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From: rcmoretz-at-gmail.com
Date: Sun, 2 Dec 2007 18:37:43 -0600
Subject: [Microscopy] Re: TEM: Visualizing 9 + 2 microtubules in sperm tails

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Brian:

A quick Google search came up with over 42K references. The relevant
ones are Tilney et al, J Cell Biol, vol 59, 1973 (or was that 1975?)
and Mizuhira and Futaeska (I don't have the complete reference). I
think the Tilney paper has the proportions, methods, etc. I didn't do
a PubMed search since the Google search gave me the basic info I
needed. Hope this helps.

Roger Moretz, Ph.D.
Retired but not dead yet

On Nov 30, 2007 5:47 PM, Roger Moretz {rcmoretz-at-gmail.com} wrote:
} Brian:
}
} I no longer have the references in front of me, but there is a long
} history of using tannic acid to enhance the preservation and
} visualization of microtubules. Do a Google search, or better yet,
} search PubMed. The references are there. Since it has been years
} since I did this, I don't remember percentages or times. I do
} remember buying a Mallinkrodt tannic acid as this is the only one that
} was recommended. Check Hayat or one of the other books as a
} reference.
}
} Roger Moretz, Ph.D.
} Retired but not dead yet
}
}
} On Nov 29, 2007 1:53 PM, {bharris-at-uoguelph.ca} wrote:
} }
} }
} }
} } ----------------------------------------------------------------------------
} } The Microscopy ListServer -- CoSponsor: The Microscopy Society of America
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} }
} } Hello: We have been asked to examine the structure of the
} } microtubules in sperm tails. Our efforts to date using the standard
} } fixations (Paraformaldehyde/glut, Osmium and UA), ethanol dehydrations
} } and LR White embedding have not been successful in revealing fine
} } structure. We look with increasing envy at the published shots and
} } wonder if anyone has a protocol we could try to get through this.
} } Thanks bob harris
} }
} } Guelph Regional Integrated Imaging Facility (GRIIF)
} } Transmission Electron Microscope Facility
} } Dept. of Molecular and Cell Biology
} } New Science Complex, 488 Gordon St.
} } University of Guelph
} } Guelph Ontario, Canada, N1G 2W1
} } Phone: 519-824-4120 X 56409
} } Fax: 519-837-1802
} }
} }
} }
} }
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==============================Original Headers==============================
4, 30 -- From rcmoretz-at-gmail.com Sun Dec 2 18:37:42 2007
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4, 30 -- To: bharris-at-uoguelph.ca, "Microscopy Listserv" {Microscopy-at-microscopy.com}
4, 30 -- Subject: Re: [Microscopy] TEM: Visualizing 9 + 2 microtubules in sperm tails
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From: schooley-at-mcn.org
Date: Mon, 3 Dec 2007 12:25:15 -0600
Subject: [Microscopy] education

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MSA's Project MICRO is a middle school outreach program. Its website
has a lot of information, including an extensive bibliography of
books, videos, DVDs & CDs, and websites. That list has just been
updated, and it's worth a visit, even if you don't do organized
"outreach". Go to http://www.microscopy.org/ProjectMICRO and try
"2007" as your search category, for example. You'll find that this
year saw the publication of the 4th revised printing of MICRO's
"Microscopic Explorations", an inexpensive 432 page atlas of
colorized SEM imasges, an outstanding history of microscopes, and a
FREE 36 page pamphlet about optics as a career (sponsored by the
Optical Society of America and the Girl Scouts of America), available
online as a pdf.

A new search category has been added this year: books in Spanish.
Forget about politics, and consider that teachers and volunteers who
want to teach science classes and workshops have a tough time when
the students include a lot of English learners. If you search the
list for "Spanish language", you'll find two excellent pairs of books
(one English, one Spanish, same text), and a bilingual Optical
Society of America "optics for kids" website.

No search is perfect; MICRO always welcomes information on in-print
publications that have been missed.

--
Caroline Schooley
Project MICRO Coordinator
Microscopy Society of America
Box 117, 45301 Caspar Point Road
Caspar, CA 95420
Phone/FAX (707)964-9460
Project MICRO: http://www.microscopy.org/ProjectMICRO

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From: heller-at-uni-hohenheim.de
Date: Mon, 3 Dec 2007 13:13:16 -0600
Subject: [Microscopy] preparation of wood for TEM

Contents Retrieved from Microscopy Listserver Archives
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Hi to all,

I tried to prepare wood (Fagus and Pinus)for transmission electron microscopy
by embedding in Epon and LR-White and got terrible problems in sectioning. The
blocks seemed ok, they were not soft. We got sections, but they immersed in the
trough and did not stretch. The result was aweful. I do not understand what
went
wrong, maybe, poor infiltration?
Is there anybody who has experience with wooden material?

Best regards,
Anne


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From: sbarlow-at-sunstroke.sdsu.edu
Date: Mon, 3 Dec 2007 13:19:31 -0600
Subject: [Microscopy] Balzers freeze fracture quartz monitor

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Hello All

I am resurrecting a Balzers 301 freeze fracture unit. The coating
and vacuum units seem to be working ok. I am having problems with my
QSG301 quartz monitor. Does anyone out there have an old system for
parts, specifically the transducer and replacement quartz crystals,
or schematics for it?

Look forward to hearing from someone in this regard.

Steve
--
Dr. Steven Barlow
EM Facility/Biology Dept.
San Diego State University
5500 Campanile Drive
San Diego CA 92182-4614
phone: (619) 594-4523
fax: (619) 594-5676

email: sbarlow-at-sunstroke.sdsu.edu
http://www.sci.sdsu.edu/emfacility

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From: Andrew.Bowling-at-ARS.USDA.GOV
Date: Mon, 3 Dec 2007 14:45:04 -0600
Subject: [Microscopy] preparation of wood for TEM

Contents Retrieved from Microscopy Listserver Archives
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Hello Anne,

Coincidentally, I just finished a study of tension wood in sweetgum. I did immunogold-silver and didn't take it the TEM, but the sections looked pretty good. Because we wanted optimal immunoreactivity, we used LR white (not epon). Here's what I did:

Using a chisel, a wafer of wood about 1x1 cm square (parallel to the surface of the trunk) and about 3-5 mm thick was removed from a living tree. The wafer was immediately immersed in water and split into "matchsticks", approximately 2-3mm per side, by inserting a razor ~1 mm into the top edge of the wafer and splitting it along the grain (not cutting). These "matchsticks" were then put into gluteraldehyde and, using a brand-new razor blade, cut into 1-2mm thick slices. So you have squares of wood, about the size of a TEM grid, about 1-2mm thick, with the long edge of the cells running top to bottom through the thinnest dimension. By splitting the wood (and not just cutting it), you are assured that the orientation of the tracheids are parallel to the long axis of the matchstick. So when you cut the matchsticks into wafers, the trachids are wide open to your solutions, thus facilitating the infiltration of the wood specimen. The rational here is that these cells were conducting water before you removed them from the tree, they should conduct alcohol and resin, too. The samples were fixed for 24 hours at room temp and then dehydrated in 25%, 50%, 75% (2 hours each) and absolute ethanol overnight. They were then infiltrated with LR white resin with increasing concentrations (25%, 50%, 75%, neat - 24 hours each step), also at room temperature. Specimens in neat resin were placed onto a shaking platform for 48 hours. Slices were placed into cylindrical polyethylene capsules and oriented with the faces of the wafers facing the bottom of the capsule and polymerized at 55º C for 2 hours. We cut mostly 0.55 micron sections.

Other notes: you'll want to be really slow with the block trimming - this resin-wood material is extremely tough. Take really thin slices with a new blade. These blocks are also really hard on the diamond knife.

I'll send you a picture to back up my protocol :)

Andy Bowling

p.s. My sweetgum samples didn't require this, but if your wood is really dry (i.e. it is full of air, won't sink in your solutions, etc.), you might have to vacuum it to get the air out and your solutions in. I'd vacuum the wafers - the air has the smallest distance to travel.

p.p.s. I got this "matchstick" technique from Clair et al, 2005: Precautions for the structural analysis of the gelatinous layer in tension wood. IAWA Journal 26: 189-195.


-----Original Message-----
X-from: heller-at-uni-hohenheim.de [mailto:heller-at-uni-hohenheim.de]
Sent: Monday, December 03, 2007 1:18 PM
To: Bowling, Andrew

Hi to all,

I tried to prepare wood (Fagus and Pinus)for transmission electron microscopy by embedding in Epon and LR-White and got terrible problems in sectioning. The blocks seemed ok, they were not soft. We got sections, but they immersed in the trough and did not stretch. The result was aweful. I do not understand what went wrong, maybe, poor infiltration?
Is there anybody who has experience with wooden material?

Best regards,
Anne


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From: contact-at-integrityscientific.com
Date: Mon, 3 Dec 2007 15:18:42 -0600
Subject: [Microscopy] Job posting - TEM

Contents Retrieved from Microscopy Listserver Archives
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Hi listers,

I'm posting this advert in my role as a researcher at the University of Cambridge, UK. Please send any replies to James Loudon or Paul Midgley, as described below.

Richard Beanland



Post-Doctoral Research Associate

IMAGING THE STRUCTURE AND DYNAMICS OF FLUX VORTICES IN HIGH TEMPERATURE SUPERCONDUCTORS

DEPARTMENT OF MATERIALS SCIENCE AND METALLURGY

Applications are invited for a postdoctoral research position, funded by the EPSRC, to investigate the structure and dynamics of flux vortices in high Tc superconductors, using low- temperature transmission electron microscopy (TEM). The successful applicant will work closely with Dr James Loudon and Prof Paul Midgley in the Electron Microscopy Group and will use Lorentz microscopy and electron holography to image individual vortices, vortex ordering and dynamics, and the control of flux vortices. The project will focus in particular on the behaviour of fluxons in confined mesoscale geometries in samples prepared using a Dual Beam workstation. The research will form part of ongoing collaborations with the Device Materials Group in the Department, and with groups at the Cavendish Laboratory and the University of Manchester.

Applicants should have (or be about to receive) a PhD and experience in transmission electron microscopy is essential. Knowledge of magnetic imaging and superconductivity would be an advantage. Post-doctoral appointments will be for up to 3 years and the salary will be at grade 7 on the university salary scale (currently £25,134 to £32,796). The post is available immediately.

Informal enquiries can be made to Dr James Loudon e-mail: j.c.loudon-at-gmail.com or Prof Paul Midgley, e-mail: pam33-at-cam.ac.uk

Applications should be emailed to j.c.loudon-at-gmail.com or sent by post to Dr J.C. Loudon, Department of Materials Science and Metallurgy, University of Cambridge, Pembroke Street, Cambridge, CB2 3QZ, UK, and should include a covering letter, CV, publication list, the names and addresses of two referees and a PD18 form with parts I and III completed (downloadable from http://www.admin.cam.ac.uk/offices/personnel/forms/pd18/).

Further details can be obtained from: http://www-hrem.msm.cam.ac.uk/vacancies/

Closing Date for applications: 31 December 2007



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From: johnf-at-geology.wisc.edu
Date: Mon, 3 Dec 2007 15:19:15 -0600
Subject: [Microscopy] EBSD Workshop May 2008 Madison WI

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

The Microbeam Analysis Society is organizing a
topical workshop on EBSD, May 20-21-22, 2008, at
the University of Wisconsin-Madison.

The first day will be an all day tutorial for
beginners, on the basics of EBSD techniques and
application. The instructors will be Andrew Deal
(General Electric Global Research Center) and
Joseph Michael (Sandia National Laboratories).
Specific topics to be addressed include: Forming,
collecting, and indexing EBSD patterns in the
SEM; Using EBSD to measure microtexture in
materials; Identification of crystalline phases
using EBSD and EDX; Application of EBSD to
Material Science and Geological problems. Later
in the afternoon there will be an "Ask the
experts" session, with experienced practitioners
of EBSD to answer questions about its practical
use: J.R. Michael, L.N. Brewer, S.I. Wright
(EDAX), S. Sitzman (Oxford), A. Deal.

The next two days of the workshop will consist of
invited and contributed talks, with general
categories including: In situ measurements in
EBSD; EBSD in three dimensions; Frontiers in EBSD
technique development; Materials Science and
Engineering applications; Geological applications.

Confirmed speakers and titles of their talks are:
David Prior, University of Liverpool - "The
beauty of triclinics: advantages and challenges
of EBSD studies of plagioclase feldspar";
Hans-Rudolf Wenk, University of California at
Berkeley - "EBSD for texture analysis:
Quantification, limitations and comparison with
other techniques";
Donna Whitney, University of Minnesota -
"Applications of EBSD to metamorphic petrology:
the tectonics of metamorphic crystallization";
Aimo Winkelmann, MPI für Mikrostrukturphysik -
"Recent Advances in Dynamical Simulations of
EBSD";
Gregory Rohrer, Carnegie Mellon University -
"Determining Five-Parameter Grain Boundary
Character Distributions From Orientation Mapping
in Three Dimensions";
David Rowenhurst, Naval Research Laboratory -
"Crystallographic and Morphological Analysis by
Combining EBSD and Serial Sectioning".

Thanks to support from NSF and others, there will
be a significant amount of funds for student
support.

There will be limited enrollment, so early
registration is urged. Online registration will
commence January 15 at www.microbeamanalysis.org

Contact John Fournelle for more information johnf-at-geology.wisc.edu

Sponsored by: MAS, NSF, EDAX-TSL, and Oxford-HKL,
with additional support from Hitachi-USA and
JEOL-USA.
--
========================================================
John Fournelle, Ph.D. office: (608) 262-7964 cell: (608) 438-7480
Cameron Electron Microprobe Lab lab: (608) 265-4798
Dept of Geology & Geophysics fax: (608) 262-0693
University of Wisconsin home: (608) 274-2245
1215 West Dayton St. email: johnf-at-geology.wisc.edu
Madison, WI 53706 amateur radio: WA3BTA
Personal http://www.geology.wisc.edu/~johnf/
Probe lab http://www.geology.wisc.edu/~johnf/sx51.html
Probe Sign Up Calender:
http://www.microscopy.wisc.edu/cgi-bin/calendar/microprobe/calendar.cgi

"The first rule of all intelligent tinkering is
to save every cog and wheel." -- Aldo Leopold

"For a successful technology, reality must take
precedence over public relations, for Nature
cannot be fooled." -- Richard P. Feynman


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From: mike.reedy-at-cellbio.duke.edu
Date: Mon, 3 Dec 2007 15:33:38 -0600
Subject: [Microscopy] Re: TEM: Visualizing 9 + 2 microtubules in sperm

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Brian-
TA fix is likely one very promising option, as Stephane and Brian
suggest; epoxy for detail, as David suggests. For
detergent-glycerol-demembranated muscle fibers, we have often used TA
as a primary fix as well, followed by UA or OsO4, with consistently
pleasing results --- works in aqueous physiological buffers, or in
acetone when doing freeze-substitution. At 0.2%, combined with 1-3%
glutaraldehyde, it can usually permeate single cells (thus, likely
spermatozoa) to enhance fixation quality and contrast as well. Don't
combine TA with PVP, TX-100, vanadate or PO4 (at greater than 10 mM);
it will form a complex, may precipitate, becomes unavailable for
fixation. However, a promising protocol is that of Maupin & Pollard
(1983; J Cell Biol 96:51-62) who combined Glut-TA with saponin to
help TA penetrate membranes, and introduced an important modification
of OsO4 post-fix procedure that we have used ever since whenever
using OsO4.

We don't recommend Epon because section staining with KMnO4 --}
Sato's lead for maximum contrast shows finest granularity in
Araldite. If using Epon, avoid NMA, use DDSA only if Mn-Pb stain is
to be tried.

Mallinckrodt #1764 seemed the best TA in the 1980s, after the
Simionescus in Palade's lab called attention to it in 1976 (J Cell
Biol 70:608 and 70:622). To us, its behavior seemed to become
inconsistent in the early 1990s, so we switched to the EMS products.
Currently, the #21700 low MW (FW 1000-1500) works well. I'd guess
the #21710 EM grade (FW 1701.28) probably works equally well for most
specimens-- it is the same MW spec as the Mallinckrodt 1764.

Usual disclaimers-- we have no connection wIth EMS except as satisfied users.

-mike reedy-

At 12:52 PM -0600 11/29/07, bharris-at-uoguelph.ca wrote:
} ----------------------------------------------------------------------------
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--
-mike reedy-

************************
Michael K. Reedy, M.D.
Duke Univ. Med. Center
Dept. Cell Biology, Box 3011 (for U.S. Mail)
458 Alex Sands Bldg, Research Dr (courier)
Durham, NC 27710

Office 919-668-2534
Lab 919-684-5674
Fax 919-681-9929
mike.reedy-at-cellbio.duke.edu
http://note.cellbio.duke.edu/Faculty/Research/Reedy.html

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10, 24 -- Subject: Re: [Microscopy] TEM: Visualizing 9 + 2 microtubules in sperm
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From: mbisher-at-princeton.edu
Date: Mon, 3 Dec 2007 18:46:35 -0600
Subject: [Microscopy] viaWWW: Job Opening Princeton

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Email: mbisher-at-princeton.edu
Name: Margaret Bisher

Organization: Princeton University

Title-Subject: [Filtered] Job Opening

Question: Specialist in the PRISM Imaging and Analysis Center at
Princeton University

Applications are invited from qualified candidates for a technical specialist
position in the Imaging and Analysis Center (www.princeton.edu/~iac), an
integral part of the Princeton Institute for the Science and Technology of
Materials, at Princeton University.

Note: The specialist level will be determined based on experience and
educational level.

Specific duties include:
ï Instruct and assist students and researchers in the operation of state-of-
the-art instruments for imaging (optical, electron and scanning probe
microscopes), and analysis (XRD, EDX, WDX)
ï Support centerís daily operation, responsible for maintenance of
microscopes, electronics, vacuum and chilling systems
ï Provide expertise in SEM and TEM sample preparation for both hard and
soft materials
ï Support the teaching programs and perform other tasks as required

Essential Qualifications:
ï Masterís degree in physical science and engineering and /or 5+ years
related work experience is required
ï Competent skills in sample preparation techniques, including ion milling,
ultramicrotome, staining, coating and polishing samples
ï Good knowledge on electron microprobe analysis is preferred
ï Excellent communication and interpersonal skills are essential

Start date is January 1, 2008 or as soon as possible.
Interested candidates should send application online at https://jobs.princeton.edu.
(requisition # 0700851)

Princeton University is an Equal Opportunity/Affirmative Action Employer. For
general application information and how to voluntarily self-identify, please link to

http://web.princeton.edu/sites/dof/ApplicantsInfo.htm




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From: llawres-at-mail.usf.edu
Date: Mon, 3 Dec 2007 18:47:30 -0600
Subject: [Microscopy] viaWWW: RJ Lee PSEM

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Email: llawres-at-mail.usf.edu
Name: Lauren Lawres

Organization: NNRC

Title-Subject: [Filtered] RJ Lee PSEM

Question: We have a 1993 Personal SEM v2.0 made by RJ Lee. We need a new motherboard for a 486 DX2 computer that runs Windows 3.1, in order to get the PSEM running. Does anyone know where we can find one?



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From: nancy-at-savvyhire.com
Date: Mon, 3 Dec 2007 18:47:51 -0600
Subject: [Microscopy] viaWWW: Job Opening: Application Scientist

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Email: nancy-at-savvyhire.com
Name: Nancy Stewart

Organization: Savvy Hire

Title-Subject: [Filtered] Job Opening: Application Scientist

Question: Title: Applications Scientist (Semiconductor metrology)

Location: West or Mid-West US

Job Status: Full-time, exempt

Position Summary: The Application Scientist is a critical role providing application support to customers utilizing SIMS and EPMA technology. This is a high visibility position requiring an advanced scientist with expertise in materials and x-ray techniques. Extensive travel will be necessary.

Responsibilities:
* Support existing applications for key customers
* Develop new applications (second stage)
* Teach customers Best Known Methods and techniques
* Prepare presentations for conference calls and
meetings
* Write reports to provide insights to sales and
technical staff
* Contribute to training materials and conduct customer
training sessions
* Attend conferences and trade shows

Required Qualifications:

* MS with 2 years of experience in Applied Physics,
Physical Chemistry or Materials Science Engineering
* Good organization skills
* Solid understanding of electron-beam, ion-beam and
x-ray beam interactions with matter
* Ability to learn new concepts and techniques quickly
* Strong analytical problem solving skills
* Excellent internal and external communication skills

Preferred Qualifications:

* Experience in the semiconductor fabrication industry
(clean room), or equivalent experience and education
* PhD preferred
* WDS and/or EDS knowledge
* Understanding of LEXES technique
* Previous trouble shooting experience
* Understanding of thin film processing

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From: mlibbee-at-gmail.com
Date: Mon, 3 Dec 2007 18:48:24 -0600
Subject: [Microscopy] viaWWW: SEM Imaging of CNT

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Email: mlibbee-at-gmail.com
Name: Marissa

Title-Subject: [Filtered] SEM Imaging of CNT

Question: Good Afternoon!

I need to know if CNT imaging (thickness measurement) can be performed without coating the sample with AuPd? If so, what are the parameters/conditions required of the microscope? I currently use a Hitachi 4700 SEM.

Also, does anyone suggest a specific amount for the AuPd coating on the CNT? Is there an advantage to breaking the wafer under LN2 temperature or coating the wafer prior to cleaving the area of interest?

Thank you for your time and continued support,
Marissa

Marissa

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From: gary-at-gaugler.com
Date: Mon, 3 Dec 2007 19:08:50 -0600
Subject: [Microscopy] Re: viaWWW: RJ Lee PSEM

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

That would be rare to find these days. Does the
board need many ISA slots? Does the PC have
SEM-specific plug in board?

In some computer stores, they have older MBs
laying around. I would suggest that you try
to locate an early Pentium board and CPU and
run Win98SE. Apps for 3.1 should work on
Win98SE.

gary g.


At 04:50 PM 12/3/2007, you wrote:




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From: beaurega-at-westol.com
Date: Mon, 3 Dec 2007 21:39:44 -0600
Subject: [Microscopy] Re: viaWWW: RJ Lee PSEM

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Hi,

The Personal SEM business was spun off to a company in Delmont, PA as Aspex
Corp. That is my understanding. I would contact them and I sent you a
personal email address of the best person I know to contact there. I am
sure he can help point you to the proper person if he can't help you.

HTH,

Paul

At 06:47 PM 12/3/07 -0600, you wrote:
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From: jacques.faerber-at-ipcms.u-strasbg.fr
Date: Tue, 4 Dec 2007 07:39:38 -0600
Subject: [Microscopy] Re: viaWWW: SEM Imaging of CNT

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Hi Marissa

We look very offen at CNT by SEM (with a Jeol6700F, an equivalent to the
S4700), and we never coat the samples. We have organised growth of CNT,
(carpet or lawn grass like), on Si coated with a 5-10 layer of SiO2 or
TiN (both insultor), and at low voltage (less than 3 keV) and short
working distance (less than 5 mm), it works well. The only limitation is
a little bit drift at high mag (more than x50000), when the insulator is
thicker.

I mount the sample most on a home made 45° or 60° pré-tilted holder, to
see them with some angle, without the need to use the stage tilt. It
allowed to have a tilted view at very short WD (45° or more at 1.5-2 mm).
The samples are in most cases not cleaved and only scratched with a
diamant tip, to make some "desorder" in the CNT coating. Depens on what
we want to see. If needed we cleved them at room temperature.

Observations are most made with the in lens detector. Sometimes we use a
higher beam energy to visualise the catalyser, inside the NTs.

One of my collegue observes sometimes CNT grown on ceramics, with
catalysts, and he use only carbon coating, and the same observation
conditions as me.

I would avoid to metallize the sample as far as possible, and play with
the primary energy, WD and detector.

