we are lookng for an inverted microscope, something simple and cheap mb second hand, if you have any suggestions and offers, please send them directly to my address csbeneas-at-wiccmail.weizmann.ac.il, thank you in advance, Elia (-:
Another alternative to avoid cutting your fingers when opening BEEM capsules with a razor blade is simply to clamp the BEEM capsule in a small bench top vice, cut one side of the capsule, turn it over and cut the other side - it takes only seconds. You can buy a small removable vice for under 20 UK pounds (shop around) which can simply be clamped to any bench (including the microtome) and of course it has 1001 uses unlike a BEEM splitter.
Malcolm Haswell University of Sunderland UK ----------
For anyone who has cut their fingers using beem molds and razor blades there is a new development called "easy molds". The epoxy bullets and samples remove easily so a razor blade is not necessary to remove the samples. The person to contact regarding these new molds is:
I have looked in the literature without much success for a non-immunological method to stained clatharin coated vesicles. I seem to recall somebody using bismuth? to enhance the coat staining. I have found some references to pre-embedding staining with tannic acid but I would like to use existing blocks of formaldehyde fixed, LR Gold embedded tissue. I have nice colloidal gold labeled staining of some primary antibodies and would now like to prove they are in coated vesicles sometimes. TIA.
Thomas E. Phillips, Ph.D. Associate Professor of Biological Sciences Director, Molecular Cytology Core Facility 3 Tucker Hall University of Missouri Columbia, MO 65211 (573)-882-4712 (voice) (573)-882-0123 (fax)
We are looking for a donation of a Balzers freeze fracture machine, preferably 300 series, that we could use for double-layer coating (platinum/carbon) for low-temperature SEM. A conventional machine would do. This would be for the University of California, Berkeley. Please reply if you know of anyone with one of these machines; any leads would help. Thanks, Jacob Bastacky
Jacob Bastacky Room 116 Donner Laboratory Lawrence Berkeley Laboratory EMail: sjbastacky-at-lbl.gov University of California Phone: (510) 486-4606 Berkeley, California 94720 Fax: (510) 486-4750
I just recieved my EMS catalog in the mail. In this volumn it has Techinical Tips. The first tip deals with "A Stable Lead Staining Solution". It is used to increase contrast and reduc contamination in secions for EM. Could some one share a more detailed description of its uses and what it should be used on? Thank you, Clarissa
Clarissa Vierrether The Doe Run Co. PO Box 500 Viburnum, MO 65566 cvierret-at-misn.com
The experiences of our school district led them to abandon At Ease in favor of FoolProof. I installed it on many machines as a volunteer and found it much more robust and conflict-free than AT Ease. I can't recall the company, but they are in Oregon.
Glen MacDonald Virginia Merrill Bloedel Hearing Research Center Box 357923 University of Washington Seattle, WA 98195-7923 (206) 616-4156 glenmac-at-u.washington.edu
} I just recieved my EMS catalog in the mail. In this volumn it has Techinical } Tips. The first tip deals with "A Stable Lead Staining Solution". It is used } to increase contrast and reduc contamination in secions for EM. Could some } one } share a more detailed description of its uses and what it should be used on? } Thank you, Clarissa } } Clarissa Vierrether } The Doe Run Co. } PO Box 500 } Viburnum, MO 65566 } cvierret-at-misn.com
I switched to the Haniachi et al. calcined lead solution about two years ago and really like it. A solution made up and stored in plastic has lasted over a year at room temperature. Contamination is very low (although high contamination rates are possible-just ask some of my students), contrast is very nice, and staining times are short (~2 min). I double stain with 30-60 min of UrAc (saturated in 70% ethanol). I work with plant tissue--mostly leaves--and they typicaly have pretty low contrast. I'm very pleased with the calcined lead recipe. I've never been sure just how long to heat the lead citrate ("heat for several hours at 200-300C until it turns a light yellow") but I've never failed to make a good batch of stain.
Under 'normal' conditions one scan dot is equal to one pixel of an image. When we scan photographic images for reports or the web, we are usually not pushing the limits of our scanner by any means. If we aim to convert a 4x5 inch photo to a 800x1000 pixel image, then all we need is 200 dpi (pixels per inch) resolution. Even cheap scanners give that, and such an image is big for the web. A 1600x2000 pixel image would require 400 dpi which is still within the capability of most scanners. However, to scan a 35mm transparency to the same image size would require about 4 times the dpi capability as the 4x5 Polaroid. Therefore, the new scanner capabilities will be needed.
There are also the phrases "optical resolution" and "interpolated resolution". I understand optical resolution to be the actual spacing of the elements of the scanning mechanism. Interpolated resolution refers to extra resolution obtained by mathematical (or mechanical?) tricks to see in between the pixels. It may help, but I would always check the optical resolution as the better measure of capability.
Now on printing, laser printers will normally need more dots per inch than you are printing pixels per inch. The reason is that the printer pixels/dots are only black or white and are dithered together to generate an area of apparent gray. For example a 3x3 or larger printer area will be needed to give the impression of shades of gray for a single image pixel. I think that 600 dpi printers are the practical *minimum* for printing gray scale images. 1200 dpi printers are better.
True gray scale printers (e.g., most dye subs) require less dpi to give a similar quality image than does a laser printer. Of course they will tend to be more expensive.
Hope this helps.
At 02:27 PM 10/31/96 +0000, you wrote: } Would someone kindly explain how to convert dpi (dots-per-inch) to } pixels? } } I would like to evaluate scanner resolution (ie. 2700 dpi) in terms of } pixels. } } Thanks for any help on this topic. } } Marc ---------------------------------------------------- Warren E. Straszheim 270 Metals Development, Ames Lab/ISU, Ames IA, 50011 Phone: 515-294-8187 FAX: 515-294-3091
I keep hearing that autofocus is a desired feature on light microscopes. Is this really true or am I just an old fashioned knob turner.
I would like to learn about your hands-on experiance with autofocus. Who are the major providers of autofocus? Who is the best supplier? What are the major applications for autofocus?
I have inherited a videoprinter and would like to obtain some information on it. A metal plate on the front panel identifies it as an AXIOM, TX-500 Videoprinter. A metal plate on the rear panel indicates that it is manufactured by Seiko/Seikosha and the reference VP-35.
Does anyone have any information on this printer, its quality, resolution, etc. In addition, does anyone know of a source of paper for this model - it appears to use paper which is approximately 5" wide. It also requires a power cord, however, it appears to be a standard 3-prong computer/hard drive cord which is readily obtainable.
Thanks in advance!
Stephen J. Beck Bio-Imaging Center/Electron Microscopy Department of Biology Nassau Community College Garden City, NY 11530 Voice Mail: (516) 572-7829 Email: {becks-at-sunynassau.edu URL: {http://www.sunynassau.edu/webpages/biology/becks.htm}
} From: "Anthony J. Garratt-Reed" {tonygr-at-MIT.EDU} } Subject: Re: Pulstar
This is in response to Antony Garrat-Reed's response to Beat Frey's posting about the Pulstar pulse processor.
} The quality of the final analysis made with EDX depends upon the number of } x-rays detected, and the signal to background ratio in the spectrum. The } number of x-rays detected depends, of course, upon electron beam current and } the time for the analysis, but also on the solid angle the detector subtends } at the sample, and the ability of the system to process (i.e. measure) the } x-rays. The signal to background ratio is partly determined by physics, } but is improved by high energy resolution in the detector and analyzer system. } Each x-ray takes a finite time for analysis; during that time, if a second } x-ray arrives, it is lost (and, in some conditions, the first x-ray is also } lost). This leads to the familiar "Dead time" which is reported, in one way } or another, by all EDX systems. A pulse processor which processes x-rays } faster leads to a lower dead time, and therefore less loss of x-rays. } However, this is only useful if the loss of x-rays was originally } significant. If the dead time is below about 25% the loss of x-rays is } quite small.
A bit is missing from this--longer processing times give better resolution. Since a digital pulse processor uses all the time available between pulses the resolution is better for any given countrate than a comparable analog processor runing at the same countrate.
} ...... This is not to say } that upgrading to the new pulse processor would not be worthwhile otherwise, } for it would undoubtedly also give you better energy resolution at lower } count rates.
This of course implies what I added.
Best regards mark
Mark W. Lund, PhD Director } } Soft X-ray Web page http://www.moxtek.com { { MOXTEK, Inc. ************************************************* Orem UT 84057 **"Soft x-rays in the 21st Century" conference ** 801-225-0930 ** 8-11 January 1997, Midway Utah ** FAX 801-221-1121 ** http://volta.byu.edu/xray/info.html ** lundm-at-xray.byu.edu *************************************************
"Let me commend a great truth to you which has been one of the supports of my life: 'The Gods send threads for a web begun.' Andrew Carnegie
I am writing a research paper on Immersion Lens SEM for a class, and as part of my thesis, and I have found very little articles or Journals by searching, does anyone know of where I can find more info? Thanks -- David Collins
Glad to get your response. I was unaware that micro-chanell plates has a topographic mode. Thanks.
John.
Jake Schaper wrote: } } RE} } BS detectors 10/29/96 } I have a microchannel plate on my 6300F JEOL. It performs extremely well in both modes - compositional (A+B) and topographical (A-B), and in low KV applications. It was purchased in 1995. If purchasing a new detector it is well worth evaluating this type, I'm sure there is more than one manufacturer. The one I have was built by Galileo Electro-Optics Corp. in Mass. (800-648-1800). No interest in the company.....just providing info.
There is possibility of an electron microprobe comming availble in the next 5 months. If you are intrested, I will be keeping a list for the customer to look at.....
I would like to know if their is a possible home for the following instrument: Cameca Electron Microprobe - MBX version - ~1984 3 wavelength spectrometers Kevex EDS Cathodoluminescence Detector BSE DEC computer
System will have to be used and not given as scrap.. Possible qualifications could include either DOD or DOE contracts...
Installation, repairs, upgrades and operating expences for first year could be as high as $100K...
Only serious inquires apply.... I will not be involved in the selection of recipent....
There is possibility of an electron microprobe comming availble in the next 5 months. If you are intrested, I will be keeping a list for the customer to look at.....
I would like to know if their is a possible home for the following instrument: Cameca Electron Microprobe - MBX version - ~1984 3 wavelength spectrometers Kevex EDS Cathodoluminescence Detector BSE DEC computer
System will have to be used and not given as scrap.. Possible qualifications could include either DOD or DOE contracts...
Installation, repairs, upgrades and operating expences for first year could be as high as $100K...
Only serious inquires apply.... I will not be involved in the selection of recipent....
I have a Zeiss 940 SEM. A tungsten filament that can last for 200hr. is now fried in about 10 hr. A chunk o filament tip disappeared; the broken ends were thinned out and pointed like needle. A lot of black deposits were found inside and outside of the whenelt aperture disc and on the anode.
Normally, I leave the saturation point untouched at the end of operation. On the next session, when Vacuum Ready light is lit, I push HT and Filament buttons, reset saturation point and off I go. It is equipped with a turbo pump, therefore, HT and filament must be turned off before specimen change and turned on again when the vacuum is ready. The filament would be turned on and off several times a day.
I suspected a leak at the gun chamber but the vacuum remains stable when I squirted methanol at the gap.
I haven't used a razor blade on beem capsules in years. I just used a regular old pair of pliers. I gently squeeze around the capsule and watch it separate from the block, then squeeze the bottom (pyramidal) end until it separates. By separating I mean that you can see that the beem capsule and the epon are not adherent; now there's a layer of air between the two. Then you just carefully squeeze the bottom of the capsule just where the pyramid begins and the block either slides out or pops out depending on how hard you squeeze. If you squeeze too hard or have not completely separated the capsule from the body of the block, you might squeeze right through and rip the polypropylene and then will need a razor blade. The other risk of incomplete separation is damaging your specimen at the tip of the block. If complete separation is accomplished, however, this rarely, if ever, happens.
One other advantage of this method is that, if you're gentle, you can reuse the beem capsules and you don't ruin razor blades -- a real money saver! (joke de jeur).
Try it.
John A.
-- John G. Aghajanian, Ph.D. } tel: 508 842-8921 ext.147 Worcester Foundation for Biomedical Research {fax: 508 842-9632 222 Maple Ave. } email: johna-at-sci.wfbr.edu Shrewsbury, MA 01545
Our laboratory is looking into purchasing a microwave for the processing of muscle and nerve samples for TEM. Currently we are investigating model 3400 from Ted Pella. Does anyone have any recommendations on this product? We would first like to attempt a "trial run" using a colleagues' microwave on our tissue samples just to see if this technique would benefit our needs. We presently embed our samples in Spurr resin; however do not have a microwave protocol. If anyone has a microwave protocol that would work for our needs, we would appreciate a reply greatly on this matter. Another question we are wondering about regards venting of the microwave during processing for TEM. Is it necessary to purchase a unit equipped witb a venting apparatus? Is placing the oven in the hood a common practice? Any input on these questions would be helpful to us. Thanks in advance,
Susan Danielson, MS Neuromuscular Laboratory Coordinator Medical College of Wisconsin
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To John and the group in general:
I did not realize that autofocus was desired by many microscopists. Please post the discussion to the group. I am also interested in autofocus for use in my optical trap/fluorescence microscope. I need to move laterally a lot in my thin film sample, eventually near 1 micron thickness, and do not want to keep refocusing by hand. I do not know of any vendors in this area.
---------------- At 05:26 PM 11/1/96 -0500, you wrote: } I keep hearing that autofocus is a desired feature on light microscopes. Is } this really true or am I just an old fashioned knob turner. } } I would like to learn about your hands-on experiance with autofocus. Who are } the major providers of autofocus? Who is the best supplier? What are the } major applications for autofocus? } } Thanks for your help. } } John A. Reffner } } 102223.406-at-compuserve.com } } } }
I had the same problem ie drastically-shortened filament life on my JEOL JXA-5A. The chamber vacuum gauge showed the vacuum there to be ok, but in the end the problem went away when I fixed one of the solenoid valves which controls the compressed air that controls the vacuum valves, so I concluded that it had been caused by a leak around the gun, too small and too remote from the vacuum gauge sensor to show up on the gauge. How sensitive/reliable is the methanol-squirting test? Maybe not sufficient. Good luck.
Ritchie Sims
} I have a Zeiss 940 SEM. A tungsten filament that can last for 200hr. is } now fried in about 10 hr. A chunk o filament tip disappeared; the broken } ends were thinned out and pointed like needle. A lot of black deposits } were found inside and outside of the whenelt aperture disc and on the } anode. } } Normally, I leave the saturation point untouched at the end of operation. } On the next session, when Vacuum Ready light is lit, I push HT and } Filament buttons, reset saturation point and off I go. It is equipped with } } a turbo pump, therefore, HT and filament must be turned off before } specimen change and turned on again when the vacuum is ready. The } filament would be turned on and off several times a day. } } I suspected a leak at the gun chamber but the vacuum remains stable } when I squirted methanol at the gap. } } What is the cause of this problem? Any idea?
Ritchie Sims phone: 64 9 3737599 ext 7713 Department of Geology fax: 64 9 3737435 University of Auckland Private Bag 92019 Auckland New Zealand
Dear Daved, At 10:40 AM 11/2/96 -0500, you wrote: } I am writing a research paper on Immersion Lens SEM for a class, and as } part of my thesis, and I have found very little articles or Journals by } searching, does anyone know of where I can find more info? Thanks } -- } David Collins I would suggest a call to a Hitachi representative for brochures and articles about the S-570, S-800, S-900, S-4500 and other SEM's using the immersion lens and upper detector. They may be able to refer you to more specific articles. Regards, Mary Mary Mager Electron Microscopist Metals and Materials Eng., UBC 6350 Stores Rd. Vancouver, B.C. V6T 1Z4 CANADA tel:604-822-5648, fax:604-822-3619 e-mail: mager-at-unixg.ubc.ca
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At 11:20 05/11/1996 GMT+1200, you wrote: } I had the same problem ie drastically-shortened filament life on my } JEOL JXA-5A. The chamber vacuum gauge showed the vacuum there to be } ok, but in the end the problem went away when I fixed one of the } solenoid valves which controls the compressed air that controls the } vacuum valves, so I concluded that it had been caused by a leak } around the gun, too small and too remote from the vacuum gauge } sensor to show up on the gauge. How sensitive/reliable is the } methanol-squirting test? Maybe not sufficient. } Good luck. } } Ritchie Sims } } } } I have a Zeiss 940 SEM. A tungsten filament that can last for 200hr. is } } now fried in about 10 hr. A chunk o filament tip disappeared; the broken } } ends were thinned out and pointed like needle. A lot of black deposits } } were found inside and outside of the whenelt aperture disc and on the } } anode. } } } } Normally, I leave the saturation point untouched at the end of operation. } } On the next session, when Vacuum Ready light is lit, I push HT and } } Filament buttons, reset saturation point and off I go. It is equipped with } } } } a turbo pump, therefore, HT and filament must be turned off before } } specimen change and turned on again when the vacuum is ready. The } } filament would be turned on and off several times a day. } } } } I suspected a leak at the gun chamber but the vacuum remains stable } } when I squirted methanol at the gap. } } } } What is the cause of this problem? Any idea?
Generally there is two main causes that destroy W filament: -An overheating of the filament due to oversaturation or electronic problem (gate transistor broken or leaking) in that case life time is very short and both side of broken filement can seen a "sphere" of melting tungnsten. - In general case, the filament itself is etched by the ions of remaining air around the filament and Wehnelt, so it's thinner and thinner and finally break ( this explain why the saturation point is moving because the resistance of filament is changing) - In case of a bad vacuum or dirty vacuum due to backstreaming , outgasing... the etching power increase and life time fall down. Generally this leak can't be seen on a chamber gauge (too far of gun) and it's too small to check by ethanol and as in many case ready is given by a pirani gauge or a timing after secondary pumping, you can't be sure of vacuum. A good practice is to install a penning gauge close to the gun and check it after all filament exchange or leaking of the column if no valve between gun and column. } } but in the end the problem went away when I fixed one of the } } solenoid valves which controls the compressed air that controls the valve.
Sometime a leak can come not from the outside of the valve but from the compressed air that control that valve, (it's leaking by the axe) in that case it's not possible to use ethanol except by introducing directly in compressed air!
Theses explanations are not very scientific, they are an experience of the field. I apologize for my non academic English. Salutations.
} I have produced some AFM tips (ESP single cantilever silicon) with small, } non conductive crystals grown on the tip apex (crystal size is approx. } 0.1- 0.5um) and I would like to characterize their morphology with either } SEM or AFM.
snips ...
} If anyone has been successful in a similar endeavor, your suggestions } would be most appreciated! } } Also, I have read a paper whose authors imaged an AFM tip using AFM but I } have had little success with this technique. Has anyone succeeded in } doing this who could offer suggestions? } } Sincerely, } } ***************************************************************** } Paul Demkowicz } University of Florida
I haven't tried it but one instrument that would probably do what you want is the Philips/Electroscan FEG ESEM which is certainly capable of producing very good high magnification images from non-conducting specimens. I'd guess most low vacuum/variable pressure FEG SEMs would produce some good images.
A tungsten filament should *not* always burn out some distance from the tip. However, it may be, if the filaments were not vacuum annealed, that the "cold stress" imparted by the bending of the filament does indeed make a "region of weakness."
Best regards, Steven E. Slap, Vice-President ******************************** Energy Beam Sciences, Inc. Adding Brilliance To Your Vision ebs-at-ebsciences.com http://www.ebsciences.com/ ********************************
John, Please send me your email address--I need to ask a question or two regarding federal accounting regulation references. Phil
&&&&&&&&&&& Illigitmi non carborundum &&&&&&&&&&&
Philip Oshel *all mail:* Microscopy University of Illinois Station A Rm 74 Bevier Hall PO Box 5037 905 S. Goodwin Ave. Champaign, IL 61825-5037 USA Urbana, IL 61801 (217) 244-3145 oshel-at-ux1.cso.uiuc.edu (217) 355-1143 home
I need some technical information on the x-sectional TEM specimen preparation of thin solid film multilayers. The layers are glass(substrate)/Mo/CuInSe2/CdS/ZnO and the total thickness of the film layers are ~5um. The tricky thing here is that the glass is very brittle, and the adhesion between glass and Mo is not very good and peeling may occur.
Any information on the x-sectional thin film specimen preparation in general or specific techniques to deal with glass substrate would be highly appreciated.
Chao-Ying Ni Materials Science University of Delaware Newark, DE 19716
I'm working on creating a museum exhibit on microscopes and microscopy focusing on light microscopy and SEM.
If anyone has any old equipment for donation I would love to hear from you. I'm still working on funding so I don't know yet how much I'll have for shipping.
Also, any and all "cool" ideas for displays are always appreciated. I need to fill two rooms with displays focussed strongly on the under 15 crowd.
The display is scheduled for next September so keep it in mind.
I am looking for a distributer of "Emde 2x2 Slide binders". I got them always from EMDE Products, Torrance, CA. The aluminum slide binders for 2x2 slides (with thin anti-Newton ring glass) are very thin, easy to assemble and have no degasing plastic part or moisture adsorbing materials. They allow the mounting of 2x2 super slides, i.e., use of the entire square projection area. EMDE is a product from Switzerland, sold in the US.
} ---------- } From: Crossman, Harold } Sent: Monday, November 04, 1996 11:00AM } To: 'Ann FookYang (Ann-Fook Yang)' } Subject: RE: Fried filament } } You may have a tight chamber but a leak elsewhere. Can you monitor the } pressure in the gun when opening the column isolation valve? Does it } increase more than say, 1/2 decade upon opening? If so, you may have } excessive pressure in the sample chamber or a leaking seal around the } isolation valve. How is the sample pressure monitored? Is there an } ionization tube or some other appropriate gauge (NOT a Pirani or } thermocouple tube!) on the chamber? Or, does the vacuum ready signal } come on after a period of time with no gauging? If so, try to put a } gauge on the chamber to read the actual pressure. } } Can you analyze the "black deposit" on the failed filament? If so, } that may point you in the right direction. } } How was the gun housing cleaned when the previous filament died? Dirty } solvent? Lint in chamber? Water? Finger prints? } } ------------------------------------------------- } Harold J. Crossman } OSRAM SYLVANIA INC. } Lighting Research Center } 71 Cherry Hill Dr. } Beverly, MA 01915 } Phone: (508) 750-1717 } E-mail: crossman-at-rd.sylvania.com } } Our web sites: www.sylvania.com } www.osram.de } www.siemens.com } -- } } "Crossman, Harold" {crossman-at-RD.SYLVANIA.com} } }
Scott Scientific has submitted this posting to me for review before posting to the Microscopy LIstserver. I have judged it to be within the rules of the Listserver.
Nestor Your Friendly Neighborhood SysOp -----------------------------------------------
MICROWAVE/TISSUE PROCESSING SCIENTIFIC WORKSHOPS
Scott Scientific is in the process of organizing scientific workshops on Microwave Processing which will be held in the different provinces of Canada. We would like to hear back from anyone who would be interested in attending such workshops or volunteer their facilities (room or lab and perhaps an EM to view final results). We also welcome inquiries from people outside of Canada.
A nominal fee for the workshops will be charged to cover the travel, lodging, etc... expenses of the invited speakers and assistants. The registration fee will be based on the number of applicants, and will only be used to cover the costs of the workshop. The larger the number of participants at a location the lower the fee to attendees.
Firm dates have not yet been set and depend on the interest and attendance for each location.
Our Scientific workshops will consist of rapid processing of tissue in a research/clinical environment for electron microscopy.
FRESH TISSUE TO SECTION in three hours, using microwave processing. Other microwave applications will be covered. Rapid immunostaining for LM or EM, rapid paraffin processing and rapid decalcification.
We encourage people to bring there own samples, either fresh or in fixative.
Please direct all email inquiries to microwave-at-scottscientific.com
Scott Scientific Ref: Microwave/Tissue Processing Scientific Workshop PO Box 66552, Station Cavendish, Montreal, Quebec, H4W 3J6, Canada Tel: 514-485-2309 Voicemail: 514-888-6509 Fax: 514-485-9931
Please fill out and return the following by email, fax or mail. ____________________________________________________ To: Scott Scientific Ref: Scientific Workshop
Title: FName: LName:
Organization: Dept:
Street Address: Office Room Number: Laboratory Room Number: P.O. Box Address: City: Province/State: Postal Code/Zip Code: Country:
Susan Danielson asked some questions regarding microwave protocols for TEM. We have put a bibliography of papers regarding microwave polymerization of TEM resins on-line at our WWW site (http://www.ebsciences.com). If you don't have access to the Web, I can fax or mail it to you.
In our H2800 Microwave Processor, you can polymerize blocks of Spurr (or other epoxy and acrylic) resin in open silicone rubber molds. It takes about 30 minutes. The protocol is described in several papers by Beverly Giammara.
We recommend *always* using a vented laboratory microwave for these procedures. Our microwaves are vented at a rate of 100cfm. The venting should also be "safety-interlocked", so that the microwave cannot be run if the venting mechanism is blocked or not working properly. The venting system both protects the user from breathing fumes when opening the cavity door, and allows for the use of flammable reagents. It should not be necessary to put the whole instrument in a fume hood; the instruments are designed to accept ordinary clothes dryer hose, which can be run into the hood. If a hood is not available, there are self-contained filtration devices into which the fumes may be vented.
Disclaimer: Energy Beam Sciences manufactures a Microwave Processor for electron and light microscopy.
Best regards, Steven E. Slap, Vice-President ******************************** Energy Beam Sciences, Inc. Adding Brilliance To Your Vision ebs-at-ebsciences.com http://www.ebsciences.com/ ********************************
Susan, in response to your question regarding microwave processing, I include the following information:
} Our laboratory is looking into purchasing a microwave for the processing
} of muscle and nerve samples for TEM.
Some references of interest
1. Armati PJ, Pollard JD, Van Reyk D, Van der Lubbe L. Neuroimmunological electron microscopy with microwave-accelerated fixation. J Immunol Methods 1988;110: 267-9.
2. Tovar CA, Armati PJ, Pollard JD. Microwave fixation of whole peripheral nerve for rapid and efficient enzyme-linked immunosorbent assay (ELISA) screening of monoclonal antibodies. J Immunol Methods 1987;94: 127-30.
3. Bonner J, Armati P. microwave assisted staining of nerve and muscle biopsy tissue. Biotechnic Histochem 1991;66: 236-8.
4. Eggli PS, Lucocq J, Ott P, Graber W, van der Zypen E. Ultrastructural localization of hyaluronan in myelin sheaths of the rat central and rat and human peripheral nervous systems using hyaluronan-binding protein-gold and link protein-gold. Neuroscience 1992;48: 737-44.
5. Ashton FT, Bhopale VM, Fine AE, Schad GA. Sensory neuroanatomy of a skin-penetrating nematode parasite: Strongyloides stercoralis. I. Amphidial neurons. J Comp Neurol 1995;357: 281-95.
6. Feirabend HK, Kok P, Choufoer H, Ploeger S. Preservation of myelinated fibers for electron microscopy: a qualitative comparison of aldehyde fixation, microwave stabilisation and other procedures all completed by osmication. J Neurosci Methods 1994;55: 137-53.
7. Bertrand N, Beley P, Beley A. Brain fixation for acetylcholine measurements. J Neurosci Methods 1994;53: 81-5.
8. Login GR, Dvorak AM. Application of microwave fixation techniques in pathology to neuroscience studies: A review. J Neurosci Methods 1994;55: 173-82.
9. Jensen FE, Harris KM. Preservation of neuronal ultrastructure in hippocampal slices using rapid microwave-enhanced fixation. J Neurosci Methods 1989;29: 217-30.
10. Login GR, Dvorak AM. Methods of microwave fixation for microscopy. A review of research and clinical applications: 1970-1992. Prog Histochem Cytochem 1994;27/4: 1-127.
} We would first like to attempt a "trial run" using a
} colleagues' microwave on our tissue samples just to see if this technique
} would benefit our needs.
References useful for setting up a "trial run" in a new microwave oven and for testing microwave-accelerated protocols:
1. Login GR, Tanda N, Dvorak AM. Calibrating and standardizing microwave ovens for microwave-accelerated specimen preparation. A review. Cell Vision 1996;3: 172-9.
2. Login GR, Dvorak AM. The Microwave Toolbook. A Practical Guide for Microscopists (Beth Israel Hospital, Boston, 1994).
} We presently embed our samples in Spurr resin;
} however do not have a microwave protocol. If anyone has a microwave
} protocol that would work for our needs, we would appreciate a reply
} greatly on this matter.
References:
1. Login GR, Dvorak AM. The Microwave Toolbook. A Practical Guide for Microscopists (Beth Israel Hospital, Boston, 1994). Chapter 10- Microwave Curing
2. McLay AL, Anderson JD, McMeekin W. Microwave polymerisation of epoxy resin: rapid processing technique in ultrastructural pathology. J Clin Pathol 1987;40: 350-2.
3. Giammara BL, Birch DJ, Harper DO. Microwave polymerization of embedding resins for biological/biomedical electron microscopy. In: Snyder WB, Sutton WH, Johnson DL, Iskander MF, eds. Microwave Processing of Materials II: Pittsburgh: Materials Research Society, 1991: vol. 189:347-53.
4. Giammara B. Microwave embedment for light and electron microscopy using Epoxy resins, LR White, and other polymers. Scanning 1993;15: 82-7.
6. Demaree RS, Jr, Giberson RT, Smith RL. Routine microwave polymerization of resins for transmission electron microscopy. Scanning 1995;17: V25-6.
7. Giammara B. EM embedding media- A comparative overview. Electron Microsc EMSA Tech Forum 1985;43: 1-7.
} Another question we are wondering about regards
} venting of the microwave during processing for TEM. Is it necessary to
} purchase a unit equipped witb a venting apparatus? Is placing the oven
} in the hood a common practice?
I recommend using a microwave oven in a lab hood whenever possible. The high volume exhaust on laboratory microwave ovens available from many manufacturers are an added safety feature which further reduce the likelihood of being exposed to fumes from heated reagents when you open the oven door.
Available: Philips 400T--twin lens and some attachments. Contact John Wheatley at 602-965-3831 or via e-mail.
John C. Wheatley Lab Manager Center for High Resolution Electron Microscopy BOX 871704 Tempe, AZ 85287-1704 Phone: (602) 965-3831 FAX: (602) 965-9004 John.Wheatley-at-ASU.Edu
} } } Something I have never gotten a satisfactory explanation of is: } } Why does a W filament always (?) burn out some distance from the tip. } Is } this inherent to the bending of the metal and a region of weakness? And } why } is it always on the same side, relative to the power input? } } } Perhaps I can shed some light on the subject. I am an engineer in a } materials characterization lab for OSRAM SYLVANIA. We make tungsten } and light bulbs. I have looked at a filament or two in the SEM. } } Tungsten SEM filaments are generally "pure" tungsten rather than doped, } or alloyed, as is normally done for light bulbs. The pure tungsten } tends to form relatively smooth grain boundaries across the wire } section, called a "bamboo structure". The grain boundaries have a } higher resistance than the crystals themselves and they tend to slide } past each other. These two factors lead to decreasing cross-sectional } area (the W evaporates faster in the hot spots) which in turn causes } the filament to get hotter, which in turn accelerates evaporation } which..... } } Also, certain tungsten oxides have a higher vapor pressure than the } metal. Thus, residual oxygen (water vapor is particularly troublesome) } reacts with the W surface and is immediately evaporated yielding } another pristine, reactive surface. More removal. } } As far as weakness, the tungsten is fully annealed as soon as it is } turned on. Pure tungsten relaxes well below 2000C and filaments can } operate at much higher temperatures. } } Hope this helps. } ------------------------------------------------- } Harold J. Crossman } OSRAM SYLVANIA INC. } Lighting Research Center } 71 Cherry Hill Dr. } Beverly, MA 01915 } Phone: (508) 750-1717 } E-mail: crossman-at-rd.sylvania.com } } Our web sites: www.sylvania.com } www.osram.de } www.siemens.com } -- } } "Crossman, Harold" {crossman-at-RD.SYLVANIA.com} } } } } }
I was asked by a fellow researcher if she could stain LR White sections with these two stains: H & E stain and Trichrome stain. The tissue embedded in the LR White is fish epithelial tissue. I have not used these stains with LR White. Has anyone else?
Thank you,
Ginger Baker EM Lab Manager 250 Veterinary Medicine Dept. of Anatomy, Pathology, and Pharmacology Oklahoma State University Stillwater, OK 74078 (405) 744-6765 FAX: (405) 744-5275 Email: lizard-at-okway.okstate.edu
If you are in Chicago sometime, check out the Microscopy Exhibit at the Museum of Science and Industry. It has a wide variety of things, including x-sections of real microscopes and a number of displays. Many of which are geared for the 15 and under crowd.
} } } Something I have never gotten a satisfactory explanation of is: } } Why does a W filament always (?) burn out some distance from the tip. } Is } this inherent to the bending of the metal and a region of weakness? And } why } is it always on the same side, relative to the power input?
Perhaps I can shed some light on the subject. I am an engineer in a materials characterization lab for OSRAM SYLVANIA. We make tungsten and light bulbs. I have looked at a filament or two in the SEM.
Tungsten SEM filaments are generally "pure" tungsten rather than doped, or alloyed, as is normally done for light bulbs. The pure tungsten tends to form relatively smooth grain boundaries across the wire section, called a "bamboo structure". The grain boundaries have a higher resistance than the crystals themselves and they tend to slide past each other. These two factors lead to decreasing cross-sectional area (the W evaporates faster in the hot spots) which in turn causes the filament to get hotter, which in turn accelerates evaporation which.....
Also, certain tungsten oxides have a higher vapor pressure than the metal. Thus, residual oxygen (water vapor is particularly troublesome) reacts with the W surface and is immediately evaporated yielding another pristine, reactive surface. More removal.
As far as weakness, the tungsten is fully annealed as soon as it is turned on. Pure tungsten relaxes well below 2000C and filaments can operate at much higher temperatures.
Hope this helps. ------------------------------------------------- Harold J. Crossman OSRAM SYLVANIA INC. Lighting Research Center 71 Cherry Hill Dr. Beverly, MA 01915 Phone: (508) 750-1717 E-mail: crossman-at-rd.sylvania.com
Our web sites: www.sylvania.com www.osram.de www.siemens.com --
ebs-at-ebsciences.com wrote: } } Hi John & Colleagues- } } A tungsten filament should *not* always burn out some distance from the tip. } However, it may be, if the filaments were not vacuum annealed, that the } "cold stress" imparted by the bending of the filament does indeed make a } "region of weakness." } } Best regards, } Steven E. Slap, Vice-President } ********************************
Steven
I'm puzzled by your response. Every tungsten filament I've ever seen which has expired due to "natural causes" (i.e., which has failed through gradual metal evaporation, rather than overcurrent, bad vacuum, etc.) has opened just a bit to one side of center. I don't think I've ever seen a filament which has gradually thinned and then opened just at the center of the bend, despite the fact that this is where one would expect the highest temperature for a filament of uniform thickness. This seems to be true for filaments of all manufacture, including those from your company.
My speculation as to a reason for this behavior is that the bending process causes a very slight thickening at the apex of the bend, with a similarly slight thinning in the adjacent regions. Near the end of its life, the slight variations in thickness create increasing differences in local ohmic heating and thus evaporation in a regenerative process. This theory may be incorrect, but it is substantiated by a lot of time spent observing operating filaments via an optical device. What I observed is that the filament wire seems to thin rather uniformly until late in the filament's life. In the last hours of lifetime, the differences in thinning become pronounced and then proceed to failure in an exponential fashion. The thinning regions were always just next to the apex. I have also speculated that there may be actual migration of metal to the tip during this end-game, thus hastening the thinning from the side.
I have never worked with powders and thus would appreciate advice on sample preparation for TEM study of microstructure and analysis. Two sets of samples have been given to us:
1) Nanocrystalline WC-Co powder 2) Milled FeSi, size 0.1mm diameter upwards to 2mm, many appear to be hollow, the hole being completely enclosed by material.
Facilities available: Gatan Ultrasonic Drill, Gatan Dimpler, Gatan Duo Ion Mill 600 (1980) with minimum angle of incidence about 13 degrees.
Thanks in advance for any suggestions.
Michael J Witcomb PhD Electron Microscope Unit University of the Witwatersrand Private Bag 3 WITS 2050 South Africa
} I have never worked with powders and thus would appreciate advice on } sample preparation for TEM study of microstructure and analysis. } Two sets of samples have been given to us: } } 1) Nanocrystalline WC-Co powder } 2) Milled FeSi, size 0.1mm diameter upwards to 2mm, many appear to be } hollow, the hole being completely enclosed by material. } } Facilities available: Gatan Ultrasonic Drill, Gatan Dimpler, Gatan Duo } Ion Mill 600 (1980) with minimum angle of incidence about 13 degrees.
Mike, If your WC-Co powders are suitably fine (say less than 200-300 nm) then you may be able to prepare specimens without resort to ion milling. You will need to prepare some thin carbon films mounted on copper grids (which is not difficult, I can provide details of how). You then disperse the powder in a suitable medium, we usually use methanol, and dip the grid in. The powder particles should then be stuck to the carbon film and can easily be observed in the TEM.
I am not so sure about the FeSi but I would imagine something like mixing with epoxy, curing and then preparing by cutting slices, drilling out discs, dimpling and ion thinning may work. Alternatively, some people have prepared similar powders by electroplating with Ni and electropolishing.
Hope this helps
=DD=DD=DD=DD=DD=DD=DD=DD=DD=DD=DD=DD=DD=DD=DD=DD=DD=DD=DD=DD=DD=DD=DD=DD=DD= =DD=DD=DD=DD=DD=DD=DD=DD=DD=DD=DD=DD=DD=DD=DD=DD=DD=DD=DD=DD=DD=DD=DD=DD=DD= =DD=DD=DD=DD=DD=DD=DD=DD=DD=DD=DD=DD=DD=DD=DD=DD Ian MacLaren, Tel: (44) (0) 121 414 3447 IRC in Materials for FAX: (44) (0) 121 414 3441 High Performance Applications, email: I.MacLaren-at-bham.ac.uk The University of Birmingham, http://sun1.bham.ac.uk/I.MacLaren/ Birmingham B15 2TT, England. =DD=DD=DD=DD=DD=DD=DD=DD=DD=DD=DD=DD=DD=DD=DD=DD=DD=DD=DD=DD=DD=DD=DD=DD=DD= =DD=DD=DD=DD=DD=DD=DD=DD=DD=DD=DD=DD=DD=DD=DD=DD=DD=DD=DD=DD=DD=DD=DD=DD=DD= =DD=DD=DD=DD=DD=DD=DD=DD=DD=DD=DD=DD=DD=DD=DD=DD
} I have never worked with powders and thus would appreciate advice on } sample preparation for TEM study of microstructure and analysis. } Two sets of samples have been given to us: } } 1) Nanocrystalline WC-Co powder } 2) Milled FeSi, size 0.1mm diameter upwards to 2mm, many appear to be } hollow, the hole being completely enclosed by material. } } Facilities available: Gatan Ultrasonic Drill, Gatan Dimpler, Gatan Duo } Ion Mill 600 (1980) with minimum angle of incidence about 13 degrees. } } Thanks in advance for any suggestions. }
Dear Mike:
You can use the ion mill. However, first you will need to press the powders into 3mm pellets. We have done this with a die and hardened steel rods, which we had made for the purpose. The die had a 3mm bore, into which the rods could be inserted. Placing a small spoonful (30 mg should be plenty) of the powder on top of one rod (inserted into the die), the second rod was inserted on top and a force was applied (we used a little more than 2 tons). This consolidated the pellet sufficiently for subsequent grinding, dimpling and ion milling.
Short of having a die made, you could try any kind of press, hopefully with a small diameter (in order to reach the necessary pressure), and then reduce the consolidated powder to a 3mm pellet.
Sometimes milled powders tend not to stick together well. In this case you can mix the powder with a nice ductile, slow-milling metal like Mo, in about 1:1 proportion. This eliminates the problem of crumbling during grinding.
If you need any more details, let me know.
Wharton
++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++ Wharton Sinkler PhD Department of Materials Science and Engineering Northwestern University 2225 Sheridan Rd. Evanston, IL 60208-3108 tel: (847) 491-7809 fax: (847) 491-7820 email: sinkler-at-apollo.numis.nwu.edu
} } Michael J Witcomb PhD } Electron Microscope Unit } University of the Witwatersrand } Private Bag 3 } WITS } 2050 } South Africa } } Telephone: + 27 11 716 4000 } + 27 11 716 2419 (messages) } Fax: + 27 11 339 3407 } E-mail: mikew-at-gecko.biol.wits.ac.za }
Hello, I have been looking for information concerning Spin Polarization Microscopy in the SEM (SEMPA). SEMPA is concerned with the ability to determine the orientation of magnetic domains in a specimen by analysis of the spin of the secondary electrons. Any information concerning recent developments (publications?) in theory, or any organization that has a product (spin polarization analyzer?) on the market that is capable of this type of analysis would be greatly apreciated. Thanks Jason Smith email: jtsmith2-at-eos.ncsu.edu
I am preparing thin solid film TEM samples by the Small-Angle Cleavage Technique(originated and developed by John McCaffrey) currently. But, the substrates are Si and the total thickness of the films is thinner than 500 nm.
