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Surplus Equipment Listings WWW Page


This forum is being supplied so that Individuals and Organizations can place Surplus Equipment announcements on-line which are of interest to the microscopy community. There are no charges to use this service, however, if you do receive monetary compensation above "disposal costs" it would be appropriate to make a voluntary contribution of an appropriate amount (i.e we are running on the honor system) to the the Listserver to help defray the cost of running this service.

In order to submit a Equipment Announcement into this database please send the brief announcement using this Electronic Form. Each submission will be reviewed by someone (probably Nestor) to insure it's appropriateness (not accuracy) for inclusion. Only Electronic Form submissions will be accepted.

Note: Updates are NOT automatic and depend upon the availability of a reviewer to read each submission!!
So don't expect to see your listing to appear below for at least 24-48 hours.

To delete a listing send an Email to zaluzec@microscopy.com requesting that your listing be removed, please insure you provide the listed Ref# and enough detail so that the correct listing can be identified.

The Microscopy Listserver assumes no responsiblity for accuracy or timeliness of the data that is entered presented here. That is the sole responsibility of the Information Provider.

The following list represents current Items posted to the Surplus Equipment DataBase. The data is approximately in chronological order.


Directory of Surplus Equipment


To add an Instrument to this DataBase use this form



Contact
Description

Justin A. Kraft
J. Kraft Microscopy Services
303 Franklin St.
Springville, NY, 14141
USA

Email: jkraft@jkraftmicro.com
WWW: http://www.jkrafticro.com

Posted: 8/22/2019
Ref#: 8388934
Gatan 650 single-tilt rotation holder for JEOL 2010

We have a Gatan single-tilt rotation holder for a JEOL 2010, or compatible goniometer (Will also fit 1200 series, and possibly 1400 series). Excellent condition, complete with special tools, carrying case, stand, etc. Has Beryllium components for EELS and EDS work.

Ken Tiekotter

POB 417
Trout Lake, WA, 98650
USA

Email: tiekotte@earthlink.net


Posted: 09-20-2018
Ref#: 8388937
Microscopes and diamond knives

AO compound, B&L compound and dissecting, Leica compound, Leitz compound, Nikon compound, Olympus compound, Reichert compound, Wild compound, Zeiss compound, most of these are trinocular.

Diamond knives used and new 2.0mm to 6mm

Contact me for specifics.

Thank you.

Elizabeth Miller, Senior Laboratory Coordinator
Michigan Technological Unviersity
1400 Townsend Drive
Houghton, MI, 49931
USA

Email: eafraki@mtu.edu
WWW: https://www.mtu.edu/

Posted: 8/7/2020
Ref#: 8388943
JEOL JEM-2010 LaB6 TEM

(TSS#289) This pre-owned, 200kV material science Transmission Electron Microscope (TEM) is ReManufactured to OEM functionality and includes:

High contrast objective lens aperture
High resolution electron diffraction stage
Goniometer stage with 5-axis motor drive
Gatan Orius Model 830 Bottom Mount Camera
JEOL Single tilt and Double tilt holders
Oxford 4Pi EDX System
IDE Active Vibration System

This Transmission Electron Microscope is currently installed at a university in Michigan, USA, and is available for demonstration.

Elizabeth Miller, Senior Laboratory Coordinator
Michigan Technological Unviersity
1400 Townsend Drive
Houghton, MI, 49931
United States

Email: eafraki@mtu.edu


Posted: 8/7/2020
Ref#: 8388944
JOEL JSM 6400

The JEOL JSM-6400 is a research grade tungsten source scanning electron microscope that is configured with several sophisticated accessories including, an ultra thin window energy dispersive x-ray spectrometer, three WDS spectrometers and Geller dSspec automation system controlling spectrometers and motorized stage. This microanalysis package is used to perform study surface morphology and composition studies on a wide variety of organic and inorganic materials.

CAPABILITIES

Imaging modes include secondary electrons, backscattered electrons and x-rays. Under ideal conditions, resolution in secondary electron imaging mode is 5 nm. Images can be recorded with Polaroid film and/or digital image capture through the Geller dPict module with subsequent output to a 1200 dpi laser printer.

Characteristic x-rays can be detected from as little as a 1 cubic micrometer volume of the specimen. Elements from atomic number 5 (B) to 92 (U) can be detected in concentrations above 0.001 wt% element. Analysis modes include qualitative, standardless, and fully rigorous standards-based quantitative analysis. Additional capabilities of the Geller software package include analog and digital x-ray mapping and report generation. Both analog and digital x-ray or compositional mapping are available.

NOTE

The gun alignment control electronics on JEOL JSM-6400 are currently in need of repair.

The instrument is sold in as is condition not including packing or shipping.

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Nestor J. Zaluzec / Zaluzec@microscopy.com