near future with PLT dehydration and UV
cryopolymerization. I would like to hear your
suggestions to have better sectioning next time.

I look forward to your helpful advice.

Thank you for the time to read my email.

Sincerely,

Claire




____________________________________________________________________________________
Pinpoint customers who are looking for what you sell.
http://searchmarketing.yahoo.com/

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11, 19 -- From: claire haueter {lukeclaire-at-yahoo.com}
11, 19 -- Subject: Monostep K4M lowicryl for Low Embed Polymerization
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From: wpchan-at-u.washington.edu
Date: Sat, 18 Aug 2007 18:58:22 -0500
Subject: [Microscopy] Re: gatan camera

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Within days of the posting, I received a call from Gatan to help me
diagnose the malfunction. A flex cable between the CCD and the camera
head electronics was probably cracked such that connection was open only
when the camera was inserted and the cable was stretched. This cable is
part of the carrier module that slides back and forth holding the CCD.
Gatan will actually sell this module (about $3K) for field replacement by
the user. But with no other means to further diagnose this 12-yr old
camera, I opted to send the camera back to Gatan for repair. I have the
camera back this past friday and it's performing fine.

According to Gatan, this flex cable should last about 7 years or so and
that certainly will depend on how often the camera is inserted and
retracted. If anybody is interested in seeing the inside of this camera,
I have some pictures that I can put up on our website. Thanks for all who
offered help and advice.

--
Pang (Wai Pang Chan, wpchan-at-u.washington.edu, PAB A087, 206-685-1519)
The Biology Imaging Facility (http://staff.washington.edu/wpchan/if/)

On Tue, 17 Jul 2007, wpchan-at-u.washington.edu wrote:

} I encountered a strange problem with a Gatan 689 Slow-Scan CCD camera
} mounted in the 35 mm port above the viewing chamber of a Philips CM100
} TEM. When I insert the camera, I can only see a uniform grey image. The
} histogram shows a single line in the middle. Changing the exposure time
} or increasing the illumination via condenser 2 has no effect. Allowing
} the shutter to be normally closed, or putting the shutter to open also has
} no effect.
}
} There seemed to be no mechanical problem for inserting or retracting the
} camera because the beam was blocked and blank as it should be.
}
} We are still using DigitalMicrograph 2.5 on an old quadra 840 with system
} 7.1. I have trashed the preferences and used another copy of the software
} with no improvement. When the camera is out, I can see the raw image in
} unprocessed view; basically the dark reference image. With high tension
} off, I used to see the same image when I insert the camera. But now I
} only see a grey image. I don't think there is anything wrong with the CCD
} or scintillator because I can see an after-image of the image I should be
} seeing when I retract the camera. This suggested that the CCD was
} exposed and formed an image but somehow not transferred to the computer.
}
} Any suggestion or insight to solve this problem will be much appreciated.

==============================Original Headers==============================
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From: jacques.faerber-at-ipcms.u-strasbg.fr
Date: Mon, 20 Aug 2007 07:37:28 -0500
Subject: [Microscopy] Re: Glue without carbon (SEM)

Contents Retrieved from Microscopy Listserver Archives
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Hi all

Late but hoping not too late ! I come back from holliday...

A way to "glue" without carbon which has not been cited, is to use as
substrate an Indium foil. In is very soft, and one can press the powder
in the In film. In is conductive too, if not oxyded. Depending of the
grain size of the powder, one may have overlapping from In-L lines with
elements from the samples such as Ca-K, but for a carbon search, it
should work. It's a way much used in XPS analysis of powders, in UHV
environement, where glue outgas to much.

And as In is expensive, it's easy to save monney by re-melt it (in a
glas tube) to purify it and separate the last used powder, and laminate
it again.

Hope it helps

J. Faerber
IPCMS-GSI
(Institut de Physique et Chimie des Matériaux de Strasbourg
Groupe Surface et Interfaces)
23, rue de Loess ; BP43
67034 Strasbourg CEDEX 2
France

Tel 00 33(0)3 88 10 71 01
Fax 00 33(0)3 88 10 72 48
E-mail Jacques.Faerber-at-ipcms.u-strasbg.fr



nizets2-at-yahoo.com a écrit :
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} Hi all!
}
} I am trying to detect organic contamination on/in
} aluminosilicate material by SEM+EDX, so it is very
} important for me to eliminate any source of carbon.
} As the specimen holders are made whether of carbon,
} silicium or aluminium (what a luck ;-)), I am planning
} to use copper disks as support but I still have to fix
} the powder on the disks. Is there anywhere in the
} known universe a glue which does not contain carbon?
}
} Best regards,
}
} Stephane
}
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From: chao.wang-at-materials.ox.ac.uk
Date: Mon, 20 Aug 2007 08:54:29 -0500
Subject: [Microscopy] viaWWW: estimate roughness of HREM images

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Email: chao.wang-at-materials.ox.ac.uk
Name: Chao Wang

Organization: Department of Materials, Oxford

Title-Subject: [Filtered] estimate roughness of HREM images

Question: Dear All

Could anyone tell me how to estimate the roughness of epitaxial layers by MBE growth like the roughness between Fe and MgO,from both HREM images and ADF images?

There are two main concerns.
1. From HREM, it's hard to see the where is the interface sometime.
2. Because the layer are epitaxial, how to estimate several Amstrong roughness?

Thank you very much for your help

All the best

Chao Wang
Oxford Materials

---------------------------------------------------------------------------

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From: ZZhang-at-uwyo.edu
Date: Mon, 20 Aug 2007 12:43:09 -0500
Subject: [Microscopy]

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Hi everyone:

The Microscopy Core Facility I am directing is heavily funded by a
couple of NIH institutional grants. As a result, I am able to keep most
of my microscopes updated and people pay less user fees. I need to,
however, to have the PIs acknowledge these grants in their publications.

I keep sending letters to the PIs to request this but without great
success. I am sure I am not alone and I wonder how other
people/facilities do this?

Thank you for your help.



Zhaojie Zhang, Ph.D.
Director, Microscopy Core Facility
Department of Zoology and Physiology
University of Wyoming
Laramie, WY 82071
TEL: 307-766-3038
FAX: 307-766-5625
zzhang-at-uwyo.edu
http://www.uwyo.edu/microscopy





==============================Original Headers==============================
8, 26 -- From ZZhang-at-uwyo.edu Mon Aug 20 12:43:08 2007
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From: Elliott-at-arizona.edu
Date: Mon, 20 Aug 2007 13:17:40 -0500
Subject: [Microscopy] Re:

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Hi Zhaojie

My first thought upon reading your question was "good luck getting
people to acknowledge your facility in their papers", but then I
started thinking. Would it work to send a letter out saying that
unacknowledged work will be retroactively billed to labs at the
'unsubsidized' (MUCH higher) rate? Just make the case that if they
want subsidies they have to help get them.

I don't know if it would work as I have not tried it, but I think I
will try it.

David


_____________________

David Elliott Ph.D.
Assistant Professor - Department of Cell Biology and Anatomy
Director, Research Microscopy Core Service
University of Arizona College of Medicine
PO Box 245004
Tucson, AZ 85724

Voice: 520-626-7870
Fax: 520-626-2097


On Aug 20, 2007, at 10:47 AM, ZZhang-at-uwyo.edu wrote:

}
}
}
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}
} The Microscopy Core Facility I am directing is heavily funded by a
} couple of NIH institutional grants. As a result, I am able to keep
} most
} of my microscopes updated and people pay less user fees. I need to,
} however, to have the PIs acknowledge these grants in their
} publications.
}
} I keep sending letters to the PIs to request this but without great
} success. I am sure I am not alone and I wonder how other
} people/facilities do this?
}
} Thank you for your help.
}
}
}
} Zhaojie Zhang, Ph.D.
} Director, Microscopy Core Facility
} Department of Zoology and Physiology
} University of Wyoming
} Laramie, WY 82071
} TEL: 307-766-3038
} FAX: 307-766-5625
} zzhang-at-uwyo.edu
} http://www.uwyo.edu/microscopy
}
}
}
}
}
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} Headers==============================
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From: kenconverse-at-qualityimages.biz
Date: Mon, 20 Aug 2007 14:46:45 -0500
Subject: [Microscopy] recipe for Au on C and Al/W dendrites

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Dear Zhaojie Zhang,

I have found that when I ask someone to do something for me that I get
more cooperation when I make it easy for them to comply. In your request
letter, you might want to include the wording that you would like them to
use. In other words, write the acknowledgement for them. You could then
suggest that they copy your sentences directly onto their document.

Bob


----- Original Message -----
X-from: {ZZhang-at-uwyo.edu}
To: {bob-at-rockisland.com}
Sent: Monday, August 20, 2007 10:44 AM

Dear listers,
I've spent quite a good deal of time googling for some clues as to how one
goes about making a Au on C (also sometimes called gold islands) resolution
sample and also an Al/W dendrite sample (which I tried once and didn't seem
to get what I was expecting). I couldn't come up with anything about the
processes. Does one evaporate or sputter the Au? What type or grade of C
is the best substrate? Does one cool the Al/W mixture quickly, slowly, or
doesn't it make a difference? I'm going to play with these some, but
sometimes it's nice to not have to reinvent the wheel.

Ken Converse
owner

QUALITY IMAGES
Servicing Scanning Electron Microscopes
Since 1981
474 So. Bridgton Rd.
Bridgton, ME 04009
207-647-4348
Fax 207-647-2688
kenconverse-at-qualityimages.biz
qualityimages.biz




_________________________________________________________________
Need personalized email and website? Look no further. It's easy
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From: maryflet-at-interchange.ubc.ca
Date: Mon, 20 Aug 2007 15:34:21 -0500
Subject: [Microscopy] recipe for Au on C and Al/W dendrites

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Dear Ken,
It has been a while since I made these, but I will try to remember. To make
the best gold-on-carbon islands, you evaporate pure gold onto polished
spectrographic-grade graphite, then post-heat the sample to make the islands
coalesce a bit. Takes a few tries to get both the amount of gold and the
post heating right. Some of the ones I've seen also have a bit of evaporated
tin on top of that; it makes little balls decorating the big balls and is
better for a FESEM and high resolution testing.
To make the Al-W phase, just put pure Al in a W basket and heat it up until
the aluminum melts, then evaporates. Soon after that, the W basket will
break at one of the arms, because the Al-W alloy formed is very brittle. The
basket with the cooled Al in it will show the dendrites and a pretty Al-W
phase. I'm not sure if cooling fast or slow matters, it cools pretty fast
when the wire breaks.
Good luck,

Mary Fletcher
Electron Microscopist
Materials Eng. UBC
#309 - 6350 Stores Road
Vancouver, B.C. V6T 1Z4
Canada
Tel: 604-822-5648
Fax: 604-822-3619
email: maryflet-at-interchange.ubc.ca


-----Original Message-----
X-from: kenconverse-at-qualityimages.biz [mailto:kenconverse-at-qualityimages.biz]
Sent: August 20, 2007 12:54 PM
To: maryflet-at-interchange.ubc.ca

Dear listers,
I've spent quite a good deal of time googling for some clues as to how one
goes about making a Au on C (also sometimes called gold islands) resolution
sample and also an Al/W dendrite sample (which I tried once and didn't seem
to get what I was expecting). I couldn't come up with anything about the
processes. Does one evaporate or sputter the Au? What type or grade of C
is the best substrate? Does one cool the Al/W mixture quickly, slowly, or
doesn't it make a difference? I'm going to play with these some, but
sometimes it's nice to not have to reinvent the wheel.