Hope it helps

J. Faerber
IPCMS-GSI
(Institut de Physique et Chimie des Matériaux de Strasbourg
Groupe Surface et Interfaces)
23, rue de Loess ; BP43
67034 Strasbourg CEDEX 2
France

Tel 00 33(0)3 88 10 71 01
Fax 00 33(0)3 88 10 72 48
E-mail Jacques.Faerber-at-ipcms.u-strasbg.fr



mlibbee-at-gmail.com a écrit :
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} Email: mlibbee-at-gmail.com
} Name: Marissa
}
} Title-Subject: [Filtered] SEM Imaging of CNT
}
} Question: Good Afternoon!
}
} I need to know if CNT imaging (thickness measurement) can be performed without coating the sample with AuPd? If so, what are the parameters/conditions required of the microscope? I currently use a Hitachi 4700 SEM.
}
} Also, does anyone suggest a specific amount for the AuPd coating on the CNT? Is there an advantage to breaking the wafer under LN2 temperature or coating the wafer prior to cleaving the area of interest?
}
} Thank you for your time and continued support,
} Marissa
}
} Marissa
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From: dac-at-research.umass.edu
Date: Tue, 4 Dec 2007 09:07:14 -0600
Subject: [Microscopy] Re: Balzers freeze fracture quartz monitor

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Hi Steve,

We have a couple of these units, and I have all documentation if you
need a copy. We recently got crystals from Tangidyne
http://www.tangidyne.com/; very good pricing and excellent performance -
much less temperature effect on the "RC" (TAN05RCG) - email them -
they'll get you what you need. You probably just need new crystals if
the unit has been kicking around and dirty. The specs show the circuit
and how to test and adjust the driver, etc. Let me know.

Dale Callaham
Umass Amherst

sbarlow-at-sunstroke.sdsu.edu wrote:
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} Hello All
}
} I am resurrecting a Balzers 301 freeze fracture unit. The coating
} and vacuum units seem to be working ok. I am having problems with my
} QSG301 quartz monitor. Does anyone out there have an old system for
} parts, specifically the transducer and replacement quartz crystals,
} or schematics for it?
}
} Look forward to hearing from someone in this regard.
}
} Steve

==============================Original Headers==============================
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From: tivol-at-caltech.edu
Date: Tue, 4 Dec 2007 12:27:21 -0600
Subject: [Microscopy] Re: tabletop carbon evaporator

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


On Nov 27, 2007, at 8:37 AM, g-leser-at-northwestern.edu wrote:

} We find ourselves with some extra money and I would like to get a
} table top carbon evaporator. Do these exist? Can anyone make any
} recommendations? It would be used for the basics, namely carbon
} coating grids, preparing carbon films, and glow discharging grids.
} Any help, commercial and non, would be greatly appreciated.



On Nov 28, 2007, at 7:02 PM, dsherman-at-purdue.edu wrote:
} I was told that the best way to clean SEM aperture strips is with a
} plasma
} cleaner. Can any one suggest an inexpensive one...if there is such
} a thing.
}


Dear George and Debby,
We have been very happy with our Cressington 208 for carbon (or
metal) evaporation and with our Harrick plasma cleaner for cleaning
and glow discharging. The cost of the Harrick unit was ~$2500, and
we bought a mechanical vacuum pump to go with it for about the same
price.
Yours,
Bill Tivol, PhD
EM Scientist
Electron Cryo-Microscopy Facility
Broad Center, Mail Code 114-96
California Institute of Technology
Pasadena CA 91125
(626) 395-8833
tivol-at-caltech.edu


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From: pgan-at-ap.ansell.com
Date: Wed, 5 Dec 2007 08:16:30 -0600
Subject: [Microscopy] AskAMicroscopist: temperature of the electron beam

Contents Retrieved from Microscopy Listserver Archives
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Below is the result of your feedback form (NJZFM-ultra-55). It was submitted by (pgan-at-ap.ansell.com) from http://microscopy.com/Ask-A-Microscopist/Ask-A-Microscopist.html on Tuesday, December 4, 2007 at 03:22:23
---------------------------------------------------------------------------

Email: pgan-at-ap.ansell.com
Name: Phay Fang Gan

Organization: Ansell Shah Alam sdn Bhd

Education: Graduate College

Location: Shah Alam, Selangor, Malaysia

Question: Does anyone know the rough temperature of the electron beam when reaching the surface of the spcimen ?

Many thanks.

---------------------------------------------------------------------------

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From: walck-at-southbaytech.com
Date: Wed, 5 Dec 2007 12:15:24 -0600
Subject: [Microscopy] AskAMicroscopist: temperature of the electron beam

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

I'm thinking that the temperature of the electrons in a beam should be
determined from E=3/2 kT. Would there be more than 3 degrees of freedom in
an electron beam? I'm not sure if we should consider rotational freedoms or
not.

Now if you are asking about the temperature of the sample, that is another
question. It depends on the beam energy, current density, and materials
properties and dimensions, i.e. thickness.


-Scott

Scott D. Walck, Ph.D.
Technical Director
South Bay Technology, Inc.
1120 Via Callejon
San Clemente, CA 92673

US Toll Free: 1-800-728-2233
Tel: (949) 492-2600
Fax: (949) 492-1499

www.southbaytech.com
walck-at-southbaytech.com

-----Original Message-----
X-from: pgan-at-ap.ansell.com [mailto:pgan-at-ap.ansell.com]
Sent: Wednesday, December 05, 2007 6:22 AM
To: Walck-at-SouthBayTech.com

Below is the result of your feedback form (NJZFM-ultra-55). It was
submitted by (pgan-at-ap.ansell.com) from
http://microscopy.com/Ask-A-Microscopist/Ask-A-Microscopist.html on Tuesday,
December 4, 2007 at 03:22:23
---------------------------------------------------------------------------

Email: pgan-at-ap.ansell.com
Name: Phay Fang Gan

Organization: Ansell Shah Alam sdn Bhd

Education: Graduate College

Location: Shah Alam, Selangor, Malaysia

Question: Does anyone know the rough temperature of the electron beam when
reaching the surface of the spcimen ?

Many thanks.

---------------------------------------------------------------------------

==============================Original Headers==============================
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==============================Original Headers==============================
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From: mcgeejj-at-kapl.gov
Date: Wed, 5 Dec 2007 16:59:54 -0600
Subject: [Microscopy] Open Position - SEM microscopist for materials science applications

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Lockheed Martin- KAPL, Inc. has an open position for a materials
scientist/engineer/electron microscopist to provide SEM materials
testing/failure analysis support. A brief description of the job is given
below. NOTE: the position requires US Citizenship.

The complete job announcement (Req ID 60318BR) can be found at the Lockheed
Martin career web site (LockheedMartin.com).

Jim McGee
************************************
James J. McGee
Lockheed Martin, KAPL, Inc.
PO Box 1072
Schenectady, NY 12301-1072

Tel: 518-395-4612
email: mcgeejj-at-kapl.gov
************************************

OPEN POSITION - Lockheed Martin, KAPL, Inc., Schenectady, NY

Req ID 60318BR
Industry Job Title Materials Engineer
Standard Job Code/Title E1862:Materials Engrg
Required skills BS degree in the physical sciences (e.g., materials,
chemistry, geology, solid state physics) or engineering plus hands-on
training and/or experience utilizing scanning electron microscopy and X-ray
microanalysis for materials characterization, development or failure
analysis.
Desired skills MS or PhD degree in physical sciences, with 5 years or
more experience in scanning electron microscopy and microanalysis (energy
dispersive spectrometry, electron backscatter diffraction), and demonstrated
problem solving experience in areas of metallurgy, alloy
testing/development, solid inorganic materials, and/or ceramics. Experience
with other associated techniques, especially Focused Ion Beam (FIB) and
Transmission Electron Microscope (TEM) utilization and application. Previous
work with nuclear or radioactive materials, fractographic analysis,
corrosion, and/or mechanical metallurgy.
Specific Job Description Scanning electron microscopy (SEM)
characterization of materials to evaluate response of materials to
environmental testing and failure analysis of in-service components.
Microstructural and microchemical characterization utilizing field emission
SEM imaging, energy dispersive spectroscopy (EDS) and electron backscatter
diffraction (EBSD) techniques. Data and image processing, data assimilation,
and reporting of results. Individual would perform multidisciplinary
collaborative investigations and team-oriented problem solving with other
materials characterization specialists and materials scientists/engineers
integrating use of associated analytical techniques (EPMA, XRD, Auger, XPS,
TEM). Utilize skills in high resolution imaging, microchemical analysis, and
ability to evaluate and recommend best sample preparation and
characterization methodologies for problems.

The major duties will be use of advanced scanning electron microscopy
and associated analytical techniques to determine the microstructure and
microchemistry of metals, alloys, and ceramic materials. Ensure
instrumentation is operating in proper condition; measure structure and
composition of materials using SEM, EDS, WDS, EBSD, etc. Analyze and
interpret data and communicate results to customers and sponsoring groups by
oral and written reports. Serve as part of research teams to design
experiments that will elucidate structure-composition-property-processing
relationships. Stay current in microscopic and microanalytical techniques
and applications. Propose and implement new capabilities or characterization
tools.

Applicants selected will be subject to a Federal background
investigation and must meet eligibility requirements for access to
classified matter. US citizenship is required.


==============================Original Headers==============================
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From: bbandli-at-mvainc.com
Date: Thu, 6 Dec 2007 13:44:29 -0600
Subject: [Microscopy] Gladstone-Dale calculations

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Hi All,

I need to determine the average refractive index of a powder of an
organic compound. I would use light microscopy to do this, but the
particle size is very small and the material is slightly soluble in the
refractive index liquids I have access to. I'd like to check my
observations against a calculated value. So... is there anyone out
there who has used the Gladstone-Dale relationship (avg. refractive
index = 1 + specific refractive energy x density) to calculate the
refractive index of organic crystals? I would like to be able to
calculate an average refractive index of a material given it's
composition and density (both of which I can get). There is a
significant amount of work on minerals using this relationship, but I
haven't found many references on organics, particularly on specific
refractive energies of organic compounds. I'm sure there is someone out
there who knows more about this than myself.

Thanks in advance for your help!
Bryan Bandli

--
-----------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Bryan Bandli
Senior Research Scientist
MVA Scientific Consultants
3300 Breckinridge Blvd., Suite 400
(770) 662-8509
bbandli-at-mvainc.com
www.mvainc.com
-----------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
The information in this email is confidential and may be legally privileged.
It is intended solely for the addressee. If you are not the intended recipient, please delete the email and notify MVA Scientific Consultants of the transmission error.
MVA Scientific Consultants - 3300 Breckinridge Blvd. Suite 400, Duluth, GA 30096 - (770)662-8509
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------




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From: ph2-at-sprynet.com
Date: Thu, 6 Dec 2007 15:45:26 -0600
Subject: [Microscopy] Gladstone-Dale calculations

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Bryan


REGARDING:

I would use light microscopy to do this, but the
particle size is very small and the material is slightly soluble in the
refractive index liquids I have access to.

RESPONSE:

You could still use the light microscope with the following changes:

1. Use either

a) a Phase Contrast Microscope, 100x obj

(see Luster, Phase Contrast Microscope Technique for Refractive
Index Determination of Anisotropic Particles at Higher Magnification,
Microscope and Crystal Front, 13, 2, 363-373, 1963.)

Sub resol particles (average RI, possible to modify to get alpha and
gamma or alpha and omega)
"Becke line" actually light or dark contrast - very simple, very
easy to tell


b) Dispersion staining with a 40X obj as opposed o the standard 10x
(plot a chart using diff liquids and wavelengths).

Ted Clarke Published a short piece in Microscopy Today on Darkfield
dispersion.

2. Use alternative liquids:


Aequeous Soln:

Sodium Chloride 1.33-1.37
Potassium iodide 1.33-1.50
Potassium tetra-iodomercurate 1.50-1.72

Benedetti-Pilcher, ID of Materials has some other options on RI liquids.
Someone at MVA should have one, or tell Jim or Tim to get a copy.

Or

Look at Bloss, Crystallography and Crystal Chemistry, Min Soc Am. 443-445.
(I Believe Randy Boltin there has this). Gladstone-Dale relationship plus 3
other relationship are listed.

Also Lorentz-Lorenz Formula (See Viney, Transmitted Poloarised Light
Micrscopy)



Tony

......................................................................
Andrew Anthony "Tony" Havics, CHMM, CIH, PE
pH2, LLC
5250 E US 36, Suite 830
Avon, IN 46123
(317) 718-7020 off
(317) 718-7038 fax
(317) 409-3238 cell

90% of Risk Management is knowing where to place the decimal point...any
consultant can give you the other 10%(SM)

This message is from pH2. This message and any attachments may contain
legally privileged or confidential information, and are intended only for
the individual or entity identified above as the addressee. If you are not
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distributed without this statement.


-----Original Message-----
X-from: bbandli-at-mvainc.com [mailto:bbandli-at-mvainc.com]
Sent: Thursday, December 06, 2007 2:56 PM
To: ph2-at-sprynet.com

Hi All,

I need to determine the average refractive index of a powder of an
organic compound. I would use light microscopy to do this, but the
particle size is very small and the material is slightly soluble in the
refractive index liquids I have access to. I'd like to check my
observations against a calculated value. So... is there anyone out
there who has used the Gladstone-Dale relationship (avg. refractive
index = 1 + specific refractive energy x density) to calculate the
refractive index of organic crystals? I would like to be able to
calculate an average refractive index of a material given it's
composition and density (both of which I can get). There is a
significant amount of work on minerals using this relationship, but I
haven't found many references on organics, particularly on specific
refractive energies of organic compounds. I'm sure there is someone out
there who knows more about this than myself.

Thanks in advance for your help!
Bryan Bandli

--
----------------------------------------------------------------------------
----------------------------------------------------------------------------
---------------------------------------------------------
Bryan Bandli
Senior Research Scientist
MVA Scientific Consultants
3300 Breckinridge Blvd., Suite 400
(770) 662-8509
bbandli-at-mvainc.com
www.mvainc.com
----------------------------------------------------------------------------
----------------------------------------------------------------------------
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It is intended solely for the addressee. If you are not the intended
recipient, please delete the email and notify MVA Scientific Consultants of
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From: bctorres-at-seton.org
Date: Thu, 6 Dec 2007 23:45:32 -0600
Subject: [Microscopy] AskAMicroscopist: deing arms

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This Question was submitted to Ask-A-Microscopist by (bctorres-at-seton.org.)
from
http://www.microscopy.org/Ask-A-Microscopist/Ask-A-Microscopist.html
on Thursday, December 6, 2007 at 13:03:26
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Email: bctorres-at-seton.org.
Name: belinda torres

Organization: dell children's hospital

Education: Undergraduate College

Location: City, State, Country

Title: cilliary bx

Question: I need a procedure that yeilds a good representation of
the deing arms. can you help me

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From: smiller-at-umr.edu
Date: Thu, 6 Dec 2007 23:46:43 -0600
Subject: [Microscopy] viaWWW: Job Opening: Senior Research Scientist

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Email: smiller-at-umr.edu
Name: Scott Miller

Organization: University of Missouri-Rolla

Title-Subject: [Filtered] Job Opening: Senior Research Scientist

Question: The Graduate Center for Materials
Research at the University of Missouri-Rolla
(UMR), to be known as Missouri University of
Science and Technology (Missouri S&T) effective
Jan 1, 2008, is seeking applicants for a
non-academic, full time Senior Research Scientist
to operate, manage, support, and conduct research
in the area of analytical electron microscopy of
materials, in particular focused ion beam (FIB)
and transmission electron microscopy (TEM). The
center has recently acquired a Helios 600 Nanolab
FIB with a 12 quadrant STEM detector and ìAuto
Slice and Viewî and ìAutoTEMî software routines.

The person in this position will work not only
with UMR faculty, staff, and students but also
local, state, and regional academic and
non-academic institutions to generate, analyze,
and publish research findings.
The successful candidate will be expected to
promote collaborations and support efforts to
obtain external funding. This position reports to
the Director of the center.

Qualifications will include a Masterís Degree
(PhD is preferred) in materials (i.e.,
metallurgy, ceramics, materials science) or the
physical sciences (i.e., physics, chemistry) with
at least five years academic or industrial
experience in electron microscopy and a
publication record in peer reviewed journals.
Preference will be given to candidates with
experience operating a dual-beam FIB system.

Compensation will be commensurate with qualifications and experience.

Interested candidates should apply online at
hr.umr.edu/applicantinfo/index.html



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From: wcrgs-at-aol.com
Date: Fri, 7 Dec 2007 09:25:26 -0600
Subject: [Microscopy] viaWWW: LM detection of NaOH and H2O2 on Wood Cross Section

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Email: wcrgs-at-aol.com
Name: R. Obie

Organization: WCRG

Title-Subject: [Filtered] LM detection of NaOH and H2O2 on Wood Cross Section

Question: We are experimenting with placing NaOH onto the surface of
wood followed by H2O2. Does anyone know of a LM staining protocol
that would allow the detection of NaOH such that we could look at the
wood sample in cross section to see how far the NaOH has penetrated,
either as NaOH or pH? What about the detection of H2O2 in the same
scenario? (We have been considering Ti(IV) for this latter
objective.) Any comments/insights would be very much appreciated.

Thank you.
R. Obie

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From: whittaks-at-si.edu
Date: Fri, 7 Dec 2007 09:26:01 -0600
Subject: [Microscopy] viaWWW: TEM usage in the DC area

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Email: whittaks-at-si.edu
Name: Scott Whittaker

Organization: Smithsonian Institution

Title-Subject: [Filtered] TEM usage in the DC area

Question: A handful of researchers here have asked if I would include
a TEM lab in my space planning and include it as a service to the
units. I am on the fence as to whether there will be enough use to
justify, but have a year before a decision needs to be made. Are
there any biologic labs in the DC area interested in providing
sectioning and scope time on a fee basis? I/we will take care of the
embedding/prep, but I have neither a functioning microtome nor the
instrument itself.


Thanks,

Scott Whittaker
Head NMNH Imaging
Manager SEM Lab
Smithsonian Institution
National Museum of Natural History
PO Box 37012 MRC104
Washington DC 20013-7012
202-633-0891

whittaks-at-si.edu





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From: m_jarnik-at-fccc.edu
Date: Fri, 7 Dec 2007 19:57:56 -0600
Subject: [Microscopy] viaWWW: Philips TEM420 donation

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Email: m_jarnik-at-fccc.edu
Name: Michal Jarnik

Organization: Fox Chase Cancer Center

Title-Subject: [Filtered] Philips TEM420 donation

Question: We have an old TEM 420 we would like to donate. The
instrument was under service contract until about 2 years ago and
should be functional or need just a bit of care. The system is
equipped with EDAX and STEM units. Located in North Philadelphia, PA.
The accepting party is responsible for dismounting and shipping
charges. We need to remove this instrument soon as we need the space.

If interested or have questions, please contact me off list.

Michal Jarnik

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From: gary-at-perfendo.com
Date: Fri, 7 Dec 2007 20:18:21 -0600
Subject: [Microscopy] Re: viaWWW: Philips TEM420 donation

Contents Retrieved from Microscopy Listserver Archives
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} I am looking for a Philps 201, working or not.
reply to gary-at-perfendo.com
thanks,
gbc
Gary B. Carr
Pacific Endodontic Research Foundation

} Organization: Fox Chase Cancer Center
}
} Title-Subject: [Filtered] Philips TEM420 donation
}
} Question: We have an old TEM 420 we would like to donate. The
} instrument was under service contract until about 2 years ago and
} should be functional or need just a bit of care. The system is
} equipped with EDAX and STEM units. Located in North Philadelphia, PA.
} The accepting party is responsible for dismounting and shipping
} charges. We need to remove this instrument soon as we need the space.
}
} If interested or have questions, please contact me off list.
}
} Michal Jarnik
}
} Login Host: 131.249.80.207
} ---------------------------------------------------------------------------
}
}
} ==============================Original
} Headers==============================
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From: qxing-at-ameslab.gov
Date: Sat, 8 Dec 2007 09:24:05 -0600
Subject: [Microscopy] viaWWW: Safety of 20% perchoric in methanol

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Email: qxing-at-ameslab.gov
Name: Qingfeng Xing

Organization: Ames Lab

Title-Subject: [Filtered] Safety of 20% perchoric in methanol

Question: Does anyone know whether it is safe to store the mixture of
20% perchloric acid and 80% methanol at room temperature?

Thanks
Qingfeng

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From: bctorres-at-seton.org
Date: Sat, 8 Dec 2007 18:24:36 -0600
Subject: [Microscopy] AskAMicroscopist: procedure for deing arms

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This Question was submitted to Ask-A-Microscopist by (bctorres-at-seton.org.)
from http://www.microscopy.org/Ask-A-Microscopist/Ask-A-Microscopist.html on Thursday, December 6, 2007 at 13:03:26
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Email: bctorres-at-seton.org.
Name: belinda torres

Organization: dell children's hospital

Education: Undergraduate College

Location: City, State, Country

Title: cilliary bx

Question: I need a procedure that yeilds a good representation of the deing arms. can you help me

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From: tina-at-pbrc.hawaii.edu
Date: Sat, 8 Dec 2007 19:20:44 -0600
Subject: [Microscopy] Re: AskAMicroscopist: procedure for deing arms

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Do you by any chance mean DYNEIN ARMS?

Tina

} Email: bctorres-at-seton.org.
} Name: belinda torres
}
} Organization: dell children's hospital
}
} Education: Undergraduate College
}
} Location: City, State, Country
}
} Title: cilliary bx
}
} Question: I need a procedure that yeilds a good representation of the deing arms. can you help me
}
} ---------------------------------------------------------------------------
}
} ==============================Original Headers==============================
} 8, 11 -- From zaluzec-at-ultra5.microscopy.com Sat Dec 8 18:24:34 2007
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} 8, 11 -- From: bctorres-at-seton.org (by way of Ask-A-Microscopist)
} 8, 11 -- Subject: AskAMicroscopist: procedure for deing arms
} 8, 11 -- Content-Type: text/plain; charset="us-ascii"
} ==============================End of - Headers==============================
}

****************************************************************************
* Tina (Weatherby) Carvalho * tina-at-pbrc.hawaii.edu *
* Biological Electron Microscope Facility * (808) 956-6251 *
* University of Hawaii at Manoa * http://www.pbrc.hawaii.edu/bemf*
****************************************************************************


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From: sekkio-at-mac.com
Date: Sun, 9 Dec 2007 14:39:55 -0600
Subject: [Microscopy] alby ERICE 2008

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Dear friends
immediately after the FOM 2008 in Japan, please fly to Erice, Sicily
for a GREAT School (download poster at www.lambs.it).
---- FIRST ANNOUNCEMENT - School will be restricted to 70 students
-------
----- INFO: diaspro-at-fisica.unige.it --- SUBJECT: ERICE 2008 - CONFOCAL
------

INTERNATIONAL SCHOOL OF BIOPHYSICS «ANTONIO BORSELLINO» 36th Course:
MULTIDIMENSIONAL OPTICAL FLUORESCENCE MICROSCOPY TOWARDS NANOSCOPY
ERICE–SICILY: 19 – 29 APRIL 2008
Sponsored by the: • Italian Ministry of Education, University and
Scientific Research • Sicilian Regional Government, Companies.