If you use Si substrates instead of glass and limit your films within 500 nm range in thickness, I suggest you may try this method.
Good luck.
S Suder Joule Physics Laboratory University of Salford Manchester M5 4WT UK Tel: +44 (0161) 745 5000x3264 Fax: +44 (0161) 745 5119 Email: s.suder-at-eee.salford.ac.uk
I saw some inquiries regarding autofocus. We have 4 light microscopes with autofocus capabilities. We could not aford 4 complete motorized stages with autofocus so we found a company that modified our existing stages and attached autofocus controls as well. I am not sure what their current prices are like but you can contact them at richard-at-brancker.ca for updated info.
I am thinking about replacing my cantankerous sputter coater. I currently use Au/Pd and am satisfied with the results when I can get them. High resolution is not as important as complete coverage of insulating materials. I am interested in reading user experiences, good and bad, about features, product support, RELIABILITY, accuracy, repeatability, etc. I am primarily interested in bench-top systems. High through-put is not an issue. I use accelerating voltages from 500 to 30keV, various beam currents, etc. If the machine can do it, I use it.
As this request is not an objective survey of instrument features, I will keep all comments confidential. Please respond directly to me.
------------------------------------------------- Harold J. Crossman OSRAM SYLVANIA INC. Lighting Research Center 71 Cherry Hill Dr. Beverly, MA 01915 Phone: (508) 750-1717 E-mail: crossman-at-rd.sylvania.com
Our web sites: www.sylvania.com www.osram.de www.siemens.com --
} I need some technical information on the x-sectional TEM specimen } preparation of thin solid film multilayers. The layers are } glass(substrate)/Mo/CuInSe2/CdS/ZnO and the total thickness of the } film layers are ~5um. The tricky thing here is that the glass is very } brittle, and the adhesion between glass and Mo is not very good and } peeling may occur.
} Any information on the x-sectional thin film specimen preparation in } general or specific techniques to deal with glass substrate would be } highly appreciated.
The simplest techniqe, and the first that I would try, would be to try the small-angle cleavage technique, but fracture the sample instead of cleaving it. 1. back-thin the sample to about 100 microns thickness 2. using a scriber on the BACK surface (the side that you back-thinned), make a series of scribe lines about 1- 2mm apart 3. fracture the sample along these lines (over the edge of a glass coverslip works well) 4. Using the scriber on the FRONT surface, make small scribe lines at a 10- 20 degree angle to the fractured edge, BUT NOT TO THE EDGE ITSELF! Keep scribing along these small lines until the sample fractures into a thin triangular-shaped needle. Make about eight of ten of these. These needles will have the original fractured edge intersecting the new scribed/fractured edge at a fine point on the surface with the layers on it. Pick out the "pointiest" of these - these are your samples! 5. Mount each sample on edge on a standard copper slot grid with a viscous epoxy (silver-filled epoxy works well).
For examples of the technique applied to layers on glass and other non- cubic crystal substrates, see Scott Walck's presentations at the spring MRS meeting in San Francisco, March 31-April 4/96 or at the spring Int'l. Conference on Metallurgical Coatings and Thin Films in San Diego, April 21-25, or contact him to ask for reprints (walcksd-at-ml.wpafb.af.mil).
For references on the technique applied to semiconductors, see J.P. McCaffrey, "Improved TEM samples of semiconductors prepared by a small-angle cleavage technique", Microscopy Research and Technique 24:1890-184 (1993), or email me and I'll send a short video that applies to both crystals and amorphous materials.
} } Hello, } I have been looking for information concerning Spin Polarization } Microscopy in the SEM (SEMPA). SEMPA is concerned with the ability to } determine the orientation of magnetic domains in a specimen by analysis } of the spin of the secondary electrons. Any information concerning } recent developments (publications?) in theory, or any organization that } has a product (spin polarization analyzer?) on the market that is } capable of this type of analysis would be greatly apreciated.
Dear Jason, Another possibility is to generate a polarized electron beam, e.g., with a Stern-Gerlach apparatus, and measure the right-left assym- metry of the scattering. As this assymetry may be measurable with commercially available detectors, producing a polarized beam may be the easiest course. Yours, Bill Tivol
I am trying to help our local high school setup and SEM and EDS system for their earth science department. I located an old SEM and now need an EDAX 9900 or 9800 EDS system for it. If anyone has one of these systems I can arrange to pick it up. Thanks, Al Sicignano
Message-Id: {199611070535.AAA17156-at-ns1.axs2000.net} To: MICROSCOPY BB {Microscopy-at-Sparc5.Microscopy.Com}
I have been asked to forward the following inquiry to the group.
(Please do not reply to me reply to: Karen Klomparens {kklompar-at-msu.edu}
------- Forwarded Message Follows -------
Popped the reprints in the mail to you today.
Would you put a question out on the list serve for me:
Does anyone have a foolproof (HA!) method to dewax thick paraffin sections (of plants) on microscope slides and then to run them up in resin for TEM? The key question, of course, is getting the sample off of the glass slide. Any methods or references will be appreciated! Thank you.
Karen Klomparens Center for Electron Optics Michigan State University
We have Reichert Ultra cut E, Reichert knife breaker, (Really LKB with Reichert logo) and a LKB auto stainer (for grids). We have shut down our EM lab and my boss is thinking about selling them. Duke surplus has to apraise them, but these guys don't really know what these things might be worth. Does any one want to give me a guess as to what they might be worth? All are about 6 years old and are working. When we sold the scope there didnot seem to be much of a market, although, we did eventually sell it. Is it amy better for microtomes and other lab stuff?
I thank you in advance for any helpful information.
larry hawkey Former Electron Microscopist Department of Neurobiology Duke University
Larry Hawkey hawkey-at-neuro.duke.edu Department of Neurobiology Duke University
I read the request for an old Spectrometer for a high school, but deleted it. However, after deletion, I saw a used EDAX9100 for sale for $500 in October's "Microscopy Today" magazine Page 20. Maybe it's worth a call by whomever was searching for one. The listed phone number is 203-389-6065. No names were listed. The area code looks like the eastern time zone.
There must be a way, but I'm not aware of it. Can I add a brief description of the sample to the tiff file, so that the description will always stay associated with the image?
What software will allow me to read/write the description? In general, what software is used to edit tiff files other than editing the image itself? I'm using a PC.
I just ordered some Kodak 4489 TEM film, and was shocked by the price increase from my normal supplier. Our price went from about $45/100 sheets to $70. Has anyone else had the same surprise?
I'd be interested in cheaper sources of this film or comparable EM films. I have been told that the Ilford EM film has been discontinued.
I haven't dewaxed tissue before, but I have reembedded tissue on a slide before. I stood a full beem capsule on top of the slide and polymerized according to instuctions for the media I filled the capsule with. To get the tissue off the slide, I placed the slide in a petri dish full of propylene oxide for an hour or so, then I removed the stub, tissue and all, with a razor blade.
I have heard it helps if the slide is coated with albumin prior to placeing the waxed section on it.
Many thanks to all who responded to my question, to Nestor and MSA who provide this wonderful forum.
I have not yet found the source of my problem. I have removed an X-ray detector with a new Be window installed. This may not be the problem. The company which installed the window told me that they used TORR SEAL and that vacuum was good (at least at the gauge). I also let the machine pump for at least 10 min. before turning on HT and filament. The filament is turned down every time and restarted slowly. There were three filaments fried before I posted the question. So far, the filament is behaving normally. It is going to take some time to sort out the source of this problem. I have summarized all the responses in the attached file.
Is your web site the best kept secret on the Internet?
We'll post your site to 50 search engines/indexes for $85 and complete the job in two business days.
Please respond for details or call 914-278-4933.
-Julie
===Web Promotions=====Press Releases=====Link Exchanges========= Owl's Eye Productions, Inc. 260 E. Main Street Brewster, NY 10509 Ph: 914-278-4933 Fx: 914-278-4507 E-mail: owlseye-at-owlsnest.com
Message-Id: {199611072043.OAA20030-at-watson.bcm.tmc.edu} X-Sender: joiner-at-bcm.tmc.edu X-Mailer: Windows Eudora Version 2.1.1 Mime-Version: 1.0 Content-Type: text/plain; charset="us-ascii"
At 11:23 AM 11/7/96 -500, you wrote:
} Does anyone have a foolproof (HA!) method to dewax thick paraffin sections } (of plants) on microscope slides and then to run them up in resin for TEM? } The key question, of course, is getting the sample off of the glass slide. } Any methods or references will be appreciated! Thank you. ***************************
Karen -
We do this somewhat routinely with H & E preps of human biopsies. First, we soak off the coverslip with xylene. We then rehydrate the section on its glass slide through a series of alcohols (100% =} water) and osmicate the tissue, again on the slide. We then dehydrate the tissue back through 100% alcohol and P.O. and flood the slide with PO/Spurr in 2:1, 1:1, 1:2, and pure Spurr, all while the tissue is still on the glass slide. We then fill a Beem capsule with resin and invert it over the section and oven cure it. The cured (and stuck) capsule and slide is then dropped into a beaker of liquid nitrogen until it is thoroughly chilled. The LN chilled slide/capsule is then transferred quickly to a beaker of hot water. This frees the glass from the block. Remember the tissue is right on the surface of the resin block and the first section off the knife will have tissue in it. So align the block in your microtome carefully.
I assume that you could collect your paraffin sections on glass slides, deparaffinize them in the usual way, and proceed as above. If you do not subject the tissue to H&E staining, etc., but osmicate and embed them right after deparaffinizing, your EM results might be better than ours. Tissue that has been embedded in paraffin, and then stained for light microscopy, doesn't have a whole lot of ultrastructure left; although we can often get our diagnosis. Plant tissue may stand up to this better than human tissue.
Good luck. Joiner ************************
Joiner Cartwright, Jr., Ph.D.
Director, Electron Microscopy tel.: (713)798-4658 Department of Pathology, Rm.286-A FAX: (713)798-3945 Baylor College of Medicine Internet: joiner-at-bcm.tmc.edu One Baylor Plaza Compuserve: 71555,1206 Houston, Texas 77030 U.S.A.
Would it be possible to measure residual stresses in tungsten carbide cutting tools as a measure of the quality of the grinding (sharpening) process? Carbide tools typically have between 3 - 15% cobalt as a binder. In grinding these tools, a visual inspection after grinding may show a good cutting edge even though the integrity of the material has been compromised by improper grinding techniques.
We'll post your site to 50 search engines/indexes for $85 and complete the job in two business days.
Please respond for details or call 914-278-4933.
-Julie
===Web Promotions=====Press Releases=====Link Exchanges========= Owl's Eye Productions, Inc. 260 E. Main Street Brewster, NY 10509 Ph: 914-278-4933 Fx: 914-278-4507 E-mail: owlseye-at-owlsnest.com
"How to annotate tiff files?" (Nov 7, 2:17pm) References: {s281efa2.092-at-depotech.com} X-Mailer: Z-Mail (3.1.0 22feb94 MediaMail) To: Richard Thrift {Richard_Thrift-at-depotech.com} , Microscopy-at-Sparc5.Microscopy.Com
On Nov 7, 2:17pm, Richard Thrift wrote: } Subject: How to annotate tiff files? } There must be a way, but I'm not aware of it. Can I add a } brief description of the sample to the tiff file, so that the } description will always stay associated with the image? } } What software will allow me to read/write the description? } In general, what software is used to edit tiff files other than } editing the image itself? } I'm using a PC. } } Thanks } Richard } -- End of excerpt from Richard Thrift
Dear Richard,
I know two softwares in PC which can open and annotate in tiff files, one is PhotoStyler, another is ImageStar.
regards, G.REN
-- +---------------------------------------------------------+ | Gang REN, Ph.D Candidate | | Email: ren-at-image.blem.ac.cn Fax: (+86-010) 62561422 | | Phone: (+86-10) 62568304; 62612498 | | Beijing Laboratory of Electron Microscopy | | Chinese Academy of Sciences, P.O Box 2724 | | Beijing 100080, P.R.China | +---------------------------------------------------------+
One of PC software called Mocha 2.1 can open TIFF files and annotate on the image in form of overlay. The overlay can be merged in image or saperated. The annotate can be saved as a overlay file. You can open the overlay file to see the annotate. The software can provide 3 overlaies in different color. Hopefull it helps.
Zhiyu Wang Dept. of Biosystem Engineering University of Hawaii
On Fri, 8 Nov 1996, Gang REN wrote:
} On Nov 7, 2:17pm, Richard Thrift wrote: } } Subject: How to annotate tiff files? } } There must be a way, but I'm not aware of it. Can I add a } } brief description of the sample to the tiff file, so that the } } description will always stay associated with the image? } } } } What software will allow me to read/write the description? } } In general, what software is used to edit tiff files other than } } editing the image itself? } } I'm using a PC. } } } } Thanks } } Richard } } -- End of excerpt from Richard Thrift } } Dear Richard, } } I know two softwares in PC which can open and annotate in tiff files, one is } PhotoStyler, another is ImageStar. } } regards, } G.REN } } } } -- } +---------------------------------------------------------+ } | Gang REN, Ph.D Candidate | } | Email: ren-at-image.blem.ac.cn Fax: (+86-010) 62561422 | } | Phone: (+86-10) 62568304; 62612498 | } | Beijing Laboratory of Electron Microscopy | } | Chinese Academy of Sciences, P.O Box 2724 | } | Beijing 100080, P.R.China | } +---------------------------------------------------------+ } } } }
We are repairing the sputter head on a 3 yr. old SCD 050 Sputter-coater (BALTEC). Has anyone done the same? Vacuum is fine but the problem seems to be in the high V. We've changed the Oring, shaft seal and now are working on the optocouplers. Thanks in advance for any time and thought you can give to this. Rosemary Walsh
Richard, Do you really want to annotate the image itself or catalog it for future reference? If the latter is true, check out Thumbs Plus image database. It allows annotation, keyword searches, thumbnail creation, and all sorts of other neat stuff. It translates a handful of image formats and runs under all Windows GUI/OS. The icing on the cake? It's about sixty-five dollars.
Cerious Software, Inc. 1515 Mockingbird Lane Suite 209 Charlotte, NC 28209 (704) 529-0200
www.cerious.com
I have no financial or other interest in Cerious. I am just a very happy customer.
------------------------------------------------- Harold J. Crossman OSRAM SYLVANIA INC. Lighting Research Center 71 Cherry Hill Dr. Beverly, MA 01915 Phone: (508) 750-1717 E-mail: crossman-at-rd.sylvania.com
Our web sites: www.sylvania.com www.siemens.com --
} I WOULD LIKE SOME HELP IDENTIFYING SOME RETROVIRUS PARTICLES IN SOME OF MY } ELECTRON MICROGRAPHS. ANY IDEAS??????
Bob,
My lab has done a bit of retrovirus diagnostic work from time to time, mostly avian but some mammalian. What exactly do you want....confirmation or id down to type?
-=W.L. Steffens=- Department of Veterinary Pathology College of Veterinary Medicine University of Georgia
I have had a request to attach a laser to my Ziess Axioplan Light Microscope. The requester would like to irradiate a material with the laser through the microscope and then record the results or the process on video. Can someone recommend articles that might describe how to attach a laser or a researcher who has done this.
All major scientific image processing software packages are able to annotate TIFF files. I made best experience with Media Cybernetics' Image-Pro Plus ! (....www.mediacy.com)
Energy Beam Sciences has, for some years now, sold AGFA SCIENTIA 23D56 film for TEM. The price is comparable to the Kodak, and it offers certain technical advantages.
Best regards, Steven E. Slap, Vice-President ******************************** Energy Beam Sciences, Inc. Adding Brilliance To Your Vision ebs-at-ebsciences.com http://www.ebsciences.com/ ********************************
Someone recently posted a message lamenting the current price of 4489. After discarding the posting, I received a catalog from Laube Photo offering the film for: 51.49/100 or 107.91/250. Not too bad!
The address is:
Laube Photo and Camera Supply 151 West Exchange Street Akron, OH 44301
(330)535-3379 Voice (330)535-0342
-=W.L. Steffens=- Department of Veterinary Pathology College of Veterinary Medicine University of Georgia
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On Thu, 7 Nov 1996, John Chandler wrote:
} I just ordered some Kodak 4489 TEM film, and was shocked by the price } increase from my normal supplier. Our price went from about $45/100 sheets } to $70. Has anyone else had the same surprise? } } I'd be interested in cheaper sources of this film or comparable EM films. } I have been told that the Ilford EM film has been discontinued. } } John } chandler-at-lamar.ColoState.EDU }
John, Yep! Too much! You can get 4489 through Penn Camera for approx. $57/box. I order the bulk pack, cat. # 166-2238, 250 sheets for $112/box. It's like getting 50 sheets free. Penn Camera can be reached at: penncamera-at-aol.com address it to Jeff. voice: 1-800-347-5770 Jeff and Art at this company are very good to deal with. Penn is the best photo dealer I've dealt with in the past 17 years. Jeff and Art can help with just about any problem you may have concerning photography. Like I said before, I've dealt with Penn Camera for 17 years and they have always been a help.
Peace through Christ,
Phil Rutledge, Director e-mail: prutle1-at-gl.umbc.edu Center for Microscopy voice: (410) 455-3582 UMBC Dept. of Biology fax: (410) 455-3875 Catonsville, MD 21228 ///// / / / / /////// /////// / / /////// /////// / / / / / / / / / / / / /////
Dear All, I would like to simulate thickness fringes in a cleaved edge semiconductor specimen with the aim of measuring composition of AlGaAs, InGaP etc.. If anyone has an idea where I might be able to get the appropriate software, comments on the feasibility of the measurement, etc., I would be very glad to hear from them.
Thanks very much in advance,
Richard Beanland GMMT Ltd., Caswell, Towcester, Northants NN12 8EQ UK e-mail richard.beanland-at-gecm.com Tel. +44 1327 356363
I agree that there is no need to pay a fee to have sites announced. Try "Submit it" {http://www.submit-it.com/} . The site is sent automatically to a bunch of users and engines. Most engines out there come to you for inclusion is the site is visited often enough!
I would like to get information on reflection electron diffraction in the TEM. Recently, someone asked me if we had on our JEOL 200CX an attachment to do reflection electron diffraction. I heard this attachment was more common in older JEOL TEMs (JEM 7 or 9), and that it is installed in the column somewhere below the OL or even below the intermediate lens. Does anybody have this facility, or has any information about it?
Augusto A. Morrone 107D-MEL, P.O. Box 116400 MAIC Materials Science and Engineering University of Florida Gainesville, FL 32611 (352) 392-1497 or 6985 Fax: (352) 392-0390 amorr-at-mse.ufl.edu
} Would it be possible to measure residual stresses in tungsten carbide } cutting tools as a measure of the quality of the grinding (sharpening) } process? Carbide tools typically have between 3 - 15% cobalt as a } binder. } In grinding these tools, a visual inspection after grinding may show a } good cutting edge even though the integrity of the material has been } compromised by improper grinding techniques. } } Thanks
Depends at what scale you are interested in examining the tools.
For 'macro' analysis, I believe that there are X-ray diffraction methods, working on the scale of mm (and up) which use the broadening of diffraction lines to measure strain.
On a 'micro' scale (micrometres down to nm), it is possible to use TEM convergent beam electron diffraction to measure strain. Essentially the same idea - you look at the broadening of diffraction lines.
However, I guess the XRD approach is potentially non-destructive whereas the TEM method requires preparation of suitable specimens - which might lead either to the release of residual stress, or introduce further stress. If you are careful and use only electro-spark errosion, you should avoid introducing more strain but it might be difficult to avoid stress release.
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Most image cataloging, and some image analysis, software allow you to do this. The standard is Adobe Photoshop. A smaller, but very capable image databasing package with basic image editing capabilities, is Ulead, Inc.'s Image Pals. Actually Image Pals has been updated and improved, and renamed; and I can't recall the new name. Any good software shop would have both of these programs. They allow you to store images with user provided titles, keywords, and annotations that can be searched. An important feature is "thumbnails" which allow you to preview small snapshots of many of your images on screen at one time. Other features of these programs that are useful are format conversion, file compression, and of course the various image enhancement (sharpening, contrast control, etc.) features which require care when used in a scientific environment.
At 02:17 PM 11/7/96 -0800, you wrote: } There must be a way, but I'm not aware of it. Can I add a } brief description of the sample to the tiff file, so that the } description will always stay associated with the image? } } What software will allow me to read/write the description? } In general, what software is used to edit tiff files other than } editing the image itself? } I'm using a PC. } } Thanks } Richard } } } ____ _ | ___\_\_o____/_| Joiner Cartwright, Jr., Ph.D. {- [____\_\_---------- {...............Baylor College of Medicine | o' Houston, Texas U.S.A.
Looking for a Side Entry Goniometer (SEG) for a JEOL 200/100 A or B or CX etc. Preferably something to be given away from an unwanted TEM. (We don't need the TEM though!)
Thanks
Mark Wall Lawrence Livermore National Lab 510 423-7162
Karen, Here's what I do when I need to embed paraffin sections on slides. Use a diamond pencil to mark back of slide with area of interest. After removing coverslip with xylene, deparaffinize tissue by soaking in xylene for a couple of hours. Remove excess tissue with razor blade. Rehydrate with EtOH , then wash in NaCacodylate. Postfix with OsO4, wash and enbloc stain U.A. Dehydrate with EtOH, then P.O. Infiltrate with 1:1 Epon Araldite : P.O. Drain in warm oven on side. Put on 100% Epon Araldite, drain, and repeat. Put 1-2 drops of resin on tissue. Use a flat hardened block that you have previously made in a Beem capsule ( add resin to capsule, close lid , and bake standing up on lid). Use the flat end of this block and place it on top of slide, being careful not to introduce air bubbles. Bake. Scrape excess resin from around block, then place on 90 degree C. hotplate. After a few minutes, pop capsule ( with tissue attached) off with pliers. This is not always foolproof, but it usually works for the few samples I do. You can also immerse slide in liq. nitrogen which will break from the capsule. In the past, I've tried inverting a capsule filled with fresh resin over the tissue, but I always ended up with a mess because the resin would leak out.. I've also tried putting the slide on top of an overfilled been capsule, then baking, but the slide moves and I end up with air bubbles. My samples are animal tissue, so you may have to modify it for plants. Good luck!
Debbie Cassout Texas Veterinary Medical Diagnostic Laboratory E.M. Lab College Station, TX e-mail: dcassout-at-tamu.edu
} } } "Richard E. Edelmann" {edelmare-at-CASMAIL.MUOHIO.EDU} 11/07/96 11:23am } } } I have been asked to forward the following inquiry to the group.
(Please do not reply to me reply to: Karen Klomparens {kklompar-at-msu.edu}
------- Forwarded Message Follows -------
Popped the reprints in the mail to you today.
Would you put a question out on the list serve for me:
Does anyone have a foolproof (HA!) method to dewax thick paraffin sections (of plants) on microscope slides and then to run them up in resin for TEM? The key question, of course, is getting the sample off of the glass slide. Any methods or references will be appreciated! Thank you.
Karen Klomparens Center for Electron Optics Michigan State University
} Dear All, } I would like to simulate thickness fringes in a cleaved edge } semiconductor specimen with the aim of measuring composition of AlGaAs, InGaP } etc.. If anyone has an idea where I might be able to get the appropriate } software, comments on the feasibility of the measurement, etc., I would be } very glad to hear from them. } } Thanks very much in advance, } } Richard Beanland } GMMT Ltd., } Caswell, } Towcester, } Northants NN12 8EQ } UK } e-mail richard.beanland-at-gecm.com } Tel. +44 1327 356363
I guess in principle that is possible although I would have doubts as to its practical implementation. I would first suggest (if you haven't already done so) going through the theory and determining how acurately you can measure the various parameters, and how sensitive the whole process is to composition.
I presume that you plan to evaluate composition via the extinction distance? However, if using thickness fringes, this also requires a knowledge of thickness and you will need to determine the thickness profile.
If you really want to try this route, I would suggest convergent beam diffraction. Under appropriate diffraction conditions, you can count Kossel-Mollenstedt fringes and measure their spacing in the CBD disc. A simple plot gives you the thickness (from the intercept) and the extinction distance (from the slope). This approach has two main advantages:
1. You are doing the analysis at a point, so in principle this will allow you to pick up any compositional inhomogeneities, which a thickness fringe approach would average out.
2. You can, if necessary, do it with a calculator and piece of graph paper! No computer simulations will be needed.
Of course, it has disadvantages:
1. Again it presupposes that the extinction distance is a sensitive measure of composition, as does the use of thickness fringes.
2. It won't work with very thin crystals - you need at least 3 dark fringes on either side of the central bright maximum to do the plot (and I'd suggest you need more to improve the accuracy).
3. You will probably need a double tilt holder to set up an appropriate diffraction condition, and even then depending on the composition and orientation of the specimen, you may not be able to find a suitable orientation.
I presume you have considered direct analysis, that is EDX or EELS, and concluded that accuracy is insufficent for the compositional changes you are trying to measure?
How about measurement of lattice parameter? This may be sensitive enough to show the compositional changes in which you are interested. There are two approaches here:
1. Direct high resolution TEM - depends on the specimen and access to a good instrument.
2. Back to convergent beam - the position of HOLZ lines is very sensitive to lattice parameter, something like +/- 5 x 10-4 nm relative to a known standard (it is not very good for absolute measurements). It does depend on the TEM having a very stable kV, but this shouldn't be a problem on a modern TEM.
Only having a rough idea of what you want to do, I'd recommend the last method.
Hope that is useful,
Regards,
--------------------------------------------------------------- Dr L. P. Stoter Technical Editor, MICROSCOPY & ANALYSIS Technesis 17, Rocks Park Road email: LPS-at-teknesis.demon.co.uk Uckfield, E. Sussex Phone: +44 (0)1825 766911 TN22 2AT Fax: +44 (0)1825 766911 United Kingdom ---------------------------------------------------------------
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I need to move a sys75.kvx file off of a DEC lsi 1173 and onto a p.c. Once on the p.c., I would like to analyze the eds spectra (print out a spectra and extract semi-quantitative elemental composition - and I would like for it to be user friendly (boy, am I asking for a lot, or what!)
I am praying that the DEC has a copy of kermit on it. If not, then I will have to either copy files one by one over the printer port to a laptop with kermit on it or someone get a copy of kermit onto the DEC.
Some other information: DEC LSI 1173 running on RT11, Kevex 9000 system 7579 delta5. The DEC is connected to the outside world by 10 MB disks...
Is there any hope?
thanks,
Steve
*************************************** Dr. Steven S. Trail B.P. Chemicals 4440 Warrensville Center Rd Warrensville Hts., OH 44128 (216) 586-5136 (work) (216) 586-5030 (fax) trailss-at-bp.com trail-at-cyberdrive.net (home) ***************************************
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I need to move a sys75.kvx file off of a DEC lsi 1173 and onto a p.c. Once on the p.c., I would like to analyze the eds spectra (print out a spectra and extract semi-quantitative elemental composition - and I would like for it to be user friendly (boy, am I asking for a lot, or what!)
I am praying that the DEC has a copy of kermit on it. If not, then I will have to either copy files one by one over the printer port to a laptop with kermit on it or someone get a copy of kermit onto the DEC.
Some other information: DEC LSI 1173 running on RT11, Kevex 9000 system 7579 delta5. The DEC is connected to the outside world by 10 MB disks...
Is there any hope?
thanks,
Steve
*************************************** Dr. Steven S. Trail B.P. Chemicals 4440 Warrensville Center Rd Warrensville Hts., OH 44128 (216) 586-5136 (work) (216) 586-5030 (fax) trailss-at-bp.com trail-at-cyberdrive.net (home) ***************************************
} Date: Fri, 8 Nov 1996 09:00:29 EST } From: Buddy Steffens {STEFFENS.B-at-calc.vet.uga.edu} } To: Robert Mixon {mixonr-at-ohsu.edu} , Microscopy-at-Sparc5.Microscopy.Com } Subject: Re: RETROVIRUS IDENTIFICATION } } } I WOULD LIKE SOME HELP IDENTIFYING SOME RETROVIRUS PARTICLES IN SOME OF MY } } ELECTRON MICROGRAPHS. ANY IDEAS?????? } } Bob, } } My lab has done a bit of retrovirus diagnostic work from time to } time, mostly avian but some mammalian. What exactly do you } want....confirmation or id down to type? } } } } -=W.L. Steffens=- } Department of Veterinary Pathology } College of Veterinary Medicine } University of Georgia
Hi Buddy,}
Ditto above. Give me a call, and I'll try to stear you. Sara
Sara E. Miller, Ph. D. P. O. Box 3020 Duke University Medical Center Durham, NC 27710 Ph: 919 684-3452 FAX: 919 684-8735
Looking for information re: the use of phase contrast microscopy and live bllod analysis. Especially interested in any research done (or being done) in the field. Thanks, Hugh Smith
Do you have such nice information about AGFA 23D56?
Thanks
On Fri, 8 Nov 1996, Buddy Steffens wrote:
} Someone recently posted a message lamenting the current price of } 4489. After discarding the posting, I received a catalog from Laube } Photo offering the film for: 51.49/100 or 107.91/250. Not too bad! } } The address is: } } Laube Photo and Camera Supply } 151 West Exchange Street } Akron, OH 44301 } } (330)535-3379 Voice } (330)535-0342 } } } } -=W.L. Steffens=- } Department of Veterinary Pathology } College of Veterinary Medicine } University of Georgia }
Yves MANIETTE Universitat de Barcelona Serveis Cientifico Tecnics Unitat ESCA TEM Carrer Lluis Sole i Sabaris, 1-3 E-08028 BARCELONA ESPANYA
Microscopy 97 Auckland 10-14 February 1997 Organised by Microscopy New Zealand (Inc.)
Something for everyone using or interested in microscopy
Workshops, Technical Sessions, Papers,
GUEST SPEAKERS
Prof. Anthony S-Y Leong,The Chinese University of Hong Kong. Immunohistochemistry and microwave techniques in pathology.
Dr Ron Milligan, The Scripps Research Institute, USA High resolution and low temperature TEM, image processing, particular in the study of molecular motors.
Dr Val Randle, University College Swansea, UK Electron backscattered kikuchi pattern analysis
Dr E.D. Salmon, The University of North Carolina, USA High resolution video-enhanced microscopy of cell motility and the cytoskeleton.
For Further Details Contact
Dr Ian Hallett Organising Committee - Microscopy =9197 HortResearch, Private Bag 92 169, Auckland, New Zealand
Ian Hallett HortResearch Mt Albert Research Centre Private Bag 92 169 Auckland, New Zealand Fax 64-9-815 4201 Telephone 64-9-849 3660 EMail ihallett-at-hort.cri.nz
Can anyone advise a source of very small quantities (yes, I'm still in trouble with microprobe standardisation) of synthetic very pure crystalline oxides? I've heard that for some elements, such oxides are produced in the semiconductor industry, but I don't have any contacts there. My wish list would include: MgO, Al2O3, SiO2, TiO2, V2O3 or V2O5, any Fe oxide, MnO or MnO2, plus anything else that's available.
thanks
Ritchie
Ritchie Sims phone: 64 9 3737599 ext 7713 Department of Geology fax: 64 9 3737435 University of Auckland Private Bag 92019 Auckland New Zealand
The Fourth Biennial Symposium on SEM Imaging and Analysis: Applications and Techniques will be held in Melbourne, Australia 3 - 7 February 1997 Organised by Australian Microbeam Analysis Society (AMAS)
The aim of the Symposium is to provide a forum where participants can discuss scanning electron microscopy, microanalysis,image processing and analysis together with all their related methods and techniques. The emphasis is on applications and techniques.
Contributions are sought on all aspects of:
SEM imaging of biological and materials specimens X-ray analysis Field emission SEM Low-voltage SEM Cryo-SEM Digital imaging, archiving and output Laboratory management Training methods
Guest speakers:
Dr. David Joy, University of Tennessee, USA Monte Carlo Simulations of Low energy electron interactions + Low Voltage Electron Microanalysis
Dr. Val Randle, University College Swansea, UK Electron Backscattered Kikuchi pattern analysis.
Dr. Guy Remond, BRGM Orleans, France Light Element Analysis and specimen preparation.
Full details of the Workshops and the Symposium can be found at http://www.minerals.csiro.au/microscopy/amas/amas.htm
For further details
Colin MacRae Workshop co-ordinator - AMAS 97 ************************************************************************ Electron Microscopy Section & Scanning Probe Microscopy
Commonwealth Scientific and Industrial Research Organisation. _--_|\ cmac-at-minerals.csiro.au Division of Minerals / \ Ph. 61 3 9647 0296 PO Box 124, Port Melbourne 3207 \_.--._/ Fax 61 3 9646 3223 AUSTRALIA
EM units WWW site http://www.minerals.csiro.au/em-unit/ *************************************************************************
} On Nov.7th Rihcard Thrift wrote: } There must be a way, but I'm not aware of it. Can I add a } brief description of the sample to the tiff file, so that the } description will always stay associated with the image? } } What software will allow me to read/write the description? } in general, what software is used to edit tiff files other than } editing the image itself? } I'm using a PC. } } Thanks } Richard
Richard, Image Central from Advanced Imaging Concepts is an MS-Windows based image databse that will let you catalog your images with any type of information you like then sort and query on that data, also we can associate a tiff image overlay plane with any image and keep that as a separate file or merge it into the original for printing only or permanently.
Contact me at : Scott E57-at-aol.com and I will gladly mail you a packge of literature and price list for our products.
Scott E. Berman Advanced Imaging Concepts, inc. Phone:(609) 921-3629 Fax:(609) 924-3010 e-mail Scott E57-at-aol.com
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At 16:31 07/11/96 -0700, you wrote: } I just ordered some Kodak 4489 TEM film, and was shocked by the price } increase from my normal supplier. Our price went from about $45/100 sheets } to $70. Has anyone else had the same surprise? } } I'd be interested in cheaper sources of this film or comparable EM films. } I have been told that the Ilford EM film has been discontinued. } } John } chandler-at-lamar.ColoState.EDU
Unfortunately Ilford EM Film has been unavailable for some years now, a pity because it was an excellent product. When this occured we investigated the prices of other films.
I can only speak for UK prices, naturally, but Agfa Scientia 23D56 film was much cheaper than Kodak. However one problem we found was that although the Agfa film was far more sensitive and therefore required less electron exposure of the specimen, it requires the use of a dark red filter to handle it and far more stringent EM and darkroom illumination conditions. Some people can find this to be a bit of a problem when loading developing racks and fiddley film holders for the EM. We found it a real pain and eventually went over to the more expensive Kodak, where we could use an orange/brown or brighter red filter.
Are there any other EM films on the market apart from Kodak and Agfa? I don't know of any.
I have the unique opportunity to assist in the design of a new EM lab, to include 2 SEMs and a TEM, mostly for materials applications. Is anyone aware of references describing considerations for EM lab design? Any other suggestions would also be appreciated.
Disclose-Recipients: prohibited "Dr. Augusto A. Morrone" {amorr-at-mse.ufl.edu} Message-Id: {5725211111111996/A14165/CAUV40/11AB5AD50000*-at-MHS} Autoforwarded: false Mime-Version: 1.0 Content-Type: TEXT/PLAIN; CHARSET=US-ASCII Content-Transfer-Encoding: 7BIT Importance: normal Priority: normal Ua-Content-Id: 11AB5AD50000 X400-Mts-Identifier: [;5725211111111996/A14165/CAUV40] Hop-Count: 2
Augusto, I am not sure what you mean by an attachment to do RHEED and REM. I did this some time ago in a Phillips 400t; all you need is an appropriate specimen. There are some excellent papers by Tung Hsu on the subject [e.g. Ultramicroscopy _11_, 239, (1983), J. Vac. Sci. Tech. _B3_ (1985)] There is also an 'idiots guide', but I don't have the reference (J. Appl. Cryst 1983?) .
Regards,
Richard Beanland, GMMT Ltd., Caswell, Towcester, Northants NN12 8EQ UK
} Dear Microscopy Netters: } } I would like to get information on reflection electron diffraction } in the TEM. Recently, someone asked me if we had on our JEOL 200CX an } attachment to do reflection electron diffraction. I heard this attachment } was more common in older JEOL TEMs (JEM 7 or 9), and that it is installed in } the column somewhere below the OL or even below the intermediate lens. Does } anybody have this facility, or has any information about it? } } Augusto A. Morrone } 107D-MEL, P.O. Box 116400 } MAIC } Materials Science and Engineering } University of Florida } Gainesville, FL 32611 } (352) 392-1497 or 6985 } Fax: (352) 392-0390 } amorr-at-mse.ufl.edu
Kermit is definitely available for the PDP-11 running RT-11 or TSX+. We have used it plenty on our Kevex 8000 Delta V, which also has a 10 MB bernoulli. I can get you a copy, plus it should be available on line from any number of places - but then there is the issue of getting it onto your machine.
You will need to determine that you have a RS-232 serial port available. And you will need to check the settings on it. They were not as common or as straightforward as the ones on PCs.
The file itself will be a bit of fun. I know there was an export utility that would convert files to ASCII format one at a time, but they would contrain only the counts and acquire time. You would have to account for the rest: energy resolution, geometry, kV, etc. But it can be done.
BTW, what do you intend to do with the info once on the PC, i.e., what software processing?
Give me a call or e-mail and I can give you more specifics. Or it may be that others on the list have found better ways to transfer the info.
At 10:12 AM 11/9/96 -0800, you wrote: } I need to move a sys75.kvx file off of a DEC lsi 1173 and onto a p.c. } Once on the p.c., I would like to analyze the eds spectra (print out a } spectra and extract semi-quantitative elemental composition - and I } would like for it to be user friendly (boy, am I asking for a lot, or what!) } } I am praying that the DEC has a copy of kermit on it. If not, then I will } have to either copy files one by one over the printer port to a laptop with } kermit } on it or someone get a copy of kermit onto the DEC. } } Some other information: DEC LSI 1173 running on RT11, Kevex 9000 system } 7579 delta5. } The DEC is connected to the outside world by 10 MB disks... } } Is there any hope? ---------------------------------------------------- Warren E. Straszheim 270 Metals Development, Ames Lab/ISU, Ames IA, 50011 Phone: 515-294-8187 FAX: 515-294-3091
Many of you use the Microscopy Listserver to announce meetings/workshops/short courses which is great. However, I don't always gleen all the information I need to easily add your information to the Master DataBases that I try to maintain at
http://www.amc.anl.gov/Docs/NonANL/Meetings.html
In order to help (me) I have created an electronic submission form which you can fill out. It will simplify my life a bit if you use it. The URL is:
http://www.msa.microscopy.com/MSAUtilities/MeetingForm.html or http://www.amc.anl.gov/Docs/NonANL/MeetingForm.html
Both of these sites have the same form, one is just a mirror of the other.
I have also created a form to register your URL with the WWW Microscpy Site Data Base at
http://www.amc.anl.gov/#NatIntSites
This also has a new electronic form:
http://www.msa.microscopy.com/MSAUtilities/WWWForm.html or http://www.amc.anl.gov/Docs/NonANL/WWWForm.html
Both of these sites also have the same form, one is just a mirror of the other.
Any and all submissions are welcome, however, they will not get "posted" until I check them out to make sure they are not bogus.
Disclaimer: Energy Beam Sciences is the United States distributor for MicroAnalysis Consultants, who manufacture standards for x-ray microanalysis.
Best regards, Steven E. Slap, Vice-President ******************************** Energy Beam Sciences, Inc. Adding Brilliance To Your Vision ebs-at-ebsciences.com http://www.ebsciences.com/ ********************************
A postdoctoral position is available, starting immediately, to work on a numb er of different projects all involving a unique UHV-HREM (see http://risc1.nu mis.nwu.edu). The projects are: 1) Application of some new techniques for imaging surfaces at the ato mic scale,and directly interpreting diffraction patterns. 2) In-situ growth and characterization of cubic boron-nitride hard co atings. 3) Characterization of high temperature superconductors.
An good background in transmission electron microscopy or STEM is required, and a background in any of the above areas and/or thin film growth or surface science will help, as will profiency in computer programming for UNIX computers (Fortran, C, X-windows).
Applicants should respond by email to ldm3-at-apollo.numis.nwu.edu enclosing copies of C.V., names of referees etc.
} Date: Wed, 06 Nov 1996 17:05:51 +0100 } From: dlietz-at-TrentU.ca (deborah Lietz) } Subject: sem snad samples } To: microscopy-at-msa.com } Cc: dlietz-at-TrentU.ca } MIME-version: 1.0 } } I have been given sand samples containing cyanobacteria which have been } grown on the sand. I am having problems getting the samples to stay on the } stubs. The sand crusts are too fragile to push down onto double sided tape } and conductive paint is just soaked up by the sand but it really doesn't } make it adhere. Does anyone have any suggestions? Any replys would be } greatly appreciated. } } Thanks Debbie } } } Debbie Lietz } Electron Microscopy Suite } Department of Biology } Trent University } Peterborough, Ontario } K9J 7B8 } Telephone: (705)748-1486 } Fax: (705) 748-1205 } email: dlietz-at-trentu.ca } }
Debbie Lietz Electron Microscopy Suite Department of Biology Trent University Peterborough, Ontario K9J 7B8 Telephone: (705)748-1486 Fax: (705) 748-1205 email: dlietz-at-trentu.ca
Subject: Time: 4:12 PM OFFICE MEMO RE:Refl'n ED in a TEM Date: 11/11/96
When I was getting started in the fields of ED and EM some 50 years ago, reflection electron diffraction was one of the new and exciting techniques, and both GE and RCA marketed instruments specifically designed for reflection electron diffraction. I did my Ph.D. research with Prof. L. O. Brockway, who was one of the pioneers in the field of electron diffraction. There is a chapter which I wrote on reflection electron diffraction in Vol. I of the second edition of the book "Physical Methods in Chemical Analysis" W. G. Berl, Ed. Academic Press (1960). My chapter is based on the use the dedicated instruments; I believe the corresponding chapter in the Third Edition may include a discussion of doing reflection ED in a TEM.