Ken Converse
owner

QUALITY IMAGES
Servicing Scanning Electron Microscopes
Since 1981
474 So. Bridgton Rd.
Bridgton, ME 04009
207-647-4348
Fax 207-647-2688
kenconverse-at-qualityimages.biz
qualityimages.biz




_________________________________________________________________
Need personalized email and website? Look no further. It's easy
with Doteasy $0 Web Hosting! Learn more at www.doteasy.com

==============================Original Headers==============================
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16, 35 -- Subject: RE: [Microscopy] recipe for Au on C and Al/W dendrites
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From: walck-at-southbaytech.com
Date: Mon, 20 Aug 2007 15:52:43 -0500
Subject: [Microscopy] recipe for Au on C and Al/W dendrites

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

I once saw a beautiful, albeit unintentional, resolution sample of someone
who evaporated gold onto an anthracite coal sample. I thought that the gold
on carbon were made by evaporating gold onto a warm polished graphite
surface. The gold doesn't wet the carbon and forms islands. If you stop
the deposition just before coalescence of the Au islands, you have your
resolution sample. Gold has a tendency to films by island coalescence on
most substrates. That is why it has a rough structure and is not a good
choice for high resolution SEM imaging.

For an alloy that forms a dendritic structure, the microstructure will be
finer with a higher cooling rate.


-Scott

Scott D. Walck, Ph.D.
Technical Director
South Bay Technology, Inc.
1120 Via Callejon
San Clemente, CA 92673

US Toll Free: 1-800-728-2233
Tel: (949) 492-2600
Fax: (949) 492-1499

www.southbaytech.com
walck-at-southbaytech.com

-----Original Message-----
X-from: maryflet-at-interchange.ubc.ca [mailto:maryflet-at-interchange.ubc.ca]
Sent: Monday, August 20, 2007 1:37 PM
To: Walck-at-SouthBayTech.com

Dear Ken,
It has been a while since I made these, but I will try to remember. To make
the best gold-on-carbon islands, you evaporate pure gold onto polished
spectrographic-grade graphite, then post-heat the sample to make the islands
coalesce a bit. Takes a few tries to get both the amount of gold and the
post heating right. Some of the ones I've seen also have a bit of evaporated
tin on top of that; it makes little balls decorating the big balls and is
better for a FESEM and high resolution testing.
To make the Al-W phase, just put pure Al in a W basket and heat it up until
the aluminum melts, then evaporates. Soon after that, the W basket will
break at one of the arms, because the Al-W alloy formed is very brittle. The
basket with the cooled Al in it will show the dendrites and a pretty Al-W
phase. I'm not sure if cooling fast or slow matters, it cools pretty fast
when the wire breaks.
Good luck,

Mary Fletcher
Electron Microscopist
Materials Eng. UBC
#309 - 6350 Stores Road
Vancouver, B.C. V6T 1Z4
Canada
Tel: 604-822-5648
Fax: 604-822-3619
email: maryflet-at-interchange.ubc.ca


-----Original Message-----
X-from: kenconverse-at-qualityimages.biz [mailto:kenconverse-at-qualityimages.biz]
Sent: August 20, 2007 12:54 PM
To: maryflet-at-interchange.ubc.ca

Dear listers,
I've spent quite a good deal of time googling for some clues as to how one
goes about making a Au on C (also sometimes called gold islands) resolution
sample and also an Al/W dendrite sample (which I tried once and didn't seem
to get what I was expecting). I couldn't come up with anything about the
processes. Does one evaporate or sputter the Au? What type or grade of C
is the best substrate? Does one cool the Al/W mixture quickly, slowly, or
doesn't it make a difference? I'm going to play with these some, but
sometimes it's nice to not have to reinvent the wheel.

Ken Converse
owner

QUALITY IMAGES
Servicing Scanning Electron Microscopes
Since 1981
474 So. Bridgton Rd.
Bridgton, ME 04009
207-647-4348
Fax 207-647-2688
kenconverse-at-qualityimages.biz
qualityimages.biz




_________________________________________________________________
Need personalized email and website? Look no further. It's easy
with Doteasy $0 Web Hosting! Learn more at www.doteasy.com

==============================Original Headers==============================
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7, 29 -- Subject: recipe for Au on C and Al/W dendrites
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From: Elliott-at-arizona.edu
Date: Mon, 20 Aug 2007 19:20:51 -0500
Subject: [Microscopy] Re: OoO

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

I would like to thank the following people for letting me know that
they are out of their offices and will not be reading my last post to
the list serve (until they get back).

Margaret Casey

Richard Doelle

Mario Gislao

Mark Riggs

Wharton Sinkler

Paul VANDERLINDEN

Neil Vincent




Now, let the next round of OoO mail come my way!

David


On Aug 20, 2007, at 11:20 AM, Elliott-at-arizona.edu wrote:

}
}
}
} ----------------------------------------------------------------------
} ------
} The Microscopy ListServer -- CoSponsor: The Microscopy Society of
} America
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} MicroscopyListserver
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}
} Hi Zhaojie
}
} My first thought upon reading your question was "good luck getting
} people to acknowledge your facility in their papers", but then I
} started thinking. Would it work to send a letter out saying that
} unacknowledged work will be retroactively billed to labs at the
} 'unsubsidized' (MUCH higher) rate? Just make the case that if they
} want subsidies they have to help get them.
}
} I don't know if it would work as I have not tried it, but I think I
} will try it.
}
} David
}
}
} _____________________
}
} David Elliott Ph.D.
} Assistant Professor - Department of Cell Biology and Anatomy
} Director, Research Microscopy Core Service
} University of Arizona College of Medicine
} PO Box 245004
} Tucson, AZ 85724
}
} Voice: 520-626-7870
} Fax: 520-626-2097
}
}
} On Aug 20, 2007, at 10:47 AM, ZZhang-at-uwyo.edu wrote:
}
} }
} }
} }
} } ---------------------------------------------------------------------
} } -
} } ------
} } The Microscopy ListServer -- CoSponsor: The Microscopy Society of
} } America
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} }
} } Hi everyone:
} }
} } The Microscopy Core Facility I am directing is heavily funded by a
} } couple of NIH institutional grants. As a result, I am able to keep
} } most
} } of my microscopes updated and people pay less user fees. I need to,
} } however, to have the PIs acknowledge these grants in their
} } publications.
} }
} } I keep sending letters to the PIs to request this but without great
} } success. I am sure I am not alone and I wonder how other
} } people/facilities do this?
} }
} } Thank you for your help.
} }
} }
} }
} } Zhaojie Zhang, Ph.D.
} } Director, Microscopy Core Facility
} } Department of Zoology and Physiology
} } University of Wyoming
} } Laramie, WY 82071
} } TEL: 307-766-3038
} } FAX: 307-766-5625
} } zzhang-at-uwyo.edu
} } http://www.uwyo.edu/microscopy
} }
} }
} }
} }
} }
} } ==============================Original
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From: gnf3-at-cdc.gov
Date: Tue, 21 Aug 2007 08:23:15 -0500
Subject: [Microscopy] viaWWW: References In Situ and Electron Microscopy

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Email: gnf3-at-cdc.gov
Name: Maureen Metcalfe

Organization: CDC

Title-Subject: [Filtered] In Situ and Electron Microscopy

Question: Could someone recommend books and/or articles relating to the application of in situ hybridization for electron microscopy?

---------------------------------------------------------------------------

==============================Original Headers==============================
6, 11 -- From zaluzec-at-microscopy.com Tue Aug 21 08:23:15 2007
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6, 11 -- Subject: viaWWW: References In Situ and Electron Microscopy
6, 11 -- Content-Type: text/plain; charset="us-ascii"
==============================End of - Headers==============================




From: pwang-at-ues.com
Date: Tue, 21 Aug 2007 08:23:41 -0500
Subject: [Microscopy] viaWWW: CCD camera for Hitachi H-600 TEM

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Email: pwang-at-ues.com
Name: Ping Wang

Organization: ues

Title-Subject: [Filtered] CCD camera for Hitachi H-600 TEM

Question:
Hello!

We have an old Hitachi H-600 TEM and we would like to purchase a CCD camera (new or used) for it.

Please forward the imformation about the compatability of ANY CCD camera (new or used) to Hitachi H-600 TEM.

Thank You Very Much!

Ping Wang

pwang-at-ues.com


---------------------------------------------------------------------------

==============================Original Headers==============================
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9, 11 -- Subject: viaWWW: CCD camera for Hitachi H-600 TEM
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From: rcommon-at-msu.edu
Date: Tue, 21 Aug 2007 09:32:50 -0500
Subject: [Microscopy] Re: OoO

Contents Retrieved from Microscopy Listserver Archives
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The Out of Office replies I will get for this posting will take maybe 2 or 3
seconds to delete, but I had to open this message to see what it was about.
Frankly I find the complaints about OoO replies much more annoying than the
OoOs themselves.