LECTURERS
Fluorescence Spectroscopy, GFP Photophysics
• R. BIZZARRI, NEST-INFM, SNS, Pisa, IT; Optics, Confocal
Microscopy, THG • F. BRAKENHOFF, University of Amsterdam, NL;
FRAP, Single particle tracking • K. BRAECKMANS, Ghent University,
BE; Single molecule force spectroscopy • J. BRUJIC, New York
University, USA; Fluctuation Microscopies for biological tissues
GIUSEPPE CHIRICO, University of Milan-Bicocca, IT; Micro-particle
manipulation • D. COJOC, TASC, INFM, Trieste, IT; SHG, CARS, 2PE
• C. COMBS, NIH, Bethesda, USA; 2PE, 3D imaging • A.
DIASPRO, University of Genoa, IT; Micro/Nano Optical Manipulation
• E. Di FABRIZIO, Unversity of Catanzaro Magna Graecia, IT;
Raster Image Correlation Spectroscopy, Photon Counting • M.
DIGMAN, UC Irvine, USA; High-content screening • M. FARETTA, IFOM-
IEO, Milan, IT; Correlative Microscopy • U. FASCIO, University
of Milan, IT; Fluorescence Lifetime, FRET • H.C. GERRITSEN,
Utrecht University, NL; FCS, Global Data Analysis
• E. GRATTON, UC Irvine, USA; Photonic crystals, nanophotonics
• M. GU, Swinburne Univ. of Technology, Victoria, AU; Time lapse
imaging • S. GUIDO, Universit of Naples, IT; Fluorescence
Optical Nanoscopy • S. HELL, MPI, Goettingen, DE; Scanning
Microscopy, Optical aberrations • M. MARTINEZ CORRAL, Univ. of
Valencia, ES; Optical systems, Scanning Microscopy • F. QUERCIOLI,
CNR-ISC, Florence, IT; 2PE, Fast scanning methods • P. SAGGAU,
Baylor College of Med. Houston, Texas, USA; Correlative Microscopy at
cryo-Temperatures • A. SARTORI, Institut Pasteur, Paris, FR;
Light Scattering, FCS applications • P.L. SAN BIAGIO, CNR-IBF,
Palermo, IT; Molecular landscapes by means of AFM • G. SCOLES,
Princeton University, USA; Linear and Non linear Optical Microscopy
• C. SHEPPARD, Ntl Univ. of Singapore, Singapore; Optical
Microscopy, 3D imaging, Photonic Forces • E. STELZER, EMBL,
Heidelberg, DE; Laser scissors and tweezers in cell biology • I.
TOLIC-NORRELYKKE, MPI, Dresden, DE; Fluorescence imaging in
Neuroscience • V. TORRE, SISSA, Trieste, IT; Quantitative
colocalization • C. USAI, CNR-IBF, Genoa, IT; Confocal
Microscopy, Structured light methods • T. WILSON, University of
Oxford, UK; Photoswitch-activatable fluorescent proteins, Lifetime
• F. WOUTERS, Univ. of Goettingen, DE.
--------


---
----------------------------------------------------
"Follow knowledge wherever it leads us." (reading Galileo Galilei)
-----------------------------------------------------
Alberto Diaspro, EBSA President-Elect, MicroScoBIO LAMBS-IFOM,
Department of Physics, University of Genoa, Via Dodecaneso 33, 16146
Genoa, Italy - fax +39-010314218 - tel +39 0103536426/309; URLs: www.lambs.it
;
EBSA is Biophysics in Europe - European Biophysical Societies'
Association www.ebsa.org
----------------------------------------------






==============================Original Headers==============================
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From: Rob.Bowen-at-caddock.com
Date: Mon, 10 Dec 2007 09:39:48 -0600
Subject: [Microscopy] Re: viaWWW: Safety of 20% perchoric in methanol

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Qingfeng,
It seems questionable. Try checking with GFS Chemicals,
www.gfschemicals.com . They manufacture perchlorates and have a lot of
safety info available.

Rob Bowen


} From: {qxing-at-ameslab.gov}
} Reply-To: {qxing-at-ameslab.gov}
} Date: Sat, 8 Dec 2007 09:27:55 -0600
} To: {rob.bowen-at-caddock.com}
} Subject: [Microscopy] viaWWW: Safety of 20% perchoric in methanol
}
}
}
}
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} Email: qxing-at-ameslab.gov
} Name: Qingfeng Xing
}
} Organization: Ames Lab
}
} Title-Subject: [Filtered] Safety of 20% perchoric in methanol
}
} Question: Does anyone know whether it is safe to store the mixture of
} 20% perchloric acid and 80% methanol at room temperature?
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} Thanks
} Qingfeng
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==============================Original Headers==============================
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From: jmkrupp-at-ucsc.edu
Date: Mon, 10 Dec 2007 13:42:24 -0600
Subject: [Microscopy] Hitachi feedback plug

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Hi

I am having a problem connecting a 3rd party image acquisition system
to our 'new' Hitachi S-2700 SEM.

Long story short, is that we got this scope just as it was about to
be tipped into the dumpster. A company was 'consolidating' operations
(ie. moving offshore) and had to get out of their leased building
ASAP. I grabbed the scope and it is now running well.

Trouble is that the scope was supposed to have a feedback plug on the
external scan connection, and it wasn't there. Second trouble is that
the scope is not supposed to work without the plug, but it does.
Third problem is that when I connect our image acquisition system to
the external scan outlet, it does not act the way it should and we
cannot collect images.

I didn't think the scope had been modified, no x-ray or any other
accessories to suggest anything like that. The only hint of something
different was a VCR in the same room as the scope, but I don't know
if it was part of the system. So the mystery is what is going on.
Anyone got a clue about where to start looking? I have contacted
Hitachi hoping they might have some old sales or service records.
Something is up with the external scan controls, but I don't know
what.

Jon
--

Jonathan Krupp
Microscopy & Imaging Lab
C230 Earth & Marine Science
University of California
Santa Cruz, CA 95064
(831) 459-2477
jmkrupp-at-ucsc.edu

I rode in AIDS/Lifecycle 6 SF to LA June 3 - 9, 2007 to raise money
for the San Francisco AIDS Foundation. Visit
http://www.aidslifecycle.org for more information about the ride.

==============================Original Headers==============================
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From: sekkio-at-mac.com
Date: Mon, 10 Dec 2007 14:26:58 -0600
Subject: [Microscopy] LM - Confocal Opinions

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

About multiple fluorescence we got excellent results using a white
light laser coupled to the SP5AOBS
I think WLL is really a great advance in spectral imaging icluding
related applications
ciao
Alby
Il giorno 20/nov/07, alle ore 15:42, nizets2-at-yahoo.com ha scritto:

}
}
}
} ----------------------------------------------------------------------------
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} America
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} ----------------------------------------------------------------------------
}
} Hi!
}
} I have used the previous Zeiss 510 microscope and liked it very
} much. It is user-friendly and powerful.
} I don't know the technical details of the Leica but in the Zeiss the
} different wavelengthes are separated not only by filters but also in
} time, so no read-through is possible. I must say this gives a
} welcome level of confidence and comfort. I did a lot of triple
} staining with great results.
}
} No interest blabla....
}
} Regards,
} Stephane
}
}
} ----- Original Message ----
} X-from: "christopher.hayden-at-novartis.com" {christopher.hayden-at-novartis.com
} }
} To: nizets2-at-yahoo.com
} Sent: Monday, November 19, 2007 7:28:16 PM
} Subject: [Microscopy] LM - Confocal Opinions
}
}
}
}
} ----------------------------------------------------------------------------
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}
} Good Day, All:
}
} We're in the fortunate position of looking around at
} acquiring a
} confocal microscope sometime in 2008. Before we start hearing the
} pitches
} from the manufacturers, we'd like to hear from the "real" world.
} Specifically, what you have and what you think of it (ease-of-use,
} upgrades, level of control, service and support, etc.).
} After having a look around, it seems like the two contenders
} for
} us are the Zeiss 510 META NLO and the Leica TCS SP5. Flexibility is
} key
} for us, as it's going to have a fairly broad set of uses as both a
} research tool and as a development tool.
} Cost isn't critical at this point; we're basically being told
} to
} "get what we need". While we have people with confocal experience,
} each is
}
} a little biased that the system they know is the best one.
}
} Thanks much!
} -Chris
}
}
}
} ==============================Original
} Headers==============================
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}
}
}
} ____________________________________________________________________________________
} Be a better pen pal.
} Text or chat with friends inside Yahoo! Mail. See how. http://overview.mail.yahoo.com/
}
} ==============================Original
} Headers==============================
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} 19, 20 -- Date: Tue, 20 Nov 2007 06:39:38 -0800 (PST)
} 19, 20 -- From: Stephane Nizet {nizets2-at-yahoo.com}
} 19, 20 -- Subject: Re: [Microscopy] LM - Confocal Opinions
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} ==============================End of -
} Headers==============================
}

----------------------------------------------------
"Follow knowledge wherever it leads us." (reading Galileo Galilei)
-----------------------------------------------------
Alberto Diaspro, EBSA President-Elect, MicroScoBIO LAMBS-IFOM,
Department of Physics, University of Genoa, Via Dodecaneso 33, 16146
Genoa, Italy - fax +39-010314218 - tel +39 0103536426/309; URLs: www.lambs.it
;
EBSA is Biophysics in Europe - European Biophysical Societies'
Association www.ebsa.org
----------------------------------------------





==============================Original Headers==============================
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From: PhillipsT-at-missouri.edu
Date: Mon, 10 Dec 2007 14:55:07 -0600
Subject: [Microscopy] LM - Confocal Opinions

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

I own a Zeiss 510 Meta NLO and am afraid I don't understand Stephane's
comment that the Zeiss separates the signal based on time. Perhaps she
means that the system can, in real-time, separate out overlapping
emission signals using spectral imaging. If not, perhaps she could
expand on her comment.

Thomas E. Phillips, Ph.D
Professor of Biological Sciences
Director, Molecular Cytology Core
2 Tucker Hall
University of Missouri
Columbia, MO 65211-7400
573-882-4712 (office)
573-882-0123 (fax)
phillipst-at-missouri.edu

http://www.biology.missouri.edu/faculty/phillips.html
http://www.biotech.missouri.edu/mcc/

-----Original Message-----
X-from: sekkio-at-mac.com [mailto:sekkio-at-mac.com]
Sent: Monday, December 10, 2007 2:28 PM
To: Phillips, Thomas E.

About multiple fluorescence we got excellent results using a white
light laser coupled to the SP5AOBS
I think WLL is really a great advance in spectral imaging icluding
related applications
ciao
Alby
Il giorno 20/nov/07, alle ore 15:42, nizets2-at-yahoo.com ha scritto:

}
}
}
}
------------------------------------------------------------------------
----
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} America
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------------------------------------------------------------------------
----
}
} Hi!
}
} I have used the previous Zeiss 510 microscope and liked it very
} much. It is user-friendly and powerful.
} I don't know the technical details of the Leica but in the Zeiss the
} different wavelengthes are separated not only by filters but also in
} time, so no read-through is possible. I must say this gives a
} welcome level of confidence and comfort. I did a lot of triple
} staining with great results.
}
} No interest blabla....
}
} Regards,
} Stephane
}
}
} ----- Original Message ----
} X-from: "christopher.hayden-at-novartis.com"
{christopher.hayden-at-novartis.com
} }
} To: nizets2-at-yahoo.com
} Sent: Monday, November 19, 2007 7:28:16 PM
} Subject: [Microscopy] LM - Confocal Opinions
}
}
}
}
}
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}
} Good Day, All:
}
} We're in the fortunate position of looking around at
} acquiring a
} confocal microscope sometime in 2008. Before we start hearing the
} pitches
} from the manufacturers, we'd like to hear from the "real" world.
} Specifically, what you have and what you think of it (ease-of-use,
} upgrades, level of control, service and support, etc.).
} After having a look around, it seems like the two contenders
} for
} us are the Zeiss 510 META NLO and the Leica TCS SP5. Flexibility is
} key
} for us, as it's going to have a fairly broad set of uses as both a
} research tool and as a development tool.
} Cost isn't critical at this point; we're basically being told
} to
} "get what we need". While we have people with confocal experience,
} each is
}
} a little biased that the system they know is the best one.
}
} Thanks much!
} -Chris
}
}
}
} ==============================Original
} Headers==============================
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________________________________________________________________________
____________
} Be a better pen pal.
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} ==============================Original
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}

----------------------------------------------------
"Follow knowledge wherever it leads us." (reading Galileo Galilei)
-----------------------------------------------------
Alberto Diaspro, EBSA President-Elect, MicroScoBIO LAMBS-IFOM,
Department of Physics, University of Genoa, Via Dodecaneso 33, 16146
Genoa, Italy - fax +39-010314218 - tel +39 0103536426/309; URLs:
www.lambs.it
;
EBSA is Biophysics in Europe - European Biophysical Societies'
Association www.ebsa.org
----------------------------------------------





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17, 26 -- From PhillipsT-at-missouri.edu Mon Dec 10 14:55:06 2007
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From: Sven.Terclavers-at-med.kuleuven.be
Date: Mon, 10 Dec 2007 15:57:31 -0600
Subject: [Microscopy] LM - Confocal Opinions

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

As a user of both a Leica and Zeiss system, in terms of user-friendly
software, I'm most happy with the Zeiss LSM510 I'm working with.

In our lab we have a more basic Zeiss LSM510 and a Zeiss LSM510 META
NLO. The Leica I'm working with is based in another lab; so though I'm
more familiar with the Zeiss-thing, I can speak a little for the
Leica-confocal microscope too I believe.

On a regular base, let's say about twice, three times a year, I give
up to 10-15 new users a training on the basic confocal system (LSM510)
which takes about 45-60 minutes. During the first weeks after this
training, I attend their first use and help them for 15 minutes where
necessary. Merely, this is just to remind them how to best adjust the
detector/amplifier gains and amplifier offset and where the buttons
for creating a z-stack went to. On average, new users are acquainted
with the system in a very short period.

The new ZEN-software in my opinion, installed on the Zeiss LSM510 META
NLO, is not only a step closer to user-friendly software, it's a giant
leap. Amazing how fast you find what you need, you hide what you don't
need but want to keep available and how you browse through all
possible settings in a very organized way. On top of that, all on a
background that doesn't blind you (soft gray versus the old & hard
white).

Concerning the Leica-software, I do like somehow the block-setup (step
by step), though it increases the amount of clicking and browsing
around to set up all, adjust & scan, and it shows quite confusing. I
prefer not to speak about the quality of the images: this system
already has some quite old setup, so it's not really comparable.

I do believe in one thing: take your samples and pass by labs where
they have or a Leica or (and/or) a Zeiss, and have a look at your own
samples, this'll show you what's the best system for you. If possible,
also take someone who doesn't know the systems and have him/her
trained during one hour. It's not too long, and this'll show you
afterwards which system is most user-friendly.

And also here: no commercial interest, my statements are purely based
on experience.

Greetings,

Sven Terclavers

} }
} } Good Day, All:
} }
} } We're in the fortunate position of looking around at
} } acquiring a
} } confocal microscope sometime in 2008. Before we start hearing the
} } pitches
} } from the manufacturers, we'd like to hear from the "real" world.
} } Specifically, what you have and what you think of it (ease-of-use,
} } upgrades, level of control, service and support, etc.).
} } After having a look around, it seems like the two contenders
} } for
} } us are the Zeiss 510 META NLO and the Leica TCS SP5. Flexibility is
} } key
} } for us, as it's going to have a fairly broad set of uses as both a
} } research tool and as a development tool.
} } Cost isn't critical at this point; we're basically being told
} } to
} } "get what we need". While we have people with confocal experience,
} } each is
} }
} } a little biased that the system they know is the best one.
} }
} } Thanks much!
} } -Chris
} }
} }
} }
} } ==============================Original
} } Headers==============================
} } 5, 29 -- From christopher.hayden-at-novartis.com Mon Nov 19 12:23:16 2007
} } 5, 29 -- Received: from mail194.messagelabs.com
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} } 5, 29 -- Subject: LM - Confocal Opinions
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} } }
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} }
} }
} }
} }
} ________________________________________________________________________
} ____________
} } Be a better pen pal.
} } Text or chat with friends inside Yahoo! Mail. See how.
} http://overview.mail.yahoo.com/
} }
} } ==============================Original
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} } 19, 20 -- From: Stephane Nizet {nizets2-at-yahoo.com}
} } 19, 20 -- Subject: Re: [Microscopy] LM - Confocal Opinions
} } 19, 20 -- To: christopher.hayden-at-novartis.com
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} }
}
} ----------------------------------------------------
} "Follow knowledge wherever it leads us." (reading Galileo Galilei)
} -----------------------------------------------------
} Alberto Diaspro, EBSA President-Elect, MicroScoBIO LAMBS-IFOM,
} Department of Physics, University of Genoa, Via Dodecaneso 33, 16146
} Genoa, Italy - fax +39-010314218 - tel +39 0103536426/309; URLs:
} www.lambs.it
} ;
} EBSA is Biophysics in Europe - European Biophysical Societies'
} Association www.ebsa.org
} ----------------------------------------------
}
}
}
}
}
} ==============================Original
} Headers==============================
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From: gerard.cox-at-goodrich.com
Date: Mon, 10 Dec 2007 18:49:08 -0600
Subject: [Microscopy] viaWWW: Image Pro Plus Macros

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Email: gerard.cox-at-goodrich.com
Name: Gerard Cox

Title-Subject: [Filtered] Image Pro Plus Macros

Question: Hello all,

We recently got an upgrade to our Image Pro Plus software to the 6.2 level. I asked the sales rep about determining grain size per ASTM standards from metallographic mounts, and he said it could be done with one or more macros. I know that there are commercial options for this, but if I could do it without more cost that would be better. Over my few months on this server I have noticed that most of the replies seem to be more focussed on the biological end of things, but hopefully there are a few metallurgists out there who can help me out. I think that the line intercept procedure would be easier to implement than the circle intercept, but I don't know how to program it. Any guidance or assistance would be greatly appreciated.

Thanks,

Gerard Cox

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From: eikonika-at-otenet.gr
Date: Tue, 11 Dec 2007 08:14:51 -0600
Subject: [Microscopy] Jeol JSM5600 Low Vacuum installation software urgently needed

Contents Retrieved from Microscopy Listserver Archives
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Dear Colleagues
I have a small home based microscopy laboratory in Athens, Greece and own an
SEM microscope Jeol JSM5600 Low Vacuum bought second hand from USA.

Unfortunately the installation CD, marked as version 2.05, has been damaged
and I cannot reinstall the software.

If anyone has the same JEOL model with CD install disk version 2.05, please
contact me directly.
Best regards
yorgos

Dr Yorgos Nikas
Athens Innovative Microscopy
Skra 36 Voula 16673 GREECE
eikonika-at-otenet.gr
Tel/fax +30 210 8957677
Mobile +30 6945 107477


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From: P.D.Scott-at-warwick.ac.uk
Date: Tue, 11 Dec 2007 08:38:08 -0600
Subject: [Microscopy] TEM - using latex particlesto quantify influenza virus

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Dear All,
I am going to try to use TEM with negative staining to quantify a
preparation of influenza virus using polystyrene latex particles (112um)
and was wondering if there were any special considerations to take into
account? I know that I need to sonicate the particles before use to
prevent clumps forming, but was not sure whether it was simply a case of
mixing them with the virus at an approximate particle:virus particle
ratio of 1:1 and then adding to a carbon coated grid followed by
negative staining? Also, how many fields of view or latex particles
would be a good number to count to give me some confidence in the
numbers seen, representing the whole sample? Email address is below.
Thanks for any help.
Paul


Dr Paul Scott
Research Fellow
Pneumovirus Laboratory
Department of Biological Sciences
The University of Warwick
Gibbet Hill Road
Coventry CV4 7AL
Tel: 02476 522696
Mob: 07930195005
Email: P.D.Scott-at-warwick.ac.uk



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From: kraftpiano-at-gmail.com
Date: Tue, 11 Dec 2007 08:57:04 -0600
Subject: [Microscopy] A call out to all high schools with electron microscopes (Or advanced microscopy programs)

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

I would like to start a mailing list and website for those of you who
are affiliated with high school programs that have electron
microscopes. I know there are some of you out there, as I have been
emailing a few of you. I want to have a forum where we can exchange
methods for instruction, lessons, equipment sources, and other topics
that are of specific interest to the high school and middle school
communities.

If you would be interested in participating in such a list, please
email me off of this list. I will assemble the names, then email out
to you when it's up and running so you can sign up.

Thanks,

Justin A. Kraft
Professional Lab Rat
Physics Teacher
Leadership Academy West
West Palm Beach, FL

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From: bigelow-at-umich.edu
Date: Tue, 11 Dec 2007 15:39:59 -0600
Subject: [Microscopy] RE: Perchloric solutions

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Fifty years ago I did a lot of work polishing the
alloys used then in the manufacture of jet
engines. These alloys were so
corrosion-resistant that about the only thing
strong enough to electrolytically polish them
were the various solutions based on perchloric
acid. Therefore, I worked with these solutions a
LOT.

Basically, perchloric acid becomes an explosive
when it becomes heated when it is concentrated
and in contact with an easily oxidizable material
(such as cotton, paper, most organic solvents,
most kinds of cloth, etc.). Therefore it is
imperative to avoid these conditions! If the
hot, concentrated stuff comes in contact with
such materials it can produce a very violent
explosion. In one instance a graduate student
filtered a small amount of a perchlorate salt out
of a solution, then placed the damp filter paper
that carried the salt in a drying oven.
Luckily, he left the room before the stuff let
loose, whereupon it drove the door of the oven
across the room and embedded it in the opposite
cinder block wall. (However, we routinely used
boiling perchloric acid to digest mineral samples
in certain analytical procedures - no organic or
oxidizable material present)

In the work I did, we always kept the polishing
solution cooled to below 10°C during the
electrolysis process. For solutions made with
acetic anhydride we kept the temperature at the
point where crystals of the anhydride just
started to form in it. We stirred the solutions
vigorously during the electrolysis process to
prevent localized heat build-up at the electrode
surfaces. And we worked inside a large
stainless steel or polyethylene pan with a
half-inch of water in the bottom, which we washed
thoroughly after an experiment was completed so
that no residue of the solution remained around
to become concentrated by evaporation.

Before a perchloric acid solution actually
explodes it will start to develop a brownish-red
color. Therefore we always kept a large beaker
full of ice water sitting by our polishing
apparatus, which we would have poured into the
polishing solution to dilute and cool it if this
ever happened, and we kept the door of the lab
open so that we could then leave in a hurry

We stored our stock solutions in glass bottles
with glass stoppers. It is important to avoid
bottles with ordinary caps made of organic
materials. We always rinsed the bottles
thoroughly with water, to remove any traces of
solution that might have dribbled down the sides
of them during solution transfer. With these
precautions we stored perchloric acid solutions
of all kinds for many months with no problems.

Perchloric acid is a very useful reagent if you
use it with proper precautions and due respect.
--
Wilbur C. Bigelow, Professor Emeritus
Materials Sci. & Engr., Univ. of Michigan
Ann Arbor, Michigan 48109-2136
e-mail: bigelow-at-umich.edu;
Fx:734-763-4788; Ph:734-975-0858
Address mail to: 2911 Whittier Court
Ann Arbor, MI 48104-6731


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From: walck-at-southbaytech.com
Date: Tue, 11 Dec 2007 16:03:26 -0600
Subject: [Microscopy] RE: Perchloric solutions

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Great summary, Wil. If you don't mind, I would like to send this to a
customer that I have been talking to about electropolishing and one of the
electrolytes that are recommended is perchloric solutions.

I would like to add another point. One of the safety things that you missed
is that you should work in a perchloric acid rated hood. These hoods are
designed so that they can be periodically washed down in the exhaust area.

In the Number 5 book in the Philips TEM series, which is about TEM sample
preparation, they also have a small section on the safety precautions for
perchloric acid solutions as well as others.

-Scott

Scott D. Walck, Ph.D.
Technical Director
South Bay Technology, Inc.
1120 Via Callejon
San Clemente, CA 92673

US Toll Free: 1-800-728-2233
Tel: (949) 492-2600
Fax: (949) 492-1499

www.southbaytech.com
walck-at-southbaytech.com

-----Original Message-----
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Sent: Tuesday, December 11, 2007 1:45 PM
To: Walck-at-SouthBayTech.com

Fifty years ago I did a lot of work polishing the alloys used then in the
manufacture of jet engines. These alloys were so corrosion-resistant that
about the only thing strong enough to electrolytically polish them were the
various solutions based on perchloric acid. Therefore, I worked with these
solutions a LOT.

Basically, perchloric acid becomes an explosive when it becomes heated when
it is concentrated and in contact with an easily oxidizable material (such
as cotton, paper, most organic solvents, most kinds of cloth, etc.).
Therefore it is imperative to avoid these conditions! If the hot,
concentrated stuff comes in contact with such materials it can produce a
very violent explosion. In one instance a graduate student filtered a small
amount of a perchlorate salt out of a solution, then placed the damp filter
paper that carried the salt in a drying oven.
Luckily, he left the room before the stuff let loose, whereupon it drove the
door of the oven across the room and embedded it in the opposite cinder
block wall. (However, we routinely used boiling perchloric acid to digest
mineral samples in certain analytical procedures - no organic or oxidizable
material present)

In the work I did, we always kept the polishing solution cooled to below
10°C during the electrolysis process. For solutions made with acetic
anhydride we kept the temperature at the point where crystals of the
anhydride just started to form in it. We stirred the solutions vigorously
during the electrolysis process to prevent localized heat build-up at the
electrode
surfaces. And we worked inside a large
stainless steel or polyethylene pan with a half-inch of water in the bottom,
which we washed thoroughly after an experiment was completed so that no
residue of the solution remained around to become concentrated by
evaporation.