In any event, section 5.3 in Vol 1 of the Series 'Practical Methods in Electron Microscopy',. A. M. Glauert, Ed. (ISBN 0-444-10404-6) North Holland, 1972 describes reflection ED in a TEM, and even shows a picture of an attachment used for the purpose on a Siemens TEM.
Microscopy-at-Sparc5.Microscopy.Com (MICROSCOPY MSA list messages) Message-ID: {1996Nov11.153500.1814.164777-at-missgate.sunderland.ac.uk} X-Mailer: Microsoft Mail via PostalUnion/SMTP for Windows NT Mime-Version: 1.0 Content-Type: text/plain; charset="US-ASCII" Organization: University of Sunderland
Yes the classic reference is : Design of the Electron Microscope Laboratory by R.H. Alderson (Vol 4 of Practical Methods in Electron Microscopy ed Audrey M. Glauert) 1975 (reprint 1985) pub. Elsevier, NY & Amsterdam ISBN 0-7204-4260-5 (paperback); ISBN 0-7204-4259-1 (hardback)
but there is also a chapter in the loose leaf publication: Procedures in Electron Microscopy (Eds A.W. Robards & A.J. Wilson) 1993-to present pub. John Wiley & Sons (Chichester, NY, Brisbane, Toronto, Singapore) ISBN 0 471 92853 4 -Chapter 1 Setting up an Electron Microscope Facility (pp 1:1.1-1:1.23; 1:2.1-1:2.2)
There also seem to be little bits/chapters in various other texts eg: Practical Electron Microscopy for Biologists - Geoffrey A. Meek 2nd Edn reprint 1981 Pub John Wiley (Chichester, NY, Brisbane, Toronto) ISBN 0 471 59031 2 (cloth); ISBN 0 471 99592 4 (paper) Chapter 9 Commercial T.E.M.s (bit out of date) Chapter 10 Installation
and of course consult the manufacturers' literature which should give a lot of information about ambient temperatures, vibration, magnetic fields, power requirements and size of rooms
I hope some of this helps
Malcolm Haswell University of Sunderland UK
----------
I have the unique opportunity to assist in the design of a new EM lab, to include 2 SEMs and a TEM, mostly for materials applications. Is anyone aware of references describing considerations for EM lab design? Any
other suggestions would also be appreciated.
Thank you.
Dennis Ward.
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We have an instrument in our lab that has a LaB6 source and I recently had to replace it. Anybody that has had to clean evaporated LaB6 off the inside of their wehnelt can identify with my situation--it's doggone hard on the fingers!!! Our service rep told me about a procedure that uses HNO3 (nitic acid) but the instructions were unclear and seemed incomplete. On top of that, he could not recall where his information had come from. Is anybody familiar with this procedure or can you possibly shed some light this subject? Thanks.
Bill -- ============================================================= Bill Chissoe III Electron Microscopist,University of Oklahoma E-mail: wchiss-at-ou.edu Ph. (405)325-4391 =============================================================
Message-Id: {9611112341.AA26848-at-lenti.med.umn.edu} To: mxkalyan-at-pau.mobil.com, Microscopy-at-Sparc5.Microscopy.Com
} Our company is currently looking to buy a printer for high } quality output of micrographs. Also, it would be have to be } easily networkable. } Is a 1200X1200 dpi printer good enough? Are there other criteria } I should apply?
If you are looking at only dpi, these printers give good resolution. The problem is that they have no gray scale unless you change the screen size. This will reduce the resolution in ralationship to the desired amount of gray scale desired.
Dana Nojima noji-at-snowman.med.umn.edu __~0_\___ Minneapolis, Minnesota (_________) (612) 624-4687 O O
Message-ID: {c=CA%a=_%p=NRC%l=NRC/IMSD/0004C975-at-imsd-exchange.nrc.ca} worldwide BB for microscopist {microscopy-at-Sparc5.Microscopy.Com}
Hello Richard, If the information that you require is the alloy concentrations in AlGaAs, InGaAs, etc., there is another fairly simple way to measure this. We recently had a paper accepted (Phil. Mag. A) that makes use of the difference in the diffracted intensities between GaAs, In(x)Ga(1-x)As and Al(y)Ga(1-y)As films using (200) dark field conditions to determine the alloy content of these layers. Essentially, we derived the total In or Al content in the structure from a DCXRD measurement, then acquired accurate contast profiles of the individual layers using dark field techniques. This approach can *probably* be applied in InGaP and other ternaries and quaternaries, although we've only done the dynamical calculations for InGaAs and AlGaAs so far.
The most interesting result was that simple structure factor calculations almost exactly matched the more difficult dynamical theory calculations for the questions "where is the indium or aluminum in the layers, and how much of it is there?" In the AlGaAs case, this was pointed out twenty years ago by Bithell and Stobbs. Anyway, I've added the abstract at the end of this note - if you'd like a preprint, please let me know.
Cheers John ----------------------------------------------------------------------- - | John P. McCaffrey tel: Canada 613-993-7823 | | National Research Council of Canada fax: Canada 613-990-0202 | | Inst. for Microstructural Sciences _____ _____ | | Montreal Road Labs, Bldg. M-50 | | __/\__ | | | | Ottawa, Ontario, K1A 0R6 | | __/\\ //\__ | | | | Canada | | \ \\ // / | | | | | | /___ ___\ | | | | email: john.mccaffrey-at-nrc.ca | | /__ __\ | | | | | | || | | | | |_____| |_____| | ----------------------------------------------------------------------- - ABSTRACT During the production of InxGa1-xAs quantum wells by the crystal growth technique of molecular beam epitaxy (MBE), the indium tends to accumulate in the surface layer and float on the crystal growth surface. This effect delays incorporation of the indium into the quantum well and results in a graduated value of "x" across the well. Detailed indium concentration profile information is essential if accurate theoretical models are to be applied to describe these quantum wells. Therefore, to quantify this indium segregation we combine the complimentary results of two experimental techniques, transmission electron microscopy (TEM) and double crystal x-ray diffraction (DCXRD). The indium concentration well profiles were determined through an analysis of the contrast variation in (200) dark field TEM images. Differences of less than 0.5% indium concentration were discernible. The DCXRD analysis provided an accurate value for the total amount of indium in the individual wells which was used as the scaling factor for the TEM concentration profile. To insure that the observed contrast differences were due to variations in indium concentration and were not merely TEM sample preparation artifacts, high quality cross-sectional TEM samples with parallel cleaved surfaces free of ion milling damage were required. Accurate thickness values for the samples were also needed. A TEM sample preparation technique was developed to provide for these requirements. Indium concentration profiles were taken from intensity line scans across dark field TEM images of these samples. These profiles were interpreted by a simple kinematical theory (structure factor) calculation, and then by a more rigorous model using the dynamical theory of electron diffraction. The results of these two models were then checked for consistency with the results of the DCXRD measurement. The model profiles of indium segregation within the quantum wells calculated using the structure factor approach for up to 35% indium content, matched very closely the profiles produced by the use of dynamical theory. Both sets of model profiles strongly supported by the DCXRD results. These results demonstrate that a simple structure factor calculation in conjunction with a DCXRD measurement can allow an accurate measure of quantum well profiles and of the abruptness of InxGa1-xAs on GaAs and GaAs on InxGa1-xAs interfaces. This information is a powerful aid in the modeling and understanding of devices based on these structures.
} } } } I have been given sand samples containing cyanobacteria which have been } } grown on the sand. I am having problems getting the samples to stay on the } } stubs. The sand crusts are too fragile to push down onto double sided tape } } and conductive paint is just soaked up by the sand but it really doesn't } } make it adhere. Does anyone have any suggestions? Any replys would be } } greatly appreciated.
Tempfix is handy for this sort of sample. Warm up your stubs to 80 deg C or so and smear a thin film of tempfix (SPI Cat #5058-AB, page 47) on the warm stub. You can make several and cool them for later use or use them while warm. The warm tempfix adheres to the sand (or powder) but wont wet it. I suspect tempfix is very like the glue for hot glue guns any hardware store sells.
} } I have been given sand samples containing cyanobacteria which have been } } grown on the sand. I am having problems getting the samples to stay on the } } stubs. The sand crusts are too fragile to push down onto double sided tape } } and conductive paint is just soaked up by the sand but it really doesn't } } make it adhere. Does anyone have any suggestions? Any replys would be } } greatly appreciated. } } } } Thanks Debbie } } } } } } Debbie Lietz
Have you tried Pella's double sticky carbon discs? They're a bit sticky than some tapes. You might also try exposing the tape to acetone vapor before dropping on the sand. The vapor will slightly dissolve the glue and make the sand stick better. Maybe. Lightly tapping the bottowm of the stub on a counter will help also, driving the sand into the glue. Phil
&&&&&&&&&&& Illigitmi non carborundum &&&&&&&&&&&
Philip Oshel *all mail:* Microscopy University of Illinois Station A Rm 74 Bevier Hall PO Box 5037 905 S. Goodwin Ave. Champaign, IL 61825-5037 USA Urbana, IL 61801 (217) 244-3145 oshel-at-ux1.cso.uiuc.edu (217) 355-1143 home
Responding to the message of {01IBQ0R7WCKY007YL9-at-TrentU.ca} from dlietz-at-trentu.ca (deborah Lietz): } } I have been given sand samples containing cyanobacteria which have been } } grown on the sand. I am having problems getting the samples to stay on the } } stubs. The sand crusts are too fragile to push down onto double sided tape } } and conductive paint is just soaked up by the sand but it really doesn't } } make it adhere. Does anyone have any suggestions? Any replys would be } } greatly appreciated. } }
We have been able to image bacteria on wet sand by just placing the sand into the Peltier stage and imaging in the Environmental SEM. The samples do not need any further handling (no coating for example) and the Peltier stage allows us to examine them in the fully hydrated state.
If you do not have access to an ESEM try Chris Gilpin at the University of Manchester (email cgilpin-at-man.ac.uk)
Good luck
Stuart McKernan stuartm-at-maroon.tc.umn.edu CIE Microscopy Facility, University of Minnesota Office: (612) 626-7942 100 Union Street S. E., Minneapolis, MN 55455 Lab: (612) 624-6590
I wouldn't bother with laser printers. Get yourselves a good dye sublimation printer. I recommend the Codonics NP1600. It has a Sparcstation built into it, it can be networked, you can ftp files to it, you can set up folders for several users, it will automatically size your output to match the printing area, etc. It is hard to beat it in quality and price. You'll be disappointed if you want high quality output but only have a laser printer. We have 1200 dpi laser printers, but we use them only for cheap, low-quality prints.
} Hi, } Our company is currently looking to buy a printer for high } quality output of micrographs. Also, it would be have to be } easily networkable. } Is a 1200X1200 dpi printer good enough? Are there other criteria } I should apply? } If you have any experience with such printers, please send me an } e-mail. Also, if there is a current archived discussion (these } run out of date quite quickly!) I can access it would be useful. } Thank you. } } Mohan Kalyanaraman } Mobil Technology Company } 609-224-3989 (ph#) } mxkalyan-at-pau.mobil.com
Russell E. Cook Electron Microscopy Center for Materials Research Argonne National Laboratory 9700 South Cass Avenue MSD-212 Argonne, IL 60439 (630)252-7194 FAX: (630)252-4798
Not precisely the same, but... I have a Kevex 8005 (8000 box, upgraded to the point of being almost a Delta). I can save/externally the data as ascii. I then can use my "sneaker-net" to get data to a PC. I have the program "RTDIR" and RTCOPY which, along with a 44 Mb Bernoulli and SCSI card in a PC, will permit cross-platform copies to be made.
Mime-Version: 1.0 Richard Beanland +44 1327 356363 {richard.beanland-at-gecm.com} Content-Type: text/plain; charset=US-ASCII Content-Transfer-Encoding: 7bit Content-Description: cc:Mail note part
Augusto,
Philips has a special bulk sample holder for reflection diffraction applications (called reflection diffraction holder). It allows you to put a bulk piece of sample onto the stage with the sample surface parallel to the electron beam at zero tilt. You can tilt the holder a few degree to obtain a glancing angle in order to obtain reflection diffractions. You can also rotate the stage to obtain diffractions from different orientations. If your sample is small enough, you can modify a double tilt holder to do certain reflection work (see also Tung Hsu's paper: Technique of reflection electron microscopy published in Microscopy Research and Technique 20:318-332, 1992). The thing is that you need to mount your speciman surface to be diffracted nearly parallel to the beam.
Regards,
******************************* Yi Feng, Ph.D. Sr. Applications Specialist Philips Electronic Instruments 85 McKee Drive Mahwah, NJ 07430 USA
Augusto, I am not sure what you mean by an attachment to do RHEED and REM. I did this some time ago in a Phillips 400t; all you need is an appropriate specimen. There are some excellent papers by Tung Hsu on the subject [e.g. Ultramicroscopy _11_, 239, (1983), J. Vac. Sci. Tech. _B3_ (1985)] There is also an 'idiots guide', but I don't have the reference (J. Appl. Cryst 1983?) .
Regards,
Richard Beanland, GMMT Ltd., Caswell, Towcester, Northants NN12 8EQ UK
} Dear Microscopy Netters: } } I would like to get information on reflection electron diffraction } in the TEM. Recently, someone asked me if we had on our JEOL 200CX an } attachment to do reflection electron diffraction. I heard this attachment } was more common in older JEOL TEMs (JEM 7 or 9), and that it is installed in } the column somewhere below the OL or even below the intermediate lens. Does } anybody have this facility, or has any information about it? } } Augusto A. Morrone } 107D-MEL, P.O. Box 116400 } MAIC } Materials Science and Engineering } University of Florida } Gainesville, FL 32611 } (352) 392-1497 or 6985 } Fax: (352) 392-0390 } amorr-at-mse.ufl.edu
Bill -- ============================================================= Bill Chissoe III Electron Microscopist,University of Oklahoma E-mail: wchiss-at-ou.edu Ph. (405)325-4391 =============================================================
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At 05:39 11/11/96 -0500, Dennis Ward wrote: } I have the unique opportunity to assist in the design of a new EM } lab, to include 2 SEMs and a TEM, mostly for materials applications. Is } anyone aware of references describing considerations for EM lab design? Any } other suggestions would also be appreciated. } } Thank you. } } Dennis Ward. **************************************************************************** ***** If it's still in print try :-
Practical Methods in Electron Microscopy ed. Audrey Glauert Volume 4: Design of the Electron Microscope Laboratory by R.H. Alderson ISBN for the series is 0 7204 42508
Sorry, I don't have the book to hand for the individual ISBN.
It was written in 1975 but should not be too dated for most general design requirements
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} Date: Mon, 11 Nov 1996 14:18:04 -0600 } From: Bill Chissoe {wchiss-at-ou.edu} } Reply-To: wchiss-at-ou.edu } Organization: University of Oklahoma } To: Microcoscpy List Server {microscopy-at-Sparc5.Microscopy.Com} } Subject: LaB6 } } We have an instrument in our lab that has a LaB6 source and I recently } had to replace it. Anybody that has had to clean evaporated LaB6 off the } inside of their wehnelt can identify with my situation--it's doggone } hard on the fingers!!! Our service rep told me about a procedure that } uses HNO3 (nitic acid) but the instructions were unclear and seemed } incomplete. On top of that, he could not recall where his information } had come from. Is anybody familiar with this procedure or can you } possibly shed some light this subject? Thanks. } } Bill } -- } ============================================================= } Bill Chissoe III } Electron Microscopist,University of Oklahoma } E-mail: wchiss-at-ou.edu Ph. (405)325-4391 } ========================================================== Bill & other EMers: Use ammonia, not nitric acid! Just place the Wehnelt in a beaker with some ammonia, leave it for an hour or over-night. Cover the top and use a fumehood. Most of the deposit will just float off. Light polishing with Wehnol or Pol is only sometimes required. This has to be removed with solvents and another shorter period in ammonia followed by a water rinse and drying. Very little "elbow grease" is required. Do not use ammonia on copper or brass parts. Do not use metal polish in pole piece bores. Cheers Jim Darley
PS Recent changes to our site discriminated against Netscape II users. That's fixed. Enjoy! Probing & Structure } (Microscopy Supplies & Accessories) PO Box 111, Thuringowa QLD 4817 Australia } } Phone +61 77 740 370 Fax: +61 77 892 313 } A great microscopy site http://www.ultra.net.au/~pns/
There is a product from Electron Microscopy Sciences called "Temp Fix". Basically you coat some stubs with a layer of it and when you are ready with the samples, sprinkle some on the stub. Put the stub in the oven (60C) or so and it will melt and adhere the samples. Let me know if I can assist you further.
} } I have been given sand samples containing cyanobacteria which have been } } grown on the sand. I am having problems getting the samples to stay on the } } stubs. The sand crusts are too fragile to push down onto double sided tape } } and conductive paint is just soaked up by the sand but it really doesn't } } make it adhere. Does anyone have any suggestions? Any replys would be } } greatly appreciated. } } } } Thanks Debbie } } } } } } Debbie Lietz } } Electron Microscopy Suite } } Department of Biology } } Trent University } } Peterborough, Ontario } } K9J 7B8 } } Telephone: (705)748-1486 } } Fax: (705) 748-1205 } } email: dlietz-at-trentu.ca } } } } } } Debbie Lietz } Electron Microscopy Suite } Department of Biology } Trent University } Peterborough, Ontario } K9J 7B8 } Telephone: (705)748-1486 } Fax: (705) 748-1205 } email: dlietz-at-trentu.ca } } } }
Thank everyone who has replied to my question about mounting sand for sem. I now have a lot of different things to try and I'm sure one will work.
Thank-you
Debbie Lietz
Debbie Lietz Electron Microscopy Suite Department of Biology Trent University Peterborough, Ontario K9J 7B8 Telephone: (705)748-1486 Fax: (705) 748-1205 email: dlietz-at-trentu.ca
Looking for a Side Entry Goniometer (SEG) for a JEOL 200/100 A or B or CX etc. Preferably something to be given away from an unwanted TEM. (We don't need the TEM though!)
Thanks
Mark Wall Lawrence Livermore National Lab 510 423-7162
I working on neurovascular control in the spinal cord. I would like to receive some informations on the Karnovsky and Roots method for Achetylcholinesterase enzymatic activity detection. In particular I would like to know which buffer is more suited for the incubation medium.
Thank you
Dr. Cristiano Rumio Istitute of Anatomy University of Milan Via Mangiagalli 31, 20133 Milan Italy E-mail clsmteam-at-imiucca.csi.unimi.it Voice: -39.2.2663683 Fax:-39.2.2364082
Dear all, I need help about comment of Candida albicans TEM photographs. I think, there are many experts in the list, I will be glad if one of them can help me about comment. I can send the 5 photos to a familiar one(s= ) with E-mail in TIF, PCX, BMP or any format.
Sincerely. Murat AYDIN muratay-at-pamuk.cc.cu.edu.tr
-=3D-=3D-=3D-=3D-=3D-=3D-=3D-=3D-=3D-=3D-=3D-=3D-=3D-=3D-=3D-=3D-=3D-=3D-= =3D-=3D-=3D-=3D-=3D-=3D-=3D-=3D-=3D-=3D-=3D-=3D-=3D-=3D-=3D-=3D-=3D-=3D Background information: Candida albicans cells were exposed to 15 =E6A of anodic direct current with silver electrodes in a culture medium for 48 hours. Yeast colonies nearby the anode and their controls were examined in TEM. Samples were separately introduced into two 5% glutaraldehyde solutions (5 ml; pH, 7.4). Fixed cells were washed twice with 0.05 M phosphate buffer 0.8 M sorbitol, then postfixed in 0.5% OsO4 overnight at 4 degree, washed in distilled water, dehydrated through an ethanol series, embedded in resin, after polymerization, ultrathin sections were collected on grids, stained with 7% uranyl acetate and with lead citrate.
=09There are many intra-cytoplasmic vesicles in the Candida cells, but which is what ? and what happened in the cells ? -=3D-=3D-=3D-=3D-=3D-=3D-=3D-=3D-=3D-=3D-=3D-=3D-=3D-=3D-=3D-=3D-=3D-=3D-= =3D-=3D-=3D-=3D-=3D-=3D-=3D-=3D-=3D-=3D-=3D-=3D-=3D-=3D-=3D-=3D-=3D-=3D
Dear Netters: Thank you for all the responses to my question about holders to perform REM-RHEED in the TEM. If anyone is interested I can send a summary of responses.
Will Bigelow: Sorry I lost your message, and I don't have your address. Please resubmit the message if you still have (I did read it before messing up, I particularly enjoyed the historical information!)
Cheers, Augusto Augusto A. Morrone 107D-MEL, P.O. Box 116400 MAIC Materials Science and Engineering University of Florida Gainesville, FL 32611 (352) 392-1497 or 6985 Fax: (352) 392-0390 amorr-at-mse.ufl.edu
Dear Bill: I would add two comments to what has already been said about effective removal of deposits. 1) The less muscle required to remove deposits the better because heavy pressure might bend the aperture.
2) Six micron diamond paste is very effective in removing oxides; somewhat less effective on those purple crystal deposits. A little "dab will do ya" applied gently with a Q-tip followed by rinses with dilute HCl (1:5 w/H2O), mild alkaline to neutralize and/or water, and usual solvent such as freon. This paste is available through Valley Design Corporation (508-692-9549); no commercial interest motivation. Obtained this procedure from friendly people at Kimball Physics.
Don Gantz Boston Univ Med School gantz-at-med-biophd.bu.edu
A week ago or so someone from Duke(?) said they might sell an Ultracut E. We're interested in buying it if it's not too expensive. Will the person who posted that note please contact me?
Thanks!
Paula Sicurello = ) U.C. Berkeley Electron Microscope Lab psic-at-uclink4.berkeley.edu
I am looking for reference material about application work being done using the new variable pressure sems. Can you point me to any specific references of libraries that might have such materials.
Message-Id: {199611121940.LAA60320-at-itsa.ucsf.edu} X-Sender: mishot-at-itsa.ucsf.edu X-Mailer: Windows Eudora Light Version 1.5.2 Mime-Version: 1.0 Content-Type: text/plain; charset="us-ascii"
} } BEWARE of the Codonics dye sub printer.It does not adhere to ICC standards for color management and the company has refused to provide a device profile for use by other software. Virtually all other printers incorporate ICC color management capabilities (see Kodak & Tektronix. But if you do not care to match the image on your monitor with what you get on a print or from batch to batch of paper or off color, ie. green & white "black & white" images the NP-1600 can be useful. Do not purchase the on-site service and warranty--in our case they refused to honor the contract. I could write more but you get the idea--one of our most troublesome purchases was the Np-1600. Larry D. Ackerman (415) 476-8751 Howard Hughes Medical Institute FAX (415) 476-5774 UCSF, Box 0724, Rm U426 533 Parnassus Ave. mishot-at-itsa.ucsf.edu San Francisco, CA 94143
While resolution is an important factor, the other factor that gives substance to the resolution and grayscale levels that a imaging system can produce is the modulation transfer function. In simplest terms, this value, expressed as a percentage, provides you with a idea of how accurate the produced(printed) image is when compared on a pixel by pixel basis to the original digital file.
When considering a imaging system, you have to consider what level of accuracy your work requires. While a dye sublimation printer gives you a nice smooth image, it may only have a MTF of 60-65% or less in terms of the gray scale values and the 'edges' that it is representing. A laser print may only have 40-50% MTF. There are applications where a thermal print would be suitable and there are applications where a _true_ photographic quality image is required. You did not indicate if your requirement was for color or just black and white(grayscale). If color is a requirement, then dye sub or d2t2 technology is your best solution. Take a file and give it to the various vendors and have them print it on their units. Be aware that the heads on these units generally begin to wear soon and image quality drops accordingly. If you only need gray scale, then the best solution is a true photographic quality system that reproduces your digital files with complete accuracy.
Who offers such a thing? Ok, I set this up. We do. The Polaroid Helios Imaging System offers true photographic quality with 100% MTF. IT is a fully networkable printer that can work simultaneously on Mac, IBM and Unix platforms.
Hi, Our company is currently looking to buy a printer for high quality output of micrographs. Also, it would be have to be easily networkable. Is a 1200X1200 dpi printer good enough? Are there other criteria I should apply? If you have any experience with such printers, please send me an e-mail. Also, if there is a current archived discussion (these run out of date quite quickly!) I can access it would be useful. Thank you.
Mohan Kalyanaraman Mobil Technology Company 609-224-3989 (ph#) mxkalyan-at-pau.mobil.com
With regards to affixing sand samples to your SEM stub, try Avery's Spot-O-Glue. It is available in most stationary stores and sounds like exactly what you need.
Good luck.
______________________________________________________________________ Donald L. Lovett e-mail: lovett-at-tcnj.edu Assoc. Professor, Dept. of Biology voice: (609) 771-2876 The College of New Jersey * fax: (609) 771-2674 Trenton, NJ 08650-4700
(* formerly Trenton State College; please note our new name)
Aren't sys75.kvx library files a pain in the butt!!!!!!! ...Along with the total lack of decent (or any?) utilities, especially for file management. Oh well, we use what we have...
The RTCOPY and RTDIR pgms were a portion of "Report Manager" which I purchased from Kevex several years back. I may be able to send you a copy, but under the circumstances, I must first check with Kevex. ...Really don't want to upset them or my employer. Since those pgms are so old, they *should not* object, but.... You never know when it comes to Kevex and $$$$.
To make the copies, you will need a Bernoulli/SCSI (like Adaptec AHA-1542B) in the PC. If you don't have a spare Bernoulli (for PC), maybe you could "quietly" borrow one from the EDS for the transfer. I have only tried this with the 44Mb disk format and don't know if the pgms will accomodate other sizes.
I have all the data needed to set-up the card which I can send to you if you like. ---Couple of paper pages, not on disk.
The programs are a little syntex sensitive (you must enter the entire command line, both source and destination drives, full file names, etc.), but they operate essentially like the DOS copy and dir commands. The PC Bernoulli is DL2: and DL6:, just as it is for the EDS. BTW, as I recall (been a while), wild cards do work.
Regards,
Woody White, Electron Microscopist, Babcock & Wilcox Research Center woody.n.white-at-mcdermott.com Home: woody.white-at-worldnet.att.net -or- http://www.geocities.com/capecanaveral/3722
Where can I find RTDIR and RTCOPY? I've got some 8" Bernoullis on a couple 8000s which I'd like to read on a PC or Mac.
Thanks, Carl
On 11 Nov 1996 Woody.N.White-at-mcdermott.com wrote:
: Not precisely the same, but... I have a Kevex 8005 (8000 box, : upgraded to the point of being almost a Delta). I can save/externally : the data as ascii. I then can use my "sneaker-net" to get data to a : PC. I have the program "RTDIR" and RTCOPY which, along with a 44 Mb : Bernoulli and SCSI card in a PC, will permit cross-platform copies to : be made. : : Woody White : : : ______________________________ Reply Separator _________________________________ : Subject: m-probe, Kevex - program to convert sys75.kvx file? : Author: trail-at-cyberdrive.net_at_internet at x400post : Date: 11/9/96 12:12 PM : : : X-Sender: trail-at-pop.cyberdrive.net : X-Mailer: Windows Eudora Pro Version 2.2 (32) : Mime-Version: 1.0 : Content-Type: text/plain; charset="us-ascii" : : I need to move a sys75.kvx file off of a DEC lsi 1173 and onto a p.c. : Once on the p.c., ...SNIP... : : Steve : : *************************************** : Dr. Steven S. Trail : B.P. Chemicals : 4440 Warrensville Center Rd : Warrensville Hts., OH 44128 : (216) 586-5136 (work) : (216) 586-5030 (fax) : trailss-at-bp.com : trail-at-cyberdrive.net (home) : *************************************** :
Carl Henderson Electron Microbeam Analysis Laboratory University of Michigan 2005 C.C. Little Bldg. Ann Arbor, MI 48109-1063 USA -------------------------------- (313) 936-1550 (voice) (313) 763-4690 (FAX) chender-at-umich.edu (e-mail) --------------------------------
} } } Warren Straszheim {wes-at-ameslab.gov} 11/11/96, 03:46pm } } } } Kermit is definitely available for the PDP-11 running RT-11 or TSX+. } .... } I can get you a copy, plus it should be available on line from any } ... } Give me a call or e-mail and I can give you more specifics. Or...
Indeed would I also like to obtain a copy of Kermit for the PDP-11 running RT-11, and am I going to email the above person.
At this moment I am ASCII downloading data from my JEOL 733 mprobe's PDP11, serialport to PC emulating DEC VT102 terminal (MS win3.1 also have such an emulator built in)
Does anybody perhaps have XMODEM (or Y or Z modem) transfer protocol source code in FORTRAN IV (fortran four) ? It is for the same purpose of transferring binary files between PDP11 and other platforms.
I uploaded xmodem Fortran VII (seven) source to the PDP11 via the VT102 emulation as ASCII and did try compile it with the RT11's compiler resulting in an infinite list of errors.
Thank you so much, Leon Smuts.
} \\\\\\\\\\\\\\\\} URL: http://www.puk.ac.za } WWW} \\\\\\\\\\\\\\\\\\\} } Leon Smuts-Electronmicroprobe-University of Potchefstroom-S_Africa} } /////////////} mailto: plbls-at-puknet.puk.ac.za } eMail} ///////////////}
Message-Id: {199611130734.IAA08404-at-dogon.geomin.unibo.it} Comments: Authenticated sender is {gaspar-at-geomin.unibo.it}
Hi,
I need help with EDS analyses. I am searching software and /or references about quantitative EDS analyses of minerals. What I need is not general literature that I know well but specific literature (or software, source code ecc) about for instance background modeling, intensity calculation and so on. I am currently working with an EDS system which has a software package absolutely unsatisfactory expecially in background modeling. Does exist software (commercial or free) that read data in ascii format (eV vs Intensity) or proprietary format and perform quantitative calculations with standards? About the make of the EDS system I prefere to talk about it only in private e-mail. Best regards
------------------------------------------- Giorgio Gasparotto Dipartimento di Scienze della Terra e Geo-Ambientali Piazza di Porta S. Donato 1 40126 Bologna Italy Tel. 51 243.556 FAX 51 243.336 WWW: http://geode.geomin.unibo.it/min/ Internet e-mail gaspar-at-geomin.unibo.it -------------------------------------------
To follow up on Giorgio's request on EDS software. Does any of you know software (comercial/freeware - PC/Mac/SUN) capable of doing off-line absorption corrections, K-factor analysis etc with ascii net-intensity data. We are using a Noran Voyager system attached to our TEM and would like to do the analysis off-line. Thereby not using up TEM time, also I don't like to way Noran saves my data afterwards.
Message-Id: {199611131644.KAA18820-at-watson.bcm.tmc.edu} X-Sender: joiner-at-bcm.tmc.edu X-Mailer: Windows Eudora Version 2.1.1 Mime-Version: 1.0 Content-Type: text/plain; charset="us-ascii"
Whenever someone asks about High Resolution networked Printers, the response is almost always "Go Dye-sub." In the EM business, especially in a service situation, we may crank out 80 to 100 or more prints a day. $4 to $6 per print just ain't going to work. Fortunately other technologies (laser and ink jet) seem to be making head roads into the problem. EM is monochrome which helps considerably; and I would guess that a fair amount of light microscopy, which we normally think of as color, could be usefully rendered in shades of gray. What is needed is a printing technology that gives us high resolution.....both spacial AND contrast......quickly and inexpensively (pennies, not $'s per page).
Joiner Cartwright, Jr., Ph.D.
Director, Electron Microscopy tel.: (713)798-4658 Department of Pathology, Rm.286-A FAX: (713)798-3945 Baylor College of Medicine Internet: joiner-at-bcm.tmc.edu One Baylor Plaza Compuserve: 71555,1206 Houston, Texas 77030 U.S.A.
We currently have a Kevex Delta V EDS system with an old Okidata 192 printer. I was wondering if anyone had any experience with changing printers to something more modern (laser) ?
We have Kermit, so we could load drivers into Kevex system if we knew what/where to load them.
Any info would be greatly appreciated.
John Giles Senior Engineer Honeywell Space Systems jegiles-at-space.honeywell.com
Hi, I am looking for secondary electron emission co-effecient for yttrium barium copper oxide material and its temperature dependency. Could anyone suggest me a reference.
thanx in advance
bye
sen
//// ___|--00_____________________________________________________________________ C ^ S.Senthil Nathan \ ~/ Dept. of Instrumentation, Indian Institute of Science, {} {} Bangalore, India e-mail:sen-at-isu.iisc.ernet.in http://www.isu.iisc.ernet.in/~sen/ voice: +80 3092349 fax: 91 80 3345135
: We currently have a Kevex Delta V EDS system with an old Okidata 192 printer. : I was wondering if anyone had any experience with changing printers to : something more modern (laser) ?
I updated an old Microline 92 printer to a 9-pin dot matrix Okidata 320 about a year ago. The printer needs a serial port expansion card and Microline (ML) emulation. The emulation is needed to handle the graphics sent by the Kevex software when printing spectra. I don't know if there are laser printers that support such emulation--maybe Okidata makes one.
Carl Carl Henderson Electron Microbeam Analysis Laboratory University of Michigan 2005 C.C. Little Bldg. Ann Arbor, MI 48109-1063 USA -------------------------------- (313) 936-1550 (voice) (313) 763-4690 (FAX) chender-at-umich.edu (e-mail) --------------------------------
I am gathering data for a research paper on the use of Backscattered Electrons in imaging. I am not limiting my search to any one field. Thus far, I have found some interesting items from the IEEE Society papers, a physics journal, and the acoustics area. Please let me know of any new developments in the use of backscattered electrons.
Since I am wrapping up my data gathering soon, (11-18-96), please let me know soon. My email address is nrjackso-at-eos.ncsu.edu
Message-Id: {1.5.4.32.19961113230715.0069d17c-at-alf.zfn.uni-bremen.de} X-Sender: heibueck-at-alf.zfn.uni-bremen.de X-Mailer: Windows Eudora Light Version 1.5.4 (32) Mime-Version: 1.0 Content-Type: text/plain; charset="iso-8859-1" Content-Transfer-Encoding: quoted-printable
Hello everyone,
our institute want to buy a new cryo-substitution unit, especially to dehydrate plant material after cryofixation. Which companies offered this technique and what are your experiences. At the moment we have only contact to Leica and Bal-tec.=20 Thanks
Heike Buecking Dr. Heike Buecking Universit=E4t Bremen, UFT Physiologische Pflanzenanatomie Leobener Str. 28359 Bremen Tel: +49-0421-218-2954 -7283 Fax: +49-0421-218-3737
Has anybody tried Cy2 with the BioRad MRC 600 with the Kr/Ar laser? According to the spectra on the mailing we just received from Jackson Labs it should work fine and, potentially (depending on whether it is as glaringly bright as we find Cy3 to be), less spillover into the red. But has anybody any experience w/ it?
-------------------------------------------- email sent from an account of the Analytical Imaging Facility The Albert Einstein College of Medicine of Yeshiva University 1300 Morris Park Ave. Bronx, NY 10461 (718) 430-2890 FAX: (718) 430-8996 --------------------------------------------
Another EDS question - while we're on the subject these days:
I operate the EDS on our Camebax microprobe through/with the/a PCA II EDS card (The Nucleus, Inc.). Although I routinely use/process/label spectra with the handy-dandy (qualitative) functions of associate software, I am now interested in export of the data to other off-line programs. Files are saveable as comma-delimited ASCII files for just such processing.
My question then - is anyone out there using ASCII files from the PCA II (or I or III, for that matter) for off-line processing? If so, what do you use?.... user-programmed software?....other commercial EDS software?....other spectral processing software?
Looking forward to your feedback.
Dr. Winton Cornell Senior Research Associate Department of Geosciences The University of Tulsa 600 South College Tulsa, OK 74104-3189
I received 14 responses to my question about a price increase for Kodak 4489 TEM film. Thank you, all.
There were replies from several EM supply houses who sell the Kodak product. Apparently, not all sell the 250 sheet Multipack. At least one, Energy Beam Sciences, sells AGFA SCIENTIA 23D56 film for TEM.
Other places mentioned are:
Laube Photo Akron, OH 330-535-3379
Mike's Camera Boulder, CO 303-443-1715 guide.boulder.net/Mikes/
National Graphic Supply Albany, NY 800-223-7130 www.natgraphicsupply.com
Penn Camera Washington, D.C. area 800-347-5770 www.penncamera.com
Prices quoted are about $60/box (100 sheets) and $110-120 for the Multipack (250 sheets). It's time for me to switch to the Multipack!
All information received was for suppliers in the US and in US dollars.
X-Sender: dwaters-at-api.com X-Mailer: Windows Eudora Version 1.4.4 Mime-Version: 1.0 Content-Type: text/plain; charset="us-ascii" To: microscopy-at-Sparc5.Microscopy.Com
****************************************************************************** Applied Precision, Inc. is seeking an Eastern Regional Sales Representative for DeltaVision, our line of deconvolution microscope systems and related products. ******************************************************************************
This is an opportunity to make a significant contribution to our rapidly growing company and product line. To be considered, you must have at least 3 years highly successful experience in technical sales of confocal or similar microscopy products.
Credentials should include: education in biology or related field, knowledge of digital imaging, knowledge of Silicon Graphics computer system (or similar skills), ability to travel up to 50% as needed.
For immediate consideration, send resume and salary requirements to: Applied Precision, Inc. Attn: DV 1040 12th Avenue NW Issaquah, WA 98027
For more information, visit our booth at the Society for Neuroscience meeting in Washington, D.C.
________________________________________________________________________ Dean Waters DeltaVision Systems Applied Precision, Inc. 1040 12th Avenue NW Issaquah, WA 98027-8929
Message-Id: {3.0b36.32.19961113112809.006c7948-at-darkwing.uoregon.edu} X-Sender: mshaf-at-darkwing.uoregon.edu X-Mailer: Windows Eudora Pro Version 3.0b36 (32)
At 10:40 AM 11/13/96 -0600, Joiner wrote:
} ... , we may crank out 80 to 100 or more prints a day. $4 to $6 } per print just ain't going to work.
The least expensive way to go would be a 600dpi Laser which is fast and suits your costs per page. The problem we've seen with lasers is that if you print a lot of images then you will notice problems with the toner cartridge about half way thru its normal lifetime (we take it out and put into a similar printer dedicated to line drawings or text). A monochrome ribbon for a dye sub will be considerable less expensive than dedicating it to color, but if you ever did want to use it for color then it is a real hassle just to change it over for a job.
Lastly ... you might want to look into a Ag salt laser (e.g., Harris PhotoPro), for about a dollar/page you can have 256 "real" grays at 256dpi on glossy paper which may have been improved since we bought ours. The problem with this printer is it can not be configured as a network printer, but you can certainly install it onto a peer-to-peer, or networked computer.
cheers, shaf
{\/} /\ {\/} /\ {\/} /\ {\/} cognito, ergo zZOooOM {\/} /\ {\/} /\ {\/} /\ {\/} Michael Shaffer, R.A. - University of Oregon Electron Probe Facility mshaf-at-oregon.uoregon.edu -or- mshaf-at-darkwing.uoregon.edu http://darkwing.uoregon.edu/~mshaf/epmahome/
One suggestion not mentioned in earlier replies from excellent sources to this inquiry is to use the sample block in the SEM and not just the section. Of course, beam penetration must be kept in mind when doing work such as BE imaging.
This may be obvious but it does make sample prep somewhat easier...
} Whenever someone asks about High Resolution networked Printers, the } response is almost always "Go Dye-sub." In the EM business, especially in a } service situation, we may crank out 80 to 100 or more prints a day. $4 to $6 } per print just ain't going to work.
Right, why then not go for a dual solution: dye-sublimation for photorealistic pictures (material for publications) at 5$ per one print and then thermal wax for drafts (300dpi, good color saturation, 5$ per 100 prints)? Color lasers have not convinced me yet (pale rendition) but are improving.
A good thermal wax printer is about 60% of the price of a good dye-sublimation printer. Color lasers are coming down in price.
ChR
_________________________________________________________________________ Christophe Roos Dr.Sc., doc. | Institute of Biotechnology | & Dept. of Biosciences Phone: +358 9 7085 9367 | Division of Genetics Fax: +358 9 7085 9366 | P.O.Box 56, Viksbagen 9 E-mail: Christophe.Roos-at-Helsinki.FI | FIN-00014 Univ. of Helsinki X-400: /G=Christophe/S=Roos/O=Helsinki/ADMD=fumail/C=Fi Finland {A HREF="http://www.helsinki.fi/~roos/index.html"} WWW Home Page: Roos {/A} -------------------------------------------------------------------------
Hi We are thinking of establishing an electron microscope unit (mainly for biological work) from scratch. That means that we have to put a proposal together for funding of equipment and staff.