Ralph Common
Michigan State University


==============================Original Headers==============================
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From: sergei2-at-ornl.gov
Date: Tue, 21 Aug 2007 17:49:21 -0500
Subject: [Microscopy] PFM Workshop - October 8,9

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Dear colleagues
Registration is now open for a new Workshop on Piezoresponse Force
Microscopy, focusing on nanoscale electromechanics in ferroelectrics,
polar materials, and biological systems, which will be held at ORNL on
October 8-9 in conjunction with the CNMS User Meeting. Registration is
available at the ORNL Users Week website
http://neutrons.ornl.gov/workshops/users2007/index.shtml. When
registering, please (a) choose option $150 (Microscopy + Share) and (b)
mark PFM Workshop [checkmark on the bottom ofthe registration form].
Workshop details are available at
http://www.cnms.ornl.gov/workshops/CNMS_PFM_Workshop.pdf
In addition to tutorials, the workshop will include poster sessions
by attendees. A limited number of registration fee wavers and partial
compensation of travel expenses will be available for student attendees.
Please contact Sergei Kalinin (sergei2-at-ornl.gov) for additional details.
Yours
Sergei Kalinin and Art Baddorf

==============================Original Headers==============================
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From: mike.reedy-at-cellbio.duke.edu
Date: Tue, 21 Aug 2007 18:16:39 -0500
Subject: [Microscopy] Transformer replacement needed for Reichert OMU3 Ultramicrotome

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

The free-standing ATF Transformator EA22 110 to 220V step-up
transformer required for our Reichert OMU3 ultramicrotome has gone
missing and stayed missing sometime in the last year. We know the
exact part because we have 2 OMU3 instruments, and only one is now
missing the transformer. Does anyone have one they might sell us, or
have experience with a serviceable replacement?
--
-mike reedy-

************************
Michael K. Reedy, M.D.
Duke Univ. Med. Center
Dept. Cell Biology, Box 3011 (for U.S. Mail)
458 Alex Sands Bldg, Research Dr (courier)
Durham, NC 27710

Office 919-668-2534
Lab 919-684-5674
Fax 919-681-9929
mike.reedy-at-cellbio.duke.edu
http://note.cellbio.duke.edu/Faculty/Research/Reedy.html

==============================Original Headers==============================
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From: atn5613-at-rit.edu
Date: Wed, 22 Aug 2007 08:45:55 -0500
Subject: [Microscopy] viaWWW: manual for ion sputtering system IBS TM200S

Contents Retrieved from Microscopy Listserver Archives
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Email: atn5613-at-rit.edu
Name: Algis Naujokas

Organization: Rochester Institute of Technology

Title-Subject: [Filtered] In need of manual for ion sputtering system IBS TM200S

Question: Hello All,
I am a graduate student at Rochester Institute of Technology and am trying get an IBS TM200S sputter device up and running. The problem is we do not have the exact manual for this device. We would be willing to purchase a copy if possible. It would be greatly appreciated as getting this instrument running is key to me starting my research. Please e-mail me off-list. Thank you for your time.

Algis Naujokas
atn5613-at-rit.edu

---------------------------------------------------------------------------

==============================Original Headers==============================
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From: gmartens-at-interchange.ubc.ca
Date: Wed, 22 Aug 2007 09:59:22 -0500
Subject: [Microscopy] job opportunity

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Hello everyone,

We have a position for a microscopy technician at the UBC BioImaging
Facility in Vancouver, British Columbia.

JOB SUMMARY:

To provide assistance with projects performed in the Bio-Imaging
facility. Duties include: maintaining laboratory supplies and
equipment; maintaining electron and optical microscopes; assisting in
developing protocols for new techniques; ordering supplies and
equipment; training and performing other related duties.

QUALIFICATIONS:

University degree in Science or equivalent diploma in microscopy
(Masters preferred) plus minimum three years microscopy experience.
Experience in image processing. Computer experience required
(Macintosh and PC). Effective oral and written communication, problem
solving, supervisory, interpersonal, organizational skills. Ability
to plan and complete work assignments independently. Ability to
follow instructions and teach.

Visit the following link if you are interested.

http://www.hr.ubc.ca/files/postings/trade.html#job47

Regards,

--
Garnet Martens

Research Manager
BioImaging Facility
University of British Columbia
6270 University Blvd.
Vancouver, B.C.
Canada
V6T 1Z4

phone 604-822-3354

==============================Original Headers==============================
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From: henriks-at-cox.net
Date: Wed, 22 Aug 2007 11:09:33 -0500
Subject: [Microscopy] viaWWW: manual for ion sputtering system IBS TM200S

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Algis:

I would suggest that you contact Scott Walck at South Bay Technology. You
can reach him by email at walck-at-southbaytech.com or at 800-728-2233.

South Bay Technology acquired VCR Group several years ago and has some of
the documentation for those older systems. He may be able to come up with a
manual for you.

Good luck.

Best regards-

David

David Henriks
henriks-at-cox.net

-----Original Message-----
X-from: atn5613-at-rit.edu [mailto:atn5613-at-rit.edu]
Sent: Wednesday, August 22, 2007 6:55 AM
To: Henriks-at-cox.net

This Question/Comment was submitted to the Microscopy Listserver
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Email: atn5613-at-rit.edu
Name: Algis Naujokas

Organization: Rochester Institute of Technology

Title-Subject: [Filtered] In need of manual for ion sputtering system IBS
TM200S

Question: Hello All,
I am a graduate student at Rochester Institute of Technology and am trying
get an IBS TM200S sputter device up and running. The problem is we do not
have the exact manual for this device. We would be willing to purchase a
copy if possible. It would be greatly appreciated as getting this instrument
running is key to me starting my research. Please e-mail me off-list. Thank
you for your time.

Algis Naujokas
atn5613-at-rit.edu

---------------------------------------------------------------------------

==============================Original Headers==============================
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From: rnichols-at-bcm.edu
Date: Wed, 22 Aug 2007 13:47:30 -0500
Subject: [Microscopy] viaWWW: Manual for Coolwell Water Chiller Unit

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Email: rnichols-at-bcm.edu
Name: Ralph Nichols

Organization: Baylor College of Medicine

Title-Subject: [Filtered] Manual for Coolwell Water Chiller Unit

Question: I have a Coolwell water chiller that chill the water for
a Zeiss 902 TEM. It is in need of repair but there is no
manual for our facilities engineers to repair it. They
have been replacing parts on it that they think will repair it. I try
to get manual from Coolwell but they have been out business
for a while now. If anyone could send a copy of it,it would
be greatly appriciated. The model # is SE 0 80W CZ.

Ralph Nichols
Baylor College of Medicine
Houston, TX
713 798-5415

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From: k.sader-at-leeds.ac.uk
Date: Wed, 22 Aug 2007 13:48:13 -0500
Subject: [Microscopy] viaWWW: Thin crystals of vermiculite

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Email: k.sader-at-leeds.ac.uk
Name: Kasim Sader

Organization: SuperSTEM, UK

Title-Subject: [Filtered] Thin crystals of vermiculite

Question: Dear list,


Does anyone have any thin crystals of vermiculite suitable for electron microscopy that they might be willing to lend? Also, does anyone know which type of vermiculite is the most beam insensitive (or which types are beam sensitive)?

I am looking for a beam insensitive thin crystal and have found a few papers using vermiculite, but if anyone has suggestions of other beam insensitive thin crystals, possibly with larger unit cells, I would appreciate these also.

Thanks,

Kasim Sader
Postdoc
SuperSTEM
Daresbury Laboratories
Warrington
WA4 4AD
UK

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From: eq23-at-rice.edu
Date: Wed, 22 Aug 2007 18:30:44 -0500
Subject: [Microscopy] viaWWW: TEM--any concerns while pregnant

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Email: eq23-at-rice.edu
Name: Elizabeth

Organization: Rice university

Title-Subject: [Filtered] TEM--any concerns while pregnant?

Question: Greetings,

A graduate student, I'm a frequent user on the Jeol 2010 and 1230 TEMs at the university. I also found out that I'm 2 months pregnant. Should I be concern of any x-ray or other ionizing energy that may leak from the TEMs? Should I wait after the first trimester (a few more weeks) to get back on the TEM? Does anybody have any good information or advice?

Thanks for your time.

---------------------------------------------------------------------------

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From: nizets2-at-yahoo.com
Date: Thu, 23 Aug 2007 02:22:16 -0500
Subject: [Microscopy] SEM: wt% or atom% ?

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Dear listers,

I will post soon a summary of all the interesting
answers I got for the problem of carbon-free
preparation of samples for SEM-EDX (not a lot of
solution, though).

Now I face a pretty stupid problem that my pair of
neurons can't resolve. When I perform an EDX analysis
in SEM (Oxford Instrument's INCA software), I obtain 2
values for each peak: weight % and atom %.
I guess that weight % represents the integration of
each peak area, whereas atom% represents
weight%/atomic weight. Now the 2 values can
significantly differ, and thus the element ratio of my
samples can also be significantly different. And that
is precisely what I want to know!

Now, please allow to ask some questions:

- why is the integration of the peaks in the EDX
spectrum called "weight %"?
- Does the intensity if the peaks in EDX depend on the
atomic weight? In other words, do heavier elements
produce more x-rays than lighter elements? It is a
hard for me to believe this, because electron shells
are the same for light and heavy elements (a K shell
is a K shell), however it is the only reason I can see
to calculate an atom% value.
- Which one of the 2 values to use, in which case and
why?

Thank you in advance.

Stephane






____________________________________________________________________________________
Yahoo! oneSearch: Finally, mobile search
that gives answers, not web links.
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From: kenconverse-at-qualityimages.biz
Date: Thu, 23 Aug 2007 05:57:45 -0500
Subject: [Microscopy] Re: recipe for Au on C and Al/W dendrites

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Dear listers,
Here are the replies I got. Very helpful. Thank you all.
Ken Converse
owner

QUALITY IMAGES
Servicing Scanning Electron Microscopes
Since 1981
474 So. Bridgton Rd.
Bridgton, ME 04009
207-647-4348
Fax 207-647-2688
kenconverse-at-qualityimages.biz
qualityimages.biz


I inadvertently made a Al/W dendrite sample by heating Al foil (or
wire, I don't remember) in a W coil basket in my vacuum evaporator
when making a telescope mirror. The Al embrittles the W and as you
evaporate the Al, eventually the W wire breaks and you are left with
a glob of Al in the basket. Looks great in BSE mode.
Henk
****************************************************************************
***

I have made the Al-W dendritic structures in an evaporator. From my
observations;
1. Use excess Al for the charge.
2. Heat the charge until the Al is molten. I usually cut-back on heating
power, you need just enough to keep the Al molten for about 3 minutes,
without evaporating it all away. 3. Cool the molten blob rapidly by just
shutting off the heater power. 4. The dendritic structures are located in
small "pockets" near the top of the now solidified blob.
Joseph M. Oparowski
****************************************************************************
*****

I don't know the answer to your question but as far as dendritic grow is
concerned, here is what I do know...

Dendritic growth is a process where one constituent of an alloy begins to
solidfy before another. This leaves the liquid with a compostion lower in
the first constituent and higher in the second. The process of the growing
is limited by a diffusion process of the two components in the liquid.
This means you get smaller dendrites with faster cooling rates and larger
dendrites with slower cooling rates. However, if you cool fast enough, you
can't get the diffusion process happening, and so then you don't get any
dendritic growth. If you cool really slow, well, then it depends upon the
alloy....

You have asked about Al/W. Now those two have really different melting
points so I'd think you'd get darned good dentritic growth with those two
just about no matter how you cooled it... If you went slow, I'd bet you'd
get a lot of interdendritic shrinkage cavities though....

Also, I don't know how big of a structure you want, but it would be my
guess that you could cool that alloy pretty quick and have some nice
dendritic growth...

What did you do the first time you tried that? And how did it turn out?

If someone does answer you with a lot more info, I'd like to find out
myself...If you don't mind sending along the info..