Before a perchloric acid solution actually explodes it will start to develop
a brownish-red color. Therefore we always kept a large beaker full of ice
water sitting by our polishing apparatus, which we would have poured into
the polishing solution to dilute and cool it if this ever happened, and we
kept the door of the lab open so that we could then leave in a hurry

We stored our stock solutions in glass bottles with glass stoppers. It is
important to avoid bottles with ordinary caps made of organic materials. We
always rinsed the bottles thoroughly with water, to remove any traces of
solution that might have dribbled down the sides of them during solution
transfer. With these precautions we stored perchloric acid solutions of all
kinds for many months with no problems.

Perchloric acid is a very useful reagent if you use it with proper
precautions and due respect.
--
Wilbur C. Bigelow, Professor Emeritus
Materials Sci. & Engr., Univ. of Michigan Ann Arbor, Michigan 48109-2136
e-mail: bigelow-at-umich.edu;
Fx:734-763-4788; Ph:734-975-0858
Address mail to: 2911 Whittier Court
Ann Arbor, MI 48104-6731


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From: walter.bobrowski-at-pfizer.com
Date: Tue, 11 Dec 2007 20:53:21 -0600
Subject: [Microscopy] viaWWW: Advice on Imaging C60 Aggregates in Buffer Medium

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Email: walter.bobrowski-at-pfizer.com
Name: Walter Bobrowski

Organization: Pfizer Global R&D

Title-Subject: [Filtered] Advice on Imaging C60 Aggregates in Buffer Medium

Question: Any advice on preparation and imaging of C60 (fullerene) aggregates in buffer for TEM appreciated. A paper (Environ. Sci. Technol. 2005, 39, 4307-4316) states they form crystalline aggregates of roundish to rectangular shapes, 25-500nm in size. Technique has been to apply droplet to filmed grid support, wick and air dry. I'm getting crystalline aggregates in the samples preps -- as well as similar looking crystals in the buffer prep alone.
TIA,

Walter F. Bobrowski
Sr. Scientist
Pfizer Global R&D
224 Eastern Point Rd
B274/0357N
Groton, CT 06340

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From: dietz-at-anl.gov
Date: Tue, 11 Dec 2007 20:54:03 -0600
Subject: [Microscopy] viaWWW: SEM/TEM of hydrogels

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Email: dietz-at-anl.gov
Name: N. Rago

Title-Subject: [Filtered] SEM/TEM of hydrogels

Question: I need to see the distribution of nanoparticles ( {50 nm) in a hydrogel. What is the best way to prepare these samples for SEM or TEM?

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From: nizets2-at-yahoo.com
Date: Wed, 12 Dec 2007 04:28:49 -0600
Subject: [Microscopy] LM - Confocal Opinions

Contents Retrieved from Microscopy Listserver Archives
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Good morning!

The LSM510 serie introduced the AOTF, which allows the ultra-fast switching between different incident wavelengthes.
This means that if you are scanning triple-stained samples, all 3 wavelengthes are scanned sequentially (time-resolved). Well sequential scanning is not a revolution, the key here is the ultra-fast switching, which allows quasi-simultaneous ("real-time" for your eyes) detection of different wavelengthes without the chance of cross-talk.
Now I did some research on the net and I found that Leica developped the same feature since 2002, although it is called AOBS ;-). I don't know if both systems all fully comparable though.

Best regards,

Stephane, male (and a nice specimen, too ;-))



----- Original Message ----
X-from: "PhillipsT-at-missouri.edu" {PhillipsT-at-missouri.edu}
To: nizets2-at-yahoo.com
Sent: Monday, December 10, 2007 10:00:41 PM

I own a Zeiss 510 Meta NLO and am afraid I don't understand Stephane's
comment that the Zeiss separates the signal based on time. Perhaps she
means that the system can, in real-time, separate out overlapping
emission signals using spectral imaging. If not, perhaps she could
expand on her comment.

Thomas E. Phillips, Ph.D
Professor of Biological Sciences
Director, Molecular Cytology Core
2 Tucker Hall
University of Missouri
Columbia, MO 65211-7400
573-882-4712 (office)
573-882-0123 (fax)
phillipst-at-missouri.edu

http://www.biology.missouri.edu/faculty/phillips.html
http://www.biotech.missouri.edu/mcc/

-----Original Message-----
X-from: sekkio-at-mac.com [mailto:sekkio-at-mac.com]
Sent: Monday, December 10, 2007 2:28 PM
To: Phillips, Thomas E.

About multiple fluorescence we got excellent results using a white
light laser coupled to the SP5AOBS
I think WLL is really a great advance in spectral imaging icluding
related applications
ciao
Alby
Il giorno 20/nov/07, alle ore 15:42, nizets2-at-yahoo.com ha scritto:

}
}
}
}
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}
} Hi!
}
} I have used the previous Zeiss 510 microscope and liked it very
} much. It is user-friendly and powerful.
} I don't know the technical details of the Leica but in the Zeiss the
} different wavelengthes are separated not only by filters but also in
} time, so no read-through is possible. I must say this gives a
} welcome level of confidence and comfort. I did a lot of triple
} staining with great results.
}
} No interest blabla....
}
} Regards,
} Stephane
}
}
} ----- Original Message ----
} X-from: "christopher.hayden-at-novartis.com"
{christopher.hayden-at-novartis.com
} }
} To: nizets2-at-yahoo.com
} Sent: Monday, November 19, 2007 7:28:16 PM
} Subject: [Microscopy] LM - Confocal Opinions
}
}
}
}
}
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}
} Good Day, All:
}
} We're in the fortunate position of looking around at
} acquiring a
} confocal microscope sometime in 2008. Before we start hearing the
} pitches
} from the manufacturers, we'd like to hear from the "real" world.
} Specifically, what you have and what you think of it (ease-of-use,
} upgrades, level of control, service and support, etc.).
} After having a look around, it seems like the two contenders
} for
} us are the Zeiss 510 META NLO and the Leica TCS SP5. Flexibility is
} key
} for us, as it's going to have a fairly broad set of uses as both a
} research tool and as a development tool.
} Cost isn't critical at this point; we're basically being told
} to
} "get what we need". While we have people with confocal experience,
} each is
}
} a little biased that the system they know is the best one.
}
} Thanks much!
} -Chris
}
}
}
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} Text or chat with friends inside Yahoo! Mail. See how.
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----------------------------------------------------
"Follow knowledge wherever it leads us." (reading Galileo Galilei)
-----------------------------------------------------
Alberto Diaspro, EBSA President-Elect, MicroScoBIO LAMBS-IFOM,
Department of Physics, University of Genoa, Via Dodecaneso 33, 16146
Genoa, Italy - fax +39-010314218 - tel +39 0103536426/309; URLs:
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17, 26 -- From PhillipsT-at-missouri.edu Mon Dec 10 14:55:06 2007
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17, 26 -- From: "Phillips, Thomas E." {PhillipsT-at-missouri.edu}
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From: kraftpiano-at-gmail.com
Date: Wed, 12 Dec 2007 12:00:41 -0600
Subject: [Microscopy] Inverted microscope parts related question.

Contents Retrieved from Microscopy Listserver Archives
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Hello all, I am working on restoring an old Unitron N-11 inverted
microscope, and I was wondering if anybody out there has one or has
used one.

Specifically, I would like to know if anybody has some extra parts
hanging around. I would like to at least get the wiring diagram for
the Xenon source, as well as find out where the overhead light would
attach.

--Justin.

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From: arrowood-at-utep.edu
Date: Wed, 12 Dec 2007 17:45:39 -0600
Subject: [Microscopy] viaWWW: perchloric acid hazards

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Email: arrowood-at-utep.edu
Name: Roy Arrowood

Organization: University of Texas El Paso

Title-Subject: [Filtered] perchloric acid hazards

Question: To elaborate slightly on one of the points about perchloric hazards: many metal perchlorates are explosive when dry (including nickel perchlorate). So even if an organic substance is not present, there can still be serious hazards. When using a perchloric-based electrolyte to prepare superalloys for microscopy, one should take care to avoid letting used electrolyte evaporate to leave a dry deposit. Also, perchloric fumes may react with metal ductwork some distance away from the fume hood, producing explosive salts. Remodelling workers have been blinded or maimed simply by tapping on a fume hood duct which was not perchloric-rated, but had been used for perchloric-acid work. If you've not had experience with this stuff, it's wise to take some time for reading and self-education before working with perchloric!

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From: sekkio-at-mac.com
Date: Thu, 13 Dec 2007 00:59:15 -0600
Subject: [Microscopy] Re: LM - Confocal Opinions

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

HI Stephan,
I think there is a little bit of confusion. The AOBS is a programmable
beamsplitter (BS) and is, let me say, more evolute than the AOTF
(about this I remember that it was introduced by Leica on 1993
approx... I had one Leica CLSM in 1987 and they told us about this
new ugrade, well I am niot sure). More recently a AOBM - beam
modulator has been introduced for delivering selected multiple
wavelengths coming from a white light laser. This sound to be a sort
of "best couple", AOBM+white light laser. AOBS has an important impact
in wavelength selection in the detection scheme. It has to be
carefully aligned and then it prevents from undesired reflections of
the selected excitation wavelength a sort of paso doble, a gentleman
and a lady dancing a Flamenco around an imaginary Bull like in a
Corrida game... sorry for this... I think that the introduction of
AOBS was a sort of puting brain instead of muscles in fluorescence
microscopy.
All my best
Alby


Il giorno 12/dic/07, alle ore 11:30, nizets2-at-yahoo.com ha scritto:

}
}
}
} ----------------------------------------------------------------------------
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} America
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} Good morning!
}
} The LSM510 serie introduced the AOTF, which allows the ultra-fast
} switching between different incident wavelengthes.
} This means that if you are scanning triple-stained samples, all 3
} wavelengthes are scanned sequentially (time-resolved). Well
} sequential scanning is not a revolution, the key here is the ultra-
} fast switching, which allows quasi-simultaneous ("real-time" for
} your eyes) detection of different wavelengthes without the chance of
} cross-talk.
} Now I did some research on the net and I found that Leica developped
} the same feature since 2002, although it is called AOBS ;-). I don't
} know if both systems all fully comparable though.
}
} Best regards,
}
} Stephane, male (and a nice specimen, too ;-))
}
}
}
} ----- Original Message ----
} X-from: "PhillipsT-at-missouri.edu" {PhillipsT-at-missouri.edu}
} To: nizets2-at-yahoo.com
} Sent: Monday, December 10, 2007 10:00:41 PM
} Subject: [Microscopy] RE: LM - Confocal Opinions
}
}
}
}
} ----------------------------------------------------------------------------
} The Microscopy ListServer -- CoSponsor: The Microscopy Society of
} America
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} On-Line Help http://www.microscopy.com/MicroscopyListserver/FAQ.html
} ----------------------------------------------------------------------------
}
} I own a Zeiss 510 Meta NLO and am afraid I don't understand Stephane's
} comment that the Zeiss separates the signal based on time. Perhaps
} she
} means that the system can, in real-time, separate out overlapping
} emission signals using spectral imaging. If not, perhaps she could
} expand on her comment.
}
} Thomas E. Phillips, Ph.D
} Professor of Biological Sciences
} Director, Molecular Cytology Core
} 2 Tucker Hall
} University of Missouri
} Columbia, MO 65211-7400
} 573-882-4712 (office)
} 573-882-0123 (fax)
} phillipst-at-missouri.edu
}
} http://www.biology.missouri.edu/faculty/phillips.html
} http://www.biotech.missouri.edu/mcc/
}
} -----Original Message-----
} X-from: sekkio-at-mac.com [mailto:sekkio-at-mac.com]
} Sent: Monday, December 10, 2007 2:28 PM
} To: Phillips, Thomas E.
} Subject: [Microscopy] LM - Confocal Opinions
}
}
}
}
} ------------------------------------------------------------------------
} ----
} The Microscopy ListServer -- CoSponsor: The Microscopy Society of
} America
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} http://www.microscopy.com/MicroscopyListserver
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} ----
}
} About multiple fluorescence we got excellent results using a white
} light laser coupled to the SP5AOBS
} I think WLL is really a great advance in spectral imaging icluding
} related applications
} ciao
} Alby
} Il giorno 20/nov/07, alle ore 15:42, nizets2-at-yahoo.com ha scritto:
}
} }
} }
} }
} }
} ------------------------------------------------------------------------
} ----
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} } America
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} }
} ------------------------------------------------------------------------
} ----
} }
} } Hi!
} }
} } I have used the previous Zeiss 510 microscope and liked it very
} } much. It is user-friendly and powerful.
} } I don't know the technical details of the Leica but in the Zeiss the
} } different wavelengthes are separated not only by filters but also in
} } time, so no read-through is possible. I must say this gives a
} } welcome level of confidence and comfort. I did a lot of triple
} } staining with great results.
} }
} } No interest blabla....
} }
} } Regards,
} } Stephane
} }
} }
} } ----- Original Message ----
} } X-from: "christopher.hayden-at-novartis.com"
} {christopher.hayden-at-novartis.com
} } }
} } To: nizets2-at-yahoo.com
} } Sent: Monday, November 19, 2007 7:28:16 PM
} } Subject: [Microscopy] LM - Confocal Opinions
} }
} }
} }
} }
} }
} ------------------------------------------------------------------------
} ----
} } The Microscopy ListServer -- CoSponsor: The Microscopy Society of
} } America
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} }
} ------------------------------------------------------------------------
} ----
} }
} } Good Day, All:
} }
} } We're in the fortunate position of looking around at
} } acquiring a
} } confocal microscope sometime in 2008. Before we start hearing the
} } pitches
} } from the manufacturers, we'd like to hear from the "real" world.
} } Specifically, what you have and what you think of it (ease-of-use,
} } upgrades, level of control, service and support, etc.).
} } After having a look around, it seems like the two contenders
} } for
} } us are the Zeiss 510 META NLO and the Leica TCS SP5. Flexibility is
} } key
} } for us, as it's going to have a fairly broad set of uses as both a
} } research tool and as a development tool.
} } Cost isn't critical at this point; we're basically being told
} } to
} } "get what we need". While we have people with confocal experience,
} } each is
} }
} } a little biased that the system they know is the best one.
} }
} } Thanks much!
} } -Chris
} }
} }
} }
} } ==============================Original
} } Headers==============================
} } 5, 29 -- From christopher.hayden-at-novartis.com Mon Nov 19 12:23:16
} } 2007
} } 5, 29 -- Received: from mail194.messagelabs.com
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} } 5, 29 -- Subject: LM - Confocal Opinions
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} om
} } }
} } 5, 29 -- From: christopher.hayden-at-novartis.com
} } 5, 29 -- Date: Mon, 19 Nov 2007 13:23:13 -0500
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} }
} }
} }
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} } ==============================Original
} } Headers==============================
} } 19, 20 -- From nizets2-at-yahoo.com Tue Nov 20 08:39:39 2007
} } 19, 20 -- Received: from web37414.mail.mud.yahoo.com
} } (web37414.mail.mud.yahoo.com [209.191.91.146])
} } 19, 20 -- by ns.microscopy.com (8.12.11.20060308/8.12.8) with



From: nizets2-at-yahoo.com
Date: Thu, 13 Dec 2007 05:49:15 -0600
Subject: [Microscopy] LM - Confocal Opinions

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

No problem for the gender, it is the same problem everywhere from germany to USA :-)

A microscope which scans and has a pinhole is indeed called Confocal Laser Scanning Microscope (confocal LSM).
The possibility to select a certain incoming wavelength is just a useful feature, but not the basic principle of the microscope. This way you can be certain that the second dye is not excited by the excitation wv of the first dye. Perhaps I misused the word "time-resolved", since english is not my primary language. However, this is indeed a sequential scanning in a confocal microscope.
Please note that I always carefully noted that this feature is useful for multiple labelings. It is useless for single labelings.

Regards,
Stephane



----- Original Message ----
X-from: "Phillips, Thomas E." {PhillipsT-at-missouri.edu}
To: nizets2-at-yahoo.com
Sent: Wednesday, December 12, 2007 4:14:47 PM

Good morning!

The LSM510 serie introduced the AOTF, which allows the ultra-fast switching between different incident wavelengthes.
This means that if you are scanning triple-stained samples, all 3 wavelengthes are scanned sequentially (time-resolved). Well sequential scanning is not a revolution, the key here is the ultra-fast switching, which allows quasi-simultaneous ("real-time" for your eyes) detection of different wavelengthes without the chance of cross-talk.
Now I did some research on the net and I found that Leica developped the same feature since 2002, although it is called AOBS ;-). I don't know if both systems all fully comparable though.

Best regards,

Stephane, male (and a nice specimen, too ;-))



----- Original Message ----
X-from: "PhillipsT-at-missouri.edu" {PhillipsT-at-missouri.edu}
To: nizets2-at-yahoo.com
Sent: Monday, December 10, 2007 10:00:41 PM

I own a Zeiss 510 Meta NLO and am afraid I don't understand Stephane's
comment that the Zeiss separates the signal based on time. Perhaps she
means that the system can, in real-time, separate out overlapping
emission signals using spectral imaging. If not, perhaps she could
expand on her comment.

Thomas E. Phillips, Ph.D
Professor of Biological Sciences
Director, Molecular Cytology Core
2 Tucker Hall
University of Missouri
Columbia, MO 65211-7400
573-882-4712 (office)
573-882-0123 (fax)
phillipst-at-missouri.edu

http://www.biology.missouri.edu/faculty/phillips.html
http://www.biotech.missouri.edu/mcc/

-----Original Message-----
X-from: sekkio-at-mac.com [mailto:sekkio-at-mac.com]
Sent: Monday, December 10, 2007 2:28 PM
To: Phillips, Thomas E.

About multiple fluorescence we got excellent results using a white
light laser coupled to the SP5AOBS
I think WLL is really a great advance in spectral imaging icluding
related applications
ciao
Alby
Il giorno 20/nov/07, alle ore 15:42, nizets2-at-yahoo.com ha scritto:

}
}
}
}
------------------------------------------------------------------------
----
} The Microscopy ListServer -- CoSponsor: The Microscopy Society of
} America
} To Subscribe/Unsubscribe --
http://www.microscopy.com/MicroscopyListserver
} On-Line Help http://www.microscopy.com/MicroscopyListserver/FAQ.html
}
------------------------------------------------------------------------
----
}
} Hi!
}
} I have used the previous Zeiss 510 microscope and liked it very
} much. It is user-friendly and powerful.
} I don't know the technical details of the Leica but in the Zeiss the
} different wavelengthes are separated not only by filters but also in
} time, so no read-through is possible. I must say this gives a
} welcome level of confidence and comfort. I did a lot of triple
} staining with great results.
}
} No interest blabla....
}
} Regards,
} Stephane
}
}
} ----- Original Message ----
} X-from: "christopher.hayden-at-novartis.com"
{christopher.hayden-at-novartis.com
} }
} To: nizets2-at-yahoo.com
} Sent: Monday, November 19, 2007 7:28:16 PM
} Subject: [Microscopy] LM - Confocal Opinions
}
}
}
}
}
------------------------------------------------------------------------
----
} The Microscopy ListServer -- CoSponsor: The Microscopy Society of
} America
} To Subscribe/Unsubscribe --
http://www.microscopy.com/MicroscopyListserver
} On-Line Help http://www.microscopy.com/MicroscopyListserver/FAQ.html
}
------------------------------------------------------------------------
----
}
} Good Day, All:
}
} We're in the fortunate position of looking around at
} acquiring a
} confocal microscope sometime in 2008. Before we start hearing the
} pitches
} from the manufacturers, we'd like to hear from the "real" world.
} Specifically, what you have and what you think of it (ease-of-use,
} upgrades, level of control, service and support, etc.).
} After having a look around, it seems like the two contenders
} for
} us are the Zeiss 510 META NLO and the Leica TCS SP5. Flexibility is
} key
} for us, as it's going to have a fairly broad set of uses as both a
} research tool and as a development tool.
} Cost isn't critical at this point; we're basically being told
} to
} "get what we need". While we have people with confocal experience,
} each is
}
} a little biased that the system they know is the best one.
}
} Thanks much!
} -Chris
}
}
}
} ==============================Original
} Headers==============================
} 5, 29 -- From christopher.hayden-at-novartis.com Mon Nov 19 12:23:16 2007
} 5, 29 -- Received: from mail194.messagelabs.com
} (mail194.messagelabs.com [85.158.140.211])
} 5, 29 -- by ns.microscopy.com (8.12.11.20060308/8.12.8) with
} ESMTP id lAJINGAI008522
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17, 26 -- From PhillipsT-at-missouri.edu Mon Dec 10 14:55:06 2007
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From: nizets2-at-yahoo.com
Date: Thu, 13 Dec 2007 06:08:03 -0600
Subject: [Microscopy] Re: LM - Confocal Opinions

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Hi Alby!