To follow up on my initial question on offline EDS software. I had several replies. The one from Henrik Kaker pointed towards the microscopy ftp sites. I downloaded some of the programs and found that the programs capable of dealing with thin films cannot deal with my oxygen measurements in TEM. Does anybody have another suggestions. Is the TFA (Thin filam Analysis) program, written by Martin J. carr and Alton D. Romig being updated??
Fellow Microscopists One of our Research students, is carrying out a Ph.D project on Al based alloys (Spay cast 7xxx series) , (10-11% Zn, 1-1.5% Mg, 1.5-2 % Cu, 0.3 % Zr, Al balance). As part of her project she is required to carry out an extensive TEM characterisation study of these alloys. However, she is encountering significant problems with rapid oxidation of the TEM samples, following preparation by a conventional twin jetting technique (involving the use of a Struers Tenupol -3 model using an electrolyte solution of 30% Nitric acid in methanol at -40oC). Following preparation by twin jetting we have tried removing the oxide films by ion beam thinning on a Gatan ion beam thinner, at a milling angle of 10o (minimum angle permitted ) and at a voltage of 4KV and at a current of 3mA. Following this dual approach, some times Oxide free Aluminium foils are prepared but some times the oxide formation persists. However, it appears that this effect is not related to the milling time, since different milling times were involved. I would deeply appreciate your advise on this persistent problem, by either their replying to the mailing list or to her directly at: meteo-at-leeds.ac.uk
Mike Warfield wrote: } I am looking for reference material about application work being } done using the new variable pressure sems. Can you point me to any } specific references of libraries that might have such materials.
Dear Mike,
You can find a bibliography of environmental scanning electron microscopy in: G. D. Danilatos, Microscopy Research and Technique, vol. 25 (1993) page 529-534.
There is also a bibliography in ElectroScan's homepages on the address: http://www.electroscan.com/bibliog.html
One major problem in the application of variable pressure SEMs is that the spatial resolution for X-ray spectrometry deteriorates with increasing pressure because the primary electrons are scattered on the gas and therefore ends up far from the electron beam target point. Concerning ways to overcome this procblem we have recently published two conference papers:
J. B. Bilde-Sorensen and C. C.Appel, Proc. 48th Annual Meeting of the Scandinavian Society for Electron Microscopy, Aarhus, 2-5 June 1996. p. 4-5 J. B. Bilde-Sorensen and C. C. Appel, Proc. 11th European Congress on Microscopy EUREM'96, Dublin, 26-30 August 1996. Session T6.
Best wishes, Jorgen. -at--at--at--at--at--at--at--at--at--at--at--at--at--at--at--at--at--at--at--at--at--at--at--at--at--at--at--at--at--at--at--at--at--at--at--at--at--at--at--at--at--at--at--at--at--at--at- J. B. Bilde-Soerensen Materials Department Risoe National Laboratory DK-4000 Roskilde Denmark
Good Luck!!! I have tried to replace my Tek 4696 injet on my delta-like Kevex 8005 to no avail. "Drivers" for the DEC system (in my case) are unique programs. I could never locate either a substitute printer or a printer program for a more modern printer. If I recall correctly, the Oki command structure is incompatible with newer printers and would then present similar problems. I had to add a video printer to replace the Tek. Still am funning the 192, but use it only for text. If unformatted ascii is all you print, your problem may not bee insurmountable, but I needed to go to the "graphics" mode.
The company who now owns the rights to the vintage DEC system (not DEC) offered to develop someting, buyt couldn't pin down a price except to say that it would be $10K, maybe $20K. Kinda pricey driver, huh? Maybe this is an opportunity for some enterprising (old) programmer. :-)
If you find more, helpful info, please forward.
Woody White, Electron Microscopist Babcock & Wilcox Research
We currently have a Kevex Delta V EDS system with an old Okidata 192 printer. I was wondering if anyone had any experience with changing printers to something more modern (laser) ?
We have Kermit, so we could load drivers into Kevex system if we knew what/where to load them.
Any info would be greatly appreciated.
John Giles Senior Engineer Honeywell Space Systems jegiles-at-space.honeywell.com
We are searching an used SEM for received it in donation .The SEM will be used for Research and Education in our School. Please, we need know the model, year of fabrication, possibility of work,and other information available. WE PAY ALL THE COSTS OF SHIPMENT. Please, contact me for any questions.
E-mail : RNBALDUC-at-arcide.edu.ar
Address:
Fernando Balducci Laboratory of Electron Microscopy School of Bioengineering. National University of Entre Rios. C.C 57 Suc 3 Parana - Entre Rios Argentina.
I am working on the X-TEM of multilayer thin films on a soda-lime substrate. What was unexpected was that when the beam (~120KeV) hit the substrate, it evaporated (melted?) and the films collapsed. Can anybody give me any suggestions on dealing with such specimens?
Your help are greatly appreciated.
Chao-Ying Ni Institute of Energy Conversion University of Delaware Newark, DE 19716
I am really sorry. Due to my hurry, I have sent to all of you a personnal message without any general interest. I'll try and do my best in the future to be more careful :-( :-( :-(
Best regards,
Paul Vanderlinden. Sales Manager.
========================================================================= See our web site: http://www.microscopy-uk.org.uk
I'll try one last time; got no response the first time.
My main question: Can you tell me whether DiI (and related dyes) flip-flop across membranes to label both sides of a bilayer (& if so does it require the presence of ATP)? I know the usual answer is "Check the Molecular Probes catalog" but the catalog says "there are discrepancies in the literature".
Also, I've heard DiI labels all internal cell membranes; is this true? If so does it diffuse through cytoplasm, is it carried by an exchange protein, or is it really constrained to stay in the plane of the outermost membrane? Can it jump from one membrane to another that is very closely apposed but not continuous? Can you suggest any good references on properties of these dyes?
Pardon my ignorance; any suggestions would be greatly appreciated! THANKS very much ! Richard Thrift Depotech Corp. Richard_Thrift-at-Depotech.com (619) 625-2424
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At 08:22 AM 11/14/96 +0001, you wrote: } The obvious solution, though not necessarily practical financially } speaking would be to have a reasonable laser printer for day to day } archiving type of work and a good dye sublimation printer to } be used only for those situations where publication quality is } required. The latter printer could be located in a institutional } central area and jobs sent remotely, while the laser writer would } be located locally. One can justify the dye sub printer costwise, } by comparing to the upkeep of a print darkroom. In addition, AFM } images and the like, for publication really cannot be output any } other way, not to mention the "fancy", full color transparencies } that can be produced! } ***************** No, that won't work. "Day to Day" is where we need the quality. We produce a large number of E.M. images upon which we base medical diagnoses. These prints have to have and convey the maximum amount of information captured in the original image. The publication images are best produced in the darkroom.
DOS/Win 3.x - Its dead, Bill-I-am-master-of-the-universe-Gates has killed it. (Besides it won't handle over 64Mb of RAM any way - Don't believe me? Go ahead and try it)
OS/2 - stabile, once you get it loaded, but its destined to die an undeserved death since no one is writing software specficially for this OS.
UNIX/AIX/LINUX/Etc. - Give us a break.
Win 95 - A toy for the masses, and not really 32-bit.
Windows NT - ? Is this what we're left with? Its far more stabile than Win 95, and is designed to handle networking issue much better. It'll be around for awhile yet. But inherent in its stability is its limitations on software control of hardware (that's why gamers don't like it), but due to the massive quantities of data, data transmission rates, and our hopes of 'live' image capture, the typical solution has been to by pass the OS and have the software directly handle the hardware (i.e. capture card) and memory transfers in order to save the time wasted in OS overhead. What does this mean interms of Windows NT and PCI capture systems?
I am looking for any KNOWN information on hardware interface problems with Windows NT and 'image' capture hardware. Alternately, or additionally, we would (I know I'm not alone) love to hear from digital imaging vendors to find out where the OS wars are heading to for microscopy needs.
Richard E. Edelmann Electron Microscopy Facility Supervisor 352 Pearson Hall Miami University, Oxford, OH 45056 Ph: 513-529-5712 Fax: 513-529-4243 E-mail: edelmare-at-muohio.edu
To follow up on my initial question on offline EDS software. I had several replies. The one from Henrik Kaker pointed towards the microscopy ftp sites. I downloaded some of the programs and found that the programs capable of dealing with thin films cannot deal with my oxygen measurements in TEM. Does anybody have another suggestions. Is the TFA (Thin filam Analysis) program, written by Martin J. carr and Alton D. Romig being updated??
} Our lab is in the process of buying a fume hood. It will be used primarilly } for protection against EM and LM processing chemicals (fixatives, resins, } solvents, etc.). } My question is basically: what characteristics are recommended? (do we need a } filter on the exhaust system? If so, what type of filter?) I would appreciate } any suggestions. } Thanks in advance. } } Adriana } A filter would be nice. Also, it's easier to build in than retro-fit, so even if you don't want one now, it's better to build for it. You'd need filters for organics and osmium. Face velocity: fume hoods here are typically 100-120 cubic feet/minute with the door open 12-18" (variations by state and institution). Watch where the exhaust is. I've been places where the fume hood exhaust mixed into the building air, or is exhausted at ground level next to busy sidewalks. It should be on the roof, and any scubbers ought to be there also. Also: don't put a storage cabinet under the fume hood! This is a common practice, and is part of the cabinet. It only incourages people to store acids, bases, and volatile organics together. Plus it makes working at the hood, doing perfusions, etc. very awkward. Put a foot well under the fume hood. Phil
&&&&&&&&&&& Illigitmi non carborundum &&&&&&&&&&&
Philip Oshel *all mail:* Microscopy University of Illinois Station A Rm 74 Bevier Hall PO Box 5037 905 S. Goodwin Ave. Champaign, IL 61825-5037 USA Urbana, IL 61801 (217) 244-3145 oshel-at-ux1.cso.uiuc.edu (217) 355-1143 home
Not quite answering your question but have you thought of including a fume bench in your installation ? We use this as frequently as the small fume hood we had originally especially for the less hazardous processing chemicals such as solvents and resins. Using an open access downdraught fume bench is far easier when attempting to manipulate small specimens - sometimes using a dissection microscope. We still use osmium in the hood though ! Check your hospital pathology labs - they go in for fume benches due to rigorous handling regulations which now apply to formaldehyde.
Good liuck
Laurence Tetley
At 09:20 14/11/96 EDT, you wrote: } } Our lab is in the process of buying a fume hood. It will be used primarilly for protection against EM and LM processing chemicals (fixatives, resins, solvents, etc.). } My question is basically: what characteristics are recommended? (do we need a filter on the exhaust system? If so, what type of filter?) I would appreciate any suggestions. } Thanks in advance. } } Adriana } } Adriana P. M. Rodriguez } Biologia Celular, CENA/USP } Av. Centenario 303, C.Postal 96 } 13400-970, Piracicaba, SP, BRAZIL } fax 55-19-429 4610 - voice 55-19-429 4694 } e-mail {adriana-at-aguia.cena.usp.br} } } } Dr Laurence Tetley IBLS EM Centre Joseph Black Building University of Glasgow Glasgow G12 8QQ
I think we would like to upgrade our ultramicrotome resources. We have an MT-2B and an MT-2. We do mostly simple thin sectioning with a fair number of students and novice users.
I am looking for expert (!) advice on the following questions:
1. If we can get the funds together, would you like to volunteer your opinions on the products currently available? (Where is Consumer Reports when you really need them?)
2. If we can't get enough together for a new instrument, what's the used microtome market like these days?
3. Should we be quiet and be happy with our MT-2B?
Jonathan Krupp Microscopy and Imaging Lab University of California Santa Cruz, CA 95064 (408) 459-2477 FAX (408) 429-0146 jmkrupp-at-cats.ucsc.edu
Alternate-Recipient: allowed Auto-Forwarded: prohibited Content-Return: allowed Disclose-Recipients: prohibited Conversion: allowed Importance: normal Priority: normal Sensitivity: Company-Confidential
} ...why then not go for a dual solution: dye-sublimation for } photorealistic pictures (material for publications) at 5$ per one } print and then thermal wax for drafts (300dpi, good color } saturation, 5$ per 100 prints)?
In our (somewhat special) situation we actually have a triple solution: the PC interfaced to the machine has a conventional laser printer, a color inkjet, and it is also networked to campus services. Color inkjets are now capable of producing "working quality" on plain paper, and relatively good (what I would call "poster quality") on coated paper--at $2 or so a shot. The final "publication quality" step is achieved by sending pictures (after careful preview, of course) to services on campus, like a truly professional color printer or slide camera. For the number of times we really need dye sub quality it is cheaper to pay them $6 a shot than to buy our own printer. Although these options are not available to all EM facilities, those in large research universities should carefully explore the services available to them.
Alfred
----------------------------------------- Alfred Kracher akracher-at-iastate.edu http://www.public.iastate.edu/~akracher -----------------------------------------
The nature of the PDP-11 and the RT-11/TSX operating system is somewhat similar to the PC and DOS. A printer driver needs to be written for every application. There is no general purpose driver that can be loaded to support a new printer like can be done under Windows or Mac-OS. The driver that is part of the RT-11 operating system simply manages the transmission of bytes from the CPU to the serial port. Therefore, you would need a version of the program that already has laser printer support built in.
I seem to recall that Kevex had support for some laser printer, but my information is buried quite deep. You may want to give them a call.
It may be that you can find a laser printer that uses the same control code set that the Okidata printer used. I don't recall if it was similar to the Epson code set or not. Even if it does emulation, you may not be happy with the graphic rendition. That is, it may be sharper and blacker but still very sparse and Spartan graphics.
The HP 4 printers support multiple personalities and can handle HPGL plotter code, once the correct escape sequences are used to enable that mode. That might be one solution for you and might allow you to use the HPPLOT program that Kevex supplied. I might be able to help you with the details of switching modes.
If you are interested in printing images, you might be better off saving the image to disk and shipping it to a PC or Mac for printing as a TIF file. I have a routine I wrote to do that. I will see about getting it onto the MSA file server.
At 12:21 PM 11/13/96 -0500, you wrote: } Hello All, } } We currently have a Kevex Delta V EDS system with an old Okidata 192 printer. } I was wondering if anyone had any experience with changing printers to } something more modern (laser) ? } } We have Kermit, so we could load drivers into Kevex system if we knew } what/where to load them. } } Any info would be greatly appreciated. } } John Giles } Senior Engineer } Honeywell Space Systems } jegiles-at-space.honeywell.com ---------------------------------------------------- Warren E. Straszheim 270 Metals Development, Ames Lab/ISU, Ames IA, 50011 Phone: 515-294-8187 FAX: 515-294-3091
Hi microscopy list, sorry but I am forwarding this which was forwarded to me to alert the list-manager to remove my old address from the list Thanks, Steve Zullo
} X-PH: V3.18-at-itchy.dcrt.nih.gov } From: "Waldman, Ivan N." {WALDMANI-at-dirpc.nimh.nih.gov} } To: "Zullo, Steven {sz5m} " {sz5m-at-nih.gov} } Subject: FW: Notification: Inbound Mail Failure - Address not found } Date: Thu, 14 Nov 1996 12:37:36 -0500 } Encoding: 27 TEXT } } Steve, } You are getting a large number of e-mail messages still being sent to your } old address --i.e. here at SEH. Can you please notify everyone of your new } address as this is causing problems. } Thanks. } Ivan Waldman } } ---------- } From: System Administrator[SMTP:postmaster-at-imc1.nih.gov] } Sent: Wednesday, November 13, 1996 11:14PM } To: NIH Hub Administrator } Subject: Notification: Inbound Mail Failure - Address not found } } A mail message was not sent because the following address(es) could not be } found: } } {zullos-at-dirpc.nimh.nih.gov} zullos-at-dirpc.nimh.nih.gov } } The message that caused this notification was: } } To: {microscopy-at-Sparc5.Microscopy.Com} } From: {Microscopy-request-at-Sparc5.Microscopy.Com} } Subject: Re: High Resolution networked Printers } } } } }
I'm not sure what setup you are using for dye-sublimation printing, but our Kodak 8650PS (about $8k after rebate) will print 8"x10" gray scale prints for about $1.75 (U.S.) per print. Even the three color prints are only about $2.20 per print. Are you figuring in depreciation on the $4-$6 per print? Also, you can easily put multiple prints on one page, reducing the cost further. As has already been mentioned in this thread, the Codonics will do this automatically and easily (and costs the same per print since the insides are the same as the Kodak and takes the same supplies), though that printer costs a bit more.
This cost is still higher than laser or thermal wax, but it is not as bad as originally presented.
I have no business interests in either Kodak or Codonics, but have been happy with our Kodak printer.
Cheers,
John Vetrano js_vetrano-at-pnl.gov _______________________________________________________________________________
} Whenever someone asks about High Resolution networked Printers, the } response is almost always "Go Dye-sub." In the EM business, especially in a } service situation, we may crank out 80 to 100 or more prints a day. $4 to $6 } per print just ain't going to work.
Right, why then not go for a dual solution: dye-sublimation for photorealistic pictures (material for publications) at 5$ per one print and then thermal wax for drafts (300dpi, good color saturation, 5$ per 100 prints)? Color lasers have not convinced me yet (pale rendition) but are improving.
A good thermal wax printer is about 60% of the price of a good dye-sublimation printer. Color lasers are coming down in price.
ChR
_________________________________________________________________________ Christophe Roos Dr.Sc., doc. | Institute of Biotechnology | & Dept. of Biosciences Phone: +358 9 7085 9367 | Division of Genetics Fax: +358 9 7085 9366 | P.O.Box 56, Viksbagen 9 E-mail: Christophe.Roos-at-Helsinki.FI | FIN-00014 Univ. of Helsinki X-400: /G=Christophe/S=Roos/O=Helsinki/ADMD=fumail/C=Fi Finland {A HREF="http://www.helsinki.fi/~roos/index.html"} WWW Home Page: Roos {/A} -------------------------------------------------------------------------
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At 12:16 PM 11/14/96 +0001, you wrote: } Well, if you really need the highest (to me, that means publication } quality)quality output on a day-to-day basis, then your organization } should recognize this and support the costs incurred. One question, } though, if this is really the case, then why would you need a print } darkroom at all? } ********************* I am trying to GET OUT OF THE DARKROOM! The world has decided that health care should be cheap, and the competition between providers has mandated that results should be delivered fast. My department will pay for the machine, but it is the HMO's etc. that will (Ho-ho-ho!) or should, pay for my services. If you have been reading the news in the past year or so, you will know that THEY want our services done for free! By digital capture of images, archiving on CD ROM, and immediate print out of the images I am hoping to shave maybe an entire day off of the turn around time for a case as well as some of the cost. Developing, washing, drying, printing negatives; then washing and drying the prints takes a lot more time. And when you add up the cost of the materials, chemicals, and most importantly, the technician's wages, you have spent serious money. Then when you try to get the print sets back from the various pathologists and clinicians in order to perform the Quality Assurance duties that are now mandated, and they have been misplaced, or "Dr. So-In-So is out of town, but he'll be sure to return them to you as soon as he gets back.......next month", the idea that your computer can print out a new set rather quickly, becomes rather attractive. In short, digital management and data basing of images is becoming more efficient than the old darkroom technology.
Joiner Cartwright, Jr., Ph.D.
Director, Electron Microscopy tel.: (713)798-4658 Department of Pathology, Rm.286-A FAX: (713)798-3945 Baylor College of Medicine Internet: joiner-at-bcm.tmc.edu One Baylor Plaza Compuserve: 71555,1206 Houston, Texas 77030 U.S.A.
} Whenever someone asks about High Resolution networked Printers, the } response is almost always "Go Dye-sub." In the EM business, especially in a } service situation, we may crank out 80 to 100 or more prints a day. $4 to $6 } per print just ain't going to work.
You seldom need to print each negative on a whole letter size page. We usually put from 2 to 6 on a dye sub page. Thats quite economic. And where you REALLY need photo quality in submitting to a journal, (1) Laser output wont do (2) you have 4-6 on one page anyway.
Fortunately other technologies (laser } and ink jet) seem to be making head roads into the problem.
They are fine for draft prints. So long as these show the image that is needed, they are OK. Most of our work can be output on our laser.
EM is monochrome } which helps considerably; and I would guess that a fair amount of light } microscopy, which we normally think of as color, could be usefully rendered } in shades of gray. What is needed is a printing technology that gives us } high resolution.....both spacial AND contrast......quickly and inexpensively } (pennies, not $'s per page). } } It sure would be nice, but I gave up holding my breath. What will be best is Customers and Journals which accept digital images on disk or down the net. We encourage customers to accept images on CD-ROM.
I am in the process of writing up a wish list of equipment to upgrade our image analysis capabilities. Before I get to my questions, I should mention that our lab examines primarily biological specimens & some polymers, where good color reproduction of histological stains is needed. We have a Zeiss (universal? 160mm) light microscope and a Wild dissecting scope, both equipped with camera C-mount. We also do TEM and SEM and have occasion to examine some macro samples on a copy stand. We may in future do some fluorescent microscopy but this is not an immediate need. Also we have a mix of PC's and Mac's but the major imaging work is done on PC's.
I am actually narrowing down my list of options for cameras, software, etc. But there are still many unknowns. So, I would like to hear from anyone with experience with the following instruments or suggestions as to which models, etc. to choose (all opinions welcome!):
Cameras:
Optronics DEI750 vs. Sony SODXC-970M vs. Pixera Professional vs. Kodak DCS 410 or 420 vs. any other suggestions?
Technical question--if signal/noise ratio = 6(bits)+ 2 then how can Pixera Professional be 24 bit and only 46 S/N?
Framegrabbers:
I know Matrox and Data Translation offer good products, but which models will be complementary to the above cameras? Are any true RGB?
Computer:
I have given up on trying to make do with what I have. So if I am going to order a new one, how does the following sound: Pentium with PCI bus, 40+ Meg RAM, 1+gig hard drive, [good graphics card ?? how to specify?], SCSI port, 2 parallel ports, ZIP drive. What type of monitor is needed? And the big question -- Windows 95 or NT??
Software:
BioScan Optimas vs. Media Cybernetics Image Pro Plus?
Misc:
Does anyone know of a good source for RG-6 75 ohm cable with quad shielding that I can get custom made at certain lengths ( {50 feet) with F-connectors and/or BNC's?
Thanks in advance for all suggestions and help!
Karen Zaruba
~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~ Life Sciences Sector Lab Reply: kszaruba-at-mmm.com 3M Company 3M Center 270-1S-01 Phone: 612-737-2971 St. Paul, MN 55144-1000 Fax: 736-1519
These opinions are my own and may not represent those of 3M.
Another combatant in the OS wars has been Macintosh (still a major player in the digital/graphics realm), with OS-8 (Copland) being pursued in gradual steps, but still a long way off. However, according to MacWeek 11.04.96, Apple is currently negociating with Be Inc. to buy BeOS, an elegant, advanced, modern OS that already has preemptive multitasking, symmetrical multiprocessing, multithreading, protected memory, and great stability. BeOS is currently PowerPC native, and the plan would be to use BeOS as the Macintosh operating system, with the OS-8 microkernel (essentially ready) underneath it. Apple would continue to support OS-7.5 for the time being, and would plan to have the BeOS-OS8 hybrid out by next summer. Although there would be a lot of problems to work out, it could be quite an exciting system with impressive specifications. Many of the major digital/graphics developers still have considerable Apple loyalty. Apparently, Adobe is already working on a BeOS version of Photoshop.
A. Kent Christensen University of Michigan {akc-at-umich.edu}
------------------------------
On Thu, 14 Nov 1996, Richard E. Edelmann wrote:
} OS wars: } } DOS/Win 3.x - Its dead, Bill-I-am-master-of-the-universe-Gates } has killed it. (Besides it won't handle over 64Mb of RAM any way - } Don't believe me? Go ahead and try it) } } OS/2 - stabile, once you get it loaded, but its destined to die an } undeserved death since no one is writing software specficially for } this OS. } } UNIX/AIX/LINUX/Etc. - Give us a break. } } Win 95 - A toy for the masses, and not really 32-bit. } } Windows NT - ? Is this what we're left with? Its far more stabile } than Win 95, and is designed to handle networking issue much better. } It'll be around for awhile yet. But inherent in its stability is its } limitations on software control of hardware (that's why gamers don't } like it), but due to the massive quantities of data, data } transmission rates, and our hopes of 'live' image capture, the } typical solution has been to by pass the OS and have the software } directly handle the hardware (i.e. capture card) and memory } transfers in order to save the time wasted in OS overhead. What } does this mean interms of Windows NT and PCI capture systems? } } I am looking for any KNOWN information on hardware interface } problems with Windows NT and 'image' capture hardware. Alternately, } or additionally, we would (I know I'm not alone) love to hear from } digital imaging vendors to find out where the OS wars are heading to } for microscopy needs. } } Richard E. Edelmann } Electron Microscopy Facility Supervisor } 352 Pearson Hall } Miami University, Oxford, OH 45056 } Ph: 513-529-5712 Fax: 513-529-4243 } E-mail: edelmare-at-muohio.edu }
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Dear John, My experience with Kevex printers is that you can only get a new printer from Kevex. Not only did they write all their own drivers for the graphics screen dump, but they put their own EPROMS, labeled "Kevex", into the printer. Kevex sold me a new Okidata Microline 320 when I complained about the old printer, for US$600. Pretty good for a nine-pin dot matrix printer! It does work better, though. Good luck, Mary
} Hello All, } } We currently have a Kevex Delta V EDS system with an old Okidata 192 printer. } I was wondering if anyone had any experience with changing printers to } something more modern (laser) ? } } We have Kermit, so we could load drivers into Kevex system if we knew } what/where to load them. } } Any info would be greatly appreciated. } } John Giles } Senior Engineer } Honeywell Space Systems } jegiles-at-space.honeywell.com } } Mary Mager Electron Microscopist Metals and Materials Eng., UBC 6350 Stores Rd. Vancouver, B.C. V6T 1Z4 CANADA tel:604-822-5648, fax:604-822-3619 e-mail: mager-at-unixg.ubc.ca
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At 10:02 14/11/96 -0500, you wrote: } } Dear all, } } I am working on the X-TEM of multilayer thin films on a soda-lime } substrate. What was unexpected was that when the beam (~120KeV) hit the } substrate, it evaporated (melted?) and the films collapsed. Can anybody } give me any suggestions on dealing with such specimens? } } Your help are greatly appreciated. } } } Chao-Ying Ni } Institute of Energy Conversion } University of Delaware } Newark, DE 19716 ************************************** Dear Chao-Ying Ni & : The obvious microscope related changes to consider are: Less beam current, smaller condensor setting, smaller condensor aperture. More important is the voltage used. Frequently a higher but sometimes a lower kV will cause markedly less damage. The most important reduction of a "melt-down", or other specimen beam damage is achieved through carbon coating the specimen. The thicker the coating, the better the specimen will tolerate the beam. Eventually this will compromise resolution. Cheers Jim Darley Probing & Structure } (Microscopy Supplies & Accessories) PO Box 111, Thuringowa QLD 4817 Australia } } Phone +61 77 740 370 Fax: +61 77 892 313 } A great microscopy site http://www.ultra.net.au/~pns/
George has asked about contamination during electropolishing. I'm afraid it'll be very hard to give a direct solution to his problem unless someone has worked on exactly the same material. I think, however, this could be a good start for a general discussion on this issue. In the past we have also tried a number of solutions for contamination but could not conclude on a general rule for all materials. Every case is different. A first question is whether the oxidation or contamination is a left-over from the polishing or occurs during later handling of the samples. At any rate, samples should be properly washed so no acid remains on the surface. In some cases removal of the sample from the jet apparatus with the voltage still on has been suggested. Rapid blow drying could be of help too. Keeping the sample in freon between thinning and EM could also limit the amount of oxidation. Recently the plasma-cleaning principle has been suggested and succesfully applied for similar problems, so I heard. We currently have similar problems with Cu-Zr samples and have a hard time to establish the best parameters for good thinning without too much amorphous contamination. If anyone has any suggestions here ??? Nick Schryvers
} REGARDING RE} probl. electropol. } } George has asked about contamination during electropolishing. I'm afraid } it'll be very hard to give a direct solution to his problem unless someone } has worked on exactly the same material. I think, however, this could be a } good start for a general discussion on this issue. } In the past we have also tried a number of solutions for contamination but } could not conclude on a general rule for all materials. Every case is } different. A first question is whether the oxidation or contamination is a } left-over from the polishing or occurs during later handling of the samples. } At any rate, samples should be properly washed so no acid remains on the } surface. In some cases removal of the sample from the jet apparatus with the } voltage still on has been suggested. Rapid blow drying could be of help too. } Keeping the sample in freon between thinning and EM could also limit the } amount of oxidation. } Recently the plasma-cleaning principle has been suggested and succesfully } applied for similar problems, so I heard. } We currently have similar problems with Cu-Zr samples and have a hard time to } establish the best parameters for good thinning without too much amorphous } contamination. If anyone has any suggestions here ??? } Nick Schryvers } }
Maybe I mistake and the story is more complex than I imagine, but does not aluminum oxidize very quickly (growing a passivating layer of alumina) in air. Thus in the case of aluminum sample, as in the case George was dealing with, if I remember, "contamination" might take place even after polishing. Maybe a transfert in oxygen free atmosphere might be contemplated in order to check out this point.
Yves MANIETTE Universitat de Barcelona Serveis Cientifico Tecnics Unitat ESCA TEM Carrer Lluis Sole i Sabaris, 1-3 E-08028 BARCELONA ESPANYA
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} Date: Thu, 14 Nov 1996 15:14:57 -0800 } From: andrew berry {andrew.berry-at-flinders.edu.au} } Reply-To: andrew.berry-at-flinders.edu.au } To: spb-at-mwrn.com } Subject: trying to contact H. Nonomura } } Hello } I am a Actinomycete researcher in South Australia, Australia, and I } would like to contact H. Nonomura who has published extensively in this } area. I am co-writing a short review paper and would like to request } permission to use some of his electronmicrographs in it. } } I hope you can help } Jackie Evans } } Susanne Pignolet Brandom, Ph.D. MC Services 6-D North Commons Lincoln MA 01773
617-259-3376
MicroWorld Resources and News http://www.mwrn.com/
Message-Id: {9611151745.AA9795-at-pho903.sbphrd.com} To: microscopy {microscopy-at-Sparc5.Microscopy.Com} {Beverly_E_Maleeff-at-sbphrd.com}
Dear Mike, I am sure if you contact Dr. V. Robinson at ETP-Semra, he will be able to assist you in your search. Dr. Robinson invented the techniqe in the 1970's and will be most pleased to respond. You can reach him at etpsemra-at-geko.net.au. Best Regards Robert Ruscica ETP-USA www.etp-usa.com e-mail, ruscica-at-etp-usa.com
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Please respond to: andrew.berry-at-flinders.edu.au
} Date: Thu, 14 Nov 1996 15:19:57 -0800 } From: andrew berry {andrew.berry-at-flinders.edu.au} } Reply-To: andrew.berry-at-flinders.edu.au } To: spb-at-mwrn.com } Subject: Trying to Contact A. Dietz } } Hello } My name is Jackie Evans and I am an actinomycete researcher in South } Australia, Australia. I would like to contact A.Dietz who has published } a number of electronmicrographs of various actinomycetes. I am writing a } short review paper and would like to ask permission to use some of these } electronmicrographs in it. } } Hoping you can help me } Jackie Evans } } Susanne Pignolet Brandom, Ph.D. MC Services 6-D North Commons Lincoln MA 01773
617-259-3376
MicroWorld Resources and News http://www.mwrn.com/
Though I am not an expert at fume hoods, one aspect of fume hood design that was brought to my attention by our lab safety personnel -- were the exhaust fan was placed. The motor needs to be at the place of exit from the building (usually on the roof). If the fan is placed just above the lab which is not the top floor of the building, a positive pressure builds up in the duct above the lab and could cause leakage into the floors above (or to the side). This is something that you would think would always be accounted for but I am constantly surprised by engineering oversights.
Ciao for now,
Ken
} Our lab is in the process of buying a fume hood. It will be used } primarilly for protection against EM and LM processing chemicals } (fixatives, resins, solvents, etc.). } My question is basically: what characteristics are recommended? (do we } need a filter on the exhaust system? If so, what type of filter?) I would } appreciate any suggestions. } Thanks in advance. } } Adriana } } Adriana P. M. Rodriguez } Biologia Celular, CENA/USP } Av. Centenario 303, C.Postal 96 } 13400-970, Piracicaba, SP, BRAZIL } fax 55-19-429 4610 - voice 55-19-429 4694 } e-mail {adriana-at-aguia.cena.usp.br}
The LaserMaster 1800dpi printer made impressive, inexpensive prints of SEM 1 and 4 MB digital images. Better than their 1200 dpi printer and considerably better than 600 dpi Apple. These were the first trials by the company on images that we printed in Zuerich and here on the other two machines.
For halftones, we've used a 2400 dpi Linotronic at the local publishing house: $10-20 per print.
Jacob Bastacky Room 116 Donner Laboratory Lawrence Berkeley Laboratory EMail: sjbastacky-at-lbl.gov University of California Phone: (510) 486-4606 Berkeley, California 94720 Fax: (510) 486-4750
joiner-at-bcm.tmc.edu wrote: } } The obvious solution, though not necessarily practical financially } } speaking would be to have a reasonable laser printer for day to day } } archiving type of work and a good dye sublimation printer to } } be used only for those situations where publication quality is } } required. The latter printer could be located in a institutional } } central area and jobs sent remotely, while the laser writer would } } be located locally. One can justify the dye sub printer costwise, } } by comparing to the upkeep of a print darkroom. In addition, AFM } } images and the like, for publication really cannot be output any } } other way, not to mention the "fancy", full color transparencies } } that can be produced! } } } ***************** } No, that won't work. "Day to Day" is where we need the quality. We produce a } large number of E.M. images upon which we base medical diagnoses. These } prints have to have and convey the maximum amount of information captured in } the original image. The publication images are best produced in the darkroom.
If this is the case then you should consider the Fuji Pictrography - it is superior to the thermal dye sub technologie at a cost of $3.50 per 8.5"x11" page or $1.75 for 1/2 page as it uses continuous material and a silver halide one step printing process at up to 400dpi. These units make a true photograph - following this thread unfortunatly you can not get true photo quality at a high print speed and at a low cost per print or for the unit - Also thermal dye sub typically is about $2.00 to $3.00 per page not $5.00 per print.
Scott E. Berman Advanced Imaging Concepts, Inc. Phone(609) 921-3629 x26 Fax(609) 924-3010 e-mail Scott E57-at-aol.com
Standard jet electropolishers usually hold the 3mm disk between two pieces of plastic. It seems to me that the time it takes to get the specimen out of the holder (an operation which occurs at room temperature), or to rinse the acid from the entire holder, could be a problem with extremely sensitive specimens.
One solution is to hold the specimen in a pair of platinum-tipped tweezers (clamped closed). The specimen must be dimpled carefully, or else it will simply dissolve in the acid before it is perforated. by viewing the specimen through a glass beaker with a light bulb positioned behind it, it should be possible to see the hole and quickly cut off the current before the specimen is ruined. I have used this technique in the past to produce TEM specimens in Titanium alloys.
Another issue is the temperature of the electrolyte. Very low temperature is good, because any reaction between the specimen and the electrolyte, which can occur after polishing and before cleaning, will be slowed.
A good reference on electropolishing (with references for further reading) is written by Van der Voort, and I believe has the word "Metallography" in the title.
Wharton
++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++ Wharton Sinkler PhD Department of Materials Science and Engineering Northwestern University 2225 Sheridan Rd. Evanston, IL 60208-3108 tel: (847) 491-7809 fax: (847) 491-7820 email: sinkler-at-apollo.numis.nwu.edu
On 15 Nov 1996, NICK SCHRYVERS wrote:
} REGARDING RE} probl. electropol. } } George has asked about contamination during electropolishing. I'm afraid } it'll be very hard to give a direct solution to his problem unless someone } has worked on exactly the same material. I think, however, this could be a } good start for a general discussion on this issue. } In the past we have also tried a number of solutions for contamination but } could not conclude on a general rule for all materials. Every case is } different. A first question is whether the oxidation or contamination is a } left-over from the polishing or occurs during later handling of the samples. } At any rate, samples should be properly washed so no acid remains on the } surface. In some cases removal of the sample from the jet apparatus with the } voltage still on has been suggested. Rapid blow drying could be of help too. } Keeping the sample in freon between thinning and EM could also limit the } amount of oxidation. } Recently the plasma-cleaning principle has been suggested and succesfully } applied for similar problems, so I heard. } We currently have similar problems with Cu-Zr samples and have a hard time to } establish the best parameters for good thinning without too much amorphous } contamination. If anyone has any suggestions here ??? } Nick Schryvers } }
The oxidation problem you decsribe may be caused by the delay in removing and rinsing your sample. The nitric/methanol solution you are using will continue to etch your sample after the unit has shut off. An alternative may be to use a "non-Acid" electrolyte. The BK-2 solution was developed by Bernie Kestel at Argonne National Lab and is described in his paper "Non-Acid Electrolyte Thins Many Materials Without Hydride Formation" Ultramicroscopy 19 (1986) 205-212.
If you don't have a copy of the paper, I can FAX and/or mail one to you. I spoke to Bernie and he said it works well on aluminum alloys, but not on pure aluminum. He suggested a voltage of 170-200 and low temperature (-40c). You can contact him directly at bernard_kestel-at-qmgate.anl.gov.
DISCLAIMER The non-acid electrolyte was developed for use on a South Bay Technology Model 550 Jet Polisher. Some of the settings required (eg voltage, current and visual observation) for use may not be available on other commercial units. We are the manufacturer of the Model 550 and have a financial interest in promoting its use.
I hope this information helps!
Best regards-
David Henriks TEL: 800-728-2233 (toll-free in USA) South Bay Technology, Inc. 714-492-2600 1120 Via Callejon FAX: 714-492-1499 San Clemente, CA 92673 USA e-mail: henriks-at-southbaytech.com http://www.southbaytech.com
Manufacturers of Precision Sample Preparation Equipment and Supplies for Metallography, Crystallography and Electron Microscopy.
Fellow Microscopists One of our Research students, is carrying out a Ph.D project on Al based alloys (Spay cast 7xxx series) , (10-11% Zn, 1-1.5% Mg, 1.5-2 % Cu, 0.3 % Zr, Al balance). As part of her project she is required to carry out an extensive TEM characterisation study of these alloys. However, she is encountering significant problems with rapid oxidation of the TEM samples, following preparation by a conventional twin jetting technique (involving the use of a Struers Tenupol -3 model using an electrolyte solution of 30% Nitric acid in methanol at -40oC). Following preparation by twin jetting we have tried removing the oxide films by ion beam thinning on a Gatan ion beam thinner, at a milling angle of 10o (minimum angle permitted ) and at a voltage of 4KV and at a current of 3mA. Following this dual approach, some times Oxide free Aluminium foils are prepared but some times the oxide formation persists. However, it appears that this effect is not related to the milling time, since different milling times were involved. I would deeply appreciate your advise on this persistent problem, by either their replying to the mailing list or to her directly at: meteo-at-leeds.ac.uk
} Dear Netters: } Thank you for all the responses to my question about holders to perform } REM-RHEED in the TEM. The following is a summary of the responses I= received. ********
Philips has a special bulk sample holder for reflection diffraction applications (called reflection diffraction holder). It allows you to put a bulk piece of sample onto the stage with the sample surface parallel to the electron beam at zero tilt. You can tilt the holder a few degree to obtain a glancing angle in order to obtain reflection diffractions. You can also rotate the stage to obtain diffractions from different orientations. If your sample is small enough, you can modify a double tilt holder to do certain reflection work (see also Tung Hsu's paper: Technique of reflection electron microscopy published in Microscopy Research and Technique 20:318-332, 1992). The thing is that you need to mount your speciman surface to be diffracted nearly parallel to the beam.
Yi Feng, Ph.D. Sr. Applications Specialist Philips Electronic Instruments 85 McKee Drive Mahwah, NJ 07430 USA
E-mail: yi_feng-at-pei.philips.com Tel: 201 529 6405 Fax: 201 529 2252 ******************************* I am not sure what you mean by an attachment to do RHEED and REM. I did this some time ago in a Phillips 400t; all you need is an appropriate specimen. There are some excellent papers by Tung Hsu on the subject [e.g. Ultramicroscopy _11_, 239, (1983), J. Vac. Sci. Tech. _B3_ (1985)] There is also an 'idiots guide', but I don't have the reference (J. Appl. Cryst= 1983?) Regards,
Richard Beanland, GMMT Ltd., Caswell, Towcester, Northants NN12 8EQ UK ******************************* Of course it's possible to attach this attachment on your 200Cx. It's calling HR Diff attachment because The location is just under the projector lens (on the port you can see on both side of column) and as the camera length is mechanically fixed (~37cm)+=7F=1C=7F=7F=16=F5(=01=7F=7F=7F=7F=7F=7F=7F=7F=7F0*0*0*=B0=04=B0=04= =1C=7F=7F=D4=8Cthe calculation is more accurate for the L Lambda. It's primary design to use with normal grid but as you can tilt at 90 degrees you can make reflection dif on bulk sample. This attachment is design with an airlock in order to change the sample without breaking vacuum in camera chamber. Depending on the tools you have in your laboratory , you can build a simple one without airlock. May be it's possible to find a used one. If you're interresting let me know. Regards.