Dj
***************************************************************************

It has been a while since I made these, but I will try to remember. To make
the best gold-on-carbon islands, you evaporate pure gold onto polished
spectrographic-grade graphite, then post-heat the sample to make the islands
coalesce a bit. Takes a few tries to get both the amount of gold and the
post heating right. Some of the ones I've seen also have a bit of evaporated
tin on top of that; it makes little balls decorating the big balls and is
better for a FESEM and high resolution testing. To make the Al-W phase, just
put pure Al in a W basket and heat it up until the aluminum melts, then
evaporates. Soon after that, the W basket will break at one of the arms,
because the Al-W alloy formed is very brittle. The basket with the cooled Al
in it will show the dendrites and a pretty Al-W phase. I'm not sure if
cooling fast or slow matters, it cools pretty fast when the wire breaks.
Good luck,

Mary Fletcher
****************************************************************************
**

I once saw a beautiful, albeit unintentional, resolution sample of someone
who evaporated gold onto an anthracite coal sample. I thought that the gold
on carbon were made by evaporating gold onto a warm polished graphite
surface. The gold doesn't wet the carbon and forms islands. If you stop
the deposition just before coalescence of the Au islands, you have your
resolution sample. Gold has a tendency to films by island coalescence on
most substrates. That is why it has a rough structure and is not a good
choice for high resolution SEM imaging.

For an alloy that forms a dendritic structure, the microstructure will be
finer with a higher cooling rate.

Scott D. Walck, Ph.D.
****************************************************************************
****




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From: mmiralles-at-pi.ac.ae
Date: Thu, 23 Aug 2007 06:12:31 -0500
Subject: [Microscopy] Differentiating CaCO3 using BSE

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Hi everyone,

Being new in geology environment, can someone enlighten me on how can I
differentiate calcite, aragonite and dolomite using BSE?
Reference to a title/name of a publication is also welcome.

Thanks,

Melina Miralles
The Petroleum Institute
Abu Dhabi, UAE
PGSc Lab Technician
The Petroleum Institute
Abu Dhabi, UAE


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From: holpc-at-firstenergycorp.com
Date: Thu, 23 Aug 2007 08:11:57 -0500
Subject: [Microscopy] SEM, considerations for medical devices

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Good morning everyone,

I have been requested to look at a medical item surgically removed from a
(living) person and need to determine whether or not to accept this job.
Being a materials person, I am quite unexperienced at biological issues.
What are some considerations to be aware of to help me decide if this job
is appropriate for us or not? I don't know how (or if) it has been cleaned
so far, but I've been told that I won't be allowed to do anything to it
other than examine it. Sorry, but at this time I can not be more specific.

I have already gotten some valuable and much appreciated input from one
local member, but thought I would pose this to the larger community as
well.

As always, TIA.

Chris Holp
FirstEnergy Corp.
BETA Labs
Mayfield Village, OH 44143
440-604-9704
holpc-at-firstenergycorp.com


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From: frah0010-at-umn.edu
Date: Thu, 23 Aug 2007 08:22:38 -0500
Subject: [Microscopy] Re: Differentiating CaCO3 using BSE

Contents Retrieved from Microscopy Listserver Archives
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Hi Melina,

I don't think one can reliably distinguish calcite and aragonite
using BSE alone unless their morphologies are diagnostic. On the
other hand, distinguishing dolomite should be possible because it has
about 20% MgO.

The mean atomic numbers for calcite and aragonite are the same, and
both have a backscatter coefficient of about 0.142. Dolomite,
though, is less dense and has a backscatter coefficient of about
0.124, so it should appear darker than calcite and aragonite.

This does not mean that there will be absolutely no contrast
difference between calcite and aragonite -- it simply will not be
clear which mineral is which, though. Both minerals can have various
impurities (Mn, Mg, Fe, etc) and crystal orientations that will add
variation to the backscatter signal.

As I mentioned, you might have to rely on their morphologies if
you're working only with BSE. The crystal lattice of aragonite is
different than that of calcite, resulting in different shapes.
Aragonite has an orthorhombic system with usually needle-like
crystals. Calcite is trigonal-rhombohedral and has a variety of
habits: fibrous, granular, lamellar, etc -- more than are easily
described here. You can either use the web or consult an
introductory textbook on mineralogy or petrography to view examples
of the different morphologies of calcite and aragonite.

If the morphologies in your samples don't lend themselves to clearly
identifying calcite vs aragonite, you'll have to something like XRD
or EBSD to differentiate the crystal lattices.

Best,
Ellery

--------------------
Ellery E. Frahm
Research Fellow & Manager
Electron Microprobe Laboratory
University of Minnesota - Twin Cities
Department of Geology & Geophysics
Lab Website: http://probelab.geo.umn.edu
Personal Website: http://umn.edu/~frah0010




On Aug 23, 2007, at 6:16 AM, mmiralles-at-pi.ac.ae wrote:

} Hi everyone,
}
} Being new in geology environment, can someone enlighten me on how
} can I
} differentiate calcite, aragonite and dolomite using BSE?
} Reference to a title/name of a publication is also welcome.
}
} Thanks,
}
} Melina Miralles
} The Petroleum Institute
} Abu Dhabi, UAE
} PGSc Lab Technician
} The Petroleum Institute
} Abu Dhabi, UAE

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From: oshel1pe-at-cmich.edu
Date: Thu, 23 Aug 2007 08:31:30 -0500
Subject: [Microscopy] Re: SEM, considerations for medical devices

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Chris,

The first thing I'd do is go to http://www.histonet.org and sign up
on the histonet mailing list and post your question. That list is
full of people who do this sort of work clinically and in research
labs. Including authors of some of the standard histotechnique texts.

Second, check with the people who want to send you the sample and get
the details of what they've done and what you can do. At the very
least, make certain there was no infection associated with the device
or that there is otherwise zero chance of any pathogen coming along
with it. Since you're in a materials lab, you will not have any
provisions with dealing with any live bacteria/fungi, etc. You should
get the sample either fixed, cleaned of biological materials, or if
neither, then guaranteed to be healthy.
What sorts of microscopy are they looking for? "... won't be allowed
to do anything to it other than examine it." really limits what you
can do.

Phil

} Good morning everyone,
}
} I have been requested to look at a medical item surgically removed from a
} (living) person and need to determine whether or not to accept this job.
} Being a materials person, I am quite unexperienced at biological issues.
} What are some considerations to be aware of to help me decide if this job
} is appropriate for us or not? I don't know how (or if) it has been cleaned
} so far, but I've been told that I won't be allowed to do anything to it
} other than examine it. Sorry, but at this time I can not be more specific.
}
} I have already gotten some valuable and much appreciated input from one
} local member, but thought I would pose this to the larger community as
} well.
}
} As always, TIA.
}
} Chris Holp
} FirstEnergy Corp.
} BETA Labs
} Mayfield Village, OH 44143
} 440-604-9704
} holpc-at-firstenergycorp.com
--
Philip Oshel
Microscopy Facility Supervisor
Biology Department
024C Brooks Hall
Central Michigan University
Mt. Pleasant, MI 48859

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From: frah0010-at-umn.edu
Date: Thu, 23 Aug 2007 08:42:45 -0500
Subject: [Microscopy] Re: SEM, considerations for medical devices

Contents Retrieved from Microscopy Listserver Archives
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Hi Chris,

Let's assume that you're being asked to look at is either a medical
device like a pacemaker or an electrical lead from one or an implant
like an artificial joint or tooth filling -- I won't ask you to
confirm or deny that -- but that's what I'm assuming for this comment.

We've analyzed such items before (although usually before
implantation). Hospitals have strict procedures for anything that
doesn't go into the medical waste, usually involving autoclave
sterilization. If you are worried about biological hazards or
anything like that, you should feel absolutely free to ask the
company exactly what has been done to clean it. If it shows up in
your laboratory, though, in a biohazard bag, feel free to send it
back to them and say "No way." But since medical devices are made to
be sterilized before being placed in a human body, they can be
cleaned very well, probably cleaner than most other samples.

In the past, we've been assured of cleanliness, and I handle most
samples with medical gloves anyway because there are plenty of toxic
geological or mat sci samples too. Basically, medical devices can be
sterilized -- ask them to do that or find someone else.

Best,
Ellery

--------------------
Ellery E. Frahm
Research Fellow & Manager
Electron Microprobe Laboratory
University of Minnesota - Twin Cities
Department of Geology & Geophysics
Lab Website: http://probelab.geo.umn.edu
Personal Website: http://umn.edu/~frah0010



On Aug 23, 2007, at 8:17 AM, holpc-at-firstenergycorp.com wrote:

} Good morning everyone,
}
} I have been requested to look at a medical item surgically removed
} from a
} (living) person and need to determine whether or not to accept this
} job.
} Being a materials person, I am quite unexperienced at biological
} issues.
} What are some considerations to be aware of to help me decide if
} this job
} is appropriate for us or not? I don't know how (or if) it has been
} cleaned
} so far, but I've been told that I won't be allowed to do anything
} to it
} other than examine it. Sorry, but at this time I can not be more
} specific.
}
} I have already gotten some valuable and much appreciated input from
} one
} local member, but thought I would pose this to the larger community as
} well.
}
} As always, TIA.
}
} Chris Holp
} FirstEnergy Corp.
} BETA Labs
} Mayfield Village, OH 44143
} 440-604-9704
} holpc-at-firstenergycorp.com

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From: rcommon-at-msu.edu
Date: Thu, 23 Aug 2007 09:03:04 -0500
Subject: [Microscopy] SEM, considerations for medical devices

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


The principal axiom of "universal precautions", required for handling human
biological material, is to assume that ALL samples are potentially
infectious and treat them as such. Unless you can positively confirm that
the objects have been sterilized or fixed, they should be handled as if they
are infectious, and not accept any assurances that there is no infection
involved.

Ralph Common
Division of Human Pathology
Michigan State University


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From: frah0010-at-umn.edu
Date: Thu, 23 Aug 2007 09:09:04 -0500
Subject: [Microscopy] Re: SEM: wt% or atom% ?

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Hi Stephanie,

Let me address your questions (as I understand them):

} 1: why is the integration of the peaks in the EDX
} spectrum called "weight %"?

We have the problem of two uses of the term "weight percent" in X-ray
analysis. There is the use of "weight" to describe the relative
intensities of the X-ray lines themselves -- that is, the relative
intensities of, say, L-alpha and L-beta X-rays -- and this value can
be reported as a "weight percent" or coefficient. There is also the
use of "weight percent" to refer to the resulting data, calculated in
terms of the mass fraction of the elements in a sample. These two
uses are creating confusion here. It sounds to me like the software
is integrating the area of the peaks to calculate your element
concentrations which are being reported in terms of "weight
percent" (mass fraction) and "atomic percent" (atom fraction) -- does
that make sense with what you're seeing?

} 2; Does the intensity if the peaks in EDX depend on the
} atomic weight? In other words, do heavier elements
} produce more x-rays than lighter elements?

