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The following list represents current Items posted to the Surplus Equipment DataBase. The data is approximately in chronological order.

Directory of Surplus Equipment

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Contact
Description

Jeffrey Farrer, Facility Director
Brigham Young University
701 East University Parkway
Provo, UT, 84097
USA

Email: jeff_farrer@byu.edu


Posted: 3/15/2018
Ref#: 8388894
FEI CompuStage, Low-Background, Double-Tilt Specimen holder
This holder is in pristine condition. Purchased new and rarely used in a Tecnai F30 Twin lens TEM. Fully controlled by CompuStage controller. Can be used in combination with Fixed beryllium cryo shields for 120 kV. Ideal for combination with EDX. Optimized specimen clamping with HexRing and locking washer.

The holder enables the specimen to be tilted in two directions perpendicular to each other, one (whose angle depends on the lens) around the main tilt axis, the second one (ħ 30°) around the Y-axis
The second tilt is read out and displayed with an accuracy of 0.1°
It incorporates the HexRing™ mounting mechanism, which is ideal for fast and reliable mounting of all specimens. Holder parts exposed to the electron beam are made of beryllium. Specimen movement is fully controlled by the CompuStage controller making the system fully safe and allowing maximum tilt for each XYZ-beta tilt position. It incorporates a Safe ENTRY key for use with the sENTRY system to prevent its insertion into the wrong lens
It is incompatible with the FEI U-TWlN lens TEM
Accepts 3.05 mm diameter grid with maximum thickness 0.34 mm
Asking $7500

Ken Tiekotter

POB 417
Trout Lake, WA, 98650
USA

Email: tiekotte@earthlink.net


Posted: 09-20-2018
Ref#: 8388908
Microscopes and diamond knives
AO compound, B&L compound and dissecting, Leica compound, Leitz compound, Nikon compound, Olympus compound, Reichert compound, Wild compound, Zeiss compound, most of these are trinocular.

Diamond knives used and new 2.0mm to 6mm

Contact me for specifics.

Thank you.

Brian Sneed, Scientist
Cabot Microelectronics Corporation
870 N. Commons Dr.
Aurora, IL, 60504
United States

Email: brian_sneed@cabotcmp.com


Posted: 11/01/2018
Ref#: 8388923
KLA-Tencor Amray 4200L SEM for Wafer Analysis (w/ 30mm2 Oxford EDS detector)
Cabot Microelectronics is replacing a KLA-Tencor Amray 4200L SEM for wafer analysis (w/ 30mm2 Oxford EDS detector) originally purchased in 1999. The microscope is in good condition except that the sample exchange door is jammed and requires repairs. Included with the scope is a 30mm2 EDS detector from Oxford that is in good condition.

Considering the state of the instrument, initial asking price is $7500 + shipping. Will consider counter-offers.

Photos available upon request.

I can be reached by email at brian_sneed@cabotcmp.com
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