We have a RHEED (Reflection High Energy Electron Diffraction) stage on our JEOL JEM-100CX electron microscope. It is attached under the Projector lens (i.e. there is no lens between it and the camera), has its own airlock, can be used both for high resolution transmission diffraction and for reflection diffraction and has X & Y movement, tilt and rotate goniometer controls. We use it in reflection mode for looking at ion implanted semi-conductors but it has also been successfully used with surface diffusion in metals. I also see from the JEOL catalogue for the JEM-200CX that JEOL made a "High Resolution Electron Diffraction Stage", No AD4, for this microscope. I assume that this is the same type of specimen stage, since they say "transmission and reflection diffraction possible". It, like our RHEED stage, has a fixed camera length of 312mm. Whether this stage is still available from JEOL I cannot say - you'd have to ask JEOL Hope this helps you with your enquiries,
Peter Smith. Electron Microscope Unit Dept of App Physics Royal Melbourne Institute of Technology 124 La Trobe St MELBOURNE Victoria 3000 AUSTRALIA
Phone: +61 3 9660 2205 Fax: +61 3 9660 3837 ***************************************** We have one on our 100CX and routinely use it for+=7F=1C=7F=7F=16=F5(=02=7F=7F=7F=7F=7F=7F=7F=7F=7F0*0*0*=B0=04=B0=04=1C= =7F=7F=D4=8Cexamining thin film surfaces. In fact, it's the most heavily used stage on the instrument!
The stage inserts into the column just above the projection chamber, and has its own prepumping controls. To ensure full rotation, the sample can be no larger than, say 0.75 cm in diameter, although we've examined (slightly) larger samples without rotating. Also, the samples can be up to (at least) 0.5 cm thick. Generally, they are mounted on a stub with silver paint.
B. G. Demczyk USAF Rome Laboratory ***************************************** .....The important technical info in it, however, was a reference to a chapter I wrote on reflection ED in Vol. 1 of the 2nd. Ed. of the book 'Physical Methods in Chemical Analysis', W. G. Berl, Ed published by Academic Press. This delt with ReflED in dedicated reflection units, but I believe the corresponding chapter in the 3rd edition deals with ED in TEMS. Also, there is a section on Refln ED with TEMs on p. 271 of Vol 1 in the series 'Practical Methods in Electron Microscopy', Audrey Glauert, Ed., North Holland, 1972 (two ISBNs given: 0-7204-4251-6 for North Holland = & 0-444-10404-6 for American Elsevier) W. C. Bigelow (bigelow-at-umich.edu) ********************************** ...You're right, the attachment is under the proj lens on both side, one for the sample holder and the second one for the air lock chamber. Take care in using a specimen holder to make REM in the objective lens cause the tilting angle is limited to +-30+=7F=03=C0 and in that case the holder itself create a "shadow" on your= REM. If you have an idea on how much you can spend on a such attachment, I can discuss with some of my customer that doesnt use that one. Regards.
Jacky Larnould tel 33 (0)4 67 72 28 26 fax 33 (0)4 67 79 54 90 email larnould-at-mnet.fr *********************************** About 10 years ago we made a reflection diffraction holder for our Jeol 100CX. We used it for a consulting job, then it went on the shelf until this year. We got an inquiry thru Jeol and ended up selling the holder to the Hauptman-Woodward Medical Research Institute in Buffalo, NY. The user is Douglas Dorset.
The holder mounted on the right diffraction camera port, just above the viewing chamber. It had two sample mounts; one for a diffraction standard+=7F=1C=7F=7F=16=F5(=03=7F=7F=7F=7F=7F=7F=7F=7F=7F0*0*0*=B0=04=B0=04= =1C=7F=7F=D4=8Cand one for the sample. It provided +/- 90 deg. tilt, 360 deg. rotation and +/- 3 mm translation in the X and Y axes. The sample holder could be retracted out of the beam when not in use.
We still have the drawings and could build another one if anyone was= interested.
Petyer W. Fullam Ernest F. Fullam, Inc. Phone: (518) 785-5533 FAX: (518) 785-8647 E-Mail: pdf-at-fullam.com
******************************* Augusto A. Morrone 107D-MEL, P.O. Box 116400 MAIC Materials Science and Engineering University of Florida Gainesville, FL 32611 (352) 392-1497 or 6985 Fax: (352) 392-0390 amorr-at-mse.ufl.edu
George and student: If you are trying to prepare truly oxide-free aluminum this will be extremely difficult, except by keeping the material in an UHV system where you can ion mill the oxide away and then directly examine your specimen. However, I find that the {2nm thickness of the native oxide that forms on clean aluminum is thin enough to be undetectable for all but the most demanding HREM. Under normal conditions this thin oxide layer is fully passivating, and the specimen is quite stable.
However, if you're getting some sort of massive oxidation throughout the entire specimen, I suspect something is wrong with your polishing procedure. I have a lot of experience polishing a number of alloys in the 7000 series: 7050, 7075, 7475, using essentially the same recipe that you have with excellent results. I use HNO3 in methanol in a 1:2 ratio, at -40C as you did. We have a Fishione electropolisher. It is important to keep the specimens very clean: I rinse in 3 methanol baths, each progressively cleaner, as immediately after perforation as possible. I give the specimen a final rinse in acetone to remove all the methanol and help it dry quickly. Typically, I put the specimens into the TEM shortly afterward, but I never have problems with specimens that spend several days in a specimen container.
You might try 5% perchloric acid in methanol at -40C or lower. I've had success with it, and it may work better for you. Unfortunately, it tends to preferentially etch away precipitates, which I suspect you want to examine in detail.
For metallurgists only!! Your alloy is very high in Zn--it's the highest I've seen in the 7000 series. What're the mechanical properties like? Is this material something like 7093?
I have a need to do some x-sectional TEM on Ta foil specimens. I tried sandwiching the foil between two peices of Si with M-bond 610. From previous experience I knew the sandwich might not stick together well enough to survive the sawing process and sure enough 87% of the samples I cut cam apart before any grinding. I have not tried the Gatan adhesive (G???). Does anyone have any suggestions or had similar experiences? The samples do need to be viewed in cross-section.
I'll take a shot at some of your questions (and then let the experts correct me).
At 05:04 PM 11/14/96 -0600, you wrote: } Cameras: } } Optronics DEI750 vs. } Sony SODXC-970M vs. } Pixera Professional vs. } Kodak DCS 410 or 420 vs. } any other suggestions? } } Technical question--if signal/noise ratio = 6(bits)+ 2 then how can Pixera } Professional be 24 bit and only 46 S/N?
We have just installed a Pixera. The 24 bit image is only 8 bits on a given color. If your formula is correct, then 6(8)+2 = 50. But since it advertises 46 dB S/N, that would mean that is really just shy of 8-bit resolution. Some intensities are going to waffle between adjacent gray levels. (Is that the correct wording?)
We are still gaining experience with our Pixera. The cost was nice (~$1200), but we have yet to prove the spatial and intensity resolution. We do not normally have rigorous applications; we thought to give the Pixera a try.
} Framegrabbers: } } I know Matrox and Data Translation offer good products, but which models } will be complementary to the above cameras? Are any true RGB?
The Pixera would net need a frame grabber. They have their own interface card for that. But you may want to get a frame buffer or arithmetic processor board to speed up the subsequent processing.
} Computer: } } I have given up on trying to make do with what I have. So if I am going to } order a new one, how does the following sound: Pentium with PCI bus, 40+ } Meg RAM, 1+gig hard drive, [good graphics card ?? how to specify?], SCSI } port, 2 parallel ports, ZIP drive. What type of monitor is needed? And the } big question -- Windows 95 or NT??
Sounds pretty good. I don't know if you need that 40 MB of RAM (I still work with 16 MB), but memory is cheap now. And you are thinking about working in color.
You will probably want a bigger hard drive. We have pretty well filled up a 4 GB drive with x-ray maps and images in a production setting. Much of that could and should be offloaded, but it filled up quick. Disks are pretty cheap too. A removable/re-writable drive of 300+ MB would be nice - could be a writable CD or phase change drive, a magneto-optical, or a conventional removable (Syquest, Zip, whatever).
Big monitors are nice for image analysis/processing. You can end up with lots of windows open.
If Windows NT gives you a better file system, it might be worth it, but I have no experience. I know Windows 3.x and 95 both are strapped with the 64K chunk per disk barrier. That is, the disk is split up into (up to) 64K pieces (allocation units) and parceled out. So a single 2 GB disk partition would get broken up into chunks that are 32 KB in size. Thus even the smallest files takes up 32 KB of disk. I think the NT file system gets around that limitation. But I don't know what other complications arise (like the availability or compatibility of programs). Someone else should comment. ---------------------------------------------------- Warren E. Straszheim 270 Metals Development, Ames Lab/ISU, Ames IA, 50011 Phone: 515-294-8187 FAX: 515-294-3091
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A Short History of the ESEM. Recently a couple of correspondents touched on the development of the ESEM and other variable pressure type SEMs. The history of the development of these instruments is rather more fascinating than most movie scripts. I do not have time to write that book, but a few snippets are appropriate fare for microscopy.com. In one paragraph: What is the ESEM? Specimens for SEM observation must be preserved, dried with minimal distortion and metal coated to conduct excess electrons to ground. The ESEM is a commercial SEM-type instrument which employs low to no vacuum near the specimen. This is achieved through differential pumping, vacuum-limiting apertures and very short distances between the final aperture and the specimen. Scanning is a time-sequential process. In the gaseous detector, similar to other types, if more electrons emerge from the specimen at an instant in time, then greater interaction occurs with gases in proximity and a stronger detector signal is translated into a brighter spot on the CRT during the scanning process. Essentially, an ESEM can look at "live", hydrated and uncoated specimens.
Viv Robinson was Gerry Danilatos' supervisor at the University of New South Wales. Robinson was instrumental in the development of the wide-angle BS detector which carries his name and which, in my experience, is the best BS detector. The early developments of the various inventions which were crucial to the variable pressure SEM must be very largely, if not entirely, attributed to Danilatos, who by then was working in Robinson's lab, but with his own research grant. Later they fell out and Danilatos had a term appointment at CSIRO's Wool Research Division. For his work he adapted an ancient JEOL SEM which was changed beyond recognition. The instrument was owned by the Uni of NSW but Danilatos was allowed to move it to CSIRO. He is of Greek origin and despite the language problems he would have had back then, he was able to obtain a PhD in physics. He was a highly task-oriented worker and not a good mixer; his achievements were astonishing. Still under 35 years old when his contract at CSIRO terminated, he had over 100 publications, several patents, was an Editor for at least one international journal - and he could not get a job anywhere! There can be little doubt that his job prospects were adversely affected by one or two science administrators who seemingly had developed a penchant to actively discourage his employment by others. Why? We can only speculate, a touch of racism, a bit of professional jealousy, gutlessness or poor judgement. Australia has given rise to quite a few outstanding electron microscopists. Like the proverbial prophet, however, Danilatos is still not recognised here as the country's most outstanding electron microscopist. With a young family to worry about and his job at an end, he invested his scarce funds in a trip, visiting all significant EM manufacturers around the world to present his invention and to request that they would consider manufacturing an SEM based on some of his patents. The answers were variations on the theme: "Interesting, but too limited in application, no commercial possibilities" and unspoken "but it was not invented here". Then the break-through: AMR's management too had turned him down, but some of the engineers were convinced of the invention's potential. They formed a company, raised venture capital and the ESEM was in gestation. Danilatos became an ESEM Research Director. With that lofty title he worked for some years in Sydney at his Bondi Beach house. The ESEM's "ancestor" was the centrepiece in his living room. He would start up the ancient JEOL's pump system before breakfast. Quite a few publications were produced in that remarkable setting. I have lost contact with Gerry Danilatos; I last saw him at the 10th Australian EM Conference, Perth, February 1988. For all I know, he is still labouring away at Bondi Beach, but I doubt it. There are now six ESEM instruments in Oz. Philips bought out ESEM in 1996 and other manufacturers make other, patent-skirting variable pressure SEMs. No doubt others researchers have made important contributions to the ESEM's development, but with the variable pressure systems, several vital detector systems and the initiating of the commercial development to his credit, Gerry Danilatos has to be regarded as Father and Godfather of these instruments. JK Galbraith observed that modern inventions are too complex and must be the products of a team effort; the lonely genius is an anachronism. This is generally true and bringing an instrument like the ESEM into production does require a large team. However, in our times it is a singular event when one person can make such a large contribution to the development of a very complex instrument. Jim Darley
PS I will make this page, perhaps slightly modified, accessible through our Links page, see URL below. Probing & Structure (Microscopy Supplies & Accessories) PO Box 111, Thuringowa QLD 4817 Australia
Phone +61 77 740 370 Fax: +61 77 892 313 A great microscopy site: http://www.ultra.net.au/~pns/
Hi. I am looking to buy a stage heater for a multi-user facility, and have pretty much decided on an air curtain heater. The trouble is, the only manufacturer I've been able to find has gone out of business. Can anyone point me in the right direction? Thanks in advance. Steve
**************************************************** Stephen Rogers Dept. of Cell & Structural Biology and the Beckman Institute - Optical Visualization Facility University of Illinois -at- C/U srogers-at-delphi.beckman.uiuc.edu ****************************************************
Would appreciate information on date, time, and place (Sta. Monica?) of the newly reorganized southern CA/"LA" microscopical society's Christmas party/meeting Dec. 1996. Contact person?
I have a need to do some x-sectional TEM on Ta foil specimens. I tried sandwiching the foil between two peices of Si with M-bond 610. From previous experience I knew the sandwich might not stick together well enough to survive the sawing process and sure enough 87% of the samples I cut cam apart before any grinding. I have not tried the Gatan adhesive (G???). Does anyone have any suggestions or had similar experiences? The samples do need to be viewed in cross-section.
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Further to my posting on ESEM history: The intent was to correct the information given in another posting and to highlight some not well known aspects of the ESEM's history. Although I believe that that posting is true in its essential elements, I accept that to be more useful, even a brief history should be more broadly based. I certainly still do not want to write "that book" but feel obliged to enlarge a bit on the development of the variable pressure SEMs. I ask that any additional, pertinent information is emailed to me. Especially wanted are hard facts, dates, events and publications (I will utilize those on the ESEM site and I have many of the old references available). Obviously such a history is for microscopists interest and would not change legal facts or outcomes. Eventually I will post a fuller (but still brief) history on this server and post/link that history also with the LINKS of my site. Perhaps the sciences (particularly EM) do not sufficiently value their heritage and it is regrettable that names like: Knoll, Ruska, von Ardenne & Oatley already would be unknown to most electron microscopists - at least Wehnelt or Everhard & Thornly have a lasting tribute. Now may be a good time to collect and write up the essential facts which led to the development of the variable pressure SEM class of electron microscope. Be assured that I am open-minded and without vested interest in these instruments - other than that my agency sells a wide range of microscopy supplies, some of which happen to be suitable for use with the variable pressure SEMs. Jim Darley Probing & Structure (Microscopy Supplies & Accessories) PO Box 111, Thuringowa QLD 4817 Australia
Phone +61 77 740 370 Fax: +61 77 892 313 A great microscopy site: http://www.ultra.net.au/~pns/
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Dear colleagues,
A small contribution to the "short history of ESEM".
The history of "environmental-EM" (actually ETEM) started in the Isleworth Research Laboratory of Unilever Research in the UK. The first ETEM was designed by J.A. Swift in 1970. In the following years G.R. Wight developed the first ESEM at the Unilever Research Lab at Port Sunlight (UK). This work was published in 1979. From 1981 G.D. Danilatos started to publish on the developments of ESEM which resulted in the introduction of a commercial instrument in 1988.
Regards,
Marcel Paques Unilever Research Laboratory Vlaardingen The Netherlands e-mail: Marcel.Paques-at-unilever.com
A Short History of the ESEM. Recently a couple of correspondents touched on the development of the ESEM and other variable pressure type SEMs. The history of the development of these instruments is rather more fascinating than most movie scripts. I do not have time to write that book, but a few snippets are appropriate fare for microscopy.com. In one paragraph: What is the ESEM? Specimens for SEM observation must be preserved, dried with minimal distortion and metal coated to conduct excess electrons to ground. The ESEM is a commercial SEM-type instrument which employs low to no vacuum near the specimen. This is achieved through differential pumping, vacuum-limiting apertures and very short distances between the final aperture and the specimen. Scanning is a time-sequential process. In the gaseous detector, similar to other types, if more electrons emerge from the specimen at an instant in time, then greater interaction occurs with gases in proximity and a stronger detector signal is translated into a brighter spot on the CRT during the scanning process. Essentially, an ESEM can look at "live", hydrated and uncoated specimens.
Viv Robinson was Gerry Danilatos' supervisor at the University of New South Wales. Robinson was instrumental in the development of the wide-angle BS detector which carries his name and which, in my experience, is the best BS detector. The early developments of the various inventions which were crucial to the variable pressure SEM must be very largely, if not entirely, attributed to Danilatos, who by then was working in Robinson's lab, but with his own research grant. Later they fell out and Danilatos had a term appointment at CSIRO's Wool Research Division. For his work he adapted an ancient JEOL SEM which was changed beyond recognition. The instrument was owned by the Uni of NSW but Danilatos was allowed to move it to CSIRO. He is of Greek origin and despite the language problems he would have had back then, he was able to obtain a PhD in physics. He was a highly task-oriented worker and not a good mixer; his achievements were astonishing. Still under 35 years old when his contract at CSIRO terminated, he had over 100 publications, several patents, was an Editor for at least one international journal - and he could not get a job anywhere! There can be little doubt that his job prospects were adversely affected by one or two science administrators who seemingly had developed a penchant to actively discourage his employment by others. Why? We can only speculate, a touch of racism, a bit of professional jealousy, gutlessness or poor judgement. Australia has given rise to quite a few outstanding electron microscopists. Like the proverbial prophet, however, Danilatos is still not recognised here as the country's most outstanding electron microscopist. With a young family to worry about and his job at an end, he invested his scarce funds in a trip, visiting all significant EM manufacturers around the world to present his invention and to request that they would consider manufacturing an SEM based on some of his patents. The answers were variations on the theme: "Interesting, but too limited in application, no commercial possibilities" and unspoken "but it was not invented here". Then the break-through: AMR's management too had turned him down, but some of the engineers were convinced of the invention's potential. They formed a company, raised venture capital and the ESEM was in gestation. Danilatos became an ESEM Research Director. With that lofty title he worked for some years in Sydney at his Bondi Beach house. The ESEM's "ancestor" was the centrepiece in his living room. He would start up the ancient JEOL's pump system before breakfast. Quite a few publications were produced in that remarkable setting. I have lost contact with Gerry Danilatos; I last saw him at the 10th Australian EM Conference, Perth, February 1988. For all I know, he is still labouring away at Bondi Beach, but I doubt it. There are now six ESEM instruments in Oz. Philips bought out ESEM in 1996 and other manufacturers make other, patent-skirting variable pressure SEMs. No doubt others researchers have made important contributions to the ESEM's development, but with the variable pressure systems, several vital detector systems and the initiating of the commercial development to his credit, Gerry Danilatos has to be regarded as Father and Godfather of these instruments. JK Galbraith observed that modern inventions are too complex and must be the products of a team effort; the lonely genius is an anachronism. This is generally true and bringing an instrument like the ESEM into production does require a large team. However, in our times it is a singular event when one person can make such a large contribution to the development of a very complex instrument. Jim Darley
PS I will make this page, perhaps slightly modified, accessible through our Links page, see URL below. Probing & Structure (Microscopy Supplies & Accessories) PO Box 111, Thuringowa QLD 4817 Australia
Phone +61 77 740 370 Fax: +61 77 892 313 A great microscopy site: http://www.ultra.net.au/~pns/
You can possibly use the Gatan Epoxy ie. G1. It works very well with all the cross-section semi-conductor samples that we prepare and cures in about 5 minutes at about 120 C. One more thing that we do to prepare difficult samples that fall apart because of bad substrate adherence, is to glue a small 3 mm. MO donut type washer to one side of the sample after the disk has been cut from the raft and just before polishing. Dimpling is performed on the glued washer side. These washers are available from EM. supply catalogs.
Specs. of washers is 3 mm. OD. Molybdenum 2 mm. inner hole.
If you need further info email directly.
Fred Pearson McMaster University email: eoptics-at-mcmaster.ca
On Fri, 15 Nov 1996, Chris D. Adams wrote:
} } I have a need to do some x-sectional TEM on Ta foil specimens. I tried } sandwiching the foil between two peices of Si with M-bond 610. From } previous experience I knew the sandwich might not stick together well } enough to survive the sawing process and sure enough 87% of the samples } I cut cam apart before any grinding. I have not tried the Gatan } adhesive (G???). Does anyone have any suggestions or had similar } experiences? The samples do need to be viewed in cross-section. } } Thanks in advance, } } Chris Adams }
I wish to solicit opinions regarding the feasibility of performing "quantitative" thin film (on substrate) EDS (including light elements) analysis in the SEM at low (i.e. 3-5kV) accelerating voltages, using a conventional tungsten hairpin filament electron source in a chamber with backing pressure in the mid to upper 10^-6 Torr range.
Reply to: RE} Low Voltage EDS Quantitative Analysis
You don't say what elements your thin films are to be made of, but one fundamental requirement is that the accelerating voltage used should be from 2 to 3 times the critical excitation potential of the heaviest element being analyzed. Unless you base your analyses on L lines, which many EDS computer programs will not let you do, you will be very severely limited in the elements you can do analyses for at 3 - 5 kV.
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To all of those of you who sent their comments about bench-top sputter coaters:
Thank you very much.
While no one system stood out as unconditionally superior, I found that there was a wide variety of opinion regarding same makes/models. One person's never-fail workhorse was another's paperweight.
Maybe I'll make my own.... ------------------------------------------------- Harold J. Crossman OSRAM SYLVANIA INC. Lighting Research Center 71 Cherry Hill Dr. Beverly, MA 01915 Phone: (508) 750-1717 E-mail: crossman-at-rd.sylvania.com
Our web sites: www.sylvania.com www.siemens.com --
Meeting Announcement for Southern California folks:
Southern California Society for Microscopy and Microbeam Analysis Society of Southern California
Location: Peppermill Restaurant, 795 E. Walnut St. Pasadena CA
Directions: Take the 210 Foothill Freeway to Pasadena and exit at Lake Ave. Go south on Lake to Walnut St. (approx 2 blocks). Turn right on Walnut St, the Peppermill is on the right.
5:30 pm -- Social Hour hosted by Tony Carpenter of JEOL
6:30 pm -- Dinner: Chicken breast with marsala sauce, rice pilaf, and accompaniments (Cost $18, Students $9)
7:30 pm -- Scientific Program
Use of SEM in Determining Relationships Among Crustaceans Jody Martin, Los Angeles Natural History Museum
Atomic Force Microscopy: Introduction and Industrial Applications. Inga Musselman -- MAS Tour Speaker, University of Texas at Dallas.
RSVP -- Please RSVP by Friday Nov 15, 1996. Contact Paul Carpenter at 818-395-6126 or email paulc-at-gps.caltech.edu
SPRING 1997 COURSE ANNOUNCEMENT - Scanning Electron Microscopy (BIO. 222-E2)
NASSAU COMMUNITY COLLEGE, Garden City, Long Island, NY
A fifteen week, Spring 1997 semester, course in Biological Scanning Electron Microscopy is being offered by the Biology Department of Nassau Community College. This is a 4 credit course offered ONE EVENING PER WEEK, Thursdays, starting at 5:30pm. Classes will begin on Jan. 23 and end on May 8, 1997.
This is a "hands-on" course emphasizing biological specimen preparation, student operation of the SEM (Hitachi S-2400 recently acquired through a NSF-ILI grant - see my website for more info.) and production of electron micrographs through the process of black & white photography, and electron micrograph analysis. Students will work on a variety of biological samples with the goal of producing a portfolio of high quality SEM photomicrographs of those samples. In addition, students will learn digital image capture, archiving and analysis on a PowerMac 7600 using NIH Image.
The course is widely transferrable and the cost per credit is reasonable at $78 per credit.
More information about the Bio-Imaging Center at NCC, course descriptions and syllabi, and the humble beginnings of a student gallery of EM photomicrographs is available at our recently completed web site. The URL is {http://www.sunynassau.edu/webpages/biology/becks.htm} .
Interested individuals should register as soon as possible since the course is limited to a total enrollment of ten (10) students. Registration for students new to NCC or non-residents of Nassau County begins on December 9, 1996.
If you have further questions, you should e-mail me directly at the address below.
Stephen J. Beck Bio-Imaging Center/Electron Microscopy Department of Biology Nassau Community College Garden City, NY 11530 Voice Mail: (516) 572-7829 Email: {becks-at-sunynassau.edu URL: {http://www.sunynassau.edu/webpages/biology/becks.htm}
I am about to righr a check so Any comments as to this would help me out. Which One do I Buy?
David
} Hy Victor,
} did you ever used a LOMO Biolam microscope ?
} My references are Zeiss and Wild scopes and in my opinion the LOMOs are } optically equal. OK, the design is a left over from the 30s, with all } advantages and disadvantages.
} + you can adjust nearly everything } + real koehler illumination } + you can use the scope with a mirror (field use) } + it is extremely robust
} - you have to adjust everything } - needs a lot of space
} The main disadvantage is you don't have a factory preset illumination, so you } have to adjust the illumination yourself. Most biology students are not able to } do this, so they work with a nonadjusted illumination and get a bad picture. I } think that's the reason for the bad reputation of the LOMOs.
} So if you buy a LOMO invest at least two weeks in reading a good microscope } book and adjust the scope yourself. Once you have properly set up yor } microscope yourself, you achieve an excellent optically quality.
} } There is simply no comparison between the Leica DM LS and the Biolam. It's } } like comparing a matchbox to a Porsche.
} Leica DM LS = matchbox (first position in comparison) } Biolam = Porsche (second position in comparison)
} Another try:
} It's like comparing a fastfood menu to a real menu. :-)
} (I know Leica (is it Leitz-Cambridge or Leitz Camera ?) builds really good } scopes, so please don't overemphasize the above comparisons)
} Carsten Pitz
Carsten
Let me get this clear : you are saying the biolam is the porsche - that is better then the DMLS -a matchbox ? You are the first person to give this opinion - do you own one? I am about to buy the DMLS - not a bad scope compared to many - no plastic parts etc., but I could buf a biolam -L for 1/2 the cost of the leica with many more option?
Message-Id: {1.5.4.32.19961119030028.006678c4-at-lisa.polymtl.ca} X-Sender: caron-at-lisa.polymtl.ca X-Mailer: Windows Eudora Light Version 1.5.4 (32) Mime-Version: 1.0 Content-Type: text/plain; charset="us-ascii" microscopy-at-Sparc5.Microscopy.Com
At 11:18 96-11-18 +0001, Brian G. Demczyk wrote: } I wish to solicit opinions regarding the feasibility of performing } "quantitative" thin film (on substrate) EDS (including light elements) } analysis in the SEM at low (i.e. 3-5kV) accelerating voltages, using a } conventional tungsten hairpin filament electron source in a chamber with } backing pressure in the mid to upper 10^-6 Torr range. } }
We recently validate a procedure for the determination of thickness and composition of multilayered thin film in the SEM by EDS and Monte Carlo simulations. To do so, we used a TiN(100nm)/Ti(10nm)/SiO2(100nm)/Si sample in conjonction with a TiN(400nm)/Si standard. The Monte Carlo simulations, performed with the CASINO program developped at the Universite de Sherbrooke, are used to compute calibration curves for different thickness and composition from which experimental K factor are fitted. The analysis were performed for electron beam energy ranging from 2KeV to 7KeV using a SEM Philips XL-20 (tungstene) equiped with a Link ISIS system operating in the windowless mode. For the deconvolution of the Ti La and N Ka lines we used also an in-house deconvolution program developped for the traitment of EDS spectrum.
Therefore, EDS at low energy are effectively possible but they are not so easy and as mentionned by Wil Bigelow, commercial softwares do not allow such analysis, especially when more than one element is present in two or more layers and when severe case of peaks convolution is involved. Background substration is another problem for low energy. The linear fit is not apllicable. You should also have strategies to taking into account detector icing if you working in windowless mode.
Mario Caron Ecole Polytechnique de Montreal Laboratory for the Integration of Sensors and Actuators
Several claims have been made lately about the development of SEMs with higher pressure in the specimen chamber, in controlled environment conditions. These instruments were first published by myself in 1974, see reference below. (max pressure 5 torr). They were introduced commercially by ISI/Akashi in conjunction with ETP Semra in 1978. To the best of my knowledge, these references predate all other references. It is this work which has resulted in some 2,000 of these types of SEMs being sold, out selling ESEM by a factor of about 10.
One author has suggested Danilatos is the inventor of this technology. Below is a copy of an updated review of the development of SEM at high chamber pressures. You will see from it, my work predates all of his by several years. I am wondering if he ever read my papers. I believe this work pre-dates all other successful attempts at specimens in a SEM specimen chamber at high pressures.
A REVIEW OF THE DEVELOPMENT OF SCANNING ELECTRON MICROSCOPY AT HIGH CHAMBER PRESSURES
Ever since electron microscopes were developed, it has been the goal of microscopists to observe specimens in their natural state, free from artefacts which can often be introduced through specimen preparation. For most biological specimens, that includes the presence of water. With a pressure of 10exp-4 torr or lower required to operate a scanning electron microscope (SEM), liquid water, which required a pressure of above 5 torr, was clearly a problem.
Although several attempts had been made to examine hydrated specimens in a SEM, the first published results of water imaged in a stable and reproducible manner in the SEM, were presented at the Eighth International Congress on Electron Microscopy in Canberra in 1974 (Robinson, 1974). This represented an increase in the pressure capability of almost 5 orders of magnitude, from less than 10exp-4 torr, to 5 torr.
Separation of the 5 torr water vapour in the specimen chamber from the high vacuum in the electron optics column, was achieved by using a single differentially pumped aperture. Although attempts at using thin films for the separation had been made, they failed because they scattered the electrons too much, even though there was no absorption. (Perhaps that would not pose a problem with some of the thin window materials now available.) Calculations based upon Duschman (1949), showed that the pressure drop across a single 100mm aperture would enable a pressure of below 10exp-4 torr to be sustained in the gun region of the SEM, whilst a pressure of up to 10 torr was maintained in the specimen chamber, providing the pumping speed above the aperture was greater than 10 litre/sec.
Another problem to be overcome was how to form an image? The conventional Everhart-Thornley (E-T) secondary electron (SE) detector, required a pressure of less than 10-4 torr to operate. Specimen current imaging was not considered useful because ionisation of the gas molecules could interfere with the adsorbed current. It was decided to use a wide angle scintillator photomultiplier backscattered electron (BSE) detector (Robinson 1974b; 1975a). These detectors could give images with similar signal to noise and resolution as could be achieved with an E-T SE detector.
There was still one further problem to be overcome. How to reduce the path the electrons travelled through the higher pressure, and thus limit the beam scattering and associated loss of image detail? This required two steps; lowering the final aperture to reduce the distance the electrons had to travel; and lowering the temperature of the chamber to make sure the water vapour was never at a higher pressure. The description of the experimental arrangement used in a modified JEOL JSM 2 SEM, was described in greater detail in a few publications. By using a short, less than 5mm, working distance and a cooled specimen chamber, with the specimen surrounded by an ice and water reservoir, it was possible to produce some good images, up to x 2,000, of specimens containing liquid water (Robinson, 1975b; 1976a; 1976b).
This system enabled hydrated specimens to be examined at magnifications from x100 to x2000, with the water present in a stable liquid state. The leak rate of the water from the specimen chamber, approximately 10exp-3 torr litre/sec., was sufficiently slow that the specimen would remain hydrated for several hours. The use of a 100 micron aperture and the inability to alter the position of the cross over point of the scan coils, meant that the minimum magnification attainable was x100 times.
Whilst using this technique, it was noticed that all specimens viewed at chamber pressures above approximately 0.1 torr, were free from charging artefacts (Robinson, 1975c). The first explanation was that it was due to residual water in the specimen, rendering it slightly conducting. This was determined to be an inadequate explanation and a new one, in terms of ionisation of the residual gas molecules, was developed. Moncrieff et al (1978), calculated the effect of ionisation due to the incident beam, the BSEs, the charge build up on the specimen, the SEs accelerated by the charge buildup, the positive ions attracted to the specimen, the SEs released by the positive ions impinging upon the surface, and the cumulative effect of these further SEs producing more ions. They also measured these cumulative effects and showed that the elimination of charging artefacts was due almost exclusively to the ionisation mentioned above. Essentially, this established that as long as the gas could be ionised, which was a property of all gases, and the specimen could emit SEs and BSEs, which is a property of all solid and liquid specimens, it was possible to examine a specimen in a SEM, free from charging artefacts, at any accelerating voltage. Should an image still display some intensity fluctuation charging artefacts, it was merely necessary to increase the pressure of the residual gas. This increased the ionisation effect and charging would be eliminated every time.
One other problem was how much did the gas interfere with the electron beam? Moncrieff et al (1979) gave a very good dissertation of the amount of scattering of the electrons by the residual gas molecules. They calculated the elastic and inelastic scattering from nitrogen molecules, and compared the results with experimental observation They showed that following a single event, an electron would be scattered tens to thousands of microns from the original beam trajectory, and would contribute only to a background signal, which could be removed by subtracting away some of the DC signal level. Those electrons which had not been scattered would continue on to form a beam diameter which had the same Gaussian FWHM diameter as would have existed without any beam scattering. In other words, even if 90% of the electrons in the beam were scattered, the unscattered electrons would still form a beam with the same diameter as if there were no scattering. 90% beam scattering did not mean 90% reduction of resolution, it resulted only in minor a minor deterioration in attainable resolution.
By that stage, the results achieved had established parameters for high pressure SEMs. The next task was to extend the capability to the limits determinable from the knowledge. The results of Moncrieff et al. (1979), showed that as the pressure was increased, shorter path lengths between the final aperture and the specimen were necessary to keep beam scattering to minimum and thus form an usable image. For a pressure of 50 torr, this distance was less than 0.5mm, and 50 torr became the upper practical limit of SEM using this type of technology.
Even then, 50 torr posed great problems for a single differentially pumped aperture. For a pressure of 50 torr to be maintained on one side of a single aperture, with 10-4 torr on the other side, an aperture diameter of about 13 micron was required. This placed such a severe limitation on the minimum size of the specimen which could be examined, as to be of little practical use. To overcome this, it was necessary to have an intermediate pressure by using two differentially pumped apertures. Danilatos and Robinson (1979) constructed a system having this capability and showed that this was usable. A pressure of 50 torr was equivalent to saturated water vapour pressure at body temperature, plus a further partial pressure of over 10 torr, for such gases as oxygen and effectively made it possible to examine biological specimens in conditions which were close to those necessary to support cell motility.
By the end of 1979, researchers at The University of New South Wales, Sydney, Australia, led by myself, had developed the following capabilities towards imaging specimens under high vapour pressure conditions:-
a) Established differentially pumped apertures as adequate for pressure separation in an SEM. b) Established the parameters for the scattering of the electron beam by the residual gas molecules. c) Established an upper practical working pressure limit of 50 torr, with higher pressures producing too short a working distance requirement. d) Shown how the ionisation of the residual gas was responsible for the elimination of charging artefacts. e) Demonstrated the ability to form images of a wide variety of specimens under a wide variety of pressures, with and without hydration.
Neal and Mills (1980), built this type of system in a Cambridge Stereoscan MkII SEM and were able to obtain video images of the adsorption of water into sponge material, as well as other effects. Again, the pressure limitation of 5 torr meant that it had to be cooled. They gave an extended description of environmental SEM operating conditions. Similar results have also been achieved by others, for example Shah and Beckett (1979).
Having established the parameter for the capability to examine specimens at higher vapour pressures, the next step was to establish reasons for doing it. After all, at this time, most microscopists were intent to look at their specimens in a cleaner vacuum system and to suggest that there were advantages to be gained from going to higher pressures was going against known convention. However, it was the ability to look at insulating specimens at high, above 10kV, accelerating voltages, without charging artefacts which proved to be most valuable. This capability occurred at pressures of approximately 0.1 torr, for most working distances. The amount of beam scattering was generally less than 10%. As 0.1 torr was generally greater than the partial pressure of most oils and waxes at room temperature, this capability enabled these and most other out gassing specimens to be examined at voltages and currents suitable for X-ray analysis, without charging artefacts. This whole situation , including TEM, STEM and SEM controlled environment operation, was reviewed in 1984 (Robinson, 1984).
Interest in this capability was generated by ETP Semra Pty Ltd which, in 1978, manufactured a device which was initially called an environmental cell modification. This was later changed to Charge Free Anti-contamination System (CFAS). This device enabled the specimen chamber to be pumped by a rotary pump to a pressure controllable between 0.05 torr and 2 torr. The aperture remained a few mm inside the final lens and an image was formed by detecting backscattered electrons. Over one hundred of these were sold on Akashi/ISI SEMs. By 1980, Akashi integrated a CFAS into one of their SEMs and called the integrated system WET SEM. Over the next few years, they sold several hundred of these systems, mostly in Japan. Despite many years of my talking to the SEM manufacturers outside Japan, there was very little interest in building this type of instrument. As Akashi increased its market share by actively promoting this technique, the other major Japanese SEM manufacturers followed, JEOL with their LV (Low Vacuum) SEM and Hitachi with their N (Natural) SEM. Initially their sales were limited to the Japanese market, which was perceived as being different from other markets. However, with continued pushing by Mr Ruscica (Electron Detectors Inc) and myself on how these devices were promoted in Japan and how a similar approach could work in USA, sales started slowly in USA, but soon increased rapidly. AMRAY Inc realised the potential of this type of instrument and introduced their ECO (Environment COntrolled) SEM in 1993. Gresham Camscan introduced their EnVac SEM. When Leica and Zeiss amalgamated to form LEO, their first product was their VP (Variable Pressure) SEM. Philips introduced their CP (Controlled Pressure) SEM in 1996. RJ Lee Instruments Ltd has released their variable pressure SEM.
By 1996, the major SEM manufacturers had all released a SEM which had the capability to examine specimens in a controllable pressure environment in the specimen chamber of their SEM. For some SEM companies, it was noticed that their sales of tungsten filament SEMs were almost exclusively due to this type of SEM. These SEMs all used a single differentialy pumped final aperture inside the final lens as a pressure limiting aperture and a backscattered electron detector to collect a signal to form an image. Although exact sales of this type of microscope are not known, sales by ETP Semra Pty Ltd, of wide angle scintillator type BSE detectors to be included in SEMs of this capability exceed 1500. Not all of this type of SEM are fitted with a scintillator type BSE detector, and I am unaware of the sales of solid state detectors for this purpose. I will leave it to the imagination of your readers to determine how many of this type of SEM have been sold, but as a conservative guess, a figure of 2000 SEMs would not be unrealistic.
While this was occurring, Danilatos continued researching higher pressure capabilities, attempting to image at atmospheric pressure (1981). However, this pressure placed such a severe limitation on depth of focus and working distance that there was no further interest in that work. He also commenced work on a secondary electron (SE) detector capable of operating at higher specimen chamber pressures (Danilatos, 1983). Images obtained with this environmental SE detector have displayed approximately the same resolution capability as those obtained with an efficient BSE detector, from similar specimens.
Much work has been performed on the development of new types of electron guns, for example, the LaB6 and thermal and cold field emission, to obtain greater resolution and through that greater specimen information. The information gained from the ability to examine specimens in their natural state, while not as spectacularly demonstrable as the improvements to gun, is never the less making a quiet revolution to the information which can be achieved from the specimen. It will not be long, given a combination of the higher brightness electron gun and improvements to detector performance, before images from hydrated biological specimens will show as much detail as is currently achieved from dehydrated and gold coated specimens imaged with a conventional tungsten filament.
List of References:
Robinson V N E: A wet stage modification to a scanning electron microscope; Electron Microscopy/1974, Proc. 8th Int. Cong., Ed. J V Sanders and D J Goodchild, Aust. Acad. Sci., Canberra, Vol. 2 (1974a) pp 50 - 51.
Dushman S: Scientific foundations of vacuum technique; John Wiley and Sons, New York, Ch. 2 (1949).
Robinson V N E: The construction and uses of an efficient backscattered electron detector for scanning electron microscopy; J. Phys. E: Sci. Instrum., Vol. 7, pp 650 - 652 (1974b).
Robinson V N E: Backscattered electron imaging; Scanning Electron Micrscopy/1975, Symp. Proc., Ed. O Johari, IITRI, Chicago, (1975a) pp 51 - 60.
Robinson V N E: A wet stage modification to a scanning electron microscope; J. Microscopy, Vol. 103, pp 71 - 77 (1975b).
Robinson V N E: Scanning electron microscope environmental cells; Scanning Electron Micrscopy/1976, Vol. 1, Symp. Proc., Ed. O Johari, and I Corvin, IITRI, Chicago (1976a) pp 91 - 100.