It is not that simple, and the accelerating voltage how efficiently X-
rays are produced from different elements (see "overvoltage ratio"),
so it differs at, say, 10 kV and 20 kV. The simple answer is no.
The not-so-simple answer involves a lot more than I am willing to
type at the moment -- try consulting the section on characteristic X-
ray production in Goldstein et al.

} 3; Which one of the 2 values to use, in which case and why?

If you are asking about asking about reporting your results in terms
of atomic fraction or mass fraction, that depends on your application
or research question and the "standard" format for your field. Why
not record or report both? You can also convert data from one form
to the other at a later date using Excel and a periodic table. So
the answer is "it depends."

I apologize if I've misunderstood any of your questions or problem
descriptions.

Best,
Ellery

--------------------
Ellery E. Frahm
Research Fellow & Manager
Electron Microprobe Laboratory
University of Minnesota - Twin Cities
Department of Geology & Geophysics
Lab Website: http://probelab.geo.umn.edu
Personal Website: http://umn.edu/~frah0010

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From: freym2-at-rpi.edu
Date: Thu, 23 Aug 2007 09:22:54 -0500
Subject: [Microscopy] e-Beam lithography Negative Resists

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Has anyone on the list had experience using H.S.Q. (hydrogen silsesquioxane)
as a negative e-beam resist? If so has it been useful, any tips you can
share as to ease of use, a good source for the material. Thanks for any help
you can offer.

David


M. David Frey
Senior Application Engineer
Rensselaer Polytechnic Institute
Low Center for Industrial Inn.
Center for Integrated Electronics
110 8th Street
CII 4161 (Office)
CII 6015 (Packages and Mail)
Troy, NY 12180
518-276-3323 (office)
518-698-2288 (mobile)




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From: James.Passmore-at-sealedair.com
Date: Thu, 23 Aug 2007 11:00:14 -0500
Subject: [Microscopy] SEM -- S4500 video monitors

Contents Retrieved from Microscopy Listserver Archives
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We have an Oxford system here so I think I can comment on this with
authority.

The weight% and atom% labels DEFINITELY refer to the two ways of
expressing results.

Weight% is synonymous with mass%. It is only roughly proportional to
peak intensity. As Ellery pointed out, there are many things that affect
the conversion of raw peak intensity to weight fraction. The only time I
make use of the correlation is if I am estimating compositions by eye. A
1 wt% S Ka peak and a 1 wt% Au Ma peak have _roughly_ the same integral
where the atomic fractions would be widely different.

Atomic% is synonymous with mole%. It is directly related to weight% by
the atomic weight of the species. It can be easily calculated using a
spreadsheet; however, every (computerized) EDS system I have seen offers
atomic% as an output option.

The two numbers are often widely different, so which do you use? It
depends. If you are interested in stoichiometry and formulas, you want
atomic fractions. If you are checking a sample against its formulation,
the sample was undoubtedly weighed out and you likely want mass
fraction. For example, I was working on a sample of EuAl2 for a
researcher yesterday. The mole (or atomic) fraction of Eu is 33.3%.
However, the mass fraction is 73.8%. Both answers are "right".

Regarding your question of why does intensity depend on weight fraction
more than atomic fraction, I would have to dig back into the texts to
say for sure. Weight depends (essentially) on the mass of the nucleus
and that tells you the number of protons and neutrons and thus the
number of electrons. Now whether it is the number of electrons or the
mass of the nucleus that determines the x-ray intensity from an atom, I
would have to go look. The answer could be a combination of factors.

Warren

-----Original Message-----
X-from: nizets2-at-yahoo.com [mailto:nizets2-at-yahoo.com]
Sent: Thursday, August 23, 2007 2:23 AM
To: wesaia-at-iastate.edu


Hello all,

We have an Hitachi S4500, vintage ~1993. We recently added a digital
acquisition & EDX system. The acquisition system sits by idle while you
tune up the image (select area, magnification, focus, etc.) on the scope's
video monitors, then takes over to acquire the image. Everything works
beautifully, but the ergonomics are not very good. We have our PC monitors
sitting on top of the console, so they are uncomfortably high to look at.

I would like to simply remove the console CRTs and replace either with a
small monitor, or even better, pipe the video signal into an image capture
board to display in a window on the acquisition PC. That's where my
question lies--how to pull the video signal out. I realize the console has
a video out BNC connector which I have tried, but the quality isn't quite
there. (Maybe a sync problem? the image is somewhat distorted.) Our
electronics guys say the old CRTs are hardwired into the system. Does
anyone know if this is a standard video signal? If so, we'll simply remove
the old CRTs (replacing the hard-wired connections with a standard
connection) and cut down the console, leaving a place for the PC monitors.
If there is no standard video signal, then things get substantially more
complicated, of course.

Any suggestions or insight would be appreciated.

Jim

----------------------------------------------
Jim Passmore
Research Associate
Sealed Air Corporation
james.passmore-at-sealedair.com
864-433-2927 voice
864-433-2205 fax
----------------------------------------------


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From: BVandenberg-at-inco.com
Date: Thu, 23 Aug 2007 11:02:34 -0500
Subject: [Microscopy] Tracor PAC 5600 stage control

Contents Retrieved from Microscopy Listserver Archives
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probably just wishful thinking but... Has anyone had any experience with
getting a PC to interface to the antiquated Tracor Northern PAC stage/
spectro controller???

Regards,

B. Vanden Berg


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From: maryflet-at-interchange.ubc.ca
Date: Thu, 23 Aug 2007 11:09:10 -0500
Subject: [Microscopy] viaWWW: TEM--any concerns while pregnant

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Dear Elizabeth,
I have had various graduate students and technicians working in my lab while
pregnant and on my 200 kV Hitachi TEM. The instrument was checked by the
university's Radiation Control Officer with a Geiger counter when it was
first installed and periodically after, particularly after the gun was
disassembled and serviced. The pregnant ladies also wore film badges, which
are much more sensitive to accumulated radiation than a Geiger counter. No
significant leakage was ever found, in fact, the bricks in the walls turned
out to emit more background radiation than the TEM operating at 200kV.
Having said that, you can check that the TEM is operating within radiation
emission limits by:
1. Having it checked while it is operating normally, with you in the
position where you normally operate the TEM
2. Always make sure all apertures, particularly the moveable condenser
aperture, are in place before turning on the beam. Let someone else align
the beam with the C aperture out, if necessary.
I think the modern microscopes are very well shielded and do not leak
significant radiation.
Regards,

Mary Fletcher (nee Mager)
Electron Microscopist
Materials Eng. UBC
#309 - 6350 Stores Road
Vancouver, B.C. V6T 1Z4
Canada
Tel: 604-822-5648
Fax: 604-822-3619
email: maryflet-at-interchange.ubc.ca

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Email: eq23-at-rice.edu
Name: Elizabeth

Organization: Rice university

Title-Subject: [Filtered] TEM--any concerns while pregnant?

Question: Greetings,

A graduate student, I'm a frequent user on the Jeol 2010 and 1230 TEMs at
the university. I also found out that I'm 2 months pregnant. Should I be
concern of any x-ray or other ionizing energy that may leak from the TEMs?
Should I wait after the first trimester (a few more weeks) to get back on
the TEM? Does anybody have any good information or advice?

Thanks for your time.

---------------------------------------------------------------------------

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From: Rob.Bowen-at-caddock.com
Date: Thu, 23 Aug 2007 12:28:51 -0500
Subject: [Microscopy] Re: e-Beam lithography Negative Resists

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--
David,
Haven't used any for e-beam resist, but www.gelest.com would be a source
for lab size amounts. They'd also be a good place to ask for advice.
HTH

Rob Bowen

Robert C. Bowen
Research Scientist
Caddock Electronics, Inc
rob.bowen-at-caddock.com
http://www.caddock.com


} From: {freym2-at-rpi.edu}
} Reply-To: {freym2-at-rpi.edu}
} Date: Thu, 23 Aug 2007 09:28:32 -0500
} To: {rob.bowen-at-caddock.com}
} Subject: [Microscopy] e-Beam lithography Negative Resists
}
}
}
}
} ----------------------------------------------------------------------------
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}
} Has anyone on the list had experience using H.S.Q. (hydrogen silsesquioxane)
} as a negative e-beam resist? If so has it been useful, any tips you can
} share as to ease of use, a good source for the material. Thanks for any help
} you can offer.
}
} David
}
}
} M. David Frey
} Senior Application Engineer
} Rensselaer Polytechnic Institute
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} 518-276-3323 (office)
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}
}
}
}
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From: tivol-at-caltech.edu
Date: Thu, 23 Aug 2007 13:34:50 -0500
Subject: [Microscopy] Re: viaWWW: TEM--any concerns while pregnant

Contents Retrieved from Microscopy Listserver Archives
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On Aug 22, 2007, at 4:30 PM, eq23-at-rice.edu wrote:

} A graduate student, I'm a frequent user on the Jeol 2010 and 1230
} TEMs at the university. I also found out that I'm 2 months
} pregnant. Should I be concern of any x-ray or other ionizing
} energy that may leak from the TEMs? Should I wait after the first
} trimester (a few more weeks) to get back on the TEM? Does anybody
} have any good information or advice?

Dear Elizabeth,
Modern EMs are well-designed so that they emit very little
radiation, and the safety officer at your institution should make
frequent checks to see that the EM meets the spec. That said, you
could wear a dosimeter to measure your exposure. I would hope that
you would be reassured that your exposure is minimal--probably below
the limit of detection.
Yours,
Bill Tivol, PhD
EM Scientist
Electron Cryo-Microscopy Facility
Broad Center, Mail Code 114-96
California Institute of Technology
Pasadena CA 91125
(626) 395-8833
tivol-at-caltech.edu


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From: rdg-at-uab.edu
Date: Thu, 23 Aug 2007 13:35:08 -0500
Subject: [Microscopy] viaWWW: TEM--any concerns while pregnant

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Many, many moons ago, I had our TEM surveyed by our radiation safety
guys when I was pregnant (JEOL 2000FX) and what they discovered was that
there was absolutely no radiation leakage EXCEPT when the condenser
aperture was out. Ours has two sets of apertures - top hat and regular
and there is an intermediate setting with no aperature in. We tried
messing up the centering on the apertures and everything to see if
anything leaked and it didn't except as I stated above. I recommend a
similar check for you. I'm sure someone on campus at Rice has a
detector. I worked at Hanford laboratory and had some extra radiation
training and developing cells are very sensitive to radiation. Along
the same lines, you need to be very careful about what chemicals and
biological hazards you handle when you do sample preparation. We've had
lots of female graduate students, employees and faculty pregnant in my
18 years here and I've never had trouble getting people to cover for a
pregnant woman. Of course, I'm in the south and southern gentlemen are
wonderfully polite so maybe that is why it was so easy for us!! I'm
sure there are rules that protect you from being forced to do stuff that
is hazardous now if you find out there are issues in your lab. Check
with your safety department and congratulations.....