Thank you for your remark.
As far as I understand the AOBS allows the selection of specific excitation wv, just like the AOTF (although the principles are clearly different). It is said that you can use the system for sequential scanning, just like the AOTF.
I paste here a link to a brochure from Leica which describes sequential scanning. Please note that the first chapter is called "avoiding crosstalk", which was precisely the subject of my note.

http://www.uib.no/med/mic/equipment/Leica-TCS-SP2-AOBS/sequential%20image%20recording.pdf

Perhaps I am missing something (I am not working with confocal microscopes anymore for years). In this case, please correct me.

regards,

Stephane

----- Original Message ----
X-from: "sekkio-at-mac.com" {sekkio-at-mac.com}
To: nizets2-at-yahoo.com
Sent: Thursday, December 13, 2007 8:05:03 AM

HI Stephan,
I think there is a little bit of confusion. The AOBS is a programmable
beamsplitter (BS) and is, let me say, more evolute than the AOTF
(about this I remember that it was introduced by Leica on 1993
approx... I had one Leica CLSM in 1987 and they told us about this
new ugrade, well I am niot sure). More recently a AOBM - beam
modulator has been introduced for delivering selected multiple
wavelengths coming from a white light laser. This sound to be a sort
of "best couple", AOBM+white light laser. AOBS has an important impact
in wavelength selection in the detection scheme. It has to be
carefully aligned and then it prevents from undesired reflections of
the selected excitation wavelength a sort of paso doble, a gentleman
and a lady dancing a Flamenco around an imaginary Bull like in a
Corrida game... sorry for this... I think that the introduction of
AOBS was a sort of puting brain instead of muscles in fluorescence
microscopy.
All my best
Alby


Il giorno 12/dic/07, alle ore 11:30, nizets2-at-yahoo.com ha scritto:

}
}
}
} ----------------------------------------------------------------------------
} The Microscopy ListServer -- CoSponsor: The Microscopy Society of
} America
} To Subscribe/Unsubscribe -- http://www.microscopy.com/MicroscopyListserver
} On-Line Help http://www.microscopy.com/MicroscopyListserver/FAQ.html
} ----------------------------------------------------------------------------
}
} Good morning!
}
} The LSM510 serie introduced the AOTF, which allows the ultra-fast
} switching between different incident wavelengthes.
} This means that if you are scanning triple-stained samples, all 3
} wavelengthes are scanned sequentially (time-resolved). Well
} sequential scanning is not a revolution, the key here is the ultra-
} fast switching, which allows quasi-simultaneous ("real-time" for
} your eyes) detection of different wavelengthes without the chance of
} cross-talk.
} Now I did some research on the net and I found that Leica developped
} the same feature since 2002, although it is called AOBS ;-). I don't
} know if both systems all fully comparable though.
}
} Best regards,
}
} Stephane, male (and a nice specimen, too ;-))
}
}
}
} ----- Original Message ----
} X-from: "PhillipsT-at-missouri.edu" {PhillipsT-at-missouri.edu}
} To: nizets2-at-yahoo.com
} Sent: Monday, December 10, 2007 10:00:41 PM
} Subject: [Microscopy] RE: LM - Confocal Opinions
}
}
}
}
} ----------------------------------------------------------------------------
} The Microscopy ListServer -- CoSponsor: The Microscopy Society of
} America
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} ----------------------------------------------------------------------------
}
} I own a Zeiss 510 Meta NLO and am afraid I don't understand Stephane's
} comment that the Zeiss separates the signal based on time. Perhaps
} she
} means that the system can, in real-time, separate out overlapping
} emission signals using spectral imaging. If not, perhaps she could
} expand on her comment.
}
} Thomas E. Phillips, Ph.D
} Professor of Biological Sciences
} Director, Molecular Cytology Core
} 2 Tucker Hall
} University of Missouri
} Columbia, MO 65211-7400
} 573-882-4712 (office)
} 573-882-0123 (fax)
} phillipst-at-missouri.edu
}
} http://www.biology.missouri.edu/faculty/phillips.html
} http://www.biotech.missouri.edu/mcc/
}
} -----Original Message-----
} X-from: sekkio-at-mac.com [mailto:sekkio-at-mac.com]
} Sent: Monday, December 10, 2007 2:28 PM
} To: Phillips, Thomas E.
} Subject: [Microscopy] LM - Confocal Opinions
}
}
}
}
} ------------------------------------------------------------------------
} ----
} The Microscopy ListServer -- CoSponsor: The Microscopy Society of
} America
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} http://www.microscopy.com/MicroscopyListserver
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}
} About multiple fluorescence we got excellent results using a white
} light laser coupled to the SP5AOBS
} I think WLL is really a great advance in spectral imaging icluding
} related applications
} ciao
} Alby
} Il giorno 20/nov/07, alle ore 15:42, nizets2-at-yahoo.com ha scritto:
}
} }
} }
} }
} }
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} } America
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} ----
} }
} } Hi!
} }
} } I have used the previous Zeiss 510 microscope and liked it very
} } much. It is user-friendly and powerful.
} } I don't know the technical details of the Leica but in the Zeiss the
} } different wavelengthes are separated not only by filters but also in
} } time, so no read-through is possible. I must say this gives a
} } welcome level of confidence and comfort. I did a lot of triple
} } staining with great results.
} }
} } No interest blabla....
} }
} } Regards,
} } Stephane
} }
} }
} } ----- Original Message ----
} } X-from: "christopher.hayden-at-novartis.com"
} {christopher.hayden-at-novartis.com
} } }
} } To: nizets2-at-yahoo.com
} } Sent: Monday, November 19, 2007 7:28:16 PM
} } Subject: [Microscopy] LM - Confocal Opinions
} }
} }
} }
} }
} }
} ------------------------------------------------------------------------
} ----
} } The Microscopy ListServer -- CoSponsor: The Microscopy Society of
} } America
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} http://www.microscopy.com/MicroscopyListserver
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} }
} ------------------------------------------------------------------------
} ----
} }
} } Good Day, All:
} }
} } We're in the fortunate position of looking around at
} } acquiring a
} } confocal microscope sometime in 2008. Before we start hearing the
} } pitches
} } from the manufacturers, we'd like to hear from the "real" world.
} } Specifically, what you have and what you think of it (ease-of-use,
} } upgrades, level of control, service and support, etc.).
} } After having a look around, it seems like the two contenders
} } for
} } us are the Zeiss 510 META NLO and the Leica TCS SP5. Flexibility is
} } key
} } for us, as it's going to have a fairly broad set of uses as both a
} } research tool and as a development tool.
} } Cost isn't critical at this point; we're basically being told
} } to
} } "get what we need". While we have people with confocal experience,
} } each is
} }
} } a little biased that the system they know is the best one.
} }
} } Thanks much!
} } -Chris
} }
} }
} }
} } ==============================Original
} } Headers==============================
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} } }
} } 5, 29 -- From: christopher.hayden-at-novartis.com
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} }
} }
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} ________________________________________________________________________
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} } Text or chat with friends inside Yahoo! Mail. See how.
} http://overview.mail.yahoo.com/
} }
} } ==============================Original
} } Headers==============================
} } 19, 20 -- From nizets2-at-yahoo.com Tue Nov 20 08:39:39 2007
} } 19, 20 -- Received: from web37414.mail.mud.yahoo.com
} } (web37414.mail.mud.yahoo.com [209.191.91.146])
} } 19, 20 -- by ns.microscopy.com (8.12.11.20060308/8.12.8) with



From: kjmorris-at-well.ox.ac.uk
Date: Thu, 13 Dec 2007 09:54:02 -0600
Subject: [Microscopy] Re: LM - Confocal Opinions

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Hi All,

I did run a Leica SP2 at my old workplace [Institute of Ophthalmology, UCL,
UK], and now we use a Zeiss 510 MetaHead at the Wellcome Institute here in
Oxford [UK] as our confocal. I always thought an AOBS was pretty much an
AOTF - the acousto-optical thingy being the important bit (with BS = Beam
Splitter, TF = Tunable Filter). e.g.
http://micro.magnet.fsu.edu/primer/java/filters/aotf/index.html.

The AOBS/AOTF is standard in both these confocals (and others) to control
laser power and excitation wavelength (i.e. select laser lines). To be
honest it's not these rather clever excitation AOBS devices that mark these
systems out (as they work very well in both), but rather the way the systems
deal with the emission spectra. Both the Zeiss and the Leica have user
tunable emission filters, rather than just fixed spectrum glass filters -
Zeiss have the MetaHead and Leica have their patented prism tunable spectral
emission filters. Leica dispense with fixed spectrum emission filters
altogether with their SP confocals, and each PMT has its own tunable
emission filter:

"The Leica SP5 features five confocal channels in parallel. Emission
selection is done for all channels and scanning techniques by Leica's SP
detectors, the only real spectral device for imaging, with tunable emission
bands and maximum efficiency. Moreover, the high-transmission and tunable
photongate, the Leica AOBS, fits to both scanners, avoiding all
disadvantages of dichroic mirrors - there is no better way to separate
excitation from emission."

With the Zeiss, the emission tunable MetaHead unit is fixed over one PMT
(the other two PMTs using conventional emission filters for routine
fluorochromes like DAPI, FITC, TRITC and CY5). The Zeiss offers a lot of
spectral unmixing [bleedthrough] and co-localisation analysis
software/hardware (as does Leica). Apparently these tunable filters are a
bit more efficient (less light loss) than conventional glass filters, as
well as being far more versatile.

Overall both the Leica and Zeiss confocals offer a lot for your money and
you wouldn't really go wrong choosing either one. Image quality is pretty
indistinguishable between them, being as much dependent on objectives etc..
as on the confocal scanning system, but both offer a lot in terms of
spectral unmixing, time-lapse, 3D, FRAP, FRET etc..as well as basic confocal
imaging. Just make you specify them all in the original quote as many
modules/hardware are options and may be heavily discounted in the original
bid (& having to find $15,000 6 months later is often a pain). I have
emailed Chris separately giving my views, and I was pretty positive about
both confocal systems, and their support teams, over here in the UK.

Regards

Keith

-----------------------------------------------------------------

Dr Keith J Morris
Molecular Cytogenetics and Microscopy Core
The Wellcome Trust Centre for Human Genetics
Roosevelt Drive
Oxford
OX3 7BN
United Kingdom

Tel: +44 ( 0 ) 1865 287568
Email: kjmorris-at-well.ox.ac.uk
HomePage: http://www.well.ox.ac.uk/cytogenetics



We know accurately only when we know little, with knowledge doubt increases.

- Johann Wolfgang von Goethe c1810

Although I also rather like his quotation:

We do not have to visit a madhouse to find disordered minds; our planet is
the mental institution of the universe.





-----Original Message-----
X-from: sekkio-at-mac.com [mailto:sekkio-at-mac.com]
Sent: 13 December 2007 07:08
To: kjmorris-at-well.ox.ac.uk

HI Stephan,
I think there is a little bit of confusion. The AOBS is a programmable
beamsplitter (BS) and is, let me say, more evolute than the AOTF
(about this I remember that it was introduced by Leica on 1993
approx... I had one Leica CLSM in 1987 and they told us about this
new ugrade, well I am niot sure). More recently a AOBM - beam
modulator has been introduced for delivering selected multiple
wavelengths coming from a white light laser. This sound to be a sort
of "best couple", AOBM+white light laser. AOBS has an important impact
in wavelength selection in the detection scheme. It has to be
carefully aligned and then it prevents from undesired reflections of
the selected excitation wavelength a sort of paso doble, a gentleman
and a lady dancing a Flamenco around an imaginary Bull like in a
Corrida game... sorry for this... I think that the introduction of
AOBS was a sort of puting brain instead of muscles in fluorescence
microscopy.
All my best
Alby


Il giorno 12/dic/07, alle ore 11:30, nizets2-at-yahoo.com ha scritto:

}
}
}
}
----------------------------------------------------------------------------
} The Microscopy ListServer -- CoSponsor: The Microscopy Society of
} America
} To Subscribe/Unsubscribe --
http://www.microscopy.com/MicroscopyListserver
} On-Line Help http://www.microscopy.com/MicroscopyListserver/FAQ.html
}
----------------------------------------------------------------------------
}
} Good morning!
}
} The LSM510 serie introduced the AOTF, which allows the ultra-fast
} switching between different incident wavelengthes.
} This means that if you are scanning triple-stained samples, all 3
} wavelengthes are scanned sequentially (time-resolved). Well
} sequential scanning is not a revolution, the key here is the ultra-
} fast switching, which allows quasi-simultaneous ("real-time" for
} your eyes) detection of different wavelengthes without the chance of
} cross-talk.
} Now I did some research on the net and I found that Leica developped
} the same feature since 2002, although it is called AOBS ;-). I don't
} know if both systems all fully comparable though.
}
} Best regards,
}
} Stephane, male (and a nice specimen, too ;-))
}
}
}
} ----- Original Message ----
} X-from: "PhillipsT-at-missouri.edu" {PhillipsT-at-missouri.edu}
} To: nizets2-at-yahoo.com
} Sent: Monday, December 10, 2007 10:00:41 PM
} Subject: [Microscopy] RE: LM - Confocal Opinions
}
}
}
}
}
----------------------------------------------------------------------------
} The Microscopy ListServer -- CoSponsor: The Microscopy Society of
} America
} To Subscribe/Unsubscribe --
http://www.microscopy.com/MicroscopyListserver
} On-Line Help http://www.microscopy.com/MicroscopyListserver/FAQ.html
}
----------------------------------------------------------------------------
}
} I own a Zeiss 510 Meta NLO and am afraid I don't understand Stephane's
} comment that the Zeiss separates the signal based on time. Perhaps
} she
} means that the system can, in real-time, separate out overlapping
} emission signals using spectral imaging. If not, perhaps she could
} expand on her comment.
}
} Thomas E. Phillips, Ph.D
} Professor of Biological Sciences
} Director, Molecular Cytology Core
} 2 Tucker Hall
} University of Missouri
} Columbia, MO 65211-7400
} 573-882-4712 (office)
} 573-882-0123 (fax)
} phillipst-at-missouri.edu
}
} http://www.biology.missouri.edu/faculty/phillips.html
} http://www.biotech.missouri.edu/mcc/
}
} -----Original Message-----
} X-from: sekkio-at-mac.com [mailto:sekkio-at-mac.com]
} Sent: Monday, December 10, 2007 2:28 PM
} To: Phillips, Thomas E.
} Subject: [Microscopy] LM - Confocal Opinions
}
}
}
}
} ------------------------------------------------------------------------
} ----
} The Microscopy ListServer -- CoSponsor: The Microscopy Society of
} America
} To Subscribe/Unsubscribe --
} http://www.microscopy.com/MicroscopyListserver
} On-Line Help http://www.microscopy.com/MicroscopyListserver/FAQ.html
} ------------------------------------------------------------------------
} ----
}
} About multiple fluorescence we got excellent results using a white
} light laser coupled to the SP5AOBS
} I think WLL is really a great advance in spectral imaging icluding
} related applications
} ciao
} Alby
} Il giorno 20/nov/07, alle ore 15:42, nizets2-at-yahoo.com ha scritto:
}
} }
} }
} }
} }
} ------------------------------------------------------------------------
} ----
} } The Microscopy ListServer -- CoSponsor: The Microscopy Society of
} } America
} } To Subscribe/Unsubscribe --
} http://www.microscopy.com/MicroscopyListserver
} } On-Line Help http://www.microscopy.com/MicroscopyListserver/FAQ.html
} }
} ------------------------------------------------------------------------
} ----
} }
} } Hi!
} }
} } I have used the previous Zeiss 510 microscope and liked it very
} } much. It is user-friendly and powerful.
} } I don't know the technical details of the Leica but in the Zeiss the
} } different wavelengthes are separated not only by filters but also in
} } time, so no read-through is possible. I must say this gives a
} } welcome level of confidence and comfort. I did a lot of triple
} } staining with great results.
} }
} } No interest blabla....
} }
} } Regards,
} } Stephane
} }
} }
} } ----- Original Message ----
} } X-from: "christopher.hayden-at-novartis.com"
} {christopher.hayden-at-novartis.com
} } }
} } To: nizets2-at-yahoo.com
} } Sent: Monday, November 19, 2007 7:28:16 PM
} } Subject: [Microscopy] LM - Confocal Opinions
} }
} }
} }
} }
} }
} ------------------------------------------------------------------------
} ----
} } The Microscopy ListServer -- CoSponsor: The Microscopy Society of
} } America
} } To Subscribe/Unsubscribe --
} http://www.microscopy.com/MicroscopyListserver
} } On-Line Help http://www.microscopy.com/MicroscopyListserver/FAQ.html
} }
} ------------------------------------------------------------------------
} ----
} }
} } Good Day, All:
} }
} } We're in the fortunate position of looking around at
} } acquiring a
} } confocal microscope sometime in 2008. Before we start hearing the
} } pitches
} } from the manufacturers, we'd like to hear from the "real" world.
} } Specifically, what you have and what you think of it (ease-of-use,
} } upgrades, level of control, service and support, etc.).
} } After having a look around, it seems like the two contenders
} } for
} } us are the Zeiss 510 META NLO and the Leica TCS SP5. Flexibility is
} } key
} } for us, as it's going to have a fairly broad set of uses as both a
} } research tool and as a development tool.
} } Cost isn't critical at this point; we're basically being told
} } to
} } "get what we need". While we have people with confocal experience,
} } each is
} }
} } a little biased that the system they know is the best one.
} }
} } Thanks much!
} } -Chris
} }
} }
} }
} } ==============================Original
} } Headers==============================
of - Headers==============================



==============================Original Headers==============================
29, 20 -- From kjmorris-at-well.ox.ac.uk Thu Dec 13 09:54:02 2007
29, 20 -- Received: from morse.well.ox.ac.uk (morse.well.ox.ac.uk [129.67.44.2])
29, 20 -- by ns.microscopy.com (8.12.11.20060308/8.12.8) with ESMTP id lBDFs1fZ010828
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29, 20 -- by morse.well.ox.ac.uk with esmtp (Exim 4.52)
29, 20 -- id 1J2qNq-00064n-A7
29, 20 -- for Microscopy-at-Microscopy.Com; Thu, 13 Dec 2007 15:53:58 +0000
29, 20 -- From: "Keith Morris" {kjmorris-at-well.ox.ac.uk}
29, 20 -- To: {Microscopy-at-Microscopy.Com}
29, 20 -- Subject: FW: [Microscopy] Re: LM - Confocal Opinions
29, 20 -- Date: Thu, 13 Dec 2007 15:56:24 -0000
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==============================End of - Headers==============================




From: greggps-at-umich.edu
Date: Thu, 13 Dec 2007 15:53:47 -0600
Subject: [Microscopy] Re: LM - Confocal Opinions

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Keith does an excellent job summing up how I would respond to this
discussion. The Zeiss and Leica both have similar capabilities, no
matter which trademarked or otherwise created term (AOBS or AOTF) they
are using to describe the functions. I recommend seeing which user
format you like the best and checking reliability issues.

If you contact each vendor, they may be able to arrange for you to get
some hands-on testing on some local machines. I recommend bringing your
own sample, as any vendor can make their 'made to order' samples look
good on their machine.

In addition, be aware that each vendor has their own special image
format, which can make post-capture image viewing/processing tricky. If
one vendor has a lower price, they may make up the cost later by selling
licenses for the image viewing software for each station, versus one
license for a whole department.

Good luck,
~Gregg

Gregg Sobocinski
Imaging Specialist/Microscopist
Univeristy of Michigan, MCDB (Biology) Dept.
Ann Arbor, Michigan, USA


-----Original Message-----
X-from: kjmorris-at-well.ox.ac.uk [mailto:kjmorris-at-well.ox.ac.uk]
Sent: Thursday, December 13, 2007 11:03 AM
To: Sobocinski, Gregg

Hi All,

I did run a Leica SP2 at my old workplace [Institute of Ophthalmology,
UCL,
UK], and now we use a Zeiss 510 MetaHead at the Wellcome Institute here
in
Oxford [UK] as our confocal. I always thought an AOBS was pretty much
an
AOTF - the acousto-optical thingy being the important bit (with BS =
Beam
Splitter, TF = Tunable Filter). e.g.
http://micro.magnet.fsu.edu/primer/java/filters/aotf/index.html.

The AOBS/AOTF is standard in both these confocals (and others) to
control
laser power and excitation wavelength (i.e. select laser lines). To be
honest it's not these rather clever excitation AOBS devices that mark
these
systems out (as they work very well in both), but rather the way the
systems
deal with the emission spectra. Both the Zeiss and the Leica have user
tunable emission filters, rather than just fixed spectrum glass filters
-
Zeiss have the MetaHead and Leica have their patented prism tunable
spectral
emission filters. Leica dispense with fixed spectrum emission filters
altogether with their SP confocals, and each PMT has its own tunable
emission filter:

"The Leica SP5 features five confocal channels in parallel. Emission
selection is done for all channels and scanning techniques by Leica's SP
detectors, the only real spectral device for imaging, with tunable
emission
bands and maximum efficiency. Moreover, the high-transmission and
tunable
photongate, the Leica AOBS, fits to both scanners, avoiding all
disadvantages of dichroic mirrors - there is no better way to separate
excitation from emission."

With the Zeiss, the emission tunable MetaHead unit is fixed over one PMT
(the other two PMTs using conventional emission filters for routine
fluorochromes like DAPI, FITC, TRITC and CY5). The Zeiss offers a lot of
spectral unmixing [bleedthrough] and co-localisation analysis
software/hardware (as does Leica). Apparently these tunable filters are
a
bit more efficient (less light loss) than conventional glass filters, as
well as being far more versatile.

Overall both the Leica and Zeiss confocals offer a lot for your money
and
you wouldn't really go wrong choosing either one. Image quality is
pretty
indistinguishable between them, being as much dependent on objectives
etc..
as on the confocal scanning system, but both offer a lot in terms of
spectral unmixing, time-lapse, 3D, FRAP, FRET etc..as well as basic
confocal
imaging. Just make you specify them all in the original quote as many
modules/hardware are options and may be heavily discounted in the
original
bid (& having to find $15,000 6 months later is often a pain). I have
emailed Chris separately giving my views, and I was pretty positive
about
both confocal systems, and their support teams, over here in the UK.

Regards

Keith

-----------------------------------------------------------------

Dr Keith J Morris
Molecular Cytogenetics and Microscopy Core
The Wellcome Trust Centre for Human Genetics
Roosevelt Drive
Oxford
OX3 7BN
United Kingdom

Tel: +44 ( 0 ) 1865 287568
Email: kjmorris-at-well.ox.ac.uk
HomePage: http://www.well.ox.ac.uk/cytogenetics



We know accurately only when we know little, with knowledge doubt
increases.

- Johann Wolfgang von Goethe c1810

Although I also rather like his quotation:

We do not have to visit a madhouse to find disordered minds; our planet
is
the mental institution of the universe.





-----Original Message-----
X-from: sekkio-at-mac.com [mailto:sekkio-at-mac.com]
Sent: 13 December 2007 07:08
To: kjmorris-at-well.ox.ac.uk

HI Stephan,
I think there is a little bit of confusion. The AOBS is a programmable
beamsplitter (BS) and is, let me say, more evolute than the AOTF
(about this I remember that it was introduced by Leica on 1993
approx... I had one Leica CLSM in 1987 and they told us about this
new ugrade, well I am niot sure). More recently a AOBM - beam
modulator has been introduced for delivering selected multiple
wavelengths coming from a white light laser. This sound to be a sort
of "best couple", AOBM+white light laser. AOBS has an important impact
in wavelength selection in the detection scheme. It has to be
carefully aligned and then it prevents from undesired reflections of
the selected excitation wavelength a sort of paso doble, a gentleman
and a lady dancing a Flamenco around an imaginary Bull like in a
Corrida game... sorry for this... I think that the introduction of
AOBS was a sort of puting brain instead of muscles in fluorescence
microscopy.
All my best
Alby


Il giorno 12/dic/07, alle ore 11:30, nizets2-at-yahoo.com ha scritto:

}
}
}
}
------------------------------------------------------------------------
----
} The Microscopy ListServer -- CoSponsor: The Microscopy Society of
} America
} To Subscribe/Unsubscribe --
http://www.microscopy.com/MicroscopyListserver
} On-Line Help http://www.microscopy.com/MicroscopyListserver/FAQ.html
}
------------------------------------------------------------------------
----
}
} Good morning!
}
} The LSM510 serie introduced the AOTF, which allows the ultra-fast
} switching between different incident wavelengthes.
} This means that if you are scanning triple-stained samples, all 3
} wavelengthes are scanned sequentially (time-resolved). Well
} sequential scanning is not a revolution, the key here is the ultra-
} fast switching, which allows quasi-simultaneous ("real-time" for
} your eyes) detection of different wavelengthes without the chance of
} cross-talk.
} Now I did some research on the net and I found that Leica developped
} the same feature since 2002, although it is called AOBS ;-). I don't
} know if both systems all fully comparable though.
}
} Best regards,
}
} Stephane, male (and a nice specimen, too ;-))
}
}
}
} ----- Original Message ----
} X-from: "PhillipsT-at-missouri.edu" {PhillipsT-at-missouri.edu}
} To: nizets2-at-yahoo.com
} Sent: Monday, December 10, 2007 10:00:41 PM
} Subject: [Microscopy] RE: LM - Confocal Opinions
}
}
}
}
}
------------------------------------------------------------------------
----
} The Microscopy ListServer -- CoSponsor: The Microscopy Society of
} America
} To Subscribe/Unsubscribe --
http://www.microscopy.com/MicroscopyListserver
} On-Line Help http://www.microscopy.com/MicroscopyListserver/FAQ.html
}
------------------------------------------------------------------------
----
}
} I own a Zeiss 510 Meta NLO and am afraid I don't understand Stephane's
} comment that the Zeiss separates the signal based on time. Perhaps
} she
} means that the system can, in real-time, separate out overlapping
} emission signals using spectral imaging. If not, perhaps she could
} expand on her comment.
}
} Thomas E. Phillips, Ph.D
} Professor of Biological Sciences
} Director, Molecular Cytology Core
} 2 Tucker Hall
} University of Missouri
} Columbia, MO 65211-7400
} 573-882-4712 (office)
} 573-882-0123 (fax)
} phillipst-at-missouri.edu
}
} http://www.biology.missouri.edu/faculty/phillips.html
} http://www.biotech.missouri.edu/mcc/
}
} -----Original Message-----
} X-from: sekkio-at-mac.com [mailto:sekkio-at-mac.com]
} Sent: Monday, December 10, 2007 2:28 PM
} To: Phillips, Thomas E.
} Subject: [Microscopy] LM - Confocal Opinions
}
}
}
}
}
------------------------------------------------------------------------
} ----
} The Microscopy ListServer -- CoSponsor: The Microscopy Society of
} America
} To Subscribe/Unsubscribe --
} http://www.microscopy.com/MicroscopyListserver
} On-Line Help http://www.microscopy.com/MicroscopyListserver/FAQ.html
}
------------------------------------------------------------------------
} ----
}
} About multiple fluorescence we got excellent results using a white
} light laser coupled to the SP5AOBS
} I think WLL is really a great advance in spectral imaging icluding
} related applications
} ciao
} Alby
} Il giorno 20/nov/07, alle ore 15:42, nizets2-at-yahoo.com ha scritto:
}
} }
} }
} }
} }
}
------------------------------------------------------------------------
} ----
} } The Microscopy ListServer -- CoSponsor: The Microscopy Society of
} } America
} } To Subscribe/Unsubscribe --
} http://www.microscopy.com/MicroscopyListserver
} } On-Line Help http://www.microscopy.com/MicroscopyListserver/FAQ.html
} }
}
------------------------------------------------------------------------
} ----
} }
} } Hi!
} }
} } I have used the previous Zeiss 510 microscope and liked it very
} } much. It is user-friendly and powerful.
} } I don't know the technical details of the Leica but in the Zeiss the
} } different wavelengthes are separated not only by filters but also in
} } time, so no read-through is possible. I must say this gives a
} } welcome level of confidence and comfort. I did a lot of triple
} } staining with great results.
} }
} } No interest blabla....
} }
} } Regards,
} } Stephane
} }
} }
} } ----- Original Message ----
} } X-from: "christopher.hayden-at-novartis.com"
} {christopher.hayden-at-novartis.com
} } }
} } To: nizets2-at-yahoo.com
} } Sent: Monday, November 19, 2007 7:28:16 PM
} } Subject: [Microscopy] LM - Confocal Opinions
} }
} }
} }
} }
} }
}
------------------------------------------------------------------------
} ----
} } The Microscopy ListServer -- CoSponsor: The Microscopy Society of
} } America
} } To Subscribe/Unsubscribe --
} http://www.microscopy.com/MicroscopyListserver
} } On-Line Help http://www.microscopy.com/MicroscopyListserver/FAQ.html
} }
}
------------------------------------------------------------------------
} ----
} }
} } Good Day, All:
} }
} } We're in the fortunate position of looking around at
} } acquiring a
} } confocal microscope sometime in 2008. Before we start hearing the
} } pitches
} } from the manufacturers, we'd like to hear from the "real" world.
} } Specifically, what you have and what you think of it (ease-of-use,
} } upgrades, level of control, service and support, etc.).
} } After having a look around, it seems like the two contenders
} } for
} } us are the Zeiss 510 META NLO and the Leica TCS SP5. Flexibility is
} } key
} } for us, as it's going to have a fairly broad set of uses as both a
} } research tool and as a development tool.
} } Cost isn't critical at this point; we're basically being told
} } to
} } "get what we need". While we have people with confocal experience,
} } each is
} }
} } a little biased that the system they know is the best one.
} }
} } Thanks much!
} } -Chris
} }
} }
} }
} } ==============================Original
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29, 20 -- From kjmorris-at-well.ox.ac.uk Thu Dec 13 09:54:02 2007
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29, 20 -- From: "Keith Morris" {kjmorris-at-well.ox.ac.uk}
29, 20 -- To: {Microscopy-at-Microscopy.Com}
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39, 25 -- From greggps-at-umich.edu Thu Dec 13 15:53:47 2007
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From: zhouda-at-umsl.edu
Date: Thu, 13 Dec 2007 21:20:16 -0600
Subject: [Microscopy] viaWWW: Searching for an used Ultramicrotme for cutting TEM

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Email: zhouda-at-umsl.edu
Name: Dan Zhou

Title-Subject: [Filtered] Searching for an used Ultramicrotme for cutting TEM sections

Question: Dear All,

Our Electron Image and Spectroscopy Technique Lab is looking for an used ultramicrotome to cut TEM thin sections.