Robinson V N E: The examination of hydrated biological specimens in a scanning electron microscope environmental cell; Electron Microscopy/1976, Proc. 6th Europ. Cong., Ed. Y Ben-Shaul, Tal International, Jerusalem, Vol 2 (1976b) pp 85 - 90.
Robinson V N E: The elimination of charging artefacts in the scanning electron microscope; J. Phys. E: Sci. Instrum., Vol. 8, pp 638 - 640 (1975c).
Moncrieff D A, Robinson V N E, Harris L B, Neutralisation of insulating surfaces in the scanning electron microscope, J. Phys. D: Appl. Phys. Vol. 12, pp 2315 - 2325 (1978).
Moncrieff D A, Barker P R, Robinson V N E: Electron scattering by gas in the scanning electron microscope; J. Phys. D: Appl. Phys., Vol. 12, pp 481 - 487 (1979).
Danilatos G D, Robinson V N E: Principles of scanning electron microscopy at high specimen chamber pressures; Scanning Vol. 2, pp 72 - 82 (1979).
Neal R J, Mills A Jr: Dynamic hydration studies in an SEM; Scanning, Vol. 3, pp 292 - 300 (1980).
Shah J S, Beckett A: A preliminary evaluation of moist environment ambient temperature scanning electron microscopy (MEATSEM); Micron, Vol. 10, pp 13 - 23 (1979).
Danilatos G D: Design and construction of an atmospheric or environmental SEM (Part 1), Scanning Vol. 4, 9 - 20 (1981).
Danilatos G D: A gaseous detector device for an environmental SEM; Micron and Microscopica Acta, Vol. 14, pp 41 - 52 (1983)
Robinson V N E: The examination of hydrated specimens in electron microscopes; in Echlin P, Analysis of organic and biological surfaces, John Wiley and Sons, New York.
Jim, now that you have read the dates of my work, don't you think these are somewhat ahead of those published by Danilatos? If you believe he single handedly invented the environmental microscope, please show me some dates of work which he has published which pre date my work.
As for some of his other statements. As can be seen from the above references, the early work on environemntal SEMs and looking at hydrated and live specimens was almost entirely the work of VNE Robinson and his crew and was largely finished by the time Danilatos joined my team on ARGS grant B75/15588. He was employed on ARGS funding obtained by myself from 3 January, 1978 until 30 June, 1981. My project under that grant was to increase the pressure to its limits and then apply it to biological applications. Together we extended the limit to 50 torr. At that stage Danilatos wished to extend the results to atmospheric pressure, while I considered that too impractical. As it was The University of New South Wales policy to let researchers try their project, he was allowed to explore his project on that grant. You will note that he did not acknowledge the receipt of any grant in his paper Danilatos GD An atmospheric scanning electron microscope, Scanning vol 3, 215 (1980).
100 papers and still under the age of 35! Perhaps he could like to list them all. "... he adapted an ancient JEOL SEM ..." In 1980, that JEOL JSM 2 was only 12 years old, well within the expcted active life of a SEM. It had been used by myself to look at liquid water since 1974. As for "science administrators who developed a penchant ...", they allowed him to take that SEM into his post University activities, an activity of which I do not think has been extended to anyone else. It certainly was not extended to myself when I left The University of New South Wales. Racism? The University of New South Wales had a long history of employing people from many different ethnic backgrounds. Professional jealousy? Gutlessness? Strong words! Poor judgement - well that fits someone we know.
For your information, there are about 2,000 variable pressure SEM systems sold through the world since their release by ISI/Akashi in conjunction with ETP Semra Pty Ltd in 1978. They were first called Environmental Cell Modifications (ECM), quiclkly followed by Charge Free Anti-contamination Systems (CFAS) and WET-SEM. They operated at pressures up to 2 torr, almost 5 orders of magnitude above the previous specimen chamber limit of {10exp-4 torr. These were commercialy available since 1978, before Danilatos even commenced publication. In 1974 the technology to build these to 5 torr was published, 5 years before Danilatos' first paper. Together Danilatos and I extended this pressure to 50 torr, with him working on a research grant I obtained. True, Danilatos did attempt atmospheric pressure, but he failed and 50 torr is the practical limit with todays technology. That is hardly the work of a lonely genius.
So what did Danilatos do to deserve the title of Father and Godfather of variable pressure SEMs?
1) First to image liquid water in a stable manner in an SEM? Not before Robinson in 1974. 2) First to image liquid water at room temperature? See Danilatos and Robinson reference above. 3) First to image at 50 torr specimen chamber pressure? See Danilatos and Robinson reference above? 4) First to image at atmospheric pressure? First to attempt - full marks for trying - but the results were not satisfactory and no one is interested in or extending the work. 5) First to commercialise SEM with high pressure in the specimen chamber. No! ISI/Akashi/ETP Semra in 1978, to a maximum pressure of 2 torr. 6) First to determine the effect of beam scatterering. See Moncreiff, Barker and Robinson (1979) reference cited above. 7) First to calculate the effect of ionisation and SE and BSE yield on charge elimination. See Moncreiff, Robinson and Harris (1978) reference cited above.
In 1978, the scientific work was extended to 5 torr and commercialisation of the product to 2 torr had already occurred. Those represent a minimum of four and almost five orders of magnitude increase in available pressure in a SEM specimen chamber. Danilatos worked with me to extend this to 50 torr, an increase of only one order of magnitude. He worked with ElectroScan to increase the commercial limit to 20 torr, again an increase of only one order of magnitude over ISI/Akashi's 2 torr in 1978.
8) Developed a Gaseous SE detector. His first US patent, No 4,823,006, dated April 18, 1989, is in the name of Danilatos and Lewis! It post dates by almost 2 years a patent application by JS Shah, the HH Wills Physics Laboratory, University of Bristol, GB patent No 2,186,737, dated 19 August, 1987, in which reference is made to
"... means for collecting the specimen current generated by the electron beam from the specimen, and biassing means for producing a substantial electric field at the surface of the specimen ..." (Claim 1)
All his own work?
".. other manufacturers make other, patent skirting variable pressure SEMs." ElectroScan's patent only applies to a gaseous secondary electron detector, not to differentialy pumped aperture systems or backscattered electron detectors, which were used in these applications years before ElectroScan was formed as a company. As mentioned earlier, over 2,000 of these have been sold world wide by more than six different companies, compared to about 200 ESEMs from ElectroScan. These 2,000 were done using a technology which extended the upper SEM chamber pressure by some five (5) orders of magnitude, using technology developed primarily by myself. ESEM has sold about 10% of that number and only increased the commercially available pressure capability by 1 to 1.5 orders of magnitude.
November 19, 1846 was a historic day for Carl Zeiss and microscopy. It was on that day that the precision mechanic, Carl Zeiss, officially opened his workshop in Jena, Germany. This was the beginning of microscope production by the firm, Carl Zeiss.
Today, November 19, 1996, we are honored to have Chancellor Helmut Kohl with us in Jena to help celebrate the 150th anniversary of our company. If you can come to Jena, we cordially invite all of our friends to join us in this celebration. We realize that most of you cannot be with us in Jena, and therefor to enable you to participate in this celebration, we are pleased to announce an Internet microscopy quiz contest open to all. If you answer all of the questions correctly, your name will be entered in a drawing to win a brass replica of a historical Zeiss microscope. The Internet address for this contest is:
http://www.zeiss.de/mi/competition_e/rules_e.htm
Entries must be received by April 18, 1997 and complete contest rules can be found at this site.
We planned from certain time to organize laboratory specifically for cryo-preparation different type of biological specimens for X-ray microanalysis. Specimens type and size varies depends of projects - from single cells from culture to bulk sample like part of seeds or thick cross-section from plant organs. We are routinely use the nuclear (proton) microprobe for quantitative elemental distribution in micro-area. The sensitivity of the nuclear microprobe allows to measure main and trace elements (to a level of few ppm) in the same time. All analysis are done in high vacuum and measured specimen must be completely dry. The preparation of sample must preserve elemental distribution without redistribution or lost of elements.
Suddenly it is a chance to obtain and spend quickly some money on needed equipment. We start just from the beginning because so far we use equipment from institution around.
We plan to buy freeze-drier, cryomicrotome, equipment for high pressure freezing and freeze-substitution. Because of administrative restriction we have to finalize it in relatively short period of time.
We, of course, contact agents and look into catalogues, but I am very interested in your and your colleagues experience. What are you using in your laboratory, what you could recommend, and which model one we should avoid rather. We would like to avoid the problems which others may have experienced. We are interested to purchase reliable high standard equipment.
Please respond to me directly, and if you wish I will keep all this comments confidential.
Thanks in advance for any comments and suggestions
Best regards
Jolanta Mesjasz-Przybylowicz ************************************************************************ Dr Jolanta Mesjasz-Przybylowicz National Accelerator Centre P.O. Box 72 Faure 7131 South Africa tel: 27-21-8433820 fax: 27-21-8433543 Internet: MESJASZ-at-nac.ac.za ************************************************************************
I am about to righr a check so Any comments as to this would help me out. Which One do I Buy?
David
} Hy Victor,
} did you ever used a LOMO Biolam microscope ?
} My references are Zeiss and Wild scopes and in my opinion the LOMOs are } optically equal. OK, the design is a left over from the 30s, with all } advantages and disadvantages.
} + you can adjust nearly everything } + real koehler illumination } + you can use the scope with a mirror (field use) } + it is extremely robust
} - you have to adjust everything } - needs a lot of space
} The main disadvantage is you don't have a factory preset illumination, so you } have to adjust the illumination yourself. Most biology students are not able to } do this, so they work with a nonadjusted illumination and get a bad picture. I } think that's the reason for the bad reputation of the LOMOs.
} So if you buy a LOMO invest at least two weeks in reading a good microscope } book and adjust the scope yourself. Once you have properly set up yor } microscope yourself, you achieve an excellent optically quality.
} } There is simply no comparison between the Leica DM LS and the Biolam. It's } } like comparing a matchbox to a Porsche.
} Leica DM LS = matchbox (first position in comparison) } Biolam = Porsche (second position in comparison)
} Another try:
} It's like comparing a fastfood menu to a real menu. :-)
} (I know Leica (is it Leitz-Cambridge or Leitz Camera ?) builds really good } scopes, so please don't overemphasize the above comparisons)
} Carsten Pitz
Carsten
Let me get this clear : you are saying the biolam is the porsche - that is better then the DMLS -a matchbox ? You are the first person to give this opinion - do you own one? I am about to buy the DMLS - not a bad scope compared to many - no plastic parts etc., but I could buf a biolam -L for 1/2 the cost of the leica with many more option?
I am currently rotary shadowing human eye lens capsule on mica sheets. The specimens are large and very difficult to remove from the mica. We are currently removing the replica using bleach. Can anyone suggest an alternate method of removal or support media? We would like to stay away from coverslips and hydrofluoric acid.
If you've used Pt/C to make your replicas, you might try chromic acid. Another suggestion would be to try an enzymatic approach. I've found that for some material enzymatic digests can beat the brute force of bleach and acid. HF will generally work with mica to detach replicas as well as digesting mica slurries used in quick-freeze deep-etch techniques. To just detach the specimen, you don't need more than 10% v:v conc HF solution, not too bad if you have a fume hood.
Good luck John Heckman Center for Electron Optics MSU
Does anyone have a copy of the manual for an ETP Semra Model PSM II Robinson Detector Electronics Control Module and the Robinson detector? I've inherited (temporarily) one of these in a malfunctioning state, and I'd like to get it working. But there's no manual. Phil
&&&&&&&&&&& Illigitmi non carborundum &&&&&&&&&&&
Philip Oshel *all mail:* Microscopy University of Illinois Station A Rm 74 Bevier Hall PO Box 5037 905 S. Goodwin Ave. Champaign, IL 61825-5037 USA Urbana, IL 61801 (217) 244-3145 oshel-at-ux1.cso.uiuc.edu (217) 355-1143 home
Does anyone know of a good source for an AC adapter for a Sanyo camera? I tried Newark Electronics and Allied Electronic and they don't carry this particular adapter (12V DC, 0.35 A).
I also have tried Sanyo Fisher Service Corp. out of New Jersey but they are very frustrating to communicate with. They cannot verify that the part they quoted me is actually of the proper amperage and voltage (all the quote says is "AC Adaptor").
If anyone knows of a source of Sanyo parts, or of specialized electronics that I can actually TALK to, I would very much appreciate it!
BTW, thanks very much to all those who responded to my question on image analysis equipment! You have helped me narrow down a few more choices, and given some good advice.
Thanks again,
Karen Zaruba ~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~ Life Sciences Sector Lab Reply: kszaruba-at-mmm.com 3M Company 3M Center 270-1S-01 Phone: 612-737-2971 St. Paul, MN 55144-1000 Fax: 736-1519
These opinions are my own and may not represent those of 3M.
philip oshel wrote: } } Does anyone have a copy of the manual for an ETP Semra Model PSM II } Robinson Detector Electronics Control Module and the Robinson detector? } I've inherited (temporarily) one of these in a malfunctioning } state, and I'd like to get it working. But there's no manual. } Phil } } &&&&&&&&&&& Illigitmi non carborundum &&&&&&&&&&& } } Philip Oshel *all mail:* } Microscopy } University of Illinois Station A } Rm 74 Bevier Hall PO Box 5037 } 905 S. Goodwin Ave. Champaign, IL 61825-5037 USA } Urbana, IL 61801 } (217) 244-3145 } oshel-at-ux1.cso.uiuc.edu } (217) 355-1143 home } } *********** looking for a job again ***********Philip, If you give me the serial number of your Robinson Detector I can help you out with a manual. You can reach me at ruscica-at-etp-usa.com or thru our web site at www.etp-usa.com. Regards, Robert Ruscica
You should try Radio Shack. They carry a wide range of AC adapters (usually called battery eliminators) for under $20. Many of their units have multiple plugs so that they can fit many devices. In the worst case, you can always cut off the existing plug and tie it to the new adapter.
Cheers, Henk
At 02:56 PM 11/19/96 -0600, you wrote: } Does anyone know of a good source for an AC adapter for a Sanyo camera? } I tried Newark Electronics and Allied Electronic and they don't carry this } particular adapter (12V DC, 0.35 A). } } I also have tried Sanyo Fisher Service Corp. out of New Jersey but they are } very frustrating to communicate with. They cannot verify that the part } they quoted me is actually of the proper amperage and voltage (all the quote } says is "AC Adaptor"). } } If anyone knows of a source of Sanyo parts, or of specialized electronics that } I can actually TALK to, I would very much appreciate it! } } BTW, thanks very much to all those who responded to my question on image } analysis equipment! You have helped me narrow down a few more choices, and } given some good advice. } } Thanks again, } } Karen Zaruba } ~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~ } Life Sciences Sector Lab Reply: kszaruba-at-mmm.com } 3M Company } 3M Center 270-1S-01 Phone: 612-737-2971 } St. Paul, MN 55144-1000 Fax: 736-1519 } } These opinions are my own and may not represent those of 3M. } } } } Hendrik O. Colijn colijn.1-at-osu.edu Campus Electron Optics Facility 116 W. 19th Ave. (614) 292-0674 "Nothing is as inevitable as a mistake whose time has come."
We have available for sale a Cambridge Stereoscan 250 Mark III microscope, equipped with an Image Store device, a one-year old BSE detector (4 quadrants from K.E. Developments) and a Link AN10000 EDX system (Be window, 10 mm2 detector). The whole instrument is about 10-11 years old but in good condition, the microscope having been under maintenance contract.
If you're interested, please contact me directly at :
SOLVAY Research and Technology Rue de Ransbeek 310 1120 Brussels Belgium phone : (32)(2)2643422 fax : (32)(2)2642055
e-mail : ghanem-solvay-at-e-mail.com
Cheers,
Antoine Ghanem
Extra X400 information begins: Originator Name: Antoine GHANEM Domain: BE/RTT/SOLVAY Message ID: 95039002116991/211341 MHS Sender: G=Antoine;I=AGM;S=GHANEM;O=NOHX400DEC;U1=AC;U2=NOH; IEA=184470 at IBMMAIL U3=LC-AN001;P=SOLVAY;A=RTT;C=BE;
Free Fmt Name: Antoine GHANEM Phone Number: 3422 G=INTERNET;S=INTERNET;P=IBMMAIL;A=IBMX400;C=GB; IEA=INTERNET at IBMMAIL Free Fmt Name: INTERNET INTERNET
Albershein P, Killias U. 1963. The use of bismuth as an electron stain for nucleic acids. J Cell Biol 17:93-103. Locke M, Huie P. 1977. Bismuth staining for light and electron microscopy. Tissue Cell 9:347-371. Brown GL, Locke M. 1978. Nucleoprotein localization by bismuth staining. Tissue Cell 10:365-388.
A more recent example is: Takeuchi IK, Takeuchi YK, 1990. Ethanol phosphotungstic acid and bismuth staining of spermatid nucleoli in mouse spermiogenesis. J Struct Biol 103:104-112.
I don't remember whether or not these are bismuth subnitrate.
A. Kent Christensen University of Michigan {akc-at-umich.edu}
-------------------------
On Tue, 19 Nov 1996, Grace Kennedy wrote:
} Can anyone out there provide the original reference describing the use of } bismuth subnitrate as an em stain?? Many thanks Grace } } }
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I have two references in my files:
Riva A; 1974; Journal de Microscopie 19:105-108. Ainsworth and Karnovsky; 1972; J. Histochem Cytochem 20:225-229.
I've used the Ainsworth & Karnovsky method to enhance ferritin in epoxy-embedded tissue sections, and it worked great.
Jane A. Fagerland, Ph.D. Dept. Microscopy and Microanalysis Abbott Laboratories Abbott Park IL
We are looking for a silver sputter target for a Ted Pella sputter unit (91000 Model 3). The target should be 57-60 mm wide and 'appropriately' thin. Ted Pella, Inc., could neither sell us one at a reasonable price (i.e. under $700) nor give us another source. Any help would be appreciated.
Daniel L. Callahan Mechanical Engineering and Materials Science Rice University
We currently have a Hitachi H9000NAR TEM available. The scope is a 300kV 1.8A HRTEM that has been under continuous service contract. It is in excellent condition, but is no longer needed for our programs. Asking price: $320,000
Henk Colijn colijn.1-at-osu.edu OSU Campus Electron Optics Facility ------------------------------------------------------------------- Prosperity is the blessing of the Old Testament; adversity is the blessing of the New. Francis Bacon, "Of Adversity."
In message {aeb8074a08021004d8da-at-[198.147.151.19]} Grace Kennedy writes: } Can anyone out there provide the original reference describing the use of } bismuth subnitrate as an em stain?? Many thanks Grace }
Grace, Here is one:
Ainsworth, S.K., Ito S., and Karnovsky, M.J. (1972). Alkaline bismuth reagent for high resolution ultrastructural demonstration of periodic-reactive sites. J. Histochem, Cytochem. 20, p. 995.
A bismuth stain kit, cat. # 11436, is available from Elcetron Microscopy Sciences. I believe this is a bismuth subnitrate kit.
Gib
Gib Ahlstrand, MMS Newsletter Editor Electron Optical Facility, University of Minnesota, Dept. Plant Pathology 495 Borlaug Hall, St. Paul, MN 55108 (612)625-8249 612-625-9728 FAX, giba-at-puccini.crl.umn.edu
"MICROSCOPY & MICROANALYSIS 96" in Minneapolis, Minnesota, Aug.11-15, 1996 Its over, but not forgotten, and it was a blast!
Robert Ruscica wrote: } } philip oshel wrote: } } } } Does anyone have a copy of the manual for an ETP Semra Model PSM II } } Robinson Detector Electronics Control Module and the Robinson detector? } } I've inherited (temporarily) one of these in a malfunctioning } } state, and I'd like to get it working. But there's no manual. } } Phil } } } } &&&&&&&&&&& Illigitmi non carborundum &&&&&&&&&&& } } } } Philip Oshel *all mail:* } } Microscopy } } University of Illinois Station A } } Rm 74 Bevier Hall PO Box 5037 } } 905 S. Goodwin Ave. Champaign, IL 61825-5037 USA } } Urbana, IL 61801 } } (217) 244-3145 } } oshel-at-ux1.cso.uiuc.edu } } (217) 355-1143 home } } } } *********** looking for a job again ***********Philip, } If you give me the serial number of your Robinson Detector I can help you } out with a manual. You can reach me at ruscica-at-etp-usa.com or thru our } web site at http://www.etp-usa.com. } Regards, } Robert Ruscica
We are working on an african green monkey (Vero) cell, but we don't have any success of staining them using standard Feulgen stain procedure. Does anyone have experience staining these cells? Your suggestion is also highly appreciated.
Best Regards,
Christopher L.C. Wang Dept. of Bio. Sci. Univeristy of Lethbridge Tel: (403) 329-2210 E-mail: wangl000-at-hg.uleth.ca
You might try exposing the replicas to acetic acid vapours. For releasing rotary shadowed replicas of molecular suspensions, we use 1% acetic acid (a small pool in a covered petri, with the mica in the bottom of a smaller petri contained within the larger petri) for about 30 minutes. ---------------------- Doug Keene DRK-at-shcc.org
We are interested in doing cross section TEM on metallic films grown on MgO= substrates. The films are Fe/Au and Fe/Ag multilayers. Given the= completely different mechanical and chemical properties of the films and= substrate, we are not sure of the best way to make cross section samples. = We believe that standard dimpling followed by ion milling at typical angles= and voltages would simply cause too much damage in the metal, although we= have not tried this as of yet. Would tripod polishing be a possibility? = (At present we do not have a tripod polisher, but we have one on order.) = Any suggestions would be welcome.
Sometimes there are threads that you should have saved, but just didn't. Someone called me the other day looking for a place to send her metal knives (LM wax sectioning) for sharpening. I recall that there was a discussion of this on the listserve not too long ago. If anyone has saved the thread or has a list of places that provide this service I would appreciate it very much if you would forward it to me. TIA. -- ================================================= Greg Strout Electron Microscopist, University Of Oklahoma e-mail: gstrout-at-ou.edu =================================================
The Materials Science Division at Argonne National Laboratory has an immediate postdoctoral opening for an electron microscopist with experience in materials problems of interest to the Materials Science Division emphasizing analysis of inert gases in waste storage glasses, radiation damage and analysis of phase transformation structures and kinetics by in situ TEM techniques. Excellent written and oral communication skills are required. Program summaries and research highlights for all Materials Science Division groups can be found at www.msd.anl.gov. Candidates should have received, within the past 3 years, a Ph.D. in Physics, Materials Science or related discipline, and are requested to send a resume, names of references, a statement of research interests, and copies of selected publications to Robert C. Birtcher, Materials Science Division, Argonne National Laboratory, Argonne, Illinois 60439. Questions can be addressed to Robert C Birtcher at (708) 252-4996, (708) 252-4798 (fax), or Birtcher-at-anl.gov.
Russell E. Cook Electron Microscopy Center for Materials Research Argonne National Laboratory 9700 South Cass Avenue MSD-212 Argonne, IL 60439 (630)252-7194 FAX: (630)252-4798
We are in the process of aquiring an energy dispersive analysis system for our TEM. One of our goals is to do elemental analysis on frozen hydrated ultrathin sections. From the reading I'm doing it appears that, because of the vulnerability of these sections to electron beam damage, it would be to our advantage to get an EDS system with a pulse processor that has the highest acquisition rate possible.
Am I off base with this assumption? I'd appreciate comments from persons with experience in this sort of thing (i.e. users, not vendors) that may help us in the decision-making process. Please e-mail directly to me.
Thanks in advance, Heather Owen
Heather A. Owen, Director Electron Microscope Laboratory Department of Biological Sciences University of Wisconsin - Milwaukee (414)229-6816
The New England Society for Electron Microscopy presents their 30th Annual Fall Symposium and Seminar Dates: December 6th and 7th, 1996 Location: Tara Ferncroft Conference Center, 50 Ferncroft Road, Danvers, MA [(508)777-2500 for hotel reservations only].
PROGRAM FRIDAY, DECEMBER 6, 1996
12 noon-----Registration and Welcome
1pm-----"Nanometer Scale Spectrum-Imaging of Interfaces: Seeing Chemical Bonds and Understanding Materials Properties" to be presented by Dr. John Bruley, Dept of Materials Science and Engineering at Lehigh University
1:45pm-----"Confocal Microscopy: Present Capabilities and Future Challenges" to be presented by Dr. Jim Pawley, and MSA/LAS-sponsored speaker from the University of Wisconsin
2:30pm-----"Digital Imaging in Electron Microscopy and Its Applications to Remote Instrument Operation and TelePresence Microscopy" to be presented by Dr. Lawrence F. Allard from the High Temperature Materials Lab at Oak Ridge National Laboratory
3:15pm-----Coffee Break
3:45pm-----"Imaging Muscle: From 3-D to 2-D and Back Again" to be presented by Dr. Margaret Ann Goldstein, President of MSA, from Baylor College of Medicine.
NESEM's Annual Business Meeting will open at 5pm, followed by our 30th Anniversary celebration Reception and Dinner.
8:15pm-----"Image Colorzation and 3-D Effects to be presented by Dr. Robert Anderhalt from Philips Electronic Instruments Co.
SATURDAY, DECEMBER 7, 1996 Image Processing Seminar
Dr. John Friel and Dr. Eddie Prestridge will present a seminar on image processing and analysis relative to its use in light and electron microsscopy. Some of topics included are: What the computer perceives in an image; Pixels, what are they and how big are they; Common image processing functions; and Image processing and analysis, is there a difference?
9am-----Image Processing Seminar
9:50am-----Commercial Exhibition
10:20am------Image Analysis Seminar
11:35am-----Vendor Interactive: Participants are encouraged to bring their favorite stored image. Image-processing programs and equipment will be available for trial.
1pm-----Seminar Adjourns
NEW MEMBERS WELCOME!
To register, contact L. Kirstein at tel: 508-473-9673 or E-mail: 104365.3522-at-compuserve.com. (Mark message: NESEM 30th Registration)
Reply to: RE} looking for Ag sputter-target source
Silver is reasonably easy to deposit on glass, as is done in making mirrors, and I believe it is also readily deposited by electroplating. Any chance you could get what you need by depositing a layer of silver on a piece of brass shim stock, or something like that??? Good luck, Bigelow-at-umich.edu
--------------------------------------
We are looking for a silver sputter target for a Ted Pella sputter unit (91000 Model 3). The target should be 57-60 mm wide and 'appropriately' thin. Ted Pella, Inc., could neither sell us one at a reasonable price (i.e. under $700) nor give us another source. Any help would be appreciated.
Daniel L. Callahan Mechanical Engineering and Materials Science Rice University
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At 2:47 PM 11/7/96 -0500, larry hawkey wrote: } We have Reichert Ultra cut E, Reichert knife breaker, (Really LKB with } Reichert logo) and a LKB auto stainer (for grids). We have shut down our } EM lab and my boss is thinking about selling them. Duke surplus has to } apraise them, but these guys don't really know what these things might be } worth. Does any one want to give me a guess as to what they might be } worth? All are about 6 years old and are working. When we sold the scope } there didnot seem to be much of a market, although, we did eventually sell } it. Is it amy better for microtomes and other lab stuff? } } I thank you in advance for any helpful information. } } larry hawkey } Former Electron Microscopist } Department of Neurobiology } Duke University } } Larry Hawkey } hawkey-at-neuro.duke.edu } Department of Neurobiology } Duke University
Larry, I am interested in learning what your surplus department sets as the price---I saw another 5 years ago (13+years old) for $12-$15K. Rosemary
POSITION: RESEARCH ASSISTANT/RESEARCH FELLOW LEVEL A
We require an experienced person to set up and manage a new multi- institution confocal facility at Monash University, to be shared with groups from the Victoria University of Technology and CSIRO, located in the Department of Ecology and Evolutionary Biology. The facility will include both upright and inverted microscopes plus a stand-alone image analysis workstation.
Experience in use and maintenance of confocal microscope hardware and software is essential. Experience in a broad range of confocal applications in biology is highly desirable, so that the appointee could assist users in selecting the best technique for their particular project, and bring new applications to their notice on a regular basis. Familiarity with 3D reconstruction and image analysis applications is also desirable.
The position is available for one year in the first instance, commencing between 1 February and 1 March, 1997, at a starting salary of $30,130 to $40,889 ($38,092 minimum with PhD) depending on experience. During 1997, users will require training in use of the microscope, and management protocols will be established. The appointee will be part of a small management committee representing the major user groups.
For further details, contact Dr. David Smyth, Department of Genetics and Developmental Biology, email David.Smyth-at-sci.monash.edu.au, ph. 61-3-9905-3861, fax 61-3-9905-5537 or Dr. Rosemary White, email r.g.white-at-sci.monash.edu.au.
Please send applications, including CV and names of three referees, to Ms. Annabel Carle, Department of Ecology and Evolutionary Biology, Monash University, Clayton, Victoria 3168, Australia.
Closing date for applications is 27 December, 1996.
Rosemary White Department of Ecology and Evolutionary Biology Monash University, Clayton, Victoria 3168, Australia phone 61-3-9905 5670 email r.g.white-at-sci.monash.edu.au fax 61-3-9905 5613 or rgwhite-at-vaxc.cc.monash.edu.au
} Good Day all: } } We are looking for a silver sputter target for a Ted Pella sputter unit } (91000 Model 3). } The target should be 57-60 mm wide and 'appropriately' thin. Ted Pella, } Inc., could neither sell us one at a reasonable price (i.e. under $700) nor } give us another source. Any help would be appreciated. } } Daniel L. Callahan } Mechanical Engineering and Materials Science } Rice University } } dlc-at-rice.edu } (713) 527-8101 x3572 } http://www.owlnet.rice.edu:80/~dlc/
How about silver coins? I don't know if there are any that have high enough purity - you might need to find some old ones.
Regards,
--------------------------------------------------------------- Dr L. P. Stoter Technical Editor, MICROSCOPY & ANALYSIS Technesis 17, Rocks Park Road email: LPS-at-teknesis.demon.co.uk Uckfield, E. Sussex Phone: +44 (0)1825 766911 TN22 2AT Fax: +44 (0)1825 766911 United Kingdom ---------------------------------------------------------------
The Ted Pella #91000 Model 3 sputter coater was a Polaron E5000 coater in a private label box. We (Energy Beam Sciences) are the exclusive U.S. distributors for Polaron and we stock consumables and spare parts for this, and all other Polaron equipment.
The correct target is a 57mm diameter foil, and silver is one of the available target materials.
Best regards, Steven E. Slap, Vice-President ******************************** Energy Beam Sciences, Inc. Adding Brilliance To Your Vision ebs-at-ebsciences.com http://www.ebsciences.com/ ********************************
Hi, we are trying to analyze the distribution of PECAM-1 in the junctions of endothelial cells using TEM immunogold labelling. We are thinking of scanning the negatives onto the computer screen, input the gold particles using a mouse, and build a graph of gold particles in relation to the position of the junctions (apical to basal). We would like to know: 1). What type of scanner we can use? 2). What type of software are available for this kind of work? 3). Any better methods? Thanks.
Xia Chen Laboratory of Cellular Physiology and Immunology Rockefeller University Tel.(212)327-7985 chenxi-at-rockvax.rockfeller.edu
} Sometimes there are threads that you should have saved, but just didn't. } Someone called me the other day looking for a place to send her metal } knives (LM wax sectioning) for sharpening. I recall that there was a } discussion of this on the listserve not too long ago. If anyone has } saved the thread or has a list of places that provide this service I } would appreciate it very much if you would forward it to me. TIA. } -- } ================================================= } Greg Strout } Electron Microscopist, University Of Oklahoma } e-mail: gstrout-at-ou.edu } ================================================= }
We send our cryostat knives to Otto Anklam Co., 4824 East 42nd Street, Minneapolis, Minn. 55406 for resharpening. Don't have his number handy, but I'm sure information can supply it for you. I'd call for pricing, and to discuss the use of the resharpened knife. He changes the sharpening angle to suit the application.
Message-Id: {199611211741.MAA15077-at-ns1.axs2000.net} To: "microscopy-at-sparc5.microscopy.com" {microscopy-at-Sparc5.Microscopy.Com}
Hi, Please note that I do not know how to close the account that you continue to send to that is no longer valid: zullos-at-dirpc.nimh.nih.gov. Thanks, Steve Zullo zullo-at-helix.nih.gov
Message-Id: {199611211441.JAA14510-at-ns1.axs2000.net} To: MICROSCOPY BB {Microscopy-at-Sparc5.Microscopy.Com}
Microscopists,
A collegue is looking for commercial sources of heated stages for an optical microscope using transmitted light. He would like a cell that can accept a sample up to 2 cm x 1 cm.
Please respond directly to him: David Johnston OSRAM SYLVANIA INC. 71 Cherry Hill Dr. Beverly, MA 01915 e-mail: johnston-at-rd.sylvania.com
Thanks
------------------------------------------------- Harold J. Crossman OSRAM SYLVANIA INC. Lighting Research Center 71 Cherry Hill Dr. Beverly, MA 01915 Phone: (508) 750-1717 E-mail: crossman-at-rd.sylvania.com
Our web sites: www.sylvania.com www.siemens.com --
Heather, I am afraid that the best pulse processor in the world will not help with the problem of EDS analysis of frozen hydrated ultrathin sections. It would be rare to exceed 2000 counts per second from a thin biological specimen. The real problem is the interaction of the beam with the water in your specimen. At the beam currents necessary to get 2000 counts, the hydrated specimen lasts for about 5-10 seconds if you are lucky. The only alternative is to freeze dry your specimen in the microscope (-90C for 15 to 30 minutes) and then you can do x-ray analysis on the specimen after it is "dry".
} We are in the process of aquiring an energy dispersive analysis system } for our TEM. One of our goals is to do elemental analysis on frozen } hydrated ultrathin sections. From the reading I'm doing it appears that, } because of the vulnerability of these sections to electron beam damage, } it would be to our advantage to get an EDS system with a pulse processor } that has the highest acquisition rate possible. } } Am I off base with this assumption? I'd appreciate comments from persons } with experience in this sort of thing (i.e. users, not vendors) that may } help us in the decision-making process. Please e-mail directly to me. } } Thanks in advance, } Heather Owen } } Heather A. Owen, Director } Electron Microscope Laboratory } Department of Biological Sciences } University of Wisconsin - Milwaukee } (414)229-6816
Herb Hagler, Ph.D. Director of Computer-Assisted Instruction for Southwestern Medical School UT Southwestern Medical Center Dallas, TX 75235-9072 New Email Address: herb.hagler-at-email.swmed.edu http://pathcuric1.swmed.edu/ (214)648-3890 Fax(214)648-3925 ---------------------------------------------- "any sufficiently advanced technology is indistinguishable from magic" Arthur C. Clarke ----------------------------------------------
} } We are looking for a silver sputter target for a Ted Pella sputter unit } } (91000 Model 3). } } How about silver coins? I don't know if there are any that have high enough } purity - you might need to find some old ones. } Dear Larry, The pre-1965 US silver coins are 90%, the 1965-1968 half-dollars are 30%. It's better to get silver lumps or wire. YMMV for other countries. Yours, Bill Tivol
I don't do TEM, but I think the wrong question was asked. The issue is what beam current would be good for your other analytical needs and how much damage would it do to the sample. If the beam current you use for other reasons saturates the EDS system, then you would want a system that could handle all the x-ray's coming its way.
However, I think the normal situation is that the current has to be cranked up to get enough x-rays for a decent analysis. Therefore you would want a system that gives you the highest solid angle in order to give you the highest output. That probably translates into a 30 mm^2 detector positioned as close to the sample as possible. That might well vary among manufacturers.
I think the pulse processing features of any system on the market would probably handle the throughput you will encounter. You will get some more counts with the newest electronics, but the improvement would likely be incremental compared to the collection angle. But I suppose a real TEM user would have to confirm that.
At 02:12 PM 11/20/96 -0600, you wrote: } We are in the process of aquiring an energy dispersive analysis system } for our TEM. One of our goals is to do elemental analysis on frozen } hydrated ultrathin sections. From the reading I'm doing it appears that, } because of the vulnerability of these sections to electron beam damage, } it would be to our advantage to get an EDS system with a pulse processor } that has the highest acquisition rate possible. } } Am I off base with this assumption? I'd appreciate comments from persons } with experience in this sort of thing (i.e. users, not vendors) that may } help us in the decision-making process. Please e-mail directly to me. } } Thanks in advance, } Heather Owen } } Heather A. Owen, Director } Electron Microscope Laboratory } Department of Biological Sciences } University of Wisconsin - Milwaukee } (414)229-6816 } } } } ---------------------------------------------------- Warren E. Straszheim 270 Metals Development, Ames Lab/ISU, Ames IA, 50011 Phone: 515-294-8187 FAX: 515-294-3091
I don't do TEM, but I think the wrong question was asked. The issue is what beam current would be good for your other analytical needs and how much damage would it do to the sample. If the beam current you use for other reasons saturates the EDS system, then you would want a system that could handle all the x-ray's coming its way.
However, I think the normal situation is that the current has to be cranked up to get enough x-rays for a decent analysis. Therefore you would want a system that gives you the highest solid angle in order to give you the highest output. That probably translates into a 30 mm^2 detector positioned as close to the sample as possible. That might well vary among manufacturers.
I think the pulse processing features of any system on the market would probably handle the throughput you will encounter. You will get some more counts with the newest electronics, but the improvement would likely be incremental compared to the collection angle. But I suppose a real TEM user would have to confirm that.
At 02:12 PM 11/20/96 -0600, you wrote: } We are in the process of aquiring an energy dispersive analysis system } for our TEM. One of our goals is to do elemental analysis on frozen } hydrated ultrathin sections. From the reading I'm doing it appears that, } because of the vulnerability of these sections to electron beam damage, } it would be to our advantage to get an EDS system with a pulse processor } that has the highest acquisition rate possible. } } Am I off base with this assumption? I'd appreciate comments from persons } with experience in this sort of thing (i.e. users, not vendors) that may } help us in the decision-making process. Please e-mail directly to me. } } Thanks in advance, } Heather Owen } } Heather A. Owen, Director } Electron Microscope Laboratory } Department of Biological Sciences } University of Wisconsin - Milwaukee } (414)229-6816 } } } } ---------------------------------------------------- Warren E. Straszheim 270 Metals Development, Ames Lab/ISU, Ames IA, 50011 Phone: 515-294-8187 FAX: 515-294-3091
POSITION: RESEARCH ASSISTANT/RESEARCH FELLOW LEVEL A
We require an experienced person to set up and manage a new multi- institution confocal facility at Monash University, to be shared with groups from the Victoria University of Technology and CSIRO, located in the Department of Ecology and Evolutionary Biology. The facility will include both upright and inverted microscopes plus a stand-alone image analysis workstation.
Experience in use and maintenance of confocal microscope hardware and software is essential. Experience in a broad range of confocal applications in biology is highly desirable, so that the appointee could assist users in selecting the best technique for their particular project, and bring new applications to their notice on a regular basis. Familiarity with 3D reconstruction and image analysis applications is also desirable.
The position is available for one year in the first instance, commencing between 1 February and 1 March, 1997, at a starting salary of $30,130 to $40,889 ($38,092 minimum with PhD) depending on experience. During 1997, users will require training in use of the microscope, and management protocols will be established. The appointee will be part of a small management committee representing the major user groups.
For further details, contact Dr. David Smyth, Department of Genetics and Developmental Biology, email David.Smyth-at-sci.monash.edu.au, ph. 61-3-9905-3861, fax 61-3-9905-5537 or Dr. Rosemary White, email r.g.white-at-sci.monash.edu.au.
Please send applications, including CV and names of three referees, to Ms. Annabel Carle, Department of Ecology and Evolutionary Biology, Monash University, Clayton, Victoria 3168, Australia.
Closing date for applications is 27 December, 1996.
Rosemary White Department of Ecology and Evolutionary Biology Monash University, Clayton, Victoria 3168, Australia phone 61-3-9905 5670 email r.g.white-at-sci.monash.edu.au fax 61-3-9905 5613 or rgwhite-at-vaxc.cc.monash.edu.au
Message-Id: {199611220241.LAA12994-at-mail.mimj.co.jp} X-Sender: chiba-at-mail.mimj.co.jp X-Mailer: Macintosh Eudora Pro Version 2.1.3-J Mime-Version: 1.0 Content-Type: text/plain; charset="ISO-2022-JP"
Hi. I'm a total novice to microscopy. And I decided to join this ML because I now have to work on microscope manuals (Japanese-English translation).
Could anyone answer my question as follows?
When a phase-contrast condenser has 3 types of built-in ring slits (annuli), how do you select one suitable for the mounted objective? You just turn the turret, set it to the required position, and one of the ring slits is selected? Or is there any other means to do it?
TIA.
PS. Is it correct to call the annulus "ring slit" anyway? Looks like that's the way my client calls it.
Chiba Atsushi ---------------------------------------- Surname: Chiba Sex: Male Snailmail: MIM, 2-19-3 Sasazuka, Tokyo 151 Site: http://www.mimj.co.jp ----------------------------------------
Message-Id: {199611220604.PAA13754-at-mail.mimj.co.jp} X-Sender: chiba-at-mail.mimj.co.jp X-Mailer: Macintosh Eudora Pro Version 2.1.3-J Mime-Version: 1.0 Content-Type: text/plain; charset="ISO-2022-JP"
Hi. I'm a total novice to microscopy. And I decided to join this ML because I now have to work on microscope manuals (Japanese-English translation).