-----Original Message-----
X-from: eq23-at-rice.edu [mailto:eq23-at-rice.edu]
Sent: Wednesday, August 22, 2007 6:38 PM
To: Robin D Griffin

This Question/Comment was submitted to the Microscopy Listserver using
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Email: eq23-at-rice.edu
Name: Elizabeth

Organization: Rice university

Title-Subject: [Filtered] TEM--any concerns while pregnant?

Question: Greetings,

A graduate student, I'm a frequent user on the Jeol 2010 and 1230 TEMs
at the university. I also found out that I'm 2 months pregnant. Should I
be concern of any x-ray or other ionizing energy that may leak from the
TEMs? Should I wait after the first trimester (a few more weeks) to get
back on the TEM? Does anybody have any good information or advice?

Thanks for your time.

------------------------------------------------------------------------
---

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From: bozzola-at-siu.edu
Date: Thu, 23 Aug 2007 16:41:40 -0500
Subject: [Microscopy] CM Taylor Corp Standard

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

I am trying to locate the C.M. Taylor Corporation, specialists in
microbeam standards.
We were given one of their standards (NO. 202) but need a map of the
minerals present.
Any help would be appreciated.

Thank you,

JB
--
+++++++++++++++++++++++++++++++++++++++++++++++++++++++

John J. Bozzola, Ph.D., Director
Integrated Microscopy & Graphics Expertise (IMAGE)
Southern Illinois University
750 Communications Drive - MC 4402
Carbondale, IL 62901
Telephone: 618-453-3730

+++++++++++++++++++++++++++++++++++++++++++++++++++++++

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From: kdunnerj-at-mdanderson.org
Date: Thu, 23 Aug 2007 17:45:09 -0500
Subject: [Microscopy] viaWWW: Osmium tetroxide on Lowicryl Sections

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Email: kdunnerj-at-mdanderson.org
Name: Kenneth Dunner Jr

Organization: MD Anderson Cancer Center

Title-Subject: [Filtered] Osmium tetroxide on Lowicryl Sections

Question: A colleague I know wants to know has anyone used osmium tetroxide on post embedded immunogold labeled Lowicryl sections to make microtubules or other membranes stand out?

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From: dlowry-at-asu.edu
Date: Thu, 23 Aug 2007 17:45:38 -0500
Subject: [Microscopy] viaWWW: negative staining problem

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Email: dlowry-at-asu.edu
Name: David Lowry

Organization: Arizona State University

Title-Subject: [Filtered] negative staining problem

Question: I believe there was a previous discussion on the List concerning this issue, but I could not locate the subject in the archives. I am having a negative staining problem with what is commonly referred to as 'champagning' or tiny bubble-like areas around specimens and other particles on the grid. I observe this frequently with all stains I use--UA, PTA and amm molybdate--and at different concentrations and pH values. It also doesn't appear to be affected by surfactants or time duration of stain application. I seem to recall this phenomenon is not well understood as to its cause, but I was wondering if anyone may have any information or ideas on how to minimize or eliminate this from occurring. Thanks,


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From: michael-at-shaffer.net
Date: Fri, 24 Aug 2007 06:47:12 -0500
Subject: [Microscopy] RE: SEM: wt% or atom% ?

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Elizabeth

if the electron microscopes are well maintained and have the usual
safety checks, there should be no problem during normal operation.

I would be much more concerned about chemical and biohazard risks in the
lab, which of course should normally be assessed.

In the UK it would be possible to ask if a risk assessment for the lab
would identify specific risks to pregnant women.

Congratulations and I hope all goes well in March/April next year.

Malcolm Haswell
e.m. unit
School of Health, Natural and Social Sciences
Fleming Building
University of Sunderland
Tyne & Wear
SR1 3SD
UK
e-mail: malcolm.haswell-at-sunderland.ac.uk


----- Original Message -----
X-from: eq23-at-rice.edu

Stephane asks ...

} - why is the integration of the peaks in the EDX spectrum
} called "weight %"?
} - Does the intensity if the peaks in EDX depend on the atomic
} weight? In other words, do heavier elements produce more
} x-rays than lighter elements? It is a hard for me to believe
} this, because electron shells are the same for light and
} heavy elements (a K shell is a K shell), however it is the
} only reason I can see to calculate an atom% value.

The EPMA technique, whether EDX or WDX, is more sensitive to mass% than
atom%. I know this is somewhat counter-intuitive and I remember having the
same conceptual problems myself. However, you can do simple tests with
stoichometric compounds that include heavy and lighter atomic numbers. A
good example would be to compare Fe metal and FeO. If you integrate the Fe
Ka peak for both you'll see that for FeO it almost directly calculates the
mass fraction rather than the atom fraction.

Therefore mass fractions are always the direct result of EPMA, while atom
fractions are calculated secondarily. Most analysts will always report the
mass% because it will include the actual total of all elements, while the
atom% will always be a result of having normalized to 100%.

HTH & cheerios, michael shaffer :o)
SEM-MLA Research Coodinator
INCO Innovation Centre
Memorial University
St. John's Newfoundland
http://www.mun.ca/creait/maf/


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6, 21 -- Subject: RE: [Microscopy] SEM: wt% or atom% ?
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From: dsherman-at-purdue.edu
Date: Fri, 24 Aug 2007 09:10:59 -0500
Subject: [Microscopy] Safety issues with microwave

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Folks,

We currently have and use heavily an older scientific microwave for EM
sample preparation. It currently sits in a fume hood so that not only will
vapors be vented efficiently from the microwave vent but also when the door
is opened. Samples are handled exclusively in the hood and all reagents are
kept in the hood adjacent to the microwave so that at no time does hazardous
materials have to be transported through the open room during sample
preparation.

I have been asked to relinquish the hood. This will require placing the
microwave on the bench in an open lab. The top of the microwave would have
to be vented into an adjacent hood and all reagents and samples would need
to be moved between this hood and the microwave through the open lab space.

My concern is a safety one. We already had one technician who had an
adverse reaction to fumes (gloved fingers swelling, numbness) when we tried
a similar configuration some years ago. We had the microwave on a table at
90o from the hood so the distance to move samples and chemicals between the
two were as short as possible. The microwave vent tube was run into the
hood. This technician has not had any adverse reactions since the
microwave and all processing is done in the same hood.

I would like to hear from others as to what your feeling are concerning the
safety issues involved and what you feel is the appropriate way to deal with
these safety issues.

Debby

Debby Sherman, Director Phone: 765-494-6666
Life Science Microscopy Facility FAX: 765-494-5896
Purdue University E-mail: dsherman-at-purdue.edu
S-052 Whistler Building
170 S. University Street
West Lafayette, IN 47907
http://www.agriculture.purdue.edu/microscopy


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From: lkerr-at-mbl.edu
Date: Fri, 24 Aug 2007 09:14:11 -0500
Subject: [Microscopy] recipe for Au on C and Al/W dendrites

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Ken,

While filing your summary I came across the following technical article
that describes the gold on carbon sample as well as others.

Humenansky, John. (1987). Manufacture and use of test samples to adjust
and evaluate the SEM, TEM and STEM. EMSA Bulletin 17:1 68-72.

Hope all is well,
Louie

kenconverse-at-qualityimages.biz wrote:

} ----------------------------------------------------------------------------
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} Dear listers,
} Here are the replies I got. Very helpful. Thank you all.
} Ken Converse
} owner
}
} QUALITY IMAGES
} Servicing Scanning Electron Microscopes
} Since 1981
} 474 So. Bridgton Rd.
} Bridgton, ME 04009
} 207-647-4348
} Fax 207-647-2688
} kenconverse-at-qualityimages.biz
} qualityimages.biz
}
}
} I inadvertently made a Al/W dendrite sample by heating Al foil (or
} wire, I don't remember) in a W coil basket in my vacuum evaporator
} when making a telescope mirror. The Al embrittles the W and as you
} evaporate the Al, eventually the W wire breaks and you are left with
} a glob of Al in the basket. Looks great in BSE mode.
} Henk
} ****************************************************************************
} ***
}
} I have made the Al-W dendritic structures in an evaporator. From my
} observations;
} 1. Use excess Al for the charge.
} 2. Heat the charge until the Al is molten. I usually cut-back on heating
} power, you need just enough to keep the Al molten for about 3 minutes,
} without evaporating it all away. 3. Cool the molten blob rapidly by just
} shutting off the heater power. 4. The dendritic structures are located in
} small "pockets" near the top of the now solidified blob.
} Joseph M. Oparowski
} ****************************************************************************
} *****
}
} I don't know the answer to your question but as far as dendritic grow is
} concerned, here is what I do know...
}
} Dendritic growth is a process where one constituent of an alloy begins to
} solidfy before another. This leaves the liquid with a compostion lower in
} the first constituent and higher in the second. The process of the growing
} is limited by a diffusion process of the two components in the liquid.
} This means you get smaller dendrites with faster cooling rates and larger
} dendrites with slower cooling rates. However, if you cool fast enough, you
} can't get the diffusion process happening, and so then you don't get any
} dendritic growth. If you cool really slow, well, then it depends upon the
} alloy....
}
} You have asked about Al/W. Now those two have really different melting
} points so I'd think you'd get darned good dentritic growth with those two
} just about no matter how you cooled it... If you went slow, I'd bet you'd
} get a lot of interdendritic shrinkage cavities though....
}
} Also, I don't know how big of a structure you want, but it would be my
} guess that you could cool that alloy pretty quick and have some nice
} dendritic growth...
}
} What did you do the first time you tried that? And how did it turn out?
}
} If someone does answer you with a lot more info, I'd like to find out
} myself...If you don't mind sending along the info..
}
} Dj
} ***************************************************************************
}
} It has been a while since I made these, but I will try to remember. To make
} the best gold-on-carbon islands, you evaporate pure gold onto polished
} spectrographic-grade graphite, then post-heat the sample to make the islands
} coalesce a bit. Takes a few tries to get both the amount of gold and the
} post heating right. Some of the ones I've seen also have a bit of evaporated
} tin on top of that; it makes little balls decorating the big balls and is
} better for a FESEM and high resolution testing. To make the Al-W phase, just
} put pure Al in a W basket and heat it up until the aluminum melts, then
} evaporates. Soon after that, the W basket will break at one of the arms,
} because the Al-W alloy formed is very brittle. The basket with the cooled Al
} in it will show the dendrites and a pretty Al-W phase. I'm not sure if
} cooling fast or slow matters, it cools pretty fast when the wire breaks.
} Good luck,
}
} Mary Fletcher
} ****************************************************************************
} **
}
} I once saw a beautiful, albeit unintentional, resolution sample of someone
} who evaporated gold onto an anthracite coal sample. I thought that the gold
} on carbon were made by evaporating gold onto a warm polished graphite
} surface. The gold doesn't wet the carbon and forms islands. If you stop
} the deposition just before coalescence of the Au islands, you have your
} resolution sample. Gold has a tendency to films by island coalescence on
} most substrates. That is why it has a rough structure and is not a good
} choice for high resolution SEM imaging.
}
} For an alloy that forms a dendritic structure, the microstructure will be
} finer with a higher cooling rate.
}
} Scott D. Walck, Ph.D.
} ****************************************************************************
} ****
}
}
}
}
} _________________________________________________________________
} Need personalized email and website? Look no further. It's easy
} with Doteasy $0 Web Hosting! Learn more at www.doteasy.com
}
}
} ==============================Original Headers==============================
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--
Louie Kerr
Research and Education Support Coordinator
Marine Biological Laboratory
7 MBL Street
Woods Hole, MA 02543
508-289-7273
508-540-6902 (FAX)
508-292-0289 (Cell phone)

VISIT OUR WEB SITES:
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From: Walter.Bobrowski-at-pfizer.com
Date: Fri, 24 Aug 2007 09:31:32 -0500
Subject: [Microscopy] Safety issues with microwave

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Hi Deb.
That microwave should be under a portable hooded enclosure which can be
vented to the main hood, with sufficient adjoining work space for
reagent handling.
Check out the vented bench top workstations from Flow Sciences:
http://www.flowsciences.com

Also, you didn't state the protective wear your colleague was wearing. I
highly recommend the use of non-powdered Nitrile gloves (double up and
discard the outer layer if they become fairly contaminated with resin).