Please let me know If anyone is selling or giving away an used ultramicrotome.

Thank you very much for any leads,

Dan

Associate Research Professor and Laboratory Manager, Center for Nanoscience William L. Clay Building University of Missouri-St. Louis One University Boulevard St. Louis, Missouri 63121

Phone: 314-516-4627
Fax: 314-516-4628
E-mail: zhouda-at-umsl.edu


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From: lcgould-at-med.cornell.edu
Date: Fri, 14 Dec 2007 08:34:39 -0600
Subject: [Microscopy] RE: LM - Confocal Opinions- Zeiss and Leica should have

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

To address Gregg's comment about proprietary formats....
As a long-time Zeiss user I am appreciative of the fact that Zeiss
makes a reduced, free-ware version of the LSM software, called Image
Browser, available as a download from their website. This allows
viewing of the images as well as some minor adjustments AND export of
the images into a variety of formats including 8, 12 or 16-bit Tifs.

Just a satisfied Zeiss customer...
Lee



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From: dac-at-research.umass.edu
Date: Fri, 14 Dec 2007 14:41:12 -0600
Subject: [Microscopy] Re: Searching for used Ultramicrotme

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Hi Dan,

Be careful what you take on. I have just found that Leica no longer
provides service or parts for the Ultracut E and other models. Check
with the vendor to make sure what you are getting will be useful.

Also, I am curious if anyone knows of after-market service for the
"abandoned" Ultracut models - like the Ultracut, and Ultracut E. Please
share with the list, vendors welcome.

Thanks,

Dale Callaham
Central Microscopy Facility
University of Massachusetts at Amherst



zhouda-at-umsl.edu wrote:
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} Email: zhouda-at-umsl.edu
} Name: Dan Zhou
}
} Title-Subject: [Filtered] Searching for an used Ultramicrotme for cutting TEM sections
}
} Question: Dear All,
}
} Our Electron Image and Spectroscopy Technique Lab is looking for an used ultramicrotome to cut TEM thin sections.
}
} Please let me know If anyone is selling or giving away an used ultramicrotome.
}
} Thank you very much for any leads,
}
} Dan
}
} Associate Research Professor and Laboratory Manager, Center for Nanoscience William L. Clay Building University of Missouri-St. Louis One University Boulevard St. Louis, Missouri 63121
}
} Phone: 314-516-4627
} Fax: 314-516-4628
} E-mail: zhouda-at-umsl.edu
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} ==============================Original Headers==============================
} 11, 12 -- From zaluzec-at-microscopy.com Thu Dec 13 21:20:16 2007
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==============================Original Headers==============================
8, 22 -- From dac-at-research.umass.edu Fri Dec 14 14:41:12 2007
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From: qxing-at-ameslab.gov
Date: Mon, 17 Dec 2007 07:43:20 -0600
Subject: [Microscopy] viaWWW: Rhombic shape of TEM SAD spots

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Thank you very much for your comments Dale!

-----Original Message-----
X-from: Dale Callaham [mailto:dac-at-research.umass.edu]
Sent: Friday, December 14, 2007 2:43 PM
To: Microscopy Listserver; Zhou, Dan

This Question/Comment was submitted to the Microscopy Listserver
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Email: qxing-at-ameslab.gov
Name: Qingfeng Xing

Organization: Ames Lab

Title-Subject: [Filtered] Rhombic shape of TEM SAD spots

Question: The TEM SAD spots of an alloy show rhombic shape, rather than normal round shape. Could anyone give some comments or references on the origin of the shape? Due to the arrangement of electron or nuclei?

In some oxides such as PbO, the diffraction spots show strong streaks (looks somehow rhombic) at low temperatures because of the disorder of electrons (thank Prof Philippe Buffat for kind explanation). All the reports on charge ordering on my hands are on oxides. I have not found similar reports on alloys. Does anyone know the relating literature in alloys?

Thank you
Qingfeng

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From: allison.van-de-meene-at-bbsrc.ac.uk
Date: Mon, 17 Dec 2007 07:44:14 -0600
Subject: [Microscopy] viaWWW: Cryo techniques course April 2008

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Email: allison.van-de-meene-at-bbsrc.ac.uk
Name: Allison van de Meene

Organization: Rothamsted Research, BBSRC Institute UK

Title-Subject: [Filtered] Cryo techniques course April 2008

Question: A course in sample preparation and cryo-microscopy techniques for both scanning and transmission electron microscopy will be held at Rothamsted Research in Harpenden, UK from 6-11th April 2008.
Techniques covered will include the Tokuyasu method, rapid freezing of samples, freeze substitution, cryosectioning, thin film TEM, cryo-transfer and freeze fracture cryo-SEM. Attendees will have the opportunity to use state of the art equipment and instrumentation from a range of manufacturers. The format will include tutorials, demonstrations and hands-on practical sessions led by technical experts. Key speakers will supplement the techniques taught.
Rothamsted Research has excellent air, rail and road links. Accommodation for 5 nights and all meals are included in the course fee. Please see the attached flyer and for further information please visit: www.rms.org.uk Or contact Victoria Lee
Tel: +44 (0)1865 254769
Email: victoria-at-rms.org.uk
Thank you,

Dr. Allison van de Meene
Head of Bioimaging
Centre for Bioimaging
Plant Pathogen and Microbiology Department Rothamsted Research Harpenden Hertfordshire AL5 2JQ UK

Tel: +44 1582 763133 ext 2285
Fax: +44 1582 760981
Email: allison.van-de-meene-at-bbsrc.ac.uk http://www.rothamsted.bbsrc.ac.uk/

===================================
Rothamsted Research is a company limited by guarantee, registered in England at the above address under the registration num

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From: Yanling.Ge-at-tkk.fi
Date: Mon, 17 Dec 2007 07:44:53 -0600
Subject: [Microscopy] viaWWW: about commercial plasma cleaner

Contents Retrieved from Microscopy Listserver Archives
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Email: Yanling.Ge-at-tkk.fi
Name: Yanling Ge

Organization: Helsinki University of Technology

Title-Subject: [Filtered] about commercial plasma cleaner

Question: Dear microscopist,

Our lab is going to buy a plasma cleaner for our Tecnai F20 TEM. The price about several commercial product, SPI, SBT, Fischione, Gatan, can be from 12K to over 50K. Is the technology is really so superior in these high price product? Could someone give some guidance for selection of plasma cleaner?

Thannks in advance!

Yanling Ge

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From: greggps-at-umich.edu
Date: Mon, 17 Dec 2007 08:23:14 -0600
Subject: [Microscopy] Re: Searching for used Ultramicrotme

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Such cautions are useful, but many of us can tell you that there's not
much like the original Ultracut microtomes for durability. You really
have to abuse them to need anything more than a belt replacement and an
occasional cleaning and regreasing. If you have just a little mechanical
inclination, or know someone who does, I'd recommend most Ultracuts for
your lab.

I just opened up an early model Ultracut that looks like it has been
dropped off a table, amongst other abuses. I opened it up to find the
internals in excellent condition (after the plastic was swept aside) and
only a belt needs replacing.

Regards,
~Gregg (Who does not have any commercial affiliations to this product,
but has experience with multiple A/O Ultracuts and Reichiert Ultracut
Es.)

Gregg Sobocinski
Imaging Specialist/Microscopist
Univeristy of Michigan
Ann Arbor, Michigan
USA

-----Original Message-----
X-from: dac-at-research.umass.edu [mailto:dac-at-research.umass.edu]
Sent: Friday, December 14, 2007 3:50 PM
To: Sobocinski, Gregg

Hi Dan,

Be careful what you take on. I have just found that Leica no longer
provides service or parts for the Ultracut E and other models. Check
with the vendor to make sure what you are getting will be useful.

Also, I am curious if anyone knows of after-market service for the
"abandoned" Ultracut models - like the Ultracut, and Ultracut E. Please
share with the list, vendors welcome.

Thanks,

Dale Callaham
Central Microscopy Facility
University of Massachusetts at Amherst



zhouda-at-umsl.edu wrote:
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}
} Title-Subject: [Filtered] Searching for an used Ultramicrotme for
cutting TEM sections
}
} Question: Dear All,
}
} Our Electron Image and Spectroscopy Technique Lab is looking for an
used ultramicrotome to cut TEM thin sections.
}
} Please let me know If anyone is selling or giving away an used
ultramicrotome.
}
} Thank you very much for any leads,
}
} Dan
}
} Associate Research Professor and Laboratory Manager, Center for
Nanoscience William L. Clay Building University of Missouri-St. Louis
One University Boulevard St. Louis, Missouri 63121
}
} Phone: 314-516-4627
} Fax: 314-516-4628
} E-mail: zhouda-at-umsl.edu
}
}
} Login Host: 134.124.125.224
}
------------------------------------------------------------------------
---
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} 11, 12 -- Subject: viaWWW: Searching for an used Ultramicrotme for
cutting TEM
} 11, 12 -- sections
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==============================Original
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8, 22 -- From dac-at-research.umass.edu Fri Dec 14 14:41:12 2007
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16, 25 -- From greggps-at-umich.edu Mon Dec 17 08:23:14 2007
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From: dac-at-research.umass.edu
Date: Mon, 17 Dec 2007 09:04:59 -0600
Subject: [Microscopy] Re: viaWWW: about commercial plasma cleaner

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Hi Yanling,

The technology is actually fairly simple. The problem is that it must be
built, and someone takes responsibility for the line voltage and HV
potential hazards, etc., etc. I have, use, and love our Harrick plasma
cleaner. It is wonderful and easy to use. I saw someone mention a price
on the list recently for the Harrick at ~$2500USD - I don't know if that
is accurate. Buy what you can, and build what you MUST.

IF you are using it to just "glow discharge" grids to make carbon
wettable you don't really need the high cleaning power levels of some of
the expensive units - I always operate the Harrick at the low power
setting for 10 - 30s.

Simply, a plasma is a plasma for the purpose at hand; it is the same as
a glow discharge. Residual air (at ~ 0.1 torr) is ripped apart by the
energy source and the activated molecules do the work. There are
different ways of generating a plasma: High Voltage AC or DC,
capacitively coupled RF, and inductively coupled RF (the Harrick does
this). The Harrick is simply an oscillator with the chamber sitting
inside the inductor; the RF field down the center of the solenoid (at ~
13.56MHz, I think) provides the energy. It is an extremely simple vacuum
tube circuit - the tubes cost about $8 (usd) each. Again, the Harrick
unit is well built and works well straight out of the box; we have had
ours for years.

I can send some information I have collected on glow-discharge and
plasmas if you are interested.

Cheers,

Dale Callaham
The University of Massachusetts at Amherst

Yanling.Ge-at-tkk.fi wrote:
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} Email: Yanling.Ge-at-tkk.fi
} Name: Yanling Ge
}
} Organization: Helsinki University of Technology
}
} Title-Subject: [Filtered] about commercial plasma cleaner
}
} Question: Dear microscopist,
}
} Our lab is going to buy a plasma cleaner for our Tecnai F20 TEM. The price about several commercial product, SPI, SBT, Fischione, Gatan, can be from 12K to over 50K. Is the technology is really so superior in these high price product? Could someone give some guidance for selection of plasma cleaner?
}
} Thannks in advance!
}
} Yanling Ge
}
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} ==============================Original Headers==============================
} 9, 11 -- From zaluzec-at-microscopy.com Mon Dec 17 07:44:52 2007
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} 9, 11 -- Subject: viaWWW: about commercial plasma cleaner
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==============================Original Headers==============================
8, 22 -- From dac-at-research.umass.edu Mon Dec 17 09:04:58 2007
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8, 22 -- Date: Mon, 17 Dec 2007 10:06:49 -0500
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From: dac-at-research.umass.edu
Date: Mon, 17 Dec 2007 09:49:29 -0600
Subject: [Microscopy] Searching for used Ultramicrotome-Cautions about

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

I agree with this advice fully. The key is "original Ultracut". The
Ultracuts got progressively more complicated over time. The Ultracut (no
letter) is a very basic design that would be easy to maintain; it is an
analog servo-motor speed control, and fully mechanical (no steppers,
etc) advance; an advanced user or shop could maintain this. The "E" got
more "digital" and while they did supply schematics, the motors and
logic will be more difficult for a user to deal with. The "S" is more
advanced electronically, uses a microcontroller, and has advanced
features like an optical encoder plate for the cutting zone
determination, and this line would be more difficult to maintain without
schematics, and the special parts would be difficult to obtain if Leica
ever drops support for it.

So yes, the "original" Ultracut is the one for the ages....

And I would like to thank all who posted the information about
MOC (Microscopical Optical Consulting Inc.) in Valley Cottage, NY,
for aftermarket microtome service! Thank You!

MOC
Helmut Patzig
Ph: 845-268-6450
Fax: 845-268-0172

Dale

greggps-at-umich.edu wrote:
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}
} Such cautions are useful, but many of us can tell you that there's not
} much like the original Ultracut microtomes for durability. You really
} have to abuse them to need anything more than a belt replacement and an
} occasional cleaning and regreasing. If you have just a little mechanical
} inclination, or know someone who does, I'd recommend most Ultracuts for
} your lab.
}
} I just opened up an early model Ultracut that looks like it has been
} dropped off a table, amongst other abuses. I opened it up to find the
} internals in excellent condition (after the plastic was swept aside) and
} only a belt needs replacing.
}
} Regards,
} ~Gregg (Who does not have any commercial affiliations to this product,
} but has experience with multiple A/O Ultracuts and Reichiert Ultracut
} Es.)
}
} Gregg Sobocinski
} Imaging Specialist/Microscopist
} Univeristy of Michigan
} Ann Arbor, Michigan
} USA
}
} -----Original Message-----
} X-from: dac-at-research.umass.edu [mailto:dac-at-research.umass.edu]
} Sent: Friday, December 14, 2007 3:50 PM
} To: Sobocinski, Gregg
} Subject: [Microscopy] Re: Searching for used Ultramicrotme
}
}
} ------------------------------------------------------------------------
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} America
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} http://www.microscopy.com/MicroscopyListserver
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} ------------------------------------------------------------------------
} ----
}
} Hi Dan,
}
} Be careful what you take on. I have just found that Leica no longer
} provides service or parts for the Ultracut E and other models. Check
} with the vendor to make sure what you are getting will be useful.
}
} Also, I am curious if anyone knows of after-market service for the
} "abandoned" Ultracut models - like the Ultracut, and Ultracut E. Please
} share with the list, vendors welcome.
}
} Thanks,
}
} Dale Callaham
} Central Microscopy Facility
} University of Massachusetts at Amherst
}
}
}
} zhouda-at-umsl.edu wrote:
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} } Email: zhouda-at-umsl.edu
} } Name: Dan Zhou
} }
} } Title-Subject: [Filtered] Searching for an used Ultramicrotme for
} cutting TEM sections
} } Question: Dear All,
} }
} } Our Electron Image and Spectroscopy Technique Lab is looking for an
} used ultramicrotome to cut TEM thin sections.
} } Please let me know If anyone is selling or giving away an used
} ultramicrotome.
} } Thank you very much for any leads,
} }
} } Dan
} }
} } Associate Research Professor and Laboratory Manager, Center for
} Nanoscience William L. Clay Building University of Missouri-St. Louis
} One University Boulevard St. Louis, Missouri 63121
} }
} } Phone: 314-516-4627
} } Fax: 314-516-4628
} } E-mail: zhouda-at-umsl.edu
} }
} }
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} }
} } ==============================Original
} Headers==============================
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} } 11, 12 -- From: zhouda-at-umsl.edu (by way of MicroscopyListserver)
} } 11, 12 -- Subject: viaWWW: Searching for an used Ultramicrotme for
} cutting TEM
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} 8, 22 -- From: Dale Callaham {dac-at-research.umass.edu}
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} 16, 25 -- References: {200712142050.lBEKoFSK021171-at-ns.microscopy.com}
} 16, 25 -- From: "Sobocinski, Gregg" {greggps-at-umich.edu}
} 16, 25 -- To: {microscopy-at-microscopy.com}
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From: oguocha-at-yahoo.com
Date: Tue, 18 Dec 2007 18:50:36 -0600
Subject: [Microscopy] Etchants for 6XXX aluminum alloys

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Hello Listers:

Does anyone know of any other good etchant(s) other than Keller's and Barker's
reagents for 6xxx aluminum alloys? Our interest is in grain size measurement.

Also, does any one know any outlet that sells ready-made Keller's etchant? We
do not want to mix the chemicals by ourselves due to some local restrictions.

Please, contact me privately if you market Keller's etchant.

Thanks for your anticipated assistance.

Ike Oguocha


Department of Mechanical Engineering
57 Campus Drive
University of Saskatchewan
Saskatoon, SK, S7N 5A9, Canada

Phone: (306)966-7832
Fax: (306)966-5427


___________________________________________________________
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11, 20 -- From: Ike Oguocha {oguocha-at-yahoo.com}
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From: gary-at-gaugler.com
Date: Tue, 18 Dec 2007 19:35:03 -0600
Subject: [Microscopy] Re: Etchants for 6XXX aluminum alloys

Contents Retrieved from Microscopy Listserver Archives
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If you have EBSD, a polished sample should produce
nice grain info. Etching enhances FSD images.
I do many Al films and solids without any etching
other than DI water.

gary g.


At 04:53 PM 12/18/2007, you wrote:
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From: dsherman-at-purdue.edu
Date: Tue, 18 Dec 2007 20:12:27 -0600
Subject: [Microscopy] EELS information

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Hi All,

I have a couple of general questions about the use of EELS in certain
experimental situations. I would appreciate comments on the feasibility of
identifying elements using this technique in the following scenarios:

In certain situations, cells can be influenced so that there is a rapid
influx of Ca. This can be seen and documented using confocal microscopy.
Would it be possible to capture the Ca++ distribution in the cells with
greater resolution if cells were treated to induce the Ca++ influx and then
immediately subjected to high pressure freezing? They would be FS and resin
embedded prior to TEM analysis with EELS.

There is a theory that, also under certain conditions, zinc will enter the
cells via Ca++ channels. Would it be possible to pick up the Zn++ using
EELS?

Is it possible to simultaneously do a standard tomogram and also an EELS
tomogram so that the two could be superimposed?

Any references documenting transient ion flux using EELS would be greatly
appreciated as would any comments from those experienced using the
technique.

Thanks,
Debby


Debby Sherman, Director Phone: 765-494-6666
Life Science Microscopy Facility FAX: 765-494-5896
Purdue University E-mail: dsherman-at-purdue.edu
S-052 Whistler Building
170 S. University Street
West Lafayette, IN 47907
http://www.agriculture.purdue.edu/microscopy



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From: michael-at-shaffer.net
Date: Wed, 19 Dec 2007 05:02:49 -0600
Subject: [Microscopy] Ni in carbon dots

Contents Retrieved from Microscopy Listserver Archives
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In case some of you believe all carbon substrates are manufactured to be
free of x-ray spectral peaks, I just discovered small nickel wire in a type
of "ultra-smooth" double-sticky carbon dots. My impression is that it is
needed to make the surface smooth. I won't reveal the manufacturer here,
and I'll admit they work relatively well for background-free imaging, but if
users require their carbon substrates to be contaminant-free they should
check their stock or ask before purchasing.

holidays' cheerios :o)
michael shaffer
Memorial University
St. John's Newfoundland


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From: andreana782-at-yahoo.com.tw
Date: Wed, 19 Dec 2007 07:53:52 -0600
Subject: [Microscopy] viaWWW: elemental composition measurements

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Email: andreana782-at-yahoo.com.tw
Name: Jean Chen

Title-Subject: [Filtered] elemental composition

Question:
I was wondering if anyone can give a comment on which analytical tool can give the best composition ratio of the solid materials. As far as I know, RBS can determine the composition of bulk sample. XPS can determine the composition of the surface. Does anyone know which one can give a more acurate composition? By the way, RBS should be a non-destructive tool or a destructive tool?

Thank you!

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From: nagashim-at-ncifcrf.gov
Date: Wed, 19 Dec 2007 08:06:46 -0600
Subject: [Microscopy] Position Open

Contents Retrieved from Microscopy Listserver Archives
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SAIC Frederick, Inc., the operations and technical support contractor
for the National Cancer Institute-Frederick, in Frederick, MD, has an
excellent opportunity for a Research Associate III to support our
Electron Microscopy Facility. You will independently examine biological
samples in the EM, identify sub-cellular structures, take images with a
digital camera, communicate with a lab manager and users, and write the
report. In addition, may require some administrative duties including
order/maintaining laboratory supplies, prepare monthly billing, maintain
sample log book, assist and coordinate users/investigators/fellow
workers and lab manager. EM samples will be processed according to
GLP/GMP protocol, and you will assist and coordinate the process with
other program scientists, and keep accurate records.