Could anyone answer my question as follows?
When a phase-contrast condenser has 3 types of built-in ring slits (annuli), how do you select one suitable for the mounted objective? You just turn the turret, set it to the required position, and one of the ring slits is selected? Or is there any other means to do it?
TIA.
PS. Is it correct to call the annulus "ring slit" anyway? Looks like that's the way my client calls it.
Chiba Atsushi ---------------------------------------- Surname: Chiba Sex: Male Snailmail: MIM, 2-19-3 Sasazuka, Tokyo 151 Site: http://www.mimj.co.jp ----------------------------------------
Message-Id: {1.5.4.32.19961122075230.0069c590-at-mailhost.ultra.net.au} X-Sender: pns-at-mailhost.ultra.net.au X-Mailer: Windows Eudora Light Version 1.5.4 (32) Mime-Version: 1.0 Content-Type: text/plain; charset="us-ascii"
At 17:22 21/11/96 -0500, you wrote: } } } We are looking for a silver sputter target for a Ted Pella sputter unit } } } (91000 Model 3). } } } } How about silver coins? I don't know if there are any that have high enough } } purity - you might need to find some old ones. } } } Dear Larry, } The pre-1965 US silver coins are 90%, the 1965-1968 half-dollars } are 30%. It's better to get silver lumps or wire. YMMV for other countries. } Yours, } Bill Tivol ******************************** The place to look for silver disks is a manufacturing jeweller wholesaler. They could be found in Yellow Pages or trade indices. Tell them what you are after and they make it. Cost of silver is cheap when compared with gold and the manufacturing charge should not be high either. I trust the target is not wanted for making mirrors. Large mirrors are made with silver solutions, but evaporated Al makes much better optical mirrors. We have a long standing offer to give away some high purity Al wire with orders. Cheers Jim Darley
Probing & Structure (Microscopy Supplies & Accessories) PO Box 111, Thuringowa QLD 4817 Australia
Phone +61 77 740 370 Fax: +61 77 892 313 A great microscopy site: http://www.ultra.net.au/~pns/
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At 08:02 21/11/96 -0600, you wrote: } Heather, } I am afraid that the best pulse processor in the world will not help with } the problem of EDS analysis of frozen hydrated ultrathin sections. It } would be rare to exceed 2000 counts per second from a thin biological } specimen. The real problem is the interaction of the beam with the water } in your specimen. At the beam currents necessary to get 2000 counts, the } hydrated specimen lasts for about 5-10 seconds if you are lucky. The only } alternative is to freeze dry your specimen in the microscope (-90C for 15 } to 30 minutes) and then you can do x-ray analysis on the specimen after it } is "dry". Herb Hagler } } } We are in the process of aquiring an energy dispersive analysis system } } for our TEM. One of our goals is to do elemental analysis on frozen } } hydrated ultrathin sections. From the reading I'm doing it appears that, } } because of the vulnerability of these sections to electron beam damage, } } it would be to our advantage to get an EDS system with a pulse processor } } that has the highest acquisition rate possible. } } } } Am I off base with this assumption? I'd appreciate comments from persons } } with experience in this sort of thing (i.e. users, not vendors) that may } } help us in the decision-making process. Please e-mail directly to me. } } } } Thanks in advance, } } Heather Owen ************************************** Herb is quite right. Additionally, EDS has a detection limit of about 0.1%. This increases by an order of magnitude when the water is gone. Sure, the percentages are only relative indicators of elemental concentrations in an biological system, but they are more likely to remain relative in dry sections than in the hydrated state, with unknown water losses. Cheers Jim Darley Probing & Structure (Microscopy Supplies & Accessories) PO Box 111, Thuringowa QLD 4817 Australia
Phone +61 77 740 370 Fax: +61 77 892 313 A great microscopy site: http://www.ultra.net.au/~pns/
Hi! I've been monitoring this listsever for sometime and can't remember seeing any AFM discussions. So if there are other AFM users out there, I would like to find out if anyone has been successful using the probe microscope to do hardness measurements on polymeric films. I have tried to get reproducible data and have been unsuccessful.
We are searching an used SEM for received it in donation .The SEM will be used for Research and Education in our School. Please, we need know the model, year of fabrication, possibility of work,and other information available. WE PAY ALL THE COSTS OF SHIPMENT. Please, contact me for any questions.
E-mail : RNBALDUC-at-arcide.edu.ar
Address:
Fernando Balducci Laboratory of Electron Microscopy School of Bioengineering. National University of Entre Rios. C.C 57 Suc 3 Parana - Entre Rios Argentina.
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I am setting up a data archival system for digitally captured/scanned TEM negatives and have evaluated a few currently available image archival softwares. I welcome comments/experiences of those who have or are in the process of implementing such a system.
Message-Id: {199611221406.JAA13313-at-post-ofc01.srv.cis.pitt.edu} To: "microscopy-at-microscopy.com" {microscopy-at-Sparc5.Microscopy.Com}
Hi Everyone! To save money (sound familiar), we have recently placed a horizontal EDS detector on an ESEM (Electroscan E-3) from an old 'scope. The optimum geometry for the ESEM is not horizontal but a detector with a 30 degree snout and use of their long working distance detector. It would be difficult to tilt the sample 30 degrees because of the very short working distance with that detector. I am curious if there are other users out there who are working with horizontal detectors in their ESEM's. If so, please contact me at GaroneL-at-Polaroid.com
We have recently noticed that the ceramic portion of our tungsten filament units often have a discolouration around at least one of the pegs to which the tungsten is attached. This occurs in the form of grey or brown circle patterns around the base of the peg. Our service representative suggests that we may want to go to using new filaments vs. rebuilt units as the rebuilt units have a reputation for problems. We do not have a vacuum meter on the scope though from the cleanliness of the gun chamber we believe that there has been adequate vacuum in the area. What are the experiences out there regarding the rebuilt units?
Wayne England wengland-at-ortech.on.ca ORTECH Mississauga, Ontario
To all interested parties, I have decided to list a shorter less detailed description of the confocal and deconvolution demos we had here at Johns Hopkins Med School this past summer. I run a multi-user facility for the Hopkins academic community so we were able to test a variety of samples and imaging needs. We looked at three confocal and two deconvolution systems. Most users were impressed with all the systems, so we had to really nit-pick to choose the right one. Over all the confocal systems faired better than the deconvolution systems. This was based on final image output and acquisiton speed. The decons were quite nice with live material but the consensus was that PMT's did better than the CCD's. We finally chose the Noran Oz system with the deconvolution option. This system gave the best 3D graphics (its on an SGI) and did the least laser damage to live cells (The AOD instead of Galvo's for laser excitation gave the fastest scan speeds). The xy resolution~0.4 um and xz~0.5 um (0.4 after deconvolution). We went with a Krypton/Argon and red HeNe. If anyone wants a more detailed comparison I will fax my original summary (no companies please). This is based upon my personal experience with the demos, and I am not receiving any compensation or gifts from any of the companies.
Hi I want to try something with NIH image, and I don't have a Mac with internet access, so I downloaded nihimage160_68.hqx via my PC. But stuffit won't extract the program (either using a friend's Mac or using the demo version of Executor 2.0 on my PC).
Is there something about downloading .hqx files to a PC that causes this? Is there anything I can do that will allow this to work, short of finding a Mac with internet access?
And incidentally, is Executor 2.0 still a good choice for a Mac emulator for running the current version of Image on a PC?
Thank you very much Richard_Thrift-at-Depotech.com
} Hello all, } } We have recently noticed that the ceramic portion of our tungsten filament } units often have a discolouration around at least one of the pegs to which } the tungsten is attached. This occurs in the form of grey or brown circle } patterns around the base of the peg. Our service representative suggests } that we may want to go to using new filaments vs. rebuilt units as the } rebuilt units have a reputation for problems. We do not have a vacuum meter } on the scope though from the cleanliness of the gun chamber we believe that } there has been adequate vacuum in the area. What are the experiences out } there regarding the rebuilt units? } } Wayne England
I have to agree that there are problems with rebuilt filaments. I have noticed shorter lives and more difficults getting good saturation and alignments. The latter two from variations in the mounting of the new filament wires on the pegs, and perhaps the solder joints. Rebuilt filaments also seem to drift more when new, and near the end of their lives. Phil
&&&&&&&&&&& Illigitmi non carborundum &&&&&&&&&&&
Philip Oshel Microscopy Station A PO Box 5037 Champaign, IL 61825-5037 USA (217) 244-3145 days oshel-at-ux1.cso.uiuc.edu (217) 355-1143 home
A friend of mine has a web page with two programs that may come in handy. The URL is http://www.wsu.edu:8080/~mic/
Going to "Updates" there is a list of goodies, two of which are unstuffit and binhex programs for PC's (for files that were originally on a Mac). This may help, but I haven't tried them so I can't guarantee.
If nothing else, my friend will be excited that someone besides he and I accessed his web page!
Cheers,
John Vetrano _______________________________________________________________________________
Hi I want to try something with NIH image, and I don't have a Mac with internet access, so I downloaded nihimage160_68.hqx via my PC. But stuffit won't extract the program (either using a friend's Mac or using the demo version of Executor 2.0 on my PC).
Is there something about downloading .hqx files to a PC that causes this? Is there anything I can do that will allow this to work, short of finding a Mac with internet access?
And incidentally, is Executor 2.0 still a good choice for a Mac emulator for running the current version of Image on a PC?
Thank you very much Richard_Thrift-at-Depotech.com
} } We have recently noticed that the ceramic portion of our tungsten filament } units often have a discolouration around at least one of the pegs to which } the tungsten is attached. This occurs in the form of grey or brown circle } patterns around the base of the peg. Our service representative suggests } that we may want to go to using new filaments vs. rebuilt units as the } rebuilt units have a reputation for problems. We do not have a vacuum meter } on the scope though from the cleanliness of the gun chamber we believe that } there has been adequate vacuum in the area. What are the experiences out } there regarding the rebuilt units? } Dear Wayne, We have used rebuilt tungsten filaments without problems. We got them from Energy Beam Sciences (I have no financial interest in EBS; I'm just a customer). We have gotten up to several hundred hours of stable beam from these filaments--as good as from new ones. Good luck. Yours, Bill Tivol
The MSA has a committee that has been active in developing educational programs on all kinds of microscopy, perhaps they could give you some ideas. I believe the current committee chair is JoAn Hudson at Clemson University (hjoan-at-clemson.clemson.edu).
--------------------------------------
Hi folks:
I have been asked for to help design an "interactive exhibit" which demonstrates in a fairly low tech way how glass is used in optics..... This is part of a large exhibit on the history of glass making in pittsburgh (believe it or not, historically one of the glass making capitals in the US) . The interactive should be simple to understand and FUN.... Your ideas on content and interactives would be appreciated.
I look forward to being swamped with suggestions and themes
Thanks
Simon
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Hello all,
The First Annual Course on 3D Microscopy of Living Cells was held last summer at the University of British Columbia, in Vancouver, Canada. Twenty-eight students got together with eleven, 3D microscopy setups and a faculty of over 20 and we all really learned a lot in eight days. As a result, we are going to do it again and a complete description is attached below.
The main differences from last year will be
- More time (10 days vs. 7.5) with the extra time given to imaging theory, time-lapse recordings and use of live-cell chambers.
- Different program of lab projects: 5 living-cell projects will be spread over 8 setups on 4 afternoons.
- A separate 3-day Workshop, after the course, concentrated on Computer Image processing for measurement and display of 3D data sets.
- Different month, June 19-29 rather than end on July.
Things that will stay the same:
- Focus on group teaching in interest-groups of three or four.
- Selective registration based on detailed application forms.
- "Bring-your-own" live-cell project to be done in evening sessions with assistance from the course faculty.
- Presentations of group results on the last morning.
More complete information follows,
Thanks,
Jim Pawley
____________
Announcing a 10-Day Short Course on
3D Microscopy of Living Cells
June 19 - 29, 1997
and NEW post-course workshop on
3D Image Processing June 30- July 2
in association with the BioSciences Microscopy Facility and the Department of Computer Science University of British Columbia Vancouver, BC, Canada
Organized by Prof. James Pawley University of Wisconsin-Madison APPLICATIONS
Applicants will complete a questionnaire to assess knowledge level and field of interest. Enrollment will be limited to about 20 participants. Selection will be made on the basis of background and perceived need. Those without previous LM experience will be provided with basic texts to read before the course begins. Application packages may be obtained from:
Prof. James Pawley, Rm. 1235, 1500 Johnson Dr., Madison, WI, USA 53706. Phone: 1-608-263-3147, Fax 1-608-265-5315, Email: jbpawley-at-facstaff.wisc.edu
or more readily from: http://www.cs.ubc.ca/spider/ladic/course/bulletin.html
Application deadlines:
Application forms requesting information on field of interest and level of experience must be received for screening by March 1, 1997. Successful applicants will be notified by April 1, and a deposit of 50% must be received by April 15, 1997. In general, refunds of the deposit will not be possible. The remainder is due before registration.
DATES:
Applications must be received by Mar. 1/97 50% deposit due Apr. 15/97 Registration 8:00 - 10:00 am Friday June 19/97 Last class will end with lunch Sun., June 29/97 3D Image Processing Workshop June 30- July 2
**************************************** Prof. James B. Pawley, Ph. 608-263-3147 Room 1235, Engineering Research Building, FAX 608-265-5315 1500 Engineering Dr., Madison, WI, 53706 JBPAWLEY-at-FACSTAFF.WISC.EDU
Bill Kroenke, Associate Director Center for Micro-Engineered Materials Farris Engineering Center Room 203 University of New Mexico Albuquerque, NM 87131 (505)277-6824 (505)277-1024 Fax yonder-at-unm.edu
I maintain a JEOL 200CX (~15 yrs old) and have encountered similar problems with the HT. The problem is intermittent, occuring about once every couple of months. I have talked to several JEOL engineers, we checked water flow and freon levels, everything is normal. Although the microscope is heavily modified for UHV and in-situ sputtering experiments I have suspected that the problem lies somewhere in the microscope logic circuits, giving rise to occasional glitches. We've spent several hours tracing through circuit diagrams etc. but the phenomenon remains a mystery... I usually resort to re-starting the microscope (emergency stop, restart, then override the diffusion pump timer), everything returns immediately to normal.
We also had problems recently with the ready light extinguishing (during operation as well as when idle), and identified the penning gauge (reading ~gun pressure) as the culprit; below ~10-5T it shuts off the ready light which in turn shuts down the HT. That problem was quickly solved by cleaning the penning head.
I too would be glad to hear from anyone who may have solved the HT problem...
I had the same problem when I operated a JEOL-1200EX/ASID10. I my case, the problem caused by intermittent malfunctioned DP heater. You can try to move two temperature sensors from DP1 and DP2 to the same DP, if the problem is still, move both to other DP. This may help you to locate which one is wrong. I was tald that the problem may also caused by the sensor of RP which is to measure the pumping speed of RP. If belt tension is below certain value, the pumping speed may be low and the HV will be shut off.
Zhiyu Wang Department of Biosystem Engineering University of Hawaii Honolulu Hawaii 96822
On Sat, 23 Nov 1996 psizrk-at-biruni.erum.com.pk wrote:
} } We are facing problem in JEOL's TEM, model: JEM-100SX that during normal } operation (Image observation), the HT suddenly cuts off and then it cannot be } generated again, however HT ready light remains ON. Service personnels have } checked the system and suspects that this is probably due to insufficient } cooling water flow through lens (column side). Now the status is rather } intermittent that sometime the E/M. works normally but sometime and most of the } time the same problem/phenomenon appears. } } Needs advise on what could be the real fault and what is remedy? Can anybody } help?? } } Suzan James }
} Hi } I want to try something with NIH image, and I don't have a } Mac with internet access, so I downloaded } nihimage160_68.hqx via my PC. But stuffit won't extract the } program (either using a friend's Mac or using the demo } version of Executor 2.0 on my PC). } } Is there something about downloading .hqx files to a PC that } causes this? Is there anything I can do that will allow this to } work, short of finding a Mac with internet access? } } And incidentally, is Executor 2.0 still a good choice for a } Mac emulator for running the current version of Image on a } PC? } } Thank you very much } Richard_Thrift-at-Depotech.com
My first guess would be that the Macs think it is still a PC file and, quite sensibily, don't like it :)
The first thing I'd do would be to go in with an application, such as Norton Disk Editor, that can see and change the various file attibutes. Then you need to set FILE TYPE to TEXT and CREATOR to BNHQ. Stuffit should then recognise it.
} We are facing problem in JEOL's TEM, model: JEM-100SX that during normal } operation (Image observation), the HT suddenly cuts off and then it cannot be } generated again, however HT ready light remains ON. Service personnels have } checked the system and suspects that this is probably due to insufficient } cooling water flow through lens (column side). Now the status is rather } intermittent that sometime the E/M. works normally but sometime and most } of the } time the same problem/phenomenon appears. } } Needs advise on what could be the real fault and what is remedy? Can anybody } help?? } } Suzan James
I'm not familiar with this particular model of TEM. However, the usual design approach to saftey interlocks is to have a number of sensors, connected in series, to a circuit holding the intended operating feature ON. If any of the sensors detects a deviation from the expected level of the parameter that sensor is monitoring, the circuit is broken, and the operation go OFF.
As other replies to the list indicate, a number of parameters appear to be monitored in the JEOL 100SX to determine if the HT should be ON or OFF. Others that are typically in the circuit, but may not be, are, for example, simple switches to detect that the gun chamber and/or camera chamber are not open.
Also note that rather than a specific, separate sensor, it is possible to use the device itself. For example, diff pump heaters can actually be in the circuit, so that if they go open circuit (and hence the vacuum is not functioning), the interlock circuit trips.
So, the first step is to try to obtain the diagram for the HT safety interlock circuit and identify all the sensors and devices that might be involved - it could quite easily be 10 or more.
From the practical side, long experience has taught me (finally) that in situations like this, where a fault is intermittent, that the problem is often not in any of the 'devices' or electronics making up the circuit but the wiring and connectors. I once spent two weeks trying to locate an intermittent fault on a plate numbering system. After removing and checking every circuit board and all the discrete devices, I finally found the fault in a connector - when the outer insulation of a multicored cable had been stripped to assemble the plug, the inner insulation had been nicked and two wires were intermittently shorting. So, it was actually a factory assembly fault that only became apparent in the instrument after 2 years!
Hope that helps, best of luck.
Regards,
--------------------------------------------------------------- Dr L. P. Stoter Technical Editor, MICROSCOPY & ANALYSIS Technesis 17, Rocks Park Road email: LPS-at-teknesis.demon.co.uk Uckfield, E. Sussex Phone: +44 (0)1825 766911 TN22 2AT Fax: +44 (0)1825 766911 United Kingdom ---------------------------------------------------------------
} -- [ From: Garber, Charles A. * EMC.Ver #3.1 ] --
snips
} With regard to high purity aluminum wire, the aluminum one gets from } "balling up" ordinary aluminum foil from the super market shelf is more than } adequate for the needs of most persons evaporating Al in an EM lab. Since } one needs quite high purity even to "roll" the aluminum into a foil in the } first place, it is generally thought that if it can be rolled, then it is } more than pure enough for an EM application. I have forgotten exactly what } that purity is generally perceived to be, but if my memory is correct, it is } something like 99.99%! } } Chuck } } } ====================================================== } Charles A. Garber, Ph. D. Ph: 1-(610)-436-5400 } President 1-(800)-2424-SPI } SPI SUPPLIES FAX: 1-(610)-436-5755 } PO BOX 656 e-mail: cgarber-at-2spi.com } West Chester, PA 19381-0656 USA Cust. Service: spi2spi-at-2spi.com
I agree that Al foil from the supermarket is high purity. However, most such foil that I have seen has a 'dull' side and a 'shiny' side - I understand that the dull side is simply oxide, but the shiny side stays that way because of a polymer coating - why it's polymer coated, I've no idea.
Does anyone know it this polymer coat causes any problems when the foil is used for evaporation? I guess it is very thin, but ....
Regards,
--------------------------------------------------------------- Dr L. P. Stoter Technical Editor, MICROSCOPY & ANALYSIS Technesis 17, Rocks Park Road email: LPS-at-teknesis.demon.co.uk Uckfield, E. Sussex Phone: +44 (0)1825 766911 TN22 2AT Fax: +44 (0)1825 766911 United Kingdom ---------------------------------------------------------------
Message-Id: {199611242041.PAA15046-at-ns1.axs2000.net} To: MICROSCOPY BB {Microscopy-at-Sparc5.Microscopy.Com}
Could anyone help me with a protocol for processing yeast cells? I haven't processed yeast before and want to know if there is a particular method that works well. I would like to embed them into spurrs resin. Any protocols and/or references will be appreciated.
Could anyone help me with a protocol for processing yeast cells? I haven't processed yeast before and want to know if there is a particular method that works well. I would like to embed them into spurrs resin. Any protocols and/or references will be appreciated.
I had a similar problem in a JEOL 100-S several years ago. After many service calls, the problem was finally isolated to cooling water flow. Our recirculator water had become contaminated and plugged up several lines, causing the problem to persist even when the water was changed. It finally resulted in much disassembly and cleaning the lines out with compressed air. The problem could probably be entirely avoided with the use of additives such as antifreeze to the coolant, but JEOL service does not like to do this.
-=W.L. Steffens=- Department of Veterinary Pathology College of Veterinary Medicine University of Georgia
Message-Id: {3.0.32.19961125080238.0068e1b8-at-mst.lanl.gov} X-Sender: nee-at-mst.lanl.gov X-Mailer: Windows Eudora Pro Version 3.0 (32)
Wayne and others, This discussion has occurred before on this list and I believe that there was some differences in opinion at that time although most people felt rebuilt filaments were fine. I personally have used rebuilt filaments from Energy Beam Sciences for over 20 years in a variety of instruments and cannot tell the difference from brand new manufacturer filaments. I have no interest in EBS other than a satisfied customer and this opinion is solely my own and does not necessarily represent my employer.
Norman Elliott | Los Alamos National Laboratory MST-7 | PO Box 1663 MS E549 | Los Alamos, NM 87545
Just to keep the record straight, I am not a "microscope service engineer". I am an end user (although I am having to be a "service engineer"). I grant that not all may have my experience with rebuilt filaments, but none the less, the remarks below are what I've seen. Phil
} -- [ From: Garber, Charles A. * EMC.Ver #3.1 ] -- } } In response to the following: } ============================================== } I have to agree that there are problems with rebuilt filaments. I have } noticed shorter lives and more difficults getting good saturation and } alignments. The latter two from variations in the mounting of the new } filament wires on the pegs, and perhaps the solder joints. Rebuilt filaments } also seem to drift more when new, and near the end of their lives. Phil } ============================================== } I would urge caution when painting the performance of all rebuilt filaments } with the same brush. ... } In many instances, a microscope service engineer will immediately blame all } of the microscope's "ills" on the use of retipped filaments, in part because } he or his firm make a nice commission on the sale of new ones, and this } could be one reason why there is a bit of a bias against the use of retipped } filaments. }
&&&&&&&&&&& Illigitmi non carborundum &&&&&&&&&&&
Philip Oshel Microscopy Station A PO Box 5037 Champaign, IL 61825-5037 USA (217) 244-3145 days oshel-at-ux1.cso.uiuc.edu (217) 355-1143 home
In message {20AE0B31BD0-at-calc.vet.uga.edu} "Buddy Steffens" writes: } I had a similar problem in a JEOL 100-S several years ago. After } many service calls, the problem was finally isolated to cooling water } flow. Our recirculator water had become contaminated and plugged up } several lines, causing the problem to persist even when the water was } changed. It finally resulted in much disassembly and cleaning the } lines out with compressed air. The problem could probably be } entirely avoided with the use of additives such as antifreeze to the } coolant, but JEOL service does not like to do this.
I had exatly this problem with my SEM some years ago. Had to use compressed air to blow out SEM cooling lines, grungy bio-rusty stuff came out, then diffusion pump stayed on and things were fine. The way to check if this is your problem is to disconnet your cooling water line at the TEM's OUTPUT and collect water in a graduated beaker for a specific time, say 10-20 seconds, and calculate the output flow rate. Compare this with your scope's recommended flow rate. In my case, it was about a third of what it was supposed to be, got back to normal after leaning the SEM lines.
Good Luck!
Gib Ahlstrand, MMS Newsletter Editor Electron Optical Facility, University of Minnesota, Dept. Plant Pathology 495 Borlaug Hall, St. Paul, MN 55108 (612)625-8249 612-625-9728 FAX, giba-at-puccini.crl.umn.edu
"MICROSCOPY & MICROANALYSIS 96" in Minneapolis, Minnesota, Aug.11-15, 1996 Its over, but not forgotten, and it was a blast!
We have a JEOL 100CX, a few months ago we also had a problem with the HT light turning off and losing the beam. It turned out that it was the pirani gauges that sense the vacuum in the gun and the column. The gauges needed to be replaced. The gauges thought there were breaks in the vacuum when none were occurring. Our microscope has 2 of these pirani gauges, one checks the vacuum in the gun, the other checks the vacuum in the column. If either on of these is bad the scope will not allow you to get the beam back. Our service guy found the location of these gauges by checking the schematics.
Of course first the gun pirani broke and a few months later the column pirani broke. JEOL does sell these gauges. Oh yeah, JEOL sells the gauges in packs of 2, one open and one closed. It appears that the open one is the one that goes bad (at least it did on our machine).
Discoloration of the ceramic base of a tungsten filament, along with shortened filament life, is usually a very reliable indication of a vacuum leak.
Energy Beam Sciences has manufactured both new and rebuilt tungsten filaments for electron microscopes for nearly 25 years. In regard to our own production, I can say with the utmost confidence that there is *no difference* between new and rebuilt filaments. Filament bases that are returned to us for rebuilding are cleaned of any contamination, and the same filament wire and production methods are used to manufacture them. They are vacuum annealed and centered just like new filaments.
I have often heard comments in the field about differences in performance between new and rebuilt filaments. Perhaps the filaments in question were not identical (different wire, different loop configurations) if they were acquired from different sources. However, rebuilt filaments offer a tremendous cost savings to the user, and I hate to see this perception of differences in quality lead users to pay additional money for new filaments for no good reason.
For this reason, Energy Beam Sciences has always offered a program for new users of rebuilt filaments: return 10 burned-out filament bases to us, and we will supply 2 free rebuilt filaments in exchange. We welcome all skeptics!
Best regards, Steven E. Slap, Vice-President ******************************** Energy Beam Sciences, Inc. Adding Brilliance To Your Vision ebs-at-ebsciences.com http://www.ebsciences.com/ ********************************
Message-Id: {1.5.4.32.19961125142206.00676118-at-mailhost.ultra.net.au} X-Sender: pns-at-mailhost.ultra.net.au X-Mailer: Windows Eudora Light Version 1.5.4 (32) Mime-Version: 1.0 Content-Type: text/plain; charset="us-ascii"
In response to Chuck Garber's "contribution":
Chuck: You forgot the disclaimer. Commercial interest and all that. Fancy American manufacturing jewellers using fixative sludge and antique silver for making targets! In Oz they source their raw materials from precious metal refiners and make items in specified grades. I had made a good contribution to this particular thread. It is rather poor to denigrate my item for a little snake oil and cheap advertising. This is not the purpose of this forum and this is not your first transgression. Jim Darley ****************************************
-- [ From: Garber, Charles A. * EMC.Ver #3.1 ] --
In response to the following posting: ============================================== The place to look for silver disks is a manufacturing jeweller wholesaler. They could be found in Yellow Pages or trade indices. Tell them what you are after and they make it. Cost of silver is cheap when compared with gold and the manufacturing charge should not be high either. I trust the target is not wanted for making mirrors. Large mirrors are made with silver solutions, but evaporated Al makes much better optical mirrors. We have a long standing offer to give away some high purity Al wire with orders. Cheers Jim Darley Probing & Structure (Microscopy Supplies & Accessories) PO Box 111, Thuringowa QLD 4817 Australia
Phone +61 77 740 370 Fax: +61 77 892 313 A great microscopy site: http://www.ultra.net.au/~pns/ =============================================== There are some sound technical reasons why most suppliers of EM supplies and consumables don't go to jewelry wholesalers:
a) The purity of the silver is not certifiable, and could contain various alloying elements depending on the (jeweler's) ultimate use of the silver, and
b) The "fabrication charge" to make small quantities, in that kind of circumstance, generally erodes any economic savings. Indeed I have been told in our exhibit booth at meetings that the typical cost to make one this way costs most persons more than our standard catalog price!
At least this firm would never dream ever of obtaining raw product of such unknown origin and putting it into commerce and let the unsuspecting customer be our quality control department!
But the real point is that the market price of a 10 mil thick cathode (most cathodes from other sources are not that thick ) is only one quarter of the price of that which was mentioned not long ago on this listserver. In reality the current price is on the order of $150 depending on current silver prices. So this hardly sounds like the horrendous price that was suggested that would motivate one to waste their time seeking out jewelry firms and to put at risk their important experimental results.
With regard to high purity aluminum wire, the aluminum one gets from "balling up" ordinary aluminum foil from the super market shelf is more than adequate for the needs of most persons evaporating Al in an EM lab. Since one needs quite high purity even to "roll" the aluminum into a foil in the first place, it is generally thought that if it can be rolled, then it is more than pure enough for an EM application. I have forgotten exactly what that purity is generally perceived to be, but if my memory is correct, it is something like 99.99%!
Chuck ====================================================== Charles A. Garber, Ph. D. President SPI SUPPLIES
I am currently trying to retrieve a book which is titled "The Beginnings of Electron Microscopy", edited by Dr Peter W. Hawkes. I already contacted numerous renowned University book suppliers in both Belgium and the Netherlands trying to get hold of a copy of Dr Hawkes's publication.
As none has been able to find a copy I would like to ask this group for further help. The full details are:
Hawkes, P.W. (1985), "The Beginnings of Electron Microscopy", Academic press., Orlando
I sincerely hope that somebody will be able to provide me with any further information which will enable me to find Dr Hawkes's work.
Yours sincerely,
Ing. Peter Michiels Philips Electron Optics Belgium
please unsubscribe me. **************************************************************************** ******** Phil Campbell Faculty Laboratory Manager Faculty of Science Queensland University of Technology
I just read an abstract discussing observation of annual growth bands in speleothem (cave) calcite deposits and one of the tools used to observe the banding was laser confocal microscopy. Can someone describe this technology and some of its applications for me?
Recently, there has been a great deal of discussion on Electropolishing. Although electropolishing is very much material and parameter dependent, once the appropriate conditions have been established, high-quality TEM specimens can be readily produced. It is imperative to determine the proper conditions when attempting electropolishing of new materials. For most metals, electropolishing provides excellent results and should be used as the preparation method of choice.
Although 30% Nitric in water can be used for Al, 33% Nitric in methanol at - -30 degrees C and 9 volts is preferred. In addition, a perchloric acid based electrolyte can be used as follows: 10% Perchloric, 90% Ethanol at 0 degrees C and 7 volts or 5% Perchloric, 20% Butoxyethanol, 75% Methanol at - -30 degrees C, and between 15 and 50 volts (depending on material). Polishing at low temperatures greatly slows the reaction and provides superior results. It should be noted that these parameters have been successfully employed with the Fischione Twin-Jet Electropolisher.
If an oxide layer is present after electropolishing, it may be removed by dipping the specimen into a solution of 16 grams Chomic Acid, 35 cc Phosphoric Acid, and 65 cc Distilled water for 5-10 minutes at room temperature.
To minimize or eliminate the oxide following electropolishing, it is essential to rapidly remove the specimen from the polishing cell and rinse it as quickly as possible. The ability of rapid removal is very much instrument dependent. It is my opinion that the design of the Model 110 Twin-Jet Electropolisher which we have produced since 1966 affords the most rapid specimen removal. The specimen holding mechanism is simply lifted from the top surface of the Electropolisher then either rinsed with a squeeze bottle of methanol or as Dan Schwartz indicated, to rinse progressively after perforation. The time from termination to rinse can be accomplished in less than 2 seconds. By rapid removal and rinsing, post electropolishing specimen etching is eliminated.
Another alternative to remove the oxide is by plasma cleaning. The removal is dependent on the ion energy impinging on the specimen. It is important to consider that ion energies are directly related to the ability to remove the oxide layer. In our Model 1400 Plasma Cleaner, introduced in 1995, the ability exists to vary the gas pressure in the plasma chamber by adjusting the flow of the process gas. There is a corresponding ion energy associated with the differing gas pressures, thus, allowing precise control over oxide reduction. Another significant advantage of this method is the ability to maintain the specimen in a good vacuum. The Model 1400 possesses an oil-free pumping system with a base vacuum of 10 to the -6 torr. Since the specimen is already contained in the TEM specimen holder and both the specimen and the specimen holder are simultaneously cleaned, a rapid venting of the Plasma Cleaner chamber allows for fast insertion into the TEM.
Should anyone wish to further discuss any of these issues, please e-mail me directly or if you will be in attendance at MRS in Boston, I will be exhibiting in the University Hall of the Marriott, Booth 428.
Thanks and regards,
Paul
Paul E. Fischione, President E.A. Fischione Instruments, Inc. 9003 Corporate Circle Export, PA 15632 Phone 412-325-5444 FAX 412-325-5443 e-mail: paul.fischione-at-internetmci.com
A number of years ago I was involved at looking at ice crystal damage to fish tissue stored at -20C using isothermal freeze-fixation to minimise changes to the ice within the tissue. I have now been asked to look at fish stored at -30C. Does anyone know if it is posible to do isothermal freeze fixation at that temperature? and has reference to a formulation? The lowest I have on file is -21C.
Other alternatives would be to freeze substitute at -30C or lower the temperature and use conventional freeze substitution or freeze drying. However I am concerned at the changes to ice that might occur.
Thanks in Advance
Ian
Ian Hallett HortResearch Mt Albert Research Centre Private Bag 92 169 Auckland, New Zealand Fax 64-9-815 4201 Telephone 64-9-849 3660 EMail ihallett-at-hort.cri.nz
No disrespect intended, but I will take public issue with your statement that a "a microscope service engineer will immediately blame all of the microscope's "ills" on the use of retipped filaments, in part because he or his firm make a nice commission on the sale of new ones"
I am a service engineer for Philips. As a courtesy to our contract customers we provide, at no charge, spare filaments (10 to a box). Yes, there is a sales commision that can be made, but OUR cost in comparison is minimal to the rewards of providing a value-added perk in hopes of keeping our customer operating uninterrupted. When issues involving short filament life arise, we examine ALL possibilities and causes. Egg on our face if we said "poorly re- tipped filaments. Here, try 'ours'", and then have ours fail just as badly.
If you are receiving poor service support or advice, it is wise to resolve those particular issues with their source, not in this forum.
Respectfully, Clay Jordan Customer Service Engineer Philips Electron Optics clay_jordan-at-pei.philips.com
On 11/24/96 15:50:43 you wrote: } } -- [ From: Garber, Charles A. * EMC.Ver #3.1 ] -- } } In response to the following: } ============================================== } I have to agree that there are problems with rebuilt filaments. I have } noticed shorter lives and more difficults getting good saturation and } alignments. The latter two from variations in the mounting of the new } filament wires on the pegs, and perhaps the solder joints. Rebuilt filaments } also seem to drift more when new, and near the end of their lives. Phil } ============================================== } I would urge caution when painting the performance of all rebuilt filaments } with the same brush. Appreciable numbers of customers worldwide regularly } use rebuilt filaments, all enjoying considerable cost savings relative to } the cost of new filaments. Now it is a fact that all rebuilt filaments do } not all come from the same place, and might not all be created equal, but } like with anything else, you have to determine which ones work best for you. } } In many instances, a microscope service engineer will immediately blame all } of the microscope's "ills" on the use of retipped filaments, in part because } he or his firm make a nice commission on the sale of new ones, and this } could be one reason why there is a bit of a bias against the use of retipped } filaments. } } SPI Supplies offers a filament rebuilding service and we have an obvious } interest in encouraging the use of rebuilt filaments! } } Chuck } } ====================================================== } Charles A. Garber, Ph. D. Ph: 1-(610)-436-5400 } President 1-(800)-2424-SPI } SPI SUPPLIES FAX: 1-(610)-436-5755 } PO BOX 656 e-mail: cgarber-at-2spi.com } West Chester, PA 19381-0656 USA Cust. Service: spi2spi-at-2spi.com } } } Look for us! } ############################ } WWW: http://www.2spi.com } ############################ } }
In recent days there has been a rash of postings on the listserver which are beginning to cross the grey area between answering a question posted by a individual and advertising/commericals. While I do not under any circumstances wish to discourage ANYONE from contributing to the discussion, however, I find it disturbing when a manufacturer uses this forum to present their product(s) beyond the ground rules of the server, or uses the server to critque other manufacturers. (i.e. recent comments on Rebuilt Filaments, Sputter Coater Targets, Electropolishing/Plasma Cleaners....)
Allow me to repost the rules of the discussion forum on advertising, and/or commerical postings and once again ask that you all honor the ground rules and that arguments be conducted off-line and not broadcast on the server.
I will also take this opportunity to remind people how to subscribe/unsubscribe!
Can I post an Advertisement? ----------------------------
No, that does not fit within the bounds of this discussion forum.
This listserver is not intended to be a Sales mechanism for commerical organizations, but rather it is an open discussion area about microscopy and microanalysis problems and solutions. If you are an organization and have equipment you wish to donate, or sell, for nominal cost (i.e. no profit) then this is generally an acceptable posting. If you are not sure then send a copy of the announcement in question to Zaluzec-at-MSA.Microscopy.Com and I will give you my opinion. An example of this type would be an old decommissioned instrument which someone is trying to give away for removal/shipping costs, that would fit within the bounds of the purposes of this list.
If you are a manufacturer, you are always welcome to observe/join in any discussion at any times. We do ask that everyone, please refrain from overt sales pitches and/or commericalism. If a product which you produce/sell can solve a problem or answer a question raised by anyone on this list, then by all means feel free to say so. Try to be brief about the product, state the simple facts in a few (short) sentences and then offer to continue the discussion with any interested parties off-line. Alternatively you can give sufficient information so that individuals can download/access the relevant information.Usually it will be sufficient to just add your phone number and/or Email address to the end of your message, and you'll be contacted by anyone that is interested.
Remember, please keep your comments about any product you "sell" to a minimum.
It is not out of line to provide your company name, Email address or WWW site as part of your signoff/signature line, at the end of ANY message you post to this system.
This Listserver operates on the honor system with respect to to posting of advertising, so please respect these simple ground rules.
=======================
How do I subscribe? -------------------
Send an Email Message to:
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Replace the "USERID-at-EMailAddress" with your real Email address. You may also append your Real Name, and Address etc.. to the end of the message as a courtesy. I'd be interested to know who you are and where you're from, and what you do.
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Send an Email Message to
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Replace the "USERID-at-EMailAddress" with your real Email address.
IMPORTANT NOTE#1. To unsubscribe you MUST supply the original address which you used when you first submitted your subscription. Over the last few years I have found that many users have their mail forwarded to new addresses, or use an alias. When they then try to unsubscribe, they forget where there mail is being sent to (or forwarded from). This causes me lots of headaches. So just remember in order to unsubscribe you from the list, the listserver must know the your original subscription address to remove it!
Please be considerate. I am not a mindreader, and don't really enjoy playing detective over the Internet. I have too many other things to do.
IMPORTANT NOTE #2: Do not send subscribe/unsubscribe message to "Microscopy-at-MSA.Microscopy.Com". When you do this ALL members of the listserver receive your message. All administrative issues should be sent to "Listserver-at-MSA.Microscopy.Com" and not to the general mailing list.
I'm Going on Vacation/To A Meeting.... what should I do? -------------------------------------------------
If your mail box is large enough then nothing.
If you don't want to collect your messages then simply unsubscribe and send in a subscription request when you return
Never, Never, remain subscribed with your Email program/system to respond to all Email with an automatic message ON-VACATION message
"I'm out-of-town will respond to your message when I return".
This can create monsterous semi-infinite recursion loops in the Email system. Some of you will recall we had a massive one a year or so ago and it took nearly a week to clear up, with literally hundreds of thousands of messages cycling through the Internet as messages where bouncing all over the world. The current software configuration minimizes the possiblity of this happening however, nothing is impossible and I want to make sure it doesn't reoccur.
Peter Michiels asked for details of a book edited by Peter Hawkes entitled "The beginnings of electron microscopy". As follows:
Advances in imaging and electron physics. The growth of electron microscopy. Volume 96. Academic Press. Ed Tom Mulvey. Editor-in- Chief Peter W Hawkes. Ass. Eds. Benjamin Kazan and Tom Mulvey. 1996. Int Standard Serial No: 1076-5670. Int Standard Book No: 0-12- 014738-6.
Disclaimer: No financial interest, just contributed to it.
Michael J Witcomb PhD Electron Microscope Unit University of the Witwatersrand Private Bag 3 WITS 2050 South Africa
S. Kikuchi is reknown for Kikuchi line, Kikuchi map etc. His pioneering paper on Kikuchi line appeared in Jpn. J. Phys. in 1928. However, little is known about his career. Does anyone know anything about him except that he wrote the first paper on Kikuchi line?