Best regards,

Walter F. Bobrowski
Sr. Scientist
Pfizer Global R&D
2800 Plymouth Rd.
Ann Arbor, MI 48105

TEL: 734-622-7814
FAX: 734-622-5718

"Like the strength of a steel rod, the true character of a person can
only be known under extreme stress." - Leslie Fieger




-----Original Message-----
X-from: dsherman-at-purdue.edu [mailto:dsherman-at-purdue.edu]
Sent: Friday, August 24, 2007 10:20 AM
To: Bobrowski, Walter

Folks,

We currently have and use heavily an older scientific microwave for EM
sample preparation. It currently sits in a fume hood so that not only
will
vapors be vented efficiently from the microwave vent but also when the
door
is opened. Samples are handled exclusively in the hood and all reagents
are
kept in the hood adjacent to the microwave so that at no time does
hazardous
materials have to be transported through the open room during sample
preparation.

I have been asked to relinquish the hood. This will require placing the
microwave on the bench in an open lab. The top of the microwave would
have
to be vented into an adjacent hood and all reagents and samples would
need
to be moved between this hood and the microwave through the open lab
space.

My concern is a safety one. We already had one technician who had an
adverse reaction to fumes (gloved fingers swelling, numbness) when we
tried
a similar configuration some years ago. We had the microwave on a table
at
90o from the hood so the distance to move samples and chemicals between
the
two were as short as possible. The microwave vent tube was run into the
hood. This technician has not had any adverse reactions since the
microwave and all processing is done in the same hood.

I would like to hear from others as to what your feeling are concerning
the
safety issues involved and what you feel is the appropriate way to deal
with
these safety issues.

Debby

Debby Sherman, Director Phone: 765-494-6666
Life Science Microscopy Facility FAX: 765-494-5896
Purdue University E-mail: dsherman-at-purdue.edu
S-052 Whistler Building
170 S. University Street
West Lafayette, IN 47907
http://www.agriculture.purdue.edu/microscopy


==============================Original
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8, 21 -- Subject: Safety issues with microwave
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23, 31 -- From Walter.Bobrowski-at-pfizer.com Fri Aug 24 09:31:25 2007
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From: gmartens-at-interchange.ubc.ca
Date: Fri, 24 Aug 2007 10:14:31 -0500
Subject: [Microscopy] Re: Safety issues with microwave

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Hi Debby,

We have similar situation to your original situation. Our main
processing microwave sits right next to the hood and is vented
through a properly taped duct system. We try to train our clients to
always use the vacuum chamber, regardless if they are applying vacuum
or not. The chamber can be closed during the transfer from the hood
to the microwave.

Our main issue is getting people to clean up after themselves. If
anyone has a nice way to convince your clients to clean up after they
finish processing I would love to hear it. The usual threats of
taking away privileges does not seem to work.

Garnet

--
Garnet Martens

Research Manager
BioImaging Facility
University of British Columbia
6270 University Blvd.
Vancouver, B.C.
Canada
V6T 1Z4

phone 604-822-3354

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From: heckman-at-bgnet.bgsu.edu
Date: Fri, 24 Aug 2007 10:17:14 -0500
Subject: [Microscopy] Re: viaWWW: Osmium tetroxide on Lowicryl Sections

Contents Retrieved from Microscopy Listserver Archives
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Kenneth-
I have never tried this, but I would be surpised if it would work.
Lowicrl resin is itself quite reactive, and I would expect it to have
reacted with a lot of the primary and secondary amines that OsO4
reacts with. This may be worth a try though. It has never been
reported, to my knowledge, so it would be new knowledge.
Carol


} ----------------------------------------------------------------------------
} The Microscopy ListServer -- CoSponsor: The Microscopy Society of America

--
Carol A. Heckman, Ph.D.
Director, Center for Microscopy & Microanalysis
and Professor of Biological Sciences
Bowling Green State University
Bowling Green, OH 43403
USA
website: http://www.bgsu.edu/departments/biology/facilities/MnM

==============================Original Headers==============================
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From: Elliott-at-arizona.edu
Date: Fri, 24 Aug 2007 10:29:24 -0500
Subject: [Microscopy] cleaning up [was - Safety issues with microwave]

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

How about billing them for the cleanup time (at the extra-special
unsubsidized billing rate)? Call it a 'service' for those too busy
to be good citizens.
David


On Aug 24, 2007, at 8:17 AM, gmartens-at-interchange.ubc.ca wrote:

} Our main issue is getting people to clean up after themselves. If
} anyone has a nice way to convince your clients to clean up after they
} finish processing I would love to hear it. The usual threats of
} taking away privileges does not seem to work.


==============================Original Headers==============================
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From: Andrew.Bowling-at-ARS.USDA.GOV
Date: Fri, 24 Aug 2007 10:40:47 -0500
Subject: [Microscopy] Re: viaWWW: Osmium tetroxide on Lowicryl Sections

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Hello Kenneth,

2 minutes in 2% UA and 30 seconds in lead citrate give strong staining
with LR and Lowicryl. This will give negative contrast on membranes and
positive contrast of microtubules. Ribosomes stand out very clearly,
too.

Also, I would recommend 2% (unbuffered) potassium permanganate for 2
minutes. This will give good positive contrast of membranes. (My
experiences are mostly with plant material, however.)

Pre-embedding treatment of tissue with 2% UA overnight before lowicryl
will preserve/stabilize the membrane as well as give them some contrast
after sectioning.

Kevin Vaughn


==============================Original Headers==============================
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From: tstephen-at-mic.tamu.edu
Date: Fri, 24 Aug 2007 11:44:36 -0500
Subject: [Microscopy] SEM of hydrogels, anyone have contamination problems?

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Hi,

Has anyone had contamination problems when looking at PEGDA (polyethylene
glycol-diacrylate) hydrogels using SEM?

Many thanks!

Tom

Tom Stephens
Assistant Research Scientist
Microscopy and Imaging Center
Texas A&M University
College Station, TX 77843
phone:979-845-1129
fax:979-847-8933
email:tstephen-at-mic.tamu.edu


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From: jvtaylo-at-emory.edu
Date: Fri, 24 Aug 2007 16:14:43 -0500
Subject: [Microscopy] dark field STEM

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

I have observed gold islands before that resulted from heating
gold-coated silica at several hundred degrees (a client's project).
Prompted by the current discussion and our own need for such a sample, I
decided to go low-tech and try replicating the result with gold on
carbon.

I sputtered several garden-variety graphite stubs with about 20 nm of
gold and heated the samples in a muffle furnace at about 500 C for about
two hours. I was busy with other things and did not control the time
well. I also did not experiment with the temperature or the thickness of
gold. (I probably should go read Humenansky's note.)

I got decent islands of gold on all samples. I have posted images on our
server at ftp://www.marl.iastate.edu/Gold-on-C/. The images were
comparable to those from our service engineers gold-on-carbon samples.
Now I wonder why I didn't try this sooner.

Warren Straszheim

-----Original Message-----
X-from: lkerr-at-mbl.edu [mailto:lkerr-at-mbl.edu]
Sent: Friday, August 24, 2007 9:15 AM
To: wesaia-at-iastate.edu

I have a question for the List. What is Dark Field STEM? I have a
student in our department who wants to use Dark Field STEM to image some
fibers and use it to calculate mass per unit length. Mass is directly
proportional to the density of the fiber. This is in reference to an
article by C. S. Goldsbury in 2000. I need help in understanding how
this is not just SEM imaging or inverted STEM imaging and in
understanding what programs were used to make the measurements and
calculations. Any comments and advice would be welcome.

Thanks, Jeannette

--
Jeannette Taylor, Technologist II
IM&MF
Cherry L. Emerson Hall, Room E106
Emory University
1515 Dickey Drive
Atlanta, Georgia 30322

Phone: 404-712-8674
FAX: 404-727-7760
jvtaylo-at-emory.edu
http://www.electronmicroscopy.emory.edu/


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From: jpchandl-at-mines.edu
Date: Fri, 24 Aug 2007 17:20:14 -0500
Subject: [Microscopy] Gatan DuoMill maintenance question

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

We're trying to "resurrect" an old Gatan DuoMill and have a problem.
Basically, the back guns on both sides have a "dark current" of ~0.5mA when
the voltage is set at 6kV and there is no gas flow. When you introduce gas,
you can get a beam that looks almost normal. The front guns appear to work
correctly but when you select both guns, the back gun appears to be the only
one working. Thus, we're trying to identify the source of the "dark
current" as that appears to make milling from both sides impossible. Any
veterans with experience on these things with suggestions?

Thanks very much for any suggestions.

--John
John Chandler, Ph.D.
Manager, Electron Microscopy Lab
Colorado School of Mines
1500 Illinois Street
Golden, CO 80401-1887
jpchandl-at-mines.edu
303.384.2203




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From: tivol-at-caltech.edu
Date: Fri, 24 Aug 2007 17:54:49 -0500
Subject: [Microscopy] Re: dark field STEM

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


On Aug 24, 2007, at 2:14 PM, jvtaylo-at-emory.edu wrote:

} I have a question for the List. What is Dark Field STEM? I have a
} student in our department who wants to use Dark Field STEM to image
} some
} fibers and use it to calculate mass per unit length. Mass is directly
} proportional to the density of the fiber. This is in reference to an
} article by C. S. Goldsbury in 2000. I need help in understanding how
} this is not just SEM imaging or inverted STEM imaging and in
} understanding what programs were used to make the measurements and
} calculations. Any comments and advice would be welcome.