A Bachelor's degree from an accredited college/university in a field
related to biomedical research or four (4) years equivalent experience
in the appropriate field in lieu of degree. is required. Foreign
educated candidates who have completed part or all of their education
outside of the United States must have their foreign education evaluated
by an SAIC-approved accrediting organization to assure that it has met
the equivalency of the qualifications of degree work in the United
States. In addition to educational requirements, at least 8 years
related laboratory experience required. Must have comprehensive
knowledge and ability to operate scientific instruments in the EM core
facility such as transmission (TEM), scanning electron microscope (SEM)
and other instruments (e.g. vacuum evaporator and ultra-microtome) and
able to do sample processing and digital imaging. Requires computer
skills (e.g. Microsoft Office, Image software). This position is
subject to obtaining a Public Trust Clearance. Knowledge of Hitachi TEM
and SEM desirable and understanding the GLP/GMP procedures is a plus.
Experience in prior supervisory position or leadership also preferred.
Excellent salary and benefits accompany our position. For immediate
consideration, please apply online for position #103978 at our website:
www.saic.com


Kunio Nagashima [Contractor]
Manager, Electron Microscope Facility
Image Analysis Laboratory
NCI-Frederick, SAIC Frederick
P.O. Box B, Bldg. 538, Room 124.
Frederick, MD 21702-1201
nagashim-at-mail.ncifcrf.gov
Phone: 301-846-1594
FAX: 301-846-6716


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From: zaluzec-at-microscopy.com
Date: Wed, 19 Dec 2007 08:11:37 -0600
Subject: [Microscopy] Re: Ni in carbon dots

Contents Retrieved from Microscopy Listserver Archives
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Michael

This can be an important issue. Is the wire magnetic?
Or is it a non-magnetic alloy? Try putting the dots
next to a strong magnet and see if they stick. I
would be concerned if the wire could be magnetized
and then adversely affect high res imaging as well as elemental
microanalysis.

Can I suggest that you contact the vendor and
find out if this was a one time event (i.e. the wrong
wire was used in a batch) or if this is standard procedure.

If it is standard, it would be appropriate for the vendor
to comment on this of his/her own accord on this forum.


Nestor
Your Friendly Neighborhood SysOp




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From: scoyle-at-gatan.com
Date: Wed, 19 Dec 2007 11:52:58 -0600
Subject: [Microscopy] RE: viaWWW: about commercial plasma cleaner

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

In principle RBS is non-destructive. But it really depends on:
1) what kind of beam is used and what current
2) what type of specimen is analyzed
It might happen that fragile specimens would be destroyed by ion beam of
typically used alpha particle beam. On the other hand, proton beam of low
current can be used to analyse some very fragile specimens which can be
destroyed even when pumping experimental chamber before measurements.
Careful pumping and careful measurements would leave such specimens intact -
i.e. the technique is non-destructive in such cases.

RBS can certainly give accurate composition of major elements with ca. 5%
error or similar.

I do not have experience with XPS.

What kind of specimens do you have?

Regards

Wojciech Przybylowicz

----- Original Message -----
X-from: {andreana782-at-yahoo.com.tw}
To: {przybylowicz-at-tlabs.ac.za}
Sent: Wednesday, December 19, 2007 3:54 PM


Dear Yanling,

While it is reasonably straightforward to generate a plasma, there are
important factors that can affect TEM samples.

The first is gas chemistry. A plasma creates a wide variety of ions and
radicals. Most of the important chemistry is the result of radicals. While
oxygen radicals are the most important species involved in removing
hydrocarbons from sample surfaces, other species and ions can be
significant. Many vendors recommend high purity gases rather than air so
that the gas chemistry can be controlled. A common gas chemistry is Ar-O2.
Argon is not reactive and can affect the sample only by ballistic impact. In
a poorly tuned or designed system positively charged Ar ions can damage thin
specimens and sometimes sputter material from holders. Replacing Ar with H2,
for instance, results in much lighter positive ions that do not damage
specimens or holders. In addition, the design of the system affects how much
energy the ions have, and thus how likely they are to damage your specimen.

The second major factor is tool automation. More automated systems, if well
designed, can result in more consistent results. For instance, the output
impedance of the RF power source should be matched to the impedance of the
chamber/plasma. Some systems have an auto-matching network that insures that
power is delivered efficiently to the plasma, rather than being reflected
back due to an impedance mismatch. Systems that rely on manually matching
the impedance are prone to user errors that can dramatically affect cleaning
efficiency. Likewise, if the gas flow is set manually, there is a danger
that untrained users can get poor results. For example, if the gas flow
(thus pressure) is too low then the mean free path of positive ions is
increased. This may result in increased sputtering of the specimen.

I think a sophisticated user can get good results from an inexpensive
system. What you should get from a more expensive system is more flexibility
and more consistent results. TEM specimens can be quite precious. Every
facility has to weigh the costs/benefits against the risk of damaging
specimens.

Best regards,
Steve Coyle

Disclaimer: Gatan manufactures a high-end plasma cleaner, which we
developed because of the reasons mentioned above.

=========================================
Steven T. Coyle, Ph.D.
Gatan Inc.
5794 W. Las Positas Blvd.
Pleasanton, CA 94588
Direct (925) 224 7383
Fax (925) 463 0204
E-mail scoyle-at-gatan.com
=========================================


Yanling.Ge-at-tkk.fi wrote:
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} Email: Yanling.Ge-at-tkk.fi
} Name: Yanling Ge
}
} Organization: Helsinki University of Technology
}
} Title-Subject: [Filtered] about commercial plasma cleaner
}
} Question: Dear microscopist,
}
} Our lab is going to buy a plasma cleaner for our Tecnai F20 TEM. The
price about several commercial product, SPI, SBT, Fischione, Gatan, can be
from 12K to over 50K. Is the technology is really so superior in these high
price product? Could someone give some guidance for selection of plasma
cleaner?
}
} Thannks in advance!
}
} Yanling Ge
}
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From: bigelow-at-umich.edu
Date: Wed, 19 Dec 2007 14:18:16 -0600
Subject: [Microscopy] RE:Etchants for Al

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

If you can get hold of a copy of the 1948 edition of the Metals
Handbook (published by the ASM) you can find two pages of information
on etching aluminum alloys (pp. 800-801). Probably similar
information is contained in the more recent editions, too.

Some of the simpler etchants include: 0.5 ml HF in 99.5 ml water; 1
g NaOH in 99 ml water; 10 g NaOH in 90 ml water; 20 ml conc
sulfuric acid in 80 ml water; 25 ml conc nitric acid in 75 ml water.

Have fun, life is short,
WCB
--
Wilbur C. Bigelow, Professor Emeritus
Materials Sci. & Engr., Univ. of Michigan
Ann Arbor, Michigan 48109-2136
e-mail: bigelow-at-umich.edu;
Fx:734-763-4788; Ph:734-975-0858
Address mail to: 2911 Whittier Court
Ann Arbor, MI 48104-6731

==============================Original Headers==============================
3, 14 -- From bigelow-at-umich.edu Wed Dec 19 14:18:15 2007
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3, 14 -- Subject: [Microscopy]RE:Etchants for Al
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From: ph2-at-sprynet.com
Date: Wed, 19 Dec 2007 14:34:43 -0600
Subject: [Microscopy] RE:Etchants for Al

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Better yet, try:

Petzow, Gunter: Metallographic Etching, 2nd ed. ASM, Materials Park, OH.
1999.

Specifically Pages 57-64.



Tony

ps ASM was having a sale on this book.


......................................................................
Andrew Anthony "Tony" Havics, CHMM, CIH, PE
pH2, LLC
5250 E US 36, Suite 830
Avon, IN 46123
(317) 718-7020 off
(317) 718-7038 fax
(317) 409-3238 cell

90% of Risk Management is knowing where to place the decimal point...any
consultant can give you the other 10%(SM)

This message is from pH2. This message and any attachments may contain
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-----Original Message-----
X-from: bigelow-at-umich.edu [mailto:bigelow-at-umich.edu]
Sent: Wednesday, December 19, 2007 3:23 PM
To: ph2-at-sprynet.com

If you can get hold of a copy of the 1948 edition of the Metals
Handbook (published by the ASM) you can find two pages of information
on etching aluminum alloys (pp. 800-801). Probably similar
information is contained in the more recent editions, too.

Some of the simpler etchants include: 0.5 ml HF in 99.5 ml water; 1
g NaOH in 99 ml water; 10 g NaOH in 90 ml water; 20 ml conc
sulfuric acid in 80 ml water; 25 ml conc nitric acid in 75 ml water.

Have fun, life is short,
WCB
--
Wilbur C. Bigelow, Professor Emeritus
Materials Sci. & Engr., Univ. of Michigan
Ann Arbor, Michigan 48109-2136
e-mail: bigelow-at-umich.edu;
Fx:734-763-4788; Ph:734-975-0858
Address mail to: 2911 Whittier Court
Ann Arbor, MI 48104-6731

==============================Original Headers==============================
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From: greggps-at-umich.edu
Date: Wed, 19 Dec 2007 15:30:03 -0600
Subject: [Microscopy] Does arc lamp ignition really damage electronics via EMF emission?

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Fluorescence Micrscopists and Vendors:
I've been searching for actual published material to support the
industry standard that requires igniting (turning on) mercury or xenon
arc lamps PRIOR to turning on electronic microscopes or computer
systems. Highly respectable microscopists have informed me that the
electromagnetic fields (EMFs) produced by the intense 'welder's arc'
spark can damage microchips and computer monitors nearby.

Does anyone have hard, fast evidence or direct experience to support
this behavior? When consulting an information technology (IT) specialist
about EMFs and computers, he says it will occasionally create problems
on a computer monitor that is easily fixed by degaussing, and it can
wipe temporary memory such as flash drives. Again, no permanent damage,
but something to consider.

If so, how far would one need to keep the electronics from the arc lamp?
I suspect that behavior is being dictated by a fear of the high expense
in case there truly is a risk, but I don't want to perpetuate paranoia
and extra lamp hours when not necessary. For example, my previous job
didn't encourage the arc lamp being turned on first, and I don't recall
any electronics issues attributed to such 'reckless behavior'.

Regards,
~Gregg

Gregg Sobocinski
Imaging Specialist/Microscopist
Univeristy of Michigan, MCDB Dept.
Ann Arbor, Michigan
USA




==============================Original Headers==============================
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From: agustinvictor-at-gmail.com
Date: Wed, 19 Dec 2007 15:33:25 -0600
Subject: [Microscopy] unsubscribe

Contents Retrieved from Microscopy Listserver Archives
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From: Elliott-at-arizona.edu
Date: Wed, 19 Dec 2007 15:53:14 -0600
Subject: [Microscopy] Re: Does arc lamp ignition really damage electronics via EMF emission?

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Hi have been wondering about this. It seems that the EMF from
starting the lamp is one possible reason for computer problems (if in-
fact there are computer problems). Another problem could be in the
power fluctuations that are propagated back into the house wiring.
If this is the case, then the distance of lamp to computer would be
less important that the shielding of the computer to bad power.

Any thoughts?

David



On Dec 19, 2007, at 2:33 PM, greggps-at-umich.edu wrote:

}
}
}
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} The Microscopy ListServer -- CoSponsor: The Microscopy Society of
} America
} To Subscribe/Unsubscribe -- http://www.microscopy.com/
} MicroscopyListserver
} On-Line Help http://www.microscopy.com/MicroscopyListserver/FAQ.html
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}
} Fluorescence Micrscopists and Vendors:
} I've been searching for actual published material to support the
} industry standard that requires igniting (turning on) mercury or xenon
} arc lamps PRIOR to turning on electronic microscopes or computer
} systems. Highly respectable microscopists have informed me that the
} electromagnetic fields (EMFs) produced by the intense 'welder's arc'
} spark can damage microchips and computer monitors nearby.
}
} Does anyone have hard, fast evidence or direct experience to support
} this behavior? When consulting an information technology (IT)
} specialist
} about EMFs and computers, he says it will occasionally create problems
} on a computer monitor that is easily fixed by degaussing, and it can
} wipe temporary memory such as flash drives. Again, no permanent
} damage,
} but something to consider.
}
} If so, how far would one need to keep the electronics from the arc
} lamp?
} I suspect that behavior is being dictated by a fear of the high
} expense
} in case there truly is a risk, but I don't want to perpetuate paranoia
} and extra lamp hours when not necessary. For example, my previous job
} didn't encourage the arc lamp being turned on first, and I don't
} recall
} any electronics issues attributed to such 'reckless behavior'.
}
} Regards,
} ~Gregg
}
} Gregg Sobocinski
} Imaging Specialist/Microscopist
} Univeristy of Michigan, MCDB Dept.
} Ann Arbor, Michigan
} USA
}
}
}
}
} ==============================Original
} Headers==============================
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} via EMF emission?
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From: r-holdford-at-ti.com
Date: Wed, 19 Dec 2007 16:03:54 -0600
Subject: [Microscopy] Re: Does arc lamp ignition really damage electronics

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Greg: I've got a UV fluorescence microscope (w/ Hg vapor lamp) in the
same (small) room with both my SEMs and the flat panel monitor of the
imaging computer is 6 inches away from the lamp housing; I've never
noticed any interference or had any damage that I could track to the
lamp arc. (Multi-users are another story.) We have the lamp on a timer
that keeps it on about 10 hours a day, which is when most people here
are likely to use the scope. I've been running the SEMs when it turns
on and when it turns off and wouldn't have noticed if the timer hadn't
clicked.

greggps-at-umich.edu wrote:
} ----------------------------------------------------------------------------
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}
} Fluorescence Micrscopists and Vendors:
} I've been searching for actual published material to support the
} industry standard that requires igniting (turning on) mercury or xenon
} arc lamps PRIOR to turning on electronic microscopes or computer
} systems. Highly respectable microscopists have informed me that the
} electromagnetic fields (EMFs) produced by the intense 'welder's arc'
} spark can damage microchips and computer monitors nearby.
}
} Does anyone have hard, fast evidence or direct experience to support
} this behavior? When consulting an information technology (IT) specialist
} about EMFs and computers, he says it will occasionally create problems
} on a computer monitor that is easily fixed by degaussing, and it can
} wipe temporary memory such as flash drives. Again, no permanent damage,
} but something to consider.
}
} If so, how far would one need to keep the electronics from the arc lamp?
} I suspect that behavior is being dictated by a fear of the high expense
} in case there truly is a risk, but I don't want to perpetuate paranoia
} and extra lamp hours when not necessary. For example, my previous job
} didn't encourage the arc lamp being turned on first, and I don't recall
} any electronics issues attributed to such 'reckless behavior'.
}
} Regards,
} ~Gregg
}
} Gregg Sobocinski
} Imaging Specialist/Microscopist
} Univeristy of Michigan, MCDB Dept.
} Ann Arbor, Michigan
} USA
}
}
}
}
} ==============================Original Headers==============================
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--
~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~
Becky Holdford (r-holdford-at-ti.com)
972-995-2360
972-648-8743 (pager)
SC Packaging FA Development
Texas Instruments, Inc.
Dallas, TX
~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~


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From: rboehrin-at-vt.edu
Date: Wed, 19 Dec 2007 16:25:23 -0600
Subject: [Microscopy] re: damage due to EMP

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

I worked in a facility that used a xenon flash tube. The electrical pulse to
trigger the bright light was strong enough to put out a pulse that occasionally
tripped some of the encoders on the system. During a typical manufacturing run
the light flashed millions of time to draw a pattern on a photographic glass
plate. Over a long period of time the position of devices was incorrect due to
these EMP induced counts. The same may be true of laboratory equipment. In our
case the absolute position values drifted. This caused a failure in the
manufacturing procedure which was detected by a visual inspection system.
Shielding and grounding of the electrical system that powered the bulb was
sufficient to prevent these events from interfering with the rest of the
equipment.

Now that 25 years has passed chip sets have smaller geometries that are packed
tighter. This means less insulation between components and components less able
to weather damage. A fatal 'nick' in the chip wiring is substantially smaller
than it was 25 years ago.

I have no hard evidence of actual damage done to chips, but I do have first hand
experience at seeing the effect of EMP on high precision equipment.

Robert Boehringer
MS student
Virginia Tech

==============================Original Headers==============================
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From: baskin-at-bio.umass.edu
Date: Wed, 19 Dec 2007 16:32:43 -0600
Subject: [Microscopy] Re: Does arc lamp ignition really damage electronics via EMF

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Gregg,
Video microscopy got going in the early 1980's with the
inclusion of computers not far behind. In those days many people were
using 200W lamps with massive (often old) powersupplies. These things
hummed, banged, and sometimes dimmed the room lights when fired. I
suspect the newer, slimmer units, 50 and 100W, have better behaved
electronics, and cause less electrical stress. They certainly run
cooler and quieter. There is also probably a wider use of surge
protectors and related circuitry in computers. So I guess in the
early days there may have been problems but I think now could be
folklore. I have heard mercury arc explosion stories and even
witnessed one, but never heard of, let alone seen an example of, a
story where firing an arc lamp EMF'd a neighboring PC.

As ever,
Tobias

}
}
} Hi have been wondering about this. It seems that the EMF from
} starting the lamp is one possible reason for computer problems (if in-
} fact there are computer problems). Another problem could be in the
} power fluctuations that are propagated back into the house wiring.
} If this is the case, then the distance of lamp to computer would be
} less important that the shielding of the computer to bad power.
}
} Any thoughts?
}
} David
}
}
} On Dec 19, 2007, at 2:33 PM, greggps-at-umich.edu wrote:
}
} }
} }
} }
}
} } ------
} }
} } Fluorescence Micrscopists and Vendors:
} } I've been searching for actual published material to support the
} } industry standard that requires igniting (turning on) mercury or xenon
} } arc lamps PRIOR to turning on electronic microscopes or computer
} } systems. Highly respectable microscopists have informed me that the
} } electromagnetic fields (EMFs) produced by the intense 'welder's arc'
} } spark can damage microchips and computer monitors nearby.
} }
} } Does anyone have hard, fast evidence or direct experience to support
} } this behavior? When consulting an information technology (IT)
} } specialist
} } about EMFs and computers, he says it will occasionally create problems
} } on a computer monitor that is easily fixed by degaussing, and it can
} } wipe temporary memory such as flash drives. Again, no permanent
} } damage,
} } but something to consider.
} }
} } If so, how far would one need to keep the electronics from the arc
} } lamp?
} } I suspect that behavior is being dictated by a fear of the high
} } expense
} } in case there truly is a risk, but I don't want to perpetuate paranoia
} } and extra lamp hours when not necessary. For example, my previous job
} } didn't encourage the arc lamp being turned on first, and I don't
} } recall
} } any electronics issues attributed to such 'reckless behavior'.
} }
} } Regards,
} } ~Gregg
} }
} } Gregg Sobocinski
} } Imaging Specialist/Microscopist
} } Univeristy of Michigan, MCDB Dept.
} } Ann Arbor, Michigan
} } USA
} }
} }
} }
} }
} } ==============================Original
} } Headers==============================
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} } 8, 25 -- References: {200712120302.lBC32vmu030821-at-ns.microscopy.com}
} } 8, 25 -- From: "Sobocinski, Gregg" {greggps-at-umich.edu}
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} damage electronics via EMF emission?
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--
_ ____ __ ____
/ \ / / \ / \ \ Tobias I. Baskin
/ / / / \ \ \ Biology Department
/_ / __ /__ \ \ \__ 611 N. Pleasant St.
/ / / \ \ \ University of Massachusetts
/ / / \ \ \ Amherst, MA, 01003
/ / ___ / \ \__/ \ ____
http://www.bio.umass.edu/biology/baskin/
Voice: 413 - 545 - 1533 Fax: 413 - 545 - 3243

==============================Original Headers==============================
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From: tivol-at-caltech.edu
Date: Wed, 19 Dec 2007 17:49:42 -0600
Subject: [Microscopy] Re: EELS information

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html


On Dec 18, 2007, at 6:12 PM, dsherman-at-purdue.edu wrote:

} I have a couple of general questions about the use of EELS in certain
} experimental situations. I would appreciate comments on the
} feasibility of
} identifying elements using this technique in the following scenarios:
}
} In certain situations, cells can be influenced so that there is a
} rapid
} influx of Ca. This can be seen and documented using confocal
} microscopy.
} Would it be possible to capture the Ca++ distribution in the cells
} with
} greater resolution if cells were treated to induce the Ca++ influx
} and then
} immediately subjected to high pressure freezing? They would be FS
} and resin
} embedded prior to TEM analysis with EELS.
}
} There is a theory that, also under certain conditions, zinc will
} enter the
} cells via Ca++ channels. Would it be possible to pick up the Zn++
} using
} EELS?
}
} Is it possible to simultaneously do a standard tomogram and also an
} EELS
} tomogram so that the two could be superimposed?
}
} Any references documenting transient ion flux using EELS would be
} greatly
} appreciated as would any comments from those experienced using the
} technique.


Dear Debby,
A. Somlyo was able to determine Ca in muscle cells, so detection is
certainly possible, although there may be many technical difficulties
with any particular system. Somlyo, for example, had to use a second-
difference method to pull the Ca signal out of the noise. I am not
sure of what happens to Ca, Zn, or, for that matter, other ions
during freeze-substitution, but if they stay put, then EELS could
pick them up. There is little difference between Ca and Zn, although
Zn edges may be either more or less visible than Ca due to energy
difference, interference with the stain atoms, or other problems.
Rather than do simultaneous tomograms, which could be done from
position-tagged spectrum collection (a good feature of the Zeiss 912,
but maybe not available on all scopes), I would take a regular tilt
series, then make a stereo pair at the Ca and/or Zn edge--you'd have
to subtract background, so each image would require two or three
exposures, and the dose for good signal-to-noise would be higher than
for a zero-loss image. It is this requirement which would increase
the total dose necessary to get good EELS mapping and a tilt series
to the point where you might damage even a plastic section. You
could then use Sterecon, or some other program to get a 3D EELS map
from the stereo pair to match up with the higher resolution
tomogram. Good luck.
Yours,
Bill Tivol, PhD
EM Scientist
Electron Cryo-Microscopy Facility
Broad Center, Mail Code 114-96
California Institute of Technology
Pasadena CA 91125
(626) 395-8833
tivol-at-caltech.edu


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From: reinhard.rachel-at-biologie.uni-regensburg.de
Date: Thu, 20 Dec 2007 02:11:22 -0600
Subject: [Microscopy] Antw: EELS information

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

A few remarks on this topic (sorry for not having the time to look up all details).

Two people came into my mind, when reading Debby's mail and thinking about
the problem.

1. the late Karl Zierold (MPI Dortmund) was able to show that for this type of question,
rapid freezing and then imaging the freeze-dried cryo-sections (he used - not only? - the
STEM) is an adequate way for tackling this problem. Karl was not able to use tomography,
though. - The question is why not using freeze-dried (or frozen-hydrated) cryo-sections,
rather than going to FS and embedding in resin? and then also trying cryo-fluorescence
light microscopy (Anna Sartori comes into my mind)

(yes , I know, the high e-dose for EELS is a severe problem and most likely limiting)

Looking up Karl's papers and contributions will help to clarify details which are not
in my mind.

2. Helmut Plattner and his group also worked on this topic. I recall a talk by Helmut
where he showed convincingly that in biology, some 'events' have been observed
(e.g. on excitable membranes) which are considerably (orders of magnitude) faster
than 'rapid' freezing in a high-pressure freezer (or other freezing devices).
In these cases, HPF is possible of course, but might be too slow, to capture the
event rapidly enough.

best regards,

Reinhard

--

----------------------
PD Dr. Reinhard Rachel
Universitaet Regensburg
Centre for EM - NWF III -
-at-Institute for Anatomy
Universitaetsstr. 31
D-93053 Regensburg - Germany
tel +49 941 943 2837, 1720
fax +49 941 943 2868
mail reinhard.rachel-at-biologie.uni-r.de
office: VKL 3.1.29



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From: kjmorris-at-well.ox.ac.uk
Date: Thu, 20 Dec 2007 03:39:16 -0600
Subject: [Microscopy] Re: Does arc lamp ignition really damage electronics

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Hi Greg,

The Bio-Rad and Leica engineers have repeatedly told me that switching on
the arc lamp supply can wipe out a diode laser on a confocal system (the
argon ones are tougher apparently) - so I always switch them off first
(although with a £13k p.a. maintenance contract I suppose I'm only saving
the manufacturer money). My father once left his computer on by mistake when
an electrician was wiring a new plug socket in his house. The electrician
switched on/off the mains three or four times - the PC went off first time
and stayed off safe - but his rather nice 19" Dell CRT monitor naturally
stayed hard switched on - it was completely dead by the time my dad realized
the PC was still on, just out of warranty and went into the bin (£350 for a
new one).