I am looking for a (practical) method or procedure for the determination of tremolite/ chrysotile ratio (volume, mass, number of fibers) in bulk samples (asbestos-cement products). I will be very grateful if you are willing to share any experience regarding this matter using optical M, SEM, TEM, XRD or classical analytical chemistry.
Best regards,
Dr. Goran Drazic Ceramics department J. Stefan Institute, University of Ljubljana Slovenia
Many thanks to all who responded to my inquiry about cleaning LaB6 wehnelts. There were several good suggestions, all of which sound better than the method I have been using. Here is a brief summary: nitric acid on a foam type swab, dilute(1:4) HCl- soak for a minute or short sequential exposures, a commercial product called "Soap Scum Remover", soaking in ammonia (1 hr. to overnight), and .25um diamond paste in water-soluble base. I knew there had to be an easier way!!! Fortunately, this is not something that needs to be done very often, but I look forward to trying some of these suggestions in the future.
Thanks, Bill -- ============================================================= Bill Chissoe III Electron Microscopist,University of Oklahoma E-mail: wchiss-at-ou.edu Ph. (405)325-4391 =============================================================
I would like information on any program to train combined hitology/EM or histology alone technicians in the US. I could not find much by calling a few places. If any training program exist and list server members have information on the curriculum I would be grateful for information. Thanks.
} I just read an abstract discussing observation of annual growth bands } in speleothem (cave) calcite deposits and one of the tools used to } observe the banding was laser confocal microscopy. Can someone } describe this technology and some of its applications for me? } } Thanks }
As far as I know we were the first group to do this (Dr Luis Gonzalez, Geology.) It is a very straight-forward technique--polish the sample, put it on the stage and image with the 488 nm line (usually full power). The images can then be montaged together and the banding patterns measured.
Thomas Moninger (moninger-at-emiris.iaf.uiowa.edu) Central Microscopy Research Facility http://www.uiowa.edu/~cemrf 85 EMRB University of Iowa Iowa City, IA 52242 319-335-8142 FAX 319-335-8049
I am thinking of purchasing NORAN'S Electron Flight Simulator 2.0 for windows. If anyone is familar with this monte carlo modeling software I would appreciate any information about 1: input parameters required to make the calculations, 2: any limitations of the software, etc. If any other company is offering monte carlo modeling software that will run under Windows95 format , I would be intersed the information about it also.
H-05 Internet Hoaxes: PKZ300, Irina, Good Times, Deeyenda, Ghost
November 20, 1996 16:00 GMT
PROBLEM: This bulletin addresses the following hoaxes and erroneous warnings: PKZ300 Warning, Irina, Good Times, Deeyenda, and Ghost.exe PLATFORM: All, via e-mail DAMAGE: Time lost reading and responding to the messages SOLUTION: Pass unvalidated warnings only to your computer security department or incident response team. See below on how to recognize validated and unvalidated warnings and hoaxes.
VULNERABILITY New hoaxes and warnings have appeared on the Internet and old ASSESSMENT: hoaxes are still being cirulated.
I} Date: Tue, 26 Nov 96 14:40:58 +0100 } X-Sender: deschuyt-at-rxu01 } Mime-Version: 1.0 } To: ZALUZEC-at-sparc5.microscopy.com } From: Michel Deschuyteneer {deschuyt-at-sbbio.be} } Subject: New virus hoax } } Dear Nestor: } } Two friends in the US have sent me today a "Deeyenda" virus warning . } As I suspected, it turns out to be of the same breed as the infamous "Good } Times". } References: } http://ciac.llnl.gov/ciac/bulletins/h-05.shtml (DoE) } http://www.kumite.com/myths/myth027.htm } } May I suggest a preemptive note to Microscopy before the list gets cluttered } with the usual round of messages? } } Best regards, } Michel } **************************************************** } Michel Deschuyteneer, Ph.D. deschuyt-at-sbbio.be
Please refer to the URL at http://www.unm.edu/~cmem
for a job opening at the University of New Mexico
Text version of the posting announcement is appended below:
THE UNIVERSITY OF NEW MEXICO, USA CENTER FOR MICRO-ENGINEERED MATERIALS ALBUQUERQUE, NEW MEXICO 87131 VACANCY ANNOUNCEMENT
POSITION: RESEARCH SCIENTIST III REQUISITION NUMBER: 963185*A APPLICATIONPERIOD: 11-18-96 to 12-20-96 EEOC JOB GROUP: 3 STARTING SALARY: $3,038.50/MO to $4,179.08/MO (Dependent on Budget/Policy) GRADE: 16, Full-Time Position/Regular PARTIALLY GRANT FUNDED POSITION
Applications from senior level scientists or engineers are invited for the staff posi-tion of Research Scientist III in the Center for Micro-Engineered Materials, a Na-tional Science Foundation/University of New Mexico Industry/University Coop-erative Research Center. The successful candidate will operate and manage a sur-face and powder characterization facility. This facility contains a scanning Auger electron spectroscopy and a scanning electron microscope. It also contains a powder characterization laboratory that provides thermogravimetric analysis, dif-ferential thermal analysis, BET surface area analysis, pycnometry, dilatometry and particle size distribution measurements based on sedimentation velocity. The suc-cessful candidate will also carry out a successful materials research program in conjunction with other Center researchers.
The candidate must possess a Ph.D. in chemistry, physics or one of the engi-neering disciplines or Master's degree in chemistry, physics or one of the engi-neering disciplines and 4 years of directly related experience or Bachelor's degree in chemistry, physics or one of the engineering disciplines and 5 years directly re-lated experience. Directly related education and experience may be substituted for each other on a year for year basis.
Desired experience includes extensive hands-on experience with: the operation and data analysis of Auger electron and X-ray photoelectron spectroscopy systems; operation of scanning electron microscopes; design and operation of ultra-high vacuum equipment; computer interfacing to laboratory instruments; operation of MAC- and PC-based computers for data analysis. Teaching experience including conducting training sessions for science and engineering students; demonstrated ability to conduct a high quality university research program; experience writing proposals for external funding and a portfolio of research results including techni-cal publications in refereed journals.
Specific responsibilities of the position include, but are not limited to operating and maintaining a scanning auger electron spectrometer and scanning electron micro-scope facility, maintaining various powder characterization instruments, training students and faculty in the operation of surface analysis and powder characteriza-tion equipment, writing proposals to funding agencies and participating in the re-search programs of a variety of groups associated with the Center.
Applicants must be legally authorized to work in the USA Successful candidate must be prepared to present degrees, certifications, licenses etc. to be photocopied and added to the personnel file.
TO APPLY: Applications/resumes, a detailed statement of experience and three confidential letters of recommendation should be sent to Abhaya K. Datye, Chair-man of the Search committee, Research Scientist III, Center for Micro-Engineered Materials, University of New Mexico, Albuquerque, NM 87131 no later than 12/20//96. Applications must include requisition number and applicant's signature. For further information, please contact William J. Kroenke, (505)277-6824, Fax (505)277-1024, or Email: yonder-at-unm.edu.
As finances become tighter at universities, administrators are increasingly adopting "responsibility center management" practices along with insisting on the recovery of more operating costs. Sometimes this works-but sometimes it does not, depending on the university.
Does anyone have any experience with the "responsibility center management" system? What are the specific problems and/or benefits? I will collate the info and provide it to interested parties. Anonymity will be preserved for all respondees.
Thanks.
John Bozzola 71 Concordia Drive Carbondale, IL 62901
} Hello All, } } We have a Philips XL40 SEM where it is very hard to focus above } 20,000 X. I see a wavy pattern as I do slow scans. Is there a } simple way to test whether this is due to AC fields
See if the effect is worse at long working distances. If it is, that suggests electrical interference rather than mechanical vibration. Test for mechanical vibration by putting a dish of water on the microscope and looking at the reflection of a light in the surface. Ripples = vibration.
There is a neat portable AC field detector called a Gauss Maus ( invented in Australia!) which you can buy e.g from SPI (Cat #11065-AB, page 72) or others (no commercial connection, I just have one). You can use it to measure the RMS strength of the ac fields in 3 axes and to find the source.
You can also get a circular coil of say 1000 turns of enameled copper wire and display the induced voltage on a oscilloscope. Of course you have no calibration but it will show you weaker and stronger.
Measures to counter AC magnetic interference:
Oxford Instruments sell a magnetic field cancelling system. USA phone is (508) 369-9933.
Once you find a source it is possible to move it away from the column. Sources can include lights (esp fluorescent), metal pipes, air conditioning ducts, steel reinforcing, power cables and so on. Metal pipes and ducts can be isolated by putting non conducting plastic segments in the pipe run.
You will also find in the yellow pages, companies that sell magnetically shielded rooms to exclude radio frequency radiation.
Department of Materials Science and Engineering & Laboratory for Research on the Structure of Matter 3231 Walnut Street University of Pennsylvania Philadelphia, PA 19104-6272
Qualified candidates will have a Ph.D. in a physical science or engineering field as well as considerable experience with transmission electron microscopy. Preferred candidates will have experience with beam sensitive materials, EELS, and/or polymer microscopy. The successful candidate will initiate two or more new projects associated with (1) lateral uniformity at polymer interfaces, (2) electrically active polymeric devices, and/or (3) optically active polymers. These projects will involve the (soon to arrive) field emission analytical TEM.
Start Date is flexible. Earliest start date: December 1, 1996 Latest start date: April 1, 1996
To apply please send the following items to the address above: 1. complete curriculum vitae 2. names and addresses of two references 3. one preprints/reprints
Applications are due November 20, 1996.
regards, Prof. Karen I. Winey winey-at-lrsm.upenn.edu
----------------------------------------------------------------------------- Karen I. Winey Assistant Professor (215) 898-0593 Materials Science and Engineering Department (215) 573-2128 FAX 3231 Walnut Street winey-at-lrsm.upenn.edu University of Pennsylvania LRSM building; room 308 Philadelphia, PA 19104-6272
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} Hello All, } } We have a Philips XL40 SEM where it is very hard to focus above } 20,000 X. I see a wavy pattern as I do slow scans. Is there a } simple way to test whether this is due to AC fields and are } there measures to counter it? Any help is appreciated. } } } Mohan Kalyanaraman } Mobil Technology Company } PO Box 480 } Paulsboro, NJ 08066 } 609-224-3989 (ph#) } mxkalyan-at-pau.mobil.com
First thing to do is confirm that it does originate from the mains supply. Check your line times for the slow scan and by counting the numbers of waves across the image you should be able to calculate the frequency of the intereference. If it is the same (or very close) to the mains frequency, or an obvious small multiple then its a good bet that the source of the problem is the mains.
If it is another frequency, then you have to look for other sources which are likely to be mechanical. This can be simple floor vibrations, or more complicated things like vibrations on cooling water from pumps with problems, TMPs with bearing problems, etc. Are there lift shafts nearby, does anyone operate an ultracentrifuge, etc?
Other electronic sources are possible - I have come across high frequency interference originating from problems in an HT supply, for example. Also, poorly shielded computer monitors close to the SEM column can be a source. Move anything that can be easily moved away from the column.
However, mains is the most probable - having said that, it doesn't need to be radiated. The best approach is to try to locate and remove the source of the problem - it MAY be the power lines in or near the SEM but, for example, incorrectly wired equipment elsewhere in the building, perhaps a long way away can transmit down the mains and cause problems.
One approach it to try to track the interference as a function of time. Is it always present, or does it dissappear about 6.00pm (when people quit work) and reappear about 8.00am when people come back into work? Also, a many-turns coil of wire connected to an oscilloscope is a sensitive detector that can help find a source.
My first assumption in these situations is a ground loop - that is the SEM has accessory equipment connected to it and the SEM and accessory equipment are connected to the mains (and grounded) at different points, AND grounded to each other. This can cause all sorts of horrible problems - the usual approach to solving this is to disconnect everything, apart from the main SEM - at which point the problem hopefully will dissappear. Then sequentially reconnect, until the problem reappears. Finally, having found the offending accessory, make sure it is grounded to the SEM and nowhere else. Preferably, power it from an accessory power point on the SEM.
But, you might discover that the problem really is AC fields radiated from mains cabling. In this case, there are commercially available field cancelling systems. The latest systems seem to work pretty well, although I have no personal experience.
Regards,
--------------------------------------------------------------- Dr L. P. Stoter Technical Editor, MICROSCOPY & ANALYSIS Technesis 17, Rocks Park Road email: LPS-at-teknesis.demon.co.uk Uckfield, E. Sussex Phone: +44 (0)1825 766911 TN22 2AT Fax: +44 (0)1825 766911 United Kingdom ---------------------------------------------------------------
We have a model 666 (Gatan) PEELS, one of the very first before Gatan had a Mac interface. It is connected to an old workstation (Apollo) which is now worth far more as tradein than anything else - about the same speed as a 486 at best. I would be interested in changing the computer interface to a PC (486 or Pentium). Are there any interfaces out there?
Microscopy-at-Sparc5.Microscopy.Com (MICROSCOPY MSA list messages) Message-ID: {1996Nov27.140920.1814.199303-at-missgate.sunderland.ac.uk} X-Mailer: Microsoft Mail via PostalUnion/SMTP for Windows NT Mime-Version: 1.0 Content-Type: text/plain; charset="US-ASCII" Organization: University of Sunderland
Manuela
would there be any chance of summarising the yeast references/replies? This would certainly be useful to me if not other readers on the list.
thanks Malcolm Haswell University of Sunderland UK e-mail: es0mhs-at-environment.sunderland.ac.uk
----------
Thanks to all of you who replied to my request on the processing of yeast cells. I now have lots of reading and a variety of methods to try out.
Here is a procedure for cleaning out cooling water lines on a 4000EX given to me by a JEOL service engineer. Problem: lenses were overheating and shutting off, even though temp. in was 56 F and out was 92 F. -at- a flow rate of l liter/min. Heat transfer was insufficient due to copper corrosion which was inside the cooling baffles. An indication of this was green particles in the bottom of the chiller or hose. Analysis of the particles suggested Copper Chloride and Sulfate. It is believed that this was caused by the use of tap water in the chiller. Flushing the system only cured it for a month. The following procedure has cured this for at least one year. 1.Cleaned baffles with a snake to remove most of the corrosion. Run water through the baffle to help flush out particles. Flush both ways. 2.Circulate a 20% solution of acetic acid through the baffles. Do each baffle separately for 10 minutes each way. 3.Flush with tap water for 5 minutes. 4.Circulate a solution of baking soda to fully neutralize. Mix 4 oz. to a gallon of water. 5 minutes each way. 5.Flush again. You should get 5 liter/min. with about 45-50 psi through each baffle. Objective les baffles should be more and condenser less. 6.Clean out chiller reservoir, water lines, valves and regulator. Give system a final flush with deionized water. Fill chiller with deionized water and add 1 gram of benzotriazole per liter of water. John Hunt
Dear All, I am intending on acquiring a high resolution printer for EM pictures. I have a choice between XL8650 PS/CMY or XLS 8650/PS/CMYK both from Kodak or the Codonics NP. Do any of you recommend one of these printers ?. I am working on a PC computer under Windows 95. Thanks,
Daničle SPEHNER Etablissement de Transfusion Sanguine 10 Rue Spielmann 67065 STRASBOURG, FRANCE
Message-Id: {199611271800.NAA24479-at-indy2.indy.net} To: Microscopy list {microscopy-at-Sparc5.Microscopy.Com}
Hello, We are currently doing diffraction on our TEM for school. Nobody seems to know what the standard exposure time is when taking a photo of the diffraction pattern. I would appreciate any suggestions.
Thank you in advance Leah L. Dobbs Madison Area Technical College
Doers anyone have a good reference that explains the advancements in imaging made possible by the development of the FE-SEM? I am writing a paper that uses this technique to image plant mitochondria and I need a standard paper on the technique/instrumentation that I can refer the reader to.
Thanks in advance
Bob
Robert R. Wise, PhD Director, UWO Electron Microscope Facility Department of Biology University of Wisconsin Oshkosh Oshkosh, WI 54901 (414) 424-3404 tel (414) 424-1101 fax wise-at-uwosh.edu
I noticed that my "thank you" received even more suggested ways to clean LaB6 wehnelts and I appreciate each response. In my initial summary of suggestions, I forgot to include the one recommending sonicating for 15 min. in sonicator cleaning solution. A number of the suggestions satified my criteria for a good technique (ie. minimum elbow grease, minimum time, minimum wear on wehnelt).
Thanks again, Bill -- ============================================================= Bill Chissoe III Electron Microscopist,University of Oklahoma E-mail: wchiss-at-ou.edu Ph. (405)325-4391 =============================================================
} Date: Wed, 27 Nov 1996 08:15:17 } To: "Mohan Kalyanaraman" {mxkalyan-at-pau.mobil.com} } From: Peter Michiels {pmi-at-mailhost.tornado.be} } Subject: Re: AC field presence detection and cancellation } } Hello Mohan, } } } It is very important that you determine whether your 'disturbance' is mechanical or electromagnetical. } } MECHANICAL DISTURBANCES } } By changing the working distance (WD) from let's say 5 mm to 30 mm, while keeping the magnification constant, the amplitude of the disturbance remains the same. } With a special tool you can also mount the specimen directly to the final lens. When the disturbance vanishes it will definitely be a mechanical disturbance. } } INTERFERENCE FIELDS (magnetical and electrical) } } By changing the high tension (decreasing from 30 kV to 1 kV), the disturbance amplitude will increase according to the following formula: } } sqrt(30) x amplitude = 5.5 } } When increasing the WD from 5 mm to 30 mm the amplitude will increase by a factor of 20! } } A magnetic field is easy to simulate by holding a soldering iron or a transformer near the column. This will result in a 50/60 Hz disturbance. } } SOME OTHER TIPS } } A dust particle on an aperture can act like an electrical disturbance with an unstable frequency. Different spotsizes can change the effect. } } A pure 50 Hz (or 60 Hz) field or disturbance (flags) can be synchronised by the mainslock. This is automaticaly done when you select a line time longer than 20 ms (16.6 ms). When in mainlock you will get some image distortions rather then flags. } } } That's about it for now. If I come up with some other useful tips, I will contact you. For now I hope that you can determine exactly what is going wrong. } } Good luck! } } } } Ing. Peter Michiels } Philips Electron Optics } Belgium } } } } At 11:48 26/11/96 EST, you wrote: } } Hello All, } } } } We have a Philips XL40 SEM where it is very hard to focus above } } 20,000 X. I see a wavy pattern as I do slow scans. Is there a } } simple way to test whether this is due to AC fields and are } } there measures to counter it? Any help is appreciated. } } } } } } Mohan Kalyanaraman } } Mobil Technology Company } } PO Box 480 } } Paulsboro, NJ 08066 } } 609-224-3989 (ph#) } } mxkalyan-at-pau.mobil.com } } } } }
} Date: Wed, 27 Nov 1996 08:15:17 } To: "Mohan Kalyanaraman" {mxkalyan-at-pau.mobil.com} } From: Peter Michiels {pmi-at-mailhost.tornado.be} } Subject: Re: AC field presence detection and cancellation } } Hello Mohan, } } } It is very important that you determine whether your 'disturbance' is mechanical or electromagnetical. } } MECHANICAL DISTURBANCES } } By changing the working distance (WD) from let's say 5 mm to 30 mm, while keeping the magnification constant, the amplitude of the disturbance remains the same. } With a special tool you can also mount the specimen directly to the final lens. When the disturbance vanishes it will definitely be a mechanical disturbance. } } INTERFERENCE FIELDS (magnetical and electrical) } } By changing the high tension (decreasing from 30 kV to 1 kV), the disturbance amplitude will increase according to the following formula: } } sqrt(30) x amplitude = 5.5 } } When increasing the WD from 5 mm to 30 mm the amplitude will increase by a factor of 20! } } A magnetic field is easy to simulate by holding a soldering iron or a transformer near the column. This will result in a 50/60 Hz disturbance. } } SOME OTHER TIPS } } A dust particle on an aperture can act like an electrical disturbance with an unstable frequency. Different spotsizes can change the effect. } } A pure 50 Hz (or 60 Hz) field or disturbance (flags) can be synchronised by the mainslock. This is automaticaly done when you select a line time longer than 20 ms (16.6 ms). When in mainlock you will get some image distortions rather then flags. } } } That's about it for now. If I come up with some other useful tips, I will contact you. For now I hope that you can determine exactly what is going wrong. } } Good luck! } } } } Ing. Peter Michiels } Philips Electron Optics } Belgium } } } } At 11:48 26/11/96 EST, you wrote: } } Hello All, } } } } We have a Philips XL40 SEM where it is very hard to focus above } } 20,000 X. I see a wavy pattern as I do slow scans. Is there a } } simple way to test whether this is due to AC fields and are } } there measures to counter it? Any help is appreciated. } } } } } } Mohan Kalyanaraman } } Mobil Technology Company } } PO Box 480 } } Paulsboro, NJ 08066 } } 609-224-3989 (ph#) } } mxkalyan-at-pau.mobil.com } } } } }
I never cease to be amazed at how frequently problems with magnetic fields arise for those of us working with EMs. Our department is just now going through a situation where the B&G Dept. wants to install a 400 Amp buss line down the center of our building to service some heavy machining equipment to be installed by another department. The field B (mG) produced at a distance X (feet) from a single long straight line of this kind carrying a current C (Amp) would be B = 6.56 C/X. A few calculations will show that the field generated by the proposed buss line would put every EM within a distance of several hundred feet out of business - and then there would also be the effects of probable vibrations from the machines to contend with. We hope we are going to be able to convince those in power to abandon their current plans. If not, our SEMs will be useless.
The source of annoying magnetic fields can be even more subtle and unexpected than this, however. One morning years ago we turned on our SEM and had horrible double images. We hooked a coil of wire to an oscilloscope and followed the source to the middle of the wall directly behind the column. That led us to explore the office next door, whereupon we found that the occupant had just started using a rather primative type of electric clock (apparently received as a gift from one of his children). It took several minutes to convince him that we had a serious problem, and that he was the cause of it, but in the end the evidence was convincing - unplug the clock and the double image went away. On another occasion similar effects were observed when a silicon carbide rod heating element in a furnace across the hall came loose and shorted to ground, producing prodigious ground loop currents in the heating ducts and steel frame members within the walls of the building.
Incidentally, there was a series of articles in Microscopy Today (Don Grimes, Ed., MicroToday-at-aol.com) recently on magnetic fields, their causes and cures. It was written by Curt Dunnam of Linear Research Associates, Trumansburg, NY 14886 (Fax: 770-368-8256). LRA apparently specializes in diagnosing and dealing with magnetic fields in EM labs. You might get useful help from them. I know there are other companies that do the same, but I don't happen to have names and addresses readily available.
Microscopy-at-sparc5.microscopy.com (MICROSCOPY MSA list messages) Organization: University of Sunderland
Manuela
would there be any chance of summarising the yeast references/replies? This would certainly be useful to me if not other readers on the list.
thanks Malcolm Haswell University of Sunderland UK e-mail: es0mhs-at-environment.sunderland.ac.uk
---------- At 08:29 27/11/96 -0500, you wrote: } I would be interested in reading the responses you received about } processing yeast. Would you mind forwarding them to me or writing a } summary ? } } Thank you, } } Barbara Hartman } Barbara.Hartman-at-spcorp.com } Here is copy of all the replies... Also I have found the following paper very useful which I dug up on a literature search: Robin Wright et al. 1989 TEM and immunocytochemical studies of yeast: analysis of HMG-CoA reductase overproduction by EM. Methods in Cells Biology, Vol. 31
If anyone else can shed some more light/advice on the subject please do so.
#1 The ONLY good and reliable method for preparation of any yeast cell for ultrathin section is (high pressure) freezing or other good freezing method (slam freezing; propane jet freezing), combined with freeze substitution. anything else should only be interpreted with great care. Lit: Studer et al. 1989 High pressure freezing comes of age. Scanning microsc. suppl. 3:253-269 Scanning microscopy Interntl.Chicago,AMF O'Hara, USA Walther et al 1988 Morphological Organization of Glycoprotein containing cell surface structures in Yeast J.Ultrastr. and Molec. Structure research 101: 123-136 C.Capellaro et al 1994 Mating type-specific cell-cell recognition of Saccharomyces cerevisiae: cell wall attachment and active sites of a- and alpha-agglutinin. EMBO J. 13: 4737-4744
#2 Hi Manuela. I maintain an archive of the biologically related material posted to this list. If you will go to the web address listed at the end of this message you will see a section called "Tips & Tricks" Go to the TEM section and there is a link to "TEM of Yeast". It has some protocols in it but more importantly, e-mail addresses of persons who have done this before. If you cannot access the info let me know and I will get it to you.
} {} {} {} {} {} {} {} {} {} {} {} {} {} {} {} {} {} {} {} {} {} {} {} {} {} { GO GATORS Scott D. Whittaker 218 Carr Hall Research Assistant Gainesville, FL 32610 University Of Florida ph 352-392-1295 ICBR EM Core Lab fax 352-846-0251 sdw-at-biotech.ufl.edu http://www.biotech.ufl.edu/~emcl/ The home of " Tips & Tricks "
#3
Yeast are difficult to handle sometimes. I would suggest that you treat the cell walls either enzymatically or with metaperiodate in order to facilitate entry and egress of reagents .
You might look at these two papers
,Byers, B.//Goetsch, L.,,,Preparation of Yeast Cells for Thin-Section Electron Microscopy,,,,,Guide to Yeast Genetics and Molecular Biology,,,,,,,,,,,1991,,194,,,602-608,,,,,,,,,,,,,,,,,
Anderson, W.H.//Thompson, E.W.//Zwizinski, C.W.,,,A Rapid Method for the Preparation of Yeast for Immunoelectron Microscopy Using Lowicryl HM-20,,,,,Journal of Electron Microscopy Technique,,,,,,,,,,,1991,,18,,2,172-175
******************************************************* G.W. Erdos, Ph.D. Phone: 352-392-1295 Scientific Director, ICBR Electron Microscopy Core Lab 218 Carr Hall Fax: 352-846-0251 University of Florida E-mail: gwe-at-biotech.ufl.edu Gainesville, FL 32611 http://www.biotech.ufl.edu/~emcl/
*****Home of the #1 Gators
"Many shall run to and fro, and knowledge shall be increased" Daniel 12:4
#4 Dear Manuela, I've processed yeast cells several times. Standard techniques are fine but fix for a little longer than usual; up to 24 hrs. is o.k., and dehydrate with acetone rather than ethanol. The fix I use is 1.25% glut plus 4% paraformaldehyde in PBS with 4% sucrose. P.S. I usually process as a cell pellet in ependorf tubes. They spin down really well into a very dense pellet. Good luck, Marilyn
Marilyn Henderson Centre for Electron Microscopy and Microstructure Analysis The University of Adelaide South Australia 5005 marilyn-at-cemmsa.adelaide.edu.au (Marilyn Henderson)
#5 I have embedded Saccharomyces cerevisiae for standard EM using EPON 812 and Immuno using LRWhite. There is a lot of ref and I do not have them with me right now but may be able to send in a couple of days. However You need to treat the yeast suspension with b-glucuronidase ( Sigma, Cat# G-2887) and Zymolyase 100T ( ICN ImmunoBiological,s Cat# 320931). Outer coating of the yeast is hard to penetrate thus results in poor infiltration. Fix in 3% glut(some ref claim to fix in 5% ??) and then run up as you would any cell pellet. If I can find my protocol I shall email them to you as soon as possible. Goodluck... } Regards... :-) :-) :-) :-) :-) :-) :-) :-) :-) :-) :-) :-) Visit us at http://www.med.upenn.edu/~path/core/EMCMAIN1.htm Neelima Shah {shahn-at-mail.med.upenn.edu}
#6
Dear Manuela Palatsides, In our lab, we are using for many years following fixation protocol:
1. Yeast cells are fixed with 2% (w/v) KMnO4 for 20 min at 0 oC. 2. The cells are then embedded into 2% (w/v) Difco Agar. 3. The embedded cells (approx.1 cubic mm cubes) are dehydrated in the ethanol series (25%, 50%, 75%, 90%, 95% [each for 15min], 100% [20min], 100% [20min]) and 100% acetone [two times for 20 min].
The samples are then embedded in Vestopal W resin. The ultrathin sections are stained according to Reynolds (1963). [Reynolds E S: The use of lead citrate at high pH as an electron-opaque stain in electron microscopy. J.Cell Biol 17:208-212 (1963)]
This approach gives a good preservation of membrane structrures in the cells. However, the procedure cannot be use for subsequent immunolocalization of specific antigens. I do not know if this fixation procedure works well for Spurrs resin. I do not have any experieces with it.
The best regards O. Benada +---------------------------------------------------------------+ Dr. Oldrich Benada Acad. Sci. CR Phone: +42-2-4752399 Institute of Microbiology Fax: +42-2-4715743 Electron Microscopy Group E-mail: benada-at-biomed.cas.cz Videnska 1083 CZ - 142 20 Prague 4 - Krc Czech Republic +
Hi everyone, I have another question regarding yeast cells. We need to stain the chromatin of the spombe yeast cells I am processing and it has been brought to my attention that staining the DNA is difficult! I've ben using standard uranyl acetate and lead citrate staining procedures and the nucleus appears to be hetergenous and lighter than the cytoplasm. So again if anyone has had experience in this field or has a reference please guide me in the right direction....
Leah Dobbs wrote: } } Hello, } We are currently doing diffraction on our TEM for school. Nobody seems to } know what the standard exposure time is when taking a photo of the } diffraction pattern. } I would appreciate any suggestions. } } Thank you in advance } Leah L. Dobbs } Madison Area Technical College
The best exposure times come through experience on diffraction patterns. Often, if you lift the small screen and allow an auto exposure at that time, the result will be very good. But, of course, this depends on how much of the diffraction pattern is hitting the small screen. This is how it is with the JEOL 2000FX.
} Hello, } We are currently doing diffraction on our TEM for school. Nobody seems to } know what the standard exposure time is when taking a photo of the } diffraction pattern. } I would appreciate any suggestions. } } Thank you in advance } Leah L. Dobbs } Madison Area Technical College
The short answer is that there isn't a standard exposure time.
Factors to think about are:
1. There is a 'sensitivity' control for the automatic exposure time detector. This will normally be set to give appropriately exposed images for the film and development procedure you use. It MIGHT be possible to determine a setting which works reasonably well for diffration patterns (if most of the work is similar, for example SADP of thin specimens) - take a series of photos of a 'typical' diffraction pattern at different settings and process. Users can then change the setting as appropriate depending on whetther they are photographing images or diffraction patterns.
Of course, the problem here is certainly going to be that somebody will forget to re-position the switch, or check its setting, and end up taking a cassette of images on the diffraction pattern setting ...... A LARGE notice might help.
2. The type of electron diffraction pattern and type of specimen will have a big influence. Traditional SADP from thin specimens results in diffraction patterns with a huge dynamic range. In this case it is probably impossible to get all the information in a single negative - a short exposure will capture the intense spots but a longer exposure will be needed to get any faint spots. Patterns from thicker specimens and different types, such as convergent beam, tend to have a smaller dynamic range.
3. What you want from the pattern will also affect how you photograph it. You will probably need several images to collect all the information you need. When I was regularly taking convergent beam patterns, I often took 6 or 8 photos of each pattern - at least 2 different C2 aperture sizes (large to show holz lines, small for spot positions), 2 or 3 different camera lengths (very short for holz rings, medium for zero layer detail, and longer for bright field detail) and 2 or 3 exposure times for each condition. I used a lot of film :)
4. You may also need to think about how you process the images. It sounds as though you are using a traditional 'wet' photographic route. One problem here it that printing paper has less dynamic range in a single exposure than film. So you can get a negative with lots of information in it, but then find it impossible to print in a single exposure - this where you have to go in by hand, with pieces of card (with and without holes). With some practise, you can expose as many as 3 or 4 different areas of the paper for different times and end up with a single print that contains all the detail of the original negative.
To conclude, even with experience, whatever type of diffraction pattern you are photographing, you'll probably need at least 2 or 3 exposures to be confident of getting one right.
Regards,
--------------------------------------------------------------- Dr L. P. Stoter Technical Editor, MICROSCOPY & ANALYSIS Technesis 17, Rocks Park Road email: LPS-at-teknesis.demon.co.uk Uckfield, E. Sussex Phone: +44 (0)1825 766911 TN22 2AT Fax: +44 (0)1825 766911 United Kingdom ---------------------------------------------------------------
We are an electron microscopy group and we search for a new CCDcamera, to scan our electron diffraction films properly. We got your address from George Farrants from Calidris. Could you hire us some advice which CCD-camera is best. We would like to buy an advanced CCD camera with 16 Bit
With best wishes Hans Kothe Group Dr. I.G. Voigt-Martin
Hi, dear colleagues, I would like to know if the Taylor company (for microanalitical standards) works and if they have an e-mail address or fax number? Thanks for your help Lajos Pogany pogany-at-power.szfki.kfki.hu
Dr. Lajos Pogany, PhD
Research Institut for Solid State Physics of the Hungarian Academy of Sciences XII. Konkoly Thege 29-33 ; Budapest Hungary P.O.Box 49 H-1525 phone: 00-36-1-169-9499 fax: 00-36-1-169-5380 e-mail: pogany-at-power.szfki.kfki.hu
We have several boxes of serial cryo sections of mouse eyes, stored with dessicant at -70deg. We would like to immunostain sections, a few at a time, from each box. What is the best way to remove a couple slides without damaging the rest of the frozen ones with freeze-thaw cycles? I have had 2 opinions - a) do it as quickly as possible so the rest are not thawed. This, however, has resulted in some ice formation inside the box. b) let the entire box warm up to room temperature, the dessicant would absorb any moisture, then refreeze.
Any opinions/experience would be greatly appreciated - these sections are the result of a LOT of work.
judy
Judy Trogadis Eye Research Institute of Canada and University of Toronto 416-603-5088 judy-at-camtwh.eric.on.ca
We are presently having severe problems keeping paraffin embedded sections attached to our ATS coated slides during in-situ hybridisation processing. Our fetal tissue is OK, but anything larger has been totally floating or to the point of being unusable.
We wash our slides well, and then coat them for 10 seconds in a 2% solution of ATS in acetone. Two washes follow, one in 100% acetone and another in DEPC water.
Any suggestions would be very gratefully received - this is now becoming a very major problem in our lab.
Pog=E1ny Lajos wrote: } =20 } Hi, } dear colleagues, I would like to know if the Taylor company (for } microanalitical standards) works and if they have an e-mail address= or fax } number? } Thanks for your help } Lajos Pogany } pogany-at-power.szfki.kfki.hu } =20 } Dr. Lajos Pogany, PhD } =20 } =20 } Research Institut for Solid State Physics of } the Hungarian Academy of Sciences } XII. Konkoly Thege 29-33 ; } Budapest } Hungary P.O.Box 49 } H-1525 } phone: 00-36-1-169-9499 } fax: 00-36-1-169-5380 } e-mail: pogany-at-power.szfki.kfki.hu } =20
Lajos,
You may found address with phone and fax number in my microscopy vend= ors database at:
About magnetic fields measurments, we have heard of an Australian company called "the Arlundya division of the Dindima group", but we failed in finding their present phones and or www address.
They seem to be in Victoria, Australia. Can anyone help?
Thank you in advance,
Yves MANIETTE Universitat de Barcelona Serveis Cientifico Tecnics Unitat ESCA TEM Carrer Lluis Sole i Sabaris, 1-3 E-08028 BARCELONA ESPANYA
Hello Suwkon, From our own experience, we can recommend the following: Concerning the resin: Use a GMA based resin (e.g. HistoResin). The sections are best prepared with a motorized rotary microtome (e.g. LEICA RM 2155) and a tungsten carbide knife. Depending on the degree of resin infiltration into the sample, it might be necessary to take the sections with the scotch-tape method after sectioning. When the resin does only enclose the sample and does not infiltrate it totally, parts of the wheat may break out of the block.
} Date: Fri, 29 Nov 1996 08:31 +1200 (NZST) } From: Smith, Peter {SMithP-at-agresearch.cri.nz} } To: microscopy listserver {Microscopy-at-Sparc5.Microscopy.Com} } Subject: ATS coated slides } } } Help help! } } We are presently having severe problems keeping paraffin embedded sections } attached to our ATS coated slides during in-situ hybridisation processing. } Our fetal tissue is OK, but anything larger has been totally floating or to } the point of being unusable. } } We wash our slides well, and then coat them for 10 seconds in a 2% solution } of ATS in acetone. Two washes follow, one in 100% acetone and another in } DEPC water. } } Any suggestions would be very gratefully received - this is now becoming a } very major problem in our lab. } } Many Thanks } Peter Smith }
We use Fisherbrand Superfrost/Plus (Fisher Scientific 800 766 7000) with good success.
Sara E. Miller, Ph. D. P. O. Box 3020 Duke University Medical Center Durham, NC 27710 Ph: 919 684-3452 FAX: 919 684-8735
We just went into a rather strange problem. Last week our service engineer dismantled the lupe of our (old) Philips 301 microscope in order to do his maintenance job... Therefore he put it on a shelf, for further use...
a few hours later came an unknown guy, found very nice this old object and decided it would look much better on his living room table than lost on a laboratory shelf...
Here we are now, how shall we be able to focus the sample, known that there is no camera on this microscope.
Conclusion: looking for a EM301 lupe, provided it comes from an instrument that has already no future. We do have a budget for this.
Thank you in advance.
Yves MANIETTE Universitat de Barcelona Serveis Cientifico Tecnics Unitat ESCA TEM Carrer Lluis Sole i Sabaris, 1-3 E-08028 BARCELONA ESPANYA
Mary Thompson and Lawrence Berkeley Laboratory has developed a nice program with us that allows Image Archiving with fast text searches and produces thumbnails of any size you choose. It's available free. Contact her at:
MRThompson-at-lbl.gov
Jacob
Jacob Bastacky Room 116 Donner Laboratory Lawrence Berkeley Laboratory EMail: sjbastacky-at-lbl.gov University of California Phone: (510) 486-4606 Berkeley, California 94720 Fax: (510) 486-4750
I am trying to help a local Researcher solve a minor problem. She captures Digital Photomicrographs and wants to archive these images. It would be nice if it worked on both Mac and/or Windows, had the ability to show thumbnails and be customizable from a fields standpoint. I am very verse with Filemaker Pro by Claris which would cover all these criteria; however, I do not want to "reinvent the wheel" and feel someone out there has done this already!
If you know of a template(s) for Filemaker or any other image databases; shareware or commercial, please direct me to it. Also, since I am a member of the notorious "Vendor Class" I would like to state up front this is not going to be used for commercial purposes or monetary gain! (I am just being a good friend and worthy consultant). Nonetheless, I am willing to show my gratitude and reward the person generously that best solves my dilemma.
Thank you,
Lawrence Kordon Nikon, Inc. Columbia, Maryland (410) 740-7404 nikon-at-jagunet.com
Arlunya Division of the Dindima Group are located at 10 Argent Place, Ringwood, Victoria, Australia, 3134. Telephone no. is international +61 3 9873 4455.
If you don't have any luck, let me know and I'll chase up a fax number for you.
Hope this helps, Roger
Roger Wallis General Manager Optiscan P/L Confocal Microscopy PO Box 1066 Mt. Waverley MDC Victoria 3149 Australia Tel: (61) 3-9562 7741 Fax: (61) 3-9562-7742 e-mail: rogerw-at-optiscan.com.au URL: http://www.optiscan.com.au ______________________________
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About magnetic fields measurments, we have heard of an Australian company called "the Arlundya division of the Dindima group", but we failed in finding their present phones and or www address.
They seem to be in Victoria, Australia. Can anyone help?
Thank you in advance,
Yves MANIETTE Universitat de Barcelona Serveis Cientifico Tecnics Unitat ESCA TEM Carrer Lluis Sole i Sabaris, 1-3 E-08028 BARCELONA ESPANYA
The National Institute of Standards & Technology has many Post Doctoral Positions open. These are offered competitively through the National Research Council. Within microscopy/microanalysis research areas we have several possible openings described at the following sites:
http://rap.nas.edu/lab/NIST/50837106.html This opportunity highlights our analytical research using Analytical Electron Microscopy/Compositional Mapping
http://rap.nas.edu/lab/NIST/50837109.html This opportunity highlights our Submicroscopic Chemical and Physical Characterization of Materials and Particles
http://rap.nas.edu/lab/NIST/50837110.html This opportunity highlights our Electron-Probe Microanalysis/Scanning Electron Microscopy research.
If you have research ideas that would be related to these analytical approaches and are looking for a Post Doc opportunity, please contact me immediately.
The NIST/NRC program offers a two year post doc at an annual salary of $45,500. The applications are due to the NRC by Jan 15, 1997! This includes a proposal and several recommendations.
A candidate must be a U.S. citizen that receives their PhD and starts work at NIST by Feb 1, 1998 (You can start as early as July 1, 1997). So, this is the perfect opportunity for those of you that are graduating this spring through next fall. Please note that NIST/NRC only accepts applications once a year, unlike some other institutions.
Eric B. Steel, Leader e-mail: eric.steel-at-nist.gov Microanalysis Research Group Office: 301-975-3902 N.I.S.T. FAX: 301-216-1134 Bldg. 222/Rm A113 Gaithersburg MD 20899
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