Dear Jeanette,
Dark field STEM uses a focussed beam rastered across the specimen to
produce an image consisting only of scattered electrons. This is
realized by having a detector that does not detect the unscattered
beam. For example, a small dot of absorbing material can be put in
the objective lens back focal plane where the unscattered beam goes,
i.e., in the center of the diffraction pattern, and the unabsorbed
electrons can continue on to the detector, or a detector with a hole
in the center can be placed in a plane conjugate to the diffraction
plane. A practical method that can be used with some specimens is to
put the objective aperture off-center to block the unscattered beam.
This method produces an image that includes only some of the Fourier
components, but if the fiber has the same composition along its
length, the proportion of the total scattered beam to that which
passes through the aperture and is detected will be constant, so
relative measurements of the mass per unit length should be OK.
Yours,
Bill Tivol, PhD
EM Scientist
Electron Cryo-Microscopy Facility
Broad Center, Mail Code 114-96
California Institute of Technology
Pasadena CA 91125
(626) 395-8833
tivol-at-caltech.edu


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From: walck-at-southbaytech.com
Date: Fri, 24 Aug 2007 18:01:05 -0500
Subject: [Microscopy] Gatan DuoMill maintenance question

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

I haven't worked on a DuoMill in a long time, but here are some things that
I would look for.

What's the color of the plasma that you can see in the gun? If it is not
purple, then you have a vacuum leak. Nitrogen will look pinkish. Nitrogen
will ionize much more easily than Ar and if you set it up for both guns,
your current will be the one with N2, not the Ar. If it is purple, then you
have a short. It might be a carbon track short or a thin film metallization
short which will only be seen at a higher voltage. Slowly bring the gun up
and see if there is a point where there is a big jump in your current. Your
solution there is to take the gun apart and thoroughly clean it, paying
particular attention to the ceramics. Any metallization or carburization
must be removed or replace the ceramic.


-Scott

Scott D. Walck, Ph.D.
Technical Director
South Bay Technology, Inc.
1120 Via Callejon
San Clemente, CA 92673

US Toll Free: 1-800-728-2233
Tel: (949) 492-2600
Fax: (949) 492-1499

www.southbaytech.com
walck-at-southbaytech.com

-----Original Message-----
X-from: jpchandl-at-mines.edu [mailto:jpchandl-at-mines.edu]
Sent: Friday, August 24, 2007 3:23 PM
To: Walck-at-SouthBayTech.com

We're trying to "resurrect" an old Gatan DuoMill and have a problem.
Basically, the back guns on both sides have a "dark current" of ~0.5mA when
the voltage is set at 6kV and there is no gas flow. When you introduce gas,
you can get a beam that looks almost normal. The front guns appear to work
correctly but when you select both guns, the back gun appears to be the only
one working. Thus, we're trying to identify the source of the "dark
current" as that appears to make milling from both sides impossible. Any
veterans with experience on these things with suggestions?

Thanks very much for any suggestions.

--John
John Chandler, Ph.D.
Manager, Electron Microscopy Lab
Colorado School of Mines
1500 Illinois Street
Golden, CO 80401-1887
jpchandl-at-mines.edu
303.384.2203




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From: walck-at-southbaytech.com
Date: Fri, 24 Aug 2007 19:42:49 -0500
Subject: [Microscopy] SEM: wt% or atom% ?

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

I haven't seen a response to this, but you are way off-base on your
assumptions.

The wt% and at.% are simply two ways of expressing compositions. The wt% is
typically output because materials scientist will almost universally use
wt.% to express phase diagrams. The area under an X-ray peak is called the
integrated peak intensity (after the background intensity is subtracted.)
All of the X-ray microanalysis techniques for bulk samples have to account
for atomic number, density, and fluorescence effects. These corrections
correct for the production of X-rays as a function of depth (the phi-rho-z
curve), absorption of X-rays as a function of depth, fluorescence as a
function of depth. Now all of these corrections depend on the composition.
The integrated peak intensities for the elements are used to iteratively
calculate the compositions. These calculations in the various correction
routines are easier to perform using the wt% values for concentrations. I
suggest that you look at the Goldstein et al. book for SEM and
Microanalysis.

To calculate the at.% of Fe in FeO is easy. It is 1/(1+1) = 0.5 or 50 at.%.
For Fe2O3 it is 2/(2+3)= 0.4 or 40%.

To calculate the wt.%, you need to use the atomic weights of the elements.

For Fe in FeO, you have 1*55.85/(1*55.85+1*16.00) = 0.777 or 77.7 wt.%. For
Fe2O3 it is (2*55.85)/(2*55.85 + 3*16.00) = 0.699 or 69.9 wt.%.

Once the software finds the wt%, it uses a relatively simple algorithm to
calulate the at.%.

You should check any introductory materials science book having a chapter on
phase diagrams to see how it is done.

To answer your third question, they are equivalent. When you do an oxide,
doing the oxide by ratio, it is easier to do it by at.%.



Now the other question that you asked is again tied up in the stuff that I
said above, but there is another thing that you should be aware of and that
is the issue of fluorescence yield. There are two competing physical
processes that can occur to relieve the excess energy in an atom when a core
electron is ejected from that atom. The first is X-ray emission which you
are familiar with. The second is Auger electron emission (After Pierre
Auger). Auger electron emission is a two electron emission process. Let's
take a K shell excitation example. Just as in the emission of a K-alpha
X-ray, an electron from the L shell drops into the K shell, but instead of
the excess energy coming off in the form of a an X-ray, the excess energy
left is enough to ionize another L shell electron. This would be the
emission of a KLL Auger electron. Auger electron spectroscopy if a surface
analytical technique since the Auger electrons will loose an indeterminate
amount of energy if it is emitted within the bulk of the sample and it is
just added to the backscattered electron background. X-rays and Auger are
competing processes. The X-ray fluorescence yield is the probability of an
X-ray being generated when a core shell electron is ionized. The X-ray
fluorescence yield is higher for heavier elements than lighter ones. The
auger yield is more prevalent for light elements. This is just another
natural physical thing that the analyst is fighting against when doing light
element X-ray microanalysis.




-Scott

Scott D. Walck, Ph.D.
Technical Director
South Bay Technology, Inc.
1120 Via Callejon
San Clemente, CA 92673

US Toll Free: 1-800-728-2233
Tel: (949) 492-2600
Fax: (949) 492-1499

www.southbaytech.com
walck-at-southbaytech.com

-----Original Message-----
X-from: nizets2-at-yahoo.com [mailto:nizets2-at-yahoo.com]
Sent: Thursday, August 23, 2007 12:26 AM
To: Walck-at-SouthBayTech.com

Dear listers,

I will post soon a summary of all the interesting answers I got for the
problem of carbon-free preparation of samples for SEM-EDX (not a lot of
solution, though).

Now I face a pretty stupid problem that my pair of neurons can't resolve.
When I perform an EDX analysis in SEM (Oxford Instrument's INCA software), I
obtain 2 values for each peak: weight % and atom %.
I guess that weight % represents the integration of each peak area, whereas
atom% represents weight%/atomic weight. Now the 2 values can significantly
differ, and thus the element ratio of my samples can also be significantly
different. And that is precisely what I want to know!

Now, please allow to ask some questions:

- why is the integration of the peaks in the EDX spectrum called "weight %"?
- Does the intensity if the peaks in EDX depend on the atomic weight? In
other words, do heavier elements produce more x-rays than lighter elements?
It is a hard for me to believe this, because electron shells are the same
for light and heavy elements (a K shell is a K shell), however it is the
only reason I can see to calculate an atom% value.
- Which one of the 2 values to use, in which case and why?

Thank you in advance.

Stephane






____________________________________________________________________________
________
Yahoo! oneSearch: Finally, mobile search that gives answers, not web links.
http://mobile.yahoo.com/mobileweb/onesearch?refer=1ONXIC

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From: cni-at-udel.edu
Date: Fri, 24 Aug 2007 22:13:13 -0500
Subject: [Microscopy] SEM: wt% or atom% ?

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Hi Stephane,

I'm in complete agreement with Scott. Also, you can learn a bit more
from any textbooks of Modern Physics.

The Answer to your question at the end is "Yes". The K shell of atom A
is different of the K shell of atom B as far as their binding energy is
concerned. Also given the fact of the existence of ONE vacancy in the K
shell, the probability to generate X-ray photons is deferent from Z1
(element one) to Z2 (element two), so are the energy amount of any
individual X-rays dictated by characteristic orbit energy differences.

Please note, when you do quantification, you need to take into
consideration of a factor called "ZAF", standing for "atomic number",
"absorption", and "florescence". For example, a total integral of a
lighter element A peak generally carries more weight than the same total
integral of a corresponding heavier element B beak assuming the primary
energy of the e-beam is sufficient.

Wt% and at% are equivalent (please find that in any General Chemistry
book.)

Yes, reading some more books shall help!

Chaoying Ni
http://eml.masc.udel.edu



------------
- Does the intensity if the peaks in EDX depend on the atomic weight? In
other words, do heavier elements produce more x-rays than lighter
elements? It is a hard for me to believe this, because electron shells
are the same for light and heavy elements (a K shell is a K shell),
however it is the only reason I can see to calculate an atom% value.



-----Original Message-----
X-from: walck-at-southbaytech.com [mailto:walck-at-southbaytech.com]
Sent: Friday, August 24, 2007 8:45 PM
To: cni-at-UDel.Edu

I haven't seen a response to this, but you are way off-base on your
assumptions.

The wt% and at.% are simply two ways of expressing compositions. The
wt% is
typically output because materials scientist will almost universally use
wt.% to express phase diagrams. The area under an X-ray peak is called
the
integrated peak intensity (after the background intensity is
subtracted.)
All of the X-ray microanalysis techniques for bulk samples have to
account
for atomic number, density, and fluorescence effects. These corrections
correct for the production of X-rays as a function of depth (the
phi-rho-z
curve), absorption of X-rays as a function of depth, fluorescence as a
function of depth. Now all of these corrections depend on the
composition.
The integrated peak intensities for the elements are used to iteratively
calculate the compositions. These calculations in the various
correction
routines are easier to perform using the wt% values for concentrations.
I
suggest that you look at the Goldstein et al. book for SEM and
Microanalysis.

To calculate the at.% of Fe in FeO is easy. It is 1/(1+1) = 0.5 or 50
at.%.
For Fe2O3 it is 2/(2+3)= 0.4 or 40%.

To calculate the wt.%, you need to use the atomic weights of the
elements.

For Fe in FeO, you have 1*55.85/(1*55.85+1*16.00) = 0.777 or 77.7 wt.%.
For
Fe2O3 it is (2*55.85)/(2*55.85 + 3*16.00) = 0.699 or 69.9 wt.%.

Once the software finds the wt%, it uses a relatively simple algorithm
to
calulate the at.%.

You should check any introductory materials science book having a
chapter on
phase diagrams to see how it is done.

To answer your third question, they