I use surge protectors on all HIFI/TV and computers and have never lost any
equipment - there is no surge protectors in PCs [or much else] and all fuses
are hard wired into the motherboard so if one fails it's a new PC [a few
modern ones have a few resettable fuses]. Fortunately the PC power supply is
modular and can be replaced easily if that fails. My mother-in-law doesn't
have mains surge protectors and has lost a quite new Panasonic DVD player,
TV and HiFi Marantz amp over the last 5 years - all due to mains transformer
failure (they all went in the bin, Marantz wanted well over £100 for their
new transformer). My last [Sugden A48II HiFi] amp, so ugly it must have been
expensive, lasted 25 years and only went to the bin because the electronic
components were simply getting too old and noisy at low volume - and it
still played loud perfectly, although I admit it was built like a Challenger
tank.

Of course any lightening strike nearby and no surge protection and you will
lose a lot of equipment (we lost many PCs and the odd lab device when our
lab building was struck by lightening back in the 80s). I have had quite a
few mains protectors fail though - they take the hit instead of your
electronics. So they are made/sold for a reason - many manufacturers state
only switch on/off the device using the internal switch not the wall socket
one (as it's inferior in quality and so more noisy) although that's assuming
the manufacture bothered to fit an on/off switch in the first place.

However that said, I have never known a PC or similar fail when switching
on/off an arc lamp. I tend to put a surge protector on the arc lamp
controller mains-line though.

Regards

Keith

-----------------------------------------------------------------

Dr Keith J Morris
Molecular Cytogenetics and Microscopy Core
The Wellcome Trust Centre for Human Genetics
Roosevelt Drive
Oxford
OX3 7BN
United Kingdom

Tel: +44 ( 0 ) 1865 287568
Email: kjmorris-at-well.ox.ac.uk
HomePage: http://www.well.ox.ac.uk/cytogenetics

-----Original Message-----
X-from: baskin-at-bio.umass.edu [mailto:baskin-at-bio.umass.edu]
Sent: 19 December 2007 22:40
To: kjmorris-at-well.ox.ac.uk

Gregg,
Video microscopy got going in the early 1980's with the
inclusion of computers not far behind. In those days many people were
using 200W lamps with massive (often old) powersupplies. These things
hummed, banged, and sometimes dimmed the room lights when fired. I
suspect the newer, slimmer units, 50 and 100W, have better behaved
electronics, and cause less electrical stress. They certainly run
cooler and quieter. There is also probably a wider use of surge
protectors and related circuitry in computers. So I guess in the
early days there may have been problems but I think now could be
folklore. I have heard mercury arc explosion stories and even
witnessed one, but never heard of, let alone seen an example of, a
story where firing an arc lamp EMF'd a neighboring PC.

As ever,
Tobias

}
}
} Hi have been wondering about this. It seems that the EMF from
} starting the lamp is one possible reason for computer problems (if in-
} fact there are computer problems). Another problem could be in the
} power fluctuations that are propagated back into the house wiring.
} If this is the case, then the distance of lamp to computer would be
} less important that the shielding of the computer to bad power.
}
} Any thoughts?
}
} David
}
}
} On Dec 19, 2007, at 2:33 PM, greggps-at-umich.edu wrote:
}
} }
} }
} }
}
} } ------
} }
} } Fluorescence Micrscopists and Vendors:
} } I've been searching for actual published material to support the
} } industry standard that requires igniting (turning on) mercury or xenon
} } arc lamps PRIOR to turning on electronic microscopes or computer
} } systems. Highly respectable microscopists have informed me that the
} } electromagnetic fields (EMFs) produced by the intense 'welder's arc'
} } spark can damage microchips and computer monitors nearby.
} }
} } Does anyone have hard, fast evidence or direct experience to support
} } this behavior? When consulting an information technology (IT)
} } specialist
} } about EMFs and computers, he says it will occasionally create problems
} } on a computer monitor that is easily fixed by degaussing, and it can
} } wipe temporary memory such as flash drives. Again, no permanent
} } damage,
} } but something to consider.
} }
} } If so, how far would one need to keep the electronics from the arc
} } lamp?
} } I suspect that behavior is being dictated by a fear of the high
} } expense
} } in case there truly is a risk, but I don't want to perpetuate paranoia
} } and extra lamp hours when not necessary. For example, my previous job
} } didn't encourage the arc lamp being turned on first, and I don't
} } recall
} } any electronics issues attributed to such 'reckless behavior'.
} }
} } Regards,
} } ~Gregg
} }
} } Gregg Sobocinski
} } Imaging Specialist/Microscopist
} } Univeristy of Michigan, MCDB Dept.
} } Ann Arbor, Michigan
} } USA
} }
} }
} }
} }
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--
_ ____ __ ____
/ \ / / \ / \ \ Tobias I. Baskin
/ / / / \ \ \ Biology Department
/_ / __ /__ \ \ \__ 611 N. Pleasant St.
/ / / \ \ \ University of
Massachusetts
/ / / \ \ \ Amherst, MA, 01003
/ / ___ / \ \__/ \ ____
http://www.bio.umass.edu/biology/baskin/
Voice: 413 - 545 - 1533 Fax: 413 - 545 - 3243

==============================Original Headers==============================
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From: jacques.faerber-at-ipcms.u-strasbg.fr
Date: Thu, 20 Dec 2007 08:04:59 -0600
Subject: [Microscopy] Re: viaWWW: elemental composition measurements

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

Hi

It will be dificult to find a direct tunnig between the two methods. The
dept scale are too much different. To make a comparaison, one should
make XPS depth profiling, suposing that the ion gun etching will no
modify the composition of the sample.

We have tried a lot, between XPS, AES, RBS and X ray reflectometry, and
we never get a direct accord. One get different sets of results, and one
have to weight them with all one know about the samples, and decides
where is the right (or the less wrong) line between them.

About the RBS, it schould not be destructive , but as someone has soon
said, it depends of your samples. The destrucive effect may be
surprising ! I had once a set of samples to observe with the SEM, after
they were "treated" by RBS. They were covered with a very thick layer of
carbon (tenth of nm) due to contamination by the poor vaccum of the RBS
vessel, and induced by the He+ beam ! For our purpous, it was
"destructive" !

Hope it helps

J. Faerber
IPCMS-GSI
(Institut de Physique et Chimie des Matériaux de Strasbourg
Groupe Surface et Interfaces)
23, rue de Loess ; BP43
67034 Strasbourg CEDEX 2
France

Tel 00 33(0)3 88 10 71 01
Fax 00 33(0)3 88 10 72 48
E-mail Jacques.Faerber-at-ipcms.u-strasbg.fr



andreana782-at-yahoo.com.tw a écrit :
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} Title-Subject: [Filtered] elemental composition
}
} Question:
} I was wondering if anyone can give a comment on which analytical tool can give the best composition ratio of the solid materials. As far as I know, RBS can determine the composition of bulk sample. XPS can determine the composition of the surface. Does anyone know which one can give a more acurate composition? By the way, RBS should be a non-destructive tool or a destructive tool?
}
} Thank you!
}
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From: dac-at-research.umass.edu
Date: Thu, 20 Dec 2007 09:54:31 -0600
Subject: [Microscopy] Re: Does arc lamp ignition really damage electronics

Contents Retrieved from Microscopy Listserver Archives
http://www.microscopy.com/MicroscopyListserver/MicroscopyArchives.html

This is not hard evidence about EMP damage, but the type of lamp, type
of housing (internal/external ignitor?) and type of ignition certainly
affect the POTENTIAL for problems.

First, let's assume that no one is still using the old units with
spark-gaps.......

Second, Hg and Xe(Hg) lamps breakover at about 4kV and I have seen some
mention of "soft start" but don't know about that. The current surge
through the cable following breakover is what is most likely to radiate
a pulse.

Xenon lamps with no mercury included break over at a much higher voltage
(ignitors for Xe typically put out 20kV) and the start pulse typically
has more energy as well.

I have run a confocal system in close proximity to HBO-100 Hg lamps
(Nikon supplied) for years and saw no effects (keeping the arc lamp
cable well away from other cables to be safe....). We also had an SGI
server in the room that ran 24hr and it never had a problem.

Dale



greggps-at-umich.edu wrote:
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} Fluorescence Micrscopists and Vendors:
} I've been searching for actual published material to support the
} industry standard that requires igniting (turning on) mercury or xenon
} arc lamps PRIOR to turning on electronic microscopes or computer
} systems. Highly respectable microscopists have informed me that the
} electromagnetic fields (EMFs) produced by the intense 'welder's arc'
} spark can damage microchips and computer monitors nearby.
}
} Does anyone have hard, fast evidence or direct experience to support
} this behavior? When consulting an information technology (IT) specialist
} about EMFs and computers, he says it will occasionally create problems
} on a computer monitor that is easily fixed by degaussing, and it can
} wipe temporary memory such as flash drives. Again, no permanent damage,
} but something to consider.
}
} If so, how far would one need to keep the electronics from the arc lamp?
} I suspect that behavior is being dictated by a fear of the high expense
} in case there truly is a risk, but I don't want to perpetuate paranoia
} and extra lamp hours when not necessary. For example, my previous job
} didn't encourage the arc lamp being turned on first, and I don't recall
} any electronics issues attributed to such 'reckless behavior'.
}
} Regards,
} ~Gregg
}
} Gregg Sobocinski
} Imaging Specialist/Microscopist
} Univeristy of Michigan, MCDB Dept.
} Ann Arbor, Michigan
} USA
}
}
}
}
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9, 23 -- From dac-at-research.umass.edu Thu Dec 20 09:54:31 2007
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From: WHITTAKS-at-si.edu
Date: Thu, 20 Dec 2007 10:41:12 -0600
Subject: [Microscopy] SEM- removing Au/Pd coatings

Contents Retrieved from Microscopy Listserver Archives
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Hello Colleagues,


I have a researcher here who needs to remove some gold palladium
coatings from some insect samples. He was successful in removing the
gold coatings, but the reference we found from the 70's using a FeCl3
solution in alcohol has not worked- at least on coated coverslips.

Do any of you have experience removing an au/pd coating from delicate
biologic tissues you would be willing to pass along?


Thanks,


Scott Whittaker
Head NMNH Imaging
Manager SEM Lab
Smithsonian Institution
National Museum of Natural History
PO Box 37012 MRC104
Washington DC 20013-7012
202-633-0891



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From: kjmorris-at-well.ox.ac.uk
Date: Fri, 21 Dec 2007 03:17:24 -0600
Subject: [Microscopy] re: damage due to EMP

Contents Retrieved from Microscopy Listserver Archives
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Hi all,

I suppose Nikon Microscopes can be trusted when they say:

"As digital imaging workstations become more popular and microscopes
equipped with high-end camera systems grow more complex, it is important to
remember how dangerous the arc lamp power supply can be to electronic
equipment. Always turn the arc lamp on before powering on auxiliary computer
or camera equipment that is in close proximity to the power supply, and
always turn this equipment off before turning off the arc lamp. The cable
supplying current to the lamp from the power supply is generally quite well
shielded, but a momentary 20,000 to 50,000 volt surge is possible when the
lamp is fired. This large voltage can generate a magnetic field strong
enough to damage sensitive integrated circuits that are nearby."

http://www.microscopyu.com/tutorials/java/arclamp/index.html

I had always assumed that the faraday cage (metal box) around the mercury
lamp and power supply shielded other equipment quite well from
electro-magnetic pulses and that mains spikes from the power surge as the
lamp starts up were the main problem*. That said I've always followed the
microscopists aural tradition by intoning the dogma to users that "the
mercury lamp goes on first and off last", although what about the other two
imaging microscopes in the same room that are already in use? - I just hope
that they aren't 'nearby' enough to suffer. Ironically I have always found
the PCs and cameras on microscopes far more reliable than their cousins in
the office and home.

I do notice that often lights dim, TV screens fluctuate etc.. when you
switch on high current devices (e.g 8kW showers at home), but that's
obviously not due to EMP. At UCL our 18W Spectra Physics laser draws 53kW
from the mains but has no discernable effect at all on lighting, PC screens
etc.. when we switch it on, probably as it's isolated behind it's own
personal three phase power supply. Plus of course there is RF interference**
that plagues TV, CRT and radio reception, that can be caused by switches,
motors etc..., but that is also rather unlikely to kill off a PC or TV,
although it isn't CRT and loudspeaker friendly (indeed audio noise from a
weak signal to a stereo TV/Radio decoder can often sound worse as it
switches repeatedly in and out). In comparison I've never noticed a mercury
lamp EMP produce any effect whatsoever on nearby equipment (fortunately).

Keith

*I suppose I am more concerned about EMP from a air-burst atomic bomb
explosion, if our lab is unfortunate enough to be less than 10km from it (or
as Edward G Robinson put it "Sweet Mother of Mercy is this the end of our
confocal?").

**http://www.scribd.com/doc/267489/Tracing-And-Eliminating-Power-Line-Interf
erence


-----------------------------------------------------------------

Dr Keith J Morris
Molecular Cytogenetics and Microscopy Core
The Wellcome Trust Centre for Human Genetics
Roosevelt Drive
Oxford
OX3 7BN
United Kingdom

Tel: +44 ( 0 ) 1865 287568
Email: kjmorris-at-well.ox.ac.uk
HomePage: http://www.well.ox.ac.uk/cytogenetics

**http://www.scribd.com/doc/267489/Tracing-And-Eliminating-Power-Line-Interf
erence





-----Original Message-----
X-from: rboehrin-at-vt.edu [mailto:rboehrin-at-vt.edu]
Sent: 19 December 2007 22:34
To: kjmorris-at-well.ox.ac.uk

I worked in a facility that used a xenon flash tube. The electrical pulse to
trigger the bright light was strong enough to put out a pulse that
occasionally
tripped some of the encoders on the system. During a typical manufacturing
run
the light flashed millions of time to draw a pattern on a photographic glass
plate. Over a long period of time the position of devices was incorrect due
to
these EMP induced counts. The same may be true of laboratory equipment. In
our
case the absolute position values drifted. This caused a failure in the
manufacturing procedure which was detected by a visual inspection system.
Shielding and grounding of the electrical system that powered the bulb was
sufficient to prevent these events from interfering with the rest of the
equipment.

Now that 25 years has passed chip sets have smaller geometries that are
packed
tighter. This means less insulation between components and components less
able
to weather damage. A fatal 'nick' in the chip wiring is substantially
smaller
than it was 25 years ago.

I have no hard evidence of actual damage done to chips, but I do have first
hand
experience at seeing the effect of EMP on high precision equipment.

Robert Boehringer
MS student
Virginia Tech

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30, 20 -- From kjmorris-at-well.ox.ac.uk Fri Dec 21 03:17:24 2007
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From: opmills-at-mtu.edu
Date: Sat, 22 Dec 2007 09:23:51 -0600
Subject: [Microscopy] viaWWW: Pelco Model "H" CP dryer

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Email: opmills-at-mtu.edu
Name: Owen Mills

Organization: Michigan Tech University

Title-Subject: [Filtered] Pelco Model "H" CP dryer

Question: Hi,

Are any of you still using this machine? I want to make sure it is safe. Next, do any of you have a manual I can copy?

Thanks, Owen

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From: panxijiang-at-gmail.com
Date: Mon, 24 Dec 2007 20:55:08 -0600
Subject: [Microscopy] viaWWW: How to perform bake out on CM serios TEM

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Email: panxijiang-at-gmail.com
Name: Xijiang Pan

Organization: Tsinghua University, Beijing

Title-Subject: [Filtered] How to perform bake out on CM serios TEM

Question: I am wondering if there is anybody in this list farmiliar with the "bake out" procedure for the CM serious TEM. The local service engineers do not have any experiences in such work. So if you know,please contact me. Thanks in advance.

Merry Christmas


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From: rao5-at-hotmail.com
Date: Wed, 26 Dec 2007 09:11:18 -0600
Subject: [Microscopy] viaWWW: Image processing software

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Email: rao5-at-hotmail.com
Name: Venkat Bommisetty

Organization: SDSU

Title-Subject: [Filtered] Image processing software

Question: Hi All,
Greetings for Merry X-mas and New Year....
Is there any general purpose image processing software that can do grain size analysis? I like to process AFM, SEM and TEM images eithr in their native format or as bitmaps.

Also, do you recommend any software for processing Selective area diffraction patterns? currently I write IDL code again, not very easy for students to use.

In both cases the software is intended to be used for use in teaching & research both. Price is an important concern


thanks in advance for your advice

Rao

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From: ammar.1-at-osu.edu
Date: Fri, 28 Dec 2007 11:17:19 -0600
Subject: [Microscopy] MRI ? on maize embryos

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Daar coleagues
I am working on a project on the vascular puncture inoculation (VPI) of maize viruses into maize embyos. We need to have a 3-D picture of the vascular bundles in (germinating) maize embyos, and a colleage of mine suggested MRI as a possible means to achieve that. I wonder if anyone has tried MRI on plants/ plant tissues, or if someone can suggest another more suitable method (apart from LM-serial sectioning). Thanks and Happy New Year to everyone.


El-Desouky Ammar, Ph.D.
Dept. of Entomology, OSU,
019 Selby Hall,
OARDC, Wooster, OH 44691
Tel: 330-263-3830.
FAX: 330-202-3563.





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From: acruz04-at-cibnor.mx
Date: Fri, 28 Dec 2007 15:53:27 -0600
Subject: [Microscopy] viaWWW: Problem EDX INCA 2000

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Hi
The emerging maize embryo is about 1 mm thick and 3 mm long. Thanks for any suggestions.


El-Desouky Ammar, Ph.D.
Dept. of Entomology, OSU,
019 Selby Hall,
OARDC, Wooster, OH 44691
Tel: 330-263-3830.
FAX: 330-202-3563.




----- Original Message -----
X-from: Joel Sheffield {jbs-at-temple.edu}

Hello,

I would humbly suggest Digital Volumetric Imaging (DVI), a technique which is being successfully used in our lab studying biomaterial implants.

The basic premise of the technique: it is automated serial sectioning and imaging of the block *face* of a fluorescently labeled EM-resin embedded sample. This allows excellent registration of the sections and subsequent 3D reconstruction in software.

Of course, it is a destructive technique and requires testing of fluorescent labels to ensure good contrast for your samples. But when optimized, the results are spectacular.

Have a look at the website of The Microscience Group:

http://www.microsciencegroup.com/

There are case studies and publications with sample images in the "Applications" section.

For your maize embryo, you could probably image at a field size of approximately 1.8mm^2 and resolution of 1.8um / voxel.

(Disclaimer: I am not affiliated with the company except as a satisfied user / customer)

--
Marc Takeno, Ph.D.
Research Scientist
Department of Bioengineering, University of Washington
takenomm-at-u.washington.edu

---------- Forwarded message ----------


Hi
The emerging maize embryo is about 1 mm thick and 3 mm long. Thanks for any suggestions.


El-Desouky Ammar, Ph.D.
Dept. of Entomology, OSU,
019 Selby Hall,
OARDC, Wooster, OH 44691
Tel: 330-263-3830.
FAX: 330-202-3563.




----- Original Message -----
X-from: Joel Sheffield {jbs-at-temple.edu}

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Email: acruz04-at-cibnor.mx
Name: Ariel Cruz

Organization: CIBNOR

Title-Subject: [Filtered] Problem EDX INCA 2000

Question: Some body know how can I do reinstall complete software for operation system. I need to intall again software for Hitachi S-3000N Oxford Inca 2000 complete procedure.

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From: lamiller-at-uiuc.edu
Date: Fri, 28 Dec 2007 15:53:56 -0600
Subject: [Microscopy] viaWWW: Forensic advice for a potential student

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Email: lamiller-at-uiuc.edu
Name: Lou Ann Miller

Organization: Vet Med College, UIUC

Title-Subject: [Filtered] Forensic advice for a potential student

Question: Greetings,

I have a niece who found out she could graduate from high school early, but in the process has not had as much career guidance as she could have had in the school system.


She has an interest in doing the lab tests in the area of forensics, and I was wondering if any of you forensics folks out there would be willing to give me your email to pass onto her.


She would like to know how best to go about training for such a field, and what is all involved in the field.


(of course, being a Medical Technologist, I told her that would be a good base, but I think the actual background for a forensic scientist could be very different)



Thanks!


Lou Ann Miller


~~~~~~~~~~~~~~~~~~~~~~~~~~~~
Lou Ann Miller, MT(ASCP)
Service Supervisor
Center for Microscopic Imaging
College of Veterinary Medicine
Rm 1204 VMBSB
2001 S Lincoln Ave
Urbana, IL 61802

217/244-1567
http://treefrog.cvm.uiuc.edu

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From: stefan.diller-at-t-online.de
Date: Mon, 31 Dec 2007 06:22:44 -0600
Subject: [Microscopy] Thanks to the list...

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Dear All,
thanks for the good discussion and the helpful tips to all on the list.


With the best wishes for a
happy new year 2008,
success at work and in business,

Stefan Diller



Please feel free to download and print out my new SEM Calendar 2008 (sorry,
text only in German) with images from scanning electron microscopy:
www.elektronenmikroskopie.info/Kalender2008_SD.pdf (29 MB). Images are
Copyright Stefan Diller 2008, please ask for permission prior to any
commercial use.
Coming exhibition: "Die Ästhetik des Unsichtbaren" at the Botanical Garden
Wuerzburg, February, 01st to February29th, 2008, opening at February, 01st
2008, 6 pm, see
www.elektronenmikroskopie.info/ausstellungen/botanischer-garten-wuerzburg/Pl
akat.pdf
More infos at
www.elektronenmikroskopie.info/ausstellungen/botanischer-garten-wuerzburg/
in some days.


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From: james99-at-uab.edu
Date: Mon, 31 Dec 2007 10:43:48 -0600
Subject: [Microscopy] AskAMicroscopist: Finding a Specialized Microscope

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This Question was submitted to Ask-A-Microscopist by (james99-at-uab.edu)
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Email: james99-at-uab.edu
Name: James Borham

Organization: University of Alabama at Birmingham

Education: Undergraduate College

Location: Birmingham, Alabama, United States of America

Title: Finding a Specialized Microscope

Question: I'm trying to find a new microscope with some specialized
features, and I'm having a lot of trouble. I'm hoping one of you may
be able to help me out.
The feature that is needed most, and has been impossible to find, is
a non-stereo microscope and/or lens with a parfocalizing distance of
90 mm or more.
Do you have any idea where I could find such a thing? Is a device
with such a long parfocalizing distance even classified as a
microscope?
I would appreciate any help on this problem.

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From: dac-at-research.umass.edu
Date: Mon, 31 Dec 2007 12:06:12 -0600
Subject: [Microscopy] Re: AskAMicroscopist: Finding a Specialized Microscope

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Hi James,

I did a quick Google search and found an advertizing press release for a
stereo "inspection microscope" (sometimes referred to as a telescope)
with a long (90mm) working distance. Some of the transmission electron
microscopes also have binocs with similar properties to view the
focusing screen. Sounds like this class of optics is what you want to
locate. I know it is stereo, but just close one eye ;-). You might find
a monocular inspection telescope somewhere. Here is the link for the
article.

http://news.thomasnet.com/fullstory/20389

Cheers,

Dale Callaham

james99-at-uab.edu wrote:
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} from
} http://www.microscopy.org/Ask-A-Microscopist/Ask-A-Microscopist.html
} on Wednesday, December 19, 2007 at 13:52:08
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} Email: james99-at-uab.edu
} Name: James Borham
}
} Organization: University of Alabama at Birmingham
}
} Education: Undergraduate College
}
} Location: Birmingham, Alabama, United States of America
}
} Title: Finding a Specialized Microscope
}
} Question: I'm trying to find a new microscope with some specialized
} features, and I'm having a lot of trouble. I'm hoping one of you may
} be able to help me out.
} The feature that is needed most, and has been impossible to find, is
} a non-stereo microscope and/or lens with a parfocalizing distance of
} 90 mm or more.
} Do you have any idea where I could find such a thing? Is a device
} with such a long parfocalizing distance even classified as a
} microscope?
} I would appreciate any help on this problem.
}
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