| Contact | Description |
Justin A. Kraft
J. Kraft Microscopy Services
303 Franklin St.
Springville, NY, 14141
USA
Email: jkraft@jkraftmicro.com
WWW: http://www.jkrafticro.com
Posted: 8/22/2019
Ref#: 8388934 |
| Gatan 650 single-tilt rotation holder for JEOL 2010 |
We have a Gatan single-tilt rotation holder for a JEOL 2010, or compatible goniometer (Will also fit 1200 series, and possibly 1400 series). Excellent condition, complete with special tools, carrying case, stand, etc. Has Beryllium components for EELS and EDS work. |
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Ken Tiekotter
POB 417
Trout Lake, WA, 98650
USA
Email: tiekotte@earthlink.net
Posted: 09-20-2018
Ref#: 8388937 |
| Microscopes and diamond knives |
AO compound, B&L compound and dissecting, Leica compound, Leitz compound, Nikon compound, Olympus compound, Reichert compound, Wild compound, Zeiss compound, most of these are trinocular.
Diamond knives used and new 2.0mm to 6mm
Contact me for specifics.
Thank you. |
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Elizabeth Miller, Senior Laboratory Coordinator
Michigan Technological Unviersity
1400 Townsend Drive
Houghton, MI, 49931
USA
Email: eafraki@mtu.edu
WWW: https://www.mtu.edu/
Posted: 8/7/2020
Ref#: 8388943 |
| JEOL JEM-2010 LaB6 TEM |
(TSS#289) This pre-owned, 200kV material science Transmission Electron Microscope (TEM) is ReManufactured to OEM functionality and includes:
• High contrast objective lens aperture
• High resolution electron diffraction stage
• Goniometer stage with 5-axis motor drive
• Gatan Orius Model 830 Bottom Mount Camera
• JEOL Single tilt and Double tilt holders
• Oxford 4Pi EDX System
• IDE Active Vibration System
This Transmission Electron Microscope is currently installed at a university in Michigan, USA, and is available for demonstration. |
|
Elizabeth Miller, Senior Laboratory Coordinator
Michigan Technological Unviersity
1400 Townsend Drive
Houghton, MI, 49931
United States
Email: eafraki@mtu.edu
Posted: 8/7/2020
Ref#: 8388944 |
| JOEL JSM 6400 |
The JEOL JSM-6400 is a research grade tungsten source scanning electron microscope that is configured with several sophisticated accessories including, an ultra thin window energy dispersive x-ray spectrometer, three WDS spectrometers and Geller dSspec automation system controlling spectrometers and motorized stage. This microanalysis package is used to perform study surface morphology and composition studies on a wide variety of organic and inorganic materials.
CAPABILITIES
Imaging modes include secondary electrons, backscattered electrons and x-rays. Under ideal conditions, resolution in secondary electron imaging mode is 5 nm. Images can be recorded with Polaroid film and/or digital image capture through the Geller dPict module with subsequent output to a 1200 dpi laser printer.
Characteristic x-rays can be detected from as little as a 1 cubic micrometer volume of the specimen. Elements from atomic number 5 (B) to 92 (U) can be detected in concentrations above 0.001 wt% element. Analysis modes include qualitative, standardless, and fully rigorous standards-based quantitative analysis. Additional capabilities of the Geller software package include analog and digital x-ray mapping and report generation. Both analog and digital x-ray or compositional mapping are available.
NOTE
The gun alignment control electronics on JEOL JSM-6400 are currently in need of repair.
The instrument is sold in as is condition not including packing or shipping. |
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